TW202230504A - Grinding method for workpiece capable of suppressing reduction of processing efficiency and improving condition of grindstone - Google Patents
Grinding method for workpiece capable of suppressing reduction of processing efficiency and improving condition of grindstone Download PDFInfo
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- TW202230504A TW202230504A TW111102296A TW111102296A TW202230504A TW 202230504 A TW202230504 A TW 202230504A TW 111102296 A TW111102296 A TW 111102296A TW 111102296 A TW111102296 A TW 111102296A TW 202230504 A TW202230504 A TW 202230504A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B47/00—Drives or gearings; Equipment therefor
- B24B47/02—Drives or gearings; Equipment therefor for performing a reciprocating movement of carriages or work- tables
- B24B47/04—Drives or gearings; Equipment therefor for performing a reciprocating movement of carriages or work- tables by mechanical gearing only
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B47/00—Drives or gearings; Equipment therefor
- B24B47/22—Equipment for exact control of the position of the grinding tool or work at the start of the grinding operation
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B51/00—Arrangements for automatic control of a series of individual steps in grinding a workpiece
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/04—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor involving a rotary work-table
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- Microelectronics & Electronic Packaging (AREA)
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- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Description
本發明係關於一種使用研削裝置研削被加工物之被加工物之研削方法。The present invention relates to a grinding method of a workpiece for grinding a workpiece using a grinding device.
在元件晶片的製造步驟中,使用在藉由互相交叉之多條切割道(分割預定線)所劃分之多個區域分別形成有元件之晶圓。藉由沿著切割道分割此晶圓,而能獲得分別具備元件之多個元件晶片。元件晶片被組裝至行動電話、個人電腦等各種電子設備。In the manufacturing process of the device wafer, a wafer in which devices are formed in a plurality of regions divided by a plurality of dicing lines (planning lines) intersecting with each other is used. By dividing the wafer along the scribe lines, a plurality of device wafers each having devices can be obtained. Component chips are assembled into various electronic devices such as mobile phones and personal computers.
近年來,伴隨電子設備的小型化,對於元件晶片亦要求薄型化。於是,在晶圓的分割前,有時會實施使用研削裝置將晶圓研削並薄化之步驟。研削裝置具備:卡盤台,其具有保持被加工物之保持面;以及研削單元,其研削被加工物,並且,研削單元裝設有包含研削磨石之研削輪。而且,研削單元係藉由使研削輪旋轉並使研削磨石接觸被加工物而研削被加工物。In recent years, along with the miniaturization of electronic devices, thinning is also required for element wafers. Therefore, before dividing the wafer, a step of grinding and thinning the wafer using a grinding apparatus may be performed. The grinding device includes: a chuck table having a holding surface for holding a workpiece; and a grinding unit that grinds the workpiece, and the grinding unit is provided with a grinding wheel including a grinding stone. Furthermore, the grinding unit grinds the workpiece by rotating the grinding wheel and bringing the grinding stone into contact with the workpiece.
在使用研削裝置研削晶圓等被加工物時,以被卡盤台保持之被加工物的中心與研削磨石的軌道重疊之方式,調整卡盤台與研削單元之位置關係。然後,若一邊使卡盤台與研削輪分別旋轉,一邊使研削輪朝向卡盤台的保持面下降,則研削磨石的下表面接觸被加工物的上表面側而研削被加工物。此種研削方式被稱為進給研削。When grinding a workpiece such as a wafer with a grinding device, the positional relationship between the chuck table and the grinding unit is adjusted so that the center of the workpiece held by the chuck table overlaps the track of the grinding stone. Then, when the grinding wheel is lowered toward the holding surface of the chuck table while the chuck table and the grinding wheel are respectively rotated, the lower surface of the grinding stone contacts the upper surface side of the workpiece to grind the workpiece. This type of grinding is called feed grinding.
另一方面,在被加工物的研削中,有時亦使用被稱為深進緩給研削之研削方式。在深進緩給研削中,以研削磨石定位於被加工物的外側,且研削磨石的下表面定位於比被加工物的上表面更下方之方式,調整卡盤台與研削單元之位置關係。然後,在不使卡盤台旋轉且使研削輪旋轉之狀態下,使卡盤台沿著與保持面平行之方向(水平方向)移動,藉此使研削磨石的側面及下表面接觸被加工物的上表面側而研削被加工物(參考專利文獻1)。 [習知技術文獻] [專利文獻] On the other hand, in the grinding of the workpiece, a grinding method called deep feed grinding is sometimes used. In deep feed grinding, the positions of the chuck table and the grinding unit are adjusted so that the grinding stone is positioned outside the workpiece and the lower surface of the grinding stone is positioned below the upper surface of the workpiece. relation. Then, without rotating the chuck table and rotating the grinding wheel, the chuck table is moved in a direction parallel to the holding surface (horizontal direction), thereby bringing the side and lower surface of the grinding stone into contact with the workpiece to be machined The workpiece is ground on the upper surface side of the workpiece (refer to Patent Document 1). [Previously known technical literature] [Patent Literature]
[專利文獻1]日本特開2005-28550號公報[Patent Document 1] Japanese Patent Laid-Open No. 2005-28550
[發明所欲解決的課題] 研削輪所含之研削磨石係藉由以結合材(黏合材)固定由金剛石等而成之磨粒所形成。然後,藉由使從研削磨石的結合材突出之磨粒撞擊被加工物,而對被加工物施行研削加工。並且,若持續由研削磨石所進行之被加工物的研削,則結合材會磨耗,露出之磨粒會脫落,且埋在結合材的內部之磨粒會新露出。此現象被稱為自銳性,藉由自銳性而維持研削磨石的研削能力。 [Problems to be solved by the invention] The grinding stone included in the grinding wheel is formed by fixing abrasive grains made of diamond or the like with a bonding material (adhesive material). Then, grinding is performed on the workpiece by colliding the abrasive grains protruding from the bonding material of the grinding stone against the workpiece. In addition, if the grinding of the workpiece by the grinding stone is continued, the bonding material will be worn away, the exposed abrasive grains will fall off, and the abrasive grains buried in the bonding material will be newly exposed. This phenomenon is called self-sharpening, and the grinding ability of the grinding stone is maintained by the self-sharpening.
於此,在深進緩給研削中,研削磨石從被加工物的側面朝向內側撞擊而研削被加工物。因此,在研削磨石的側面側雖容易產生磨耗,但在研削磨石的下表面側不易產生磨耗。其結果,在研削磨石的下表面側中,自銳性並未以適當的頻率產生,而有時研削磨石的研削能力會降低。並且,因研削加工而產生之碎屑(研削屑)會積存在研削磨石的下表面側,而有時磨粒的突出會變得不充分(氣孔堵塞)。Here, in the deep feed grinding, the grinding stone collides inward from the side surface of the workpiece to grind the workpiece. Therefore, although abrasion is likely to occur on the side surface of the grinding stone, abrasion is less likely to occur on the lower surface side of the grinding stone. As a result, self-sharpening does not occur at an appropriate frequency on the lower surface side of the grinding stone, and the grinding ability of the grinding stone may be lowered. In addition, chips (grinding chips) generated by the grinding process may accumulate on the lower surface side of the grinding stone, and the protrusion of the abrasive grains may become insufficient (clogging of pores).
如上述,若在深進緩給研削中研削磨石的狀態惡化,則變得容易產生加工不良。因此,在深進緩給研削的中途有時會實施修整步驟,所述修整步驟係使研削磨石撞擊預定的構件而刻意地使研削磨石磨耗。然而,若施行研削磨石的修整,則被加工物的加工會中斷,加工效率會降低。As described above, when the state of the grinding stone is deteriorated during deep feed grinding, machining defects are likely to occur. Therefore, in the middle of deep feed grinding, a dressing step of intentionally abrading the grinding stone by striking the grinding stone against a predetermined member may be performed. However, when dressing the grinding stone is performed, the processing of the workpiece is interrupted, and the processing efficiency is reduced.
本發明係鑑於上述問題而完成者,其目的在於提供一種被加工物之研削方法,其能抑制加工效率的降低並改善研削磨石的狀態。The present invention was made in view of the above-mentioned problems, and an object of the present invention is to provide a method for grinding a workpiece capable of suppressing a decrease in machining efficiency and improving the state of a grinding stone.
[解決課題的技術手段] 依據本發明之一態樣,提供一種被加工物之研削方法,其使用研削裝置研削被加工物,該研削裝置具備:卡盤台,其具有保持該被加工物之保持面,且沿著與該保持面垂直之方向設定有旋轉軸;以及研削單元,其裝設有包含研削磨石之研削輪,並以該研削磨石研削該被加工物,並且,所述被加工物之研削方法包含:第一準備步驟,其以該研削磨石定位於被該卡盤台保持之該被加工物的外側,且該研削磨石的下表面定位於距離被該卡盤台保持之該被加工物的上表面預定的距離下方之方式,調整該卡盤台與該研削單元之位置關係;第一研削步驟,其在實施該第一準備步驟後,一邊使該研削輪旋轉,一邊使該卡盤台與該研削單元沿著與該保持面平行之方向相對地移動,並以該研削磨石將該被加工物從一端側研削至另一端側;第二準備步驟,其在實施該第一研削步驟後,以該卡盤台的旋轉軸與該研削磨石的軌道重疊之方式,調整該卡盤台與該研削單元之位置關係;以及第二研削步驟,其在實施該第二準備步驟後,一邊使該卡盤台與該研削輪旋轉,一邊使該卡盤台及該研削單元沿著與該保持面垂直之方向相對地移動,並以該研削磨石研削該被加工物。 [Technical means to solve the problem] According to one aspect of the present invention, there is provided a method for grinding a workpiece, which uses a grinding device to grind the workpiece, the grinding device including: a chuck table having a holding surface for holding the workpiece, and extending along the same direction as the workpiece. A rotation axis is set in the vertical direction of the holding surface; and a grinding unit is provided with a grinding wheel including a grinding stone, and the workpiece is ground with the grinding stone, and the grinding method of the workpiece includes: : The first preparation step, in which the grinding stone is positioned on the outside of the workpiece held by the chuck table, and the lower surface of the grinding stone is positioned at a distance from the workpiece held by the chuck table. The positional relationship between the chuck table and the grinding unit is adjusted by a predetermined distance below the upper surface of the upper surface; in the first grinding step, after the first preparation step is performed, the grinding wheel is rotated while the chuck is rotated. The table and the grinding unit are relatively moved along a direction parallel to the holding surface, and the workpiece is ground from one end side to the other end side with the grinding stone; the second preparation step is to perform the first grinding After the step, adjust the positional relationship between the chuck table and the grinding unit in such a way that the rotation axis of the chuck table overlaps the orbit of the grinding stone; and a second grinding step, which is performed after the second preparation step is performed , while rotating the chuck table and the grinding wheel, the chuck table and the grinding unit are moved relatively in a direction perpendicular to the holding surface, and the workpiece is ground with the grinding stone.
此外,較佳為,在該被加工物之研削方法中,將該第一準備步驟、該第一研削步驟、該第二準備步驟及該第二研削步驟分別實施兩次以上。Moreover, in the grinding method of the workpiece, preferably, the first preparation step, the first grinding step, the second preparation step, and the second grinding step are each carried out twice or more.
[發明功效] 在本發明的一態樣之被加工物之研削方法中,在實施使卡盤台與研削單元沿著與保持面平行之方向相對地移動之第一研削步驟後,實施使卡盤台與研削單元沿著與保持面垂直之方向相對地移動之第二研削步驟。藉此,促進研削磨石的下表面側的磨耗,改善研削磨石的狀態。並且,在第二研削步驟中,同時實施研削磨石的下表面側的修整與被加工物的研削。因此,在研削磨石的修整中亦持續進行被加工物的研削,而提升加工效率。 [Inventive effect] In the method for grinding a workpiece according to an aspect of the present invention, after the first grinding step of relatively moving the chuck table and the grinding unit in a direction parallel to the holding surface is performed, the chuck table and the grinding unit are subjected to grinding. A second grinding step in which the unit moves relatively in a direction perpendicular to the holding surface. Thereby, abrasion of the lower surface side of a grinding stone is accelerated, and the state of a grinding stone is improved. Furthermore, in the second grinding step, the dressing of the lower surface side of the grinding stone and the grinding of the workpiece are simultaneously performed. Therefore, the grinding of the workpiece is continued even in the dressing of the grinding stone, and the processing efficiency is improved.
以下,參照隨附圖式,說明本發明的一態樣之實施方式。首先,針對能利用本實施方式之被加工物的研削方法之研削裝置的構成例進行說明。圖1係表示研削裝置2之局部剖面側視圖。此外,在圖1中,X軸方向(第一加工進給方向、第一水平方向、前後方向)與Y軸方向(第二水平方向、左右方向)係互相垂直之方向。並且,Z軸方向(第二加工進給方向、垂直方向、上下方向、高度方向)係與X軸方向及Y軸方向垂直之方向。Hereinafter, embodiments of one aspect of the present invention will be described with reference to the accompanying drawings. First, a configuration example of a grinding apparatus that can utilize the method for grinding a workpiece of the present embodiment will be described. FIG. 1 is a partial cross-sectional side view showing the
研削裝置2具備:基台4,其支撐或容納構成研削裝置2之各構成要素。在基台4的上表面側設置有長方體狀的開口4a。而且,在開口4a的內側設置有保持被加工物11之卡盤台(保持台)6,所述被加工物11成為由研削裝置2所進行之加工的對象。卡盤台6的上表面係與X軸方向及Y軸方向大致平行之平坦面,且構成保持被加工物11之保持面6a。The
並且,在基台4的內側設置有移動機構(移動單元)8。移動機構8係與卡盤台6連結,且使卡盤台6沿著X軸方向移動。具體而言,移動機構8具備沿著X軸方向所配置之滾珠螺桿10。滾珠螺桿10螺合於與卡盤台6連結之螺帽部(未圖示)。並且,在滾珠螺桿10的端部連結有使滾珠螺桿10旋轉之脈衝馬達12。若以脈衝馬達12使滾珠螺桿10旋轉,則卡盤台6沿著X軸方向移動。Furthermore, a moving mechanism (moving means) 8 is provided inside the base 4 . The
並且,卡盤台6連結有馬達等旋轉驅動源(未圖示)。此旋轉驅動源使卡盤台6繞著與保持面6a大致垂直之旋轉軸(與Z軸方向大致平行之旋轉軸)旋轉。亦即,卡盤台6的旋轉軸係沿著與保持面6a垂直之方向而設定。In addition, a rotational drive source (not shown) such as a motor is connected to the chuck table 6 . This rotational drive source rotates the chuck table 6 about a rotation axis (a rotation axis substantially parallel to the Z-axis direction) substantially perpendicular to the
在卡盤台6及移動機構8的後方(圖1的紙面右側)設置有長方體狀的支撐構造(柱體)14。而且,在支撐構造14的正面側(前表面側)設置有移動機構(移動單元)16。移動機構16使卡盤台6與後述的研削單元28沿著與卡盤台6的保持面6a垂直之方向(Z軸方向)接近及分離。A rectangular parallelepiped-shaped support structure (column body) 14 is provided behind the chuck table 6 and the moving mechanism 8 (on the right side of the drawing in FIG. 1 ). Furthermore, a moving mechanism (moving unit) 16 is provided on the front side (front surface side) of the
具體而言,移動機構16具備固定於支撐構造14的正面側之一對導軌18。一對導軌18係以在Y軸方向中互相分離的狀態,沿著Z軸方向而配置。並且,平板狀的移動板20以能沿著導軌18滑動之狀態裝設於一對導軌18。Specifically, the
在移動板20的背面側(後表面側)設置有螺帽部22。並且,滾珠螺桿24係沿著Z軸方向而被設置於一對導軌18之間,且滾珠螺桿24與螺帽部22螺合。而且,滾珠螺桿24的端部係與使滾珠螺桿24旋轉之脈衝馬達26連結。若以脈衝馬達26使滾珠螺桿24旋轉,則移動板20沿著導軌18而在Z軸方向移動(升降)。A
在移動板20的正面側(前表面側)裝設有研削被加工物11之研削單元28。研削單元28具備固定於移動板20的正面側之中空的圓柱狀的支撐構件30。在支撐構件30容納有圓柱狀的外殼32。外殼32的下表面側係隔著以橡膠等而成之緩衝構件34而被支撐構件30的下表面支撐。A grinding
在外殼32容納有沿著Z軸方向所配置之圓柱狀的主軸36。主軸36的前端部(下端部)從外殼32露出,並透過設置於支撐構件30的底部之開口而從支撐構件30的下表面往下方突出。並且,在主軸36的基端部(上端部)連結有使主軸36旋轉之馬達等旋轉驅動源(未圖示)。A cylindrical
在主軸36的前端部固定有以金屬等而成之圓盤狀的安裝件38。而且,在安裝件38的下表面側裝設研削被加工物11之環狀的研削輪40。例如,研削輪40係藉由螺栓等固定工具而固定於安裝件38。A disk-shaped
研削輪40具備環狀的基台42,所述基台42係以鋁、不鏽鋼等金屬而成,且被形成為與安裝件38大致相同直徑。基台42的上表面側被固定於安裝件38的下表面側。並且,在基台42的下表面側固定有多個研削磨石44。例如,多個研削磨石44被形成為長方體狀,且沿著基台42的圓周方向大致等間隔地被配置成環狀。The grinding
研削磨石44係藉由以金屬結合劑、樹脂結合劑、陶瓷結合劑等結合材(黏合材)固定由金剛石、cBN(cubic Boron Nitride,立方氮化硼)等而成之磨粒所形成。但是,研削磨石44的材質、形狀、構造、大小等並無限制。並且,研削磨石44的數量亦可任意地設定。The grinding
研削輪40係藉由從與主軸36的基端部連結之旋轉驅動源透過主軸36及安裝件38所傳遞之動力,而繞著與卡盤台6的保持面6a大致垂直之旋轉軸(與Z軸方向大致平行之旋轉軸)旋轉。亦即,研削輪40的旋轉軸係沿著與保持面6a垂直之方向而設定。然後,若使旋轉之研削磨石44接觸被卡盤台6保持之被加工物11的上表面側,則將被加工物11的上表面側削去。藉此,對被加工物11施行研削加工,將被加工物11薄化。The grinding
研削裝置2的各構成要素(卡盤台6、移動機構8、移動機構16、研削單元28等)係與控制研削裝置2之控制單元(控制部、控制裝置)46連接。控制單元46生成控制研削裝置2的構成要素的動作之控制訊號,而控制研削裝置2的運行。Each component of the grinding apparatus 2 (the chuck table 6 , the moving
例如,控制單元46係藉由電腦所構成,且包含:運算部,其進行研削裝置2的運行所需之運算;及記憶部,其記憶使用於研削裝置2的運行之各種資訊(資料、程式等)。運算部係包含CPU(Central Processing Unit,中央處理器)等處理器所構成。並且,記憶部係包含發揮作為主要記憶裝置、輔助記憶裝置等的功能之各種記憶體所構成。For example, the
被加工物11在被卡盤台6保持之狀態下,被研削單元28研削。圖2係表示卡盤台6及研削單元28之立體圖。The
卡盤台6具備以SUS(不鏽鋼)等金屬、玻璃、陶瓷、樹脂等而成之圓柱狀的框體(本體部)48。在框體48的上表面48a側的中央部設置有圓柱狀的凹部48b。並且,在凹部48b嵌入有以多孔陶瓷等多孔質構件而成之圓盤狀的保持構件50。保持構件50在內部包含從保持構件50的上表面連通至下表面之空孔(流路)。保持構件50的上表面50a相當於藉由卡盤台6保持被加工物11時吸引被加工物11之吸引面。The chuck table 6 includes a cylindrical frame body (main body portion) 48 made of metal such as SUS (stainless steel), glass, ceramics, resin, or the like. A columnar recessed
凹部48b的深度與保持構件50的厚度被設定成大致相同,框體48的上表面48a與保持構件50的上表面50a配置於大致相同平面上。而且,藉由框體48的上表面48a與保持構件50的上表面50a而構成卡盤台6的保持面6a。保持面6a透過保持構件50所含之空孔、形成於框體48的內部之流路(未圖示)、閥(未圖示)等,而與噴射器等吸引源(未圖示)連接。The depth of the recessed
在卡盤台6的保持面6a上配置被加工物11。例如,被加工物11係以矽等半導體材料而成之圓盤狀的晶圓,且包含互相大致平行之正面(第一面)11a及背面(第二面)11b。The
被加工物11係藉由以互相交叉的方式配置成格子狀之多條切割道(分割預定線),而被劃分成多個矩形區域。而且,在藉由切割道所劃分之多個區域的正面11a側,分別形成有IC(Integrated Circuit,積體電路)、LSI(Large Scale Integration,大型積體電路)、LED(Light Emitting Diode,發光二極體)、MEMS(Micro Electro Mechanical Systems,微機電系統)元件等元件(未圖示)。The
藉由沿著切割道分割被加工物11,而能獲得分別具備元件之多個元件晶片。並且,在分割被加工物11前,藉由研削裝置2研削被加工物11的背面11b側而將被加工物11薄化,藉此能獲得經薄型化之元件晶片。By dividing the
但是,被加工物11的種類、材質、大小、形狀、構造等並無限制。例如,被加工物11亦可為以矽以外的半導體(GaAs、InP、GaN、SiC等)、玻璃、陶瓷、樹脂、金屬等而成之圓盤狀的晶圓(基板)。並且,被加工物11亦可為CSP(Chip Size Package,晶片尺寸封裝)基板、QFN(Quad Flat Non-leaded package,四方平面無引腳封裝)基板等封裝基板。However, the type, material, size, shape, structure, etc. of the
例如,被加工物11係以正面11a側與保持面6a對向且背面11b側在上方露出之方式被配置於卡盤台6上。若在此狀態下使吸引源的吸引力(負壓)作用於保持面6a,則被加工物11被卡盤台6吸引保持。此外,被加工物11的正面11a側亦可黏貼以樹脂等而成且保護被加工物11的正面11a側(元件)之保護片。在此情形中,被加工物11係隔著保護片而被保持在卡盤台6的保持面6a。For example, the
被卡盤台6保持之被加工物11係藉由研削輪40所含之研削磨石44而被研削並薄化。並且,在研削單元28的內部或附近,設置有用於供給純水等液體(研削液)的研削液供給路徑(未圖示)。在藉由研削磨石44研削被加工物11時,將研削液供給至被加工物11及研削磨石44。藉此,使被加工物11及研削磨石44冷卻,且洗去因研削加工而產生之碎屑(研削屑)。The
在本實施方式中,藉由實施深進緩給研削與進給研削而將被加工物11薄化,所述深進緩給研削係使卡盤台6與研削輪40沿著與保持面6a平行之方向相對地移動而研削被加工物11,所述進給研削係使卡盤台6與研削輪40沿著與保持面6a垂直之方向相對地移動而研削被加工物11。以下,說明使用研削裝置2之被加工物的研削方法的具體例。In the present embodiment, the
首先,調整卡盤台6與研削單元28之位置關係(第一準備步驟)。圖3(A)係表示第一準備步驟中之卡盤台6及研削單元28之側視圖。在第一準備步驟中,以研削磨石44定位於被卡盤台6保持之被加工物11的外側,且研削磨石44的下表面定位於距離被卡盤台6保持之被加工物11的上表面(背面11b)預定的距離下方之方式,調整卡盤台6及研削單元28的位置。First, the positional relationship between the chuck table 6 and the grinding
具體而言,以被加工物11不與研削磨輪40重疊地配置於研削輪40的前方(圖3(A)中之紙面左側)之方式,藉由移動機構8(參考圖1)控制卡盤台6在X軸方向中的位置。並且,以研削磨石44的下表面定位於比被加工物11的背面11b更下方之方式,藉由移動機構16(參考圖1)控制研削單元28在Z軸方向中的位置。此時的被加工物11的背面11b與研削磨石44的下表面之高度位置(在Z軸方向中之位置)的差ΔH,相當於後續在第一研削步驟中之被加工物11的研削量(研削前後的被加工物11的厚度的差)的目標值。Specifically, the chuck is controlled by the moving mechanism 8 (refer to FIG. 1 ) so that the
接著,一邊使研削輪40旋轉,一邊使卡盤台6與研削單元28沿著與保持面6a平行之方向相對地移動,並以研削磨石44將被加工物11從一端側研削至另一端側(第一研削步驟)。圖3(B)係表示第一研削步驟中之卡盤台6及研削單元28之側視圖。Next, while rotating the
在第一研削步驟中,藉由深進緩給研削而研削被加工物11。具體而言,首先,藉由使主軸36旋轉,而使研削輪40繞著與卡盤台6的保持面6a大致垂直之旋轉軸旋轉。例如,研削輪40的轉速被設定成1000rpm以上且3000rpm以下。In the first grinding step, the
然後,在使研削輪40旋轉之狀態下,使卡盤台6不旋轉地沿著X軸方向往研削輪40側移動(第一加工進給)。藉此,卡盤台6與研削輪40沿著與卡盤台6的保持面6a平行之方向互相接近。此外,卡盤台6的移動速度(加工進給速度)例如被設定成1mm/s以上且20mm/s以下。Then, in a state where the grinding
若卡盤台6移動,被加工物11的一端(被加工物11的移動方向中之前端,圖3(B)中之紙面右端)到達研削磨石44的軌道,則藉由研削磨石44削去被加工物11的一端部。然後,卡盤台6沿著X軸方向移動直至被加工物11的另一端(被加工物11的移動方向中之後端,圖3(B)中之紙面左端)被配置於與研削磨石44的軌道重疊之位置為止。其結果,被加工物11被從一端側研削至另一端側,而將被加工物11的整體薄化。When the chuck table 6 moves and one end of the workpiece 11 (the front end in the moving direction of the
在上述的深進緩給研削中,因研削磨石44從被加工物11的側面朝向內側撞擊並研削被加工物,故在研削磨石44的側面側容易產生磨耗,但在研削磨石44的下表面側不易產生磨耗。亦即,在研削中,研削磨石44的下表面在Z軸方向之位置不易變動。其結果,減少被加工物11的研削量的誤差。In the above-mentioned deep feed grinding, since the grinding
並且,在研削後的被加工物11的背面11b側會殘留沿著研削磨石44的軌道所形成之圓弧狀的傷痕(研削痕、鋸痕)。而且,在深進緩給研削中,因在卡盤台6不旋轉之狀態下研削被加工物11,故在研削後的被加工物11的背面11b側會大致平行地形成多條研削痕。如此,藉由使研削痕的朝向一致,而可控制研削後的被加工物11的強度的各向異性。In addition, arc-shaped flaws (grinding marks, saw marks) formed along the trajectory of the grinding
然而,如同上述,在深進緩給研削中,因在研削磨石44的下表面側不易產生磨耗,故在研削磨石44的下表面側中不易產生自銳性。並且,研削屑容易積存在研削磨石44的下表面側,而有時研削磨石44的磨粒的突出會變得不充分(氣孔堵塞)。因而,若長時間僅實施深進緩給研削,則有時研削磨石44的研削能力會降低。However, as described above, in the deep feed grinding, self-sharpening is less likely to occur on the lower surface side of the grinding
於是,在本實施方式中,在實施深進緩給研削後,藉由進給研削而研削被加工物11。藉此,促進研削磨石44的下表面側的磨耗,良好地維持研削磨石44的狀態。Therefore, in the present embodiment, after the deep feed grinding is performed, the
首先,在實施第一研削步驟後,調整卡盤台6與研削單元28之位置關係(第二準備步驟)。圖4(A)係表示第二準備步驟中之卡盤台6及研削單元28之側視圖。在第二準備步驟中,以卡盤台6的旋轉軸與研削磨石44的軌道重疊之方式,調整卡盤台6與研削單元28之位置關係。此外,研削磨石44的軌道相當於在使研削輪40旋轉時多個研削磨石44分別通過之環狀的路徑(移動路徑、旋轉路徑)。First, after the first grinding step is performed, the positional relationship between the chuck table 6 and the grinding
具體而言,首先,藉由移動機構16(參考圖1)使研削單元28上升,使研削磨石44離開被加工物11。然後,以卡盤台6的旋轉軸與研削磨石44的軌道重疊之方式,藉由移動機構8(參考圖1)控制卡盤台6在X軸方向中之位置。例如,以保持面6a的中心及被加工物11的中心與配置於研削輪40的前端部(圖4(A)中之紙面左端部)之研削磨石44重疊的方式,調整卡盤台6的位置。Specifically, first, the grinding
接著,一邊使卡盤台6與研削單元28旋轉,一邊使卡盤台6與研削單元28沿著與保持面6a垂直之方向相對地移動,並以研削磨石44研削被加工物11(第二研削步驟)。圖4(B)係表示第二研削步驟中之卡盤台6及研削單元28之側視圖。Next, while rotating the chuck table 6 and the grinding
在第二研削步驟中,對被加工物11施行進給研削。具體而言,在使卡盤台6及研削輪40旋轉之狀態下,藉由移動機構16(參照圖1)使研削單元28沿著Z軸方向下降(第二加工進給)。藉此,卡盤台6與研削輪40沿著與卡盤台6的保持面6a垂直之方向互相接近。In the second grinding step, feed grinding is performed on the
若研削磨石44的下表面接觸被加工物11的上表面(背面11b),則藉由研削磨石44而削去被加工物11的背面11b側,將被加工物11薄化。然後,持續被加工物11的研削直至被加工物11的厚度成為預定的厚度為止。When the lower surface of the grinding
在上述的第二研削步驟中,在與被加工物11接觸之研削磨石44的下表面側產生磨耗,促進自銳性且解決氣孔堵塞。亦即,與被加工物11的研削同時地進行研削磨石44的下表面側的修整。其結果,改善研削磨石44的狀態,恢復研削磨石44的研削能力。In the above-described second grinding step, abrasion occurs on the lower surface side of the grinding
在第二研削步驟中之被加工物11的加工條件被設定成對研削磨石44的下表面側施行適當的修整。例如,被加工物11的研削量被設定成10μm以上且100μm以下,較佳為20μm以上且40μm以下。並且,卡盤台6的轉速例如被設定成100rpm以上且300rpm以下。再者,研削單元28的下降速度(加工進給速度)例如被設定成0.2μm/s以上且1μm/s以下。The processing conditions of the
此外,在第二研削步驟中,相較於實施以薄化被加工物11為主要目的之一般的進給研削之情形,較佳為將研削輪40的轉速設定成低速。藉此,促進研削磨石44的下表面側的磨耗,而在短時間改善研削磨石44的狀態。具體而言,研削輪40的轉速例如較佳為2000rpm以上且3000rpm以下。In addition, in the second grinding step, it is preferable to set the rotational speed of the
其後,依序實施與第一準備步驟(參照圖3(A))相同內容的第三準備步驟以及與第一研削步驟(參照圖3(B))相同內容的第三研削步驟,而再度開始深進緩給研削。此外,在第三研削步驟中,以已藉由實施第二研削步驟而改善狀態之研削磨石44研削被加工物11。藉此,加工品質提升,抑制加工不良的產生。然後,若將被加工物11薄化至被加工物11的厚度成為預定的目標值(完工厚度),則結束被加工物11的研削加工。After that, the third preparation step having the same contents as the first preparation step (refer to FIG. 3(A) ) and the third grinding step having the same contents as the first grinding step (refer to FIG. 3(B) ) are sequentially performed, and again Start deep feed and slow feed grinding. In addition, in the third grinding step, the
上述的由研削裝置2所進行之被加工物11的研削係藉由以控制單元46(參照圖1)控制研削裝置2的各構成要素的動作而實現。具體而言,在控制單元46的記憶部記憶有程式,所述程式記述實施第一準備步驟、第一研削步驟、第二準備步驟、第二研削步驟、第三準備步驟、第三研削步驟所需之研削裝置2的各構成要素的一連串動作。然後,在執行被加工物11的研削時,控制單元46從記憶部讀取並執行程式,而將控制訊號輸出至研削裝置2的各構成要素。藉此,控制研削裝置2的運行,並自動地實施本實施方式之被加工物的研削方法。The above-described grinding of the
如同上述,在本實施方式之被加工物的研削方法中,在實施使卡盤台6與研削單元28沿著與保持面6a平行之方向相對地移動之第一研削步驟(深進緩給研削)後,實施使卡盤台6與研削單元28沿著與保持面6a垂直之方向相對地移動之第二研削步驟(進給研削)。藉此,促進在研削磨石44的下表面側之磨耗,並改善研削磨石44的狀態。As described above, in the method for grinding a workpiece according to the present embodiment, the first grinding step (deep feed grinding) in which the chuck table 6 and the grinding
並且,在第二研削步驟(進給研削)中,研削磨石44的下表面側的修整係以與被加工物11的研削同時進行之方式實施。因此,在研削磨石44的修整中亦持續進行被加工物11的研削,加工效率會提升。In addition, in the second grinding step (feed grinding), the dressing of the lower surface side of the grinding
此外,在本實施方式之被加工物的研削方法中,深進緩給研削(第一準備步驟及第一研削步驟)的實施次數及進給研削(第二準備步驟及第二研削步驟)的實施次數,可因應被加工物11的材質、研削量等而適當設定。亦即,亦可將第一準備步驟、第一研削步驟、第二準備步驟、第二研削步驟分別實施兩次以上。Further, in the method for grinding a workpiece according to the present embodiment, the number of times of performing deep feed grinding (the first preparation step and the first grinding step) and the number of times of the feed grinding (the second preparation step and the second grinding step) The number of times of execution can be appropriately set according to the material of the
例如,將深進緩給研削(第一準備步驟及第一研削步驟)連續實施一次或兩次以上後,實施一次進給研削(第二準備步驟及第二研削步驟),以改善研削磨石44的狀態。其後,藉由同樣地依序重複深進緩給研削與進給研削,而將被加工物11薄化。藉此,可良好地維持著研削磨石44的狀態,將被加工物11薄化至成為期望的厚度為止。For example, after the deep feed grinding (the first preparation step and the first grinding step) is performed one or more times in a row, the first feed grinding (the second preparation step and the second grinding step) is performed to improve the grinding stone. 44 status. Thereafter, the
但是,最後對被加工物11施行之研削加工,較佳為深進緩給研削(第三研削步驟)。藉此,降低研削加工後的被加工物11的厚度的偏差,且控制研削加工後的被加工物11的強度的各向異性。However, the final grinding operation performed on the
另外,上述實施方式之構造、方法等,在不脫離本發明之目的範圍內,則可適當變更並實施。In addition, the structure, method, etc. of the above-mentioned embodiment can be suitably changed and implemented in the range which does not deviate from the objective of this invention.
11:被加工物
11a:正面(第一面)
11b:背面(第二面)
2:研削裝置
4:基台
4a:開口
6:卡盤台(保持台)
6a:保持面
8:移動機構(移動單元)
10:滾珠螺桿
12:脈衝馬達
14:支撐構造(柱體)
16:移動機構(移動單元)
18:導軌
20:移動板
22:螺帽部
24:滾珠螺桿
26:脈衝馬達
28:研削單元
30:支撐構件
32:外殼
34:緩衝構件
36:主軸
38:安裝件
40:研削輪
42:基台
44:研削磨石
46:控制單元(控制部、控制裝置)
48:框體(本體部)
48a:上表面
48b:凹部
50:保持構件
50a:上表面
11: Processed
圖1係表示研削裝置之局部剖面側視圖。 圖2係表示卡盤台及研削單元之立體圖。 圖3(A)係表示第一準備步驟中之卡盤台及研削單元之側視圖,圖3(B)係表示第一研削步驟中之卡盤台及研削單元之側視圖。 圖4(A)係表示第二準備步驟中之卡盤台及研削單元之側視圖,圖4(B)係表示第二研削步驟中之卡盤台及研削單元之側視圖。 FIG. 1 is a partial cross-sectional side view showing a grinding apparatus. FIG. 2 is a perspective view showing a chuck table and a grinding unit. FIG. 3(A) is a side view showing the chuck table and the grinding unit in the first preparation step, and FIG. 3(B) is a side view showing the chuck table and the grinding unit in the first grinding step. 4(A) is a side view showing the chuck table and the grinding unit in the second preparation step, and FIG. 4(B) is a side view showing the chuck table and the grinding unit in the second grinding step.
2:研削裝置 2: Grinding device
4:基台 4: Abutment
4a:開口 4a: Opening
6:卡盤台(保持台) 6: Chuck table (holding table)
6a:保持面 6a: Keep Face
8:移動機構(移動單元) 8: Moving mechanism (moving unit)
10:滾珠螺桿 10: Ball screw
11:被加工物 11: Processed objects
12:脈衝馬達 12: Pulse motor
14:支撐構造(柱體) 14: Support structure (column)
16:移動機構(移動單元) 16: Moving mechanism (moving unit)
18:導軌 18: Rails
20:移動板 20: Mobile board
22:螺帽部 22: Nut part
24:滾珠螺桿 24: Ball screw
26:脈衝馬達 26: Pulse motor
28:研削單元 28: Grinding unit
30:支撐構件 30: Support member
32:外殼 32: Shell
34:緩衝構件 34: Buffer member
36:主軸 36: Spindle
38:安裝件 38: Mounting pieces
40:研削輪 40: Grinding wheel
42:基台 42: Abutment
44:研削磨石 44: Grinding Stone
46:控制單元(控制部、控制裝置) 46: Control unit (control unit, control device)
Claims (2)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2021-009275 | 2021-01-25 | ||
JP2021009275A JP2022113212A (en) | 2021-01-25 | 2021-01-25 | Method for grinding workpiece |
Publications (1)
Publication Number | Publication Date |
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TW202230504A true TW202230504A (en) | 2022-08-01 |
Family
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Application Number | Title | Priority Date | Filing Date |
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TW111102296A TW202230504A (en) | 2021-01-25 | 2022-01-20 | Grinding method for workpiece capable of suppressing reduction of processing efficiency and improving condition of grindstone |
Country Status (4)
Country | Link |
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JP (1) | JP2022113212A (en) |
KR (1) | KR20220107950A (en) |
CN (1) | CN114789371A (en) |
TW (1) | TW202230504A (en) |
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JP2005028550A (en) | 2003-07-11 | 2005-02-03 | Disco Abrasive Syst Ltd | Method for polishing wafer having crystal orientation |
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2022
- 2022-01-07 CN CN202210016768.2A patent/CN114789371A/en active Pending
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JP2022113212A (en) | 2022-08-04 |
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