TW329536B - IC mounting and removing device and its mounting head - Google Patents

IC mounting and removing device and its mounting head

Info

Publication number
TW329536B
TW329536B TW086105784A TW86105784A TW329536B TW 329536 B TW329536 B TW 329536B TW 086105784 A TW086105784 A TW 086105784A TW 86105784 A TW86105784 A TW 86105784A TW 329536 B TW329536 B TW 329536B
Authority
TW
Taiwan
Prior art keywords
mounting
center adjustment
tray
supply part
clearance
Prior art date
Application number
TW086105784A
Other languages
English (en)
Inventor
Isao Arakawa
Yoshinori Hirata
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Application granted granted Critical
Publication of TW329536B publication Critical patent/TW329536B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S29/00—Metal working
    • Y10S29/044—Vacuum
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/53—Means to assemble or disassemble
    • Y10T29/5313—Means to assemble electrical device
    • Y10T29/53174—Means to fasten electrical component to wiring board, base, or substrate
    • Y10T29/53178—Chip component
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/53—Means to assemble or disassemble
    • Y10T29/5313—Means to assemble electrical device
    • Y10T29/53191—Means to apply vacuum directly to position or hold work part
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/53—Means to assemble or disassemble
    • Y10T29/5313—Means to assemble electrical device
    • Y10T29/53265—Means to assemble electrical device with work-holder for assembly

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Manipulator (AREA)
  • Automatic Assembly (AREA)
TW086105784A 1996-12-02 1997-05-01 IC mounting and removing device and its mounting head TW329536B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8321748A JPH10163385A (ja) 1996-12-02 1996-12-02 Ｉｃ着脱装置及びその着脱ヘッド

Publications (1)

Publication Number Publication Date
TW329536B true TW329536B (en) 1998-04-11

Family

ID=18136015

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086105784A TW329536B (en) 1996-12-02 1997-05-01 IC mounting and removing device and its mounting head

Country Status (8)

Country Link
US (1) US5864943A (zh)
JP (1) JPH10163385A (zh)
KR (1) KR100253936B1 (zh)
CN (1) CN1149908C (zh)
DE (1) DE19738151C2 (zh)
MY (1) MY117914A (zh)
SG (1) SG71713A1 (zh)
TW (1) TW329536B (zh)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11163000A (ja) * 1997-12-02 1999-06-18 Mitsubishi Electric Corp リードフレーム移送装置
DE19853184A1 (de) * 1998-11-19 2000-06-08 Steiff Foerdertech Vorrichtung zum Fördern eines Trägerelements
JP4186146B2 (ja) * 1999-10-18 2008-11-26 Ｓｍｃ株式会社 ロボットハンド用ツール取付装置
US6640423B1 (en) * 2000-07-18 2003-11-04 Endwave Corporation Apparatus and method for the placement and bonding of a die on a substrate
JP3960054B2 (ja) * 2002-01-21 2007-08-15 松下電器産業株式会社 電子部品実装装置および電子部品の実装ヘッドユニット
KR100431621B1 (ko) * 2002-05-13 2004-05-20 배일순 브이에프디 피치 유니트 교체형 취부대
US7037805B2 (en) * 2003-05-07 2006-05-02 Honeywell International Inc. Methods and apparatus for attaching a die to a substrate
TW200604060A (en) * 2004-06-11 2006-02-01 Assembleon Nv Component placement apparatus, component feeding apparatus and method
EP1835796B9 (en) * 2004-12-03 2011-02-23 Hallys Corporation Interposer bonding device
US7491567B2 (en) * 2005-11-22 2009-02-17 Honeywell International Inc. MEMS device packaging methods
US20070114643A1 (en) * 2005-11-22 2007-05-24 Honeywell International Inc. Mems flip-chip packaging
KR100898641B1 (ko) * 2007-06-12 2009-05-21 (주)마스터테크 반도체소자용 더블 픽업 실린더
US7880900B2 (en) * 2008-08-19 2011-02-01 Silverbrook Research Pty Ltd Measuring apparatus for performing positional analysis on an integrated circuit carrier
US20100045729A1 (en) * 2008-08-19 2010-02-25 Silverbrook Research Pty Ltd Method for testing alignment of a test bed with a plurality of integrated circuits thereon
US20100044437A1 (en) * 2008-08-19 2010-02-25 Silverbrook Research Pty Ltd Measuring apparatus for a carrier of printhead integrated circuitry
US7845068B2 (en) * 2008-08-19 2010-12-07 Silverbrook Research Pty Ltd Method for assembling a carrier for integrated circuits
US7721420B2 (en) * 2008-08-19 2010-05-25 Silverbrook Research Pty Ltd Assembler for assembling a carrier for printhead integrated circuits
US7924440B2 (en) * 2008-08-19 2011-04-12 Silverbrook Research Pty Ltd Imaging apparatus for imaging integrated circuits on an integrated circuit carrier
JP5751945B2 (ja) * 2011-06-15 2015-07-22 富士機械製造株式会社 マルチロボットシステムおよび電子部品実装機
CN103220900B (zh) * 2013-04-09 2016-10-05 深圳市东旭发自动化有限公司 一种自动贴片机
KR101637524B1 (ko) * 2014-12-26 2016-07-07 주식회사 티에프이 반도체 패키지 흡착 가압 장치
CN105171179B (zh) * 2015-09-23 2018-05-04 深圳市迈特迅科技有限公司 一种波峰焊托盘自动解压扣机
CN109733872B (zh) * 2018-12-06 2020-09-18 苏州永创智能科技有限公司 悬臂式自动烧录机

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61501117A (ja) * 1984-01-23 1986-05-29 ダイナパ−ト　プレシマ　リミテツド 電子部品取扱い用ピックアップヘッド
ES2023372B3 (es) * 1986-02-21 1992-01-16 Sud Finanz S A Dispositivo para embragar herramientas de montaje, tales como una cuchara, o similares.
GB2201941A (en) * 1987-03-13 1988-09-14 Philips Nv Gripping device
DE3737506A1 (de) * 1987-11-05 1989-05-24 Ibm Deutschland Vorrichtung zur bestueckung insbesondere von leiterplatten
US5165165A (en) * 1989-06-02 1992-11-24 Canon Kabushiki Kaisha Part inserting apparatus and method for use
US5342460A (en) * 1989-06-13 1994-08-30 Matsushita Electric Industrial Co., Ltd. Outer lead bonding apparatus
JPH07105637B2 (ja) * 1990-05-31 1995-11-13 三洋電機株式会社 部品装着装置
TW287235B (zh) * 1994-06-30 1996-10-01 Zenshin Test Co

Also Published As

Publication number Publication date
KR19980063357A (ko) 1998-10-07
CN1184331A (zh) 1998-06-10
CN1149908C (zh) 2004-05-12
KR100253936B1 (ko) 2000-04-15
US5864943A (en) 1999-02-02
DE19738151A1 (de) 1998-06-18
DE19738151C2 (de) 2000-07-06
MY117914A (en) 2004-08-30
JPH10163385A (ja) 1998-06-19
SG71713A1 (en) 2000-04-18

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