TW201932237A - Setup method of cutting apparatus detecting a position of the cutting unit when electrical conduction between the chuck table and the cutting blade is detected - Google Patents

Setup method of cutting apparatus detecting a position of the cutting unit when electrical conduction between the chuck table and the cutting blade is detected Download PDF

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Publication number
TW201932237A
TW201932237A TW108102468A TW108102468A TW201932237A TW 201932237 A TW201932237 A TW 201932237A TW 108102468 A TW108102468 A TW 108102468A TW 108102468 A TW108102468 A TW 108102468A TW 201932237 A TW201932237 A TW 201932237A
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cutting
reference position
unit
chuck table
holding surface
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TW108102468A
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TWI772601B (en
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笠井剛史
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日商迪思科股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0058Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0058Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
    • B28D5/0082Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/02Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
    • B28D5/022Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67092Apparatus for mechanical treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67259Position monitoring, e.g. misposition detection or presence detection

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Dicing (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Confectionery (AREA)
  • Treatment Of Fiber Materials (AREA)

Abstract

A reference position of a cutting unit is appropriately derived. A setup method of a cutting apparatus is provided; the cutting apparatus comprises a set-up unit for detecting the position of the cutting unit when the electrical conduction between the chuck table and the cutting blade is detected. The cutting apparatus setup method uses the cutting apparatus to set the position of the cutting unit as a reference position when the cutting blade is brought into contact with the chuck table. The cutting apparatus setup method comprises: a temporary reference position registration step for moving the cutting unit and registering the position where the electrical conduction is detected as a temporary reference position; and a contact mark determination step for determining the presence or absence of a contact mark of the cutting blade. When the contact mark determination step determines that the contact mark is present, a reference position setting step is performed such that the temporary reference position is set as the reference position. When it is determined in the contact mark determination step that there is no contact mark, the temporary reference position registration step and the contact mark determination step are carried out again.

Description

切割裝置的設定方法Setting method of cutting device

本發明關於一種以切割刀片切割工件的切割裝置的設定方法。The invention relates to a setting method of a cutting device for cutting a workpiece with a cutting blade.

搭載有半導體元件的元件晶片是將半導體晶圓或封裝基板等分割而形成。藉由交叉的多條分割預定線劃分半導體晶圓等的正面,在所劃分的各區域中形成半導體元件,之後,沿著分割預定線將該半導體晶圓等進行分割即可形成各個元件晶片。An element wafer on which a semiconductor element is mounted is formed by dividing a semiconductor wafer, a package substrate, or the like. The front of a semiconductor wafer or the like is divided by a plurality of intersecting division lines, and a semiconductor element is formed in each of the divided regions. Then, the semiconductor wafer or the like is divided along the division line to form each element wafer.

半導體晶圓等的分割,例如可使用具備切割單元的切割裝置,切割單元還裝設有圓環狀切割刀片。切割裝置中使切割刀片在相對於半導體晶圓等工件的正面垂直的平面上旋轉,並使切割刀片下降至切入進給方向的預定高度位置,將工件在沿著分割預定線的方向上加工進給而以切割刀片切割工件。For the division of semiconductor wafers, for example, a dicing device having a dicing unit can be used, and the dicing unit is also provided with a circular dicing blade. In the dicing apparatus, the dicing blade is rotated on a plane perpendicular to the front surface of a workpiece such as a semiconductor wafer, and the dicing blade is lowered to a predetermined height position in the cutting feed direction, and the workpiece is processed in a direction along a predetermined division line A cutting blade is used to cut the workpiece.

將工件進行切割時,以使切割刀片的刀刃的下端位於適當的高度位置的方式將該切割單元定位於基準位置,此點十分重要。該基準位置例如為使切割刀片的刀刃的下端對準保持工件的卡盤台的保持面的高度位置時,切割單元的高度位置(在切入進給方向上的位置)。在實施切割之前,實施導出該基準位置的設定程序。When cutting a workpiece, it is important to position the cutting unit at a reference position such that the lower end of the cutting edge of the cutting blade is positioned at an appropriate height position. This reference position is, for example, the height position (position in the cutting feed direction) of the cutting unit when the lower end of the cutting edge of the cutting blade is aligned with the height position of the holding surface of the chuck table holding the workpiece. Before the cutting is performed, a setting procedure for deriving the reference position is performed.

設定程序中,例如,在使切割刀片旋轉的狀態下使切割單元逐漸下降,使切割刀片接觸卡盤台的保持面。卡盤台與切割刀片接觸時切割單元在切入進給方向上的位置成為切割單元的基準位置。卡盤台與切割刀片的接觸,例如可藉由監測兩者之間有無通電來檢測(參照專利文獻1及專利文獻2)。In the setting procedure, for example, the cutting unit is gradually lowered while the cutting blade is rotated, and the cutting blade is brought into contact with the holding surface of the chuck table. When the chuck table contacts the cutting blade, the position of the cutting unit in the feed direction becomes the reference position of the cutting unit. The contact between the chuck table and the cutting blade can be detected, for example, by monitoring the presence or absence of power between the two (see Patent Literature 1 and Patent Literature 2).

[習知技術文獻]
[專利文獻]
[專利文獻1] 日本實開平7-10552號公報
[專利文獻2] 日本特開2010-251577號公報
[Xizhi technical literature]
[Patent Literature]
[Patent Document 1] Japanese Shikaihei 7-10552
[Patent Document 2] Japanese Patent Laid-Open No. 2010-251577

[發明所欲解決的課題]
另外,當以切割刀片切割工件時,會從工件產生切割屑而飛散。又,因工件與切割刀片之間的摩擦而產生加工熱。於是,在以切割刀片切割工件時對工件或切割刀片供給純水等的切割液。因切割所產生的加工屑被切割液帶走而去除,又,藉由該切割液將切割刀片及工件冷卻。另一方面,若使用切割液,則有該切割液附著於切割刀片或卡盤台而殘留的情況。
[Problems to be Solved by the Invention]
In addition, when a workpiece is cut with a cutting blade, cutting chips are generated from the workpiece and scattered. In addition, processing heat is generated due to friction between the workpiece and the cutting blade. Then, when the workpiece is cut with a cutting blade, a cutting liquid such as pure water is supplied to the work or the cutting blade. The cutting chips generated by the cutting are removed by the cutting liquid, and the cutting blade and the workpiece are cooled by the cutting liquid. On the other hand, when a cutting fluid is used, the cutting fluid may adhere to a cutting blade or a chuck table and may remain.

若該切割液附著於切割刀片或卡盤台,則在設定程序中,在切割單元到達應為基準位置高度之前,會有切割刀片與卡盤台透過切割液而通電的情況。若檢測到透過切割液的傳導,就會導出不適當的位置作為切割單元的基準位置。If the cutting fluid is attached to the cutting blade or the chuck table, in the setting procedure, the cutting blade and the chuck table may be energized through the cutting liquid before the cutting unit reaches the height which should be the reference position. If conduction through the cutting fluid is detected, an inappropriate position is derived as the reference position of the cutting unit.

該基準位置是決定以切割刀片進行切割加工的精確度的非常重要的基準,若將不適當的高度位置登錄作為切割單元的基準位置,則有無法以切割刀片適當切割工件的情況。This reference position is a very important reference for determining the accuracy of the cutting process with the cutting blade. If an inappropriate height position is registered as the reference position of the cutting unit, the workpiece cannot be appropriately cut with the cutting blade.

本發明為鑑於此問題點而完成,其目的在於提供一種可適當地導出切割單元的基準位置的切割裝置的設定方法。The present invention has been made in view of this problem, and an object thereof is to provide a method for setting a cutting device that can appropriately derive a reference position of a cutting unit.

[解決課題的技術手段]
根據本發明的一態樣,可提供一種切割裝置的設定方法,切割裝置具備:卡盤台,具有保持面,以將工件保持於該保持面上;切割單元,以切割刀片切割保持於該卡盤台上的工件,同時對該工件及該切割刀片供給切割液;切入進給單元,使該切割單元在與該保持面垂直的切入進給方向上移動;攝影機,拍攝保持於該卡盤台上的工件;及設定單元,能夠檢測該卡盤台及該切割刀片之間的通電,且在藉由該切入進給單元使該切割單元移動而該通電被檢測到時,能夠檢測該切割單元在該切入進給方向上的位置,該切割裝置的設定方法為在該切割裝置中,將該切割刀片接觸該卡盤台時該切割單元的位置導出作為基準位置,其中,該切割裝置的設定方法具備:暫時基準位置登錄步驟,使該切割單元朝向該保持面而在該切入進給方向上移動,將檢測到該切割刀片及該卡盤台之間的通電時該切割單元在該切入進給方向上的位置登錄作為暫時基準位置;及接觸痕判定步驟,在實施該暫時基準位置登錄步驟後,以該攝影機拍攝該保持面,判定有無因該切割刀片與該卡盤台的接觸而在該保持面上形成的接觸痕,在該接觸痕判定步驟中判定具有該接觸痕的情況下,實施基準位置設定步驟,將該暫時基準位置設定為該基準位置,在該接觸痕判定步驟中判定無該接觸痕的情況下,再次實施該暫時基準位置登錄步驟及該接觸痕判定步驟。
[Technical means to solve the problem]
According to an aspect of the present invention, a setting method of a cutting device is provided. The cutting device includes a chuck table having a holding surface to hold a workpiece on the holding surface, and a cutting unit to cut and hold the card with a cutting blade. The workpiece on the tray table is simultaneously supplied with cutting fluid to the workpiece and the cutting blade; a cutting-in feed unit moves the cutting unit in a cutting-in feed direction perpendicular to the holding surface; a camera is photographed and held on the chuck table And a setting unit that can detect the energization between the chuck table and the cutting blade, and can detect the cutting unit when the cutting unit is moved by the infeed unit and the energization is detected. At the position in the cutting feed direction, the setting method of the cutting device is that in the cutting device, the position of the cutting unit when the cutting blade contacts the chuck table is derived as a reference position, wherein the setting of the cutting device is The method includes a temporary reference position registration step, the cutting unit is moved toward the holding surface in the cutting feed direction, and the cutting blade is detected And the registration position of the cutting unit in the cutting feed direction when power is applied between the chuck table as a temporary reference position; and a contact mark determination step, after implementing the temporary reference position registration step, photographing the holding with the camera And determine whether there is a contact mark formed on the holding surface due to the contact between the cutting blade and the chuck table. When it is determined that the contact mark exists in the contact mark determination step, a reference position setting step is performed, and The temporary reference position is set as the reference position, and when it is determined that the contact mark is not present in the contact mark determination step, the temporary reference position registration step and the contact mark determination step are performed again.

較佳地,在該接觸痕判定步驟中判定無該接觸痕的情況下,於再次實施該暫時基準位置登錄步驟之前,實施噴吹氣體步驟,對該保持面吹氣以將附著於該保持面上的該切割液去除。Preferably, in the case where it is determined that the contact mark is absent in the contact mark determination step, before performing the temporary reference position registration step again, a gas blowing step is performed to blow the holding surface to adhere to the holding surface. This cutting fluid is removed.

[發明功效]
涉及本發明的一態樣的切割裝置的設定方法,為實施暫時基準位置登錄步驟,將檢測到切割刀片及卡盤台之間的通電時切割單元的高度位置(在切入進給方向上的位置)登錄作為暫時基準位置。
[Inventive effect]
In the setting method of the cutting device according to one aspect of the present invention, in order to implement the temporary reference position registration step, the height position of the cutting unit (the position in the cutting feed direction) when the energization between the cutting blade and the chuck table is detected ) Register as a temporary reference position.

將切割單元定位於應為基準位置的高度位置,切割刀片與卡盤台接觸而檢測到兩者之間的通電時,因切割刀片稍微切割卡盤台的保持面,而在該保持面形成接觸痕。另一方面,保持面附著有切割液而透過該切割液檢測到通電的情況下,切割單元未到達應為基準位置的高度位置而未切割卡盤台的保持面,故未在該保持面形成接觸痕。Position the cutting unit at a height that should be the reference position. When the cutting blade is in contact with the chuck table and the energization between the two is detected, the cutting blade slightly cuts the holding surface of the chuck table to make contact on the holding surface. mark. On the other hand, when a cutting fluid is adhered to the holding surface and the current is detected through the cutting fluid, the cutting unit does not reach the height position that should be the reference position and the holding surface of the chuck table is not cut, so it is not formed on the holding surface. Contact marks.

於是,在本發明的一態樣中實施接觸痕判定步驟,以攝影機拍攝卡盤台的保持面,判定有無切割刀片的接觸痕。在判定該保持面具有接觸痕的情況下,確認已藉由暫時基準位置登錄步驟而適當實施設定程序,故實施基準位置設定步驟,將已登錄的暫時基準位置設定為基準位置。Then, in one aspect of the present invention, a contact mark determination step is performed, and the holding surface of the chuck table is photographed with a camera to determine the presence or absence of a contact mark of the cutting blade. When it is determined that the holding surface has a contact mark, it is confirmed that the setting procedure has been appropriately implemented by the temporary reference position registration step. Therefore, the reference position setting step is performed to set the registered temporary reference position as the reference position.

另一方面,在判定該保持面無接觸痕的情況下,確認未適當實施設定程序,故再次實施暫時基準位置登錄步驟及接觸痕判定步驟。On the other hand, when it is determined that there is no contact mark on the holding surface, it is confirmed that the setting procedure is not properly performed, and therefore the temporary reference position registration step and the contact mark determination step are performed again.

如上所述,可藉由判定有無形成於該保持面的該接觸痕而適當實施設定程序,進而可適當地導出切割單元的基準位置。As described above, the setting program can be appropriately implemented by determining the presence or absence of the contact mark formed on the holding surface, and the reference position of the cutting unit can be appropriately derived.

因此,根據本發明之一態樣,提供一種切割裝置的設定方法,可適當地導出切割單元的基準位置。Therefore, according to an aspect of the present invention, a method for setting a cutting device is provided, and a reference position of a cutting unit can be appropriately derived.

參照圖式對涉及本發明的一態樣的實施方式進行說明。首先,使用圖1對實施涉及本實施方式的設定方法的切割裝置、及被該切割裝置進行切割的工件進行說明。圖1為示意性地表示切割裝置及工件的立體圖。工件1例如為由矽、SiC(碳化矽)、或其他半導體等的材料、或是藍寶石、玻璃、石英等的材料所構成的略圓板狀基板等。An embodiment according to one aspect of the present invention will be described with reference to the drawings. First, the cutting apparatus which implements the setting method concerning this embodiment, and the workpiece | work cut by this cutting apparatus are demonstrated using FIG. 1. FIG. FIG. 1 is a perspective view schematically showing a cutting device and a workpiece. The workpiece 1 is, for example, a substantially circular plate-shaped substrate made of a material such as silicon, SiC (silicon carbide), or other semiconductors, or a material such as sapphire, glass, or quartz.

以排列成網格狀的多條分割預定線劃分工件1的正面,在所劃分的各區域中形成IC等的元件。最終沿著該分割預定線將工件1分割,藉此形成各個元件晶片。例如,將工件1保持於貼在環狀框架3的膠膜5上,在與框架3、膠膜5形成一體的框架單元的狀態下進行切割。適當切割工件1的情況下,下述切割刀片的刀刃的下端會到達該膠膜5。The front surface of the workpiece 1 is divided by a plurality of predetermined division lines arranged in a grid shape, and elements such as ICs are formed in the divided regions. Finally, the workpiece 1 is divided along the predetermined division line, thereby forming each element wafer. For example, the workpiece 1 is held on the adhesive film 5 attached to the ring-shaped frame 3 and cut in a state where the frame unit is integrated with the frame 3 and the adhesive film 5. When the workpiece 1 is appropriately cut, the lower end of the cutting edge of the cutting blade described below reaches the adhesive film 5.

接著,對切割裝置進行說明。如圖1所示,切割裝置2具備支撐各構成要件的裝置基台4。在裝置基台4的中央上部配設有X軸移動台6、及使該X軸移動台6在加工進給方向(X軸方向)上移動的加工進給單元(未圖示)。在該X軸移動台6的上部的端部安裝有覆蓋該加工進給單元的防塵防滴蓋8。Next, the cutting device will be described. As shown in FIG. 1, the cutting device 2 includes a device base 4 that supports each constituent element. An X-axis moving table 6 and a processing feed unit (not shown) that moves the X-axis moving table 6 in the processing feed direction (X-axis direction) are arranged on the center upper part of the device base 4. A dust-proof and drip-proof cover 8 covering the processing feed unit is attached to the upper end of the X-axis moving table 6.

在X軸移動台6上設有用以吸引保持工件1的卡盤台10。卡盤台10具備形成有向上方開口的凹部的圓盤狀框體10c、及配設於該凹部內的多孔質構件,該多孔質構件的上表面成為吸引、保持工件1的保持面10a。該多孔質構件透過形成於卡盤台10內部的流路(未圖示)與吸引源(未圖示)連接。將工件1載置於該保持面10a上,施加負壓即可吸引保持工件1。A chuck table 10 for attracting and holding the work 1 is provided on the X-axis moving table 6. The chuck table 10 includes a disc-shaped frame 10 c formed with a recessed portion that opens upward, and a porous member disposed in the recessed portion. The upper surface of the porous member is a holding surface 10 a that attracts and holds the workpiece 1. This porous member is connected to a suction source (not shown) through a flow path (not shown) formed inside the chuck table 10. The workpiece 1 is placed on the holding surface 10 a, and a negative pressure is applied to attract and hold the workpiece 1.

在該保持面10a的周圍配設有夾具10b,其用以固定透過膠膜5保持該工件1的環狀框架3。卡盤台10與馬達等的旋轉驅動源(未圖示)連結,而可繞著與該保持面10a垂直的旋轉軸旋轉。又,藉由上述加工進給單元將卡盤台10送至加工進給方向(X軸方向)。Around the holding surface 10a, a jig 10b is arranged to fix the ring-shaped frame 3 holding the workpiece 1 through the adhesive film 5. The chuck table 10 is connected to a rotation drive source (not shown) such as a motor, and is rotatable about a rotation axis perpendicular to the holding surface 10a. Moreover, the chuck table 10 is sent to a processing feed direction (X-axis direction) by the processing feed unit.

在裝置基台4的前部配設有可載置容納工件1的卡匣12a的卡匣載置台12。切割裝置2具備搬送單元(未圖示),其在載置於卡匣載置台12的卡匣12a與卡盤台10之間搬送工件1。A cassette mounting table 12 on which a cassette 12 a for accommodating the workpiece 1 is placed is arranged at the front of the apparatus base 4. The cutting device 2 includes a transfer unit (not shown) that transfers the workpiece 1 between the cassette 12 a and the chuck table 10 placed on the cassette mounting table 12.

在裝置基台4的上表面,以在X軸移動台6的上方突出的方式配置有支撐部16,以支撐切割工件1的切割單元14。在支撐部16的前面配設有使切割單元14在分度進給方向(Y軸方向)上移動的分度進給單元18a。A support portion 16 is disposed on the upper surface of the device base 4 so as to protrude above the X-axis moving table 6 to support the cutting unit 14 that cuts the workpiece 1. An index feeding unit 18 a for moving the cutting unit 14 in the index feeding direction (Y-axis direction) is disposed on the front surface of the support portion 16.

分度進給單元18a具備配置於支撐部16的前面且與Y軸方向平行的一對Y軸導軌20。Y軸移動板22可滑動地安裝於Y軸導軌20上。在Y軸移動板22的背面側(後面側)設有螺帽部(未圖示),與Y軸導軌20平行的Y軸滾珠螺桿24螺合於該螺帽部。The indexing feed unit 18 a includes a pair of Y-axis guides 20 arranged in front of the support portion 16 and parallel to the Y-axis direction. The Y-axis moving plate 22 is slidably mounted on the Y-axis guide 20. A nut portion (not shown) is provided on the back side (rear side) of the Y-axis moving plate 22, and a Y-axis ball screw 24 parallel to the Y-axis guide 20 is screwed to the nut portion.

在Y軸滾珠螺桿24的一端部上連結有Y軸脈衝馬達(未圖示)。若以Y軸脈衝馬達使Y軸滾珠螺桿24旋轉,則Y軸移動板22沿著Y軸導軌20在分度進給方向上移動。在Y軸移動板22的正面(前面)配設有使切割單元14在切入進給方向(Z軸方向)上移動的切入進給單元18b。A Y-axis pulse motor (not shown) is connected to one end of the Y-axis ball screw 24. When the Y-axis ball screw 24 is rotated by a Y-axis pulse motor, the Y-axis moving plate 22 moves along the Y-axis guide 20 in the index feed direction. A cut-in feed unit 18 b that moves the cutting unit 14 in the cut-in feed direction (Z-axis direction) is provided on the front (front) of the Y-axis moving plate 22.

在Y軸移動板22的表面設有與Z軸方向平行的一對Z軸導軌26。Z軸移動板28可滑動地安裝於各Z軸導軌26上。A pair of Z-axis guides 26 are provided on the surface of the Y-axis moving plate 22 in parallel with the Z-axis direction. The Z-axis moving plate 28 is slidably mounted on each Z-axis guide 26.

在Z軸移動板28的背面側(後面側)設有螺帽部(未圖示),與Z軸導軌26平行的Z軸滾珠螺桿30螺合於該螺帽部。在Z軸滾珠螺桿30的一端部上連結有Z軸脈衝馬達32。若以Z軸脈衝馬達32使Z軸滾珠螺桿30旋轉,則Z軸移動板28沿著Z軸導軌26在切入進給方向上移動。A nut portion (not shown) is provided on the back side (rear side) of the Z-axis moving plate 28, and a Z-axis ball screw 30 parallel to the Z-axis guide 26 is screwed to the nut portion. A Z-axis pulse motor 32 is connected to one end of the Z-axis ball screw 30. When the Z-axis ball screw 30 is rotated by the Z-axis pulse motor 32, the Z-axis moving plate 28 moves in the plunging feed direction along the Z-axis guide 26.

在Z軸移動板28的前面下部固定有將保持於卡盤台10上的工件1進行切割的切割單元14、及可拍攝該工件1的攝影機(攝像單元)34。若使Y軸移動板22在Y軸方向上移動,則切割單元14及攝影機34在分度進給方向上移動,若使Z軸移動板28在Z軸方向上移動,則切割單元14及攝影機34在切入進給方向上移動。A cutting unit 14 that cuts the workpiece 1 held on the chuck table 10 and a camera (imaging unit) 34 that can capture the workpiece 1 are fixed to the lower portion of the front of the Z-axis moving plate 28. If the Y-axis moving plate 22 is moved in the Y-axis direction, the cutting unit 14 and the camera 34 are moved in the index feed direction, and if the Z-axis moving plate 28 is moved in the Z-axis direction, the cutting unit 14 and the camera are moved 34 moves in the plunging feed direction.

切割單元14具備構成與Y軸方向平行的旋轉軸的主軸40(參照圖2(A))、及裝設於該主軸40的一端側的圓環狀切割刀片36。在主軸40的另一端側連結有馬達等的旋轉驅動源42(參照圖2(A)),若使旋轉驅動源42運作,則可使裝設於主軸40的切割刀片36旋轉。在切割刀片36的外周部固定有用以切入工件1的環狀切割刀刃。The cutting unit 14 includes a main shaft 40 (see FIG. 2 (A)) constituting a rotation axis parallel to the Y-axis direction, and an annular cutting blade 36 attached to one end side of the main shaft 40. A rotary driving source 42 (see FIG. 2 (A)) such as a motor is connected to the other end side of the spindle 40. When the rotary driving source 42 is operated, the cutting blade 36 mounted on the spindle 40 can be rotated. An annular cutting blade for cutting into the workpiece 1 is fixed to the outer peripheral portion of the cutting blade 36.

當以切割刀片36切割工件1時,會從工件1產生切割屑,在工件1上或切割裝置2的內部飛散而成為汙染源。又,由於工件1與切割刀片36之間的摩擦而產生加工熱,進而有對切割刀片36或工件1造成損傷的疑慮。於是,在切割工件1時,對切割刀片36及工件1供給切割液。When the workpiece 1 is cut with the cutting blade 36, cutting chips are generated from the workpiece 1, and are scattered on the workpiece 1 or inside the cutting device 2 and become a source of pollution. In addition, processing heat is generated due to friction between the work 1 and the cutting blade 36, and there is a concern that the cutting blade 36 or the work 1 may be damaged. Then, when the work 1 is cut, the cutting blade 36 and the work 1 are supplied with a cutting liquid.

在切割刀片36的附近配設有對該切割刀片36及工件1供給該切割液的切割液供給噴嘴50(參照圖4)。因切割所產生的加工屑被切割液帶走而去除,故可抑制工件1或切割裝置2的汙染。又,可藉由該切割液將切割刀片36及工件1冷卻,故可抑制切割刀片36或工件1的損傷。該切割液例如為純水或添加有界面活性劑等的水。A cutting fluid supply nozzle 50 (see FIG. 4) that supplies the cutting fluid to the cutting blade 36 and the workpiece 1 is disposed near the cutting blade 36. The cutting chips generated by the cutting are taken away and removed by the cutting liquid, and contamination of the workpiece 1 or the cutting device 2 can be suppressed. In addition, since the cutting blade 36 and the workpiece 1 can be cooled by the cutting liquid, damage to the cutting blade 36 or the workpiece 1 can be suppressed. This cutting liquid is, for example, pure water or water to which a surfactant is added.

如圖1所示,在裝置基台4的上表面後部配設有清洗經切割的工件1的清洗單元38。清洗單元38具備保持工件1的清洗台38a、及對保持於清洗台38a的工件1供給清洗液以清洗工件1的清洗噴嘴38b。As shown in FIG. 1, a cleaning unit 38 for cleaning the cut workpiece 1 is arranged at the rear of the upper surface of the device base 4. The cleaning unit 38 includes a cleaning table 38 a that holds the workpiece 1, and a cleaning nozzle 38 b that supplies a cleaning liquid to the workpiece 1 held by the cleaning table 38 a to clean the workpiece 1.

在藉由切割單元14切割工件1時,首先,將框架單元狀態的工件1載置於卡盤台10的保持面10a上,對工件1施加負壓以使工件1吸引保持於卡盤台10上。此時,藉由夾具10b把持框架單元的框架3。When cutting the workpiece 1 by the cutting unit 14, first, the workpiece 1 in a frame unit state is placed on the holding surface 10 a of the chuck table 10, and a negative pressure is applied to the workpiece 1 to attract and hold the workpiece 1 on the chuck table 10. on. At this time, the frame 3 of the frame unit is held by the jig 10b.

接著,使卡盤台10在加工進給方向上移動,並藉由攝影機34拍攝保持於卡盤台10上的工件1的上表面,以確認工件1的分割預定線的位置。然後,調整切割單元14及卡盤台10的相對位置,以能夠沿著該分割預定線將工件1進行切割加工。Next, the chuck table 10 is moved in the processing feed direction, and the upper surface of the work 1 held on the chuck table 10 is photographed by the camera 34 to confirm the position of the predetermined division line of the work 1. Then, the relative positions of the cutting unit 14 and the chuck table 10 are adjusted so that the workpiece 1 can be cut along the predetermined division line.

之後,使切割刀片36在卡盤台10的外周側的上方旋轉,並使切入進給單元18b運作以使切割單元14下降至以基準位置為基準的預定高度位置。此處,基準位置為切割刀片36接觸卡盤台10時切割單元14在切入進給方向(Z軸方向)上的位置。接著,當使加工進給單元運作以使卡盤台10在加工進給方向上移動,而切割刀片36切入工件1時,就會將工件1進行切割。After that, the cutting blade 36 is rotated above the outer peripheral side of the chuck table 10, and the cutting feed unit 18b is operated to lower the cutting unit 14 to a predetermined height position based on the reference position. Here, the reference position is the position of the cutting unit 14 in the cutting feed direction (Z-axis direction) when the cutting blade 36 contacts the chuck table 10. Next, when the processing feed unit is operated to move the chuck table 10 in the processing feed direction and the cutting blade 36 cuts into the workpiece 1, the workpiece 1 is cut.

沿著一條分割預定線切割工件1後,藉由分度進給單元18a使切割單元14在分度進給方向上移動,再陸續沿著其他分割預定線切割工件1。在沿著排列於一個方向的全部分割預定線切割工件1後,使卡盤台10繞著與保持面10a垂直的軸旋轉,並沿著依照其他方向排列的分割預定線切割工件1。然後,若沿著全部分割預定線切割工件1,則切割加工完成。After cutting the workpiece 1 along a predetermined division line, the cutting unit 14 is moved in the index feeding direction by the index feeding unit 18a, and then the workpiece 1 is successively cut along other predetermined division lines. After cutting the workpiece 1 along all the planned division lines arranged in one direction, the chuck table 10 is rotated around an axis perpendicular to the holding surface 10a, and the workpiece 1 is cut along the planned division lines arranged in other directions. Then, if the workpiece 1 is cut along all the division lines, the cutting process is completed.

切割裝置2進一步具備設定單元44(參照圖2(A)),其實施在開始工件1的切割加工之前導出切割單元的基準位置的設定程序。此外,設定單元44亦可具備控制切割裝置2的各構成的控制單元(未圖示)。設定單元44透過主軸40(參照圖2(A))與切割刀片36電性連接,又,與卡盤台10的框體10c電性連接。The cutting device 2 further includes a setting unit 44 (see FIG. 2 (A)) that executes a setting program for deriving a reference position of the cutting unit before starting the cutting process of the workpiece 1. In addition, the setting unit 44 may include a control unit (not shown) that controls each configuration of the cutting device 2. The setting unit 44 is electrically connected to the cutting blade 36 through the main shaft 40 (see FIG. 2 (A)), and is also electrically connected to the frame 10 c of the chuck table 10.

設定程序中,使切割刀片36一邊旋轉一邊朝向保持面10a而在該切入進給方向上移動,以使該切割刀片36接觸卡盤台10的框體10c。該設定單元44藉由檢測切割刀片36與卡盤台10之間的通電而檢測兩者的接觸。然後,將檢測到切割刀片36與卡盤台10的接觸時切割單元14在切入進給方向上的位置登錄作為基準位置。In the setting procedure, the cutting blade 36 is moved in the cutting feed direction toward the holding surface 10 a while rotating, so that the cutting blade 36 contacts the housing 10 c of the chuck table 10. The setting unit 44 detects the contact between the cutting blade 36 and the chuck table 10 by detecting the energization between the cutting blade 36 and the chuck table 10. Then, the position of the cutting unit 14 in the cutting feed direction when contact between the cutting blade 36 and the chuck table 10 is detected is registered as a reference position.

然而,例如,在切割工件1時所供給的切割液殘留於卡盤台10的保持面10a上的情況下,在實施設定程序時,會有切割刀片36與卡盤台10透過該切割液而通電的情況。此情況下,儘管切割刀片36的刀刃的下端未到達卡盤台10,但是設定單元44檢測到兩者的接觸,而登錄不適當的位置作為基準位置。However, for example, if the cutting fluid supplied during cutting of the workpiece 1 remains on the holding surface 10a of the chuck table 10, the cutting blade 36 and the chuck table 10 may pass through the cutting liquid during the setting process. When power is applied. In this case, although the lower end of the cutting edge of the cutting blade 36 does not reach the chuck table 10, the setting unit 44 detects contact between the two, and an inappropriate position is registered as a reference position.

於是,涉及本實施方式的切割裝置2的設定方法中,為檢測由切割刀片36對卡盤台10的接觸而形成於保持面10a的接觸痕。然後,確認切割刀片36與卡盤台10有接觸而適當地導出切割單元14的基準位置。以下,對涉及本實施方式的切割裝置2的設定方法進行詳細敘述。Therefore, in the setting method of the cutting device 2 according to the present embodiment, a contact mark formed on the holding surface 10 a is used to detect the contact of the cutting blade 36 to the chuck table 10. Then, it is confirmed that the cutting blade 36 is in contact with the chuck table 10 and the reference position of the cutting unit 14 is appropriately led out. Hereinafter, a setting method of the cutting device 2 according to the present embodiment will be described in detail.

該設定方法具備暫時基準位置登錄步驟,將檢測到切割刀片36及卡盤台10之間的通電時切割單元14在該切入進給方向上的位置登錄作為暫時基準位置。使用圖2(A)對暫時基準位置登錄步驟進行說明。圖2(A)為示意性地表示暫時基準位置登錄步驟的剖面圖。This setting method includes a temporary reference position registration step of registering the position of the cutting unit 14 in the plunging feed direction when the energization between the cutting blade 36 and the chuck table 10 is detected as the temporary reference position. The temporary reference position registration procedure will be described using FIG. 2 (A). FIG. 2 (A) is a cross-sectional view schematically showing a temporary reference position registration step.

暫時基準位置登錄步驟中,首先,以將切割刀片36定位於卡盤台10的框體10c上方的方式使X軸移動台6移動,又,使分度進給單元18a運作。接著,使切入進給單元18b運作,並使切割單元14朝向保持面10a在切入進給方向上移動。In the temporary reference position registration step, first, the X-axis moving table 6 is moved so that the cutting blade 36 is positioned above the housing 10c of the chuck table 10, and the index feeding unit 18a is operated. Next, the cutting feed unit 18b is operated, and the cutting unit 14 is moved toward the holding surface 10a in the cutting feed direction.

此時,使設定單元44監測切割刀片36與卡盤台10之間有無通電。然後,在觀測到兩者的通電時,將切割單元14的高度位置登錄作為暫時基準位置。例如,設定單元44可具備暫時基準位置登錄部(未圖示),將該暫時基準位置登錄於暫時基準位置登錄部。此外,該暫時基準位置登錄部可配設於控制切割裝置2的控制單元(未圖示)。At this time, the setting unit 44 is caused to monitor the presence or absence of power between the cutting blade 36 and the chuck table 10. Then, when the energization of both is observed, the height position of the cutting unit 14 is registered as a temporary reference position. For example, the setting unit 44 may include a temporary reference position registration unit (not shown), and register the temporary reference position in the temporary reference position registration unit. The temporary reference position registration unit may be provided in a control unit (not shown) that controls the cutting device 2.

接著,實施接觸痕判定步驟。圖2(B)為示意性地表示接觸痕判定步驟的剖面圖。使用圖2(B)對接觸痕判定步驟進行說明。接觸痕判定步驟中,使攝影機34移動至保持面10a的欲使切割刀片36接觸的區域上方,並以攝影機34拍攝保持面10a。然後,判定有無形成於保持面10a的切割刀片36的接觸痕。Next, a contact mark determination step is performed. FIG. 2 (B) is a cross-sectional view schematically showing a contact mark determination step. The step of determining a contact mark will be described using FIG. 2 (B). In the contact mark determination step, the camera 34 is moved over the area of the holding surface 10 a where the cutting blade 36 is to be brought into contact, and the holding surface 10 a is captured by the camera 34. Then, it is determined whether there is a contact mark of the cutting blade 36 formed on the holding surface 10a.

圖3為示意性地表示接觸痕判定步驟的俯視圖。如圖3所示,藉由先前實施的設定程序在卡盤台10的框體10c上形成有接觸痕48。FIG. 3 is a plan view schematically showing a contact mark determination step. As shown in FIG. 3, a contact mark 48 is formed on the housing 10 c of the chuck table 10 by a previously performed setting procedure.

在預定使保持面10a的切割刀片36接觸的接觸預定處46確認到這種接觸痕48的情況下,檢測到切割刀片36與卡盤台10的通電時確認兩者有接觸。亦即,確認已實施適當的設定程序,故實施將暫時基準位置設定為基準位置的基準位置設定步驟。When such a contact mark 48 is confirmed at the contact predetermined place 46 where the cutting blade 36 of the holding surface 10a is to be brought into contact, it is confirmed that the cutting blade 36 and the chuck table 10 are in contact with each other when power is detected. That is, it is confirmed that an appropriate setting procedure has been performed, and therefore a reference position setting step of setting a temporary reference position as a reference position is performed.

另一方面,圖3所示的例中,可知在接觸預定處46未形成接觸痕48。此情況下,例如,由於在切割刀片36或保持面10a上附著有切割液而檢測到透過該切割液造成的兩者之通電等的理由,而確認實際上兩者未接觸。因此,可確認所登錄的暫時基準位置並非應登錄作為基準位置的位置。On the other hand, in the example shown in FIG. 3, it is understood that the contact mark 48 is not formed at the predetermined contact position 46. In this case, it is confirmed that, for example, the cutting fluid is adhered to the cutting blade 36 or the holding surface 10a and the energization of the two caused by the penetration of the cutting fluid is detected, and it is confirmed that the two are not actually in contact. Therefore, it can be confirmed that the registered temporary reference position is not a position that should be registered as a reference position.

於是,為了適當地導出切割單元14的基準位置而再次實施暫時基準位置登錄步驟及接觸痕判定步驟。此時,亦可無需在保持面10a的該接觸預定處46直接實施兩個步驟,而可重新設定與該接觸預定處46不同的位置作為接觸預定處46而實施兩個步驟。Then, the temporary reference position registration step and the contact mark determination step are performed again in order to appropriately derive the reference position of the cutting unit 14. At this time, it is not necessary to directly perform the two steps at the predetermined contact point 46 of the holding surface 10a, and a different position from the predetermined contact point 46 may be reset to perform the two steps.

此外,在再次實施暫時基準位置登錄步驟之前,可實施噴吹氣體步驟,對保持面10a吹氣以將附著於該保持面10a的該切割液去除。圖4為示意性地表示噴吹氣體步驟的剖面圖。例如,切割單元14可具備對該保持面10a噴吹高壓的乾燥空氣等氣體52a的噴吹氣體單元52。噴吹氣體步驟中,藉由噴吹氣體單元52對保持面10a供給氣體52a,以將切割液50a去除。In addition, before the temporary reference position registration step is performed again, a gas blowing step may be performed to blow the holding surface 10a to remove the cutting liquid attached to the holding surface 10a. FIG. 4 is a cross-sectional view schematically showing a gas blowing step. For example, the cutting unit 14 may include a blowing gas unit 52 that blows a gas 52 a such as high-pressure dry air onto the holding surface 10 a. In the gas blowing step, a gas 52a is supplied to the holding surface 10a by the gas blowing unit 52 to remove the cutting liquid 50a.

之後,若再次實施暫時基準位置登錄步驟,則切割刀片36與卡盤台10接觸而檢測到通電,同時在保持面10a形成接觸痕。然後,在接觸痕判定步驟中判定具有該接觸痕,而將再次實施的暫時基準位置登錄步驟中所登錄的暫時基準位置作為基準位置。After that, if the temporary reference position registration step is performed again, the cutting blade 36 comes into contact with the chuck table 10 to detect the energization, and at the same time, a contact mark is formed on the holding surface 10a. Then, it is determined in the contact mark determination step that the contact mark is present, and the temporary reference position registered in the temporary reference position registration step that is performed again is used as the reference position.

此外,即使在接觸痕判定步驟中判定無接觸痕的情況下,亦有可不實施噴吹氣體步驟的情況。例如,在暫時基準位置登錄步驟中,旋轉的切割刀片36與附著於保持面10a的切割液接觸時,檢測到該通電的同時,該切割液可能因切割刀片36的旋轉而彈飛。此情況下,若直接再次實施暫時基準位置登錄步驟,即可適當地導出基準位置。In addition, even when it is determined that there is no contact mark in the contact mark determination step, the gas blowing step may not be performed. For example, in the temporary reference position registration step, when the rotating cutting blade 36 is in contact with the cutting fluid attached to the holding surface 10a, the cutting fluid may be ejected due to the rotation of the cutting blade 36 when the current is detected. In this case, if the temporary reference position registration step is directly performed again, the reference position can be appropriately derived.

如上所述,根據涉及本實施方式的切割裝置的設定方法,可適當地導出切割單元14的基準位置。又,可確認所導出的該基準位置為適當位置。As described above, according to the setting method of the cutting device according to the present embodiment, the reference position of the cutting unit 14 can be appropriately derived. In addition, it can be confirmed that the derived reference position is an appropriate position.

此外,上述實施方式中是在接觸痕判定步驟中藉由攝影機34拍攝保持面10a而判定有無接觸痕48,但本發明的一態樣並不限定於此。本發明的一態樣中亦可藉由其他方法判定是否應將暫時基準位置登錄作為基準位置。In the above-mentioned embodiment, the presence or absence of the contact mark 48 is determined by the imaging of the holding surface 10a by the camera 34 in the contact mark determination step, but one aspect of the present invention is not limited to this. In one aspect of the present invention, it may be determined by other methods whether to register the temporary reference position as the reference position.

例如,亦可藉由攝影機34拍攝保持面10a,而判定有無殘留的切割液等。此情況下,例如,判定在切割刀片36的接觸預定處46附著有切割液等的情況下,實施噴吹氣體步驟將該切割液去除,並再次實施暫時基準位置登錄步驟。For example, the holding surface 10a can be imaged by the camera 34 to determine the presence or absence of a cutting fluid or the like. In this case, for example, if it is determined that a cutting fluid or the like is attached to the predetermined contact position 46 of the cutting blade 36, the cutting fluid is performed by removing the cutting fluid, and the temporary reference position registration process is performed again.

此外,在不脫離本發明的目的的範圍內,涉及上述實施方式的結構、方法等可適當變更而實施。In addition, the structure, method, etc. concerning the said embodiment can be changed suitably, and it can implement it, without deviating from the objective of this invention.

1‧‧‧工件1‧‧‧Workpiece

3‧‧‧框架 3‧‧‧frame

5‧‧‧膠膜 5‧‧‧ Adhesive film

2‧‧‧切割裝置 2‧‧‧ cutting device

4‧‧‧裝置基台 4‧‧‧ device abutment

6‧‧‧X軸移動台 6‧‧‧X-axis mobile stage

8‧‧‧防塵防滴蓋 8‧‧‧Dustproof and drip-proof cover

10‧‧‧卡盤台 10‧‧‧ chuck table

10a‧‧‧保持面 10a‧‧‧ keep face

10b‧‧‧夾具 10b‧‧‧Jig

10c‧‧‧框體 10c‧‧‧Frame

12‧‧‧卡匣載置台 12‧‧‧ Cassette Loading Platform

12a‧‧‧卡匣 12a‧‧‧Cassette

14‧‧‧切割單元 14‧‧‧ cutting unit

16‧‧‧支撐部 16‧‧‧ support

18a‧‧‧分度進給單元 18a‧‧‧ indexing feed unit

18b‧‧‧切入進給單元 18b‧‧‧cut into the feed unit

20、26‧‧‧導軌 20, 26‧‧‧ rail

22、28‧‧‧移動板 22, 28‧‧‧ mobile board

24、30‧‧‧滾珠螺桿 24, 30‧‧‧ Ball Screw

32‧‧‧脈衝馬達 32‧‧‧Pulse motor

34‧‧‧攝影機 34‧‧‧Camera

36‧‧‧切割刀片 36‧‧‧ cutting blade

38‧‧‧清洗單元 38‧‧‧cleaning unit

38a‧‧‧清洗台 38a‧‧‧washing table

38b‧‧‧清洗噴嘴 38b‧‧‧clean nozzle

40‧‧‧主軸 40‧‧‧ Spindle

42‧‧‧旋轉驅動源 42‧‧‧Rotary drive source

44‧‧‧設定單元 44‧‧‧setting unit

46‧‧‧接觸預定處 46‧‧‧ Contact Reservation

48‧‧‧接觸痕 48‧‧‧contact marks

50‧‧‧切割液供給噴嘴 50‧‧‧ cutting fluid supply nozzle

50a‧‧‧切割液 50a‧‧‧ cutting fluid

52‧‧‧噴吹氣體單元 52‧‧‧Blow gas unit

52a‧‧‧氣體 52a‧‧‧gas

圖1為示意性地表示切割裝置及工件的立體圖。FIG. 1 is a perspective view schematically showing a cutting device and a workpiece.

圖2(A)為示意性地表示暫時基準位置登錄步驟的剖面圖,圖2(B)為示意性地顯示接觸痕判定步驟的剖面圖。 FIG. 2 (A) is a cross-sectional view schematically showing a temporary reference position registration step, and FIG. 2 (B) is a cross-sectional view schematically showing a contact mark determination step.

圖3為示意性地表示形成於卡盤台的保持面的切割痕的俯視圖。 3 is a plan view schematically showing a cut mark formed on a holding surface of a chuck table.

圖4為示意性地表示噴吹氣體步驟的剖面圖。 FIG. 4 is a cross-sectional view schematically showing a gas blowing step.

Claims (2)

一種切割裝置的設定方法,切割裝置具備: 卡盤台,具有保持面,以將工件保持於該保持面上; 切割單元,以切割刀片切割保持於該卡盤台上的工件,同時對該工件及該切割刀片供給切割液; 切入進給單元,使該切割單元在與該保持面垂直的切入進給方向上移動; 攝影機,拍攝保持於該卡盤台上的工件;及 設定單元,能夠檢測該卡盤台及該切割刀片之間的通電,且在藉由該切入進給單元使該切割單元移動而該通電被檢測到時,能夠檢測該切割單元在該切入進給方向上的位置, 該切割裝置的設定方法為在該切割裝置中,將該切割刀片接觸該卡盤台時該切割單元的位置導出作為基準位置,其中, 該切割裝置的設定方法具備: 暫時基準位置登錄步驟,使該切割單元朝向該保持面而在該切入進給方向上移動,將檢測到該切割刀片及該卡盤台之間的通電時該切割單元在該切入進給方向上的位置登錄作為暫時基準位置;及 接觸痕判定步驟,在實施該暫時基準位置登錄步驟後,以該攝影機拍攝該保持面,判定有無因該切割刀片與該卡盤台的接觸而在該保持面上形成的接觸痕, 在該接觸痕判定步驟中判定具有該接觸痕的情況下,實施基準位置設定步驟,將該暫時基準位置設定為該基準位置, 在該接觸痕判定步驟中判定無該接觸痕的情況下,再次實施該暫時基準位置登錄步驟及該接觸痕判定步驟。A setting method of a cutting device, the cutting device includes: The chuck table has a holding surface to hold the workpiece on the holding surface; A cutting unit that cuts a workpiece held on the chuck table with a cutting blade, and simultaneously supplies cutting liquid to the workpiece and the cutting blade; A cutting-in feeding unit, so that the cutting unit moves in a cutting-in feeding direction perpendicular to the holding surface; A camera that captures the workpiece held on the chuck table; and The setting unit can detect the energization between the chuck table and the cutting blade, and when the cutting unit is moved by the cut-in feed unit and the power is detected, it can detect the cutting unit at the cut-in feed Position in the direction, The setting method of the cutting device is that in the cutting device, the position of the cutting unit when the cutting blade contacts the chuck table is derived as a reference position, where: The setting method of the cutting device includes: The temporary reference position registration step moves the cutting unit in the cutting feed direction toward the holding surface, and the cutting unit is in the cutting feed direction when power is detected between the cutting blade and the chuck table. Registered as a temporary reference position; and In the contact mark determination step, after performing the temporary reference position registration step, the holding surface is photographed with the camera, and it is determined whether there is a contact mark formed on the holding surface due to the contact between the cutting blade and the chuck table, When it is determined that the contact mark is present in the contact mark determination step, a reference position setting step is performed, and the temporary reference position is set as the reference position. When it is determined that there is no contact mark in the contact mark determination step, the temporary reference position registration step and the contact mark determination step are performed again. 如申請專利範圍第1項所述之切割裝置的設定方法,其中, 在該接觸痕判定步驟中判定無該接觸痕的情況下,於再次實施該暫時基準位置登錄步驟之前,實施噴吹氣體步驟,對該保持面吹氣以將附著於該保持面上的該切割液去除。The setting method of the cutting device according to item 1 of the scope of patent application, wherein: In the case where it is determined that the contact mark is absent in the contact mark determination step, before the temporary reference position registration step is performed again, a gas blowing step is performed, and the holding surface is blown to blow the cutting adhered to the holding surface. Liquid removal.
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