TWI398653B - A test device and test machine for preventing electromagnetic interference - Google Patents

Description

Test device and test machine for preventing electromagnetic interference

The invention relates to a test device and a test machine for preventing electromagnetic interference, in particular to a test device capable of shielding electronic components generated by an electronic component to be tested during testing to avoid affecting an external space and having the test device. Test machine.

From mobile phones, wireless network cards, Bluetooth headset devices, etc., as long as it is a device that needs to transmit and receive signals, almost all use RF ICs, and relatively test the RF integrated circuit chips at this stage. The demand is gradually increasing. At present, the traditional automated test machine used to test ICs can be roughly divided into analog signals provided by the test stand, analog test of output signals of each output pin, and actual functional boards and peripherals, and ICs to be tested. Position, put the IC to be tested into the actual test in the actual use environment.

In the current industry, it is the reality test that conforms to the use environment, that is, the vacancy of the IC to be tested is left alone, and the IC under test fills the measured position, and the actual machine is tested according to the state of use, which can be easily obtained. The reaction state of the IC under test in the actual use environment, and knowing whether the IC to be tested is available for actual installation, may also be referred to as system level test. For example, if the IC to be measured is applied to a mobile phone, the test circuit board of the above-mentioned actual test is a mobile phone circuit board. If the IC to be tested is an IC for a network card, the network card can be used as a test circuit. Boards, no matter what kind of card, are mostly common on the market or already owned by the manufacturer, so the environment for the actual test is not difficult to create.

The general simple RF IC test device uses the method of manually replacing the electronic components to be tested, the test speed is slow, and the test of the electronic components to be tested in the closed space is not only labor-intensive, but also has human factors for test efficiency and test results. It is difficult to faithfully reflect the actual test results. In addition, in terms of packaging and testing operations, some special electronic components (such as RF ICs, microphone ICs, etc.), when tested in an open environment, are susceptible to interference from extremely complex external noises (such as RF electromagnetic waves). And affect the accuracy of its testing, so the electronic components of this class must be isolated from the outside noise in order to effectively improve the accuracy of their testing.

Therefore, if an automatic test machine can be provided and an anti-interference test device is matched with the test ,, the test accuracy and efficiency can be improved, and the test process of the multi-test 一体化 can be integrated.

The object of the present invention is to provide a test device and a test machine for preventing electromagnetic interference, so that when the electronic component to be tested is placed on the transport device, the electronic noise generated by the test can be limited to the outside by a test device. space.

An object of the present invention is to provide a test device and a test machine for preventing electromagnetic interference, and an automatic test machine for improving the test when the electronic component to be tested is tested and has the function of preventing noise interference. Accuracy and efficiency enable the integration of the test process of multiple tests.

The invention relates to a test device and a test machine for preventing electromagnetic interference, which comprises a plurality of test zones, a plurality of conveying devices, a plurality of conveying tracks, a feeding zone, a discharging zone and a group a picking arm, wherein the feeding zone is for providing a carrier having a plurality of electronic components to be tested, and the discharging zone is for providing a carrier having a plurality of electronic components to be tested, and the group is disposed The picking arm is configured to move the electronic component to be tested between the loading zone carrier, the discharge zone carrier and the test zone; and the test zone comprises an upper cover, a driving device, a lower pressing mechanism and a moving device Forming a test space upper cover body on the test area, one side of the upper cover body has an opening for the electronic component to be tested to enter and exit, and an electronic component to be tested is disposed opposite to the opening a moving device that moves between an open position when moving, and a closed position when testing the electronic component to be tested; and the conveying device is provided with a test socket for inserting the electronic component to be tested, and is inside the test space And test runs back and forth outside the space, and a conveying path disposed in the delivery device in the interior space of the outer test volume and test run back and forth path.

More specifically, the test zone is provided with a lower pressing mechanism, which is driven by a driving device, and the pressing mechanism is provided with a lower pressing fixture at a position corresponding to the electronic component to be tested, and the pressing device is The lower pressing mechanism acts to move up and down. Therefore, when the electronic component to be tested is located in the test space and the moving device moves to the closed position, the pressing mechanism is pressed against the electronic component to be tested to perform a test operation, more specifically, The mobile device controls a cylinder to drive the lifting displacement by an electronic signal. Therefore, when the mobile device moves to the open position, the electronic component to be tested is operated by the conveying device inside and outside the test space and outside the test space, and the mobile device moves to When the position is closed, the electronic component to be tested is located in the test space, and the test area is in a close state.

More specifically, the upper cover and the moving device are made of a metal material.

More specifically, the blocking RF electromagnetic wave of the upper cover and the moving device is coated by applying a conductive plating.

The above and other technical contents, features and advantages of the present invention will be apparent from the following detailed description of the preferred embodiments.

Please refer to FIG. 1A and FIG. 1B for a schematic diagram of a test apparatus for testing electromagnetic interference prevention and a test apparatus of a test machine, and a schematic diagram of a simple test plan of the test machine. It can be seen from the figure that the test device for preventing electromagnetic interference mainly includes: A test area 1 includes an upper cover 11, a driving device 12, a lower pressing mechanism 13 and a moving device 15, wherein a test space upper cover 11 is formed on the test area 1, and the upper cover One side of the 11 has an opening 14 for the electronic component 5 to be tested to enter and exit, and an opening position 141 for moving the electronic component 5 to be tested is provided with respect to the opening 14 to test the electronic component 5 to be tested. The moving device 15 is operated between the closed position 142; and the lower pressing mechanism 13 is disposed in the test area 1 for the electronic component 5 to be tested to be located in the test space 16 and the mobile device to move to the closed position 142. The electronic component 5 to be tested is pressed against (refer to FIG. 1A, FIG. 2B and FIG. 2C); a conveying device 2 is provided with a test seat 21 for inserting the electronic component 5 to be tested, and is tested. Inside space 16 and outside test space 16 Running back and forth, and providing a conveying track 3 on the path of the conveying device 2 running inside the test space 16 and outside the test space 16; in addition, the testing machine includes a plurality of test zones 1, a plurality of conveying devices 2, and a plurality of a conveying rail 3, a feeding zone 41, a discharging zone 421, 422, 423 and a set of picking arms 43, wherein the feeding zone 41 is for providing a carrier having a plurality of electronic components to be tested, and the discharging zone 421, 422, 423 is The utility model is provided for providing a carrier having a plurality of electronic components to be tested for testing, and the set of picking arms 43 is used for carrying the electronic component to be tested in the loading tray of the feeding zone 41, the loading tray of the discharging zone 42 and the test zone. Between 1.

It is worth mentioning that when the mobile device 15 is moved to the open position 141, the electronic component 5 to be tested is operated by the transport device 2 inside and outside the test space 16 and outside the test space 16, when the mobile device 15 is moved to the closed position 142. The electronic component 5 to be tested is located in the test space 16, and the test area 1 is in a close state (please refer to FIG. 2B and FIG. 2C).

It is worth mentioning that the pressing mechanism 13 is driven by a driving device 12, and the pressing mechanism 13 is disposed at a position of the electronic component 5 to be tested, and a lower pressing fixture 131 is provided, and the lower pressing fixture 131 is pressed down. The mechanism 12 carries an action lifting displacement for pressing the electronic component 5 to be tested to perform a test operation.

However, if the electronic component 5 to be tested is a small integrated circuit IC, the inside of the test space 16 is considered to exclude the driving device 12, the pressing mechanism 13, and the lower pressing jig 131. For example, when the pickup arm 43 places the electronic component 5 to be tested on the test seat 21 outside the test space 16, at this time, the preparatory action has been completed, and only the transport device 2 is moved into the test space 16, and the mobile device 15 is moved to When the position 142 is closed, the test operation is performed.

It is worth mentioning that the mobile device 15 is driven by an electronic signal to control a lifting cylinder 151 to move up and down, and to operate between the open position 141 and the closed position 142 of the opening 14.

It is worth mentioning that the test of the test stand 21 is to use a test public board, which is tested by the synchronous public board recognized by the electronic component to be tested (commonly known as semiconductor component, IC). The public board is directly tested on each of the electronic components to be tested by the actual public board. The test board and the test stand system are electrically connected to a control processing unit (not shown), and perform data transfer processing. When the electronic component 5 to be tested is pressed, it is electrically connected to the test stand 21 for testing. The test will be classified after the test is completed.

It is worth mentioning that the upper cover 11 and the moving device 15 prevent the radio frequency electromagnetic waves generated from being infiltrated into the external space when the electronic component 5 to be tested is tested, and therefore must be formed by blocking radio frequency electromagnetic waves. : It is made of a metal material or a conductive coating layer applied to the upper cover 11 or the like.

Please refer to FIG. 2A to FIG. 2G for an embodiment of a test apparatus and a test machine for preventing electromagnetic interference according to the present invention. It can be seen from the figure that one of the test methods of the test device is implemented (this embodiment) In the case where the pressing mechanism 13 is provided):

1. The picking arm 43 places the electronic component 5 to be tested on the test socket 21 of the conveying device 2 (please refer to FIG. 2A);

2. When the picking arm 43 is raised, the moving device 15 is moved to the open position 141, and the conveying device 2 carrying the electronic component 5 to be tested is transferred to the upper surface of the test area 1 by a conveying rail 3. 11 (please refer to Figure 2B);

3. After the transport device 2 carrying the electronic component 5 to be tested enters the test space 16, the mobile device 15 is moved to the closed position 142, and the pressing mechanism 13 is lowered and pressed against the electronic component 5 to be tested. At seat 21, and begin the test operation (please refer to Figure 2C);

4. When the test is completed, the mobile device 15 is moved to the open position 141, the pressing mechanism 13 is automatically raised (please refer to FIG. 2D), and the transport device 2 carrying the electronic component 6 is tested by the transport track 3. Transferred (please refer to Figure 2E);

5. The lowering of the electronic component 6 on the transport device 2 (refer to FIG. 2F and FIG. 2G) is carried out by the picking arm 43 and the loading and unloading of the electronic component 6 is completed. The discharge area 421, 422, 423 is completed, and the operation of classifying the electronic components is completed (please refer to FIG. 1B).

It is worth mentioning that when the pressing mechanism is not disposed inside the upper cover body, once the conveying device is transferred to the upper cover body, the mobile device will move to the closed position, and at the same time, the test operation is started, and the test is completed. At this time, the mobile device will move to the open position (not shown).

The test device and the test machine for preventing electromagnetic interference provided by the invention have the following advantages when compared with other conventional technologies:

1. The test device and the test machine for preventing electromagnetic interference according to the present invention are capable of limiting the electronic noise interference generated when the electronic component to be tested carried by the test stand is tested by a closed test mechanism. To the external space.

2. The test device and the test machine for preventing electromagnetic interference according to the present invention, wherein when the test stand is transferred to the closed test mechanism, the closed test mechanism can automatically close the opening to make the test flow in one go.

3. The test device and the test machine for preventing electromagnetic interference of the present invention move the electronic component to be tested in the feeding zone, the discharge zone and the predetermined position in an automated process, which can improve the test efficiency.

4. The test device and the test machine for preventing electromagnetic interference according to the present invention are capable of effectively improving the speed of the automatic test and preventing the electronic noise generated by the test through the multi-test-site closed test mechanism. Interfere with the external space and maintain the test level of each test.

The features and spirit of the present invention will be more apparent from the detailed description of the preferred embodiments. On the contrary, the intention is to cover various modifications and equivalents within the scope of the invention as claimed.

1. . . Test area

11. . . Upper cover

12. . . Drive unit

13. . . Pressing mechanism

131‧‧‧Under pressure fixture

14‧‧‧ openings

141‧‧‧Open position

142‧‧‧Closed position

15‧‧‧Mobile devices

151‧‧‧Cylinder

16‧‧‧Test space

2‧‧‧Conveyor

21‧‧‧ test seat

3‧‧‧Transportation track

41‧‧‧Feeding area

421‧‧‧Drawing area

422‧‧‧Drawing area

423‧‧‧Drawing area

43‧‧‧ pick arm

5‧‧‧Electronic components to be tested

6‧‧‧Complete electronic components

1A is a schematic diagram of a test device for preventing electromagnetic interference and a test device for a test machine;

FIG. 1B is a schematic diagram of a simple planning process of a test device for preventing electromagnetic interference and a test machine for testing a test machine;

2A is a diagram showing an embodiment of a test device and a test machine for preventing electromagnetic interference according to the present invention;

2B is a diagram showing an embodiment of a test device and a test machine for preventing electromagnetic interference according to the present invention;

2C is a diagram showing an embodiment of a test device and a test machine for preventing electromagnetic interference according to the present invention;

2D is a diagram showing an embodiment of a test device and a test machine for preventing electromagnetic interference according to the present invention;

2E is a diagram showing an embodiment of a test device and a test machine for preventing electromagnetic interference according to the present invention;

2F is a diagram of an embodiment of a test device and a test machine for preventing electromagnetic interference according to the present invention;

FIG. 2G is a diagram showing an embodiment of a test device and a test machine for preventing electromagnetic interference according to the present invention.

1. . . Test area

11. . . Upper cover

12. . . Drive unit

13. . . Pressing mechanism

131. . . Pressing fixture

14. . . Opening

15. . . Mobile device

151. . . Pressure cylinder

16. . . Test space

2. . . Conveyor

twenty one. . . Test stand

3. . . Transport track

43. . . Pick arm

5. . . Electronic component to be tested

Claims (14)

A test device for preventing electromagnetic interference, comprising: a test area, wherein a test space is formed on the test area, and one side of the upper cover has an opening for the electronic component to be tested to enter and exit, Providing, relative to the opening, a moving device that moves between an open position when the electronic component to be tested moves and a closed position when the electronic component to be tested is tested; and a conveying device provided with an electronic component to be tested Inserting the test socket and running back and forth inside the test space and outside the test space; thereby, when the mobile device is moved to the open position, the electronic component to be tested is operated by the transport device inside and outside the test space and outside the test space. When the mobile device moves to the closed position, the electronic component to be tested is located in the test space, and the test area assumes a close state. The test device for preventing electromagnetic interference according to claim 1, wherein the test zone is provided with a depression mechanism for when the electronic component to be tested is located in the test space and the mobile device is moved to the closed position. , the electronic component to be tested is pressed against. The apparatus for testing electromagnetic interference prevention according to claim 2, wherein the pressing mechanism is driven by a driving device, and the pressing mechanism is provided with a lower pressing fixture at a position corresponding to the electronic component to be tested. The pressing fixture is lifted and displaced by the pressing mechanism to press the electronic component to be tested to perform the testing operation. A test apparatus for preventing electromagnetic interference according to claim 1, wherein a transport track is disposed on the path of the transport device running inside the test space and outside the test space. A test apparatus for preventing electromagnetic interference according to claim 1, wherein the moving device is driven to move up and down by a cylinder, and operates between an open position and a closed position of the opening. A test apparatus for preventing electromagnetic interference according to claim 1, wherein the mobile device is controlled by an electronic signal to operate between an open position and a closed position of the opening. A test apparatus for preventing electromagnetic interference according to claim 1, wherein the upper cover and the mobile device are made of a metal material. A test machine for preventing electromagnetic interference, comprising: a feeding area for providing a carrier having a plurality of electronic components to be tested; and a discharging area for providing a plurality of measuring ends to be tested a carrier for electronic components; a set of pick-up arms for moving the electronic components to be tested in the loading tray of the feeding zone, the loading tray of the discharge zone and the test section; a plurality of test zones, one test formed on each test zone a cover above the space, one side of the upper cover has an opening for the electronic component to be tested to enter and exit, and an open position of the electronic component to be tested is moved relative to the opening, and the test is to be tested a moving device for moving between the closed positions of the electronic components; a plurality of conveying devices each having a test socket for inserting the electronic component to be tested, and running inside and outside the test space and outside the test space; Therefore, when the picking arm moves the electronic component to be tested from the loading tray of the feeding zone to the testing zone, it is taken by the conveying device with the test seat, and when the moving device moves to the open position, the electronic component to be tested is transported by the loading device. Sended to the inside of the test space, when the mobile device moves to the closed position, the electronic component to be tested is located in the test space for testing, and the finished electronic component is sent to the outside of the test space by the transport device, and the picking arm moves the electronic component and classifies it. The carrier in the discharge area. A test machine for preventing electromagnetic interference according to claim 8, wherein the test zone is provided with a lower pressure mechanism for the electronic component to be tested to be located in the test space and the mobile device is moved to the closed position. At this time, the electronic component to be tested is pressed. The test machine for preventing electromagnetic interference according to claim 9, wherein the pressing mechanism is driven by a driving device, and the pressing mechanism is provided with a lower pressing fixture at a position corresponding to the electronic component to be tested. The pressing tool is lifted and displaced by the pressing mechanism to press the electronic component to be tested to perform the testing operation. A test machine for preventing electromagnetic interference according to the invention of claim 8, wherein a transport track is disposed on the path of the transport device running inside the test space and outside the test space. A test machine for preventing electromagnetic interference according to the invention of claim 8, wherein the moving device is driven to be moved up and down by a cylinder, and operates between an open position and a closed position of the opening. A test apparatus for preventing electromagnetic interference according to claim 8, wherein the mobile device is controlled by an electronic signal to operate between an open position and a closed position of the opening. A test machine for preventing electromagnetic interference according to claim 8, wherein the upper cover and the mobile device are made of a metal material.