TW202308920A - Transmission mechanism, testing equipment, detecting method, and handler using the same - Google Patents

Abstract

The present invention reveals a Transmission mechanism, including a first transmitter and an image. The first transmitter has a first driver and a first carrier. The first driver drives the first carrier and the electronic component carried on the first carrier to move along a first route between a first operating zone and a second operating zone. The image capturer is disposed on the first carrier. The image capturer can take the images of a taker, which receives electronic components from the first carrier, and the electronic component received by the taker. Therefore, position deviation of the electronic components can be measured for precisely adjusting position of the electronic components.

Description

Conveyor mechanism, test device, detection method and operating machine for its application

The invention provides a conveying mechanism capable of improving conveying efficiency.

At present, electronic component testing devices use a material shifter to take out electronic components to be tested from the loading platform of the conveying mechanism, and move them into the test socket to perform electrical testing operations. However, the loading platform uses the accommodating part to hold the electronic components, and transports the electronic components to the side of the test seat. The material shifter is driven by the pulley set and the transfer arm to move in the Y direction, and moves from the testing area to the feeding The electronic components are taken out from the top of the stage, and then the electronic components are directly moved into the test socket, so that the contacts of the electronic components are in contact with the probes of the test socket to perform electrical testing.

However, the size of the accommodating part of the loading platform is larger than the size of the electronic components. During the process of conveying the electronic components on the loading platform, the electronic components are easy to slip in the accommodating part, so that the position of the electronic components picked up by the material shifter is shifted. Problem; In addition, in the process of transferring electronic components, the material shifter is prone to shifting the position of the electronic components picked up by the material shifter due to factors such as movement errors or structural assembly errors. Based on the aforementioned problems, it is impossible to use The contacts of the electronic components are in precise contact with the probes of the test socket, which affects the quality of the test; especially the electronic components are becoming more and more sophisticated, and the precision requirements are quite high. If the electronic components transferred by the material shifter are slightly shifted, the electronic Components perform test tasks accurately and reduce test quality.

The first object of the present invention is to provide a conveying mechanism, including at least one first conveyer and at least one image picker, the first conveyer is provided with a first driving source and a first stage, and the first driving source drives the first stage Displaced along the first path in the first operation area and the second operation area for carrying electronic components, the image picker is assembled on the first stage, and is carried by the first stage to the second operation area for the second operation area The electronic components on the shifter in the second work area perform imaging operations to detect whether the electronic components are offset, so as to facilitate the adjustment of the shifter and accurately transfer the electronic components, thereby improving the efficiency of transportation.

The second object of the present invention is to provide a conveying mechanism whose first conveyer is equipped with an image picker , while the first conveyor carries the electronic components and moves to the second working area, it can simultaneously carry the image picker to the second working area, so as to effectively reduce the configuration of the drive source of the image picker and simplify the sequence of actions, thereby effectively Save institutional costs and facilitate space allocation.

The third object of the present invention is to provide a test device, including at least one tester and the conveying mechanism of the present invention, at least one tester is provided with an electrically connected transmission member and a circuit board for testing electronic components, and the conveying mechanism of the present invention is provided with At least one first conveyor and at least one image pickup device further include at least one material shifter, at least one material shifter can move to the second working area along the second path to transfer electronic components, the first conveyor moves along the first The path is located in the first work area and the second work area for carrying electronic components, and the image picker is assembled on the first stage, and is carried by the first stage to the second work area for the second work area The electronic components on the material shifter perform imaging operations to detect whether the electronic components are offset, so as to facilitate the adjustment of the material shifter and accurately transfer the electronic components, so that the contacts of the electronic components can be accurately aligned with the transmission parts of the tester. Thus improving the test quality.

The fourth object of the present invention is to provide a detection method, including means for picking up materials, means for conveying images, means for holding positions and comparing means; means for picking up materials is to pick up electronic components with a material shifter; The carrier conveys the image picker to move to the second working area to pick up the electronic components of the material shifter; after the position-carrying means finishes taking the image of the image picker, the first conveyor is located in the second working area for the material shifter Moving in or out of electronic components; the comparison method uses the processor to receive the electronic component imaging data transmitted by the image picker to determine whether the electronic components are offset, and compensate and adjust the position of the electronic components, so that the material shifter can accurately transfer the electronic components.

The fifth object of the present invention is to provide a detection method, which further includes a means for moving the material and taking the image. The means for moving the material and taking the image is displaced along the second path by the material shifter, and the first conveyor is used to carry the image picker along the first path. Displacement enables the imager to capture images of different blocks of electronic components for more accurate analysis of the positional offset of electronic components, thereby further improving detection accuracy.

The sixth object of the present invention is to provide a working machine, which includes a machine platform, a feeding device, a material receiving device, a testing device with a conveying mechanism of the present invention, and a central control device. The feeding device is arranged on the machine platform and is provided with at least one supply A material container for accommodating at least one electronic component to be tested; the material receiving device is arranged on the machine table, and at least one material container is provided for accommodating at least one electronic component to be tested; the testing device is arranged in The machine platform is provided with at least one tester and the conveying mechanism of the present invention, at least one tester is used for testing electronic components, and the conveying mechanism of the present invention is provided with at least one first conveyer, at least one image picker and at least one material shifter , the material shifter is used to transfer electronic components, the first conveyor and the image picker mounted on it are used to transport electronic components and detect the position of electronic components on the material transfer device; the central control device is used to control and integrate various devices actuate to perform automated operations.

In order to make your review committee members have a further understanding of the present invention, hereby give a preferred embodiment and cooperate with the drawings, as follows in detail:

Referring to Fig. 1, the working machine of the present invention includes a machine platform 10, a feeding device 20, a receiving device 30, a testing device 40 and a central control device (not shown) of the conveying mechanism of the present invention.

The feeding device 20 is arranged on the machine platform 10, and is provided with at least one feeding container 21 for accommodating at least one electronic component to be tested; the material receiving device 30 is arranged on the machine platform 10, and is provided with at least one receiving material The container 31 is used for accommodating at least one tested electronic component; the central control device (not shown in the figure) is used to control and integrate the actions of each device to perform automatic operations.

The testing device 40 is configured on the machine platform 10, and is provided with at least one tester and the conveying mechanism of the present invention; at least one tester is used for testing electronic components, and further, the tester has circuit boards and transmission parts (such as probes) that are electrically connected. pin), the circuit board itself can have a test program, or be electrically connected to a testing machine; Hold and test electronic components.

Furthermore, the test device 40 is provided with a test room for the tester to be located in the test room to perform the test operation; the test room can be equipped with at least one delivery pipe (not shown) for delivering dry air to the test room to make the electronic components (Not shown in the figure) The cold test is performed in a test room that simulates the ambient temperature of future use. However, according to the operation requirements, during the heat measurement operation, a blower (not shown in the figure) can be installed in the test room to blow hot air and heat up the interior of the test room.

The conveying mechanism of the present invention includes at least one first conveyer 43 and at least one image taker 44; the first conveyer 43 is provided with a first driving source 431 and a first stage 432, and the first driving source 431 drives the first stage 432 Displaced along the first path in the first operation area A1 and the second operation area A2 for carrying electronic components, the image pickup device 44 is assembled on the first carrier 432, and is carried by the first carrier 432 to the second operation area A2 is used to perform imaging operations on the electronic components on the material shifter in the second operation area A2 to detect whether the electronic components are offset, so as to facilitate the adjustment of the material shifter and accurately transfer the electronic components.

Furthermore, the first conveyor 43 can carry the tested electronic components, the electronic components to be tested, or the tested electronic components and the electronic components to be tested. The first path can be positioned at the side or top of the test seat 42; for example, the first path is positioned at the side of the test seat 42, and the first conveyor 43 is displaced to the side of the test seat 42 along the first path (such as the X direction), so as to The feeder moves in the Y-Z direction between the first conveyor 43 and the test seat to pick and place electronic components; for example, the first path is above the test seat 42, and the first conveyor 43 is displaced to the test seat 42 along the first path Above, for the material shifter above the test seat 42 to move in the Z direction to pick and place electronic components.

Furthermore, the first driving source 431 can be a linear motor or include a motor and at least one transmission group; for example, the first driving source 431 includes a motor and a transmission group that is a pulley set, for example, the first driving source 431 is a linear motor, and the linear motor Contains a plurality of stators and at least one rotor for linear displacement of the rotor . The first carrier 432 can be a flat plate or a pedestal with accommodating parts (such as grooves), and the flat plate can have positioning components (such as suction holes) to position electronic components; in this embodiment, the first conveyor 43 is used for carrying For the electronic components tested, the first driving source 431 is a linear motor, and is arranged on the first path (such as the X direction), and is located on the side of the test seat 42, and the first driving source 431 is connected to drive a first accommodating portion 4321 The first carrier 432 is displaced between the first working area A1 and the second working area A2 along the first path, so that the first carrier 432 can accommodate the measured electrons in the second working area A2 with the first accommodating portion 4321. element. However, the first operation area A1 in this embodiment is the discharge area, and the second operation area A2 is the waiting area located on the side of the test seat 42. In other words, according to the operation requirements, when the first carrier 432 is displaced along the first path To the top of the test seat 42, the area above the test seat 42 is the second working area A2.

The image pickup device 44 is assembled on the first carrier 432 of the first conveyor 43, and is carried by the first carrier 432 to the second operation area A2 for electronic components on the material shifter of the second operation area A2 Carry out the image-picking operation; Further, the image-picking device 44 can be assembled on any position of the non-supporting electronic components of the first carrier 432, for example, be installed on the side or the top surface of the first carrier 432; Further, take The imager 44 can directly take images of the electronic components on the material shifter from bottom to top, or can be used in conjunction with a prism to take images of electronic components. In this embodiment, the image pickup device 44 is a CCD, and is installed on the front side of the first stage 432 of the first conveyor 43 for capturing the electronic components on the material shifter from bottom to top.

According to operation requirements, the conveying mechanism further includes at least one material shifter, and at least one material shifter can be displaced along the second path to the second operation area A2 to transfer electronic components; moreover, the material shifter further includes a temperature control unit ( Not shown in the figure), the temperature control unit is provided with at least one temperature control on the material shifter for temperature control of electronic components; further, the temperature control can be a heating element, a cooling chip or a seat with fluid.

In this embodiment, the conveying mechanism further includes a second conveyor 45 , a first material shifter 46 , a second material shifter 47 and a third material shifter 48 .

The second conveyor 45 includes a second driving source 451 and a second carrier 452. The second driving source 451 drives a second carrier 452 with a second accommodating portion 4521 to displace along the first path, and the second accommodating portion 452 moves along the first path. Part 4521 is used to carry the electronic components to be tested; further, the second drive source 451 and the first drive source 431 can be independent drive sources respectively, so as to drive the second stage 452 or the first stage 432 to move independently ; or the second drive source 451 and the first drive source 431 can be the same drive source (for example, the same drive source is a linear motor , the linear motor uses a plurality of stators to drive the two rotors to move, and the two rotors respectively drive the displacement of the first stage 432 and the second stage 452) to drive the displacement of the second stage 452 and the first stage 432. Furthermore, the image pickup 44 can also be assembled on the second conveyor 45, and when the second conveyor 45 is displaced along the first path, it will drive the image pickup 44 to move synchronously, so that the image pickup 44 is in the second working area A2 It is also possible to get the electronic components on the second material shifter 47.

In this embodiment, the second driving source 451 is an independent driving source, and is arranged on the first path, and is located on the side of the test seat 42, so as to drive the second stage 452 to move along the first path (such as the X direction). In the third work area A3 and the second work area A2. However, the third operating area A3 of the present embodiment is the feeding area In other words, according to the operation requirements, when the first stage 432 is displaced to the top of the test seat 42 along the first path, the area on the side of the test seat 42 is the first operation area A1 and the third operation area A3 for moving into the waiting area. Test electronic components and take out the tested electronic components.

The first material shifter 46 can be displaced in the first, second, and third directions (such as the X-Y-Z direction) for transferring electronic components to be tested between the feeding device 20 and the second conveyor 45 located in the third operation area A3 . The second shifter 47 can be displaced in the second and third directions (such as the Y-Z direction) for the test seat 42 and the first conveyor 43 or the second conveyor 45 located in the second operation area A2 to transfer the electrons to be tested. Components or tested electronic components, the electronic components to be tested on the second material shifter 47 are used for the image picker 44 located in the second operation area A2 to perform the imaging operation ; Further, the second material shifter 47 can perform the transfer and crimping actions according to the operation requirements, so as to crimp the electronic components on the test socket 42 to perform the test operation; and the second material transfer device 47 can further include temperature Control unit (not shown in the figure), the temperature control unit is provided with at least one temperature control on the material shifter for temperature control of electronic components; The electronic component has been tested, and the electronic component to be tested is pressed on the test socket 42 to perform the test operation. The third material shifter 48 can be displaced in the first, second, and third directions (such as X-Y-Z direction) for transferring the measured electronic components between the receiving device 30 and the first conveyor 43 located in the first operation area A1 .

Please refer to Figures 2 to 8, a detection method, including the means of picking up materials, the means of conveying images, the means of holding positions and the means of comparison; the means of picking up materials is to pick up electronic components with a material shifter; The carrier conveys the image picker to move to the second working area to pick up the electronic components of the material shifter; after the position-carrying means finishes taking the image of the image picker, the first conveyor is located in the second working area for the material shifter Moving in or out of electronic components; the comparison method uses the processor to receive the electronic component imaging data transmitted by the image picker to determine whether the electronic components are offset, and compensate and adjust the position of the electronic components, so that the material shifter can accurately transfer the electronic components.

Based on the above, it also includes the material transfer and image acquisition means. The material transfer and image acquisition means uses the material transfer device for displacement in the second direction, and cooperates with the first conveyor to carry the image pickup device for displacement in the first direction, so that the image pickup device can capture electronic images. The different blocks of the components are used for more accurate analysis of the position offset value of the electronic components, thereby improving the detection accuracy.

Before performing the pick-up means, the detection method of the present invention further includes a pre-feeding means, and the pre-feeding means uses the second conveyor 45 to transport the electronic components to be tested, so that the material transfer device can pick up the electronic components to be tested ; In this embodiment, the first material shifter 46 is displaced in the X-Y-Z direction, and the electronic components to be tested are taken out from the feed container 21 of the feed device 20, and transferred to the third operation area A3, and the electronic components to be tested are transferred to the third operation area A3. The electronic components are moved into the second accommodating portion 4521 of the second stage 452 of the second conveyor 45, and the second stage 452 is displaced along the first path to transport the electronic components to be tested from the third operation area A3 to the second operation area A2, and located on the side of the test socket 42.

The pick-up means picks up the electronic components with a material shifter; in this embodiment, the second material shifter 47 is displaced in the Y-Z direction, and the electronic components to be tested are taken out on the second carrier 452 of the second conveyor 45, and the second carrier 452 for reverse displacement reset. The conveying and imaging means uses the first conveyor to carry the imaging device and move it to the second operation area to capture the electronic components of the material shifter; more preferably, the detection method has a material shifting and imaging means, and a material shifting and imaging means Use the material shifter to move along the second path, and cooperate with the first conveyor to carry the image picker to move along the first path, so that the image picker can capture images of different blocks of electronic components for more accurate analysis of the position deviation of electronic components shift value, thereby improving detection accuracy; in the present embodiment, the conveying imaging means uses the first drive source 431 of the first conveyer 43 to drive the first stage 432 to move along the first path, and drives the pick-up mounted on it. The imager 44 is synchronously displaced from the first working area A1 to the second working area A2. Since the imager 44 is assembled on the front side of the first stage 432, the imager 44 can be moved to the second operating area A2 first, so that the first The electronic components picked up by the second material shifter 47 perform the imaging operation; then the image pickup 44 is displaced in the X direction, and the second material shifter 47 can be used for the Y direction displacement, so that the image pickup 44 can take images of the electronic components from bottom to top. Different blocks to obtain more imaging data for analysis and comparison.

After the position-carrying means finishes taking the image by the image picker, the first conveyor is located in the second operation area A2 for the material shifter to move in or out of the electronic components; in this embodiment, the image picker 44 takes the image of the second material shifter After the electronic components on 47 are completed, the first drive source 431 of the first conveyor 43 drives the first stage 432 to move along the first path, so that the empty first accommodating part 4231 of the first stage 432 waits to be positioned at the first position first. The discharge position of the second material shifter 47 is to wait for the Y-Z displacement of the second material shifter 47 to move into the measured electronic components; therefore, the first stage 432 is displaced along the first path to carry out the action of carrying the measured electronic components Beforehand, the image picker 44 can be carried in advance to perform image capture operations on the electronic components on the second material shifter 47, which not only reduces the number of drive components for the image picker, but also effectively simplifies the sequence of image capture operations, thereby saving costs and improving use efficiency .

The comparison method uses the processor (not shown in the figure) to receive the electronic component imaging data transmitted by the image picker 44 to determine whether the electronic component is offset, and compensate and adjust the position of the electronic component, so that the material shifter can accurately transfer the electronic component ; In this embodiment, the comparison means receives the electronic component imaging data transmitted by the image picker 44 with the processor, and compares the electronic component imaging data with the electronic component sample data in a database (not shown in the figure) , to judge whether the electronic component is offset, if the offset value is zero, then there is no need to adjust the position of the electronic component, if the offset value is not zero, then adjust the offset value to adjust the position of the electronic component, the second material shifter 47 After adjusting the position of the electronic component, the second material shifter 47 moves the electronic component into and crimps it on the test socket 42, so that the multiple contacts of the electronic component are accurately aligned with the multiple probes of the test socket 42 to perform the test operation.

Since the empty first accommodating part 4231 of the first carrier 432 of the first conveyor 43 has already been placed in the discharge position of the second material shifter 47, after the electronic component test is completed, the second material shifter 47 moves in the Y-Z direction Displace and move out of the tested electronic component of the test seat 42, and move the tested electronic component into the first accommodation portion 4231 of the first stage 432, and the first driver 431 of the first conveyor 43 drives a load carrying the tested electronic component The first stage 432 and the image picker 44 mounted on it are simultaneously displaced in reverse along the first path, from the second work area A2 to the first work area A1 (ie, the discharge area), and the image picker 44 leaves In the second working area A2, the first carrier 432 carries out the tested electronic components, and the third material shifter 48 moves in the X-Y-Z direction to the first working area A1 (ie, the discharge area) , and take out the tested electronic components on the first stage 432, and transfer the tested electronic components to the material receiving container 31 of the material receiving device 30 according to the test results, and classify and store them.

10: machine 20: Feeding device 21: Feed container 30: Receiving device 31: Receiving container 40: Test device 41: circuit board 42: Test seat 43: First conveyor 431: The first driving source 432: The first platform 4321: The first container 44: image picker 45: Second conveyor 451: Second driving source 452:Second platform 4521: the second storage part 46: The first material shifter 47: Second shifter 48: The third shifter A1: The first work area A2: The second work area A3: The third work area

Figure 1: A schematic diagram of the present invention applied to a working machine. Figure 2: Schematic diagram of the detection method of the present invention. Figure 3: Schematic diagram of the detection of electronic components in the present invention (1). Figure 4: Schematic diagram of the detection of electronic components in the present invention (2). Figure 5: Schematic diagram of the detection of electronic components of the present invention (3). Figure 6: Schematic diagram of the detection of electronic components in the present invention (4). Figure 7: Schematic diagram (5) of the action of detecting electronic components of the present invention. Figure 8: Schematic diagram of the detection of electronic components in the present invention (6).

10: machine

20: Feeding device

21: Feed container

30: Receiving device

31: Receiving container

40: Test device

41: circuit board

42: Test seat

43: First conveyor

431: The first driving source

432: The first platform

4321: The first container

44: image picker

45: Second conveyor

451: Second driving source

452:Second platform

4521: the second storage part

46: The first material shifter

47: Second shifter

48: The third shifter

A1: The first work area

A2: The second work area

A3: The third work area

Claims (16)

A delivery mechanism comprising: At least one first conveyor: provided with a first driving source and a first carrier, the first driving source driving the first carrier to move along the first path between the first working area and the second working area, the first carrier is used to carry electronic components; At least one image picker: assembled on the first carrier, for the first carrier to carry the image pickup The device is synchronously displaced in the first working area and the second working area, and the image picker can take images of the electronic components picked up by the shifter in the second working area to detect whether the electronic components are offset. The conveying mechanism as described in claim 1, which includes at least one material shifter, which can be moved along the second path to the second working area to transfer electronic components for the image picker to take images of electronic components . In the conveying mechanism described in claim 2, the material shifter further includes a temperature control unit, and the temperature control unit is provided with at least one temperature control on the material shifter for temperature control of electronic components. According to the conveying mechanism described in claim 1, the first driving source can be a linear motor or include a motor and at least one transmission unit. According to the conveying mechanism described in claim 1, the first carrier is provided with an accommodating portion for accommodating electronic components. In the conveying mechanism as described in claim 1, the image picker can be mounted on any part of the first stage that does not hold electronic components. As the conveying mechanism described in claim 1, the image pickup device is a CCD. The conveying mechanism as described in claim 1, further comprising a second conveyer, the second conveyer is provided with a second driving source and a second stage, and the second driving source drives the second stage along the first path Displaced between the third working area and the second working area, the second carrier is used to carry electronic components. A test device comprising: At least one tester: transmission parts and circuit boards with electrical connections for testing electronic element; At least one conveying mechanism as described in claim 1: the material shifter is between the first conveyor and The electronic components are transferred between the testers, the first conveyor transports the electronic components, and the image picker takes images of the electronic components on the transfer device. As the test device described in claim 9, the first path of the first conveyor can be located at The side or top of the tester. The test device as described in claim 9 further includes a test chamber, the test chamber is used to cover the The tester executes the test job. As the test device described in claim 11, the test chamber is equipped with at least one delivery tube for For conveying dry air. A detection method comprising: Picking means: Pick up electronic components with a material shifter; Conveyance and imaging means: the first conveyor is used to carry the image pickup device along the first path and move to the second Working area to pick up the electronic components of the shifter; Stand-by bearing means: After the image pickup is completed, the first conveyor is located at the first Two working areas for the material shifter to move in or out of electronic components; Comparison method: the processor receives the imaging data of the electronic components transmitted by the image picker, and uses Determine whether the electronic components are offset, and compensate and adjust the position of the electronic components. The detection method as described in claim 13 further includes means for moving material and taking images, and the material moving and taking images The method is to use the material shifter to move along the second path, and cooperate with the first conveyor to carry the image picker to move along the first path, so that the image picker can take images of different blocks of electronic components. The detection method as described in claim 13 further includes a pre-feeding means, the pre-feeding means uses the second conveyor to transport the electronic components, and the material shifter picks up the electronic components. A work machine, comprising: Machine; Feeding device: it is arranged on the machine table, and is provided with at least one feeding container for accommodating One less electronic component to be tested; Material receiving device: it is arranged on the machine platform, and is provided with at least one material receiving container for accommodating One less electronic component tested; At least one test device as described in claim 9: assemble the machine; Central control device: to control and integrate the actions of various devices to perform automated operations.

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