TW322661B - - Google Patents

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Publication number
TW322661B
TW322661B TW085111418A TW85111418A TW322661B TW 322661 B TW322661 B TW 322661B TW 085111418 A TW085111418 A TW 085111418A TW 85111418 A TW85111418 A TW 85111418A TW 322661 B TW322661 B TW 322661B
Authority
TW
Taiwan
Prior art keywords
buffer
latch
gate
input
slave
Prior art date
Application number
TW085111418A
Other languages
English (en)
Chinese (zh)
Original Assignee
Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronics Nv filed Critical Philips Electronics Nv
Application granted granted Critical
Publication of TW322661B publication Critical patent/TW322661B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits
    • H03K3/0372—Bistable circuits of the primary-secondary type

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Logic Circuits (AREA)
TW085111418A 1995-08-14 1996-09-18 TW322661B (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP95202203 1995-08-14

Publications (1)

Publication Number Publication Date
TW322661B true TW322661B (enExample) 1997-12-11

Family

ID=8220566

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085111418A TW322661B (enExample) 1995-08-14 1996-09-18

Country Status (4)

Country Link
US (1) US5831463A (enExample)
EP (1) EP0786170A1 (enExample)
TW (1) TW322661B (enExample)
WO (1) WO1997007592A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3797778B2 (ja) * 1998-01-19 2006-07-19 東芝マイクロエレクトロニクス株式会社 データ伝送回路
US20020000858A1 (en) * 1999-10-14 2002-01-03 Shih-Lien L. Lu Flip-flop circuit
US6326829B1 (en) * 1999-10-14 2001-12-04 Hewlett-Packard Company Pulse latch with explicit, logic-enabled one-shot
US6417711B2 (en) 1999-10-19 2002-07-09 Honeywell Inc. High speed latch and flip-flop
US6563356B2 (en) 1999-10-19 2003-05-13 Honeywell International Inc. Flip-flop with transmission gate in master latch
JP2001285034A (ja) * 2000-03-29 2001-10-12 Ando Electric Co Ltd Ｄ−ｆｆ回路
US6275083B1 (en) * 2000-09-05 2001-08-14 Agilent Technologies, Inc. Low operational power, low leakage power D-type flip-flop
US20070147572A1 (en) * 2005-12-28 2007-06-28 Intel Corporation Registers for an enhanced idle architectural state
US8067970B2 (en) * 2006-03-31 2011-11-29 Masleid Robert P Multi-write memory circuit with a data input and a clock input
US8427214B2 (en) 2010-06-03 2013-04-23 Arm Limited Clock state independent retention master-slave flip-flop
US9013219B2 (en) * 2013-09-11 2015-04-21 The Boeing Company Filtered radiation hardened flip flop with reduced power consumption

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4495628A (en) * 1982-06-17 1985-01-22 Storage Technology Partners CMOS LSI and VLSI chips having internal delay testing capability
US4656368A (en) * 1985-09-13 1987-04-07 Ncr Corporation High speed master-slave flip-flop
JP2621993B2 (ja) * 1989-09-05 1997-06-18 株式会社東芝 フリップフロップ回路
JPH04263510A (ja) * 1991-02-18 1992-09-18 Nec Corp フリップフロップ回路
TW222725B (en) * 1993-07-09 1994-04-21 Philips Electronics Nv Testing sequential logic circuit upon changing into combinatorial logic circuit
JPH07183771A (ja) * 1993-12-22 1995-07-21 Fujitsu Ltd フリップフロップ回路
US5459421A (en) * 1994-03-31 1995-10-17 Intel Corporation Dynamic-static master slave flip-flop circuit
US5612632A (en) * 1994-11-29 1997-03-18 Texas Instruments Incorporated High speed flip-flop for gate array

Also Published As

Publication number Publication date
US5831463A (en) 1998-11-03
EP0786170A1 (en) 1997-07-30
WO1997007592A1 (en) 1997-02-27

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Legal Events

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MK4A Expiration of patent term of an invention patent