TW429413B - Projection exposure device, projection exposure method, optical cleaning method, and the method of fabricating semiconductor device - Google Patents
Projection exposure device, projection exposure method, optical cleaning method, and the method of fabricating semiconductor deviceInfo
- Publication number
- TW429413B TW429413B TW87117021A TW87117021A TW429413B TW 429413 B TW429413 B TW 429413B TW 87117021 A TW87117021 A TW 87117021A TW 87117021 A TW87117021 A TW 87117021A TW 429413 B TW429413 B TW 429413B
- Authority
- TW
- Taiwan
- Prior art keywords
- wafer
- transmittance
- exposure
- optical system
- projection exposure
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title abstract 6
- 238000000034 method Methods 0.000 title abstract 3
- 238000004140 cleaning Methods 0.000 title 1
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
- 238000002834 transmittance Methods 0.000 abstract 8
- 238000005286 illumination Methods 0.000 abstract 1
- 230000010355 oscillation Effects 0.000 abstract 1
- 230000001105 regulatory effect Effects 0.000 abstract 1
Landscapes
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP33710497 | 1997-12-08 | ||
| JP06702198A JP4029200B2 (ja) | 1997-12-08 | 1998-03-17 | 投影露光装置、投影露光方法、光洗浄方法および半導体デバイスの製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW429413B true TW429413B (en) | 2001-04-11 |
Family
ID=26408226
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW87117021A TW429413B (en) | 1997-12-08 | 1998-10-14 | Projection exposure device, projection exposure method, optical cleaning method, and the method of fabricating semiconductor device |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP4029200B2 (https=) |
| TW (1) | TW429413B (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN121541419A (zh) * | 2026-01-19 | 2026-02-17 | 中国科学院光电技术研究所 | 多工况补偿器参数计算方法、系统、介质和程序产品 |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4586954B2 (ja) * | 2003-04-04 | 2010-11-24 | 株式会社ニコン | 露光装置及び露光方法、並びにデバイス製造方法 |
| US7671347B2 (en) * | 2006-10-10 | 2010-03-02 | Asml Netherlands B.V. | Cleaning method, apparatus and cleaning system |
| JP5314433B2 (ja) * | 2009-01-06 | 2013-10-16 | ギガフォトン株式会社 | 極端紫外光源装置 |
| JP5312959B2 (ja) * | 2009-01-09 | 2013-10-09 | ギガフォトン株式会社 | 極端紫外光源装置 |
-
1998
- 1998-03-17 JP JP06702198A patent/JP4029200B2/ja not_active Expired - Lifetime
- 1998-10-14 TW TW87117021A patent/TW429413B/zh not_active IP Right Cessation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN121541419A (zh) * | 2026-01-19 | 2026-02-17 | 中国科学院光电技术研究所 | 多工况补偿器参数计算方法、系统、介质和程序产品 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4029200B2 (ja) | 2008-01-09 |
| JP2002025880A (ja) | 2002-01-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| AU8358198A (en) | Projection aligner, projection exposure method, optical cleaning method and method of fabricating semiconductor device | |
| NO934713L (no) | Belysnings og bildedannende delsystemer for et linseinspeksjonssystem | |
| EP1014429A4 (en) | Method and device for exposure control, method and device for exposure, and method of manufacture of device | |
| NO934717D0 (no) | Fremgangsmaate for inspisering av optalmise linser | |
| JPS54111832A (en) | Exposure device | |
| DE60233514D1 (de) | Optische sensoreinrichtung und verfahren zur steuerung ihrer belichtungszeit | |
| TW429413B (en) | Projection exposure device, projection exposure method, optical cleaning method, and the method of fabricating semiconductor device | |
| JPS55137548A (en) | Method and apparatus for image formation | |
| JPS5779922A (en) | Automatic focusing camera | |
| JPS57212406A (en) | Method and device for focusing | |
| JPS5455429A (en) | Automatic exposure control device for camera with blur detecting circuit | |
| JPS54149421A (en) | Image pickup system | |
| JPS552260A (en) | Automatic digital exposure control unit of both shutter and aperture control | |
| JPS5651734A (en) | Direct positive image forming method | |
| JPS56106227A (en) | Photometric device of reflex photometric system camera | |
| KR980003870A (ko) | 반도체 사진 식각 공정의 노광방법 | |
| JPS5518645A (en) | Automatic exposure control type lighting device of copying machine | |
| JPS5579471A (en) | Exposure method in copying machine | |
| JPS5346725A (en) | Exposure controller of cameras | |
| JPS56110962A (en) | Exposure device of electrophotographic copier | |
| JPS5360626A (en) | Method for eliminating illumination irregularity | |
| JPS55164820A (en) | Alarm device of camera using materially electro* magneto optical diaphragm device | |
| JPS5716341A (en) | Photoluminescence image viewer | |
| JPS5512926A (en) | Light-sensing device for camera | |
| JPS6464462A (en) | Device for reading image of microfilm |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent | ||
| MM4A | Annulment or lapse of patent due to non-payment of fees |