DE602004022878D1 - Auswertung eines ausgangssignals eines gerade geprüften bausteins - Google Patents

Auswertung eines ausgangssignals eines gerade geprüften bausteins

Info

Publication number
DE602004022878D1
DE602004022878D1 DE602004022878T DE602004022878T DE602004022878D1 DE 602004022878 D1 DE602004022878 D1 DE 602004022878D1 DE 602004022878 T DE602004022878 T DE 602004022878T DE 602004022878 T DE602004022878 T DE 602004022878T DE 602004022878 D1 DE602004022878 D1 DE 602004022878D1
Authority
DE
Germany
Prior art keywords
output signal
signal
device under
under test
evaluation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004022878T
Other languages
English (en)
Inventor
J Rivoir
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Verigy Singapore Pte Ltd
Original Assignee
Verigy Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Verigy Singapore Pte Ltd filed Critical Verigy Singapore Pte Ltd
Publication of DE602004022878D1 publication Critical patent/DE602004022878D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31932—Comparators

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
DE602004022878T 2004-07-07 2004-07-07 Auswertung eines ausgangssignals eines gerade geprüften bausteins Expired - Lifetime DE602004022878D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2004/051401 WO2006002693A1 (en) 2004-07-07 2004-07-07 Evaluation of an output signal of a device under test

Publications (1)

Publication Number Publication Date
DE602004022878D1 true DE602004022878D1 (de) 2009-10-08

Family

ID=34957999

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004022878T Expired - Lifetime DE602004022878D1 (de) 2004-07-07 2004-07-07 Auswertung eines ausgangssignals eines gerade geprüften bausteins

Country Status (7)

Country Link
US (1) US8378707B2 (de)
EP (1) EP1763678B1 (de)
JP (1) JP2008505329A (de)
CN (1) CN1985182B (de)
AT (1) ATE441120T1 (de)
DE (1) DE602004022878D1 (de)
WO (1) WO2006002693A1 (de)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8838406B2 (en) 2008-11-11 2014-09-16 Advantest (Singapore) Pte Ltd Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment
US8825446B2 (en) * 2010-12-23 2014-09-02 Texas Instruments Incorporated Independently based diagnostic monitoring
US9470753B2 (en) 2012-11-07 2016-10-18 Cascade Microtech, Inc. Systems and methods for testing electronic devices that include low power output drivers
DE102013209309A1 (de) * 2013-05-21 2014-11-27 Zf Friedrichshafen Ag Verfahren und Schaltung zur Bewertung pulsweitenmodulierter Signale
BR102014031426B1 (pt) 2014-12-15 2018-07-24 Jjgc Ind E Comercio De Materiais Dentarios S/A implante
US11092656B2 (en) * 2015-05-12 2021-08-17 Texas Instruments Incorporated Fluxgate magnetic field detection method and circuit
CN106896309B (zh) * 2015-12-17 2019-08-06 上海和辉光电有限公司 信号处理装置及方法、信号偏移检测系统及方法
US10002650B1 (en) * 2016-12-21 2018-06-19 Mediatek Inc. Signal quality detection circuit for generating signal quality detection result according to two-dimensional nominal sampling point pattern and associated signal quality detection method
EP3508865B1 (de) * 2018-01-08 2022-07-20 Delta Electronics (Thailand) Public Co., Ltd. Verfahren zur schätzung einer signaleigenschaft
US11032725B1 (en) * 2020-03-18 2021-06-08 Litepoint Corporation System and method for testing data packet signal transceivers with a tester using externally initiated and self-terminating test control sequences
CN112462257B (zh) * 2020-11-06 2021-12-10 珠海格力电器股份有限公司 电机端电压检测方法、装置、电路及空调系统

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US4001818A (en) * 1975-10-22 1977-01-04 Storage Technology Corporation Digital circuit failure detector
JPS607049A (ja) * 1983-06-24 1985-01-14 Hitachi Ltd 電位測定装置
US4641246A (en) * 1983-10-20 1987-02-03 Burr-Brown Corporation Sampling waveform digitizer for dynamic testing of high speed data conversion components
JPS6149561A (ja) * 1984-08-17 1986-03-11 Hitachi Ltd Ａ／ｄ変換器装置
DE69100204T2 (de) * 1991-11-11 1994-01-13 Hewlett Packard Gmbh Einrichtung zur Erzeugung von Testsignalen.
DE4305442C2 (de) * 1993-02-23 1999-08-05 Hewlett Packard Gmbh Verfahren und Vorrichtung zum Erzeugen eines Testvektors
US5638005A (en) * 1995-06-08 1997-06-10 Schlumberger Technologies Inc. Predictive waveform acquisition
JP3331109B2 (ja) * 1996-01-23 2002-10-07 株式会社アドバンテスト 半導体試験装置の比較器
DE69700149T2 (de) 1997-05-22 1999-07-01 Hewlett-Packard Co., Palo Alto, Calif. Dekompressionsschaltkreis
DE69700660T2 (de) 1997-05-30 2000-02-10 Hewlett-Packard Co., Palo Alto Mehrkanalanordnung mit einem unabhängigen Taktsignal pro Kanal
EP0864977B1 (de) 1997-09-13 1999-07-14 Hewlett-Packard Company Ausgleich von Latenzzeit in einem Speicher
DE69700327T2 (de) 1997-09-13 1999-11-04 Hewlett-Packard Co., Palo Alto Optimierte Speicherorganisation in einer Mehrkanalcomputerarchitektur
JP2001021609A (ja) * 1999-07-07 2001-01-26 Mitsubishi Electric Corp 半導体集積回路の検査方法
EP1127602A3 (de) * 2000-02-17 2001-12-19 Stanadyne Automotive Corp. Mehrfach konfigurierbarer Sockel für Kartuschenfilter und dessen Herstellungsverfahren
US6445208B1 (en) * 2000-04-06 2002-09-03 Advantest Corp. Power source current measurement unit for semiconductor test system
DE60001254T2 (de) 2000-06-16 2003-07-10 Agilent Technologies, Inc. (N.D.Ges.D.Staates Delaware) Testgerät für integrierte Schaltungen mit Multiportprüffunktionalität
JP4416310B2 (ja) * 2000-11-20 2010-02-17 株式会社アドバンテスト 電子デバイスの試験装置
JP2002250754A (ja) * 2001-02-26 2002-09-06 Yokogawa Electric Corp 半導体テスト装置
US6700401B2 (en) * 2001-02-28 2004-03-02 Advanced Micro Devices, Inc. Reduced noise line drivers and method of operation
JP2002296329A (ja) * 2001-03-30 2002-10-09 Agilent Technologies Japan Ltd 集積回路の試験装置
JP3594136B2 (ja) * 2001-11-15 2004-11-24 横河電機株式会社 Ｉｃテスタ及びｄｕｔカード
JP2003240821A (ja) * 2002-02-14 2003-08-27 Yokogawa Electric Corp Ｉｃテスタ
TWI260415B (en) * 2004-03-31 2006-08-21 Nanya Technology Corp Apparatus and method for testing semiconductor device
US7652494B2 (en) * 2005-07-01 2010-01-26 Apple Inc. Operating an integrated circuit at a minimum supply voltage
US7394277B2 (en) * 2006-04-20 2008-07-01 Advantest Corporation Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method
US8269520B2 (en) * 2009-10-08 2012-09-18 Teradyne, Inc. Using pattern generators to control flow of data to and from a semiconductor device under test

Also Published As

Publication number Publication date
WO2006002693A1 (en) 2006-01-12
US20070150224A1 (en) 2007-06-28
EP1763678A1 (de) 2007-03-21
ATE441120T1 (de) 2009-09-15
JP2008505329A (ja) 2008-02-21
CN1985182A (zh) 2007-06-20
EP1763678B1 (de) 2009-08-26
US8378707B2 (en) 2013-02-19
CN1985182B (zh) 2012-01-11

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