TW202226935A - Repairing method of electronic component installing substrate, repairing material, cured prodcut and wiring substrate - Google Patents
Repairing method of electronic component installing substrate, repairing material, cured prodcut and wiring substrate Download PDFInfo
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- TW202226935A TW202226935A TW110126245A TW110126245A TW202226935A TW 202226935 A TW202226935 A TW 202226935A TW 110126245 A TW110126245 A TW 110126245A TW 110126245 A TW110126245 A TW 110126245A TW 202226935 A TW202226935 A TW 202226935A
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- electronic component
- cured product
- meth
- electronic components
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/04—Mounting of components, e.g. of leadless components
- H05K13/0486—Replacement and removal of components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02032—Preparing bulk and homogeneous wafers by reclaiming or re-processing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/483—Containers
- H01L33/486—Containers adapted for surface mounting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
- H05K3/027—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed by irradiation, e.g. by photons, alpha or beta particles
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3478—Applying solder preforms; Transferring prefabricated solder patterns
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3489—Composition of fluxes; Methods of application thereof; Other methods of activating the contact surfaces
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
- H01L2933/0066—Processes relating to semiconductor body packages relating to arrangements for conducting electric current to or from the semiconductor body
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/10—Using electric, magnetic and electromagnetic fields; Using laser light
- H05K2203/107—Using laser light
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Conductive Materials (AREA)
Abstract
Description
本發明係關於一種電子元件安裝基板之修復方法、用於其之修復材料、修復材料之固化物及具備該固化物之配線基板。The present invention relates to a repairing method of an electronic component mounting substrate, a repairing material used therefor, a cured product of the repairing material, and a wiring substrate provided with the cured product.
液晶顯示裝置等光電裝置係用作電腦或行動電話及其他各種電子設備的顯示部等,尤其液晶顯示裝置因輕量/薄型且耗電低,而廣泛用作各種電子設備的顯示部。在該等液晶顯示裝置中,大多使用在液晶面板等光電元件的背面側具備所謂的背光。Optoelectronic devices such as liquid crystal display devices are used as display parts of computers, mobile phones, and other various electronic devices, and the like. In particular, liquid crystal display devices are widely used as display parts of various electronic devices because of their light weight, thinness, and low power consumption. In many of these liquid crystal display devices, a so-called backlight provided on the back side of a photovoltaic element such as a liquid crystal panel is used.
近年來,逐漸使用LED陣列基板作為用於光電裝置等的背光。LED陣列基板係在配線基板上將多個LED晶片安裝成矩陣狀,藉由焊料等將各個LED晶片與配線基板進行電性連接而成。近來,為了背光的小型化及效率化,在LED陣列基板中,逐漸使用更小的LED晶片,將各個LED晶片積體化安裝於配線基板上。伴隨於此,在LED晶片的安裝中,開始使用被稱為各向異性導電材料的導電膠或導電膜來代替以往以焊料進行電性連接。各向異性導電材料係使導電粒子分散於絕緣性固化性樹脂黏結劑而成之材料,其係藉由將電子元件彼此(此處為配線基板與LED晶片)的電極部分進行熱壓接,僅在加壓方向上經導電粒子電性連接電子元件,相鄰之電極間則維持絕緣性,並藉由固化性樹脂黏結劑的固化將電子元件固定(例如,專利文獻1等)。In recent years, LED array substrates have been increasingly used as backlights for optoelectronic devices and the like. The LED array substrate is formed by mounting a plurality of LED chips in a matrix on a wiring substrate, and electrically connecting each LED chip and the wiring substrate by solder or the like. Recently, in order to reduce the size and efficiency of backlights, smaller LED chips are gradually used in LED array substrates, and each LED chip is integrated and mounted on a wiring substrate. Along with this, in the mounting of the LED chip, a conductive paste or a conductive film called an anisotropic conductive material has been used instead of the conventional electrical connection by solder. The anisotropic conductive material is a material obtained by dispersing conductive particles in an insulating curable resin binder. It is used by thermocompression bonding of the electrode parts of electronic components (here, the wiring board and the LED chip). Only The electronic components are electrically connected via conductive particles in the pressing direction, and the insulating properties are maintained between adjacent electrodes, and the electronic components are fixed by curing of the curable resin adhesive (for example, Patent Document 1, etc.).
使用各向異性導電材料代替焊料的優點在於可同時且在短時間內將大量LED晶片安裝於配線基板上。另一方面,相較於焊接,各向異性導電材料有再加工性不佳等的問題。亦即,若為焊接連接,可藉由將再加工標的元件加熱而輕易地將標的元件從配線基板卸下並再安裝,但若以如上述的各向異性導電材料進行連接,電子元件彼此由樹脂黏結劑牢固地接著,故無法輕易地卸下,即使在可將電子元件卸下的情況下,固化之樹脂黏結劑亦會殘留於配線基板上,因此必須利用專用的溶劑等將樹脂黏結劑去除等。The advantage of using an anisotropic conductive material instead of solder is that a large number of LED chips can be mounted on the wiring substrate simultaneously and in a short time. On the other hand, compared with soldering, anisotropic conductive materials have problems such as poor reworkability. That is, in the case of solder connection, the target element can be easily removed from the wiring board by heating the reworked target element and remounted, but if the connection is made with the anisotropic conductive material as described above, the electronic components are connected by each other. The resin adhesive is firmly attached, so it cannot be easily removed. Even if the electronic components can be removed, the cured resin adhesive will remain on the wiring board. Therefore, the resin adhesive must be removed with a special solvent, etc. remove etc.
為了應對該等課題,專利文獻2中記載了一種技術,其係在將固化之各向異性導電材殘留於配線基板的狀態下貼附新的各向異性導電膜,從而在不使用修復劑的狀態下即可將電子元件進行再壓接。 [先前技術文獻] [專利文獻] In order to cope with these problems, Patent Document 2 describes a technique in which a new anisotropic conductive film is attached in a state where the cured anisotropic conductive material is left on a wiring board, so that a repairing agent is not used. In this state, the electronic components can be re-crimped. [Prior Art Literature] [Patent Literature]
[專利文獻1]日本特開平8-003529號公報 [專利文獻2]日本特開2010-272545號公報 [Patent Document 1] Japanese Patent Application Laid-Open No. 8-003529 [Patent Document 2] Japanese Patent Application Laid-Open No. 2010-272545
[發明所欲解決之課題][The problem to be solved by the invention]
然而,專利文獻2所提出的方法中,各向異性導電膜之固化物須設計成於150℃中的彈性模量為10MPa以下,故難以獲得電子元件間的連接可靠度(耐熱性)。又,在再安裝電子元件時必須加壓,因此在使用FPC(可撓性配線基板)等作為配線基板的情況下,無法避免損傷配線基板。However, in the method proposed in Patent Document 2, since the cured product of the anisotropic conductive film needs to be designed to have an elastic modulus of 10 MPa or less at 150°C, it is difficult to obtain connection reliability (heat resistance) between electronic components. Moreover, since it is necessary to pressurize when remounting an electronic component, when using FPC (flexible wiring board) etc. as a wiring board, it is unavoidable to damage the wiring board.
再者,近年來,LED晶片邁向小型化,例如,將外形尺寸數十微米左右的LED晶片以1mm以下的相鄰間隔安裝於配線基板而成的LED陣列基板亦已實用化,然使得從配線基板卸下LED晶片進行修復變得更加困難。又,由於將不良的LED晶片卸下之空間窄小,故去除殘留於配線基板側的固化樹脂黏結劑的作業亦非常困難。雖考量使用強力去除溶劑,但在此情況下,可能會對安裝於周圍的電子元件等造成損傷。In addition, in recent years, LED chips have been miniaturized. For example, LED array substrates in which LED chips with an external dimension of about tens of microns are mounted on a wiring substrate with an adjacent interval of 1 mm or less have also been put into practical use. It becomes more difficult to remove the LED chip from the wiring board for repair. Moreover, since the space for removing the defective LED chip is narrow, the work of removing the cured resin adhesive remaining on the wiring board side is also very difficult. Although strong removal of the solvent is considered, in this case, it may cause damage to the surrounding electronic components.
本發明係鑒於這樣的課題而完成,其目的在於提供一種容易進行再加工作業,並且可獲得優異連接可靠度的電子元件安裝基板之修復方法。又,本發明之另一目的在於提供一種用於該修復方法之修復材料、修復材料之固化物及具備修復材料之固化物的配線基板。 [解決課題之手段] The present invention has been made in view of such a problem, and an object of the present invention is to provide a method of repairing an electronic component mounting board that can easily perform rework and can obtain excellent connection reliability. Another object of the present invention is to provide a repair material used in the repair method, a cured product of the repair material, and a wiring board provided with the cured product of the repair material. [Means of Solving Problems]
針對上述課題,本案發明人等得出下述見解:在再安裝電子元件前,藉由雷射照射去除以往修復電子元件安裝基板時所殘留之樹脂成分,藉此使再加工作業容易進行,並且可改善再安裝之電子元件的連接可靠度。本發明係根據所述見解而完成。亦即,本發明的目的如下。In view of the above-mentioned problems, the inventors of the present application have come to the following findings: before remounting the electronic components, the resin components remaining in the conventional repairing of the electronic component mounting board are removed by laser irradiation, thereby facilitating the reprocessing operation, and It can improve the connection reliability of re-installed electronic components. The present invention has been completed based on the above findings. That is, the object of the present invention is as follows.
[1] 一種電子元件安裝基板之修復方法,該電子元件安裝基板係經導電膏組合物之固化物使配線基板上之電極與電子元件通電的方式安裝,該方法的特徵在於具有以下步驟: 加熱一電子元件安裝區域,其至少具有未正常安裝之電子元件,以從配線基板上去除該未正常安裝之電子元件; 對去除了該電子元件之該區域照射雷射光,從該配線基板去除該導電膏組合物之固化物的全部或至少一部分;以及 在已去除該固化物之區域再安裝電子元件。 [2] 如[1]所述之方法,其中,將含有固化性樹脂之修復材料塗佈於去除了該固化物之區域或要再安裝之電子元件上,再安裝該電子元件。 [3] 如[1]或[2]所述之方法,其中,該導電膏組合物含有導電粒子,該導電粒子之光吸收波長為300nm~10600nm。 [4] 如[3]所述之方法,其中,該電子元件安裝區域係以高於該固化物之玻璃轉移溫度且在該導電粒子之熔點及以上之溫度進行加熱。 [5] 如[2]至[4]中任一項所述之方法,其中,該導電膏組合物及該修復材料含有助焊劑;以質量計,該修復材料中所含助焊劑之量相對於該導電膏組合物中所含助焊劑之量為2~10倍。 [6] 如[5]所述之方法,其中,該修復材料含有相對於該修復材料固體份1~10質量%比例之該助焊劑。 [7] 一種修復材料,係供一電子元件安裝基板去除未正常安裝之電子元件後,再安裝電子元件時使用,該電子元件安裝基板係經導電膏組合物之固化物使配線基板上之電極與電子元件通電的方式安裝;該修復材料的特徵在於: 至少含有固化性樹脂及助焊劑, 該助焊劑相對於修復材料固體份為1~20質量%。 [8] 如[7]所述之修復材料,其進一步包含導電粒子。 [9] 一種固化物,其係如[7]或[8]所述之修復材料的固化物。 [10] 一種配線基板,包含如[9]所述之固化物。 [發明之效果] [1] A method of repairing an electronic component mounting substrate, wherein the electronic component mounting substrate is mounted in such a way that electrodes on a wiring substrate and electronic components are energized through a cured product of a conductive paste composition, and the method is characterized by having the following steps: heating an electronic component mounting area, which has at least electronic components not normally installed, to remove the electronic components not normally installed from the wiring substrate; irradiating laser light to the region from which the electronic component has been removed to remove all or at least a part of the cured product of the conductive paste composition from the wiring substrate; and Reinstall the electronic components in the area where the cured product has been removed. [2] The method according to [1], wherein a repairing material containing a curable resin is applied to an area from which the cured product has been removed or an electronic component to be remounted, and the electronic component is then mounted. [3] The method according to [1] or [2], wherein the conductive paste composition contains conductive particles, and the light absorption wavelength of the conductive particles is 300 nm to 10600 nm. [4] The method according to [3], wherein the electronic component mounting region is heated at a temperature higher than the glass transition temperature of the cured product and at or above the melting point of the conductive particles. [5] The method according to any one of [2] to [4], wherein the conductive paste composition and the repair material contain a flux; the amount of the flux contained in the repair material is relative to The amount of the flux contained in the conductive paste composition is 2 to 10 times. [6] The method according to [5], wherein the repair material contains the flux in a proportion of 1 to 10% by mass relative to the solid content of the repair material. [7] A repair material, which is used for mounting electronic components after removing electronic components that are not normally mounted on an electronic component mounting substrate, the electronic component mounting substrate is cured by a conductive paste composition to make electrodes on a wiring substrate Installed in an energized manner with electronic components; this repair material is characterized by: Contains at least curable resin and flux, The flux is 1 to 20 mass % based on the solid content of the repair material. [8] The repair material according to [7], further comprising conductive particles. [9] A cured product of the repair material according to [7] or [8]. [10] A wiring board comprising the cured product according to [9]. [Effect of invention]
根據本發明,藉由對去除電子元件之電子元件安裝基板區域照射雷射光,可將殘留於配線基板的導電膏組合物之固化物去除,由此可藉由修復材料簡易且輕易地實施再加工作業,並且亦可改善再安裝之電子元件的連接可靠度。尤其在修復小型化之LED晶片時十分有效。According to the present invention, the cured product of the conductive paste composition remaining on the wiring board can be removed by irradiating a laser beam to the region of the electronic component mounting substrate from which the electronic component has been removed, so that reprocessing can be performed simply and easily with a repair material. operation, and can also improve the connection reliability of re-installed electronic components. It is especially effective in repairing miniaturized LED chips.
本發明的電子元件安裝基板之修復方法包含下述步驟:(i)加熱一電子元件安裝區域,其至少具有未正常安裝之電子元件,以從配線基板上去除該未正常安裝之電子元件的步驟;(ii)對去除了該電子元件之該區域照射雷射光,從該配線基板去除該導電膏組合物之固化物的全部或至少一部分的步驟;及(iii)在已去除該固化物之區域再安裝電子元件的步驟。The method for repairing an electronic component mounting substrate of the present invention includes the following steps: (i) heating an electronic component mounting area having at least electronic components not normally mounted, so as to remove the electronic components not normally mounted from the wiring substrate (ii) the step of irradiating laser light to the region from which the electronic component has been removed to remove all or at least a part of the cured product of the conductive paste composition from the wiring substrate; and (iii) the region where the cured product has been removed Steps for re-installing electronic components.
本發明之修復方法中使用的電子元件安裝基板係指經導電膏組合物之固化物使配線基板上之電極與電子元件通電的方式安裝的配線基板。然而,並非積極地排除藉由焊料等電性連接方式使配線基板上之電極與電子元件通電的方式安裝的電子元件安裝基板,若為經樹脂將電子元件固定(接著)於配線基板上的電子元件安裝基板,當然亦可使用本發明之修復方法。The electronic component mounting board used in the repairing method of this invention means the wiring board mounted so that the electrode on the wiring board and an electronic component may be electrically connected through the hardened|cured material of a conductive paste composition. However, an electronic component mounting board mounted in such a way that the electrodes on the wiring board and electronic components are energized by an electrical connection method such as solder is not actively excluded. Of course, the repairing method of the present invention can also be used for the component mounting substrate.
在配線基板上安裝電子元件,如上所述,通常係將各向異性導電性接著劑等的導電膏組合物塗佈於配線基板,並將各電子元件配置於配線基板上之電極位置,接著藉由加熱使組合物固化而將電子元件接著於配線基板,同時經組合物中的導電粒子進行配線基板之電極與電子元件的導通連接。加熱時,亦可視需求從電子元件側進行加壓。導電膏組合物本身為絕緣性,但導電膏組合物中所含之導電粒子因加熱而熔融,藉此夾雜於配線基板側的電極與電子元件側的電極之間,形成導電通路。結果,可進行構件間的電性連接。另一方面,在加熱後亦未夾於電極間的區域之中,導電粒子保持分散狀態,故可維持絕緣性。藉此,形成所謂的各向異性導電性連接結構體。當然,電子元件安裝基板亦可藉由上述以外的方法來製造,不限於由上述方法製造。Mounting electronic components on a wiring board, as described above, generally involves applying a conductive paste composition such as an anisotropic conductive adhesive to the wiring board, arranging each electronic component on the electrode position on the wiring board, and then using The composition is cured by heating, and the electronic component is attached to the wiring board, and at the same time, the conductive particles of the wiring board and the electronic component are electrically connected through the conductive particles in the composition. During heating, pressure can also be applied from the electronic component side as required. The conductive paste composition itself is insulating, but the conductive particles contained in the conductive paste composition are melted by heating, and are interposed between the electrodes on the wiring board side and the electrodes on the electronic component side to form conductive paths. As a result, electrical connection between the components can be performed. On the other hand, even in the region not sandwiched between the electrodes after heating, the conductive particles are kept in a dispersed state, so that the insulating properties can be maintained. Thereby, a so-called anisotropic conductive connection structure is formed. Of course, the electronic component mounting board may be manufactured by a method other than the above, and is not limited to the manufacture by the above method.
本發明之修復方法中適用的電子元件安裝基板,只要是使用上述導電膏組合物所製作之電子元件安裝基板,其製造方法並無特別限制,例如,亦可塗佈於配線基板上,經導電膏組合物將電子元件設置於配線基板上後,於配線基板上加熱電子元件,藉此將電子元件安裝於配線基板上以進行製作。The electronic component mounting substrate applicable to the repairing method of the present invention is not particularly limited as long as it is an electronic component mounting substrate produced by using the above-mentioned conductive paste composition, and the manufacturing method is not particularly limited. The paste composition mounts the electronic components on the wiring board and manufactures them by heating the electronic components on the wiring board after placing the electronic components on the wiring board.
又,作為可適用本發明之修復方法的電子元件安裝基板,可舉例如將裸晶片或LED晶片等電子元件直接設置於配線基板上而連接的晶片板(COB)等。以下針對本發明的電子元件安裝基板之修復方法進行詳細敘述。Moreover, as an electronic component mounting board|substrate to which the repairing method of this invention is applicable, for example, the chip board (COB) etc. which arrange|position electronic components, such as a bare chip or an LED chip, directly on a wiring board and are connected are mentioned. Hereinafter, the repairing method of the electronic component mounting substrate of the present invention will be described in detail.
<未正常安裝之電子元件的去除步驟> 首先,確定安裝於配線基板上之電子元件中未正常安裝之電子元件(以下稱為「不良處」)。本發明中,不良處不僅係在電子元件安裝基板中實施通電檢查時,因電子元件的缺陷而無法正常發揮功能之處,亦包含電子元件本身正常發揮功能但與配線基板之電極發生連接不良之處,以及與電子元件及配線基板之電極的連接亦正常但發生錯位等的電子元件的配置不佳之處。又,作為配線基板,不僅可為剛性印刷電路板,亦可為可撓性印刷電路板。 <Removal steps for electronic components not installed properly> First, among the electronic components mounted on the wiring board, electronic components that are not normally mounted (hereinafter referred to as "defects") are identified. In the present invention, the defects are not only those that fail to function normally due to defects of the electronic components when conducting an energization inspection on the electronic component mounting board, but also those that the electronic components themselves function normally but have poor connection with the electrodes of the wiring board. The place where the connection with the electrode of the electronic component and the wiring board is normal, but the dislocation of the electronic component is not good. Moreover, as a wiring board, not only a rigid printed wiring board but a flexible printed wiring board may be sufficient as it.
不良處的確定可以目視進行,又,亦可使用通用的檢查機械等來進行。例如,電子元件安裝基板為LED陣列基板的情況下,不良處的確定可藉由實施亮燈檢查來進行,確定未亮燈、有發光顏色、亮度等問題存在的LED晶片。Defects can be determined visually, and can also be performed using a general-purpose inspection machine or the like. For example, when the electronic component mounting substrate is an LED array substrate, defects can be identified by performing a lighting inspection to identify LED chips that are not lit, have problems such as emission color and brightness.
接著,將至少包含以上述方式所確定之不良處的電子元件安裝區域進行加熱,以從配線基板去除未正常安裝之電子元件。此處的電子元件安裝區域可僅為已確定的未正常安裝之電子元件,又,亦可為包含該電子元件的周圍區域。例如,僅1個電子元件不良時,可為安裝該電子元件之處,亦可為包含位於該電子元件周圍而正常發揮功能之電子元件的周圍區域。Next, the electronic component mounting region including at least the defect identified in the above-described manner is heated to remove the electronic component that is not normally mounted from the wiring board. The electronic component mounting area here may only be a determined electronic component that is not normally installed, and may also be a surrounding area including the electronic component. For example, when only one electronic component is defective, it may be the place where the electronic component is mounted, or the surrounding area including the electronic component that is located around the electronic component and functions normally.
作為加熱區域,只要包含已確定之電子元件即可,不良處僅為1處的情況下,可僅將該不良處加熱而去除已確定之電子元件。又,電子元件安裝基板中存在多處不良處的情況下,可將各不良處加熱,亦可將整個配線基板加熱,以去除已確定之電子元件。As the heating area, it is only necessary to include the identified electronic components, and when there is only one defect, the identified electronic components can be removed by heating only the defect. Moreover, when there are many defects in an electronic component mounting board, each defect may be heated, and the whole wiring board may be heated, and the determined electronic component may be removed.
作為加熱溫度,只要為可將安裝於配線基板之電子元件去除的溫度,則並無特別限制,但較佳為高於導電膏組合物之固化物的玻璃轉移溫度的溫度,且較佳為導電粒子之熔融固化物(亦即,導電膏組合物所含導電粒子)的熔點及以上的溫度。雖然亦因使用之導電膏組合物所包含的固化性樹脂及導電粒子而異,但較佳係以100~240℃進行加熱,更佳係以120~220℃進行,特佳為140~200℃。又,加熱時間為1~60秒,較佳為1~30秒,更佳為1~15秒。The heating temperature is not particularly limited as long as it is a temperature at which the electronic components mounted on the wiring board can be removed, but it is preferably a temperature higher than the glass transition temperature of the cured product of the conductive paste composition, and is preferably conductive The temperature of the melting point and above of the molten solidified product of the particles (that is, the conductive particles contained in the conductive paste composition). Although it also depends on the curable resin and conductive particles contained in the conductive paste composition to be used, it is preferably heated at 100 to 240°C, more preferably at 120 to 220°C, and particularly preferably at 140 to 200°C . Moreover, the heating time is 1 to 60 seconds, preferably 1 to 30 seconds, and more preferably 1 to 15 seconds.
可從配線基板上安裝有電子元件側的面進行加熱,亦可從相反側的面進行加熱,但從將對電子元件的熱損害壓到最低的觀點來看,較佳為從配線基板上與安裝有電子元件之側為相反側的面進行加熱。又,加熱方式並無特別限定,可使用各種方法,例如,僅局部加熱不良處的情況下,可應用點加熱器(spot heater)或熱烘機等的加熱方式,又,加熱整個配線基板的情況下,可適用加熱板等的面狀加熱方式。Heating can be performed from the surface on the side where the electronic components are mounted on the wiring board, or from the surface on the opposite side, but from the viewpoint of minimizing thermal damage to the electronic components, it is preferable to heat the wiring board from the surface on the side where the electronic components are mounted. The side on which the electronic components are mounted is the opposite side to be heated. Further, the heating method is not particularly limited, and various methods can be used. For example, when only a localized heating defect is required, a heating method such as a spot heater or a hot oven can be applied, and the entire wiring board can be heated. In this case, a planar heating method such as a hot plate can be applied.
藉由加熱將配線基板與電子元件固定(接著)的導電膏組合物之固化物軟化,使固化物中的導電粒子之熔融固化物進行再熔融,由此不需要施加不必要的應力即可從電子元件安裝基板去除電子元件。作為去除電子元件的方式,可使用鑷子等手動進行,又,亦可使用具備專用握持工具之去除裝置。The cured product of the conductive paste composition that fixes (bonds) the wiring board and the electronic component is softened by heating, and the molten cured product of the conductive particles in the cured product is remelted, so that unnecessary stress can be applied without applying unnecessary stress. The electronic component mounting substrate removes electronic components. As a method of removing electronic components, it can be performed manually using tweezers or the like, and a removal device provided with a dedicated holding tool can also be used.
<固化物的去除步驟> 若以上述方式從電子元件安裝基板去除確定之電子元件,則會在去除後的電子元件安裝基板表面上殘留將配線基板與電子元件接著的導電膏組合物之固化物。這些殘留物在再安裝新的電子元件時,可能成為連接不良的原因或導致電子元件的安裝錯位。在本發明中,對導電膏組合物之固化物照射雷射光,將雷射光照射的能量轉換成熱,藉由該熱將構成殘留固化物之樹脂成分去除。亦即,如上所述,對從電子元件安裝基板去除了確定之電子元件後的區域照射雷射光,將殘留於配線基板上之導電膏組合物之固化物去除。從再安裝後的電子元件之連接穩定性的觀點來看,可以說較佳係將殘留於配線基板上的全部固化物去除,但亦可不必去除全部的固化物,只要去除至少一部分即可。例如,固化物中包含樹脂成分及源自導電粒子之成分(導電粒子熔融固化而成者),可藉由雷射照射去除樹脂成分,但源自導電粒子之成分則幾乎未去除。在本發明中,從有效地去除殘留於基板之固化物的觀點來看,固化物較佳為包含固化性樹脂及可吸收雷射光波長頻帶之至少一部分的導電粒子之導電膏組合物之固化物。 <Removal step of cured product> When a certain electronic component is removed from the electronic component mounting board in the above-described manner, the cured product of the conductive paste composition for bonding the wiring board and the electronic component will remain on the surface of the electronic component mounting board after removal. These residues may cause poor connections or misplacement of electronic components when new electronic components are installed. In the present invention, the cured product of the conductive paste composition is irradiated with laser light, the energy irradiated with the laser light is converted into heat, and the resin component constituting the remaining cured product is removed by the heat. That is, as described above, laser light is irradiated to an area after removing a certain electronic component from the electronic component mounting board, and the cured product of the conductive paste composition remaining on the wiring board is removed. From the viewpoint of the connection stability of the electronic components after remounting, it can be said that it is preferable to remove all the cured products remaining on the wiring board. For example, if the cured product contains a resin component and a component derived from conductive particles (those obtained by melting and solidifying the conductive particles), the resin component can be removed by laser irradiation, but the component derived from the conductive particles is hardly removed. In the present invention, from the viewpoint of effectively removing the cured product remaining on the substrate, the cured product is preferably a cured product of a conductive paste composition comprising a curable resin and conductive particles capable of absorbing at least a part of the wavelength band of laser light .
作為照射之雷射光,只要為導電膏組合物之固化物中所含導電粒子可吸收照射光而轉換成熱的波長範圍(300nm~10600nm)即可,並無特別限制,可使用各種波長或種類的雷射光,可為連續波雷射亦可為脈衝波雷射。作為連續波雷射,例如可使用釩酸釔(YVO 4)雷射、光纖雷射、準分子雷射、綠光雷射、二氧化碳雷射、紫外線雷射、釔鋁石榴石(YAG)雷射、半導體雷射、玻璃雷射、紅寶石雷射、氦氖(He-Ne)雷射、氮氣雷射、螯合物雷射、色素雷射等。又,作為脈衝波雷射,例如可使用奈秒脈衝雷射、毫秒脈衝雷射等。 The laser light to be irradiated is not particularly limited as long as the conductive particles contained in the cured product of the conductive paste composition can absorb the irradiated light and convert it into heat in a wavelength range (300 nm to 10600 nm), and various wavelengths and types can be used. The laser light can be continuous wave laser or pulse wave laser. As the continuous wave laser, for example, yttrium vanadate (YVO 4 ) laser, fiber laser, excimer laser, green laser, carbon dioxide laser, ultraviolet laser, and yttrium aluminum garnet (YAG) laser can be used , semiconductor laser, glass laser, ruby laser, helium-neon (He-Ne) laser, nitrogen laser, chelate laser, pigment laser, etc. Moreover, as a pulse wave laser, a nanosecond pulse laser, a millisecond pulse laser, etc. can be used, for example.
雷射光的輸出只要為可去除固化物中之樹脂成分的程度即可,並無特別限制,但若輸出高則可能發生過熱而損傷基板。因此,較佳係以0.2~1.0W左右的平均輸出反復進行雷射光照射。反復次數並無特別限制,但從兼具避免基板損傷與實用性的觀點來看,較佳為5~50次左右。又,可使用連續波雷射反復進行雷射光照射,亦可使用脈衝波雷射。雷射光的光束直徑例如為5μm~200μm左右。The output of the laser light is not particularly limited as long as the resin component in the cured product can be removed, but if the output is high, overheating may occur and the substrate may be damaged. Therefore, it is preferable to repeatedly perform laser light irradiation with an average output of about 0.2 to 1.0 W. The number of repetitions is not particularly limited, but is preferably about 5 to 50 times from the viewpoint of both avoiding damage to the substrate and practicality. In addition, the laser light irradiation may be repeatedly performed using a continuous wave laser, or a pulse wave laser may be used. The beam diameter of the laser light is, for example, about 5 μm to 200 μm.
在本發明之修復方法中,在去除所安裝之電子元件時殘留於配線基板上之固化物(導電膏組合物之固化物)之中,藉由照射雷射光將主要樹脂成分分解而去除。根據雷射光照射,即使為窄小的區域,亦可確實地將固化物的全部或至少一部分去除,並且可降低對周圍的熱影響,故不易因為熱而對安裝之其他正常電子元件造成不良影響。因此,可以說適合用於修復將裸晶片或LED晶片等電子元件直接裝配於基板上而連接之晶片板(COB)等電子元件安裝基板。尤其適合用在從配線基板去除外部尺寸為0.3mm以下、更佳為0.2mm以下等的電子元件並再安裝時使用。此外,電子元件的外部尺寸係指縱、橫、高三邊之中最長邊的長度。又,亦適合用於以高密度安裝此類小型電子元件之基板的修復。例如,尤其適合用於修復相鄰電子元件間的間隔為5mm以下、較佳為4mm以下之類的電子元件安裝基板。In the repair method of the present invention, in the cured product (cured product of the conductive paste composition) remaining on the wiring board when the mounted electronic components are removed, the main resin component is decomposed and removed by irradiating laser light. According to the irradiation of laser light, even in a narrow area, all or at least a part of the cured product can be removed reliably, and the thermal influence on the surrounding can be reduced, so it is not easy to cause adverse effects on other normal electronic components installed due to heat. . Therefore, it can be said that it is suitable for repairing electronic component mounting substrates such as a chip board (COB) in which electronic components such as bare chips and LED chips are directly mounted and connected to the substrate. In particular, it is suitable for use when removing and remounting electronic components whose outer dimensions are 0.3 mm or less, more preferably 0.2 mm or less, from the wiring board. In addition, the external dimensions of electronic components refer to the length of the longest side among the three sides of the vertical, horizontal and height. Moreover, it is also suitable for the repair of the board|substrate which mounts such a small electronic component at a high density. For example, it is particularly suitable for repairing electronic component mounting substrates in which the interval between adjacent electronic components is 5 mm or less, preferably 4 mm or less.
此處,針對適用本發明之修復方法的電子元件安裝基板所適合使用之導電膏組合物進行說明。導電膏組合物一般包含固化性樹脂及導電粒子,只要不損及上述各向異性導電接著功能,亦可包含其他成分。Here, the conductive paste composition suitably used for the electronic component mounting board|substrate to which the repairing method of this invention is applied is demonstrated. The conductive paste composition generally contains curable resin and conductive particles, and may contain other components as long as the above-mentioned anisotropic conductive adhesive function is not impaired.
導電膏組合物所含固化性樹脂可發揮作為導電性微粒子之黏結劑的功能,並且兼具固化以將配線基板與電子元件固定的功能。作為固化性樹脂,較佳為受熱會固化的固化性樹脂,可舉例如環氧樹脂、酚醛樹脂、三聚氰胺樹脂、不飽和聚酯樹脂、馬來醯亞胺樹脂、聚胺基甲酸酯樹脂、聚矽氧樹脂、氰酸酯樹脂、丙烯酸樹脂等,於該等之中,較佳為使用環氧樹脂或丙烯酸樹脂,特佳為環氧樹脂。The curable resin contained in the conductive paste composition functions as a binder for the conductive fine particles, and also has a function of curing to fix the wiring board and the electronic components. The curable resin is preferably a curable resin that can be cured by heat, for example, epoxy resins, phenol resins, melamine resins, unsaturated polyester resins, maleimide resins, polyurethane resins, Silicone resin, cyanate resin, acrylic resin, etc. Among them, epoxy resin or acrylic resin is preferably used, and epoxy resin is particularly preferred.
作為環氧樹脂,只要為1分子中具有2個以上之環氧基者即可使用,並無限制。可舉例如雙酚A型環氧樹脂、雙酚F型環氧樹脂、氫化雙酚A型環氧樹脂、溴化雙酚A型環氧樹脂、雙酚S型環氧樹脂、苯酚酚醛清漆型環氧樹脂、甲酚酚醛清漆型環氧樹脂、雙酚A之酚醛清漆型環氧樹脂、聯苯型環氧樹脂、萘酚型環氧樹脂、萘型環氧樹脂、雙環戊二烯型環氧樹脂、三苯甲烷型環氧樹脂、脂環式環氧樹脂、脂肪族鏈狀環氧樹脂、含磷環氧樹脂、蔥型環氧樹脂、降莰烯型環氧樹脂、金剛烷型環氧樹脂、茀型環氧樹脂、胺基苯酚型環氧樹脂、胺基甲酚型環氧樹脂、烷基苯酚型環氧樹脂等。上述環氧樹脂可單獨使用1種或組合2種以上使用。The epoxy resin is not limited as long as it has two or more epoxy groups in one molecule. For example, bisphenol A type epoxy resin, bisphenol F type epoxy resin, hydrogenated bisphenol A type epoxy resin, brominated bisphenol A type epoxy resin, bisphenol S type epoxy resin, phenol novolac type epoxy resin can be mentioned. Epoxy resin, cresol novolak epoxy resin, bisphenol A novolac epoxy resin, biphenyl epoxy resin, naphthol epoxy resin, naphthalene epoxy resin, dicyclopentadiene ring Oxygen resin, triphenylmethane-type epoxy resin, alicyclic epoxy resin, aliphatic chain epoxy resin, phosphorus-containing epoxy resin, onion-type epoxy resin, norbornene-type epoxy resin, adamantane-type epoxy resin Oxygen resin, phenolic epoxy resin, aminophenol type epoxy resin, aminocresol type epoxy resin, alkylphenol type epoxy resin, etc. The said epoxy resin can be used individually by 1 type or in combination of 2 or more types.
上述環氧樹脂之中,從使組合物為膏狀形態的觀點而言,液狀優於固狀。具體而言,較佳為雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚E型環氧樹脂。作為該等樹脂的市售品,可舉例如NIPPON STEEL Chemical & Material Co., Ltd.製ZX-1059(雙酚A型/雙酚F型環氧樹脂之混合物)、三菱化學股份有限公司製jER-828、同公司製jER-834、同公司製jER-1001(雙酚A型環氧樹脂)、同公司製jER-807、同公司製jER-4004P(雙酚F型環氧樹脂)、AIR WATER INC.製R710(雙酚E型環氧樹脂)等。Among the above epoxy resins, a liquid state is preferable to a solid state from the viewpoint of making the composition into a paste form. Specifically, a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, and a bisphenol E type epoxy resin are preferable. As commercial products of these resins, for example, ZX-1059 (mixture of bisphenol A type/bisphenol F type epoxy resin) manufactured by NIPPON STEEL Chemical & Material Co., Ltd., and jER manufactured by Mitsubishi Chemical Co., Ltd. -828, the same company's jER-834, the same company's jER-1001 (bisphenol A type epoxy resin), the same company's jER-807, the same company's jER-4004P (bisphenol F type epoxy resin), AIR R710 (bisphenol E type epoxy resin) manufactured by WATER INC. etc.
作為丙烯酸樹脂,只要為具有(甲基)丙烯酸基之樹脂即可,並無特別限制,可舉例如三羥甲基丙烷三甲基丙烯酸酯、具有三甲基丙烷骨架之環氧丙烯酸酯等的三官能之甲基丙烯酸酯單體等。於該等之中,較佳可使用單官能(甲基)丙烯酸酯、雙官能(甲基)丙烯酸酯、三官能以上之多官能(甲基)丙烯酸酯、環氧(甲基)丙烯酸酯、胺基甲酸酯(甲基)丙烯酸酯、雙官能以上之聚酯(甲基)丙烯酸酯。The acrylic resin is not particularly limited as long as it has a (meth)acrylic group, and examples thereof include trimethylolpropane trimethacrylate, epoxy acrylate having a trimethylpropane skeleton, and the like. Trifunctional methacrylate monomers, etc. Among them, monofunctional (meth)acrylates, bifunctional (meth)acrylates, polyfunctional (meth)acrylates of trifunctional or more, epoxy (meth)acrylates, Urethane (meth)acrylate, polyester (meth)acrylate with more than bifunctional.
作為單官能(甲基)丙烯酸酯,可舉例如(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸二級丁酯、(甲基)丙烯酸三級丁酯、(甲基)丙烯酸丁氧基乙酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸辛基庚酯、(甲基)丙烯酸壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十一酯、(甲基)丙烯酸十二酯、(甲基)丙烯酸十三酯、(甲基)丙烯酸十四酯、(甲基)丙烯酸十五酯、(甲基)丙烯酸十六酯、(甲基)丙烯酸十八酯、(甲基)丙烯酸二十二酯、(甲基)丙烯酸2-羥乙酯、(甲基)丙烯酸2-羥丙酯、(甲基)丙烯酸3-氯基-2-羥丙酯、(甲基)丙烯酸2-羥丁酯等脂肪族(甲基)丙烯酸酯、(甲基)丙烯酸環戊酯、(甲基)丙烯酸環己酯、 (甲基)丙烯酸二環戊酯、(甲基)丙烯酸二環戊烯酯、(甲基)丙烯酸異莰酯、(甲基)丙烯酸3-甲基-3-氧雜環丁烷基甲酯、(甲基)丙烯酸1-金剛烷酯等脂環式(甲基)丙烯酸酯、(甲基)丙烯酸苯酯、(甲基)丙烯酸壬基苯酯、(甲基)丙烯酸對枯基苯酯、(甲基)丙烯酸鄰聯苯酯、(甲基)丙烯酸1-萘酯、(甲基)丙烯酸2-萘酯、(甲基)丙烯酸芐酯、(甲基)丙烯酸2-羥基-3-苯氧基丙酯、(甲基)丙烯酸2-羥基-3-(鄰苯基苯氧基)丙酯、(甲基)丙烯酸2-羥基-3-(1-萘氧基)丙酯、(甲基)丙烯酸2-羥基-3-(2-萘氧基)丙酯等芳香族(甲基)丙烯酸酯、(甲基)丙烯酸2-四氫糠酯、N-(甲基)丙烯醯氧基乙基六氫鄰苯二甲醯亞胺、2-(甲基)丙烯醯氧基乙基-N-咔唑等雜環式(甲基)丙烯酸酯。Examples of monofunctional (meth)acrylates include methyl (meth)acrylate, ethyl (meth)acrylate, propyl (meth)acrylate, isopropyl (meth)acrylate, and (meth)acrylate. Butyl acrylate, isobutyl (meth)acrylate, tertiary butyl (meth)acrylate, tertiary butyl (meth)acrylate, butoxyethyl (meth)acrylate, amyl (meth)acrylate Esters, Hexyl (Meth)acrylate, 2-Ethylhexyl (Meth)acrylate, Heptyl (Meth)acrylate, Octylheptyl (Meth)acrylate, Nonyl (Meth)acrylate, (Meth) Decyl acrylate, undecyl (meth)acrylate, dodecyl (meth)acrylate, tridecyl (meth)acrylate, tetradecyl (meth)acrylate, pentadecyl (meth)acrylate, ( Cetyl (meth)acrylate, octadecyl (meth)acrylate, behenyl (meth)acrylate, 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, ( Aliphatic (meth)acrylates such as 3-chloro-2-hydroxypropyl meth)acrylate, 2-hydroxybutyl (meth)acrylate, cyclopentyl (meth)acrylate, cyclopentyl (meth)acrylate Hexyl ester, dicyclopentyl (meth)acrylate, dicyclopentenyl (meth)acrylate, isobornyl (meth)acrylate, 3-methyl-3-oxetane (meth)acrylate Alicyclic (meth)acrylates such as methyl ester, 1-adamantyl (meth)acrylate, phenyl (meth)acrylate, nonylphenyl (meth)acrylate, p-cumyl (meth)acrylate Phenyl (meth)acrylate, o-biphenyl (meth)acrylate, 1-naphthyl (meth)acrylate, 2-naphthyl (meth)acrylate, benzyl (meth)acrylate, 2-hydroxy (meth)acrylate -3-Phenoxypropyl, 2-hydroxy-3-(o-phenylphenoxy)propyl (meth)acrylate, 2-hydroxy-3-(1-naphthoxy)propyl (meth)acrylate Esters, aromatic (meth)acrylates such as 2-hydroxy-3-(2-naphthyloxy)propyl (meth)acrylate, 2-tetrahydrofurfuryl (meth)acrylate, N-(methyl) Heterocyclic (meth)acrylates such as acryloxyethylhexahydrophthalimide and 2-(meth)acryloyloxyethyl-N-carbazole.
作為雙官能(甲基)丙烯酸酯,可舉例如乙二醇二(甲基)丙烯酸酯、二乙二醇二(甲基)丙烯酸酯、三乙二醇二(甲基)丙烯酸酯、四乙二醇二(甲基)丙烯酸酯、聚乙二醇二(甲基)丙烯酸酯、丙二醇二(甲基)丙烯酸酯、二丙二醇二(甲基)丙烯酸酯、三丙二醇二(甲基)丙烯酸酯、四丙二醇二(甲基)丙烯酸酯、聚丙二醇二(甲基)丙烯酸酯、1,3-丁二醇二(甲基)丙烯酸酯、2-甲基-1,3-丙二醇二(甲基)丙烯酸酯、1,4-丁二醇二(甲基)丙烯酸酯、新戊二醇二(甲基)丙烯酸酯、3-甲基-1,5-戊二醇二(甲基)丙烯酸酯、1,6-己二醇二(甲基)丙烯酸酯、2-丁基-2-乙基-1,3-丙二醇二(甲基)丙烯酸酯、1,9-壬二醇二(甲基)丙烯酸酯、1,10-癸二醇二(甲基)丙烯酸酯、甘油二(甲基)丙烯酸酯、三環癸烷二甲醇(甲基)丙烯酸酯等脂肪族(甲基)丙烯酸酯、環己烷二甲醇(甲基)丙烯酸酯、三環癸烷二甲醇(甲基)丙烯酸酯、氫化雙酚A二(甲基)丙烯酸酯、氫化雙酚F二(甲基)丙烯酸酯等脂環式(甲基)丙烯酸酯、雙酚A二(甲基)丙烯酸酯、雙酚F二(甲基)丙烯酸酯、雙酚AF二(甲基)丙烯酸酯、乙氧化雙酚A二(甲基)丙烯酸酯、茀型二(甲基)丙烯酸酯等芳香族(甲基)丙烯酸酯、異三聚氰酸二(甲基)丙烯酸酯等雜環式(甲基)丙烯酸酯。As the bifunctional (meth)acrylate, for example, ethylene glycol di(meth)acrylate, diethylene glycol di(meth)acrylate, triethylene glycol di(meth)acrylate, tetraethylene glycol Glycol di(meth)acrylate, polyethylene glycol di(meth)acrylate, propylene glycol di(meth)acrylate, dipropylene glycol di(meth)acrylate, tripropylene glycol di(meth)acrylate , tetrapropylene glycol di(meth)acrylate, polypropylene glycol di(meth)acrylate, 1,3-butanediol di(meth)acrylate, 2-methyl-1,3-propanediol di(methyl)acrylate ) acrylate, 1,4-butanediol di(meth)acrylate, neopentyl glycol di(meth)acrylate, 3-methyl-1,5-pentanediol di(meth)acrylate , 1,6-hexanediol di(meth)acrylate, 2-butyl-2-ethyl-1,3-propanediol di(meth)acrylate, 1,9-nonanediol di(methyl)acrylate ) acrylates, aliphatic (meth)acrylates such as 1,10-decanediol di(meth)acrylate, glycerol di(meth)acrylate, tricyclodecane dimethanol (meth)acrylate, Lipids such as cyclohexanedimethanol (meth)acrylate, tricyclodecanedimethanol (meth)acrylate, hydrogenated bisphenol A di(meth)acrylate, hydrogenated bisphenol F di(meth)acrylate, etc. Cyclic (meth)acrylate, bisphenol A di(meth)acrylate, bisphenol F di(meth)acrylate, bisphenol AF di(meth)acrylate, ethoxylated bisphenol A di(meth)acrylate Aromatic (meth)acrylates such as base) acrylates and phenylephrine di(meth)acrylates, and heterocyclic (meth)acrylates such as isocyanuric acid di(meth)acrylates.
作為三官能以上之多官能(甲基)丙烯酸酯,可舉例如三羥甲基丙烷三(甲基)丙烯酸酯、季戊四醇三(甲基)丙烯酸酯、二-三羥甲基丙烷四(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇五(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、乙氧化甘油三(甲基)丙烯酸酯等脂肪族(甲基)丙烯酸酯、異三聚氰酸三(甲基)丙烯酸酯等雜環式(甲基)丙烯酸酯。Tri- or higher polyfunctional (meth)acrylates include, for example, trimethylolpropane tri(meth)acrylate, pentaerythritol tri(meth)acrylate, and di-trimethylolpropane tetra(meth)acrylate. ) acrylate, pentaerythritol tetra(meth)acrylate, dipentaerythritol penta(meth)acrylate, dipentaerythritol hexa(meth)acrylate, ethoxylated glycerol tri(meth)acrylate and other aliphatic (meth)acrylates Heterocyclic (meth)acrylates such as acrylates and isocyanuric tri(meth)acrylates.
導電膏組合物中亦可包含其他固化性樹脂。例如,除了上述環氧樹脂以外,亦可包含多官能環氧樹脂。作為多官能環氧樹脂,可舉例如作為羥基二苯甲酮型液狀環氧樹脂的ADEKA Corporation製EP-3300E等、作為胺基苯酚型液狀環氧樹脂(對胺基苯酚型液狀環氧樹脂)的三菱化學股份有限公司製jER-630、住友化學股份有限公司製ELM-100等、作為縮水甘油胺型環氧樹脂的三菱化學股份有限公司製jER-604、NIPPON STEEL Chemical & Material Co., Ltd.製EPOTOHTOYH-434、住友化學工業股份有限公司製SUMI-EPOXY ELM-120、作為苯酚酚醛清漆型環氧樹脂的Dow Chemical公司製DEN-431等。該等多官能環氧樹脂可單獨使用1種或組合2種以上使用。Other curable resins may be contained in the conductive paste composition. For example, a polyfunctional epoxy resin may be contained in addition to the above-mentioned epoxy resin. Examples of the polyfunctional epoxy resin include EP-3300E manufactured by ADEKA Corporation, which is a hydroxybenzophenone-type liquid epoxy resin, and an aminophenol-type liquid epoxy resin (p-aminophenol-type liquid epoxy resin). Oxygen resin) jER-630 made by Mitsubishi Chemical Co., Ltd., ELM-100 made by Sumitomo Chemical Co., Ltd., etc., glycidylamine type epoxy resins made by Mitsubishi Chemical Co., Ltd. jER-604, NIPPON STEEL Chemical & Material Co. ., EPOTOHTOYH-434 manufactured by Ltd., SUMI-EPOXY ELM-120 manufactured by Sumitomo Chemical Co., Ltd., DEN-431 manufactured by Dow Chemical Co., Ltd. as a phenol novolak epoxy resin, and the like. These polyfunctional epoxy resins can be used individually by 1 type or in combination of 2 or more types.
導電膏組合物中亦可包含用以使上述固化性樹脂固化的固化劑。作為固化劑,可使用一般用於使熱固性樹脂固化的習知固化劑,例如胺類、咪唑類、多官能酚類、酸酐、異氰酸酯類、及包含該等官能基之聚合物類,亦可視需求使用該等多種成分。胺類有雙氰胺、二胺二苯甲烷等。咪唑類有烷基取代咪唑、苯并咪唑等。又,咪唑化合物亦可為咪唑加成物等的咪唑潛伏性固化劑。多官能酚類有氫醌、間苯二酚、雙酚A及其鹵化物、進一步為此與醛之縮合物的酚醛清漆、甲階酚醛樹脂等。酸酐有鄰苯二甲酸酐、六氫鄰苯二甲酸酐、甲基萘二酸酐(Methyl Nadic Anhydride)、二苯甲酮四羧酸等。異氰酸酯類有甲伸苯基二異氰酸酯、異佛爾酮二異氰酸酯等,亦可使用以酚類等遮蔽該異氰酸酯而成者。該等固化劑可單獨使用1種或組合2種以上使用。The conductive paste composition may contain a curing agent for curing the above-mentioned curable resin. As the curing agent, conventional curing agents generally used for curing thermosetting resins can be used, such as amines, imidazoles, polyfunctional phenols, acid anhydrides, isocyanates, and polymers containing these functional groups, and can also be customized as required Use these various ingredients. Amines include dicyandiamide, diamine diphenylmethane and the like. Imidazoles include alkyl-substituted imidazoles, benzimidazoles, and the like. In addition, the imidazole compound may be an imidazole latent curing agent such as an imidazole adduct. The polyfunctional phenols include hydroquinone, resorcinol, bisphenol A and its halides, further novolaks, resole resins, etc., which are condensates with aldehydes. Acid anhydrides include phthalic anhydride, hexahydrophthalic anhydride, Methyl Nadic Anhydride, benzophenone tetracarboxylic acid and the like. Examples of the isocyanates include tolyl diisocyanate, isophorone diisocyanate, and the like, and those obtained by masking the isocyanate with phenols or the like may also be used. These curing agents may be used alone or in combination of two or more.
藉由調整固化劑或固化促進劑的種類或摻合量,可控制樹脂的固化速度,但從各向異性導電性的觀點來看,樹脂的反應溫度(固化溫度)較佳為高於下述導電粒子的熔點,更佳為高出5℃以上。藉由使樹脂的反應溫度(固化溫度)高於導電粒子的熔點,可使組合物中已分散之導電粒子在樹脂固化之前自凝集(autoagglutination)。The curing speed of the resin can be controlled by adjusting the type or compounding amount of the curing agent or curing accelerator, but from the viewpoint of anisotropic conductivity, the reaction temperature (curing temperature) of the resin is preferably higher than the following: The melting point of the conductive particles is more preferably higher than 5°C. By making the reaction temperature (curing temperature) of the resin higher than the melting point of the conductive particles, the dispersed conductive particles in the composition can be autoagglutinated before the resin is cured.
關於固化性樹脂、以及固化劑或固化促進劑的選定,亦可為固化後的樹脂著色之類的組合。如下所述,導電粒子較佳為具有吸收雷射光而轉換成熱能的功能,但即使在導電粒子不吸收雷射光的情況下,只要已固化之樹脂可吸收雷射光而轉換成熱能者即可。亦即,已固化之樹脂能夠吸收雷射光波長頻帶之至少一部分的波長頻帶。藉由使樹脂成分吸收雷射光而轉換成熱能,可提升固化物中樹脂成分的去除性。Regarding the selection of curable resin and curing agent or curing accelerator, a combination such as coloring of the cured resin may be used. As described below, the conductive particles preferably have the function of absorbing the laser light and converting it into thermal energy, but even if the conductive particles do not absorb the laser light, the cured resin only needs to be able to absorb the laser light and convert it into thermal energy. That is, the cured resin can absorb at least a part of the wavelength band of the laser light wavelength band. The removability of the resin component in the cured product can be improved by converting the resin component into thermal energy by absorbing the laser light.
作為導電粒子,只要為具有導電性之材料則可使用,並無特別限制,但較佳可使用能夠吸收雷射光的波長頻帶之至少一部分者,可舉例如金、銀、鎳、銅、鉛及下述的低熔點焊料粒子等。導電粒子亦可為以金屬層被覆作為核之玻璃、陶瓷、塑膠等非導電性粒子的複合粒子、具有該非導電粒子與金屬粒子之複合粒子。若此導電粒子為上述複合粒子或熱熔性金屬粒子,則可藉由加熱,導電粒子會熔融變形,故連接時與電極的接觸面積將增加,而可獲得特別高的可靠度。此外,作為此導電粒子,亦可使用銀被覆銅粒子、具有細微金屬粒子大量連結成鏈狀之形狀的金屬粒子。The conductive particles can be used as long as they are conductive materials without particular limitations, but preferably those that can absorb at least a part of the wavelength band of the laser light can be used, for example, gold, silver, nickel, copper, lead, and The following low melting point solder particles and the like. The conductive particles may also be composite particles in which non-conductive particles such as glass, ceramics, and plastics are coated with a metal layer as a core, or composite particles including the non-conductive particles and metal particles. If the conductive particles are the above-mentioned composite particles or hot-melt metal particles, the conductive particles can be melted and deformed by heating, so the contact area with the electrodes during connection increases, and particularly high reliability can be obtained. In addition, as the conductive particles, silver-coated copper particles and metal particles having a shape in which a large number of fine metal particles are connected in a chain shape can also be used.
在本發明中,若導電膏組合物之固化物中包含導電粒子,則藉由固化物之去除步驟時的雷射光照射,使固化物中的導電粒子吸收雷射光而轉換成光能,以局部加熱固化物。結果,認為主要構成固化物之樹脂成分熱分解,而去除固化物的全部或至少一部分。In the present invention, if the cured product of the conductive paste composition contains conductive particles, the conductive particles in the cured product are irradiated with laser light during the removal step of the cured product, so that the conductive particles in the cured product absorb the laser light and are converted into light energy, so that the localized Heat the cured product. As a result, it is considered that the resin component mainly constituting the cured product is thermally decomposed, and all or at least a part of the cured product is removed.
作為導電粒子,較佳為熱熔性導電粒子,特佳為使用於170℃以下加熱而熔融的導電粒子,其中,更佳為低熔點焊料粒子,更佳為Sn-Pb系、Sn-Bi系低熔點焊料粒子。此外,低熔點焊料粒子意即熔點在200℃以下、較佳在170℃以下、更佳在150℃以下的焊料粒子。特別是從上述不良電子元件的去除步驟中容易去除電子元件的觀點來看,導電粒子的熔點可高於或低於上述固化性樹脂之固化物的玻璃轉移溫度。The conductive particles are preferably thermally fusible conductive particles, particularly preferably those that are melted by heating at 170° C. or lower, among them, low-melting solder particles are more preferred, and Sn-Pb-based and Sn-Bi-based are more preferred Low melting point solder particles. In addition, the low melting point solder particles mean solder particles having a melting point of 200°C or lower, preferably 170°C or lower, and more preferably 150°C or lower. In particular, the melting point of the conductive particles may be higher or lower than the glass transition temperature of the cured product of the above-mentioned curable resin, from the viewpoint of easy removal of electronic components in the above-mentioned step of removing defective electronic components.
又,作為低熔點焊料粒子,較佳為不含鉛的焊料粒子,此不含鉛之焊料粒子意即JIS Z 3282:2017(焊料-化學成分及形狀)所規定的含鉛率0.10質量%以下的焊料粒子。In addition, the low melting point solder particles are preferably lead-free solder particles, and the lead-free solder particles mean a lead content rate of 0.10 mass % or less as defined in JIS Z 3282:2017 (Solder-Chemical Composition and Shape). solder particles.
作為不含鉛之焊料粒子,宜使用選自由錫、鉍、銦、銅、銀、銻之1種以上之金屬所構成的低熔點焊料粒子。特別是從成本、處理性、接合強度之平衡觀點來看,較佳為使用錫(Sn)與鉍(Bi)之合金。As the lead-free solder particles, low-melting solder particles composed of at least one metal selected from the group consisting of tin, bismuth, indium, copper, silver, and antimony are preferably used. In particular, it is preferable to use an alloy of tin (Sn) and bismuth (Bi) from the viewpoint of the balance of cost, handleability, and bonding strength.
此類低熔點焊料粒子中Bi含量比例可在15~65質量%,較佳在35~65質量%,更佳在55~60質量%的範圍內適當選擇。The content ratio of Bi in such low melting point solder particles can be appropriately selected within the range of 15 to 65 mass %, preferably 35 to 65 mass %, and more preferably 55 to 60 mass %.
藉由使Bi的含量比例為15質量%以上,該合金約於160℃開始熔融。若進一步增加Bi的含量比例,則熔融起始溫度將逐漸降低,20質量%以上之熔融起始溫度將變成139℃,58質量%則變成共晶組成。因此,藉由使Bi的含量比例為15~65質量%的範圍,可充分獲得低熔點化的效果,結果,即使在低溫下亦可獲得充分的導通連接。By making the content ratio of Bi to 15 mass % or more, the alloy starts to melt at about 160°C. If the content ratio of Bi is further increased, the melting onset temperature will gradually decrease, the melting onset temperature of 20 mass % or more becomes 139°C, and 58 mass % becomes a eutectic composition. Therefore, by setting the content ratio of Bi in the range of 15 to 65 mass %, the effect of lowering the melting point can be sufficiently obtained, and as a result, sufficient conduction can be obtained even at low temperature.
導電粒子較佳為球狀。此處,球狀的導電粒子係指在可確認導電粒子形狀的倍率下,包含90%以上的球狀粉之長徑與短徑的比為1~1.5者。又,導電粒子其平均粒徑較佳為1~100μm,更佳為3~80μm,再佳為5~60μm。此外,在本說明書中,平均粒徑係指使用雷射繞射式粒度分布計所測量的中位直徑(D50)。The conductive particles are preferably spherical. Here, spherical conductive particles refer to those containing 90% or more of spherical powder at a magnification at which the shape of the conductive particles can be confirmed, and the ratio of the major axis to the minor axis is 1 to 1.5. In addition, the average particle diameter of the conductive particles is preferably 1 to 100 μm, more preferably 3 to 80 μm, and even more preferably 5 to 60 μm. In addition, in this specification, the average particle diameter means the median diameter (D50) measured using a laser diffraction particle size distribution analyzer.
又,導電粒子其比表面積較佳為300cm 2/g~2000cm 2/g,更佳為500cm 2/g~1500cm 2/g。藉由使用比表面積在上述範圍的導電粒子,配線基板之電極與電子元件的導通連接的穩定性提升。此外,導電粒子的比表面積意即以BET法所測量的值,具體而言,可使已知一個分子大小的非活性氣體(例如氮氣)吸附於測量試樣的表面,從其吸附量與非活性氣體的占有面積求出比表面積。 In addition, the specific surface area of the conductive particles is preferably 300 cm 2 /g to 2000 cm 2 /g, more preferably 500 cm 2 /g to 1500 cm 2 /g. By using the conductive particles with the specific surface area in the above-mentioned range, the stability of the conductive connection between the electrodes of the wiring board and the electronic components is improved. In addition, the specific surface area of the conductive particles means the value measured by the BET method. Specifically, an inert gas with a known molecular size (such as nitrogen) can be adsorbed on the surface of the measurement sample, and the amount of adsorption is related to the non-reactive gas. The occupied area of the active gas was used to obtain the specific surface area.
導電粒子的摻合量相對於導電膏組合物中的固體份較佳為20~70質量%,更佳為30~60質量%,特佳為40~50質量%的範圍。藉由使導電粒子的摻合量為20質量%以上,可確保配線基板與電子元件間的密合性並確保充分的導通連接。又,藉由使導電粒子的摻合量為70質量%以下,可確保導通連接性並確保充分的密合性。The blending amount of the conductive particles is preferably 20 to 70% by mass, more preferably 30 to 60% by mass, and particularly preferably 40 to 50% by mass relative to the solid content in the conductive paste composition. By making the compounding quantity of an electrically conductive particle into 20 mass % or more, adhesiveness between a wiring board and an electronic component can be ensured, and sufficient conduction|electrical_connection can be ensured. Moreover, by making the compounding quantity of an electroconductive particle into 70 mass % or less, it is possible to secure the electrical conductivity and secure sufficient adhesiveness.
除了固化性樹脂及導電性微粒子以外,導電膏組合物亦可包含其他成分。為了提高導通連接的穩定性,導電膏組合物中亦可包含助焊劑。作為助焊劑,可使用導電膏組合物中已使用的習知助焊劑,可舉例如氯化鋅、氯化鋅與無機鹵化物之混合物、氯化鋅與無機酸之混合物、熔融鹽、磷酸、磷酸之衍生物、有機鹵化物、聯胺、有機酸、松脂等。該等助焊劑可單獨使用1種或組合2種以上使用。In addition to the curable resin and the conductive fine particles, the conductive paste composition may contain other components. In order to improve the stability of the conductive connection, the conductive paste composition may also contain flux. As the flux, conventional fluxes used in the conductive paste composition can be used, such as zinc chloride, a mixture of zinc chloride and inorganic halide, a mixture of zinc chloride and inorganic acid, molten salt, phosphoric acid, Derivatives of phosphoric acid, organic halides, hydrazine, organic acids, rosin, etc. These fluxes can be used alone or in combination of two or more.
上述助焊劑之中,宜使用有機酸。作為較佳的有機酸,除了單羧酸以外,可舉例如二羧酸、三羧酸、四羧酸等多羧酸。作為單羧酸,可舉例如甲酸、乙酸、丙酸、丁酸、戊酸、己酸、庚酸、癸酸、月桂酸、十四酸、十五酸、軟脂酸、十七酸、硬脂酸、結核硬脂酸、二十酸、二十二酸、二十四酸、乙醇酸等。作為二羧酸,可舉例如草酸、丙二酸、琥珀酸、戊二酸、己二酸、庚二酸、辛二酸、壬二酸、癸二酸、富馬酸、馬來酸、酒石酸、二乙醇酸等。作為三羧酸,可舉例如苯-1,2,5-三羧酸、1,2,4-苯三甲酸、1,2,3-丙烷三羧酸等。又,作為四羧酸,可舉例如二苯甲酮四羧酸、1,2,3,4-丁烷四羧酸等。該等羧酸之中,較佳為二羧酸,更佳為戊二酸、己二酸,特佳為己二酸。Among the above-mentioned fluxes, organic acids are preferably used. As a preferable organic acid, other than monocarboxylic acid, polycarboxylic acid, such as a dicarboxylic acid, a tricarboxylic acid, and a tetracarboxylic acid, is mentioned, for example. Examples of the monocarboxylic acid include formic acid, acetic acid, propionic acid, butyric acid, valeric acid, caproic acid, heptanoic acid, capric acid, lauric acid, tetradecanoic acid, pentadecanoic acid, palmitic acid, heptadecanoic acid, and hexadecanoic acid. Fatty acid, tuberculous stearic acid, eicosic acid, behenic acid, behenic acid, glycolic acid, etc. Examples of the dicarboxylic acid include oxalic acid, malonic acid, succinic acid, glutaric acid, adipic acid, pimelic acid, suberic acid, azelaic acid, sebacic acid, fumaric acid, maleic acid, and tartaric acid. , Diglycolic acid, etc. As tricarboxylic acid, benzene-1,2,5-tricarboxylic acid, 1,2,4-benzenetricarboxylic acid, 1,2,3-propanetricarboxylic acid etc. are mentioned, for example. Moreover, as a tetracarboxylic acid, benzophenone tetracarboxylic acid, 1, 2, 3, 4- butane tetracarboxylic acid etc. are mentioned, for example. Among these carboxylic acids, dicarboxylic acid is preferred, glutaric acid and adipic acid are more preferred, and adipic acid is particularly preferred.
導電膏組合物中助焊劑的含量相對於組合物中的固體份較佳為0.5~15質量%,更佳為0.5~10質量%。藉由使用助焊劑的含量在上述範圍內的導電膏組合物,可進一步提升導通連接性。The content of the flux in the conductive paste composition is preferably 0.5 to 15 mass %, more preferably 0.5 to 10 mass % with respect to the solid content in the composition. Conductivity can be further improved by using a conductive paste composition having a flux content within the above range.
又,為了調整助焊劑的活性度,亦可包含鹼性有機化合物。作為鹼性有機化合物,可舉例如苯胺鹽酸鹽及氫氯酸肼等。Moreover, in order to adjust the activity degree of a flux, a basic organic compound may be contained. As a basic organic compound, aniline hydrochloride, hydrazine hydrochloride, etc. are mentioned, for example.
再者,為了提高固化物的物理強度等,可視需求於導電膏組合物中摻合填料。作為填料,可使用習知的無機或有機填料,但特佳為使用硫酸鋇、球狀二氧化矽、水滑石及滑石。又,可將用於獲得阻燃性的金屬氧化物或氫氧化鋁等金屬氫氧化物作為體質顏料填料。該等填料之中,較佳可使用具有能夠吸收雷射光的波長頻帶之至少一部分的波長頻帶者,可舉例如氧化鈦等。藉由包含該等填料,可使固化物容易將吸收的雷射光轉換成熱能,使固化物中的樹脂成分去除性提升。Furthermore, in order to improve the physical strength of the cured product, etc., a filler may be blended into the conductive paste composition as required. As the filler, known inorganic or organic fillers can be used, but barium sulfate, spherical silica, hydrotalcite, and talc are particularly preferably used. In addition, metal oxides for obtaining flame retardancy and metal hydroxides such as aluminum hydroxide can be used as extender pigment fillers. Among these fillers, those having a wavelength band capable of absorbing at least a part of the wavelength band of laser light can be preferably used, for example, titanium oxide and the like. By including these fillers, the cured product can easily convert the absorbed laser light into thermal energy, thereby improving the removability of the resin component in the cured product.
又,在摻合填料的情況下,為了提高導電膏組合物中的分散性,填料亦可經過表面處理。藉由使用經表面處理之填料,可抑制凝集。表面處理方法並無特別限定,只要使用習知慣用的方法即可,但較佳係以具有固化性反應基之表面處理劑,例如以具有固化性反應基作為有機基的偶合劑等將無機填料的表面進行處理。In addition, in the case of blending a filler, in order to improve the dispersibility in the conductive paste composition, the filler may be surface-treated. Aggregation can be suppressed by using a surface-treated filler. The surface treatment method is not particularly limited, as long as a conventional method is used, but it is preferably a surface treatment agent with a curable reactive group, such as a coupling agent with a curable reactive group as an organic group, etc. surface treatment.
作為偶合劑,可使用矽烷系、鈦酸酯系、鋁酸酯系及鋁鋯酸酯系等的偶合劑。其中較佳為矽烷系偶合劑。作為所述矽烷系偶合劑的例子,可舉例如乙烯基三甲氧基矽烷、乙烯基三乙氧基矽烷、N-(2-胺基甲基)-3-胺基丙基甲基二甲氧基矽烷、N-(2-胺基乙基)-3-胺基丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-苯胺基丙基三甲氧基矽烷、3-環氧丙氧基丙基三甲氧基矽烷、3-環氧丙氧基丙基甲基二甲氧基矽烷、2-(3,4-環氧環己基)乙基三甲氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-巰基丙基三甲氧基矽烷等,該等可單獨使用1種或組合2種以上使用。As the coupling agent, silane-based, titanate-based, aluminate-based, and aluminozirconate-based coupling agents can be used. Among them, a silane-based coupling agent is preferable. Examples of the silane-based coupling agent include vinyltrimethoxysilane, vinyltriethoxysilane, N-(2-aminomethyl)-3-aminopropylmethyldimethoxy Silane, N-(2-aminoethyl)-3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-anilinopropyltrimethoxysilane, 3- Glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldimethoxysilane, 2-(3,4-epoxycyclohexyl)ethyltrimethoxysilane, 3- Methacryloyloxypropyltrimethoxysilane, 3-mercaptopropyltrimethoxysilane, etc. may be used alone or in combination of two or more.
從製備容易度及塗佈性的觀點來看,亦可於導電膏組合物中摻合有機溶劑。作為有機溶劑,可使用甲乙酮、環己酮等酮類;甲苯、二甲苯、四甲基苯等芳香族烴類;賽路蘇、甲基賽路蘇、丁基賽路蘇、卡必醇、甲基卡必醇、丁基卡必醇、丙二醇單甲醚、二丙二醇單甲醚、二丙二醇二乙醚、二乙二醇單甲醚乙酸酯、三丙二醇單甲醚等二醇醚類;乙酸乙酯、乙酸丁酯、乳酸丁酯、乙酸賽路蘇、丁基賽路蘇乙酸酯、卡必醇乙酸酯、丁基卡必醇乙酸酯、丙二醇單甲醚乙酸酯、二丙二醇單甲醚乙酸酯、碳酸丙烯酯等酯類;辛烷、癸烷等脂肪族烴類;石油醚、石油腦、溶劑石油腦等石油系溶劑等的習知慣用之有機溶劑。該等有機溶劑可單獨使用1種或組合2種以上使用。From the viewpoint of ease of preparation and coatability, an organic solvent may be blended in the conductive paste composition. As the organic solvent, ketones such as methyl ethyl ketone and cyclohexanone can be used; aromatic hydrocarbons such as toluene, xylene, and tetramethylbenzene; Methyl carbitol, butyl carbitol, propylene glycol monomethyl ether, dipropylene glycol monomethyl ether, dipropylene glycol diethyl ether, diethylene glycol monomethyl ether acetate, tripropylene glycol monomethyl ether and other glycol ethers; Ethyl acetate, butyl acetate, butyl lactate, celusol acetate, butyl cyluthol acetate, carbitol acetate, butyl carbitol acetate, propylene glycol monomethyl ether acetate, Commonly used organic solvents such as esters such as dipropylene glycol monomethyl ether acetate and propylene carbonate; aliphatic hydrocarbons such as octane and decane; and petroleum-based solvents such as petroleum ether, naphtha, and solvent naphtha. These organic solvents may be used alone or in combination of two or more.
<電子元件的再安裝步驟> 如上所述,於去除固化物之全部或至少一部分的區域再安裝該電子元件。電子元件的再安裝,可將修復材料塗佈於配線基板上配置電子元件之區域或要再安裝之電子元件,設置電子元件後,加熱使修復材料固化,藉此將配線基板與電子元件固定(接著),以再安裝該電子元件。加熱時,亦可視需求從電子元件側進行加壓。以下說明在配線基板上再安裝電子元件時使用之修復材料。 <Reinstallation procedure of electronic components> As described above, the electronic component is remounted in the area where all or at least a part of the cured product is removed. For the re-installation of electronic components, the repair material can be applied to the area where the electronic components are arranged on the wiring substrate or the electronic components to be re-installed. After the electronic components are installed, the repair material is cured by heating, thereby fixing the wiring substrate and the electronic components ( Next), to re-install the electronic components. During heating, pressure can also be applied from the electronic component side as required. The following describes the repair materials used when remounting electronic components on the wiring board.
本發明之修復方法中使用的修復材料必須具有將已去除固化物之配線基板與再安裝之電子元件接著的功能。因此,修復材料含有固化性樹脂。作為固化性樹脂,可使用與上述導電膏組合物中使用的固化性樹脂相同者。在本發明之修復方法中,如上所述,藉由照射雷射光將殘留於配線基板上之固化物去除時,雖然構成固化物之樹脂成分熱分解而從配線基板去除,固化物中所含導電粒子的熔融固化物由於照射雷射光進行加熱而再熔融,但通常不會分解或蒸發,而在附著於配線基板上之電極上的狀態下殘留。因此,藉由加熱至殘留之導電粒子會再熔融的溫度,可使配線基板之電極與電子元件導通連接。又,修復材料中所含固化性樹脂藉由加熱而固化變成固化物,故可將電子元件固定(接著)於配線基板。The repairing material used in the repairing method of the present invention must have the function of adhering the wiring board from which the cured product has been removed and the electronic component to be remounted. Therefore, the repair material contains curable resin. As curable resin, the same thing as the curable resin used for the said conductive paste composition can be used. In the repair method of the present invention, as described above, when the cured product remaining on the wiring board is removed by irradiating laser light, although the resin component constituting the cured product is thermally decomposed and removed from the wiring board, the conductive material contained in the cured product is removed from the wiring board. The molten solidified product of the particles is heated and remelted by irradiation with laser light, but usually does not decompose or evaporate, and remains in a state of adhering to the electrodes on the wiring board. Therefore, by heating to a temperature at which the remaining conductive particles are remelted, the electrodes of the wiring board and the electronic components can be electrically connected. Moreover, since the curable resin contained in the repair material is cured by heating and becomes a cured product, the electronic component can be fixed (bonded) to the wiring board.
修復材料除了固化性樹脂以外亦包含助焊劑。作為助焊劑,可使用與上述導電膏組合物中使用的助焊劑相同者。在本發明中,如上所述,藉由照射雷射光將殘留於配線基板上之固化物中的樹脂成分去除時,固化物中的導電粒子之熔融固化物在將雷射光的光能轉換成熱時進行氧化。特別是接觸空氣之熔融固化物表面也可能形成氧化膜。因此,若再安裝該電子元件,由於氧化膜的影響,配線基板之電極與電子元件的導通連接可能發生缺陷。在本發明中,修復材料包含助焊劑,藉此可抑制氧化膜的影響而提升導通連接性。The repair material contains flux in addition to curable resin. As the flux, the same ones as those used in the above-mentioned conductive paste composition can be used. In the present invention, as described above, when the resin component in the cured product remaining on the wiring board is removed by irradiating the laser light, the molten cured product of the conductive particles in the cured product converts the light energy of the laser light into heat Oxidation occurs. In particular, an oxide film may also form on the surface of the molten solidified product in contact with the air. Therefore, when the electronic component is mounted again, the conductive connection between the electrode of the wiring board and the electronic component may be defective due to the influence of the oxide film. In the present invention, the repair material contains the flux, whereby the influence of the oxide film can be suppressed and the electrical conductivity can be improved.
從導通連接性的觀點來看,以質量計,修復材料中所含的助焊劑含量相對於上述導電膏組合物中所含助焊劑之含量較佳為2~10倍,更佳為4~6倍。又,從導通連接性的觀點來看,助焊劑的含量相對於修復材料固體份較佳為1~20質量%。From the viewpoint of electrical continuity, the content of the flux contained in the repair material is preferably 2 to 10 times, more preferably 4 to 6 times, by mass relative to the content of the flux contained in the above-mentioned conductive paste composition. times. Moreover, it is preferable that content of a flux is 1-20 mass % with respect to the solid content of a repair material from a viewpoint of electrical continuity.
即使修復材料不含導電粒子,如上所述,亦可將配線基板之電極與再安裝之電子元件導通連接,但修復材料亦可包含導電粒子。作為導電粒子,可使用與上述導電膏組合物中使用的導電粒子相同者。修復材料中包含導電粒子時,其摻合量相對於修復材料中的固體份較佳為20~70質量%,更佳為30~60質量%,再佳為35~55質量%。Even if the repair material does not contain conductive particles, as described above, the electrodes of the wiring board can be electrically connected to the electronic components to be remounted, but the repair material may also include conductive particles. As the conductive particles, the same ones as those used in the above-mentioned conductive paste composition can be used. When the repair material contains conductive particles, the blending amount thereof is preferably 20 to 70% by mass, more preferably 30 to 60% by mass, and still more preferably 35 to 55% by mass relative to the solid content in the repair material.
又,修復材料中可包含與導電膏組合物相同的成分(例如,填料或有機溶劑等),其摻合量亦可與導電膏組合物為相同程度。In addition, the repair material may contain the same components as the conductive paste composition (for example, fillers, organic solvents, etc.), and the blending amount may be the same as the conductive paste composition.
將修復材料塗佈於再安裝該電子元件之區域(亦即,以照射雷射光去除固化物之區域)的方法、或將修復材料塗佈於要再安裝之電子元件的方法並無特別限制,從可局部塗佈的觀點來看,可舉例如隔著網眼或金屬遮罩藉由刮板進行塗佈的方法、使用分注器(dispenser)進行塗佈的方法。該等塗佈方法之中,從可簡易且輕易地將修復材料塗佈於預期區域的觀點而言,較佳為使用分注器進行塗佈的方法。在將裸晶片或LED晶片等電子元件直接裝配於基板上而連接的晶片板(COB)等電子元件安裝基板中,即使是窄小的區域,也能夠以適當的塗佈量確實地塗佈修復材料。使用分注器塗佈修復材料時,可將填充有修復材料之狀態的注射器裝設於分注器,一邊調節吐出量一邊將修復材料塗佈於預期的區域。修復材料亦可塗佈於再安裝該電子元件之區域及要再安裝之電子元件兩者。The method of applying the repair material to the area where the electronic component is to be reinstalled (that is, the area where the cured product is removed by irradiating laser light), or the method of applying the repair material to the electronic component to be reinstalled is not particularly limited, From the viewpoint of being partially coatable, for example, a method of coating with a squeegee through a mesh or a metal mask, and a method of coating using a dispenser are exemplified. Among these coating methods, the method of coating using a dispenser is preferred from the viewpoint that the repair material can be easily and easily coated on a desired area. In electronic component mounting substrates such as a wafer board (COB) in which electronic components such as bare chips or LED chips are directly mounted on the substrate and connected, even a narrow area can be reliably coated with an appropriate coating amount and repaired Material. When applying the repair material using a dispenser, a syringe filled with the repair material can be attached to the dispenser, and the repair material can be applied to a desired area while adjusting the discharge volume. Repair material can also be applied to both the area where the electronic component is to be reinstalled and the electronic component to be reinstalled.
將修復材料塗佈再安裝該電子元件之區域或電子元件後,在已塗佈修復材料之再安裝區域配置電子元件並加熱。修復材料因加熱而固化,同時殘留於基板電極之導電粒子的熔融固化物再熔融,從而將配線基板之電極與電子元件導通連接,並將電子元件固定(接著)於電子元件安裝基板,藉此完成修復。加熱時,亦可視需求從電子元件側進行加壓。After the repairing material is applied to the area where the electronic component is installed or the electronic component is installed, the electronic component is arranged and heated in the reinstallation area where the repairing material has been applied. The repair material is cured by heating, and at the same time, the molten solidified product of the conductive particles remaining on the substrate electrode is remelted, thereby conducting the connection between the electrode of the wiring substrate and the electronic component, and fixing (then) the electronic component to the electronic component mounting substrate. Complete the repair. During heating, pressure can also be applied from the electronic component side as required.
加熱時的溫度只要是可使修復材料固化並且使殘留於配線基板之電極上的導電粒子之熔融固化物可再熔融的溫度即可,並無特別限制,可為100~240℃,較佳為120~200℃,更佳為145~200℃。在不損及導通連接性的範圍內,亦可在加熱的同時視需求進行加壓以將電子元件進行壓接。進行加熱壓接的情況下,係以0.5~5.0MPa、較佳以0.8~3.0MPa、更佳以1.0~2.0MPa進行壓接,加熱時間為1~60秒,較佳為1~30秒,更佳為1~15秒。若為此加熱或壓接條件,再安裝之電子元件、安裝於周圍的電子元件將不會因加熱或壓接而受損,故可確保導通連接。The temperature during heating is not particularly limited as long as the repair material can be cured and the molten solidified product of the conductive particles remaining on the electrodes of the wiring board can be remelted, and it can be 100 to 240°C, preferably 120~200℃, more preferably 145~200℃. As long as the electrical conductivity is not impaired, the electronic components can also be crimped by applying pressure as required while heating. In the case of thermocompression bonding, the compression bonding is performed at 0.5 to 5.0 MPa, preferably 0.8 to 3.0 MPa, more preferably 1.0 to 2.0 MPa, and the heating time is 1 to 60 seconds, preferably 1 to 30 seconds. More preferably, it is 1 to 15 seconds. If this heating or crimping condition is used, the re-installed electronic components and the surrounding electronic components will not be damaged by heating or crimping, so the conductive connection can be ensured.
根據本發明,亦提供一種上述修復材料之固化物。於修復材料之固化物中,加熱時的溫度等製作條件,例如前述所述。According to the present invention, a cured product of the above repair material is also provided. In the cured product of the repair material, the production conditions such as the temperature during heating are as described above.
又,根據本發明,亦提供一種具備上述固化物之配線基板。作為具備修復材料之固化物的配線基板種類,可舉例如印刷電路板、玻璃基板、陶瓷基板上具有配線層之基板等。配線基板可為單面或雙面,亦可為多層。Moreover, according to this invention, the wiring board provided with the said hardened|cured material is also provided. As a kind of wiring board provided with the hardened|cured material of a repair material, the board|substrate etc. which have a wiring layer on a printed wiring board, a glass substrate, a ceramic substrate, etc. are mentioned, for example. The wiring board may be single-sided or double-sided, and may be multilayered.
根據本發明,包含以下實施形態。 [1]一種電子元件安裝基板之修復方法,該電子元件安裝基板係經導電膏組合物之固化物使配線基板上之電極與電子元件通電的方式安裝,該導電膏組合物包含固化性樹脂及可吸收雷射光的波長頻帶之至少一部分的導電粒子,該方法的特徵在於具有以下步驟: 確定未正常安裝該電子元件之不良處; 加熱一電子元件安裝區域,其至少包含該不良處,以從配線基板去除該確定之電子元件; 對去除了該電子元件之該區域照射雷射光,去除該導電膏組合物之固化物的全部或至少一部分; 將含有固化性樹脂之修復材料塗佈於去除了該固化物之區域或要再安裝之電子元件上,在去除了該電子元件之配線基板之電極上載置電子元件,使該修復材料固化,以再安裝該電子元件。 [2] 如[1]所述之方法,其中,該導電膏組合物相對於導電膏組合物中的固體份,以20~70質量%的比例包含該導電粒子。 [3] 如[1]或[2]所述之方法,其中,該導電粒子之光吸收波長為300nm~10600nm。 [4] 如[1]至[3]中任一項所述之方法,其中,該電子元件安裝區域係以高於該固化物之玻璃轉移溫度且在該導電粒子之熔點及以上之溫度進行加熱。 [5] 如[1]至[4]中任一項所述之方法,其中,該導電粒子的比表面積為300cm 2/g~2000cm 2/g。 [6] 如[1]至[5]中任一項所述之方法,其中,該導電膏組合物及該修復材料含有助焊劑;以質量計,該修復材料中所含助焊劑之量相對於該導電膏組合物中所含助焊劑之量為2~10倍。 [7] 如[1]至[6]中任一項所述之方法,其中,該修復材料含有相對於該修復材料固體份1~10質量%比例之該助焊劑。 [8] 如[1]至[7]中任一項所述之方法,其中,該助焊劑包含羧酸化合物。 [9] 如[1]至[8]中任一項所述之方法,其中,該固化性樹脂為環氧樹脂。 [10] 如[1]至[9]中任一項所述之方法,其中,該電子元件具有1mm以下的外部尺寸。 [11] 如[1]至[10]中任一項所述之方法,其中,電子元件安裝基板與相鄰之電子元件的間隔為5mm以下。 [12] 一種修復材料,係供一電子元件安裝基板去除未正常安裝之電子元件後,再安裝電子元件時使用,該電子元件安裝基板係經導電膏組合物之固化物使配線基板上之電極與電子元件通電的方式安裝;該修復材料的特徵在於: 至少含有固化性樹脂及助焊劑; 該助焊劑相對於該修復材料固體份為1~20質量%。 [13] 如[12]所述之修復材料,其進一步包含導電粒子。 [實施例] According to the present invention, the following embodiments are included. [1] A method of repairing an electronic component mounting substrate, wherein the electronic component mounting substrate is mounted in such a way that electrodes on a wiring substrate and electronic components are energized through a cured product of a conductive paste composition, the conductive paste composition comprising a curable resin and Conductive particles capable of absorbing at least a part of the wavelength band of laser light, the method is characterized by having the following steps: determining the defect that the electronic component is not normally mounted; Removing the determined electronic component from the wiring board; irradiating the region from which the electronic component has been removed with laser light to remove all or at least a part of the cured product of the conductive paste composition; applying a repair material containing curable resin to the removed On the area of the cured product or the electronic component to be remounted, the electronic component is placed on the electrode of the wiring board from which the electronic component has been removed, and the repair material is cured to remount the electronic component. [2] The method according to [1], wherein the conductive paste composition contains the conductive particles in a ratio of 20 to 70 mass % with respect to the solid content in the conductive paste composition. [3] The method according to [1] or [2], wherein the light absorption wavelength of the conductive particles is 300 nm to 10600 nm. [4] The method according to any one of [1] to [3], wherein the electronic component mounting region is performed at a temperature higher than the glass transition temperature of the cured product and at or above the melting point of the conductive particles heating. [5] The method according to any one of [1] to [4], wherein the conductive particles have a specific surface area of 300 cm 2 /g to 2000 cm 2 /g. [6] The method according to any one of [1] to [5], wherein the conductive paste composition and the repair material contain a flux; and, on a mass basis, the amount of the flux contained in the repair material is relative to The amount of the flux contained in the conductive paste composition is 2-10 times. [7] The method according to any one of [1] to [6], wherein the repair material contains the flux in a proportion of 1 to 10% by mass relative to the solid content of the repair material. [8] The method according to any one of [1] to [7], wherein the flux contains a carboxylic acid compound. [9] The method according to any one of [1] to [8], wherein the curable resin is an epoxy resin. [10] The method of any one of [1] to [9], wherein the electronic component has an outer dimension of 1 mm or less. [11] The method according to any one of [1] to [10], wherein the distance between the electronic component mounting substrate and the adjacent electronic components is 5 mm or less. [12] A repair material for use when mounting electronic components after removing electronic components that are not normally mounted on an electronic component mounting substrate, the electronic component mounting substrate is cured by a conductive paste composition to make electrodes on a wiring substrate It is installed in a way of electrifying electronic components; the repair material is characterized in that: it contains at least a curable resin and a flux; the flux is 1-20 mass % relative to the solid content of the repair material. [13] The repair material according to [12], further comprising conductive particles. [Example]
以下藉由實施例更具體地說明本發明,但本發明並不限定於實施例。此外,以下「份」及「%」,若無特別說明,皆為質量基準。Hereinafter, the present invention will be described in more detail by way of examples, but the present invention is not limited to the examples. In addition, the following "parts" and "%" are the quality standards unless otherwise specified.
[實施例1] <電子元件安裝基板的準備> 首先,將下列所示之各成分以預定比例混合,並以三輥研磨機進行揉合,藉此製備各向異性導電膏組合物。 ・環氧樹脂 55質量份 (jER-828,常溫下為液狀,三菱化學股份有限公司製) ・固化劑(DICY,雙氰胺) 3質量份 ・助焊劑(己二酸) 1質量份 ・低熔點焊料粒子 41質量份 (42Sn-58Bi球狀粒子,熔點139℃,比表面積541cm 2/g(以BET法所測量的值),千住金屬工業股份有限公司製) [Example 1] <Preparation of Electronic Component Mounting Board> First, each component shown below was mixed in a predetermined ratio, and kneaded with a three-roll mill to prepare an anisotropic conductive paste composition. ・55 parts by mass of epoxy resin (jER-828, liquid at room temperature, manufactured by Mitsubishi Chemical Corporation) ・3 parts by mass of curing agent (DICY, dicyandiamide) ・1 part by mass of flux (adipic acid)・ 41 parts by mass of low melting point solder particles (42Sn-58Bi spherical particles, melting point 139°C, specific surface area 541 cm 2 /g (value measured by BET method), manufactured by Senju Metal Industry Co., Ltd.)
接著,以厚度為80μm的方式,藉由刮板將所得之各向異性導電膏組合物隔著金屬遮罩(遮罩厚:100μm,開口:200μm×100μm)塗佈於硬板(基材:FR-4,電極寬度:120μm,電極長度:200um,間距:0.6mm,電極數150,閃金(Flash Au)處理)上。 接著,在已塗佈各向異性導電膏組合物狀態的硬板之各電極位置上配置各個LED晶片(125μm×75μm)電極為重疊的態樣,以180℃從LED晶片側進行10分鐘的加熱,製作設置有150個LED晶片之基板。 Next, the obtained anisotropic conductive paste composition was applied to a hard plate (substrate: substrate: FR-4, electrode width: 120μm, electrode length: 200um, spacing: 0.6mm, number of electrodes 150, flash gold (Flash Au) treatment). Next, the electrodes of each LED chip (125 μm×75 μm) were placed on the respective electrode positions of the hard board in the state where the anisotropic conductive paste composition had been applied, and the electrodes were placed so as to overlap, and the heating was performed at 180° C. from the LED chip side for 10 minutes. , making a substrate with 150 LED chips.
<電子元件安裝基板的修復> 首先,針對以上述方式所得之LED安裝基板,使用信號產生器(日置電機股份有限公司製,直流信號源(DC signal source)7011)進行導通亮燈檢查,確認150個LED皆亮燈。從中任意選擇10個LED,將該10個LED假定為不良處。此外,在選擇10個LED時,避免選擇相鄰之LED。 接著,使用以隔熱材料局部遮蔽加熱面之加熱板,從安裝有確定為不良處之LED的基板裡側,以170℃加熱1分鐘,將確定為不良處之LED從基板去除後,再將基板冷卻至室溫。目視觀察已去除LED之各處,結果確認全部10處中,各向異性導電膏組合物之固化物皆殘留於基板表面之電極上。 接著,使用光纖雷射(波長:1064nm,光束直徑:40μm),以0.4W的輸出對已去除LED之處照射雷射光1秒鐘。反復此操作15次。目視觀察照射雷射光之處,結果確認全部10處中,雖然焊料殘留於基板的電極表面,但樹脂固體成分未殘留。 <Repair of electronic component mounting board> First, on the LED mounting board obtained in the above-described manner, a signal generator (a DC signal source (DC signal source) 7011, manufactured by Hioki Electric Co., Ltd.) was used to conduct a lighting check, and it was confirmed that all 150 LEDs were turned on. Among them, 10 LEDs are arbitrarily selected, and the 10 LEDs are assumed to be defective. Also, when selecting 10 LEDs, avoid selecting adjacent LEDs. Next, using a heating plate that partially shields the heating surface with a heat insulating material, from the back side of the substrate on which the LEDs identified as defectives are mounted, at 170°C for 1 minute, the LEDs identified as defectives are removed from the substrate, and then the LEDs identified as defectives are removed from the substrate. The substrate is cooled to room temperature. As a result of visual observation of each place where the LEDs were removed, it was confirmed that in all 10 places, the cured product of the anisotropic conductive paste composition remained on the electrodes on the surface of the substrate. Next, using a fiber laser (wavelength: 1064 nm, beam diameter: 40 μm), laser light was irradiated for 1 second at an output of 0.4 W to the portion where the LED had been removed. Repeat this operation 15 times. The place where the laser light was irradiated was visually observed, and it was confirmed that in all 10 places, although the solder remained on the electrode surface of the substrate, the resin solid content did not remain.
使用分注裝置,將300mg的各向異性導電膏組合物塗佈於已去除LED之處(1處的面積:約120μm×200μm),並將與用於LED安裝基板之LED相同的LED設置於塗佈有修復材料之處,調整成基板的電極與LED的電極的位置重疊。 接著,以180℃從LED晶片側進行10分鐘的加熱,以進行LED的再安裝。 Using a dispensing apparatus, 300 mg of the anisotropic conductive paste composition was applied to the place where the LEDs had been removed (area at 1 place: about 120 μm×200 μm), and the same LEDs as those used for the LED mounting substrate were placed on the Where the repair material is applied, the positions of the electrodes of the substrate and the electrodes of the LEDs are adjusted to overlap. Next, the LED was remounted by heating at 180° C. from the LED wafer side for 10 minutes.
<導通試驗評價> 針對再安裝10個LED之基板,與上述相同使用信號產生器(日置電機股份有限公司製,直流信號源7011)進行導通亮燈檢查,結果再安裝之LED中4個亮燈,6個未亮燈。 又,對再安裝之基板實施溫度85℃、濕度85%RH 1000小時的熱濕試驗(Thermal Humidity Test)後,以上述相同的方式進行導通亮燈檢查,結果再安裝之LED中4個亮燈,6個未亮燈。 <Continuity test evaluation> For the board on which 10 more LEDs are installed, a signal generator (made by Nikki Electric Co., Ltd., DC signal source 7011) is used to check the continuity and lighting in the same way as above. As a result, 4 of the installed LEDs are lit, and 6 are not lit. lamp. In addition, a thermal humidity test (Thermal Humidity Test) at a temperature of 85° C. and a humidity of 85%RH for 1000 hours was performed on the remounted board, and then a continuity lighting inspection was performed in the same manner as above. As a result, 4 of the remounted LEDs turned on. , 6 are not lit.
[實施例2] <修復材料1的製備> 將下列所示之各成分以預定比例混合,並以攪拌機進行揉合,藉此獲得修復材料1~4。 修復材料1 ・環氧樹脂 54質量份 (jER-828,常溫下為液狀,三菱化學股份有限公司製) ・固化劑(DICY,雙氰胺) 3質量份 ・助焊劑(己二酸) 3質量份 ・低熔點焊料粒子 40質量份 (42Sn-58Bi球狀粒子,熔點139℃,比表面積541cm 2/g,千住金屬工業股份有限公司製) [Example 2] <Preparation of Restoration Material 1> Restoration materials 1 to 4 were obtained by mixing each component shown below in a predetermined ratio and kneading it with a mixer. Repair material 1 ・54 parts by mass of epoxy resin (jER-828, liquid at room temperature, manufactured by Mitsubishi Chemical Corporation) ・Curing agent (DICY, dicyandiamide) 3 parts by mass ・Flux (adipic acid) 3 Parts by mass・40 parts by mass of low melting point solder particles (42Sn-58Bi spherical particles, melting point 139°C, specific surface area 541cm 2 /g, manufactured by Senju Metal Industry Co., Ltd.)
使用修復材料1代替LED再安裝時使用之各向異性導電膏組合物,除此之外,以與實施例1相同的方式進行LED的再安裝,並進行導通試驗評價。結果,再安裝之LED中6個亮燈,4個未亮燈。又,在實施熱濕試驗後的導通亮燈檢查中,再安裝之LED中6個亮燈,4個未亮燈。Reinstallation of the LED was carried out in the same manner as in Example 1, except that the anisotropic conductive paste composition used at the time of LED remounting was replaced with the repairing material 1, and the continuity test evaluation was performed. As a result, 6 of the re-installed LEDs are lit, and 4 are not lit. In addition, in the continuity lighting inspection after the heat-humidity test, 6 of the remounted LEDs were lit, and 4 were not lit.
[實施例3] <修復材料2的製備> ・環氧樹脂 52質量份 (jER-828,常溫下為液狀,三菱化學股份有限公司製) ・固化劑(DICY,雙氰胺) 3質量份 ・助焊劑(己二酸) 6質量份 ・低熔點焊料粒子 39質量份 (42Sn-58Bi球狀粒子,熔點139℃,比表面積541cm 2/g,千住金屬工業股份有限公司製) [Example 3] <Preparation of Repair Material 2> ・52 parts by mass of epoxy resin (jER-828, liquid at room temperature, manufactured by Mitsubishi Chemical Corporation) ・3 parts by mass of curing agent (DICY, dicyandiamide) ・6 parts by mass of flux (adipic acid) ・39 parts by mass of low melting point solder particles (42Sn-58Bi spherical particles, melting point 139°C, specific surface area 541cm 2 /g, manufactured by Senju Metal Industry Co., Ltd.)
使用修復材料2代替LED再安裝時使用之各向異性導電膏組合物,除此之外,以與實施例1相同的方式進行LED的再安裝,並進行導通試驗評價。結果,確認再安裝之LED全部10個皆亮燈。又,在實施熱濕試驗後的導通亮燈檢查中,確認再安裝之LED全部10個皆亮燈。Reinstallation of the LED was carried out in the same manner as in Example 1, except that the anisotropic conductive paste composition used at the time of LED remounting was used instead of the repairing material 2, and the continuity test evaluation was performed. As a result, it was confirmed that all 10 LEDs to be remounted were turned on. In addition, it was confirmed that all 10 LEDs that were remounted were turned on in the conduction lighting inspection after the heat and humidity test was carried out.
[實施例4] <修復材料3的製備> ・環氧樹脂 49質量份 (jER-828,常溫下為液狀,三菱化學股份有限公司製) ・固化劑(DICY,雙氰胺) 3質量份 ・助焊劑(己二酸) 9質量份 ・低熔點焊料粒子 39質量份 (42Sn-58Bi球狀粒子,熔點139℃,比表面積541cm 2/g,千住金屬工業股份有限公司製) [Example 4] <Preparation of Repair Material 3> ・49 parts by mass of epoxy resin (jER-828, liquid at room temperature, manufactured by Mitsubishi Chemical Co., Ltd.) ・3 parts by mass of curing agent (DICY, dicyandiamide) ・Soldering flux (adipic acid) 9 parts by mass ・39 parts by mass of low melting point solder particles (42Sn-58Bi spherical particles, melting point 139°C, specific surface area 541cm 2 /g, manufactured by Senju Metal Industry Co., Ltd.)
使用修復材料3代替LED再安裝時使用之各向異性導電膏組合物,除此之外,以與實施例1相同的方式進行LED的再安裝,並進行導通試驗評價。結果,確認再安裝之LED全部10個皆亮燈。又,在實施熱濕試驗後的導通亮燈檢查中,再安裝之LED中9個亮燈,1個未亮燈。Reinstallation of the LED was carried out in the same manner as in Example 1, except that the anisotropic conductive paste composition used at the time of LED remounting was used instead of the repairing material 3, and the continuity test evaluation was performed. As a result, it was confirmed that all 10 LEDs to be remounted were turned on. In addition, in the continuity lighting inspection after the heat-humidity test, 9 of the LEDs that were remounted were lit, and 1 was not lit.
[實施例5] <修復材料4的製備> ・環氧樹脂 46質量份 (jER-828,常溫下為液狀,三菱化學股份有限公司製) ・固化劑(DICY,雙氰胺) 3質量份 ・助焊劑(己二酸) 12質量份 ・低熔點焊料粒子 39質量份 (42Sn-58Bi球狀粒子,熔點139℃,比表面積541cm 2/g,千住金屬工業股份有限公司製) [Example 5] <Preparation of Repair Material 4> ・46 parts by mass of epoxy resin (jER-828, liquid at room temperature, manufactured by Mitsubishi Chemical Co., Ltd.) ・3 parts by mass of curing agent (DICY, dicyandiamide) ・12 parts by mass of flux (adipic acid) ・39 parts by mass of low melting point solder particles (42Sn-58Bi spherical particles, melting point 139°C, specific surface area 541cm 2 /g, manufactured by Senju Metal Industry Co., Ltd.)
使用修復材料4代替LED再安裝時使用之各向異性導電膏組合物,除此之外,以與實施例1相同的方式進行LED的再安裝,並進行導通試驗評價。結果,確認再安裝之LED全部10個皆亮燈。又,在實施熱濕試驗後的導通亮燈檢查中,再安裝之LED中6個亮燈,4個未亮燈。Reinstallation of the LED was carried out in the same manner as in Example 1, except that the anisotropic conductive paste composition used at the time of LED re-installation was used instead of the repairing material 4, and the continuity test evaluation was carried out. As a result, it was confirmed that all 10 LEDs to be remounted were turned on. In addition, in the continuity lighting inspection after the heat-humidity test, 6 of the remounted LEDs were lit, and 4 were not lit.
[比較例1] 在上述電子元件安裝基板的修復步驟中,未照射雷射光,除此之外,以與實施例1相同的方式將10個LED再安裝於基板上。 接著,與實施例1相同進行導通亮燈檢查,結果再安裝之LED的10個皆未亮燈。又,在實施熱濕試驗後的導通亮燈檢查中,再安裝之LED的10個皆未亮燈。 [Comparative Example 1] In the above-mentioned repairing step of the electronic component mounting board, 10 LEDs were remounted on the board in the same manner as in Example 1, except that the laser light was not irradiated. Next, as in Example 1, the conduction lighting inspection was carried out, and as a result, none of the 10 LEDs that were remounted were turned on. In addition, in the conduction lighting inspection after the heat and humidity test, none of the 10 LEDs that were remounted were turned on.
[比較例2] 在上述電子元件安裝基板的修復步驟中,使用有機溶劑(甲乙酮)代替照射雷射光,將已去除LED晶片之處的基板電極上所殘留的附著物去除,除此之外,以與實施例1相同的方式將10個LED再安裝於基板上。 接著,與實施例1相同進行導通亮燈檢查,結果再安裝之LED全部10個皆未亮燈。又,在實施熱濕試驗後的導通亮燈檢查中,再安裝之LED全部10個皆未亮燈。 [Comparative Example 2] In the above-mentioned repairing step of the electronic component mounting substrate, an organic solvent (methyl ethyl ketone) is used instead of irradiating laser light to remove the attachments remaining on the substrate electrodes where the LED chip has been removed. 10 LEDs were remounted on the substrate in the same manner. Next, as in Example 1, the conduction lighting inspection was carried out, and as a result, all 10 LEDs that were remounted were not turned on. In addition, in the conduction lighting inspection after the heat-humidity test, all 10 LEDs that were remounted were not turned on.
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