TW202227809A - 光學積層膜之檢查方法及薄膜製品之製造方法 - Google Patents

光學積層膜之檢查方法及薄膜製品之製造方法 Download PDF

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Publication number
TW202227809A
TW202227809A TW110135589A TW110135589A TW202227809A TW 202227809 A TW202227809 A TW 202227809A TW 110135589 A TW110135589 A TW 110135589A TW 110135589 A TW110135589 A TW 110135589A TW 202227809 A TW202227809 A TW 202227809A
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TW
Taiwan
Prior art keywords
film
mark
optical
mentioned
peeling
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TW110135589A
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English (en)
Chinese (zh)
Inventor
古澤修也
田壷宏和
Original Assignee
日商日東電工股份有限公司
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Publication date
Application filed by 日商日東電工股份有限公司 filed Critical 日商日東電工股份有限公司
Publication of TW202227809A publication Critical patent/TW202227809A/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Polarising Elements (AREA)
TW110135589A 2021-01-08 2021-09-24 光學積層膜之檢查方法及薄膜製品之製造方法 TW202227809A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021002359A JP2022107419A (ja) 2021-01-08 2021-01-08 光学積層フィルムの検査方法及びフィルム製品の製造方法
JP2021-002359 2021-01-08

Publications (1)

Publication Number Publication Date
TW202227809A true TW202227809A (zh) 2022-07-16

Family

ID=82357835

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110135589A TW202227809A (zh) 2021-01-08 2021-09-24 光學積層膜之檢查方法及薄膜製品之製造方法

Country Status (5)

Country Link
JP (1) JP2022107419A (fr)
KR (1) KR20230127235A (fr)
CN (1) CN116710759A (fr)
TW (1) TW202227809A (fr)
WO (1) WO2022149299A1 (fr)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001165865A (ja) * 1999-12-14 2001-06-22 Sony Corp 機能フィルムの検査方法と検査装置
JP2001305070A (ja) 2000-04-19 2001-10-31 Sumitomo Chem Co Ltd シート状製品の欠陥マーキング方法および装置
US20100162865A1 (en) * 2008-12-31 2010-07-01 E.I. Du Pont De Nemours And Company Defect-containing strip and method for detecting such defects
KR101898835B1 (ko) * 2015-04-09 2018-09-13 스미또모 가가꾸 가부시키가이샤 적층 광학 필름의 결함 검사 방법, 광학 필름의 결함 검사 방법 및 적층 광학 필름의 제조 방법
KR102475056B1 (ko) * 2017-03-03 2022-12-06 스미또모 가가꾸 가부시키가이샤 결함 마킹 방법 및 결함 마킹 장치, 원반의 제조 방법 및 원반, 그리고 시트의 제조 방법 및 시트

Also Published As

Publication number Publication date
CN116710759A (zh) 2023-09-05
JP2022107419A (ja) 2022-07-21
KR20230127235A (ko) 2023-08-31
WO2022149299A1 (fr) 2022-07-14

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