TW202122813A - Radio frequency electric component test device and test operation equipment applying the same achieving the practical benefit of increasing the test yield - Google Patents

Radio frequency electric component test device and test operation equipment applying the same achieving the practical benefit of increasing the test yield Download PDF

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TW202122813A
TW202122813A TW108144567A TW108144567A TW202122813A TW 202122813 A TW202122813 A TW 202122813A TW 108144567 A TW108144567 A TW 108144567A TW 108144567 A TW108144567 A TW 108144567A TW 202122813 A TW202122813 A TW 202122813A
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radio frequency
test
frequency electronic
tester
electronic component
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TW108144567A
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TWI734288B (en
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李子瑋
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鴻勁精密股份有限公司
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Abstract

A radio frequency electric component test device comprises an antenna test unit and an electric property test unit. The antenna test unit is disposed with a transfer arm and an antenna tester. The antenna tester is driven by the transfer arm to perform at least a directional displacement so that an antenna of a radio frequency electric component located at a test station receives or emits a wireless signal. The electric property test unit is disposed with an electric property tester having a circuit board and a bonding member, and the radio frequency electric component located at the test station is electrically connected by the bonding member. Accordingly, when the electric property test unit executes electric property test operation for the radio frequency electric component located at the test station, the antenna test unit is synchronously utilized to perform wireless signal test operation for the antenna of the radio frequency electric component located at the test station, thereby achieving the practical benefit of increasing the test yield.

Description

射頻電子元件測試裝置及其應用之測試作業設備Radio frequency electronic component test device and test operation equipment for its application

本發明係提供一種射頻電子元件的測試裝置。The invention provides a testing device for radio frequency electronic components.

在現今,行動通訊區域無線網路系統、無線通訊區域網路系統或藍芽無線個人網路系統等,於增加資料傳輸速度的需求下,一內建有天線之射頻電子元件即為前述通訊系統之重要應用;天線的發射場型依應用場所而有不同,例如偶極天線具有全指向性發射場型,應用於終端設備,使終端設備可接收不同指向之波束所傳輸的無線訊號;例如無線網路接取器之天線,則需要能夠產生特定指向(如0°、45°或21°指向)的發射場型,而接收特定位置之設備所發射的無線訊號。目前射頻電子元件係於二面分別設置接點及天線,或者於同一面設置接點及天線,利用調節天線的相位及波束成形技術,進而調整發射場型,亦即使天線陣列於特定指向的發射/接收無線訊號一致地疊加,進而產生最佳發射/接收之波束;因此,如何測試射頻電子元件之天線對於預設指向的無線訊號傳輸效能,進而淘汰出不良品,即為業者研發之標的。Nowadays, in order to increase the data transmission speed of mobile communication area wireless network system, wireless communication area network system or Bluetooth wireless personal network system, etc., a radio frequency electronic component with built-in antenna is the aforementioned communication system The important application; the antenna's transmitting field type varies according to the application site, for example, the dipole antenna has an omnidirectional transmitting field type, which is applied to terminal equipment so that the terminal equipment can receive the wireless signals transmitted by beams of different directions; such as wireless The antenna of the network access device needs to be able to generate a specific directional (such as 0°, 45°, or 21° directional) transmitting field type, and receive the wireless signal emitted by the device at a specific location. At present, radio frequency electronic components are equipped with contacts and antennas on two sides, or on the same side. The phase and beamforming technology of the antenna are adjusted to adjust the transmission field pattern, even if the antenna array emits in a specific direction. /Receiving wireless signals are uniformly superimposed to produce the best transmitting/receiving beam; therefore, how to test the transmission performance of the radio frequency electronic component's antenna to the wireless signal transmission performance of the preset direction, and then eliminate the defective products, is the target of the industry's research and development.

本發明之目的一,係提供一種射頻電子元件測試裝置,包含天線測試單元及電性測試單元,該天線測試單元係設置移載臂及天線測試器,天線測試器由移載臂帶動作至少一方向位移,以供對位於測試工位之射頻電子元件的天線接收或發射無線訊號,該電性測試單元係設有具電路板及接合部件之電性測試器,並以接合部件供電性連接位於測試工位之射頻電子元件;藉以於電性測試單元對位於測試工位之射頻電子元件執行電性測試作業時,同步利用天線測試單元對測試工位之射頻電子元件的天線進行無線訊號測試作業,達到提升測試產能之實用效益。The first object of the present invention is to provide a radio frequency electronic component test device, including an antenna test unit and an electrical test unit. The antenna test unit is provided with a transfer arm and an antenna tester, and the antenna tester is driven by the transfer arm to move at least one Directional displacement for receiving or transmitting wireless signals to the antenna of the radio frequency electronic component at the test station. The electrical test unit is equipped with an electrical tester with a circuit board and a joint part, and the joint part is electrically connected to the Radio frequency electronic components of the test station; when the electrical test unit performs electrical testing operations on the radio frequency electronic components located in the test station, the antenna test unit is used to simultaneously perform wireless signal test operations on the antenna of the radio frequency electronic component of the test station , To achieve the practical benefits of improving test productivity.

本發明之目的二,係提供一種射頻電子元件測試裝置,更包含載具,以供裝配電性測試器,載具係作線性位移或旋轉位移,並視作業需求,而帶動電性測試器及射頻電子元件依第二測試路徑位移,達到提升測試使用效能之實用效益。The second objective of the present invention is to provide a radio frequency electronic component test device, which further includes a carrier for assembling an electrical tester. The carrier is linearly displaced or rotationally displaced, and drives the electrical tester and The radio frequency electronic component is displaced according to the second test path to achieve the practical benefit of improving the test efficiency.

本發明之目的三,係提供一種射頻電子元件測試裝置,更包含測試室,不僅可防止外部雜訊,並供射頻電子元件位於模擬應用場所溫度測試環境執行測試作業,達到提升測試品質之實用效益。The third objective of the present invention is to provide a radio frequency electronic component testing device, which also includes a test room, which not only prevents external noise, but also allows radio frequency electronic components to be located in a simulated application site temperature test environment to perform test operations, thereby achieving practical benefits of improving test quality .

本發明之目的四,係提供一種射頻電子元件測試裝置,更包含承座,承座係承置射頻電子元件位於測試工位,以使電性測試器及天線測試器對承座上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業 ,達到提升測試產能之實用效益。The fourth object of the present invention is to provide a radio frequency electronic component testing device, which further includes a socket. The socket holds the radio frequency electronic component at the test station, so that the electrical tester and the antenna tester are on the socket and located on the test station. The radio frequency electronic components of the station perform electrical test operations and wireless signal test operations , To achieve the practical benefits of improving test productivity.

本發明之目的五,係提供一種射頻電子元件測試裝置,其移載臂係設有訊號通道及至少一作業治具,訊號通道供裝配天線測試器,作業治具係供拾取射頻電子元件位於測試工位,不僅可依第一測試路徑移載射頻電子元件 ,並供電性測試器及天線測試器對移載臂上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業,達到提升測試產能之實用效益。The fifth object of the present invention is to provide a radio frequency electronic component test device, the transfer arm is provided with a signal channel and at least one work fixture, the signal channel is used for assembling the antenna tester, and the work fixture is used for picking up the radio frequency electronic components in the test Work station, not only can transfer radio frequency electronic components according to the first test path , And the power tester and antenna tester perform electrical test operations and wireless signal test operations on the radio frequency electronic components on the transfer arm and located in the test station to achieve the practical benefits of improving test productivity.

本發明之目的六,係提供一種射頻電子元件測試裝置,其天線測試單元可視作業需求,而配置天線調整器,以供裝配天線測試器,利用天線調整器調整天線測試器之擺置位置或角度,以利測試不同指向之射頻電子元件,進而有效縮減天線測試器之配置數量,達到節省天線測試器成本之實用效益。The sixth object of the present invention is to provide a radio frequency electronic component test device, the antenna test unit of which can be equipped with an antenna adjuster according to operational requirements for assembling the antenna tester, and the antenna adjuster is used to adjust the position or angle of the antenna tester , In order to facilitate the testing of radio frequency electronic components of different directions, thereby effectively reducing the number of antenna testers, and achieving the practical benefit of saving the cost of antenna testers.

本發明之目的七,係提供一種射頻電子元件測試裝置,其電性測試單元可視作業需求,而配置電性調整器,以供裝配電性測試器,利用電性調整器調整電性測試器及射頻電子元件的擺置位置或角度,以利測試不同指向之射頻電子元件,亦可有效縮減天線測試器之配置數量,達到節省天線測試器成本之實用效益。The seventh objective of the present invention is to provide a radio frequency electronic component test device, the electrical test unit of which can be configured with an electrical adjuster according to operational requirements for assembling the electrical tester, and the electrical adjuster is used to adjust the electrical tester and The placement or angle of the radio frequency electronic components facilitates the testing of radio frequency electronic components of different orientations. It can also effectively reduce the number of antenna testers and achieve the practical benefit of saving the cost of antenna testers.

本發明之目的八,係提供一種測試作業設備,包含機台、供料裝置、收料裝置、本發明測試裝置、輸送裝置及中央控制裝置;供料裝置係配置於機台上,並設有至少一容納待測射頻電子元件之供料承置器;收料裝置係配置於機台上,並設有至少一容納已測射頻電子元件之收料承置器;本發明測試裝置係配置於機台上,包含天線測試單元及電性測試單元,以對射頻電子元件執行電性測試作業及無線訊號測試作業;輸送裝置係配置於機台上,並設有至少一輸送器,用以輸送射頻電子元件;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。The eighth object of the present invention is to provide a test operation equipment, including a machine, a feeding device, a receiving device, a test device of the present invention, a conveying device, and a central control device; the feeding device is arranged on the machine and equipped with At least one feeding holder for accommodating the radio frequency electronic component to be tested; the receiving device is arranged on the machine, and is provided with at least one receiving holder for accommodating the measured radio frequency electronic component; the test device of the present invention is arranged on The machine platform includes an antenna test unit and an electrical test unit to perform electrical test operations and wireless signal test operations on radio frequency electronic components; the conveying device is arranged on the machine platform and is equipped with at least one conveyor for conveying Radio frequency electronic components; the central control device is used to control and integrate the actions of various devices to perform automated operations and achieve practical benefits of improving operational performance.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如后。In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given with the drawings, and the details are as follows.

請參閱第1圖,本發明測試裝置10之第一實施例,測試裝置10包含天線測試單元及電性測試單元。Please refer to Fig. 1, a first embodiment of the test device 10 of the present invention. The test device 10 includes an antenna test unit and an electrical test unit.

該天線測試單元包含移載臂11及天線測試器12,更包含測試室,更進一步,可於面板與箱體之間形成測試室,或者一外罩罩置於面板而形成測試室,面板可為機台板或機架板,箱體或面板可開設輸送通道,亦可於輸送通道處設置可啟閉之門板;於本實施例中,測試裝置10係於箱體13與機台板31之間形成測試室131,以供射頻電子元件(圖未示出)位於模擬應用場所溫度之測試環境,另於箱體13設有輸送通道132及至少一輸送管133,輸送通道132供移入/移出射頻電子元件,輸送管133以供輸入具預設溫度之乾燥流體至測試室131,使測試室131保持預設溫度及防結露。The antenna test unit includes a transfer arm 11 and an antenna tester 12, and also includes a test room. Furthermore, a test room can be formed between the panel and the box, or a cover can be placed on the panel to form a test room. The panel can be The machine board or frame board, the box body or the panel can be provided with a conveying channel, and a door panel that can be opened and closed can also be provided at the conveying channel; in this embodiment, the test device 10 is attached to the box 13 and the machine board 31 A test chamber 131 is formed between the RF electronic components (not shown in the figure) in a test environment that simulates the temperature of the application site. In addition, a conveying channel 132 and at least one conveying pipe 133 are provided in the box 13 for moving in/out. For radio frequency electronic components, the delivery pipe 133 is used to input the dry fluid with a preset temperature to the test chamber 131, so that the test chamber 131 maintains the preset temperature and prevents condensation.

該移載臂11係作至少一方向位移,以供裝配天線測試器12,更進一步,移載臂11可為架體或轉軸,並裝配於機架或箱體13,而由第一驅動源(圖未示出)驅動位移或旋轉,移載臂11可作線性位移或旋轉位移,亦或作線性位移及旋轉位移,例如移載臂11依第一測試路徑作Z方向位移或X-Y-Z方向位移移載天線測試器12,例如移載臂11依第一測試路徑作角度旋轉及作Z方向位移移載天線測試器12;又移載臂11係設有作業治具及訊號通道,作業治具係供拾取射頻電子元件位於測試工位,訊號通道係供裝配天線測試器12,且供通過無線訊號,移載臂11不僅可依第一測試路徑移載射頻電子元件,並供天線測試器12及電性測試單元分別對移載臂11上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業,移載臂11與電性測試單元之電性測試器可作相對位移;於本實施例中,移載臂11係裝配於箱體13,並以第一驅動源(圖未示出)驅動作Z方向位移,移載臂11係為架體,並於內部設有訊號通道111,以供裝配天線測試器12,且供通過無線訊號。The transfer arm 11 is displaced in at least one direction for assembling the antenna tester 12. Furthermore, the transfer arm 11 can be a frame or a rotating shaft, and is assembled on the frame or box 13, and is driven by a first drive source (Not shown in the figure) by driving displacement or rotation, the transfer arm 11 can perform linear displacement or rotational displacement, or linear displacement and rotational displacement. For example, the transfer arm 11 can perform Z-direction displacement or XYZ-direction displacement according to the first test path. The transfer antenna tester 12, for example, the transfer arm 11 rotates angularly according to the first test path and moves the transfer antenna tester 12 in the Z direction; and the transfer arm 11 is equipped with a work fixture and a signal channel, and a work fixture It is for picking up radio frequency electronic components at the test station, and the signal channel is for assembling the antenna tester 12 and for passing wireless signals. The transfer arm 11 can not only transfer the radio frequency electronic components according to the first test path, but also supply the antenna tester 12 The electrical testing unit and the electrical testing unit respectively perform electrical testing and wireless signal testing on the radio frequency electronic components on the transfer arm 11 and located at the testing station. The transfer arm 11 and the electrical tester of the electrical testing unit can perform relative displacement. In this embodiment, the transfer arm 11 is assembled in the box 13, and is driven by the first drive source (not shown) for displacement in the Z direction. The transfer arm 11 is a frame body, and is provided with The signal channel 111 is used for assembling the antenna tester 12 and for passing wireless signals.

至少一天線測試器12係裝配於移載臂11,以供對位於測試工位之射頻電子元件的天線執行無線訊號測試作業,例如天線測試器12對射頻電子元件執行接收無線訊號之作業,例如天線測試器12對射頻電子元件執行發射測試用無線訊號之作業,例如天線測試器12對射頻電子元件執行接收及發射無線訊號之作業;又天線測試器12可連接一獨立之處理器(圖未示出),以將接收射頻電子元件的無線訊號傳輸至處理器,或者將處理器之測試用無線訊號發射至射頻電子元件,該處理器亦可為中央控制裝置(圖未示出)之處理器;再者,天線測試器12之作業軸線L位於預設指向,作業軸線L之角度可相同或偏近於射頻電子元件之待測指向(如0°、45°或30°指向),以接收射頻電子元件之待測指向所發出波束的無線訊號,或朝向射頻電子元件之待測指向發出測試用無線訊號;於本實施例中,天線測試器12係裝配於移載臂11之訊號通道111,天線測試器12之作業軸線L角度係位於預設之0°指向。At least one antenna tester 12 is mounted on the transfer arm 11 for performing wireless signal testing operations on the antennas of the radio frequency electronic components at the test station. For example, the antenna tester 12 performs radio signal reception operations on the radio frequency electronic components, such as The antenna tester 12 performs the operation of transmitting wireless signals for testing radio frequency electronic components. For example, the antenna tester 12 performs the operation of receiving and transmitting wireless signals for the radio frequency electronic components; and the antenna tester 12 can be connected to an independent processor (not shown in the figure) (Shown), in order to transmit the wireless signal of the receiving radio frequency electronic component to the processor, or transmit the wireless signal for testing of the processor to the radio frequency electronic component, the processor can also be the processing of the central control device (not shown) Furthermore, the operating axis L of the antenna tester 12 is located in the preset direction, and the angle of the operating axis L can be the same or close to the direction to be tested of the radio frequency electronic component (such as 0°, 45° or 30°), Receives wireless signals from the beams emitted from the direction to be tested of the radio frequency electronic component, or sends out wireless signals for testing toward the direction to be tested of the radio frequency electronic component; in this embodiment, the antenna tester 12 is mounted on the signal channel of the transfer arm 11 111. The angle of the operating axis L of the antenna tester 12 is at the preset 0° direction.

測試裝置10可依測試作業需求而變換天線測試器12之配置數量,天線測試器12可採固定式配置或活動式配置,例如天線測試器12可固設於測試室131,例如天線測試器12可搭配天線調整器(圖未示出)而裝配於移載臂11,以調整擺置位置或角度,天線調整器可為機械手臂、轉軸、滑軌組或包含複數個調整桿件,可視作業需求,以帶動天線測試器12依待測指向所需而位移調整擺置位置或角度,亦或於原軸向旋轉調整擺置角度,以利天線測試器12測試不同待測指向(如0°、45°或30°指向)之射頻電子元件,進而有效縮減天線測試器之配置數量及節省成本。再者,天線測試單元可依測試作業需求,而於天線測試器12與測試工位之間設有至少一中介器(圖未示出),中介器可為菱鏡或折射元件等,中介器係於射頻電子元件與天線測試器12之間轉送傳輸無線訊號。The test device 10 can change the configuration number of the antenna tester 12 according to the test operation requirements. The antenna tester 12 can adopt a fixed configuration or a movable configuration. For example, the antenna tester 12 can be fixed in the test room 131, such as the antenna tester 12 It can be combined with an antenna adjuster (not shown in the figure) to be assembled on the transfer arm 11 to adjust the position or angle. The antenna adjuster can be a robot arm, a rotating shaft, a slide rail set or a plurality of adjustment rods, which can be operated visually. It is required to drive the antenna tester 12 to shift the position or angle according to the direction to be tested, or rotate the original axis to adjust the position, so that the antenna tester 12 can test different directions to be tested (such as 0° , 45° or 30° pointing) radio frequency electronic components, thereby effectively reducing the number of antenna testers and saving costs. Furthermore, the antenna test unit can be provided with at least one intermediary (not shown in the figure) between the antenna tester 12 and the test station according to the requirements of the test operation. The intermediary can be a diamond mirror or a refraction element, etc. The intermediary It is used to transmit and transmit wireless signals between the radio frequency electronic components and the antenna tester 12.

該電性測試單元係設置具電路板211及接合部件212之電性測試器21,其接合部件212供電性連接位於測試工位之射頻電子元件而執行電性測試作業;更進一步,電性測試器21可位於測試室131、載具或移載臂11,電性測試器可採固定式配置或活動式配置,例如電性測試器21可作固定式配置於測試室131;例如電性測試器21可裝配於載具或移載臂11而作至少一方向位移;更進一步,電性測試器21可搭配電性調整器(圖未示出),而調整擺置位置或角度 ,電性調整器可為機械手臂、轉軸、滑軌組或包含複數個調整桿件,可視作業需求,以帶動電性測試器21及射頻電子元件依待測指向所需而位移調整擺置位置或角度,亦或於原軸向調整擺置呈不同角度,以利測試不同指向(如0°、45°或30°指向)之射頻電子元件,進而有效縮減天線測試器12之配置數量及節省成本;於本實施例中,電性測試器21係設有電路板211及具接合部件212之測試座213,測試座213設有供承置射頻電子元件之容置部2131,接合部件212之一端電性連接電路板211,另一端則供電性連接射頻電子元件。The electrical test unit is provided with an electrical tester 21 with a circuit board 211 and a joining component 212, and the joining component 212 is electrically connected to the radio frequency electronic component at the test station to perform electrical testing; further, electrical testing The device 21 can be located in the test room 131, the carrier or the transfer arm 11, and the electrical tester can adopt a fixed configuration or a movable configuration. For example, the electrical tester 21 can be fixedly configured in the test room 131; for example, electrical testing The device 21 can be assembled to the carrier or the transfer arm 11 for displacement in at least one direction; further, the electrical tester 21 can be equipped with an electrical adjuster (not shown) to adjust the placement position or angle , The electrical adjuster can be a mechanical arm, a rotating shaft, a slide rail group or a plurality of adjusting rods, depending on the operation requirements, to drive the electrical tester 21 and the radio frequency electronic components to move and adjust the placement position according to the required direction of the test Or angle, or adjust the placement to different angles in the original axis to facilitate testing of radio frequency electronic components with different orientations (such as 0°, 45° or 30° orientation), thereby effectively reducing the number of antenna testers 12 and saving Cost; In this embodiment, the electrical tester 21 is provided with a circuit board 211 and a test base 213 with a bonding part 212, the test base 213 is provided with a receiving portion 2131 for holding radio frequency electronic components, and the bonding part 212 One end is electrically connected to the circuit board 211, and the other end is electrically connected to radio frequency electronic components.

以電性測試器21配置於載具而言,測試裝置10更包含載具,以供裝配電性測試器,載具可為載座、轉盤或升降器等,以供承置電性測試器21,並由第二驅動源驅動作線性位移或旋轉位移,第二驅動源可為線性馬達、壓缸或包含馬達及傳動器,並視作業需求,而帶動電性測試器21依第二測試路徑位移,使電性測試器21移入/移出測試室131;於本實施例中,載具係為載座41,載座41設有擋板411及承板412,擋板411係供啟閉箱體13之輸送通道132,承板412則供承置電性測試器21,第二驅動源42係驅動載座41依第二測試路徑且經由箱體13之輸送通道132移入/移出測試室131,使電性測試器21承載射頻電子元件移入/移出測試室131。As far as the electrical tester 21 is arranged on a carrier, the testing device 10 further includes a carrier for assembling the electrical tester. The carrier can be a carrier, a turntable or a lifter, etc., for holding the electrical tester. 21. It is driven by a second driving source for linear displacement or rotational displacement. The second driving source can be a linear motor, a cylinder, or a motor and a transmission. Depending on the operation requirements, the electrical tester 21 is driven to perform the second test. The path displacement moves the electrical tester 21 into/out of the test chamber 131; in this embodiment, the carrier is a carrier 41, and the carrier 41 is provided with a baffle 411 and a bearing plate 412, and the baffle 411 is for opening and closing The conveying channel 132 of the box 13 and the supporting plate 412 are used to hold the electrical tester 21. The second driving source 42 drives the carrier 41 to move into/out of the test room through the conveying channel 132 of the box 13 according to the second test path. 131. Move the electrical tester 21 into/out of the test chamber 131 carrying the radio frequency electronic components.

又該測試工位可位於測試室131、移載臂11或承座(圖未示出),依不同測試作業需求而定,不受限於本實施例;例如測試工位可位於測試室131,電性測試器21承置射頻電子元件位於測試室131而執行測試作業;例如測試工位可位於移載臂11,移載臂11具有作業治具及訊號通道111,作業治具係移載射頻電子元件,並以移載射頻電子元件執行測試之位置作為測試工位,移載臂11之訊號通道111供通過無線訊號,以供射頻電子元件於測試工位執行測試作業;例如測試工位可位於承座(圖未示出),承座係承置射頻電子元件位於測試室131,以供射頻電子元件於測試工位執行測試作業,承座可為固定配置 ,或承座與電性測試器21可作相對位移。再者,該測試工位與天線測試器12間不具有訊號干擾件(如金屬件或導電件),以避免無線訊號於傳輸過程損耗,使射頻電子元件之天線於測試工位對預設指向發出波束的無線訊號而進行無線訊號測試作業。In addition, the test station may be located in the test room 131, the transfer arm 11 or the socket (not shown in the figure), depending on the requirements of different test operations, and is not limited to this embodiment; for example, the test station may be located in the test room 131 , The electrical tester 21 carries the radio frequency electronic components in the test room 131 to perform the test operation; for example, the test station can be located in the transfer arm 11, the transfer arm 11 has a work fixture and a signal channel 111, and the work fixture is transferred Radio frequency electronic components, and the test station is used as the test station. The signal channel 111 of the carrier arm 11 is used for passing wireless signals for the radio frequency electronic components to perform test operations at the test station; for example, the test station It can be located on a socket (not shown in the figure). The socket holds the radio frequency electronic components in the test room 131 for the radio frequency electronic components to perform test operations at the test station. The socket can be a fixed configuration , Or the socket and the electrical tester 21 can make relative displacement. Furthermore, there are no signal interference parts (such as metal parts or conductive parts) between the test station and the antenna tester 12 to avoid the loss of wireless signals during the transmission process, so that the antenna of the radio frequency electronic component is directed to the preset point at the test station Send out the wireless signal of the beam to perform the wireless signal test operation.

請參閱第2、3圖,以測試工位位於測試室131而言,第二驅動源42係驅動載座41作X方向向外位移,並令擋板411開啟箱體13之輸送通道132,使載座41之承板412載送電性測試器21移出測試室131,以供移料器51作X-Y-Z方向位移將射頻電子元件61移入電性測試器21之測試座213的容置部2131;射頻電子元件61之一面具有接點611,另一面具有天線612;第二驅動源42再驅動載座41作X方向反向位移,令載座41之承板412載送電性測試器21及射頻電子元件61移入測試室131,使電性測試器21位於測試室131,並使射頻電子元件61位於天線測試器12之下方,即測試工位在測試室131,載座41並以擋板411關閉箱體13之輸送通道132,由於電性測試器21之接合部件212電性連接射頻電子元件61之接點611,電性測試器21之電路板211經由接合部件212而對射頻電子元件61執行電性測試作業,由於天線測試器12係裝配於移載臂11,移載臂11可依作業需求,而帶動天線測試器12作Z方向位移而調整作業高度,天線測試器12之作業軸線L的角度係相同射頻電子元件61之天線612的待測指向且為0°,當位於測試工位之射頻電子元件61的天線612朝0°指向發出波束而傳輸無線訊號時,天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Figures 2 and 3, assuming that the test station is located in the test chamber 131, the second driving source 42 drives the carrier 41 to move outward in the X direction, and makes the baffle 411 open the conveying channel 132 of the box 13. Move the carrying plate 412 of the carrier 41 carrying the electrical tester 21 out of the test chamber 131, so that the shifter 51 can move the radio frequency electronic component 61 into the accommodating portion 2131 of the test seat 213 of the electrical tester 21 for XYZ direction displacement; The radio frequency electronic component 61 has a contact 611 on one side, and an antenna 612 on the other side; the second driving source 42 drives the carrier 41 to make a reverse displacement in the X direction, so that the carrier board 412 of the carrier 41 carries the power transmission tester 21 and the radio frequency The electronic component 61 is moved into the testing room 131, the electrical tester 21 is located in the testing room 131, and the radio frequency electronic component 61 is located under the antenna tester 12, that is, the testing station is in the testing room 131, the carrier 41 and the baffle 411 The conveying channel 132 of the box 13 is closed. Since the joint part 212 of the electrical tester 21 is electrically connected to the contact 611 of the radio frequency electronic component 61, the circuit board 211 of the electrical tester 21 is connected to the radio frequency electronic component 61 through the joint part 212. To perform electrical testing operations, since the antenna tester 12 is assembled on the transfer arm 11, the transfer arm 11 can drive the antenna tester 12 to move in the Z direction to adjust the operating height according to operating requirements. The operating axis of the antenna tester 12 The angle of L is the same as the direction to be measured of the antenna 612 of the radio frequency electronic component 61 and is 0°. When the antenna 612 of the radio frequency electronic component 61 at the test station emits a beam toward 0° to transmit wireless signals, the antenna tester 12 That is, the wireless signal of the radio frequency electronic component 61 is received, and the received radio signal is transmitted to the processor (not shown in the figure) of the central control device for judging the quality of the radio frequency electronic component 61.

請參閱第4圖,本發明測試裝置10之第二實施例,其與第一實施例之差異在於載具為轉盤43之應用型式,測試裝置10係於箱體13與機台板31之間形成測試室131,以供射頻電子元件61位於模擬應用場所溫度之測試環境,另於箱體13設有輸送通道132,輸送通道132供移入/移出射頻電子元件61,輸送通道132處則可設置至少一遮蔽件134,以防止外部雜訊;轉盤43可作水平角度旋轉,或水平角度旋轉及Z方向位移,並設置至少一載裝部431,載裝部431相通轉盤43之底面,並供裝配電性測試器21,於本實施例中,轉盤43係由第二驅動源驅動作角度旋轉,第二驅動源包含馬達(圖未示出)及一為轉軸44之傳動器 ,轉軸44連結驅動轉盤43依第二測試路徑作角度旋轉,以使轉盤43之各載裝部431移入/移出測試室131;電性測試單元之電性測試器21可於轉盤43之各載裝部431配置電性連接之電路板211及接合部件212,或者於轉盤43之各載裝部431配置具接合部件212之測試座213,以及於測試室131配置承置具214,承置具214承置電路板211,以供電路板211電性連接該接合部件212,承置具214可為固定式配置,或者承置具214與轉盤43作相對位移;於本實施例中,承置具214係作至少一Z方向位移,以承載電路板211電性連接轉盤43上之接合部件212;當轉軸44驅動轉盤43依第二測試路徑作角度旋轉,而帶動電性測試器21及射頻電子元件61移入測試室131,測試工位係位於測試室131,承置具214帶動電路板211作Z方向位移,使電路板211電性連接轉盤43上之接合部件212,電性測試器21即對射頻電子元件61執行電性測試作業,當射頻電子元件61的天線朝0°指向發出波束而傳輸無線訊號時,移載臂11上之天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Fig. 4, the second embodiment of the test device 10 of the present invention is different from the first embodiment in that the carrier is the application type of the turntable 43, and the test device 10 is located between the box body 13 and the machine table 31 A test chamber 131 is formed for the radio frequency electronic component 61 to be located in a test environment that simulates the temperature of the application site. In addition, a conveying channel 132 is provided in the box 13 for moving in/out of the radio frequency electronic component 61. The conveying channel 132 can be installed At least one shield 134 to prevent external noise; the turntable 43 can be rotated at a horizontal angle, or rotated at a horizontal angle and displaced in the Z direction, and is provided with at least one loading portion 431, which communicates with the bottom surface of the turntable 43 and provides The electrical tester 21 is assembled. In this embodiment, the turntable 43 is driven by a second driving source for angular rotation. The second driving source includes a motor (not shown) and a transmission that is a shaft 44 , The rotating shaft 44 is connected to the drive turntable 43 to rotate at an angle according to the second test path, so that the loading parts 431 of the turntable 43 move into/out of the test chamber 131; the electrical tester 21 of the electrical test unit can be mounted on each of the turntable 43 The mounting portion 431 is configured with an electrically connected circuit board 211 and a joining component 212, or each loading portion 431 of the turntable 43 is equipped with a test seat 213 with a joining component 212, and a supporting tool 214 is configured in the testing room 131, the supporting tool 214 supports the circuit board 211, so that the circuit board 211 is electrically connected to the joining member 212. The support 214 can be a fixed configuration, or the support 214 and the turntable 43 can move relative to each other; in this embodiment, the support The device 214 is displaced by at least one Z direction to carry the circuit board 211 to electrically connect the joining component 212 on the turntable 43; when the rotating shaft 44 drives the turntable 43 to rotate at an angle according to the second test path, the electrical tester 21 and the radio frequency are driven The electronic component 61 is moved into the testing room 131, and the testing station is located in the testing room 131. The holder 214 drives the circuit board 211 to move in the Z direction, so that the circuit board 211 is electrically connected to the joining part 212 on the turntable 43, and the electrical tester 21 That is, the electrical test operation is performed on the radio frequency electronic component 61. When the antenna of the radio frequency electronic component 61 emits a beam toward 0° to transmit wireless signals, the antenna tester 12 on the transfer arm 11 receives the radio signal of the radio frequency electronic component 61 , And transmit the received wireless signal to the processor (not shown in the figure) of the central control device for judging the quality of the radio frequency electronic component 61.

請參閱第5圖,係本發明測試裝置10之第三實施例,其與第二實施例之差異在於承座為旋轉台71之應用型式,測試裝置10係於箱體13與機台板31之間形成測試室131,以供射頻電子元件61位於模擬應用場所溫度之測試環境,另於箱體13設有輸送通道132,輸送通道132供移入/移出射頻電子元件61;一為旋轉台71之承座,旋轉台71可作水平方向旋轉,或水平方向旋轉及Z方向位移,並設置至少一承接部711,以供承置射頻電子元件61,承接部711係設有相通旋轉台71底面之通孔712;以供通過電性測試器21,於本實施例中,旋轉台71係由第三驅動源驅動作水平方向旋轉,第三驅動源包含馬達(圖未示出)及一為轉動軸72之傳動器,轉動軸72連結驅動旋轉台71作水平方向旋轉,以使旋轉台71之各承接部711由箱體13之輸送通道132移入/移出測試室131,由於旋轉台71之承接部711移入測試室131之位置係相對於天線測試器12,使得承接部711之位置即為測試工位,一載具係為升降器45之型式,並配置於測試室131,以供承置且驅動電性測試器21作Z方向位移,當轉動軸72驅動旋轉台71依第二測試路徑作角度旋轉,而帶動射頻電子元件61移入測試室131後,旋轉台71係令射頻電子元件61位於電性測試器21及天線測試器12之間,升降器45帶動電性測試器21作Z方向位移,使電性測試器21通過旋轉台71之通孔712,以電性連接旋轉台71上之射頻電子元件61而執行電性測試作業,當射頻電子元件61的天線朝0°指向發出波束而傳輸無線訊號時,移載臂11上之天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Figure 5, which is the third embodiment of the test device 10 of the present invention. The difference from the second embodiment is that the bearing is the application type of the rotating table 71, and the test device 10 is attached to the box 13 and the table 31 A test chamber 131 is formed in between for the radio frequency electronic component 61 to be located in a test environment that simulates the temperature of the application site. In addition, a conveying channel 132 is provided in the box 13 for moving in/out of the radio frequency electronic component 61; one is a rotating table 71 The rotating table 71 can be rotated in the horizontal direction, or rotated in the horizontal direction and displaced in the Z direction, and is provided with at least one receiving portion 711 for receiving the radio frequency electronic component 61. The receiving portion 711 is provided with the bottom surface of the connected rotating table 71 The through hole 712; for passing the electrical tester 21, in this embodiment, the rotating table 71 is driven by a third driving source to rotate in a horizontal direction, the third driving source includes a motor (not shown) and a The transmission of the rotating shaft 72, the rotating shaft 72 is connected to drive the rotating table 71 to rotate in the horizontal direction, so that the receiving parts 711 of the rotating table 71 are moved into/out of the test chamber 131 from the conveying channel 132 of the box body 13, due to the rotation of the rotating table 71 The position where the receiving part 711 moves into the testing room 131 is relative to the antenna tester 12, so that the position of the receiving part 711 is the test station, and a carrier is in the form of a lifter 45 and is arranged in the testing room 131 for receiving The electrical tester 21 is set and driven to move in the Z direction. When the rotating shaft 72 drives the rotating table 71 to rotate at an angle according to the second test path, and drives the radio frequency electronic components 61 to move into the test chamber 131, the rotating table 71 makes the radio frequency electronic components 61 is located between the electrical tester 21 and the antenna tester 12. The lifter 45 drives the electrical tester 21 to move in the Z direction, so that the electrical tester 21 passes through the through hole 712 of the rotating table 71 and is electrically connected to the rotating table The radio frequency electronic component 61 on the 71 performs electrical testing operations. When the antenna of the radio frequency electronic component 61 emits a beam toward 0° to transmit wireless signals, the antenna tester 12 on the transfer arm 11 receives the radio frequency electronic component 61 The wireless signal is transmitted to the processor (not shown in the figure) of the central control device for determining the quality of the radio frequency electronic component 61.

請參閱第6圖,係本發明測試裝置10之第四實施例,其與第三實施例之差異在於一為升降器45之載具係配置機台板31,以供承置且驅動電性測試器21作Z方向位移,移載臂11係作至少一方向位移,並設有訊號通道111及至少一作業治具,該訊號通道111供裝配天線測試器12,該作業治具係為吸嘴112 ,以供移載及壓接射頻電子元件61,射頻電子元件61之天線612係朝向天線測試器12,而接點611則朝向電性測試器21,該測試工位係位於移載臂11,當移載臂11帶動天線測試器12及射頻電子元件61朝向電性測試器21作Z方向相對位移,以及升降器45帶動電性測試器21朝向射頻電子元件61作Z方向相對位移時 ,電性測試器21係電性連接移載臂11上且位於測試工位之射頻電子元件61而執行電性測試作業,射頻電子元件61的天線朝0°指向發出波束而傳輸無線訊號,移載臂11上之天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Fig. 6, which is the fourth embodiment of the test device 10 of the present invention. The difference from the third embodiment is that a carrier of the lifter 45 is equipped with a machine plate 31 for holding and driving electrical properties. The tester 21 is displaced in the Z direction, and the transfer arm 11 is displaced in at least one direction, and is provided with a signal channel 111 and at least one work fixture. The signal channel 111 is used to assemble the antenna tester 12, and the work fixture is a suction Mouth 112 , For transferring and crimping the radio frequency electronic component 61. The antenna 612 of the radio frequency electronic component 61 faces the antenna tester 12, and the contact point 611 faces the electrical tester 21. The test station is located on the transfer arm 11. When the transfer arm 11 drives the antenna tester 12 and the radio frequency electronic component 61 to make a relative displacement in the Z direction toward the electrical tester 21, and the lifter 45 drives the electrical tester 21 to make a relative displacement in the Z direction towards the radio frequency electronic element 61 , The electrical tester 21 is electrically connected to the radio frequency electronic component 61 on the transfer arm 11 and located at the test station to perform electrical testing operations. The antenna of the radio frequency electronic component 61 emits a beam toward 0° to transmit wireless signals. The antenna tester 12 on the carrier arm 11 receives the wireless signal of the radio frequency electronic component 61, and transmits the received radio signal to the processor (not shown in the figure) of the central control device for judging the quality of the radio frequency electronic component 61.

請參閱第7圖,本發明測試裝置10之第五實施例,以電性測試器21配置於測試室131而言,測試工位如前所述,可位於測試室131、移載臂11或承座(圖未示出),依不同測試作業需求而定,不受限於本實施例;於本實施例中,機台板31與箱體13之間形成測試室131,並於箱體13之兩側設置輸送通道135;又天線測試單元係於至少一輸送通道135設置至少一載台,亦或於箱體13外部設置至少一載台,載台可載送待測之射頻電子元件或已測之射頻電子元件 ,或載送待測之射頻電子元件及已測之射頻電子元件;於本實施例中,係於二輸送通道135設置二作Y方向位移之載台136,以供載送射頻電子元件;電性測試器21係裝配於測試室131,並設有電路板211及具接合部件212之測試座213,測試座213係設有可承置射頻電子元件61之容置部2131,接合部件212電性連接電路板211;移載臂11係作至少一方向位移,並設有訊號通道111及至少一作業治具,該訊號通道111供裝配天線測試器12,該作業治具係為吸嘴112,以供於載台136及電性測試器21之間移載射頻電子元件61。Please refer to Fig. 7, in the fifth embodiment of the test device 10 of the present invention, the electrical tester 21 is arranged in the test room 131, and the test station can be located in the test room 131, the transfer arm 11 or The socket (not shown in the figure) depends on the requirements of different test operations and is not limited to this embodiment; in this embodiment, a test chamber 131 is formed between the machine plate 31 and the box body 13, and is located in the box body Conveying channels 135 are arranged on both sides of 13; and the antenna test unit is equipped with at least one carrier on at least one conveying channel 135, or at least one carrier is arranged on the outside of the box 13, the carrier can carry the radio frequency electronic components to be tested Or tested radio frequency electronic components , Or to carry the radio frequency electronic components to be tested and the radio frequency electronic components that have been tested; in this embodiment, two transport channels 135 are provided with two Y-displacement stages 136 for carrying radio frequency electronic components; The tester 21 is assembled in the test room 131, and is provided with a circuit board 211 and a test base 213 with a bonding part 212. The test base 213 is provided with a accommodating part 2131 that can hold the radio frequency electronic component 61, and the bonding part 212 is electrically connected. Sexually connected to the circuit board 211; the transfer arm 11 is displaced in at least one direction, and is provided with a signal channel 111 and at least one work fixture. The signal channel 111 is used to assemble the antenna tester 12, and the work fixture is a nozzle 112 , For transferring the radio frequency electronic component 61 between the carrier 136 and the electrical tester 21.

請參閱第8、9圖,測試工位係位於測試室131,當一載台136承載射頻電子元件61至電性測試器21之側方時,移載臂11依第一測試路徑作X-Z方向位移,令吸嘴112於載台136取出待測之射頻電子元件61,並移載至電性測試器21之容置部2131,電性測試器21之接合部件212電性連接射頻電子元件61之接點611;移載臂11再帶動天線測試器12作Z方向位移至預設作業高度,當電性測試器21對射頻電子元件61執行電性測試作業時,射頻電子元件61之天線612於0°待測指向發射波束的無線訊號,由於移載臂11之訊號通道111供通過無線訊號,使得射頻電子元件61之天線612的無線訊號通過訊號通道111而傳輸至天線測試器12,以進行無線訊號測試作業,天線測試器12於接收無線訊號後,並將無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別分析射頻電子元件61之品質。Please refer to Figures 8 and 9, the test station is located in the test room 131. When a carrier 136 carries the radio frequency electronic component 61 to the side of the electrical tester 21, the transfer arm 11 moves in the XZ direction according to the first test path Displacement, so that the suction nozzle 112 takes out the radio frequency electronic component 61 to be tested on the stage 136, and transfers it to the accommodating portion 2131 of the electrical tester 21, and the bonding part 212 of the electrical tester 21 is electrically connected to the radio frequency electronic component 61 The contact 611; the transfer arm 11 then drives the antenna tester 12 to move to the preset operating height in the Z direction. When the electrical tester 21 performs electrical testing on the radio frequency electronic element 61, the antenna 612 of the radio frequency electronic element 61 The wireless signal of the transmitting beam at the 0° direction to be measured is transmitted to the antenna tester 12 through the signal channel 111 because the signal channel 111 of the transfer arm 11 is used to pass the wireless signal, so that the wireless signal of the antenna 612 of the radio frequency electronic component 61 is transmitted to the antenna tester 12 For wireless signal testing, after receiving the wireless signal, the antenna tester 12 transmits the wireless signal to the processor (not shown in the figure) of the central control device for determining and analyzing the quality of the radio frequency electronic component 61.

請參閱第10圖,本發明測試裝置10之第六實施例,其與第五實施例之差異在於測試工位係位於移載臂11,機台板31與箱體13之間形成測試室131,並於箱體13設置輸送通道132;載具係配置於測試室131,該載具係為升降器45,以供承置且驅動電性測試器21作Z方向位移;移載臂11係作至少一方向位移,並設有訊號通道111及至少一作業治具,該訊號通道111供裝配天線測試器12,該作業治具係為吸嘴112,以供移載射頻電子元件61,移載臂11係作X-Z方向位移將射頻電子元件61由箱體13之輸送通道132移入測試室131,令射頻電子元件61對位於電性測試器21,當升降器45帶動電性測試器21朝向射頻電子元件61作Z方向相對位移時,電性測試器21係電性連接射頻電子元件61而執行電性測試作業,射頻電子元件61的天線朝0°指向發出波束而傳輸無線訊號,移載臂11上之天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Fig. 10, the sixth embodiment of the test device 10 of the present invention differs from the fifth embodiment in that the test station is located on the transfer arm 11, and a test chamber 131 is formed between the machine plate 31 and the box 13 , And a conveying channel 132 is provided in the box 13; the carrier is arranged in the test room 131, and the carrier is a lifter 45 for holding and driving the electrical tester 21 for displacement in the Z direction; the transfer arm 11 is Displacement in at least one direction, and is provided with a signal channel 111 and at least one work fixture. The signal channel 111 is used to assemble the antenna tester 12. The work fixture is a suction nozzle 112 for transferring radio frequency electronic components 61. The carrier arm 11 is moved in the XZ direction to move the radio frequency electronic component 61 from the conveying channel 132 of the box 13 into the test room 131, so that the radio frequency electronic component 61 is positioned on the electrical tester 21, when the lifter 45 drives the electrical tester 21 towards When the radio frequency electronic component 61 is relatively displaced in the Z direction, the electrical tester 21 is electrically connected to the radio frequency electronic component 61 to perform electrical testing operations. The antenna of the radio frequency electronic component 61 emits a beam toward 0° to transmit wireless signals, and transfers The antenna tester 12 on the arm 11 receives the wireless signal of the radio frequency electronic component 61 and transmits the received radio signal to the processor (not shown in the figure) of the central control device for judging the quality of the radio frequency electronic component 61.

請參閱第11圖,係本發明測試裝置10之第七實施例,以電性測試器21配置於移載臂11而言,測試工位如前所述,可位於測試室131、移載臂11或承座,依不同測試作業需求而定,不受限於本實施例;於本實施例中,該天線測試單元之移載臂11係作至少一方向位移,並設有訊號通道111及至少一作業治具,訊號通道111供裝配天線測試器12,作業治具係為吸嘴112,以供移載射頻電子元件,另於移載臂11裝配外罩113,由移載臂11帶動外罩113及天線測試器12同步作Z方向位移,電性測試器21係裝配於移載臂11,並設有電性連接之電路板211及接合部件212,接合部件212係供電性連接射頻電子元件;測試裝置10之承座除了可為旋轉台之型式外,亦可為座體或面板,若為座體,則設有供承置射頻電子元件之承接部,於本實施例中,係於機台板31上設置為座體73之承座,座體73係設有承接部731,以供承置射頻電子元件。Please refer to Figure 11, which is the seventh embodiment of the test device 10 of the present invention. The electrical tester 21 is arranged on the transfer arm 11. The test station can be located in the test chamber 131 and the transfer arm as described above. 11 or pedestal, depending on the requirements of different test operations, and is not limited to this embodiment; in this embodiment, the transfer arm 11 of the antenna test unit is displaced in at least one direction, and is provided with a signal channel 111 and At least one work fixture, the signal channel 111 is used for assembling the antenna tester 12, the work fixture is the suction nozzle 112 for transferring radio frequency electronic components, and the transfer arm 11 is equipped with a cover 113, which is driven by the transfer arm 11 113 and the antenna tester 12 move synchronously in the Z direction. The electrical tester 21 is assembled on the transfer arm 11, and is provided with an electrical circuit board 211 and a joint part 212 that are electrically connected to the radio frequency electronic components. ; In addition to the type of rotating table, the socket of the test device 10 can also be a seat body or a panel. If it is a seat body, it is provided with a socket for holding radio frequency electronic components. In this embodiment, it is The base plate 31 is provided with a bearing seat of the base body 73, and the base body 73 is provided with a receiving portion 731 for holding radio frequency electronic components.

請參閱第12、13圖,測試工位係位於測試室131,移載臂11係以吸嘴112拾取移載射頻電子元件61,由於射頻電子元件61之接點611與天線612係配置於同一面,以及電性測試器21裝配於移載臂11,而可使射頻電子元件61之接點611電性連接電性測試器21之接合部件212,並使射頻電子元件61之天線612朝向天線測試器12,移載臂11作X方向位移將外罩113、電性測試器21及射頻電子元件61同步移載至座體73之上方;當移載臂11帶動外罩113、電性測試器21及射頻電子元件61同步作Z方向位移時,即令外罩113罩置於機台板31而形成測試室131,並將射頻電子元件61移入且壓接於座體73之承接部731,使電性測試器21係對射頻電子元件61執行電性測試作業時,射頻電子元件61的天線612朝0°指向發出波束而傳輸無線訊號,移載臂11上之天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Figures 12 and 13, the test station is located in the test room 131, and the transfer arm 11 uses the suction nozzle 112 to pick up and transfer the RF electronic component 61, because the contact 611 of the RF electronic component 61 and the antenna 612 are arranged in the same The surface, and the electrical tester 21 are assembled on the transfer arm 11, so that the contact 611 of the radio frequency electronic component 61 can be electrically connected to the joint part 212 of the electrical tester 21, and the antenna 612 of the radio frequency electronic component 61 can face the antenna The tester 12, the transfer arm 11 moves the cover 113, the electrical tester 21 and the radio frequency electronic component 61 synchronously to the top of the base body 73 when the transfer arm 11 moves in the X direction; when the transfer arm 11 drives the cover 113, the electrical tester 21 When the radio frequency electronic component 61 and the radio frequency electronic component 61 are simultaneously moved in the Z direction, the outer cover 113 is placed on the machine plate 31 to form a test chamber 131, and the radio frequency electronic component 61 is moved into and crimped on the receiving part 731 of the base body 73 to make the electrical When the tester 21 performs electrical testing operations on the radio frequency electronic component 61, the antenna 612 of the radio frequency electronic component 61 emits a beam toward 0° to transmit wireless signals, and the antenna tester 12 on the transfer arm 11 receives the radio frequency electronic component 61 And transmit the received wireless signal to the processor (not shown in the figure) of the central control device for judging the quality of the radio frequency electronic component 61.

請參閱第14圖,係本發明測試裝置10之第八實施例,其與第七實施例之差異在於測試工位係位於承座73,該天線測試單元之移載臂11係作至少一方向位移,並設有訊號通道111及至少一作業治具,訊號通道111供裝配天線測試器12,作業治具係為吸嘴112,以供移載射頻電子元件;電性測試器21係裝配於移載臂11,並設有電性連接之電路板211及接合部件212,接合部件212係供電性連接射頻電子元件;測試裝置10係於機台板31上設置為座體73之承座 ,座體73設有可承置射頻電子元件(圖未示出)之承接部731;當移載臂11之吸嘴112拾取移載射頻電子元件,即可使射頻電子元件之接點電性連接電性測試器21之接合部件212,並使射頻電子元件之天線朝向天線測試器12,當移載臂11將射頻電子元件移入且壓接於座體73之承接部731,電性測試器21即對射頻電子元件執行電性測試作業,射頻電子元件的天線朝0°指向發出波束而傳輸無線訊號,移載臂11上之天線測試器12即接收射頻電子元件之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以判別射頻電子元件之品質。Please refer to Fig. 14, which is the eighth embodiment of the test device 10 of the present invention. The difference from the seventh embodiment is that the test station is located on the bearing 73, and the transfer arm 11 of the antenna test unit is oriented in at least one direction. It is equipped with a signal channel 111 and at least one work fixture. The signal channel 111 is used for assembling the antenna tester 12. The work fixture is a suction nozzle 112 for transferring radio frequency electronic components; the electrical tester 21 is mounted on The transfer arm 11 is provided with an electrically connected circuit board 211 and a joining part 212. The joining part 212 is electrically connected to radio frequency electronic components; the test device 10 is set on the machine board 31 as a seat for the seat body 73 , The base body 73 is provided with a receiving portion 731 that can hold radio frequency electronic components (not shown); when the suction nozzle 112 of the transfer arm 11 picks up and transfers the radio frequency electronic components, the contacts of the radio frequency electronic components can be made electrical Connect the joint part 212 of the electrical tester 21, and make the antenna of the radio frequency electronic component face the antenna tester 12, when the transfer arm 11 moves the radio frequency electronic component into and crimps it to the receiving part 731 of the base body 73, the electrical tester 21 is to perform electrical testing operations on radio frequency electronic components. The antenna of the radio frequency electronic components emits a beam toward 0° to transmit wireless signals. The antenna tester 12 on the transfer arm 11 receives the radio signals of the radio frequency electronic components and will receive The wireless signal is transmitted to the processor (not shown in the figure) of the central control device to determine the quality of the radio frequency electronic components.

請參閱第1至3、15圖,本發明測試裝置10之第一實施例應用於測試作業設備之示意圖,包含機台30、供料裝置80、收料裝置90、本發明測試裝置10、輸送裝置100及中央控制裝置(圖未示出);供料裝置80係配置於機台30上,並設有至少一容納待測射頻電子元件之供料承置器81;收料裝置90係配置於機台30上,並設有至少一容納已測射頻電子元件之收料承置器91;本發明之測試裝置10係配置於機台30上,包含天線測試單元及電性測試單元,天線測試單元係設置移載臂11及天線測試器12,天線測試器12由移載臂11帶動作至少一方向位移,以供對位於測試工位之射頻電子元件的天線接收或發射無線訊號 ,該電性測試單元係設有具電路板211及接合部件212之電性測試器21,並以接合部件212供電性連接位於測試工位之射頻電子元件,藉以於電性測試單元對位於測試工位之射頻電子元件執行電性測試作業時,同步利用天線測試單元對測試工位之射頻電子元件的天線進行無線訊號測試作業;於本實施例中,測試裝置10係於機台30之第一側及第二側分別配置有複數個天線測試單元及電性測試單元, 更包含於機台30之第一側及第二側分別配置有測試室131及可為載座41之載具,另於機台30之第一側及第二側分別配置有移料器51,以分別於第一側及第二側載座41上之複數個電性測試器21移載待測/已測之射頻電子元件,測試裝置10另於機台30之第一側及第二側分別配置有載台136,以承載待測/已測之射頻電子元件;輸送裝置100係配置於機台30上,並設有至少一輸送器,用以輸送射頻電子元件,於本實施例中,輸送裝置100係設有作X-Y-Z方向位移之輸送器1001,以於供料裝置80取出待測之射頻電子元件,並移載至測試裝置10之載台136,載台136供移料器51取出待測之射頻電子元件,以及移入已測之射頻電子元件,移料器51將待測之射頻電子元件移載至載座41上之電性測試器21 ,載座41將電性測試器21及射頻電子元件移入測試室131執行電性測試作業及無線訊號測試作業,輸送器1001於載台136取出已測之射頻電子元件,並依測試結果,將已測之射頻電子元件移載至收料裝置110而分類收置;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能。Please refer to Figures 1 to 3 and 15, a schematic diagram of the first embodiment of the test device 10 of the present invention applied to test operation equipment, including the machine 30, the feeding device 80, the receiving device 90, the test device 10 of the present invention, and the conveying device. The device 100 and the central control device (not shown in the figure); the feeding device 80 is configured on the machine 30, and is provided with at least one feeding holder 81 that contains the radio frequency electronic component to be tested; the receiving device 90 is configured The machine 30 is provided with at least one receiving holder 91 for accommodating the tested radio frequency electronic components; the test device 10 of the present invention is arranged on the machine 30 and includes an antenna test unit and an electrical test unit, and an antenna The test unit is equipped with a transfer arm 11 and an antenna tester 12. The antenna tester 12 is moved by the transfer arm 11 to move at least in one direction to receive or transmit wireless signals to the antenna of the radio frequency electronic component at the test station. The electrical test unit is provided with an electrical tester 21 with a circuit board 211 and a joining component 212, and the joining component 212 is used to electrically connect the radio frequency electronic components at the testing station, so that the electrical testing unit is positioned to test When the radio frequency electronic components of the station perform electrical testing operations, the antenna test unit is used to simultaneously perform wireless signal testing operations on the antenna of the radio frequency electronic components of the test station; in this embodiment, the test device 10 is located on the first part of the machine 30 A plurality of antenna test units and electrical test units are respectively arranged on one side and the second side, and the first side and the second side of the machine 30 are respectively equipped with a test chamber 131 and a carrier that can be a carrier 41, In addition, a shifter 51 is respectively arranged on the first side and the second side of the machine 30 to transfer the plurality of electrical testers 21 on the first side and the second side carrier 41 to be tested/tested. For the radio frequency electronic components, the test device 10 is also equipped with a carrier 136 on the first side and the second side of the machine 30 to carry the radio frequency electronic components to be tested/tested; the conveying device 100 is arranged on the machine 30 , And at least one conveyor is provided for conveying radio frequency electronic components. In this embodiment, the conveying device 100 is provided with a conveyor 1001 that is displaced in the XYZ direction to take out the radio frequency electronic components to be tested from the feeding device 80 , And transferred to the carrier 136 of the test device 10, the carrier 136 for the shifter 51 to take out the radio frequency electronic components to be tested, and to move in the radio frequency electronic components that have been tested, and the shifter 51 moves the radio frequency electronic components to be tested Electrical tester 21 mounted on carrier 41 , The carrier 41 moves the electrical tester 21 and radio frequency electronic components into the test room 131 to perform electrical test operations and wireless signal test operations. The conveyor 1001 takes out the tested radio frequency electronic components on the carrier 136, and according to the test results, The tested radio frequency electronic components are transferred to the material receiving device 110 for sorting and storage; the central control device is used to control and integrate the actions of each device to perform automated operations and improve operational performance.

10:測試裝置 11:移載臂 111:訊號通道 112:吸嘴 113:外罩 12:天線測試器 L:作業軸線 13:箱體 131:測試室 132:輸送通道 133:輸送管 134:遮蔽件 135:輸送通道 136:載台 21:電性測試器 211:電路板 212:接合部件 213:測試座 2131:容置部 214:承置具 30:機台 31:機台板 41:載座 411:擋板 412:承板 42:第二驅動源 43:轉盤 431:載裝部 44:轉軸 45:升降器 51:移料器 61:射頻電子元件 611:接點 612:天線 71:旋轉台 711:承接部 712:通孔 72:轉動軸 73:座體 731:承接部 80:供料裝置 81:供料承置器 90:收料裝置 91:收料承置器 100:輸送裝置 1001:輸送器10: Test device 11: Transfer arm 111: signal channel 112: Nozzle 113: outer cover 12: Antenna tester L: work axis 13: cabinet 131: Test Room 132: Conveying Channel 133: Conveying Pipe 134: Shading 135: Conveying Channel 136: Stage 21: Electrical tester 211: Circuit Board 212: Joining Parts 213: Test Block 2131: accommodating part 214: Holder 30: Machine 31: machine board 41: Carrier 411: bezel 412: bearing plate 42: second drive source 43: turntable 431: Loading Department 44: shaft 45: lifter 51: Shifter 61: RF electronic components 611: Contact 612: Antenna 71: Rotating table 711: Acceptance Department 712: Through Hole 72: Rotation axis 73: Seat 731: Acceptance Department 80: Feeding device 81: Feeder 90: Receiving device 91: Receiving holder 100: Conveying device 1001: Conveyor

第1圖:本發明測試裝置第一實施例之示意圖。 第2圖:本發明測試裝置第一實施例之使用示意圖(一)。 第3圖:本發明測試裝置第一實施例之使用示意圖(二)。 第4圖:本發明測試裝置第二實施例之示意圖。 第5圖:本發明測試裝置第三實施例之示意圖。 第6圖:本發明測試裝置第四實施例之示意圖。 第7圖:本發明測試裝置第五實施例之示意圖。 第8圖:本發明測試裝置第五實施例之使用示意圖(一)。 第9圖:本發明測試裝置第五實施例之使用示意圖(二)。 第10圖:本發明測試裝置第六實施例之示意圖。 第11圖:本發明測試裝置第七實施例之示意圖。 第12圖:本發明測試裝置第七實施例之使用示意圖(一)。 第13圖:本發明測試裝置第七實施例之使用示意圖(二)。 第14圖:本發明測試裝置第八實施例之示意圖。 第15圖:本發明測試裝置應用於測試作業設備之示意圖。Figure 1: A schematic diagram of the first embodiment of the testing device of the present invention. Figure 2: A schematic diagram of the use of the first embodiment of the testing device of the present invention (1). Figure 3: A schematic diagram of the use of the first embodiment of the testing device of the present invention (2). Figure 4: A schematic diagram of the second embodiment of the testing device of the present invention. Figure 5: A schematic diagram of the third embodiment of the testing device of the present invention. Figure 6: A schematic diagram of the fourth embodiment of the testing device of the present invention. Figure 7: A schematic diagram of the fifth embodiment of the testing device of the present invention. Figure 8: A schematic diagram of the use of the fifth embodiment of the test device of the present invention (1). Figure 9: A schematic diagram of the use of the fifth embodiment of the test device of the present invention (2). Figure 10: A schematic diagram of the sixth embodiment of the testing device of the present invention. Figure 11: A schematic diagram of the seventh embodiment of the testing device of the present invention. Figure 12: A schematic diagram of the use of the seventh embodiment of the testing device of the present invention (1). Figure 13: A schematic diagram of the use of the seventh embodiment of the testing device of the present invention (2). Figure 14: A schematic diagram of the eighth embodiment of the testing device of the present invention. Figure 15: A schematic diagram of the testing device of the present invention applied to testing equipment.

10:測試裝置10: Test device

11:移載臂11: Transfer arm

111:訊號通道111: signal channel

12:天線測試器12: Antenna tester

L:作業軸線L: work axis

13:箱體13: cabinet

131:測試室131: Test Room

132:輸送通道132: Conveying Channel

133:輸送管133: Conveying Pipe

21:電性測試器21: Electrical tester

211:電路板211: Circuit Board

212:接合部件212: Joining Parts

213:測試座213: Test Block

2131:容置部2131: accommodating part

31:機台板31: machine board

41:載座41: Carrier

411:擋板411: bezel

412:承板412: bearing plate

42:第二驅動源42: second drive source

Claims (17)

一種射頻電子元件測試裝置,包含: 天線測試單元:係設置移載臂及天線測試器,該移載臂係供作至少一方向位移,該天線測試器係裝配於該移載臂,以供對位於測試工位之該射頻電子元件執行無線訊號測試作業; 電性測試單元:係設置至少一電性測試器,該電性測試器係設置電路 板及接合部件,該接合部件供電性連接位於該測試工 位之該射頻電子元件執行電性測試作業。A radio frequency electronic component testing device, including: Antenna test unit: a transfer arm and an antenna tester are provided. The transfer arm is provided for displacement in at least one direction. The antenna tester is mounted on the transfer arm for alignment of the radio frequency electronic component at the test station. Perform wireless signal test operations; Electrical test unit: at least one electrical tester is provided, and the electrical tester is equipped with a circuit Board and joint parts, the joint parts are electrically connected to the tester Position the radio frequency electronic components to perform electrical testing operations. 依申請專利範圍第1項所述之射頻電子元件測試裝置,其中,該移載臂係供裝配該電性測試器,而供帶動該電性測試器位移。According to the radio frequency electronic component test device described in item 1 of the scope of patent application, the transfer arm is used for assembling the electrical tester and is used for driving the electrical tester to move. 依申請專利範圍第1項所述之射頻電子元件測試裝置,更包含測試室 ,該測試室以供裝配該電性測試器。According to the radio frequency electronic component test device described in item 1 of the scope of patent application, it also includes a test room , The test room is for assembling the electrical tester. 依申請專利範圍第1項所述之射頻電子元件測試裝置,更包含載具,該載具以供裝配該電性測試器。The radio frequency electronic component test device described in item 1 of the scope of patent application further includes a carrier for assembling the electrical tester. 依申請專利範圍第4項所述之射頻電子元件測試裝置,其中,該電性測試器係於該載具裝配具該接合部件之測試座,該測試座供承置該射頻電子元件,該電性測試器並設置至少一承置具承置該電路板,以供該電路板電性連接該接合部件。According to the radio frequency electronic component test device described in item 4 of the scope of patent application, wherein the electrical tester is a test base equipped with the joint component on the carrier, and the test base is configured to hold the radio frequency electronic element, and the electrical The tester is equipped with at least one supporting tool to support the circuit board, so that the circuit board is electrically connected to the joint component. 依申請專利範圍第1至4項任一項所述之射頻電子元件測試裝置,其中,該測試工位係位於該移載臂。According to the radio frequency electronic component test device described in any one of items 1 to 4 of the scope of patent application, the test station is located on the transfer arm. 依申請專利範圍第1、2、4或5項任一項所述之射頻電子元件測試裝置,更包含測試室,該測試工位係位於該測試室。The radio frequency electronic component test device according to any one of items 1, 2, 4, or 5 of the scope of patent application further includes a test room, and the test station is located in the test room. 依申請專利範圍第3項所述之射頻電子元件測試裝置,其中,該測試工位係位於該測試室。According to the radio frequency electronic component test device described in item 3 of the scope of patent application, the test station is located in the test room. 依申請專利範圍第3或8項所述之射頻電子元件測試裝置,其係於面板與箱體之間形成該測試室,並於該箱體或該面板設置輸送通道。According to the radio frequency electronic component test device described in item 3 or 8 of the scope of patent application, the test chamber is formed between the panel and the box, and the box or the panel is provided with a conveying channel. 依申請專利範圍第3或8項所述之射頻電子元件測試裝置,其係於一外罩罩置於面板時形成該測試室。According to the radio frequency electronic component test device described in item 3 or 8 of the scope of patent application, the test chamber is formed when an outer cover is placed on the panel. 依申請專利範圍第1至5項任一項所述之射頻電子元件測試裝置,更包含承座,該測試工位係位於該承座。According to any one of items 1 to 5 of the scope of patent application, the radio frequency electronic component testing device further includes a socket, and the test station is located on the socket. 依申請專利範圍第11項所述之射頻電子元件測試裝置,其中,該承座係設有通孔。According to the radio frequency electronic component test device described in item 11 of the scope of patent application, the socket is provided with a through hole. 依申請專利範圍第1至5項所述之射頻電子元件測試裝置,其中,該移載臂係設有至少一作業治具及訊號通道,該作業治具係供執行預設作業,該訊號通道係供通過無線訊號。According to the radio frequency electronic component test device described in items 1 to 5 of the scope of patent application, wherein the transfer arm is provided with at least one work fixture and a signal channel, the work fixture is for performing preset operations, and the signal channel It is for passing wireless signals. 依申請專利範圍第1至4項任一項所述之射頻電子元件測試裝置,其中,該電性測試單元係設置電性調整器,以裝配該電性測試器,而供該電性測試器作至少一方向位移或作角度轉動,或作至少一方向位移及角度轉動。According to the radio frequency electronic component test device described in any one of items 1 to 4 of the scope of patent application, wherein the electrical test unit is provided with an electrical adjuster to assemble the electrical tester and supply the electrical tester Make at least one direction displacement or angle rotation, or make at least one direction displacement and angle rotation. 依申請專利範圍第1至5項任一項所述之射頻電子元件測試裝置,其中,該天線測試單元係設置天線調整器,以裝配該天線測試器,而供該天線測試器作至少一方向位移或作角度轉動,或作至少一方向位移及角度轉動。According to the radio frequency electronic component test device described in any one of items 1 to 5 of the scope of patent application, wherein the antenna test unit is provided with an antenna adjuster to assemble the antenna tester, and the antenna tester is used for at least one direction Displacement or angular rotation, or at least one direction displacement and angular rotation. 依申請專利範圍第1至5項任一項所述之射頻電子元件測試裝置,更包含於該天線測試器與該測試工位之間設有至少一中介器。The radio frequency electronic component testing device described in any one of items 1 to 5 of the scope of patent application further includes at least one intermediary provided between the antenna tester and the testing station. 一種射頻電子元件測試作業設備,包含: 機台; 供料裝置:係配置於該機台上,並設有至少一容納待測該射頻電子 元件之供料承置器; 收料裝置:係配置於該機台上,並設有至少一容納已測該射頻電子 元件之收料承置器; 至少一依申請專利範圍第1至5項任一項所述之射頻電子元件測試裝 置:係配置於該機台上,以供測試該射頻電子元件; 輸送裝置:係配置於該機台上,並設有至少一輸送器,以供輸送該 射頻電子元件; 中央控制裝置:係用以控制及整合各裝置作動,以執行自動化作A radio frequency electronic component testing equipment, including: Machine; Feeding device: It is configured on the machine and is equipped with at least one radio frequency electronic device to be tested Component feeder holder; Receiving device: it is arranged on the machine, and is equipped with at least one accommodating radio frequency electronic Component receiving holder; At least one radio frequency electronic component test device according to any one of items 1 to 5 in the scope of the patent application Setting: It is configured on the machine for testing the radio frequency electronic components; Conveying device: It is arranged on the machine and is equipped with at least one conveyor for conveying the RF electronic components; Central control device: used to control and integrate the actions of various devices to perform automated operations
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TWI804309B (en) * 2022-05-11 2023-06-01 量崴科技股份有限公司 Antenna test system

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TWI783706B (en) * 2021-10-01 2022-11-11 鴻勁精密股份有限公司 Testing room structure, testing apparatus, and processing machine
TWI804309B (en) * 2022-05-11 2023-06-01 量崴科技股份有限公司 Antenna test system

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