TW202105643A - 高熱通量多元件總成之熱管理 - Google Patents
高熱通量多元件總成之熱管理 Download PDFInfo
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Abstract
本發明提供一種電子封裝,其包括用於自電子元件陣列散熱之熱界面,該電子元件陣列包括緊固至基板之複數個電子元件。熱界面包括用於沿橫向於熱通量之方向傳遞來自電子元件之熱輸入的薄熱分散層。熱分散層為層壓結構之部分,其藉由將熱能分散於整個輸入平面上而得以有效地利用。
Description
本發明大體上係關於電子器件之熱管理,且更特定言之,係關於用於將熱能自電子元件陣列高效傳輸至散熱器之熱界面構造。
熱界面廣泛用於需要將過量熱能自一個位置傳遞至另一位置之散熱應用中。通常以用高效且機械上適用之方式容納所需熱傳遞的方式將熱界面定位於此類部位之間。此類熱界面之實例應用包括電子工業,其中必須冷卻電子元件以便維持最小臨限效能特徵。通常,藉由將電子器件熱耦接至通常具有相對較高熱耗散容量之散熱器(諸如散熱片)而使熱量傳遞離開產熱電子器件。熱耗散特徵包括適當材料、組態及曝露於冷卻介質。
產熱元件(諸如電子元件)與散熱器之熱耦接可藉由熱界面材料及結構促進。例如,歸因於產熱元件附近之相對外部幾何形狀、材料及特定限制,產熱之電子元件與散熱片之間的直接物理耦接可為困難的。因此,熱界面可充當產熱元件與散熱片之間的物理連接機構而不對熱傳遞產生顯著阻礙。因為熱傳遞在熱障壁處可能受到顯著阻礙,在熱障壁處熱能必須穿過具有相對低熱導率之介質,所以熱界面可藉由將熱障壁之存在降至最低來增加將熱傳遞至散熱片之效率。可使熱界面為可撓性的以與表面不規則性「適型」,藉此將可能以其他方式起作用以阻礙熱傳遞之空隙減至最少。
隨著微電子之小型化及功率增加,熱耗散對各種電子器件之效能、可靠性及進一步小型化變得至關重要。積體電路(「IC」)表示可能需要散熱以可靠地執行之實例產熱電子元件。IC通常藉由將其物理且電耦接至基板(諸如電路板,或更特定言之,印刷電路板(「PCB」))而組裝成封裝。緊固至基板之IC及/或其他電子元件之陣列形成電子總成。對體積減小之電子總成之效能增加的需要導致每單位面積之產熱增加。因此,改良之熱管理解決方案為解決增加之熱傳遞需求所必需。
熱耦接至熱界面之產熱元件構成經由熱阻抗最低之路徑發射熱能之熱源。在(例如)其中熱產生器元件熱耦接至均一熱界面之應用中,熱能通常沿錐形或柱狀模式耗散至散熱片。在散熱片實質上比熱界面更具導熱性之情況下,來自熱源之熱耗散遵循到達散熱片之熱阻抗最低的路徑。在均一熱界面之情況下,此類路徑為熱源與散熱片之間穿過熱界面之最短距離的路徑。此現象已引起研發出具有異向性熱導率之熱界面,其中經由厚度(「z」)方向(熱源與散熱片之間的最短路徑)之熱導率具有經調適以促進沿此類「z」方向之熱傳遞的專門設計之構造。此類熱界面之實例包括定向石墨墊,其中石墨纖維平行於「z」軸穿過熱界面之厚度定向。經由此類配置,熱界面展現沿「z」軸優先之熱傳遞。儘管已證實沿z軸方向具有高熱導率值之異向性熱界面適用於傳導熱能,但若干缺點妨礙其普遍接受。例如,定向纖維熱界面傾向於為昂貴的。另外,某些應用需要電子封裝在製造期間沿z軸壓縮,該壓縮可能損壞定向纖維且使總體熱導率劣化。
某些習知高熱導率界面(包括異向性熱界面之許多變體)展現不足以視為非導體之電阻率。許多應用需要使連接之電子元件電隔離,其中此類高熱導率界面不適合。
因此,一個目標為提供一種穿過其厚度為非導體之熱界面。
另一目標為提供一種在厚度壓縮之後維持高效熱導率的熱界面。
另一目標為提供一種有成本效益之熱界面,其能夠同時耗散來自產熱電子元件之陣列之熱能。
再另一目標為提供一種利用熱界面以高效耗散來自複數個間隔開電子元件之陣列之熱能的電子封裝。
藉助於本發明,由複數個電子元件之陣列產生的過量熱能可高效地耗散至散熱器。詳言之,本發明提供一種藉由沿x軸及y軸分散來自熱源之熱能來增強沿平行於厚度軸線之方向之總體熱導率的熱界面。熱界面利用熱分散層,其經組態以高效地沿x軸及y軸傳導熱以便增加熱界面用於沿z軸將熱傳遞至散熱器的體積利用率。
在一實例實施例中,本發明之電子封裝包括基板及電子元件陣列,該電子元件陣列包括緊固至基板之複數個離散間隔開之電子元件。電子封裝進一步包括散熱器及位於處於電子元件陣列與散熱器之間的熱路徑中之熱界面。熱界面包括熱分散層及順應層以及沿厚度軸線穿過該熱分散層及該順應層界定之厚度。該熱分散層小於厚度之20%且展現第一熱導率。該順應層展現實質上小於該第一熱導率之第二熱導率及介於104
Pa-106
Pa之間的壓縮模數。
在另一實施例中,本發明之電子封裝包括基板及電子元件陣列,該電子元件陣列包括緊固至基板之複數個離散間隔開之電子元件。電子封裝進一步包括熱界面,其包括熱分散層及順應層以及沿厚度軸線穿過該熱分散層及該順應層界定之厚度。該熱分散層小於厚度之20%且展現第一熱導率。該順應層展現實質上小於該第一熱導率之第二熱導率及介於104
Pa-106
Pa之間的壓縮模數。熱分散層熱連接至電子元件陣列,且散熱器熱連接至熱界面之順應層。
本發明之用於製備電子封裝之方法包括提供具有熱分散層及順應層以及沿厚度軸線穿過該熱分散層及該順應層界定之厚度的熱界面。該熱界面展現初始熱導率。熱界面之熱分散層小於厚度之20%且展現至少100 W/m*K之熱導率。順應層展現介於104
Pa-106
Pa之間的壓縮模數。將熱界面貼附於處於散熱器與緊固至基板之複數個電子元件之電子元件陣列之間的熱路徑中。熱界面沿厚度軸線壓縮以減小厚度,使得厚度減小高達50%之熱界面展現的經壓縮熱導率為初始熱導率之至少80%。熱界面之壓縮可包括將基板及散熱器中之至少一者朝向基板及散熱器中之另一者移動。
現將以參考隨附圖式所描述之詳細實施例形式呈現上文所列舉之目標及優點以及由本發明表示之其他目標、特徵及發展。將本發明之其他實施例及態樣識別為在一般熟習此項技術者之掌握內。
出於描述本發明之設備的目的,術語「向上」、「向下」、「水平」、「垂直」、「以上」、「以下」、「近端」、「遠端」或類似相關術語可在本文中用於描述設備之元件部分及其相對位置。此類術語參考隨附圖式出於方便起見而使用,但不應解釋為限制本發明之範疇。
現參看圖式,且首先參看圖1,電子封裝10包括基板12及電子元件陣列14,該電子元件陣列包括緊固至基板12之複數個電子元件16。電子封裝10進一步包括散熱器18及位於處於電子元件陣列14與散熱器18之間的熱路徑(由虛線箭頭22指示)中的熱界面20。電子封裝10經配置以藉由提供自電子元件陣列14至與散熱器18接觸之熱吸收流體介質24之熱傳導路徑來耗散由電子元件16產生之熱能。在典型應用中,流體介質24可為由空氣驅動機推動以吸收來自散熱器18之熱能的氣體,諸如空氣。電子封裝10為實例配置,其可適當地修改以適應各種電子應用,諸如資料處理器、資料記憶體、通訊板、天線及其類似者。此類器件可用於計算裝置、通信裝置及其周邊配置中。在一特定實例實施例中,電子封裝10可用以支援蜂巢式通信裝置中之各種功能。
除了作為電子元件陣列14之支撐以外,基板12亦可提供多種功能中之一或多者。出於簡單描述本發明之電子封裝10之目的,基板12可為電路板,諸如在安裝表面13上具有導電跡線之印刷電路板,該等導電跡線用於視需要在總成中電連接電子元件16。元件16可經由焊接或其他已知技術電連接至佈線跡線。在操作中,電子元件16產生必須耗散以便維持最佳效能之顯著過量熱能。電子元件16可為適用於電子製程之多種元件中之任一者,且可包括例如積體電路、電阻器、電晶體、電容器、電感器及二極體。
熱界面20大體上沿熱路徑22提供處於電子元件陣列14及散熱器18之間的導熱橋。散熱器18可以最高效地將熱能傳輸至散熱器18之方式熱耦接至熱界面20。如示意性地說明,散熱器18可具有併有相對高表面積之組態,諸如貫穿鰭28。散熱器之使用已為人充分理解,且預期可在本發明之配置中利用習知及自訂設計。
用於熱界面之習知方法包括均一且順應之導熱物質,諸如膏體或凝膠。另一實例界面包括定向之纖維器件,其具有實質上平行於熱路徑22定向之導熱纖維。如上文所述,此類解決方案對於某些應用可能不充分。已研發出熱界面20以最高效地利用界面之順應導熱體積以使熱容量最大化。為此,熱界面20包括用於在傳輸至順應層32之前將自電子元件16接收之熱能分散於整個較寬區域上的熱分散層30。藉由本發明配置促進之熱傳遞更充分地利用熱界面20之總傳導容量,當與複數個間隔開之熱源(諸如電子元件16)結合使用時,該總傳導容量相應地增加熱界面20之總體熱導率效能。
熱界面20可為包括熱分散層30及順應層32之多層複合物。熱界面20具有沿厚度軸線34穿過熱分散層30及順應層32界定之厚度「T」。熱分散層30具有小於厚度T之20%、較佳小於T之15%且更佳小於厚度T之10%的厚度「T1
」。在一些實施例中,分散層30之厚度T1
可在熱界面20之厚度T的5-10%之間。
與熱界面20之總厚度T相比,熱分散層30相對較薄,以促進實質上沿「x」軸及「y」軸之熱能分佈,如圖2及圖3中所說明。熱分散層30較佳地展現實質上大於順應層32之第二熱導率「C2
」的第一熱導率「C1
」。因為熱能沿最小電阻之路徑傳遞,所以由熱界面20在熱分散層30處接收到之熱能在傳遞穿過順應層32之前將主要在整個熱分散層30中傳遞。此「最小電阻之路徑」作用使得來自電子元件陣列14之離散電子元件16之熱輸入在穿過z軸傳遞之前主要沿x軸及y軸兩者分散在整個熱分散層30中。以此方式,熱能實質上傳遞至順應層32中,遍及在順應層32之第一表面33處所表示之界面區域,且其後遍及順應層32之實質上整個體積。此方法使順應層32之熱導容量最大化。在於熱界面20處不存在熱分散層30之情況下,如習知膏體及凝膠中,來自離散熱源點之熱輸入通常未在整個熱界面體積中傳遞,且反而沿厚度軸線在更多直接路徑中傳遞至散熱器。
為實現熱分散特徵,熱分散層30較佳地展現至少100 W/m*K,且更佳地至少400 W/m*K之第一熱導率C1
。在一些實施例中,第一熱導率C1
可在100-1500 W/m*K之間,且更佳地在400-1000 W/m*K之間。出於本發明之目的,藉由ASTM D5470測定層或結構之熱導率。熱分散層30之熱導率可在三個維度中實質上相等,或可具有異向性,其中實質上沿x軸及y軸之熱傳遞優先。換言之,在圖2及圖3中所說明之定向中,穿過熱分散層30之熱傳遞較佳沿所有三個軸線(x、y、z)實質上相等,或展現沿z軸及y軸之熱傳遞比沿z軸之熱傳遞優先。為了達到沿x軸及y軸熱分散的目的,使用沿z軸傳遞熱優先於沿x軸及y軸之熱傳遞的異向性熱分散層30將為不合需要的。適用於熱分散層30之實例材料包括銅、鋁、石墨及氮化硼。然而,預期其他高度導熱材料適用於本發明之熱分散層30。
為促進沿熱界面20之x軸及y軸的熱傳遞,與熱界面20之總厚度T相比,熱分散層30較佳沿厚度軸線34相對較薄。由於熱分散層30與順應層32相比熱導率實質上較大,故相對較薄之熱分散層30更高效地引導沿x軸及y軸之熱傳遞。然而,申請人已發現,較佳在沿x軸及y軸驅動熱傳遞與在熱分散層30中提供足夠熱容量以容納來自電子元件陣列14之熱能輸入而不會過早地將熱傳遞至順應層32之間達到平衡。因此,至少在一些實施例中,較佳維持用於熱分散層30之最小厚度臨限值來以不「過載」熱分散層30之總熱容量之方式容納熱能輸入,該「過載」可能導致自離散熱源穿過厚度軸線34之直接熱傳遞更多。因此,需要熱分散層厚度T1
可表示熱界面20之總厚度T之至少5%,且更佳地介於厚度T之5-20%之間。在一些實施例中,熱分散層厚度T1
可在25-125微米之間。
順應層32較佳至少沿z軸導熱,且較佳為適型材料以使與散熱器18之熱接觸最大化。順應層32可由多種材料形成,該等材料可單獨或組合使用以產生適型且導熱之物質。較佳地,順應層32至少在室溫下自我支撐,其中順應層32之所界定三維形狀至少在室溫下且在不施加外力之情況下自我維持。用於順應層32之實例材料包括微晶蠟或基於聚矽氧之聚合物,包括聚矽氧蠟、聚矽氧脂膏及聚矽氧凝膠。適用於順應層32之調配物之實例包括美國專利第5,950,066號及第6,197,859號中所描述之調配物,該等專利之內容以引用之方式併入本文中。在一些實施例中,順應層32可包括熔點介於約40℃-80℃之間範圍內的相變材料。
順應層32可進一步包括分散於其中之導熱微粒物質以增強熱導率。可利用多種導熱微粒物質來幫助順應層32之熱導率,包括例如氧化鋁、氮化鋁、氮化硼、石墨、碳化矽、金剛石、金屬粉末、陶瓷粒子、碳纖維及奈米管、金屬合金及其組合。高達約200微米之粒度為典型的。微粒填充劑材料可以介於約10重量%與95重量%之間的濃度提供於順應層32中。微粒填充劑之負載量可影響順應層32之總體壓縮模數。因此,需要在室溫下維持不大於約106
Pa且較佳在104
-106
Pa之間的壓縮模數。出於此處之目的,術語「壓縮模數」由測試程序ASTM D575定義。
順應層32可展現實質上小於熱分散層熱導率C1
之熱導率C2
。儘管在熱界面中需要低熱阻抗性/高熱導率,但使熱界面主體自身之熱導率最大化可能以適型性為代價。申請人認識到,在控管熱界面材料之有效性方面,適型性可甚至比熱界面材料內之熱導率更重要。因此,通常在熱界面之熱導率與熱界面之適型性之間達到平衡。本發明之設備藉由在順應層32中維持適型性(如由其壓縮模數表示)而達到此平衡。適型之熱界面材料的熱導率範圍可變化,但通常小於20 W/m*K。因此,順應層32較佳地展現至少沿z軸介於1-15 W/m*K之間的熱導率。在一些較佳實施例中,至少沿z軸之順應層32之熱導率在5-12 W/m*K之間。應理解,在順應層32及/或熱分散層30內之各個點處之局部熱導率值可小於上文所描述之值。然而,至少沿z軸之淨熱導率較佳如上文所描述。
順應層32可經形成而具有厚度尺寸T2
,該厚度尺寸T2
可與熱分散層30形成熱界面20之厚度T的平衡。然而,預期除了熱分散層30及順應層32之外的層可存在於熱界面20中。在一些實例實施例中,順應層32之厚度T2
可在0.25-2.5 mm之間,且更佳地在0.5-1 mm之間。
在一些實施例中,黏著材料40可用於將熱分散層30緊固至電子元件陣列14。如圖4中所說明,可將諸如壓敏黏著劑之黏著材料40塗覆至熱分散層30以將熱分散層30緊固至電子元件陣列14之一或多個電子元件16上。黏著材料40可以層或離散平面(land)形式提供,以用於緊固至陣列14之一或多個電子元件16。黏著材料40可為導熱的,其具有至少約0.5 W/m*K的熱導率。適用之黏著材料之實例包括可購自Henkel Corporation, Irvine, CA之Bond PlyTM
及LiquiBondTM
導熱黏著劑。
熱界面20較佳可沿厚度軸線34穿過厚度T電絕緣。熱界面20優於習知高度導熱界面之優勢為熱界面20在需要電隔離之應用中之適用性。一些習知高度導熱界面依賴於將電阻抗減小至喪失電隔離特性之程度的結構及組成。高度導熱界面之實例習知方法使用定向石墨,其穿過界面之厚度定向以促進沿z軸之熱導率。然而,在此情況下,定向石墨穿過熱界面形成導電路徑。某些應用並不適用於低電阻熱界面。順應層32較佳為非導體,從而使得熱界面20沿厚度軸線34穿過厚度T展現至少108
Ω*cm之電阻率。熱界面20可更佳地沿厚度軸線34穿過厚度T展現至少1010
Ω*cm之電阻率。
預期可經由多種方法中之一者將熱分散層30組裝至順應層32,該等方法包括例如氣相沈積、電漿聚合、噴塗、濺鍍及其類似者。展現熱界面製造之實例方法步驟之流程圖闡述於圖5中。詳言之,用於熱分散層30之材料以預定厚度沈積於離型襯墊上以便形成經塗佈之基板。在一些實施例中,材料可塗覆至基板達到介於約25-125微米之間的預定厚度。離型襯墊為此項技術中所熟知,且預期能夠相對容易地自熱分散層30移除之習知離型襯墊可用於熱界面製程中。適用於接收所沈積之熱分散層30且隨後自所述熱分散層移除之實例離型襯墊為聚對苯二甲酸伸乙酯(PET)。
經塗佈之基板隨後以以下定向置放於壓光操作中,其中離型襯墊與壓光輥接觸,且熱分散層30材料曝露以用於與順應層32對齊。熱分散層30與順應層32之對齊使得熱分散層30以大於熱分散層30與其相應離型襯墊基板之間的耦接之強度黏著於順應層32。因此,隨後自熱分散層30移除基板,同時熱分散層30保持與順應層32接觸。可接著將個別熱界面模切為所需尺寸。
本發明之一個態樣為熱界面20在沿厚度軸線34壓縮之後如何幾乎不損失其熱導率效能。某些熱界面之熱導率效能在壓縮後顯著劣化。此可能因為例如達成熱導率效能所依賴之定向纖維的破壞。本發明之熱界面20之構造准許沿厚度軸線34壓縮而不會使其熱效能實質上劣化。
圖6說明相比於本發明之0.08吋標稱10 W/m*K熱界面,具有0.07吋之初始厚度的標稱20 W/m*K定向石墨熱界面在沿相應厚度軸線進行漸進性壓縮時的熱效能之比較。詳言之,圖6之比較數據展示定向石墨界面在壓縮後熱導率顯著降低,而本發明配置之熱導率即使在顯著壓縮後仍幾乎不受影響。在較佳實施例中,厚度減小高達50%之熱界面20展現的經壓縮熱導率為其初始熱導率之至少80%。如圖6中所說明,標稱10 W/m*K熱界面之熱導率在沿其厚度軸線壓縮50%之後降低小於20%。
圖7A及圖7B說明用於製備本發明之電子封裝的方法,其中熱界面20貼附於處於散熱器18與緊固至基板12之複數個電子元件16之電子元件陣列14之間的熱路徑22中。藉由將力如藉由力向量F1
、F2
所描繪地施加至散熱器18及基板12中之一者或兩者,熱界面20沿厚度軸線34壓縮。習知壓縮機構可用以按所需程度壓縮電子封裝10。在一些實施例中,電子封裝10可沿厚度軸線34壓縮至一定程度以使得熱界面20之厚度T減小至多50%。圖7B說明壓縮製程之後的電子封裝10。與熱界面20相比,散熱器18、電子元件陣列14及基板12中之每一者相對不可壓縮。在一些實施例中,與順應層32相比,熱界面20之熱分散層30相對不可壓縮。在此類實施例中,施加至電子封裝10之壓縮力F1
、F2
可主要僅壓縮熱界面20之順應層32。在圖7A及圖7B中所說明之實例中,熱界面20之初始厚度Ti
可減小至多約50%,其中最終厚度Tf
可藉由以下關係表示:
Tf
= 0.5 ≤ Ti
≤ 1.0
如上文所描述,申請人已發現,熱界面20可如此壓縮且仍實質上維持其熱導率效能。此類特徵在組裝期間需要壓縮或利用壓縮之應用中為重要的。
本發明已在本文中相當詳細地進行描述,以便為熟習此項技術者提供應用新穎原理及根據需要建構及使用本發明之實施例所需之資訊。然而,應理解,可在不脫離本發明自身之範疇的情況下實現各種修改。
10:電子封裝
12:基板
13:安裝表面
14:電子元件陣列
16:電子元件
18:散熱器
20:熱界面
22:熱路徑
24:熱吸收流體介質
28:貫穿鰭
30:熱分散層
32:順應層
33:第一表面
34:厚度軸線
40:黏著材料
F1:力向量
F2:力向量
T:熱界面之厚度
T1:熱分散層之厚度
T2:順應層之厚度
Ti:熱界面之初始厚度
Tf:熱界面之最終厚度
x:軸線
y:軸線
z:軸線
圖1為本發明之電子封裝的橫截面圖;
圖2為本發明之電子封裝之熱界面部分的橫截面圖;
圖3為本發明之電子封裝之熱界面部分的立體圖;
圖4為本發明之電子封裝之一部分的橫截面圖;
圖5為描述用於製造本發明之電子封裝之熱界面部分之方法的流程圖;
圖6為比較熱導率圖;
圖7A為本發明之電子封裝在壓縮力下的橫截面圖;及
圖7B為本發明之電子封裝在壓縮之後的橫截面圖。
10:電子封裝
12:基板
13:安裝表面
14:電子元件陣列
16:電子元件
18:散熱器
20:熱界面
22:熱路徑
24:熱吸收流體介質
28:貫穿鰭
30:熱分散層
32:順應層
33:第一表面
Claims (20)
- 一種電子封裝,其包含: 基板; 電子元件陣列,該電子元件陣列包括緊固至該基板之複數個離散間隔開之電子元件; 散熱器;及 位於處於該電子元件陣列與該散熱器之間的熱路徑中之熱界面,該熱界面包括熱分散層及順應層以及沿厚度軸線穿過該熱分散層及該順應層界定之厚度,其中該熱分散層小於該厚度之20%且展現第一熱導率,且該順應層展現實質上小於該第一熱導率之第二熱導率及介於104 Pa-106 Pa之間的壓縮模數。
- 如請求項1之電子封裝,其中該第一熱導率為至少100 W/m*K,且該第二熱導率在1-15 W/m*K之間。
- 如請求項2之電子封裝,其中該熱界面沿該厚度軸線穿過該厚度展現至少108 Ω*cm之電阻率。
- 如請求項1之電子封裝,其中該熱界面緊固至該散熱器及該電子元件陣列中之至少一者。
- 如請求項4之電子封裝,其包括用於將該熱分散層緊固至該電子元件陣列之複數個該等電子元件的黏著材料。
- 如請求項5之電子封裝,其中該黏著材料包括壓敏黏著劑。
- 如請求項1之電子封裝,其中該基板為電路板。
- 如請求項1之電子封裝,其中該等電子元件包括積體電路、電阻器、電晶體、電容器、電感器及二極體中之一或多者。
- 如請求項1之電子封裝,其中該熱分散層係選自由銅、鋁、石墨及氮化硼組成之群。
- 如請求項1之電子封裝,其中該熱分散層沿該厚度軸線在25-125 µm之間。
- 如請求項1之電子封裝,其中該順應層包括分散於聚矽氧聚合物基質中之微粒填充劑。
- 如請求項1之電子封裝,其中該厚度軸線平行於該熱路徑。
- 一種用於製備電子封裝之方法,該方法包含: a. 提供熱界面,該熱界面具有熱分散層及順應層以及沿厚度軸線穿過該熱分散層及該順應層界定之厚度,其中該熱界面展現初始熱導率,且其中該熱分散層小於該厚度之20%且展現至少100 W/m*K之熱導率,且該順應層展現介於104 Pa-106 Pa之間的壓縮模數; b. 將該熱界面貼附於處於散熱器與緊固至基板之複數個電子元件之電子元件陣列之間的熱路徑中;及 c. 沿該厚度軸線壓縮該熱界面以減小該厚度,其中厚度減小高達50%之該熱界面展現的經壓縮熱導率為該初始熱導率之至少80%。
- 如請求項13之方法,其中該熱界面之該順應層展現介於1-15 W/m*K之間的熱導率。
- 如請求項13之方法,其中該厚度軸線平行於該熱路徑。
- 如請求項13之方法,其中該熱界面沿該厚度軸線穿過該厚度展現至少108 Ω*cm之電阻率。
- 如請求項13之方法,其中壓縮包括將該基板及該散熱器中之至少一者朝向該基板及該散熱器中之另一者移動。
- 一種電子封裝,其包含: 基板; 電子元件陣列,該電子元件陣列包括緊固至該基板之複數個離散間隔開之電子元件; 熱界面,該熱界面包括熱分散層及順應層以及沿厚度軸線穿過該熱分散層及該順應層界定之厚度,其中該熱分散層小於該厚度之20%且展現第一熱導率,且該順應層展現實質上小於該第一熱導率之第二熱導率及介於104 Pa-106 Pa之間的壓縮模數,其中該熱分散層熱連接至該電子元件陣列;及 散熱器,該散熱器熱連接至該熱界面之該順應層。
- 如請求項18之電子封裝,其中該第一熱導率為至少100 W/m*k,且該第二熱導率在1-15 W/m*K之間。
- 如請求項19之電子封裝,其中該熱界面沿該厚度軸線穿過該厚度展現至少108 Ω*cm之電阻率。
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JP (1) | JP2022541611A (zh) |
KR (1) | KR20220035046A (zh) |
CN (1) | CN114144877A (zh) |
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US6597575B1 (en) * | 2002-01-04 | 2003-07-22 | Intel Corporation | Electronic packages having good reliability comprising low modulus thermal interface materials |
US7215551B2 (en) * | 2004-09-29 | 2007-05-08 | Super Talent Electronics, Inc. | Memory module assembly including heat sink attached to integrated circuits by adhesive |
US8076773B2 (en) * | 2007-12-26 | 2011-12-13 | The Bergquist Company | Thermal interface with non-tacky surface |
JP5243975B2 (ja) * | 2008-02-04 | 2013-07-24 | 新光電気工業株式会社 | 熱伝導部材を有する半導体パッケージ放熱用部品及びその製造方法 |
US8987876B2 (en) * | 2013-03-14 | 2015-03-24 | General Electric Company | Power overlay structure and method of making same |
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US10763188B2 (en) * | 2015-12-23 | 2020-09-01 | Intel Corporation | Integrated heat spreader having electromagnetically-formed features |
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US10319609B2 (en) * | 2017-06-21 | 2019-06-11 | International Business Machines Corporation | Adhesive-bonded thermal interface structures |
US11094608B2 (en) * | 2018-06-29 | 2021-08-17 | Taiwan Semiconductor Manufacturing Co., Ltd. | Heat dissipation structure including stacked chips surrounded by thermal interface material rings |
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