TW202122809A - Test device for radio frequency electronic component and its applied testing operation equipment wherein the test device for radio frequency electronic component comprises an antenna test unit and an electrical test unit - Google Patents

Test device for radio frequency electronic component and its applied testing operation equipment wherein the test device for radio frequency electronic component comprises an antenna test unit and an electrical test unit Download PDF

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TW202122809A
TW202122809A TW108144572A TW108144572A TW202122809A TW 202122809 A TW202122809 A TW 202122809A TW 108144572 A TW108144572 A TW 108144572A TW 108144572 A TW108144572 A TW 108144572A TW 202122809 A TW202122809 A TW 202122809A
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radio frequency
frequency electronic
electronic component
test
antenna
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TW108144572A
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TWI741435B (en
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李子瑋
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鴻勁精密股份有限公司
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Abstract

A test device for radio frequency electronic component comprises an antenna test unit and an electrical test unit. The antenna test unit is equipped with a supporting stand and an antenna tester. The antenna tester is assembled on the supporting stand. The antenna tester is used to receive or transmit wireless signals with respect to the antenna of the radio frequency electronic component located at the test station. The electrical test unit is equipped with an electrical tester having a circuit board and an engaging part, and the engaging part is used to electrically connect the radio frequency electronic component located at the test station. When the electrical test unit performs the electrical testing task on the radio frequency electronic component located at the test station, the antenna test unit is used to simultaneously perform a wireless signal testing task on the antenna of the radio frequency electronic component at the test station to achieve the practical benefit of improving test productivity. The test device for radio frequency electronic component further comprises a transfer arm for driving the electrical tester to move, wherein the transfer arm includes at least one operating fixture for performing a preset operation. The present invention also provides a testing operation equipment for radio frequency electronic component, comprising a machine; a feeding device arranged on the machine and provided with at least one feeding holder for accommodating the radio frequency electronic component under test; a material receiving device arranged on the machine and provided with at least one material receiving holder for accommodating the tested radio frequency electronic component; a test device arranged on the machine for testing the radio frequency electronic component; a conveying device arranged on the machine and provided with at least one conveyer for conveying the radio frequency electronic component; and a central controller for controlling and integrating the actions of various devices to perform the automated operation.

Description

射頻電子元件測試裝置及其應用之測試作業設備Radio frequency electronic component test device and test operation equipment for its application

本發明係提供一種射頻電子元件的測試裝置。The invention provides a testing device for radio frequency electronic components.

在現今,行動通訊區域無線網路系統、無線通訊區域網路系統或藍芽無線個人網路系統等,於增加資料傳輸速度的需求下,一內建有天線之射頻電子元件即為前述通訊系統之重要應用;天線的發射場型依應用場所而有不同,例如偶極天線具有全指向性發射場型,應用於終端設備,使終端設備可接收不同指向之波束所傳輸的無線訊號;例如無線網路接取器之天線,則需要能夠產生特定指向(如0°、45°或21°指向)的發射場型,而接收特定位置之設備所發射的無線訊號。目前射頻電子元件係於二面分別設置接點及天線,或者於同一面設置接點及天線,利用調節天線的相位及波束成形技術,進而調整發射場型,亦即使天線陣列於特定指向的發射/接收無線訊號一致地疊加,進而產生最佳發射/接收之波束;因此,如何測試射頻電子元件之天線對於預設指向的無線訊號傳輸效能,進而淘汰出不良品,即為業者研發之標的。Nowadays, in order to increase the data transmission speed of mobile communication area wireless network system, wireless communication area network system or Bluetooth wireless personal network system, etc., a radio frequency electronic component with built-in antenna is the aforementioned communication system The important application; the antenna's transmitting field type varies according to the application site, for example, the dipole antenna has an omnidirectional transmitting field type, which is applied to terminal equipment so that the terminal equipment can receive the wireless signals transmitted by beams of different directions; such as wireless The antenna of the network access device needs to be able to generate a specific directional (such as 0°, 45°, or 21° directional) transmitting field type, and receive the wireless signal emitted by the device at a specific location. At present, radio frequency electronic components are equipped with contacts and antennas on two sides, or on the same side. The phase and beamforming technology of the antenna are adjusted to adjust the transmission field pattern, even if the antenna array emits in a specific direction. /Receiving wireless signals are uniformly superimposed to produce the best transmitting/receiving beam; therefore, how to test the transmission performance of the radio frequency electronic component's antenna to the wireless signal transmission performance of the preset direction, and then eliminate the defective products, is the target of the industry's research and development.

本發明之目的一,係提供一種射頻電子元件測試裝置,包含天線測試單元及電性測試單元,天線測試單元係設置承座及天線測試器,承座係裝配天線測試器,天線測試器係供對位於測試工位之射頻電子元件的天線接收或發射無線訊號,該電性測試單元係設有具電路板及接合部件之電性測試器,並以接合部件供電性連接位於測試工位之射頻電子元件;藉以於電性測試單元對位於測試工位之射頻電子元件執行電性測試作業時,同步利用天線測試單元對測試工位之射頻電子元件的天線進行無線訊號測試作業,達到提升測試產能之實用效益。The first objective of the present invention is to provide a radio frequency electronic component test device, which includes an antenna test unit and an electrical test unit. The antenna test unit is provided with a socket and an antenna tester, the socket is equipped with an antenna tester, and the antenna tester is provided for To receive or transmit wireless signals to the antenna of the radio frequency electronic component at the test station, the electrical test unit is equipped with an electrical tester with a circuit board and a joint part, and the joint part is used to power-connect the radio frequency at the test station Electronic components; when the electrical testing unit performs electrical testing on the radio frequency electronic components located in the test station, the antenna test unit is used to simultaneously perform wireless signal testing operations on the antenna of the radio frequency electronic component at the test station to increase test productivity The practical benefits.

本發明之目的二,係提供一種射頻電子元件測試裝置,其承座係設有第一訊號通道及承接部,第一訊號通道供裝配天線測試器,且供通過無線訊號,承接部係供承置射頻電子元件位於測試工位,使電性測試器及天線測試器對承接部上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業,達到提升測試產能之實用效益。The second object of the present invention is to provide a radio frequency electronic component testing device, the socket is provided with a first signal channel and a receiving part, the first signal channel is for mounting an antenna tester, and for passing wireless signals, and the receiving part is for receiving Placing the radio frequency electronic components at the testing station allows the electrical tester and antenna tester to perform electrical testing and wireless signal testing on the radio frequency electronic components on the receiving part and located at the testing station, so as to achieve the practical benefits of improving test productivity.

本發明之目的三,係提供一種射頻電子元件測試裝置,更包含載具,以供裝配電性測試器,載具係依第一測試路徑而帶動電性測試器作線性位移或旋轉位移,達到提升測試使用效能之實用效益。The third objective of the present invention is to provide a radio frequency electronic component testing device, which further includes a carrier for assembling the electrical tester. The carrier drives the electrical tester to perform linear displacement or rotational displacement according to the first test path to achieve Practical benefits of improving test efficiency.

本發明之目的四,係提供一種射頻電子元件測試裝置,更包含測試室,不僅可防止外部雜訊,並供射頻電子元件位於模擬應用場所溫度測試環境執行測試作業,達到提升測試品質之實用效益。The fourth objective of the present invention is to provide a radio frequency electronic component testing device, which further includes a test room, which not only prevents external noise, but also allows radio frequency electronic components to be located in a simulated application site temperature test environment to perform test operations, thereby achieving practical benefits of improving test quality .

本發明之目的五,係提供一種射頻電子元件測試裝置,更包含移載臂,以供裝配電性測試器,移載臂依第二測試路徑而帶動電性測試器作線性位移或旋轉位移,達到提升測試使用效能之實用效益。The fifth object of the present invention is to provide a radio frequency electronic component testing device, which further includes a transfer arm for assembling the electrical tester. The transfer arm drives the electrical tester for linear displacement or rotational displacement according to the second test path. To achieve the practical benefits of improving the test efficiency.

本發明之目的六,係提供一種射頻電子元件測試裝置,其移載臂係設有讓位部及至少一作業治具,讓位部可供電性測試器對射頻電子元件執行電性測試作業,作業治具係供拾取射頻電子元件位於測試工位,以供電性測試器及天線測試器對移載臂上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業,達到提升測試產能之實用效益。The sixth object of the present invention is to provide a radio frequency electronic component testing device, the transfer arm is equipped with a relieving portion and at least one work fixture, and the relieving portion can be powered by a tester to perform electrical testing operations on the radio frequency electronic components. The work fixture is used to pick up the radio frequency electronic components at the test station, and use the power tester and antenna tester to perform electrical test operations and wireless signal test operations on the radio frequency electronic components on the transfer arm and at the test station to achieve improvement Practical benefits of testing capacity.

本發明之目的七,係提供一種射頻電子元件測試裝置,其天線測試單元可視作業需求,而配置天線調整器,利用天線調整器調整天線測試器之擺置位置或角度,以利測試不同指向之射頻電子元件,進而有效縮減天線測試器之配置數量,達到節省天線測試器成本之實用效益。The seventh objective of the present invention is to provide a radio frequency electronic component test device, the antenna test unit of which can be configured with an antenna adjuster according to operational requirements, and the antenna adjuster is used to adjust the position or angle of the antenna tester to facilitate testing of different directions The radio frequency electronic components can effectively reduce the number of antenna testers, and achieve the practical benefit of saving the cost of antenna testers.

本發明之目的八,係提供一種射頻電子元件測試裝置,其電性測試單元可視作業需求,而配置電性調整器,利用電性調整器調整電性測試器及射頻電子元件的擺置位置或角度,以利測試不同指向之射頻電子元件,亦可有效縮減天線測試器之配置數量,達到節省天線測試器成本之實用效益。The eighth object of the present invention is to provide a radio frequency electronic component test device. The electrical test unit can be equipped with an electrical adjuster according to operational requirements. The electrical adjuster is used to adjust the placement position of the electrical tester and the radio frequency electronic component or The angle can be used to test the radio frequency electronic components of different directions. It can also effectively reduce the number of antenna testers and achieve the practical benefit of saving the cost of antenna testers.

本發明之目的九,係提供一種測試作業設備,包含機台、供料裝置、收料裝置、本發明測試裝置、輸送裝置及中央控制裝置;供料裝置係配置於機台上,並設有至少一容納待測射頻電子元件之供料承置器;收料裝置係配置於機台上,並設有至少一容納已測射頻電子元件之收料承置器;本發明測試裝置係配置於機台上,包含天線測試單元及電性測試單元,以對射頻電子元件執行電性測試作業及無線訊號測試作業;輸送裝置係配置於機台上,並設有至少一輸送器,用以輸送射頻電子元件;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。The ninth object of the present invention is to provide a test operation equipment, including a machine, a feeding device, a receiving device, the test device of the present invention, a conveying device, and a central control device; the feeding device is arranged on the machine and equipped with At least one feeding holder for accommodating the radio frequency electronic component to be tested; the receiving device is arranged on the machine, and is provided with at least one receiving holder for accommodating the measured radio frequency electronic component; the test device of the present invention is arranged on The machine platform includes an antenna test unit and an electrical test unit to perform electrical test operations and wireless signal test operations on radio frequency electronic components; the conveying device is arranged on the machine platform and is equipped with at least one conveyor for conveying Radio frequency electronic components; the central control device is used to control and integrate the actions of various devices to perform automated operations and achieve practical benefits of improving operational performance.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如后。In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given with the drawings, and the details are as follows.

請參閱第1圖,本發明測試裝置10之第一實施例,測試裝置10包含天線測試單元及電性測試單元。Please refer to Fig. 1, a first embodiment of the test device 10 of the present invention. The test device 10 includes an antenna test unit and an electrical test unit.

該天線測試單元包含承座11及天線測試器12,更包含測試室,更進一步,可於面板與箱體之間形成測試室,或者一外罩罩置於面板而形成測試室,面板可為機台板或機架板,箱體或面板可開設輸送通道,亦可於輸送通道處設置可啟閉之門板或可承置射頻電子元件之載台;於本實施例中,測試裝置10係於箱體13與機台板31之間形成測試室131,以供射頻電子元件(圖未示出)位於模擬應用場所溫度之測試環境,另於箱體13設有輸送通道132、輸送管133及門板134,輸送通道132係供移入/移出射頻電子元件,輸送管133係供輸入具預設溫度之乾燥流體至測試室131,使測試室131保持預設溫度及防結露,門板134係供啟閉輸送通道132。The antenna test unit includes a socket 11 and an antenna tester 12, and further includes a test room. Furthermore, a test room can be formed between the panel and the box, or a cover can be placed on the panel to form a test room. The panel can be a machine The table or rack board, the box or the panel can be provided with a conveying channel, and a door that can be opened and closed or a carrier that can hold radio frequency electronic components can also be arranged at the conveying channel; in this embodiment, the test device 10 is attached to A test chamber 131 is formed between the box body 13 and the machine board 31 for radio frequency electronic components (not shown) in a test environment that simulates the temperature of the application site. In addition, the box body 13 is provided with a conveying channel 132, a conveying pipe 133 and The door 134, the conveying channel 132 is for moving in/out of radio frequency electronic components, the conveying pipe 133 is for inputting the dry fluid with a preset temperature to the test chamber 131, so that the test chamber 131 maintains the preset temperature and prevents condensation, the door 134 is for opening Close the conveying channel 132.

承座11係供裝配天線測試器12,更進一步,承座11可為面板或架座,並為固定式配置或活動式配置,例如承座11可固定式配置於機台板31,例如承座11可由第一驅動源(圖未示出)驅動作Z方向位移或X-Y-Z方向位移至預設作業位置;另承座11係設有第一訊號通道111及承接部112,第一訊號通道111係供裝配天線測試器12,且供通過無線訊號,承接部112係相通第一訊號通道111,以供承置射頻電子元件位於測試工位,使天線測試器12及電性測試單元分別對承座11上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業,又承座11與電性測試單元之電性測試器可作相對位移;於本實施例中,承座11係為架座,並裝配於機台板31,且位於測試室131,承座11之內部設有第一訊號通道111,以供裝配天線測試器12,且供通過無線訊號,承座11於頂部設有相通第一訊號通道111之承接部112,承接部112係供承置射頻電子元件位於測試工位。The holder 11 is used for assembling the antenna tester 12. Furthermore, the holder 11 can be a panel or a stand, and can be a fixed configuration or a movable configuration. For example, the holder 11 can be fixedly disposed on the machine board 31, for example, The base 11 can be driven by a first driving source (not shown in the figure) for displacement in the Z direction or XYZ direction to a preset operating position; in addition, the base 11 is provided with a first signal channel 111 and a receiving portion 112, and a first signal channel 111 It is for assembling the antenna tester 12 and for passing wireless signals. The receiving part 112 communicates with the first signal channel 111 for the radio frequency electronic components to be located at the test station, so that the antenna tester 12 and the electrical test unit respectively face The radio frequency electronic components on the base 11 and located at the testing station perform electrical testing operations and wireless signal testing operations, and the electrical tester of the electrical testing unit and the supporting base 11 can be moved relative to each other; in this embodiment, the supporting stand The 11 series is a frame base, which is assembled on the machine board 31 and is located in the test room 131. A first signal channel 111 is provided inside the socket 11 for assembling the antenna tester 12 and for passing wireless signals. The socket 11 A receiving portion 112 communicating with the first signal channel 111 is provided on the top, and the receiving portion 112 is used to hold the radio frequency electronic component at the testing station.

至少一天線測試器12係裝配於承座11,以供對位於測試工位之射頻電子元件的天線執行無線訊號測試作業,例如天線測試器12對射頻電子元件執行接收無線訊號之作業,例如天線測試器12對射頻電子元件執行發射測試用無線訊號之作業,例如天線測試器12對射頻電子元件執行接收及發射無線訊號之作業;又天線測試器12可連接一獨立之處理器(圖未示出),以將接收射頻電子元件的無線訊號傳輸至處理器,或者將處理器之測試用無線訊號發射至射頻電子元件,該處理器亦可為中央控制裝置(圖未示出)之處理器;再者,天線測試器12之作業軸線L位於預設指向,作業軸線L之角度可相同或偏近於射頻電子元件之待測指向(如0°、45°或30°指向),以接收射頻電子元件之待測指向所發出波束的無線訊號,或朝向射頻電子元件之待測指向發出測試用無線訊號;於本實施例中,天線測試器12係裝配於承座11之第一訊號通道111,天線測試器12之作業軸線L角度係位於預設之0°指向。At least one antenna tester 12 is assembled on the socket 11 for performing wireless signal test operations on the antenna of the radio frequency electronic component at the test station, for example, the antenna tester 12 performs radio signal reception operation on the radio frequency electronic component, such as an antenna The tester 12 performs the operation of transmitting wireless signals for testing radio frequency electronic components. For example, the antenna tester 12 performs the operation of receiving and transmitting wireless signals for the radio frequency electronic components; and the antenna tester 12 can be connected to an independent processor (not shown in the figure) Out), to transmit the wireless signal of the receiving radio frequency electronic component to the processor, or to transmit the wireless signal for testing of the processor to the radio frequency electronic component, the processor can also be the processor of the central control device (not shown) ; Furthermore, the operating axis L of the antenna tester 12 is located in the preset direction, and the angle of the operating axis L can be the same or close to the direction to be measured of the radio frequency electronic component (such as 0°, 45° or 30° direction) to receive The wireless signal of the beam emitted from the direction to be tested of the radio frequency electronic component, or the wireless signal for testing is transmitted toward the direction to be tested of the radio frequency electronic component; in this embodiment, the antenna tester 12 is assembled on the first signal channel of the socket 11 111. The angle of the operating axis L of the antenna tester 12 is at the preset 0° direction.

測試裝置10可依測試作業需求而變換天線測試器12之配置數量,天線測試器12可採固定式配置或活動式配置,例如天線測試器12可固設於承座11,例如天線測試器12可搭配天線調整器(圖未示出)而裝配於承座11,以供調整擺置位置或角度,天線調整器可為機械手臂、轉軸、滑軌組或包含複數個調整桿件,可視作業需求,以帶動天線測試器12依待測指向所需而位移調整擺置位置或角度,亦或於原軸向旋轉調整擺置角度,以利天線測試器12測試不同待測指向(如0°、45°或30°指向)之射頻電子元件,進而有效縮減天線測試器之配置數量及節省成本。再者,天線測試單元可依測試作業需求,而於天線測試器12與測試工位之間設有至少一中介器(圖未示出),中介器可為菱鏡或折射元件等,中介器係於射頻電子元件與天線測試器12之間轉送傳輸無線訊號。The test device 10 can change the configuration number of the antenna tester 12 according to the requirements of the test operation. The antenna tester 12 can adopt a fixed configuration or a movable configuration. For example, the antenna tester 12 can be fixed on the holder 11, such as the antenna tester 12 It can be combined with an antenna adjuster (not shown in the figure) to be assembled on the holder 11 for adjusting the position or angle. The antenna adjuster can be a robotic arm, a rotating shaft, a slide rail group or a plurality of adjustment rods, which can be operated visually. It is required to drive the antenna tester 12 to shift the position or angle according to the direction to be tested, or rotate the original axis to adjust the position, so that the antenna tester 12 can test different directions to be tested (such as 0° , 45° or 30° pointing) radio frequency electronic components, thereby effectively reducing the number of antenna testers and saving costs. Furthermore, the antenna test unit can be provided with at least one intermediary (not shown in the figure) between the antenna tester 12 and the test station according to the requirements of the test operation. The intermediary can be a diamond mirror or a refraction element, etc. The intermediary It is used to transmit and transmit wireless signals between the radio frequency electronic components and the antenna tester 12.

該電性測試單元係設置具電路板211及接合部件212之電性測試器21,其接合部件212供電性連接位於測試工位之射頻電子元件而執行電性測試作業;更進一步,電性測試器21可位於測試室131、載具或移載臂,電性測試器可採固定式配置或活動式配置,例如電性測試器21可作固定式配置於測試室131,而承座11朝向電性測試器21作相對位移;例如電性測試器21可裝配於載具或移載臂(圖未示出)而作至少一方向位移;更進一步,電性測試器21可搭配電性調整器(圖未示出),而調整擺置位置或角度,電性調整器可為機械手臂、轉軸、滑軌組或包含複數個調整桿件,可視作業需求,以帶動電性測試器21及射頻電子元件依待測指向所需而位移調整擺置位置或角度,亦或於原軸向調整擺置呈不同角度,以利測試不同指向(如0°、45°或30°指向)之射頻電子元件,進而有效縮減天線測試器12之配置數量及節省成本;於本實施例中,電性測試器21係設有電性連接之電路板211及接合部件212,接合部件212供電性連接射頻電子元件。The electrical test unit is provided with an electrical tester 21 with a circuit board 211 and a joining component 212, and the joining component 212 is electrically connected to the radio frequency electronic component at the test station to perform electrical testing; further, electrical testing The tester 21 can be located in the test room 131, the carrier or the transfer arm. The electrical tester can adopt a fixed configuration or a movable configuration. For example, the electrical tester 21 can be fixedly disposed in the test room 131, and the bearing 11 faces The electrical tester 21 performs relative displacement; for example, the electrical tester 21 can be mounted on a carrier or a transfer arm (not shown) for displacement in at least one direction; further, the electrical tester 21 can be matched with electrical adjustments (Not shown in the figure), and to adjust the position or angle, the electrical adjuster can be a mechanical arm, a rotating shaft, a slide rail group or a plurality of adjusting rods, depending on the operation requirements, to drive the electrical tester 21 and The position or angle of the radio frequency electronic component is adjusted according to the direction of the test, or adjusted to different angles in the original axis to facilitate the test of radio frequency with different directions (such as 0°, 45° or 30°) Electronic components, thereby effectively reducing the number of antenna testers 12 configuration and saving costs; in this embodiment, the electrical tester 21 is provided with an electrically connected circuit board 211 and a joint part 212, and the joint part 212 is electrically connected to the radio frequency Electronic component.

以電性測試器21配置於載具而言,測試裝置10更包含載具,以供裝配電性測試器21,載具可為載座、轉盤或作動器等,並由第二驅動源(圖未示出)驅動作線性位移或旋轉位移,第二驅動源可為線性馬達、壓缸或包含馬達及傳動器,並視作業需求,而帶動電性測試器21依第一測試路徑位移;於本實施例中,載具係為作動器41,作動器41係裝配於箱體13,並由第二驅動源驅動作Z方向位移,使作動器41帶動電性測試器21於測試室131作Z方向位移。As far as the electrical tester 21 is disposed on a carrier, the testing device 10 further includes a carrier for assembling the electrical tester 21. The carrier can be a carrier, a turntable, or an actuator, etc., and is driven by a second driving source ( (Not shown in the figure) drive for linear displacement or rotational displacement, the second driving source can be a linear motor, a cylinder, or a motor and a transmission, and depending on the operation requirements, drive the electrical tester 21 to move according to the first test path; In this embodiment, the carrier is an actuator 41. The actuator 41 is assembled to the box 13 and is driven by the second driving source to move in the Z direction, so that the actuator 41 drives the electrical tester 21 in the test chamber 131 Make a displacement in the Z direction.

又該測試工位可位於測試室131、移載臂(圖未示出)或承座11,依不同測試作業需求而定,不受限於本實施例;例如測試工位可位於測試室131,承座11承置射頻電子元件位於測試室131而執行測試作業;例如測試工位可位於移載臂,移載臂之作業治具係移載射頻電子元件,並以移載射頻電子元件執行測試之位置作為測試工位;例如測試工位可位於承座11,承座11係承置射頻電子元件位於測試工位執行測試作業;再者,該測試工位與天線測試器12間不具有訊號干擾件(如金屬件或導電件),以避免無線訊號於傳輸過程損耗,使射頻電子元件之天線於測試工位對預設指向發出波束的無線訊號而進行無線訊號測試作業。In addition, the test station may be located in the test room 131, the transfer arm (not shown in the figure) or the socket 11, depending on the requirements of different test operations, and is not limited to this embodiment; for example, the test station may be located in the test room 131 , The socket 11 carries the radio frequency electronic components in the test room 131 to perform the test operation; for example, the test station can be located on the transfer arm, and the work fixture of the transfer arm transfers the radio frequency electronic components and performs the transfer radio frequency electronic components. The test position is used as the test station; for example, the test station can be located at the socket 11, which is used to hold the radio frequency electronic components in the test station to perform the test operation; furthermore, there is no space between the test station and the antenna tester 12 Signal interference parts (such as metal parts or conductive parts) to avoid the loss of wireless signals during the transmission process, so that the antennas of the radio frequency electronic components can perform wireless signal testing operations on the wireless signals of the preset direction at the test station.

請參閱第2、3圖,以測試工位位於測試室131而言,箱體13係控制門板134開啟輸送通道132,以供一移料器51經由輸送通道132而將待測之射頻電子元件61移入測試室131,令射頻電子元件61位於承座11之承接部112上方;移料器51將射頻電子元件61移入承座11之承接部112後,即退出箱體13,箱體13係控制門板134關閉輸送通道132,由於承座11承置射頻電子元件61位於測試室131,即測試工位位於測試室131,射頻電子元件61之接點611朝向電性測試器21,而射頻電子元件61之天線612朝向天線測試器12,第二驅動器(圖未示出)經作動器41帶動電性測試器21於測試室131作Z方向向下位移,電性測試器21之接合部件212電性連接射頻電子元件61之接點611,電路板211經由接合部件212而對射頻電子元件61執行電性測試作業;由於天線測試器12係裝配於承座11,作業軸線L的角度係相同射頻電子元件61之天線612的待測指向且為0° ,當位於測試工位之射頻電子元件61的天線612朝0°指向發出波束而傳輸無線訊號時,承座11之第一訊號通道111係供通過無線訊號,使天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Figures 2 and 3, assuming that the test station is located in the test room 131, the box 13 controls the door panel 134 to open the conveying channel 132 for a shifter 51 to transfer the radio frequency electronic components to be tested through the conveying channel 132 61 is moved into the test room 131, so that the radio frequency electronic component 61 is located above the receiving portion 112 of the socket 11; after the shifter 51 moves the radio frequency electronic component 61 into the receiving portion 112 of the socket 11, it exits the box 13, and the box 13 is The door panel 134 is controlled to close the conveying channel 132. Since the socket 11 supports the radio frequency electronic component 61 in the testing room 131, that is, the testing station is located in the testing room 131, the contact 611 of the radio frequency electronic component 61 faces the electrical tester 21, and the radio frequency electronic component 61 faces the electrical tester 21. The antenna 612 of the element 61 faces the antenna tester 12, the second driver (not shown) drives the electrical tester 21 through the actuator 41 to move downward in the Z direction in the test chamber 131, and the joint part 212 of the electrical tester 21 The contact 611 of the radio frequency electronic component 61 is electrically connected, and the circuit board 211 performs an electrical test operation on the radio frequency electronic component 61 via the joining part 212; since the antenna tester 12 is assembled on the socket 11, the angle of the working axis L is the same The antenna 612 of the radio frequency electronic component 61 has a direction to be measured and is 0° When the antenna 612 of the radio frequency electronic component 61 at the test station emits a beam toward 0° to transmit a wireless signal, the first signal channel 111 of the socket 11 is for passing the radio signal, so that the antenna tester 12 receives the radio frequency electronic The wireless signal of the component 61 is transmitted to the processor (not shown in the figure) of the central control device for determining the quality of the radio frequency electronic component 61.

請參閱第4、5圖,本發明測試裝置10之第二實施例,其與第一實施例之差異在於測試裝置10更包含移載臂71,移載臂71係作至少一方向位移,並設有至少一作業治具及讓位部711,作業治具係供拾取射頻電子元件位於測試工位,讓位部711可供電性測試器21對射頻電子元件執行電性測試作業,不僅可依第二測試路徑移載射頻電子元件,並供電性測試器21及天線測試器12對移載臂71上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業;於本實施例中,移載臂71係由第三驅動器(圖未示出)驅動作X-Y-Z方向位移,並設有為吸嘴712之作業治具,以拾取射頻電子元件61位於測試工位,即測試工位係位於移載臂71,移載臂71依第二測試路徑位移,並通過箱體13之輸送通道132,而將射頻電子元件61移入於測試室131,令射頻電子元件61位於天線測試器12及電性測試器21之間;又第二驅動器(圖未示出)經作動器41而帶動電性測試器21於測試室131作Z方向向下位移,電性測試器21係通過移載臂71之讓位部711,並以接合部件212電性連接射頻電子元件61之接點611,電路板211經由接合部件212而對射頻電子元件61執行電性測試作業;由於天線測試器12係裝配於承座11之第一訊號通道111,且作業軸線L的角度係相同射頻電子元件61之天線612的待測指向且為0°,當位於測試工位之射頻電子元件61的天線612朝0°指向發出波束而傳輸無線訊號時,承座11之第一訊號通道111供通過無線訊號,使天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Figures 4 and 5, the second embodiment of the test device 10 of the present invention differs from the first embodiment in that the test device 10 further includes a transfer arm 71, which is displaced in at least one direction, and There is at least one work fixture and a relief portion 711. The work fixture is used for picking up radio frequency electronic components at the test station. The relief portion 711 can perform electrical testing operations on the radio frequency electronic components by the power supply tester 21. The second test path transfers the radio frequency electronic components, and the power tester 21 and the antenna tester 12 perform electrical test operations and wireless signal test operations on the radio frequency electronic components on the transfer arm 71 and located at the test station; in this implementation In the example, the transfer arm 71 is driven by a third driver (not shown in the figure) to move in the XYZ direction, and is provided with a work fixture as the suction nozzle 712 to pick up the radio frequency electronic component 61 at the test station, that is, the test station. The position is located on the transfer arm 71. The transfer arm 71 is displaced according to the second test path and passes through the conveying channel 132 of the box 13 to move the radio frequency electronic component 61 into the testing room 131, so that the radio frequency electronic component 61 is located in the antenna tester 12 and the electrical tester 21; and the second driver (not shown) drives the electrical tester 21 to move downwards in the Z direction in the test chamber 131 via the actuator 41, and the electrical tester 21 is moved through The relieving part 711 of the carrier arm 71 is electrically connected to the contact 611 of the radio frequency electronic component 61 by the joining part 212. The circuit board 211 performs the electrical test operation on the radio frequency electronic component 61 through the joining part 212; due to the antenna tester 12 It is assembled on the first signal channel 111 of the socket 11, and the angle of the operating axis L is the same as the direction to be measured of the antenna 612 of the radio frequency electronic component 61 and is 0°. When the antenna 612 of the radio frequency electronic component 61 at the test station is located When the beam is emitted toward 0° to transmit wireless signals, the first signal channel 111 of the holder 11 is for passing the wireless signals, so that the antenna tester 12 receives the wireless signals of the radio frequency electronic components 61 and transmits the received wireless signals to the center The processor of the control device (not shown in the figure) is used to judge the quality of the radio frequency electronic component 61.

請參閱第6、7圖,本發明測試裝置10之第三實施例,其與第一實施例之差異在於載具為轉盤42之應用型式,轉盤42可作水平角度旋轉,或水平角度旋轉及Z方向位移,並設置至少一載裝部421,載裝部421相通轉盤42之底面,並供裝配電性測試器21;於本實施例中,轉盤42係由第二驅動源驅動作水平角度旋轉,第二驅動源包含馬達(圖未示出)及一為轉軸43之傳動器,轉軸43連結驅動轉盤42依第一測試路徑作水平角度旋轉,以使轉盤42之各載裝部421移入/移出測試室131;電性測試單元之電性測試器21可於轉盤42之載裝部421配置電性連接之電路板211及接合部件212,或者於載裝部421配置電路板211及具接合部件212之測試座213,於本實施例中,電性測試器21係於轉盤42之載裝部421配置電路板211及具接合部件212之測試座213,測試座213係設有承置射頻電子元件61之容置部2131,並開設有相通轉盤42底面之第二訊號通道2132;當轉軸43驅動轉盤42依第一測試路徑作水平旋轉,轉盤42之載裝部421帶動電性測試器21及射頻電子元件61移入測試室131,測試工位係位於測試室131,令射頻電子元件61相對於天線測試器12,由於電性測試器21之接合部件212已電性連接射頻電子元件61之接點611,電性測試器21即對射頻電子元件61執行電性測試作業,當射頻電子元件61的天線612朝0°指向發出波束而傳輸無線訊號時,承座11之第一訊號通道111供通過無線訊號,使天線測試器12接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Figures 6 and 7, the third embodiment of the test device 10 of the present invention differs from the first embodiment in that the carrier is the application type of the turntable 42. The turntable 42 can be rotated at a horizontal angle, or rotated at a horizontal angle. Displacement in the Z direction, and at least one loading portion 421 is provided. The loading portion 421 communicates with the bottom surface of the turntable 42 and is used to assemble the electrical tester 21; in this embodiment, the turntable 42 is driven by a second driving source for a horizontal angle Rotation, the second driving source includes a motor (not shown in the figure) and a transmission which is a shaft 43. The shaft 43 is connected to the drive turntable 42 to rotate horizontally according to the first test path, so that the loading parts 421 of the turntable 42 are moved in /Remove out of the test room 131; the electrical tester 21 of the electrical test unit can be equipped with an electrically connected circuit board 211 and a joint component 212 on the loading portion 421 of the turntable 42, or a circuit board 211 and tools on the loading portion 421 The test base 213 of the joint component 212. In this embodiment, the electrical tester 21 is provided with a circuit board 211 and a test base 213 with a joint component 212 on the loading portion 421 of the turntable 42. The test base 213 is provided with a support The accommodating portion 2131 of the radio frequency electronic component 61 is provided with a second signal channel 2132 communicating with the bottom surface of the turntable 42; when the rotating shaft 43 drives the turntable 42 to rotate horizontally according to the first test path, the loading part 421 of the turntable 42 drives the electrical test The tester 21 and the radio frequency electronic component 61 are moved into the test room 131. The test station is located in the test room 131, so that the radio frequency electronic element 61 is opposite to the antenna tester 12, because the joint part 212 of the electrical tester 21 is electrically connected to the radio frequency electronic element 61 of the contact 611, the electrical tester 21 is to perform electrical testing operations on the radio frequency electronic component 61, when the antenna 612 of the radio frequency electronic component 61 emits a beam toward 0° to transmit wireless signals, the first signal of the holder 11 The channel 111 is used for passing the wireless signal to make the antenna tester 12 receive the wireless signal of the radio frequency electronic component 61, and transmit the received wireless signal to the processor of the central control device (not shown in the figure) for judging the radio frequency electronic component 61 quality.

請參閱第8圖,係本發明測試裝置10之第四實施例,其與第一實施例之差異在於測試工位係位於承座11,並無配置測試室,該承座11係為架座 ,並裝配於機台板31,承座11之內部設有第一訊號通道111,以供裝配天線測試器12,且供通過無線訊號,承座11於頂部設有相通第一訊號通道111之承接部112,承接部112係供承置射頻電子元件61位於測試工位;該電性測試單元之電性測試器21係設有電性連接之電路板211及接合部件212,接合部件212供電性連接射頻電子元件61;以電性測試器21配置於載具而言,載具係為作動器41 ,並由第二驅動源(圖未示出)驅動作Z方向位移,使作動器41帶動電性測試器21作Z方向位移,電性測試器21即對射頻電子元件61執行電性測試作業,當射頻電子元件61的天線612朝0°指向發出波束而傳輸無線訊號時,承座11之第一訊號通道111供通過無線訊號,使天線測試器12接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Fig. 8, which is the fourth embodiment of the test device 10 of the present invention. The difference from the first embodiment is that the test station is located on the socket 11, and there is no test chamber. The socket 11 is a frame. , And assembled on the machine plate 31, the inside of the socket 11 is provided with a first signal channel 111 for assembling the antenna tester 12 and for passing wireless signals, and the top of the socket 11 is provided with a first signal channel 111 communicating with it The receiving portion 112 is used to hold the radio frequency electronic component 61 at the testing station; the electrical tester 21 of the electrical testing unit is provided with an electrical circuit board 211 and a joint part 212, which is powered by the joint part 212 Connected to the radio frequency electronic component 61; in terms of the electrical tester 21 being configured on the carrier, the carrier is the actuator 41 , And driven by the second drive source (not shown in the figure) to move in the Z direction, so that the actuator 41 drives the electrical tester 21 to move in the Z direction, and the electrical tester 21 performs electrical testing operations on the radio frequency electronic components 61 When the antenna 612 of the radio frequency electronic component 61 is directed towards 0° to emit a beam to transmit wireless signals, the first signal channel 111 of the holder 11 is for passing the radio signal, so that the antenna tester 12 receives the radio signal of the radio frequency electronic component 61, and The received wireless signal is transmitted to the processor (not shown in the figure) of the central control device for judging the quality of the radio frequency electronic component 61.

請參閱第9圖,本發明測試裝置10之第五實施例,以電性測試器21配置於移載臂72而言,移載臂72係作至少一方向位移,其型式係設有至少一作業治具,作業治具係供拾取射頻電子元件,測試工位如前所述,可位於測試室131、移載臂72或承座11,依不同測試作業需求而定,不受限於本實施例;於本實施例中,移載臂72係由第三驅動器(圖未示出)驅動作X-Z方向位移,並設有可為吸嘴721之作業治具,吸嘴721係供拾取射頻電子元件;天線測試單元係於機台板31與箱體13之間形成測試室131,並於箱體13之兩側設置輸送通道135 ;又天線測試單元係於輸送通道135設置至少一載台,亦或於箱體13外部設置至少一載台,載台可載送待測之射頻電子元件或已測之射頻電子元件,或載送待測之射頻電子元件及已測之射頻電子元件;於本實施例中,係於二輸送通道135設置二作Y方向位移之載台136,以供載送射頻電子元件61;電性測試器21係裝配於移載臂72,而由移載臂72帶動作X-Z方向位移,電性測試器21設有電性連接之電路板211及接合部件212,接合部件212係供電性連接射頻電子元件61;承座11係為架座,並裝配於機台板31,且位於測試室131,承座11之內部設有第一訊號通道111,以供裝配天線測試器12,且供通過無線訊號,承座11於頂部設有相通第一訊號通道111之承接部112,承接部112係供承置射頻電子元件61位於測試工位。Please refer to Figure 9, the fifth embodiment of the test device 10 of the present invention, the electrical tester 21 is disposed on the transfer arm 72, the transfer arm 72 is displaced in at least one direction, and its type is provided with at least one The work fixture is used for picking up radio frequency electronic components. The test station can be located in the test room 131, the transfer arm 72 or the socket 11 as described above. It depends on the requirements of different test operations and is not limited to this Embodiment; in this embodiment, the transfer arm 72 is driven by a third driver (not shown) for displacement in the XZ direction, and is provided with a work fixture that can be a suction nozzle 721, which is used to pick up radio frequency Electronic components; the antenna test unit is formed between the machine board 31 and the box 13 to form a test chamber 131, and a conveying channel 135 is provided on both sides of the box 13 ; And the antenna test unit is to set at least one carrier on the conveying channel 135, or at least one carrier on the outside of the box 13, the carrier can carry the radio frequency electronic components to be tested or the radio frequency electronic components tested, or Send the radio frequency electronic components to be tested and the radio frequency electronic components tested; in this embodiment, two carriers 136 with Y-direction displacement are provided in the two conveying channels 135 to carry the radio frequency electronic components 61; electrical testing The device 21 is assembled on the transfer arm 72, and the transfer arm 72 drives the displacement in the XZ direction. The electrical tester 21 is provided with an electrical circuit board 211 and a joint part 212 that are electrically connected. The joint part 212 is electrically connected to the radio frequency electronics. Component 61; the socket 11 is a frame, and is assembled on the machine board 31, and is located in the test room 131. The inside of the socket 11 is provided with a first signal channel 111 for assembling the antenna tester 12 and for passing wireless Signal, the top of the socket 11 is provided with a receiving portion 112 that communicates with the first signal channel 111, and the receiving portion 112 is used to hold the radio frequency electronic component 61 at the testing station.

請參閱第10圖,測試工位係位於測試室131,當一載台136承載射頻電子元件61至承座11之側方時,移載臂72依第二測試路徑作X-Z方向位移,令吸嘴721於載台136取出待測之射頻電子元件61,並移入及壓接於承座11之承接部112,由於移載臂72上之電性測試器21的接合部件212已電性連接射頻電子元件61之接點611,當電性測試器21對射頻電子元件61執行電性測試作業時,射頻電子元件61之天線612於0°待測指向發射波束的無線訊號,承座11之第一訊號通道111供通過無線訊號,使得天線測試器12接收無線訊號而執行無線訊號測試作業,並將無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別分析射頻電子元件61之品質。Please refer to Figure 10, the test station is located in the test room 131. When a carrier 136 carries the radio frequency electronic component 61 to the side of the socket 11, the transfer arm 72 moves in the XZ direction according to the second test path, so that the suction The nozzle 721 takes out the radio frequency electronic component 61 to be tested from the carrier 136, and moves it into and crimps it to the receiving portion 112 of the socket 11. Since the joint part 212 of the electrical tester 21 on the transfer arm 72 is electrically connected to the radio frequency The contact 611 of the electronic component 61. When the electrical tester 21 performs the electrical test operation on the radio-frequency electronic component 61, the antenna 612 of the radio-frequency electronic component 61 emits the wireless signal of the beam at 0° to be tested. A signal channel 111 is used to pass wireless signals so that the antenna tester 12 receives the wireless signals to perform wireless signal testing operations, and transmits the wireless signals to the processor of the central control device (not shown) for discrimination and analysis of radio frequency electronic components The quality of 61.

請參閱第11圖,係本發明測試裝置10之第六實施例,以電性測試器21配置於移載臂72而言,測試工位如前所述,可位於測試室、移載臂72或承座11,依不同測試作業需求而定,不受限於本實施例;於本實施例中,該移載臂72係作至少一方向位移,並設有為吸嘴721之作業治具,以供移載射頻電子元件61,另於移載臂72裝配外罩14,移載臂72帶動外罩14及電性測試器21同步作Z方向位移,電性測試器21係設有電性連接之電路板211及接合部件212,接合部件212係供電性連接射頻電子元件61;承座11係裝配於機台板31,並設有第一訊號通道111,以供裝配天線測試器12,且供通過無線訊號,承座11於頂部設有相通第一訊號通道111之承接部112,承接部112係供承置射頻電子元件61;當移載臂72帶動外罩14及電性測試器21同步作Z方向向下位移時,吸嘴721係將射頻電子元件61移入且壓接於承座11之承接部112,外罩14則罩置於機台板31而形成測試室141,測試工位係位於測試室141,使承座11上之射頻電子元件61於測試室141執行電性測試作業及無線訊號測試作業。Please refer to Figure 11, which is the sixth embodiment of the test device 10 of the present invention. The electrical tester 21 is configured on the transfer arm 72. The test station can be located in the test room and the transfer arm 72 as described above. Or the holder 11, depending on the requirements of different test operations, and is not limited to this embodiment; in this embodiment, the transfer arm 72 is displaced in at least one direction, and is provided with a work fixture as a suction nozzle 721 , In order to transfer the radio frequency electronic component 61, in addition to the transfer arm 72 to assemble the cover 14, the transfer arm 72 drives the cover 14 and the electrical tester 21 to move synchronously in the Z direction, and the electrical tester 21 is provided with an electrical connection The circuit board 211 and the joining part 212 are connected to the radio frequency electronic component 61 by power supply; the socket 11 is assembled on the machine board 31 and is provided with a first signal channel 111 for assembling the antenna tester 12, and For wireless signals, the top of the socket 11 is provided with a receiving portion 112 that communicates with the first signal channel 111. The receiving portion 112 is used to hold the radio frequency electronic component 61; when the transfer arm 72 drives the housing 14 and the electrical tester 21 to synchronize When moving downward in the Z direction, the suction nozzle 721 moves the radio frequency electronic component 61 in and presses it on the receiving portion 112 of the socket 11, and the outer cover 14 is placed on the machine table 31 to form a test chamber 141. The test station is Located in the test room 141, the radio frequency electronic component 61 on the socket 11 performs the electrical test operation and the wireless signal test operation in the test room 141.

請參閱第12圖,係本發明測試裝置10之第七實施例,其與第六實施例之差異在於電性測試器21配置於移載臂72,測試工位係位於承座11,並無配置測試室;該承座11係裝配於機台板31,並設有第一訊號通道111,以供裝配天線測試器12,且供通過無線訊號,承座11於頂部設有相通第一訊號通道111之承接部112,承接部112係供承置射頻電子元件61位於測試工位;該電性測試器21係裝配於移載臂72,並設有電性連接之電路板211及接合部件212,接合部件212供電性連接射頻電子元件61;當移載臂72之吸嘴721將射頻電子元件61移入且壓接於承座11之承接部112,使電性測試器21對射頻電子元件61執行電性測試作業,以及使天線測試器12對射頻電子元件61執行無線訊號測試作業 ,進而測試射頻電子元件61之品質。Please refer to Figure 12, which is the seventh embodiment of the test device 10 of the present invention. The difference from the sixth embodiment is that the electrical tester 21 is disposed on the transfer arm 72, and the test station is located on the socket 11, and there is no Configure the test room; the socket 11 is assembled on the machine plate 31, and is provided with a first signal channel 111 for assembling the antenna tester 12 and for passing wireless signals. The socket 11 is provided with a first communication signal on the top The receiving portion 112 of the channel 111 is used to hold the radio frequency electronic component 61 at the testing station; the electrical tester 21 is assembled on the transfer arm 72 and is provided with an electrical circuit board 211 and joint components 212. The joining component 212 is electrically connected to the radio frequency electronic component 61; when the suction nozzle 721 of the transfer arm 72 moves the radio frequency electronic component 61 into and presses it on the receiving portion 112 of the socket 11, the electrical tester 21 is opposed to the radio frequency electronic component 61 Perform electrical testing operations, and make the antenna tester 12 perform wireless signal testing operations on the radio frequency electronic components 61 , And then test the quality of the radio frequency electronic component 61.

請參閱第13圖,本發明測試裝置10之第八實施例,其與第七實施例之差異在於承座15並無承接部,測試工位係位於移載臂72;該承座15係裝配於機台板31,並設有第一訊號通道151,以供裝配天線測試器12,且供通過無線訊號;電性測試器21係裝配於移載臂72,並設有電性連接之電路板211及接合部件212,接合部件212供電性連接射頻電子元件61;移載臂72係以吸嘴721拾取射頻電子元件61,並移載至承座15之上方,令射頻電子元件61之天線612相對於天線測試器12,使電性測試器21對射頻電子元件61執行電性測試作業,以及使天線測試器12對射頻電子元件61執行無線訊號測試作業,進而測試射頻電子元件61之品質。Please refer to Figure 13, the eighth embodiment of the test device 10 of the present invention is different from the seventh embodiment in that the socket 15 does not have a receiving part, and the test station is located at the transfer arm 72; the socket 15 is assembled The machine board 31 is provided with a first signal channel 151 for assembling the antenna tester 12 and for passing wireless signals; the electrical tester 21 is installed on the transfer arm 72 and is provided with an electrical connection circuit The board 211 and the jointing part 212, the jointing part 212 is electrically connected to the radio frequency electronic component 61; the transfer arm 72 uses the suction nozzle 721 to pick up the radio frequency electronic component 61 and move it to the top of the holder 15 to make the antenna of the radio frequency electronic component 61 Relative to the antenna tester 12, 612 enables the electrical tester 21 to perform electrical testing operations on the radio frequency electronic components 61, and the antenna tester 12 to perform wireless signal testing operations on the radio frequency electronic components 61, thereby testing the quality of the radio frequency electronic components 61 .

請參閱第1至3、14圖,本發明測試裝置10之第一實施例應用於測試作業設備之示意圖,包含機台30、供料裝置80、收料裝置90、本發明測試裝置10、輸送裝置100及中央控制裝置(圖未示出);供料裝置80係配置於機台30上,並設有至少一容納待測射頻電子元件之供料承置器81;收料裝置90係配置於機台30上,並設有至少一容納已測射頻電子元件之收料承置器91;本發明之測試裝置10係配置於機台30上,包含天線測試單元及電性測試單元,以對射頻電子元件執行電性測試作業及無線訊號測試作業,於本實施例中,測試裝置10係於機台30之第一側及第二側分別配置有複數個天線測試單元及電性測試單元,天線測試單元係於測試室131配置承座11,承座11供裝配天線測試器12,天線測試器12以供對射頻電子元件執行無線訊號測試作業,電性測試單元係設有電性測試器21,以供對射頻電子元件執行電性測試作業,測試裝置10另於機台30之第一側及第二側分別配置有移料器51,以分別於第一側及第二側之複數個承座11移載待測/已測之射頻電子元件,測試裝置10另於機台30之第一側及第二側分別配置有載台136,以承載待測/已測之射頻電子元件;輸送裝置100係配置於機台30上,並設有至少一輸送器,用以輸送射頻電子元件,於本實施例中 ,輸送裝置100係設有作X-Y-Z方向位移之輸送器1001,以於供料裝置80取出待測之射頻電子元件,並移載至測試裝置10之載台136,載台136供移料器51取出待測之射頻電子元件,以及移入已測之射頻電子元件,移料器51將待測之射頻電子元件移載至測試室131,且移入於承座11,使射頻電子元件於測試室131執行電性測試作業及無線訊號測試作業,輸送器1001於載台136取出已測之射頻電子元件,並依測試結果,將已測之射頻電子元件移載至收料裝置90而分類收置;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。Please refer to Figures 1 to 3 and 14, a schematic diagram of the first embodiment of the test device 10 of the present invention applied to test operation equipment, including the machine 30, the feeding device 80, the receiving device 90, the test device 10 of the present invention, and the conveying device. The device 100 and the central control device (not shown in the figure); the feeding device 80 is configured on the machine 30, and is provided with at least one feeding holder 81 that contains the radio frequency electronic component to be tested; the receiving device 90 is configured The machine 30 is provided with at least one receiving holder 91 for accommodating the tested radio frequency electronic components; the test device 10 of the present invention is arranged on the machine 30, and includes an antenna test unit and an electrical test unit to Perform electrical test operations and wireless signal test operations on radio frequency electronic components. In this embodiment, the test device 10 is configured with a plurality of antenna test units and electrical test units on the first side and the second side of the machine 30, respectively The antenna test unit is equipped with a socket 11 in the test room 131. The socket 11 is used to assemble the antenna tester 12, and the antenna tester 12 is used to perform wireless signal testing on radio frequency electronic components. The electrical test unit is equipped with electrical tests. The device 21 is used to perform electrical testing operations on the radio frequency electronic components. The testing device 10 is also equipped with a shifter 51 on the first side and the second side of the machine 30 respectively, so as to be placed on the first side and the second side respectively. A plurality of pedestals 11 transfer the radio frequency electronic components to be tested/tested, and the test device 10 is additionally equipped with a carrier 136 on the first side and the second side of the machine 30 to carry the radio frequency electronic components to be tested/tested. Components; the conveying device 100 is configured on the machine 30, and is provided with at least one conveyor for conveying radio frequency electronic components, in this embodiment , The conveying device 100 is provided with a conveyer 1001 that is displaced in the XYZ direction to take out the radio frequency electronic component to be tested from the feeding device 80 and transfer it to the carrier 136 of the test device 10, and the carrier 136 is for the feeder 51 Take out the radio frequency electronic component to be tested, and move in the radio frequency electronic component that has been tested. The shifter 51 transfers the radio frequency electronic component to be tested to the test room 131 and moves it into the socket 11 so that the radio frequency electronic component is in the test room 131 Perform electrical test operations and wireless signal test operations. The conveyor 1001 takes out the tested radio frequency electronic components from the carrier 136, and according to the test results, transfers the tested radio frequency electronic components to the receiving device 90 for sorting and storing; The central control device is used to control and integrate the actions of various devices to perform automated operations and achieve practical benefits of enhancing operational performance.

10:測試裝置 11、15:承座 111、151:第一訊號通道 112:承接部 12:天線測試器 L:作業軸線 13:箱體 131:測試室 132:輸送通道 133:輸送管 134:門板 135:輸送通道 136:載台 14:外罩 141:測試室 21:電性測試器 211:電路板 212:接合部件 213:測試座 2131:容置部 2132:第二訊號通道 30:機台 31:機台板 41:作動器 42:轉盤 421:載裝部 43:轉軸 51:移料器 61:射頻電子元件 611:接點 612:天線 71、72:移載臂 711:讓位部 712、721:吸嘴 80:供料裝置 81:供料承置器 90:收料裝置 91:收料承置器 100:輸送裝置 1001:輸送器10: Test device 11, 15: seat 111, 151: the first signal channel 112: Acceptance Department 12: Antenna tester L: work axis 13: cabinet 131: Test Room 132: Conveying Channel 133: Conveying Pipe 134: Door Panel 135: Conveying Channel 136: Stage 14: outer cover 141: Test Room 21: Electrical tester 211: Circuit Board 212: Joining Parts 213: Test Block 2131: accommodating part 2132: The second signal channel 30: Machine 31: machine board 41: Actuator 42: turntable 421: Loading Department 43: shaft 51: Shifter 61: RF electronic components 611: Contact 612: Antenna 71, 72: transfer arm 711: Recession Department 712, 721: Nozzle 80: Feeding device 81: Feeder 90: Receiving device 91: Receiving holder 100: Conveying device 1001: Conveyor

第1圖:本發明測試裝置第一實施例之示意圖。 第2圖:本發明測試裝置第一實施例之使用示意圖(一)。 第3圖:本發明測試裝置第一實施例之使用示意圖(二)。 第4圖:本發明測試裝置第二實施例之示意圖。 第5圖:本發明測試裝置第二實施例之使用示意圖。 第6圖:本發明測試裝置第三實施例之示意圖。 第7圖:本發明測試裝置第三實施例之使用示意圖。 第8圖:本發明測試裝置第四實施例之示意圖。 第9圖:本發明測試裝置第五實施例之示意圖。 第10圖:本發明測試裝置第五實施例之使用示意圖。 第11圖:本發明測試裝置第六實施例之示意圖。 第12圖:本發明測試裝置第七實施例之示意圖。 第13圖:本發明測試裝置第八實施例之示意圖。 第14圖:本發明測試裝置應用於測試作業設備之示意圖。Figure 1: A schematic diagram of the first embodiment of the testing device of the present invention. Figure 2: A schematic diagram of the use of the first embodiment of the testing device of the present invention (1). Figure 3: A schematic diagram of the use of the first embodiment of the testing device of the present invention (2). Figure 4: A schematic diagram of the second embodiment of the testing device of the present invention. Figure 5: A schematic diagram of the use of the second embodiment of the testing device of the present invention. Figure 6: A schematic diagram of the third embodiment of the testing device of the present invention. Figure 7: A schematic diagram of the use of the third embodiment of the testing device of the present invention. Figure 8: A schematic diagram of the fourth embodiment of the testing device of the present invention. Figure 9: A schematic diagram of the fifth embodiment of the testing device of the present invention. Figure 10: A schematic diagram of the use of the fifth embodiment of the testing device of the present invention. Figure 11: A schematic diagram of the sixth embodiment of the testing device of the present invention. Figure 12: A schematic diagram of the seventh embodiment of the testing device of the present invention. Figure 13: A schematic diagram of the eighth embodiment of the testing device of the present invention. Figure 14: A schematic diagram of the testing device of the present invention applied to testing equipment.

10:測試裝置10: Test device

11:承座11: Socket

111:第一訊號通道111: The first signal channel

112:承接部112: Acceptance Department

12:天線測試器12: Antenna tester

L:作業軸線L: work axis

13:箱體13: cabinet

131:測試室131: Test Room

132:輸送通道132: Conveying Channel

133:輸送管133: Conveying Pipe

134:門板134: Door Panel

21:電性測試器21: Electrical tester

211:電路板211: Circuit Board

212:接合部件212: Joining Parts

31:機台板31: machine board

41:作動器41: Actuator

Claims (18)

一種射頻電子元件測試裝置,包含: 天線測試單元:係設置承座及天線測試器,該承座係供裝配該天線測試器,該天線測試器係供對位於測試工位之該射頻電子元件執行無線訊號測試作業; 電性測試單元:係設置至少一電性測試器,該電性測試器係設置電路 板及接合部件,該接合部件供電性連接位於該測試工 位之該射頻電子元件執行電性測試作業。A radio frequency electronic component testing device, including: Antenna test unit: a socket and an antenna tester are set, the socket is for assembling the antenna tester, and the antenna tester is for performing wireless signal testing operations on the radio frequency electronic component at the test station; Electrical test unit: at least one electrical tester is provided, and the electrical tester is equipped with a circuit Board and joint parts, the joint parts are electrically connected to the tester Position the radio frequency electronic components to perform electrical testing operations. 依申請專利範圍第1項所述之射頻電子元件測試裝置,更包含移載臂,該移載臂係配置該電性測試器,以供帶動該電性測試器位移,該移載臂並設有至少一作業治具,該作業治具係執行預設作業。The radio frequency electronic component test device described in item 1 of the scope of patent application further includes a transfer arm configured with the electrical tester for driving the electrical tester to move, and the transfer arm is arranged in parallel There is at least one work tool, and the work tool executes preset operations. 依申請專利範圍第1項所述之射頻電子元件測試裝置,更包含測試室 ,該測試室係配置該電性測試器。According to the radio frequency electronic component test device described in item 1 of the scope of patent application, it also includes a test room , The test room is equipped with the electrical tester. 依申請專利範圍第1項所述之射頻電子元件測試裝置,更包含載具,該載具係配置該電性測試器。The radio frequency electronic component test device described in item 1 of the scope of patent application further includes a carrier equipped with the electrical tester. 依申請專利範圍第4項所述之射頻電子元件測試裝置,其中,該電性測試器係設有該電路板及具該接合部件之測試座,該測試座係設有第二訊號通道,以供通過無線訊號。According to the radio frequency electronic component test device described in item 4 of the scope of patent application, the electrical tester is provided with the circuit board and a test base with the joint component, and the test base is provided with a second signal channel to For passing wireless signals. 依申請專利範圍第1至4項任一項所述之射頻電子元件測試裝置,其中,該測試工位係位於該承座。According to the radio frequency electronic component test device described in any one of items 1 to 4 in the scope of patent application, the test station is located on the socket. 依申請專利範圍第1至4項所述之射頻電子元件測試裝置,其中,該承座係設有第一訊號通道,以供通過無線訊號。According to the radio frequency electronic component test device described in items 1 to 4 of the scope of patent application, the socket is provided with a first signal channel for passing wireless signals. 依申請專利範圍第7項所述之射頻電子元件測試裝置,其中,該承座係設有承接部,以供承置該射頻電子元件,該承接部係相通該第一訊號通道。According to the radio frequency electronic component testing device described in item 7 of the scope of patent application, the socket is provided with a receiving portion for holding the radio frequency electronic component, and the receiving portion communicates with the first signal channel. 依申請專利範圍第1、2或4項任一項所述之射頻電子元件測試裝置,更包含測試室,該測試工位係位於該測試室。The radio frequency electronic component testing device according to any one of items 1, 2 or 4 in the scope of the patent application further includes a testing room, and the testing station is located in the testing room. 依申請專利範圍第3項所述之射頻電子元件測試裝置,其中,該測試工位係位於該測試室。According to the radio frequency electronic component test device described in item 3 of the scope of patent application, the test station is located in the test room. 依申請專利範圍第3或10項所述之射頻電子元件測試裝置,其係於面板與箱體之間形成該測試室,並於該箱體或該面板設置輸送通道。According to the radio frequency electronic component test device described in item 3 or 10 of the scope of patent application, the test chamber is formed between the panel and the box, and the box or the panel is provided with a conveying channel. 依申請專利範圍第3或10項所述之射頻電子元件測試裝置,其係於一外罩罩置於面板時形成該測試室。According to the radio frequency electronic component test device described in item 3 or 10 of the scope of patent application, the test chamber is formed when an outer cover is placed on the panel. 依申請專利範圍第1、3或4項任一項所述之射頻電子元件測試裝置 ,更包含移載臂,該測試工位係位於該移載臂。Radio frequency electronic component test device according to any one of item 1, 3 or 4 in the scope of patent application , It also includes a transfer arm, and the test station is located on the transfer arm. 依申請專利範圍第13項所述之射頻電子元件測試裝置,其中,該移載臂係設有至少一作業治具及讓位部,該作業治具係供執行預設作業,該讓位部係供該電性測試器測試該射頻電子元件。According to the radio frequency electronic component test device described in item 13 of the scope of patent application, wherein the transfer arm is provided with at least one work jig and a relief portion, the work jig is for performing preset operations, and the relief portion The electrical tester is used to test the radio frequency electronic components. 依申請專利範圍第1至4項任一項所述之射頻電子元件測試裝置,其中,該電性測試單元係設置電性調整器,以裝配該電性測試器,而供該電性測試器作至少一方向位移或作角度轉動,或作至少一方向位移及角度轉動。According to the radio frequency electronic component test device described in any one of items 1 to 4 of the scope of patent application, wherein the electrical test unit is provided with an electrical adjuster to assemble the electrical tester and supply the electrical tester Make at least one direction displacement or angle rotation, or make at least one direction displacement and angle rotation. 依申請專利範圍第1至4項任一項所述之射頻電子元件測試裝置,其中,該天線測試單元係設置天線調整器,以裝配該天線測試器,而供該天線測試器作至少一方向位移或作角度轉動,或作至少一方向位移及角度轉動。According to the radio frequency electronic component test device described in any one of items 1 to 4 in the scope of patent application, wherein the antenna test unit is provided with an antenna adjuster to assemble the antenna tester, and the antenna tester is used for at least one direction Displacement or angular rotation, or at least one direction displacement and angular rotation. 依申請專利範圍第1至4項任一項所述之射頻電子元件測試裝置,更包含於該天線測試器與該測試工位之間設有至少一中介器。The radio frequency electronic component testing device described in any one of items 1 to 4 of the scope of patent application further includes at least one intermediary provided between the antenna tester and the testing station. 一種射頻電子元件測試作業設備,包含: 機台; 供料裝置:係配置於該機台上,並設有至少一容納待測該射頻電子 元件之供料承置器; 收料裝置:係配置於該機台上,並設有至少一容納已測該射頻電子 元件之收料承置器; 至少一依申請專利範圍第1至4項任一項所述之射頻電子元件測試裝 置:係配置於該機台上,以供測試該射頻電子元件; 輸送裝置:係配置於該機台上,並設有至少一輸送器,以供輸送該 射頻電子元件; 中央控制裝置:係用以控制及整合各裝置作動,以執行自動化作A radio frequency electronic component testing equipment, including: Machine; Feeding device: It is configured on the machine and is equipped with at least one radio frequency electronic device to be tested Component feeder holder; Receiving device: it is arranged on the machine, and is equipped with at least one accommodating radio frequency electronic Component receiving holder; At least one radio frequency electronic component test device described in any one of items 1 to 4 in the scope of the patent application Setting: It is configured on the machine for testing the radio frequency electronic components; Conveying device: It is arranged on the machine and is equipped with at least one conveyor for conveying the RF electronic components; Central control device: used to control and integrate the actions of various devices to perform automated operations
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TWI804309B (en) * 2022-05-11 2023-06-01 量崴科技股份有限公司 Antenna test system

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