TW326077B - Predictive waveform acquisition method and apparatus - Google Patents

Predictive waveform acquisition method and apparatus

Info

Publication number
TW326077B
TW326077B TW085106912A TW85106912A TW326077B TW 326077 B TW326077 B TW 326077B TW 085106912 A TW085106912 A TW 085106912A TW 85106912 A TW85106912 A TW 85106912A TW 326077 B TW326077 B TW 326077B
Authority
TW
Taiwan
Prior art keywords
voltage
filter
node
applying
specified delay
Prior art date
Application number
TW085106912A
Other languages
English (en)
Inventor
N Rajan Suresh
Kenichi Kanei
Original Assignee
Schlumberger Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schlumberger Technologies Inc filed Critical Schlumberger Technologies Inc
Application granted granted Critical
Publication of TW326077B publication Critical patent/TW326077B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW085106912A 1995-06-08 1996-06-08 Predictive waveform acquisition method and apparatus TW326077B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/488,650 US5638005A (en) 1995-06-08 1995-06-08 Predictive waveform acquisition

Publications (1)

Publication Number Publication Date
TW326077B true TW326077B (en) 1998-02-01

Family

ID=23940562

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085106912A TW326077B (en) 1995-06-08 1996-06-08 Predictive waveform acquisition method and apparatus

Country Status (4)

Country Link
US (1) US5638005A (zh)
EP (1) EP0747716A3 (zh)
JP (1) JPH0926464A (zh)
TW (1) TW326077B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106842537A (zh) * 2015-10-05 2017-06-13 Fei公司 用于超大规模集成电路设备的经优化的波长光子发射显微镜

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US5959458A (en) * 1996-11-08 1999-09-28 Schlumberger Technologies, Inc. Method and apparatus for measuring electrical waveforms using atomic force microscopy
TW330322B (en) * 1997-08-20 1998-04-21 Winbond Electronics Corp The method for determining the voltage sampling of ring oscillator frequency
US6359451B1 (en) 2000-02-11 2002-03-19 Image Graphics Incorporated System for contactless testing of printed circuit boards
WO2001058558A2 (en) 2000-02-14 2001-08-16 Eco 3 Max Inc. Process for removing volatile organic compounds from an air stream and apparatus therefor
CN100394207C (zh) 2001-04-30 2008-06-11 诚信系统公司 用于波形采集的开环
US6737853B2 (en) * 2001-10-18 2004-05-18 Nptest, Llc Photoconductive-sampling voltage measurement
JP3633545B2 (ja) 2001-11-07 2005-03-30 セイコーエプソン株式会社 電子ビームテストシステム及び電子ビームテスト方法
US6833716B1 (en) * 2002-03-29 2004-12-21 Advanced Micro Devices, Inc. Electro-optical analysis of integrated circuits
DE602004022878D1 (de) 2004-07-07 2009-10-08 Verigy Pte Ltd Singapore Auswertung eines ausgangssignals eines gerade geprüften bausteins
US7289921B1 (en) * 2005-05-26 2007-10-30 National Semiconductor Corporation System and method for providing an improved voltage monitor for an adjustable supply voltage in adaptive voltage scaling
AU2007225135B2 (en) * 2006-03-14 2011-08-11 Cardiomems, Inc. Communicating with an implanted wireless sensor
KR100883500B1 (ko) * 2007-01-05 2009-02-16 베리지 (싱가포르) 피티이. 엘티디. 피검사 장치의 출력 신호 평가 방법 및 시스템과, 컴퓨터 판독가능 저장 매체
US7921312B1 (en) 2007-09-14 2011-04-05 National Semiconductor Corporation System and method for providing adaptive voltage scaling with multiple clock domains inside a single voltage domain
WO2010054669A1 (en) 2008-11-11 2010-05-20 Verigy (Singapore) Pte.Ltd. Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment
US8615373B2 (en) * 2011-01-06 2013-12-24 International Business Machines Corporation Voltage driver for a voltage-driven intelligent characterization bench for semiconductor
US9043179B2 (en) 2011-01-06 2015-05-26 International Business Machines Corporation Voltage-driven intelligent characterization bench for semiconductor
JP5979955B2 (ja) * 2012-04-20 2016-08-31 ルネサスエレクトロニクス株式会社 半導体集積回路装置、電源装置及び電源装置の制御方法
JP7042071B2 (ja) 2016-12-20 2022-03-25 エフ・イ－・アイ・カンパニー ｅビーム操作用の局部的に排気された容積を用いる集積回路解析システムおよび方法
US10809346B2 (en) * 2017-06-30 2020-10-20 Rohm Co., Ltd. Semiconductor device, ultrasonic sensor, and moving body
EP3968035A1 (en) * 2020-09-11 2022-03-16 ASML Netherlands B.V. Delay time measurement method and system
WO2023217355A1 (en) * 2022-05-10 2023-11-16 Applied Materials, Inc. Methods and apparatuses for identifying defective electrical connections of a substrate

Family Cites Families (8)

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Publication number Priority date Publication date Assignee Title
JPS607049A (ja) * 1983-06-24 1985-01-14 Hitachi Ltd 電位測定装置
DE3428965A1 (de) * 1984-08-06 1986-02-06 Siemens AG, 1000 Berlin und 8000 München Verfahren und vorrichtung zur detektion und abbildung von messpunkten, die einen bestimmten signalverlauf aufweisen
EP0226913A3 (de) * 1985-12-17 1988-10-05 Siemens Aktiengesellschaft Verfahren und Anordnung zur Lokalisierung und/oder Abbildung der ein bestimmtes zeitabhängiges Signal führenden Punkte einer Probe
JPH065691B2 (ja) * 1987-09-26 1994-01-19 株式会社東芝 半導体素子の試験方法および試験装置
US5144225A (en) * 1989-03-31 1992-09-01 Schlumberger Technologies, Inc. Methods and apparatus for acquiring data from intermittently failing circuits
JPH03101041A (ja) * 1989-09-14 1991-04-25 Hitachi Ltd 電子ビームによる電圧測定装置
DE3941178A1 (de) * 1989-12-13 1991-06-20 Siemens Ag Verfahren zur quantitativen potentialmessung mit einer korpuskularsonde
US5210487A (en) * 1991-06-04 1993-05-11 Schlumberger Technologies Inc. Double-gated integrating scheme for electron beam tester

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106842537A (zh) * 2015-10-05 2017-06-13 Fei公司 用于超大规模集成电路设备的经优化的波长光子发射显微镜

Also Published As

Publication number Publication date
US5638005A (en) 1997-06-10
JPH0926464A (ja) 1997-01-28
EP0747716A3 (en) 1997-09-24
EP0747716A2 (en) 1996-12-11

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