TW342524B - Method of depositing SiH4 oxide by fluoro-doped plasma-enhanced chemical vapor deposition - Google Patents

Method of depositing SiH4 oxide by fluoro-doped plasma-enhanced chemical vapor deposition

Info

Publication number
TW342524B
TW342524B TW085101717A TW85101717A TW342524B TW 342524 B TW342524 B TW 342524B TW 085101717 A TW085101717 A TW 085101717A TW 85101717 A TW85101717 A TW 85101717A TW 342524 B TW342524 B TW 342524B
Authority
TW
Taiwan
Prior art keywords
depositing
fluoro
vapor deposition
chemical vapor
enhanced chemical
Prior art date
Application number
TW085101717A
Other languages
Chinese (zh)
Inventor
Lai-Juh Chern
Original Assignee
Ind Tech Res Inst
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ind Tech Res Inst filed Critical Ind Tech Res Inst
Priority to TW085101717A priority Critical patent/TW342524B/en
Application granted granted Critical
Publication of TW342524B publication Critical patent/TW342524B/en

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Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Formation Of Insulating Films (AREA)

Abstract

A process for producing an integrated circuit, which comprises: producing a semiconductor structure in the interior of, and on a semiconductor substrate; and planarizing the surface of the semiconductor structure; depositing a conductor layer on the surface of the semiconductor structure, and forming a pattern on the conductor layer, in which a pore is formed in the region of the patterned conductor layer; depositing an oxide layer on the patterned conductor layer, in which the oxide layer is doped with fluoro ions by flowing CF4 gas at about 1000 sccm during the deposition of the oxide layer thereby the pore will be filled with the fluoro-doped oxide layer; and completing assembly of the integrated circuit.
TW085101717A 1996-02-08 1996-02-08 Method of depositing SiH4 oxide by fluoro-doped plasma-enhanced chemical vapor deposition TW342524B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW085101717A TW342524B (en) 1996-02-08 1996-02-08 Method of depositing SiH4 oxide by fluoro-doped plasma-enhanced chemical vapor deposition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW085101717A TW342524B (en) 1996-02-08 1996-02-08 Method of depositing SiH4 oxide by fluoro-doped plasma-enhanced chemical vapor deposition

Publications (1)

Publication Number Publication Date
TW342524B true TW342524B (en) 1998-10-11

Family

ID=58263584

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085101717A TW342524B (en) 1996-02-08 1996-02-08 Method of depositing SiH4 oxide by fluoro-doped plasma-enhanced chemical vapor deposition

Country Status (1)

Country Link
TW (1) TW342524B (en)

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees