TW202124640A - 黏著帶 - Google Patents
黏著帶 Download PDFInfo
- Publication number
- TW202124640A TW202124640A TW109145850A TW109145850A TW202124640A TW 202124640 A TW202124640 A TW 202124640A TW 109145850 A TW109145850 A TW 109145850A TW 109145850 A TW109145850 A TW 109145850A TW 202124640 A TW202124640 A TW 202124640A
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- TW
- Taiwan
- Prior art keywords
- acrylic resin
- adhesive tape
- resin
- polymer
- mgkoh
- Prior art date
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- 239000002390 adhesive tape Substances 0.000 title claims abstract description 80
- 239000004925 Acrylic resin Substances 0.000 claims abstract description 108
- 229920000178 Acrylic resin Polymers 0.000 claims abstract description 108
- 229920000642 polymer Polymers 0.000 claims abstract description 61
- 239000012790 adhesive layer Substances 0.000 claims abstract description 38
- 239000002253 acid Substances 0.000 claims abstract description 37
- 239000004065 semiconductor Substances 0.000 claims description 34
- 238000004519 manufacturing process Methods 0.000 claims description 20
- 239000004848 polyfunctional curative Substances 0.000 claims description 18
- 238000009826 distribution Methods 0.000 claims description 15
- 239000003054 catalyst Substances 0.000 claims description 14
- 239000003822 epoxy resin Substances 0.000 claims description 14
- 229920000647 polyepoxide Polymers 0.000 claims description 14
- 229920005989 resin Polymers 0.000 description 38
- 239000011347 resin Substances 0.000 description 38
- 238000007789 sealing Methods 0.000 description 38
- -1 -isopropyl ester Chemical class 0.000 description 21
- 238000000034 method Methods 0.000 description 20
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 16
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 16
- 238000006243 chemical reaction Methods 0.000 description 14
- 230000000052 comparative effect Effects 0.000 description 14
- 235000012431 wafers Nutrition 0.000 description 13
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 12
- 230000015572 biosynthetic process Effects 0.000 description 12
- 238000003786 synthesis reaction Methods 0.000 description 12
- 239000000758 substrate Substances 0.000 description 11
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 10
- 239000000853 adhesive Substances 0.000 description 10
- 230000001070 adhesive effect Effects 0.000 description 9
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 9
- 239000003795 chemical substances by application Substances 0.000 description 8
- 238000005227 gel permeation chromatography Methods 0.000 description 8
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical class CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 7
- CQEYYJKEWSMYFG-UHFFFAOYSA-N butyl acrylate Chemical compound CCCCOC(=O)C=C CQEYYJKEWSMYFG-UHFFFAOYSA-N 0.000 description 7
- 238000005520 cutting process Methods 0.000 description 7
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 7
- 239000000203 mixture Substances 0.000 description 7
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 6
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 6
- 238000011109 contamination Methods 0.000 description 6
- 239000003292 glue Substances 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 6
- 238000003825 pressing Methods 0.000 description 6
- OZAIFHULBGXAKX-UHFFFAOYSA-N 2-(2-cyanopropan-2-yldiazenyl)-2-methylpropanenitrile Chemical compound N#CC(C)(C)N=NC(C)(C)C#N OZAIFHULBGXAKX-UHFFFAOYSA-N 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- 239000004593 Epoxy Substances 0.000 description 5
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 5
- 229920001577 copolymer Polymers 0.000 description 5
- 238000011156 evaluation Methods 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 238000000465 moulding Methods 0.000 description 5
- 229920001721 polyimide Polymers 0.000 description 5
- 239000004642 Polyimide Substances 0.000 description 4
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 4
- 239000011889 copper foil Substances 0.000 description 4
- 229920006037 cross link polymer Polymers 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 229920003986 novolac Polymers 0.000 description 4
- 230000000704 physical effect Effects 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 3
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 3
- 239000000654 additive Substances 0.000 description 3
- 238000004132 cross linking Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 239000003999 initiator Substances 0.000 description 3
- 239000012948 isocyanate Substances 0.000 description 3
- 150000002513 isocyanates Chemical class 0.000 description 3
- 239000010410 layer Substances 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 229920000139 polyethylene terephthalate Polymers 0.000 description 3
- 239000005020 polyethylene terephthalate Substances 0.000 description 3
- 229910052714 tellurium Inorganic materials 0.000 description 3
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 description 3
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 3
- 238000011282 treatment Methods 0.000 description 3
- LXBGSDVWAMZHDD-UHFFFAOYSA-N 2-methyl-1h-imidazole Chemical compound CC1=NC=CN1 LXBGSDVWAMZHDD-UHFFFAOYSA-N 0.000 description 2
- ZVYGIPWYVVJFRW-UHFFFAOYSA-N 3-methylbutyl prop-2-enoate Chemical compound CC(C)CCOC(=O)C=C ZVYGIPWYVVJFRW-UHFFFAOYSA-N 0.000 description 2
- UPMLOUAZCHDJJD-UHFFFAOYSA-N 4,4'-Diphenylmethane Diisocyanate Chemical compound C1=CC(N=C=O)=CC=C1CC1=CC=C(N=C=O)C=C1 UPMLOUAZCHDJJD-UHFFFAOYSA-N 0.000 description 2
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical group [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- YNQLUTRBYVCPMQ-UHFFFAOYSA-N Ethylbenzene Chemical compound CCC1=CC=CC=C1 YNQLUTRBYVCPMQ-UHFFFAOYSA-N 0.000 description 2
- WRQNANDWMGAFTP-UHFFFAOYSA-N Methylacetoacetic acid Chemical compound COC(=O)CC(C)=O WRQNANDWMGAFTP-UHFFFAOYSA-N 0.000 description 2
- MZRVEZGGRBJDDB-UHFFFAOYSA-N N-Butyllithium Chemical compound [Li]CCCC MZRVEZGGRBJDDB-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 239000004952 Polyamide Substances 0.000 description 2
- 239000004734 Polyphenylene sulfide Substances 0.000 description 2
- 230000001476 alcoholic effect Effects 0.000 description 2
- 150000001412 amines Chemical class 0.000 description 2
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 2
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 125000004432 carbon atom Chemical group C* 0.000 description 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000008367 deionised water Substances 0.000 description 2
- 229910021641 deionized water Inorganic materials 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 125000000524 functional group Chemical group 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- 238000003475 lamination Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000000178 monomer Substances 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- 238000009832 plasma treatment Methods 0.000 description 2
- 229920002647 polyamide Polymers 0.000 description 2
- 229920000069 polyphenylene sulfide Polymers 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- 238000010526 radical polymerization reaction Methods 0.000 description 2
- 230000009257 reactivity Effects 0.000 description 2
- 239000011342 resin composition Substances 0.000 description 2
- DCKVNWZUADLDEH-UHFFFAOYSA-N sec-butyl acetate Chemical compound CCC(C)OC(C)=O DCKVNWZUADLDEH-UHFFFAOYSA-N 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- FKTHNVSLHLHISI-UHFFFAOYSA-N 1,2-bis(isocyanatomethyl)benzene Chemical compound O=C=NCC1=CC=CC=C1CN=C=O FKTHNVSLHLHISI-UHFFFAOYSA-N 0.000 description 1
- LZDKZFUFMNSQCJ-UHFFFAOYSA-N 1,2-diethoxyethane Chemical compound CCOCCOCC LZDKZFUFMNSQCJ-UHFFFAOYSA-N 0.000 description 1
- ZTNJGMFHJYGMDR-UHFFFAOYSA-N 1,2-diisocyanatoethane Chemical compound O=C=NCCN=C=O ZTNJGMFHJYGMDR-UHFFFAOYSA-N 0.000 description 1
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 1
- OVBFMUAFNIIQAL-UHFFFAOYSA-N 1,4-diisocyanatobutane Chemical compound O=C=NCCCCN=C=O OVBFMUAFNIIQAL-UHFFFAOYSA-N 0.000 description 1
- UICXTANXZJJIBC-UHFFFAOYSA-N 1-(1-hydroperoxycyclohexyl)peroxycyclohexan-1-ol Chemical compound C1CCCCC1(O)OOC1(OO)CCCCC1 UICXTANXZJJIBC-UHFFFAOYSA-N 0.000 description 1
- FBHPRUXJQNWTEW-UHFFFAOYSA-N 1-benzyl-2-methylimidazole Chemical compound CC1=NC=CN1CC1=CC=CC=C1 FBHPRUXJQNWTEW-UHFFFAOYSA-N 0.000 description 1
- AVTLBBWTUPQRAY-UHFFFAOYSA-N 2-(2-cyanobutan-2-yldiazenyl)-2-methylbutanenitrile Chemical compound CCC(C)(C#N)N=NC(C)(CC)C#N AVTLBBWTUPQRAY-UHFFFAOYSA-N 0.000 description 1
- XMNIXWIUMCBBBL-UHFFFAOYSA-N 2-(2-phenylpropan-2-ylperoxy)propan-2-ylbenzene Chemical compound C=1C=CC=CC=1C(C)(C)OOC(C)(C)C1=CC=CC=C1 XMNIXWIUMCBBBL-UHFFFAOYSA-N 0.000 description 1
- JAHNSTQSQJOJLO-UHFFFAOYSA-N 2-(3-fluorophenyl)-1h-imidazole Chemical compound FC1=CC=CC(C=2NC=CN=2)=C1 JAHNSTQSQJOJLO-UHFFFAOYSA-N 0.000 description 1
- GOXQRTZXKQZDDN-UHFFFAOYSA-N 2-Ethylhexyl acrylate Chemical compound CCCCC(CC)COC(=O)C=C GOXQRTZXKQZDDN-UHFFFAOYSA-N 0.000 description 1
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 1
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 1
- NPSJHQMIVNJLNN-UHFFFAOYSA-N 2-ethylhexyl 4-nitrobenzoate Chemical compound CCCCC(CC)COC(=O)C1=CC=C([N+]([O-])=O)C=C1 NPSJHQMIVNJLNN-UHFFFAOYSA-N 0.000 description 1
- 239000004808 2-ethylhexylester Substances 0.000 description 1
- WFUGQJXVXHBTEM-UHFFFAOYSA-N 2-hydroperoxy-2-(2-hydroperoxybutan-2-ylperoxy)butane Chemical compound CCC(C)(OO)OOC(C)(CC)OO WFUGQJXVXHBTEM-UHFFFAOYSA-N 0.000 description 1
- 125000000954 2-hydroxyethyl group Chemical group [H]C([*])([H])C([H])([H])O[H] 0.000 description 1
- OMIGHNLMNHATMP-UHFFFAOYSA-N 2-hydroxyethyl prop-2-enoate Chemical compound OCCOC(=O)C=C OMIGHNLMNHATMP-UHFFFAOYSA-N 0.000 description 1
- CFVWNXQPGQOHRJ-UHFFFAOYSA-N 2-methylpropyl prop-2-enoate Chemical compound CC(C)COC(=O)C=C CFVWNXQPGQOHRJ-UHFFFAOYSA-N 0.000 description 1
- LRRBANSQUYNJTH-UHFFFAOYSA-N 2-tert-butylperoxy-2-methylpropane;2-ethylhexanoic acid Chemical compound CCCCC(CC)C(O)=O.CC(C)(C)OOC(C)(C)C LRRBANSQUYNJTH-UHFFFAOYSA-N 0.000 description 1
- LLEASVZEQBICSN-UHFFFAOYSA-N 2-undecyl-1h-imidazole Chemical compound CCCCCCCCCCCC1=NC=CN1 LLEASVZEQBICSN-UHFFFAOYSA-N 0.000 description 1
- QZPSOSOOLFHYRR-UHFFFAOYSA-N 3-hydroxypropyl prop-2-enoate Chemical compound OCCCOC(=O)C=C QZPSOSOOLFHYRR-UHFFFAOYSA-N 0.000 description 1
- FVCSARBUZVPSQF-UHFFFAOYSA-N 5-(2,4-dioxooxolan-3-yl)-7-methyl-3a,4,5,7a-tetrahydro-2-benzofuran-1,3-dione Chemical compound C1C(C(OC2=O)=O)C2C(C)=CC1C1C(=O)COC1=O FVCSARBUZVPSQF-UHFFFAOYSA-N 0.000 description 1
- OZAIFHULBGXAKX-VAWYXSNFSA-N AIBN Substances N#CC(C)(C)\N=N\C(C)(C)C#N OZAIFHULBGXAKX-VAWYXSNFSA-N 0.000 description 1
- 239000004342 Benzoyl peroxide Substances 0.000 description 1
- OMPJBNCRMGITSC-UHFFFAOYSA-N Benzoylperoxide Chemical compound C=1C=CC=CC=1C(=O)OOC(=O)C1=CC=CC=C1 OMPJBNCRMGITSC-UHFFFAOYSA-N 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- LCGLNKUTAGEVQW-UHFFFAOYSA-N Dimethyl ether Chemical compound COC LCGLNKUTAGEVQW-UHFFFAOYSA-N 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 239000005057 Hexamethylene diisocyanate Substances 0.000 description 1
- 239000005058 Isophorone diisocyanate Substances 0.000 description 1
- 239000002841 Lewis acid Substances 0.000 description 1
- 229920000877 Melamine resin Polymers 0.000 description 1
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 1
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 1
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 description 1
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 1
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- OFOBLEOULBTSOW-UHFFFAOYSA-N Propanedioic acid Natural products OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 1
- XBDQKXXYIPTUBI-UHFFFAOYSA-M Propionate Chemical compound CCC([O-])=O XBDQKXXYIPTUBI-UHFFFAOYSA-M 0.000 description 1
- 239000006087 Silane Coupling Agent Substances 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 1
- KXBFLNPZHXDQLV-UHFFFAOYSA-N [cyclohexyl(diisocyanato)methyl]cyclohexane Chemical compound C1CCCCC1C(N=C=O)(N=C=O)C1CCCCC1 KXBFLNPZHXDQLV-UHFFFAOYSA-N 0.000 description 1
- 239000006096 absorbing agent Substances 0.000 description 1
- KXKVLQRXCPHEJC-UHFFFAOYSA-N acetic acid trimethyl ester Natural products COC(C)=O KXKVLQRXCPHEJC-UHFFFAOYSA-N 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 150000001338 aliphatic hydrocarbons Chemical class 0.000 description 1
- 125000005907 alkyl ester group Chemical group 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 125000003368 amide group Chemical group 0.000 description 1
- 125000003277 amino group Chemical group 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000003712 anti-aging effect Effects 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- 235000019400 benzoyl peroxide Nutrition 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000003851 corona treatment Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 238000002788 crimping Methods 0.000 description 1
- LDHQCZJRKDOVOX-NSCUHMNNSA-N crotonic acid Chemical compound C\C=C\C(O)=O LDHQCZJRKDOVOX-NSCUHMNNSA-N 0.000 description 1
- MRIZMKJLUDDMHF-UHFFFAOYSA-N cumene;hydrogen peroxide Chemical compound OO.CC(C)C1=CC=CC=C1 MRIZMKJLUDDMHF-UHFFFAOYSA-N 0.000 description 1
- 150000004292 cyclic ethers Chemical class 0.000 description 1
- 150000004656 dimethylamines Chemical class 0.000 description 1
- 238000002845 discoloration Methods 0.000 description 1
- 238000004821 distillation Methods 0.000 description 1
- 239000000975 dye Substances 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- JDVIRCVIXCMTPU-UHFFFAOYSA-N ethanamine;trifluoroborane Chemical compound CCN.FB(F)F JDVIRCVIXCMTPU-UHFFFAOYSA-N 0.000 description 1
- IOLQWGVDEFWYNP-UHFFFAOYSA-N ethyl 2-bromo-2-methylpropanoate Chemical compound CCOC(=O)C(C)(C)Br IOLQWGVDEFWYNP-UHFFFAOYSA-N 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 150000002334 glycols Chemical class 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- SCFQUKBBGYTJNC-UHFFFAOYSA-N heptyl prop-2-enoate Chemical compound CCCCCCCOC(=O)C=C SCFQUKBBGYTJNC-UHFFFAOYSA-N 0.000 description 1
- RRAMGCGOFNQTLD-UHFFFAOYSA-N hexamethylene diisocyanate Chemical compound O=C=NCCCCCCN=C=O RRAMGCGOFNQTLD-UHFFFAOYSA-N 0.000 description 1
- LNMQRPPRQDGUDR-UHFFFAOYSA-N hexyl prop-2-enoate Chemical compound CCCCCCOC(=O)C=C LNMQRPPRQDGUDR-UHFFFAOYSA-N 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
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Abstract
一種黏著帶,具有包含酸值為30 mgKOH/g~100 mgKOH/g的第一丙烯酸樹脂及酸值為0 mgKOH/g~10 mgKOH/g的第二丙烯酸樹脂的黏著層,且所述第一丙烯酸樹脂與所述第二丙烯酸樹脂的比例為第一丙烯酸樹脂:第二丙烯酸樹脂=85:15~65:35,所述第一丙烯酸樹脂與第二丙烯酸樹脂具有半相互侵入高分子網眼結構。
Description
本發明是有關於一種主要用於製造半導體裝置的黏著帶。
於大規模積體電路(Large Scale Integrated circuit,LSI)的安裝技術中,晶片級封裝(Chip Size/Scale Package,CSP)技術受到關注,其中,關於以四方無引線封裝(Quad Flat Non-leaded package,QFN)為代表的將引線端子裝入封裝內部的形態的封裝,於小型化與高積體的方面有利。作為此種QFN的製造方法,可採用如下方法:將多個QFN用半導體晶片排列於引線框架的封裝圖案區域的晶粒墊(die pad)上,並於模具的模穴內利用密封樹脂成批密封後,切分成個別的QFN結構物,藉此提高引線框架每單位面積的生產性。
於如上所述的成批密封多個半導體晶片的QFN的製造方法中,樹脂密封時模塑(mold)模具所夾的區域僅為比封裝圖案區域向外側擴展的樹脂密封區域的更外側的區域。因此,密封樹脂向引線框架背面洩露,容易產生由模塑樹脂產生的毛刺所引起的連接不良、或QFN的端子等被樹脂被覆的問題。因此,於QFN的製造方法中,認為有效的是於引線框架的背面側貼附耐熱性的黏著帶,藉由利用該黏著帶的自身黏著力(遮蔽)的密封效果來防止樹脂密封時向引線框架背面側的樹脂洩漏。
於此種製造方法中,可採用:於引線框架上搭載半導體晶片後或者於實施打線接合後進行黏著帶的貼合的方法;或於最初的階段將黏著帶貼合於引線框架的背面(外部焊墊面),然後,經過半導體晶片的搭載步驟或打線接合步驟來進行利用密封樹脂的密封步驟的方法。此時,提出了如下製造方法:使用具有黏著劑層的耐熱性黏著帶,可於防止樹脂洩漏的同時實施打線接合等一系列的步驟(參照專利文獻1)。
另外,專利文獻2中揭示了於黏著劑成分中添加脫模劑成分的耐熱性黏著帶,藉此可較佳地防止密封步驟中的樹脂洩漏,另外,報告了由於黏著劑層中含有脫模劑,因此可容易地進行密封步驟後的剝落,可抑制剝落應力所引起的經模塑的樹脂的剝離或破損。
[現有技術文獻]
[專利文獻]
[專利文獻1]日本專利特開2002-184801號公報
[專利文獻2]日本專利特開2010-157752號公報
[發明所欲解決之課題]
於QFN中使用的引線框架是預鍍引線框架(pre-plated leadframe,PPF)的情況下,無法進行剝離黏著帶後的物理研磨。即,PPF中無法進行機械清洗,因此存在由於無法藉由目視判別的奈米級殘膠而引起焊料不附著等特性惡化或變色所引起的良率惡化的問題。
於該方面,於使用矽酮樹脂作為黏著帶的黏著層的情況下,存在容易受到熱分解而於密封步驟後產生矽氧烷氣體所引起的污染的問題。另外,於使用丙烯酸樹脂作為黏著層的情況下,雖然藉由充分進行交聯反應可防止污染,但為了抑制模塑樹脂所引起的毛刺所需要的密封步驟中的密接力降低。
另外,專利文獻2所揭示的黏著帶的密接性良好,另一方面,就兼顧密接性與防止殘膠的觀點而言,還不能說充分。
本發明是鑑於所述情況而成者,目的在於提供一種防止密封步驟中的模塑樹脂毛刺且於帶剝離步驟中無殘膠的、兼顧了密接性與耐污染性的黏著帶。
[解決課題之手段]
本發明者等人為了解決所述課題進行了銳意研究,結果發現以特定的比例含有具有特定範圍的酸值的至少兩種丙烯酸樹脂且具有半相互侵入高分子網眼結構的黏著帶可解決所述課題,從而完成了本發明。
即,本發明如下所述。
[1]
一種黏著帶,具有包含酸值為30 mgKOH/g~100 mgKOH/g的第一丙烯酸樹脂及酸值為0 mgKOH/g~10 mgKOH/g的第二丙烯酸樹脂的黏著層,且
所述第一丙烯酸樹脂與所述第二丙烯酸樹脂的比例為第一丙烯酸樹脂:第二丙烯酸樹脂=85:15~65:35,
所述第一丙烯酸樹脂與第二丙烯酸樹脂具有半相互侵入高分子網眼結構。
[2]
如所述[1]所述的黏著帶,其中所述第一丙烯酸樹脂的分子量分佈(Mw/Mn)為2.0以下,所述第二丙烯酸樹脂的分子量分佈(Mw/Mn)為2.0以下。
[3]
如所述[1]或[2]所述的黏著帶,其中所述第一丙烯酸樹脂的重量平均分子量(Mw)為40萬~100萬,所述第二丙烯酸樹脂的重量平均分子量(Mw)為40萬~80萬。
[4]
如所述[1]~[3]中任一項所述的黏著帶,其中所述黏著層進而含有硬化劑,且可藉由所述硬化劑使所述第一丙烯酸樹脂硬化而獲得。
[5]
如所述[4]所述的黏著帶,其中所述硬化劑為環氧樹脂。
[6]
如所述[4]或[5]所述的黏著帶,其中相對於所述第一丙烯酸樹脂,所述硬化劑的含量為0.4當量~0.6當量。
[7]
如所述[1]~[6]中任一項所述的黏著帶,其中所述黏著層進而含有硬化觸媒。
[8]
如所述[1]~[7]中任一項所述的黏著帶,可用於製造半導體裝置。
[發明的效果]
根據本發明,可提供一種防止密封步驟中的模塑樹脂毛刺且於帶剝離步驟中無殘膠的、兼顧了密接性與耐污染性的黏著帶。
以下,對用於實施本發明的形態(以下,簡稱為「本實施方式」)進行詳細說明。以下的本實施方式是用於說明本發明的例示,主旨並非是將本發明限定於以下內容。本發明可於其主旨的範圍內適當變形來實施。再者,於本說明書中,只要無特別說明,則「(甲基)丙烯酸」是指「丙烯酸」及/或「甲基丙烯酸」,同樣地,「(甲基)丙烯醯基」是指「丙烯醯基」及/或「甲基丙烯醯基」,「(甲基)丙烯酸酯」是指「丙烯酸酯」及/或「甲基丙烯酸酯」,所謂「硬化」,不僅為全硬化,亦包含半硬化。
本實施方式的黏著帶是具有包含酸值為30 mgKOH/g~100 mgKOH/g的第一丙烯酸樹脂及酸值為0 mgKOH/g~10 mgKOH/g的第二丙烯酸樹脂的黏著層的黏著帶,且所述第一丙烯酸樹脂與所述第二丙烯酸樹脂的比例為第一丙烯酸樹脂:第二丙烯酸樹脂=85:15~65:35,所述第一丙烯酸樹脂與第二丙烯酸樹脂具有半相互侵入高分子網眼結構。
本實施方式的黏著帶的黏著層中所含的第一丙烯酸樹脂與第二丙烯酸樹脂具有半相互侵入高分子網眼結構。此處,所謂「相互侵入高分子網眼」,是具有不同種類的交聯高分子網眼相互侵入的網眼結構的混合物,作為簡稱,亦稱為IPN(互穿聚合物網路(Interpenetrating Polymer Network))。所謂本實施方式的半相互侵入高分子網眼結構(半IPN),是指如下結構:其中一種成分為直鏈狀(或大致直鏈狀)、另一種成分為交聯高分子網眼狀,且直鏈狀的丙烯酸樹脂的一部分或全部侵入至交聯高分子網眼狀的另一種丙烯酸樹脂之間。
本實施方式的黏著帶藉由具有所述結構,第二丙烯酸樹脂被保持於第一丙烯酸樹脂的交聯高分子網眼結構內,因此可防止第二丙烯酸樹脂的洩漏所引起的殘膠。另外,藉由第二丙烯酸樹脂未交聯或交聯密度低而可提高高溫時的密接力,因此可抑制密封樹脂的洩漏所引起的樹脂毛刺。
[丙烯酸樹脂]
作為本實施方式的黏著帶中所含的丙烯酸樹脂,例如可列舉含有(甲基)丙烯酸酯與不飽和羧酸作為結構單元的共聚物,較佳為含有(甲基)丙烯酸酯與不飽和羧酸作為結構單元的共聚物且於側鏈具有羧基與(甲基)丙烯醯基的共聚物。
作為具有不飽和羧酸的單量體,例如可列舉(甲基)丙烯酸、丁烯酸、馬來酸、衣康酸等。於丙烯酸樹脂是含有(甲基)丙烯酸酯與(甲基)丙烯酸作為結構單元的共聚物的情況下,可使用兩種以上的(甲基)丙烯酸酯,亦可使用甲基丙烯酸與丙烯酸此兩種作為(甲基)丙烯酸。
作為所述丙烯酸樹脂,只要具有羧基及乙烯性不飽和鍵即可,例如可列舉至少包含(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸-正丙酯、(甲基)丙烯酸-異丙酯、(甲基)丙烯酸-正丁酯、(甲基)丙烯酸-異丁酯、(甲基)丙烯酸-第二丁酯、(甲基)丙烯酸-第三丁酯、(甲基)丙烯酸-正戊酯、(甲基)丙烯酸-異戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸異戊酯、(甲基)丙烯酸-2-乙基己酯、(甲基)丙烯酸-正辛酯、(甲基)丙烯酸-異辛酯、(甲基)丙烯酸-正壬酯、(甲基)丙烯酸-異壬酯、(甲基)丙烯酸-正癸酯、(甲基)丙烯酸-異癸酯、(甲基)丙烯酸-正十二烷基酯、(甲基)丙烯酸-正十四烷基酯、(甲基)丙烯酸硬脂基酯、(甲基)丙烯酸-異硬脂基酯等(甲基)丙烯酸烷基酯;(甲基)丙烯酸-2-羥基乙酯、(甲基)丙烯酸-2-羥基丙酯、(甲基)丙烯酸-3-羥基丙酯等(甲基)丙烯酸羥基烷基酯;丙烯醯胺、甲基丙烯醯胺、N-甲基丙烯醯胺、N-甲基甲基丙烯醯胺等丙烯醯胺類;單甲基胺基乙酯、單乙基胺基乙酯、單甲基胺基丙酯、單乙基胺基丙酯等丙烯酸單烷基胺基酯中的任一種作為單量體的丙烯酸樹脂等。
該些中,就相對於被黏物的貼附性或初期的追隨性等更優異的觀點而言,亦較佳為含有(甲基)丙烯酸-正丁酯及/或(甲基)丙烯酸-2-乙基己酯的丙烯酸樹脂。再者,若為不失去本實施方式的效果的範圍內,則可進而含有羥基、胺基、醯胺基等官能基。
丙烯酸樹脂亦可進而含有所述(甲基)丙烯酸酯或不飽和羧酸以外的結構單元。
本實施方式中的黏著片的黏著層含有酸值高的第一丙烯酸樹脂與酸值低的第二丙烯酸樹脂。酸值高的第一丙烯酸樹脂藉由利用硬化劑交聯而形成交聯密度大的高分子網眼結構。另一方面,酸值低的第二丙烯酸樹脂即使於藉由硬化劑交聯的情況下,交聯密度亦低,成為直鏈狀或大致直鏈狀。
第一丙烯酸樹脂的酸值為30 mgKOH/g~100 mgKOH/g,較佳為45 mgKOH/g~80 mgKOH/g。於第一丙烯酸樹脂的酸值未滿30 mgKOH/g的情況下,交聯密度變得不充分,產生低分子量成分的洩漏所引起的污染的風險變高。另一方面,於酸值超過100 mgKOH/g時,未反應的酸性官能基與密封樹脂反應,加工後進行重剝離化的風險變高。
第二丙烯酸樹脂的酸值為0 mgKOH/g~10 mgKOH/g,較佳為0 mgKOH/g~5 mgKOH/g。第二丙烯酸樹脂的酸值尤佳為0 mgKOH/g,若為發揮本申請案發明的效果的範圍內,則第二丙烯酸樹脂的酸值亦可為超過0 mgKOH/g,於該情況下,第二丙烯酸樹脂可與後述的硬化劑反應。於第二丙烯酸樹脂的酸值的上限超過10 mgKOH/g時,高溫時的與引線框架(外部焊墊面)的密接力降低,產生樹脂毛刺的風險變高。
酸值可按照後述的實施例中記載的方法測定。
丙烯酸樹脂的重量平均分子量(Mw)並無特別限定,但較佳為第一丙烯酸樹脂的重量平均分子量(Mw)與第二丙烯酸樹脂的重量平均分子量(Mw)的差為0萬~40萬。於第一丙烯酸樹脂及第二丙烯酸樹脂的重量平均分子量的差處於所述範圍內的情況下,兩者的相容性提高,有本申請案發明所發揮的效果變得更顯著的傾向。
就密接力的觀點而言,第一丙烯酸樹脂的重量平均分子量較佳為40萬~100萬,更佳為60萬~90萬。
就耐污染性的觀點而言,第二丙烯酸樹脂的重量平均分子量較佳為40萬~80萬。
丙烯酸樹脂的分子量分佈較佳為第一丙烯酸樹脂的分子量分佈(Mw/Mn)為2.0以下,第二丙烯酸樹脂的分子量分佈(Mw/Mn)為2.0以下。於第一丙烯酸樹脂及第二丙烯酸樹脂的分子量分佈處於所述範圍內的情況下,第二丙烯酸樹脂被充分且穩定地保持於第一丙烯酸樹脂的高分子網眼結構的內部,有本申請案發明所發揮的效果變得更顯著的傾向。
本實施方式的黏著帶的黏著層中所含的第一丙烯酸樹脂與第二丙烯酸樹脂的比例為第一丙烯酸樹脂:第二丙烯酸樹脂=85:15~65:35,更佳為80:20~70:30。於黏著層中所含的第一丙烯酸樹脂的比例過高時,高溫時的密接性變得不充分,藉此產生密封步驟中的模塑樹脂所引起的毛刺的風險提高。另一方面,於黏著層中所含的第二丙烯酸樹脂的比例過高時,產生帶剝離步驟中的殘膠,半導體裝置被污染的風險提高。
[丙烯酸樹脂的製造方法]
丙烯酸樹脂的製造方法並無特別限定,可使用先前已知的方法等。例如於酸值高的第一丙烯酸樹脂的製造中可採用自由基聚合,於酸值低的第二丙烯酸樹脂的製造中可採用活性自由基聚合。
[硬化劑]
本實施方式中的黏著帶亦可為黏著層進而含有硬化劑且可藉由所述硬化劑使第一丙烯酸樹脂硬化而獲得者。第二丙烯酸樹脂可藉由硬化劑硬化,亦可不硬化,但就密接性的觀點而言,較佳為不硬化。作為硬化劑,例如可列舉環氧樹脂、異氰酸酯樹脂等。該些中,就耐熱性等觀點而言,較佳為環氧樹脂。作為環氧樹脂,就反應性的觀點而言,環氧當量較佳為90 g/eq~300 g/eq。
作為環氧樹脂,例如可列舉:雙酚A型環氧樹脂、雙酚F型環氧樹脂、酚醛清漆型環氧樹脂、胺型環氧樹脂等,其中,就耐熱性的觀點而言,亦較佳為酚醛清漆型環氧樹脂、胺型環氧樹脂。進而,就與第一丙烯酸樹脂的相容性的觀點而言,較佳為酚醛清漆型環氧樹脂,進而,較佳為酚醛清漆型環氧樹脂的重複單元n為2~10,更佳為2~5。
作為異氰酸酯樹脂,就反應性的觀點而言,較佳為多官能基異氰酸酯。例如可列舉:伸乙基二異氰酸酯、伸丁基二異氰酸酯、六亞甲基二異氰酸酯、伸環戊基二異氰酸酯、伸環己基二異氰酸酯、異佛爾酮二異氰酸酯、2,4-甲苯二異氰酸酯、二苯基甲烷二異氰酸酯、伸二甲苯基二異氰酸酯、4,4'-二苯基甲烷二異氰酸酯、二環己基甲烷二異氰酸酯等。
黏著帶的黏著層中所含的硬化劑的含量並無特別限定,相對於第一丙烯酸樹脂,較佳為0.4當量~0.6當量。於硬化劑的含量為0.4當量以上時,第一丙烯酸樹脂的交聯充分進行,有耐污染性進一步提高的傾向。另一方面,於硬化劑的含量為0.6當量以下時,有密接性進一步提高的傾向。
[硬化觸媒]
本實施方式的黏著帶的黏著層中可進而含有硬化觸媒。作為硬化觸媒,較佳為使用活性溫度為120℃以下者。作為硬化觸媒,例如可列舉:過氧化苯甲醯、過氧化甲基乙基酮、過氧化第三丁基-2-乙基己酸酯、枯烯過氧化氫、過氧化環己酮、過氧化二枯基等有機過氧化物;2-甲基咪唑、N-苄基-2-甲基咪唑等咪唑系起始劑;2,2'-偶氮雙-(2-甲基丁腈)、2,2'-偶氮雙異丁腈等偶氮系起始劑、三氟化硼單乙胺等路易斯酸錯合物、多胺、三聚氰胺樹脂等。所述中,就觸媒殘渣所引起的污染的觀點而言,較佳為2-甲基咪唑、2-十一烷基咪唑等咪唑系起始劑。
硬化觸媒相對於丙烯酸樹脂100質量份的含量較佳為0.01質量份~3質量份。於硬化觸媒的含量為3質量份以下時,有被黏物污染的風險變低的傾向,於為0.01質量份以上時,有可充分開始聚合的傾向。硬化觸媒相對於丙烯酸樹脂100質量份的含量更佳為0.05質量份~2質量份,進而佳為0.05質量份~1質量份。
本實施方式的黏著帶中所含的黏著層除了所述以外,亦可進而含有其他添加劑等。作為此種其他添加劑,可列舉:脫模劑、紫外線吸收劑、黏著賦予劑、軟化劑、填充劑、抗老化劑、顏料、染料、矽烷偶合劑等各種添加劑。
[黏著帶]
本實施方式的黏著帶是具有包含所述特定的丙烯酸樹脂的黏著層的黏著帶。此處,黏著帶可包含黏著層及基材層。
例如將構成本實施方式的黏著層的樹脂組成物塗佈於基材(有時亦稱為基底膜等)等上而形成黏著層等,藉此可製成黏著帶。
本實施方式的黏著帶的黏著層的厚度較佳為3 μm~40 μm,更佳為3 μm~20 μm。於黏著層的厚度為3 μm以上時,於密封步驟中有無法獲得充分的密封性的傾向。另一方面,於厚度為40 μm以下時,黏著層亦不會因模具的緊固壓力而受到破壞,有可穩定地製造黏著帶的傾向。
另一方面,基材層的厚度並無特別限定,就防止折斷或裂開的觀點而言,較佳為5 μm以上,就處理性的觀點而言,更佳為10~100 μm。
作為構成基材層的材料,並無特別限定,例如可列舉:聚對苯二甲酸乙二酯(polyethylene terephthalate,PET)系基材、聚醯亞胺(Polyimide,PI)系基材、聚醯胺(Polyamide,PA)系基材、聚萘二甲酸乙二酯(polyethylene naphthalate,PEN)系基材、聚苯醚硫醚(polyphenylene sulfide,PPS)系基材等。該些中,就耐熱性等觀點而言,較佳為聚醯亞胺系基材。另外,亦可對基材實施電暈處理或電漿處理等表面改質處理。藉此,可防止基材的經時的物性變化或進行各種表面改質等。
本實施方式的黏著帶可於使用前藉由脫模膜(分離膜)等保護黏著層。藉由預先貼合此種脫模膜,可維持黏著層的黏著力等。作為脫模膜,並無特別限定,亦可適當使用公知者。作為脫模膜,例如可列舉實施了矽酮系脫模處理或氟系脫模處理的聚對苯二甲酸乙二酯膜、聚丙烯膜、聚乙烯膜、脫模紙等。
作為本實施方式的黏著帶的製造方法,例如可列舉藉由準備使構成黏著層的樹脂組成物溶解於有機溶媒中而成的溶液並將該溶液塗佈於基材上且使其乾燥等而於基材上形成黏著層的方法等。
作為有機溶媒,例如可列舉:甲醇、乙醇等醇類;乙二醇、丙二醇等二醇類;乙二醇單甲醚、乙二醇單乙醚等二醇單烷基醚類;乙二醇二甲醚、乙二醇二乙醚等二醇二烷基醚;乙酸甲酯、乙酸乙酯、乙酸丙酯、乙醯乙酸甲酯、乙醯乙酸甲酯等烷基酯類;丙酮、甲基乙基酮、甲基異丁基酮、環己酮等酮類;苯、甲苯、二甲苯、乙基苯等芳香族烴類;己烷、環己烷、辛烷等脂肪族烴類;二甲基甲醯胺、二甲基乙醯胺、N-甲基吡咯啶酮等醯胺類;四氫呋喃、二噁烷等環狀醚類等。
塗佈方法並無特別限定,亦可採用公知的方法。例如可使用模塗機、缺角輪塗佈機、凹版印刷塗佈機等。
[半導體裝置的製造方法]
本實施方式的黏著帶是於對電子零件或半導體零件進行樹脂密封時為了遮蔽端子部而黏貼並使用者。
圖1的(a)~圖1的(g)是使用本實施方式的黏著帶的半導體裝置的製造方法的一例的步驟圖。如圖1所示,本實施方式的半導體裝置的製造方法至少包括半導體晶片3的搭載步驟及利用密封樹脂5的密封步驟。本實施方式的半導體裝置的製造方法可進而包括切斷被密封的結構物的切割步驟。
如圖1的(a)~圖1的(d)所示,搭載步驟是於引線框架背面側(圖的下側)貼合了黏著帶1的金屬製的引線框架2的晶粒墊上接合半導體晶片3的步驟。
所謂引線框架2,例如是以銅等金屬為素材且刻有QFN的端子圖案者,於其電接點部分亦有時經銀、鎳、鈀、金等素材被覆(鍍敷)。引線框架2的厚度一般為100 μm~300 μm。再者,部分性地藉由蝕刻等加工得較薄的部分不限於此。引線框架2較佳為各QFN的配置圖案整齊地排列,以便於以後的切斷步驟中容易進行切分。
黏著帶1較佳為至少黏貼於封裝圖案區域的外側,黏貼於包括經樹脂密封的樹脂密封區域的外側的整周的區域。引線框架2通常較佳為於端邊附近具有用於進行樹脂密封時的定位的導銷用孔,黏貼於不堵塞導銷用孔的區域。另外,於引線框架2的長邊方向配置有多個樹脂密封區域,因此較佳為以跨越該些多個區域的方式連續地黏貼黏著帶1。
於如上所述的引線框架2上搭載半導體晶片3、即作為半導體積體電路部分的矽晶圓/晶片。為了固定該半導體晶片3,於引線框架2上設置有被稱為晶粒墊的固定區域,向該晶粒墊的接合(固定)的方法使用導電性糊,或者可使用接著帶、接著劑等各種方法。於使用導電性糊或熱硬化性接著劑等進行晶粒接合的情況下,一般於150℃~200℃左右的溫度下加熱固化30分鐘~90分鐘左右。為了去除晶粒吸附(Die Attach)材等的污垢,提高線連接性或模具/框架之間的接著性,可對搭載有半導體晶片的引線框架實施圖1的(c)所示的電漿處理。
一般而言,緊接著進行利用接合線電連接所述引線框架的端子部前端與所述半導體晶片上的電極墊的打線接合步驟。如圖1的(d)所示,打線接合步驟是利用接合線4電連接引線框架2的端子部(內部引線)的前端與半導體晶片3上的電極墊的步驟。作為接合線4,例如可使用金線或鋁線等。一般而言於加熱至120℃~250℃的狀態下,藉由併用超音波所引起的振動能及施加加壓所引起的壓接能進行接線。此時,藉由真空吸引黏貼於引線框架2的黏著帶1面,可確實地固定於加熱塊(Heater block)。再者,雖然上文示出了朝上安裝半導體晶片來進行接線步驟的情況,但於朝下安裝半導體晶片的情況下,適當地實施回焊步驟。
如圖1的(e)所示,密封步驟是藉由密封樹脂5單面密封半導體晶片側的步驟。密封步驟是為了保護搭載於引線框架2的半導體晶片3或接合線4而進行,尤其具代表性的是使用以環氧系的樹脂為代表的密封樹脂且於模具中成型。此時,一般而言使用包含具有多個模穴的上模具及下模具的模具,利用多個密封樹脂5同時進行密封步驟。具體而言,例如樹脂密封時的加熱溫度為170℃~180℃,於該溫度下固化數分鐘後,進而進行數小時的模塑後固化(post mold cure)。繼密封步驟之後,如圖1的(f)所示,剝離貼合於引線框架2的黏著帶。再者,黏著帶1較佳為於模塑後固化之前剝離。
如圖1的(g)所示,切割步驟是將經密封的結構物切斷成個別的半導體裝置10的步驟。一般而言,可列舉使用切割機等旋轉切斷刀切割密封樹脂5的切斷部的切割步驟。
再者,本實施方式的黏著帶如上所述可於半導體晶片的搭載步驟之前與引線框架貼合,亦可於半導體晶片的搭載步驟後(打線接合後)、密封步驟前與引線框架貼合。
[實施例]
藉由以下的實施例及比較例更詳細地說明本發明,但本發明不受以下實施例的任何限定。
各評價方法及測定方法如下所述。
<酸值>
藉由利用氫氧化鉀溶液進行滴定來測定酸值。具體而言,按照以下的計算式計算出酸值。
酸值(mgKOH/g)={(5.61×a×F)/S}/(不揮發成分濃度/100)
其中,S:試樣的採集量(g)、a:0.1 N醇性氫氧化鉀溶液的消耗量(ml)、F:0.1 N醇性氫氧化鉀溶液的效價
<重量平均分子量及分子量分佈>
使用凝膠滲透層析法(Gel Permeation Chromatography:GPC)進行測定。
<半IPN的確認>
藉由於黏著層的剖面觀察形態(morphology),將海島的面積比與聚合物的混合比進行比較時,島的比率比少量的聚合物的比率小而確認了黏著層具有半IPN結構。
更具體而言,對於黏著帶的黏著劑層,使用切片機(microtome)法於厚度方向上製作薄膜片。藉由電子顯微鏡(日立高新技術(Hitachi High-technologies)公司製造的S-4800)對所製作的薄膜片拍攝了5000倍的照片。基於該照片中拍攝的海島結構,計算出下述式的X。
X=α(面積比例)/β(添加比例)
α=島(第二丙烯酸樹脂)的面積相對於海島結構的總面積(第一丙烯酸樹脂與第二丙烯酸樹脂的合計面積)的比例。
β=第二丙烯酸樹脂的添加量(重量份)相對於第一丙烯酸樹脂與第二丙烯酸樹脂的合計添加量(重量份)的比例。
X為0.9~1.0:×(未形成半IPN結構)
X未滿0.9:○(形成了半IPN結構)
<污染性的評價>
於將黏著帶輥層壓至實施了鍍NiPdAu的金屬板上(30℃、0.4 MPa、1 m/min)後,於175℃的乾燥機中加熱6小時。於加熱後剝落黏著帶,利用ESCA(賽默飛世爾科技(Thermo Fisher Scientific)公司製造的K-Alpha)分析帶剝離面。根據所獲得的碳原子的原子數濃度(C)及層壓前的黏著帶的碳原子的原子數濃度(D),基於下述求出Y的值,並評價其污染性。
Y=100-[C/D×100](%)
Y為10%以下:○
Y超過10%且為20%以下:△
Y超過20%:×
<熱剝離力的測定>
於將黏著帶輥層壓至軋製銅箔(厚度35 μm)的光澤面側(30℃、0.4 MPa、1 m/min)後,製成25 mm寬的試驗片。利用雙面帶貼合所製作的試驗片的軋製銅箔面與不鏽鋼板,利用帶恆溫槽的測定裝置[島津製作所公司製造,奧特古拉(Autograph)AGS-500]測定於150℃的環境下放置3分鐘後於該環境下將黏著帶在180°方向上以200 mm/min的速度剝落時的剝離力。
75 mN/25 mm以上:○
50 mN/25 mm以上且未滿75 mN/25 mm:△
未滿50 mN/25 mm:×
<壓製後剝離力的測定>
於將黏著帶貼合於軋製銅箔(厚度35 μm)的光澤面側並於180℃、3.0 MPa、60分鐘的條件下加熱加壓後,製成25 mm寬的試驗片。利用雙面帶貼合所製作的試驗片的軋製銅箔面與不鏽鋼板,利用測定裝置(同上)測定在180°方向上以200 mm/min的速度剝落黏著帶時的剝離力。
[合成例1:乙基-2-甲基-2-正丁基碲基-丙酸酯]
使金屬碲[奧德里奇(Aldrich)公司製造,製品名「碲(Tellurium)(-40目(mesh))」]6.38 g(50 mmol)懸浮於四氫呋喃(tetrahydrofuran,THF)50 mL中,於室溫下緩慢地向其中滴加正丁基鋰[奧德里奇(Aldrich)公司製造,1.6 mol/L己烷溶液]34.4 mL(55 mmol)。攪拌該反應溶液直至金屬碲完全消失。於室溫下向該反應溶液中加入乙基-2-溴-異丁酸酯10.7 g(55 mmol),攪拌2小時。於反應結束後,於減壓下將溶媒濃縮,接著進行減壓蒸餾,而獲得作為黃色油狀物的乙基-2-甲基-2-正丁基碲基-丙酸酯8.98 g(產率59.5%)。
[合成例2:聚合物A]
於經氬置換的手套箱內,使合成例1中製造的乙基-2-甲基-2-正丁基碲基-丙酸酯68 μL(0.28 mmol)、丙烯酸丁酯130.8 g(1.02 mol)、丙烯酸11.4 g(158 mmol)及2,2'-偶氮雙(異丁腈)[AIBN;奧德里奇(Aldrich)公司製造]4.6 mg(0.03 mmol)於60℃下反應20小時。於反應結束後,自手套箱中取出反應器,於溶解於乙酸乙酯500 mL中後,將該聚合物溶液通過利用活性氧化鋁[和光純藥工業公司製造]製成的管柱。添加乙酸乙酯以使聚合物溶液的黏度成為7,000 mPa·s(25℃),獲得聚合物A的溶液。所獲得的聚合物A溶液的固體成分為23.0質量%。
聚合物A的藉由凝膠滲透層析法(GPC)求出的重量平均分子量為64.4萬,分子量分佈(Mw/Mn)=1.78。另外,聚合物A的酸值為60 mgKOH/g。
[合成例3:聚合物B]
除了以丙烯酸丁酯:丙烯酸2-羥基乙酯=80:20的比例反應以外,藉由與合成例2相同的方法獲得聚合物B的溶液。聚合物B的重量平均分子量為59.7萬,分子量分佈(Mw/Mn)=1.82。另外,聚合物B的酸值為0 mgKOH/g。
[合成例4:聚合物C]
向反應容器中加入乙酸乙酯100 g、丙烯酸丁酯100.0 g(780 mmol)、丙烯酸8.7 g(121 mmol)及2,2'-偶氮雙(異丁腈)0.33 g(2.0 mmol),於70℃下攪拌。自反應開始60分鐘後每30分鐘取出一部分反應溶液,利用脫離子水使反應停止,藉由甲基乙基酮進行萃取,利用凝膠滲透層析法(GPC)分析萃取溶液。根據GPC分析,於反應物的分子量為50萬以上的階段將反應容器冷卻,並停止反應。利用脫離子水將所獲得的混合物水洗,並進行乾燥,藉此獲得聚合物C的溶液。
聚合物C的藉由GPC求出的重量平均分子量為81.4萬,分子量分佈(Mw/Mn)=4.77。另外,聚合物C的酸值為61 mgKOH/g。
[合成例5:聚合物D]
除了以丙烯酸丁酯:丙烯酸=98:2的比例反應以外,藉由與合成例2相同的方法獲得聚合物D的溶液。聚合物D的重量平均分子量為60.3萬,分子量分佈(Mw/Mn)=1.96。另外,聚合物D的酸值為16 mgKOH/g。
[合成例6:聚合物E]
除了以丙烯酸丁酯:丙烯酸=98:2的比例反應以外,藉由與合成例2相同的方法獲得聚合物E的溶液。聚合物E的重量平均分子量為62.1萬,分子量分佈(Mw/Mn)=4.78。另外,聚合物E的酸值為17 mgKOH/g。
[合成例7:聚合物F]
除了使乙基-2-甲基-2-正丁基碲基-丙酸酯以41 μL(0.17 mmol)反應以外,藉由與合成例2相同的方法獲得聚合物F的溶液。聚合物F的重量平均分子量為96.6萬,分子量分佈(Mw/Mn)=1.79。另外,聚合物F的酸值為62 mgKOH/g。
[實施例1]
將聚合物A溶液29.3 g(23.0%)、聚合物B溶液11.3 g(20.0%)、酚醛清漆型環氧樹脂[DIC股份有限公司製造,艾比克隆(EPICLON)N730A]0.66 g(0.5當量)、咪唑觸媒[四國化成工業股份有限公司製造,科萊魯(Curezol)C11Z]及甲基乙基酮19 g於室溫下攪拌而獲得組成物1。以使乾燥後的厚度為7 μm的方式,將組成物1塗佈於聚醯亞胺膜(厚度25 μm),於150℃下乾燥5分鐘,獲得黏著帶。藉由層壓來將實施了脫模處理的脫模膜的脫模面貼合至黏著帶的黏著層,於105℃下加熱24小時,而獲得帶脫模膜的黏著帶。
使用所獲得的黏著帶進行各物性的評價。評價結果如表1所示(表中的含量的單位只要未特別標明,則表示「質量份」)。
[實施例2]~[實施例6]
除了將形成黏著層的組成物中所含的各成分的種類及含量替換為表1~表3所示的種類及含量以外,藉由與實施例1相同的方法製造黏著帶,進行各物性的評價。
[比較例1]~[比較例13]
除了將形成黏著層的組成物中所含的各成分的種類及含量替換為表1~表3所示的種類及含量以外,藉由與實施例1相同的方法製造黏著帶,進行各物性的評價。
[表1]
樹脂 | 實施例1 | 實施例2 | 實施例3 | 比較例1 | 比較例2 | 比較例3 | 比較例4 | 比較例5 | |||
Mw(萬) | Mw/Mn | 酸值 | |||||||||
聚合物A | 64.4 | 1.78 | 60 | 75 | 85 | 65 | 100 | 50 | 95 | 90 | 60 |
聚合物B | 59.7 | 1.82 | 0 | 25 | 15 | 35 | 50 | 5 | 10 | 40 | |
聚合物C | 81.4 | 4.77 | 61 | ||||||||
聚合物D | 60.3 | 1.96 | 16 | ||||||||
聚合物E | 62.1 | 4.78 | 17 | ||||||||
聚合物F | 96.6 | 1.79 | 62 | ||||||||
硬化劑(環氧)[當量] | 0.5 | ||||||||||
觸媒 | 0.2 | ||||||||||
半IPN結構 | ○ | ○ | ○ | × | × | ○ | ○ | ○ | |||
污染性[%] | ○ | ○ | △ | ○ | × | ○ | ○ | × | |||
熱剝離力[mN/25 mm] | ○ | △ | ○ | × | △ | × | × | ○ | |||
壓製後剝離力[mN/25 mm] | 1113 | 1448 | 1143 | 1526 | 1063 | 1502 | 1504 | 1376 |
[表2]
樹脂 | 實施例4 | 比較例6 | 比較例7 | 比較例8 | 比較例9 | |||
Mw(萬) | Mw/Mn | 酸值 | ||||||
聚合物A | 64.4 | 1.78 | 60 | 75 | 75 | |||
聚合物B | 59.7 | 1.82 | 0 | 25 | 25 | |||
聚合物C | 81.4 | 4.77 | 61 | 100 | ||||
聚合物D | 60.3 | 1.96 | 16 | 25 | 75 | |||
聚合物E | 62.1 | 4.78 | 17 | 25 | ||||
聚合物F | 96.6 | 1.79 | 62 | 75 | ||||
硬化劑(環氧)[當量] | 0.5 | |||||||
觸媒 | 0.2 | |||||||
半IPN結構 | ○ | × | ○ | ○ | ○ | |||
污染性[%] | △ | ○ | × | × | △ | |||
熱剝離力[mN/25 mm] | ○ | × | ○ | ○ | × | |||
壓製後剝離力[mN/25 mm] | 948 | 828 | 1779 | 844 | 628 |
[表3]
樹脂 | 實施例5 | 實施例6 | 比較例10 | 比較例11 | |||
Mw(萬) | Mw/Mn | 酸值 | |||||
聚合物A | 64.4 | 1.78 | 60 | 75 | 75 | 75 | 75 |
聚合物B | 59.7 | 1.82 | 0 | 25 | 25 | ||
聚合物C | 81.4 | 4.77 | 61 | ||||
聚合物D | 60.3 | 1.96 | 16 | 25 | 25 | ||
聚合物E | 62.1 | 4.78 | 17 | ||||
聚合物F | 96.6 | 1.79 | 62 | ||||
硬化劑(環氧)[當量] | 0.3 | 0.7 | 0.5 | 0.7 | |||
觸媒 | 0.2 | ||||||
半IPN結構 | ○ | ○ | ○ | ○ | |||
污染性[%] | ○ | △ | × | × | |||
熱剝離力[mN/25 mm] | ○ | △ | ○ | ○ | |||
壓製後剝離力[mN/25 mm] | 1405 | 1255 | 1779 | 1863 |
如表1~表3所示,可知實施例1~實施例6的黏著帶兼顧密接性與耐污染性,可同時達成防止密封步驟中的模塑樹脂毛刺與抑制帶剝離步驟中的殘膠。
本申請案是基於2019年12月27日於日本專利局提出申請的日本專利申請(日本專利特願2019-238895)而成者,將其內容作為參照而引入至本申請案中。
[產業上的可利用性]
本發明的黏著帶具有作為半導體裝置的製造中可使用的黏著帶的產業上的可利用性。
1:黏著帶
2:引線框架
3:半導體晶片
4:接合線
5:密封樹脂
10:半導體裝置
圖1的(a)~圖1的(g)是表示使用本發明的黏著帶的半導體裝置的製造方法的一例的步驟圖。
1:黏著帶
2:引線框架
3:半導體晶片
4:接合線
5:密封樹脂
10:半導體裝置
Claims (8)
- 一種黏著帶,具有包含酸值為30 mgKOH/g~100 mgKOH/g的第一丙烯酸樹脂及酸值為0 mgKOH/g~10 mgKOH/g的第二丙烯酸樹脂的黏著層,且 所述第一丙烯酸樹脂與所述第二丙烯酸樹脂的比例為第一丙烯酸樹脂:第二丙烯酸樹脂=85:15~65:35, 所述第一丙烯酸樹脂與第二丙烯酸樹脂具有半相互侵入高分子網眼結構。
- 如請求項1所述的黏著帶,其中所述第一丙烯酸樹脂的分子量分佈(Mw/Mn)為2.0以下,所述第二丙烯酸樹脂的分子量分佈(Mw/Mn)為2.0以下。
- 如請求項1或請求項2所述的黏著帶,其中所述第一丙烯酸樹脂的重量平均分子量(Mw)為40萬~100萬,所述第二丙烯酸樹脂的重量平均分子量(Mw)為40萬~80萬。
- 如請求項1至請求項3中任一項所述的黏著帶,其中所述黏著層進而含有硬化劑,且是藉由所述硬化劑使所述第一丙烯酸樹脂硬化而獲得。
- 如請求項4所述的黏著帶,其中所述硬化劑為環氧樹脂。
- 如請求項4或請求項5所述的黏著帶,其中相對於所述第一丙烯酸樹脂,所述硬化劑的含量為0.4當量~0.6當量。
- 如請求項1至請求項6中任一項所述的黏著帶,其中所述黏著層進而含有硬化觸媒。
- 如請求項1至請求項7中任一項所述的黏著帶,用於製造半導體裝置。
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JP2019238895A JP6905579B1 (ja) | 2019-12-27 | 2019-12-27 | 粘着テープ |
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JP (1) | JP6905579B1 (zh) |
CN (1) | CN113748180B (zh) |
MY (1) | MY197181A (zh) |
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JP4357754B2 (ja) | 2000-10-02 | 2009-11-04 | 日東電工株式会社 | 半導体装置の製造方法 |
MY138566A (en) * | 2004-03-15 | 2009-06-30 | Hitachi Chemical Co Ltd | Dicing/die bonding sheet |
KR100813217B1 (ko) * | 2006-03-16 | 2008-03-13 | 재단법인서울대학교산학협력재단 | Semi-IPN 구조 형성에 의한 UV 경화형 아크릴점착제 점착물성 개선방법 |
JP5008900B2 (ja) * | 2006-06-06 | 2012-08-22 | 日東電工株式会社 | 粘着剤組成物、粘着シート及び粘着剤付着型機能性フィルム |
JP5265891B2 (ja) * | 2007-07-31 | 2013-08-14 | スリーエム イノベイティブ プロパティズ カンパニー | 初期タックが改善された粘着剤組成物 |
WO2011065779A2 (ko) * | 2009-11-27 | 2011-06-03 | (주)Lg화학 | 점착제 조성물 |
JP5160575B2 (ja) | 2010-02-15 | 2013-03-13 | 日東電工株式会社 | 半導体装置の製造方法及びこれに用いる耐熱性粘着テープ |
JP2011187571A (ja) * | 2010-03-05 | 2011-09-22 | Nitto Denko Corp | ダイシング・ダイボンドフィルム |
KR101567131B1 (ko) * | 2010-03-19 | 2015-11-06 | 세키스이가가쿠 고교가부시키가이샤 | 경화성 조성물, 다이싱-다이본딩 테이프, 접속 구조체 및 점접착제층을 갖는 반도체 칩의 제조 방법 |
JP6013709B2 (ja) * | 2010-06-08 | 2016-10-25 | 日東電工株式会社 | 熱硬化型ダイボンドフィルム、ダイシング・ダイボンドフィルム、及び、半導体装置の製造方法 |
KR101665164B1 (ko) * | 2013-11-29 | 2016-10-12 | 제일모직주식회사 | 편광판용 점착 필름, 이를 포함하는 편광판 및 이를 포함하는 광학표시장치 |
JP2015129226A (ja) * | 2014-01-08 | 2015-07-16 | 日東電工株式会社 | フィルム状接着剤、フィルム状接着剤付きダイシングテープ、半導体装置の製造方法、及び半導体装置 |
JP6545487B2 (ja) * | 2015-03-12 | 2019-07-17 | リンテック株式会社 | 粘着シート |
JP6633923B2 (ja) * | 2016-01-26 | 2020-01-22 | 日本カーバイド工業株式会社 | 保護フィルム用粘着剤組成物及び保護フィルム |
CN109415609B (zh) * | 2016-06-23 | 2021-03-16 | 株式会社寺冈制作所 | 粘接剂组合物及粘接片 |
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EP3954746B1 (en) | 2023-12-27 |
CN113748180B (zh) | 2022-07-15 |
EP3954746A4 (en) | 2022-07-20 |
CN113748180A (zh) | 2021-12-03 |
EP3954746A1 (en) | 2022-02-16 |
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