TW202518579A - 蝕刻液、蝕刻方法及半導體裝置之製造方法 - Google Patents

蝕刻液、蝕刻方法及半導體裝置之製造方法 Download PDF

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Publication number
TW202518579A
TW202518579A TW113124278A TW113124278A TW202518579A TW 202518579 A TW202518579 A TW 202518579A TW 113124278 A TW113124278 A TW 113124278A TW 113124278 A TW113124278 A TW 113124278A TW 202518579 A TW202518579 A TW 202518579A
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TW
Taiwan
Prior art keywords
etching solution
etching
silicon
mass
compound
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Application number
TW113124278A
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English (en)
Chinese (zh)
Inventor
安龍杰
笠井鉄夫
白江宏之
Original Assignee
日商三菱化學股份有限公司
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Application filed by 日商三菱化學股份有限公司 filed Critical 日商三菱化學股份有限公司
Publication of TW202518579A publication Critical patent/TW202518579A/zh

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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00Etching, surface-brightening or pickling compositions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/01Manufacture or treatment
    • H10D30/019Manufacture or treatment of FETs having stacked nanowire, nanosheet or nanoribbon channels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/01Manufacture or treatment
    • H10D30/021Manufacture or treatment of FETs having insulated gates [IGFET]
    • H10D30/025Manufacture or treatment of FETs having insulated gates [IGFET] of vertical IGFETs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • H10P50/60Wet etching
    • H10P50/64Wet etching of semiconductor materials
    • H10P50/642Chemical etching
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • H10P50/69Etching of wafers, substrates or parts of devices using masks for semiconductor materials
    • H10P50/691Etching of wafers, substrates or parts of devices using masks for semiconductor materials for Group V materials or Group III-V materials

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Weting (AREA)
TW113124278A 2023-06-28 2024-06-28 蝕刻液、蝕刻方法及半導體裝置之製造方法 TW202518579A (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2023-105664 2023-06-28
JP2023105664 2023-06-28
JP2023-105663 2023-06-28
JP2023105663 2023-06-28

Publications (1)

Publication Number Publication Date
TW202518579A true TW202518579A (zh) 2025-05-01

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ID=93939240

Family Applications (1)

Application Number Title Priority Date Filing Date
TW113124278A TW202518579A (zh) 2023-06-28 2024-06-28 蝕刻液、蝕刻方法及半導體裝置之製造方法

Country Status (4)

Country Link
JP (1) JPWO2025005206A1 (https=)
KR (1) KR20260027162A (https=)
TW (1) TW202518579A (https=)
WO (1) WO2025005206A1 (https=)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4975430B2 (ja) * 2006-12-28 2012-07-11 関東化学株式会社 異方性エッチング液およびそれを用いたエッチング方法
JP5244030B2 (ja) * 2009-06-01 2013-07-24 パナソニック株式会社 シリコン異方性エッチング方法及びシリコン異方性エッチング液
JP5455461B2 (ja) * 2009-06-17 2014-03-26 キヤノン株式会社 シリコン基板の加工方法及び液体吐出ヘッド用基板の製造方法
JP2021012940A (ja) * 2019-07-05 2021-02-04 株式会社デンソー 半導体装置の製造方法
JP2021136429A (ja) * 2020-02-27 2021-09-13 株式会社トクヤマ シリコンエッチング液、該エッチング液を用いたシリコンデバイスの製造方法および基板処理方法
US11508828B2 (en) * 2020-07-06 2022-11-22 Applied Materials, Inc. Selective silicon etch for gate all around transistors
JP7765206B2 (ja) * 2021-06-24 2025-11-06 花王株式会社 シリコン用エッチング液

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Publication number Publication date
JPWO2025005206A1 (https=) 2025-01-02
KR20260027162A (ko) 2026-02-27
WO2025005206A1 (ja) 2025-01-02

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