PH12020552280A1 - Contact pin and electronic component socket - Google Patents

Contact pin and electronic component socket

Info

Publication number
PH12020552280A1
PH12020552280A1 PH12020552280A PH12020552280A PH12020552280A1 PH 12020552280 A1 PH12020552280 A1 PH 12020552280A1 PH 12020552280 A PH12020552280 A PH 12020552280A PH 12020552280 A PH12020552280 A PH 12020552280A PH 12020552280 A1 PH12020552280 A1 PH 12020552280A1
Authority
PH
Philippines
Prior art keywords
end portion
terminal
plunger
abuts
electrically conductive
Prior art date
Application number
PH12020552280A
Inventor
Yasuyuki Sakamoto
Akira Miura
Original Assignee
Enplas Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Enplas Corp filed Critical Enplas Corp
Publication of PH12020552280A1 publication Critical patent/PH12020552280A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
    • H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
    • H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Multi-Conductor Connections (AREA)
  • Connections Arranged To Contact A Plurality Of Conductors (AREA)

Abstract

This contact pin is provided with an electrically conductive barrel 32, a plunger 31 including a board side small diameter portion 31a which is provided on one end portion side of the plunger 31, and which is electrically connected to a connecting portion 9 of a wiring board P by abutting an inner wall surface of the electrically conductive barrel, and a terminal side large diameter portion 31b which is provided on the other end portion side of the plunger 31, and which has a distal end portion 31c which comes into contact with a part of a terminal 4a of an electric component 4, and a spring 33 having one end portion 33a which abuts a root part 31d of the terminal side large diameter portion and another end portion 33b which abuts an open peripheral edge of the electrically conductive barrel, the spring 33 contracting by being pressed, wherein, in a pressed state, the position in which the distal end portion is in contact with said part of the terminal, and the position in which the one end portion abuts the root part are positioned on a diagonal of the terminal side large diameter portion along which there is generated a rotational force resulting from the force of the terminal pressing the distal end portion, and the force of the spring pushing the root part back. It is thus possible to prevent isolation of a conduction path forming an electrical connection, without adopting a special construction.
PH12020552280A 2018-07-27 2020-12-29 Contact pin and electronic component socket PH12020552280A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018141779A JP7096095B2 (en) 2018-07-27 2018-07-27 Sockets for contact pins and electrical components
PCT/JP2019/029474 WO2020022493A1 (en) 2018-07-27 2019-07-26 Contact pin, and electric component socket

Publications (1)

Publication Number Publication Date
PH12020552280A1 true PH12020552280A1 (en) 2021-07-12

Family

ID=69181673

Family Applications (1)

Application Number Title Priority Date Filing Date
PH12020552280A PH12020552280A1 (en) 2018-07-27 2020-12-29 Contact pin and electronic component socket

Country Status (5)

Country Link
JP (1) JP7096095B2 (en)
CN (1) CN112470011B (en)
PH (1) PH12020552280A1 (en)
TW (1) TWI808225B (en)
WO (1) WO2020022493A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7455603B2 (en) 2020-02-12 2024-03-26 株式会社エンプラス contact pins and sockets

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6462567B1 (en) 1999-02-18 2002-10-08 Delaware Capital Formation, Inc. Self-retained spring probe
JP2004504703A (en) * 2000-07-13 2004-02-12 リカ　エレクトロニクス　インターナショナル　インコーポレイテッド Contact equipment particularly useful for test equipment
JP2003167001A (en) 2001-11-29 2003-06-13 Yamaichi Electronics Co Ltd Contact probe of socket for electronic parts and electronic parts using the same
JP2003307525A (en) 2002-04-16 2003-10-31 Sumitomo Electric Ind Ltd Contact probe
JP2010025844A (en) * 2008-07-23 2010-02-04 Unitechno Inc Contact probe and inspection socket
JP2010060316A (en) * 2008-09-01 2010-03-18 Masashi Okuma Anisotropic conductive member and measuring substrate having anisotropic conductivity
JP4900843B2 (en) * 2008-12-26 2012-03-21 山一電機株式会社 Electrical connection device for semiconductor device and contact used therefor
JP4998838B2 (en) * 2010-04-09 2012-08-15 山一電機株式会社 Probe pin and IC socket having the same
JP5821432B2 (en) * 2011-09-05 2015-11-24 日本電産リード株式会社 Connection terminal and connection jig
JP6243130B2 (en) * 2013-03-27 2017-12-06 株式会社エンプラス Electrical contact and socket for electrical parts
JP6328925B2 (en) * 2013-12-24 2018-05-23 株式会社エンプラス Contact probe and socket for electrical parts
JP2015125971A (en) * 2013-12-27 2015-07-06 株式会社エンプラス Socket for electrical component
JP6337633B2 (en) * 2014-06-16 2018-06-06 オムロン株式会社 Probe pin
SG11201700936RA (en) * 2014-08-08 2017-03-30 Nhk Spring Co Ltd Connecting terminal
JP2017037021A (en) * 2015-08-11 2017-02-16 山一電機株式会社 Inspection contact terminal and electric connection device including the same

Also Published As

Publication number Publication date
CN112470011A (en) 2021-03-09
CN112470011B (en) 2023-08-25
TW202013836A (en) 2020-04-01
WO2020022493A1 (en) 2020-01-30
JP2020016620A (en) 2020-01-30
TWI808225B (en) 2023-07-11
JP7096095B2 (en) 2022-07-05

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