TW202303160A - 導電接觸針以及其製造方法 - Google Patents

導電接觸針以及其製造方法 Download PDF

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Publication number
TW202303160A
TW202303160A TW111110395A TW111110395A TW202303160A TW 202303160 A TW202303160 A TW 202303160A TW 111110395 A TW111110395 A TW 111110395A TW 111110395 A TW111110395 A TW 111110395A TW 202303160 A TW202303160 A TW 202303160A
Authority
TW
Taiwan
Prior art keywords
metal
build
conductive contact
contact pin
laminated
Prior art date
Application number
TW111110395A
Other languages
English (en)
Chinese (zh)
Inventor
安範模
朴勝浩
邊聖鉉
Original Assignee
南韓商普因特工程有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 南韓商普因特工程有限公司 filed Critical 南韓商普因特工程有限公司
Publication of TW202303160A publication Critical patent/TW202303160A/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G01R1/06761—Material aspects related to layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Manufacture Of Switches (AREA)
  • Contacts (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
TW111110395A 2021-03-30 2022-03-21 導電接觸針以及其製造方法 TW202303160A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2021-0041143 2021-03-30
KR1020210041143A KR20220135453A (ko) 2021-03-30 2021-03-30 전기 전도성 접촉핀 및 이의 제조방법

Publications (1)

Publication Number Publication Date
TW202303160A true TW202303160A (zh) 2023-01-16

Family

ID=83459350

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111110395A TW202303160A (zh) 2021-03-30 2022-03-21 導電接觸針以及其製造方法

Country Status (3)

Country Link
KR (1) KR20220135453A (ko)
TW (1) TW202303160A (ko)
WO (1) WO2022211344A1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20240137371A (ko) * 2023-03-08 2024-09-20 (주)포인트엔지니어링 금속 성형물 및 그 제조 방법과, 전기 전도성 접촉핀 및 그 제조 방법

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG75186A1 (en) 1998-11-30 2000-09-19 Advantest Corp Method for producing contact structures
JP2012048030A (ja) * 2010-08-27 2012-03-08 Kanagawa Acad Of Sci & Technol 基板の製造方法
KR101544845B1 (ko) * 2013-06-07 2015-08-18 주식회사 에이엠에스티 프로브의 제조방법 및 이 제조방법에 의해 제조된 단일체형 프로브
KR102015798B1 (ko) * 2016-11-21 2019-08-29 리노공업주식회사 검사장치용 프로브
KR101962644B1 (ko) * 2017-08-23 2019-03-28 리노공업주식회사 검사프로브 및 이를 사용한 검사장치
WO2019183548A1 (en) * 2018-03-22 2019-09-26 Formfactor, Inc. Probe tip with embedded skate

Also Published As

Publication number Publication date
WO2022211344A1 (ko) 2022-10-06
KR20220135453A (ko) 2022-10-07

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