TW202202856A - Wireless communication electronic component testing device and testing equipment using the same - Google Patents

Abstract

The present invention reveals a wireless communication electronic component testing device, including a tester, an antenna, and a contactor. The contactor has a carrier and a pressing member. The pressing member is disposed to and moved by the carrier. The pressing member is made of low-k material, which has a small relative dielectric constant to allow wireless signal to pass therethrough. The pressing member is then placed between the antenna and the wireless communication electronic component, pressing on the electronic component to ensure electrical contact between the tester and the electric component without blocking the wireless signal between the electric component and the antenna. Therefore, electricity testing of the wireless communication electronic component can be processed smoothly.

Description

Radio frequency electronic component test equipment and test equipment for its application

The present invention provides a joint mechanism that can be crimped to an electronic component and used to transmit wireless signals.

Please refer to FIG. 1 , a radio frequency electronic device 10 with a plurality of built-in antennas is widely used in the fields of mobile communication area wireless network system and wireless communication area network system. At present, the radio frequency electronic device 10 is provided with a plurality of contacts 11 on one side. , and an antenna 12 is arranged on the other side. Before the radio frequency electronic component 10 leaves the factory, in addition to performing the wireless signal testing operation, it also needs to perform the electrical testing operation to ensure the quality.

The test device for radio frequency electronic components is equipped with a circuit board 21 and a test seat 22 that are electrically connected to the machine. The test seat 22 has a plurality of probes 221 for testing the radio frequency electronic components 10 , and the test device is also disposed above the test seat 22 The antenna tester 23 is used to transmit or receive wireless signals to the radio frequency electronic component 10; when the radio frequency electronic component 10 is placed on the test seat 22, the radio frequency electronic component 10 contacts the probe 221 of the test seat 22 with the contact point 11 to perform electrical testing In the test operation, the antenna 12 is directed toward the antenna tester 23 in the predetermined direction to be tested to send out a wireless signal, and the antenna tester 23 receives the wireless signal to perform the wireless signal test operation.

The above-mentioned radio frequency electronic component 10 only uses its own weight to make the contact 11 contact the probe 221 of the test seat 22. Since the probe 221 has a spring, this self-weight pressure cannot make the contact 11 and the probe 221 really contact each other. , so as to affect the electrical test quality of the radio frequency electronic component 10 ; since the antenna 12 of the radio frequency electronic component 10 is relative to the antenna tester 23 , how can the antenna tester 23 and the radio frequency electronic component 10 transmit wireless signals without affecting the requirements The crimpable radio frequency electronic component 10 to perform the test operation is the target of the research and development of the industry.

One object of the present invention is to provide a radio frequency electronic component testing device, which includes electrical A tester, an antenna tester and a joint mechanism, the joint mechanism is provided with a carrier and an anti-disturbance pressure piece, the carrier is assembled and drives the displacement of the anti-disturbance pressure piece, the anti-disturbance pressure piece is made of shielding material, and has a low dielectric coefficient It can allow the wireless signal to pass through, so that the carrier carries the anti-interference pressure member between the antenna tester and the radio frequency electronic component. The tester is used to perform the test operation, and the wireless signal transmitted between the antenna tester and the radio frequency electronic components can pass through the anti-interference pressure element to perform the wireless signal test operation, thereby improving the test quality.

The second object of the present invention is to provide a test device for radio frequency electronic components, the carrier of the joint mechanism is used for assembling the anti-disturbance pressing piece and the antenna tester, the anti-disturbing pressing piece is located under the antenna tester, and the carrier drives the anti-disturbing pressing piece and the antenna tester. The antenna tester synchronizes the displacement, thereby improving the test production efficiency.

The third object of the present invention is to provide a testing device for radio frequency electronic components, the joint mechanism of which is provided with at least one pick-up member on the anti-interference pressing member or its peripheral side, whereby the pick-up member displaces the radio frequency electronic components to the electrical tester, and is equipped with the anti-interference pressure member. Crimping parts crimp RF electronic components, thereby increasing test throughput.

The fourth object of the present invention is to provide a radio frequency electronic component testing device, further comprising a first platform, the first platform is equipped with an adjuster for adjusting the placement position or angle, the first platform is provided with an electrical tester and a joint mechanism, It not only enables the joint mechanism to adjust the position or angle synchronously with the electrical tester, but also enables the RF electronic components to perform wireless signal testing operations with different directions to be tested, so as to reduce the number of antenna testers configured, save the cost of the antenna tester and increase the use of the antenna. Practical benefits of performance.

The fifth object of the present invention is to provide a test equipment, including a machine and a feeding device , a receiving device, a testing device, a conveying device and a central control device of the present invention; the feeding device is arranged on the machine table, and is provided with at least one feeding holder for accommodating the RF electronic components to be tested; the receiving device is arranged on the machine On the table, there is at least one receiver for accommodating the tested RF electronic components; the testing device of the present invention is arranged on the machine table, and includes an electrical tester, an antenna tester and a joint mechanism for testing and crimping the RF Electronic components; the conveying device is arranged on the machine table, and is provided with at least one conveyor for conveying radio frequency electronic components ; The central control device is used to control and integrate the actions of various devices to perform automated operations to achieve practical benefits of improving operational efficiency.

In order to make your examiners further understand the present invention, hereby give a preferred embodiment and cooperate with the drawings, the details are as follows:

Please refer to FIG. 2 , the first embodiment of the test device 30 of the present invention includes an electrical tester 31 , an antenna tester 32 and a joint mechanism 33 .

The electrical tester 31 is provided with an electrically connected circuit board 311 and at least one test socket 312. The test socket 312 is electrically connected to at least one RF electronic component located at the test station to perform electrical testing operations on the RF electronic component. Furthermore, the test seat 312 has a plurality of probes 313 , one end of the probes 313 is electrically connected to the circuit board 311 , and the other end is electrically connected to the radio frequency electronic components. Furthermore, the test station is a preset position where the RF electronic components perform the test operation, and the test station can be located in the electrical tester 31, the carrier Or conveyors, etc., are determined according to different test operation requirements, and are not limited to this embodiment; in this embodiment, the test station is located at the test seat 312 .

The electrical tester 31 further includes at least one limiting member on the test seat 312 , and the limiting member can be a limiting plate, a limiting column or an air suction hole; in this embodiment, the limiting member is the air suction hole 314 , the 314 is connected to an air extraction device (not shown in the figure) so as to absorb and limit the radio frequency electronic components.

The electrical tester 31 is assembled on the first platform 34 , and further, the first platform 34 can be a panel, an end, a frame or a base, or a part connected to the relevant components of the electrical tester 31 as the first The platform 34 and the first platform 34 can be of any type as long as the electrical tester 31 can be installed. The bearing parts of the carrier, etc., the carrier can be a rotary tool, a linear drive source (such as an actuating arm, a slide rail group or a screw screw base group, etc.) or a drive source including a box cover and a drive source that can drive the displacement of the box cover; the first platform 34 can be fixed or movable, for example, when the first platform 34 is a table top of a machine or a panel of a test room, the electrical tester 31 can be fixed at a preset position . The movable first platform 34 can perform at least one direction displacement or angular rotation, or at least one direction displacement and angular rotation; for example, when the first platform 34 is a bearing part of the adjuster, it can drive the electrical tester 31 Rotate the angle to adjust the placement angle or make at least one direction displacement to change the placement position; for example, when the first platform 34 is the supporting part of the carrier, it can drive the electrical tester 31 to perform linear displacement or rotational displacement; In an embodiment, the first platform 34 is fixedly configured and is a platen of a machine for assembling the electrical tester 31 .

The antenna tester 32 is provided with at least one signal operation part 321 for the radio frequency electronic components to perform wireless signal testing operations; Components for receiving and transmitting wireless signals . The antenna tester 32 can be connected to an independent processor (not shown in the figure), so as to transmit the wireless signal received by the radio frequency electronic component to the processor, or transmit the wireless signal for testing of the processor to the radio frequency electronic component, the processor It can also be the processor of the central control device (not shown). Furthermore, the angle of the operation axis L of the signal operating member 321 of the antenna tester 32 may be the same or different from the direction to be tested (eg, 0° or 45° or 30°) of the RF electronic component.

The testing device 30 can change the configuration quantity and configuration position of the antenna testers 32 according to the needs of the test operation. For example, when testing wireless signals with a single direction, a single antenna tester 32 can be configured. A plurality of antenna testers 32 are arranged at a plurality of positions; in this embodiment, the antenna testers 32 are assembled on the second platform 35 , and the operating axis L of the signal operation member 321 of the antenna tester 32 is located at 0° for receiving radio frequency electronics The wireless signal sent by the component is transmitted to the processor of the central control device for analysis to determine whether the wireless signal strength of the beam to be measured by the RF electronic component meets the standard.

The second platform 35 can be a panel, an end, a frame or a base, or a part connected to the relevant components of the antenna tester 32 is used as the second platform 35. The type of the second platform 35 can be used as long as the antenna tester can be assembled. 32 can be used. For example, the second platform 35 includes a plurality of panels in different positions, which can be used to assemble a plurality of antenna testers 32 in different positions. Loading parts, panel of test room, panel of box cover, bearing part of carrier, bearing part of carrier or frame plate of bearing, etc. Rail group or screw and screw seat group, etc.) or include a box cover and a drive source that can drive the displacement of the box cover. The second platform 35 can be fixed or movable. For example, when the second platform 35 is a table board of a machine, a panel of a test room or a shelf of a support, the antenna tester 32 can be fixed at a preset position; The second platform 35 can perform at least one direction displacement or angular rotation, or at least one direction displacement and angular rotation; for example, the second platform 35 is a bearing part of the adjuster, for driving the antenna tester 32 to adjust the placement Angle or position; for example, the second platform 35 is a supporting part of the carrier for driving the antenna tester 32 to perform linear displacement or rotational displacement.

In this embodiment, the second platform 35 is a fixedly configured shelf for assembling the antenna tester 32 . The angle L of the operating axis L of the signal operating member 321 of the antenna tester 32 is the same as the 0° of the RF electronic component to be tested. Pointing, to receive the wireless signal of the beam emitted by the point to be measured of the radio frequency electronic component.

The joint mechanism 33 includes a carrier 331 and an anti-disturbance pressure piece 332. The carrier 331 is used for assembling the anti-disturbance pressure piece 332. The anti-disturbance pressure piece 332 is made of a shielding material and has a low dielectric coefficient. The carrier 331 carries the anti-disturbance pressure piece. The component 332 is located between the antenna tester 32 and the radio frequency electronic component, and one of the anti-interference pressure component 332 and the radio frequency electronic component is used for crimping displacement toward the other to perform the electrical test operation, and further , since different types of RF electronic components have different volumes, the antenna can be configured on the RF electronic components One of the crimping position or the non-crimping position, the crimping position is a preset position for the anti-interference crimping member 332 to be crimped; for example, for a bulky radio frequency electronic component, the antenna is arranged at the non-crimping position of the radio frequency electronic component In other words, the non-crimping position is not crimped by the anti-interference pressing member 332, and the anti-interference pressing member 332 will not be crimped above the antenna, so that the wireless signal transmitted between the antenna tester 32 and the radio frequency electronic components The wireless signal test operation can be performed without passing through the anti-interference pressing member 332; for example, the antenna of a small RF electronic component is arranged below the crimping position of the RF electronic component, that is, the anti-interference pressing member 332 will be crimped on the antenna. above , so that the wireless signal transmitted between the antenna tester 32 and the radio frequency electronic components can pass through the anti-interference pressure member 332 to perform the wireless signal test operation. Furthermore, the carrier 331 carries the anti-interference pressing member 332 and the radio frequency electronic component for relative displacement, and the anti-interference pressing member 332 can still be used to press the radio frequency electronic component to perform the electrical test operation.

The carrier 331 is a fixed or movable design, and the carrier 331 can be a fixed frame, a movable arm, a crimping seat or a rotating shaft. For example, the carrier 331 is a fixed frame and is arranged between the antenna tester 32 and the electrical tester 31 For example, the carrier 331 is a moving arm, a crimping base or a rotating shaft, and it is displaced in at least one direction, and the displacement can be linear displacement or rotational displacement, or linear displacement and rotational displacement. The carrier 331 can be made of an anti-shielding material or a non-shielding material (such as a metal material), as long as its strength can bear the anti-disturbance pressing member 332; 331 defines an accommodating portion 3311 , and the accommodating portion 3311 penetrates through the top surface and the bottom surface of the carrier 331 .

The anti-disturbance pressing member 332 is assembled on the carrier 331 and is made of anti-shielding material and has a low dielectric coefficient; further, the anti-disturbing pressing member 332 can be mounted on one side of the carrier 331 or pass through the carrier 331 , and is carried by the carrier 331 between the antenna tester 32 and the radio frequency electronic components; the anti-shielding material applied to the anti-disturbing pressure member 332 can be closed-cell polyethylene foam or aerogel, when the interior of the anti-shielding material is a vacuum , its dielectric coefficient is 1, when the interior of the anti-shielding material is air, its dielectric coefficient is close to 1; the anti-disturbing pressure member 332 has appropriate strength and elasticity, and can return to its original state after being pressed; in this embodiment, The anti-disturbance pressure member 332 is a closed-cell polyethylene foam with appropriate strength and elasticity. The anti-disturbance pressure member 332 is assembled in the accommodating portion 3311 of the carrier 331, and has one side as the crimping surface 3321, and the crimping surface 3321 Protruding from the accommodating portion 3311 for crimping the radio frequency electronic components, the other side is the mounting surface 3322 for forming a transmission channel T between the crimping surface 3321 and the mounting surface 3322 relative to the antenna tester 32; The dielectric coefficient can be 1.06~1.03, more preferably, the dielectric coefficient is 1.03~1, the dielectric coefficient of the anti-interference pressure member 332 is low, especially the interference to the millimeter wave wireless signal is small, and the transmission of the wireless signal can be reduced. the loss.

In addition, a frame made of non-shielding material (not shown in the figure) can be installed on the peripheral side, top surface or bottom surface of the anti-disturbing pressing member 332 according to the operation requirements, and the frame avoids the transmission channel T to ensure that the wireless signal transmission is free from interference. .

Of course, when the joint mechanism 33 has the use requirements of crimping and transfer, at least one pick-up piece can be provided on the anti-disturbance pressure piece 332 or its peripheral side, and the pick-up piece is assembled on the carrier 331 for picking and placing the radio frequency electronic components; In other words, when the joint mechanism 33 has the requirement of crimping, it is not necessary to arrange a pick-up member on the carrier 331; Place and transfer RF electronic components.

Referring to FIG. 3 , the joint mechanism 33 uses a pick-up member 333 to absorb a radio frequency electronic component 40 to be tested. One side of the radio frequency electronic component 40 has a plurality of contacts 41 , and the other side has an antenna 42 , and the antenna 42 is located under the pressure of the radio frequency electronic component 40 . Below the connection position; the carrier 331 of the joint mechanism 33 is displaced in the XZ direction to move and place the RF electronic component 40 to be tested on the test seat 312 (ie the test station) of the electrical tester 31. The contact 41 is initially electrically contacted with the probe 313 of the test seat 312 , and the test seat 312 absorbs the radio frequency electronic element 40 through the air suction hole 314 to limit the position.

However, in order to make the contact 41 of the radio frequency electronic component 40 contact the probe 313 of the test seat 312, the carrier 331 of the joint mechanism 33 drives the anti-interference pressing member 332 to move in the Z direction, so that the crimping surface of the anti-disturbing pressing member 332 is displaced. The 3321 crimps the crimping position of the radio frequency electronic component 40 with a preset crimping force, so that the contact 41 of the radio frequency electronic component 40 contacts the probe 313 of the test seat 312. The electrical testing operation; furthermore, the direction to be tested of the antenna 42 of the RF electronic component 40 is 0°, and the angle L of the operating axis L of the signal operation member 321 of the antenna tester 32 is the same as the direction to be tested of the RF electronic component 40 and is 0° , although the anti-disturbance pressure member 332 of the joint mechanism 33 is located between the antenna 42 of the radio frequency electronic component 40 and the antenna tester 32, because the anti-disturbance pressure member 332 is made of a shielding material, its dielectric coefficient is 1.03~1, and the anti-disturbance pressure member 332 is made of a shielding material. Therefore, when the mounting surface 3322 of the anti-interference pressing member 332 is opposite to the antenna tester 32, the transmission channel T of the anti-interference pressing member 332 can be made to be opposite to the antenna tester 32 at When the antenna 42 of the RF electronic component 40 of the test station is directed to 0° to be tested and sends out a beam to transmit wireless signals , under the requirement that the anti-interference pressure member 332 has low dielectric coefficient and low loss, the wireless signal is transmitted to the antenna tester 32 through the transmission channel T of the anti-disturbance pressure member 332, and the signal operation member 321 of the antenna tester 32 receives the radio frequency The wireless signal of the electronic component 40 is used to perform the wireless signal test operation. The antenna tester 32 transmits the received wireless signal to the processor of the central control device (not shown in the figure) for the processor to analyze and determine the radio frequency. Whether the strength of the wireless signal emitted by the direction to be measured of the electronic component 40 meets the standard; if so, the radio frequency electronic component 40 is judged to be a good product; Therefore, the joint mechanism 33 of the testing device 30 can not only crimp the RF electronic components 40 to ensure the quality of the electrical testing operation, but also enable the wireless signal testing operation to be performed smoothly, thereby improving the production efficiency.

Please refer to FIGS. 4 and 5 , the second embodiment of the testing device 30 of the present invention is different from the first embodiment in that the antenna tester 32 is assembled on a carrier 331 of the joint mechanism 33 , and a signal channel is opened inside the carrier 331 3312, one end of the signal channel 3312 is used for assembling the antenna tester 32, and the other end is equipped with an anti-interference pressing member 332, the mounting surface 3322 of the anti-interference pressing member 332 is opposite to the antenna tester 32, and the crimping surface 3321 is used for relative to the RF electronic The element 40, the transmission channel T of the anti-disturbing pressure member 332 can pass the wireless signal; in this embodiment, after the radio frequency electronic element 40 is moved into the electrical tester 31, the carrier 331 of the joint mechanism 33 drives the antenna tester 32 and the anti-interference device 31. The pressure disturbing member 332 is displaced in the Z direction synchronously, so that the crimping surface 3321 of the anti-disturbing pressure member 332 is pressed against the radio frequency electronic element 40 with a predetermined crimping force, so that the contact 41 of the radio frequency electronic element 40 is indeed in contact with the electrical tester 31 . The probe 313 is used to perform electrical testing operations, and is used for the antenna of the radio frequency electronic component 40 The wireless signal from 42 is transmitted to the antenna tester 32 through the transmission channel T of the anti-disturbing pressure member 332, so that the antenna tester 32 receives the wireless signal of the radio frequency electronic component 40, and then performs the wireless signal test operation.

Please refer to FIGS. 6 and 7 , the test device 30 of the present invention is provided with at least one adjuster on the first platform 34 or the second platform for adjusting the placement position or angle of the electrical tester 31 or the antenna tester 32 ; In an embodiment, the test device 30 is provided with an adjuster 36 on the first platform 34 , and the first platform 34 is equipped with an electrical tester 31 for adjusting the placement position or angle of the electrical tester 31 so that the antenna 42 of the radio frequency electronic component 40 can be adjusted. Execute wireless signal test operations with different preset directions, so as to reduce the configuration quantity of the antenna tester 32 and save costs; in addition, the adjuster 36 can be a mechanical arm or a rotating shaft, or includes a plurality of adjustment rods to adjust the electrical test The device 31 and the radio frequency electronic components 40 on it are placed at the angle required for the test operation (eg 0° , 30° or 45°), for example, a plurality of adjusting rods can be combined to act at different heights to drive and adjust the first platform 34 .

Furthermore, when the adjuster 36 drives the first platform 34 and the electrical tester 31 to adjust the placement angle synchronously, the joint mechanism 33 can act independently, and the carrier 331 adjusts the anti-locking mechanism depending on the placement angle of the electrical tester 31 . The placement angle of the disturbing member 332; however, the engagement mechanism 33 can also be arranged on the first platform 34, and the first platform 34, the electrical tester 31 and the engagement mechanism 33 are driven by the adjuster 36 to adjust the placement angle synchronously; In the embodiment, the carrier 331 of the joint mechanism 33 is arranged on the first platform 34 and is displaced in a plurality of directions , when picking and unloading materials, the carrier 331 drives the anti-disturbing pressure member 332 to perform linear displacement or rotational displacement to avoid the conveyor (not shown in the figure), so as to facilitate the conveyor to pick and place the radio frequency electronic components 40 in the electrical tester 31; During testing, the adjuster 36 drives the first platform 34 , the electrical tester 31 and the radio frequency electronic component 40 to adjust the placement angle synchronously However, under the condition that the anti-interference range of the anti-interference pressure member 332 is greater than the range of the radio frequency electronic component 40 to be measured, the antenna 42 of the radio frequency electronic component 40 is directed towards the 30° direction to be measured to transmit wireless signals, and the carrier 331 is used to drive the anti-interference The tampering element 332 presses the radio frequency electronic element 40 with a predetermined crimping force to perform an electrical test operation, and the wireless signal sent by the antenna 42 of the radio frequency electronic element 40 is transmitted to the antenna tester 32 through the anti-interference crimping element 332 , so that the The signal operation part 321 of the antenna tester 32 receives the wireless signal of the radio frequency electronic component 40, and then performs the wireless signal test operation.

Please refer to FIG. 8 , the fourth embodiment of the test device 30 of the present invention. The test device 30 further includes a test chamber. The electrical tester 31 , the antenna tester 32 and the joint mechanism 33 are located in the test chamber during testing. The test chamber may be a test chamber. An independent box chamber with a door panel, or a box cover with a door panel is fixed on the machine table, and a test room is formed between the box cover and the machine table, or an outer cover that can be displaced in the Z direction is arranged above the machine table, When the outer cover is placed on the machine, a test room is formed between the outer cover and the machine; in this embodiment, the test device 30 is fixed on the machine 50 with a box cover 371 with a door 372, and the box cover 371 and A test chamber 373 is formed between the machines 50. The test chamber 373 is provided with at least one delivery pipe 374 that can input a fluid with a predetermined temperature, so that the test chamber 373 forms a test environment that simulates the temperature of the application site of the RF electronic components in the future; an electrical tester 31 and the bonding mechanism 33 are arranged on the machine 50 in the test chamber 373, and the carrier 331 of the bonding mechanism 33 is displaced in a plurality of directions (such as XZ directions), so as to avoid the conveyor 52 and the radio frequency electronic components 40 that can be crimped, The antenna tester 32 is disposed on the top plate 375 of the test chamber 373 ; when a conveyor 52 moves the RF electronic component 40 to be tested into the test chamber 373 , the carrier 331 is displaced in the XZ direction to avoid the conveyor 52 for conveyance The device 52 moves the radio frequency electronic component 40 into the test station of the electrical tester 31 , and the joint mechanism 33 drives the anti-interference pressing member 332 to press the radio frequency electronic component 40 with the carrier 331 to perform the electrical test operation, and supply the radio frequency electronic component 40 The wireless signal from the antenna 42 is transmitted to the antenna tester 32 through the anti-interference pressure member 332, so that the antenna tester 32 receives the wireless signal of the radio frequency electronic component 40, and then performs the wireless signal test operation; therefore, the test device 30 can make the radio frequency The electronic component 40 performs wireless signal testing and electrical testing in the testing room 373 .

Please refer to FIG. 9 , a fifth embodiment of the test device 30 of the present invention. The test device 30 further includes a test chamber. An electrical tester 31 , an antenna tester 32 and a joint mechanism 33 are located in the test chamber during testing. The electrical tester 31 is located in the test chamber. Disposed on the machine 50 in the test room, the joint mechanism 33 is disposed above the electrical tester 31, the carrier 331 can be displaced in a plurality of directions (such as the XZ direction), and a signal channel 3312 and a signal channel 3312 are arranged inside. One end is for assembling the antenna tester 32, and the other end is for assembling the anti-turbulence pressure piece 332 , the mounting surface 3322 of the anti-interference pressing member 332 is opposite to the antenna tester 32, and the pressing surface 3321 is for the antenna 42 opposite to the radio frequency electronic component 40, and the anti-disturbing pressing member 332 can pass wireless signals; A carrier is set on one side of the electrical tester 31 to carry the radio frequency electronic components; in this embodiment, two carriers 381 and 382 which are displaced in the Y direction are set on the side of the electrical tester 31 for carrying the RF to be tested. The electronic component 40 and the tested RF electronic component 40; when a carrier 381 carries the RF electronic component 40 to be tested to the side of the electrical tester 31, the carrier 331 of the joint mechanism 33 drives the pickup 333 to move in the XZ direction , let the pickup 333 take out the RF electronic component 40 to be tested on a carrier 381, and move it into the electrical tester 31, the carrier 331 drives the anti-disturbance pressure piece 332 and the antenna tester 32 to move in the Z direction, and to prevent interference The pressing piece 332 is pressed against the radio frequency electronic component 40 to perform the electrical test operation, and the wireless signal sent by the antenna 42 of the radio frequency electronic component 40 is transmitted to the antenna tester 32 through the anti-interference pressing piece 332, so that the antenna tester 32 can receive the radio frequency The wireless signal of the electronic component 40 is used to perform the wireless signal test operation. After the test is completed, the pickup 333 of the joint mechanism 33 transfers the tested RF electronic component 40 of the electrical tester 31 to another carrier 382 for discharging.

Please refer to Figures 2 and 10, which are schematic diagrams of the test device 30 of the present invention applied to test equipment , including the machine 50, the feeding device 60, the receiving device 70, the testing device 30 of the present invention, the conveying device 80 and the central control device (not shown in the figure); the feeding device 60 is arranged on the machine 50, and is set There is at least one feeding and receiving device 61 for accommodating the RF electronic components to be tested; the receiving device 70 is arranged on the machine table 50, and is provided with at least one receiving and receiving device 71 for accommodating the tested RF electronic components; the present invention The testing device 30 is disposed on the machine 50 and includes an electrical tester 31, an antenna tester 32 and a joint mechanism 33 for crimping RF electronic components, and performing electrical testing operations and wireless signal testing operations on the RF electronic components , in this embodiment, the testing device 30 is respectively disposed on the first side and the second side of the machine 50; the conveying device 80 is disposed on the machine 50, and is provided with at least one conveyor for conveying the radio frequency electronic components, In this embodiment, the conveying device 80 is provided with a first conveyor 81 for displacement in the XYZ direction. The first conveyor 81 takes out the RF electronic components to be tested from the feeding device 60 and transfers them to the second carrier. Two conveyors 82, the third conveyor 83 of the conveying device 80 picks and places the RF electronic components to be tested and the tested RF electronic components on the second conveyor 82 and the electrical tester 31 of the testing device 30, the first conveyor 81 and then take out the tested RF electronic components from the second conveyor 82, and according to the test results, transfer the tested RF electronic components to the receiving device 70 for classification and storage; the central control device is used to control and integrate each The device is activated to perform automated operations to achieve practical benefits of improving operational efficiency.

[acquaintance] 10: RF Electronic Components 11: Contact 12: Antenna 21: circuit board 22: Test seat 221: Probe 23: Antenna Tester [this invention] 30: Test device 31: Electrical tester 311: circuit board 312: Test seat 313: Probe 314: exhaust hole 32: Antenna Tester 321: Signal operation piece L: Working axis 33: Engagement mechanism 331: Carrier 3311: accommodating part 3312: Signal channel 332: Anti-interference pressure parts 3321: Crimp face 3322: Assembly Surface T: transmission channel 333: Pickup 34: First Platform 35: Second Platform 36: Adjuster 371: Box Cover 372: Door Panel 373: Test Room 374: Delivery Tube 375: Top Plate 381, 382: stage 40: RF Electronic Components 41: Contact 42: Antenna 50: Machine 52: Conveyor 60: Feeding device 61: Feed holder 70: Receiving device 71: Receiving holder 80: Conveying device 81: First Conveyor 82: Second conveyor 83: Third Conveyor

Figure 1: A schematic diagram of the use of a conventional test device. FIG. 2 is a schematic diagram of the first embodiment of the testing device of the present invention. FIG. 3 is a schematic diagram of the use of the first embodiment of the testing device of the present invention. FIG. 4 is a schematic diagram of the second embodiment of the testing device of the present invention. FIG. 5 is a schematic diagram of the use of the second embodiment of the testing device of the present invention. FIG. 6 is a schematic diagram of a third embodiment of the testing device of the present invention. FIG. 7 is a schematic diagram of the use of the third embodiment of the testing device of the present invention. FIG. 8 is a schematic diagram of the use of the fourth embodiment of the testing device of the present invention. FIG. 9 is a schematic diagram of the use of the fifth embodiment of the testing device of the present invention. FIG. 10 is a schematic diagram of the application of the testing device of the present invention to testing equipment.

30: Test device

31: Electrical tester

313: Probe

32: Antenna Tester

33: Engagement mechanism

331: Carrier

3312: Signal channel

332: Anti-interference pressure parts

3321: Crimp face

T: transmission channel

40: RF Electronic Components

41: Contact

42: Antenna

Claims (12)

A radio frequency electronic component testing device, comprising: Electrical tester: a circuit board with electrical connections and at least one test socket, the test socket for Electrically connect at least one of the RF electronic components located at the test station to Perform electrical testing operations on the RF electronic components; Antenna tester: It is provided with at least one signal operation element for executing the RF electronic components Wireless signal test operation; Joint mechanism: a carrier and an anti-disturbance pressure piece are provided, the carrier is used for assembling the anti-disturbance pressure piece, The anti-disturbance pressure piece has a crimping surface, so that the carrier can carry the anti-disturbance pressure piece Located between the antenna tester and the radio frequency electronic component, the anti-interference pressure component Apply a crimping force to the RF electronic component. The radio frequency electronic component testing device according to claim 1, wherein the carrier of the joint mechanism is provided with at least one pick-up member on the anti-interference pressure member or its peripheral side for picking and placing the radio frequency electronic component. The radio frequency electronic component testing device as claimed in claim 1, the bearing of the joint mechanism A device for assembling the antenna tester and the anti-interference pressure piece. The radio frequency electronic component testing device according to claim 1, wherein the anti-turbulence pressure member of the joint mechanism is made of anti-shielding material and has a low dielectric coefficient. The radio frequency electronic component testing device according to claim 1, wherein the anti-interference range of the anti-interference pressure member of the joint mechanism is larger than the to-be-measured directional range of the radio frequency electronic component. The radio frequency electronic component testing device as claimed in claim 1, wherein one side of the anti-interference pressing member of the joint mechanism is used as the crimping surface for crimping the radio frequency electronic component, and the other side is an assembly surface for relative to the radio frequency electronic component. In the antenna tester, a transmission channel is formed between the crimping surface and the assembling surface. The radio frequency electronic component testing device according to claim 1, wherein the electrical tester of the joint mechanism is mounted on the first platform, and the antenna tester is mounted on the second platform. The radio frequency electronic component testing device according to claim 7, wherein the electrical tester and the joint mechanism are assembled on the first platform. The radio frequency electronic component testing device according to claim 7, wherein the first platform or the second platform is provided with at least one adjuster for adjusting the placement position or angle of the electrical tester or the antenna tester. The radio frequency electronic component testing device according to any one of claims 1 to 9, further comprising a testing room, for the electrical tester, the antenna tester and the joint mechanism to be located in the testing room during testing. The radio frequency electronic component testing device as claimed in claim 10, wherein the test chamber is provided with a stage on one side of the electrical tester, so as to carry the radio frequency electronic components. A test device comprising: Machine; Feeding device: It is arranged on the machine and is provided with at least one accommodating radio frequency electronic component to be tested. the feed holder; Receiving device: It is arranged on the machine, and is equipped with at least one accommodating radio frequency electronic component that has been tested. the receiver; At least the radio frequency electronic component testing device as described in claim 1: disposed on the machine; Conveying device: it is arranged on the machine and has at least one conveyor for conveying radio frequency Electronic component; Central control device: to control and integrate the actions of various devices to perform automated operations.

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