TW202206216A - Cut-off device and method for manufacturing cut-off product wherein the cut-off device includes a light source, an image capturing unit, and a detection unit - Google Patents

Cut-off device and method for manufacturing cut-off product wherein the cut-off device includes a light source, an image capturing unit, and a detection unit Download PDF

Info

Publication number
TW202206216A
TW202206216A TW110128330A TW110128330A TW202206216A TW 202206216 A TW202206216 A TW 202206216A TW 110128330 A TW110128330 A TW 110128330A TW 110128330 A TW110128330 A TW 110128330A TW 202206216 A TW202206216 A TW 202206216A
Authority
TW
Taiwan
Prior art keywords
workpiece
light pattern
imaging unit
cutting device
cut
Prior art date
Application number
TW110128330A
Other languages
Chinese (zh)
Other versions
TWI806114B (en
Inventor
片岡昌一
今井一郎
井口晴貴
Original Assignee
日商Towa股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商Towa股份有限公司 filed Critical 日商Towa股份有限公司
Publication of TW202206216A publication Critical patent/TW202206216A/en
Application granted granted Critical
Publication of TWI806114B publication Critical patent/TWI806114B/en

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67092Apparatus for mechanical treatment
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/02Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
    • B28D5/022Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/12Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0058Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0058Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
    • B28D5/0064Devices for the automatic drive or the program control of the machines
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0058Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
    • B28D5/0082Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
    • B28D5/0094Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work the supporting or holding device being of the vacuum type
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608Height gauges
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67259Position monitoring, e.g. misposition detection or presence detection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67259Position monitoring, e.g. misposition detection or presence detection
    • H01L21/67265Position monitoring, e.g. misposition detection or presence detection of substrates stored in a container, a magazine, a carrier, a boat or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10Measuring as part of the manufacturing process
    • H01L22/12Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/544Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Mechanical Engineering (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Dicing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)

Abstract

The issue of the present invention is to provide a cut-off device, which can detect the height position of a workpiece at a lower cost. The solution of the present invention is a cut-off device configured to cut off a workpiece. The cut-off device includes a light source, an image capturing unit, and a detection unit. The light source is configured to project a light pattern onto a workpiece. The image capturing unit is configured to capture the light pattern and generate a first image data. The detection unit is configured to detect the height position of the workpiece based on the first image data. The angle formed by the direction of the light source projecting the light pattern and the direction of the image capturing unit capturing the light pattern is greater than 0 DEG.

Description

切斷裝置及切斷品的製造方法Cutting device and manufacturing method of cut product

本發明關於一種切斷裝置及切斷品的製造方法。The present invention relates to a cutting device and a method for manufacturing a cut product.

日本特開2019-45418號公報(專利文獻1)揭示一種雷射加工裝置,其對半導體晶圓等待加工物進行分割。於該雷射加工裝置中,將特定波長段的光照射至待加工物的上表面,基於反射光與基準光的干涉光檢測待加工物的高度位置(參考專利文獻1)。Japanese Patent Application Laid-Open No. 2019-45418 (Patent Document 1) discloses a laser processing apparatus that divides a semiconductor wafer to be processed. In this laser processing apparatus, the upper surface of the object to be processed is irradiated with light of a specific wavelength band, and the height position of the object to be processed is detected based on the interference light between the reflected light and the reference light (refer to Patent Document 1).

[先前技術文獻] (專利文獻) 專利文獻1:日本特開2019-45418號公報。[Prior Art Literature] (patent literature) Patent Document 1: Japanese Patent Laid-Open No. 2019-45418.

(發明所欲解決的問題) 於上述專利文獻1所揭示之雷射加工裝置中,是藉由使用雷射光源等昂貴的零件來檢測待加工物的高度位置。亦即,當使用上述專利文獻1的技術時,為了檢測待加工物的高度位置,會花費較高成本。(Problems to be solved by the invention) In the laser processing apparatus disclosed in the above-mentioned Patent Document 1, the height position of the object to be processed is detected by using expensive components such as a laser light source. That is, when the technique of the above-mentioned Patent Document 1 is used, high cost is incurred in order to detect the height position of the object to be processed.

本發明是為解決如上問題而完成的,其目的在於提供一種切斷裝置等,其能夠以更低成本檢測工件的高度位置。The present invention has been made to solve the above-mentioned problems, and an object thereof is to provide a cutting device and the like which can detect the height position of a workpiece at a lower cost.

(用於解決問題的手段) 根據本發明的一方面的切斷裝置,其構成為將工件加以切斷。該切斷裝置具備:光源、攝像部、檢測部。光源,被構成為將光圖案投影至工件。攝像部,被構成為拍攝光圖案,並生成第一圖像資料。檢測部,被構成為基於第一圖像資料檢測工件的高度位置。光源投影光圖案之方向與攝像部拍攝光圖案之方向所形成的角度大於0°。(means used to solve problems) According to one aspect of the present invention, a cutting device is configured to cut a workpiece. The cutting device includes a light source, an imaging unit, and a detection unit. The light source is configured to project a light pattern onto the workpiece. The imaging unit is configured to capture the light pattern and generate the first image data. The detection unit is configured to detect the height position of the workpiece based on the first image data. The angle formed by the direction of the light source projecting the light pattern and the direction of the imaging part shooting the light pattern is greater than 0°.

又,根據本發明的另一方面的切斷品的製造方法是使用上述切斷裝置的製造方法。該切斷品的製造方法包含以下步驟:將光圖案投影至工件;拍攝光圖案,並生成圖像資料;基於圖像資料檢測工件的高度位置;及,基於工件的高度位置切斷工件,以製造切斷品。Moreover, the manufacturing method of the cut product according to another aspect of the present invention is a manufacturing method using the above-mentioned cutting device. The manufacturing method of the cut product includes the following steps: projecting a light pattern onto a workpiece; photographing the light pattern and generating image data; detecting a height position of the workpiece based on the image data; and cutting the workpiece based on the height position of the workpiece to Manufacture of cut products.

(發明的功效) 根據本發明,可提供一種切斷裝置等,其能夠以更低成本檢測工件的高度位置。(Effect of invention) According to this invention, the cutting apparatus etc. which can detect the height position of a workpiece|work at lower cost can be provided.

以下,一邊參考圖式一邊對本發明的實施方式進行詳細說明。再者,對圖中相同或相當的部分附加上相同符號,不再重複說明。Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In addition, the same symbols are attached to the same or corresponding parts in the drawings, and the description will not be repeated.

[1.切斷裝置的構造] 第1圖是示意性地表示根據本實施方式的切斷裝置10的一部分的平面之圖。第2圖是示意性地表示切斷裝置10的一部分的正面之圖。再者,於第1圖及第2圖中,箭頭XYZ各自所表示之方向是共通的。[1. Structure of the cutting device] FIG. 1 is a plan view schematically showing a part of the cutting device 10 according to the present embodiment. FIG. 2 is a front view schematically showing a part of the cutting device 10 . In addition, in FIG. 1 and FIG. 2, the directions indicated by arrows XYZ are common to each other.

切斷裝置10構成為藉由切斷工件W1而將工件W1單片化為複數個切斷品(全切)。又,切斷裝置10構成為藉由移除工件W1的一部分而於工件W1形成溝槽(半切)。亦即,切斷裝置10的名稱(切斷裝置)中所包含之用語「切斷」的概念包括將切斷對象分離成複數個以及移除切斷對象的一部分。工件W1例如為封裝體基板。於封裝體基板中,安裝有半導體晶片之基板或引線框架由樹脂密封。亦即,工件W1為樹脂成形後的基板。於以下說明中,亦將工件W1的密封側的面記為「封裝體面」,將基板或引線框架側的面記為「基板面」。The cutting device 10 is configured to separate the workpiece W1 into a plurality of cut products (full cut) by cutting the workpiece W1. Moreover, the cutting apparatus 10 is comprised so that a groove|channel (half cut) may be formed in the workpiece|work W1 by removing a part of workpiece|work W1. That is, the concept of the term "cutting" included in the name (cutting device) of the cutting device 10 includes separating the cutting object into plural pieces and removing a part of the cutting object. The workpiece W1 is, for example, a package substrate. In the package substrate, the substrate or lead frame on which the semiconductor chip is mounted is sealed with resin. That is, the workpiece W1 is a substrate after resin molding. In the following description, the surface on the sealing side of the workpiece W1 is also referred to as a "package surface", and the surface on the substrate or lead frame side is referred to as a "substrate surface".

作為封裝體基板的一例,可列舉球柵陣列(Ball Grid Array, BGA)封裝體基板、柵格陣列(Land Grid Array,LGA)封裝體基板、晶片尺寸封裝(Chip Size Package,CSP)封裝體基板、發光二極體(Light Emitting Diode,LED)封裝體基板、四方無引線(Quad Flat No-leaded,QFN)封裝體基板。Examples of package substrates include Ball Grid Array (BGA) package substrates, Land Grid Array (LGA) package substrates, and Chip Size Package (CSP) package substrates , Light Emitting Diode (Light Emitting Diode, LED) package substrate, Quad Flat No-leaded (Quad Flat No-leaded, QFN) package substrate.

如第1圖及第2圖所示,切斷裝置10包括切斷單元100、工件保持單元200、接觸刀具組(Contact Cutter Set, CCS)區塊300、攝像單元400及控制部500。As shown in FIGS. 1 and 2 , the cutting device 10 includes a cutting unit 100 , a workpiece holding unit 200 , a contact cutter set (CCS) block 300 , a camera unit 400 and a control unit 500 .

切斷單元100構成為將工件W1加以切斷,且包括主軸部110、滑塊103和104、及支撐體105。再者,切斷裝置10為包括兩組主軸部110與滑塊103和104之組的雙主軸構造,但亦可為僅包括一組主軸部110與滑塊103和104之組的單主軸構造。The cutting unit 100 is configured to cut the workpiece W1 , and includes a main shaft portion 110 , sliders 103 and 104 , and a support body 105 . Furthermore, the cutting device 10 has a double-spindle structure including two sets of the spindle portion 110 and a set of the sliders 103 and 104, but may also be a single-spindle structure including only one set of the spindle portion 110 and a set of the sliders 103 and 104. .

支撐體105為金屬製棒狀構件,構成為沿未圖示之導件在箭頭Y方向上移動。於支撐體105,形成有沿長側方向(箭頭X方向)延伸之導件G1。The support body 105 is a metal rod-shaped member, and is comprised so that it may move in the arrow Y direction along the guide which is not shown in figure. The support body 105 is formed with a guide G1 extending in the longitudinal direction (arrow X direction).

滑塊104為金屬製的矩形形狀的板狀構件,且以可沿導件G1在箭頭X方向移動之狀態安裝於支撐體105。於滑塊104,形成有沿長側方向(箭頭Z方向)延伸之導件G2。滑塊103為金屬製的矩形形狀的板狀構件,且以可沿導件G2在高度方向(箭頭Z方向)移動之狀態安裝於滑塊104。The slider 104 is a metal rectangular plate-like member, and is attached to the support body 105 in a state of being movable in the arrow X direction along the guide G1. The slider 104 is formed with a guide G2 extending in the longitudinal direction (arrow Z direction). The slider 103 is a metal rectangular plate-shaped member, and is attached to the slider 104 in a state of being movable in the height direction (arrow Z direction) along the guide G2 .

主軸部110包括主軸部主體102、及安裝於主軸部主體102之刀片101。刀片101藉由高速旋轉,而將工件W1切斷,從而將工件W1單片化為複數個切斷品(半導體封裝體)。主軸部主體102安裝於滑塊103。主軸部110構成為隨滑塊103和104及支撐體105的移動而移動至切斷裝置10內的期望位置。The main shaft part 110 includes a main shaft part main body 102 and a blade 101 attached to the main shaft part main body 102 . The blade 101 cuts the workpiece W1 by rotating at a high speed, and separates the workpiece W1 into a plurality of cut products (semiconductor packages). The main shaft portion main body 102 is attached to the slider 103 . The main shaft portion 110 is configured to move to a desired position in the cutting device 10 with the movement of the sliders 103 and 104 and the support body 105 .

工件保持單元200構成為保持工件W1,且包括切斷台201、及配置於切斷台201上之橡膠件202。於本實施方式中,例示有具有兩個工件保持單元200之雙切割台構成的切斷裝置10。再者,工件保持單元200的數量並不限於兩個,亦可為一個,亦可為三個以上。The workpiece holding unit 200 is configured to hold the workpiece W1 , and includes a cutting table 201 and a rubber member 202 arranged on the cutting table 201 . In the present embodiment, the cutting device 10 having two workpiece holding units 200 including a double cutting table is exemplified. Furthermore, the number of the workpiece holding units 200 is not limited to two, and may be one or three or more.

橡膠件202為橡膠製的板狀構件,是吸附構件的一例,於橡膠件202中形成有複數個孔。於橡膠件202上配置有工件W1。切斷台201藉由自下方的封裝面側對配置於橡膠件202上之工件W1進行吸附而保持工件W1。切斷台201可沿θ方向旋轉。工件W1是在由工件保持單元200保持之狀態下,自基板面側被主軸部110切斷。再者,工件保持單元200並非必須包括橡膠件202,亦可包括自下方的封裝面側對配置於上方之工件W1進行吸附之其他構件來代替橡膠件202。The rubber piece 202 is a rubber-made plate-shaped member, and is an example of an adsorption member, and a plurality of holes are formed in the rubber piece 202 . The workpiece W1 is arranged on the rubber member 202 . The cutting table 201 holds the workpiece W1 by attracting the workpiece W1 arranged on the rubber member 202 from the lower sealing surface side. The cutting table 201 is rotatable in the θ direction. The workpiece W1 is cut by the spindle portion 110 from the substrate surface side in a state held by the workpiece holding unit 200 . Furthermore, the workpiece holding unit 200 does not necessarily have to include the rubber member 202 , and may also include other components that absorb the workpiece W1 disposed above from the lower packaging surface side instead of the rubber member 202 .

CCS區塊300用來檢測主軸部110的高度位置的控制中的控制座標原點。控制座標原點為主軸部110在高度方向上的控制上的基準位置,例如包括電性原點。The CCS block 300 is used to detect the control coordinate origin in the control of the height position of the main shaft portion 110 . The origin of the control coordinates is a reference position in the control of the main shaft portion 110 in the height direction, and includes, for example, an electrical origin.

第3圖是用來說明使用了CCS區塊300之控制座標原點的檢測順序的圖。於切斷裝置10中,預先記憶有CCS區塊300的高度H1。如第3圖所示,於切斷裝置10中,藉由使刀片101接觸CCS區塊300,而檢測主軸部110在高度方向上的控制座標原點。FIG. 3 is a diagram for explaining the detection procedure of the origin of the control coordinates using the CCS block 300 . In the cutting device 10, the height H1 of the CCS block 300 is stored in advance. As shown in FIG. 3 , in the cutting device 10 , by bringing the blade 101 into contact with the CCS block 300 , the origin of the control coordinates in the height direction of the spindle portion 110 is detected.

攝像單元400構成為在工件W1位於攝像單元400的下方之狀態下將光圖案投影至工件W1的上表面,並拍攝投影有該光圖案之工件W1的上表面。攝像單元400能夠沿上下方向(箭頭Z方向)移動。基於攝像單元400所生成之圖像資料進行下述各種檢測。The imaging unit 400 is configured to project a light pattern on the upper surface of the workpiece W1 in a state where the workpiece W1 is positioned below the imaging unit 400 , and to photograph the upper surface of the workpiece W1 on which the light pattern is projected. The imaging unit 400 can move in the up-down direction (arrow Z direction). The following various detections are performed based on the image data generated by the imaging unit 400 .

第4圖是示意性地表示攝像單元400的構造的圖。如第4圖所示,攝像單元400包括光源410及攝像部420。光源410構成為將光圖案投影至工件W1的上表面。攝像部420構成為拍攝工件W1的上表面,並生成圖像資料。亦即,光源410使光線入射至工件W1,攝像部420拍攝由工件W1反射之光線。FIG. 4 is a diagram schematically showing the structure of the imaging unit 400 . As shown in FIG. 4 , the imaging unit 400 includes a light source 410 and an imaging unit 420 . The light source 410 is configured to project a light pattern onto the upper surface of the workpiece W1. The imaging unit 420 is configured to image the upper surface of the workpiece W1 and generate image data. That is, the light source 410 makes the light incident on the workpiece W1, and the imaging unit 420 captures the light reflected by the workpiece W1.

光源410將光圖案投影至工件W1的上表面之方向與攝像部420拍攝工件W1的上表面之方向所形成的角度為A1。角度A1大於0°,較佳為30°~60°,進而較佳為40°~50°。光源410將光圖案自工件W1的上表面的斜上方朝工件W1的上表面投影。攝像部420自工件W1的正上方拍攝工件W1的上表面。The angle formed by the direction in which the light source 410 projects the light pattern on the upper surface of the workpiece W1 and the direction in which the imaging unit 420 images the upper surface of the workpiece W1 is A1. The angle A1 is larger than 0°, preferably 30° to 60°, and more preferably 40° to 50°. The light source 410 projects a light pattern toward the upper surface of the workpiece W1 from obliquely above the upper surface of the workpiece W1. The imaging unit 420 images the upper surface of the workpiece W1 from directly above the workpiece W1.

第5圖是示意性地表示光源410的構造的圖。如第5圖所示,光源410包括LED照明411及光學系統412。LED照明411構成為朝向光學系統412發光。FIG. 5 is a diagram schematically showing the structure of the light source 410 . As shown in FIG. 5 , the light source 410 includes an LED illumination 411 and an optical system 412 . The LED illumination 411 is configured to emit light toward the optical system 412 .

光學系統412包括投影透鏡413、光圈414及狹縫構件415。於光學系統412中,自LED照明411側依序配置有狹縫構件415、光圈414及投影透鏡413。投影透鏡413由單位共軛比設計的雙凸透鏡構成。光圈414配置於投影透鏡413的焦點位置。藉由將光圈414配置於投影透鏡413的焦點位置而實現遠心照明。在狹縫構件415,形成有線狀狹縫。狹縫的大小,例如長度為2 mm,寬度為0.05 mm。The optical system 412 includes a projection lens 413 , a diaphragm 414 and a slit member 415 . In the optical system 412, a slit member 415, a diaphragm 414, and a projection lens 413 are arranged in this order from the LED illumination 411 side. The projection lens 413 is composed of a lenticular lens designed with a unit conjugate ratio. The diaphragm 414 is arranged at the focal position of the projection lens 413 . Telecentric illumination is realized by arranging the diaphragm 414 at the focal position of the projection lens 413 . In the slit member 415, a linear slit is formed. The size of the slit, e.g. 2 mm in length and 0.05 mm in width.

第6圖是表示投影至工件W1之光圖案的一例的圖。如第6圖所示,若LED照明411朝向光學系統412發光,則形狀與形成於狹縫構件415之狹縫相同(線狀)的光圖案L1便被投影至工件W1上。FIG. 6 is a diagram showing an example of a light pattern projected on the workpiece W1. As shown in FIG. 6 , when the LED illumination 411 emits light toward the optical system 412 , a light pattern L1 having the same shape (linear) as the slit formed in the slit member 415 is projected onto the workpiece W1 .

再次參考第1圖及第2圖,控制部500包括中央處理單元(Central Processing Unit,CPU)、隨機存取記憶體(Random Access Memory,RAM)及唯讀記憶體(Read Only Memory,ROM)等,且構成為根據資訊處理而控制各構成要素。控制部500例如構成為控制切斷單元100、工件保持單元200及攝像單元400。Referring to FIGS. 1 and 2 again, the control unit 500 includes a central processing unit (CPU), a random access memory (RAM), a read only memory (ROM), etc. , and is configured to control each component according to information processing. The control unit 500 is configured to control the cutting unit 100 , the workpiece holding unit 200 , and the imaging unit 400 , for example.

於切斷裝置10中,進行工件W1的全切及半切。為了透過半切於工件W1上形成期望深度的溝槽,需要高精度地檢測工件W1的高度位置。於切斷裝置10中,高精度地檢測工件W1的高度位置。又,於切斷裝置10中,檢測形成於工件W1之溝槽的深度、刀片101的磨損狀態、形成於工件W1之毛邊、及橡膠件202的劣化狀態。隨後,對在切斷裝置10中檢測工件W1的高度位置之理由進行說明。In the cutting device 10, full cutting and half cutting of the workpiece W1 are performed. In order to form a groove of a desired depth in the workpiece W1 by half cutting, it is necessary to detect the height position of the workpiece W1 with high accuracy. In the cutting device 10, the height position of the workpiece W1 is detected with high accuracy. Moreover, in the cutting device 10, the depth of the groove formed in the workpiece|work W1, the wear state of the blade 101, the burr formed in the workpiece|work W1, and the deterioration state of the rubber|gum 202 are detected. Next, the reason for detecting the height position of the workpiece W1 in the cutting device 10 will be described.

[2.需要檢測高度位置的理由] 第7圖是包含保持於工件保持單元200上之工件W1的前視圖。如第7圖所示,於切斷工件W1時,橡膠件202配置於切斷台201的上表面,工件W1配置於橡膠件202的上表面。[2. Reason for need to detect height position] FIG. 7 is a front view including the workpiece W1 held by the workpiece holding unit 200 . As shown in FIG. 7 , when cutting the workpiece W1 , the rubber piece 202 is arranged on the upper surface of the cutting table 201 , and the workpiece W1 is arranged on the upper surface of the rubber piece 202 .

於切斷裝置10中,若基於設計階段的尺寸值而預先記憶有工件W1的高度H2及橡膠件202的高度H3等各構件的高度,則亦可認為並非一定需要檢測工件W1的高度位置。然而,各構件的高度資訊未必準確。例如,橡膠件202可能會因來自切斷台201的吸附而撓曲。又,橡膠件202可能會隨時間變化而被磨損。又,工件W1可能會因之前的步驟中的熱等而撓曲。又,工件W1可能會因由主軸部110等構成零件的加工所引起的誤差等而撓曲。In the cutting device 10, if the heights of the components such as the height H2 of the workpiece W1 and the height H3 of the rubber piece 202 are stored in advance based on the dimension values at the design stage, it can be considered that it is not always necessary to detect the height position of the workpiece W1. However, the height information of each component may not be accurate. For example, the rubber piece 202 may be deflected by suction from the cutting table 201 . Also, the rubber member 202 may be worn over time. Also, the workpiece W1 may be deflected by heat or the like in the previous step. In addition, the workpiece W1 may be deflected due to an error or the like caused by machining of components such as the main shaft portion 110 .

如此,由於各種因素,有時各構件的實際高度與預先記憶的高度並不一致。因此,需要實際檢測工件W1的高度位置,以掌握工件W1的實際高度位置。Thus, due to various factors, sometimes the actual height of each member does not match the pre-recorded height. Therefore, it is necessary to actually detect the height position of the workpiece W1 to grasp the actual height position of the workpiece W1.

[3.各種檢測原理] <3-1.高度位置的檢測原理> 第8圖是表示光源410所投影之光圖案是如何根據工件W1的上表面的高度位置而變化的圖。如第8圖所示,於切斷裝置10中,當工件W1的上表面的高度位置為基準位置Z1時,由光源410發出之光的圖案投影至位置A1。又,當工件W1的上表面的高度位置為位置Z1+α時,光圖案投影至位置A2,當工件W1的上表面的高度位置為位置Z1-α時,光圖案投影至位置A3。[3. Various detection principles] <3-1. Principle of detection of height position> FIG. 8 is a diagram showing how the light pattern projected by the light source 410 changes according to the height position of the upper surface of the workpiece W1. As shown in FIG. 8, in the cutting device 10, when the height position of the upper surface of the workpiece W1 is the reference position Z1, the pattern of light emitted by the light source 410 is projected to the position A1. Also, when the height position of the upper surface of the workpiece W1 is position Z1+α, the light pattern is projected to position A2, and when the height position of the upper surface of workpiece W1 is position Z1-α, the light pattern is projected to position A3.

於切斷裝置10中,預先決定攝像單元400在高度方向上的基準位置Z2(未圖示)。於工件W1的高度位置的檢測開始時刻,攝像單元400的高度位置為基準位置Z2。當攝像單元400的高度位置為基準位置Z2,且工件W1的上表面的高度位置為基準位置Z1時,光圖案的焦點在工件W1的上表面對準。亦即,於切斷裝置10中,預先準備這樣的基準位置Z1、Z2。於切斷裝置10中,預先記憶有基準位置Z1、Z2。In the cutting device 10, a reference position Z2 (not shown) in the height direction of the imaging unit 400 is predetermined. At the start time of detection of the height position of the workpiece W1, the height position of the imaging unit 400 is the reference position Z2. When the height position of the imaging unit 400 is the reference position Z2, and the height position of the upper surface of the workpiece W1 is the reference position Z1, the focus of the light pattern is aligned on the upper surface of the workpiece W1. That is, in the cutting device 10, such reference positions Z1 and Z2 are prepared in advance. In the cutting device 10, reference positions Z1 and Z2 are stored in advance.

第9圖是用以說明投影至工件W1之光圖案的示例的圖。如第9圖所示,當攝像單元400存在於基準位置Z2,且工件W1的上表面存在於基準位置Z1時,有光圖案L2投影至工件W1。又,當攝像單元400存在於基準位置Z2,且工件W1的上表面存在於位置Z1-α時,有光圖案L3投影至工件W1。又,當攝像單元400存在於基準位置Z2,且工件W1的上表面存在於位置Z1+α時,有光圖案L4投影至工件W1。FIG. 9 is a diagram for explaining an example of the light pattern projected on the workpiece W1. As shown in FIG. 9 , when the imaging unit 400 exists at the reference position Z2 and the upper surface of the workpiece W1 exists at the reference position Z1 , the light pattern L2 is projected onto the workpiece W1 . In addition, when the imaging unit 400 is present at the reference position Z2 and the upper surface of the workpiece W1 is present at the position Z1-α, the light pattern L3 is projected on the workpiece W1. In addition, when the imaging unit 400 is present at the reference position Z2 and the upper surface of the workpiece W1 is present at the position Z1+α, the light pattern L4 is projected on the workpiece W1.

亦即,光圖案的投影位置根據工件W1的上表面的高度位置而發生變化。其原因在於,光源410將光圖案投影至工件W1的上表面之方向與攝像部420拍攝工件W1的上表面之方向所形成的角度大於0°。That is, the projection position of the light pattern changes according to the height position of the upper surface of the workpiece W1. This is because the angle formed by the direction in which the light source 410 projects the light pattern on the upper surface of the workpiece W1 and the direction in which the imaging unit 420 captures the upper surface of the workpiece W1 is greater than 0°.

當攝像單元400存在於基準位置Z2,且工件W1的上表面存在於基準位置Z1時,光圖案L2位於攝像部420拍攝到之圖像中的箭頭Y方向的中心。因工件W1的上表面的高度位置自基準位置Z1偏移,故光圖案之投影位置在箭頭Y方向上發生偏移。再者,雖然光圖案L2的焦點有對準,但光圖案L3、L4的焦點未對準。When the imaging unit 400 is present at the reference position Z2 and the upper surface of the workpiece W1 is present at the reference position Z1, the light pattern L2 is positioned at the center in the direction of arrow Y in the image captured by the imaging unit 420. Since the height position of the upper surface of the workpiece W1 is shifted from the reference position Z1, the projected position of the light pattern is shifted in the arrow Y direction. Furthermore, although the focus of the light pattern L2 is aligned, the focus of the light patterns L3 and L4 is not aligned.

如上所述,於工件W1的上表面的高度位置的檢測開始時,攝像單元400的高度位置為基準位置Z2。此時,當光圖案被投影至攝像部420拍攝到之圖像的箭頭Y方向的中心時,控制部500確定工件W1的上表面的高度位置為基準位置Z1。另一方面,當光圖案被投影至自攝像部420拍攝到之圖像的箭頭Y方向的中心偏移的位置時,控制部500以使光圖案移動至中心之方式調整攝像單元400的高度位置。於切斷裝置10中,預先記憶有攝像單元400的移動量與工件W1的上表面的高度位置的關係。控制部500基於攝像單元400在高度方向(箭頭Z方向)上的移動量,算出工件W1的上表面的高度位置。藉由上述方法,檢測工件W1的上表面的高度位置。As described above, when the detection of the height position of the upper surface of the workpiece W1 starts, the height position of the imaging unit 400 is the reference position Z2. At this time, when the light pattern is projected to the center in the arrow Y direction of the image captured by the imaging unit 420, the control unit 500 determines the height position of the upper surface of the workpiece W1 as the reference position Z1. On the other hand, when the light pattern is projected to a position shifted from the center in the arrow Y direction of the image captured by the imaging unit 420, the control unit 500 adjusts the height position of the imaging unit 400 so as to move the light pattern to the center . In the cutting device 10, the relationship between the movement amount of the imaging unit 400 and the height position of the upper surface of the workpiece W1 is stored in advance. The control part 500 calculates the height position of the upper surface of the workpiece|work W1 based on the movement amount of the imaging unit 400 in the height direction (arrow Z direction). By the above-described method, the height position of the upper surface of the workpiece W1 is detected.

<3-2.溝槽的深度的檢測原理> 第10圖是用以說明當於工件W1形成有溝槽GR1時投影至工件W1之光圖案的示例的圖。如第10圖所示,於工件W1的上表面形成有沿箭頭Y方向延伸之溝槽GR1。<3-2. Principle of detection of groove depth> FIG. 10 is a diagram for explaining an example of a light pattern projected to the workpiece W1 when the groove GR1 is formed in the workpiece W1. As shown in FIG. 10, the groove|channel GR1 extended in the arrow Y direction is formed in the upper surface of the workpiece|work W1.

光源410被構成為將光圖案L5投影至橫跨工件W1的上表面的溝槽GR1之區域。光圖案L5沿與溝槽GR1延伸之方向大致垂直之方向延伸。再者,光圖案L5延伸之方向並非必須與溝槽GR1延伸之方向大致垂直。只要光圖案L5橫跨溝槽GR1即可。光圖案L5包括部分P1、P2、P3。部分P1、P3投影至除溝槽GR1以外之工件W1的上表面,部分P2投影至溝槽GR1。因除溝槽GR1以外之工件W1的上表面的高度位置與溝槽GR1的高度位置不同,故部分P1、P3與部分P2投影至箭頭Y方向上的不同位置。The light source 410 is configured to project the light pattern L5 to the region of the groove GR1 spanning the upper surface of the workpiece W1. The light pattern L5 extends in a direction substantially perpendicular to the direction in which the trench GR1 extends. Furthermore, the direction in which the light pattern L5 extends is not necessarily substantially perpendicular to the direction in which the trench GR1 extends. It is sufficient as long as the light pattern L5 straddles the trench GR1. The light pattern L5 includes portions P1, P2, P3. Parts P1, P3 are projected onto the upper surface of the workpiece W1 except for the groove GR1, and part P2 is projected onto the groove GR1. Since the height position of the upper surface of the workpiece W1 other than the groove GR1 is different from the height position of the groove GR1, the parts P1, P3 and P2 are projected to different positions in the arrow Y direction.

控制部500例如以使部分P1、P3移動至攝像部420拍攝到之圖像的箭頭Y方向的中心之方式,來調整攝像單元400的高度位置。之後,控制部500以使部分P2移動至箭頭Y方向的中心之方式,來調整攝像單元400的高度位置。控制部500基於使部分P2移動至箭頭Y方向的中心時攝像單元400在高度方向上的移動量,算出溝槽GR1的深度。藉由上述方法,檢測溝槽GR1的深度。再者,於該例中是先使部分P1、P3移動至圖像的箭頭Y方向的中心,但亦可先使部分P2移動至箭頭Y方向的中心。For example, the control unit 500 adjusts the height position of the imaging unit 400 so that the parts P1 and P3 are moved to the center in the arrow Y direction of the image captured by the imaging unit 420 . Then, the control part 500 adjusts the height position of the imaging unit 400 so that the part P2 may be moved to the center of the arrow Y direction. The control unit 500 calculates the depth of the groove GR1 based on the movement amount of the imaging unit 400 in the height direction when the portion P2 is moved to the center in the arrow Y direction. By the above method, the depth of the groove GR1 is detected. In this example, the parts P1 and P3 are first moved to the center in the arrow Y direction of the image, but the part P2 may be moved to the center in the arrow Y direction first.

<3-3.刀片的磨損狀態的檢測原理> 第11圖是示意性地表示利用刀片101形成有溝槽GR2之工件W1的局部剖面圖。如第11圖所示,若刀片101未磨損,則應於工件W1形成溝槽GR21。亦即,若刀片101的側面未因摩耗而變薄,則應於工件W1形成溝槽GR21。溝槽GR21的側壁自工件W1的上表面大致垂直地向下方延伸。另一方面,當刀片101磨損,刀片101的側面變薄時,例如,會於工件W1形成溝槽GR2。溝槽GR2的側壁自工件W1的上表面平緩地傾斜並向下方延伸。<3-3. Principle of detection of the wear state of the blade> FIG. 11 is a partial cross-sectional view schematically showing a workpiece W1 in which the groove GR2 is formed by the insert 101 . As shown in FIG. 11, if the insert 101 is not worn, the groove GR21 should be formed in the workpiece W1. That is, if the side surface of the insert 101 is not thinned by wear, the groove GR21 should be formed in the workpiece W1. The side wall of the groove GR21 extends downward substantially vertically from the upper surface of the workpiece W1. On the other hand, when the blade 101 is worn and the side surface of the blade 101 becomes thinner, for example, a groove GR2 is formed in the workpiece W1. The side wall of the groove GR2 is gently inclined from the upper surface of the workpiece W1 and extends downward.

第12圖是用以說明當利用磨損的刀片101形成有溝槽GR2時,投影至工件W1之光圖案的示例的圖。如第12圖所示,於工件W1的上表面形成有沿箭頭Y方向延伸之溝槽GR2。FIG. 12 is a diagram for explaining an example of a light pattern projected to the workpiece W1 when the groove GR2 is formed by the worn insert 101 . As shown in FIG. 12, the groove|channel GR2 extended in the arrow Y direction is formed in the upper surface of the workpiece|work W1.

光源410被構成為將光圖案L6投影至橫跨工件W1的上表面的溝槽GR2之區域。光圖案L6沿與溝槽GR2延伸之方向大致垂直之方向延伸。再者,光圖案L6延伸之方向並非必須與溝槽GR2延伸之方向大致垂直。只要光圖案L6橫跨溝槽GR2即可。光圖案L6包括部分P4、P5、P6、P7、P8。部分P4、P8投影至除溝槽GR2以外之工件W1的上表面,部分P5、P6、P7投影至溝槽GR2。The light source 410 is configured to project the light pattern L6 to the region of the groove GR2 spanning the upper surface of the workpiece W1. The light pattern L6 extends in a direction substantially perpendicular to the direction in which the trench GR2 extends. Furthermore, the direction in which the light pattern L6 extends is not necessarily substantially perpendicular to the direction in which the trench GR2 extends. It is sufficient as long as the light pattern L6 straddles the trench GR2. Light pattern L6 includes portions P4, P5, P6, P7, P8. Portions P4, P8 are projected onto the upper surface of the workpiece W1 except for the groove GR2, and portions P5, P6, P7 are projected onto the trench GR2.

因除溝槽GR2以外之工件W1的上表面的高度位置與溝槽GR2的高度位置不同,故部分P4、P8與部分P5、P6、P7投影至箭頭Y方向上的不同位置。尤其是,因溝槽GR2的側壁平緩,故部分P5自部分P4斜向延伸並逐漸靠向部分P6,部分P7自部分P8斜向延伸並逐漸靠向部分P6。Since the height position of the upper surface of the workpiece W1 other than the groove GR2 is different from the height position of the groove GR2, the parts P4, P8 and the parts P5, P6, and P7 are projected to different positions in the arrow Y direction. In particular, since the sidewall of the trench GR2 is gentle, the portion P5 extends obliquely from the portion P4 and gradually approaches the portion P6, and the portion P7 extends obliquely from the portion P8 and gradually approaches the portion P6.

控制部500例如基於攝像部420拍攝到之圖像,檢測部分P5、P7的斜率。當部分P5、P7的斜率相較於既定斜率較為平緩時,控制部500判定刀片101有磨損,否則,判定刀片101未磨損。The control unit 500 detects the slopes of the parts P5 and P7 based on, for example, the image captured by the imaging unit 420 . When the slopes of the parts P5 and P7 are gentler than the predetermined slopes, the control unit 500 determines that the blade 101 is worn, otherwise, it is determined that the blade 101 is not worn.

例如,當部分P4與部分P5的連接部分的X座標(箭頭X方向上的座標)和部分P5與部分P6的連接部分的X座標的差為既定值以上時,控制部500判定部分P5的斜率平緩。再者,控制部500既可於部分P5、P7兩者的斜率平緩時判定刀片101有磨損,亦可於部分P5、P7中的至少一者的斜率平緩時判定刀片101有磨損。藉由上述方法,檢測刀片101的磨損狀態。For example, the control unit 500 determines the slope of the portion P5 when the difference between the X-coordinate (coordinate in the arrow X direction) of the connecting portion of the portion P4 and the portion P5 and the X-coordinate of the connecting portion of the portion P5 and the portion P6 is equal to or greater than a predetermined value gentle. Furthermore, the control unit 500 may determine that the blade 101 is worn when the slopes of both the parts P5 and P7 are gentle, or determine that the blade 101 is worn when the slope of at least one of the parts P5 and P7 is gentle. By the above method, the wear state of the blade 101 is detected.

<3-4.與毛邊相關的檢測原理> 例如,當工件W1為使用了金屬製引線框架之QFN封裝體基板時,有時會因工件W1的切斷而於工件W1的金屬端子部分產生毛邊。<3-4. Detection principle related to burrs> For example, when the workpiece W1 is a QFN package substrate using a metal lead frame, burrs may be generated in the metal terminal portion of the workpiece W1 due to cutting of the workpiece W1.

第13圖是表示形成於工件W1之毛邊的一例的圖。如第13圖所示,於工件W1中,於端子510形成有毛邊511。端子510為金屬製。FIG. 13 is a diagram showing an example of burrs formed on the workpiece W1. As shown in FIG. 13, in the workpiece|work W1, the burr 511 is formed in the terminal 510. The terminal 510 is made of metal.

第14圖是用以說明當於端子510形成有毛邊511時,投影至工件W1之光圖案的示例的圖。如第14圖所示,於工件W1的上表面形成有沿箭頭Y方向延伸之溝槽GR3。於工件W1中,沿溝槽GR3排列有複數個端子510。FIG. 14 is a diagram for explaining an example of a light pattern projected on the workpiece W1 when the terminal 510 has the burr 511 formed thereon. As shown in FIG. 14, the groove|channel GR3 extended in the arrow Y direction is formed in the upper surface of the workpiece|work W1. In the workpiece W1, a plurality of terminals 510 are arranged along the groove GR3.

光源410被構成為將光圖案L7投影至橫跨工件W1的上表面的溝槽GR3及端子510之區域。光圖案L7沿與溝槽GR3延伸之方向大致垂直之方向延伸。再者,光圖案L7延伸之方向並非必須與溝槽GR3延伸之方向大致垂直。只要光圖案L7橫跨溝槽GR3即可。光圖案L7包括部分P9、P10、P11。部分P9、P11投影至除溝槽GR3以外之工件W1的上表面,部分P10投影至溝槽GR3。The light source 410 is configured to project the light pattern L7 on the area of the groove GR3 and the terminal 510 spanning the upper surface of the workpiece W1. The light pattern L7 extends in a direction substantially perpendicular to the direction in which the trench GR3 extends. Furthermore, the direction in which the light pattern L7 extends is not necessarily substantially perpendicular to the direction in which the trench GR3 extends. It is sufficient as long as the light pattern L7 straddles the trench GR3. Light pattern L7 includes portions P9, P10, P11. Parts P9 and P11 are projected to the upper surface of the workpiece W1 except for the groove GR3, and part P10 is projected to the groove GR3.

於端子510形成有毛邊511,因相較於未形成毛邊511之部分,毛邊511部分隆起,故部分P9、P11的投影位置在毛邊511附近於箭頭Y方向中偏移。A burr 511 is formed on the terminal 510 , and since the burr 511 is partially raised compared to the portion where the burr 511 is not formed, the projected positions of the portions P9 and P11 are shifted in the arrow Y direction near the burr 511 .

控制部500例如基於攝像部420拍攝到之圖像,判定形成於工件W1的上表面之端子510部分中是否存在隆起之部分。例如,控制部500基於部分P9、P11的投影位置是否在端子510附近於箭頭Y方向上偏移既定量以上,判定端子510部分中是否存在隆起之部分。控制部500於判定出存在隆起之部分時,判定於工件W1形成有毛邊511。藉由上述方法,檢測形成於工件W1之毛邊511。The control unit 500 determines whether or not there is a raised portion in the portion of the terminal 510 formed on the upper surface of the workpiece W1 based on, for example, the image captured by the imaging unit 420 . For example, the control unit 500 determines whether or not there is a raised portion in the terminal 510 portion based on whether the projection positions of the portions P9 and P11 are shifted by a predetermined amount or more in the arrow Y direction in the vicinity of the terminal 510 . The control part 500 determines that the burr 511 is formed in the workpiece|work W1, when it determines that there exists a raised part. By the above-described method, the burrs 511 formed on the workpiece W1 are detected.

又,於切斷裝置10中,不僅檢測工件W1中有無毛邊511,亦檢測毛邊511的高度。隨後,對毛邊511的高度的檢測原理進行說明。控制部500例如以使部分P9中遠離溝槽GR3既定量的位置(部分P9中於箭頭Y方向未偏移之位置)移動至攝像部420拍攝到之圖像的箭頭Y方向的中心之方式,調整攝像單元400的高度位置。之後,控制部500以使部分P9中於箭頭Y方向上偏移最大的位置(毛邊511最為隆起之位置)移動至箭頭Y方向的中心之方式,調整攝像單元400的高度位置。控制部500基於使部分P9中於箭頭Y方向上偏移最大的位置移動至箭頭Y方向的中心時,攝像單元400在高度方向上的移動量,算出毛邊511的高度。藉由上述方法,檢測毛邊511的高度。再者,於該例中是先使部分P9中遠離溝槽GR3既定量的位置移動至圖像的箭頭Y方向的中心,但亦可先使部分P9中於箭頭Y方向上偏移最大的位置移動至箭頭Y方向的中心。Moreover, in the cutting device 10, not only the presence or absence of the burr 511 in the workpiece W1 is detected, but also the height of the burr 511 is detected. Next, the detection principle of the height of the burr 511 will be described. For example, the control unit 500 moves the position in the portion P9 away from the groove GR3 by a predetermined amount (the position in the portion P9 that is not displaced in the direction of the arrow Y) to the center in the direction of the arrow Y of the image captured by the imaging unit 420, Adjust the height position of the camera unit 400 . After that, the control unit 500 adjusts the height position of the imaging unit 400 so that the position most displaced in the arrow Y direction (the position where the burr 511 is most protruded) in the portion P9 is moved to the center in the arrow Y direction. The control unit 500 calculates the height of the burr 511 based on the amount of movement of the imaging unit 400 in the height direction when the position of the portion P9 most displaced in the arrow Y direction is moved to the center in the arrow Y direction. By the above method, the height of the burr 511 is detected. Furthermore, in this example, the position in the portion P9 that is far away from the groove GR3 by a predetermined amount is moved to the center of the image in the direction of the arrow Y, but the position in the portion P9 that is most shifted in the direction of the arrow Y may be moved first. Move to the center in the Y direction of the arrow.

<3-5.橡膠件的劣化狀態的檢測原理> 如上所述,於切斷裝置10中,亦進行工件W1的全切。因工件W1的全切而導致載置有工件W1之橡膠件202劣化。<3-5. Detection principle of deterioration state of rubber parts> As described above, the cutting device 10 also performs full cutting of the workpiece W1. The rubber member 202 on which the workpiece W1 is placed is deteriorated due to the full cut of the workpiece W1.

第15圖是用以說明投影至橡膠件202之光圖案的示例的圖。如第15圖所示,於橡膠件202,透過工件W1的全切,例如形成溝槽GR4、GR5。溝槽GR4、GR5各自沿箭頭Y方向延伸。於橡膠件202形成有用以吸引工件W1之複數個孔B1。FIG. 15 is a diagram for explaining an example of the light pattern projected on the rubber member 202 . As shown in FIG. 15, grooves GR4 and GR5 are formed in the rubber member 202 through the full cut of the workpiece W1, for example. Each of the grooves GR4 and GR5 extends in the arrow Y direction. A plurality of holes B1 for attracting the workpiece W1 are formed in the rubber member 202 .

光源410被構成為將光圖案L8投影至橫跨橡膠件202的上表面的溝槽GR4、GR5之區域。光圖案L8沿與溝槽GR4、GR5延伸之方向大致垂直的方向延伸。再者,光圖案L8延伸之方向並非必須與溝槽GR4、GR5延伸之方向大致垂直。只要光圖案L8橫跨溝槽GR4、GR5即可。光圖案L8包括部分P12、P13、P14、P15、P16、P17。部分P12、P14、P15、P17投影至除溝槽GR4、GR5以外之橡膠件202的上表面。部分P13投影至溝槽GR4,部分P16投影至溝槽GR5。The light source 410 is configured to project the light pattern L8 onto the regions of the grooves GR4 and GR5 spanning the upper surface of the rubber member 202 . The light pattern L8 extends in a direction substantially perpendicular to the direction in which the grooves GR4 and GR5 extend. Furthermore, the extending direction of the light pattern L8 is not necessarily substantially perpendicular to the extending direction of the trenches GR4 and GR5. The light pattern L8 only needs to straddle the grooves GR4 and GR5. The light pattern L8 includes portions P12, P13, P14, P15, P16, P17. Portions P12, P14, P15, P17 are projected onto the upper surface of the rubber piece 202 except for the grooves GR4, GR5. Portion P13 is projected onto trench GR4, and portion P16 is projected onto trench GR5.

若除溝槽GR4、GR5等以外之橡膠件202的上表面的面積變窄,則工件W1與橡膠件202的接觸面積變小,因此,工件W1的吸附變得不穩定。亦即,若部分P12、P14、P15、P17等短,則工件W1的吸附會變得不穩定。If the area of the upper surface of the rubber member 202 other than the grooves GR4, GR5, etc. is narrowed, the contact area between the workpiece W1 and the rubber member 202 becomes small, and therefore, the adsorption of the workpiece W1 becomes unstable. That is, if the parts P12, P14, P15, P17, etc. are short, the adsorption of the workpiece W1 becomes unstable.

例如,當部分P12、P14、P15、P17等的長度短於既定長度時,控制部500判定橡膠件202劣化。再者,控制部500既可於部分P12、P14、P15、P17等皆短於既定長度時判定橡膠件202劣化,亦可於部分P12、P14、P15、P17等中的至少一部分短於既定長度時判定橡膠件202劣化。又,控制部500亦可於部分P13、P16等長於既定長度時判定橡膠件202劣化。此時,控制部500亦既可於部分P13、P16等皆長於既定長度時判定橡膠件202劣化,亦可於部分P13、P16等中的至少一部分長於既定長度時判定橡膠件202劣化。藉由上述方法,檢測橡膠件202的劣化狀態。For example, when the lengths of the parts P12, P14, P15, P17, etc. are shorter than a predetermined length, the control section 500 determines that the rubber piece 202 is deteriorated. Furthermore, the control unit 500 may determine that the rubber member 202 is deteriorated when all of the parts P12, P14, P15, P17, etc. are shorter than the predetermined length, or at least some of the parts P12, P14, P15, P17, etc. are shorter than the predetermined length. When it is judged that the rubber piece 202 is deteriorated. In addition, the control unit 500 may determine that the rubber member 202 is deteriorated when the parts P13, P16 and the like are longer than a predetermined length. At this time, the control unit 500 may determine that the rubber member 202 is degraded when all of the parts P13, P16, etc. are longer than a predetermined length, or determine that the rubber member 202 is deteriorated when at least some of the parts P13, P16, etc. are longer than a predetermined length. By the above method, the deterioration state of the rubber member 202 is detected.

[4.動作] <4-1.切斷品的製造順序> 第16圖是表示切斷品的製造順序的流程圖。該流程圖所示之處理是於準備好作為切斷對象的工件W1後由控制部500執行。[4. Action] <4-1. Manufacturing sequence of cut products> Fig. 16 is a flowchart showing a manufacturing procedure of a cut product. The processing shown in this flowchart is executed by the control unit 500 after the workpiece W1 to be cut is prepared.

參考第16圖,控制部500以使刀片101接觸CCS區塊300之方式控制主軸部110,以檢測主軸部110在高度方向上的控制座標原點(步驟S100)。控制部500控制攝像單元400以檢測被保持於工件保持單元200上之工件W1的上表面的複數個部位的高度位置(步驟S110)。再者,此時,工件W1位於攝像單元400的下方。16 , the control unit 500 controls the spindle unit 110 so that the blade 101 contacts the CCS block 300 to detect the control coordinate origin of the spindle unit 110 in the height direction (step S100 ). The control unit 500 controls the imaging unit 400 to detect the height positions of a plurality of locations on the upper surface of the workpiece W1 held by the workpiece holding unit 200 (step S110 ). Furthermore, at this time, the workpiece W1 is located below the imaging unit 400 .

第17圖是表示第16圖的步驟S110中之具體處理內容的流程圖。參考第17圖,控制部500控制攝像單元400う將光圖案投影至工件W1的上表面(步驟S200)。控制部500判定光圖案是否位於攝像單元400拍攝到之圖像的箭頭Y方向(參考第9圖等)的中心(以下,亦簡稱為「圖像的中心」)(步驟S210)。FIG. 17 is a flowchart showing the specific processing content in step S110 of FIG. 16 . Referring to FIG. 17 , the control unit 500 controls the imaging unit 400 to project the light pattern on the upper surface of the workpiece W1 (step S200 ). The control unit 500 determines whether the light pattern is located at the center of the image captured by the imaging unit 400 in the arrow Y direction (refer to FIG. 9 and the like) (hereinafter, also simply referred to as the “center of the image”) (step S210 ).

若判定出光圖案位於圖像的中心(步驟S210中為「是」),則控制部500確定工件W1的高度位置為基準位置Z1(步驟S220)。When it is determined that the light pattern is located at the center of the image (YES in step S210 ), the control unit 500 determines the height position of the workpiece W1 as the reference position Z1 (step S220 ).

另一方面,若判定出光圖案未位於圖像的中心(步驟S210中為「否」),則控制部500以使光圖案的位置移動至圖像的中心之方式,使攝像單元400於上下方向移動(步驟S230)。控制部500基於攝像單元400的移動量,算出工件W1的高度位置(步驟S240)。On the other hand, if it is determined that the light pattern is not located at the center of the image (NO in step S210 ), the control unit 500 moves the imaging unit 400 in the vertical direction so as to move the position of the light pattern to the center of the image move (step S230). The control part 500 calculates the height position of the workpiece|work W1 based on the movement amount of the imaging unit 400 (step S240).

控制部500判定預定的所有部位的高度位置是否已檢測完畢(步驟S250)。若判定出預定的所有部位的高度位置已檢測完畢(步驟S250中為「是」),則該流程圖所示之處理結束。另一方面,若判定出預定的所有部位的高度位置未檢測完畢(步驟S250中為「否」),則控制部500於調整工件保持單元200的位置後,重複步驟S200~S250的處理。The control unit 500 determines whether or not the height positions of all predetermined parts have been detected (step S250 ). If it is determined that the detection of the height positions of all the predetermined parts has been completed (YES in step S250 ), the processing shown in this flowchart ends. On the other hand, if it is determined that the height positions of all the predetermined parts have not been detected (NO in step S250 ), the control unit 500 repeats the processing of steps S200 to S250 after adjusting the position of the workpiece holding unit 200 .

再次參考第16圖,若步驟S110的處理結束,則控制部500基於工件W1的高度位置的測定結果調整主軸部110的高度位置(步驟S120)。控制部500控制主軸部110一邊調整主軸部110的高度位置,一邊進行工件W1的切斷(步驟S130)。透過上述處理,進行工件W1的切斷。Referring again to FIG. 16 , when the process of step S110 ends, the control unit 500 adjusts the height position of the spindle unit 110 based on the measurement result of the height position of the workpiece W1 (step S120 ). The control unit 500 controls the spindle unit 110 to perform cutting of the workpiece W1 while adjusting the height position of the spindle unit 110 (step S130 ). The cutting of the workpiece W1 is performed by the above-mentioned processing.

<4-2.溝槽的深度的檢測動作> 第18圖是表示形成於工件W1之溝槽的深度的檢測動作的流程圖。該流程圖所示之處理是於在上表面形成有溝槽之工件W1位於攝像單元400的下方之狀態下,由控制部500執行。<4-2. Detection operation of groove depth> FIG. 18 is a flowchart showing the detection operation of the depth of the groove formed in the workpiece W1. The processing shown in this flowchart is executed by the control unit 500 in a state where the workpiece W1 having the groove formed on the upper surface is positioned below the imaging unit 400 .

參考第18圖,控制部500控制攝像單元400以將光圖案投影至工件W1的上表面的包括溝槽在內之區域(步驟S300)。控制部500判定投影至除溝槽以外之工件W1的上表面之光圖案是否位於攝像單元400拍攝到之圖像的中心(步驟S310)。Referring to FIG. 18 , the control section 500 controls the imaging unit 400 to project the light pattern to the area including the grooves on the upper surface of the workpiece W1 (step S300 ). The control part 500 determines whether the light pattern projected on the upper surface of the workpiece|work W1 other than a groove|channel is located in the center of the image captured by the imaging unit 400 (step S310).

若判定出投影至除溝槽以外之工件W1的上表面之光圖案未位於圖像的中心(步驟S310中為「否」),則控制部500以使光圖案的位置移動至圖像的中心之方式,使攝像單元400於上下方向移動(步驟S320)。另一方面,若判定出投影至除溝槽以外之工件W1的上表面之光圖案位於圖像的中心(步驟S310中為「是」),則處理移至步驟S330。If it is determined that the light pattern projected onto the upper surface of the workpiece W1 other than the groove is not located at the center of the image (NO in step S310 ), the control unit 500 moves the position of the light pattern to the center of the image In this way, the imaging unit 400 is moved in the up-down direction (step S320 ). On the other hand, if it is determined that the light pattern projected onto the upper surface of the workpiece W1 other than the groove is located at the center of the image (YES in step S310 ), the process proceeds to step S330 .

之後,控制部500以使投影至溝槽之光圖案的位置移動至圖像的中心之方式,使攝像單元400於上下方向移動(步驟S330)。控制部500基於步驟S330中之攝像單元400的移動量,算出形成於工件W1之溝槽的深度(步驟S340)。After that, the control unit 500 moves the imaging unit 400 in the vertical direction so as to move the position of the light pattern projected on the groove to the center of the image (step S330 ). The control part 500 calculates the depth of the groove|channel formed in the workpiece|work W1 based on the movement amount of the imaging unit 400 in step S330 (step S340).

<4-3.刀片的磨損狀態的檢測動作> 第19圖是表示刀片101的磨損狀態的檢測動作的流程圖。該流程圖所示之處理是於在上表面形成有溝槽之工件W1位於攝像單元400的下方之狀態下,由控制部500執行。<4-3. Detection operation of the wear state of the blade> FIG. 19 is a flowchart showing the detection operation of the wear state of the blade 101 . The processing shown in this flowchart is executed by the control unit 500 in a state where the workpiece W1 having the groove formed on the upper surface is positioned below the imaging unit 400 .

參考第19圖,控制部500控制攝像單元400以將光圖案投影至工件W1的上表面的包括溝槽在內之區域(步驟S400)。控制部500基於攝像單元400拍攝到之圖像,對例如將第12圖所示之部分P4(靠右的線)與部分P6(靠左的線)加以連接之部分P5(連接部分)進行檢測(步驟S410)。Referring to FIG. 19 , the control part 500 controls the imaging unit 400 to project the light pattern to the area including the grooves on the upper surface of the workpiece W1 (step S400 ). The control unit 500 detects, for example, a portion P5 (connection portion) that connects the portion P4 (the line on the right) and the portion P6 (the line on the left) shown in FIG. 12 based on the image captured by the imaging unit 400 . (step S410).

控制部500判定部分P5(連接部分)的斜率相較於既定斜率是否較為平緩(步驟S420)。若判定出部分P5的斜率相較於既定斜率較為平緩(步驟S420中為「是」),則控制部500判定刀片101的側面有磨損(步驟S430)。另一方面,若判定出部分P5的斜率相較於既定斜率並不平緩(步驟S420中為「否」),則控制部500判定刀片101的側面未磨損(步驟S440)。The control part 500 determines whether the slope of the part P5 (connection part) is gentler than a predetermined slope (step S420). If it is determined that the slope of the portion P5 is gentler than the predetermined slope (YES in step S420 ), the control unit 500 determines that the side surface of the blade 101 is worn (step S430 ). On the other hand, if it is determined that the slope of the portion P5 is not gentler than the predetermined slope (NO in step S420 ), the control unit 500 determines that the side surface of the blade 101 is not worn (step S440 ).

<4-4.與毛邊相關的檢測動作> 第20圖是表示形成於工件W1之毛邊511的有無的檢測動作的流程圖。該流程圖所示之處理是於經切斷之工件W1位於攝像單元400的下方之狀態下,由控制部500執行。<4-4. Detection operation related to burrs> FIG. 20 is a flowchart showing the detection operation of the presence or absence of the burrs 511 formed on the workpiece W1. The processing shown in this flowchart is executed by the control unit 500 in a state where the cut workpiece W1 is located below the imaging unit 400 .

參考第20圖,控制部500控制攝像單元400以將光圖案投影至工件W1的上表面的包括端子510在內之區域(步驟S500)。Referring to FIG. 20 , the control section 500 controls the imaging unit 400 to project the light pattern to the area including the terminal 510 of the upper surface of the workpiece W1 (step S500 ).

控制部500基於攝像單元400拍攝到之圖像,判定端子510處是否存在隆起之區域(步驟S510)。若判定出存在隆起之區域(步驟S510中為「是」),則控制部500判定於工件W1形成有毛邊511(步驟S520)。另一方面,若判定出不存在隆起之區域(步驟S510中為「否」),則控制部500判定於工件W1未形成毛邊511(步驟S530)。The control unit 500 determines whether or not there is a raised area at the terminal 510 based on the image captured by the imaging unit 400 (step S510 ). When it is determined that there is a raised region (YES in step S510 ), the control unit 500 determines that the burr 511 is formed in the workpiece W1 (step S520 ). On the other hand, if it is determined that there is no raised region (NO in step S510 ), the control unit 500 determines that the burr 511 is not formed on the workpiece W1 (step S530 ).

第21圖是表示形成於工件W1之毛邊511的高度的檢測動作的流程圖。該流程圖所示之處理是於經切斷之工件W1位於攝像單元400的下方之狀態下,由控制部500執行。FIG. 21 is a flowchart showing the detection operation of the height of the burr 511 formed on the workpiece W1. The processing shown in this flowchart is executed by the control unit 500 in a state where the cut workpiece W1 is located below the imaging unit 400 .

參考第21圖,控制部500控制攝像單元400以將光圖案投影至工件W1的上表面的包括端子510在內之區域(步驟S600)。控制部500判定光圖案中遠離溝槽GR3(第14圖)既定量之部分(於第14圖中,部分P9中於箭頭Y方向未偏移之部分)是否位於攝像單元400拍攝到之圖像的中心(步驟S610)。Referring to FIG. 21 , the control part 500 controls the imaging unit 400 to project the light pattern to the area including the terminal 510 of the upper surface of the workpiece W1 (step S600 ). The control unit 500 determines whether or not a portion of the light pattern that is far away from the groove GR3 ( FIG. 14 ) by a predetermined amount (in FIG. 14 , the portion P9 that is not shifted in the direction of the arrow Y) is located in the image captured by the imaging unit 400 the center (step S610).

若判定出光圖案中遠離溝槽GR3既定量之部分未位於圖像的中心(步驟S610中為「否」),則控制部500以使光圖案中遠離溝槽GR3既定量之部分移動至圖像的中心之方式,使攝像單元400於上下方向移動(步驟S620)。另一方面,若判定出光圖案中遠離溝槽GR3既定量之部分位於圖像的中心(步驟S610中為「是」),則處理移至步驟S630。If it is determined that the portion of the light pattern that is far away from the groove GR3 by the predetermined amount is not located at the center of the image (NO in step S610 ), the control unit 500 moves the portion of the light pattern that is far away from the groove GR3 by the predetermined amount to the image. The camera unit 400 is moved in the up and down direction in a manner of being in the center (step S620 ). On the other hand, if it is determined that a portion of the light pattern that is distant from the groove GR3 by a predetermined amount is located at the center of the image (YES in step S610 ), the process proceeds to step S630 .

之後,控制部500以使光圖案中投影至毛邊511最為隆起之部位的部分(於第14圖中,部分P9中於箭頭Y方向上偏移最大之部分)移動至圖像的中心之方式,使攝像單元400於上下方向移動(步驟S630)。控制部500基於步驟S630中之攝像單元400的移動量,算出毛邊511的高度(步驟S640)。After that, the control unit 500 moves the part of the light pattern projected to the most protruding part of the burr 511 (in FIG. 14, the part with the largest deviation in the direction of the arrow Y in the part P9) to the center of the image, The imaging unit 400 is moved up and down (step S630 ). The control part 500 calculates the height of the burr 511 based on the movement amount of the imaging unit 400 in step S630 (step S640).

<4-5.橡膠件的劣化狀態的檢測動作> 第22圖是表示橡膠件202的劣化狀態的檢測動作的流程圖。該流程圖所示之處理是於在上表面未載置工件W1之橡膠件202位於攝像單元400的下方之狀態下,由控制部500執行。<4-5. Detection operation of the deterioration state of rubber parts> FIG. 22 is a flowchart showing the detection operation of the deterioration state of the rubber material 202 . The processing shown in this flowchart is executed by the control unit 500 in a state where the rubber member 202 on which the workpiece W1 is not placed on the upper surface is positioned below the imaging unit 400 .

參考第22圖,控制部500控制攝像單元400以將光圖案投影至橡膠件202的上表面(步驟S700)。控制部500基於攝像單元400拍攝到之圖像,檢測投影至除溝槽以外之橡膠件202的上表面之線狀光圖案(步驟S710)。Referring to FIG. 22 , the control part 500 controls the imaging unit 400 to project the light pattern on the upper surface of the rubber member 202 (step S700 ). The control unit 500 detects the linear light pattern projected onto the upper surface of the rubber member 202 excluding the grooves based on the image captured by the imaging unit 400 (step S710 ).

控制部500判定被投影至除溝槽以外之橡膠件202的上表面之線狀光圖案是否短於既定長度(步驟S720)。若判定出光圖案短於既定長度(步驟S720中為「是」),則控制部500判定橡膠件202劣化(步驟S730)。另一方面,若判定出光圖案並不短於既定長度(步驟S720中為「否」),則控制部500判定橡膠件202未劣化(步驟S740)。The control unit 500 determines whether or not the linear light pattern projected onto the upper surface of the rubber member 202 excluding the groove is shorter than a predetermined length (step S720 ). If it is determined that the light pattern is shorter than the predetermined length (YES in step S720 ), the control unit 500 determines that the rubber piece 202 is deteriorated (step S730 ). On the other hand, if it is determined that the light pattern is not shorter than the predetermined length (NO in step S720 ), the control unit 500 determines that the rubber member 202 is not degraded (step S740 ).

[5.特徵] 如上所述,於根據本實施方式的切斷裝置10中,光源410將光圖案投影至工件W1之方向與攝像部420拍攝光圖案之方向所形成的角度大於0°。因此,工件W1的上表面的光圖案的投影位置根據工件W1的上表面的高度位置而發生變化。因此,根據切斷裝置10,無需使用昂貴的零件,基於光圖案的投影位置,便能夠檢測工件W1的上表面的高度位置。[5. Features] As described above, in the cutting device 10 according to the present embodiment, the angle formed by the direction in which the light source 410 projects the light pattern to the workpiece W1 and the direction in which the imaging unit 420 captures the light pattern is greater than 0°. Therefore, the projection position of the light pattern on the upper surface of the workpiece W1 changes according to the height position of the upper surface of the workpiece W1. Therefore, according to the cutting device 10, the height position of the upper surface of the workpiece W1 can be detected based on the projected position of the light pattern without using expensive components.

又,因切斷裝置10具有如上所述的特徵,故根據切斷裝置10,無需使用昂貴的零件,基於投影至工件W1之光圖案的形狀,便能夠檢測刀片101的磨損狀態。Furthermore, since the cutting device 10 has the above-mentioned features, the cutting device 10 can detect the wear state of the blade 101 based on the shape of the light pattern projected on the workpiece W1 without using expensive components.

又,因切斷裝置10具有上述特徵,故根據切斷裝置10,無需使用昂貴的零件,基於投影至工件W1之光圖案的形狀,便能夠進行與形成於工件W1之毛邊511相關的檢測。In addition, since the cutting device 10 has the above-mentioned features, the cutting device 10 can detect the burrs 511 formed on the workpiece W1 based on the shape of the light pattern projected on the workpiece W1 without using expensive components.

又,因切斷裝置10具有上述特徵,故根據切斷裝置10,無需使用昂貴的零件,基於投影至橡膠件202之光圖案的形狀,便能夠檢測橡膠件202的劣化狀態。Moreover, since the cutting device 10 has the above-mentioned characteristics, the cutting device 10 can detect the deterioration state of the rubber material 202 based on the shape of the light pattern projected on the rubber material 202 without using expensive components.

[6.其他實施方式] 上述實施方式的思想並不限於以上所說明之實施方式。以下,對能夠應用上述實施方式的思想之其他實施方式的一例進行說明。[6. Other Embodiments] The idea of the above-described embodiment is not limited to the above-described embodiment. Hereinafter, an example of another embodiment to which the idea of the above-described embodiment can be applied will be described.

於上述實施方式中,光源410所投影之光圖案為線狀。然而,光圖案的形狀並不限於此。光圖案的形狀例如亦可為圓狀,亦可為多邊形狀。In the above embodiment, the light pattern projected by the light source 410 is linear. However, the shape of the light pattern is not limited to this. The shape of the light pattern may be, for example, a circular shape or a polygonal shape.

又,於上述實施方式中,切斷裝置10具有工件W1的高度位置的檢測功能、形成於工件W1之溝槽的深度的檢測功能、刀片101的劣化狀態的檢測功能、形成於工件W1之毛邊511的檢測功能、及橡膠件202的劣化狀態的檢測功能。然而,切斷裝置10並非必須具有所有功能。切斷裝置10例如亦可僅具有上述功能中的一部分功能。Further, in the above-described embodiment, the cutting device 10 has the function of detecting the height position of the workpiece W1, the function of detecting the depth of the groove formed in the workpiece W1, the function of detecting the deterioration state of the blade 101, and the burr formed in the workpiece W1. The detection function of 511, and the detection function of the deterioration state of the rubber member 202. However, the cutting device 10 does not necessarily have all functions. The cutting device 10 may have, for example, only some of the functions described above.

又,於上述實施方式中,主軸部110是於箭頭XY方向移動。然而,主軸部110亦可不必於箭頭XY方向移動。例如,亦可藉由工件保持單元200於箭頭XY方向移動,代替主軸部110於箭頭XY方向移動,而將工件W1搬送至主軸部110的下方的切斷位置。In addition, in the above-mentioned embodiment, the main shaft part 110 moves in the arrow XY directions. However, the main shaft portion 110 does not necessarily need to move in the arrow XY directions. For example, the workpiece W1 may be conveyed to the cutting position below the spindle portion 110 by moving the workpiece holding unit 200 in the arrow XY directions instead of the spindle portion 110 moving in the arrow XY directions.

又,於上述實施方式中,是藉由使用CCS區塊300,檢測主軸部110在高度方向上的控制座標原點。然而,主軸部110在高度方向上的控制座標原點亦可不必藉由使用CCS區塊300進行檢測。主軸部110在高度方向上的控制座標原點,例如亦可藉由使用對刀片101的接觸進行檢測之觸控感測器等進行檢測。又,於檢測控制座標原點時,接觸CCS區塊300等之部分並非必須是刀片101。例如,亦可由主軸部110的除刀片101以外之部分來接觸CCS區塊300等。Furthermore, in the above-described embodiment, the control coordinate origin of the main shaft portion 110 in the height direction is detected by using the CCS block 300 . However, the origin of the control coordinates in the height direction of the main shaft portion 110 does not need to be detected by using the CCS block 300 . The origin of the control coordinates of the spindle portion 110 in the height direction can also be detected, for example, by using a touch sensor or the like that detects the contact of the blade 101 . In addition, when detecting the origin of the control coordinates, the portion contacting the CCS block 300 and the like does not necessarily have to be the blade 101 . For example, the portion of the spindle portion 110 other than the blade 101 may contact the CCS block 300 or the like.

又,於根據上述實施方式的切斷裝置10中,為實現上述各種功能,另行設置有攝像單元400。然而,並非必須另行設置攝像單元400來實現上述各種功能。In addition, in the cutting device 10 according to the above-described embodiment, in order to realize the various functions described above, an imaging unit 400 is separately provided. However, it is not necessary to separately provide the imaging unit 400 to realize the various functions described above.

第23圖是示意性地表示切斷裝置10A的一部分的平面之圖。如第23圖所示,切斷裝置10A不包括上述實施方式中的攝像單元400。Fig. 23 is a plan view schematically showing a part of the cutting device 10A. As shown in FIG. 23 , the cutting device 10A does not include the imaging unit 400 in the above-described embodiment.

切斷裝置10A包括第一位置確認相機700及第二位置確認相機800。第一位置確認相機700及第二位置確認相機800於第1圖中未圖示。於工件W1的上表面印刷有既定標記。該標記例如表示工件W1的切斷位置。第一位置確認相機700拍攝工件W1,並生成圖像資料。控制部500基於圖像資料所示之標記的位置,確認工件保持單元200上的工件W1的位置及工件W1的切斷位置。利用第一位置確認相機700進行的拍攝是於切斷工件W1之前進行。The cutting device 10A includes a first position checking camera 700 and a second position checking camera 800 . The first position checking camera 700 and the second position checking camera 800 are not shown in the first figure. A predetermined mark is printed on the upper surface of the workpiece W1. This mark indicates, for example, the cutting position of the workpiece W1. The first position confirmation camera 700 images the workpiece W1 and generates image data. The control unit 500 confirms the position of the workpiece W1 on the workpiece holding unit 200 and the cutting position of the workpiece W1 based on the position of the mark shown in the image data. The imaging by the first position confirmation camera 700 is performed before the workpiece W1 is cut.

又,第二位置確認相機800拍攝切斷後的工件W1,並生成圖像資料。控制部500基於所生成之圖像資料,確認工件保持單元200上的工件W1的位置、以及工件W1的切斷位置及切斷寬度等。基於由第二位置確認相機800生成之圖像資料,判定工件W1的切斷位置及切斷寬度等是否有問題。In addition, the second position checking camera 800 images the workpiece W1 after cutting, and generates image data. The control unit 500 confirms the position of the workpiece W1 on the workpiece holding unit 200, the cutting position and the cutting width of the workpiece W1, and the like based on the generated image data. Based on the image data generated by the second position checking camera 800, it is determined whether or not there is a problem with the cutting position and cutting width of the workpiece W1.

例如,第一位置確認相機700或第二位置確認相機800亦可包括上述實施方式中的攝像單元400的構成。如此,能夠藉由在現有的相機中包括攝像單元400的構成,實現成本的降低及空間的節省。For example, the first position confirmation camera 700 or the second position confirmation camera 800 may also include the configuration of the imaging unit 400 in the above-described embodiment. In this way, by including the imaging unit 400 in the conventional camera, cost reduction and space saving can be achieved.

又,例如,當第一位置確認相機700包括攝像單元400的構成時,於確認工件W1的切斷位置時,一併檢測工件W1的高度位置,因此,得以更準確地檢測工件W1的切斷位置處的工件W1的高度位置。Also, for example, when the first position checking camera 700 includes the imaging unit 400, the height position of the workpiece W1 is also detected when the cutting position of the workpiece W1 is checked, so that the cutting of the workpiece W1 can be detected more accurately. The height position of the workpiece W1 at the position.

又,例如,當第二位置確認相機800包括攝像單元400的構成時,能夠藉由最低限度的工件W1的移動,實現與工件W1的毛邊相關的檢測、或與刀片101的側面的磨損狀態相關的檢測等的在切斷工件W1後進行之檢測。Also, for example, when the second position checking camera 800 includes the imaging unit 400, it is possible to detect the burr of the workpiece W1 or the wear state of the side surface of the blade 101 with minimal movement of the workpiece W1. The inspection of the workpiece W1 is performed after the workpiece W1 is cut.

以上,對本發明的實施方式進行了示例性說明。亦即,為進行示例性說明,揭示了詳細說明及隨附圖式。因此,於詳細說明及所附圖式所記載之構成要素中,有時會包括並非解決問題所必需的構成要素。因此,不應該因為在詳細說明及隨附圖式中記載有這些並非必需的構成要素,便直接認定這些並非必需的構成要素是必需的。The embodiments of the present invention have been exemplified above. That is, for illustrative purposes, the detailed description and accompanying drawings are disclosed. Therefore, the components described in the detailed description and the attached drawings may include components that are not necessary to solve the problem. Therefore, it should not be assumed that these unnecessary components are essential because they are described in the detailed description and the accompanying drawings.

又,上述實施方式在所有方面僅是本發明的例示。上述實施方式可於本發明的範圍內進行各種改良或變更。即,於實施本發明時,可根據實施方式適當地採用具體的構成。In addition, the above-mentioned embodiment is only an illustration of this invention in every respect. The above-mentioned embodiment can be variously improved or changed within the scope of the present invention. That is, when carrying out this invention, a specific structure can be suitably employ|adopted according to embodiment.

10,10A:切斷裝置 100:切斷單元 101:刀片 102:主軸部主體 103,104:滑塊 105:支撐體 110:主軸部 200:工件保持單元 201:切斷台 202:橡膠件(吸附構件的一例) 300:CCS區塊 400:攝像單元 410:光源 411:LED照明 412:光學系統 413:投影透鏡 414:光圈 415:狹縫構件 420:攝像部 500:控制部(檢測部的一例) 510:端子 511:毛邊 700:第一位置確認相機 800:第二位置確認相機 A1:角度 A1~A3:位置 B1:孔 G1,G2:導件 GR1~GR5,GR21:溝槽 H1~H3:高度 L1~L8:光圖案 P1~P17:部分 S100~S130,S200~S250,S300~S340,S400~S440,S500~S530,S600~S640,S700~S740:步驟 W1:工件 X,Y,Z:箭頭 Z1:基準位置 Z1+α,Z1-α:位置 θ:方向10,10A: Cut-off device 100: Cut off unit 101: Blades 102: Main body of main shaft 103, 104: Slider 105: Support body 110: Spindle part 200: Workpiece holding unit 201: Cut-off table 202: Rubber parts (an example of adsorption member) 300: CCS block 400: Camera unit 410: Light source 411: LED lighting 412: Optical System 413: Projection Lens 414: Aperture 415: Slit Member 420: Camera Department 500: Control part (an example of detection part) 510: Terminal 511: Burrs 700: First position confirmation camera 800: Second position confirmation camera A1: Angle A1~A3: Location B1: hole G1, G2: Guide GR1~GR5, GR21: Groove H1~H3: Height L1~L8: Light pattern P1~P17: part S100~S130, S200~S250, S300~S340, S400~S440, S500~S530, S600~S640, S700~S740: Steps W1: Workpiece X,Y,Z: Arrow Z1: Reference position Z1+α, Z1-α: position θ: direction

第1圖是示意性地表示切斷裝置的一部分的平面之圖。 第2圖是示意性地表示切斷裝置的一部分的正面之圖。 第3圖是用以說明使用了CCS區塊之控制座標原點的檢測順序的圖。 第4圖是示意性地表示攝像單元的構造的圖。 第5圖是示意性地表示光源的構造的圖。 第6圖是表示投影至工件之光圖案的一例的圖。 第7圖是包括保持於工件保持單元上之工件的前視圖。 第8圖是表示光源所投影之光圖案是如何根據工件的上表面的高度位置來變化的圖。 第9圖是用以說明投影至工件之光圖案的示例的圖。 第10圖是用以說明當於工件形成有溝槽時,投影至工件之光圖案的示例的圖。 第11圖是示意性地表示利用刀片形成有溝槽之工件的局部剖面圖。 第12圖是用以說明當利用磨損的刀片形成有溝槽時,投影至工件之光圖案的示例的圖。 第13圖是表示形成於工件之毛邊的一例的圖。 第14圖是用以說明當於端子形成有毛邊時,投影至工件之光圖案的示例的圖。 第15圖是用以說明投影至橡膠件之光圖案的示例的圖。 第16圖是表示切斷品的製造順序的流程圖。 第17圖是表示第16圖的步驟S110中之具體處理內容的流程圖。 第18圖是表示形成於工件之溝槽的深度的檢測動作的流程圖。 第19圖是表示刀片的磨損狀態的檢測動作的流程圖。 第20圖是表示形成於工件之毛邊的有無的檢測動作的流程圖。 第21圖是表示形成於工件之毛邊的高度的檢測動作的流程圖。 第22圖是表示橡膠件的劣化狀態的檢測動作的流程圖。 第23圖是示意性地表示其他實施方式中之切斷裝置的一部分的平面之圖。FIG. 1 is a plan view schematically showing a part of the cutting device. FIG. 2 is a front view schematically showing a part of the cutting device. FIG. 3 is a diagram for explaining the detection procedure of the origin of the control coordinates using the CCS block. FIG. 4 is a diagram schematically showing the structure of the imaging unit. FIG. 5 is a diagram schematically showing the structure of the light source. FIG. 6 is a diagram showing an example of a light pattern projected on a workpiece. Fig. 7 is a front view including the workpiece held by the workpiece holding unit. FIG. 8 is a diagram showing how the light pattern projected by the light source changes according to the height position of the upper surface of the workpiece. FIG. 9 is a diagram for explaining an example of a light pattern projected onto a workpiece. FIG. 10 is a diagram for explaining an example of a light pattern projected on the workpiece when grooves are formed in the workpiece. Fig. 11 is a partial cross-sectional view schematically showing a workpiece in which grooves are formed by an insert. FIG. 12 is a diagram for explaining an example of a light pattern projected on a workpiece when a groove is formed by a worn blade. Fig. 13 is a diagram showing an example of burrs formed on a workpiece. FIG. 14 is a diagram for explaining an example of a light pattern projected on a workpiece when a burr is formed on a terminal. FIG. 15 is a diagram for explaining an example of a light pattern projected onto a rubber member. Fig. 16 is a flowchart showing a manufacturing procedure of a cut product. FIG. 17 is a flowchart showing the specific processing content in step S110 of FIG. 16 . FIG. 18 is a flowchart showing the detection operation of the depth of the groove formed in the workpiece. FIG. 19 is a flowchart showing the detection operation of the wear state of the blade. FIG. 20 is a flowchart showing the detection operation for the presence or absence of burrs formed on the workpiece. Fig. 21 is a flowchart showing the detection operation of the height of the burr formed on the workpiece. Fig. 22 is a flowchart showing the detection operation of the deterioration state of the rubber material. Fig. 23 is a plan view schematically showing a part of a cutting device in another embodiment.

國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無Domestic storage information (please note in the order of storage institution, date and number) without Foreign deposit information (please note in the order of deposit country, institution, date and number) without

10:切斷裝置10: Cutting device

100:切斷單元100: Cut off unit

101:刀片101: Blades

102:主軸部主體102: Main body of main shaft

103,104:滑塊103, 104: Slider

105:支撐體105: Support body

110:主軸部110: Spindle part

200:工件保持單元200: Workpiece holding unit

201:切斷台201: Cut-off table

202:橡膠件(吸附構件的一例)202: Rubber parts (an example of adsorption member)

300:CCS區塊300: CCS block

400:攝像單元400: Camera unit

500:控制部(檢測部的一例)500: Control part (an example of detection part)

W1:工件W1: Workpiece

X,Y,Z:箭頭X,Y,Z: Arrow

θ:方向θ: direction

21~22:基板21~22: Substrate

Claims (9)

一種切斷裝置,其構成為將工件加以切斷,且具備: 光源,其被構成為將光圖案投影至該工件; 攝像部,其被構成為拍攝該光圖案,並生成第一圖像資料;及, 檢測部,其被構成為基於該第一圖像資料檢測該工件的高度位置;且, 該光源投影該光圖案之方向與該攝像部拍攝該光圖案之方向所形成的角度大於0°。A cutting device, which is configured to cut a workpiece, and is provided with: a light source configured to project a light pattern onto the workpiece; an imaging unit configured to capture the light pattern and generate first image data; and, a detection unit configured to detect the height position of the workpiece based on the first image data; and, The angle formed by the direction in which the light source projects the light pattern and the direction in which the imaging unit captures the light pattern is greater than 0°. 如請求項1所述之切斷裝置,其中: 該檢測部被構成為基於由該攝像部拍攝到之該光圖案的位置,檢測該工件的高度位置。A cutting device as claimed in claim 1, wherein: The detection unit is configured to detect the height position of the workpiece based on the position of the light pattern captured by the imaging unit. 如請求項1或2所述之切斷裝置,其中: 該工件為樹脂成形後的基板。A cutting device as claimed in claim 1 or 2, wherein: The workpiece is a substrate after resin molding. 如請求項1~3中任一項所述之切斷裝置,其中: 該光源被構成為自該工件的斜方向朝該工件投影該光圖案。The cutting device according to any one of claims 1 to 3, wherein: The light source is configured to project the light pattern toward the workpiece from an oblique direction of the workpiece. 如請求項1~4中任一項所述之切斷裝置,更具備:刀片,其中, 於該工件形成有溝槽; 該光源被構成為將該光圖案投影至包括該工件中的該溝槽之區域, 該檢測部被構成為基於由該攝像部拍攝到之該光圖案的形狀,檢測該刀片的磨損狀態。The cutting device according to any one of claims 1 to 4, further comprising: a blade, wherein: a groove is formed in the workpiece; the light source is configured to project the light pattern onto an area including the groove in the workpiece, The detection unit is configured to detect the wear state of the blade based on the shape of the light pattern captured by the imaging unit. 如請求項1~5中任一項所述之切斷裝置,其中: 該光源被構成為將該光圖案投影至包括形成於該工件之金屬端子之區域; 該檢測部被構成為基於由該攝像部拍攝到之該光圖案的形狀,進行與該工件的毛邊相關的檢測。The cutting device according to any one of claims 1 to 5, wherein: the light source is configured to project the light pattern onto an area including metal terminals formed on the workpiece; The detection unit is configured to detect the burrs of the workpiece based on the shape of the light pattern captured by the imaging unit. 如請求項1~6中任一項所述之切斷裝置,更具備:載置該工件之吸附構件,其中, 該光源被構成為將該光圖案投影至該吸附構件, 該攝像部被構成為拍攝該吸附構件, 該檢測部被構成為基於由該攝像部拍攝到之該吸附構件上的該光圖案的形狀,檢測該吸附構件的劣化狀態。The cutting device according to any one of claims 1 to 6, further comprising: a suction member for placing the workpiece, wherein: The light source is configured to project the light pattern onto the suction member, The imaging unit is configured to photograph the suction member, The detection unit is configured to detect the deterioration state of the suction member based on the shape of the light pattern on the suction member captured by the imaging unit. 如請求項1~7中任一項所述之切斷裝置,其中: 該攝像部被構成為拍攝形成於該工件上之標記,並生成第二圖像資料, 該檢測部被構成為基於該第二圖像資料檢測該工件的切斷位置。The cutting device according to any one of claims 1 to 7, wherein: The imaging unit is configured to capture a mark formed on the workpiece and generate second image data, The detection unit is configured to detect the cutting position of the workpiece based on the second image data. 一種切斷品的製造方法,其使用如請求項1至7中任一項所述之切斷裝置,且包括以下步驟: 將光圖案投影至該工件; 拍攝該光圖案,並生成圖像資料; 基於該圖像資料檢測該工件的高度位置;及, 基於該工件的高度位置切斷該工件,以製造該切斷品。A manufacturing method of a cut product, which uses the cutting device as described in any one of claims 1 to 7, and comprises the following steps: projecting a light pattern onto the workpiece; photographing the light pattern and generating image data; Detecting the height position of the workpiece based on the image data; and, The workpiece is cut based on the height position of the workpiece to manufacture the cut product.
TW110128330A 2020-08-06 2021-08-02 Cutting device and method of manufacturing cut product TWI806114B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020133787A JP7530763B2 (en) 2020-08-06 2020-08-06 Cutting device and manufacturing method of cut products
JP2020-133787 2020-08-06

Publications (2)

Publication Number Publication Date
TW202206216A true TW202206216A (en) 2022-02-16
TWI806114B TWI806114B (en) 2023-06-21

Family

ID=80233508

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110128330A TWI806114B (en) 2020-08-06 2021-08-02 Cutting device and method of manufacturing cut product

Country Status (4)

Country Link
JP (1) JP7530763B2 (en)
KR (1) KR102673712B1 (en)
CN (1) CN114055647B (en)
TW (1) TWI806114B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114800196A (en) * 2022-05-16 2022-07-29 河北新金轧材有限公司 Numerically controlled grinder for steel rolling mill

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10106937A (en) * 1996-09-26 1998-04-24 Nikon Corp Position detecting method, its equipment and projection aligner
JPH10318718A (en) * 1997-05-14 1998-12-04 Hitachi Ltd Optical height detecting device
JP3872007B2 (en) * 2002-12-16 2007-01-24 シーケーディ株式会社 Measuring device and inspection device
JP2005109324A (en) * 2003-10-01 2005-04-21 Tokyo Seimitsu Co Ltd Laser beam dicing device
JP5334861B2 (en) * 2006-12-15 2013-11-06 フラウンホッファー−ゲゼルシャフト ツァ フェルダールング デァ アンゲヴァンテン フォアシュンク エー.ファオ Method and apparatus for thickness measurement
JP4879012B2 (en) * 2006-12-28 2012-02-15 株式会社ディスコ Cutting blade tip shape inspection method
WO2008126647A1 (en) * 2007-04-05 2008-10-23 Nikon Corporation Geometry measurement instrument and method for measuring geometry
JP2009031150A (en) * 2007-07-27 2009-02-12 Omron Corp Three-dimensional shape measuring device, three-dimensional shape measurement method, three-dimensional shape measurement program, and record medium
JP5248825B2 (en) * 2007-09-06 2013-07-31 株式会社ディスコ Device for detecting the height position of the workpiece held on the chuck table
JP2009094295A (en) * 2007-10-09 2009-04-30 Juki Corp Apparatus for measuring height of electronic component
JP4715944B2 (en) * 2009-04-03 2011-07-06 オムロン株式会社 Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, and three-dimensional shape measuring program
JP5389613B2 (en) * 2009-11-12 2014-01-15 株式会社ディスコ Method for managing consumption of cutting blade in cutting apparatus
JP2012242138A (en) * 2011-05-16 2012-12-10 Kobe Steel Ltd Shape measuring device
CN104136881B (en) * 2012-02-03 2017-08-29 独立行政法人产业技术综合研究所 The method and device for the method for the height of projection or ridge on measurement article surface
JP5882072B2 (en) * 2012-02-06 2016-03-09 株式会社日立ハイテクノロジーズ Defect observation method and apparatus
ES2683364T3 (en) * 2012-11-07 2018-09-26 Artec Europe S.A.R.L. Method to monitor linear dimensions of three-dimensional objects
JP6115642B2 (en) * 2013-08-01 2017-04-19 株式会社島津製作所 Height measuring device
JP5997127B2 (en) * 2013-11-18 2016-09-28 Ckd株式会社 Solder printing inspection apparatus and board manufacturing system
JP2015102485A (en) * 2013-11-27 2015-06-04 株式会社ニコン Shape measuring device, optical scanner, structure manufacturing system, shape measuring method, structure manufacturing method, and shape measuring program
JP6143668B2 (en) * 2013-12-28 2017-06-07 Towa株式会社 Cutting apparatus and method for manufacturing electronic parts
JP6285784B2 (en) * 2014-04-09 2018-02-28 株式会社ディスコ Height position detector
JP6491425B2 (en) * 2014-05-21 2019-03-27 Towa株式会社 Electronic parts package side view photographing device
JP6489429B2 (en) * 2015-03-09 2019-03-27 株式会社東京精密 Wafer chuck clogging inspection apparatus and inspection method
JP6651257B2 (en) * 2016-06-03 2020-02-19 株式会社ディスコ Workpiece inspection method, inspection device, laser processing device, and expansion device
JP6848385B2 (en) * 2016-11-18 2021-03-24 オムロン株式会社 3D shape measuring device
JP6330162B2 (en) * 2016-11-24 2018-05-30 株式会社新川 Bonding apparatus and method for detecting height of bonding object
US10832976B2 (en) * 2017-01-12 2020-11-10 Hitachi High-Tech Corporation Charged particle beam device and optical examination device
JP6953242B2 (en) * 2017-09-06 2021-10-27 株式会社ディスコ Height detector and laser machining equipment
JP6991668B2 (en) * 2018-02-15 2022-01-12 株式会社ディスコ Processing equipment
JP7090446B2 (en) * 2018-03-22 2022-06-24 株式会社キーエンス Image processing equipment
JP7219034B2 (en) * 2018-09-14 2023-02-07 株式会社ミツトヨ Three-dimensional shape measuring device and three-dimensional shape measuring method
JP7164411B2 (en) * 2018-11-15 2022-11-01 株式会社ディスコ Laminate processing method

Also Published As

Publication number Publication date
JP2022030051A (en) 2022-02-18
KR102673712B1 (en) 2024-06-11
TWI806114B (en) 2023-06-21
KR20220018424A (en) 2022-02-15
CN114055647A (en) 2022-02-18
CN114055647B (en) 2024-06-21
JP7530763B2 (en) 2024-08-08

Similar Documents

Publication Publication Date Title
JP6465722B2 (en) Processing equipment
US10816322B2 (en) Bonding apparatus and method for detecting height of bonding target
KR102194372B1 (en) Use of placeable marker components for a staged placement of components on a carrier
JP2010050418A (en) Method of controlling electronic component mounting equipment
TWI806114B (en) Cutting device and method of manufacturing cut product
TW201621997A (en) Cutting apparatus
JP2016004987A (en) Electronic component packaging device, and electronic component packaging method
JP5238730B2 (en) Component mounting machine, component detection apparatus, and component mounting method
CN110783224A (en) Assembling component carriers using offset information between structural features formed on opposite sides of a reference component
JP3933060B2 (en) Bonding wire inspection method
JP2010261965A (en) Component recognition device, surface mounting machine, and component inspection device
TW202003183A (en) Workpiece processing method capable of appropriately adjusting height of cutting blade without greatly reducing productivity
JP6752706B2 (en) Judgment device and surface mounter
JP2007168050A (en) Substrate cutting device
CN114102718B (en) Cutting device and method for manufacturing cut product
JP7050926B2 (en) Foreign matter detection method and electronic component mounting device
JPWO2019239573A1 (en) Work machine
JP2002267415A (en) Semiconductor measuring instrument
TWI854334B (en) System and method for determining contact height of a packaged chip
JP2022006715A (en) Cutting device and method for manufacturing cut product
JP4463910B2 (en) Method and apparatus for detecting lead lift of electronic components
TWM659479U (en) Wafer identification device
JPH1187452A (en) Inspection apparatus and method of inspecting positional deviation
JP2024138624A (en) Processing method
JPH03208400A (en) Method and relevant device for inspecting electronic component