WO2022149299A1 - Procédé d'inspection de films optiques stratifiés et procédé de fabrication de produits de type films - Google Patents

Procédé d'inspection de films optiques stratifiés et procédé de fabrication de produits de type films Download PDF

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Publication number
WO2022149299A1
WO2022149299A1 PCT/JP2021/030554 JP2021030554W WO2022149299A1 WO 2022149299 A1 WO2022149299 A1 WO 2022149299A1 JP 2021030554 W JP2021030554 W JP 2021030554W WO 2022149299 A1 WO2022149299 A1 WO 2022149299A1
Authority
WO
WIPO (PCT)
Prior art keywords
film
mark
defect
optical
peeling
Prior art date
Application number
PCT/JP2021/030554
Other languages
English (en)
Japanese (ja)
Inventor
修也 古澤
宏和 田壷
Original Assignee
日東電工株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日東電工株式会社 filed Critical 日東電工株式会社
Priority to CN202180089801.8A priority Critical patent/CN116710759A/zh
Priority to KR1020237021973A priority patent/KR20230127235A/ko
Publication of WO2022149299A1 publication Critical patent/WO2022149299A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects

Definitions

  • the first mark and the second mark are each composed of two or more dots arranged substantially linearly along the transport direction of the optical laminated film, and the first mark is formed.
  • One mark includes two or more dots arranged with an interval smaller than the diameter of one dot, and the second mark is arranged with an interval smaller than the diameter of the one dot. However, it does not contain two or more dots.
  • the first mark and the second mark are each composed of two or more dots arranged substantially linearly along the transport direction of the optical laminated film, and the first mark is composed of two or more dots. The dots that make up the 1st mark and the dots that make up the 2nd mark have different shapes.
  • the film product of the first group is treated as a defective product
  • the film product of the second group is re-inspected
  • the film product that has passed the re-inspection is treated as a normal product. ..
  • a first mark corresponding to a peeling manifestation defect is attached, and a second mark corresponding to a defect other than the peeling manifestation defect and having a different pattern from the first mark is attached. Since the film product with the second mark can be inspected for defects without peeling the film, the film product can be re-inspected and classified into a normal product and a defective product. According to the present invention, it is possible to improve the production efficiency of a film product while preventing defective products from being offered to the market.
  • FIG. 5 is a plan view showing another example of the first mark corresponding to a defect that can be detected by peeling off the surface protective film.
  • the reference plan view which shows the state when it is cut across the 1st mark.
  • a reference plan view for conceptually explaining how to set the mark pattern.
  • the second inspection device 32 is arranged before the separator film 13a is attached.
  • the second inspection device 32 inspects the presence or absence of bright spots on the optical film 11a before attaching the separator film 13a.
  • a cross Nicol permeation inspection is used as the second inspection device 32.
  • the bright spot is difficult to detect after the separator film 13a is attached to the back surface of the optical film 11a, and is particularly detected after the separator film 13a and the surface protective film 12a are attached to the optical film 11a. Is more difficult. This is because the phase difference shifts when the separator film 13a or the like intervenes, so that an accurate cross Nicol inspection cannot be performed on the polarizing film of the optical film 11a.
  • the defect is detected and its position is specified by the same procedure as described above.
  • the marking device 4 prints the first mark 71 on the front surface (or back surface) of the optical laminated film 1a in response to the separator-peeling manifestation defect.
  • the set of a plurality of dots represented in the vicinity of the star mark is the first mark 71 (separator-mark corresponding to the peeling manifestation defect).
  • the former is referred to as "1-A”. It is referred to as "mark 71A”, and the latter is referred to as "1-B mark 71B".
  • the second mark 72 is composed of two or more dots d arranged in the transport direction with a large interval LW.
  • the second mark 72 does not include two dots arranged in the transport direction with a small interval.
  • the second mark 72 is composed of four dots d arranged in the transport direction with a large interval LW.
  • ⁇ Manufacturing zone for film products> In the film product manufacturing zone of the system 9, a plurality of film products F are cut out from the optical laminated film 1a with the inspection and each mark.
  • the conveyors 51 and 52 convey the marked optical laminated film 1a to the downstream side.
  • the conveyors 51 and 52 having an endless belt are illustrated, but the conveyors 51 and 52 are not limited thereto.
  • the cutting device 6 is arranged on the downstream side of the marking device 4.
  • the layer structure of the obtained film product F is the same as the layer structure of the optical laminated film 1a.
  • a film product F having a substantially rectangular shape (a substantially rectangular shape or a substantially square shape) in a plan view is formed by the cutting device 6 is exemplified.
  • the formed film product F is not limited to a substantially rectangular shape (substantially rectangular shape), and is a substantially polygonal shape such as a substantially triangular shape or a substantially hexagonal shape, a substantially circular shape, a substantially elliptical shape, and a combination of these shapes. It may have a different shape.
  • a sorting device 8 having an imaging means (camera or the like), an image processing means, and a removing means is provided. Deploy.
  • the film product F is imaged by the image pickup means of the sorting device 8, and the captured image is appropriately subjected to image processing by the image processing means to obtain the product F with the first mark 71 and the product F with the second mark 72.
  • the product F with the first mark 71 and the product F with the second mark 72 are taken out from the production line by a removing means (not shown), and each is divided into a first group G1 and a second group G2 and integrated.
  • the product F without the mark is left as it is on the production line and integrated to form the third group G3.
  • the film product F of the second group G2 to be re-inspected is in a relatively small amount, even if a person inspects it precisely, it has almost no effect on the product cost. Therefore, by performing a re-inspection by at least a person, a defective product can be reliably removed as a defective product.

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Polarising Elements (AREA)

Abstract

Ce procédé de fabrication comprenant : une étape d'inspection de défauts pendant le processus de fabrication d'un film optique stratifié (1a) comprenant un film optique (11a), un film de protection superficielle et un film séparateur ; et une étape de fabrication de marques correspondant aux défauts détectés sur le film optique stratifié (1a). Une distinction est faite entre des défauts révélés par pelage, détectables par pelage du film de protection superficielle et/ou du film séparateur du film optique stratifié (1a), et des défauts autres que ceux révélés par pelage. Des premières marques (71) correspondant aux défauts révélés par pelage sont faites sur le film optique stratifié (1a) et des secondes marques (72), c'est-à-dire des marques correspondant à des défauts autres que ceux révélés par pelage et à motif différent des premières marques (71), sont faites sur le film optique stratifié (1a).
PCT/JP2021/030554 2021-01-08 2021-08-20 Procédé d'inspection de films optiques stratifiés et procédé de fabrication de produits de type films WO2022149299A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN202180089801.8A CN116710759A (zh) 2021-01-08 2021-08-20 光学层叠膜的检查方法以及膜产品的制造方法
KR1020237021973A KR20230127235A (ko) 2021-01-08 2021-08-20 광학 적층 필름의 검사 방법 및 필름 제품의 제조 방법

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021002359A JP2022107419A (ja) 2021-01-08 2021-01-08 光学積層フィルムの検査方法及びフィルム製品の製造方法
JP2021-002359 2021-01-08

Publications (1)

Publication Number Publication Date
WO2022149299A1 true WO2022149299A1 (fr) 2022-07-14

Family

ID=82357835

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2021/030554 WO2022149299A1 (fr) 2021-01-08 2021-08-20 Procédé d'inspection de films optiques stratifiés et procédé de fabrication de produits de type films

Country Status (5)

Country Link
JP (1) JP2022107419A (fr)
KR (1) KR20230127235A (fr)
CN (1) CN116710759A (fr)
TW (1) TW202227809A (fr)
WO (1) WO2022149299A1 (fr)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001165865A (ja) * 1999-12-14 2001-06-22 Sony Corp 機能フィルムの検査方法と検査装置
US20100162865A1 (en) * 2008-12-31 2010-07-01 E.I. Du Pont De Nemours And Company Defect-containing strip and method for detecting such defects
WO2016163261A1 (fr) * 2015-04-09 2016-10-13 住友化学株式会社 Procédé pour inspecter un défaut de film optique stratifié, procédé pour inspecter un défaut de film optique, et procédé de fabrication de film optique stratifié
JP2018146580A (ja) * 2017-03-03 2018-09-20 住友化学株式会社 欠陥マーキング方法及び欠陥マーキング装置、原反の製造方法及び原反、並びにシートの製造方法及びシート

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001305070A (ja) 2000-04-19 2001-10-31 Sumitomo Chem Co Ltd シート状製品の欠陥マーキング方法および装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001165865A (ja) * 1999-12-14 2001-06-22 Sony Corp 機能フィルムの検査方法と検査装置
US20100162865A1 (en) * 2008-12-31 2010-07-01 E.I. Du Pont De Nemours And Company Defect-containing strip and method for detecting such defects
WO2016163261A1 (fr) * 2015-04-09 2016-10-13 住友化学株式会社 Procédé pour inspecter un défaut de film optique stratifié, procédé pour inspecter un défaut de film optique, et procédé de fabrication de film optique stratifié
JP2018146580A (ja) * 2017-03-03 2018-09-20 住友化学株式会社 欠陥マーキング方法及び欠陥マーキング装置、原反の製造方法及び原反、並びにシートの製造方法及びシート

Also Published As

Publication number Publication date
TW202227809A (zh) 2022-07-16
KR20230127235A (ko) 2023-08-31
JP2022107419A (ja) 2022-07-21
CN116710759A (zh) 2023-09-05

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