TW202013836A - Contact pin and socket for electrical component - Google Patents

Abstract

The present invention comprises a conductive barrel 32, a plunger 31 including a board-side small-diameter part 31a that is provided on one end side to bring a connection part 9 of the wiring board P into connection by abutting against the inner wall surface of the conductive barrel, and a terminal-side large-diameter portion 31b that is provided on the other end part side and has a tip portion 31c contacting with a part of the terminal 4a of an electrical component 4; and a spring 33 that is contracted by means of pressing such that one end 33a abuts on the base portion 31d of the terminal-side large-diameter portion, and the other end 33b abuts on the opening periphery of the conductive barrel. Under the state of being pressed, the position where the tip portion contacts the part of the terminal and the position where one end abuts the base portion are located on the diagonal line of the terminal-side large-diameter portion that a rotational force is applied, in which the rotational force is caused from a force of that the terminal pushes the tip portion and a force of that the spring pushes back the base portion. Thereby, it is possible to prevent insulation of conductive path for forming the electrical connection without adopting a special structure.

Description

Contact pin and socket for electronic parts

The present invention relates to contact pins of sockets for electronic parts that can be used in performance tests of electronic components such as IC packages, etc.; in particular, to contact pins that can prevent the formation of an electrical path of an electrical connection and to provide it Socket for electronic parts.

When inspecting an inspection object such as a semiconductor integrated circuit, in order to electrically connect the inspection object and the inspection substrate on the measuring device side, contact pins are generally used (for example, refer to Japanese Patent Laid-Open No. 2010-256251). In addition, contact pins are sometimes called "contact probes".

Patent Document 1 discloses a first plunger for connection with an inspection object, a second plunger for connection with an inspection substrate, and a mutual connection between the first and second plungers The contact leg of the spring with potential energy added in the direction of separation; the contact between the first plunger and the second plunger is formed as follows: the columnar part of the other plunger is slidably fitted into the one plunger The structure formed by the inner periphery of the cylindrical portion; furthermore, the column portion has an elastic deformation portion which is in contact with the inner peripheral surface of the cylindrical portion due to the reaction force of the elastic deformation.

However, when the contact leg as described above is used, since the elastic deformation portion is formed into a special shape, the contact area with the inner peripheral surface of the cylindrical portion may be limited.

Therefore, the object of the present invention is to deal with such problems, to provide a contact pin that can prevent the formation of an electrically connected electrical path without having to use a special shape such as the above-mentioned elastic deformation portion, and has Its socket for electronic parts.

In order to solve the above-mentioned problems, the contact pin of the present invention (the invention related to claim 1 of the present case) is a contact pin for electrically connecting an electronic component and a wiring board, which is provided with: one end is open and formed into a cylindrical conductive A conductive barrel cavity; including: an opening provided in one end portion side and inserted into the conductive barrel cavity, and a substrate side connected to the connection portion of the wiring board via contact with the inner wall surface of the conductive barrel cavity The small diameter portion, and the plunger provided on the other end portion side and having the terminal side large diameter portion in contact with one of the terminals of the electronic component terminal; and one end portion is in contact with the terminal side large diameter portion The base part of the abuts, and the other end is a spring that abuts the periphery of the opening of the conductive barrel cavity and contracts by pressing the electronic component. In the state where the electronic component is pressed, the front end of the large-diameter portion of the terminal side of the plunger is a position in contact with a part of the terminal of the electronic component, and one end of the spring is larger than the terminal side The position where the base portion of the diameter portion abuts is located on the side of the terminal-side large-diameter portion of the rotational force caused by the force of the terminal pushing the front end portion and the force of pushing the base portion against the spring Corner line.

In addition, the contact pin of the present invention (the invention related to claim 2 of the present case) is a contact pin for electrically connecting an electronic component and a wiring board; it includes: a conductive barrel formed at both ends with openings and formed into a cylindrical shape Cavity; prevent both ends of the conductive barrel cavity from being partially inserted into it, the terminal-side plunger in contact with the terminal of the electronic component, and the substrate-side plunger in contact with the connection portion of the wiring substrate to conduct; And a spring in the conductive barrel cavity that adds potential energy to the direction separating the terminal-side plunger and the substrate-side plunger, and is compressed by pressing the electronic component. The terminal-side plunger includes a terminal-side small part that engages with the inner wall surface of the conductive barrel cavity in a state of being inserted into the conductive barrel cavity and abuts one end of the spring with a base portion The diameter portion and the terminal-side large-diameter portion provided in a state of protruding from the conductive barrel and having a tip portion in contact with one of the terminals of the electronic component. In a state where the electronic component is pressed, the front end of the terminal side plunger of the terminal side plunger is a position in contact with a part of the terminal of the electronic component, and one end of the spring is in contact with the above The position where the base portion of the terminal-side small-diameter portion of the terminal-side plunger abuts is at the above-mentioned rotational force caused by the force of the terminal pushing the front end portion and the spring pushing the root portion back The diagonal of the plunger on the terminal side.

Furthermore, the socket for electronic parts of the present invention (the invention related to claim 7 of the present case) is a frame having a housing portion provided with an electronic part that can be electrically connected to a wiring board, and in the frame, A plurality of insertion holes that can be inserted into the support plate provided below the receiving portion, respectively, for an electronic component socket for electrically connecting the terminals of the electronic component and the plurality of contact pins of the connection portion of the wiring board, wherein the contact The foot is a contact foot described in the means for solving the above-mentioned problem.

According to the contact pin of the present invention (the invention related to claim 1 of the present case), in the state where the electronic component is pressed, the front end of the large-diameter portion of the terminal side of the plunger is in contact with a part of the terminal of the electronic component The position where the one end of the spring is in contact with the base portion of the large-diameter portion on the terminal side is located at: due to the force of the terminal pushing the front end portion and the force of the spring pushing the base portion The above-mentioned terminal-side large-diameter portion that generates rotational force is on a diagonal line. Therefore, the contact leg can press the side portion of the substrate-side small-diameter portion against the inner wall surface of the conductive barrel with a pressing force of a moment due to the rotational force. Therefore, it is not necessary to adopt a special shape such as the elastic deformation portion of the conventional example, and current does not flow to the spring, and it is possible to achieve the insulation prevention of the electrical connection path forming the electrical connection.

Also, according to the contact pin of the present invention (the invention related to claim 2 of the present case), in a state where the electronic component is pressed, the front end portion of the terminal-side large-diameter portion of the terminal-side plunger is in contact with the electronic component The position where a part of the terminal is in contact, and one end of the spring is the position where the base portion of the terminal-side small-diameter portion of the terminal-side plunger is in contact with: the terminal pushes the tip The diagonal force of the terminal-side plunger generated by the force that pushes against the spring against the force of the base portion. Therefore, the contact leg can press the side portion of the substrate-side plunger against the inner wall surface of the conductive barrel by the pressing force of the force generated by the rotation force. Therefore, it is not necessary to adopt a special shape such as the elastic deformation portion of the conventional example, and it is possible to prevent the formation of an electrical path through the electrical connection without allowing current to flow into the spring.

Furthermore, according to the socket for electronic parts of the present invention (the invention related to claim 7 of the present case), by using the above-mentioned contact foot of the present invention, it is possible not to adopt a special shape such as an elastic deformation portion of the conventional example, and, It is possible to prevent current from flowing into the spring, and it is possible to achieve: insulation prevention of the electrical path forming the electrical connection.

Hereinafter, the embodiment of the present invention will be described based on the drawings.

1 is a plan view showing an embodiment of the socket for electronic parts of the present invention. FIG. 2 is a front view of FIG. 1; FIG. 3 is a cross-sectional view taken along line AA of FIG. The socket 1 for electronic parts can be used for performance testing of electronic parts such as IC packages, etc., and has a frame body 2 and contact pins 3.

The housing 2 is a device for accommodating the electronic components of the test object such as the IC package 4; as shown in FIGS. 2 and 3, it is configured to be disposed on the wiring board P. As shown in FIGS. 1 to 3, the frame body 2 is formed of an insulating material into a rectangular block shape, and for example, is formed as a receiving portion 5 of the IC package 4 at the center of the upper surface. The accommodating portion 5 is used to fix and accommodate the IC package 4 that can be electrically connected to the wiring board P as shown in FIG. 2, and is configured to position the four corners of the IC package 4 with a corner guide or the like.

In the housing 2, as shown in FIG. 3 below the housing section 5, a support plate 6 and a plate 7 are provided. The support plate 6 houses the IC package 4 on the top and is composed of a plate material formed of an insulating material in a flat plate shape; the bottom plate 7 is also formed of a plate material formed of an insulating material in a flat plate shape and is fixed to the support The lower side of the board 6.

On each of the support plate 6 and the bottom plate 7 located below the accommodating portion 5, as shown in FIG. 3, a plurality of insertion holes penetrating the vertical and horizontal graphical cross sections are formed; in these insertion holes, there are respectively The contact pin 3 is inserted in the up-down direction. Thereby, as shown in FIG. 1, for example, a plurality of contact legs 3 are inserted into the entire area of the rectangular-shaped storage portion 5 having a planar distribution. These contact pins 3 are configured to electrically connect the terminals of the IC package 4 and the connection portion of the wiring board P, that is, they are formed as a surface pressure contact type.

In addition, in FIGS. 1 to 3, although the illustration is omitted, in FIG. 2, in a state where the IC package 4 is accommodated in the accommodating portion 5, a socket cover system that covers the upper portion and fixes the IC package 4 It is arranged that the switch can be switched with one end (for example, the right end) as the center of rotation.

Next, the contact pin related to the first embodiment will be described. Fig. 4 is a front view of the contact leg according to the first embodiment. In detail, an enlarged front view of the contact pin 3 used for taking out the socket 1 for electronic parts shown in FIG. 1 is shown. FIG. 5 is a cross-sectional view of the contact foot of FIG. 4. In the first embodiment, first, a description will be given of an application example in which a spring device is used as a contact pin of an external spring method.

The contact pin 3 is used to electrically connect the IC package 4 and the wiring board P. In detail, the contact pin 3 is used to electrically connect the terminal 4 a of the IC package 4 and the pad (connecting portion) 9 of the wiring board P (see FIG. 6 ). The contact leg 3 includes a plunger 31, a conductive barrel 32, and a spring 33. In addition, the terminal 4a is shown in FIG. 18 of the use state mentioned later, for example, the solder ball 8. FIG.

In detail, as shown in FIG. 5, the plunger 31 includes: provided on one end side, inserted into the opening of the conductive barrel 32, and abutting against the inner wall surface of the conductive barrel 32 The small-diameter portion 31a on the substrate side of the connection portion 9 (refer to FIG. 6) that conducts the wiring substrate P; and the other end portion that is provided with a front end that contacts a part of the terminal 4a (refer to FIG. 6) of the IC package 4 The terminal-side large-diameter portion 31b of the portion 31c. The plunger 31 is made of a conductive material such as metal. The terminal-side large-diameter portion 31 b has a front end portion 31 c that is in partial contact with the terminal 4 a of the IC package 4 and a base portion 31 d that is in contact with one end 33 a of the spring 33. The small-diameter portion 31a on the substrate side and the large-diameter portion 31b on the terminal side are connected by a shaft rod portion 31e.

In the conductive barrel 32, a part of the plunger 31 (a region including the substrate-side small-diameter portion 31a) is inserted. The conductive barrel 32 is provided with a push-out opening peripheral portion 32a in contact with the other end 33b of the spring 33.

As shown in FIG. 5, the spring 33 has one end 33 a that is in contact with the base portion 31 d of the terminal-side large-diameter portion 31 b and the other end 33 b that is in contact with the opening peripheral portion 32 a of the conductive barrel 32. It shrinks by the aforementioned pressing force. Specifically, the spring 33 is, for example, a coil spring, and is configured to surround the plunger 31 and add potential energy to the direction separating the base portion 31d of the opening peripheral portion 32a of the conductive barrel 32 and the terminal-side large-diameter portion 31b. Here, the periphery of the plunger 31 refers to an area where the plunger 31 is wound around the spring 33 from one end 33 a of the spring 33 to the other end 33 b of the spring 33.

Next, the function of the contact leg 3 according to the first embodiment will be explained. FIG. 6 is an explanatory diagram showing the relationship between forces generated by pressing from the IC package.

In FIG. 6, with the IC package 4 pressed, the tip 31 c of the terminal-side large-diameter portion 31 b of the plunger 31 is in contact with a part of the terminal 4 a of the IC package 4 and one end of the spring 33 The portion 33a is the position where the base portion 31d of the terminal-side large-diameter portion 31b abuts is the rotation force caused by the force of the terminal 4a pushing the front end portion 31c and the force of the spring 33 pushing the base portion 31d The diagonal of the terminal-side large-diameter portion 31b.

Here, the position where the tip portion 31c contacts a part of the terminal 4a of the IC package 4 functions as a point of action as a force for pushing the tip portion 31c of the terminal 4a of the IC package 4 in a pressed state. Moreover, the position where one end 33a of the spring 33 abuts against the base portion 31d of the terminal-side large-diameter portion 31b is exerted in a state of being pressed as one end 33a of the spring 33 pushes the base portion 31d back The function of the reaction point of the force. In addition, in the following description of the contact leg 3 according to the first embodiment, the position where the tip portion 31c contacts a part of the terminal 4a may be referred to as a "point of action". In addition, the position where one end 33a of the spring 33 abuts on the base portion 31d is sometimes referred to as a "reaction point". Then, the straight line connecting the action point and the reaction point becomes a diagonal line.

Specifically, in FIG 6, via a press charge from the IC package 4, when the terminal 4a is pushed by the front end portion of the force F ₁ 31c, as its reaction, generating one end 33a of a spring 33 pushed by trans The reaction force (-F ₁ ) of the base portion 31d of the terminal-side large-diameter portion 31b (negative sign means reverse). In this case, the action line of action ₁₁ A F and the reaction force (-F ₁₎ A ₂ is a line parallel to the force F. ₁ and the reaction force (-F ₁₎ of equal size, since the generating direction is inversely Two opposing forces, and thus a moment of two forces (even forces). The moment M _{1 of these} two forces is as shown in the following formula when the clockwise rotation is positive. M ₁ = F ₁ × L ₁ … (1)

Here, L ₁ is the distance between the lines of action of the moments of the two forces. Specifically, the sinθ component of the distance (diagonal line) connecting the point of action of the force F _{1 and} the point of reaction of the reaction force (−F ₁ ).

The torque of the two forces, because the force F ₁ + reaction force (-F ₁ ) = 0, although the force that causes the plunger 31 to move in the X direction or the Y direction does not occur, however, a rotating force (moment of a couple force) is generated.

In this embodiment, the front end portion 31c of the terminal-side large-diameter portion 31b of the plunger 31 has a push-out shape that is in contact with a part of the terminal 4a. Therefore, in FIG. 6, the front end portion 31c is used as a fulcrum to rotate clockwise The rotating force is applied to the plunger 31.

On the other hand, with respect to the rotational force of clockwise rotation, since the substrate-side small diameter portion 31a is inserted into the conductive barrel 32, the plunger 31 does not rotate and becomes statically balanced. In this case, the moment M ₂ of the force acting on the substrate-side small-diameter portion 31 a at a distance L ₂ from the fulcrum of the tip portion 31 c is represented by the following formula. M ₂ = F ₂ × L ₂ … (2)

Then, since a static balance is formed, in this case, equation (1) = equation (2) may be the following equation. F ₁ ×L ₁ =F ₂ ×L ₂ ... (3) From the equation (3), the pressing force F ₂ is as shown in the following equation. F ₂ = ((F ₁ ×L ₁ )/L ₂ )...(4)

From equation (4), the larger the distance L ₁ is, the larger the pressing force F ₂ acting on the substrate-side small-diameter portion 31 a becomes. This means that: when Zhi diagonal distance from the distal end portion 31c and the connecting root portion 31d from the greater, the distance L ₁ of Zhi means becomes larger. Therefore, the contact leg 3 can press the side portion of the substrate-side small-diameter portion 31 a against the inner wall surface of the conductive barrel cavity by the pressing force F ₂ .

FIG. 7 is an explanatory diagram showing a comparative example of the relationship of forces in FIG. 6. In the contact leg 30 shown in FIG. 7, compared with the contact leg 3 shown in FIG. 6, one end 33a of the spring 33 is provided on the opposite side in the circumferential direction, and the other end 33b is also provided on the opposite side in the circumferential direction. Next, for convenience of explanation, in the comparative example, although a part of the structure around the opening of the conductive barrel 32 is different from the contact leg 3, however, it does not affect the occurrence of rotational force (torque of the couple force). No impact.

In the comparative example shown in FIG. 7, in a state where the IC package 4 is pressed, the front end portion 31c of the terminal-side large-diameter portion 31b of the plunger 31 is in contact with a part of the terminal 4a, although it is in contact with The legs 3 are the same. However, one end 33a of the spring 33 is a base portion on the opposite side of the base portion 31d where the terminal-side large-diameter portion 31b abuts. In this case, the line of action ₁₁ A F, and the reaction force (-F ₁₎ A ₂ line of action are parallel, the force F ₁ and reaction force (-F ₁₎ of equal size, due to the occurrence direction There are two opposing forces, so a moment of 2 forces (even forces) occurs. However, the distance L3 between the action lines showing the interval between the action line A ₁ and the action line A ₂ is shorter than the distance L ₁ shown in FIG. 6, so it can be understood that the button acting on the substrate-side small diameter portion 31a The holding force F ₂ becomes smaller than in the case of FIG. 6.

Therefore, in a state where the IC package 4 is pressed, the front end portion 31c of the terminal-side large-diameter portion 31b of the plunger 31 is in contact with a part of the terminal 4a, and one end 33a of the spring 33 is in contact with the terminal side location-based root portion of the large diameter portion 31b is configured to abut against the distance L increases Zhi _1, it is ideally positioned on a diagonal line of the large diameter portion 31b of the terminal side. This means that as the value of the distance L ₁ becomes larger, the rotation force caused by the force of the terminal 4a pushing the front end portion 31c and the force of the spring 33 pushing back against the base portion becomes larger. That is, the root portion is ideally at the position of the root portion 31d shown in FIG. 6.

Next, in this embodiment, for example, the spring 33 is pushed to a predetermined design position by pressing from the IC package 4, and in the contracted state, the end 33a of one of the springs 33 and the other end of the spring 33 The end portion 33b is arranged as shown in FIG. 6, and the phase is ideally shifted by 180 degrees. In the configuration shown in FIG. 6, when the phase is shifted by 180 degrees, the value of the distance L ₁ among the moments of the two forces (the moments of the couple forces) becomes the largest (refer to FIG. 6 ). In the present embodiment, the distance L ₁ is a so-called Zhi maximum mean distance between the line of action of the line A ₁ and the spacing between the line of action of A ₂ L Zhi 6 shows the role of _{FIG. 1} in the design of FIG. In terms of the maximum value, hereinafter, the distance L _{1 in} this case is referred to as the “maximum distance”.

Fig. 8 is an explanatory diagram regarding the deviation of the phase deviation of the spring. Fig. 8(a) is a front view of the spring 33 with the contact leg 3 shown in Fig. 4 taken out. 8(b) is a plan view of the spring 33 viewed from the Y ₁ direction. Fig. 8(c) is a plan view of the spring 33 viewed from the Y ₂ direction. In this embodiment, the phase shift of 180 degrees refers to the end 33a of one side of the spring 33 as shown in FIG. 8(b) when viewed from the Y ₁ direction or the Y ₂ direction, as shown in FIG. 8(c). The position shown on the other end 33b is off by 180 degrees.

Furthermore, in this embodiment, as shown in FIG. 6, the push-shaped opening peripheral portion 32 a which is in contact with the other end 33 b of the spring 33 is provided, and the other end 33 b becomes a catching push The structure of the pull-shaped opening peripheral portion 32a. Therefore, in the state where the IC package 4 is pressed, the transmission path of the load of the force that the other end 33b pushes the opening peripheral portion 32a acts on the conductive barrel 32 because it does not act on the plunger 31 Therefore, it will not affect the pressing force F ₂ .

From the above, the contact leg 3 according to the first embodiment is such that the front end portion 31c can be fixed at a position in contact with a part of the terminal 4a, and one end 33a of the spring 33 can contact the base portion 31d The structure of the connected position. In this way, it can be ensured that the torque of the two forces (the moment of the couple force) generated by the action point and the reaction point is stable and strong. That is, the contact leg 3 according to the first embodiment can suppress the variation in the occurrence of a couple force by fixing the distance L ₁ at which the moment of two forces is generated to the maximum distance.

In addition, the contact leg 3 according to the first embodiment is capable of reducing the diameter of the substrate side with the pressing force F ₂ of the moment generated by the rotation force when the distance L ₁ is the maximum distance. The side of the portion 31a is pressed against the inner wall surface of the conductive barrel 32. That is, the contact load on the side portion of the substrate-side small-diameter portion 31a is stable and becomes large. With this, the contact leg 3 according to the first embodiment can eliminate the need for a special shape such as the above-mentioned elastically deformable portion; and it is possible to achieve the prevention of insulation that forms an electrical connection path.

Next, a modification of the first embodiment will be described. In the modification of the first embodiment, the plunger 31 is replaced with the plungers 31A to 31D described below. In addition, the plungers 31A, 31B, and 31D are applied to the spring 38 shown in FIG. 9.

FIG. 9 is an explanatory diagram of the phase deviation variation when the shape of the spring shown in FIG. 8 is partially different. FIG. 9(a) is a front view of the spring 38 that can be applied to the contact leg 3 shown in FIG. 9(b) is a plan view of the spring 38 viewed from the Y ₁ direction. 9(c) is a plan view of the spring 38 viewed from the Y ₂ direction. The difference between the spring 33 and the spring 38 is that one end 38a of the spring 38 shown in FIG. 9(b) has a protrusion in the Y direction. On the other hand, the other end portion 38b of the spring 38 shown in FIG. 9(c) is the same as the other end portion 33b of the spring 33 shown in FIG.

Next, the shape of the terminal-side large-diameter portion 31b of the plungers 31A to 31D and the effects of the shape will be described.

10 to 13 are explanatory diagrams showing the arrangement combination of the positioning of the large-diameter portion on the terminal side of the plunger and the spring. The plungers 31A to 31D shown in FIGS. 10 to 13 mainly explain the differences between the plungers 31 shown in FIG. 5. In addition, although the plungers 31A to 31D are diagrams depicting the middle section of the shaft rod portion 31e, the structure below that is the same as that of the plunger 31.

First, the plunger 31A will be described. Like the plunger 31 shown in FIG. 5, the plunger 31A shown in FIG. 10 has a terminal-side large-diameter portion 31b, a front end portion 31c, and a base portion 31d. However, it is different from the plunger 31 in that the plunger 31A is located at the base portion 31d and has a hole portion 31f. Specifically, at the contact surface of the base portion 31d with which one end 38a of the spring 38 abuts, the end 33a of the spring 38 is at a position where it contacts the base portion 31d on the diagonal (reaction point) ) A hole portion 31f is provided, and the protrusion of one end 38a of the spring 38 is fixed to the hole portion 31f in advance. Next, the other end 38b of the spring 38 is formed to be positioned at a position deviated from the phase by 180 degrees. The positional relationship between the distal end portion 31f and the hole portion 31c is designed as the above-described distance L ₁ is configured as a maximum distance. Therefore, when the plunger 31A is used, the contact leg 3 can also press the side portion of the substrate-side small-diameter portion 31 a against the inner wall surface of the conductive barrel 32 with the above-mentioned pressing force F _2, and can also achieve: Insulation prevention of electrical paths that form electrical connections.

Next, the plunger 31B will be described. The plunger 31B shown in FIG. 11 has a terminal-side large-diameter portion 31b, a front end portion 31c, and a base portion 31g in the same manner as the plunger 31 shown in FIG. 5. However, the plunger 31B is different from the plunger 31 in that the base portion 31g has a hole portion 31f and has an inclined surface. The hole portion 31f is placed as a reaction point. Specifically, the base portion 31g that abuts one end 38a of the spring 38 has an inclined surface, and the one end 38a of the spring 38 slides on the inclined surface as the IC package 4 is pressed; One of the end portions 38a is in a position where it contacts the base portion 31g on the diagonal, and the one end portion 38a is inserted into the hole portion 31f to be positioned. Thereby, the other end 38b of the spring 38 can be positioned at a position deviated from the phase by 180 degrees.

In other words, when the spring 38 is assembled around the plunger 31B in a state where both ends are not free to rotate, when the spring 38 is pushed into a predetermined design position, one of the ends 38a of the spring 38 protrudes The portion is inserted into the hole portion 31f by self-induction, and the other end portion 38b of the spring 38 is positioned at a position deviated from the phase by 180 degrees. Therefore, when the plunger 31B is used, the contact leg 3 can also press the side portion of the substrate-side small-diameter portion 31 a against the inner wall surface of the conductive barrel 32 with the above-mentioned pressing force F ₂ , and it can also be achieved : Insulation prevention of the electrical path forming the electrical connection.

Next, the plunger 31C will be described. The plunger 31C shown in FIG. 12 has the terminal-side large-diameter portion 31b, the tip portion 31c, and the base portion 31h in the same manner as the plunger 31 shown in FIG. 5. However, the plunger 31C has an inclined surface (curved surface push) with a steeper slope than the base portion 31g shown in FIG. 11, but does not provide a hole portion such as the hole portion 31f shown in FIG. In this case, when the spring 33 is pressed to a predetermined design position using the spring 33 as shown in FIG. 8, one end 33a of the spring 33 is self-inducedly positioned at the above-mentioned distance L _{1 to} become the maximum distance Office.

In other words, the base portion 31h abutting the end 33a of the spring 33 has an inclined surface (curved surface pushing), and as the IC package 4 is pressed, the end 33a of the spring 33 slides along the inclined surface The one end 33a of the spring 33 is positioned at a position (reaction point) that is in contact with the base 31h on the diagonal. In addition, the other end 33b of the spring 33 is positioned at a position deviated from the phase by 180 degrees.

Therefore, when the plunger 31C is used, the contact leg 3 can also press the side portion of the substrate-side small-diameter portion 31 a against the inner wall surface of the conductive barrel 32 with the above-mentioned pressing force F ₂ , and can achieve: Insulation prevention of electrical paths that form electrical connections.

Next, the plunger 31D will be described. Like the plunger 31 shown in FIG. 5, the plunger 31D shown in FIG. 13 has a terminal-side large-diameter portion 31b, a front end portion 31c, and a base portion 31i. However, the plunger 31D is different from the plunger 31 in that it has a hole portion 31f at the base portion 31i, and has a steeply inclined surface (curved surface pushing) like the plunger 31C. In this case, when the spring 38 is pressed to the predetermined design position via the pressing from the IC package 4, one end 38a of the spring 38 moves along the inclined surface and is pressed to the design position, The protrusion of one end 38a of the spring 38 is inserted into the hole portion 31f. Therefore, the other end 38b of the spring 38 is positioned at a position deviated from the phase by 180 degrees.

Therefore, when the plunger 31D is used, the contact leg 3 can also press the side portion of the substrate-side small-diameter portion 31a against the inner wall surface of the conductive barrel 32 with the above-mentioned pressing force F ₂ and can also achieve : Insulation prevention of the electrical path forming the electrical connection. In addition, in the present embodiment, the spring 33 applied to the contact leg 3 may be freely rotatable, or it may be fixed in advance only one end 33a of the spring 33; One end 33a and the other end 33b are fixed. However, an arrangement such as shown in FIG. 6 is configured such that the distance L ₁ described above becomes the maximum distance, and the phase is set to be 180 degrees off.

Next, the contact pins related to the second embodiment will be described in detail. In the following, differences from the first embodiment are mainly explained. In the second embodiment, the spring is configured as an inner spring-type contact leg that cannot be seen from the outside compared to the outer spring-type contact leg described in the first embodiment.

Fig. 14 is a front view of a contact leg according to the second embodiment. FIG. 14 shows the state where the contact pins usable in the socket for electronic parts of the present invention are taken out. 15 is a cross-sectional view of the contact foot shown in FIG. 14.

This contact leg 3A is used to electrically connect the IC package 4 and the wiring board P shown in FIG. 2 in the same manner as the contact leg 3 of the first embodiment. As shown in FIG. 14, the contact leg 3A is provided with a conductive barrel 34 and a terminal side plunger 35 that prevents both ends of the conductive barrel 34 from being partially inserted into the interior and comes into contact with the terminals of the IC package 4 And the board-side plunger 36 which is in contact with and connected to the connection portion of the wiring board P as shown in FIG. 2. As shown in FIG. 15, the contact leg 3A includes a spring 37 inside.

The conductive barrel 34 is formed of a conductive material such as metal. As shown in FIG. 15, it is formed into a cylindrical shape with open ends. A part of the terminal-side plunger 35 is inserted into the upper end of the conductive barrel 34. The terminal-side plunger 35 is in electrical contact with the terminal 4a (refer to FIG. 16) of the IC package 4 and is formed of a conductive material such as metal. It is partially processed to form a part that can be embedded in a conductive barrel The inside of the cavity 34 is round rod-shaped.

Specifically, the terminal-side plunger 35 includes: in a state of being inserted into the conductive barrel 34, engaging with the inner wall surface of the conductive barrel 34, and abutting one side of the spring 37 with a base portion 35d The terminal-side small-diameter portion 35a of the end portion 37a of the terminal; and the terminal-side large-diameter portion of the tip portion 35c having a push-out shape in contact with a part of the terminal of the IC package 4 when provided in a state protruding from the conductive barrel 35b.

The protrusion on the inner wall surface of the conductive barrel 34 of the terminal-side small-diameter portion 35a is fitted and blocked and fixed to the narrow waist portion 35f in the circumferential direction.

The remaining portion of the substrate-side plunger 36 is inserted into the lower end side of the conductive barrel 34. The board-side plunger 36 is in electrical contact with the connection pad 9 of the wiring board P shown in FIG. 16 and is formed of a conductive material such as metal.

The substrate-side plunger 36 has a substrate-side large-diameter portion 36a having a protrusion-shaped protrusion 36c whose side is in contact with the inside of the conductive barrel 34 and is in contact with the other end 37b of the spring 37; And a diameter of the base-side small-diameter portion that is smaller than the substrate-side large-diameter portion 36a and has a tip that is in contact with the connection pad 9 of the wiring board P in a state where a portion protrudes from the conductive barrel 34 36b. The board-side plunger 36 is formed such that the board-side large-diameter portion 36 a is embedded in the inside of the conductive barrel 34 and is slidable by pressing from the IC package 4.

In the inside of the conductive barrel 34, a spring 37 is inserted between the terminal-side plunger 35 and the substrate-side plunger 36. The spring 37 adds potential energy to the direction separating the terminal-side plunger 35 and the substrate-side plunger 36 in the conductive barrel 34, and is pressed and contracted via the IC package 4. The spring 37 is formed of a conductive material such as metal, and is configured as a coil spring that can expand and contract within the conductive barrel 34 and has an outer diameter smaller than the inner diameter of the conductive barrel 34.

Next, the function of the contact leg 3A will be explained.

FIG. 16 is an explanatory diagram showing the relationship of forces generated by pressing from the IC package. In FIG. 16, in a state where the IC package 4 shown in FIG. 2 is pressed, the front end portion 35c of the terminal side large diameter portion 35b of the terminal side plunger 35 is in contact with a part of the terminal 4a of the IC package 4 The position where one end 37a of the spring 37 is in contact with the base portion 35d of the terminal side small diameter portion 35a of the terminal side plunger 35 is located at: the force of the front end portion 35c pushed by the terminal 4a is opposite to the spring 37 The terminal side plunger 35 generates a rotational force due to the force of the base portion 35d of the terminal side small diameter portion 35a.

Here, the front end portion 35c is a function of a point of contact with a part of the terminal 4a in a state of being pressed, and serves as a point of action for the terminal 4a of the IC package 4 to push the front end portion 35c. In addition, one end 37a of the spring 37 is a position in contact with the base portion 35d, and functions as a reaction point that acts as a force for the spring 37 to push against the base portion 35d of the terminal-side small-diameter portion 35a. In addition, in the following description of the contact leg 3A according to the second embodiment, the position where the tip portion 35c is in contact with a part of the terminal 4a may be referred to as a "point of action". In addition, the position where one end 37a of the spring 37 is in contact with the base portion 35d is sometimes referred to as a "reaction point".

Specifically, in FIG. 16, from the IC package 4 via the press charge, the terminal 4a is pushed by a force F ₁ the front end portion 35c, generated by the reaction of one end portion 37a of the spring 37 is pushed by anti small side terminal The reaction force (-F ₁ ) of the base portion 35d of the diameter portion 35a. In this case, the line of action ₁₁ A F, and the reaction force (-F ₁₎ A ₂ line of action are parallel, and thus the force F ₁ and reaction force (-F ₁₎ is of equal size was due to the occurrence direction Two forces that oppose each other, and thus a moment of two forces (even forces) occurs. The moment M ₁ of the two forces is as shown in the above formula (1).

The moment of the two forces becomes force F ₁ + reaction force (−F ₁ )=0 as in the contact leg 3 of the first embodiment, so that the terminal side plunger 35 does not move in the X direction or Y direction although The force, but the rotation force works.

That is, in this embodiment, the front end portion 35c of the terminal-side large-diameter portion 35b of the terminal-side plunger 35 has a push-out shape that partially contacts the terminal 4a of the IC package 4, so in FIG. 16, the terminal-side post The plug 35 is subjected to a rotational force that rotates clockwise with the terminal-side tip portion 35c as a fulcrum.

On the other hand, the terminal side plunger 35 and the conductive barrel 34 are completely integrated, and do not rotate and become statically balanced. In this case, the role of the large-diameter portion 36a of the substrate side of the power line from the moment M ₂ L ₂ position of the fulcrum as shown in only from the distal end portion 35c of the above-described formula (2). Then, when the above formulas (3) to (4) are applied, the pressing force F ₂ (refer to FIG. 16) of the conductive barrel 34 pressed against the substrate-side plunger 36 becomes ((F ₁ ×L ₁ ) /L ₂ ). With such a configuration, the contact leg 3A can press the substrate-side plunger 36 with the pressing force F ₂ and through the conductive barrel 34, and as a result, the side of the substrate-side large-diameter portion 36a can be pressed against the conductive barrel 34's inner wall surface. In addition, compared with FIG. 6, the position of the arrow pressing the force F ₂ as shown in FIG. 16 is different. In the case of FIG. 6, the moment with respect to the force acts on the plunger 31 in In the case of FIG. 16, the moment of the force is caused by acting on the terminal plunger 35 and the conductive barrel 34 which are integrally integrated.

FIG. 17 is an explanatory diagram showing a comparative example of the relationship of forces in FIG. 16. Compared with the contact leg 3A shown in FIG. 16, in the contact leg 30A shown in FIG. 17, one end 37a of the spring 37 is provided on the opposite side in the circumferential direction, and the other end 37b is also provided on The opposite side in the circumferential direction.

In the comparative example shown in FIG. 17, the positional relationship between the front end portion 35 c of the terminal-side large-diameter portion 35 b that is in contact with the terminal 4 a of the IC package 4 and one end portion 37 a of the spring 37 is configured as follows: 4 is pressed, the moment generated by the force of the terminal 4a pushing the front end portion 35c and the force of one end 37a of the spring 37 pushing the terminal side small diameter portion 35a is arranged to be smaller than FIG. 16 Composition. That is, the distance L3 between the action lines indicating the interval between the action line A ₁ and the action line A ₂ is a component smaller than in the case of FIG. 16, and the moment of the coupling force also becomes smaller. Therefore, it is preferable to form a configuration that is closer to the contact leg 3A than the contact leg 30A.

In this embodiment, the contact leg 3A is similar to the contact leg 3, and when the spring 37 is pressed to a predetermined design position by pressing from the IC package 4, one of the end 37a of the spring 37 and the spring 37 The phase of the other end 37b deviates from 180 degrees. By this means, the tip portion 35c is used as a fulcrum to indicate that the distance L ₁ between the action lines A ₁ and the action line A ₂ is maximized. In this embodiment, by providing a push-out protrusion 36c in contact with the other end 37b of the spring 37, it is further formed that, as shown in FIG. 16, the other end 37b catches the push-out shape The structure of the protrusion 36c. Therefore, in the state where the IC package 4 is pressed, the transmission path of the load due to the force of the other end 37b pushing against the push-out protrusion 36c is directed from the front end direction of the board-side plunger 36 toward the wiring board P, so it does not act on the conductive barrel 34 and does not affect the pressing force F ₂ .

From the above, according to the contact leg 3A according to the second embodiment, it can be fixed that the front end portion 35c is in contact with a part of the terminal 4a, and one end 37a of the spring 37 is in contact with the base portion 35d The structure of the connected position. Therefore, it can be ensured that the moment of the two forces (the moment of the couple force) generated through the action point and the reaction point is stable and strong. That is, the contact leg 3A according to the second embodiment can suppress the variation of the occurrence of the couple force by fixing the distance L ₁ of the moment where two forces are generated to the maximum distance.

Next, the contact leg 3 according to the second embodiment is the pressing force F ₂ of the moment generated by the rotation force when the above-mentioned distance L ₁ becomes the maximum distance, and the large-diameter portion 36a of the substrate side The side portion is pressed against the inner wall surface of the conductive barrel 34. That is, the contact load on the side portion of the substrate-side large-diameter portion 36a is stable and becomes large. Therefore, the contact leg 3A according to the second embodiment does not need to adopt the above-mentioned special shape of the elastically deformable portion, and it is possible to achieve the prevention of the insulation of the electrical connection path forming the electrical connection.

In addition, in the contact leg 3A according to the second embodiment, the same configuration as the plungers 31A to 31D shown in FIGS. 10 to 13 can be applied to the terminal-side small-diameter portion 35 a of the terminal-side plunger 35. With this, the same effects as those shown by the plungers 31A to 31D shown in FIGS. 10 to 13 can be obtained.

Moreover, in this embodiment, the spring 37 applied to the contact leg 3A may be freely rotatable, or may be fixed to only one end 37a of the spring 37 in advance; or may fix one end 37a of the spring 37 in advance And the other end 37b. However, it is configured such that the above-described distance L ₁ becomes the maximum distance and the phase shown in FIG. 16 is shifted by 180 degrees.

Next, the use and operation of the socket 1 for electronic parts provided with the contact pin 3A will be described with reference to FIGS. 2, 3 and 18. In addition, in FIG. 3, the contact leg 3 is replaced with the contact leg 3A.

FIG. 18 is an explanatory diagram showing the use state of the contact foot in FIG. 14. In detail, FIG. 18 is a cross-sectional explanatory view of an essential part of the operation of the contact leg 3A when the electronic component socket 1 is mounted on the wiring board P, and the electronic component is accommodated in the accommodating portion. As shown in FIGS. 2 and 3, first, the socket 1 for electronic components is arranged on the wiring board P. At that time, as shown in FIG. 18(a), the lower surface of the bottom plate 7 shown in FIG. 3 is placed on the upper surface of the wiring board P, and the contact portion of the front end of the substrate-side plunger 36 is crimped to the wiring board P的连接垫9。 The connection pad 9.

In this state, as shown in FIG. 2, the IC package 4 of the test object is housed in the housing portion 5 of the housing 2 as shown by arrow B. At that time, a mechanical device such as a robot arm holds the IC package 4 by suction or the like, transports it to the socket 1 for electronic parts, and is accommodated in the accommodating portion 5. Then, the socket cover (not shown) is closed and the IC package 4 is fixed.

At that time, as shown in FIG. 18(b), with the closing operation of the socket cover described above, the IC package 4 is pressed down in the manner of arrow C. At this time, the solder balls 8 arranged in a lattice shape (grid shape) on the lower surface of the IC package 4 press the front end portion 35 c of the terminal-side plunger 35. At that time, the terminal-side plunger 35 is pressed against the additional potential of the spring 37 as shown in FIG. 15, and the entire conductive barrel 34 descends in the direction of arrow C and contracts. Thereby, the terminal 4a of the IC package 4 and the connection part of the wiring board P can be electrically connected. At that time, in the inside of the contact leg 3A, the current flows through the path of the terminal-side plunger 35 → the conductive barrel 34 → the substrate-side plunger 36 through the above-mentioned pressing force F ₂ .

As a result, in the contact leg 3A having the movable portion, the part intended to be the energization path is insulated, and the current flows to the spring 37 which is not intended to be the energization path, thereby preventing damage such as blowout. In addition, although the case where the contact leg 3A is used has been described, the effect of the same can also be obtained when the contact leg 3 is used.

In this state, the IC package 4 is accommodated in, for example, the socket 1 for electronic parts, and a predetermined test is performed for 20 to 30 seconds. When the test is completed, the socket cover is opened, the IC package 4 is taken out, and the robot arm waits Transport at the storage location to complete a series of test actions. Then, the mechanical contact of the conductive member electrically connecting the terminal of the IC package 4 and the connection portion of the wiring board P can be improved, and the resistance value can be stabilized, and a predetermined test can be performed on the electronic component.

A ₁ : action line of F ₁ A ₂ : action line of reaction force (－F ₁ ) F ₁ : force F ₂ : pressing force L ₁ : distance L ₂ : distance L ₃ : distance M ₁ : torque P: wiring substrate the Y _1: the direction of the Y _2: direction 1: 3 box:: electronic component socket two contact pins 3A: the contact pins 4: IC package 4a: IC package terminals 54: the storage unit 6: the support plate 7: bottom 8 : Solder ball 9: Connection pad (connection part) 30: Contact foot 30A: Contact foot 31: Plunger 31A: Plunger 31a: Substrate side small diameter part 31B: Plunger 31b: Terminal side large diameter part 31C: Plunger 31c : Front end portion 31D: Plunger 31d: Root portion 31e: Shaft portion 31f: Hole portion 31g: Root portion 31h: Root portion 31i: Root portion 32: Conductive barrel 32a: Open peripheral portion 33: Spring 33a: End 33b: end portion 34: conductive barrel 35: terminal side plunger 35a: terminal side small diameter portion 35b: terminal side large diameter portion 35c: front end portion 35d: base portion 35f: thin waist portion 36: substrate side plunger 36a: Substrate side large diameter portion 36b: base end side small diameter portion 36c: protrusion 37: spring 37a: end 37b: the other end 38: spring 38a: end 38b: end

1 is a plan view showing an embodiment of the socket for electronic parts of the present invention. FIG. 2 is a front view of FIG. 1. Fig. 3 is a sectional view taken along line AA in Fig. 1. 4 is an enlarged front view of the contact leg according to the first embodiment. FIG. 5 is a cross-sectional view of the contact foot shown in FIG. 4. 6 is an explanatory diagram showing the relationship between forces generated by pressing from the IC package. 7 is an explanatory diagram showing a comparative example of the relationship of forces in FIG. 6. FIG. 8 is an explanatory diagram regarding the variation of the phase deviation of the spring. FIG. 9 is an explanatory diagram of phase deviation variation when the shape of the spring shown in FIG. 8 is partially different. FIG. 10 is an explanatory diagram showing an arrangement combination of positioning of a large-diameter portion on a terminal side of a plunger and a spring. FIG. 11 is an explanatory diagram showing an arrangement combination of positioning of a large diameter portion on a terminal side of a plunger and a spring. FIG. 12 is an explanatory diagram showing an arrangement combination of positioning of a large diameter portion on a terminal side of a plunger and a spring. FIG. 13 is an explanatory diagram showing an arrangement combination of positioning of a large diameter portion on a terminal side of a plunger and a spring. Fig. 14 is a front view of a contact leg according to the second embodiment. FIG. 15 is a cross-sectional view of the contact foot shown in FIG. 14. FIG. 16 is an explanatory diagram showing the relationship between forces generated by pressing from the IC package. FIG. 17 is an explanatory diagram showing a comparative example of the relationship of forces in FIG. 16. FIG. 18 is an explanatory diagram showing an example of the use state of the contact foot in FIG. 14.

3: contact foot

31: plunger

31a: Small diameter part on the substrate side

31b: Large diameter part on the terminal side

31c: Front end

31d: Basic part

31e: Shaft bar

32: conductive barrel

32a: opening periphery

33: Spring

33b: end

33a: end

Claims (7)

A contact pin is a contact pin for electrically connecting an electronic component and a wiring board, and is characterized by having: A conductive barrel with an opening at one end and a cylindrical shape; A plunger includes: a small-diameter portion on the substrate side provided on one end side and a large-diameter portion on the terminal side provided on the other end side; wherein the small-diameter portion on the substrate side is Inserted into the opening of the conductive barrel cavity and abutting against the inner wall surface of the conductive barrel cavity, thereby conducting the connection portion of the wiring board, the large-diameter portion on the side of the substrate is in contact with a part of the terminal of the electronic component Front end A spring (spring), one end of which is in contact with the base portion of the terminal-side large-diameter portion, and the other end is in contact with the periphery of the opening of the conductive barrel cavity, and can be pressed by the electronic component And shrink; where In the state where the electronic component is pressed, the front end of the large-diameter portion of the terminal side of the plunger is a position in contact with a part of the terminal of the electronic component, and one end of the spring is in contact with the aforementioned The position of the base portion of the terminal-side large-diameter portion is located on the diagonal line of the terminal-side large-diameter portion that generates a rotational force due to the force of the terminal pushing the front end portion and the force of the spring back pushing the base portion . A contact pin is a contact pin for electrically connecting an electronic component and a wiring board, and is characterized by having: Conductive barrel cavity, both ends of which are open and formed into a cylindrical shape; The board-side plunger is blocked by both ends of the conductive barrel, and a part of it is inserted into the inside, and the terminal-side plunger that is in contact with the terminal of the electronic component and the connection with the wiring board Contact and conduction; The spring adds potential energy to the direction separating the terminal-side plunger and the substrate-side plunger in the conductive barrel, and shrinks by pressing the electronic component; The terminal-side plunger includes a terminal-side small-diameter portion that is engaged with the inner wall surface of the conductive barrel cavity while being inserted into the conductive barrel cavity and abuts against one end of the spring with a base portion, And a terminal-side large-diameter portion provided in a state where it protrudes from the conductive barrel cavity and comes into contact with a part of the terminal of the electronic component before; In a state where the electronic component is pressed, the terminal-side plunger front end of the terminal-side large-diameter portion is a position in contact with a part of the terminal of the electronic component, and one end of the spring is The position where the base portion of the terminal-side small-diameter portion of the terminal-side plunger abuts is at the rotation caused by the force of the terminal pushing the front end portion and the force of the spring pushing the base portion back The diagonal of the plunger on the terminal side of the aforementioned force. The contact pin as described in claim 1 or 2, wherein the phase of one end of the spring and the other end of the spring deviate by 180 degrees when the electronic component is pressed and the spring is contracted . The contact foot as described in claim 3, wherein the base portion abutting the end of the spring has an inclined surface; as the electronic component is pressed, the end of the spring is on the inclined surface Slide to locate the abutment position with the aforementioned base. The contact pin according to claim 4, wherein a hole is provided in the inclined surface of the root portion at a position in contact with the root portion; the end of the one side can be inserted into the hole for positioning. The contact leg according to claim 3, wherein a hole is provided at a position where one end of the spring contacts the base portion; the one end of the spring is fixed in the hole in advance. A socket for electronic parts, which is a socket for electronic parts with a frame body and a plurality of contact pins, characterized by: The frame is an accommodating part having electronic parts electrically connected to the wiring board; The plurality of contact pins are respectively inserted into the plurality of insertion holes of the support plate provided below the receiving portion in the frame body, and are used for electrically connecting the terminals of the electronic components and the wiring board; The aforementioned contact pin is provided with the contact pin as described in claim 1 or 2.

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