TW202205400A - Laser processing device and laser processing method - Google Patents
Laser processing device and laser processing method Download PDFInfo
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- TW202205400A TW202205400A TW110111575A TW110111575A TW202205400A TW 202205400 A TW202205400 A TW 202205400A TW 110111575 A TW110111575 A TW 110111575A TW 110111575 A TW110111575 A TW 110111575A TW 202205400 A TW202205400 A TW 202205400A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/067—Dividing the beam into multiple beams, e.g. multifocusing
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/073—Shaping the laser spot
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/50—Working by transmitting the laser beam through or within the workpiece
- B23K26/53—Working by transmitting the laser beam through or within the workpiece for modifying or reforming the material inside the workpiece, e.g. for producing break initiation cracks
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Abstract
Description
本發明的一態樣是關於雷射加工裝置及雷射加工方法。One aspect of the present invention relates to a laser processing apparatus and a laser processing method.
專利文獻1所載的雷射加工裝置係具備:保持工件之保持機構、及對由保持機構保持的工件照射雷射光之雷射照射機構。在專利文獻1所載的雷射加工裝置,具有聚光透鏡之雷射照射機構相對於基台是固定的,藉由保持機構來實施沿著與聚光透鏡之光軸垂直的方向之工件的移動。
[先前技術文獻]
[專利文獻]The laser processing apparatus described in
[專利文獻1]日本特許第5456510號公報 [專利文獻2]日本特開2020-069530號公報[Patent Document 1] Japanese Patent No. 5456510 [Patent Document 2] Japanese Patent Application Laid-Open No. 2020-069530
[發明所欲解決之問題][Problems to be Solved by Invention]
然而,在例如半導體裝置(device)的製程,會有實施修整加工的情況。該修整加工是從半導體晶圓將其外緣部分當作不需要的部分而予以除去。但是,為了從對象物將其外緣部分除去,藉由沿著在對象物之外緣的內側呈環狀延伸的線(line)讓雷射光的聚光點相對移動,而沿著該線形成改質區域時,已知外緣部分被除去而形成之對象物之修整面的品質有按照場所而降低的疑慮。However, in processes such as semiconductor devices, there are cases where trimming is performed. In this trimming process, the outer edge portion of the semiconductor wafer is removed as an unnecessary portion. However, in order to remove the outer edge portion of the object from the object, the laser beam is formed along the line by relatively moving the condensing point of the laser light along the line extending annularly inside the outer edge of the object. In the modified region, it is known that the quality of the trimmed surface of the object formed by removing the outer edge portion may decrease depending on the location.
另一方面,依據本發明人的認識,在修整加工時,要以自對象物之雷射光的入射面側到達其相反側的面的方式從改質區域讓龜裂伸展的情況,並不是沿著對象物的厚度方向而朝鉛直方向讓龜裂伸展,而是要求以相對於厚度方向傾斜的方式斜向地讓龜裂伸展。這是為了抑制例如以下的現象,當沿著厚度方向讓龜裂伸展的情況,會到達沿著厚度方向配置於對象物的正下方之其他對象物(例如,在作為對象物之晶圓上所貼合的其他晶圓)。亦即,本發明人對於上述技術領域有新的認識,亦即要求能夠在抑制外緣部分被除去後之對象物的修整面之品質降低的狀態下形成斜向龜裂。On the other hand, according to the knowledge of the present inventors, during the trimming process, the cracks are extended from the modified region so as to reach the surface on the opposite side from the incident surface side of the laser light of the object, not along the In order to extend the crack in the vertical direction with respect to the thickness direction of the object, it is required to extend the crack obliquely with respect to the thickness direction. This is to suppress, for example, a phenomenon in which, when a crack is extended in the thickness direction, it will reach another object (for example, on a wafer that is an object) arranged directly below the object in the thickness direction. bonded other wafers). That is, the inventors of the present invention have new knowledge in the above-mentioned technical field, that is, it is required that the oblique cracks can be formed in a state in which the quality degradation of the trimmed surface of the object after the outer edge portion is removed is suppressed.
於是,本發明的一態樣,其目的是為了提供能夠在抑制外緣部分被除去後之對象物的修整面之品質降低的狀態下形成斜向龜裂之雷射加工裝置及雷射加工方法。 [解決問題之技術手段]Then, one aspect of the present invention aims to provide a laser processing apparatus and a laser processing method capable of forming an oblique crack while suppressing deterioration in the quality of the trimmed surface of the object after removal of the outer edge portion. . [Technical means to solve problems]
本發明人,為了解決上述問題是進行苦心研究的結果,有了以下般的認識。亦即,首先,當對象物是晶圓,該晶圓以(100)面為主面,且具有與一個(110)面正交之第1結晶方位及與另一個(110)面正交之第2結晶方位的情況,以接近第1結晶方位及第2結晶方位當中與加工進展方向(聚光點之相對移動的方向)之間的角度較大的一方的方式,且以相對於加工進展方向傾斜的方式將光束形狀成形,藉此可抑制外側面的品質降低(例如,參照上述專利文獻2)。The inventors of the present invention have come to the following knowledge as a result of earnest research in order to solve the above-mentioned problems. That is, first, when the object is a wafer, the wafer has the (100) plane as its main plane, and has a first crystal orientation orthogonal to one (110) plane and a first crystal orientation orthogonal to the other (110) plane. In the case of the second crystal orientation, among the first crystal orientation and the second crystal orientation, the angle between the first crystal orientation and the second crystal orientation and the processing progress direction (the direction of relative movement of the light-converging point), whichever is larger, is close to the processing progress. By shaping the beam shape so that the direction is inclined, it is possible to suppress deterioration of the quality of the outer surface (for example, refer to the above-mentioned Patent Document 2).
更具體的說,當從改質區域延伸的龜裂例如在第1結晶方位被拉伸的情況,將光束形狀設為長條狀,且其長邊方向的朝向不是設為加工進展方向的朝向,而是相對於加工進展方向以接近與第1結晶方位側為相反側之第2結晶方位的方式傾斜。藉此,對於結晶方位(結晶軸)所致之龜裂伸展力,將光束形狀設為長條狀所致之龜裂伸展力應可發揮抵消的作用,而讓龜裂沿著加工進展方向精度良好地伸展。More specifically, when the crack extending from the modified region is stretched in the first crystal orientation, for example, the beam shape is elongated, and the orientation of the longitudinal direction is not the orientation of the processing progress direction. , but inclines so as to approach the second crystal orientation on the opposite side of the first crystal orientation with respect to the processing progress direction. Therefore, for the crack extension force due to the crystal orientation (crystal axis), the crack extension force due to the long beam shape should be able to counteract the crack extension force, so that the crack can be accurately processed along the direction of progress. Stretch well.
又當從改質區域延伸的龜裂例如在第2結晶方位被拉伸的情況,將光束形狀設為長條狀,且其長邊方向的朝向不是設為加工進展方向的朝向,而是相對於加工進展方向以接近與第2結晶方位側為相反側之第1結晶方位的方式傾斜。藉此,對於結晶方位所致之龜裂伸展力,將光束形狀設為長條狀所致之龜裂伸展力應可發揮抵消的作用,而讓龜裂沿著加工進展方向精度良好地伸展。結果應可抑制修整面的品質降低。Also, when the crack extending from the modified region is stretched in the second crystal orientation, for example, the beam shape is elongated, and the direction of the longitudinal direction is not the direction of the processing progress direction, but is relatively It inclines so as to approach the first crystal orientation on the opposite side to the second crystal orientation side in the processing progress direction. Therefore, the crack extension force due to the crystal orientation should be counteracted by the beam shape being elongated, so that the cracks can be accurately extended along the machining progress direction. As a result, the quality degradation of the trimmed surface should be suppressed.
另一方面,本發明人根據上述認識而進一步展開研究的結果發現到,縱使根據加工進展方向和結晶構造而將光束形狀之長邊方向的朝向如上述般進行設定的情況,按照光束形狀之長邊方向的朝向和斜向龜裂之傾斜方向的關係,仍有進一步抑制修整面的品質降低的餘地。亦即,當光束形狀之長邊方向的朝向和斜向龜裂的傾斜方向相對於加工進展方向位在同一側的情況,修整面的品質相對良好。但當光束形狀之長邊方向的朝向和斜向龜裂的傾斜方向相對於加工進展方向彼此成為相反側的情況,會有修整面的品質相對不良好的情況。On the other hand, as a result of further research based on the above-mentioned knowledge, the present inventors found that even if the direction of the longitudinal direction of the beam shape is set as described above according to the direction of processing progress and the crystal structure, the length of the beam shape varies according to the length of the beam shape. The relationship between the direction of the edge direction and the inclination direction of the oblique crack still has room to further suppress the deterioration of the quality of the trimmed surface. That is, when the direction of the longitudinal direction of the beam shape and the inclination direction of the oblique crack are on the same side with respect to the progressing direction of processing, the quality of the trimmed surface is relatively good. However, when the direction of the longitudinal direction of the beam shape and the inclination direction of the oblique crack are opposite to each other with respect to the progressing direction of processing, the quality of the trimmed surface may be relatively poor.
特別是,當將規定加工進展方向的線與第2結晶方位正交的點設為0˚,將該線與第1結晶方位正交的點設為90˚,將該線上之0˚和90˚之中間的點設為45˚時,在進行45˚的點之加工時,若處於光束形狀之長邊方向的朝向和斜向龜裂的傾斜方向相對於加工進展方向彼此成為相反側的狀態,容易發生修整面的品質降低。本發明的一態樣是根據以上般的認識而完成者。In particular, let the point at which the line defining the direction of machining progresses orthogonal to the second crystal orientation be 0°, the point at which the line intersecting the first crystal orientation is orthogonal to 90°, and 0° and 90° on the line. When the point in the middle of ˚ is set to 45˚, when processing the point of 45˚, if the direction of the longitudinal direction of the beam shape and the inclination direction of the oblique crack are opposite to each other with respect to the progressing direction of machining , it is easy to reduce the quality of the trimmed surface. One aspect of the present invention was completed based on the above general knowledge.
亦即,本發明的一態樣之雷射加工裝置,係用於對對象物照射雷射光來形成改質區域之雷射加工裝置,其係具備:用於支承對象物之支承部、用於朝向由支承部支承之對象物照射雷射光之照射部、用於讓雷射光的聚光區域對於對象物進行相對移動之移動部、以及用於控制移動部及照射部之控制部;對象物具有結晶構造,該結晶構造係包含:(100)面、一個(110)面、另一個(110)面、與一個(110)面正交之第1結晶方位、與另一個(110)面正交之第2結晶方位,對象物是以(100)面成為雷射光之入射面的方式由支承部支承;在對象物設定從與入射面交叉之Z方向觀察時呈圓環狀的線,該線係包含:圓弧狀的第1區域、及具有與第1區域的邊界之圓弧狀的第2區域;照射部具有成形部,該成形部是以從Z方向觀察時讓聚光區域具有長邊方向的方式將雷射光成形;控制部係實行第1加工處理及第2加工處理,第1加工處理,係藉由控制照射部及移動部,沿著線中的第1區域讓聚光區域相對移動,藉此沿著第1區域在對象物形成改質區域,並形成從該改質區域朝向與對象物之入射面為相反側的相反面且相對於Z方向傾斜地延伸之斜向龜裂;第2加工處理,係藉由控制照射部及移動部,沿著線中的第2區域讓聚光區域相對移動,藉此沿著第2區域在對象物形成改質區域,並形成從改質區域朝向相反面延伸之斜向龜裂;在第1加工處理及第2加工處理,控制部係藉由控制成形部,使聚光區域的長邊方向以接近第1結晶方位及第2結晶方位當中與聚光區域的移動方向、即加工進展方向之間的角度較大之一方的朝向相對於加工進展方向傾斜的方式,將雷射光成形,並藉由控制移動部,在第1加工處理和第2加工處理使加工進展方向的順逆成為相同;當將第2結晶方位和線正交的點設為0˚,將第1結晶方位和線正交的點設為90˚,將線上之0˚和90˚之中間的點設為45˚時,在第1區域及第2區域中,從Z方向觀察時,以使長邊方向之傾斜的朝向相對於加工進展方向是和斜向龜裂延伸側成為同一側之一方包含45˚點的方式,設定第1區域和第2區域的邊界。That is, a laser processing apparatus according to an aspect of the present invention is a laser processing apparatus for irradiating a target object with laser light to form a modified region, and includes a support portion for supporting the target object, a laser processing apparatus for an irradiation part for irradiating laser light toward an object supported by the support part, a moving part for relatively moving a light-converging region of the laser light with respect to the object, and a control part for controlling the moving part and the irradiation part; the object has A crystal structure consisting of a (100) plane, one (110) plane, another (110) plane, a first crystal orientation orthogonal to one (110) plane, and a first crystal orientation orthogonal to the other (110) plane In the second crystal orientation, the object is supported by the support part so that the (100) plane becomes the incident surface of the laser light; when the object is viewed from the Z direction intersecting with the incident plane, a circular line is set, and the line The system includes: an arc-shaped first region, and an arc-shaped second region having a boundary with the first region; The laser light is shaped in the direction of the edge; the control unit executes the first processing and the second processing. By relative movement, a modified region is formed in the object along the first region, and an oblique crack extending obliquely with respect to the Z direction is formed from the modified region toward the opposite surface opposite to the incident surface of the object. ; In the second processing, by controlling the irradiating part and the moving part, the light-converging area is relatively moved along the second area in the line, thereby forming a modified area on the object along the second area, and forming a modified area. Oblique cracks in which the quality region extends toward the opposite surface; in the first processing and the second processing, the control part controls the forming part to make the long-side direction of the light-converging region approach the first crystal orientation and the second crystal Among the orientations, the moving direction of the light-converging area, that is, the direction of the larger angle between the processing progress direction, is inclined with respect to the processing progress direction. The forward and reverse directions of the processing progress direction are the same as in the second processing treatment; when the point where the second crystal orientation and the line are orthogonal is set to 0°, the point where the first crystal orientation and the line are orthogonal is set to 90°, and the point between the line and the line is set to 90°. When the point between 0° and 90° is set to 45°, in the first area and the second area, when viewed from the Z direction, the direction of the inclination of the longitudinal direction is the same as the direction of the machining progress. The boundary between the first area and the second area is set so that the side of the crack extension becomes the same side including the 45° point.
或是,本發明的一態樣之雷射加工方法,係用於對對象物照射雷射光來形成改質區域之雷射加工方法,其係具備第1加工工序及第2加工工序,第1加工工序,係藉由沿著在對象物上設定的線中的第1區域讓雷射光的聚光區域相對移動,而沿著第1區域在對象物形成改質區域,並形成從該改質區域朝向與對象物之雷射光的入射面為相反側之相反面且相對於與入射面交叉之Z方向傾斜地延伸之斜向龜裂,第2加工工序,係藉由沿著線中的第2區域讓聚光區域相對移動,而沿著第2區域在對象物形成改質區域,並形成從改質區域朝向相反面延伸之斜向龜裂;對象物具有結晶構造,該結晶構造係包含:(100)面、一個(110)面、另一個(110)面、與一個(110)面正交之第1結晶方位、與另一個(110)面正交之第2結晶方位,且將(100)面設為入射面,在對象物設定從Z方向觀察時呈圓環狀的線,該線係包含:圓弧狀的第1區域、及具有與第1區域的邊界之圓弧狀的第2區域;在第1加工工序及第2加工工序,以從Z方向觀察時使聚光區域具有長邊方向的方式,且使聚光區域的長邊方向以接近第1結晶方位及第2結晶方位當中與聚光區域的移動方向、即加工進展方向之間的角度較大之一方的朝向相對於加工進展方向傾斜的方式,將雷射光成形,並在第1形成工序和第2形成工序將加工進展方向的順逆設為相同,當將第2結晶方位和線正交的點設為0˚,將第1結晶方位和線正交的點設為90˚,將線上之0˚和90˚之中間的點設為45˚時,在第1區域及第2區域中,從Z方向觀察時,以使長邊方向之傾斜的朝向相對於加工進展方向是和斜向龜裂延伸側成為同一側之一方包含45˚點的方式,設定第1區域和第2區域的邊界。Alternatively, a laser processing method according to an aspect of the present invention is a laser processing method for irradiating a target object with laser light to form a modified region, comprising a first processing step and a second processing step, and a first processing step. In the processing step, a modified region is formed on the object along the first region by relatively moving the condensing region of the laser light along the first region in the line set on the object, and the modified region is formed from the modified region. An oblique crack extending obliquely with respect to the Z-direction intersecting the incident surface and extending obliquely with respect to the Z direction intersecting the incident surface, the second processing step is performed by the second processing step along the line. The area moves the light-converging area relatively, and along the second area, a modified area is formed in the object, and an oblique crack extending from the modified area to the opposite side is formed; the object has a crystal structure, and the crystal structure includes: (100) plane, one (110) plane, the other (110) plane, a first crystal orientation orthogonal to one (110) plane, and a second crystal orientation orthogonal to the other (110) plane, and ( 100) The plane is set as the incident plane, and the object is set as an annular line when viewed from the Z direction, and the line includes an arc-shaped first area and an arc-shaped area having a boundary with the first area. The second region; in the first processing step and the second processing step, the long-side direction of the light-converging region is made to be close to the first crystal orientation and the second crystal orientation so that the light-converging region has a longitudinal direction when viewed from the Z direction. Among the crystal orientations, the direction of the movement direction of the light-converging region, that is, the direction of the processing progress, whichever is larger, is inclined with respect to the processing progress direction. The forward and reverse directions of the machining progress direction are set to be the same, and the point where the second crystal orientation is perpendicular to the line is set to 0°, the point where the first crystal orientation and the line are orthogonal is set to 90°, and the point between 0° and 90° on the line is set. When the middle point between ˚ is set to 45˚, in the first area and the second area, when viewed from the Z direction, the direction of the inclination of the longitudinal direction with respect to the machining progress direction is the same as the oblique crack extension side. Set the boundary between the 1st area and the 2nd area so that one side of the same side includes a 45° point.
在該等的裝置及方法,對象物具有結晶構造,該結晶構造係包含:(100)面、一個(110)面、另一個(110)面、與一個(110)面正交之第1結晶方位、與另一個(110)面正交之第2結晶方位。而且,在此,當沿著讓雷射光的聚光區域相對移動的線中的第1區域在對象物形成改質區域的情況(第1加工處理、第1加工工序)、以及當沿著該線中的第2區域在對象物形成改質區域的情況(第2加工處理、第2加工工序)各個,使聚光區域的長邊方向以接近第1結晶方位及第2結晶方位當中與加工進展方向之間的角度較大之一方的朝向相對於加工進展方向傾斜的方式,將雷射光成形。因此,如上述認識所示般,可抑制修整面的品質降低。In these apparatuses and methods, the object has a crystal structure including a (100) plane, one (110) plane, another (110) plane, and a first crystal orthogonal to one (110) plane Orientation, the second crystal orientation orthogonal to the other (110) plane. Here, in the case where a modified region is formed in the object along the first region of the line that relatively moves the condensing region of the laser light (first processing, first processing), and when the modified region is formed along the line When the second region in the line is formed as a modified region in the object (second processing, second processing), the longitudinal direction of the light-condensing region is made to be close to the first crystal orientation and the second crystal orientation. The laser beam is shaped so that the direction of the larger angle between the advancing directions is inclined with respect to the processing advancing direction. Therefore, as shown by the above-mentioned knowledge, the quality degradation of the trimmed surface can be suppressed.
另一方面,在該等裝置及方法,在第1加工處理及第2加工處理(第1加工工序及第2加工工序也是同樣的(以下相同))中,形成從改質區域朝向對象物之與入射面為相反側的相反面且相對於Z方向(與入射面交叉的方向)傾斜地延伸之斜向龜裂。因此,如上述認識所示般,必須考慮該斜向龜裂的延伸方向和聚光區域之長邊方向的朝向之關係。特別是在進行45˚點的加工時,若聚光區域之長邊方向的朝向和斜向龜裂的傾斜方向相對於加工進展方向彼此成為相反側的狀態,容易發生修整面的品質降低。On the other hand, in these apparatuses and methods, in the first processing and the second processing (the same is true for the first processing and the second processing (the same applies hereinafter)), a path from the modified region to the object is formed. An oblique crack extending obliquely with respect to the Z direction (direction intersecting with the incident surface) on the opposite surface to the incident surface. Therefore, as indicated by the above knowledge, it is necessary to consider the relationship between the extending direction of the oblique crack and the orientation of the longitudinal direction of the light-converging region. In particular, when the 45° point processing is performed, if the direction of the longitudinal direction of the light-converging region and the inclination direction of the oblique cracks are opposite to each other with respect to the progressing direction of the processing, the quality of the trimmed surface is likely to deteriorate.
針對這點,在該等裝置及方法,在第1區域及第2區域中,以使長邊方向之傾斜的朝向相對於加工進展方向是和斜向龜裂延伸側成為同一側之一方包含45˚點的方式,設定第1區域和第2區域之間的邊界。換言之,在第1區域及第2區域中,以聚光區域之長邊方向的朝向和斜向龜裂的傾斜方向相對於加工進展方向彼此成為相反側的狀態進行加工的區域,不致到達線上之45˚點。因此,可抑制品質降低。如此般,依據該等裝置及方法,能夠在抑制對象物的修整面之品質降低的狀態下形成斜向龜裂。In view of this, in these apparatuses and methods, in the first region and the second region, the direction of the inclination of the longitudinal direction with respect to the machining progress direction is one of the same side as the oblique crack extension side, including 45 ˚ point to set the boundary between the 1st area and the 2nd area. In other words, in the first area and the second area, the areas processed in such a state that the direction of the longitudinal direction of the light-converging area and the inclination direction of the oblique cracks are opposite to each other with respect to the progressing direction of the processing do not reach the upper part of the line. 45˚ point. Therefore, quality degradation can be suppressed. As described above, according to these apparatuses and methods, it is possible to form diagonal cracks in a state in which deterioration of the quality of the trimmed surface of the object is suppressed.
再者,在該等裝置及方法,在第1加工處理和第2加工處理,是使加工進展方向的順逆成為相同。因此,相較於在第1加工處理和第2加工處理將加工進展方向的順逆切換的情況,可減少與雷射光之聚光區域的相對移動之加減速有關的時間。In addition, in these apparatuses and methods, in the first processing and the second processing, the forward and reverse directions of the processing progress directions are the same. Therefore, compared to the case where the forward and reverse directions of the machining progress are switched in the first machining process and the second machining process, the time associated with the acceleration and deceleration of the relative movement of the laser light condensing region can be reduced.
在本發明的一態樣之雷射加工裝置亦可為,將第1區域及第2區域中的一方設定成比第1區域及第2區域中的另一方更長。如此般,可將第1區域和第2區域的長度設定成不同。In the laser processing apparatus of one aspect of the present invention, one of the first region and the second region may be set longer than the other of the first region and the second region. In this way, the lengths of the first region and the second region can be set to be different.
在本發明的一態樣之雷射加工裝置亦可為,對象物係包含:沿著Z方向從相反面側起依序排列之第1部分及第2部分,控制部,對於第1部分,係將加工進展方向的順逆設為相同並實行第1加工處理及第2加工處理,對於第2部分,係實行與第1加工處理及第2加工處理不同之其他加工處理,在其他加工處理,控制部係控制照射部及移動部,在線的全體將加工進展方向的順逆設為相同且沿著線讓聚光區域相對移動,藉此沿著線在對象物形成改質區域及從該改質區域沿著Z方向延伸之龜裂。在此情況,在形成沿著Z方向的龜裂之第2部分,是在線的全體使加工進展方向的朝向成為相同而進行雷射加工。因此,相較於在第2部分是在線的第1區域和第2區域將加工進展方向的順逆切換的情況,可減少與雷射光之聚光區域的相對移動之加減速有關的時間。In the laser processing apparatus according to one aspect of the present invention, the object may include a first part and a second part arranged in order from the opposite surface side along the Z direction, and the control unit may include, for the first part, The forward and reverse directions of the processing progress are set to be the same, and the first processing and the second processing are carried out. For the second part, other processing different from the first processing and the second processing is carried out. In other processing, The control unit controls the irradiation unit and the moving unit, sets the forward and reverse directions of the machining progress direction to be the same for the entire wire, and relatively moves the light-converging area along the wire, thereby forming a modified area on the object along the wire, and from the modified area along the wire. A crack that extends in the Z direction. In this case, in the second portion where the cracks along the Z direction are formed, the entire wire is laser-processed so that the direction of the processing progress direction is the same. Therefore, compared to the case where the forward and reverse directions of the machining progress are switched between the first and second regions where the second part is a line, the time associated with the acceleration and deceleration of the relative movement of the laser light condensing region can be reduced.
在本發明的一態樣之雷射加工裝置亦可為,在其他加工處理,控制部係控制成形部,以使聚光區域之長邊方向沿著加工進展方向的方式將雷射光成形。在此情況,在形成沿著Z方向的龜裂之第2部分,不須以在線之第1區域的加工和第2區域的加工之間讓聚光區域之長邊方向和加工進展方向的關係改變的方式進行雷射光的成形,因此可簡化控制部的處理。In the laser processing apparatus of one aspect of the present invention, in another processing, the control unit may control the shaping unit to shape the laser light so that the longitudinal direction of the light-converging region may be aligned with the processing progress direction. In this case, in the second portion where the cracks along the Z direction are formed, it is not necessary to set the relationship between the longitudinal direction of the light-converging region and the machining progress direction between the machining of the first region of the wire and the machining of the second region. Since the shaping of the laser beam is performed in a different manner, the processing of the control unit can be simplified.
在本發明的一態樣之雷射加工裝置亦可為,對象物係包含接合於其他構件之接合區域,在第1加工處理及第2加工處理,控制部係形成隨著從入射面朝向相反面而從接合區域之內側的位置朝向接合區域之外緣傾斜之斜向龜裂。在此情況,當以斜向龜裂為邊界而將對象物的一部分從對象物除去,並讓對象物的剩餘部分存留的情況,可避免超越對象物之與其他構件的接合區域而使對象物的剩餘部分往外側延伸。In the laser processing apparatus according to one aspect of the present invention, the object may include a bonding region to be bonded to another member, and in the first processing and the second processing, the control portion may be formed in an opposite direction from the incident surface. An oblique crack that slopes from the inner side of the joint area toward the outer edge of the joint area. In this case, when a part of the object is removed from the object with the oblique crack as a boundary, and the remaining part of the object is left, the object can be prevented from exceeding the junction area between the object and other members and causing the object to be damaged. The rest of it extends outward.
在本發明的一態樣之雷射加工裝置亦可為,在第1加工處理及第2加工處理,控制部係實行第1形成處理及第2形成處理,第1形成處理,係將Z方向上之聚光區域的位置設定成第1Z位置,並沿著線讓聚光區域相對移動,藉此將作為改質區域之第1改質區域及從第1改質區域延伸的龜裂形成於對象物,第2形成處理,係將Z方向上之聚光區域的位置設定成比第1Z位置更靠入射面側之第2Z位置,並沿著線讓聚光區域相對移動,藉此形成作為改質區域之第2改質區域及從第2改質區域延伸的龜裂,在第1形成處理,控制部係將與加工進展方向及Z方向交叉的Y方向上之聚光區域的位置設定成第1Y位置,在第2形成處理,控制部係將Y方向上之聚光區域的位置設定成從第1Y位置移位(shift)後的第2Y位置,藉由成形部的控制,使在包含Y方向及Z方向之YZ面內之聚光區域的形狀,在至少比聚光區域的中心更靠入射面側成為朝移位方向傾斜之傾斜形狀的方式將雷射光成形,藉此在YZ面內以朝移位方向傾斜的方式形成斜向龜裂。如此,能夠適當地形成相對於Z方向傾斜之斜向龜裂。In the laser processing apparatus of one aspect of the present invention, in the first processing and the second processing, the control unit may execute the first forming processing and the second forming processing, and the first forming processing may be performed in the Z direction. The position of the condensing region above is set to the 1Z position, and the light condensing region is relatively moved along the line, thereby forming the first modified region as the modified region and the crack extending from the first modified region. The object, in the second forming process, is formed by setting the position of the light-converging region in the Z direction to the 2Z position on the incident surface side relative to the 1Z position, and relatively moving the light-converging region along the line. In the second modified region of the modified region and the cracks extending from the second modified region, in the first forming process, the control unit sets the position of the light-converging region in the Y direction intersecting the machining progress direction and the Z direction In the second forming process, the control unit sets the position of the light-condensing area in the Y direction to the 2Y position after shifting from the 1Y position, and controls the forming unit to make it in the 1Y position. The shape of the condensing area in the YZ plane including the Y direction and the Z direction is formed so that the laser beam is shaped so as to be inclined in the direction of displacement at least on the incident surface side from the center of the condensing area, thereby forming the laser beam in the YZ. Oblique cracks are formed in the plane so as to be inclined in the displacement direction. In this way, an oblique crack inclined with respect to the Z direction can be appropriately formed.
在本發明的一態樣之雷射加工裝置亦可為,成形部係包含:用於將雷射光按照調變圖案進行調變而將雷射光成形之空間光調變器,照射部係包含:用於將來自空間光調變器的雷射光朝向對象物聚光之聚光透鏡,在第2形成處理,控制部係控制在空間光調變器顯示之調變圖案,以使聚光區域的形狀成為傾斜形狀的方式將雷射光調變,藉此將雷射光成形。在此情況,能夠利用空間光調變器而輕易地將雷射光成形。In one aspect of the present invention, the laser processing apparatus may also be such that the shaping unit includes: a spatial light modulator for modulating the laser light according to the modulation pattern to shape the laser light, and the irradiation unit includes: A condensing lens for condensing the laser light from the spatial light modulator toward the object. In the second forming process, the control unit controls the modulation pattern displayed on the spatial light modulator so that the light-converging area is The laser light is modulated in such a way that the shape becomes an oblique shape, thereby shaping the laser light. In this case, the laser light can be easily shaped using the spatial light modulator.
在本發明的一態樣之雷射加工裝置亦可為,調變圖案係包含用於對雷射光賦予彗形像差之彗形像差圖案,在第2形成處理,控制部係控制基於彗形像差圖案之彗形像差的大小,藉此進行用於使聚光區域的形狀成為傾斜形狀之第1圖案控制。依據本發明人的認識,在此情況,在YZ面內之聚光區域的形狀形成為弧狀。亦即,在此情況,聚光區域的形狀,在比聚光區域的中心更靠入射面側是朝移位方向傾斜,且在比聚光區域的中心更靠入射面之相反側是朝與移位方向相反的方向傾斜。在此情況也是,能夠形成朝移位方向傾斜的斜向龜裂。In the laser processing apparatus of one aspect of the present invention, the modulation pattern may include a coma aberration pattern for imparting coma aberration to the laser light, and in the second forming process, the control unit may control the coma based on the The magnitude of the coma aberration of the morphological aberration pattern is used to perform the first pattern control for making the shape of the light-converging region into an oblique shape. According to the knowledge of the present inventors, in this case, the shape of the light-converging region in the YZ plane is formed in an arc shape. That is, in this case, the shape of the condensing area is inclined toward the displacement direction on the side of the incident surface from the center of the condensing area, and is inclined toward the opposite side of the incident surface from the center of the condensing area. The direction opposite to the displacement direction is inclined. Also in this case, an oblique crack inclined in the displacement direction can be formed.
在本發明的一態樣之雷射加工裝置亦可為,調變圖案係包含用於修正雷射光的球面像差之球面像差修正圖案,在第2形成處理,控制部係相對於聚光透鏡之入瞳面的中心讓球面像差修正圖案的中心在Y方向偏置(offset),藉此進行用於使聚光區域的形狀成為傾斜形狀之第2圖案控制。依據本發明人的認識,在此情況也是,與利用彗形像差圖案的情況同樣的,能夠將在YZ面內之聚光區域的形狀形成為弧狀,能夠形成朝移位方向傾斜的斜向龜裂。In the laser processing apparatus of one aspect of the present invention, the modulation pattern may include a spherical aberration correction pattern for correcting spherical aberration of the laser light, and in the second forming process, the control unit may The center of the entrance pupil surface of the lens is offset in the Y direction with the center of the spherical aberration correction pattern, thereby performing the second pattern control for making the shape of the light-converging region into an oblique shape. According to the knowledge of the present inventors, also in this case, as in the case of using the coma aberration pattern, the shape of the light condensing region in the YZ plane can be formed into an arc shape, and the oblique shape inclined in the displacement direction can be formed. to crack.
在本發明的一態樣之雷射加工裝置亦可為,在第2形成處理,控制部係藉由讓關於沿著加工進展方向之軸線呈非對稱的調變圖案顯示於空間光調變器,來進行用於使聚光區域的形狀成為傾斜形狀之第3圖案控制。依據本發明人的認識,在此情況,能夠讓在YZ面內之聚光區域的形狀全體朝移位方向傾斜。在此情況也是,能夠形成朝移位方向傾斜的斜向龜裂。In the laser processing apparatus of one aspect of the present invention, in the second forming process, the control unit may display on the spatial light modulator an asymmetric modulation pattern with respect to an axis along the processing direction. , to perform the third pattern control for making the shape of the light-converging region into an oblique shape. According to the knowledge of the present inventors, in this case, the shape of the light-converging region in the YZ plane can be made to incline as a whole in the displacement direction. Also in this case, an oblique crack inclined in the displacement direction can be formed.
在本發明的一態樣之雷射加工裝置亦可為,調變圖案係包含用於使在XY面內之聚光區域的形狀成為以X方向為長邊的橢圓形狀之橢圓圖案,XY面係包含與Y方向及Z方向交叉的X方向和Y方向;在第2形成處理,控制部係以使橢圓圖案的強度成為關於沿著X方向之軸線呈非對稱的方式讓調變圖案顯示於空間光調變器,藉此進行用於使聚光區域的形狀成為傾斜形狀之第4圖案控制。依據本發明人的認識,在此情況也是,能夠使在YZ面內之聚光區域的形狀形成為弧狀,能夠形成朝移位方向傾斜的斜向龜裂。In the laser processing apparatus of one aspect of the present invention, the modulation pattern may include an ellipse pattern for making the shape of the light-condensing region in the XY plane an ellipse with a long side in the X direction, and the XY plane may include an ellipse pattern. It includes the X direction and the Y direction intersecting the Y direction and the Z direction; in the second forming process, the control unit displays the modulation pattern in such a way that the intensity of the elliptical pattern becomes asymmetrical with respect to the axis along the X direction. The spatial light modulator performs the fourth pattern control for making the shape of the light-converging region into an oblique shape. According to the knowledge of the present inventors, also in this case, the shape of the light-converging region in the YZ plane can be formed in an arc shape, and an oblique crack inclined in the displacement direction can be formed.
在本發明的一態樣之雷射加工裝置亦可為,在第2形成處理,控制部係讓用於形成在YZ面內沿著移位方向排列之複數個雷射光的聚光點之調變圖案顯示於空間光調變器,藉此進行用於使包含複數個聚光點之聚光區域的形狀成為傾斜形狀之第5圖案控制。依據本發明人的認識,在此情況也是,能夠形成朝移位方向傾斜的斜向龜裂。 [發明之效果]In the laser processing apparatus according to an aspect of the present invention, in the second forming process, the control unit may adjust the focus point for forming a plurality of laser beams aligned along the displacement direction in the YZ plane. The variable pattern is displayed on the spatial light modulator, whereby the fifth pattern control for making the shape of the light-converging region including a plurality of light-converging points into an oblique shape is performed. According to the knowledge of the present inventors, also in this case, an oblique crack inclined in the displacement direction can be formed. [Effect of invention]
依據本發明的一態樣,提供能夠在抑制外緣部分被除去後之對象物的修整面之品質降低的狀態下形成斜向龜裂之雷射加工裝置及雷射加工方法。According to one aspect of the present invention, there are provided a laser processing apparatus and a laser processing method capable of forming an oblique crack while suppressing deterioration in the quality of the trimmed surface of the object after the outer edge portion has been removed.
以下,針對一實施形態,參照圖式詳細地說明。又在各圖中,對於同一或相當的部分會有標註同一符號而省略重複說明的情形。又在各圖中,會有顯示由X軸、Y軸及Z軸所規定之正交座標系的情況。 [雷射加工裝置及雷射加工的概要]Hereinafter, an embodiment will be described in detail with reference to the drawings. In addition, in each drawing, the same or corresponding parts are denoted by the same reference numerals, and repeated descriptions may be omitted. In addition, in each drawing, the orthogonal coordinate system defined by the X-axis, the Y-axis, and the Z-axis may be displayed. [Outline of Laser Processing Device and Laser Processing]
圖1係顯示一實施形態的雷射加工裝置的構成之示意圖。如圖1所示般,雷射加工裝置1係具備:載台(支承部)2、照射部3、移動部4,5、控制部6。雷射加工裝置1,係用於藉由對對象物11照射雷射光L而在對象物11形成改質區域12的裝置。FIG. 1 is a schematic diagram showing the configuration of a laser processing apparatus according to an embodiment. As shown in FIG. 1 , the
載台2是藉由保持例如貼合於對象物11的薄膜,而將對象物11支承。載台2能以與Z方向平行的軸線為旋轉軸而進行旋轉。載台2亦可構成為,能夠沿著X方向及Y方向移動。又X方向及Y方向是彼此交叉(正交)之第1水平方向及第2水平方向,Z方向是鉛直方向。The
照射部3係將對對象物11具有穿透性的雷射光L聚光並照射於對象物11。若讓雷射光L聚光於藉由載台2支承之對象物11的內部,在與雷射光L之聚光區域C(例如後述的中心Ca)對應的部分,雷射光L特別被吸收,而在對象物11的內部形成改質區域12。又聚光區域C,雖詳如後述,係距離雷射光L的光束強度變得最高的位置、或光束強度的重心位置既定範圍的區域。The
改質區域12,是密度、折射率、機械強度、其他的物理特性與周圍之非改質區域不同的區域。作為改質區域12,例如可舉:熔融處理區域、裂痕區域、介電質破壞區域、折射率變化區域等。改質區域12可形成為,從改質區域12朝向雷射光L的入射側及其相反側讓龜裂延伸。這樣的改質區域12及龜裂,例如利用於對象物11的切斷。The modified
作為一例,若讓載台2沿著X方向移動,而對於對象物11讓聚光區域C沿著X方向相對移動,會以沿著X方向排成1列的方式形成複數個改質點12s。1個改質點12s,是藉由1個脈衝之雷射光L的照射所形成的。1列的改質區域12是排成1列之複數個改質點12s的集合。相鄰的改質點12s,依對於對象物11之聚光區域C的相對移動速度及雷射光L的重複頻率,會有彼此相連的情況,也會有彼此分離的情況。As an example, when the
移動部4係包含:讓載台2在與Z方向交叉(正交)的面內之一方向移動之第1移動部41、讓載台2在與Z方向交叉(正交)的面內之另一方向移動之第2移動部42。作為一例,第1移動部41是讓載台2沿著X方向移動,第2移動部42是讓載台2沿著Y方向移動。又移動部4是讓載台2以與Z方向平行的軸線為旋轉軸而進行旋轉。移動部5支承照射部3。移動部5是讓照射部3沿著X方向、Y方向及Z方向移動。在形成有雷射光L的聚光區域C之狀態下,讓載台2及/或照射部3移動,藉此使聚光區域C對於對象物11進行相對移動。亦即,移動部4,5,為了對於對象物11讓雷射光L的聚光區域C相對移動,係讓載台2及照射部3的至少一方移動。The moving
控制部6係控制載台2、照射部3及移動部4,5的動作。控制部6具有處理部、記憶部及輸入接收部(未圖示)。處理部是以包含處理器、記憶體、儲存設備及通訊裝置等之電腦裝置的形式來構成。在處理部,處理器係執行被載入記憶體等的軟體(程式),並控制記憶體及儲存設備中之資料的讀取及寫入、以及基於通訊裝置之通訊。記憶部是例如硬碟等,用於儲存各種資料。輸入接收部,係顯示各種資訊並從使用者接收各種資訊的輸入之介面部。輸入接收部是構成GUI(圖形化使用者介面,Graphical User Interface)。The
圖2係顯示圖1所示之照射部的構成之示意圖。圖2所示的假想線A表示預定的雷射加工。如圖2所示般,照射部3係具有:光源31、空間光調變器(成形部)7、聚光透鏡33、4f透鏡單元34。光源31是藉由例如脈衝振盪方式來輸出雷射光L。又照射部3亦可不具備光源31,而構成為從照射部3的外部將雷射光L導入。空間光調變器7是將從光源31輸出的雷射光L進行調變。聚光透鏡33,是將藉由空間光調變器7調變而從空間光調變器7輸出的雷射光L朝向對象物11聚光。FIG. 2 is a schematic diagram showing the configuration of the irradiation section shown in FIG. 1 . The imaginary line A shown in FIG. 2 shows the predetermined laser processing. As shown in FIG. 2 , the
如圖3所示般,4f透鏡單元34係具有:排列在從空間光調變器7朝向聚光透鏡33之雷射光L的光路上之一對的透鏡34A,34B。一對的透鏡34A,34B是構成空間光調變器7的調變面7a和聚光透鏡33的入瞳面(瞳面)33a處於成像關係之雙側遠心光學系統。藉此,使在空間光調變器7的調變面7a之雷射光L的像(在空間光調變器7調變後之雷射光L的像),像轉移(成像)到聚光透鏡33之入瞳面33a。又圖中的Fs表示傅立葉面。As shown in FIG. 3 , the
如圖4所示般,空間光調變器7係反射型液晶(LCOS:Liquid Crystal on Silicon)的空間光調變器(SLM:Spatial Light Modulator)。空間光調變器7,係在半導體基板71上依序積層驅動電路層72、像素電極層73、反射膜74、配向膜75、液晶層76、配向膜77、透明導電膜78及透明基板79而構成。As shown in FIG. 4 , the spatial
半導體基板71是例如矽基板。驅動電路層72,是在半導體基板71上構成主動矩陣電路。像素電極層73係包含:沿著半導體基板71的表面呈矩陣狀排列之複數個像素電極73a。各像素電極73a是例如由鋁等的金屬材料所形成。藉由驅動電路層72對各像素電極73a施加電壓。The
反射膜74是例如介電體多層膜。配向膜75設置在液晶層76之反射膜74側的表面,配向膜77設置在液晶層76之與反射膜74為相反側的表面。各配向膜75,77是例如由聚醯亞胺等的高分子材料所形成,在各配向膜75,77之與液晶層76的接觸面,被實施例如摩擦(rubbing)處理。配向膜75,77是讓液晶層76所含的液晶分子76a沿著一定方向排列。The
透明導電膜78,是設置在透明基板79之配向膜77側的表面,而隔著液晶層76等與像素電極層73相對向。透明基板79是例如玻璃基板。透明導電膜78是例如由ITO等的具有光穿透性且導電性的材料所形成。透明基板79及透明導電膜78是讓雷射光L穿透。The transparent
在如以上般構成的空間光調變器7,若將表示調變圖案的信號從控制部6輸入驅動電路層72,因應該信號的電壓會施加於各像素電極73a,而在各像素電極73a和透明導電膜78之間形成電場。若形成有該電場,在液晶層76中,在與各像素電極73a對應的每個區域,液晶分子76a的配列方向改變,而使在與各像素電極73a對應的每個區域的折射率改變。此狀態是在液晶層76顯示有調變圖案的狀態。調變圖案是用於將雷射光L進行調變。In the spatial
亦即,在液晶層76顯示有調變圖案的狀態下,當雷射光L從外部透過透明基板79及透明導電膜78入射液晶層76,由反射膜74反射後,從液晶層76透過透明導電膜78及透明基板79而往外部出射時,因應在液晶層76顯示的調變圖案,雷射光L被調變。如此般,依據空間光調變器7,藉由將在液晶層76顯示的調變圖案適宜地設定,可進行雷射光L的調變(例如,雷射光L的強度、振幅、相位、偏光等的調變)。又圖3所示的調變面7a是例如液晶層76。That is, in the state where the
如以上般,從光源31輸出的雷射光L,透過空間光調變器7及4f透鏡單元34入射聚光透鏡33,並藉由聚光透鏡33而在對象物11內聚光,藉此在其聚光區域C中,在對象物11形成改質區域12及從改質區域12延伸的龜裂。進而,由控制部6控制移動部4,5,使聚光區域C對於對象物11進行相對移動,藉此沿著聚光區域C的移動方向而形成改質區域12及龜裂。
[關於斜向龜裂形成的認識之說明]As described above, the laser light L output from the
在此,將這時聚光區域C的相對移動方向(加工進展方向)設為X方向。又將與對象物11之雷射光L的入射面、即第1面11a交叉(正交)的方向設為Z方向。又將與X方向及Z方向交叉(正交)的方向設為Y方向。X方向及Y方向是沿著第1面11a的方向。又Z方向亦可被定義為:聚光透鏡33的光軸、透過聚光透鏡33朝向對象物11聚光之雷射光L的光軸。Here, the relative movement direction (processing progress direction) of the condensing region C at this time is referred to as the X direction. Further, the direction intersecting (orthogonal) with the
如圖5所示般,在與加工進展方向的X方向交叉之交叉面(包含Y方向及Z方向之YZ面S)內,要求沿著相對於Z方向及Y方向傾斜的線RA(在此,相對於Y方向以既定的角度θ傾斜的線RA)形成斜向龜裂。關於對於這樣的斜向龜裂形成之本發明人的認識,一邊呈現加工例一邊做說明。As shown in FIG. 5 , in the intersection plane (YZ plane S including the Y direction and the Z direction) intersecting the X direction of the machining progress direction, it is required to follow the line RA inclined with respect to the Z direction and the Y direction (here , a line RA) inclined at a predetermined angle θ with respect to the Y direction forms an oblique crack. The inventor's knowledge of the formation of such an oblique crack will be described while showing a processing example.
在此,作為改質區域12是形成改質區域12a,12b。藉此,將從改質區域12a延伸的龜裂13a和從改質區域12b延伸的龜裂13b相連,而形成沿著線RA傾斜地延伸之龜裂13。在此,首先,如圖6所示般,以對象物11之第1面11a作為雷射光L的入射面而形成聚光區域C1。另一方面,在比聚光區域C1更靠第1面11a側,以第1面11a作為雷射光L的入射面而形成聚光區域C2。這時,聚光區域C2相對於聚光區域C1是在Z方向移位距離Sz,且相對於聚光區域C1是在Y方向移位距離Sy。距離Sz及距離Sy,作為一例是對應於線RA的斜率。Here, the modified
另一方面,如圖7所示般,藉由使用空間光調變器7來將雷射光L調變,使在聚光區域C(至少聚光區域C2)的YZ面S內之光束形狀,在至少比聚光區域C的中心Ca更靠第1面11a側,成為相對於Z方向朝移位方向(在此為Y方向的負側)傾斜的傾斜形狀。在圖7的例子,在比中心Ca更靠第1面11a側,是相對於Z方向朝Y方向的負側傾斜,且在比中心Ca更靠第1面11a的相反側也是,相對於Z方向朝Y方向的負側傾斜,而成為弧形狀。又在YZ面S內之聚光區域C的光束形狀,是指在YZ面S內之聚光區域C之雷射光L的強度分布。On the other hand, as shown in FIG. 7 , by using the spatial
如此般,讓至少2個聚光區域C1,C2在Y方向移位,並使至少聚光區域C2(在此為聚光區域C1,C2雙方)的光束形狀成為傾斜形狀,藉此如圖9(a)所示般,能夠形成斜向延伸的龜裂13。又例如藉由空間光調變器7之調變圖案的控制,亦可藉由將雷射光L分支而同時形成聚光區域C1,C2來進行改質區域12及龜裂13的形成(多焦點加工),亦可在藉由聚光區域C1的形成來形成改質區域12a及龜裂13a之後,藉由聚光區域C2的形成來形成改質區域12b及龜裂13b(單道次(single pass)加工)。In this way, at least two condensing regions C1 and C2 are shifted in the Y direction, and the beam shape of at least the condensing regions C2 (here, both of the condensing regions C1 and C2) is inclined, as shown in FIG. 9 . As shown in (a), a
又亦可為,藉由在聚光區域C1和聚光區域C2之間形成其他的聚光區域,如圖9(b)所示般,在改質區域12a和改質區域12b之間讓其他的改質區域12c介入,而形成更長的斜向延伸的龜裂13。Alternatively, by forming another light condensing region between the light condensing region C1 and the light condensing region C2, as shown in FIG. The modified
接下來,針對用於使在聚光區域C之YZ面S內的光束形狀成為傾斜形狀之認識做說明。首先,針對聚光區域C的定義具體地說明。在此,聚光區域C是距離中心Ca既定範圍(例如Z方向上,距離中心Ca±25μm的範圍)的區域。如上述般,中心Ca是光束強度變得最高的位置,或光束強度的重心位置。光束強度的重心位置,是在基於調變圖案的調變未進行的狀態下之雷射光L的光軸上,光束強度的重心所在的位置,該調變圖案是例如用於讓雷射光L分支之調變圖案等之讓雷射光L的光軸移位之調變圖案。光束強度變得最高的位置或光束強度的重心,可如以下般取得。亦即,在將雷射光L的輸出降低到在對象物11無法形成改質區域12的程度(比加工閾值低)的狀態下,對對象物11照射雷射光L。在此同時,將來自對象物11之與雷射光L的入射面為相反側的面(在此是第2面11b)之雷射光L的反射光,例如在圖15所示之Z方向的複數個位置F1~F7用攝像機進行攝像。藉此,根據所獲得的圖像可取得光束強度變得最高的位置或重心。又改質區域12是在該中心Ca附近形成。Next, the understanding for making the beam shape in the YZ plane S of the condensing region C into an oblique shape will be described. First, the definition of the condensing region C will be specifically described. Here, the light-converging region C is a region within a predetermined range from the center Ca (for example, a range of ±25 μm from the center Ca in the Z direction). As described above, the center Ca is the position where the intensity of the beam becomes the highest, or the position of the center of gravity of the intensity of the beam. The position of the center of gravity of the beam intensity is the position of the center of gravity of the beam intensity on the optical axis of the laser light L when the modulation based on the modulation pattern is not performed, for example, the modulation pattern is used for branching the laser light L A modulation pattern such as a modulation pattern for shifting the optical axis of the laser light L. The position where the beam intensity becomes the highest or the center of gravity of the beam intensity can be obtained as follows. That is, the
為了使在聚光區域C的光束形狀成為傾斜形狀,可採用讓調變圖案偏置的方法。更具體的說,在空間光調變器7上顯示:用於修正波前畸變之畸變修正圖案、用於將雷射光分支之格柵圖案、狹縫圖案、像散圖案、彗形像差圖案、及球面像差修正圖案等各種的圖案(顯示其等重疊後的圖案)。其中,如圖8所示般,藉由讓球面像差修正圖案Ps偏置,可調整聚光區域C的光束形狀。In order to make the beam shape in the condensing region C an oblique shape, a method of offsetting the modulation pattern can be used. More specifically, the spatial
在圖8的例子,在調變面7a上,相對於雷射光L的(光束點的)中心Lc,讓球面像差修正圖案Ps的中心Pc朝Y方向的負側以偏置量Oy1進行偏置。如上述般,藉由4f透鏡單元34使調變面7a像轉移到聚光透鏡33的入瞳面33a。因此,調變面7a上的偏置,在入瞳面33是成為朝向Y方向的正側的偏置。亦即,在入瞳面33a,相對於雷射光L的中心Lc、及入瞳面33a的中心(在此,是與中心Lc一致),球面像差修正圖案Ps的中心Pc 是朝Y方向的正側偏置了偏置量Oy2。In the example of FIG. 8, on the
如此般,藉由讓球面像差修正圖案Ps偏置,使雷射光L之聚光區域C的光束形狀變形成圖7所示般之弧狀的傾斜形狀。以上般讓球面像差修正圖案Ps偏置,是相當於對雷射光L賦予彗形像差。因此,可藉由讓空間光調變器7的調變圖案包含用於對雷射光L賦予彗形像差之彗形像差圖案,而使聚光區域C的光束形狀成為傾斜形狀。又作為彗形像差圖案可使用:相當於Zernike多項式之前9項(第3級彗形像差的Y成分)的圖案,亦即在Y方向產生彗形像差的圖案。In this way, by offsetting the spherical aberration correction pattern Ps, the beam shape of the condensing region C of the laser light L is deformed into an arc-like inclined shape as shown in FIG. 7 . As described above, offsetting the spherical aberration correction pattern Ps is equivalent to imparting coma aberration to the laser beam L. FIG. Therefore, by making the modulation pattern of the spatial
接下來,針對對象物11的結晶性和龜裂13的關係之認識做說明。圖10係對象物的示意俯視圖。在此,對象物11是矽晶圓(t775μm、<100>、1Ω・cm),且形成有缺口11d。對於該對象物11,讓加工進展方向、即X方向與0˚ (110)面一致的第1加工例顯示於圖11(a),讓X方向與15˚一致的第2加工例顯示於圖11(b),讓X方向與30˚一致的其他加工例顯示於圖12(a),讓X方向與45˚(100)面一致的第4加工例顯示於圖12(b)。在各加工例中,在YZ面S內之線RA之相對於Y方向的角度θ為71˚。Next, the understanding of the relationship between the crystallinity of the
又在各加工例是採用單道次加工,作為第1道次是讓聚光區域C1在X方向相對移動而形成改質區域12a及龜裂13a之後,作為第2道次是讓聚光區域C2在X方向相對移動而形成改質區域12b及龜裂13b。第1道次及第2道次的加工條件如以下所示。又以下的CP表示聚光修正的強度,彗形像差(LBA偏置Y),是將球面像差修正圖案Ps之朝Y方向的偏置量用空間光調變器7之像素單位表示。In each processing example, a single pass is used, and the first pass is to relatively move the light-converging region C1 in the X direction to form the modified
<第1道次> Z方向位置:161μm CP:-18 輸出:2W 速度:530mm/s 頻率:80kHz 彗形像差(LBA偏置Y):-5 Y方向位置:0<1st pass> Z-direction position: 161μm CP:-18 Output: 2W Speed: 530mm/s Frequency: 80kHz Comatic Aberration (LBA Bias Y): -5 Y direction position: 0
<第2道次> Z方向位置:151μm CP:-18 輸出:2W 速度:530mm/s 頻率80kHz 彗形像差(LBA偏置Y):-5 Y方向位置:0.014mm<Second pass> Z-direction position: 151μm CP:-18 Output: 2W Speed: 530mm/s Frequency 80kHz Comatic Aberration (LBA Bias Y): -5 Y direction position: 0.014mm
如圖11及圖12所示般,不管是哪個情況,都能沿著相對於Y方向以71˚傾斜的線RA形成龜裂13。亦即,不受對象物11之作為主要劈開面之(110)面、(111)面、及(100)面等的影響,亦即不管對象物11的結晶構造如何,都能形成沿著所期望的線RA斜向延伸的龜裂13。As shown in FIGS. 11 and 12 , in either case, the
又用於形成如此般斜向延伸的龜裂13之光束形狀的控制,並不限定於上述例子。接下來,針對用於使光束形狀成為傾斜形狀之其他例子做說明。如圖13(a)所示般,亦可利用關於沿著加工進展方向之X方向的軸線Ax呈非對稱的調變圖案PG1將雷射光L調變,而使聚光區域C的光束形狀成為傾斜形狀。調變圖案PG1,係在比軸線Ax更靠Y方向的負側包含格柵圖案Ga,並在比軸線Ax更靠Y方向的正側包含非調變區域Ba,軸線Ax是通過Y方向上之雷射光L的光束點之中心Lc且沿著X方向。換言之,調變圖案PG1僅在比軸線Ax更靠Y方向的正側包含格柵圖案Ga。又圖13(b)是讓圖13(a)的調變圖案PG1以對應於聚光透鏡33之入瞳面33a的方式反轉而成。Furthermore, the control of the beam shape for forming the
圖14(a)係顯示在聚光透鏡33的入瞳面33a之雷射光L的強度分布。如圖14(a)所示般,藉由使用這樣的調變圖案PG1,朝空間光調變器7入射之雷射光L中之藉由格柵圖案Ga調變後的部分,變得不朝聚光透鏡33的入瞳面33a入射。結果,如圖14(b)及圖15所示般,能夠使在YZ面S內之聚光區域C的光束形狀成為其整體相對於Z方向朝一方向傾斜的傾斜形狀。FIG. 14( a ) shows the intensity distribution of the laser light L at the
亦即,在此情況,聚光區域C的光束形狀,在比聚光區域C的中心Ca更靠第1面11a側是相對於Z方向朝Y方向的負側傾斜,且在比聚光區域C的中心Ca更靠第1面11a的相反側是相對於Z方向朝Y方向的正側傾斜。又圖15(b)的各圖,係顯示在圖15(a)所示之Z方向的各位置F1~F7之雷射光L的XY面內之強度分布,係基於攝像機之實際的觀測結果。在將聚光區域C的光束形狀如此般進行控制的情況也是,與上述例子同樣的,能夠形成斜向延伸的龜裂13。That is, in this case, the beam shape of the condensing region C is inclined to the negative side of the Y direction with respect to the Z direction on the side of the
再者,作為關於軸線Ax呈非對稱的調變圖案,還能採用圖16所示之調變圖案PG2,PG3,PG4。調變圖案PG2,係在比軸線Ax更靠Y方向的負側包含:沿著從軸線Ax離開的方向依序排列之非調變區域Ba及格柵圖案Ga,且在比軸線Ax更靠Y方向的正側包含非調變區域Ba。亦即,調變圖案PG2係在比軸線Ax更靠Y方向的負側之區域的一部分包含格柵圖案Ga。Furthermore, the modulation patterns PG2 , PG3 , and PG4 shown in FIG. 16 can also be used as modulation patterns that are asymmetric about the axis Ax. The modulation pattern PG2 includes the non-modulation region Ba and the grid pattern Ga arranged in sequence along the direction away from the axis Ax on the negative side of the Y direction relative to the axis Ax, and is closer to the Y direction than the axis Ax The positive side of the direction contains the non-modulation area Ba. That is, the modulation pattern PG2 includes the grating pattern Ga in a part of the region on the negative side in the Y direction with respect to the axis Ax.
調變圖案PG3,係在比軸線AX更靠Y方向的負側包含:沿著從軸線Ax離開的方向依序排列之非調變區域Ba及格柵圖案Ga,並在比軸線Ax更靠Y方向的正側包含:沿著從軸線Ax離開的方向依序排列之非調變區域Ba及格柵圖案Ga。在調變圖案PG3,在比軸線Ax更靠Y方向的正側和更靠Y方向的負側,讓非調變區域Ba及格柵圖案Ga的比例不同(在Y方向的負側,相對地使非調變區域Ba變窄),而成為關於軸線Ax呈非對稱。The modulation pattern PG3 includes, on the negative side of the Y direction relative to the axis AX, a non-modulation region Ba and a grid pattern Ga arranged in sequence along the direction away from the axis Ax, and is closer to the Y direction than the axis Ax. The positive side of the direction includes: the non-modulation area Ba and the grid pattern Ga arranged in order along the direction away from the axis Ax. In the modulation pattern PG3, the ratios of the non-modulation area Ba and the grid pattern Ga are different on the positive side in the Y direction and on the negative side in the Y direction than the axis Ax (on the negative side in the Y direction, relatively The non-modulation region Ba is narrowed) to become asymmetrical with respect to the axis Ax.
調變圖案PG4,是與調變圖案PG2同樣的,在比軸線Ax更靠Y方向的負側之區域的一部分包含格柵圖案Ga。在調變圖案PG4,進一步在X方向也是,設有格柵圖案Ga的區域成為局部。亦即,在調變圖案PG4,在比軸線Ax更靠Y方向的負側之區域包含:沿著X方向依序排列之非調變區域Ba、格柵圖案Ga、及非調變區域Ba。在此,格柵圖案Ga配置在包含軸線Ay的區域,軸線Ay是通過X方向上之雷射光L的光束點之中心Lc且沿著Y方向。Like the modulation pattern PG2, the modulation pattern PG4 includes the grating pattern Ga in a part of the region on the negative side in the Y direction with respect to the axis Ax. In the modulation pattern PG4, also in the X direction, the region where the grid pattern Ga is provided becomes a part. That is, in the modulation pattern PG4, the region on the negative side of the Y direction with respect to the axis Ax includes the non-modulated region Ba, the grating pattern Ga, and the non-modulated region Ba arranged in order along the X direction. Here, the grating pattern Ga is arranged in a region including an axis Ay that passes through the center Lc of the beam spot of the laser light L in the X direction and is along the Y direction.
利用以上任一個調變圖案PG2~PG4,都能使聚光區域C的光束形狀,在至少比中心Ca更靠第1面11a側成為相對於Z方向朝Y方向的負側傾斜之傾斜形狀。亦即,為了將聚光區域C的光束形狀控制成在至少比中心Ca更靠第1面11a側成為相對於Z方向朝Y方向的負側傾斜,可使用調變圖案PG1~PG4那樣的包含格柵圖案Ga之非對稱的調變圖案,或是調變圖案PG1~PG4以外之包含格柵圖案Ga之非對稱的調變圖案。Using any of the above modulation patterns PG2 to PG4, the beam shape of the condensing region C can be made to have an inclined shape inclined toward the negative side of the Y direction with respect to the Z direction at least on the
再者,作為用於使聚光區域C的光束形狀成為傾斜形狀之非對稱的調變圖案,並不限定於利用格柵圖案Ga。圖17係顯示非對稱的調變圖案之其他例。如圖17(a)所示般,調變圖案PE,係在比軸線Ax更靠Y方向的負側包含橢圓圖案Ew,並在比軸線Ax更靠Y方向的正側包含橢圓圖案Es。又圖17(b),是讓圖17(a)的調變圖案PE以對應於聚光透鏡33之入瞳面33a的方式反轉而成。In addition, the grid pattern Ga is not limited to be used as an asymmetric modulation pattern for making the beam shape of the condensing region C into an oblique shape. FIG. 17 shows another example of asymmetric modulation patterns. As shown in FIG. 17( a ), the modulation pattern PE includes an elliptical pattern Ew on the negative side in the Y direction relative to the axis Ax, and includes an elliptical pattern Es on the positive side in the Y direction relative to the axis Ax. FIG. 17( b ) is obtained by inverting the modulation pattern PE of FIG. 17( a ) so as to correspond to the
如圖17(c)所示般,橢圓圖案Ew,Es都是,用於使在包含X方向及Y方向的XY面之聚光區域C的光束形狀成為以X方向為長邊方向之橢圓形狀的圖案。然而,在橢圓圖案Ew和橢圓圖案Es,調變的強度不同。更具體的說,橢圓圖案Es之調變的強度比橢圓圖案Ew之調變的強度更大。亦即,利用橢圓圖案Es調變後之雷射光L所形成的聚光區域Cs,比起利用橢圓圖案Ew調變後之雷射光L所形成的聚光區域Cw,是成為在X方向更長的橢圓形狀。在此,是在比軸線Ax更靠Y方向的負側配置相對強的橢圓圖案Es。As shown in FIG. 17( c ), the elliptical patterns Ew and Es are both for making the beam shape in the light-condensing region C of the XY plane including the X-direction and the Y-direction an elliptical shape with the X-direction as the longitudinal direction picture of. However, in the elliptical pattern Ew and the elliptical pattern Es, the intensity of modulation is different. More specifically, the modulation intensity of the elliptical pattern Es is greater than the modulation intensity of the elliptical pattern Ew. That is, the light-converging region Cs formed by the laser light L modulated by the elliptical pattern Es is longer in the X direction than the light-converging region Cw formed by the laser light L modulated by the elliptical pattern Ew. oval shape. Here, the relatively strong elliptical pattern Es is arranged on the negative side in the Y direction rather than the axis Ax.
如圖18(a)所示般,藉由使用這樣的調變圖案PE,能使在YZ面S內之聚光區域C的光束形狀,在比中心Ca更靠第1面11a側成為相對於Z方向朝Y方向的負側傾斜之傾斜形狀。特別是在此情況,在YZ面S內之聚光區域C的光束形狀,在比中心Ca更靠第1面11a的相反側也是成為相對於Z方向朝Y方向的負側傾斜,而使整體成為弧狀。又圖18(b)的各圖,係顯示在圖18(a)所示之Z方向的各位置H1~H8之雷射光L的XY面內之強度分布,是基於攝像機之實際的觀測結果。As shown in FIG. 18( a ), by using such a modulation pattern PE, the beam shape of the condensing region C in the YZ plane S can be made to be relative to the
再者,用於使聚光區域C的光束形狀成為傾斜形狀之調變圖案,並不限定於以上的非對稱的圖案。作為一例,作為那樣的調變圖案是如圖19所示般,在YZ面S內的複數位置形成聚光點CI,以利用複數個聚光點CI全體來形成(包含複數個聚光點CI)傾斜形狀的聚光區域C的方式將雷射光L調變的圖案。這樣的調變圖案,作為一例,可根據錐鏡(axicon lens)圖案來形成。當使用這樣的調變圖案的情況,改質區域12本身也能在YZ面S內傾斜地形成。因此,在此情況,可按照所期望的傾斜而正確地形成斜向龜裂13。另一方面,在使用這樣的調變圖案的情況,相較於上述其他例,龜裂13的長度有變短的傾向。因此,藉由按照要求來使用各種的調變圖案,可達成所期望的加工。In addition, the modulation pattern for making the beam shape of the condensing region C into an oblique shape is not limited to the above-mentioned asymmetric pattern. As an example, as such a modulation pattern, as shown in FIG. 19 , the condensing points CI are formed at plural positions in the YZ plane S, and the entirety of the plural condensing points CI is formed (including the plural condensing points CI). ) The pattern of modulating the laser light L in the manner of the condensing area C of the inclined shape. Such a modulation pattern can be formed by an axicon lens pattern as an example. When such a modulation pattern is used, the modified
又上述聚光點CI,是例如讓非調變的雷射光聚光的點。如以上般,依據本發明人的認識,在YZ面S內讓至少2個改質區域12a,12b在Y方向及Z方向移位,且在YZ面S內使聚光區域C的光束形狀成為傾斜形狀,藉此能夠形成相對於Z方向朝Y方向傾斜之斜向延伸的龜裂13。The above-mentioned condensing point CI is, for example, a point where non-modulated laser light is condensed. As described above, according to the knowledge of the present inventors, in the YZ plane S, at least two
又在控制光束形狀時,在利用球面像差修正圖案之偏置的情況、利用彗形像差圖案的情況、及利用橢圓圖案的情況,比起利用繞射光柵圖案而將雷射光的一部分截止的情況,可達成高能量的加工。又在這些情況,在重視龜裂的形成的情況是有效的。又在利用彗形像差圖案的情況,在多焦點加工的情形,可僅使一部分的聚光區域之光束形狀成為傾斜形狀。再者,在利用錐鏡圖案的情況,比起利用其他圖案,在重視改質區域的形成的情況是有效的。 [修整加工的一例]When controlling the beam shape, when using the offset of the spherical aberration correction pattern, when using the coma aberration pattern, and using the elliptical pattern, a part of the laser beam is cut off compared to the use of the diffraction grating pattern. In this case, high-energy processing can be achieved. Furthermore, in these cases, it is effective when attaching importance to the formation of cracks. Also, in the case of using the coma aberration pattern, in the case of multifocal processing, the beam shape of only a part of the condensing area can be made to have an oblique shape. In addition, the use of the axicon pattern is effective when the formation of the modified region is more important than the use of other patterns. [An example of dressing processing]
接下來,針對修整加工的一例做說明。修整加工,是將對象物11中之不需要部分予以除去的加工。修整加工包含雷射加工方法,該雷射加工方法是讓聚光區域對準對象物11來照射雷射光L,藉此在對象物11形成改質區域12。對象物11包含例如形成為圓板狀的半導體晶圓。作為對象物沒有特別的限定,可由各種的材料形成,可呈各種的形狀。在對象物11的第2面11b形成有功能元件(未圖示)。功能元件是例如光二極體等的受光元件、雷射二極體等的發光元件、記憶體等的電路元件等。Next, an example of the dressing process will be described. The trimming process is a process of removing unnecessary parts in the
圖20及圖21係顯示加工的對象物。如圖20,21所示般,在對象物11設定有效區域R及除去區域E。有效區域R,是與要取得的半導體裝置對應的部分。在此的有效區域R,在將對象物11從厚度方向觀察時,是包含中央部分之圓板狀的部分。除去區域E是對象物11中之比有效區域R更外側的區域。除去區域E是對象物11中之有效區域R以外的外緣部分。在此的除去區域E,是包圍有效區域R之圓環狀的部分。除去區域E,在將對象物11從厚度方向觀察時,是包含周緣部分(外緣的斜面(bevel)部)。有效區域R及除去區域E之設定可在控制部6進行。有效區域R及除去區域E亦可為被指定座標者。20 and 21 show objects to be processed. As shown in FIGS. 20 and 21 , an effective area R and a removal area E are set on the
載台2是用於載置對象物11之支承部。在本實施形態的載台2,是在對象物11的第1面11a位於雷射光入射面側、即上側的狀態(第2面11b位於載台2側、即下側的狀態)下,載置對象物11。載台2具有設置於其中心之旋轉軸Cx。旋轉軸Cx是沿著Z方向延伸的軸。載台2能以旋轉軸Cx為中心進行旋轉。載台2是藉由馬達等之公知的驅動裝置的驅動力而被旋轉驅動。The
照射部3,係對載置於載台2之對象物11沿著Z方向照射雷射光L,而在該對象物11的內部形成改質區域。照射部3安裝於移動部5。照射部3可藉由馬達等之公知的驅動裝置之驅動力而在Z方向線性移動。照射部3可藉由馬達等之公知的驅動裝置之驅動力而在X方向及Y方向線性移動。The
如上述般,照射部3係具備空間光調變器7。空間光調變器7是構成成形部,該成形部是將在與雷射光L的光軸垂直的面內之聚光區域C的形狀(亦即,從Z方向觀察時之聚光區域C的形狀)(以下也稱為「光束形狀」)進行成形。空間光調變器7能夠以從Z方向觀察時的光束形狀具有長邊方向的方式將雷射光L成形。例如空間光調變器7是顯示使光束形狀成為橢圓形狀的調變圖案,藉此使光束形狀朝橢圓形狀進行成形。As described above, the
光束形狀並不限定於橢圓形狀,只要是長條形狀即可。光束形狀亦可為扁平圓形狀、長圓形狀或跑道(track)形狀。光束形狀亦可為長條的三角形形狀、矩形形狀或多角形形狀。用於實現這樣的光束形狀之空間光調變器7之調變圖案,可包含狹縫圖案及像散圖案之至少任一者。又當雷射光L是利用像散等而具有複數個聚光區域C的情況,複數個聚光區域C中在雷射光L的光路上之最上游側之聚光區域C的形狀,是本實施形態的光束形狀(在其他雷射光是同樣的)。在此的長邊方向,是光束形狀之橢圓形狀的長軸方向,也稱為橢圓長軸方向。The beam shape is not limited to an elliptical shape, as long as it is an elongated shape. The beam shape may also be a flat circular shape, an oblong shape or a track shape. The beam shape can also be an elongated triangular shape, a rectangular shape or a polygonal shape. The modulation pattern of the spatial
光束形狀並不限定於聚光點的形狀,亦可為聚光點附近的形狀,總之只要是聚光區域C之一部分的形狀即可。例如,在具有像散之雷射光L的情況,如圖22(a)所示般,在聚光點附近之雷射光入射面側的區域,光束形狀具有長邊方向NH。在圖22(a)之光束形狀的平面內(在聚光點附近之雷射光入射面側的Z方向位置之平面內)之光束強度分布,成為在長邊方向NH具有較強的強度之分布,光束強度較強的方向與長邊方向NH一致。The shape of the light beam is not limited to the shape of the condensing point, and the shape near the condensing point may be used. For example, in the case of laser light L having astigmatism, as shown in FIG. 22( a ), the beam shape has a longitudinal direction NH in the region on the laser light incident surface side near the condensing point. The beam intensity distribution in the plane of the beam shape of Fig. 22(a) (in the plane at the position in the Z direction on the side of the laser light incident surface near the condensing point) becomes a distribution with a strong intensity in the longitudinal direction NH , the direction of the stronger beam intensity is consistent with the long-side direction NH.
在具有像散之雷射光L的情況,如圖22(c)所示般,在聚光點附近之雷射光入射面之相反面側的區域,光束形狀具有與雷射光入射面側之區域的長邊方向NH(參照圖22(a))垂直的長邊方向NH0。在圖22(c)之光束形狀的平面內(在聚光點附近之雷射光入射面之相反面側的Z方向位置之平面內)的光束強度分布,成為在長邊方向NH0具有較強的強度之分布,光束強度較強的方向與長邊方向NH0一致。在具有像散之雷射光L的情況,如圖22(b)所示般,在聚光點附近之雷射光入射面側和其相反面側之間的區域,聚光區域C沒有長邊方向而成為圓形。In the case of laser light L having astigmatism, as shown in FIG. 22(c), in the region on the opposite side of the laser light incident surface near the condensing point, the beam shape has a shape similar to that of the region on the laser light incident surface side. The longitudinal direction NH (refer to FIG. 22( a )) is the perpendicular longitudinal direction NH0 . The beam intensity distribution in the plane of the beam shape of Fig. 22(c) (in the plane at the position in the Z direction on the opposite side of the laser light incident surface near the condensing point) has a strong intensity in the longitudinal direction NH0. In the distribution of intensity, the direction with stronger beam intensity is consistent with the long-side direction NH0. In the case of the laser light L having astigmatism, as shown in FIG. 22( b ), in the region between the laser light incident surface side and the opposite surface side near the condensing point, the condensing region C has no longitudinal direction. become circular.
在如此般具有像散之雷射光L的情況,在本實施形態作為對象的聚光區域C,是包含在聚光點附近之雷射光入射面側的區域,在本實施形態作為對象的光束形狀,是圖22(a)所示的光束形狀。In the case of the laser light L having astigmatism in this way, the condensing region C targeted in this embodiment is an area on the side of the incident surface of the laser light included in the vicinity of the condensing point, and the beam shape targeted in this embodiment , is the beam shape shown in Fig. 22(a).
又藉由調整空間光調變器7的調變圖案,可將在聚光區域C之成為圖22(a)所示之光束形狀的位置進行所期望的控制。例如能夠控制成,在聚光點附近之雷射光入射面的相反面側的區域具有圖22(a)所示的光束形狀。又例如能夠控制成,在聚光點附近之雷射光入射面側和其相反面側之間的區域具有圖22(a)所示的光束形狀。聚光區域C之一部分的位置沒有特別的限定,可以是從對象物11之雷射光入射面到其相反面之間的任何位置。Furthermore, by adjusting the modulation pattern of the spatial
又例如在採用調變圖案的控制及/或基於機械式機構之狹縫或橢圓光學系統的情況,如圖23(a)所示般,在聚光點附近之雷射光入射面側的區域,光束形狀具有長邊方向NH。在圖23(a)之光束形狀的平面內(在聚光點附近之雷射光入射面側的Z方向位置之平面內)之光束強度分布,成為在長邊方向NH具有較強的強度之分布,光束強度較強的方向與長邊方向NH一致。For another example, in the case of using the control of the modulation pattern and/or the slit or elliptical optical system based on the mechanical mechanism, as shown in FIG. The beam shape has a long-side direction NH. The beam intensity distribution in the plane of the beam shape in Fig. 23(a) (in the plane at the position in the Z direction on the side of the laser light incident surface near the condensing point) becomes a distribution with a strong intensity in the longitudinal direction NH , the direction of the stronger beam intensity is consistent with the long-side direction NH.
在採用狹縫或橢圓光學系統的情況,如圖23(c)所示般,在聚光點附近之雷射光入射面的相反面側的區域,光束形狀具有與雷射光入射面側的區域之長邊方向NH(參照圖22(a))相同的長邊方向NH。在圖23(c)的光束形狀之平面內(在聚光點附近之雷射光入射面的相反面側之Z方向位置的平面內)之光束強度分布,成為在長邊方向NH具有較強的強度之分布,光束強度較強的方向與長邊方向NH一致。在採用狹縫或橢圓光學系統的情況,如圖23(b)所示般,在聚光點,光束形狀具有與雷射光入射面側的區域之長邊方向NH(參照圖23(a))垂直的長邊方向NH0。在圖23(b)的光束形狀之平面內(在聚光點的Z方向位置之平面內)的光束強度分布,成為在長邊方向NH0具有較強的強度之分布,光束強度較強的方向與長邊方向NH0一致。In the case of using a slit or elliptical optical system, as shown in Fig. 23(c), in the area on the opposite side of the laser light incident surface near the condensing point, the beam shape has a difference between the beam shape and the area on the laser light incident surface side. The longitudinal direction NH (refer to FIG. 22( a )) is the same as the longitudinal direction NH. The beam intensity distribution in the plane of the beam shape shown in Fig. 23(c) (in the plane at the position in the Z direction on the opposite side of the laser light incident surface near the condensing point) has a strong distribution in the longitudinal direction NH. In the distribution of intensity, the direction where the beam intensity is stronger is consistent with the long-side direction NH. In the case of using a slit or elliptical optical system, as shown in FIG. 23(b), the beam shape at the condensing point has the longitudinal direction NH of the region on the side of the incident surface of the laser light (refer to FIG. 23(a)) Vertical long-side direction NH0. The beam intensity distribution in the plane of the beam shape in Fig. 23(b) (in the plane of the Z direction position of the condensing point) becomes a distribution with a strong intensity in the longitudinal direction NH0, and a direction in which the beam intensity is strong Consistent with the longitudinal direction NH0.
在採用如此般的狹縫或橢圓光學系統的情況,聚光點以外的光束形狀成為具有長邊方向的形狀,聚光點以外的光束形狀是在本實施形態作為對象的光束形狀。亦即,在本實施形態作為對象之聚光區域C的一部分,係包含在聚光點附近之雷射光入射面側的區域,在本實施形態作為對象的光束形狀,是圖23(a)所示的光束形狀。When such a slit or elliptical optical system is employed, the beam shape other than the condensing point has a longitudinal direction, and the beam shape other than the condensing point is the beam shape targeted by this embodiment. That is, a part of the condensing area C that is targeted in this embodiment is an area on the side of the laser light incident surface near the condensing point, and the beam shape targeted in this embodiment is as shown in FIG. 23(a) . the beam shape shown.
在修整加工,控制部6係控制載台2的旋轉、來自照射部3之雷射光L的照射、光束形狀、及聚光區域C的移動。控制部6,可根據與載台2的旋轉量有關之旋轉資訊(以下也稱為「θ資訊」)來實行各種的控制。θ資訊,可根據讓載台2旋轉之驅動裝置的驅動量來取得,亦可藉由另外的感測器等來取得。θ資訊可利用公知的各種手法來取得。在此的θ資訊包含:以對象物11位於0˚方向的位置時的狀態為基準之旋轉角度。In the trimming process, the
控制部6,一邊讓載台2旋轉,一邊在讓聚光區域C位於對象物11之沿著線A(有效區域R的周緣)的位置的狀態下,根據θ資訊來控制在照射部3之雷射光L的照射開始及停止,藉此實行沿著有效區域R的周緣讓改質區域形成之周緣處理。The
控制部6,不讓載台2旋轉,讓雷射光L照射於除去區域E且讓該雷射光L的聚光區域C移動,藉此實行在除去區域E讓改質區域形成的除去處理。The
控制部6,是以在改質區域所含的複數個改質點的節距(在加工進展方向上鄰接之改質點的間隔)成為一定的方式,控制載台2的旋轉、來自照射部3之雷射光L的照射、以及聚光區域C的移動中之至少一者。The
控制部6,係根據對準用的攝像機(未圖示)之攝像圖像,取得對象物11的旋轉方向的基準位置(0˚方向的位置)及對象物11的直徑。控制部6,以使照射部3可沿著X方向移動到載台2之旋轉軸Cx上的方式,控制照射部3的移動。The
接下來,針對修整加工的一例做說明。首先,以使第1面11a成為雷射光L入射面的方式,在載台2上載置對象物11。在對象物11之搭載有功能元件之第2面11b側,是黏著支承基板或帶狀材(tape material)而被保護。Next, an example of the dressing process will be described. First, the
接著實施修整加工。在修整加工,藉由控制部6實行周緣處理。具體而言,如圖24(a)所示般,一邊讓載台2以一定的速度旋轉,一邊在讓聚光區域C位於沿著對象物11之有效區域R的周緣的位置的狀態下,根據θ資訊來控制在照射部3之雷射光L的照射開始及停止。藉此,如圖24(b)及圖24(c)所示般,沿著線A(有效區域R的周緣)形成改質區域12。所形成的改質區域12係包含改質點及從改質點延伸的龜裂。Next, trim processing is performed. In the trimming process, peripheral edge processing is performed by the
在修整加工,藉由控制部6實行除去處理。具體而言,如圖25(a)所示般,不讓載台2旋轉,在除去區域E照射雷射光L,並讓照射部3沿著X方向移動,使該雷射光L的聚光區域C對於對象物11在X方向相對移動。在讓載台2旋轉90˚之後,在除去區域E照射雷射光L,並讓照射部3沿著X方向移動,使該雷射光L的聚光區域C對於對象物11在X方向相對移動。In the trimming process, removal processing is performed by the
藉此,如圖25(b)所示般,沿著從Z方向觀察時以將除去區域E四等分的方式延伸的線來形成改質區域12。所形成的改質區域12係包含改質點及從改質點延伸的龜裂。該龜裂,可到達第1面11a及第2面11b之至少任一者,亦可不到達第1面11a及第2面11b之至少任一者。之後,如圖26(a)及圖26(b)所示般,例如利用治具或氣體(air),以改質區域12為邊界而將除去區域E去除。藉此,從對象物11讓半導體裝置11K形成。Thereby, as shown in FIG.25(b), the modified area|
接著,如圖26(c)所示般,對於半導體裝置11K的剝離面11c,進行精加工的磨削、乃至基於磨石等的研磨材KM之研磨。在利用蝕刻將對象物11剝離的情況,可將該研磨簡化。以上的結果,取得半導體裝置11M。Next, as shown in FIG.26(c), the peeling
接下來,針對修整加工,做更詳細的說明。如圖27所示般,對象物11呈板狀。對象物11具有結晶構造,該結晶構造包含:(100)面、一個(110)面、另一個(110)面、與一個(110)面正交的第1結晶方位K1、及與另一個(110)面正交的第2結晶方位K2。對象物11的第1面11a是(100)面。對象物11是以(100)面(亦即第1面11a)成為雷射光L入射面的方式由載台2支承。對象物11是例如矽所形成的矽晶圓。(110)面是劈開面。第1結晶方位K1及第2結晶方位K2是劈開方向,亦即對象物11中最容易讓龜裂延伸的方向。第1結晶方位K1和第2結晶方位K2互相正交。Next, the trimming process will be described in more detail. As shown in FIG. 27 , the
在對象物11設置對準對象11n。例如對準對象11n,對於對象物11之0˚方向的位置在θ方向(繞載台2的旋轉軸Cx之旋轉方向)具有一定的關係。0˚方向的位置,是在θ方向成為基準之對象物11的位置。例如對準對象11n是形成於外緣部之缺口。又對準對象11n沒有特別的限定,可以是對象物11的定向平面,也可以是功能元件的圖案。在圖示的例子,對準對象11n設置在對象物11之0˚方向的位置。換言之,對準對象11n設置在對象物11的外緣和第2結晶方位K2正交的位置。An
在對象物11,設定有作為修整預定線的線A。線A是預定形成改質區域12的線。線A是在對象物11之外緣的內側呈環狀延伸。在此的線A呈圓環狀延伸。線A設定在對象物11的有效區域R和除去區域E之邊界。線A的設定可在控制部6進行。線A雖是假想線,但亦可為實際劃設的線。線A亦可為被指定座標者。In the
控制部6取得與對象物11有關之對象物資訊。對象物資訊例如包含:與對象物11的結晶方位(第1結晶方位K1及第2結晶方位K2)有關的資訊、與對象物11之0˚方向的位置及對象物11的直徑有關之對準資訊。控制部6,可根據對準用的攝像機之攝像圖像、以及基於使用者的操作或來自外部的通訊等之輸入,來取得對象物資訊。The
又控制部6係取得與線A有關的線資訊。線資訊係包含:線A的資訊、及在沿著線A讓聚光區域C相對移動的情況之與該移動的移動方向(也稱為「加工進展方向」)有關的資訊。例如加工進展方向,係通過位於線A上的聚光區域C之線A的切線方向。控制部6可根據基於使用者的操作或來自外部的通訊等之輸入來取得線資訊。Further, the
再者,控制部6,係根據所取得的對象物資訊及線資訊,以使光束形狀的長邊方向與加工進展方向交叉的方式,來決定當沿著線A讓聚光區域C相對移動的情況之長邊方向的朝向。具體而言,控制部6是根據對象物資訊及線資訊,將長邊方向NH的朝向決定為第1朝向及第2朝向。第1朝向,係當沿著線A的第1區域A1讓聚光區域C相對移動的情況之光束形狀之長邊方向的朝向。第2朝向,係當沿著線A的第2區域A2讓聚光區域C相對移動的情況之光束形狀之長邊方向的朝向。以下,將「光束形狀之長邊方向的朝向」也簡稱為「光束形狀的朝向」。Furthermore, the
第1區域A1是圓弧狀的區域,作為一例,當將第2結晶方位K2和線A正交的點設為0˚,將第1結晶方位K1和線A正交的點設為90˚,將線A上之0˚和90˚中間的點設為45˚時,第1區域A1包含:0˚~45˚的區域、90˚~135˚的區域、180˚~225˚的區域、以及270˚~315˚的區域。第2區域A2是圓弧狀的區域,且包含:45˚~90˚區域、135˚~180˚的區域、225˚~270˚的區域、及315˚~360˚的區域。又在此情況,45˚點及225˚點,是與(100)面正交之第3結晶方位K3和線A正交的點;135˚點及315˚點,是與(100)面正交之第4結晶方位K4和線A正交的點。The first region A1 is an arc-shaped region, and as an example, the point at which the second crystal orientation K2 and the line A are orthogonal is set at 0°, and the point at which the first crystal orientation K1 and the line A are orthogonal is set at 90° , when the point between 0° and 90° on line A is set to 45°, the first area A1 includes: the area of 0°~45°, the area of 90°~135°, the area of 180°~225°, And the area of 270˚~315˚. The second area A2 is an arc-shaped area, and includes a 45˚~90˚ area, a 135˚~180˚ area, a 225˚~270˚ area, and a 315˚~360˚ area. Also in this case, the 45° point and the 225° point are the points orthogonal to the third crystal orientation K3 orthogonal to the (100) plane and the line A; the 135° point and the 315° point are the (100) plane points. A point where the fourth crystal orientation K4 and the line A are orthogonal to each other.
如此般,線A包含:朝逆時針方向每隔45˚交互排列之複數個第1區域A1及複數個第2區域A2。但第1區域A1及第2區域A2的上述角度範圍,可按照是將0˚點設定在哪裡而任意地變更。例如,當將第1結晶方位K1和線A正交的點設定為0˚的情況(將上述90˚點設定為0˚的情況),第1區域A1及第2區域A2成為從上述角度範圍旋轉90˚後的角度範圍。又如上述般設定0˚點的情況,從0˚點朝順時針方向旋轉45˚後的點之315˚點,也能稱為-45˚點。再者,第1區域A1和第2區域A2的邊界(例如45˚)點,可包含於第1區域A1和第2區域A2的任一方,也能包含於雙方。In this way, the line A includes a plurality of first areas A1 and a plurality of second areas A2 alternately arranged at intervals of 45° in the counterclockwise direction. However, the above-mentioned angular ranges of the first area A1 and the second area A2 can be arbitrarily changed according to where the 0° point is set. For example, when the point at which the first crystal orientation K1 is perpendicular to the line A is set to 0° (the above-mentioned 90° point is set to 0°), the first area A1 and the second area A2 are in the angle range from the above-mentioned angle. Angular range after 90˚ rotation. When the 0° point is set as described above, the 315° point of the point rotated 45° clockwise from the 0° point can also be called the -45° point. In addition, the boundary (for example, 45°) point of the first area A1 and the second area A2 may be included in either one of the first area A1 and the second area A2, or may be included in both.
第1區域A1,當沿著線A讓聚光區域C相對移動的情況,係包含後述的加工角度成為0˚~45˚、或-90˚~-45˚的區域。第2區域A2,當沿著線A讓聚光區域C相對移動的情況,係包含後述的加工角度成為45˚以上未達90˚或-45˚以上未達0˚的區域。The first area A1 includes the area where the processing angle described later is 0° to 45°, or -90° to -45°, when the light-converging area C is relatively moved along the line A. The second area A2, when the light-converging area C is relatively moved along the line A, includes the area where the processing angle described later is 45° or more and less than 90° or -45° or more and less than 0°.
如圖28(b)所示般,加工角度α是相對於第1結晶方位K1之加工進展方向ND的角度。加工角度α,從與雷射光L的入射面、即第1面11a交叉之Z方向觀察時,將朝逆時針方向的角度設為正(+)的角度,將朝順時針方向的角度設為負(-)的角度。加工角度α可根據載台2的θ資訊、對象物資訊及線資訊來取得。當沿著第1區域A1讓聚光區域C相對移動的情況,例如可視為加工角度α是0˚~45˚或-90˚~-45˚的情況。當沿著第2區域A2讓聚光區域C相對移動的情況,例如可視為加工角度α是45˚~90˚或-45˚~0˚的情況。As shown in FIG. 28( b ), the machining angle α is an angle with respect to the machining progress direction ND of the first crystal orientation K1 . The processing angle α, when viewed from the Z direction intersecting the
第1朝向及第2朝向,是以接近第1結晶方位K1及第2結晶方位K2當中與加工進展方向ND之間的角度較大的一方(更遠離的一方)的方式,相對於加工進展方向ND呈傾斜的方向的朝向。The first orientation and the second orientation are relative to the machining progression direction so as to be closer to the larger (farther away) angle between the first crystal orientation K1 and the second crystal orientation K2 and the machining progression direction ND. ND is oriented in an oblique direction.
第1朝向及第2朝向,當加工角度α為0˚~90˚的情況,是如以下般。第1朝向,是往接近第2結晶方位K2側使長邊方向NH相對於加工進展方向ND呈傾斜之方向的朝向。第2朝向,是往接近第1結晶方位K1側使長邊方向NH相對於加工進展方向ND呈傾斜之方向的朝向。第1朝向,例如是從加工進展方向ND朝接近第2結晶方位K2側呈10˚~35˚傾斜之方向的朝向。第2朝向,例如是從加工進展方向ND朝接近第1結晶方位K1側呈10˚~35˚傾斜之方向的朝向。The first and second orientations are as follows when the machining angle α is 0° to 90°. The first orientation is the orientation of the direction in which the longitudinal direction NH is inclined with respect to the machining progress direction ND toward the side close to the second crystal orientation K2. The second orientation is a direction in which the longitudinal direction NH is inclined with respect to the machining progress direction ND toward the side close to the first crystal orientation K1. The first orientation is, for example, an orientation in a direction inclined by 10° to 35° toward the side close to the second crystal orientation K2 from the machining progress direction ND. The second direction is, for example, a direction inclined by 10° to 35° toward the side close to the first crystal orientation K1 from the machining progress direction ND.
第1朝向是光束角度β為+10˚~+35˚的情況之聚光區域C的朝向。第2朝向是光束角度β為-35˚~-10˚的情況之聚光區域C的朝向。光束角度β是加工進展方向ND和長邊方向NH之間的角度。光束角度β,從與雷射光L的入射面、即第1面11a交叉之Z方向觀察時,將朝逆時針方向的角度設為正(+)的角度,將朝順時針方向的角度設為負(-)的角度。光束角度β可根據聚光區域C的朝向和加工進展方向ND來取得。The first orientation is the orientation of the condensing area C when the beam angle β is +10° to +35°. The second orientation is the orientation of the condensing area C when the beam angle β is -35° to -10°. The beam angle β is the angle between the machining progress direction ND and the long-side direction NH. The beam angle β, when viewed from the Z direction intersecting the
控制部6是控制對對象物11之雷射加工的開始及停止。控制部6實行第1加工處理,該第1加工處理,是沿著線A的第1區域A1讓聚光區域C相對移動而讓改質區域12形成,並讓在線A之第1區域A1以外的區域之改質區域12的形成停止。控制部6實行第2加工處理,該第2加工處理,是沿著線A的第2區域A2讓聚光區域C相對移動而讓改質區域12形成,並讓在線A之第2區域A2以外的區域之改質區域12的形成停止。The
基於控制部6之改質區域12的形成及其停止的切換,可如以下所述般實現。例如,在照射部3將雷射光L的照射(輸出)之開始及停止(ON/OFF)切換,藉此可將改質區域12的形成和該形成的停止進行切換。具體而言,當雷射振盪器是由固態雷射所構成的情況,藉由將設置於共振器內之Q開關(AOM(聲光調變器)、EOM(電光調變器)等)的ON/OFF進行切換,可將雷射光L的照射之開始及停止高速地切換。當雷射振盪器是由光纖雷射所構成的情況,藉由將構成種光源雷射(seed laser)、放大器(激發用)雷射之半導體雷射的輸出之ON/OFF進行切換,可將雷射光L的照射之開始及停止高速地切換。當雷射振盪器是使用外部變調元件的情況,藉由將設置於共振器外之外部變調元件(AOM、EOM等)的ON/OFF進行切換,可將雷射光之照射的ON/OFF高速地切換。The formation of the modified
或者,基於控制部6之改質區域12的形成及其停止的切換,亦可如以下所述般實現。例如,藉由控制快門(shutter)等之機械式機構來將雷射光L的光路進行開閉,藉此切換改質區域12的形成和該形成的停止。亦可將雷射光L切換成CW光(連續波),藉此讓改質區域12的形成停止。亦可在空間光調變器7之液晶層76顯示:使雷射光L的聚光狀態成為無法改質狀態的圖案(例如,讓雷射散射之梨皮狀的圖案),藉此讓改質區域12的形成停止。亦可控制衰減器等之功率調整部,以無法形成改質區域的方式讓雷射光L的輸出降低,藉此讓改質區域12的形成停止。亦可將偏光方向切換,藉此讓改質區域12的形成停止。亦可使雷射光L朝光軸以外的方向散射(散開)而將其截止,藉此讓改質區域12的形成停止。Alternatively, the formation of the modified
控制部6,藉由控制空間光調變器7來調整聚光區域C的朝向。控制部6,在實行第1加工處理的情況,是以成為第1朝向的方式調整聚光區域C的朝向。控制部6,在實行第2加工處理的情況,是以成為第2朝向的方式調整聚光區域C的朝向。控制部6,作為一例,以相對於加工進展方向ND在±35˚的範圍內變化的方式,調整聚光區域C之長邊方向NH。The
在上述的雷射加工裝置1,是實施以下的修整加工。In the above-mentioned
在修整加工,首先,以使對準用的攝像機位於對象物11之對準對象11n的正上方且使攝像機聚焦於對準對象11n的方式,讓載台2旋轉並讓攝像機所搭載的照射部3沿著X方向及Y方向移動。In the trimming process, first, the
接下來藉由對準用的攝像機進行攝像。根據攝像機的攝像圖像取得對象物11之0˚方向的位置。藉由控制部6,根據攝像機的攝像圖像、以及基於使用者的操作或來自外部的通訊等之輸入,取得對象物資訊及線資訊。對象物資訊包含對象物11之0˚方向的位置及與直徑有關之對準資訊。如上述般,因為對準對象11n對於0˚方向的位置在θ方向具有一定的關係,藉由從攝像圖像取得對準對象11n的位置,可取得0˚方向的位置。根據攝像機的攝像圖像可取得對象物11的直徑。又對象物11的直徑是藉由來自使用者的輸入來設定亦可。Next, imaging is performed with a camera for alignment. The position of the
接下來,根據所取得的對象物資訊及線資訊,藉由控制部6,決定第1朝向及第2朝向來作為沿著線A讓聚光區域C相對移動的情況之聚光區域C之長邊方向NH的朝向。Next, based on the acquired object information and line information, the
接下來,讓載台2旋轉,使對象物11位於0˚方向的位置。以在X方向上使聚光區域C位於修整既定位置的方式,讓照射部3沿著X方向及Y方向移動。例如修整既定位置是對象物11中之線A上的既定位置。Next, the
接下來,開始進行載台2的旋轉。開始進行基於測距感測器(未圖示)之第1面11a的追蹤。又在開始進行測距感測器的追蹤之前,事先確認聚光區域C的位置是在測距感測器之測量範圍內。在載台2的旋轉速度成為一定(等速)的時點,開始進行基於照射部3之雷射光L的照射。Next, the rotation of the
一邊讓載台2旋轉,一邊藉由控制部6將雷射光L的照射之ON/OFF進行切換,如圖28(a)所示般,沿著線A中的第1區域A1讓聚光區域C相對移動而讓改質區域12形成,並讓在線A之第1區域A1以外的區域之改質區域12的形成停止(第1加工工序)。如圖28(b)所示般,在實行第1加工工序的情況,藉由控制部6以成為第1朝向的方式調整聚光區域C的朝向。亦即,在第1加工工序之聚光區域C的朝向,是固定在第1朝向。While the
接下來,一邊讓載台2旋轉,一邊藉由控制部6將雷射光L的照射之ON/OFF進行切換,如圖29(a)所示般,沿著線A中的第2區域A2讓聚光區域C相對移動而讓改質區域12形成,並讓在線A之第1區域A1以外的區域之改質區域12的形成停止(第2加工工序)。如圖29(b)所示般,在實行第2加工工序的情況,藉由控制部6以成為第2朝向的方式調整聚光區域C的朝向。亦即,在第2加工工序之聚光區域C的朝向,是固定在第2朝向。Next, while the
改變修整既定位置之Z方向的位置而重複進行上述第1加工工序及第2加工工序。藉由以上操作,在對象物11的內部,沿著有效區域R之周緣的線A而在Z方向形成複數列的改質區域12。
[雷射加工之第1實施形態]The above-described first processing step and second processing step are repeated by changing the position in the Z direction of the trimming predetermined position. As a result of the above operations, a plurality of rows of modified
以上說明了與斜向龜裂形成有關的認識、及修整加工之一例。在此,針對在修整加工時進行斜向龜裂的形成之雷射加工的一實施形態進行說明。圖30係顯示一實施形態之雷射加工的對象物。圖30(a)係俯視圖,圖30(b)係側視圖。圖31係圖30所示的對象物之剖面圖。The above has explained the knowledge related to the formation of the oblique crack and an example of the trimming process. Here, an embodiment of laser processing for forming oblique cracks at the time of trimming will be described. FIG. 30 shows an object of laser processing according to an embodiment. Fig. 30(a) is a plan view, and Fig. 30(b) is a side view. FIG. 31 is a cross-sectional view of the object shown in FIG. 30 .
如圖30,31所示般,對象物100係包含:上述對象物11、及與對象物11為不同構件之對象物11R。對象物11R是例如矽晶圓。對象物11包含複數個功能元件,且包含形成於第2面11b之裝置層110。對象物11R包含複數個功能元件,且包含形成於對象物11R的第1面11Ra之裝置層110R。對象物11和對象物11R,是以裝置層110和裝置層110R彼此相對向的方式配置,藉由互相接合而貼合在一起,藉此構成對象物100。As shown in FIGS. 30 and 31 , the
在此,在對象物11形成改質區域12及從改質區域12延伸的龜裂13,並進行以該等改質區域12及龜裂13為邊界而將對象物11的除去區域E切除之修整加工。更具體的說,對象物11係包含:從成為雷射光L的入射面之第1面11a的相反側之第2面11b(相反面)側起依序排列之第1部分15A及第2部分15B。而且,在第1部分15A,以形成相對於Z方向傾斜地延伸之龜裂13(以下會有稱為「斜向龜裂」的情形)的方式進行改質區域12的形成;在第2部分15B,以形成沿著Z方向延伸之龜裂13(以下會有稱為「垂直龜裂」的情形)的方式進行改質區域12的形成。又圖31的線R1表示形成斜向龜裂之預定的線,線R2表示形成垂直龜裂之預定的線。Here, the modified
因此,在至少第1部分15A的加工時,係並用上述的修整加工和用於讓斜向龜裂產生之加工。亦即,在第1部分15A的加工時,使長邊方向NH以接近第1結晶方位K1及第2結晶方位K2當中與加工進展方向ND之間的角度較大之一方且相對於加工進展方向ND傾斜的方式,將光束形狀成形,並沿著線A形成改質區域12及龜裂13,而使龜裂13成為斜向龜裂。Therefore, in the processing of at least the
更具體的說,在進行線A之第1區域A1的加工的情況,以成為如圖28(b)所示般之第1朝向之第1形狀Q1之聚光區域C的方式進行雷射光L的成形;在進行線A之第2區域A2的加工的情況,以成為如圖29(b)所示般之第2朝向之第2形狀Q2之聚光區域C的方式進行雷射光L的成形。對於如此般進行加工的情況,進行了以下所述的加工試驗。More specifically, when processing the first region A1 of the line A, the laser light L is irradiated so as to become the light-condensing region C of the first shape Q1 in the first orientation as shown in FIG. 28( b ). In the case of processing the second area A2 of the line A, the laser beam L is formed so as to become the condensing area C of the second shape Q2 in the second direction as shown in FIG. 29(b). . In the case of processing in this way, the processing test described below was carried out.
圖32係圖30所示的對象物之俯視圖。如圖32所示般,在此,對於線A中之從線A和第2結晶方位K2的交點、即0˚點到線A和第4結晶方位K4的交點、即-45˚點為止的第2區域A2,在將加工進展方向ND設為順方向ND1而讓聚光區域C相對移動的情況、及在將加工進展方向ND設為逆方向ND2而讓聚光區域C相對移動的情況分別實際地進行加工並進行了剖面觀察。在此,為了進行第2區域A2的加工,聚光區域C成為圖29(b)所示之第2形狀Q2。又斜向龜裂的延伸方向CD,是從對象物11之中心側朝向外側的方向(參照圖29(b))。FIG. 32 is a plan view of the object shown in FIG. 30 . As shown in FIG. 32, here, for the line A from the intersection of the line A and the second crystal orientation K2, that is, the 0° point to the intersection of the line A and the fourth crystal orientation K4, that is, up to the -45° point In the second area A2, when the processing progress direction ND is set to the forward direction ND1 and the light-converging area C is relatively moved, and when the processing progress direction ND is set to the reverse direction ND2 and the light-converging area C is relatively moved, respectively Actual processing was performed and cross-sectional observation was performed. Here, in order to process the second region A2, the light-converging region C has a second shape Q2 shown in FIG. 29(b). Further, the extending direction CD of the diagonal crack is a direction from the center side of the
因此,圖29(b)所示般,在加工進展方向ND為順方向ND1的情況,相對於加工進展方向ND使聚光區域C之長邊方向NH之傾斜的朝向、和斜向龜裂的延伸方向CD成為同一側,另一方面,在加工進展方向ND為逆方向ND2的情況(加工進展方向ND之箭頭的朝向為相反的情況),相對於加工進展方向ND使長邊方向NH之傾斜的朝向、和斜向龜裂的延伸方向CD彼此成為相反側。又順方向ND1設為朝逆時針方向,逆方向ND2設為朝順時針方向。Therefore, as shown in FIG. 29( b ), when the machining progress direction ND is the forward direction ND1 , the direction of the inclination of the longitudinal direction NH of the light-converging region C with respect to the machining progress direction ND and the direction of the oblique cracks The extending direction CD is on the same side, and on the other hand, when the machining progress direction ND is the reverse direction ND2 (the direction of the arrow in the machining progress direction ND is opposite), the longitudinal direction NH is inclined with respect to the machining progress direction ND The direction of , and the extending direction CD of the diagonal cracks are opposite to each other. Further, the forward direction ND1 is set to be in the counterclockwise direction, and the reverse direction ND2 is set to be in the clockwise direction.
圖33及圖34顯示加工結果的剖面照片。圖33顯示在順方向ND1的加工結果,圖33(a)~(d)分別為0˚點、-15˚點、-30˚點、及-45˚點的剖面照片。又圖34顯示在逆方向ND2的加工結果,圖34(a)~(d)分別為0˚點、-15˚點、-30˚點、及-45˚點的剖面照片。33 and 34 show cross-sectional photographs of the processing results. Fig. 33 shows the processing results of ND1 in the forward direction, and Fig. 33(a)~(d) are the cross-sectional photos at the 0° point, the -15° point, the -30° point, and the -45° point, respectively. Figure 34 also shows the processing results of ND2 in the reverse direction. Figure 34(a)~(d) are the cross-sectional photos of the 0° point, the -15° point, the -30° point, and the -45° point, respectively.
如圖33,34所示般,在長邊方向NH的朝向和斜向龜裂的延伸方向CD相對於加工進展方向ND成為同一側之順方向ND1的加工,從0˚到-45˚獲得良好的加工結果,但在長邊方向NH的朝向和斜向龜裂的延伸方向CD相對於加工進展方向ND成為相反側之逆方向ND2的加工,在-45˚點(圖34(d)),產生到達下表面的凹凸FN,而確認發生了品質降低。因此可理解,相對於加工進展方向ND之長邊方向NH之傾斜的朝向、和相對於加工進展方向ND之斜向龜裂的延伸方向CD的關係,會對加工品質造成影響。根據此理解進行了其他的加工試驗。As shown in Figs. 33 and 34, when the direction of the longitudinal direction NH and the extending direction CD of the diagonal cracks are the same side as the machining progress direction ND, the machining in the forward direction ND1 is good from 0° to -45°. However, the direction of the longitudinal direction NH and the extension direction CD of the diagonal cracks are opposite to the machining progress direction ND, and the machining results in the opposite direction ND2 are at the -45° point (Fig. 34(d)). Asperities FN reaching the lower surface were generated, and it was confirmed that quality degradation occurred. Therefore, it is understood that the relationship between the direction of the inclination of the longitudinal direction NH with respect to the working progress direction ND and the extending direction CD of the diagonal crack with respect to the working progress direction ND affects the working quality. Based on this understanding, other processing tests were performed.
圖35係用於說明加工試驗之示意圖。圖36係顯示在加工試驗之加工進展方向和光束形狀和斜向龜裂的關係之示意圖。如圖35,36所示般,在本加工試驗,從Z方向觀察時,將相對於(110)面成為45˚的方向設為加工進展方向ND,關於其順方向ND1和逆方向ND2各個,分別進行將斜向龜裂的延伸方向CD設為正方向CD1的情況和設為逆方向CD2的情況之加工。亦即,對於加工進展方向ND的順逆這2種、斜向龜裂的延伸方向CD的正逆這2種之合計4種的組合,進而進行將聚光區域C的光束形狀設為第1形狀Q1的情況和設為第2形狀Q2的情況之加工(合計8種的加工)。Fig. 35 is a schematic diagram for explaining a processing test. Fig. 36 is a schematic diagram showing the relationship between the machining progress direction and the beam shape and the oblique crack in the machining test. As shown in Figs. 35 and 36, in this machining test, when viewed from the Z direction, the direction of 45° with respect to the (110) plane is referred to as the machining progress direction ND, and about the forward direction ND1 and the reverse direction ND2, respectively, The processing was carried out in the case where the extending direction CD of the oblique crack was set as the positive direction CD1 and the case where it was set as the reverse direction CD2, respectively. That is, for a total of four combinations of two types of forward and reverse in the processing progress direction ND and two types of forward and reverse in the extending direction CD of the diagonal crack, the beam shape of the condensing region C is further made into the first shape. Processing in the case of Q1 and in the case of using the second shape Q2 (8 types of processing in total).
圖37係顯示圖35,36所示之加工試驗的結果之表。如圖37所示般,對於合計8種的加工,在將斜向龜裂的延伸方向CD設為正方向CD1時,當將聚光區域C的光束形狀設為第2形狀Q2且將加工進展方向ND設為順方向ND1的情況、及將聚光區域C的光束形狀設為第1形狀Q1且將加工進展方向ND設為逆方向ND2的情況,可獲得良好的加工結果(圖37的表中之「A」)。Figure 37 is a table showing the results of the processing tests shown in Figures 35, 36. As shown in FIG. 37 , for a total of eight types of processing, when the extending direction CD of the diagonal crack is set as the positive direction CD1, the beam shape of the condensing region C is set as the second shape Q2, and the processing is advanced. When the direction ND is the forward direction ND1, and when the beam shape of the condensing region C is the first shape Q1 and the machining progress direction ND is the reverse direction ND2, good machining results can be obtained (Table of FIG. 37 ). "A" in).
又對於合計8種的加工,在將斜向龜裂的延伸方向CD設為逆方向CD2時,當將聚光區域C的光束形狀設為第1形狀Q1且將加工進展方向ND設為順方向ND1的情況、及將聚光區域C的光束形狀設為第2形狀Q2且將加工進展方向ND設為逆方向ND2的情況,可獲得良好的加工結果。如此得到以下的認識,在進行至少45˚點的加工時,調整加工進展方向ND的順逆,相對於加工進展方向ND使聚光區域C之長邊方向NH之傾斜的朝向和斜向龜裂的延伸方向CD成為同一側的情況,可獲得良好的加工結果。In addition, for a total of 8 types of processing, when the extending direction CD of the diagonal crack is the reverse direction CD2, the beam shape of the condensing region C is the first shape Q1 and the processing progress direction ND is the forward direction. In the case of ND1 and the case where the beam shape of the condensing region C is the second shape Q2 and the machining progress direction ND is the reverse direction ND2, good machining results can be obtained. In this way, the following knowledge is obtained. When processing at least 45° points, the forward and reverse directions of the processing progress direction ND are adjusted, and the direction of the inclination of the longitudinal direction NH of the light-converging region C with respect to the processing progress direction ND and the direction of the diagonal cracks are adjusted. When the extending direction CD is on the same side, a good processing result can be obtained.
當將第2結晶方位K2和線A正交的點設為0˚的情況,45˚點是與(100)面正交之第3結晶方位K3和線A正交的點,等同於同樣與(100)面正交之第4結晶方位K4和線A正交的點、即-45˚點。When the point at which the second crystal orientation K2 and the line A are orthogonal is set to 0°, the 45° point is the point where the third crystal orientation K3 orthogonal to the (100) plane is orthogonal to the line A, which is equivalent to the same The point at which the fourth crystal orientation K4 orthogonal to the (100) plane is orthogonal to the line A, that is, the -45° point.
根據以上的認識,進行進一步的加工試驗。圖38係顯示加工試驗的結果之表。圖38的表所示之各條件中,在第1區域A1將光束形狀設為第1形狀Q1的條件、及在第2區域A2將光束形狀設為第2形狀Q2的條件,且相對於加工進展方向ND使聚光區域C之長邊方向NH之傾斜的朝向和斜向龜裂的延伸方向CD成為同一側的條件IR1及條件IR2,獲得了良好的加工結果(圖38的表中之評價「A」或評價「B」)。又圖38所示的評價,其良好度的順序為評價「A」、評價「B」、評價「C」、評價「D」、及評價「E」(亦即,評價「A」最良好,評價「E」最不良好)。Based on the above knowledge, further processing tests were carried out. Figure 38 is a table showing the results of the processing tests. Among the conditions shown in the table of FIG. 38 , the conditions for setting the beam shape to the first shape Q1 in the first area A1 and the conditions for setting the beam shape to the second shape Q2 in the second area A2 are relative to the processing Under the conditions IR1 and IR2 where the direction of the inclination of the longitudinal direction NH of the light-converging region C and the extending direction CD of the oblique cracks are on the same side as the progress direction ND, good processing results were obtained (evaluation in the table of FIG. 38 ). "A" or rating "B"). In the evaluation shown in FIG. 38, the order of goodness is evaluation "A", evaluation "B", evaluation "C", evaluation "D", and evaluation "E" (that is, evaluation "A" is the best, The rating "E" is the least favorable).
條件IR1是對於在將第1結晶方位K1和線A正交的點設為0˚的情況之從0˚點到-45˚點為止的第2區域A2,將加工進展方向ND設為順方向ND1且將聚光區域C的光束形狀設為第2形狀Q2。又條件IR2是對於在將第1結晶方位K1和線A正交的點設為0˚的情況之從-45˚點到-90˚點為止的第1區域A1,將加工進展方向ND設為逆方向ND2且將聚光區域C的光束形狀設為第1形狀Q1。The condition IR1 is that the machining progress direction ND is the forward direction for the second region A2 from the 0° point to the -45° point when the point at which the first crystal orientation K1 and the line A are orthogonal is set to 0°. ND1 and the beam shape of the condensing region C is the second shape Q2. In addition, the condition IR2 is to set the machining progress direction ND as the first region A1 from the -45° point to the -90° point when the point at which the first crystal orientation K1 and the line A are orthogonal is set to 0°. The beam shape of the condensing region C is the first shape Q1 in the reverse direction ND2.
另一方面,在圖38的表所示之各條件中,只要是在第1區域A1將光束形狀設為第1形狀Q1的條件、及在第2區域A2將光束形狀設為第2形狀Q2的條件下,縱使是相對於加工進展方向ND使聚光區域C之長邊方向NH之傾斜的朝向和斜向龜裂之延伸方向CD不在同一側之條件IR3及條件IR4,雖比條件IR1及條件IR2差,但除了-45˚點以外仍可獲得大致良好的加工結果。另一方面,在圖38的表所示之各條件中,在第1區域A1將光束形狀設為第2形狀Q2的條件IR5、及在第2區域A2將光束形狀設為第1形狀Q1的條件IR6,不管加工進展方向ND的順逆如何,全都無法獲得良好的結果。On the other hand, among the conditions shown in the table of FIG. 38 , as long as the beam shape is the first shape Q1 in the first area A1, and the beam shape is the second shape Q2 in the second area A2 Under the same conditions, even if the direction of the inclination of the longitudinal direction NH of the light-converging region C and the extending direction CD of the oblique cracks are not on the same side with respect to the processing progress direction ND, the conditions IR3 and IR4 are smaller than those of the conditions IR1 and IR4. Conditional IR2 is poor, but generally good machining results are obtained except for the -45˚ point. On the other hand, among the conditions shown in the table of FIG. 38 , the condition IR5 in which the beam shape is the second shape Q2 in the first area A1 and the condition IR5 in which the beam shape is the first shape Q1 in the second area A2 Condition IR6, regardless of the forward or reverse direction of the processing progress direction ND, could not obtain a good result.
又圖39(a)係對應於圖38之表中的評價「E」之剖面照片的一例,圖39(b)係對應於圖38之表中的評價「D」之剖面照片的一例,圖39(c)係對應於圖38之表中的評價「C」之剖面照片的一例,圖39(d)係對應於圖38之表中的評價「B」之剖面照片的一例,圖39(e)係對應於圖38之表中的評價「A」之剖面照片的一例。如圖39所示般,評價「A」及評價「B」並未形成到達下表面的凹凸,而顯示良好的加工結果。又評價「C」雖稍產生到達下表面的凹凸,但顯示大致良好的結果。另一方面,評價「D」及評價「E」產生相對大量之到達下表面的凹凸,而顯示不良好的結果。Also, Fig. 39(a) is an example of a cross-sectional photograph corresponding to the evaluation "E" in the table of Fig. 38, and Fig. 39(b) is an example of a cross-sectional photograph corresponding to the evaluation "D" in the table of Fig. 38. 39(c) is an example of a cross-sectional photograph corresponding to the evaluation "C" in the table of Fig. 38, Fig. 39(d) is an example of a cross-sectional photograph corresponding to the evaluation "B" in the table of Fig. 38, Fig. 39 ( e) is an example of a cross-sectional photograph corresponding to the evaluation "A" in the table of Fig. 38 . As shown in FIG. 39, the evaluation "A" and the evaluation "B" did not form the unevenness|corrugation which reached the lower surface, but showed favorable processing results. In the evaluation "C", although unevenness reaching the lower surface was slightly generated, it showed a generally good result. On the other hand, the evaluation "D" and the evaluation "E" produced a relatively large amount of unevenness reaching the lower surface, and showed unfavorable results.
依據圖38,39所示之加工試驗的結果,可確認根據圖37所示之加工試驗的結果所得到的認識是正確的。From the results of the processing tests shown in Figs. 38 and 39, it was confirmed that the knowledge obtained from the results of the processing tests shown in Fig. 37 was correct.
在本實施形態,是根據以上般的認識來進行雷射加工。在此,首先,進行對象物11之第1部分15A(參照圖31)的加工。亦即,一邊讓載台2旋轉,一邊藉由控制部6將雷射光L之照射的ON/OFF進行切換,如圖40(a)所示般,沿著線A中的第1區域A1讓聚光區域C相對移動而形成改質區域12,並讓在線A之第1區域A1以外的區域(第2區域A2)之改質區域12的形成停止(第1加工)。In the present embodiment, laser processing is performed based on the above-mentioned knowledge. Here, first, processing of the
如圖40(b)所示般,在第1加工,基於控制部6對移動部4的控制來控制載台2的旋轉方向,而使加工進展方向ND成為逆方向ND2。又在第1加工,因為是第1區域A1的加工,基於控制部6的控制來進行基於空間光調變器7之雷射光L的成形,而使聚光區域C的光束形狀成為第1形狀Q1。再者,在此,以隨著朝向第2面11b而相對於Z方向從對象物11的中心朝向外側的方向呈傾斜的方式(參照圖31),使斜向龜裂的延伸方向CD成為正方向CD1。As shown in FIG. 40( b ), in the first machining, the rotational direction of the
針對在此之斜向龜裂的形成方法,具體地說明。亦即,在第1加工,如圖41所示般,是將對象物11中之與雷射光L1的入射面、即第1面11a交叉之Z方向上之聚光區域C1的位置設定為第1Z位置Z1,並沿著線A(X方向)讓聚光區域C1相對移動,藉此將改質區域(第1改質區域)12a及從改質區域12a延伸的龜裂(第1龜裂)13a形成於對象物11 (第1形成)。在該第1形成,將沿著第1面11a且與X方向交叉之Y方向上之聚光區域C1的位置設定為第1Y位置Y1。The formation method of the diagonal crack here is demonstrated concretely. That is, in the first processing, as shown in FIG. 41 , the position of the light-condensing region C1 in the Z direction intersecting with the incident surface of the laser light L1 in the
又在第1加工,是將Z方向上之雷射光L2之聚光區域C2的位置設定為比在第1形成之聚光區域C1的第1Z位置Z1更靠第1面11a(入射面)側的第2Z位置Z2,並沿著線A(X方向)讓聚光區域C2相對移動,藉此將改質區域12b(第2改質區域)及從改質區域12b延伸的龜裂(第2龜裂)13b形成(第2形成)。在該第2形成,是將Y方向上之聚光區域C2的位置設定為從聚光區域C1的第1Y位置Y1移位後之第2Y位置Y2。又在第2形成,是讓雷射光L2調變,而使在包含Y方向及Z方向之YZ面S內之聚光區域C2的光束形狀,在至少比聚光區域C2的中心更靠第1面11a側成為朝該移位的方向傾斜之傾斜形狀(從Z方向觀察時之聚光區域C2的光束形狀為第1形狀Q1)。藉此,在YZ面S內以朝該移位的方向傾斜的方式形成龜裂13。關於在YZ面S內之光束形狀的控制,是像在與上述斜向龜裂有關的認識所說明的那樣。Furthermore, in the first processing, the position of the condensing region C2 of the laser light L2 in the Z direction is set to be closer to the
又在此,在第1形成也是與第2形成同樣的,是讓雷射光L1調變,而在包含Y方向及Z方向之YZ面S內之聚光區域C1的光束形狀,在至少比聚光區域C1的中心更靠第1面11a側成為朝該移位的方向傾斜之傾斜形狀(在此情況也是,從Z方向觀察時之聚光區域C1的光束形狀為第1形狀Q1)。藉由以上操作,如圖41(b)所示般,在線A的第1區域A1,使龜裂13a和龜裂13b相連,而形成橫跨改質區域12a,12b傾斜地延伸之龜裂13(斜向龜裂13F)。斜向龜裂13F是到達或未到達對象物11的第2面11b皆可(能夠按照所要求的加工態樣而適宜地設定)。Here, in the first formation, similarly to the second formation, the laser light L1 is modulated, and the beam shape of the light-converging region C1 in the YZ plane S including the Y-direction and the Z-direction is at least higher than the condensing region C1. The center of the light area C1 has an inclined shape inclined in the direction of the displacement further on the
例如可在空間光調變器7顯示用於將雷射光L分支的圖案而將雷射光L調變,藉此將雷射光L分支成2束而產生雷射光L1,L2。在此情況,變成第1形成和第2形成同時實施。但雷射光L1,L2亦可為不同的雷射光,在此情況,第1形成和第2形成是在不同的時點進行。又聚光區域C1,C2分別是相當於雷射光L的聚光區域C之雷射光L1,L2的聚光區域。For example, the spatial
另一方面,在本實施形態,一邊讓載台2旋轉,一邊藉由控制部6將雷射光L之照射的ON/OFF進行切換,如圖42(a)所示般,沿著線A中的第2區域A2讓聚光區域C相對移動而形成改質區域12,並讓在線A之第2區域A2以外的區域(第1區域A1)之改質區域12的形成停止(第2加工)。On the other hand, in the present embodiment, while the
如圖42(b)所示般,在第2加工,基於控制部6對移動部4的控制而控制載台2之旋轉方向,藉此使加工進展方向ND成為順方向ND1。亦即,在第1加工和第2加工之間,加工進展方向ND的順逆(是成為順方向ND1或成為逆方向ND2)被切換。又在第2加工,因為是第2區域A2的加工,基於控制部6之控制來進行基於空間光調變器7之雷射光L的成形,藉此使聚光區域C的光束形狀成為第2形狀Q2。再者,在此,以隨著朝向第2面11b而相對於Z方向從對象物11的中心朝向外側的方向呈傾斜的方式(參照圖31),使斜向龜裂的延伸方向CD成為正方向CD1。As shown in FIG. 42( b ), in the second machining, the rotational direction of the
針對在此之斜向龜裂的形成方法,具體地說明。亦即,在第2加工,如圖43(a)所示般,是將對象物11中之與雷射光L1的入射面、即第1面11a交叉之Z方向上之聚光區域C1的位置設定為第1Z位置Z1,並沿著線A(X方向)讓聚光區域C1相對移動,藉此將改質區域(第1改質區域)12a及從改質區域12a延伸的龜裂(第1龜裂)13a形成於對象物11 (第1形成)。在該第1形成,將沿著第1面11a且與X方向交叉之Y方向上之聚光區域C1的位置設定為第1Y位置Y1。The formation method of the diagonal crack here is demonstrated concretely. That is, in the second processing, as shown in FIG. 43( a ), the position of the condensing region C1 in the Z direction intersecting with the incident surface of the laser light L1 in the
又在第2形成,是將Z方向上之雷射光L2之聚光區域C2的位置設定為比在第1形成之聚光區域C1的第1Z位置Z1更靠第1面11a(入射面)側的第2Z位置Z2,並沿著線A(X方向)讓聚光區域C2相對移動,藉此將改質區域12b(第2改質區域)及從改質區域12b延伸的龜裂(第2龜裂)13b形成(第2形成)。在該第2形成,是將Y方向上之聚光區域C2的位置設定為從聚光區域C1的第1Y位置Y1移位後之第2Y位置Y2。又在第2形成,是讓雷射光L2調變,而使在包含Y方向及Z方向之YZ面S內之聚光區域C2的光束形狀,在至少比聚光區域C2的中心更靠第1面11a側成為朝該移位的方向傾斜之傾斜形狀(從Z方向觀察時之聚光區域C2的光束形狀為第2形狀Q2)。藉此,在YZ面S內以朝該移位的方向傾斜的方式形成龜裂13。In the second formation, the position of the condensing region C2 of the laser light L2 in the Z direction is set to be closer to the
又在此,在第1形成也是與第2形成同樣的,是讓雷射光L1調變,而在包含Y方向及Z方向之YZ面S內之聚光區域C1的光束形狀,在至少比聚光區域C1的中心更靠第1面11a側成為朝該移位的方向傾斜之傾斜形狀(在此情況也是,從Z方向觀察時之聚光區域C1的光束形狀為第2形狀Q2)。藉由以上操作,如圖43(b)所示般,在線A的第2區域A2,使龜裂13a和龜裂13b相連,而形成橫跨改質區域12a,12b傾斜地延伸之龜裂13(斜向龜裂13F)。龜裂13是到達或未到達對象物11的第2面11b皆可(能夠按照所要求的加工態樣而適宜地設定)。又用於使光束形狀成為傾斜形狀的調變圖案是如以上所述般。Here, in the first formation, similarly to the second formation, the laser light L1 is modulated, and the beam shape of the light-converging region C1 in the YZ plane S including the Y-direction and the Z-direction is at least higher than the condensing region C1. The center of the light area C1 has an inclined shape inclined in the direction of the displacement further on the
亦即,在此的調變圖案,可包含用於對雷射光L賦予彗形像差之彗形像差圖案,在至少第2形成,控制部6係控制基於彗形像差圖案之彗形像差的大小,藉此進行用於使聚光區域C2的光束形狀成為傾斜形狀之第1圖案控制。如上述般,對雷射光L賦予彗形像差,是與球面像差修正圖案的偏置同義。That is, the modulation pattern here may include a coma aberration pattern for imparting coma aberration to the laser light L, and in at least the second formation, the
因此,在此的調變圖案,亦可包含用於修正雷射光L的球面像差之球面像差修正圖案Ps,在至少第2形成,控制部6係相對於聚光透鏡33之入瞳面33a的中心讓球面像差修正圖案Ps的中心Pc朝Y方向偏置,藉此進行用於使聚光區域C2的光束形狀成為傾斜形狀之第2圖案控制。Therefore, the modulation pattern here may include a spherical aberration correction pattern Ps for correcting the spherical aberration of the laser light L, which is formed at least in the second, and the
或是亦可為,在第2形成,控制部6係在空間光調變器7上顯示關於沿著X方向的軸線Ax呈非對稱的調變圖案,藉此進行用於使聚光區域C2的光束形狀成為傾斜形狀之第3圖案控制。作為關於軸線Ax呈非對稱的調變圖案,可以是包含格柵圖案Ga的調變圖案PG1~PG4,也可以是包含橢圓圖案Es,Ew的調變圖案PE(或是包含雙方亦可)。Alternatively, in the second formation, the
亦即,在此的調變圖案,亦可包含用於使在XY面內之聚光區域C的光束形狀成為以X方向為長邊之橢圓形狀之橢圓圖案Es,Ew,在第2形成,控制部6以使橢圓圖案Es,Ew的強度關於沿著X方向的軸線Ax成為非對稱的方式在空間光調變器7顯示調變圖案PE,藉此進行用於使聚光區域C2的光束形狀成為傾斜形狀之第4圖案控制。That is, the modulation pattern here may include elliptical patterns Es, Ew for making the beam shape of the condensing region C in the XY plane an elliptical shape with the X direction as the long side, and are formed in the second, The
再者亦可為,在第2形成,控制部6係在空間光調變器7顯示用於在YZ面S內形成沿著該移位的方向排列之複數個聚光區域C的調變圖案(例如上述的錐鏡圖案PA),藉此進行用於使聚光區域C的光束形狀成為傾斜形狀之第5圖案控制。上述各種圖案可任意地組合並重疊。亦即,控制部6可將第1圖案控制~第5圖案控制任意組合來實行。Furthermore, in the second formation, the
又第1形成和第2形成可同時實施(多焦點加工),亦可依序實施(單道次加工)。亦即,控制部6,對於線A之例如第1區域A1,可在實施第1形成之後,再實施第2形成。或是亦可為,控制部6係在空間光調變器7顯示包含用於讓雷射光L分支成雷射光L1,L2的分支圖案之調變圖案,藉此對於設定在對象物11的線A之例如第1區域A1,將第1形成和第2形成同時實施。Furthermore, the first formation and the second formation may be performed simultaneously (multi-focus processing) or sequentially (single-pass processing). That is, the
接著,在本實施形態,係進行對象物11的第2部分15B(參照圖31)的加工。在第2部分15B,不須形成斜向龜裂,在此是形成垂直龜裂。因此,第2部分15B的加工,是藉由與上述修整加工同樣的加工,來形成改質區域12c,12d及從改質區域12c,12d延伸的龜裂(垂直龜裂)13c,13d(參照圖45)。在此情況,在第2部分15B,不須在第1區域A1和第2區域A2將加工進展方向ND的順逆切換,而進行第1加工及第2加工。Next, in the present embodiment, processing of the
但在上述修整加工,為了抑制修整面的品質降低,在第1區域A1的加工時使光束形狀成為第1形狀Q1(第1加工),在第2區域A2的加工時使光束形狀成為第2形狀Q2(第2加工),但在第2部分15B亦可為,以使聚光區域C的長邊方向NH沿著加工進展方向ND(相對於加工進展方向ND不傾斜)的方式,在第1區域A1和第2區域A2的邊界不進行雷射光L之照射的ON・OFF而在線A全體連續地讓聚光區域C相對移動來形成改質區域12c,12d及龜裂13c,13d。亦即,在第2部分15B,也能進行與第1加工及第2加工不同的其他加工。或是亦可為,在第2部分15B,不進行加工進展方向ND的切換,作為其他加工係進行第1Z加工及第2Z加工。在第1Z加工,係沿著線A中的第1區域A1讓聚光區域C相對移動,藉此沿著第1區域A1形成改質區域12c,12d,並形成從該改質區域12c,12d沿著Z方向延伸的龜裂13c,13d;在第2Z加工,係沿著線A中的第2區域A2讓聚光區域C相對移動,藉此沿著第2區域A2形成改質區域12c,12d,並形成從該改質區域12c,12d沿著Z方向延伸的龜裂13c,13d。在此情況,在第1Z加工及第2Z加工,能夠與第1加工及第2加工同樣的,以從Z方向觀察時使聚光區域C具有長邊方向NH的方式,且使該長邊方向NH以接近第1結晶方位K1及第2結晶方位K2當中與加工進展方向ND之間的角度較大之一方的朝向相對於加工進展方向ND傾斜的方式,將雷射光L進行成形。However, in the above trimming process, in order to suppress deterioration of the quality of the trimmed surface, the beam shape is set to the first shape Q1 (first process) during the process of the first area A1, and the beam shape is set to the second shape during the process of the second area A2 Shape Q2 (second processing), but in the
藉由以上的加工,如圖44及圖45所示般,在線A的全體且在Z方向的大致全體,在對象物11形成改質區域12及龜裂13。特別是如圖45所示般,在第1部分15A形成了龜裂13a,13b,龜裂13a,13b是以隨著從對象物11的第1面11a朝向第2面11b而從對象物11之裝置層110和對象物11R之裝置層110R之接合區域的內側的位置朝向該接合區域之外緣110e的方式傾斜。又龜裂13c,13d可以不相連續而分離,也可以相連續。再者,龜裂13b和龜裂13c可以不相連續而分離,也可以相連續。By the above processing, as shown in FIGS. 44 and 45 , the modified
接著,與上述修整加工同樣的,進行除去處理。具體而言,不讓載台2旋轉,在除去區域E照射雷射光L,並讓照射部3沿著X方向移動,使該雷射光L的聚光區域C對於對象物11在X方向相對移動。在讓載台2旋轉90˚之後,在除去區域E照射雷射光L,並讓照射部3沿著X方向移動,而使該雷射光L的聚光區域C對於對象物11在X方向相對移動。Next, a removal process is performed in the same manner as the above-mentioned trimming process. Specifically, the laser beam L is irradiated on the removal area E without rotating the
藉此,如圖46所示般,沿著從Z方向觀察時以將除去區域E四等分的方式延伸之線來形成改質區域12及從改質區域12延伸的龜裂13。然後,如圖47(a)所示般,藉由例如治具或氣體,以改質區域12為邊界將除去區域E去除。藉此,從對象物11讓半導體裝置11K形成,而獲得包含半導體裝置11K之對象物100K。As a result, as shown in FIG. 46 , the modified
接著,將半導體裝置11K從第1面11a側進行磨削。在此,將第2部分15B除去,並將第1部分15A的一部分除去。第1部分15A之被除去的一部分,是形成有改質區域12a,12b的部分。因此,第1部分15A之存留的剩餘部分並不包含改質區域12a,12b。在利用蝕刻將對象物11剝離的情況,可將該研磨簡化。以上操作的結果,讓半導體裝置11M形成,而獲得包含半導體裝置11M之對象物100M。Next, the
對於以上之本實施形態的雷射加工,以雷射加工裝置1之構成的形式做說明。亦即,雷射加工裝置1,係用於對對象物11照射雷射光L(雷射光L1,L2)來形成改質區域12,其係至少具備:用於支承對象物11之載台2、用於朝向由載台2支承的對象物11照射雷射光L之照射部3、用於讓雷射光L的聚光區域C(聚光區域C1,C2)對於對象物11相對移動之移動部4,5、以及用於控制移動部4,5及照射部3之控制部6。照射部3具有空間光調變器7,空間光調變器7是以從Z方向觀察時使聚光區域C具有長邊方向NH的方式將雷射光L成形。The laser processing of the present embodiment described above will be described in terms of the configuration of the
而且,控制部6係實行第1加工處理(上述第1加工),在第1加工處理,係控制照射部3及移動部4,5,沿著線A中的第1區域A1讓聚光區域C(聚光區域C1,C2)相對移動,藉此沿著第1區域A1在對象物11形成改質區域12(改質區域12a,12b),並形成從該改質區域12朝向與對象物11的入射面、即第1面11a為相反側之第2面11b且相對於Z方向傾斜地延伸之斜向龜裂13F。Then, the
再者,控制部6係實行第2加工處理(上述第2加工),在第2加工處理,係控制照射部3及移動部4,5,沿著線A中的第2區域A2讓聚光區域C(聚光區域C1,C2)相對移動,藉此沿著第2區域A2在對象物11形成改質區域12(改質區域12a,12b),並形成從改質區域12朝向第2面11b延伸的斜向龜裂13F(龜裂13a,13b)。Furthermore, the
在第1加工處理及第2加工處理,控制部6係控制空間光調變器7,以從Z方向觀察時使聚光區域C具有長邊方向NH的方式,且使該聚光區域C的長邊方向NH以接近第1結晶方位K1及第2結晶方位K2當中與聚光區域C的移動方向、即加工進展方向ND之間的角度較大之一方的朝向相對於加工進展方向ND呈傾斜的方式,將雷射光L成形。又在第1加工處理及第2加工處理,控制部6藉由控制移動部4,5,從Z方向觀察時,以長邊方向NH之傾斜的朝向相對於加工進展方向ND是和斜向龜裂13F的延伸方向成為同一側的方式,將加工進展方向ND的順逆在第1加工處理和第2加工處理進行切換。In the first processing and the second processing, the
接下來,對於以上之本實施形態的雷射加工,以雷射加工方法之工序的形式做說明。亦即,本實施形態的雷射加工方法,係用於對對象物11照射雷射光L(雷射光L1,L2)來形成改質區域12,其係具有第1加工工序(上述第1加工),在第1加工工序,係沿著設定在對象物11之線A中的第1區域A1讓聚光區域C(聚光區域C1,C2)相對移動,藉此沿著第1區域A1在對象物11形成改質區域12(改質區域12a,12b),並形成從該改質區域12朝向與對象物11的入射面、即第1面11a為相反側的第2面11b且相對於Z方向傾斜地延伸之斜向龜裂13F(龜裂13a,13b)。Next, the laser processing of the present embodiment described above will be described in terms of steps of the laser processing method. That is, the laser processing method of the present embodiment is for irradiating the
又本實施形態的雷射加工方法係具有第2加工工序(上述第2加工),在第2加工工序,係沿著線A中的第2區域A2讓聚光區域C(聚光區域C1,C2)相對移動,藉此沿著第2區域A2在對象物11形成改質區域12(改質區域12a,12b),並形成從改質區域12朝向第2面11b延伸的斜向龜裂13F(龜裂13a,13b)。Furthermore, the laser processing method of the present embodiment includes a second processing step (the above-mentioned second processing), and in the second processing step, the light-converging region C (light-converging region C1, C2) Relative movement, whereby the modified region 12 (modified
在第1加工工序及第2加工工序,是以從Z方向觀察時使聚光區域C具有長邊方向NH的方式,且使聚光區域C的長邊方向NH以接近第1結晶方位K1及第2結晶方位K2當中與聚光區域C之移動方向、即加工進展方向ND之間的角度較大之一方的朝向相對於加工進展方向ND傾斜的方式,將雷射光L成形。又在第1加工工序及第2加工工序,從Z方向觀察時,以長邊方向NH之傾斜的朝向相對於加工進展方向ND是和斜向龜裂13F的延伸方向成為同一側的方式,將加工進展方向ND的順逆在第1加工工序和第2加工工序進行切換。In the first processing step and the second processing step, the long-side direction NH of the light-converging region C is made to be close to the first crystal orientation K1 and The laser beam L is shaped so that the direction of the larger angle between the second crystal orientation K2 and the moving direction of the light-converging region C, that is, the machining progress direction ND, is inclined with respect to the machining progress direction ND. Furthermore, in the first processing step and the second processing step, when viewed from the Z direction, the direction of the inclination of the longitudinal direction NH is on the same side as the extending direction of the
如以上所說明般,在本實施形態的雷射加工裝置1及雷射加工方法,對象物11具有結晶構造,該結晶構造包含:(100)面、一個(110)面、另一個(110)面、與一個(110)面正交的第1結晶方位K1、及與另一個(110)面正交的第2結晶方位K2。而且,在此,在沿著讓雷射光L的聚光區域C相對移動之線A中的第1區域A1在對象物11形成改質區域12的情況(第1加工處理、第1加工工序)、及沿著該線A中的第2區域A2在對象物11形成改質區域12的情況(第2加工處理、第2加工工序)各個,使聚光區域C的長邊方向NH以接近第1結晶方位K1及第2結晶方位K2當中與加工進展方向ND之間的角度較大之一方的朝向相對於加工進展方向ND傾斜的方式,將雷射光L成形。因此,可抑制修整面的品質降低。As described above, in the
另一方面,在本實施形態的雷射加工裝置1及雷射加工方法,在第1加工處理及第2加工處理(第1加工工序及第2加工工序也是同樣的(以下相同))中,形成從改質區域12朝向對象物11的第2面11b且相對於Z方向(與入射面交叉的方向)傾斜地延伸之斜向龜裂13F。因此,必須考慮該斜向龜裂13F的延伸方向和聚光區域C之長邊方向NH的朝向之關係。而且,在本實施形態的雷射加工裝置1及雷射加工方法,從Z方向觀察時,以長邊方向NH之傾斜的朝向相對於加工進展方向ND是和斜向龜裂13F之延伸側成為同一側的方式,將加工進展方向ND的順逆在第1加工處理和第2加工處理進行切換。On the other hand, in the
結果,在第1區域A1及第2區域A2雙方,相對於加工進展方向ND使聚光區域C之長邊方向NH之傾斜的朝向與斜向龜裂13F之延伸側成為同一側。如此,聚光區域C之長邊方向NH的朝向和斜向龜裂13F的傾斜方向之關係成為可獲得相對良好的品質之組合,而能夠抑制品質降低。如此般,依據本實施形態的雷射加工裝置1及雷射加工方法,能夠在抑制對象物11之修整面的品質降低的狀態下形成斜向龜裂。As a result, in both the first area A1 and the second area A2, the direction of the inclination of the longitudinal direction NH of the light-converging area C with respect to the machining progress direction ND is made the same side as the extending side of the
又在本實施形態的雷射加工裝置1亦可為,對象物11係包含:沿著Z方向從第2面11b側起依序排列之第1部分15A及第2部分15B。而且,控制部6對於第1部分15A,是將加工進展方向ND的順逆切換而實行第1加工處理及第2加工處理,對於第2部分15B,不進行加工進展方向ND的切換而實行第1加工處理及第2加工處理,對第2部分15B形成改質區域12(改質區域12c,12d)及從該改質區域12沿著Z方向延伸的龜裂13(龜裂13c,13d)。在此情況,在形成沿著Z方向的龜裂13之第2部分15B,在第1加工處理和第2加工處理並不進行加工進展方向ND的順逆之切換。因此,相較於在第1加工處理和第2加工處理將加工進展方向ND的順逆切換的情況,可減少與雷射光L之聚光區域C之相對移動的加減速有關的時間。In the
或是,在本實施形態的雷射加工裝置1亦可為,控制部6對於第1部分15A,是將加工進展方向ND的順逆切換而實行第1加工處理及第2加工處理,對於第2部分15B,是實行與第1加工處理及第2加工處理不同的其他加工處理(其他加工)。在其他加工處理,控制部6係控制照射部3及移動部4,5,在線A的全體將加工進展方向ND的順逆設為相同且讓聚光區域C沿著線A相對移動,藉此沿著線A在對象物11形成改質區域12及從該改質區域12沿著Z方向延伸的龜裂13。在此情況,相較於在第2部分15B也在線A的第1區域A1和第2區域A2將加工進展方向ND的順逆切換的情況,可減少與雷射光L之聚光區域C之相對移動的加減速有關的時間。Alternatively, in the
又在本實施形態的雷射加工裝置1亦可為,在其他加工處理,控制部6藉由控制空間光調變器7,以從Z方向觀察時使聚光區域C具有長邊方向NH的方式,且使該聚光區域C的長邊方向NH沿著加工進展方向ND的方式,將雷射光L成形。在此情況,相較於在形成沿著Z方向的龜裂13之第2部分15B,以在線A之第1區域A1的加工和第2區域A2的加工之間使雷射光L之聚光區域C的傾斜變化的方式進行雷射光L的成形的情況,可簡化控制部6的處理。Furthermore, in the
又在本實施形態的雷射加工裝置1亦可為,對象物11係包含與其他構件(對象物11R)接合之接合區域,在第1加工處理及第2加工處理,控制部6是形成以隨著從第1面11a朝向第2面11b而從接合區域之內側的位置朝向接合區域之外緣11e的方式傾斜之斜向龜裂13F。在此情況,以斜向龜裂13F為邊界而將對象物11的一部分從對象物11除去,讓對象物11的剩餘部分存留的情況,可避免超越對象物11之與其他構件的接合區域而使對象物11的剩餘部分往外側延伸。In addition, in the
又在本實施形態的雷射加工裝置1亦可為,在第1加工處理及第2加工處理,控制部6係實行第1形成處理(上述第1形成)及第2形成處理(上述第2形成),在第1形成處理,係將Z方向上之聚光區域C1的位置設定成第1Z位置Z1,並沿著線A讓聚光區域C1相對移動,藉此將改質區域12a及從改質區域12a延伸的龜裂13a形成於對象物11;在第2形成處理,係將Z方向上之聚光區域C2的位置設定成比第1Z位置Z1更靠第1面11a側之第2Z位置Z2,並沿著線A讓聚光區域C2相對移動,藉此形成改質區域12b及從改質區域12b延伸的龜裂13b。Furthermore, in the
在第1形成處理,控制部6係將與加工進展方向ND及Z方向交叉的Y方向上之聚光區域C1的位置設定成第1Y位置Y1,在第2形成處理,控制部6係將Y方向上之聚光區域C2的位置設定成從第1Y位置Y1移位後的第2Y位置Y2,並藉由空間光調變器7的控制,使在包含Y方向及Z方向之YZ面S內之聚光區域C2的形狀,在至少比聚光區域C2的中心更靠第1面11a側成為朝移位方向傾斜之傾斜形狀的方式將雷射光L2成形,藉此在YZ面S內以朝移位方向傾斜的方式形成龜裂13b。如此,能夠適當地形成相對於Z方向傾斜之斜向龜裂。In the first forming process, the
又在本實施形態的雷射加工裝置1亦可為,照射部3係包含:用於將來自空間光調變器7的雷射光L朝向對象物11聚光之聚光透鏡33,在第2形成處理,控制部6係控制在空間光調變器7所顯示的調變圖案,以使聚光區域C的形狀成為傾斜形狀的方式將雷射光L調變,藉此將雷射光L成形。在此情況,能夠利用空間光調變器7而輕易地將雷射光L成形。In the
這時,在本實施形態的雷射加工裝置1亦可為,調變圖案係包含:用於對雷射光L賦予彗形像差之彗形像差圖案,在第2形成處理,控制部6藉由控制基於彗形像差圖案之彗形像差的大小,來進行用於使聚光區域C的形狀成為傾斜形狀之第1圖案控制。依據本發明人的認識,在此情況,在YZ面S內之聚光區域C的形狀形成為弧狀。亦即,在此情況,聚光區域C的形狀,在比聚光區域C的中心Ca更靠第1面11a(入射面)側是朝移位方向傾斜,在比聚光區域C的中心Ca更靠入射面的相反側是朝與移位方向相反的方向傾斜。在此情況也是,可形成朝移位方向傾斜的斜向龜裂13F。In this case, in the
又在本實施形態的雷射加工裝置1亦可為,對象物11係包含:沿著Z方向從第2面11b側起依序排列的第1部分15A及第2部分15B。而且,控制部6,作為其他加工處理係實行第1Z加工處理(上述第1Z加工)及第2Z加工處理(上述第2Z加工),在第1Z加工處理,對於第1部分15A,係將加工進展方向ND的順逆切換而實行第1加工處理及第2加工處理,對於第2部分15B,不進行加工進展方向ND的切換,藉由控制照射部3及移動部4,5,沿著線A中的第1區域A1讓聚光區域C相對移動,藉此沿著第1區域A1在對象物11形成改質區域12,並形成從該改質區域12沿著Z方向延伸的龜裂13;在第2Z加工處理,藉由控制照射部3及移動部4,5,沿著線A中的第2區域A2讓聚光區域C相對移動,藉此沿著第2區域A2在對象物11形成改質區域12,並形成從該改質區域12沿著Z方向延伸的龜裂13。在此情況,相較於在第2部分15B也在第1區域A1和第2區域A2將聚光區域C的長邊方向NH按照加工進展方向ND來設定,且在第1區域A1和第2區域A2將加工進展方向ND的順逆切換的情況,可減少與雷射光L之聚光區域C之相對移動的加減速有關的時間。Furthermore, in the
又在本實施形態的雷射加工裝置1亦可為,調變圖案係包含用於修正雷射光L的球面像差之球面像差修正圖案,在第2形成處理,控制部6係相對於聚光透鏡33之入瞳面33a的中心讓球面像差修正圖案Ps的中心朝Y方向偏置,藉此進行用於使聚光區域C的形狀成為傾斜形狀之第2圖案控制。依據本發明人的認識,在此情況也是,與利用彗形像差圖案的情況同樣的,能夠使在YZ面S內之聚光區域C的形狀形成為弧狀,可形成朝移位方向傾斜的斜向龜裂13F。In the
又本實施形態的雷射加工裝置1亦可為,在第2形成處理,控制部6係藉由讓關於沿著加工進展方向ND之軸線呈非對稱的調變圖案顯示於空間光調變器7,來進行用於使聚光區域C的形狀成為傾斜形狀之第3圖案控制。依據本發明人的認識,在此情況,能夠使在YZ面S內之聚光區域C的形狀全體朝移位方向傾斜。在此情況也是,可形成朝移位方向傾斜的斜向龜裂13F。In the
又在本實施形態的雷射加工裝置1亦可為,調變圖案係包含用於使XY面內之聚光區域C的形狀成為以X方向為長邊的橢圓形狀之橢圓圖案,XY面係包含與Y方向及Z方向交叉的X方向和Y方向;在第2形成處理,控制部6係以使橢圓圖案的強度成為關於沿著X方向之軸線呈非對稱的方式讓調變圖案顯示於空間光調變器7,藉此進行用於使光束形狀成為傾斜形狀之第4圖案控制。依據本發明人的認識,在此情況也是,能夠使在YZ面S內之聚光區域C的形狀形成為弧狀,可形成朝移位方向傾斜的斜向龜裂13F。Furthermore, in the
又在本實施形態的雷射加工裝置1亦可為,在第2形成處理,控制部6係讓用於形成在YZ面S內沿著移位方向排列之複數個雷射光L的聚光點CI之調變圖案顯示於空間光調變器7,藉此進行用於使包含複數個聚光點CI之聚光區域C的形狀成為傾斜形狀之第5圖案控制。依據本發明人的認識,在此情況也是,可形成朝移位方向傾斜的斜向龜裂13F。
[雷射加工之第2實施形態]Furthermore, in the
接下來,針對在修整加工時進行斜向龜裂的形成之雷射加工的其他實施形態做說明。圖48係顯示一實施形態的雷射加工之對象物。如圖48所示般,本實施形態的雷射加工之對象物,與第1實施形態同樣的,是與對象物11R貼合而構成對象物100之對象物11。但在本實施形態,線A中之第1區域A1及第2區域A2的角度範圍是與第1實施形態不同。Next, another embodiment of laser processing for forming oblique cracks at the time of dressing processing will be described. FIG. 48 shows an object of laser processing according to an embodiment. As shown in FIG. 48 , the object of the laser processing of the present embodiment is the
在第1實施形態,作為一例,第1區域A1和第2區域A2的邊界設定在容易發生修整面的品質降低之45˚或-45˚的點。這是根據以下的認識。亦即,在第1實施形態,縱使在容易發生品質降低之45˚,-45˚的點,只要調整加工進展方向ND的順逆,在45˚,-45˚的點之加工時相對於加工進展方向ND使聚光區域C之長邊方向NH之傾斜的朝向和斜向龜裂13F的延伸方向成為同一側,就能抑制品質降低。In the first embodiment, as an example, the boundary between the first area A1 and the second area A2 is set at a point of 45° or -45° at which quality degradation of the trimmed surface is likely to occur. This is based on the following understanding. That is, in the first embodiment, even at the points of 45° and -45°, where quality degradation is likely to occur, as long as the forward and reverse directions of the processing progress direction ND are adjusted, the processing at the points of 45° and -45° is relative to the processing progress. In the direction ND, the direction of the inclination of the longitudinal direction NH of the light-converging region C and the extending direction of the
另一方面,如圖38的表所示般,例如,當將第1區域A1及第2區域A2加工時之加工進展方向ND皆設為順方向ND1的情況(參照從上方起第1個及第3個表),在-45˚點,在聚光區域C的光束形狀設為第1形狀Q1時(參照從上方起第3個表)雖可見品質降低,但在設為第2形狀Q2時(參照從上方起第1個表)可獲得良好的品質,且縱使在-50˚點依然能獲得良好的品質。On the other hand, as shown in the table of FIG. 38 , for example, when the machining progress direction ND when machining the first area A1 and the second area A2 is both the forward direction ND1 (refer to the first and second from the top). Table 3), at -45°, when the beam shape of the condensing region C is set to the first shape Q1 (refer to the third table from the top), the quality is degraded, but when the beam shape is set to the second shape Q2 (refer to the first table from the top), good quality can be obtained, and even at -50° point, good quality can be obtained.
因此,縱使將第1區域A1及第2區域A2加工時之加工進展方向ND統一為順方向ND1,只要在0˚~-50˚左右的角度範圍之加工時將聚光區域C的光束形狀設為第2形狀Q2,且在-50˚~-90˚左右的角度範圍之加工時將聚光區域C的光束形狀設為第1形狀Q1,則在全部的角度範圍都能獲得良好的加工品質。實際上,參照圖49的表可知,藉由將條件IR7和條件IR8並用,可在全部的角度範圍獲得良好的加工品質。Therefore, even if the processing progress direction ND during processing of the first area A1 and the second area A2 is unified as the forward direction ND1, as long as the beam shape of the condensing area C is set during processing in the angular range of 0° to -50° It is the second shape Q2, and the beam shape of the condensing area C is set to the first shape Q1 during processing in the angular range of -50° to -90°, so that good processing quality can be obtained in the entire angular range. . In fact, referring to the table of FIG. 49 , it can be seen that by using the condition IR7 and the condition IR8 in combination, good processing quality can be obtained in the entire angle range.
再者,例如,當將第1區域A1及第2區域A2加工時之加工進展方向ND皆設為逆方向ND2的情況(參照從上方起第2個及第4個表),在-45˚點,與順方向D1的例相反,在將聚光區域C的光束形狀設為第2形狀Q2時(參照從上方起第2個表)雖可見品質降低,但在設為第1形狀Q1時(參照從上方起第4個表)可獲得良好的品質,且縱使在-40˚點依然能獲得良好的品質。Furthermore, for example, when the machining progress direction ND when machining the first area A1 and the second area A2 is both the reverse direction ND2 (refer to the second and fourth tables from the top), at -45° In contrast to the example in the forward direction D1, when the beam shape of the condensing region C is set to the second shape Q2 (refer to the second table from the top), the quality is degraded, but when the first shape Q1 is set (Refer to the 4th table from the top) Good quality can be obtained, and good quality can be obtained even at the -40° point.
因此,縱使將第1區域A1及第2區域A2加工時之加工進展方向ND統一為逆方向ND2,只要在0˚~-40˚左右的角度範圍加工時將聚光區域C的光束形狀設為第2形狀Q2,且在-40˚~-90˚左右的角度範圍加工時將聚光區域C的光束形狀設為第1形狀Q1,則在全部的角度範圍都能獲得良好的加工品質。實際上,參照圖50的表可知,藉由將條件IR9條件IR10並用,可在全部的角度範圍獲得良好的加工品質。Therefore, even if the machining progress direction ND during machining of the first area A1 and the second area A2 is unified as the reverse direction ND2, the beam shape of the condensing area C is set as In the second shape Q2, when machining in an angle range of about -40° to -90°, the beam shape of the condensing region C is set to the first shape Q1, so that good machining quality can be obtained in the entire angle range. Actually, referring to the table of FIG. 50 , it can be seen that by using the condition IR9 and the condition IR10 in combination, good processing quality can be obtained in the entire angle range.
亦即,使聚光區域C的長邊方向NH以接近第1結晶方位K1及第2結晶方位K2當中與加工進展方向ND之間的角度較大之一方的朝向相對於加工進展方向ND傾斜的方式將雷射光L成形,而在此前提下,當在第1區域A1的加工(上述第1加工)和第2區域A2的加工(上述第2加工)將加工進展方向的順逆設定為相同的情況,只要以在第1區域A1及第2區域A2中,使長邊方向NH之傾斜的朝向相對於加工進展方向ND是和斜向龜裂13F的延伸側成為同一側之一方包含45˚點(上述例子為-45˚點)的方式,設定第1區域A1和第2區域A2的邊界,就能在全部的角度範圍都獲得良好的加工品質。That is, the longitudinal direction NH of the light-condensing region C is inclined with respect to the machining advancement direction ND in the direction close to the larger angle between the first crystal orientation K1 and the second crystal orientation K2 and the machining advancement direction ND. The laser beam L is shaped in such a way that the forward and reverse directions of the processing progress directions are set to be the same in the processing of the first area A1 (the above-mentioned first processing) and the processing of the second area A2 (the above-mentioned second processing). In the first area A1 and the second area A2, as long as the direction of the inclination of the longitudinal direction NH is the same side as the extension side of the
本實施形態的雷射加工,是根據以上的認識所進行的。亦即,在本實施形態的雷射加工,如圖48所示般,第1區域A1和第2區域A2的邊界Ks設定成,使長邊方向NH之傾斜的朝向相對於加工進展方向ND是和斜向龜裂13F的延伸側成為同一側之一方包含45˚點(在上述例子為-45˚點)。在圖示的例子,加工進展方向ND設為順方向ND1,以使第2區域A2包含45˚點的方式設定邊界Ks。The laser processing of this embodiment is performed based on the above knowledge. That is, in the laser processing of the present embodiment, as shown in FIG. 48 , the boundary Ks of the first area A1 and the second area A2 is set so that the direction of the inclination of the longitudinal direction NH with respect to the processing progress direction ND is The 45° point (-45° point in the above example) is included in the same side as the extension side of the
特別是,在此,相較於第1實施形態,第1區域A1縮小約5˚分量而成為0˚~40˚左右之約40˚分量的圓弧,第2區域A2擴大約5˚分量而成為40˚~90˚左右之約50˚分量的圓弧,因此第2區域A2比第1區域A1長約10˚分量。第1區域A1及第2區域A2各個的加工,除了加工進展方向ND統一為順方向ND1(或逆方向ND2)這點以外,是與上述第1加工及第2加工(進而第1形成及第2形成)同樣地實施。In particular, compared with the first embodiment, the first area A1 is reduced by about 5° and becomes an arc of about 40°, which is about 0° to 40°, and the second area A2 is enlarged by about 5°. Since it becomes an arc of about 50° component of about 40° to 90°, the second area A2 is longer than the first area A1 by about 10° component. The processing of each of the first area A1 and the second area A2 is the same as the above-mentioned first processing and second processing (further the first forming and 2 Forming) is implemented in the same way.
針對以上之本實施形態的雷射加工,以雷射加工裝置1之構成的形式做說明。亦即,雷射加工裝置1,係用於對對象物11照射雷射光L(雷射光L1,L2)來形成改質區域12,其係至少具備:用於支承對象物11之載台2、用於朝向由載台2支承的對象物11照射雷射光L之照射部3、用於讓雷射光L的聚光區域C(聚光區域C1,C2)對於對象物11相對移動之移動部4,5、以及用於控制移動部4,5及照射部3之控制部6。照射部3具有空間光調變器7,空間光調變器7是以從Z方向觀察時使聚光區域C具有長邊方向NH的方式將雷射光L成形。The laser processing of the present embodiment described above will be described in terms of the configuration of the
而且,控制部6係實行第1加工處理(上述第1加工),在第1加工處理,係控制照射部3及移動部4,5,沿著線A中的第1區域A1讓聚光區域C(聚光區域C1,C2)相對移動,藉此沿著第1區域A1在對象物11形成改質區域12(改質區域12a,12b),並形成從該改質區域12朝向與對象物11的入射面、即第1面11a為相反側之第2面11b且相對於Z方向傾斜地延伸之斜向龜裂13F(龜裂13a,13b)。Then, the
再者,控制部6係實行第2加工處理(上述第2加工),在第2加工處理,係控制照射部3及移動部4,5,沿著線A中的第2區域A2讓聚光區域C(聚光區域C1,C2)相對移動,藉此沿著第2區域A2在對象物11形成改質區域12(改質區域12a,12b),並形成從改質區域12朝向第2面11b延伸的斜向龜裂13F(龜裂13a,13b)。Furthermore, the
在第1加工處理及第2加工處理,控制部6係控制空間光調變器7,以使聚光區域C的長邊方向NH以接近第1結晶方位K1及第2結晶方位K2當中與聚光區域C的移動方向、即加工進展方向ND之間的角度較大之一方的朝向相對於加工進展方向ND呈傾斜的方式,將雷射光L成形,且在第1加工處理和第2加工處理是將加工進展方向ND的順逆設為相同。In the first processing and the second processing, the
而且,在將第2結晶方位K2和線A正交的點設為0˚,將第1結晶方位K1和線A正交的點設為90˚,將線A上之0˚和90˚之中間的點設為45˚時,第1區域A1及第2區域A2中,從Z方向觀察時,以使長邊方向NH之傾斜的朝向相對於加工進展方向ND是和斜向龜裂13F的延伸側成為同一側的一方包含45˚點的方式,設定第1區域A1和第2區域A2的邊界Ks。Furthermore, the point where the second crystal orientation K2 and the line A are orthogonal is set to 0°, the point where the first crystal orientation K1 and the line A are orthogonal is set to 90°, and the point between 0° and 90° on the line A is set. When the intermediate point is set to 45°, the first area A1 and the second area A2, when viewed from the Z direction, are inclined in the direction of the longitudinal direction NH relative to the machining progress direction ND and the
接下來,對於以上之本實施形態的雷射加工,以雷射加工方法之工序的形式做說明。亦即,本實施形態的雷射加工方法,係用於對對象物11照射雷射光L(雷射光L1,L2)來形成改質區域12,其係具有第1加工工序(上述第1加工),在第1加工工序,係沿著設定在對象物11之線A中的第1區域A1讓聚光區域C(聚光區域C1,C2)相對移動,藉此沿著第1區域A1在對象物11形成改質區域12(改質區域12a,12b),並形成從該改質區域12朝向與對象物11的入射面、即第1面11a為相反側的第2面11b且相對於Z方向傾斜地延伸之斜向龜裂13F(龜裂13a,13b)。Next, the laser processing of the present embodiment described above will be described in terms of steps of the laser processing method. That is, the laser processing method of the present embodiment is for irradiating the
又本實施形態的雷射加工方法係具有第2加工工序(上述第2加工),在第2加工工序,係沿著線A中的第2區域A2讓聚光區域C(聚光區域C1,C2)相對移動,藉此沿著第2區域A2在對象物11形成改質區域12(改質區域12a,12b),並形成從改質區域12朝向第2面11b延伸的斜向龜裂13F(龜裂13a,13b)。Furthermore, the laser processing method of the present embodiment includes a second processing step (the above-mentioned second processing), and in the second processing step, the light-converging region C (light-converging region C1, C2) Relative movement, whereby the modified region 12 (modified
在第1加工工序及第2加工工序,是以從Z方向觀察時使聚光區域C具有長邊方向NH的方式,且使聚光區域C的長邊方向NH以接近第1結晶方位K1及第2結晶方位K2當中與聚光區域C之移動方向、即加工進展方向ND之間的角度較大之一方的朝向相對於加工進展方向ND傾斜的方式,將雷射光L成形,且在第1加工工序和第2加工工序是將加工進展方向ND的順逆設為相同。In the first processing step and the second processing step, the long-side direction NH of the light-converging region C is made to be close to the first crystal orientation K1 and The laser beam L is shaped so that the direction of the larger angle between the second crystal orientation K2 and the moving direction of the light-converging region C, that is, the machining progress direction ND, is inclined with respect to the machining progress direction ND, and the first In the processing step and the second processing step, the forward and reverse directions of the processing progress direction ND are the same.
而且,在將第2結晶方位K2和線A正交的點設為0˚,將第1結晶方位K1和線A正交的點設為90˚,將線A上之0˚和90˚之中間的點設為45˚時,在第1區域A1及第2區域A2中,從Z方向觀察時,以使長邊方向NH之傾斜的朝向相對於加工進展方向ND是和斜向龜裂13F的延伸側成為同一側的一方包含45˚點的方式,設定第1區域A1和第2區域A2的邊界Ks。Furthermore, the point where the second crystal orientation K2 and the line A are orthogonal is set to 0°, the point where the first crystal orientation K1 and the line A are orthogonal is set to 90°, and the point between 0° and 90° on the line A is set. When the middle point is set to 45°, in the first area A1 and the second area A2, when viewed from the Z direction, the direction of the inclination of the longitudinal direction NH is relative to the machining progress direction ND and the
如以上所說明般,在本實施形態的雷射加工裝置1及雷射加工方法,對象物11具有結晶構造,該結晶構造包含:(100)面、一個(110)面、另一個(110)面、與一個(110)面正交的第1結晶方位K1、及與另一個(110)面正交的第2結晶方位K2。而且,在此,在沿著讓雷射光L的聚光區域C相對移動之線A中的第1區域A1在對象物11形成改質區域12的情況(第1加工處理、第1加工工序)、及沿著該線A中的第2區域A2在對象物11形成改質區域12的情況(第2加工處理、第2加工工序)各個,使聚光區域C的長邊方向NH以接近第1結晶方位K1及第2結晶方位K2當中與加工進展方向ND之間的角度較大之一方的朝向相對於加工進展方向ND傾斜的方式,將雷射光L成形。因此,如上述認識所示般,可抑制修整面的品質降低。As described above, in the
另一方面,在本實施形態的雷射加工裝置1及雷射加工方法,在第1加工處理及第2加工處理(第1加工工序及第2加工工序也是同樣的(以下相同))中,形成從改質區域12朝向對象物11的與第1面11a(入射面)為相反側之第2面11b(相反面)且相對於Z方向(與入射面交叉的方向)傾斜地延伸之斜向龜裂13F。因此,必須考慮該斜向龜裂13F的延伸方向和聚光區域C之長邊方向NH的朝向之關係。特別是在45˚點的加工時,若處於聚光區域C之長邊方向NH的朝向與斜向龜裂13F之傾斜方向相對於加工進展方向ND彼此成為相反側的狀態,容易發生修整面的品質降低。On the other hand, in the
針對此,在本實施形態的雷射加工裝置1及雷射加工方法,第1區域A1和第2區域A2之間的邊界Ks設定成,在第1區域A1及第2區域A2中,使長邊方向NH之傾斜的朝向相對於加工進展方向ND是和斜向龜裂13F的延伸側成為同一側之一方包含45˚點。換言之,在第1區域A1及第2區域A2中,以聚光區域C之長邊方向NH的朝向和斜向龜裂13F的傾斜方向相對於加工進展方向ND彼此成為相反側的狀態進行加工的區域,不致到達線A上之45˚點。因此,可抑制品質降低。如此般,依據本實施形態的雷射加工裝置1及雷射加工方法,可在抑制對象物11之修整面的品質降低之狀態下形成斜向龜裂13F。On the other hand, in the
再者,在本實施形態的雷射加工裝置1及雷射加工方法,在第1加工處理和第2加工處理是將加工進展方向ND的順逆設為相同。因此,相較於在第1加工處理和第2加工處理將加工進展方向ND的順逆切換的情況,可減少與雷射光L之聚光區域C之相對移動的加減速有關的時間。In addition, in the
又在本實施形態的雷射加工裝置1亦可為,在第1區域A1及第2區域A2中,從Z方向觀察時,使長邊方向NH之傾斜的朝向相對於加工進展方向ND是和斜向龜裂13F的延伸側成為同一側之一方比另一方更長。如此般,可將第1區域A1和第2區域A2的長度設定為不同。Furthermore, in the
又在本實施形態的雷射加工裝置1亦可為,控制部6對於第1部分15A,是將加工進展方向ND的順逆設為相同而實行第1加工處理及第2加工處理,對於第2部分15B,是實行與第1加工處理及第2加工處理不同的其他加工處理(其他加工)。在其他加工處理,控制部6係控制照射部3及移動部4,5,在線A的全體將加工進展方向ND的順逆設為相同且沿著線A讓聚光區域C相對移動,藉此沿著線A在對象物11形成改質區域12及從該改質區域12沿著Z方向延伸的龜裂13。在此情況,相較於在第2部分15B也在線A的第1區域A1和第2區域A2將加工進展方向ND的順逆切換的情況,可減少與雷射光L之聚光區域C之相對移動的加減速有關的時間。In the
又在本實施形態的雷射加工裝置1亦可為,在其他加工處理,控制部6藉由控制空間光調變器7,以從Z方向觀察時使聚光區域C具有長邊方向NH的方式,且使該聚光區域C的長邊方向NH沿著加工進展方向ND的方式,將雷射光L成形。在此情況,相較於在形成沿著Z方向的龜裂13之第2部分15B,以在線A之第1區域A1的加工和第2區域A2的加工之間使雷射光L之聚光區域C的傾斜變化的方式進行雷射光L的成形的情況,可簡化控制部6的處理。Furthermore, in the
又本實施形態的雷射加工裝置1亦可為,作為其他加工處理係實行第1Z加工處理(上述第1Z加工)及第2Z加工處理(上述第2Z加工),在第1Z加工處理,對於第2部分15B,不進行加工進展方向ND的切換,藉由控制照射部3及移動部4,5,沿著線A中的第1區域A1讓聚光區域C相對移動,藉此沿著第1區域A1在對象物11形成改質區域12,並形成從該改質區域12沿著Z方向延伸的龜裂13;在第2Z加工處理,藉由控制照射部3及移動部4,5,沿著線A中的第2區域A2讓聚光區域C相對移動,藉此沿著第2區域A2在對象物11形成改質區域12,並形成從該改質區域12沿著Z方向延伸的龜裂13。在此情況,相較於在第2部分15B也在第1區域A1和第2區域A2將聚光區域C的長邊方向NH按照加工進展方向ND來設定,且在第1區域A1和第2區域A2將加工進展方向ND的順逆切換的情況,可減少與雷射光L之聚光區域C之相對移動的加減速有關的時間。In addition, the
在本實施形態的雷射加工裝置1亦可為,對象物11係包含與其他構件(對象物11R)接合之接合區域,在第1加工處理及第2加工處理,控制部6是形成以隨著從第1面11a朝向第2面11b而從接合區域之內側的位置朝向接合區域之外緣11e的方式傾斜之斜向龜裂13F。在此情況,以斜向龜裂13F為邊界而將對象物11的一部分從對象物11除去,讓對象物11的剩餘部分存留的情況,可避免超越對象物11之與其他構件的接合區域而使對象物11的剩餘部分往外側延伸。In the
在本實施形態的雷射加工裝置1亦可為,在第1加工處理及第2加工處理,控制部6係實行第1形成處理(上述第1形成)及第2形成處理(上述第2形成),在第1形成處理,係將Z方向上之聚光區域C1的位置設定成第1Z位置Z1,並沿著線A讓聚光區域C1相對移動,藉此將改質區域12a及從改質區域12a延伸的龜裂13a形成於對象物11;在第2形成處理,係將Z方向上之聚光區域C2的位置設定成比第1Z位置Z1更靠第1面11a側之第2Z位置Z2,並沿著線A讓聚光區域C2相對移動,藉此形成改質區域12b及從改質區域12b延伸的龜裂13b。In the
在第1形成處理,控制部6係將與加工進展方向ND及Z方向交叉的Y方向上之聚光區域C1的位置設定成第1Y位置Y1,在第2形成處理,控制部6係將Y方向上之聚光區域C2的位置設定成從第1Y位置Y1移位後的第2Y位置Y2,並藉由空間光調變器7的控制,使在包含Y方向及Z方向之YZ面S內之聚光區域C2的形狀,在至少比聚光區域C2的中心更靠第1面11a側成為朝移位方向傾斜之傾斜形狀的方式將雷射光L2成形,藉此在YZ面S內以朝移位方向傾斜的方式形成斜向龜裂13F。如此,能夠適當地形成相對於Z方向傾斜之斜向龜裂。In the first forming process, the
在本實施形態的雷射加工裝置1亦可為,照射部3係包含:用於將來自空間光調變器7的雷射光L朝向對象物11聚光之聚光透鏡33,在第2形成處理,控制部6係控制在空間光調變器7所顯示的調變圖案,以使聚光區域C的形狀成為傾斜形狀的方式將雷射光L調變,藉此將雷射光L成形。在此情況,能夠利用空間光調變器7而輕易地將雷射光L成形。In the
這時,在本實施形態的雷射加工裝置1亦可為,調變圖案係包含:用於對雷射光L賦予彗形像差之彗形像差圖案,在第2形成處理,控制部6藉由控制基於彗形像差圖案之彗形像差的大小,來進行用於使聚光區域C的形狀成為傾斜形狀之第1圖案控制。依據本發明人的認識,在此情況,在YZ面S內之聚光區域C的形狀形成為弧狀。亦即,在此情況,聚光區域C的形狀,在比聚光區域C的中心Ca更靠第1面11a(入射面)側是朝移位方向傾斜,在比聚光區域C的中心Ca更靠入射面的相反側是朝與移位方向相反的方向傾斜。在此情況也是,可形成朝移位方向傾斜的斜向龜裂13F。In this case, in the
在本實施形態的雷射加工裝置1亦可為,調變圖案係包含用於修正雷射光L的球面像差之球面像差修正圖案,在第2形成處理,控制部6係相對於聚光透鏡33之入瞳面33a的中心讓球面像差修正圖案Ps的中心朝Y方向偏置,藉此進行用於使聚光區域C的形狀成為傾斜形狀之第2圖案控制。依據本發明人的認識,在此情況也是,與利用彗形像差圖案的情況同樣的,能夠使在YZ面S內之聚光區域C的形狀形成為弧狀,可形成朝移位方向傾斜的斜向龜裂13F。In the
本實施形態的雷射加工裝置1亦可為,在第2形成處理,控制部6係藉由讓關於沿著加工進展方向ND之軸線呈非對稱的調變圖案顯示於空間光調變器7,來進行用於使聚光區域C的形狀成為傾斜形狀之第3圖案控制。依據本發明人的認識,在此情況,能夠使在YZ面S內之聚光區域C的形狀全體朝移位方向傾斜。在此情況也是,可形成朝移位方向傾斜的斜向龜裂13F。In the
在本實施形態的雷射加工裝置1亦可為,調變圖案係包含用於使XY面內之聚光區域C的形狀成為以X方向為長邊的橢圓形狀之橢圓圖案,XY面係包含與Y方向及Z方向交叉的X方向和Y方向;在第2形成處理,控制部6係以使橢圓圖案的強度成為關於沿著X方向之軸線呈非對稱的方式讓調變圖案顯示於空間光調變器7,藉此進行用於使光束形狀成為傾斜形狀之第4圖案控制。依據本發明人的認識,在此情況也是,能夠使在YZ面S內之聚光區域C的形狀形成為弧狀,可形成朝移位方向傾斜的斜向龜裂13F。In the
在本實施形態的雷射加工裝置1亦可為,在第2形成處理,控制部6係讓用於形成在YZ面S內沿著移位方向排列之複數個雷射光L的聚光點CI之調變圖案顯示於空間光調變器7,藉此進行用於使包含複數個聚光點CI之聚光區域C的形狀成為傾斜形狀之第5圖案控制。依據本發明人的認識,在此情況也是,可形成朝移位方向傾斜的斜向龜裂13F。
[變形例]In the
以上是針對雷射加工裝置及雷射加工方法的一態樣做說明,但本發明的一態樣並不限定於上述態樣,是可變形的。One aspect of the laser processing apparatus and the laser processing method has been described above, but one aspect of the present invention is not limited to the above aspect, and can be deformed.
例如,在上述例子,雖舉由對象物11和對象物11R所貼合而構成的對象物100(貼合晶圓),但雷射加工的對象並不限定於這樣的貼合晶圓,也可以是單一晶圓等的對象物。For example, in the above-mentioned example, the object 100 (bonded wafer) composed of the
又在圖45所示的例子,是舉出:對於第1部分15A,使用2個聚光區域C1,C2來形成2個改質區域12a,12b的情況。在此情況,在斜向龜裂13F的形成時,是控制至少在更靠第1面11a側之聚光區域C2的YZ面S內之光束形狀。然而,對於第1部分15A,在形成複數組改質區域12a,12b的情況,在最靠第2面11b側(對象物11R側)之改質區域12a,12b的形成時,只要控制至少在更靠第1面11a側之聚光區域C2之YZ面S內的光束形狀即可。Also, in the example shown in FIG. 45 , the case where the two modified
又在上述實施形態,是對於對象物11之第2部分15B形成垂直龜裂。然而,關於對象物11之第2部分15B也是,與第1部分15A同樣地形成斜向龜裂亦可。Also in the above-described embodiment, vertical cracks are formed in the
又在第1實施形態的雷射加工所記載的例子,是將線A中的第1區域A1之加工、即第1加工和第2區域A2的加工、即第2加工像0˚、45˚、90˚那樣以45˚間隔切換的方式在GUI上設定,實際雷射的ON・OFF也是以那樣的角度進行。但在實際的裝置,起因於雷射ON・OFF的遲延,會有比設定遲延數百msec左右的情況。亦即,並不限定於在第1區域A1和第2區域A2的邊界嚴格地進行雷射的ON・OFF的情況。In the example described in the laser processing of the first embodiment, the processing of the first area A1 in the line A, that is, the processing of the first processing and the processing of the second area A2, that is, the processing of the
又因為上述般的原因,為了減少改質區域12之形成位置偏差量,控制部6亦可具有:將雷射ON・OFF的遲延時間事先修正而讓雷射提前ON・OFF之修正參數。在此情況,可將改質區域12之形成位置的偏差抑制在1mm以內。作為一例,當對象物11是12吋晶圓的情況,圓周約942mm,每1˚是2.617mm左右,因此在此情況的偏差可抑制在1˚以內。For the reasons described above, in order to reduce the amount of deviation in the formation position of the modified
又如圖38等的結果所示般可確認,在第1區域A1和第2區域A2的切換點存在±5˚左右的加工品質裕度(margin)。因此,像0˚±5˚、45˚±5˚、90˚±5˚那樣只要在品質裕度內,將切換點的設定刻意地錯開亦可。Also, as shown in the results of FIG. 38 and the like, it can be confirmed that there is a processing quality margin of about ±5° at the switching point between the first area A1 and the second area A2. Therefore, as long as it is within the quality margin, the setting of the switching point can be deliberately shifted, such as 0˚±5˚, 45˚±5˚, and 90˚±5˚.
又在上述實施形態,例如藉由雷射的ON・OFF,以從Z方向觀察時成為環狀的方式形成改質區域12,但嚴格來說亦可為,在被ON・OFF的位置,局部地讓改質區域12(例如數百μm左右)重疊的情況,或相反的,存在局部未形成改質區域12的區域(例如數百μm左右)。為了避免受到其等的影響造成品質惡化,會有採用多段加工的情況,讓複數段具有斜向龜裂的形成及上述第1加工、第2加工的效果而進行加工。In the above-mentioned embodiment, for example, the modified
又在實際的加工,直到聚光區域C的相對移動速度成為一定為止,助跑距離是必要的,因此順方向ND1和逆方向ND2的切換包含助跑。在助跑時將雷射OFF,成為等速後在切換點將雷射ON。助跑時的轉速則取決於裝置的性能。又關於自動對焦,是以從助跑時追蹤而避免在改質區域形成時發生過衝的方式進行調整。In actual processing, the run-up distance is necessary until the relative movement speed of the light-converging region C becomes constant, so the switching of the forward direction ND1 and the reverse direction ND2 includes the run-up. Turn off the laser during the run-up, and turn on the laser at the switching point when the speed becomes constant. The speed of the approach depends on the performance of the device. As for the autofocus, it is adjusted so as to avoid overshoot when the modified area is formed by tracking from the start-up time.
再者,在第2實施形態也是,關於切換的精度,雖是與上述例子共通的,但作為45˚點、135˚點等的切換點,如圖49之表所示般,在-45˚點至少不進行切換, 而以-50˚點為中心進行切換(在圖50之表的例子,以-40˚點為中心進行切換)。這時,偏差的容許裕度,作為一例是±2˚左右,按照光束形狀(將橢圓率進一步提高),會有可提高到例如±4˚左右的情況。另一方面,0˚、90˚的切換點雖沒有必要錯開,但按照品質的裕度,例如在±4˚度左右的範圍錯開亦可。 [產業利用可能性]Furthermore, in the second embodiment, the switching accuracy is the same as the above-mentioned example, but as switching points such as the 45° point and the 135° point, as shown in the table in Fig. 49, at -45° At least the point is not switched, but is switched around the -50° point (in the example of the table in Figure 50, the switch is performed around the -40° point). In this case, the allowable margin of deviation is, for example, about ±2°, and may be increased to about ±4°, for example, depending on the beam shape (the ellipticity is further increased). On the other hand, it is not necessary to stagger the switching points of 0° and 90°, but it may be staggered within the range of ±4°, for example, according to the margin of quality. [Industrial Utilization Possibility]
提供能夠在抑制外緣部分被除去後之對象物的修整面之品質降低的狀態下形成斜向龜裂之雷射加工裝置及雷射加工方法。Provided are a laser processing apparatus and a laser processing method capable of forming an oblique crack while suppressing deterioration of the quality of the trimmed surface of the object after the outer edge portion has been removed.
1:雷射加工裝置
2:載台(支承部)
3:照射部
4,5:移動部
6:控制部
7:空間光調變器
11:對象物
11a:第1面(入射面)
11b:第2面(相反面)
12,12a,12b:改質區域
13,13a,13b:龜裂
13F:斜向龜裂
33:聚光透鏡
A1:第1區域
A2:第2區域
K1:第1結晶方位
K2:第2結晶方位
L:雷射光
C,C1,C2:聚光區域
ND:加工進展方向1: Laser processing device
2: stage (support part)
3:
[圖1]係顯示一實施形態的雷射加工裝置的構成之示意圖。 [圖2]係顯示圖1所示的雷射照射部的構成之示意圖。 [圖3]係顯示圖2所示的4f透鏡單元。 [圖4]係顯示圖2所示的空間光調變器。 [圖5](a),(b)係用於說明斜向龜裂形成的認識之對象物的剖面圖。 [圖6]係用於說明斜向龜裂形成的認識之對象物的剖面圖。 [圖7]係顯示雷射光的聚光區域之光束形狀。 [圖8]係顯示調變圖案的偏置。 [圖9](a),(b)係顯示斜向龜裂的形成狀態之剖面照片。 [圖10]係對象物的示意俯視圖。 [圖11](a),(b)係顯示斜向龜裂的形成狀態之剖面照片。 [圖12](a),(b)係顯示斜向龜裂的形成狀態之剖面照片。 [圖13](a),(b)係顯示調變圖案的一例。 [圖14](a),(b)係顯示在聚光透鏡的入瞳面之強度分布、及聚光區域的光束形狀。 [圖15](a),(b)係顯示聚光區域的光束形狀、及聚光區域的強度分布之觀測結果。 [圖16](a),(b),(c)係顯示調變圖案的一例。 [圖17](a),(b),(c)係顯示非對稱的調變圖案之其他例。 [圖18](a),(b)係顯示在聚光透鏡的入瞳面之強度分布、及聚光區域的光束形狀。 [圖19]係顯示調變圖案的一例、及聚光區域的形成。 [圖20]係顯示加工的對象物。 [圖21](a),(b)係顯示加工的對象物。 [圖22](a),(b),(c)係顯示聚光區域的光束形狀之示意圖。 [圖23](a),(b),(c)係顯示聚光區域的光束形狀之示意圖。 [圖24](a),(b),(c)係顯示修整加工的一工序。 [圖25](a),(b)係顯示修整加工的一工序。 [圖26](a),(b),(c)係顯示修整加工的一工序。 [圖27]係顯示修整加工的一工序。 [圖28](a),(b)係顯示修整加工的一工序。 [圖29](a),(b)係顯示修整加工的一工序。 [圖30](a),(b)係顯示一實施形態的雷射加工之對象物。 [圖31]係圖30所示的對象物之剖面圖。 [圖32]係圖30所示的對象物之俯視圖。 [圖33](a),(b),(c),(d)係顯示加工結果的剖面照片。 [圖34](a),(b),(c),(d)係顯示加工結果的剖面照片。 [圖35]係用於說明顯示加工試驗之示意圖。 [圖36](a),(b)係顯示在加工試驗之加工進展方向和光束形狀和斜向龜裂的關係之示意圖。 [圖37]係顯示圖35,36所示的加工試驗的結果之表。 [圖38]係顯示加工試驗的結果之表。 [圖39](a),(b),(c),(d),(e)係顯示加工試驗的結果之剖面照片。 [圖40](a),(b)係顯示一實施形態的雷射加工之一工序。 [圖41](a),(b)係顯示一實施形態的雷射加工之一工序。 [圖42](a),(b)係顯示一實施形態的雷射加工之一工序。 [圖43](a),(b)係顯示一實施形態的雷射加工之一工序。 [圖44](a),(b)係顯示一實施形態的雷射加工之一工序。 [圖45]係顯示一實施形態的雷射加工之一工序。 [圖46](a),(b)係顯示一實施形態的雷射加工之一工序。 [圖47](a),(b)係顯示一實施形態的雷射加工之一工序。 [圖48]係顯示一實施形態的雷射加工之對象物。 [圖49]係顯示加工試驗的結果之表。 [圖50]係顯示加工試驗的結果之表。FIG. 1 is a schematic diagram showing the configuration of a laser processing apparatus according to an embodiment. FIG. 2 is a schematic diagram showing the configuration of the laser irradiation section shown in FIG. 1 . [Fig. 3] shows the 4f lens unit shown in Fig. 2. [Fig. [Fig. 4] shows the spatial light modulator shown in Fig. 2. [Fig. [Fig. 5] (a), (b) are cross-sectional views of the object for explaining the recognition of the formation of the oblique crack. Fig. 6 is a cross-sectional view of an object for explaining the recognition of oblique crack formation. [Fig. 7] shows the beam shape of the condensing region of the laser light. [Fig. 8] shows the bias of the modulation pattern. [Fig. 9] (a), (b) are cross-sectional photographs showing the formation state of the oblique crack. [ Fig. 10 ] A schematic plan view of an object. [Fig. 11] (a), (b) are cross-sectional photographs showing the formation state of the oblique cracks. [Fig. 12] (a), (b) are cross-sectional photographs showing the formation state of the oblique crack. [Fig. 13] (a) and (b) show examples of modulation patterns. [Fig. 14] (a) and (b) show the intensity distribution at the entrance pupil plane of the condenser lens and the beam shape in the condensing area. [Fig. 15] (a) and (b) show the observation results of the beam shape of the condensing area and the intensity distribution of the condensing area. [Fig. 16] (a), (b), and (c) show examples of modulation patterns. [Fig. 17] (a), (b), (c) show other examples of asymmetric modulation patterns. [Fig. 18] (a) and (b) show the intensity distribution at the entrance pupil plane of the condenser lens and the beam shape in the condensing area. FIG. 19 shows an example of a modulation pattern and the formation of a light condensing area. [ Fig. 20 ] The object to be processed is shown. [Fig. 21] (a) and (b) show the processed objects. [Fig. 22] (a), (b), (c) are schematic diagrams showing the shape of the beam in the condensing area. [Fig. 23] (a), (b), (c) are schematic diagrams showing the beam shape of the light-converging region. [ Fig. 24 ] (a), (b), and (c) show one step of the trimming process. [Fig. 25] (a) and (b) show one step of the trimming process. [ Fig. 26 ] (a), (b), and (c) show one step of the trimming process. [ Fig. 27 ] A step of the trimming process is shown. [Fig. 28] (a) and (b) show one step of the trimming process. [ Fig. 29 ] (a) and (b) show one step of the trimming process. [Fig. 30] (a) and (b) show the object of laser processing according to one embodiment. Fig. 31 is a cross-sectional view of the object shown in Fig. 30 . [FIG. 32] It is a top view of the object shown in FIG. 30. [FIG. [Fig. 33] (a), (b), (c), and (d) are cross-sectional photographs showing processing results. [Fig. 34] (a), (b), (c), and (d) are cross-sectional photographs showing processing results. [ Fig. 35 ] A schematic diagram for explaining the display processing test. [ Fig. 36 ] (a) and (b) are schematic diagrams showing the relationship between the direction of progress of processing and the shape of the beam and the oblique crack in the processing test. Fig. 37 is a table showing the results of the processing tests shown in Figs. 35 and 36 . [Fig. 38] is a table showing the results of the processing test. [Fig. 39] (a), (b), (c), (d), and (e) are cross-sectional photographs showing the results of processing tests. [ Fig. 40 ] (a) and (b) show one step of laser processing in one embodiment. [ Fig. 41 ] (a) and (b) show one step of laser processing in one embodiment. [ Fig. 42 ] (a) and (b) show one step of laser processing in one embodiment. [ Fig. 43 ] (a) and (b) show one step of laser processing in one embodiment. [ Fig. 44 ] (a) and (b) show one step of laser processing in one embodiment. FIG. 45 shows one step of laser processing in one embodiment. [ Fig. 46 ] (a) and (b) show one step of laser processing in one embodiment. [ Fig. 47 ] (a) and (b) show one step of laser processing in one embodiment. Fig. 48 shows an object of laser processing according to an embodiment. [ Fig. 49 ] A table showing the results of the processing test. [ Fig. 50 ] is a table showing the results of processing tests.
11:對象物11: Object
A:線A: Line
A1:第1區域A1:
A2:第2區域A2:
C:聚光區域C: Concentrating area
CD:斜向龜裂的延伸方向CD: the extension direction of the oblique crack
CD2:逆方向CD2: reverse direction
E:除去區域E: remove area
K1:第1結晶方位K1: The first crystal orientation
K2:第2結晶方位K2: The second crystal orientation
K3:第3結晶方位K3: The third crystal orientation
K4:第4結晶方位K4: 4th crystal orientation
ND:加工進展方向ND: Processing progress direction
ND2:逆方向ND2: reverse direction
NH:長邊方向NH: Long side direction
R:有效區域R: effective area
Q1:第1形狀Q1: 1st shape
α:加工角度α: Machining angle
β:光束角度β: Beam angle
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JP5775265B2 (en) * | 2009-08-03 | 2015-09-09 | 浜松ホトニクス株式会社 | Laser processing method and semiconductor device manufacturing method |
JP5456510B2 (en) | 2010-02-23 | 2014-04-02 | 株式会社ディスコ | Laser processing equipment |
JP5389264B2 (en) * | 2010-07-26 | 2014-01-15 | 浜松ホトニクス株式会社 | Laser processing method |
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