TW202000955A - Vapor deposition source for vacuum vapor deposition apparatus - Google Patents
Vapor deposition source for vacuum vapor deposition apparatus Download PDFInfo
- Publication number
- TW202000955A TW202000955A TW108117013A TW108117013A TW202000955A TW 202000955 A TW202000955 A TW 202000955A TW 108117013 A TW108117013 A TW 108117013A TW 108117013 A TW108117013 A TW 108117013A TW 202000955 A TW202000955 A TW 202000955A
- Authority
- TW
- Taiwan
- Prior art keywords
- vapor deposition
- crucible
- vapor
- vacuum
- sublimated
- Prior art date
Links
- 238000007740 vapor deposition Methods 0.000 title claims abstract description 43
- 239000000463 material Substances 0.000 claims abstract description 61
- 238000010438 heat treatment Methods 0.000 claims abstract description 20
- 239000011368 organic material Substances 0.000 abstract description 28
- 230000008022 sublimation Effects 0.000 abstract description 15
- 238000000859 sublimation Methods 0.000 abstract description 15
- 239000008186 active pharmaceutical agent Substances 0.000 abstract description 7
- 238000000151 deposition Methods 0.000 abstract description 6
- 229910052751 metal Inorganic materials 0.000 description 21
- 239000002184 metal Substances 0.000 description 21
- 239000000758 substrate Substances 0.000 description 21
- 238000001704 evaporation Methods 0.000 description 9
- 230000008020 evaporation Effects 0.000 description 9
- 150000004984 aromatic diamines Chemical class 0.000 description 5
- 230000002093 peripheral effect Effects 0.000 description 5
- 125000006850 spacer group Chemical group 0.000 description 5
- 239000007787 solid Substances 0.000 description 4
- TVIVIEFSHFOWTE-UHFFFAOYSA-K tri(quinolin-8-yloxy)alumane Chemical compound [Al+3].C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1 TVIVIEFSHFOWTE-UHFFFAOYSA-K 0.000 description 4
- 238000007738 vacuum evaporation Methods 0.000 description 4
- 230000008021 deposition Effects 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 239000007921 spray Substances 0.000 description 3
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 239000010935 stainless steel Substances 0.000 description 3
- 229910001374 Invar Inorganic materials 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000007791 liquid phase Substances 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 238000004080 punching Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- -1 tris(8-hydroxyquinoline) aluminum oxide Chemical group 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910001200 Ferrotitanium Inorganic materials 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004745 nonwoven fabric Substances 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/164—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/12—Organic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/243—Crucibles for source material
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Physical Vapour Deposition (AREA)
- Electroluminescent Light Sources (AREA)
Abstract
Description
本發明係關於被配置於真空腔內,用以使昇華性的材料昇華來對於被蒸鍍物進行蒸鍍的真空蒸鍍裝置用之蒸鍍源。The present invention relates to a vapor deposition source for a vacuum vapor deposition apparatus which is arranged in a vacuum chamber to sublimate a sublimable material to vapor deposit a vapor-deposited object.
例如,於有機EL元件之製造工程中,係具有在真空氛圍中對於基板等之被蒸鍍物蒸鍍三(8-羥基喹啉)鋁錯合物(Alq3
)或芳香族二胺等之昇華性的材料(有機材料)的工程,於此蒸鍍工程中係廣泛利用有真空蒸鍍裝置。被使用於這種真空蒸鍍裝置的蒸鍍源,例如,係在專利文獻1被揭示。其係具備在垂直方向上面作開口的坩堝、和將坩堝加熱的感應線圈等的加熱手段(參照先前技術的部分)。For example, in the manufacturing process of organic EL devices, it is possible to vapor-deposit tris(8-hydroxyquinoline) aluminum complex (Alq 3 ) or aromatic diamine, etc. in a vacuum atmosphere on the substrate to be vaporized. In the sublimation material (organic material) project, vacuum evaporation equipment is widely used in this evaporation process. A vapor deposition source used in such a vacuum vapor deposition device is disclosed in
在此,上述種類的材料,一般而言導熱率為差,並且與經過液相來氣化的材料不同,加熱時,在坩堝內的材料不會產生對流。因此,若以上述以往例的蒸發源,於坩堝內填充例如粉末狀的材料,並在真空氛圍中藉由加熱手段將坩堝加熱,則會從接觸到直接導熱的坩堝之壁面的材料開始而進行昇華。此時,從面向坩堝的上面開口之所填充的材料之上層部分起,已昇華的材料會通過坩堝的上面開口來朝向被蒸鍍物飛散,但是,在位置於其下方的下層部分,已昇華的材料會與存在其周圍之較低溫(若換言之,尚未被加熱至昇華溫度)的材料碰撞而恢復為固體。其結果,由於已昇華的材料只會從有限的範圍飛散,因此存在有在相同的壓力下之每單位時間的昇華量為少而對於被蒸鍍物之蒸鍍速率為低(也就是說,生產性為低)的問題。這種情況,雖然可考慮將坩堝的加熱溫度提高,但是在三(8-羥基喹啉)鋁錯合物或芳香族二胺(有機)材料的情況,若將加熱溫度提高,則材料會在蒸鍍源處而分解,而無法蒸鍍有具備決定元件的性能之所期望的膜質之薄膜。因此,作為將上述種類之昇華性的材料進行蒸鍍的真空蒸鍍裝置之蒸鍍源,近年來要求進行以較低的溫度得到高蒸鍍速率者之開發。 [先前技術文獻] [專利文獻]Here, the above-mentioned materials generally have poor thermal conductivity and are different from materials vaporized through the liquid phase. When heated, the materials in the crucible do not cause convection. Therefore, if the crucible is filled with a material such as powder in the evaporation source of the above-mentioned conventional example, and the crucible is heated by a heating means in a vacuum atmosphere, it will start from the material that comes into contact with the wall surface of the directly-conducting crucible. sublimation. At this time, starting from the upper part of the filled material facing the upper opening of the crucible, the sublimated material will be scattered toward the vapor-deposited object through the upper opening of the crucible, but in the lower part below it, it has been sublimated The material will collide with the material that has a lower temperature around it (in other words, it has not been heated to the sublimation temperature) and return to a solid. As a result, since the sublimated material can only be scattered from a limited range, there is little sublimation per unit time under the same pressure and the evaporation rate for the vapor-deposited object is low (that is, Low productivity). In this case, although it may be considered to increase the heating temperature of the crucible, in the case of tris(8-hydroxyquinoline) aluminum complex or aromatic diamine (organic) material, if the heating temperature is increased, the material will be It is decomposed at the vapor deposition source, and a thin film having a desired film quality that determines the performance of the device cannot be vapor deposited. Therefore, as a vapor deposition source of a vacuum vapor deposition apparatus that vapor-deposits the above-mentioned kinds of sublimable materials, development of those who obtain a high vapor deposition rate at a relatively low temperature has been required in recent years. [Prior Technical Literature] [Patent Literature]
[專利文獻1]日本特開2010-1529號公報[Patent Document 1] Japanese Patent Application Publication No. 2010-1529
[發明所欲解決之課題][Problems to be solved by the invention]
本發明係鑑於以上之觀點,而以提供在將昇華性的材料進行蒸鍍時,可增加每單位時間之昇華量,且對於被蒸鍍物之蒸鍍速率為高的真空蒸鍍裝置用之蒸鍍源作為其課題者。 [用以解決課題之手段]In view of the above viewpoints, the present invention is intended to provide a vacuum vapor deposition apparatus which can increase the amount of sublimation per unit time when vapor-depositing materials are vapor-deposited and has a high vapor deposition rate for the vapor-deposited material The deposition source is the subject. [Means to solve the problem]
為了解決上述課題,被配置於真空腔內,用以使昇華性之材料昇華來對於被蒸鍍物進行蒸鍍的本發明之真空蒸鍍裝置用之蒸鍍源,其特徵為,具備:外容器,係具有朝向被蒸鍍物來噴出已昇華的材料之噴出口、和內容器,係對於此外容器從其壁面起隔著間隔地被內插並收容昇華性的材料、以及加熱手段,係可將內容器內的材料加熱,於內容器開設有容許已昇華的材料連通之複數個透孔。In order to solve the above-mentioned problems, the vapor deposition source for the vacuum vapor deposition apparatus of the present invention, which is arranged in a vacuum chamber and sublimates a sublimation material to vapor-deposit a vapor-deposited object, is characterized by comprising: The container has an ejection port for ejecting the sublimated material toward the object to be vapor-deposited, and the inner container. For the container, the container is inserted at intervals from the wall surface and contains the sublimable material, and the heating means is The material in the inner container can be heated, and the inner container is provided with a plurality of through holes allowing the sublimated material to communicate.
依據本發明,若於蒸鍍源之內容器內填充例如成為粉末狀之昇華性的材料,並在真空氛圍中例如將外容器藉由加熱手段加熱,則會從藉由來自外容器之輻射熱而通過透孔被直接加熱的材料或從藉由輻射熱而被加熱的內容器所直接導熱的材料開始而進行昇華。此已昇華的材料,係從各透孔,藉由外容器的內壁面與內容器的外壁面之間的空間之傳導而經過該空間而被導引至外容器的噴出口,並從此噴出口朝向被蒸鍍物飛散。如此般地,於本發明中,此已昇華的材料幾乎都被取出至各透孔,而盡可能地抑制其與較低溫的材料(也就是說,非加熱的材料)碰撞而恢復為固體(換言之,由於已昇華的材料飛散而使面積增加),因此,相較於已昇華的材料只會從有限的範圍飛散之上述以往例者,係能夠使昇華量飛躍性地增加,而可提高對於被蒸鍍物之蒸鍍速率。其結果,本發明之真空蒸鍍裝置用之蒸鍍源,係即使是低的加熱溫度,也可得到高的蒸鍍速率,因此,成為最適合蒸鍍三(8-羥基喹啉)鋁錯合物或芳香族二胺之類的有機材料。另外,內容器與外容器之間的間隙,係為了可藉由來自外容器之輻射而有效率地加熱,並為了使已昇華的材料從各透孔經過上述空間來有效率地取出至外容器的噴出口,而被設定為1mm~30mm之範圍。According to the present invention, if the inner container of the evaporation source is filled with a sublimable material such as powder, and the outer container is heated by heating means in a vacuum atmosphere, for example, the radiant heat from the outer container Sublimation begins with materials that are directly heated through the through-holes or materials that directly conduct heat through the inner vessel that is heated by radiant heat. This sublimated material is guided from each through hole through the space between the inner wall surface of the outer container and the outer wall surface of the inner container to the discharge port of the outer container through the space, and from this discharge port Flying toward the vapor-deposited object. In this way, in the present invention, almost all the sublimated material is taken out to each through hole, and it is suppressed as much as possible to collide with a lower temperature material (that is, a non-heated material) and return to a solid ( In other words, since the sublimated material is scattered and the area is increased), compared with the sublimated material, which only scatters from a limited range, the above-mentioned conventional example can dramatically increase the amount of sublimation and improve the The evaporation rate of the material to be evaporated. As a result, the vapor deposition source for the vacuum vapor deposition apparatus of the present invention can obtain a high vapor deposition rate even at a low heating temperature, and therefore, it is most suitable for vapor deposition of tris(8-hydroxyquinoline) aluminum oxide Organic materials such as compounds or aromatic diamines. In addition, the gap between the inner container and the outer container is to be efficiently heated by the radiation from the outer container, and to allow the sublimated material to be efficiently taken out to the outer container from each through-hole through the above space The discharge port is set in the range of 1mm to 30mm.
於本發明中,在如前述外容器係以在垂直方向上面作了開口之坩堝所構成的情況,前述內容器,係亦可採用以在上面作了開口的有底之筒狀體所構成,並於此筒狀體的外底壁設置有腳片的構造。依據此,僅需使腳片側為下來將內容器插入至坩堝內,並使該腳片抵接於坩堝的內底壁,便可簡單地將內容器設置於坩堝內,在此狀態下,除了坩堝的內側壁與內容器的外側壁之間的空間(第1空間)以外,於坩堝的內底壁與內容器的外底壁之間,亦形成有區劃出供已昇華的材料通過的空間(第2空間)之一定間隙,藉此,可更進一步增加昇華量,而為有利。於此情況中,只要於坩堝的內側壁或內容器的外側壁之至少其中一方設置複數個間隔構件,則僅藉由設置內容器,便能夠以形成區劃出上述第1空間之一定間隙的方式來於坩堝內將內容器同心地作定位,而為有利。In the present invention, in the case where the outer container is constituted by a crucible having an opening in the vertical direction as described above, the inner container may also be constituted by a bottomed cylindrical body having an opening above, A leg piece structure is provided on the outer bottom wall of the cylindrical body. According to this, it is only necessary to insert the inner container into the crucible with the leg piece side down, and make the leg piece abut against the inner bottom wall of the crucible, the inner container can be simply set in the crucible, in this state, except In addition to the space between the inner side wall of the crucible and the outer side wall of the inner container (the first space), a space is formed between the inner bottom wall of the crucible and the outer bottom wall of the inner container to allow the sublimated material to pass through (Second space) A certain gap can be used to further increase the amount of sublimation, which is advantageous. In this case, as long as a plurality of spacers are provided on at least one of the inner side wall of the crucible or the outer side wall of the inner container, only by providing the inner container, it is possible to form a certain gap that defines the above-mentioned first space It is advantageous to locate the inner container concentrically in the crucible.
另外,於本發明中,作為上述筒狀體,係可使用如金屬網格般地將特定直徑的金屬製線材組裝成格子狀者、如衝孔金屬般地於金屬製板材上開設有讓蒸氣通過的圓形或是狹縫狀的開口(透孔)者、或將多孔金屬網成形成筒狀者,其他,亦可以將上述筒狀體藉由如多孔質之陶瓷般地具有讓蒸氣通過的多數個細孔之多孔質體來構成。又,只要是具有讓蒸氣通過的透孔者,亦可藉由將複數個金屬網格重疊來使其具有厚度者、或使金屬製線材纏繞來形成為不織布狀者,而構成上述筒狀體。例如,在以金屬網格構成上述筒狀體的情況,較理想為,該線徑係設為Φ0.2~1.0mm之範圍,且成為容許已昇華的材料連通的透孔之網眼的大小係設為#10~#50之範圍。只要是這種金屬網格,則即使填充粉狀的材料,一般而言,由於三(8-羥基喹啉)鋁錯合物或芳香族二胺等之昇華性的材料(有機材料)係具有凝聚性,因此幾乎不會從各網眼漏出而會被堆積,又,就算是一部分漏出,也僅會積存於外容器的內底壁,其後在外容器被加熱時進行昇華,因此不會產生特別的問題。In addition, in the present invention, as the cylindrical body, it is possible to use a metal wire rod of a specific diameter assembled into a grid like a metal grid, and a metal plate is provided on the metal plate like a punching metal to allow steam Round or slit-shaped openings (through holes), or a porous metal mesh formed into a cylindrical shape, other, the cylindrical body can also be used to allow steam to pass through like a porous ceramic It consists of a porous body with many pores. In addition, as long as it has a through-hole for allowing steam to pass through, a plurality of metal meshes may be stacked to have a thickness, or a metal wire may be wound to form a non-woven fabric to form the cylindrical body . For example, when the above cylindrical body is constituted by a metal mesh, it is desirable that the wire diameter is in the range of Φ0.2 to 1.0 mm, and the mesh size of the through-hole that allows the sublimated material to communicate It is set to the range of #10~#50. As long as it is such a metal grid, even if it is filled with powdery materials, generally speaking, due to sublimation materials (organic materials) such as tris(8-hydroxyquinoline) aluminum complex or aromatic diamine, etc. Because it is cohesive, it hardly leaks from each mesh and will accumulate. Even if a part of it leaks, it will only accumulate on the inner bottom wall of the outer container. Subsequent sublimation occurs when the outer container is heated, so it does not occur. Special problem.
以下,參照附圖,以將被蒸鍍物設為具有矩形輪廓的特定厚度之玻璃基板(以下,稱為「基板Sw」)、將蒸鍍物質設為昇華性之有機材料,並於基板Sw之其中一面蒸鍍特定的薄膜之情況為例,來說明本發明之真空蒸鍍裝置用之蒸鍍源的實施形態。於以下內容中,代表「上」、「下」之方向的用語,係以展示真空蒸鍍裝置之設置姿勢的第1圖為基準。Hereinafter, referring to the drawings, the vapor-deposited object is a glass substrate having a rectangular outline and a specific thickness (hereinafter, referred to as "substrate Sw"), and the vapor-deposited substance is an organic material that is sublimable, and the substrate Sw A case where a specific thin film is vapor-deposited on one side is taken as an example to describe an embodiment of a vapor deposition source for the vacuum vapor deposition apparatus of the present invention. In the following, the terms representing the directions of "up" and "down" are based on the first figure showing the installation posture of the vacuum evaporation apparatus.
參照第1圖,Dm係為具備本實施形態的蒸鍍源DS之真空蒸鍍裝置。真空蒸鍍裝置Dm,係具備真空腔1,於真空腔1,雖無特別圖示說明,但係經由排氣管來連接真空泵,而可真空吸引達特定壓力(真空度)來形成真空氛圍。又,於真空腔1的上部係設置有基板搬送裝置2。基板搬送裝置2,係具有以將作為成膜面的下面作了開放的狀態保持基板Sw的載體21,並藉由圖外的驅動裝置,來將載體21乃至基板Sw朝真空腔1內的一方向以特定速度移動。作為基板搬送裝置2,係由於可利用周知者,因此其他說明係省略。Referring to FIG. 1, Dm is a vacuum deposition apparatus provided with a deposition source DS of this embodiment. The vacuum vapor deposition apparatus Dm is provided with a
於藉由基板搬送裝置2被搬送的基板Sw與蒸鍍源DS之間,係設置有板狀的遮罩板3。於本實施形態中,遮罩板3,係構成為與基板Sw一體地安裝而與基板Sw一起藉由基板搬送裝置2而被搬送。另外,遮罩板3,係亦可預先被固定配置於真空腔1。於遮罩板3,係形成有貫通板厚方向之複數個開口31,而成為可藉由對於在並不存在有該等開口31的位置處的已昇華的材料之對於基板Sw的蒸鍍範圍作限制,而以特定的圖案來被成膜(蒸鍍)於基板Sw。作為遮罩板3,係除了不變鋼(INVAR)、鋁、氧化鋁或不鏽鋼等之金屬製以外,也可使用聚醯亞胺等之樹脂製者。並且,於真空腔1的底面,係與基板Sw對向地設置有本實施形態之蒸鍍源DS。Between the substrate Sw transferred by the
蒸鍍源DS,係具有構成本實施形態之外容器的坩堝4。坩堝4,係具有在垂直方向上面作了開口的有底筒狀之輪廓,並由鉬、鈦、不鏽鋼或碳等之導熱佳且高熔點的材料所形成。於此情況中,坩堝4的上面開口41係構成本實施形態之已昇華的材料之噴出口。於坩堝4的周圍,係設置有由護套式加熱器或燈加熱器等之周知者所構成之加熱手段Ht。並且,於坩堝4,係內插有構成本實施形態之內容器的筒狀體5。筒狀體5,係與坩堝4同樣地,以鉬、鈦或不鏽鋼等之導熱佳且高熔點的材料所構成,於本實施形態中,係將由線材51組裝成格子狀而成之金屬網格以具有有底筒狀之輪廓的方式成形,金屬網格之各網眼52的部分係構成本實施形態的透孔。於此情況中,線材51之線徑,較理想係設為Φ0.2~1.0mm之範圍,又,網眼52之大小,較理想係設為#10~#50之範圍。若網眼(開口)52過大,則會產生無法保持材料的問題,另一方面,若網眼52過小,則會產生已昇華的材料之通過被阻礙的問題。The vapor deposition source DS has a
於筒狀體5之外底壁53,係隔著間隔地立設有複數個棒狀的腳片54。又,於構成本實施形態之外側壁的筒狀體5之外周壁55,係以從坩堝4的內底壁42起相同的高度位置且在周方向上隔著間隔地立設有複數個棒狀的間隔構件56。在大氣壓下的真空腔1內將筒狀體5設置於坩堝4的情況,於坩堝4的上面開口41,係從該腳片54側插入筒狀體5,並一邊使各間隔構件56沿著構成本實施形態之內側壁的坩堝4的內周面43滑動一邊使筒狀體5移動至下方。接著,若各腳片54抵接於坩堝4的內底面42,則於坩堝4筒狀體5係同心地定位設置。在此狀態下,於坩堝4的內周面43與筒狀體5的外周壁55之間,區劃出由相當於間隔構件56之長度的間隙W1所構成的第1空間6a,除此之外,於坩堝4的內底面42與筒狀體5的外底壁53之間,區劃出由相當於間隔構件56之長度的間隙W2所構成的第2空間6b。A plurality of rod-
腳片54或間隔構件56的長度,係為了能夠在以使真空腔1成為了真空氛圍的狀態下來藉由加熱手段Ht將坩堝4加熱時,藉由來自此坩堝4的輻射而可有效率地加熱,並藉由第1空間6a及第2空間6b的傳導來使已昇華的有機材料可從金屬網格之各網眼52經過第1空間6a及第2空間6b而有效率地導引至坩堝4的上面開口41,而設定為1mm~30mm之範圍。在將筒狀體5內插至坩堝4之後,於筒狀體5填充昇華性的有機材料7。The length of the
作為被使用於本實施形態之蒸鍍源的蒸鍍之有機材料7,係可列舉三(8-羥基喹啉)鋁錯合物(Alq3
)或芳香族二胺等,成為粉末狀者係成為可從筒狀體5的上面開口被填充。即使如此般地於筒狀體5填充粉末狀的有機材料7,亦由於該等有機材料7具有凝聚性,因此幾乎不會從金屬網格之各網眼52漏出而會被堆積。另外,即使其一部分漏出,由於亦僅會堆積於坩堝4的內底面42上,並於其後在坩堝4被加熱時昇華,而經過第1空間6a及第2空間6b而被導引至坩堝4的上面開口41,因此並不會產生特別的問題。Examples of the vapor-deposited
在此,如上述般的有機材料7,一般而言導熱率為差,並且與經過液相來氣化的材料不同,加熱時,在坩堝內的材料不會產生對流。因此,在如同以往例一般地將有機材料7直接填充於坩堝Pc內來進行蒸鍍的情況時,如第2圖(a)所示般地,若藉由圖外的加熱手段而將坩堝Pc加熱,則會從接觸到直接導熱的坩堝Pc之壁面的有機材料7開始來進行昇華,然而,從面向坩堝Pc的上面開口Po之所填充的有機材料7之上層部分Pu起,雖然已昇華的有機材料7a會通過坩堝Pc的上面開口Po來朝向基板(未圖示)飛散,但是,在位置於較其更下方的下層部分Pd,已昇華的有機材料7b會與存在其周圍之較低溫(換言之,尚未被加熱至昇華溫度)的有機材料7碰撞而恢復為固體。其結果,由於已昇華的有機材料7只會從有限的範圍飛散,因此在相同的壓力下之每單位時間的昇華量為少,對於被蒸鍍物之蒸鍍速率係為低。Here, the
相對於此,於本實施形態之蒸鍍源DS中,當在真空氛圍中對於基板Sw蒸鍍有機材料7的情況時,若藉由加熱手段Ht將坩堝4加熱,則會從藉由來自坩堝4的輻射熱而通過各網眼52來被直接加熱的有機材料7或從藉由輻射熱而被加熱的金屬網格之線材51所直接導熱的有機材料7開始而進行昇華。此已昇華的有機材料71當中,從所填充的有機材料7之上層部分,係直接通過坩堝4的上面開口41,且從所填充的有機材料7之下層部分,係藉由第1空間6a與第2空間6b之傳導,而從第1空間6a、及從第2空間6b經過第1空間6a,而被導引至坩堝4的上面開口41,並從此噴出口朝向基板Sw飛散。On the other hand, in the evaporation source DS of this embodiment, when the
如此般地,於本實施形態中,係已昇華的有機材料71幾乎都會從金屬網格之各網眼52而被取出,而盡可能地抑制其與較低溫的材料(也就是說,非加熱的材料)碰撞而恢復為固體(換言之,由於已昇華的材料會飛散而使面積增加),因此,相較於已昇華的材料只會從有限的範圍飛散之上述以往例者,係能夠使昇華量飛躍性地增加,而可提高對於被蒸鍍物之蒸鍍速率。也就是說,如第3圖所示般地,若測定對於坩堝4,Pc之加熱溫度的蒸鍍速率,則相較於以-〇-線所示之以往例者,於以-●-線所示之本發明之實施形態者中,係可得到1.1~2倍的蒸鍍速率。In this way, in the present embodiment, the sublimated
以上,雖針對本發明之實施形態作了說明,但在不脫離本發明之技術思想的範圍內,可進行各種之變形。於上述實施形態中,作為內容器,係以將金屬網格成形成筒狀者為例來作說明,但並不限定於此,可使用將衝孔金屬般地於金屬製板材上開設有圓形或是狹縫狀的開口(透孔)者成形成筒狀者、或將多孔金屬網成形成筒狀者,其他,亦可藉由多孔質之陶瓷來構成上述筒狀體,又,於內容器之底壁不一定要有透孔。於此情況中,透孔的孔徑,係只要是可容許已昇華的有機材料通過者則無特別限制,又,全透孔之合計總面積的相對於筒狀體之外表面積之比,係考慮蒸鍍速率來適當設定。Although the embodiments of the present invention have been described above, various modifications can be made without departing from the technical idea of the present invention. In the above-mentioned embodiment, the inner container is described by taking the metal mesh into a cylindrical shape as an example, but it is not limited to this, and it is possible to use a punching metal as a circle on a metal plate The shape or slit-shaped opening (through hole) is formed into a cylindrical shape, or the porous metal mesh is formed into a cylindrical shape, and the above cylindrical body can also be constituted by porous ceramics. The bottom wall of the inner container does not have to have through holes. In this case, the pore size of the through-hole is not particularly limited as long as it permits the passage of sublimated organic materials, and the ratio of the total area of the total through-holes to the surface area outside the cylindrical body is considered The evaporation rate is appropriately set.
又,於上述實施形態中,作為外容器,係以藉由在上面作了開口的坩堝4構成者為例進行說明,但為了調整第1空間6a及第2空間6b的傳導度,亦可於坩堝4的上面,安裝至少設置有1個噴射噴嘴的蓋體。於此情況中,作為外容器,雖無特別圖示來說明,但亦可使用將噴射噴嘴排列設置於收容箱的上面者(所謂線狀來源)。In addition, in the above-mentioned embodiment, the outer container is described by taking the
Dm‧‧‧真空蒸鍍裝置
DS‧‧‧真空蒸鍍裝置用之蒸鍍源
Ht‧‧‧加熱手段
Sw‧‧‧基板(被蒸鍍物)
1‧‧‧真空腔
4‧‧‧坩堝(外容器)
41‧‧‧上面開口(噴出口)
5‧‧‧筒狀體(內容器)
52‧‧‧網眼(透孔)Dm‧‧‧vacuum evaporation device
DS‧‧‧Vapor deposition source for vacuum evaporation equipment
Ht‧‧‧Heating means
Sw‧‧‧substrate (to be deposited)
1‧‧‧
[第1圖](a),係示意性地展示具備本發明之實施形態的蒸鍍源之真空蒸鍍裝置的剖面圖。(b),係將蒸鍍源分解來說明的剖面圖。 [第2圖](a),係展示來自本發明之蒸鍍源的已昇華的材料之飛散的樣子的部分放大剖面圖。(b),係展示來自以往例之蒸鍍源的已昇華的材料之飛散的樣子的部分放大剖面圖。 [第3圖]係說明相對於加熱溫度之蒸鍍速率的變化的圖表。[Figure 1] (a) is a cross-sectional view schematically showing a vacuum vapor deposition apparatus provided with a vapor deposition source according to an embodiment of the present invention. (b) is a cross-sectional view for explaining the decomposition of the vapor deposition source. [Figure 2] (a) is a partially enlarged cross-sectional view showing how the sublimated material from the vapor deposition source of the present invention is scattered. (b) is a partially enlarged cross-sectional view showing how the sublimated material from the conventional deposition source has scattered. [Figure 3] A graph illustrating the change in the vapor deposition rate with respect to the heating temperature.
Pc‧‧‧坩堝 Pc‧‧‧Crucible
Po‧‧‧上面開口 Po‧‧‧Open above
Pu‧‧‧上層部分 Pu‧‧‧ Upper part
Pd‧‧‧下層部分 Pd‧‧‧Lower part
Ht‧‧‧加熱手段 Ht‧‧‧Heating means
4‧‧‧坩堝(外容器) 4‧‧‧Crucible (outer container)
5‧‧‧筒狀體(內容器) 5‧‧‧Cylinder (inner container)
6a‧‧‧第1空間 6a‧‧‧First Space
6b‧‧‧第2空間 6b‧‧‧ 2nd space
7、7a、7b、7c‧‧‧有機材料 7, 7a, 7b, 7c ‧‧‧ organic materials
41‧‧‧上面開口 41‧‧‧Open above
43‧‧‧內周面 43‧‧‧Inner peripheral surface
51‧‧‧線材 51‧‧‧Wire
52‧‧‧網眼(透孔) 52‧‧‧mesh (through hole)
53‧‧‧外底壁 53‧‧‧Outer bottom wall
54‧‧‧腳片 54‧‧‧Foot
55‧‧‧外周壁 55‧‧‧Outer wall
56‧‧‧間隔構件 56‧‧‧Spacer
71‧‧‧有機材料 71‧‧‧ organic materials
Claims (2)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018-110671 | 2018-06-08 | ||
JP2018110671 | 2018-06-08 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW202000955A true TW202000955A (en) | 2020-01-01 |
Family
ID=68770004
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW108117013A TW202000955A (en) | 2018-06-08 | 2019-05-17 | Vapor deposition source for vacuum vapor deposition apparatus |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP6918233B2 (en) |
KR (1) | KR102453030B1 (en) |
CN (1) | CN111108230A (en) |
TW (1) | TW202000955A (en) |
WO (1) | WO2019235118A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7444843B2 (en) * | 2021-12-02 | 2024-03-06 | キヤノントッキ株式会社 | Deposition crucible and deposition equipment |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010001529A (en) | 2008-06-20 | 2010-01-07 | Seiko Epson Corp | Vapor deposition source, and vapor deposition apparatus |
JP4468474B1 (en) * | 2008-12-24 | 2010-05-26 | 三菱重工業株式会社 | Vacuum deposition apparatus and temperature adjustment method |
JP2013209696A (en) * | 2012-03-30 | 2013-10-10 | Samsung Display Co Ltd | Vacuum deposition device and vapor deposition source of the same |
KR20140103583A (en) * | 2013-02-18 | 2014-08-27 | (주)와이에스썸텍 | Linear Evaporation Source |
JP6851143B2 (en) * | 2016-04-05 | 2021-03-31 | 株式会社アルバック | Evaporation source, vacuum deposition equipment and vacuum deposition method |
CN205662589U (en) * | 2016-05-16 | 2016-10-26 | 鄂尔多斯市源盛光电有限责任公司 | Coating by vaporization source and coating by vaporization device |
KR20180047087A (en) * | 2016-10-31 | 2018-05-10 | 한국표준과학연구원 | Inductive Heating Evaporation Deposition Apparatus |
-
2019
- 2019-05-08 WO PCT/JP2019/018352 patent/WO2019235118A1/en active Application Filing
- 2019-05-08 CN CN201980004684.3A patent/CN111108230A/en active Pending
- 2019-05-08 KR KR1020207033597A patent/KR102453030B1/en active IP Right Grant
- 2019-05-08 JP JP2020523574A patent/JP6918233B2/en active Active
- 2019-05-17 TW TW108117013A patent/TW202000955A/en unknown
Also Published As
Publication number | Publication date |
---|---|
KR20210002607A (en) | 2021-01-08 |
KR102453030B1 (en) | 2022-10-11 |
WO2019235118A1 (en) | 2019-12-12 |
JPWO2019235118A1 (en) | 2020-12-17 |
CN111108230A (en) | 2020-05-05 |
JP6918233B2 (en) | 2021-08-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101450339B1 (en) | Evaporation source and vacuum evaporator using the same | |
EP1803836B1 (en) | Evaporation source and method of depositing thin film using the same | |
US7359630B2 (en) | Evaporation source for evaporating an organic electroluminescent layer | |
KR100805531B1 (en) | Evaporation source | |
JP2007128898A (en) | Deposition source for organic electroluminescent film deposition | |
JPWO2018199184A1 (en) | Evaporation source and film forming apparatus | |
TW202000955A (en) | Vapor deposition source for vacuum vapor deposition apparatus | |
KR101418712B1 (en) | Evaporation source and Apparatus for deposition having the same | |
JP7223632B2 (en) | Evaporation source for vacuum deposition equipment | |
KR101754802B1 (en) | Evaporation Apparatus And Evaporation Deposition Apparatus | |
KR101660393B1 (en) | Evaporation source and Apparatus for deposition having the same | |
JP2023075126A (en) | Vapor deposition apparatus and method for coating substrate in vacuum chamber | |
KR101772621B1 (en) | Downward Evaporation Apparatus And Downward Evaporation Deposition Apparatus | |
JP7078462B2 (en) | Thin-film deposition source for vacuum-film deposition equipment | |
KR100730172B1 (en) | Apparatus for depositing organic thin film | |
KR100656820B1 (en) | Source for depositing electroluminescent layer | |
KR20190106120A (en) | OLED Source | |
KR100987670B1 (en) | Source for depositing electroluminescent layer | |
KR100656535B1 (en) | Source for depositing electroluminescent layer comprising the adiabatic layer | |
KR100669194B1 (en) | Device for depositing organic electro-luminescent element | |
KR100889761B1 (en) | Heating crucible for forming apparatus of organic thin film | |
KR20050024548A (en) | Source for depositing electroluminescent layer | |
KR20050082838A (en) | Source for depositing electroluminescent layer | |
KR20050016845A (en) | Source for depositing electroluminescent layer |