TW350167B - Flip-flop circuit - Google Patents

Flip-flop circuit

Info

Publication number
TW350167B
TW350167B TW086104103A TW86104103A TW350167B TW 350167 B TW350167 B TW 350167B TW 086104103 A TW086104103 A TW 086104103A TW 86104103 A TW86104103 A TW 86104103A TW 350167 B TW350167 B TW 350167B
Authority
TW
Taiwan
Prior art keywords
latch
circuit
pair
flip
transfer gates
Prior art date
Application number
TW086104103A
Other languages
English (en)
Chinese (zh)
Inventor
Kenji Kasuga
Original Assignee
Fujitsu Ltd
Fujitsu Vlsi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Fujitsu Vlsi Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of TW350167B publication Critical patent/TW350167B/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356104—Bistable circuits using complementary field-effect transistors
    • H03K3/356165—Bistable circuits using complementary field-effect transistors using additional transistors in the feedback circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01—Details
    • H03K3/012—Modifications of generator to improve response time or to decrease power consumption

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Logic Circuits (AREA)
  • Electronic Switches (AREA)
  • Manipulation Of Pulses (AREA)
TW086104103A 1996-06-28 1997-09-27 Flip-flop circuit TW350167B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8169463A JPH1022793A (ja) 1996-06-28 1996-06-28 フリップフロップ回路

Publications (1)

Publication Number Publication Date
TW350167B true TW350167B (en) 1999-01-11

Family

ID=15887044

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086104103A TW350167B (en) 1996-06-28 1997-09-27 Flip-flop circuit

Country Status (3)

Country Link
JP (1) JPH1022793A (ko)
KR (1) KR100251469B1 (ko)
TW (1) TW350167B (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100604852B1 (ko) 2004-05-15 2006-07-31 삼성전자주식회사 제어신호 발생기, 스캔 기능을 수행하는 래치회로, 및상기 펄스 발생기와 상기 래치를 구비하는 플립플롭
JP5889818B2 (ja) * 2013-02-28 2016-03-22 株式会社東芝 半導体集積回路装置

Also Published As

Publication number Publication date
KR100251469B1 (ko) 2000-04-15
JPH1022793A (ja) 1998-01-23
KR980006846A (ko) 1998-03-30

Similar Documents

Publication Publication Date Title
US5162666A (en) Transmission gate series multiplexer
GB9127379D0 (en) An implementation of the ieee 1149.1 boundary-scan architecture
ES2015817A6 (es) Elemento de conmutacion para comunicaciones.
TW357488B (en) Glitch-free clock enable circuit and method for providing a glitch-free clock signal
WO2004023240A3 (en) Event driven dynamic logic for reducing power consumption
SG55046A1 (en) Architecture and interconnect scheme for programmable logic circuits
AU1082099A (en) Method and apparatus for coupling signals between two circuits operating in different clock domains
JPS6084015A (ja) 同期式アツプ／ダウンカウンタ
EP0330971A3 (en) Flip-flop circuit
TW359027B (en) CMOS digital level shift circuit
JPS6490618A (en) High speed continuous approximation register in analog-to-digital converter
KR100253343B1 (ko) 직병렬선택 변환기
EP0313229A3 (en) Vsli chip with ring oscillator
TW350167B (en) Flip-flop circuit
EP0262556A3 (en) A high speed flip-flop latch
JPS55150195A (en) Shift register with latch
KR960701539A (ko) 단일 단자 펄스 게이팅 회로(single-ended pulse gating circuit)
KR910007266A (ko) 클럭 및 제어 신호 발생 회로
EP0224656A3 (en) Cmos technique multistage carry ripple adder with two types of adder cells
DE3881220D1 (de) Kommunikationsvermittlungselement.
KR920017511A (ko) 집적된 스피커폰 회로 및 스피커폰용 직렬 포트 인터페이스
JPS61174857A (ja) 分岐回路
EP0766402A3 (en) Counter circuit
EP0347048A3 (en) A cmos differential driver
JPS5737934A (en) Binary couter circuit

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees