TW356526B - An IC testing method and IC testing device using the same method - Google Patents

An IC testing method and IC testing device using the same method

Info

Publication number
TW356526B
TW356526B TW086118710A TW86118710A TW356526B TW 356526 B TW356526 B TW 356526B TW 086118710 A TW086118710 A TW 086118710A TW 86118710 A TW86118710 A TW 86118710A TW 356526 B TW356526 B TW 356526B
Authority
TW
Taiwan
Prior art keywords
testing device
tested
testing
terminals
test
Prior art date
Application number
TW086118710A
Other languages
English (en)
Inventor
Yoshihiro Hashimoto
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from PCT/JP1997/004228 external-priority patent/WO1999027376A1/ja
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of TW356526B publication Critical patent/TW356526B/zh

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW086118710A 1997-11-20 1997-12-11 An IC testing method and IC testing device using the same method TW356526B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP1997/004228 WO1999027376A1 (fr) 1997-11-20 1997-11-20 Procede de test de circuits integres et appareil de test de circuits integres utilisant ce procede

Publications (1)

Publication Number Publication Date
TW356526B true TW356526B (en) 1999-04-21

Family

ID=27590536

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086118710A TW356526B (en) 1997-11-20 1997-12-11 An IC testing method and IC testing device using the same method

Country Status (2)

Country Link
JP (1) JP3426254B2 (zh)
TW (1) TW356526B (zh)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5886467A (ja) * 1981-11-18 1983-05-24 Ando Electric Co Ltd 論理回路試験装置
JPS58158566A (ja) * 1982-03-17 1983-09-20 Hitachi Ltd 検査装置
JPS5923676U (ja) * 1982-08-04 1984-02-14 株式会社アドバンテスト 自己診断機能を持つｉｃ試験装置
JPH0743413B2 (ja) * 1984-05-09 1995-05-15 三菱電機株式会社 半導体試験装置
JPS6329277A (ja) * 1986-07-23 1988-02-06 Nec Corp 論理集積回路の試験装置
JPH0645909Y2 (ja) * 1987-05-29 1994-11-24 株式会社アドバンテスト Ｉｃ試験装置
JPS6447973A (en) * 1987-08-18 1989-02-22 Yokogawa Electric Corp Device tester
JPH0559354U (ja) * 1992-01-28 1993-08-06 株式会社アドバンテスト Ｉｃ試験装置
JP3331103B2 (ja) * 1995-07-24 2002-10-07 株式会社アドバンテスト Ｉｃテスタの電流測定装置

Also Published As

Publication number Publication date
JP3426254B2 (ja) 2003-07-14

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