TW356525B - A voltage activate electrical current testing method and the apparatus - Google Patents

A voltage activate electrical current testing method and the apparatus

Info

Publication number
TW356525B
TW356525B TW086118703A TW86118703A TW356525B TW 356525 B TW356525 B TW 356525B TW 086118703 A TW086118703 A TW 086118703A TW 86118703 A TW86118703 A TW 86118703A TW 356525 B TW356525 B TW 356525B
Authority
TW
Taiwan
Prior art keywords
voltage
current
resistor
current testing
testing
Prior art date
Application number
TW086118703A
Other languages
English (en)
Inventor
Yoshihiro Hashimoto
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Application granted granted Critical
Publication of TW356525B publication Critical patent/TW356525B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/08—Circuits for altering the measuring range
    • G01R15/09—Autoranging circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measurement Of Current Or Voltage (AREA)
TW086118703A 1997-12-02 1997-12-11 A voltage activate electrical current testing method and the apparatus TW356525B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP1997/004398 WO1999028756A1 (fr) 1997-12-02 1997-12-02 Procede permettant de mesurer une intensite en appliquant une tension, et dispositif a cet effet

Publications (1)

Publication Number Publication Date
TW356525B true TW356525B (en) 1999-04-21

Family

ID=14181583

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086118703A TW356525B (en) 1997-12-02 1997-12-11 A voltage activate electrical current testing method and the apparatus

Country Status (6)

Country Link
US (1) US6255842B1 (zh)
JP (1) JP3184539B2 (zh)
DE (1) DE19782254T1 (zh)
GB (1) GB2336217B (zh)
TW (1) TW356525B (zh)
WO (1) WO1999028756A1 (zh)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002236148A (ja) * 2001-02-08 2002-08-23 Mitsubishi Electric Corp 半導体集積回路の試験装置およびそれを用いた半導体集積回路の試験方法
US6777970B2 (en) * 2001-04-19 2004-08-17 Intel Corporation AC testing of leakage current in integrated circuits using RC time constant
JP2003075515A (ja) * 2001-08-31 2003-03-12 Mitsubishi Electric Corp 半導体集積回路の試験装置およびその試験方法
DK175691B1 (da) * 2002-09-11 2005-01-17 Bactoforce As Fremgangsmåde til at undersøge en varmeveksler for lækage
US7352193B2 (en) * 2002-12-11 2008-04-01 Advantest Corporation Voltage-impressed current measuring apparatus and current buffers with switches used therefor
US7276893B2 (en) * 2005-02-28 2007-10-02 Keithley Instruments, Inc. Automatic ranging current shunt
JP3953087B2 (ja) 2005-10-18 2007-08-01 日本電産リード株式会社 絶縁検査装置及び絶縁検査方法
US7492181B1 (en) * 2006-05-31 2009-02-17 Credence Systems Corporation Method and device for enabling the measurement of device under test voltages using a testing instrument of limited range
US7557592B2 (en) * 2006-06-06 2009-07-07 Formfactor, Inc. Method of expanding tester drive and measurement capability
JP2009115506A (ja) * 2007-11-02 2009-05-28 Yokogawa Electric Corp 直流試験装置及び半導体試験装置
JP4983688B2 (ja) * 2008-03-27 2012-07-25 富士通セミコンダクター株式会社 半導体装置
FR2932568B1 (fr) * 2008-06-11 2010-06-11 Schneider Electric Ind Sas Dispositif de mesure de courant et unite de traitement comportant un tel dispositif
US8278909B2 (en) 2009-07-16 2012-10-02 Mks Instruments, Inc. Wide-dynamic range electrometer with a fast response
JP5489798B2 (ja) * 2010-03-17 2014-05-14 三菱電機株式会社 電流検出装置およびモータシステム
JPWO2011151856A1 (ja) * 2010-05-31 2013-07-25 株式会社アドバンテスト 測定装置および測定方法
US8823385B2 (en) * 2011-03-10 2014-09-02 Infineon Technologies Ag Detection of pre-catastrophic, stress induced leakage current conditions for dielectric layers
KR102236200B1 (ko) 2011-06-30 2021-04-06 에이에스엠엘 네델란즈 비.브이. 용량성 측정 시스템을 위한 능동 실드
US9551741B2 (en) * 2011-11-23 2017-01-24 Intel Corporation Current tests for I/O interface connectors
DE102012207217B4 (de) * 2012-04-30 2021-03-04 Leica Microsystems Cms Gmbh Mikroskop mit einer Beleuchtungseinrichtung
SG2012068490A (en) 2012-09-13 2014-04-28 Schneider Electric South East Asia Hq Pte Ltd A relay for automatically selecting a monitoring range
US10024889B2 (en) * 2015-12-23 2018-07-17 Intel IP Corporation Apparatuses, methods, and systems for detection of a current level
FR3056299B1 (fr) * 2016-09-16 2018-10-19 STMicroelectronics (Alps) SAS Procede de determination de la consommation en courant d'une charge active, par exemple une unite de traitement, et circuit electronique associe
TWI628448B (zh) * 2017-03-07 2018-07-01 慧榮科技股份有限公司 電路測試方法
CN109959818B (zh) * 2017-12-25 2022-02-08 中国电信股份有限公司 电流测试方法、控制器和装置
JP6996420B2 (ja) * 2018-05-25 2022-01-17 三菱電機株式会社 半導体装置の試験方法
WO2020244831A1 (en) * 2019-06-07 2020-12-10 Commsolid Gmbh Method and apparatus for precise power and energy consumption measurements of communication modems
JP2021021580A (ja) * 2019-07-25 2021-02-18 株式会社Ｇｓユアサ 電流計測装置、電流の計測方法、蓄電装置及び抵抗器
JP2021032735A (ja) * 2019-08-26 2021-03-01 日置電機株式会社 検出回路及び測定装置
US11486903B2 (en) 2019-08-28 2022-11-01 Panasonic Intellectual Property Management Co., Ltd. Ventilation device
JP2022167016A (ja) * 2021-04-22 2022-11-04 東京エレクトロン株式会社 デバイス検査装置及びデバイス検査方法
DE102021210139B4 (de) 2021-09-14 2024-05-29 Volkswagen Aktiengesellschaft Messkörper für ein Ermitteln einer Funktionalität eines Bordnetzes eines Fahrzeuges sowie Fahrzeug

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2590068B2 (ja) 1986-07-11 1997-03-12 株式会社日立製作所 自動取引装置
JPH0611510Y2 (ja) * 1986-07-21 1994-03-23 株式会社アドバンテスト 電圧印加電流測定装置
CH677266A5 (zh) 1986-10-28 1991-04-30 Pacific Wietz Gmbh & Co Kg
JPS63190975U (zh) * 1987-05-29 1988-12-08
JP2748321B2 (ja) 1987-11-16 1998-05-06 キヤノン株式会社 画像形成装置
JPH01129667U (zh) * 1988-02-19 1989-09-04
US5428297A (en) * 1993-06-15 1995-06-27 Grace; James W. Precision integrated resistors
JPH10124159A (ja) * 1996-10-18 1998-05-15 Advantest Corp 電圧印加回路

Also Published As

Publication number Publication date
GB9916466D0 (en) 1999-09-15
DE19782254T1 (de) 2000-01-13
US6255842B1 (en) 2001-07-03
GB2336217B (en) 2002-06-19
GB2336217A (en) 1999-10-13
WO1999028756A1 (fr) 1999-06-10
JP3184539B2 (ja) 2001-07-09

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