TW202307568A - 圖案形成方法、電子元件之製造方法、感光化射線性或感放射線性樹脂組成物、光阻膜 - Google Patents

圖案形成方法、電子元件之製造方法、感光化射線性或感放射線性樹脂組成物、光阻膜 Download PDF

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Publication number
TW202307568A
TW202307568A TW111125323A TW111125323A TW202307568A TW 202307568 A TW202307568 A TW 202307568A TW 111125323 A TW111125323 A TW 111125323A TW 111125323 A TW111125323 A TW 111125323A TW 202307568 A TW202307568 A TW 202307568A
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group
formula
acid
compound
represented
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TW111125323A
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吉野文博
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日商富士軟片股份有限公司
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Publication of TW202307568A publication Critical patent/TW202307568A/zh

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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F20/00Homopolymers and copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride, ester, amide, imide or nitrile thereof
    • C08F20/02Monocarboxylic acids having less than ten carbon atoms, Derivatives thereof
    • C08F20/10Esters
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Materials For Photolithography (AREA)
TW111125323A 2021-07-12 2022-07-06 圖案形成方法、電子元件之製造方法、感光化射線性或感放射線性樹脂組成物、光阻膜 TW202307568A (zh)

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JP2021115277 2021-07-12
JP2021-115277 2021-07-12

Publications (1)

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TW202307568A true TW202307568A (zh) 2023-02-16

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TW111125323A TW202307568A (zh) 2021-07-12 2022-07-06 圖案形成方法、電子元件之製造方法、感光化射線性或感放射線性樹脂組成物、光阻膜

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JP (1) JPWO2023286586A1 (https=)
TW (1) TW202307568A (https=)
WO (1) WO2023286586A1 (https=)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3751065B2 (ja) * 1995-06-28 2006-03-01 富士通株式会社 レジスト材料及びレジストパターンの形成方法
JP5573356B2 (ja) * 2009-05-26 2014-08-20 信越化学工業株式会社 レジスト材料及びパターン形成方法
JP5685919B2 (ja) * 2010-12-13 2015-03-18 Jsr株式会社 感放射線性樹脂組成物及びレジストパターン形成方法
US11681218B2 (en) * 2018-02-14 2023-06-20 Sumitomo Chemical Company, Limited Compound, resist composition and method for producing resist pattern

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WO2023286586A1 (ja) 2023-01-19
JPWO2023286586A1 (https=) 2023-01-19

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