TW202321707A - Device and method for detecting the wear rate of a probe - Google Patents

Device and method for detecting the wear rate of a probe Download PDF

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TW202321707A
TW202321707A TW110142882A TW110142882A TW202321707A TW 202321707 A TW202321707 A TW 202321707A TW 110142882 A TW110142882 A TW 110142882A TW 110142882 A TW110142882 A TW 110142882A TW 202321707 A TW202321707 A TW 202321707A
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probe
wear rate
head
image capture
detecting
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TW110142882A
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TWI807490B (en
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江國棟
李育珊
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洛克半導體材料股份有限公司
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A device and method for detecting the wear rate of a probe are provided. The method for detecting the wear rate of the probe includes a light-emitting element is used to emit light toward a head of at least one probe, and the light is reflected by the head and received by the image capturing element. A lens of the image capturing element is used for aligning and positioning the head so that a plurality of tip portions of the head fall within a predetermined detection range of the image capturing element. The image capturing element is used to capture an initial image of the head, and the image capturing element transmits the initial image to the control module. The control module is used for standardizing the initial image to obtain a processed image, and the processed image shows a plurality of tip portions. The control module is used to calculate the ratio of the area of each tip portion to the area of the predetermined detection range to obtain the wear rate of each tip portion.

Description

偵測探針磨耗率的裝置與方法Device and method for detecting probe wear rate

本發明涉及一種偵測探針磨耗率的裝置與方法,特別是涉及一種偵測尖頭型探針的磨耗率的裝置與方法。The invention relates to a device and a method for detecting the wear rate of a probe, in particular to a device and a method for detecting the wear rate of a pointed probe.

目前,在半導體封裝製程中,在封裝前會先以探針卡(Probe card)對晶粒(Die)進行電性測試。探針卡上具有多支探針,在測試過程中,是將測試用的電訊號,經由探針卡的其中一些探針傳輸入金屬黏著墊(Bond pad),再流入晶粒內,經過運算後的結果再由針卡的另外一些針腳輸出。測試機台能夠藉由這些輸出的電訊號來判斷晶粒是否正常工作,或是在當晶片封裝製程完成後要進行晶片性能測試時確認封裝良率。At present, in the semiconductor packaging process, before packaging, a probe card (Probe card) is used to conduct an electrical test on the die (Die). There are multiple probes on the probe card. During the test, the electrical signal for testing is transmitted to the metal bonding pad (Bond pad) through some of the probes of the probe card, and then flows into the die. The final result is then output by other pins of the needle card. The testing machine can use these output electrical signals to determine whether the chip is working normally, or to confirm the packaging yield when the chip performance test is performed after the chip packaging process is completed.

然而,在測試過程中,每一根探針需要與晶片的金屬腳位接觸數萬次,因此探針的頭部(或稱探針的頭部)長久之後會有磨損而產生鈍化,進而導致測試機台的判讀錯誤。現有技術中,主要是以人工目測的方式來對探針的摩損程度進行觀察以及判斷是否需進行更換。這樣的方式不但耗時且判斷標準也常不一致。因此,現有技術仍然具有可改善空間。However, during the testing process, each probe needs to be in contact with the metal pins of the wafer tens of thousands of times, so the head of the probe (or the head of the probe) will be worn and passivated after a long time, which will lead to The interpretation error of the test machine. In the prior art, the degree of wear of the probe is mainly observed by manual visual inspection and whether it needs to be replaced is judged. Such an approach is not only time-consuming but also often inconsistent in judgment criteria. Therefore, the prior art still has room for improvement.

本發明所要解決的技術問題在於,針對現有技術的不足提供一種偵測探針磨耗率的裝置與方法。The technical problem to be solved by the present invention is to provide a device and method for detecting the wear rate of the probe in view of the deficiencies in the prior art.

為了解決上述的技術問題,本發明所採用的其中一技術方案是提供一種偵測探針磨耗率的裝置,其包括一測試平台、一影像擷取元件、以及一控制模組。測試平台具有一承載座,承載座用以承載至少一探針,至少一探針具有一頭部,頭部包括多個針尖部位。影像擷取元件設置在測試平台上,影像擷取元件透過測試平台進行三維移動,影像擷取元件具有一鏡頭與一發光元件,鏡頭用以對準頭部並且進行定位,以使多個針尖部位落入影像擷取元件的一預定偵測範圍內。發光元件用以朝向頭部發出光線。控制模組電性連接於測試平台與影像擷取元件。光線經過頭部的反射而被影像擷取元件接收,影像擷取元件用以擷取到頭部的一初始影像,影像擷取元件將初始影像傳輸至控制模組,控制模組用以對初始影像進行標準化處理以獲得一處理後影像,處理後影像顯示出多個針尖部位,控制模組用於計算出每一針尖部位的面積占預定偵測範圍的面積的比例,以獲得每一針尖部位的磨耗率。In order to solve the above technical problems, one of the technical solutions adopted by the present invention is to provide a device for detecting the wear rate of probes, which includes a test platform, an image capture device, and a control module. The test platform has a bearing base for bearing at least one probe, and the at least one probe has a head, and the head includes a plurality of needle points. The image capture element is set on the test platform, and the image capture element moves three-dimensionally through the test platform. The image capture element has a lens and a light-emitting element. The lens is used to align the head and position it so that multiple needlepoints falling within a predetermined detection range of the image capture device. The light emitting element is used for emitting light toward the head. The control module is electrically connected to the test platform and the image capture device. The light is reflected by the head and received by the image capture unit, the image capture unit is used to capture an initial image of the head, the image capture unit transmits the initial image to the control module, and the control module is used to control the initial The image is standardized to obtain a processed image. The processed image shows multiple needle tip locations. The control module is used to calculate the ratio of the area of each needle tip location to the area of the predetermined detection range, so as to obtain each needle tip location wear rate.

為了解決上述的技術問題,本發明所採用的另外一技術方案是提供一種偵測探針磨耗率的方法,其應用於一偵測探針磨耗率的裝置,偵測探針磨耗率的裝置包括一測試平台、一具有一鏡頭與一發光元件的影像擷取元件以及一電性連接於測試平台與影像擷取元件的控制模組,影像擷取元件設置在測試平台上,偵測探針磨耗率的方法包括以下步驟: 發光元件用於朝向至少一探針的一頭部發出光線,光線經過頭部的反射而被影像擷取元件接收;鏡頭用以對準頭部並且進行定位,以使頭部的多個針尖部位落入影像擷取元件的一預定偵測範圍內;影像擷取元件用以擷取到頭部的一初始影像,影像擷取元件將初始影像傳輸至控制模組;控制模組用以對初始影像進行標準化處理以獲得一處理後影像,處理後影像顯示出多個針尖部位;以及控制模組用於計算出每一針尖部位的面積占預定偵測範圍的面積的比例,以獲得每一針尖部位的磨耗率。In order to solve the above-mentioned technical problems, another technical solution adopted by the present invention is to provide a method for detecting the wear rate of the probe, which is applied to a device for detecting the wear rate of the probe, and the device for detecting the wear rate of the probe includes A test platform, an image capture element with a lens and a light-emitting element, and a control module electrically connected to the test platform and the image capture element, the image capture element is set on the test platform to detect probe wear The high-efficiency method includes the following steps: the light-emitting element is used to emit light toward a head of at least one probe, and the light is reflected by the head and received by the image-capturing element; the lens is used to align the head and position it so that Multiple needle tip parts of the head fall within a predetermined detection range of the image capture element; the image capture element is used to capture an initial image of the head, and the image capture element transmits the initial image to the control module; The control module is used to standardize the initial image to obtain a processed image, and the processed image shows multiple needle tip locations; and the control module is used to calculate the ratio of the area of each needle tip location to the predetermined detection range scale to obtain the wear rate for each tip site.

本發明的其中一有益效果在於,本發明所提供的偵測探針磨耗率的裝置與方法,其能通過“光線經過頭部的反射而被影像擷取元件接收,影像擷取元件用以擷取到頭部的一初始影像,影像擷取元件將初始影像傳輸至控制模組,控制模組用以對初始影像進行標準化處理以獲得一處理後影像,處理後影像顯示出多個針尖部位,控制模組用於計算出每一針尖部位的面積占預定偵測範圍的面積的比例,以獲得每一針尖部位的磨耗率”的技術方案,以提升探針磨損程度的判斷一致性,以提高檢測品質,並且還能提升檢測效率。One of the beneficial effects of the present invention is that the device and method for detecting the wear rate of the probe provided by the present invention can be received by the image capture element through "the light is reflected by the head, and the image capture element is used to capture An initial image of the head is acquired, and the image capture unit transmits the initial image to the control module, and the control module is used to standardize the initial image to obtain a processed image. The processed image shows a plurality of needle tip locations, The control module is used to calculate the ratio of the area of each needle point to the area of the predetermined detection range, so as to obtain the technical solution of the wear rate of each needle point, so as to improve the judgment consistency of the wear degree of the probe and improve the Improve detection quality and improve detection efficiency.

為使能更進一步瞭解本發明的特徵及技術內容,請參閱以下有關本發明的詳細說明與圖式,然而所提供的圖式僅用於提供參考與說明,並非用來對本發明加以限制。In order to further understand the features and technical content of the present invention, please refer to the following detailed description and drawings related to the present invention. However, the provided drawings are only for reference and description, and are not intended to limit the present invention.

以下是通過特定的具體實施例來說明本發明所公開有關“偵測探針磨耗率的裝置與方法”的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本發明的優點與效果。本發明可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不背離本發明的構思下進行各種修改與變更。另外,本發明的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本發明的相關技術內容,但所公開的內容並非用以限制本發明的保護範圍。另外,應當可以理解的是,雖然本文中可能會使用到“第一”、“第二”、“第三”等術語來描述各種元件,但這些元件不應受這些術語的限制。這些術語主要是用以區分一元件與另一元件。另外,本文中所使用的術語“或”,應視實際情況可能包括相關聯的列出項目中的任一個或者多個的組合。另外,本文中所使用的術語“或”,應視實際情況可能包括相關聯的列出項目中的任一個或者多個的組合。The following are specific examples to illustrate the implementation of the "apparatus and method for detecting probe wear rate" disclosed in the present invention. Those skilled in the art can understand the advantages and effects of the present invention from the content disclosed in this specification. The present invention can be implemented or applied through other different specific embodiments, and various modifications and changes can be made to the details in this specification based on different viewpoints and applications without departing from the concept of the present invention. In addition, the drawings of the present invention are only for simple illustration, and are not drawn according to the actual size, which is stated in advance. The following embodiments will further describe the relevant technical content of the present invention in detail, but the disclosed content is not intended to limit the protection scope of the present invention. In addition, it should be understood that although terms such as "first", "second", and "third" may be used herein to describe various elements, these elements should not be limited by these terms. These terms are mainly used to distinguish one element from another. In addition, the term "or" used herein may include any one or a combination of more of the associated listed items depending on the actual situation. In addition, the term "or" used herein may include any one or a combination of more of the associated listed items depending on the actual situation.

[實施例][Example]

參閱圖1所示,圖1為本發明的偵測探針磨耗率的裝置的立體示意圖。本發明提供一種偵測探針磨耗率的裝置M,其包括一測試平台1與一影像擷取元件2 。測試平台1具有一承載座1以及設置在承載座11上的移動軸12。影像擷取元件2設置在測試平台1的移動軸12上。舉例來說,測試平台1是依據一直角坐標系(如圖1的XYZ坐標軸)而設計出的三維移動平台,移動軸12可依據直角坐標系進行移動。藉此,影像擷取元件2能夠透過測試平台1的移動軸12進行三維移動。另外,舉例來說,移動軸12也可以是依據一圓坐標系或是圓柱坐標系而設計出的三維移動平台,本發明不以測試平台1的形式為限制。承載座11主要用以承載一針座4,針座4上有多個置針孔41,每一置針孔41可供插入一探針N,並且使得探針N的頭部N1朝向影像擷取元件2。Referring to FIG. 1 , FIG. 1 is a three-dimensional schematic diagram of a device for detecting the wear rate of a probe according to the present invention. The present invention provides a device M for detecting the wear rate of a probe, which includes a test platform 1 and an image capture device 2 . The test platform 1 has a bearing base 1 and a moving shaft 12 disposed on the bearing base 11 . The image capture device 2 is arranged on the moving shaft 12 of the test platform 1 . For example, the test platform 1 is a three-dimensional mobile platform designed according to a rectangular coordinate system (such as XYZ coordinate axes in FIG. 1 ), and the moving axis 12 can move according to the rectangular coordinate system. Thereby, the image capture device 2 can move three-dimensionally through the moving shaft 12 of the testing platform 1 . In addition, for example, the moving axis 12 may also be a three-dimensional moving platform designed according to a circular coordinate system or a cylindrical coordinate system, and the present invention is not limited to the form of the testing platform 1 . The bearing base 11 is mainly used to carry a needle base 4, and there are a plurality of pinholes 41 on the needle base 4, and each pinhole 41 can be used for inserting a probe N, and makes the head N1 of the probe N face the image capture Take element 2.

參閱圖2所示,圖2為本發明的偵測探針的示意圖。影像擷取元件2具有一鏡頭21與一發光元件22,鏡頭21用以對準探針N的頭部N1並且進行定位,以使頭部N1上的多個針尖部位落入影像擷取元件2的一預定偵測範圍內。發光元件22朝向探針N的頭部N1發出光線,須說明的是,圖2中的發光元件22僅作為示意說明,並非用以限定發光元件22的具體位置。舉例來說,發光元件22可以設置在鏡頭21上,也可以作為一獨立的單一元件設置在鏡頭21的鄰近位置。另外,舉例來說,發光元件22能夠位於探針N的頭部N1的正上方或斜上方,本發明不以為限。此外,偵測探針磨耗率的裝置M除了包括測試平台1與影像擷取元件2,還包括一控制模組3。控制模組3電性連接於測試平台1與影像擷取元件2,使得控制模組3與測試平台1及影像擷取元件2之間能夠進行訊號傳輸。Referring to FIG. 2 , FIG. 2 is a schematic diagram of the detection probe of the present invention. The image capture device 2 has a lens 21 and a light emitting device 22. The lens 21 is used to align the head N1 of the probe N and position it so that a plurality of needle points on the head N1 fall into the image capture device 2 within a predetermined detection range. The light emitting element 22 emits light toward the head N1 of the probe N. It should be noted that the light emitting element 22 in FIG. For example, the light emitting element 22 can be arranged on the lens 21 , or can be arranged as an independent single element near the lens 21 . In addition, for example, the light emitting element 22 can be located directly above or obliquely above the head N1 of the probe N, and the present invention is not limited thereto. In addition, the device M for detecting the wear rate of the probe includes not only the test platform 1 and the image capture device 2 , but also a control module 3 . The control module 3 is electrically connected to the test platform 1 and the image capture device 2 , so that signal transmission can be performed between the control module 3 and the test platform 1 and the image capture device 2 .

參閱圖1、圖2與圖4所示,圖4為本發明的偵測探針磨耗率的方法的步驟S101至S106的示意圖。本發明提供一種偵測探針磨耗率的方法,其應用於本發明所提供的偵測探針磨耗率的裝置M。所述方法包括至少以下步驟:Referring to FIG. 1 , FIG. 2 and FIG. 4 , FIG. 4 is a schematic diagram of steps S101 to S106 of the method for detecting probe wear rate of the present invention. The present invention provides a method for detecting the wear rate of a probe, which is applied to the device M for detecting the wear rate of a probe provided by the present invention. The method comprises at least the following steps:

步驟S101: 發光元件22用於朝向至少一探針N的一頭部N1發出光線,光線經過頭部N1的反射而被影像擷取元件2接收;Step S101: the light emitting element 22 is used to emit light toward a head N1 of at least one probe N, and the light is reflected by the head N1 and received by the image capture element 2;

步驟S102: 影像擷取元件2的鏡頭21用以對準頭部N1並且進行定位,以使頭部N1的多個針尖部位落入影像擷取元件2的一預定偵測範圍S內;Step S102: The lens 21 of the image capture device 2 is used to align and position the head N1 so that the multiple needlepoints of the head N1 fall within a predetermined detection range S of the image capture device 2;

步驟S103:影像擷取元件2用以擷取到頭部N1的一初始影像,影像擷取元件2將初始影像傳輸至控制模組3;Step S103: The image capture component 2 is used to capture an initial image of the head N1, and the image capture component 2 transmits the initial image to the control module 3;

步驟S104:控制模組用以對初始影像進行標準化處理以獲得一處理後影像P,處理後影像P顯示出多個針尖部位;Step S104: The control module is used to standardize the initial image to obtain a processed image P, and the processed image P shows a plurality of needle tip locations;

步驟S105:控制模組3用於計算出每一針尖部位的面積占預定偵測範圍的面積的比例,以獲得每一針尖部位的磨耗率;以及Step S105: the control module 3 is used to calculate the ratio of the area of each needle point to the area of the predetermined detection range, so as to obtain the wear rate of each needle point; and

步驟S106:控制模組3將至少一探針N進行編號,並且將編號以及所量測的至少一探針N的磨耗率數據儲存至一儲存元件31,其中,磨耗率數據包括至少一探針N的頭部N1的每一針尖部位在不同使用時數時的所對應的磨耗率,以及至少一探針N的頭部N1的每一針尖部位當前所對應的磨耗率(即每一針尖部位目前的磨耗率)。Step S106: The control module 3 numbers the at least one probe N, and stores the number and the measured wear rate data of the at least one probe N in a storage element 31, wherein the wear rate data includes at least one probe N The wear rate corresponding to each needle point part of the head N1 of N at different hours of use, and the current wear rate corresponding to each needle point part of the head N1 of at least one probe N (that is, each needle point part current wear rate).

接著,針對上述的步驟S101至S106來詳細說明本發明的偵測探針磨耗率的方法。如圖1與圖2所示,控制模組3可依據使用者指令來控制測試平台1的移動軸12,透過移動軸12移動影像擷取元件2至針座4上的多個探針N中的其中一個探針N的正上方。接著,啟動影像擷取元件2以及發光元件22,使得發光元件22朝向該探針N的頭部N1發出一光線(入射光L1),部分光線並經過探針N的頭部N1的反射(形成反射光L2)而被影像擷取元件2接收。影像擷取元件2內部的感光器23可以將光訊號轉為電訊號並且據以產生一初始影像。舉例來說,感光器2可為感光耦合元件(Charge Coupled Device,CMOS)。另外,需說明的是,本發明中所提供的偵測探針磨耗率的裝置M主要是用以偵測探針N的頭部N1上的針尖部位,因為針尖是探針N用於接觸晶粒的部位。另外,由於不同種類的探針其頭部上的針尖數目都不相同,因此,本發明的探針N主要是以尖頭型探針中的四爪型探針作為示例說明,但本發明所提供的偵測探針磨耗率的裝置M與方法不限於僅偵測四爪型探針,合先敘明。Next, the method for detecting the wear rate of the probe of the present invention will be described in detail for the above steps S101 to S106. As shown in FIG. 1 and FIG. 2 , the control module 3 can control the moving shaft 12 of the test platform 1 according to user instructions, and move the image capture device 2 to the plurality of probes N on the needle base 4 through the moving shaft 12 One of the probes N is directly above. Next, activate the image capture element 2 and the light emitting element 22, so that the light emitting element 22 emits a light (incident light L1) towards the head N1 of the probe N, and part of the light is reflected by the head N1 of the probe N (forming The reflected light L2) is received by the image capture device 2 . The photoreceptor 23 inside the image capture device 2 can convert the light signal into an electrical signal and generate an initial image accordingly. For example, the photoreceptor 2 can be a charge coupled device (CMOS). In addition, it should be noted that the device M for detecting the wear rate of the probe provided in the present invention is mainly used to detect the needle point on the head N1 of the probe N, because the needle point is used by the probe N to contact the crystal. Part of the grain. In addition, because different types of probes have different numbers of needle points on their heads, the probe N of the present invention is mainly described as an example of the four-claw probe in the pointed probe, but the present invention The provided device M and method for detecting the wear rate of the probe are not limited to only detecting the four-claw type probe, which will be described first.

承上述,當影像擷取元件2能夠擷取到探針N的頭部N1的一初始影像之後,影像擷取元件2將所述初始影像傳輸至控制模組3,控制模組3對初始影像進行標準化處理以獲得一處理後影像P。In view of the above, when the image capture component 2 can capture an initial image of the head N1 of the probe N, the image capture component 2 transmits the initial image to the control module 3, and the control module 3 performs an initial image analysis on the initial image. Perform normalization processing to obtain a processed image P.

由於頭部N1表面是呈凹凸不平,因此入射光L1通過頭部N1表面反射後產生的反射光L2在影像擷取元件2擷取後獲得的初始影像會無法清楚辨識出頭部N1的具體形狀,或者會有其他雜點(例如附著在探針N的頭部N1的細微顆粒)被認為針尖部位。因此,影像擷取元件2將初始影像傳輸至控制模組3,控制模組3對初始影像進行標準化處理以獲得一處理後影像P,處理後影像P能夠清楚顯示出探針N(四爪型探針)的頭部N1上的四個針尖部位N11、N12、N13、N14,並且將影像中的雜點去除。另外需說明的是,本發明所謂的影像標準化處理,是指控制模組3對所述初始影像進行二值化處理以得到具有黑白效果的處理後影像P。Since the surface of the head N1 is uneven, the initial image captured by the image capture device 2 and the reflected light L2 generated after the incident light L1 is reflected by the surface of the head N1 cannot clearly identify the specific shape of the head N1. Or there may be other miscellaneous spots (such as fine particles attached to the head N1 of the probe N) which are regarded as the needle tip. Therefore, the image capture unit 2 transmits the initial image to the control module 3, and the control module 3 performs standardization processing on the initial image to obtain a processed image P, which can clearly show the probe N (four-claw type) The four needle tip positions N11, N12, N13, N14 on the head N1 of the probe) and remove the noise in the image. In addition, it should be noted that the so-called image normalization processing in the present invention means that the control module 3 performs binarization processing on the initial image to obtain a processed image P with a black and white effect.

繼續參閱圖2與圖3所示,圖3為本發明的偵測探針磨耗率產生的處理後影像的示意圖。在圖3中,四個三角形部位分別表示四個針尖部位N11、N12、N13、N14,中間的十字型形狀表示四個所述針尖部位之間的十字型溝槽C(即為四爪型探針的四個爪頭之間的溝槽輪廓,換言之不同種類的探針的溝槽輪廓形狀不一定相同)。當影像擷取元件2的鏡頭21對準探針N的頭部N1時,影像擷取元件2可依據十字型溝槽C為基準來進行定位,也就是說,影像擷取元件2是先將十字型溝槽C設定鏡頭21所擷取的畫面中的中央,藉以使所述頭部的多個針尖部位落入影像擷取元件2的一預定偵測範圍S內。預定偵測範圍S是由一外邊界線S1與一內邊界線S2定義出來的一幾何圖形。舉例來說,外邊界線S1形成一外圓,而內邊界線S2形成一內圓,該幾何圖形為外邊界線S1與內邊界線S2之間的同心圓形狀。但本發明不以為限,舉例來說,外邊界線S1可以形成一外正方形,而內邊界線S2形成一內正方形,該幾何圖形為外邊界線S1與內邊界線S2之間的同心正方形。或者,外邊界線S1可以形成一外三角形,而內邊界線S2形成一內三角形,該幾何圖形為外邊界線S1與內邊界線S2之間的同心三角形。Continuing to refer to FIG. 2 and FIG. 3 , FIG. 3 is a schematic diagram of the processed image generated by the detection probe wear rate of the present invention. In Fig. 3, the four triangular parts represent the four needle tip parts N11, N12, N13, N14 respectively, and the cross-shaped shape in the middle represents the cross-shaped groove C between the four needle tip parts (that is, the four-claw type probe). The groove profile between the four claw heads of the needle, in other words, the groove profile shapes of different types of probes are not necessarily the same). When the lens 21 of the image capture device 2 is aimed at the head N1 of the probe N, the image capture device 2 can be positioned based on the cross-shaped groove C, that is to say, the image capture device 2 is first positioned The cross-shaped groove C sets the center of the image captured by the lens 21 , so as to make the needlepoints of the head fall into a predetermined detection range S of the image capture device 2 . The predetermined detection range S is a geometric figure defined by an outer boundary line S1 and an inner boundary line S2. For example, the outer boundary line S1 forms an outer circle, and the inner boundary line S2 forms an inner circle, and the geometric figure is a concentric circle shape between the outer boundary line S1 and the inner boundary line S2. But the present invention is not limited thereto. For example, the outer boundary line S1 can form an outer square, and the inner boundary line S2 can form an inner square. The geometric figure is a concentric square between the outer boundary line S1 and the inner boundary line S2. Alternatively, the outer boundary line S1 may form an outer triangle, and the inner boundary line S2 may form an inner triangle, and the geometric figure is a concentric triangle between the outer boundary line S1 and the inner boundary line S2.

進一步來說,預定偵測範圍S包含四個偵測區域T1、T2、T3、T4,在圖3中,四個偵測區域T1、T2、T3、T4是以方形的虛線框表示,四個偵測區域T1、T2、T3、T4位於外邊界線S1與內邊界線S2之間。當影像擷取元件2的鏡頭21對準探針N的頭部N1並且進行定位時,影像擷取元件2是先將十字型溝槽C設定鏡頭21所擷取的畫面中的中央,藉以使所述頭部的四個針尖部位N11、N12、N13、N14落入影像擷取元件2的一預定偵測範圍S內,且四個針尖部位N11、N12、N13、N14分別落入四個偵測區域T1、T2、T3、T4內。接著,控制模組3會計算出落入四個偵測區域T1、T2、T3、T4的每一偵測區域內的針尖部位的面積占預定偵測範圍的面積的比例,以獲得每一針尖部位的磨耗率。Further, the predetermined detection range S includes four detection areas T1, T2, T3, and T4. In FIG. The detection areas T1, T2, T3, T4 are located between the outer boundary line S1 and the inner boundary line S2. When the lens 21 of the image capture device 2 is aimed at the head N1 of the probe N and positioned, the image capture device 2 first sets the cross-shaped groove C at the center of the picture captured by the lens 21, so that The four needle tip parts N11, N12, N13, N14 of the head fall into a predetermined detection range S of the image capture device 2, and the four needle tip parts N11, N12, N13, N14 respectively fall into four detection ranges. In the measurement area T1, T2, T3, T4. Then, the control module 3 will calculate the ratio of the area of the needle tip falling into each of the four detection areas T1, T2, T3, T4 to the area of the predetermined detection range, so as to obtain the wear rate.

本發明用以計算每一針尖部位的S的計算公式為:The present invention is used for calculating the calculation formula of the S of each needle tip position as:

R=(A X/A)×100%; R=(A X /A)×100%;

其中,R為磨耗率,A X(包含A11、A12、A13、A14)為每一針尖部位(N11、N12、N13、N14)位於對應的偵測區域內(T1、T2、T3、T4)的面積,如圖3所示,A11為針尖部位N11位於偵測區域T1的面積,A12為針尖部位N12位於偵測區域T2的面積,A13為針尖部位N13位於偵測區域T3的面積,A14為針尖部位N14位於偵測區域T4的面積。A為由外邊界線S1與內邊界線S2定義出來的幾何圖形的面積,也就是預定偵測範圍S的面積(在本實施例中,A即為外邊界線S1與內邊界線S2定義出來的同心圓的面積)。 Among them, R is the wear rate, and A X (including A11, A12, A13, A14) is each needle point (N11, N12, N13, N14) located in the corresponding detection area (T1, T2, T3, T4). Area, as shown in Figure 3, A11 is the area of the needle tip N11 located in the detection area T1, A12 is the area of the needle tip N12 located in the detection area T2, A13 is the area of the needle tip N13 located in the detection area T3, and A14 is the needle tip The part N14 is located in the area of the detection area T4. A is the area of the geometric figure defined by the outer boundary line S1 and the inner boundary line S2, that is, the area of the predetermined detection range S (in this embodiment, A is defined by the outer boundary line S1 and the inner boundary line S2 area of concentric circles).

繼續參閱圖3所示,四個針尖部位N11、N12、N13、N14中,針尖部位N11、N12是完全位於偵測區域T1、T2內,而針尖部位N13、N14是大部分位於偵測區域T3、T4內。也就是說,針尖部位N13、N14並非完全落入偵測區域T3、T4內。因此,當控制模組3在計算針尖部位N13、N14的磨耗率時,只會計算位於偵測區域T3、T4內的針尖部位N13、N14的部分面積,而不是計算針尖部位N13、N14的全部面積。Continuing to refer to FIG. 3, among the four needle tip parts N11, N12, N13 and N14, the needle tip parts N11 and N12 are completely located in the detection areas T1 and T2, while most of the needle tip parts N13 and N14 are located in the detection area T3 , T4. That is to say, the needle tip parts N13 and N14 do not completely fall into the detection areas T3 and T4. Therefore, when the control module 3 calculates the wear rate of the needle tip parts N13 and N14, it only calculates the partial area of the needle tip parts N13 and N14 located in the detection areas T3 and T4, instead of calculating the entire area of the needle tip parts N13 and N14. area.

此外,控制模組3包括一儲存元件31,儲存元件31電性連接控制模組3與影像擷取元件2。舉例來說,儲存元件31可為記憶體元件或是外接式硬碟,本發明不以為限。在進行偵測探針N的磨耗率之前,控制模組3會先控制移動軸12來移動影像擷取元件2來掃描針座4上的所有探針N以進行計數與編號,以確認針座4上的探針N數目以及每一探針N的位置。藉此,控制模組3可依據使用者指令來控制測試平台1的移動軸12,並且透過移動軸12準確移動影像擷取元件2至針座4上的多個探針N中的其中一個探針N的正上方。儲存元件31用以儲存每一探針N的編號,以及儲存每一探針N的頭部N1的每一針尖部位在不同使用時數時的所對應的磨耗率,以及儲存每一探針N的頭部N1的每一針尖部位當前所對應的磨耗率R。In addition, the control module 3 includes a storage element 31 , and the storage element 31 is electrically connected to the control module 3 and the image capture element 2 . For example, the storage element 31 can be a memory element or an external hard disk, and the present invention is not limited thereto. Before detecting the wear rate of the probes N, the control module 3 will first control the moving shaft 12 to move the image capture device 2 to scan all the probes N on the needle holder 4 for counting and numbering, so as to confirm the needle holder The number of probe N on 4 and the position of each probe N. In this way, the control module 3 can control the moving shaft 12 of the test platform 1 according to the user's instruction, and accurately move the image capture device 2 to one of the plurality of probes N on the needle base 4 through the moving shaft 12. directly above pin N. The storage element 31 is used to store the serial number of each probe N, and store the corresponding wear rate of each needle point of the head N1 of each probe N at different hours of use, and store the number of each probe N The current wear rate R corresponding to each needle point of the head N1.

[實施例的有益效果][Advantageous Effects of Embodiment]

本發明的其中一有益效果在於,本發明所提供的偵測探針磨耗率的裝置與方法,其能通過“光線經過頭部的反射而被影像擷取元件接收,影像擷取元件用以擷取到頭部的一初始影像,影像擷取元件將初始影像傳輸至控制模組,控制模組用以對初始影像進行標準化處理以獲得一處理後影像,處理後影像顯示出多個針尖部位,控制模組用於計算出每一針尖部位的面積占預定偵測範圍的面積的比例,以獲得每一針尖部位的磨耗率”的技術方案,以提升探針磨損程度的判斷一致性,以提高檢測品質,並且還能提升檢測效率。One of the beneficial effects of the present invention is that the device and method for detecting the wear rate of the probe provided by the present invention can be received by the image capture element through "the light is reflected by the head, and the image capture element is used to capture An initial image of the head is acquired, and the image capture unit transmits the initial image to the control module, and the control module is used to standardize the initial image to obtain a processed image. The processed image shows a plurality of needle tip locations, The control module is used to calculate the ratio of the area of each needle point to the area of the predetermined detection range, so as to obtain the technical solution of the wear rate of each needle point, so as to improve the judgment consistency of the wear degree of the probe and improve the Improve detection quality and improve detection efficiency.

更進一步來說,現有技術中都是利用人為主觀判斷探針是否需要更換,這往往會產生許多誤判。對於本領域來說,將還能使用的探針置換將會使耗材成本上升。此外,測試機台的測試介面的平整度或探針載具(即針座)的汙染等,都會造成探頭部的針尖部位或甚至其他特定位置的損耗,但人為判斷的方式則無法有效判斷及管控探針是否該更換。因此,本發明利用光學反射的原理,將光線照射在探針的頭部上,並使用影像擷取元件的鏡頭捕取反射光,透過控制模組偵測探針的頭部的反光面積,計算探針頭部的針尖部位的損耗率。Furthermore, in the prior art, human beings are used to judge whether the probe needs to be replaced subjectively, which often leads to many misjudgments. For the field, replacing probes that are still usable would drive up the cost of consumables. In addition, the flatness of the test interface of the test machine or the contamination of the probe carrier (i.e. the needle seat) will cause wear and tear on the tip of the probe or even other specific positions, but human judgment cannot effectively judge and Control probe should be replaced. Therefore, the present invention uses the principle of optical reflection to irradiate light on the head of the probe, and uses the lens of the image capture device to capture the reflected light, and detects the reflective area of the head of the probe through the control module to calculate The rate of wear at the tip of the probe head.

以上所公開的內容僅為本發明的優選可行實施例,並非因此侷限本發明的申請專利範圍,所以凡是運用本發明說明書及圖式內容所做的等效技術變化,均包含於本發明的申請專利範圍內。The content disclosed above is only a preferred feasible embodiment of the present invention, and does not therefore limit the scope of the patent application of the present invention. Therefore, all equivalent technical changes made by using the description and drawings of the present invention are included in the application of the present invention. within the scope of the patent.

M:探針磨耗偵測裝置 1:測試平台 11:承載座 12:移動軸 2:影像擷取元件 21:鏡頭 22:發光元件 23:感光器 3:控制模組 31:儲存元件 4:針座 41:置針孔 P:處理後影像 N:探針 N1:頭部 N11~N14:針尖部位 S:預定偵測範圍 S1:外邊界線 S2:內邊界線 C:十字型溝槽 T1~T4:偵測區域 L1:入射光 L2:反射光 X、Y、Z:坐標軸 S101~S106:步驟 M: Probe wear detection device 1: Test platform 11: Bearing seat 12: Move axis 2: Image capture component 21: Lens 22: Light emitting element 23: photoreceptor 3: Control module 31: storage element 4: Needle seat 41: Set pinhole P: processed image N: Probe N1: head N11~N14: Needle tip S: Predetermined detection range S1: Outer boundary line S2: Inner boundary line C: Cross groove T1~T4: detection area L1: incident light L2: reflected light X, Y, Z: coordinate axes S101~S106: steps

圖1為本發明的偵測探針磨耗率的裝置的立體示意圖。FIG. 1 is a three-dimensional schematic diagram of a device for detecting the wear rate of a probe according to the present invention.

圖2為本發明的偵測探針的示意圖。FIG. 2 is a schematic diagram of the detection probe of the present invention.

圖3為本發明的偵測探針磨耗率產生的處理後影像的示意圖。FIG. 3 is a schematic diagram of the processed image generated by the detection probe wear rate of the present invention.

圖4為本發明的偵測探針磨耗率的方法的步驟S101至S106的示意圖。FIG. 4 is a schematic diagram of steps S101 to S106 of the method for detecting probe wear rate of the present invention.

S101~S106:步驟 S101~S106: steps

Claims (12)

一種偵測探針磨耗率的裝置,其包括: 一測試平台,具有一承載座,所述承載座用以承載至少一探針,所述至少一探針具有一頭部,所述頭部包括多個針尖部位; 一影像擷取元件,設置在所述測試平台上,所述影像擷取元件透過所述測試平台進行三維移動,所述影像擷取元件包括一鏡頭與一發光元件,所述鏡頭用以對準所述頭部並且進行定位,以使多個所述針尖部位落入所述影像擷取元件的一預定偵測範圍內,所述發光元件用以朝向所述頭部發出光線;以及 一控制模組,電性連接於所述測試平台與所述影像擷取元件; 其中,所述光線經過所述頭部的反射而被所述影像擷取元件接收,所述影像擷取元件用以擷取到所述頭部的一初始影像,所述影像擷取元件將所述初始影像傳輸至所述控制模組,所述控制模組用以對所述初始影像進行標準化處理以獲得一處理後影像,所述處理後影像顯示出多個所述針尖部位,所述控制模組用以計算出每一所述針尖部位的面積占所述預定偵測範圍的面積的比例,以獲得每一所述針尖部位的磨耗率。 A device for detecting the wear rate of a probe, comprising: A test platform has a bearing seat, and the bearing seat is used to carry at least one probe, and the at least one probe has a head, and the head includes a plurality of needle tip parts; An image capture element is arranged on the test platform, the image capture element moves three-dimensionally through the test platform, the image capture element includes a lens and a light emitting element, and the lens is used for aligning The head is also positioned so that a plurality of the needle tip parts fall within a predetermined detection range of the image capture element, and the light emitting element is used to emit light toward the head; and a control module, electrically connected to the test platform and the image capture device; Wherein, the light is received by the image capture element after being reflected by the head, and the image capture element is used to capture an initial image of the head, and the image capture element captures the The initial image is transmitted to the control module, the control module is used to standardize the initial image to obtain a processed image, the processed image shows a plurality of the needle tip locations, the control The module is used to calculate the ratio of the area of each needle point to the area of the predetermined detection range, so as to obtain the wear rate of each needle point. 如請求項1所述的偵測探針磨耗率的裝置,其中,所述至少一探針為四爪探針,所述頭部具有四個所述針尖部位,且四個所述針尖部位之間具有一個十字型溝槽,當所述鏡頭對準所述頭部時,所述影像擷取元件用以依據所述十字型溝槽進行定位。The device for detecting the wear rate of a probe according to claim 1, wherein the at least one probe is a four-claw probe, the head has four needle tip locations, and one of the four needle tip locations There is a cross-shaped groove between them, and when the lens is aimed at the head, the image capture element is used for positioning according to the cross-shaped groove. 如請求項2所述的偵測探針磨耗率的裝置,其中,所述預定偵測範圍是由一外邊界線與一內邊界線定義出來的一幾何圖形,所述幾何圖形為一同心圓。The device for detecting the wear rate of a probe according to claim 2, wherein the predetermined detection range is a geometric figure defined by an outer boundary line and an inner boundary line, and the geometric figure is a concentric circle . 如請求項3所述的偵測探針磨耗率的裝置,其中,所述預定偵測範圍包含多個偵測區域,多個所述偵測區域位於所述外邊界線與所述內邊界線之間;其中,當所述鏡頭用以對準所述頭部並且進行定位時,多個所述針尖部位分別落入多個所述偵測區域內, 所述控制模組用以計算出落入每一所述偵測區域內的所述針尖部位的面積占所述預定偵測範圍的面積的比例,以獲得每一所述針尖部位的磨耗率。The device for detecting the wear rate of a probe according to claim 3, wherein the predetermined detection range includes a plurality of detection areas, and a plurality of detection areas are located on the outer boundary line and the inner boundary line Wherein, when the lens is used to align the head and perform positioning, a plurality of the needle tip parts respectively fall into a plurality of the detection areas, and the control module is used to calculate the falling The ratio of the area of the needle tip that enters each of the detection areas to the area of the predetermined detection range is calculated to obtain the wear rate of each needle tip. 如請求項1所述的偵測探針磨耗率的裝置,其中,所述標準化處理是指所述控制模組對所述初始影像進行二值化處理以得到具有黑白效果的所述處理後影像。The device for detecting the wear rate of a probe according to claim 1, wherein the normalization process means that the control module performs a binarization process on the initial image to obtain the processed image with a black and white effect . 如請求項1所述的偵測探針磨耗率的裝置,其中,所述控制模組包括一儲存元件,電性連接所述影像擷取元件,所述儲存元件用於儲存所述至少一探針的編號,以及儲存所述至少一探針的所述頭部的每一所述針尖部位在不同使用時數時的所對應的磨耗率,以及儲存所述至少一探針的所述頭部的每一所述針尖部位當前所對應的磨耗率。The device for detecting the wear rate of the probe according to claim 1, wherein the control module includes a storage element electrically connected to the image capture element, and the storage element is used to store the at least one probe The serial number of the needle, and the corresponding wear rate of each needle tip part of the head of the at least one probe stored at different hours of use, and the head of the at least one probe stored The current wear rate corresponding to each of the needle tip parts. 一種偵測探針磨耗率的方法,其應用於一偵測探針磨耗率的裝置,所述偵測探針磨耗率的裝置包括一測試平台、一具有一鏡頭與一發光元件的影像擷取元件以及一電性連接於所述測試平台與所述影像擷取元件的控制模組,所述影像擷取元件設置在所述測試平台上,所述偵測探針磨耗率的方法包括以下步驟: 所述發光元件用於朝向至少一探針的一頭部發出光線,所述光線經過所述頭部的反射而被所述影像擷取元件接收; 所述鏡頭用以對準所述頭部並且進行定位,以使所述頭部的多個針尖部位落入所述影像擷取元件的一預定偵測範圍內; 所述影像擷取元件用以擷取到所述頭部的一初始影像,所述影像擷取元件用以將所述初始影像傳輸至所述控制模組; 所述控制模組用以對所述初始影像進行標準化處理以獲得一處理後影像,所述處理後影像顯示出多個所述針尖部位;以及 所述控制模組用於計算出每一所述針尖部位的面積占所述預定偵測範圍的面積的比例,以獲得每一所述針尖部位的磨耗率。 A method for detecting the wear rate of a probe, which is applied to a device for detecting the wear rate of the probe, and the device for detecting the wear rate of the probe includes a test platform, an image capture device with a lens and a light-emitting element A component and a control module electrically connected to the test platform and the image capture component, the image capture component is set on the test platform, and the method for detecting the wear rate of the probe includes the following steps : The light emitting element is used to emit light toward a head of at least one probe, and the light is reflected by the head and received by the image capture element; The lens is used to align the head and position it so that a plurality of needlepoints of the head fall within a predetermined detection range of the image capture device; The image capture component is used to capture an initial image of the head, and the image capture component is used to transmit the initial image to the control module; The control module is used to standardize the initial image to obtain a processed image, the processed image shows a plurality of the needle tip locations; and The control module is used to calculate the ratio of the area of each needle point to the area of the predetermined detection range, so as to obtain the wear rate of each needle point. 如請求項7所述的偵測探針磨耗率的方法,其中,所述至少一探針為四爪型探針,所述頭部具有四個所述針尖部位,且四個所述針尖部位之間具有一個十字型溝槽,當所述鏡頭用以對準所述頭部時,所述影像擷取元件用以依據所述十字型溝槽進行定位。The method for detecting the wear rate of a probe according to claim 7, wherein the at least one probe is a four-claw type probe, the head has four needle tip locations, and the four needle tip locations There is a cross-shaped groove therebetween, and when the lens is used to align the head, the image capture element is used for positioning according to the cross-shaped groove. 如請求項8所述的偵測探針磨耗率的方法,其中,所述預定偵測範圍是由一外邊界線與一內邊界線定義出來的一幾何圖形,所述幾何圖形為一同心圓。The method for detecting the wear rate of a probe according to claim 8, wherein the predetermined detection range is a geometric figure defined by an outer boundary line and an inner boundary line, and the geometric figure is a concentric circle . 如請求項9所述的偵測探針磨耗率的方法,其中,所述預定偵測範圍包含多個偵測區域,多個所述偵測區域位於所述外邊界線與所述內邊界線之間;其中,當所述鏡頭用以對準所述頭部並且進行定位時,多個所述針尖部位分別落入多個所述偵測區域內, 所述控制模組用於計算出落入每一所述偵測區域內的所述針尖部位的面積占所述預定偵測範圍的面積的比例,以獲得每一所述針尖部位的磨耗率。The method for detecting the wear rate of a probe according to claim 9, wherein the predetermined detection range includes a plurality of detection areas, and a plurality of detection areas are located on the outer boundary line and the inner boundary line Wherein, when the lens is used to align the head and perform positioning, a plurality of the needle tip parts respectively fall into a plurality of the detection areas, and the control module is used to calculate the falling The ratio of the area of the needle tip that enters each of the detection areas to the area of the predetermined detection range is calculated to obtain the wear rate of each needle tip. 如請求項7所述的偵測探針磨耗率的方法,其中,所述標準化處理是指所述控制模組用以對所述初始影像進行二值化處理以得到具有黑白效果的所述處理後影像。The method for detecting the wear rate of a probe according to claim 7, wherein the normalization process refers to that the control module is used to perform binarization processing on the initial image to obtain the processing with a black and white effect After image. 如請求項7所述的偵測探針磨耗率的方法,還包括以下步驟: 所述控制模組用以將所述至少一探針進行編號,並且將所述編號以及所量測的所述至少一探針的磨耗率數據儲存至一儲存元件,其中,所述磨耗率數據包括所述至少一探針的所述頭部的每一所述針尖部位在不同使用時數時的所對應的磨耗率,以及所述至少一探針的所述頭部的每一所述針尖部位當前所對應的磨耗率。 The method for detecting probe wear rate as described in claim item 7, also includes the following steps: The control module is used to number the at least one probe, and store the number and the measured wear rate data of the at least one probe in a storage element, wherein the wear rate data Including the corresponding wear rate of each of the tip parts of the head of the at least one probe at different hours of use, and each of the tip of the head of the at least one probe The current wear rate corresponding to the part.
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