TW202122809A - Test device for radio frequency electronic component and its applied testing operation equipment wherein the test device for radio frequency electronic component comprises an antenna test unit and an electrical test unit - Google Patents
Test device for radio frequency electronic component and its applied testing operation equipment wherein the test device for radio frequency electronic component comprises an antenna test unit and an electrical test unit Download PDFInfo
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本發明係提供一種射頻電子元件的測試裝置。The invention provides a testing device for radio frequency electronic components.
在現今,行動通訊區域無線網路系統、無線通訊區域網路系統或藍芽無線個人網路系統等,於增加資料傳輸速度的需求下,一內建有天線之射頻電子元件即為前述通訊系統之重要應用;天線的發射場型依應用場所而有不同,例如偶極天線具有全指向性發射場型,應用於終端設備,使終端設備可接收不同指向之波束所傳輸的無線訊號;例如無線網路接取器之天線,則需要能夠產生特定指向(如0°、45°或21°指向)的發射場型,而接收特定位置之設備所發射的無線訊號。目前射頻電子元件係於二面分別設置接點及天線,或者於同一面設置接點及天線,利用調節天線的相位及波束成形技術,進而調整發射場型,亦即使天線陣列於特定指向的發射/接收無線訊號一致地疊加,進而產生最佳發射/接收之波束;因此,如何測試射頻電子元件之天線對於預設指向的無線訊號傳輸效能,進而淘汰出不良品,即為業者研發之標的。Nowadays, in order to increase the data transmission speed of mobile communication area wireless network system, wireless communication area network system or Bluetooth wireless personal network system, etc., a radio frequency electronic component with built-in antenna is the aforementioned communication system The important application; the antenna's transmitting field type varies according to the application site, for example, the dipole antenna has an omnidirectional transmitting field type, which is applied to terminal equipment so that the terminal equipment can receive the wireless signals transmitted by beams of different directions; such as wireless The antenna of the network access device needs to be able to generate a specific directional (such as 0°, 45°, or 21° directional) transmitting field type, and receive the wireless signal emitted by the device at a specific location. At present, radio frequency electronic components are equipped with contacts and antennas on two sides, or on the same side. The phase and beamforming technology of the antenna are adjusted to adjust the transmission field pattern, even if the antenna array emits in a specific direction. /Receiving wireless signals are uniformly superimposed to produce the best transmitting/receiving beam; therefore, how to test the transmission performance of the radio frequency electronic component's antenna to the wireless signal transmission performance of the preset direction, and then eliminate the defective products, is the target of the industry's research and development.
本發明之目的一,係提供一種射頻電子元件測試裝置,包含天線測試單元及電性測試單元,天線測試單元係設置承座及天線測試器,承座係裝配天線測試器,天線測試器係供對位於測試工位之射頻電子元件的天線接收或發射無線訊號,該電性測試單元係設有具電路板及接合部件之電性測試器,並以接合部件供電性連接位於測試工位之射頻電子元件;藉以於電性測試單元對位於測試工位之射頻電子元件執行電性測試作業時,同步利用天線測試單元對測試工位之射頻電子元件的天線進行無線訊號測試作業,達到提升測試產能之實用效益。The first objective of the present invention is to provide a radio frequency electronic component test device, which includes an antenna test unit and an electrical test unit. The antenna test unit is provided with a socket and an antenna tester, the socket is equipped with an antenna tester, and the antenna tester is provided for To receive or transmit wireless signals to the antenna of the radio frequency electronic component at the test station, the electrical test unit is equipped with an electrical tester with a circuit board and a joint part, and the joint part is used to power-connect the radio frequency at the test station Electronic components; when the electrical testing unit performs electrical testing on the radio frequency electronic components located in the test station, the antenna test unit is used to simultaneously perform wireless signal testing operations on the antenna of the radio frequency electronic component at the test station to increase test productivity The practical benefits.
本發明之目的二,係提供一種射頻電子元件測試裝置,其承座係設有第一訊號通道及承接部,第一訊號通道供裝配天線測試器,且供通過無線訊號,承接部係供承置射頻電子元件位於測試工位,使電性測試器及天線測試器對承接部上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業,達到提升測試產能之實用效益。The second object of the present invention is to provide a radio frequency electronic component testing device, the socket is provided with a first signal channel and a receiving part, the first signal channel is for mounting an antenna tester, and for passing wireless signals, and the receiving part is for receiving Placing the radio frequency electronic components at the testing station allows the electrical tester and antenna tester to perform electrical testing and wireless signal testing on the radio frequency electronic components on the receiving part and located at the testing station, so as to achieve the practical benefits of improving test productivity.
本發明之目的三,係提供一種射頻電子元件測試裝置,更包含載具,以供裝配電性測試器,載具係依第一測試路徑而帶動電性測試器作線性位移或旋轉位移,達到提升測試使用效能之實用效益。The third objective of the present invention is to provide a radio frequency electronic component testing device, which further includes a carrier for assembling the electrical tester. The carrier drives the electrical tester to perform linear displacement or rotational displacement according to the first test path to achieve Practical benefits of improving test efficiency.
本發明之目的四,係提供一種射頻電子元件測試裝置,更包含測試室,不僅可防止外部雜訊,並供射頻電子元件位於模擬應用場所溫度測試環境執行測試作業,達到提升測試品質之實用效益。The fourth objective of the present invention is to provide a radio frequency electronic component testing device, which further includes a test room, which not only prevents external noise, but also allows radio frequency electronic components to be located in a simulated application site temperature test environment to perform test operations, thereby achieving practical benefits of improving test quality .
本發明之目的五,係提供一種射頻電子元件測試裝置,更包含移載臂,以供裝配電性測試器,移載臂依第二測試路徑而帶動電性測試器作線性位移或旋轉位移,達到提升測試使用效能之實用效益。The fifth object of the present invention is to provide a radio frequency electronic component testing device, which further includes a transfer arm for assembling the electrical tester. The transfer arm drives the electrical tester for linear displacement or rotational displacement according to the second test path. To achieve the practical benefits of improving the test efficiency.
本發明之目的六,係提供一種射頻電子元件測試裝置,其移載臂係設有讓位部及至少一作業治具,讓位部可供電性測試器對射頻電子元件執行電性測試作業,作業治具係供拾取射頻電子元件位於測試工位,以供電性測試器及天線測試器對移載臂上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業,達到提升測試產能之實用效益。The sixth object of the present invention is to provide a radio frequency electronic component testing device, the transfer arm is equipped with a relieving portion and at least one work fixture, and the relieving portion can be powered by a tester to perform electrical testing operations on the radio frequency electronic components. The work fixture is used to pick up the radio frequency electronic components at the test station, and use the power tester and antenna tester to perform electrical test operations and wireless signal test operations on the radio frequency electronic components on the transfer arm and at the test station to achieve improvement Practical benefits of testing capacity.
本發明之目的七,係提供一種射頻電子元件測試裝置,其天線測試單元可視作業需求,而配置天線調整器,利用天線調整器調整天線測試器之擺置位置或角度,以利測試不同指向之射頻電子元件,進而有效縮減天線測試器之配置數量,達到節省天線測試器成本之實用效益。The seventh objective of the present invention is to provide a radio frequency electronic component test device, the antenna test unit of which can be configured with an antenna adjuster according to operational requirements, and the antenna adjuster is used to adjust the position or angle of the antenna tester to facilitate testing of different directions The radio frequency electronic components can effectively reduce the number of antenna testers, and achieve the practical benefit of saving the cost of antenna testers.
本發明之目的八,係提供一種射頻電子元件測試裝置,其電性測試單元可視作業需求,而配置電性調整器,利用電性調整器調整電性測試器及射頻電子元件的擺置位置或角度,以利測試不同指向之射頻電子元件,亦可有效縮減天線測試器之配置數量,達到節省天線測試器成本之實用效益。The eighth object of the present invention is to provide a radio frequency electronic component test device. The electrical test unit can be equipped with an electrical adjuster according to operational requirements. The electrical adjuster is used to adjust the placement position of the electrical tester and the radio frequency electronic component or The angle can be used to test the radio frequency electronic components of different directions. It can also effectively reduce the number of antenna testers and achieve the practical benefit of saving the cost of antenna testers.
本發明之目的九,係提供一種測試作業設備,包含機台、供料裝置、收料裝置、本發明測試裝置、輸送裝置及中央控制裝置;供料裝置係配置於機台上,並設有至少一容納待測射頻電子元件之供料承置器;收料裝置係配置於機台上,並設有至少一容納已測射頻電子元件之收料承置器;本發明測試裝置係配置於機台上,包含天線測試單元及電性測試單元,以對射頻電子元件執行電性測試作業及無線訊號測試作業;輸送裝置係配置於機台上,並設有至少一輸送器,用以輸送射頻電子元件;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。The ninth object of the present invention is to provide a test operation equipment, including a machine, a feeding device, a receiving device, the test device of the present invention, a conveying device, and a central control device; the feeding device is arranged on the machine and equipped with At least one feeding holder for accommodating the radio frequency electronic component to be tested; the receiving device is arranged on the machine, and is provided with at least one receiving holder for accommodating the measured radio frequency electronic component; the test device of the present invention is arranged on The machine platform includes an antenna test unit and an electrical test unit to perform electrical test operations and wireless signal test operations on radio frequency electronic components; the conveying device is arranged on the machine platform and is equipped with at least one conveyor for conveying Radio frequency electronic components; the central control device is used to control and integrate the actions of various devices to perform automated operations and achieve practical benefits of improving operational performance.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如后。In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given with the drawings, and the details are as follows.
請參閱第1圖,本發明測試裝置10之第一實施例,測試裝置10包含天線測試單元及電性測試單元。Please refer to Fig. 1, a first embodiment of the
該天線測試單元包含承座11及天線測試器12,更包含測試室,更進一步,可於面板與箱體之間形成測試室,或者一外罩罩置於面板而形成測試室,面板可為機台板或機架板,箱體或面板可開設輸送通道,亦可於輸送通道處設置可啟閉之門板或可承置射頻電子元件之載台;於本實施例中,測試裝置10係於箱體13與機台板31之間形成測試室131,以供射頻電子元件(圖未示出)位於模擬應用場所溫度之測試環境,另於箱體13設有輸送通道132、輸送管133及門板134,輸送通道132係供移入/移出射頻電子元件,輸送管133係供輸入具預設溫度之乾燥流體至測試室131,使測試室131保持預設溫度及防結露,門板134係供啟閉輸送通道132。The antenna test unit includes a
承座11係供裝配天線測試器12,更進一步,承座11可為面板或架座,並為固定式配置或活動式配置,例如承座11可固定式配置於機台板31,例如承座11可由第一驅動源(圖未示出)驅動作Z方向位移或X-Y-Z方向位移至預設作業位置;另承座11係設有第一訊號通道111及承接部112,第一訊號通道111係供裝配天線測試器12,且供通過無線訊號,承接部112係相通第一訊號通道111,以供承置射頻電子元件位於測試工位,使天線測試器12及電性測試單元分別對承座11上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業,又承座11與電性測試單元之電性測試器可作相對位移;於本實施例中,承座11係為架座,並裝配於機台板31,且位於測試室131,承座11之內部設有第一訊號通道111,以供裝配天線測試器12,且供通過無線訊號,承座11於頂部設有相通第一訊號通道111之承接部112,承接部112係供承置射頻電子元件位於測試工位。The
至少一天線測試器12係裝配於承座11,以供對位於測試工位之射頻電子元件的天線執行無線訊號測試作業,例如天線測試器12對射頻電子元件執行接收無線訊號之作業,例如天線測試器12對射頻電子元件執行發射測試用無線訊號之作業,例如天線測試器12對射頻電子元件執行接收及發射無線訊號之作業;又天線測試器12可連接一獨立之處理器(圖未示出),以將接收射頻電子元件的無線訊號傳輸至處理器,或者將處理器之測試用無線訊號發射至射頻電子元件,該處理器亦可為中央控制裝置(圖未示出)之處理器;再者,天線測試器12之作業軸線L位於預設指向,作業軸線L之角度可相同或偏近於射頻電子元件之待測指向(如0°、45°或30°指向),以接收射頻電子元件之待測指向所發出波束的無線訊號,或朝向射頻電子元件之待測指向發出測試用無線訊號;於本實施例中,天線測試器12係裝配於承座11之第一訊號通道111,天線測試器12之作業軸線L角度係位於預設之0°指向。At least one
測試裝置10可依測試作業需求而變換天線測試器12之配置數量,天線測試器12可採固定式配置或活動式配置,例如天線測試器12可固設於承座11,例如天線測試器12可搭配天線調整器(圖未示出)而裝配於承座11,以供調整擺置位置或角度,天線調整器可為機械手臂、轉軸、滑軌組或包含複數個調整桿件,可視作業需求,以帶動天線測試器12依待測指向所需而位移調整擺置位置或角度,亦或於原軸向旋轉調整擺置角度,以利天線測試器12測試不同待測指向(如0°、45°或30°指向)之射頻電子元件,進而有效縮減天線測試器之配置數量及節省成本。再者,天線測試單元可依測試作業需求,而於天線測試器12與測試工位之間設有至少一中介器(圖未示出),中介器可為菱鏡或折射元件等,中介器係於射頻電子元件與天線測試器12之間轉送傳輸無線訊號。The
該電性測試單元係設置具電路板211及接合部件212之電性測試器21,其接合部件212供電性連接位於測試工位之射頻電子元件而執行電性測試作業;更進一步,電性測試器21可位於測試室131、載具或移載臂,電性測試器可採固定式配置或活動式配置,例如電性測試器21可作固定式配置於測試室131,而承座11朝向電性測試器21作相對位移;例如電性測試器21可裝配於載具或移載臂(圖未示出)而作至少一方向位移;更進一步,電性測試器21可搭配電性調整器(圖未示出),而調整擺置位置或角度,電性調整器可為機械手臂、轉軸、滑軌組或包含複數個調整桿件,可視作業需求,以帶動電性測試器21及射頻電子元件依待測指向所需而位移調整擺置位置或角度,亦或於原軸向調整擺置呈不同角度,以利測試不同指向(如0°、45°或30°指向)之射頻電子元件,進而有效縮減天線測試器12之配置數量及節省成本;於本實施例中,電性測試器21係設有電性連接之電路板211及接合部件212,接合部件212供電性連接射頻電子元件。The electrical test unit is provided with an
以電性測試器21配置於載具而言,測試裝置10更包含載具,以供裝配電性測試器21,載具可為載座、轉盤或作動器等,並由第二驅動源(圖未示出)驅動作線性位移或旋轉位移,第二驅動源可為線性馬達、壓缸或包含馬達及傳動器,並視作業需求,而帶動電性測試器21依第一測試路徑位移;於本實施例中,載具係為作動器41,作動器41係裝配於箱體13,並由第二驅動源驅動作Z方向位移,使作動器41帶動電性測試器21於測試室131作Z方向位移。As far as the
又該測試工位可位於測試室131、移載臂(圖未示出)或承座11,依不同測試作業需求而定,不受限於本實施例;例如測試工位可位於測試室131,承座11承置射頻電子元件位於測試室131而執行測試作業;例如測試工位可位於移載臂,移載臂之作業治具係移載射頻電子元件,並以移載射頻電子元件執行測試之位置作為測試工位;例如測試工位可位於承座11,承座11係承置射頻電子元件位於測試工位執行測試作業;再者,該測試工位與天線測試器12間不具有訊號干擾件(如金屬件或導電件),以避免無線訊號於傳輸過程損耗,使射頻電子元件之天線於測試工位對預設指向發出波束的無線訊號而進行無線訊號測試作業。In addition, the test station may be located in the
請參閱第2、3圖,以測試工位位於測試室131而言,箱體13係控制門板134開啟輸送通道132,以供一移料器51經由輸送通道132而將待測之射頻電子元件61移入測試室131,令射頻電子元件61位於承座11之承接部112上方;移料器51將射頻電子元件61移入承座11之承接部112後,即退出箱體13,箱體13係控制門板134關閉輸送通道132,由於承座11承置射頻電子元件61位於測試室131,即測試工位位於測試室131,射頻電子元件61之接點611朝向電性測試器21,而射頻電子元件61之天線612朝向天線測試器12,第二驅動器(圖未示出)經作動器41帶動電性測試器21於測試室131作Z方向向下位移,電性測試器21之接合部件212電性連接射頻電子元件61之接點611,電路板211經由接合部件212而對射頻電子元件61執行電性測試作業;由於天線測試器12係裝配於承座11,作業軸線L的角度係相同射頻電子元件61之天線612的待測指向且為0°
,當位於測試工位之射頻電子元件61的天線612朝0°指向發出波束而傳輸無線訊號時,承座11之第一訊號通道111係供通過無線訊號,使天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Figures 2 and 3, assuming that the test station is located in the
請參閱第4、5圖,本發明測試裝置10之第二實施例,其與第一實施例之差異在於測試裝置10更包含移載臂71,移載臂71係作至少一方向位移,並設有至少一作業治具及讓位部711,作業治具係供拾取射頻電子元件位於測試工位,讓位部711可供電性測試器21對射頻電子元件執行電性測試作業,不僅可依第二測試路徑移載射頻電子元件,並供電性測試器21及天線測試器12對移載臂71上且位於測試工位之射頻電子元件執行電性測試作業及無線訊號測試作業;於本實施例中,移載臂71係由第三驅動器(圖未示出)驅動作X-Y-Z方向位移,並設有為吸嘴712之作業治具,以拾取射頻電子元件61位於測試工位,即測試工位係位於移載臂71,移載臂71依第二測試路徑位移,並通過箱體13之輸送通道132,而將射頻電子元件61移入於測試室131,令射頻電子元件61位於天線測試器12及電性測試器21之間;又第二驅動器(圖未示出)經作動器41而帶動電性測試器21於測試室131作Z方向向下位移,電性測試器21係通過移載臂71之讓位部711,並以接合部件212電性連接射頻電子元件61之接點611,電路板211經由接合部件212而對射頻電子元件61執行電性測試作業;由於天線測試器12係裝配於承座11之第一訊號通道111,且作業軸線L的角度係相同射頻電子元件61之天線612的待測指向且為0°,當位於測試工位之射頻電子元件61的天線612朝0°指向發出波束而傳輸無線訊號時,承座11之第一訊號通道111供通過無線訊號,使天線測試器12即接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Figures 4 and 5, the second embodiment of the
請參閱第6、7圖,本發明測試裝置10之第三實施例,其與第一實施例之差異在於載具為轉盤42之應用型式,轉盤42可作水平角度旋轉,或水平角度旋轉及Z方向位移,並設置至少一載裝部421,載裝部421相通轉盤42之底面,並供裝配電性測試器21;於本實施例中,轉盤42係由第二驅動源驅動作水平角度旋轉,第二驅動源包含馬達(圖未示出)及一為轉軸43之傳動器,轉軸43連結驅動轉盤42依第一測試路徑作水平角度旋轉,以使轉盤42之各載裝部421移入/移出測試室131;電性測試單元之電性測試器21可於轉盤42之載裝部421配置電性連接之電路板211及接合部件212,或者於載裝部421配置電路板211及具接合部件212之測試座213,於本實施例中,電性測試器21係於轉盤42之載裝部421配置電路板211及具接合部件212之測試座213,測試座213係設有承置射頻電子元件61之容置部2131,並開設有相通轉盤42底面之第二訊號通道2132;當轉軸43驅動轉盤42依第一測試路徑作水平旋轉,轉盤42之載裝部421帶動電性測試器21及射頻電子元件61移入測試室131,測試工位係位於測試室131,令射頻電子元件61相對於天線測試器12,由於電性測試器21之接合部件212已電性連接射頻電子元件61之接點611,電性測試器21即對射頻電子元件61執行電性測試作業,當射頻電子元件61的天線612朝0°指向發出波束而傳輸無線訊號時,承座11之第一訊號通道111供通過無線訊號,使天線測試器12接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Figures 6 and 7, the third embodiment of the
請參閱第8圖,係本發明測試裝置10之第四實施例,其與第一實施例之差異在於測試工位係位於承座11,並無配置測試室,該承座11係為架座
,並裝配於機台板31,承座11之內部設有第一訊號通道111,以供裝配天線測試器12,且供通過無線訊號,承座11於頂部設有相通第一訊號通道111之承接部112,承接部112係供承置射頻電子元件61位於測試工位;該電性測試單元之電性測試器21係設有電性連接之電路板211及接合部件212,接合部件212供電性連接射頻電子元件61;以電性測試器21配置於載具而言,載具係為作動器41
,並由第二驅動源(圖未示出)驅動作Z方向位移,使作動器41帶動電性測試器21作Z方向位移,電性測試器21即對射頻電子元件61執行電性測試作業,當射頻電子元件61的天線612朝0°指向發出波束而傳輸無線訊號時,承座11之第一訊號通道111供通過無線訊號,使天線測試器12接收射頻電子元件61之無線訊號,並將接收之無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別射頻電子元件61之品質。Please refer to Fig. 8, which is the fourth embodiment of the
請參閱第9圖,本發明測試裝置10之第五實施例,以電性測試器21配置於移載臂72而言,移載臂72係作至少一方向位移,其型式係設有至少一作業治具,作業治具係供拾取射頻電子元件,測試工位如前所述,可位於測試室131、移載臂72或承座11,依不同測試作業需求而定,不受限於本實施例;於本實施例中,移載臂72係由第三驅動器(圖未示出)驅動作X-Z方向位移,並設有可為吸嘴721之作業治具,吸嘴721係供拾取射頻電子元件;天線測試單元係於機台板31與箱體13之間形成測試室131,並於箱體13之兩側設置輸送通道135
;又天線測試單元係於輸送通道135設置至少一載台,亦或於箱體13外部設置至少一載台,載台可載送待測之射頻電子元件或已測之射頻電子元件,或載送待測之射頻電子元件及已測之射頻電子元件;於本實施例中,係於二輸送通道135設置二作Y方向位移之載台136,以供載送射頻電子元件61;電性測試器21係裝配於移載臂72,而由移載臂72帶動作X-Z方向位移,電性測試器21設有電性連接之電路板211及接合部件212,接合部件212係供電性連接射頻電子元件61;承座11係為架座,並裝配於機台板31,且位於測試室131,承座11之內部設有第一訊號通道111,以供裝配天線測試器12,且供通過無線訊號,承座11於頂部設有相通第一訊號通道111之承接部112,承接部112係供承置射頻電子元件61位於測試工位。Please refer to Figure 9, the fifth embodiment of the
請參閱第10圖,測試工位係位於測試室131,當一載台136承載射頻電子元件61至承座11之側方時,移載臂72依第二測試路徑作X-Z方向位移,令吸嘴721於載台136取出待測之射頻電子元件61,並移入及壓接於承座11之承接部112,由於移載臂72上之電性測試器21的接合部件212已電性連接射頻電子元件61之接點611,當電性測試器21對射頻電子元件61執行電性測試作業時,射頻電子元件61之天線612於0°待測指向發射波束的無線訊號,承座11之第一訊號通道111供通過無線訊號,使得天線測試器12接收無線訊號而執行無線訊號測試作業,並將無線訊號傳輸至中央控制裝置之處理器(圖未示出),以供判別分析射頻電子元件61之品質。Please refer to Figure 10, the test station is located in the
請參閱第11圖,係本發明測試裝置10之第六實施例,以電性測試器21配置於移載臂72而言,測試工位如前所述,可位於測試室、移載臂72或承座11,依不同測試作業需求而定,不受限於本實施例;於本實施例中,該移載臂72係作至少一方向位移,並設有為吸嘴721之作業治具,以供移載射頻電子元件61,另於移載臂72裝配外罩14,移載臂72帶動外罩14及電性測試器21同步作Z方向位移,電性測試器21係設有電性連接之電路板211及接合部件212,接合部件212係供電性連接射頻電子元件61;承座11係裝配於機台板31,並設有第一訊號通道111,以供裝配天線測試器12,且供通過無線訊號,承座11於頂部設有相通第一訊號通道111之承接部112,承接部112係供承置射頻電子元件61;當移載臂72帶動外罩14及電性測試器21同步作Z方向向下位移時,吸嘴721係將射頻電子元件61移入且壓接於承座11之承接部112,外罩14則罩置於機台板31而形成測試室141,測試工位係位於測試室141,使承座11上之射頻電子元件61於測試室141執行電性測試作業及無線訊號測試作業。Please refer to Figure 11, which is the sixth embodiment of the
請參閱第12圖,係本發明測試裝置10之第七實施例,其與第六實施例之差異在於電性測試器21配置於移載臂72,測試工位係位於承座11,並無配置測試室;該承座11係裝配於機台板31,並設有第一訊號通道111,以供裝配天線測試器12,且供通過無線訊號,承座11於頂部設有相通第一訊號通道111之承接部112,承接部112係供承置射頻電子元件61位於測試工位;該電性測試器21係裝配於移載臂72,並設有電性連接之電路板211及接合部件212,接合部件212供電性連接射頻電子元件61;當移載臂72之吸嘴721將射頻電子元件61移入且壓接於承座11之承接部112,使電性測試器21對射頻電子元件61執行電性測試作業,以及使天線測試器12對射頻電子元件61執行無線訊號測試作業
,進而測試射頻電子元件61之品質。Please refer to Figure 12, which is the seventh embodiment of the
請參閱第13圖,本發明測試裝置10之第八實施例,其與第七實施例之差異在於承座15並無承接部,測試工位係位於移載臂72;該承座15係裝配於機台板31,並設有第一訊號通道151,以供裝配天線測試器12,且供通過無線訊號;電性測試器21係裝配於移載臂72,並設有電性連接之電路板211及接合部件212,接合部件212供電性連接射頻電子元件61;移載臂72係以吸嘴721拾取射頻電子元件61,並移載至承座15之上方,令射頻電子元件61之天線612相對於天線測試器12,使電性測試器21對射頻電子元件61執行電性測試作業,以及使天線測試器12對射頻電子元件61執行無線訊號測試作業,進而測試射頻電子元件61之品質。Please refer to Figure 13, the eighth embodiment of the
請參閱第1至3、14圖,本發明測試裝置10之第一實施例應用於測試作業設備之示意圖,包含機台30、供料裝置80、收料裝置90、本發明測試裝置10、輸送裝置100及中央控制裝置(圖未示出);供料裝置80係配置於機台30上,並設有至少一容納待測射頻電子元件之供料承置器81;收料裝置90係配置於機台30上,並設有至少一容納已測射頻電子元件之收料承置器91;本發明之測試裝置10係配置於機台30上,包含天線測試單元及電性測試單元,以對射頻電子元件執行電性測試作業及無線訊號測試作業,於本實施例中,測試裝置10係於機台30之第一側及第二側分別配置有複數個天線測試單元及電性測試單元,天線測試單元係於測試室131配置承座11,承座11供裝配天線測試器12,天線測試器12以供對射頻電子元件執行無線訊號測試作業,電性測試單元係設有電性測試器21,以供對射頻電子元件執行電性測試作業,測試裝置10另於機台30之第一側及第二側分別配置有移料器51,以分別於第一側及第二側之複數個承座11移載待測/已測之射頻電子元件,測試裝置10另於機台30之第一側及第二側分別配置有載台136,以承載待測/已測之射頻電子元件;輸送裝置100係配置於機台30上,並設有至少一輸送器,用以輸送射頻電子元件,於本實施例中
,輸送裝置100係設有作X-Y-Z方向位移之輸送器1001,以於供料裝置80取出待測之射頻電子元件,並移載至測試裝置10之載台136,載台136供移料器51取出待測之射頻電子元件,以及移入已測之射頻電子元件,移料器51將待測之射頻電子元件移載至測試室131,且移入於承座11,使射頻電子元件於測試室131執行電性測試作業及無線訊號測試作業,輸送器1001於載台136取出已測之射頻電子元件,並依測試結果,將已測之射頻電子元件移載至收料裝置90而分類收置;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。Please refer to Figures 1 to 3 and 14, a schematic diagram of the first embodiment of the
10:測試裝置
11、15:承座
111、151:第一訊號通道
112:承接部
12:天線測試器
L:作業軸線
13:箱體
131:測試室
132:輸送通道
133:輸送管
134:門板
135:輸送通道
136:載台
14:外罩
141:測試室
21:電性測試器
211:電路板
212:接合部件
213:測試座
2131:容置部
2132:第二訊號通道
30:機台
31:機台板
41:作動器
42:轉盤
421:載裝部
43:轉軸
51:移料器
61:射頻電子元件
611:接點
612:天線
71、72:移載臂
711:讓位部
712、721:吸嘴
80:供料裝置
81:供料承置器
90:收料裝置
91:收料承置器
100:輸送裝置
1001:輸送器10:
第1圖:本發明測試裝置第一實施例之示意圖。 第2圖:本發明測試裝置第一實施例之使用示意圖(一)。 第3圖:本發明測試裝置第一實施例之使用示意圖(二)。 第4圖:本發明測試裝置第二實施例之示意圖。 第5圖:本發明測試裝置第二實施例之使用示意圖。 第6圖:本發明測試裝置第三實施例之示意圖。 第7圖:本發明測試裝置第三實施例之使用示意圖。 第8圖:本發明測試裝置第四實施例之示意圖。 第9圖:本發明測試裝置第五實施例之示意圖。 第10圖:本發明測試裝置第五實施例之使用示意圖。 第11圖:本發明測試裝置第六實施例之示意圖。 第12圖:本發明測試裝置第七實施例之示意圖。 第13圖:本發明測試裝置第八實施例之示意圖。 第14圖:本發明測試裝置應用於測試作業設備之示意圖。Figure 1: A schematic diagram of the first embodiment of the testing device of the present invention. Figure 2: A schematic diagram of the use of the first embodiment of the testing device of the present invention (1). Figure 3: A schematic diagram of the use of the first embodiment of the testing device of the present invention (2). Figure 4: A schematic diagram of the second embodiment of the testing device of the present invention. Figure 5: A schematic diagram of the use of the second embodiment of the testing device of the present invention. Figure 6: A schematic diagram of the third embodiment of the testing device of the present invention. Figure 7: A schematic diagram of the use of the third embodiment of the testing device of the present invention. Figure 8: A schematic diagram of the fourth embodiment of the testing device of the present invention. Figure 9: A schematic diagram of the fifth embodiment of the testing device of the present invention. Figure 10: A schematic diagram of the use of the fifth embodiment of the testing device of the present invention. Figure 11: A schematic diagram of the sixth embodiment of the testing device of the present invention. Figure 12: A schematic diagram of the seventh embodiment of the testing device of the present invention. Figure 13: A schematic diagram of the eighth embodiment of the testing device of the present invention. Figure 14: A schematic diagram of the testing device of the present invention applied to testing equipment.
10:測試裝置10: Test device
11:承座11: Socket
111:第一訊號通道111: The first signal channel
112:承接部112: Acceptance Department
12:天線測試器12: Antenna tester
L:作業軸線L: work axis
13:箱體13: cabinet
131:測試室131: Test Room
132:輸送通道132: Conveying Channel
133:輸送管133: Conveying Pipe
134:門板134: Door Panel
21:電性測試器21: Electrical tester
211:電路板211: Circuit Board
212:接合部件212: Joining Parts
31:機台板31: machine board
41:作動器41: Actuator
Claims (18)
Priority Applications (1)
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TW108144572A TWI741435B (en) | 2019-12-05 | 2019-12-05 | Radio frequency electronic component test device and test operation equipment for its application |
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TW202122809A true TW202122809A (en) | 2021-06-16 |
TWI741435B TWI741435B (en) | 2021-10-01 |
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Cited By (1)
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TWI804309B (en) * | 2022-05-11 | 2023-06-01 | 量崴科技股份有限公司 | Antenna test system |
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US11536760B2 (en) * | 2017-11-28 | 2022-12-27 | Ase Test, Inc. | Testing device, testing system, and testing method |
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TWI804309B (en) * | 2022-05-11 | 2023-06-01 | 量崴科技股份有限公司 | Antenna test system |
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