TW202306136A - Biometric identification device - Google Patents

Abstract

A biometric identification device includes a substrate, a plurality of photosensitive devices, a first dielectric layer, a plurality of first light-shielding parts, a second dielectric layer and a second light-shielding part. The photosensitive devices are disposed on the substrate. The first dielectric layer is disposed on the photosensitive devices. The first light-shielding parts are disposed on the first dielectric layer, in which each of the first light-shielding parts has a first light-transmitting area and a first light-shielding area surrounding the first light-transmitting area, the first light-transmitting area corresponds to and overlaps with each of the photosensitive devices, and at least two of the first light-shielding parts are spaced apart by a spacer area. The second dielectric layer is disposed on the first light-shielding parts. The second light-shielding part is disposed on the second dielectric layer. An orthogonal projection of at least a portion of the spacer area on the substrate is within an orthogonal projection of the second light-shielding part on the substrate.

Description

biometric identification device

The present disclosure relates to a biometric identification device.

With the development of technology, information security has become an important consideration for consumers when using electronic devices. Therefore, most of the electronic devices are currently equipped with an identity authentication mechanism, and the method of identifying the identity using biometric features is a trend in recent years.

However, the current biometric identification device has the problem of poor image due to high stray capacitance and insufficient response of the biometric signal.

Therefore, how to provide a biometric identification device with reduced stray capacitance is a problem to be solved.

Some embodiments of the present disclosure provide a biometric identification device, including a substrate, a plurality of photosensitive elements, a first dielectric layer, a plurality of first light-shielding parts, a second dielectric layer, and a second light-shielding part. The photosensitive element is arranged on the substrate. The first dielectric layer is disposed on the photosensitive element. A plurality of first light-shielding parts are disposed on the first dielectric layer, wherein each first light-shielding part has a first light-transmitting area and a first light-shielding area surrounding the first light-transmitting area, and the first light-shielding area corresponds to each photosensitive element and overlapping, and at least two of the first light shielding parts are separated by a spacer. The second dielectric layer is disposed on the first light shielding portion. The second light-shielding portion is disposed on the second dielectric layer, wherein the second light-shielding portion has a plurality of second light-transmitting regions and a second light-shielding region between two adjacent second light-transmitting regions, each second light-transmitting region The regions correspond to the respective first light-transmitting regions, and at least part of the interval region is within the range of the orthographic projection of the substrate on the second light-shielding region.

In some embodiments, the first light-shielding parts are separated by spacers.

In some embodiments, part of the first light-shielding portion is connected via the first light-shielding region.

In some embodiments, the material of the first light shielding area is metal.

In some embodiments, the length of the first light-transmitting region ranges from 2.5 microns to 5 microns.

In some embodiments, the outline shape of the first light-shielding region in plan view includes circle, square, pentagon, hexagon, or octagon.

In some embodiments, the distance between the center points of adjacent second light-transmitting regions is defined as P, the length of each second light-transmitting region is L2, the length of the spacer is S0, and the first light-transmitting region The length is L1, the vertical length from the contour edge of the first light-shielding area to the contour edge of the first light-transmitting area is L', and the length of the light range projected on each photosensitive element by each microlens is L0, then P-L2>S0;P-L1-2L'=S0; and L1+2L'>L0. In some embodiments, the distance between the center points of adjacent second light-transmitting regions is defined as P, the length of each second light-transmitting region is L2, the length of the spacer is S0, and the first light-transmitting region The length is L1, the vertical length from the contour edge of the first light-shielding area to the contour edge of the first light-transmitting area is L', the length of the light range projected on each photosensitive element by each microlens is L0, and the upper surface of the photosensitive element The distance to the upper surface of the first dielectric layer is H0, and the distance from the upper surface of the first dielectric layer to the upper surface of the second dielectric layer is H1, then

In some embodiments, the length S0 of the spacer region is in the range of 10 microns ≥ S ≥ 2.5; and the vertical length L' from the contour edge of the first light-shielding region to the contour edge of the first light-transmitting region is in the range of 10 microns ≥ L '≥2.5 microns.

In some embodiments, the range of the length L2 of each second light transmission area is 10 microns ≥ L2 ≥ 2.5 microns; the range of the length L1 of the first light transmission area is 8 microns ≥ L1 ≥ 2.5 microns; the length L0 of the light range The range of the distance H0 from the upper surface of the photosensitive element to the upper surface of the first dielectric layer is 6 microns ≥ H0 ≥ 2 microns; and the upper surface of the first dielectric layer to the second The distance H1 between the upper surfaces of the second dielectric layer is in the range of 30 microns ≥ H1 ≥ 5 microns.

In some embodiments, the first light-shielding region includes a first light-shielding metal layer and the first metal oxide layer is disposed on the first light-shielding metal layer.

In some embodiments, the second light-shielding region includes a second light-shielding metal layer and the second metal oxide layer is disposed on the second light-shielding metal layer.

In some embodiments, the biometric identification device further includes an active element connected to a photosensitive element.

In some embodiments, the biometric identification device further includes a microlens disposed on the second light-shielding portion, wherein the orthographic projection range of the second light-transmitting area on the substrate is within the orthographic projection range of the microlens on the substrate.

In some embodiments, the biometric identification device further includes a plurality of microlenses disposed on the second light-shielding portion, wherein each microlens corresponds to each second light-transmitting region.

The following will clearly illustrate the spirit of the disclosure with drawings and detailed descriptions. Anyone with ordinary knowledge in the technical field can learn the technology taught by the disclosure after understanding the preferred implementation modes and examples of the disclosure. Changes and modifications are made without departing from the spirit and scope of the disclosure.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting. As used herein, the singular forms "a", "an" and "the" are intended to include plural forms including "at least one" unless the content clearly dictates otherwise. "Or" means "and/or". As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items. It should also be understood that when used in this specification, the terms "comprising" and/or "comprising" designate the stated features, regions, integers, steps, operations, the presence of elements and/or parts, but do not exclude one or more Existence or addition of other features, regions as a whole, steps, operations, elements, parts and/or combinations thereof.

Exemplary embodiments are described herein with reference to top schematic illustrations that are idealized embodiments. Accordingly, variations from the shapes of the illustrations as a result, for example, of manufacturing techniques and/or tolerances are to be expected. Thus, embodiments described herein should not be construed as limited to the particular shapes of regions as illustrated herein but are to include deviations in shapes that result, for example, from manufacturing. For example, a region shown or described as flat, may, typically, have rough and/or non-linear features. Additionally, acute corners shown may be rounded. Thus, the regions shown in the figures are schematic in nature and their shapes are not intended to illustrate the precise shape of a region and are not intended to limit the scope of the claims.

Several implementations are listed below to describe the touch device of the present invention in more detail, but they are only for illustrative purposes and are not intended to limit the present invention. The scope of protection of the present invention shall prevail as defined by the scope of the appended patent application .

FIG. 1 shows a schematic cross-sectional view of a biometric identification device 100 according to some embodiments of the present disclosure.

The biometric identification device 100 includes a substrate 110, a buffer layer 120, an active element T, a gate dielectric layer GI, an interlayer dielectric layer ILD, a plurality of photosensitive elements SR, a first electrode layer E1, a second electrode layer E2, an insulating layer 130 , a dielectric layer 140 , a plurality of first light-shielding parts 150 , a second light-shielding part 160 , a microlens LN, and a cover plate 170 .

In some implementations, the biological feature identification device 100 can be applied to fingerprint identification, and the identified biological features are, for example, the features in the ridges and valleys of the fingerprint, but are not limited thereto. In some other implementations, the biometric identification device 100 can also be applied to palmprint identification, and the identified biometric features can be features in the ridge-valley pattern of the identified palmprint. For ease of description, fingerprint recognition is used as an example below.

In some embodiments, the substrate 110 can be a light-transmitting material. For example, the substrate 110 can be a glass substrate, a quartz substrate, a sapphire substrate, an organic polymer substrate or other suitable hard substrates or flexible substrates (flexible substrates). wait.

The buffer layer 120 is disposed on the substrate 110 . The active device T is disposed on the buffer layer 120 . The interlayer dielectric layer ILD is disposed on the active device T. The photosensitive element SR is disposed on the first electrode layer E1 , therefore, the photosensitive element SR is electrically connected to the active element T through the first electrode layer E1 . In some embodiments, the photosensitive element SR is made of silicon-rich oxide (SRO) or other suitable materials. In some embodiments, the material of the first electrode layer E1 is a metal material, such as an opaque metal material.

The active device T includes a semiconductor layer SC and a gate electrode GE on the semiconductor layer SC. The semiconductor layer SC includes a source/drain region S/D and the channel region CA is connected to the source/drain region S/D. In some embodiments, the channel region CA is polysilicon (Poly-Silicon), and the source/drain regions S/D are doped polysilicon. In some other embodiments, the source/drain regions S/D may be alloys, nitrides of metal materials, oxides of metal materials, oxynitrides of metal materials, or other suitable materials.

In one embodiment, the semiconductor layer SC is formed on the buffer layer 120 by patterning, and then the gate dielectric layer GI covers the semiconductor layer SC. The gate electrode GE is patterned and formed on the gate dielectric layer GI. The source/drain region S/D is formed after the semiconductor layer SC is doped, and the undoped region (located below the gate electrode GE) in the semiconductor layer SC is the channel region CA. The interlayer dielectric layer ILD is formed on the gate dielectric layer GI and covers the gate electrode GE. Next, an opening is formed in the gate dielectric layer GI and the interlayer dielectric layer ILD (through the gate dielectric layer GI and the interlayer dielectric layer ILD), and a metal material is deposited and patterned in the opening to form a first electrode layer E1 is in the opening and on the interlayer dielectric layer ILD. Next, the photosensitive element SR is disposed on the first electrode layer E1, so as to electrically connect the source/drain region S/D and the photosensitive element SR through the first electrode layer E1.

The insulating layer 132 is disposed on the first electrode layer E1 and the interlayer dielectric layer ILD. In some embodiments, the insulating layer 132 partially covers the photosensitive element SR (for example, covers the outer edge region of the photosensitive element SR, as shown in FIG. 1 , that is, the insulating layer 132 forms a groove A on the photosensitive element SR).

In some embodiments, the material of the insulating layer 132 can be a transparent insulating material, such as silicone rubber, acrylic resin, unsaturated polyester, polyurethane, epoxy resin, other suitable materials, derivatives of the foregoing, or a combination of the foregoing .

The second electrode layer E2 is disposed on the insulating layer 132 and the photosensitive element SR. In some embodiments, the second electrode layer E2 extends into the groove A, covers part of the photosensitive element SR (for example, covers the central area of the photosensitive element SR) and is electrically connected with the photosensitive element SR (for example, see FIG. 1 ) .

In some embodiments, the material of the second electrode layer E2 includes a transparent conductive material, such as indium tin oxide (Indium Tin Oxide; ITO), indium zinc oxide, aluminum tin oxide, aluminum zinc oxide, indium gallium zinc oxide material, other suitable oxides, or a stacked layer of at least two of the above.

The insulating layer 134 is disposed on the insulating layer 132 and the second electrode layer E2. The material of the insulating layer 134 can be the same as or similar to that of the insulating layer 132 , which will not be repeated here.

The dielectric layer 142 is disposed on the insulating layer 134 . A plurality of first light-shielding portions 150 are disposed on the dielectric layer 142, wherein each first light-shielding portion 150 has a first light-transmitting region LT1 and a first light-shielding region BR1 surrounding the first light-transmitting region LT1, and each first light-shielding portion 150 has a first light-shielding region LT1 surrounding the first light-shielding region LT1. The light area LT1 corresponds to and overlaps with the individual photosensitive element SR (for example, the center point of the individual first light transmission area LT1 overlaps with the center point of the photosensitive element SR), and at least two of the first light shielding parts 150 are separated by the spacer SP .

In some embodiments, the material of the dielectric layer 142 can be an organic material, an inorganic material or a combination thereof, including, but not limited to, epoxy resin, silicon oxide (SiOx), silicon nitride (SiNx), silicon oxide and nitrogen A composite layer composed of silicon and silicon, or other suitable dielectric materials. In some embodiments, the dielectric layer 142 is a transparent insulating material.

In some embodiments, the material of the first light-shielding region BR1 can be inorganic material, organic material, metal, other suitable materials, or a combination thereof.

It is worth emphasizing that if the first light-shielding region BR1 is made of inorganic or organic materials, there is a process limitation that the length L1 of the first light-transmitting region LT1 is greater than 5 micrometers. However, when the material of the first light-shielding region BR1 is metal, it can have better manufacturing precision, for example, the length L1 of the first light-transmitting region LT1 can be realized in a range of less than 5 microns (for example, between 2.5 microns and 5 microns). . In some embodiments, the first light-shielding region BR1 includes the first light-shielding metal layer BM1 and the first metal oxide layer OX1 is disposed on the first light-shielding metal layer BM1 .

In some embodiments, the first light shielding portions 150 are separated by a spacer SP. For example, please refer to the first block B1 in FIG. 1 and FIG. 2A. FIG. 2A shows a top view of the first block B1 in the biometric identification device 100 according to some embodiments of the present disclosure. The section cut by the line A-A in the figure is the first light shielding portion 150 and the spacer SP in the first box B1 in the first figure. There is a spacer SP between each first light shielding portion 150 .

In addition, it is worth emphasizing that when the first light-shielding region BR1 is made of metal, the contact area between the first light-shielding region BR1 (especially the first light-shielding metal layer BM1) and the dielectric layer 142 can be reduced through the design of the spacer SP, The parasitic capacitance between the first light-shielding region BR1 and the dielectric layer 142 is reduced, thereby reducing the interference of stray capacitance and increasing the accuracy of fingerprint signal detection.

In some other embodiments, although a part of the first light shielding portion 150 is separated by the spacer region SP, another part of the first light shielding portion 150 is connected by the first light shielding region BR1 . For example, please refer to the second block B2 in FIG. 1 and FIG. 2B. FIG. 2B shows the upper view of the second block B2 in the biometric identification device 100 according to some embodiments of the present disclosure, wherein, along the 2B The section cut by the line B-B in the figure is the first light shielding portion 150 in the second box B2 in the first figure. In FIG. 2B , the first light-shielding portion 150 is respectively connected to another first light-shielding portion 150 adjacent in the X-axis direction and another first light-shielding portion 150 adjacent in the Y-axis direction.

Referring to Fig. 2B, in plan view, the first light shielding region BR1 connected to the first light shielding portion 150 has a diameter d along the X-axis direction smaller than the length of the first light shielding portion 150 (twice the contour edge of the first light shielding region BR1 The vertical length L' (2L')+the length L1 of the first light-transmitting region LT1 to the contour edge of the first light-transmitting region LT1), so as to reduce the contact area between the first light-shielding region BR1 and the dielectric layer 142, and reduce the parasitic capacitance , thereby reducing the interference of stray capacitance and increasing the accuracy of fingerprint signal detection.

It can be understood that the first light shielding parts 150 can be connected to each other in any manner, which is not limited here. For example, please refer to the second block B2 in FIG. 1 and FIG. 2C. FIG. 2C shows a top view of another example of the second block B2 in the biometric identification device 100 according to some embodiments of the present disclosure, wherein, The section cut along the line C-C in FIG. 2C is the first light shielding portion 150 in the second box B2 in FIG. 1 . In Figure 2C, the first light-shielding portion 150 on the lower left in Figure 2C is connected to another first light-shielding portion 150 adjacent in the X-axis direction, but not to another first light-shielding portion 150 adjacent in the Y-axis direction. The light shielding part 150 is connected. However, the two first light shielding portions 150 on the right in FIG. 2C are not connected to any adjacent first light shielding portions 150 .

In some embodiments, please refer to FIG. 2D , for example. FIG. 2D shows the contour shape of the first light shielding portion 150 in the biometric identification device 100 according to some embodiments of the present disclosure in a top view. FIG. 2D illustrates that the outline shape of the first light shielding portion 150 in plan view includes a circle, a square, a pentagon, a hexagon, or an octagon. It can be understood that, when the first shading region BR1 (please refer to FIG. 1 ) is made of metal, the outline shape of the first shading part 150 is circular. Compared with other shapes, it can minimize the shading effect while A contact area between the light-shielding region BR1 and the dielectric layer 142 reduces parasitic capacitance, thereby reducing the interference of stray capacitance and increasing the accuracy of fingerprint signal detection.

Please go back to Figure 1. The insulating layer 136 is disposed on the dielectric layer 142 and the first light-shielding metal layer BM1 , and fills up the first light-transmitting region LT1 and the spacer region SP. The material of the insulating layer 136 can be the same as or similar to that of the insulating layer 132 , which will not be repeated here.

Next, please see Figures 3A to 3E. FIG. 3A shows a top view of the first electrode layer E1 , the photosensitive element SR, and the insulating layer portion 136A filling the first light-transmitting region LT1 of the biometric identification device 100 according to some embodiments of the present disclosure. 3B to 3E respectively illustrate the first electrode layer E1, the photosensitive element SR, the second electrode layer E2 and the insulating layer filling the first light-transmitting region LT1 of the biometric identification device 100 according to some embodiments of the present disclosure. Layered top view of section 136A. The outline shape of the first electrode layer E1, the photosensitive element SR, and the second electrode layer E2 in plan view is basically hexagonal (for example, a regular hexagon), and the outline shape of the insulating layer portion 136A in plan view may be circular. , The actual application of the circuit can be seen by the components of each layer, and the connection mode of the circuit can be adjusted.

For example, in FIG. 3B , the first electrode layer E1 is formed as a group of four hexagons arranged in an array, and the outer contours of the four hexagons are extended and connected. In the 3D diagram, the second electrode layer E2 is a group of four hexagons arranged in an array, and the four hexagons are cross-connected. In FIG. 3C , the photosensitive elements SR are individual hexagons and are not connected to each other.

It can be understood that the contour shapes of the first electrode layer E1 , the photosensitive element SR, and the second electrode layer E2 are not limited to hexagonal shapes in plan view, for example, please refer to FIG. 4A to FIG. 4E . FIG. 4A shows a top view of another example of the first electrode layer E1 , the photosensitive element SR, and the insulating layer portion 136A filling the first light-transmitting region LT1 of the biometric authentication device 100 according to some embodiments of the present disclosure. 4B to 4E respectively illustrate the first electrode layer E1, the photosensitive element SR, the second electrode layer E2 and the insulating layer filling the first light-transmitting region LT1 of the biometric identification device 100 according to some embodiments of the present disclosure. Layered top view of another example of section 136A.

Figures 4A to 4E are basically the same as those in Figures 3A to 3E, except that the contours of the first electrode layer E1, the photosensitive element SR, and the second electrode layer E2 are basically octagonal in plan view .

Next, please return to Figure 1. The dielectric layer 144 is disposed on the insulating layer 136 . The second light-shielding portion 160 is disposed on the dielectric layer 144, wherein the second light-shielding portion 160 has a plurality of second light-transmitting regions LT2 and a second light-shielding region BR2 between two adjacent second light-transmitting regions LT2, respectively. The second light transmission area LT2 corresponds to the individual first light transmission area LT1 (for example, the center point of the individual second light transmission area LT2 overlaps with the center point of the individual first light transmission area LT1), and at least part of the spacer SP is on the substrate. The range of the orthographic projection of 110 is within the range of the orthographic projection of the second light shielding region BR2 on the substrate 110 . In some embodiments, the range of the orthographic projection of all the spacer regions SP on the substrate 110 falls within the range of the orthographic projection of the second light-shielding region BR2, and the second light-shielding region BR2 blocks all the spacer regions SP to avoid exposing the spacer regions SP, and The stray light irradiates the photosensitive element SR through the spacer SP to interfere with the detection of the fingerprint signal.

In some implementations, the material of the dielectric layer 144 may be the same as or similar to that of the dielectric layer 142 , which will not be further described here.

In some embodiments, the material of the second light-shielding region BR2 can be inorganic material, organic material, metal, other suitable materials, or a combination thereof. In some embodiments, the second light-shielding region BR2 includes the second light-shielding metal layer BM2 and the second metal oxide layer OX2 is disposed on the second light-shielding metal layer BM2. In some embodiments, the length L2 of the second light transmission area LT2 is greater than or equal to the length L1 of the first light transmission area LT1 .

Please see Figure 1. A plurality of microlenses LN are disposed on the second light-shielding portion 160, wherein individual microlenses LN correspond to individual second light-transmitting regions LT2 (for example, the central points of individual second light-transmitting regions LT2 are located on the perpendicular bisectors of individual microlenses LN) .

In some embodiments, by adjusting the radius of curvature of the microlens LN and the position of the convex part LNa of the microlens LN, the imaging of the reflected light can be adjusted (for example, the external light signal is amplified via the microlens LN), so as to obtain the fingerprint of the finger picture.

The cover plate 170 is disposed on the microlens LN. For example, in FIG. 1 , the microlens LN is directly connected to the cover plate 170 .

In some embodiments, the cover plate 170 includes at least one of a protection plate, a touch panel, and a display panel, so as to provide a function of protecting the microlens LN, or a function of touch control, or even a function of displaying an image.

Next, please see Fig. 5A and Fig. 5B. FIG. 5A shows a schematic cross-sectional view of light (such as reflected light RL and stray light SL) traveling in the biometric identification device 100 in some embodiments of the present disclosure. FIG. 5B shows a top view of part of the first light shielding portion 150 in FIG. 5A.

In Figure 5A, the distance between the center points of adjacent individual second light-transmitting regions LT2 is defined as distance P, the length of individual second light-transmitting regions LT2 is length L2, and the length of spacer SP is length S0 , the length of the first light-transmitting region LT1 is length L1, and the vertical length from the contour edge of the first light-shielding region BR1 to the contour edge of the first light-transmitting region LT1 is a vertical length L', which is projected onto an individual photosensitive element through an individual microlens LN The length of the ray range of SR (or the ray range of reflected light RL) is the length L0, in relation 1: P-L2>S0 (the length of the individual second shading area BR2 is greater than the length S0 of the spacer area SP, wherein the length The relational expression 2 of S0 is P-L1-2L'=S0), and the relational expression 3: L1+2L'>L0 (the length of the individual first light-shielding part 150 is greater than the light projected by the individual microlens LN on the individual photosensitive element SR On the premise of the length of the range L0), it is possible to avoid stray light SL (such as light with an incident angle greater than the maximum incident angle θ of the reflected light RL) from entering the photosensitive element SR from the spacer region SP. That is, designing element lengths and distances that conform to the relational expressions 1 to 3 can avoid the interference of stray light SL incident from the spacer SP, improve the accuracy of fingerprint signal detection, and at the same time retain the spacer SP to reduce the first shading area BR1 and the parasitic capacitance between the dielectric layer 142 .

In some embodiments, the length S0 of the spacer SP is in the range of 10 μm≧S≧2.5 μm. In some embodiments, the range of the vertical length L' from the contour edge of the first light-shielding region BR1 to the contour edge of the first light-transmitting region LT1 is 10 microns ≥ vertical length L' ≥ 2.5 microns.

In some embodiments, the length L2 of the individual second light-transmitting regions LT2 is in a range of 10 microns≧length L2≧2.5 microns. In some embodiments, the range of the length L1 of the first light-transmitting region LT1 is 8 microns ≥ length L1 ≥ 2.5 microns. In some embodiments, the range of the length L0 of the light range projected on the individual photosensitive element SR by the individual microlens LN is 10 microns ≥ length L0 ≥ 2.5 microns.

+L’):H0=(P+

):(H0+H1)，其中第一遮光區BR1以及第二遮光區BR2的厚度極薄，於此忽略不計) 帶入關係式1至3中 (關係式1:L1+2L’＞L0、關係式2:P-L1-2L’=S0以及關係式3:P-L2＞S0)，經整理而得關係式4:

In the 5A figure, the distance from the upper surface of the photosensitive element SR to the upper surface of the dielectric layer 142 (the dielectric layer 142 is omitted in the 5A figure, and the dielectric layer 142 can refer to the first figure) is the distance H0, and the dielectric layer 142 The distance from the upper surface of the dielectric layer 144 to the upper surface of the dielectric layer 144 (the dielectric layer 144 is omitted in the 5A figure, and the dielectric layer 144 can refer to the first figure) is the distance H1, and the upper surface of the dielectric layer 144 to the cover plate 170 The distance is the distance H2. According to the principle that when a triangle is equiangular, the side lengths are in equal proportion (for example, please refer to the triangle box B3 and triangle box B4), the distance H0 and the distance H1 are combined with the length L', the length S0, and the distance P , the relationship between length L1 (for example (

+L'):H0=(P+

): (H0+H1), where the thicknesses of the first shading region BR1 and the second shading region BR2 are extremely thin, and are ignored here) into relational expressions 1 to 3 (relational expression 1: L1+2L'>L0, Relational formula 2: P-L1-2L'=S0 and relational formula 3: P-L2>S0), after sorting out relational formula 4:

Since the first light-shielding region BR1 is directly disposed on the dielectric layer 142 , in FIG. 5A , the upper surface of the dielectric layer 142 can also be understood as the lower surface of the first light-shielding region BR1 . In addition, since the second light-shielding region BR2 is directly disposed on the dielectric layer 144 , in FIG. 5A , the upper surface of the dielectric layer 144 can also be understood as the lower surface of the second light-shielding region BR2 .

In some embodiments, the distance H0 from the upper surface of the photosensitive element SR to the upper surface of the dielectric layer 142 (not shown in FIG. 5A) (or the distance from the upper surface of the photosensitive element SR to the lower surface of the first light shielding region BR1 ) in the range of 6 microns ≥ distance H0 ≥ 2 microns. In some embodiments, the distance H1 from the upper surface of the dielectric layer 142 (not shown in Figure 5A) to the upper surface of the dielectric layer 144 (not shown in Figure 5A) (or the lower surface of the first light-shielding region BR1 to the second The distance between the lower surface of the second shading region BR2) ranges from 30 microns ≥ distance H1 ≥ 5 microns.

In one embodiment, when the length L1 is 4 microns, the length L2 is 6.5 microns, the vertical length L' is 5 microns, the distance H0 is 5 microns, and the distance H1 is 10 microns (and the length S0 is calculated as 2.9 microns by relational formula 2 micrometers), which can meet the relational expressions 1 to 4, and achieve the technical effect of blocking stray light SL from incident on the photosensitive element SR.

In some other implementations, the microlenses LN of the biometric identification device 100 may also have different arrangements.

For example, please refer to FIG. 6A. FIG. 6A shows a schematic cross-sectional view of a biometric identification device 200 in another embodiment of the present disclosure. The component configurations in FIG. 6A and FIG. 1 are basically similar, and the difference is that FIG. 6A The microlenses LN are connected to the cover plate 270 via the adhesive layer 280 . In some embodiments, the adhesive layer 280 is a transparent optical glue.

In some other implementations, the microlens LN may be disposed on the second light shielding portion 260 with the convex portion facing upward. In some implementations, an insulating layer can be optionally added between the microlens LN and the second light shielding portion 260 .

For example, please refer to FIG. 6B. FIG. 6B shows a schematic cross-sectional view of a biometric identification device 300 in another embodiment of the present disclosure. The configuration of components in FIG. 6B is basically similar to that in FIG. 1. The difference lies in that in FIG. 6B A single microlens LN is arranged on a plurality of second light-shielding parts 360, wherein the orthographic projection range of the second light transmission area LT2 on the substrate 310 is within the orthographic projection range of the microlens LN on the substrate 310, that is, the single microlens LN Corresponding to a plurality of second light-transmitting regions LT2.

Some embodiments of the present disclosure provide a biometric identification device, which separates at least one group of adjacent first light-shielding parts through spacers, prevents the first light-shielding parts from extending to cover the entire dielectric layer, and reduces the number of first light-shielding parts in the first light-shielding parts. The parasitic capacitance generated by the contact between the shading area and the dielectric layer reduces the interference of stray capacitance, improves the response of the biometric signal, and thus improves the detection accuracy of the biometric.

Although the present disclosure has been disclosed above with multiple implementations and examples, it is not intended to limit the present disclosure. Anyone skilled in the art can make various changes without departing from the spirit and scope of the present disclosure. Therefore, the scope of protection of this disclosure should be defined by the scope of the appended patent application.

100, 200, 300: biometric identification device 110, 210, 310: Substrate 120, 220, 320: buffer layer 130, 132, 134, 136, 230, 232, 234, 236, 330, 332, 334, 336: insulating layer 136A: Insulation layer part 140, 142, 144, 240, 242, 244, 340, 342, 344: dielectric layer 150, 250, 350: the first shading part 160, 260, 360: the second shading part 170, 270, 370: cover plate 280: Adhesive layer A: Groove T: active component SC: semiconductor layer GE: gate electrode S/D: source/drain region CA: passage area GI: gate dielectric layer ILD: interlayer dielectric layer SR: photosensitive element E1: the first electrode layer E2: Second electrode layer LT1: the first light transmission area BR1: the first shading area BM1: the first light-shielding metal layer OX1: the first metal oxide layer LT2: the second light transmission area BR2: Second shading area BM2: Second light-shielding metal layer OX2: the second metal oxide layer SP: Spacer RL: reflected light SL: stray light LN: microlens LNa: convex part B1: First box B2: Second box B3, B4: triangle frame L0, L1, L2: Length L': vertical length H0, H1, H2: Distance S0: length P: distance A-A: line A-A B-B: line B-B C-C: line C-C X: X-axis Y: Y-axis Z: Z-axis d: diameter

A more complete understanding of the present disclosure can be obtained by reading the following detailed description of the embodiments with reference to the accompanying drawings. FIG. 1 shows a schematic cross-sectional view of a biometric identification device according to some embodiments of the present disclosure. FIG. 2A shows a top view of the first block in the biometric identification device according to some embodiments of the present disclosure. FIG. 2B shows a top view of the second block in the biometric identification device according to some embodiments of the present disclosure. FIG. 2C shows a top view of another example of the second block in the biometric identification device according to some embodiments of the present disclosure. FIG. 2D shows the contour shape of the first light-shielding portion in a top view of the biometric identification device according to some embodiments of the present disclosure. FIG. 3A shows a top view of the first electrode layer, the photosensitive element, and the insulating layer filling the first light-transmitting region of the biometric identification device according to some embodiments of the present disclosure. Figure 3B to Figure 3E respectively depict the first electrode layer, the photosensitive element, the second electrode layer and the layers of the insulating layer filling the first light-transmitting region of the biometric identification device according to some embodiments of the present disclosure. view. FIG. 4A shows a top view of other examples of the first electrode layer, the photosensitive element, and the insulating layer filling the first light-transmitting region of the biometric authentication device according to some embodiments of the present disclosure. Figures 4B to 4E respectively illustrate other examples of the first electrode layer, the photosensitive element, the second electrode layer, and the insulating layer filling the first light-transmitting region of the biometric identification device according to some embodiments of the present disclosure. Layered top view. FIG. 5A shows a schematic cross-sectional view of light traveling through a biometric identification device in some embodiments of the present disclosure. FIG. 5B shows a top view of part of the first light-shielding portion in FIG. 5A. FIG. 6A is a schematic cross-sectional view of a biometric identification device in another embodiment of the present disclosure. FIG. 6B is a schematic cross-sectional view of a biometric identification device in another embodiment of the present disclosure.

100: Biometric identification device

110: Substrate

120: buffer layer

130, 132, 134, 136: insulating layer

136A: Insulation layer part

140, 142, 144: dielectric layer

150: the first shading part

160: the second shading part

170: cover plate

A: Groove

T: active component

SC: semiconductor layer

GE: gate electrode

S/D: source/drain region

CA: passage area

GI: gate dielectric layer

ILD: interlayer dielectric layer

SR: photosensitive element

E1: the first electrode layer

E2: Second electrode layer

LT1: the first light transmission area

BR1: the first shading area

BM1: the first light-shielding metal layer

OX1: the first metal oxide layer

LT2: the second light transmission area

BR2: Second shading zone

BM2: Second light-shielding metal layer

OX2: the second metal oxide layer

SP: Spacer

LN: microlens

LNa: convex part

B1: First box

B2: Second box

L1, L2: Length

H0, H1, H2: Distance

X: X-axis

Z: Z-axis

Claims (15)

A biometric identification device, comprising: a substrate; A plurality of photosensitive elements are arranged on the substrate; a first dielectric layer disposed on the photosensitive elements; A plurality of first light-shielding portions are arranged on the first dielectric layer, wherein each of the first light-shielding portions has a first light-transmitting region and a first light-shielding region surrounding the first light-transmitting region, and the first light-shielding region The light area corresponds to and overlaps with each of the photosensitive elements, and at least two of the first light shielding parts are separated by a spacer; a second dielectric layer disposed on the first light-shielding portions; and A second light-shielding portion disposed on the second dielectric layer, wherein the second light-shielding portion has a plurality of second light-transmitting regions and a second light-shielding portion between two adjacent second light-transmitting regions Each of the second light-transmitting regions corresponds to each of the first light-transmitting regions, and at least part of the orthographic projection range of the spacer region on the substrate is within the orthographic projection range of the second light-shielding region on the substrate. The biometric identification device according to claim 1, wherein the first light-shielding parts are separated by the spacer. The biometric identification device as claimed in claim 1, wherein some of the first light-shielding parts are connected via the first light-shielding area. The biometric identification device according to claim 1, wherein the material of the first light-shielding area is metal. The biometric identification device according to claim 4, wherein the length of the first light-transmitting region ranges from 2.5 microns to 5 microns. The biometric identification device according to claim 1, wherein the contour shape of the first light-shielding region in plan view includes a circle, a square, a pentagon, a hexagon, or an octagon. The biometric identification device as described in Claim 1, wherein the distance between the center points of the adjacent second light-transmitting regions is defined as P, the length of each of the second light-transmitting regions is L2, and the interval The length of the area is S0, the length of the first light-transmitting area is L1, and the vertical length from the outline edge of the first light-shielding area to the outline edge of the first light-transmitting area is L', projected on each of the microlenses The length of the light range of one of the photosensitive elements is L0, then P-L2>S0; P-L1-2L'=S0; and L1+2L'>L0. The biometric identification device as described in Claim 1, wherein the distance between the center points of the adjacent second light-transmitting regions is defined as P, the length of each of the second light-transmitting regions is L2, and the interval The length of the area is S0, the length of the first light-transmitting area is L1, and the vertical length from the outline edge of the first light-shielding area to the outline edge of the first light-transmitting area is L', projected on each of the microlenses The length of one light range of the photosensitive element is L0, the distance from the upper surface of the photosensitive element to the upper surface of the first dielectric layer is H0, and the distance from the upper surface of the first dielectric layer to the second dielectric layer is The distance from the upper surface is H1, then

. The biometric identification device according to claim 7 or 8, wherein, The length S0 of the spacer is in the range of 10 microns ≥ S ≥ 2.5; and The range of the vertical length L' from the outline edge of the first light-shielding area to the outline edge of the first light-transmitting area is 10 microns ≥ L' ≥ 2.5 microns. The biometric identification device according to claim 7 or 8, wherein, The range of the length L2 of each second light-transmitting region is 10 microns ≥ L2 ≥ 2.5 microns; The range of the length L1 of the first light-transmitting region is 8 microns ≥ L1 ≥ 2.5 microns; The range of the length L0 of the light range is 10 microns ≥ L0 ≥ 2.5 microns; The distance H0 from the upper surface of the photosensitive element to the upper surface of the first dielectric layer is in the range of 6 microns ≥ H0 ≥ 2 microns; and A distance H1 from the upper surface of the first dielectric layer to the upper surface of the second dielectric layer is in the range of 30 microns ≥ H1 ≥ 5 microns. The biometric identification device according to claim 1, wherein the first light-shielding region includes a first light-shielding metal layer and a first metal oxide layer is disposed on the first light-shielding metal layer. The biometric identification device according to claim 1, wherein the second light-shielding region includes a second light-shielding metal layer and a second metal oxide layer is disposed on the second light-shielding metal layer. The biometric identification device as claimed in claim 1 further includes an active element connected to the photosensitive elements. The biometric identification device as described in Claim 1, further comprising a microlens disposed on the second light-shielding part, wherein the range of the orthographic projection of the second light-transmitting regions on the substrate is located at the position of the microlens on the substrate within the orthographic projection range. The biometric identification device according to claim 1 further includes a plurality of microlenses disposed on the second light-shielding portion, wherein each of the microlenses corresponds to each of the second light-transmitting regions.

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