TW374176B - Input/output circuit of high-speed semiconductor memory device requiring less time for testing - Google Patents

Input/output circuit of high-speed semiconductor memory device requiring less time for testing

Info

Publication number
TW374176B
TW374176B TW087103950A TW87103950A TW374176B TW 374176 B TW374176 B TW 374176B TW 087103950 A TW087103950 A TW 087103950A TW 87103950 A TW87103950 A TW 87103950A TW 374176 B TW374176 B TW 374176B
Authority
TW
Taiwan
Prior art keywords
input
memory device
semiconductor memory
testing
output circuit
Prior art date
Application number
TW087103950A
Other languages
English (en)
Inventor
Tae-Hyun Kim
Kye-Hyun Kyung
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Application granted granted Critical
Publication of TW374176B publication Critical patent/TW374176B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Static Random-Access Memory (AREA)
TW087103950A 1997-11-18 1998-03-17 Input/output circuit of high-speed semiconductor memory device requiring less time for testing TW374176B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019970060815A KR100275724B1 (ko) 1997-11-18 1997-11-18 테스트 타임이 감소되는 고속 반도체 메모리 장치의 입출력 회로

Publications (1)

Publication Number Publication Date
TW374176B true TW374176B (en) 1999-11-11

Family

ID=19524981

Family Applications (1)

Application Number Title Priority Date Filing Date
TW087103950A TW374176B (en) 1997-11-18 1998-03-17 Input/output circuit of high-speed semiconductor memory device requiring less time for testing

Country Status (4)

Country Link
US (1) US5986953A (zh)
JP (1) JP3735699B2 (zh)
KR (1) KR100275724B1 (zh)
TW (1) TW374176B (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6141245A (en) * 1999-04-30 2000-10-31 International Business Machines Corporation Impedance control using fuses
JP2001195899A (ja) 2000-01-06 2001-07-19 Mitsubishi Electric Corp 半導体記憶装置
US6587384B2 (en) * 2001-04-21 2003-07-01 Hewlett-Packard Development Company, L.P. Multi-function serial I/O circuit
US7609725B2 (en) * 2003-02-28 2009-10-27 Lsi Corporation Large transmissions on packetized data bus
KR100735527B1 (ko) * 2006-02-13 2007-07-04 삼성전자주식회사 2개의 패드 행을 포함하는 반도체 메모리 장치
KR20180038339A (ko) * 2016-10-06 2018-04-16 에스케이하이닉스 주식회사 셀어레이 불량 테스트 방법 및 이를 수행하는 반도체장치

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5659514A (en) * 1991-06-12 1997-08-19 Hazani; Emanuel Memory cell and current mirror circuit
JPH04212799A (ja) * 1990-01-31 1992-08-04 Nec Ic Microcomput Syst Ltd テスト回路内蔵半導体メモリ
JPH05249196A (ja) * 1992-03-02 1993-09-28 Hitachi Ltd 半導体記憶装置
US5379308A (en) * 1992-04-20 1995-01-03 Intel Corporation Apparatus for a bus-based integrated circuit test architecture
JP3563750B2 (ja) * 1992-10-16 2004-09-08 テキサス インスツルメンツ インコーポレイテツド アナログ回路のための走査に基づく試験
JP3753190B2 (ja) * 1995-04-26 2006-03-08 三菱電機株式会社 半導体装置
US5506499A (en) * 1995-06-05 1996-04-09 Neomagic Corp. Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad
US5592422A (en) * 1995-06-07 1997-01-07 Sgs-Thomson Microelectronics, Inc. Reduced pin count stress test circuit for integrated memory devices and method therefor
US5568437A (en) * 1995-06-20 1996-10-22 Vlsi Technology, Inc. Built-in self test for integrated circuits having read/write memory
US5615159A (en) * 1995-11-28 1997-03-25 Micron Quantum Devices, Inc. Memory system with non-volatile data storage unit and method of initializing same

Also Published As

Publication number Publication date
KR100275724B1 (ko) 2000-12-15
KR19990040441A (ko) 1999-06-05
JP3735699B2 (ja) 2006-01-18
US5986953A (en) 1999-11-16
JPH11162200A (ja) 1999-06-18

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees