TW202122813A - Radio frequency electric component test device and test operation equipment applying the same achieving the practical benefit of increasing the test yield - Google Patents
Radio frequency electric component test device and test operation equipment applying the same achieving the practical benefit of increasing the test yield Download PDFInfo
- Publication number
- TW202122813A TW202122813A TW108144567A TW108144567A TW202122813A TW 202122813 A TW202122813 A TW 202122813A TW 108144567 A TW108144567 A TW 108144567A TW 108144567 A TW108144567 A TW 108144567A TW 202122813 A TW202122813 A TW 202122813A
- Authority
- TW
- Taiwan
- Prior art keywords
- radio frequency
- test
- frequency electronic
- tester
- electronic component
- Prior art date
Links
Images
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
Abstract
Description
本發明係提供一種射頻電子元件的測試裝置。The invention provides a testing device for radio frequency electronic components.
在現今,行動通訊區域無線網路系統、無線通訊區域網路系統或藍芽無線個人網路系統等,於增加資料傳輸速度的需求下,一內建有天線之射頻電子元件即為前述通訊系統之重要應用;天線的發射場型依應用場所而有不同,例如偶極天線具有全指向性發射場型,應用於終端設備,使終端設備可接收不同指向之波束所傳輸的無線訊號;例如無線網路接取器之天線,則需要能夠產生特定指向(如0°、45°或21°指向)的發射場型,而接收特定位置之設備所發射的無線訊號。目前射頻電子元件係於二面分別設置接點及天線,或者於同一面設置接點及天線,利用調節天線的相位及波束成形技術,進而調整發射場型,亦即使天線陣列於特定指向的發射/接收無線訊號一致地疊加,進而產生最佳發射/接收之波束;因此,如何測試射頻電子元件之天線對於預設指向的無線訊號傳輸效能,進而淘汰出不良品,即為業者研發之標的。Nowadays, in order to increase the data transmission speed of mobile communication area wireless network system, wireless communication area network system or Bluetooth wireless personal network system, etc., a radio frequency electronic component with built-in antenna is the aforementioned communication system The important application; the antenna's transmitting field type varies according to the application site, for example, the dipole antenna has an omnidirectional transmitting field type, which is applied to terminal equipment so that the terminal equipment can receive the wireless signals transmitted by beams of different directions; such as wireless The antenna of the network access device needs to be able to generate a specific directional (such as 0°, 45°, or 21° directional) transmitting field type, and receive the wireless signal emitted by the device at a specific location. At present, radio frequency electronic components are equipped with contacts and antennas on two sides, or on the same side. The phase and beamforming technology of the antenna are adjusted to adjust the transmission field pattern, even if the antenna array emits in a specific direction. /Receiving wireless signals are uniformly superimposed to produce the best transmitting/receiving beam; therefore, how to test the transmission performance of the radio frequency electronic component's antenna to the wireless signal transmission performance of the preset direction, and then eliminate the defective products, is the target of the industry's research and development.
本發明之目的一,係提供一種射頻電子元件測試裝置,包含天線測試單元及電性測試單元,該天線測試單元係設置移載臂及天線測試器,天線測試器由移載臂帶動作至少一方向位移,以供對位於測試工位之射頻電子元件的天線接收或發射無線訊號,該電性測試單元係設有具電路板及接合部件之電性測試器,並以接合部件供電性連接位於測試工位之射頻電子元件;藉以於電性測試單元對位於測試工位之射頻電子元件執行電性測試作業時,同步利用天線測試單元對測試工位之射頻電子元件的天線進行無線訊號測試作業,達到提升測試產能之實用效益。The first object of the present invention is to provide a radio frequency electronic component test device, including an antenna test unit and an electrical test unit. The antenna test unit is provided with a transfer arm and an antenna tester, and the antenna tester is driven by the transfer arm to move at least one Directional displacement for receiving or transmitting wireless signals to the antenna of the radio frequency electronic component at the test station. The electrical test unit is equipped with an electrical tester with a circuit board and a joint part, and the joint part is electrically connected to the Radio frequency electronic components of the test station; when the electrical test unit performs electrical testing operations on the radio frequency electronic components located in the test station, the antenna test unit is used to simultaneously perform wireless signal test operations on the antenna of the radio frequency electronic component of the test station , To achieve the practical benefits of improving test productivity.
本發明之目的二,係提供一種射頻電子元件測試裝置,更包含載具,以供裝配電性測試器,載具係作線性位移或旋轉位移,並視作業需求,而帶動電性測試器及射頻電子元件依第二測試路徑位移,達到提升測試使用效能之實用效益。The second objective of the present invention is to provide a radio frequency electronic component test device, which further includes a carrier for assembling an electrical tester. The carrier is linearly displaced or rotationally displaced, and drives the electrical tester and The radio frequency electronic component is displaced according to the second test path to achieve the practical benefit of improving the test efficiency.
本發明之目的三,係提供一種射頻電子元件測試裝置,更包含測試室,不僅可防止外部雜訊,並供射頻電子元件位於模擬應用場所溫度測試環境執行測試作業,達到提升測試品質之實用效益。The third objective of the present invention is to provide a radio frequency electronic component testing device, which also includes a test room, which not only prevents external noise, but also allows radio frequency electronic components to be located in a simulated application site temperature test environment to perform test operations, thereby achieving practical benefits of improving test quality .
本發明之目的四,係提供一種射頻電子元件測試裝置,更包含承座,承座係承置射頻電子元件位於測試工位,以使電性測試器及天線測試器對承座上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業 ,達到提升測試產能之實用效益。The fourth object of the present invention is to provide a radio frequency electronic component testing device, which further includes a socket. The socket holds the radio frequency electronic component at the test station, so that the electrical tester and the antenna tester are on the socket and located on the test station. The radio frequency electronic components of the station perform electrical test operations and wireless signal test operations , To achieve the practical benefits of improving test productivity.
本發明之目的五,係提供一種射頻電子元件測試裝置,其移載臂係設有訊號通道及至少一作業治具,訊號通道供裝配天線測試器,作業治具係供拾取射頻電子元件位於測試工位,不僅可依第一測試路徑移載射頻電子元件 ,並供電性測試器及天線測試器對移載臂上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業,達到提升測試產能之實用效益。The fifth object of the present invention is to provide a radio frequency electronic component test device, the transfer arm is provided with a signal channel and at least one work fixture, the signal channel is used for assembling the antenna tester, and the work fixture is used for picking up the radio frequency electronic components in the test Work station, not only can transfer radio frequency electronic components according to the first test path , And the power tester and antenna tester perform electrical test operations and wireless signal test operations on the radio frequency electronic components on the transfer arm and located in the test station to achieve the practical benefits of improving test productivity.
本發明之目的六,係提供一種射頻電子元件測試裝置,其天線測試單元可視作業需求,而配置天線調整器,以供裝配天線測試器,利用天線調整器調整天線測試器之擺置位置或角度,以利測試不同指向之射頻電子元件,進而有效縮減天線測試器之配置數量,達到節省天線測試器成本之實用效益。The sixth object of the present invention is to provide a radio frequency electronic component test device, the antenna test unit of which can be equipped with an antenna adjuster according to operational requirements for assembling the antenna tester, and the antenna adjuster is used to adjust the position or angle of the antenna tester , In order to facilitate the testing of radio frequency electronic components of different directions, thereby effectively reducing the number of antenna testers, and achieving the practical benefit of saving the cost of antenna testers.
本發明之目的七,係提供一種射頻電子元件測試裝置,其電性測試單元可視作業需求,而配置電性調整器,以供裝配電性測試器,利用電性調整器調整電性測試器及射頻電子元件的擺置位置或角度,以利測試不同指向之射頻電子元件,亦可有效縮減天線測試器之配置數量,達到節省天線測試器成本之實用效益。The seventh objective of the present invention is to provide a radio frequency electronic component test device, the electrical test unit of which can be configured with an electrical adjuster according to operational requirements for assembling the electrical tester, and the electrical adjuster is used to adjust the electrical tester and The placement or angle of the radio frequency electronic components facilitates the testing of radio frequency electronic components of different orientations. It can also effectively reduce the number of antenna testers and achieve the practical benefit of saving the cost of antenna testers.
本發明之目的八,係提供一種測試作業設備,包含機台、供料裝置、收料裝置、本發明測試裝置、輸送裝置及中央控制裝置;供料裝置係配置於機台上,並設有至少一容納待測射頻電子元件之供料承置器;收料裝置係配置於機台上,並設有至少一容納已測射頻電子元件之收料承置器;本發明測試裝置係配置於機台上,包含天線測試單元及電性測試單元,以對射頻電子元件執行電性測試作業及無線訊號測試作業;輸送裝置係配置於機台上,並設有至少一輸送器,用以輸送射頻電子元件;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。The eighth object of the present invention is to provide a test operation equipment, including a machine, a feeding device, a receiving device, a test device of the present invention, a conveying device, and a central control device; the feeding device is arranged on the machine and equipped with At least one feeding holder for accommodating the radio frequency electronic component to be tested; the receiving device is arranged on the machine, and is provided with at least one receiving holder for accommodating the measured radio frequency electronic component; the test device of the present invention is arranged on The machine platform includes an antenna test unit and an electrical test unit to perform electrical test operations and wireless signal test operations on radio frequency electronic components; the conveying device is arranged on the machine platform and is equipped with at least one conveyor for conveying Radio frequency electronic components; the central control device is used to control and integrate the actions of various devices to perform automated operations and achieve practical benefits of improving operational performance.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如后。In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given with the drawings, and the details are as follows.
請參閱第1圖,本發明測試裝置10之第一實施例,測試裝置10包含天線測試單元及電性測試單元。Please refer to Fig. 1, a first embodiment of the
該天線測試單元包含移載臂11及天線測試器12,更包含測試室,更進一步,可於面板與箱體之間形成測試室,或者一外罩罩置於面板而形成測試室,面板可為機台板或機架板,箱體或面板可開設輸送通道,亦可於輸送通道處設置可啟閉之門板;於本實施例中,測試裝置10係於箱體13與機台板31之間形成測試室131,以供射頻電子元件(圖未示出)位於模擬應用場所溫度之測試環境,另於箱體13設有輸送通道132及至少一輸送管133,輸送通道132供移入/移出射頻電子元件,輸送管133以供輸入具預設溫度之乾燥流體至測試室131,使測試室131保持預設溫度及防結露。The antenna test unit includes a
該移載臂11係作至少一方向位移,以供裝配天線測試器12,更進一步,移載臂11可為架體或轉軸,並裝配於機架或箱體13,而由第一驅動源(圖未示出)驅動位移或旋轉,移載臂11可作線性位移或旋轉位移,亦或作線性位移及旋轉位移,例如移載臂11依第一測試路徑作Z方向位移或X-Y-Z方向位移移載天線測試器12,例如移載臂11依第一測試路徑作角度旋轉及作Z方向位移移載天線測試器12;又移載臂11係設有作業治具及訊號通道,作業治具係供拾取射頻電子元件位於測試工位,訊號通道係供裝配天線測試器12,且供通過無線訊號,移載臂11不僅可依第一測試路徑移載射頻電子元件,並供天線測試器12及電性測試單元分別對移載臂11上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業,移載臂11與電性測試單元之電性測試器可作相對位移;於本實施例中,移載臂11係裝配於箱體13,並以第一驅動源(圖未示出)驅動作Z方向位移,移載臂11係為架體,並於內部設有訊號通道111,以供裝配天線測試器12,且供通過無線訊號。The
至少一天線測試器12係裝配於移載臂11,以供對位於測試工位之射頻電子元件的天線執行無線訊號測試作業,例如天線測試器12對射頻電子元件執行接收無線訊號之作業,例如天線測試器12對射頻電子元件執行發射測試用無線訊號之作業,例如天線測試器12對射頻電子元件執行接收及發射無線訊號之作業;又天線測試器12可連接一獨立之處理器(圖未示出),以將接收射頻電子元件的無線訊號傳輸至處理器,或者將處理器之測試用無線訊號發射至射頻電子元件,該處理器亦可為中央控制裝置(圖未示出)之處理器;再者,天線測試器12之作業軸線L位於預設指向,作業軸線L之角度可相同或偏近於射頻電子元件之待測指向(如0°、45°或30°指向),以接收射頻電子元件之待測指向所發出波束的無線訊號,或朝向射頻電子元件之待測指向發出測試用無線訊號;於本實施例中,天線測試器12係裝配於移載臂11之訊號通道111,天線測試器12之作業軸線L角度係位於預設之0°指向。At least one
測試裝置10可依測試作業需求而變換天線測試器12之配置數量,天線測試器12可採固定式配置或活動式配置,例如天線測試器12可固設於測試室131,例如天線測試器12可搭配天線調整器(圖未示出)而裝配於移載臂11,以調整擺置位置或角度,天線調整器可為機械手臂、轉軸、滑軌組或包含複數個調整桿件,可視作業需求,以帶動天線測試器12依待測指向所需而位移調整擺置位置或角度,亦或於原軸向旋轉調整擺置角度,以利天線測試器12測試不同待測指向(如0°、45°或30°指向)之射頻電子元件,進而有效縮減天線測試器之配置數量及節省成本。再者,天線測試單元可依測試作業需求,而於天線測試器12與測試工位之間設有至少一中介器(圖未示出),中介器可為菱鏡或折射元件等,中介器係於射頻電子元件與天線測試器12之間轉送傳輸無線訊號。The
該電性測試單元係設置具電路板211及接合部件212之電性測試器21,其接合部件212供電性連接位於測試工位之射頻電子元件而執行電性測試作業;更進一步,電性測試器21可位於測試室131、載具或移載臂11,電性測試器可採固定式配置或活動式配置,例如電性測試器21可作固定式配置於測試室131;例如電性測試器21可裝配於載具或移載臂11而作至少一方向位移;更進一步,電性測試器21可搭配電性調整器(圖未示出),而調整擺置位置或角度
,電性調整器可為機械手臂、轉軸、滑軌組或包含複數個調整桿件,可視作業需求,以帶動電性測試器21及射頻電子元件依待測指向所需而位移調整擺置位置或角度,亦或於原軸向調整擺置呈不同角度,以利測試不同指向(如0°、45°或30°指向)之射頻電子元件,進而有效縮減天線測試器12之配置數量及節省成本;於本實施例中,電性測試器21係設有電路板211及具接合部件212之測試座213,測試座213設有供承置射頻電子元件之容置部2131,接合部件212之一端電性連接電路板211,另一端則供電性連接射頻電子元件。The electrical test unit is provided with an
以電性測試器21配置於載具而言,測試裝置10更包含載具,以供裝配電性測試器,載具可為載座、轉盤或升降器等,以供承置電性測試器21,並由第二驅動源驅動作線性位移或旋轉位移,第二驅動源可為線性馬達、壓缸或包含馬達及傳動器,並視作業需求,而帶動電性測試器21依第二測試路徑位移,使電性測試器21移入/移出測試室131;於本實施例中,載具係為載座41,載座41設有擋板411及承板412,擋板411係供啟閉箱體13之輸送通道132,承板412則供承置電性測試器21,第二驅動源42係驅動載座41依第二測試路徑且經由箱體13之輸送通道132移入/移出測試室131,使電性測試器21承載射頻電子元件移入/移出測試室131。As far as the
又該測試工位可位於測試室131、移載臂11或承座(圖未示出),依不同測試作業需求而定,不受限於本實施例;例如測試工位可位於測試室131,電性測試器21承置射頻電子元件位於測試室131而執行測試作業;例如測試工位可位於移載臂11,移載臂11具有作業治具及訊號通道111,作業治具係移載射頻電子元件,並以移載射頻電子元件執行測試之位置作為測試工位,移載臂11之訊號通道111供通過無線訊號,以供射頻電子元件於測試工位執行測試作業;例如測試工位可位於承座(圖未示出),承座係承置射頻電子元件位於測試室131,以供射頻電子元件於測試工位執行測試作業,承座可為固定配置
,或承座與電性測試器21可作相對位移。再者,該測試工位與天線測試器12間不具有訊號干擾件(如金屬件或導電件),以避免無線訊號於傳輸過程損耗,使射頻電子元件之天線於測試工位對預設指向發出波束的無線訊號而進行無線訊號測試作業。In addition, the test station may be located in the
請參閱第2、3圖,以測試工位位於測試室131而言,第二驅動源42係驅動載座41作X方向向外位移,並令擋板411開啟箱體13之輸送通道132,使載座41之承板412載送電性測試器21移出測試室131,以供移料器51作X-Y-Z方向位移將射頻電子元件61移入電性測試器21之測試座213的容置部2131;射頻電子元件61之一面具有接點611,另一面具有天線612;第二驅動源42再驅動載座41作X方向反向位移,令載座41之承板412載送電性測試器21及射頻電子元件61移入測試室131,使電性測試器21位於測試室131,並使射頻電子元件61位於天線測試器12之下方,即測試工位在測試室131,載座41並以擋板411關閉箱體13之輸送通道132,由於電性測試器21之接合部件212電性連接射頻電子元件61之接點611,電性測試器21之電路板211經由接合部件212而對射頻電子元件61執行電性測試作業,由於天線測試器12係裝配於移載臂11,移載臂11可依作業需求,而帶動天線測試器12作Z方向位移而調整作業高度,天線測試器12之作業軸線L的角度係相同射頻電子元件61之天線612的待測指向且為0°,當位於測試工位之射頻電子元件61的天線612朝0°指向發出波束而傳輸無線訊號時,天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Figures 2 and 3, assuming that the test station is located in the
請參閱第4圖,本發明測試裝置10之第二實施例,其與第一實施例之差異在於載具為轉盤43之應用型式,測試裝置10係於箱體13與機台板31之間形成測試室131,以供射頻電子元件61位於模擬應用場所溫度之測試環境,另於箱體13設有輸送通道132,輸送通道132供移入/移出射頻電子元件61,輸送通道132處則可設置至少一遮蔽件134,以防止外部雜訊;轉盤43可作水平角度旋轉,或水平角度旋轉及Z方向位移,並設置至少一載裝部431,載裝部431相通轉盤43之底面,並供裝配電性測試器21,於本實施例中,轉盤43係由第二驅動源驅動作角度旋轉,第二驅動源包含馬達(圖未示出)及一為轉軸44之傳動器
,轉軸44連結驅動轉盤43依第二測試路徑作角度旋轉,以使轉盤43之各載裝部431移入/移出測試室131;電性測試單元之電性測試器21可於轉盤43之各載裝部431配置電性連接之電路板211及接合部件212,或者於轉盤43之各載裝部431配置具接合部件212之測試座213,以及於測試室131配置承置具214,承置具214承置電路板211,以供電路板211電性連接該接合部件212,承置具214可為固定式配置,或者承置具214與轉盤43作相對位移;於本實施例中,承置具214係作至少一Z方向位移,以承載電路板211電性連接轉盤43上之接合部件212;當轉軸44驅動轉盤43依第二測試路徑作角度旋轉,而帶動電性測試器21及射頻電子元件61移入測試室131,測試工位係位於測試室131,承置具214帶動電路板211作Z方向位移,使電路板211電性連接轉盤43上之接合部件212,電性測試器21即對射頻電子元件61執行電性測試作業,當射頻電子元件61的天線朝0°指向發出波束而傳輸無線訊號時,移載臂11上之天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Fig. 4, the second embodiment of the
請參閱第5圖,係本發明測試裝置10之第三實施例,其與第二實施例之差異在於承座為旋轉台71之應用型式,測試裝置10係於箱體13與機台板31之間形成測試室131,以供射頻電子元件61位於模擬應用場所溫度之測試環境,另於箱體13設有輸送通道132,輸送通道132供移入/移出射頻電子元件61;一為旋轉台71之承座,旋轉台71可作水平方向旋轉,或水平方向旋轉及Z方向位移,並設置至少一承接部711,以供承置射頻電子元件61,承接部711係設有相通旋轉台71底面之通孔712;以供通過電性測試器21,於本實施例中,旋轉台71係由第三驅動源驅動作水平方向旋轉,第三驅動源包含馬達(圖未示出)及一為轉動軸72之傳動器,轉動軸72連結驅動旋轉台71作水平方向旋轉,以使旋轉台71之各承接部711由箱體13之輸送通道132移入/移出測試室131,由於旋轉台71之承接部711移入測試室131之位置係相對於天線測試器12,使得承接部711之位置即為測試工位,一載具係為升降器45之型式,並配置於測試室131,以供承置且驅動電性測試器21作Z方向位移,當轉動軸72驅動旋轉台71依第二測試路徑作角度旋轉,而帶動射頻電子元件61移入測試室131後,旋轉台71係令射頻電子元件61位於電性測試器21及天線測試器12之間,升降器45帶動電性測試器21作Z方向位移,使電性測試器21通過旋轉台71之通孔712,以電性連接旋轉台71上之射頻電子元件61而執行電性測試作業,當射頻電子元件61的天線朝0°指向發出波束而傳輸無線訊號時,移載臂11上之天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Figure 5, which is the third embodiment of the
請參閱第6圖,係本發明測試裝置10之第四實施例,其與第三實施例之差異在於一為升降器45之載具係配置機台板31,以供承置且驅動電性測試器21作Z方向位移,移載臂11係作至少一方向位移,並設有訊號通道111及至少一作業治具,該訊號通道111供裝配天線測試器12,該作業治具係為吸嘴112
,以供移載及壓接射頻電子元件61,射頻電子元件61之天線612係朝向天線測試器12,而接點611則朝向電性測試器21,該測試工位係位於移載臂11,當移載臂11帶動天線測試器12及射頻電子元件61朝向電性測試器21作Z方向相對位移,以及升降器45帶動電性測試器21朝向射頻電子元件61作Z方向相對位移時
,電性測試器21係電性連接移載臂11上且位於測試工位之射頻電子元件61而執行電性測試作業,射頻電子元件61的天線朝0°指向發出波束而傳輸無線訊號,移載臂11上之天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Fig. 6, which is the fourth embodiment of the
請參閱第7圖,本發明測試裝置10之第五實施例,以電性測試器21配置於測試室131而言,測試工位如前所述,可位於測試室131、移載臂11或承座(圖未示出),依不同測試作業需求而定,不受限於本實施例;於本實施例中,機台板31與箱體13之間形成測試室131,並於箱體13之兩側設置輸送通道135;又天線測試單元係於至少一輸送通道135設置至少一載台,亦或於箱體13外部設置至少一載台,載台可載送待測之射頻電子元件或已測之射頻電子元件
,或載送待測之射頻電子元件及已測之射頻電子元件;於本實施例中,係於二輸送通道135設置二作Y方向位移之載台136,以供載送射頻電子元件;電性測試器21係裝配於測試室131,並設有電路板211及具接合部件212之測試座213,測試座213係設有可承置射頻電子元件61之容置部2131,接合部件212電性連接電路板211;移載臂11係作至少一方向位移,並設有訊號通道111及至少一作業治具,該訊號通道111供裝配天線測試器12,該作業治具係為吸嘴112,以供於載台136及電性測試器21之間移載射頻電子元件61。Please refer to Fig. 7, in the fifth embodiment of the
請參閱第8、9圖,測試工位係位於測試室131,當一載台136承載射頻電子元件61至電性測試器21之側方時,移載臂11依第一測試路徑作X-Z方向位移,令吸嘴112於載台136取出待測之射頻電子元件61,並移載至電性測試器21之容置部2131,電性測試器21之接合部件212電性連接射頻電子元件61之接點611;移載臂11再帶動天線測試器12作Z方向位移至預設作業高度,當電性測試器21對射頻電子元件61執行電性測試作業時,射頻電子元件61之天線612於0°待測指向發射波束的無線訊號,由於移載臂11之訊號通道111供通過無線訊號,使得射頻電子元件61之天線612的無線訊號通過訊號通道111而傳輸至天線測試器12,以進行無線訊號測試作業,天線測試器12於接收無線訊號後,並將無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別分析射頻電子元件61之品質。Please refer to Figures 8 and 9, the test station is located in the
請參閱第10圖,本發明測試裝置10之第六實施例,其與第五實施例之差異在於測試工位係位於移載臂11,機台板31與箱體13之間形成測試室131,並於箱體13設置輸送通道132;載具係配置於測試室131,該載具係為升降器45,以供承置且驅動電性測試器21作Z方向位移;移載臂11係作至少一方向位移,並設有訊號通道111及至少一作業治具,該訊號通道111供裝配天線測試器12,該作業治具係為吸嘴112,以供移載射頻電子元件61,移載臂11係作X-Z方向位移將射頻電子元件61由箱體13之輸送通道132移入測試室131,令射頻電子元件61對位於電性測試器21,當升降器45帶動電性測試器21朝向射頻電子元件61作Z方向相對位移時,電性測試器21係電性連接射頻電子元件61而執行電性測試作業,射頻電子元件61的天線朝0°指向發出波束而傳輸無線訊號,移載臂11上之天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Fig. 10, the sixth embodiment of the
請參閱第11圖,係本發明測試裝置10之第七實施例,以電性測試器21配置於移載臂11而言,測試工位如前所述,可位於測試室131、移載臂11或承座,依不同測試作業需求而定,不受限於本實施例;於本實施例中,該天線測試單元之移載臂11係作至少一方向位移,並設有訊號通道111及至少一作業治具,訊號通道111供裝配天線測試器12,作業治具係為吸嘴112,以供移載射頻電子元件,另於移載臂11裝配外罩113,由移載臂11帶動外罩113及天線測試器12同步作Z方向位移,電性測試器21係裝配於移載臂11,並設有電性連接之電路板211及接合部件212,接合部件212係供電性連接射頻電子元件;測試裝置10之承座除了可為旋轉台之型式外,亦可為座體或面板,若為座體,則設有供承置射頻電子元件之承接部,於本實施例中,係於機台板31上設置為座體73之承座,座體73係設有承接部731,以供承置射頻電子元件。Please refer to Figure 11, which is the seventh embodiment of the
請參閱第12、13圖,測試工位係位於測試室131,移載臂11係以吸嘴112拾取移載射頻電子元件61,由於射頻電子元件61之接點611與天線612係配置於同一面,以及電性測試器21裝配於移載臂11,而可使射頻電子元件61之接點611電性連接電性測試器21之接合部件212,並使射頻電子元件61之天線612朝向天線測試器12,移載臂11作X方向位移將外罩113、電性測試器21及射頻電子元件61同步移載至座體73之上方;當移載臂11帶動外罩113、電性測試器21及射頻電子元件61同步作Z方向位移時,即令外罩113罩置於機台板31而形成測試室131,並將射頻電子元件61移入且壓接於座體73之承接部731,使電性測試器21係對射頻電子元件61執行電性測試作業時,射頻電子元件61的天線612朝0°指向發出波束而傳輸無線訊號,移載臂11上之天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Figures 12 and 13, the test station is located in the test room 131, and the transfer arm 11 uses the suction nozzle 112 to pick up and transfer the RF electronic component 61, because the contact 611 of the RF electronic component 61 and the antenna 612 are arranged in the same The surface, and the electrical tester 21 are assembled on the transfer arm 11, so that the contact 611 of the radio frequency electronic component 61 can be electrically connected to the joint part 212 of the electrical tester 21, and the antenna 612 of the radio frequency electronic component 61 can face the antenna The tester 12, the transfer arm 11 moves the cover 113, the electrical tester 21 and the radio frequency electronic component 61 synchronously to the top of the base body 73 when the transfer arm 11 moves in the X direction; when the transfer arm 11 drives the cover 113, the electrical tester 21 When the radio frequency electronic component 61 and the radio frequency electronic component 61 are simultaneously moved in the Z direction, the outer cover 113 is placed on the machine plate 31 to form a test chamber 131, and the radio frequency electronic component 61 is moved into and crimped on the receiving part 731 of the base body 73 to make the electrical When the tester 21 performs electrical testing operations on the radio frequency electronic component 61, the antenna 612 of the radio frequency electronic component 61 emits a beam toward 0° to transmit wireless signals, and the antenna tester 12 on the transfer arm 11 receives the radio frequency electronic component 61 And transmit the received wireless signal to the processor (not shown in the figure) of the central control device for judging the quality of the radio frequency electronic component 61.
請參閱第14圖,係本發明測試裝置10之第八實施例,其與第七實施例之差異在於測試工位係位於承座73,該天線測試單元之移載臂11係作至少一方向位移,並設有訊號通道111及至少一作業治具,訊號通道111供裝配天線測試器12,作業治具係為吸嘴112,以供移載射頻電子元件;電性測試器21係裝配於移載臂11,並設有電性連接之電路板211及接合部件212,接合部件212係供電性連接射頻電子元件;測試裝置10係於機台板31上設置為座體73之承座
,座體73設有可承置射頻電子元件(圖未示出)之承接部731;當移載臂11之吸嘴112拾取移載射頻電子元件,即可使射頻電子元件之接點電性連接電性測試器21之接合部件212,並使射頻電子元件之天線朝向天線測試器12,當移載臂11將射頻電子元件移入且壓接於座體73之承接部731,電性測試器21即對射頻電子元件執行電性測試作業,射頻電子元件的天線朝0°指向發出波束而傳輸無線訊號,移載臂11上之天線測試器12即接收射頻電子元件之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以判別射頻電子元件之品質。Please refer to Fig. 14, which is the eighth embodiment of the
請參閱第1至3、15圖,本發明測試裝置10之第一實施例應用於測試作業設備之示意圖,包含機台30、供料裝置80、收料裝置90、本發明測試裝置10、輸送裝置100及中央控制裝置(圖未示出);供料裝置80係配置於機台30上,並設有至少一容納待測射頻電子元件之供料承置器81;收料裝置90係配置於機台30上,並設有至少一容納已測射頻電子元件之收料承置器91;本發明之測試裝置10係配置於機台30上,包含天線測試單元及電性測試單元,天線測試單元係設置移載臂11及天線測試器12,天線測試器12由移載臂11帶動作至少一方向位移,以供對位於測試工位之射頻電子元件的天線接收或發射無線訊號
,該電性測試單元係設有具電路板211及接合部件212之電性測試器21,並以接合部件212供電性連接位於測試工位之射頻電子元件,藉以於電性測試單元對位於測試工位之射頻電子元件執行電性測試作業時,同步利用天線測試單元對測試工位之射頻電子元件的天線進行無線訊號測試作業;於本實施例中,測試裝置10係於機台30之第一側及第二側分別配置有複數個天線測試單元及電性測試單元, 更包含於機台30之第一側及第二側分別配置有測試室131及可為載座41之載具,另於機台30之第一側及第二側分別配置有移料器51,以分別於第一側及第二側載座41上之複數個電性測試器21移載待測/已測之射頻電子元件,測試裝置10另於機台30之第一側及第二側分別配置有載台136,以承載待測/已測之射頻電子元件;輸送裝置100係配置於機台30上,並設有至少一輸送器,用以輸送射頻電子元件,於本實施例中,輸送裝置100係設有作X-Y-Z方向位移之輸送器1001,以於供料裝置80取出待測之射頻電子元件,並移載至測試裝置10之載台136,載台136供移料器51取出待測之射頻電子元件,以及移入已測之射頻電子元件,移料器51將待測之射頻電子元件移載至載座41上之電性測試器21
,載座41將電性測試器21及射頻電子元件移入測試室131執行電性測試作業及無線訊號測試作業,輸送器1001於載台136取出已測之射頻電子元件,並依測試結果,將已測之射頻電子元件移載至收料裝置110而分類收置;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能。Please refer to Figures 1 to 3 and 15, a schematic diagram of the first embodiment of the
10:測試裝置 11:移載臂 111:訊號通道 112:吸嘴 113:外罩 12:天線測試器 L:作業軸線 13:箱體 131:測試室 132:輸送通道 133:輸送管 134:遮蔽件 135:輸送通道 136:載台 21:電性測試器 211:電路板 212:接合部件 213:測試座 2131:容置部 214:承置具 30:機台 31:機台板 41:載座 411:擋板 412:承板 42:第二驅動源 43:轉盤 431:載裝部 44:轉軸 45:升降器 51:移料器 61:射頻電子元件 611:接點 612:天線 71:旋轉台 711:承接部 712:通孔 72:轉動軸 73:座體 731:承接部 80:供料裝置 81:供料承置器 90:收料裝置 91:收料承置器 100:輸送裝置 1001:輸送器10: Test device 11: Transfer arm 111: signal channel 112: Nozzle 113: outer cover 12: Antenna tester L: work axis 13: cabinet 131: Test Room 132: Conveying Channel 133: Conveying Pipe 134: Shading 135: Conveying Channel 136: Stage 21: Electrical tester 211: Circuit Board 212: Joining Parts 213: Test Block 2131: accommodating part 214: Holder 30: Machine 31: machine board 41: Carrier 411: bezel 412: bearing plate 42: second drive source 43: turntable 431: Loading Department 44: shaft 45: lifter 51: Shifter 61: RF electronic components 611: Contact 612: Antenna 71: Rotating table 711: Acceptance Department 712: Through Hole 72: Rotation axis 73: Seat 731: Acceptance Department 80: Feeding device 81: Feeder 90: Receiving device 91: Receiving holder 100: Conveying device 1001: Conveyor
第1圖:本發明測試裝置第一實施例之示意圖。 第2圖:本發明測試裝置第一實施例之使用示意圖(一)。 第3圖:本發明測試裝置第一實施例之使用示意圖(二)。 第4圖:本發明測試裝置第二實施例之示意圖。 第5圖:本發明測試裝置第三實施例之示意圖。 第6圖:本發明測試裝置第四實施例之示意圖。 第7圖:本發明測試裝置第五實施例之示意圖。 第8圖:本發明測試裝置第五實施例之使用示意圖(一)。 第9圖:本發明測試裝置第五實施例之使用示意圖(二)。 第10圖:本發明測試裝置第六實施例之示意圖。 第11圖:本發明測試裝置第七實施例之示意圖。 第12圖:本發明測試裝置第七實施例之使用示意圖(一)。 第13圖:本發明測試裝置第七實施例之使用示意圖(二)。 第14圖:本發明測試裝置第八實施例之示意圖。 第15圖:本發明測試裝置應用於測試作業設備之示意圖。Figure 1: A schematic diagram of the first embodiment of the testing device of the present invention. Figure 2: A schematic diagram of the use of the first embodiment of the testing device of the present invention (1). Figure 3: A schematic diagram of the use of the first embodiment of the testing device of the present invention (2). Figure 4: A schematic diagram of the second embodiment of the testing device of the present invention. Figure 5: A schematic diagram of the third embodiment of the testing device of the present invention. Figure 6: A schematic diagram of the fourth embodiment of the testing device of the present invention. Figure 7: A schematic diagram of the fifth embodiment of the testing device of the present invention. Figure 8: A schematic diagram of the use of the fifth embodiment of the test device of the present invention (1). Figure 9: A schematic diagram of the use of the fifth embodiment of the test device of the present invention (2). Figure 10: A schematic diagram of the sixth embodiment of the testing device of the present invention. Figure 11: A schematic diagram of the seventh embodiment of the testing device of the present invention. Figure 12: A schematic diagram of the use of the seventh embodiment of the testing device of the present invention (1). Figure 13: A schematic diagram of the use of the seventh embodiment of the testing device of the present invention (2). Figure 14: A schematic diagram of the eighth embodiment of the testing device of the present invention. Figure 15: A schematic diagram of the testing device of the present invention applied to testing equipment.
10:測試裝置10: Test device
11:移載臂11: Transfer arm
111:訊號通道111: signal channel
12:天線測試器12: Antenna tester
L:作業軸線L: work axis
13:箱體13: cabinet
131:測試室131: Test Room
132:輸送通道132: Conveying Channel
133:輸送管133: Conveying Pipe
21:電性測試器21: Electrical tester
211:電路板211: Circuit Board
212:接合部件212: Joining Parts
213:測試座213: Test Block
2131:容置部2131: accommodating part
31:機台板31: machine board
41:載座41: Carrier
411:擋板411: bezel
412:承板412: bearing plate
42:第二驅動源42: second drive source
Claims (17)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW108144567A TWI734288B (en) | 2019-12-05 | 2019-12-05 | Radio frequency electronic component test device and test operation equipment for its application |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW108144567A TWI734288B (en) | 2019-12-05 | 2019-12-05 | Radio frequency electronic component test device and test operation equipment for its application |
Publications (2)
Publication Number | Publication Date |
---|---|
TW202122813A true TW202122813A (en) | 2021-06-16 |
TWI734288B TWI734288B (en) | 2021-07-21 |
Family
ID=77516869
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW108144567A TWI734288B (en) | 2019-12-05 | 2019-12-05 | Radio frequency electronic component test device and test operation equipment for its application |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI734288B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI783706B (en) * | 2021-10-01 | 2022-11-11 | 鴻勁精密股份有限公司 | Testing room structure, testing apparatus, and processing machine |
TWI804309B (en) * | 2022-05-11 | 2023-06-01 | 量崴科技股份有限公司 | Antenna test system |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI258588B (en) * | 2005-01-19 | 2006-07-21 | Mitac Int Corp | Antenna test chamber for dual tests |
CN101368981A (en) * | 2007-08-14 | 2009-02-18 | 海华科技股份有限公司 | Radio frequency module testing platform |
CN101839961B (en) * | 2009-03-19 | 2012-06-27 | 广达电脑股份有限公司 | Test system and method |
CN101995520B (en) * | 2009-08-10 | 2014-04-30 | 深圳富泰宏精密工业有限公司 | Antenna testing device and antenna testing method |
CN202083751U (en) * | 2011-05-16 | 2011-12-21 | 英顺达科技有限公司 | Combined type fully anechoic chamber |
TWI513986B (en) * | 2014-10-13 | 2015-12-21 | 矽品精密工業股份有限公司 | Radiofrequency testing device |
TWI677685B (en) * | 2018-10-08 | 2019-11-21 | 鴻勁精密股份有限公司 | Electronic component test equipment |
-
2019
- 2019-12-05 TW TW108144567A patent/TWI734288B/en active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI783706B (en) * | 2021-10-01 | 2022-11-11 | 鴻勁精密股份有限公司 | Testing room structure, testing apparatus, and processing machine |
TWI804309B (en) * | 2022-05-11 | 2023-06-01 | 量崴科技股份有限公司 | Antenna test system |
Also Published As
Publication number | Publication date |
---|---|
TWI734288B (en) | 2021-07-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI734288B (en) | Radio frequency electronic component test device and test operation equipment for its application | |
TWI703333B (en) | Test device for electronic component with antenna and test equipment for its application | |
US20150012137A1 (en) | Production apparatus | |
TW202210397A (en) | Electronic component pressing apparatus and electronic component testing apparatus | |
TWI741434B (en) | Radio frequency electronic component test device and test operation equipment for its application | |
TWI741435B (en) | Radio frequency electronic component test device and test operation equipment for its application | |
TWI741432B (en) | Radio frequency electronic component test device and its application test equipment | |
TWI730466B (en) | Radio frequency electronic component test device and its application test equipment | |
TWI728860B (en) | Wireless communication electronic component testing device and testing equipment using the same | |
TWI756141B (en) | Rfic testing apparatus and testing equipment using the same | |
TWI756138B (en) | Rfic testing apparatus and testing equipment using the same | |
CN113945777A (en) | Radio frequency electronic component testing device and testing equipment applying same | |
TWI724568B (en) | Test device for radio frequency electronic component with antenna and test equipment for its application | |
TWI741433B (en) | Radio frequency electronic component test device and test operation equipment for its application | |
TWI756139B (en) | Rfic testing apparatus and testing equipment using the same | |
TWI756140B (en) | Rfic testing apparatus and testing equipment using the same | |
TWI715220B (en) | Test device for radio frequency electronic component with antenna and test equipment for its application | |
TWI769846B (en) | Rfic testing apparatus and testing equipment using the same | |
TWI709756B (en) | Test device for radio frequency electronic component with antenna and test equipment for its application | |
TWI741673B (en) | Wireless communication electronic component testing device and testing equipment using the same | |
TWI715219B (en) | Test device for radio frequency electronic component with antenna and test classification machine for its application | |
TWI767556B (en) | Sustainer mechanism and handler having the same | |
CN113945776B (en) | Radio frequency electronic element testing device and testing equipment using same | |
TWI703332B (en) | Method and measuring mechanism for measuring antenna in antenna system by way of back-point pin | |
CN112713947A (en) | Radio frequency electronic element testing device and testing equipment applied by same |