TW201932221A - Laser processing method - Google Patents

Laser processing method Download PDF

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TW201932221A
TW201932221A TW107147445A TW107147445A TW201932221A TW 201932221 A TW201932221 A TW 201932221A TW 107147445 A TW107147445 A TW 107147445A TW 107147445 A TW107147445 A TW 107147445A TW 201932221 A TW201932221 A TW 201932221A
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laser light
irradiated
conformal
light irradiation
laser
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TW107147445A
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TWI669180B (en
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工藤幸利
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日商三菱電機股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/064Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
    • B23K26/066Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms by using masks
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/08Devices involving relative movement between laser beam and workpiece
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/38Removing material by boring or cutting
    • B23K26/382Removing material by boring or cutting by boring
    • B23K26/386Removing material by boring or cutting by boring of blind holes
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Laser Beam Processing (AREA)

Abstract

Provided is a laser processing method for performing a conformal processing with a plurality of holes to be formed, which solves a problem in conventional laser processing methods in which protrusion of a glass cloth is easy to occur because an insulating material is selectively decomposed and removed due to the increasing amount of heat stored in one conformal mask when a pulsed laser is continuously irradiated to an outer peripheral portion, the laser processing method including a first processing step of irradiating laser light 1 to a region defined inside or outside the first mask 30a constituting a plurality of conformal masks 30a to 30f provided corresponding to the number of holes; and processing steps different from the first processing step of irradiating the laser light 1 on the inner side or the outer side of masks 30b~30f constituting a plurality of conformal masks 30a to 30f and different from the first mask 30a, a processing sequence of performing from the first processing step to the different processing steps being repeated several times, and the position where the laser light 1 being irradiated being changed every time when the processing sequence is repeated so as to complete the processing.

Description

雷射加工方法 Laser processing method

本發明係關於一種進行保形(conformal)加工的雷射加工方法。 The present invention relates to a laser processing method for performing conformal processing.

近年來,由於在車載用電子機器等,於冷熱環境、振動環境下需要連接可靠性的電子電路形成步驟中,能夠進行高密度安裝,因此以電路基板的開孔加工方法而言,已從習知的鑽孔(drill)加工法,進展至以雷射加工法來替代。雷射加工法自以往以來已被採用作為形成用以進行印刷配線板之層間電性連接之導通孔的方法。車載用電子機器所新採用之電路基板的材料,係具有使用浸漬樹脂於玻璃移轉溫度較高之玻璃纖維布(glass cloth)而成之複合材料以作為絕緣材的特徵。 In recent years, high-density mounting can be performed in electronic circuit forming steps such as in-vehicle electronic equipment that require connection reliability in hot and cold environments and vibration environments. The known drilling processing method has been replaced by a laser processing method. The laser processing method has been conventionally adopted as a method for forming a via hole for electrical connection between layers of a printed wiring board. The material of the circuit board newly used in the vehicle-mounted electronic equipment has a characteristic of using a composite material made of glass cloth cloth impregnated with resin at a high glass transition temperature as an insulating material.

另一方面,為了要去除絕緣材,玻璃移轉溫度愈高,就愈要照射高強度的雷射光。被使用於車載用電子機器之基板的絕緣層厚度,一般為100μm以上,為了有效率地去除貫通孔部分的絕緣材,係採用光強度較高的CO2脈衝雷射(pulse laser)作為光源。 On the other hand, in order to remove the insulating material, the higher the glass transition temperature, the more intense laser light must be irradiated. The thickness of the insulating layer used in the substrate of automotive electronic equipment is generally 100 μm or more. In order to efficiently remove the insulating material in the through-hole portion, a CO2 pulse laser with high light intensity is used as the light source.

[先前技術文獻] [Prior technical literature] [專利文獻] [Patent Literature]

專利文獻1:日本特開2011-110598號公報(第17頁,第1圖)。 Patent Document 1: Japanese Patent Application Laid-Open No. 2011-110598 (Page 17, FIG. 1).

以往,雖使用利用雷射掃描裝置,沿著一個保形遮罩(conformal mask)的外周而依序連續照射脈衝雷射的加工方法,但當對外周部分連續地照射脈衝雷射時,在保形遮罩的外周部分,先被分解去除而電漿(plasma)化後的雷射光吸收物質,會吸收之後進行照射的雷射光而滯留在原處,而在滯留附近之絕緣材內部的蓄熱量會增加。當蓄熱量增加時,絕緣材內部的玻璃纖維布不會被充分冷卻至玻璃移轉溫度以下,結果,玻璃纖維布不會被充分地分解去除,而會有易於產生玻璃纖維布的突出,玻璃珠會殘留至孔底部的問題。 Conventionally, although a processing method of sequentially irradiating a pulse laser along the outer periphery of a conformal mask using a laser scanning device has been used, when the pulse laser is continuously irradiated to the outer periphery, The outer part of the mask is decomposed and removed, and the laser light absorbing material after plasmaization will absorb the laser light that is irradiated and stay in place, and the heat storage inside the insulating material near the stay will be increase. When the heat storage capacity is increased, the glass fiber cloth inside the insulating material will not be sufficiently cooled below the glass transition temperature. As a result, the glass fiber cloth will not be sufficiently decomposed and removed, and the glass fiber cloth will easily protrude. Problems with beads remaining to the bottom of the well.

本發明係為了解決上述的問題而研創者,其目的為抑制絕緣材內部的蓄熱量而可效率良好地形成孔。 The present invention was developed by the inventors to solve the above-mentioned problems, and an object thereof is to efficiently form pores while suppressing the amount of heat stored in the insulating material.

在本發明之雷射加工方法,係對於按形成於基材上之N個保形遮罩各者分別設定之M個雷射光照射點依序進行雷射光照射之雷射加工方法,其中,在對M×N個雷射光照射點依序進行雷射光照射時,反覆進行M×N 次之下述操作:對於一個保形遮罩中的M個雷射光照射點之中的一點進行一個雷射光照射,接著對於別的保形遮罩的M個雷射光照射點之中的一點進行下一個雷射光照射之操作,藉此按每個保形遮罩形成一個孔。 In the laser processing method of the present invention, a laser processing method for sequentially performing laser light irradiation on M laser light irradiation points respectively set by N conformal masks formed on a substrate, wherein When M × N laser light irradiation spots are sequentially irradiated with laser light, M × N is repeatedly performed The second operation is as follows: one laser light irradiation is performed on one of the M laser light irradiation points in one conformal mask, and then one of the M laser light irradiation points on another conformal mask is performed. The next operation of laser light irradiation, thereby forming a hole for each conformal mask.

本發明係當著眼於任意的保形遮罩1孔時,之後進行照射的雷射光,會在經過某程度之時間後,照射至與先被分解去除而電漿化後之雷射光吸收物質之產生位置不同的位置,因此雷射光吸收物質會隨時間經過而擴散,抑制對於1個保形遮罩的蓄熱量,可確保絕緣材內部之玻璃纖維布冷卻至玻璃移轉溫度以下之充分的照射間隔,結果,玻璃纖維布會被充分地分解去除,不會產生玻璃纖維布的突出,而可抑制玻璃珠殘留至孔底部,因此可效率良好地形成孔。 When the present invention focuses on one hole of an arbitrary conformal mask, the laser light that is irradiated thereafter will be irradiated to a laser light absorbing substance that is decomposed and removed and plasmatized after a certain period of time. The position is different, so the laser light absorbing substance will diffuse with time, and the heat storage of a conformal mask is suppressed, and the glass fiber cloth inside the insulating material can be cooled to a sufficient irradiation below the glass transition temperature. As a result, the glass fiber cloth is sufficiently decomposed and removed without causing the glass fiber cloth to protrude, and glass beads can be suppressed from remaining at the bottom of the hole, so that the hole can be efficiently formed.

1‧‧‧雷射光 1‧‧‧laser light

2‧‧‧雷射振盪器 2‧‧‧laser oscillator

3‧‧‧能量調整裝置 3‧‧‧ Energy Adjustment Device

4、20‧‧‧光掃描裝置 4, 20‧‧‧ light scanning device

5‧‧‧fθ透鏡 5‧‧‧fθ lens

6‧‧‧被加工材 6‧‧‧Machined material

7‧‧‧焦點面 7‧‧‧ focus plane

8‧‧‧經平行移動後的面 8‧‧‧ Face after parallel movement

9‧‧‧移動平台 9‧‧‧ mobile platform

10‧‧‧基材 10‧‧‧ Substrate

11、12、21、22、61‧‧‧外周部 11, 12, 21, 22, 61‧‧‧ Peripheral

13、62‧‧‧雷射光照射點 13, 62‧‧‧ laser light irradiation point

14‧‧‧雷射吸收物質 14‧‧‧ laser absorbing substance

16‧‧‧表面導體層 16‧‧‧ surface conductor layer

17‧‧‧絕緣層 17‧‧‧ Insulation

18‧‧‧玻璃纖維布 18‧‧‧ fiberglass cloth

19‧‧‧背面導體層 19‧‧‧ back conductor layer

30a至30f、60a、60b‧‧‧保形遮罩 30a to 30f, 60a, 60b‧‧‧ conformal mask

50‧‧‧控制裝置 50‧‧‧control device

a、b‧‧‧雷射光照射位置 a, b‧‧‧ laser light irradiation position

第1圖係顯示本發明之實施例1之雷射加工裝置的構成圖。 Fig. 1 is a block diagram showing a laser processing apparatus according to a first embodiment of the present invention.

第2圖係顯示本發明之實施例1之雷射光之照射位置的圖。 Fig. 2 is a diagram showing the irradiation position of the laser light in the first embodiment of the present invention.

第3圖係顯示對於本發明之實施例1之被加工材之表面垂直切斷的剖面圖。 Fig. 3 is a cross-sectional view showing the surface of the material to be processed according to Example 1 of the present invention cut perpendicularly.

第4圖係顯示本發明之實施例1之雷射光照射順序的圖。 FIG. 4 is a diagram showing a laser light irradiation sequence in Embodiment 1 of the present invention.

第5圖係顯示本發明之實施例1之雷射加工裝置的構成圖。 Fig. 5 is a block diagram showing a laser processing apparatus according to a first embodiment of the present invention.

第6圖係顯示本發明之實施例2之雷射光之照射位置的圖。 Fig. 6 is a diagram showing a laser light irradiation position in Embodiment 2 of the present invention.

第7圖係顯示本發明之實施例3之雷射光之照射位置的圖。 Fig. 7 is a diagram showing a laser light irradiation position in Embodiment 3 of the present invention.

實施例1 Example 1

第1圖係顯示本發明之實施例1之雷射加工裝置的構成圖。第1圖所示的雷射加工裝置係包括:雷射振盪器2,係產生屬於脈衝的雷射光1;能量調整裝置3,係調整雷射光1的能量;光掃描裝置4,係使雷射光1的照射方向偏向;及fθ透鏡5,係使雷射光1聚光。被加工材6係設置於移動平台(table)9上,被加工材6的表面係與fθ透鏡5的焦點面7一致,或者以使雷射光1偏移焦點進行照射之方式,將被加工材6配置在從焦點面7朝移動平台9方向平行移動後的面8。控制裝置50係為了控制雷射振盪器的雷射動作並且實現本發明之實施例1所示的加工方法,乃控制光掃描裝置4與移動平台9。 Fig. 1 is a block diagram showing a laser processing apparatus according to a first embodiment of the present invention. The laser processing device shown in FIG. 1 includes: a laser oscillator 2 for generating laser light 1 belonging to a pulse; an energy adjusting device 3 for adjusting the energy of the laser light 1; and a light scanning device 4 for causing the laser light The irradiation direction of 1 is deviated; and the fθ lens 5 condenses the laser light 1. The work material 6 is set on a movable table 9 and the surface of the work material 6 is consistent with the focal surface 7 of the fθ lens 5 or the laser light 1 is shifted from the focus and irradiated. 6 is arranged on the surface 8 that has been moved in parallel from the focal plane 7 in the direction of the moving platform 9. The control device 50 controls the laser scanning operation of the laser oscillator and implements the processing method shown in the first embodiment of the present invention, and controls the light scanning device 4 and the mobile platform 9.

在雷射振盪器2所產生的雷射光1,係藉由能量調整裝置3調整能量為最適於加工的值,且射入至要使雷射光1之照射方向偏向的光掃描裝置4。藉由控制裝置50所控制的光掃描裝置4,係對應預先算出的雷射光照射位置,而使雷射光1的照射方向偏向。雷射光照射位置 被光掃描裝置4定位後的雷射光1,係射入至fθ透鏡5,且照射至被加工材6。 The laser light 1 generated by the laser oscillator 2 is adjusted by the energy adjustment device 3 to an optimal value for processing, and is incident on the light scanning device 4 to deflect the irradiation direction of the laser light 1. The light scanning device 4 controlled by the control device 50 deflects the irradiation direction of the laser light 1 in accordance with the laser light irradiation position calculated in advance. Laser light irradiation position The laser light 1 positioned by the optical scanning device 4 is incident on the fθ lens 5 and is irradiated onto the workpiece 6.

第2圖係顯示雷射光1對於屬於被加工材6之形成有3個保形遮罩30a至30c之基材10的照射位置。在第2圖中,係以保形遮罩30a為例進行說明,基材10的表面,原本雖被表面導體層16所覆蓋,但在較保形遮罩30a之外周部11更內側部分的表面導體層16,已在其他步驟中被預先去除。做為雷射光照射點13者,係在保形遮罩30a的內側,以保形遮罩30a的重心為基點,定出與保形遮罩30a之外周部11相似形狀的外周部12作為區域,且以將外周部12之外周長予以等分之方式,決定雷射光照射點13。或者,亦可從保形遮罩30a的重心延伸放射狀的等角線,在保形遮罩30a的內側,定出與保形遮罩30a相似形狀的外周部12作為區域,且將與外周部12之外周的交點作為照射點13。當保形遮罩為圓形時,保形遮罩的重心會為保形遮罩的中心。 FIG. 2 shows the irradiation positions of the laser light 1 on the substrate 10 belonging to the work material 6 and formed with three conformal masks 30 a to 30 c. In FIG. 2, the conformal mask 30 a is used as an example. Although the surface of the substrate 10 was originally covered by the surface conductor layer 16, it is located on the inner side of the outer periphery 11 of the conformal mask 30 a. The surface conductor layer 16 has been previously removed in other steps. As the laser light irradiating point 13, it is tied to the inside of the conformal mask 30a. Based on the center of gravity of the conformal mask 30a, a peripheral portion 12 having a shape similar to the outer peripheral portion 11 of the conformal mask 30a is determined as an area. The laser light irradiation point 13 is determined in such a manner that the perimeter outside the outer peripheral portion 12 is equally divided. Alternatively, a radial isometric line may be extended from the center of gravity of the conformal mask 30a. Inside the conformal mask 30a, an outer peripheral portion 12 having a shape similar to that of the conformal mask 30a may be defined as an area, and The intersection point on the outer periphery of the portion 12 is defined as the irradiation point 13. When the conformal mask is circular, the center of gravity of the conformal mask is the center of the conformal mask.

在第2圖中,雖係在保形遮罩30a的內側,以保形遮罩30a的重心為基點,定出與保形遮罩30a之外周部11相似形狀的外周部12作為區域,但亦可在保形遮罩30a的外側,定出與保形遮罩30a相似形狀的外周部12作為區域,而與保形遮罩30a相似形狀之外周部12的放大縮小率,可設為適於加工的值。 In FIG. 2, although the outer peripheral portion 12 having a shape similar to the outer peripheral portion 11 of the conformal mask 30 a is defined as a region while being located inside the conformal mask 30 a and using the center of gravity of the conformal mask 30 a as a base point, The outer peripheral portion 12 having a shape similar to the shape of the conformal mask 30a can also be defined as an area outside the conformal cover 30a. For processing.

第3圖係通過第2圖中保形遮罩30a至30c的各個重心,對於屬於被加工材6之基材10的表面垂直切 斷的剖面圖。基材10係由表面導體層16、絕緣層17、背面導體層19所構成。在絕緣層17的內部,係內含有屬於基材10之補強材的玻璃纖維布18。14係藉由雷射光1分解去除後所產生的雷射吸收物質。 FIG. 3 is a vertical cut of the surface of the base material 10 belonging to the material 6 through the respective centers of gravity of the conformal masks 30 a to 30 c in FIG. 2. Broken section view. The base material 10 is composed of a surface conductor layer 16, an insulating layer 17, and a back conductor layer 19. Inside the insulating layer 17, a glass fiber cloth 18 containing a reinforcing material belonging to the base material 10 is contained. 14 is a laser absorbing substance generated after the laser light 1 is decomposed and removed.

第4圖係顯示基材存在複數個保形遮罩時的雷射光照射順序的圖。在一個保形遮罩中,係預先規定有4個以上照射雷射光1的位置,例如,在保形遮罩30a至30c中,係分別規定有8個照射雷射光1的位置。在N個保形遮罩中,當各保形遮罩中存在M個雷射光照射點時,即存在M×N個加工步驟,將第n個保形遮罩中之第m個雷射光照射位置設為k(n、m)。在此,1≦n≦N,1≦m≦M。例如,在第4圖中,保形遮罩30a至30f的數量為6(N=6)、雷射光照射點的數量為8(M=8)。另外,雷射光1照射於雷射光照射位置k(n、m)時的加工條件均設為相同條件。另外,在第4圖中,係針對雷射光1的脈衝照射數為1脈衝的情形進行說明。 FIG. 4 is a diagram showing a laser light irradiation sequence when the substrate has a plurality of conformal masks. In one conformal mask, four or more positions irradiating the laser light 1 are specified in advance. For example, in the conformal masks 30a to 30c, eight positions irradiating the laser light 1 are specified. In N conformal masks, when there are M laser light irradiation points in each conformal mask, there are M × N processing steps to irradiate the mth laser light in the nth conformal mask. The position is set to k (n, m). Here, 1 ≦ n ≦ N and 1 ≦ m ≦ M. For example, in FIG. 4, the number of conformal masks 30a to 30f is 6 (N = 6), and the number of laser light irradiation points is 8 (M = 8). The processing conditions when the laser light 1 is irradiated to the laser light irradiation position k (n, m) are set to the same conditions. In addition, FIG. 4 illustrates a case where the number of pulse irradiations of the laser light 1 is one pulse.

在第4圖中,存在合計共M×N個,亦即48個雷射光照射位置k(n、m),1≦n≦6,1≦m≦8,且以下列順序照射雷射光1。 In FIG. 4, there are a total of M × N, that is, 48 laser light irradiation positions k (n, m), 1 ≦ n ≦ 6, 1 ≦ m ≦ 8, and the laser light 1 is irradiated in the following order.

最初對屬於第1遮罩之保形遮罩30a的k(1、1)照射1脈衝之雷射光1,做為第1加工步驟。接著,係對屬於不同於第1遮罩之第2遮罩之保形遮罩30b的k(2、1)照射1脈衝之雷射光1,做為第2加工步驟。然後依序對屬於不同於第1遮罩之第3遮罩之保形遮罩30c的k(3、 1)照射1脈衝之雷射光1做為第3加工步驟,對屬於不同於第1遮罩之第4遮罩之保形遮罩30d的k(4、1)照射1脈衝之雷射光1做為第4加工步驟,對屬於不同於第1遮罩之第5遮罩之保形遮罩30e的k(5、1)照射1脈衝之雷射光1做為第5加工步驟,對屬於不同於第1遮罩之第6遮罩之保形遮罩30f的k(6、1)照射1脈衝之雷射光1做為第6加工步驟。 First, k (1, 1) of the conformal mask 30a belonging to the first mask is irradiated with laser pulse 1 of 1 pulse as a first processing step. Next, a pulse of laser light 1 is irradiated to k (2, 1) belonging to the conformal mask 30b that is different from the second mask of the first mask as a second processing step. Then, k (3, 3, which belongs to the conformal mask 30c which is different from the third mask of the first mask 1) Irradiate 1 pulse of laser light 1 as the third processing step, and irradiate 1 pulse of laser light 1 on k (4, 1) belonging to the conformal mask 30d which is different from the first mask of the fourth mask For the fourth processing step, a pulse of laser light 1 is irradiated to k (5, 1) of the conformal mask 30e belonging to the fifth mask different from the first mask as the fifth processing step. The k (6, 1) of the conformal mask 30f of the first mask and the sixth mask irradiates the laser light 1 with one pulse as the sixth processing step.

每逢重覆實施第1加工步驟至第6加工步驟之一連串之加工步驟的加工程序時,在要對1個保形遮罩照射雷射光1之際,係將雷射光1照射於距照射完成之位置最遠的位置而且為雷射光1的未照射位置。首先,在對保形遮罩30f的k(6、1)照射1脈衝後,將雷射光1照射1脈衝於保形遮罩30a的k(1、2)作為第2次加工程序。接著,將雷射光1照射1脈衝於保形遮罩30b的k(2、2)。然後依序將雷射光1照射1脈衝於保形遮罩30c的k(3、2)、保形遮罩30d的k(4、2)、保形遮罩30e的k(5、2)、保形遮罩30f的k(6、2)。 When repeatedly performing a series of processing steps from the first processing step to the sixth processing step, when a conformal mask is to be irradiated with the laser light 1, the laser light 1 is irradiated to the distance. The farthest position is the unirradiated position of the laser light 1. First, after k (6,1) is irradiated to the conformal mask 30f for one pulse, laser beam 1 is irradiated with k (1,2) for one pulse to the conformal mask 30a as the second processing program. Next, the laser light 1 is irradiated with k (2, 2) for one pulse on the conformal mask 30b. Then, the laser light 1 is sequentially irradiated with 1 pulse on k (3, 2) of the conformal mask 30c, k (4, 2) of the conformal mask 30d, k (5, 2) of the conformal mask 30e, and K (6, 2) of the shape mask 30f.

接著,以第3次加工程序而言,係對保形遮罩30a的k(1、3)照射1脈衝之雷射光1。接著,對保形遮罩30b的k(2、3)照射1脈衝之雷射光1。然後依序對保形遮罩30c的k(3、3)照射1脈衝之雷射光1,對保形遮罩30d的k(4、3)照射1脈衝之雷射光1,對保形遮罩30e的k(5、3)照射1脈衝之雷射光1,對保形遮罩30f的k(6、3)照射1脈衝之雷射光1。 Next, in the third processing sequence, k (1, 3) of the conformal mask 30a is irradiated with laser pulse 1 of one pulse. Next, k (2, 3) of the conformal mask 30b is irradiated with laser light 1 of one pulse. Then, one pulse of laser light 1 is irradiated to k (3, 3) of the conformal mask 30c, and one pulse of laser light 1 is irradiated to k (4, 3) of the conformal mask 30d, and the conformal mask is irradiated. K (5, 3) of 30e irradiates laser light 1 of 1 pulse, and k (6, 3) of conformal mask 30f irradiates laser light 1 of 1 pulse.

接著,以第4次的加工程序而言,係對保形遮罩30a的k(1、4)照射1脈衝之雷射光1。接著,對保形遮罩30b的k(2、4)照射1脈衝之雷射光1。然後依序對保形遮罩30c的k(3、4)照射1脈衝之雷射光1,對保形遮罩30d的k(4、4)照射1脈衝之雷射光1,對保形遮罩30e的k(5、4)照射1脈衝之雷射光1,對保形遮罩30f的k(6、4)照射1脈衝之雷射光1。 Next, in the fourth processing sequence, k (1, 4) of the conformal mask 30a is irradiated with one pulse of laser light 1. Next, k (2, 4) of the conformal mask 30b is irradiated with laser light 1 of one pulse. Then, k (3, 4) of the conformal mask 30c is sequentially irradiated with 1 pulse of laser light 1, and k (4, 4) of the conformal mask 30d is irradiated with 1 pulse of laser light 1, and the conformal mask is irradiated. K (5, 4) of 30e irradiates laser light 1 of 1 pulse, and k (6, 4) of conformal mask 30f irradiates laser light 1 of 1 pulse.

接著,以第5次的加工程序而言,係對保形遮罩30a的k(1、5)照射1脈衝之雷射光1。接著,對保形遮罩30b的k(2、5)照射1脈衝之雷射光1。然後依序對保形遮罩30c的k(3、5)照射1脈衝之雷射光1,對保形遮罩30d的k(4、5)照射1脈衝之雷射光1,對保形遮罩30e的k(5、5)照射1脈衝之雷射光1,對保形遮罩30f的k(6、5)照射1脈衝之雷射光1。 Next, in the fifth processing sequence, k (1, 5) of the conformal mask 30a is irradiated with one pulse of laser light 1. Next, k (2, 5) of the conformal mask 30b is irradiated with laser light 1 of one pulse. Then, k (3, 5) of the conformal mask 30c is sequentially irradiated with 1 pulse of laser light 1, and k (4, 5) of the conformal mask 30d is irradiated with 1 pulse of laser light 1, and the conformal mask is irradiated. K (5, 5) of 30e irradiates laser light 1 of 1 pulse, and k (6, 5) of conformal mask 30f irradiates laser light 1 of 1 pulse.

接著,以第6次的加工程序而言,係對保形遮罩30a的k(1、6)照射1脈衝之雷射光1。接著,對保形遮罩30b的k(2、6)照射1脈衝之雷射光1。然後依序對保形遮罩30c的k(3、6)照射1脈衝之雷射光1,對保形遮罩30d的k(4、6)照射1脈衝之雷射光1,對保形遮罩30e的k(5、6)照射1脈衝之雷射光1,對保形遮罩30f的k(6、6)照射1脈衝之雷射光1。 Next, in the sixth processing sequence, k (1, 6) of the conformal mask 30a is irradiated with one pulse of laser light 1. Next, k (2, 6) of the conformal mask 30b is irradiated with laser light 1 of one pulse. Then, one pulse of laser light 1 is irradiated on k (3, 6) of the conformal mask 30c, and one pulse of laser light 1 is irradiated on k (4, 6) of the conformal mask 30d, and the conformal mask is irradiated. K (5, 6) of 30e irradiates laser light 1 of 1 pulse, and k (6, 6) of conformal mask 30f irradiates laser light 1 of 1 pulse.

接著,以第7次的加工程序而言,係對保形遮罩30a的k(1、7)照射1脈衝之雷射光1。接著,對保形遮罩30b的k(2、7)照射1脈衝之雷射光1。然後依序對 保形遮罩30c的k(3、7)照射1脈衝之雷射光1,對保形遮罩30d的k(4、7)照射1脈衝之雷射光1,對保形遮罩30e的k(5、7)照射1脈衝之雷射光1,對保形遮罩30f的k(6、7)照射1脈衝之雷射光1。 Next, in the seventh processing sequence, k (1, 7) of the conformal mask 30a is irradiated with one pulse of laser light 1. Next, k (2, 7) of the conformal mask 30b is irradiated with laser light 1 of one pulse. Then sequentially K (3, 7) of the conformal mask 30c irradiates 1 pulse of laser light 1, and k (4, 7) of the conformal mask 30d irradiates 1 pulse of laser light 1, and k ( 5. 7) One pulse of laser light 1 is irradiated, and k (6, 7) of the conformal mask 30f is irradiated with one pulse of laser light 1.

最後,以第8次的加工程序而言,係對保形遮罩30a的k(1、8)照射1脈衝之雷射光1。接著,對保形遮罩30b的k(2、8)照射1脈衝之雷射光1。然後依序對保形遮罩30c的k(3、8)照射1脈衝之雷射光1,對保形遮罩30d的k(4、8)照射1脈衝之雷射光1,對保形遮罩30e的k(5、8)照射1脈衝之雷射光1,對保形遮罩30f的k(6、8)照射1脈衝之雷射光1,加工完成。 Finally, in the eighth processing program, k (1, 8) of the conformal mask 30a is irradiated with one pulse of laser light 1. Next, k (2, 8) of the conformal mask 30b is irradiated with laser light 1 of one pulse. Then, k (3, 8) of the conformal mask 30c is sequentially irradiated with 1 pulse of laser light 1, and k (4, 8) of the conformal mask 30d is irradiated with 1 pulse of laser light 1, and the conformal mask is irradiated. K (5, 8) of 30e irradiates laser light 1 of 1 pulse, and k (6, 8) of conformal mask 30f irradiates laser light 1 of 1 pulse, and the processing is completed.

接著說明保形遮罩的數量為N個,各保形遮罩中存在M個雷射光照射點之一般情形的加工步驟。 Next, the processing steps in the general case where the number of conformal masks is N and there are M laser light irradiation points in each conformal mask will be described.

當照射雷射光1的第n個保形遮罩非為最後的第N個保形遮罩時,在對第n個保形遮罩(1≦n≦N)中之第m個雷射光照射點照射雷射光1後,亦即,在對雷射光照射位置k(n、m)照射雷射光1後,將雷射光照射點往雷射光照射位置k(n+1、m)依序重覆加工步驟而照射雷射光1。 When the n-th conformal mask irradiating laser light 1 is not the last N-th conformal mask, the m-th laser light in the n-th conformal mask (1 ≦ n ≦ N) is irradiated After the laser light 1 is irradiated at a spot, that is, after the laser light 1 is irradiated to the laser light irradiation position k (n, m), the laser light irradiation point is sequentially repeated to the laser light irradiation position k (n + 1, m). Processing steps to irradiate the laser light 1.

當要照射雷射光1的第n個保形遮罩為最後的第N個保形遮罩而且第m個雷射光照射點非為最後的第M個雷射光照射點時,在對第N個保形遮罩中之第m個雷射光照射點照射雷射光1後,亦即在將雷射光1照射於雷射光照射位置k(N、m)之後,將雷射光照射點返回第 1個保形遮罩,並且移動至雷射光照射位置k(1、m+1)而照射雷射光1。當從雷射光照射位置k(N、m)移動至雷射光照射位置k(1、m+1)時,亦即在相同之保形遮罩內的照射順序,較理想為以蓄熱的影響為最小之方式依次選擇對角位置。 When the n-th conformal mask to be irradiated with laser light 1 is the last N-th conformal mask and the m-th laser light irradiation point is not the last M-th laser light irradiation point, the N-th After the m-th laser light irradiation point in the conformal mask irradiates the laser light 1, that is, after the laser light 1 is irradiated to the laser light irradiation position k (N, m), the laser light irradiation point is returned to the first One conformal mask is moved to the laser light irradiation position k (1, m + 1) to irradiate the laser light 1. When moving from the laser light irradiation position k (N, m) to the laser light irradiation position k (1, m + 1), that is, the irradiation sequence in the same conformal mask, it is ideal to take the influence of heat storage as The smallest way is to select the diagonal positions in order.

當要照射雷射光1的第n個保形遮罩為最後的第N個保形遮罩而且為第m個雷射光照射點為最後的第M個雷射光照射點時,在對第N個保形遮罩中之第M個雷射光照射點照射雷射光1後,亦即在將雷射光1照射於雷射光照射位置k(N、M)之後,完成加工。或者,在將雷射光1照射於雷射光照射位置k(N、M)之後,再度返回雷射光照射位置k(1、1),重覆複數次相同的加工步驟,完成加工。 When the n-th conformal mask to be irradiated with laser light 1 is the last N-th conformal mask and the m-th laser light irradiation point is the last M-th laser light irradiation point, the N-th After the M-th laser light irradiation point in the conformal mask irradiates the laser light 1, that is, after the laser light 1 is irradiated to the laser light irradiation position k (N, M), the processing is completed. Alternatively, after the laser light 1 is irradiated to the laser light irradiation position k (N, M), the laser light is returned to the laser light irradiation position k (1, 1) again, and the same processing steps are repeated several times to complete the processing.

茲以雷射光1的照射脈衝數為1脈衝為例進行說明,在對於任意之保形遮罩的雷射光照射位置k(n、m)照射1脈衝的雷射光1之後,之後進行之脈衝的雷射光1係照射至屬於不同之保形遮罩的雷射光照射位置k(n+1、m)。此外,若著眼於某保形遮罩,則在將雷射光1照射至所著眼之保形遮罩所屬之雷射光照射位置k(n、m)之後,直到下一次雷射光1照射至相同保形遮罩所屬之雷射光照射位置k(n、m+1)為止的時間間隔,係與按每1脈衝逐一改變位置地照射至其他N-1個保形遮罩所屬之雷射光照射位置的時間間隔相同。 The following description is based on an example where the number of pulses of the laser light 1 is 1 pulse. After irradiating the laser light 1 with a pulse of 1 at any laser light irradiation position k (n, m) of a conformal mask, The laser light 1 is irradiated to a laser light irradiation position k (n + 1, m) belonging to a different conformal mask. In addition, if focusing on a conformal mask, the laser light 1 is irradiated to the laser light irradiation position k (n, m) to which the conformal mask of the eye belongs, until the next time the laser light 1 is irradiated to the same conformal mask. The time interval up to the laser light irradiation position k (n, m + 1) to which the shape mask belongs is the same as the time to irradiate the laser light irradiation position to which other N-1 conformal masks belong by changing the position one by one every pulse. The time interval is the same.

所著眼的保形遮罩,係在經過一個加工程 序完成的時間之後,再度接受雷射光1的照射,但由於該雷射光照射位置,係不同於先前之加工程序時所照射之雷射光照射位置的位置,因此之後進行的雷射光1係在經過某程度的時間之後,照射至不同於被分解去除後所產生之雷射吸收物質14的位置。因此,雷射吸收物質會隨時間經過而擴散,對於1個保形遮罩的蓄熱量係受到抑制,可確保絕緣材內部的玻璃纖維布冷卻至玻璃移轉溫度以下之充分的照射間隔。 Conformal masks of interest, after a processing After the completion of the sequence, the laser light 1 is irradiated again, but because the laser light irradiation position is different from the laser light irradiation position irradiated during the previous processing procedure, the laser light 1 performed later is passed by After a certain period of time, it is irradiated to a position different from the laser absorbing substance 14 generated after being decomposed and removed. Therefore, the laser absorbing substance diffuses with time, and the heat storage capacity of a conformal mask is suppressed, and the glass fiber cloth inside the insulating material can be cooled to a sufficient irradiation interval below the glass transition temperature.

此外,以往係對於相同的保形遮罩照射雷射光1,因此會因為存在由於先照射之雷射光1的照射所產生的雷射吸收物質14而受到蓄熱的影響,但在本發明的實施例1中,之後進行的雷射光1,會在經過某程度的時間之後,照射至不同於被分解去除後所產生之雷射吸收物質14的位置,因此雷射吸收物質會隨著時間經過而擴散,不易產生之後要照射之雷射光1之強度的衰減或強度分布的變化,而可形成良好的孔。 In addition, conventionally, the same conformal mask is irradiated with the laser light 1, so it is affected by heat storage because of the laser absorbing substance 14 generated by the irradiation of the laser light 1 irradiated first, but in the embodiment of the present invention In 1, the laser light 1 that is carried out after a certain period of time will be irradiated to a position different from the laser absorbing substance 14 generated after being decomposed and removed, so the laser absorbing substance will diffuse with time. , It is not easy to generate the attenuation of the intensity of the laser light 1 to be irradiated or the change of the intensity distribution, and a good hole can be formed.

雷射光1的照射位置,係藉由經由控制裝置50所控制之光掃描裝置4所進行的偏向,或是由移動平台9之驅動所進行之被加工材6的平行移動,或是由光掃描裝置4所進行的偏向與移動平台9之驅動的雙方來定位。若為光掃描裝置4的掃描範圍內,亦可在使移動平台9靜止的狀態下,僅藉由光掃描裝置4的掃描而使雷射光1的照射位置變化。 The irradiation position of the laser light 1 is the deflection by the light scanning device 4 controlled by the control device 50 or the parallel movement of the workpiece 6 by the driving of the mobile platform 9 or the light scanning Both the deflection performed by the device 4 and the driving of the mobile platform 9 are positioned. As long as it is within the scanning range of the optical scanning device 4, the irradiation position of the laser light 1 may be changed only by the scanning of the optical scanning device 4 while the mobile platform 9 is stationary.

亦可為,將相對於各保形遮罩的重心位於 相同的相對位置亦即m為相同的雷射光照射位置k(n、m)分組,在對於m為相同的雷射光照射位置群組的照射中,僅藉由光掃描裝置4所進行的偏向來進行照射雷射光1的定位,而對於位於m為不同之相對位置之雷射光照射位置群組之照射時,係使移動平台9驅動相應於群組間之座標的差分,使被加工材6平行移動,藉此對於群組間的雷射光照射位置賦予相對性位移。 Alternatively, the center of gravity with respect to each conformal mask may be located The same relative position, that is, m is the same laser light irradiation position k (n, m) grouping. In the irradiation of the same laser light irradiation position group with m being the same, only the deflection by the light scanning device 4 is used. The positioning of the irradiation laser light 1 is performed, and when the irradiation of the laser light irradiation position group located at a different relative position m, the mobile platform 9 is driven to drive the difference corresponding to the coordinates between the groups, so that the workpiece 6 is parallel By moving, a relative displacement is given to the laser light irradiation position between groups.

作為藉由移動平台9的驅動而使被加工材6平行移動的替代者,亦可如第5圖所示,在較fθ透鏡5之設置位置更靠振盪器2側的位置追加配置光掃描裝置20,且藉由光掃描裝置20而對於雷射光照射位置賦予相對性位移。 As an alternative to moving the workpiece 6 in parallel by the driving of the moving platform 9, as shown in FIG. 5, an optical scanning device may be additionally disposed at a position closer to the side of the oscillator 2 than the position of the fθ lens 5. 20, and a relative displacement is given to the laser light irradiation position by the light scanning device 20.

在實施例1中,雖已針對對於雷射光照射位置k(n、m)之各者的位置照射1脈衝的情形進行了說明,但亦可連續照射複數個脈衝數,來加速孔形成的進展。 In the first embodiment, the case where one pulse is irradiated to each of the laser light irradiation positions k (n, m) has been described, but a plurality of pulses may be continuously irradiated to accelerate the progress of hole formation. .

如此,當著眼於任意的保形遮罩時,之後進行照射的雷射光,會在經過某程度的時間之後,照射至不同於先被分解去除且經電漿化後之雷射光吸收物質的產生位置的位置,因此雷射光吸收物質會隨著時間經過而擴散,對於1個保形遮罩的蓄熱量受到抑制,可確保絕緣材內部的玻璃纖維布冷卻至玻璃移轉溫度以下之充分的照射間隔,結果,玻璃纖維布會被充分地分解去除,不會產生玻璃纖維布的突出,而可抑制玻璃珠殘留至孔底部,因此可效率良好地形成孔。 In this way, when focusing on an arbitrary conformal mask, after a certain amount of time, the laser light that is irradiated will be irradiated to a different generation of the laser light absorbing material that was first decomposed and removed and plasmatized. Position, the laser light absorbing substance diffuses with the passage of time, the heat storage capacity of a conformal mask is suppressed, and the glass fiber cloth inside the insulating material can be cooled to a sufficient irradiation below the glass transition temperature As a result, the glass fiber cloth is sufficiently decomposed and removed without causing the glass fiber cloth to protrude, and glass beads can be suppressed from remaining at the bottom of the hole, so that the hole can be efficiently formed.

實施例2 Example 2

在實施例1中,雖已針對將雷射光照射點以保形遮罩的重心為基點定出一個與保形遮罩之外周部相似形狀的情形,但亦可以保形遮罩的重心為基點定出複數個與保形遮罩之外周部相似形狀的外周部。當保形遮罩為圓形時,保形遮罩的重心即為保形遮罩的中心。 In the first embodiment, although a case where the shape of the shape of the outer periphery of the conformal mask is set based on the center of gravity of the conformal mask as the base point of the laser light irradiation point, the center of gravity of the conformal mask can also be used as the base point. A plurality of outer peripheral portions having a shape similar to the outer peripheral portion of the conformal mask is determined. When the conformal mask is circular, the center of gravity of the conformal mask is the center of the conformal mask.

第6圖係顯示對於屬於本發明之實施例2之被加工材6之形成有2個保形遮罩60a至60b之基材10照射雷射光1的照射位置。在本發明的實施例2中,係以保形遮罩60a為例進行說明,在保形遮罩60a的內側以保形遮罩60a的重心為基點,定出與保形遮罩60a之外周部61相似形狀的外周部21與外周部22,且以將外周部21與外周部22之外周長度均分之方式決定雷射光照射點62。在N個保形遮罩中,當各保形遮罩中對於外周部21存在P個雷射光照射點,對於外周部22存在Q個雷射光照射點時,將第n個保形遮罩中之照射至外周部21的第p個雷射光照射位置設為a(n、p),且將照射至外周部22的第q個雷射光照射位置設為b(n、q)。在此,1≦n≦N,1≦p≦P,1≦q≦Q。 FIG. 6 shows the irradiation position of the laser beam 1 on the substrate 10 having two conformal masks 60a to 60b formed on the workpiece 6 belonging to the second embodiment of the present invention. In the second embodiment of the present invention, the conformal mask 60a is described as an example. The center of the conformal mask 60a is used as a base point on the inner side of the conformal mask 60a to determine the outer periphery of the conformal mask 60a. The outer peripheral portion 21 and the outer peripheral portion 22 having a similar shape to the portion 61 determine the laser light irradiation point 62 so that the outer peripheral lengths of the outer peripheral portion 21 and the outer peripheral portion 22 are evenly divided. In the N conformal masks, when there are P laser light irradiation points for the outer peripheral part 21 and Q laser light irradiation points for the outer peripheral part 22 in each of the conformal masks, the nth conformal mask is The p-th laser light irradiation position irradiated to the outer peripheral part 21 is set to a (n, p), and the q-th laser light irradiation position irradiated to the outer peripheral part 22 is set to b (n, q). Here, 1 ≦ n ≦ N, 1 ≦ p ≦ P, and 1 ≦ q ≦ Q.

針對加工順序,不予以區別照射至外周部21的雷射光照射位置a(n、p)與照射至外周部22的雷射光照射位置b(n、q),只要以與實施例1中所說明之雷射光照射順序相同的順序來決定即可。在一個保形遮罩中,要照射雷射光1的位置,係預先規定4個以上,每逢一個加工 程序完成要對1個保形遮罩照射雷射光1時,就將雷射光1照射至距照射完成之位置最遠的位置而且為雷射光1的未照射位置。另外,對於雷射光照射位置a(n、p)與b(n、q)照射雷射光1時的加工條件均設為相同。 Regarding the processing sequence, the laser light irradiation position a (n, p) irradiated to the outer peripheral portion 21 and the laser light irradiation position b (n, q) irradiated to the outer peripheral portion 22 are not distinguished, as long as it is as described in Embodiment 1. The laser light irradiation order may be determined in the same order. In a conformal mask, the positions of the laser light 1 to be irradiated are 4 or more in advance, and each time it is processed When the procedure is completed, when a conformal mask is irradiated with the laser light 1, the laser light 1 is irradiated to the position farthest from the position where the irradiation is completed and is the unirradiated position of the laser light 1. The processing conditions when the laser light 1 is irradiated to the laser light irradiation positions a (n, p) and b (n, q) are the same.

如此,當著眼於任意的保形遮罩時,之後進行照射的雷射光,會在經過某程度之時間後,照射至與先被分解去除而電漿化後之雷射光吸收物質之產生位置不同的位置,因此雷射光吸收物質會隨時間經過而擴散,對於1個保形遮罩的蓄熱量係受到抑制,可確保絕緣材內部之玻璃纖維布冷卻至玻璃移轉溫度以下之充分的照射間隔,結果,玻璃纖維布會被充分地分解去除,不會產生玻璃纖維布的突出,而可抑制玻璃珠殘留至孔底部,因此可效率良好地形成孔。 In this way, when focusing on an arbitrary conformal mask, the laser light that is irradiated thereafter will be irradiated to a position different from the generation position of the laser light absorbing material that is decomposed and removed and plasmatized after a certain period of time. Position, the laser light absorbing substance will diffuse with time, and the heat storage capacity of a conformal mask is suppressed, which can ensure that the glass fiber cloth inside the insulating material is cooled to a sufficient irradiation interval below the glass transition temperature. As a result, the glass fiber cloth is sufficiently decomposed and removed, and the glass fiber cloth does not protrude, and the glass beads can be suppressed from remaining at the bottom of the hole, so that the hole can be efficiently formed.

實施例3 Example 3

在實施例2中,雖已針對將雷射光1照射於雷射光照射位置a(n、p)與b(n、q)時之加工條件均為相同的情形進行了說明,但亦可如第7圖所示,依要照射雷射光1的每一外周部,變更所要照射之雷射光1的脈衝寬度、射束強度、擊發數、基材10之表面與fθ透鏡5之焦點面7之距離之類的參數中之至少一個參數。 In the second embodiment, the case where the processing conditions when the laser light 1 is irradiated to the laser light irradiation positions a (n, p) and b (n, q) is the same has been described, but it can also be described as As shown in FIG. 7, the pulse width, the beam intensity, the number of shots, the distance between the surface of the substrate 10 and the focal surface 7 of the fθ lens 5 are changed according to each outer peripheral portion of the laser light 1 to be irradiated. At least one of the parameters.

以保形遮罩60a為例進行說明,茲考慮以保形遮罩60a的重心為基點,先對於與保形遮罩60a之外周部相似形狀的外周部中之最外側的外周部21照射雷射光1,接下來,對於內側的外周部22照射雷射光1的情形。關於 保形遮罩60a的重心部分,由於樹脂及玻璃纖維布的大部分已被先照射至外周部21的雷射光1所去除,因此當對於內側的外周部22以與先照射至外周部21之雷射光1相同的加工條件照射時,線能量會變過多,而會有在底面導通層產生熔融部分的情形。因此,要照射至內側之外周部22的雷射光1,係可降低射束強度進行加工,藉此避免熔融而進行良好的孔形成。 The conformal mask 60a is taken as an example for description. Considering that the center of gravity of the conformal mask 60a is used as a base point, the outermost peripheral portion 21 of the outer peripheral portion having a shape similar to the outer peripheral portion of the conformal mask 60a is first irradiated with lightning. The emitted light 1 is then irradiated with the laser light 1 to the inner peripheral portion 22. on Since most of the center of gravity of the conformal mask 60a has been removed by the laser light 1 that first irradiated the outer peripheral portion 21, the inner peripheral portion 22 should be irradiated to the outer peripheral portion 21 first. When the laser light 1 is irradiated under the same processing conditions, the linear energy may become excessive, and a molten portion may be generated in the bottom conduction layer. Therefore, the laser light 1 to be irradiated to the inner outer peripheral portion 22 can be processed by reducing the beam intensity, thereby avoiding melting and performing good hole formation.

此外,當保形遮罩內部之絕緣層17的厚度例如為200μm以上時,為了有效地去除絕緣層17之背面導體層19側下部,當要照射雷射光1於內側的外周部22時,可藉由使雷射光1更為聚光在絕緣層17的背面導體層19側下部之方式使fθ透鏡5的焦點面7下降或者使被加工材6上升,而在絕緣層17的背面導體層19側下部,進行擴大了絕緣物去除面積的孔形成。 In addition, when the thickness of the insulating layer 17 inside the conformal mask is, for example, 200 μm or more, in order to effectively remove the lower portion of the back conductive layer 19 side of the insulating layer 17, when the laser light 1 is to be irradiated to the inner peripheral portion 22 on the inner side, By focusing the laser light 1 on the lower side of the back conductor layer 19 of the insulating layer 17, the focal surface 7 of the fθ lens 5 is lowered or the workpiece 6 is raised, and the back conductor layer 19 of the insulating layer 17 is raised. The lower part of the side is formed with a hole having an enlarged insulation removal area.

如此,當著眼於任意的保形遮罩時,之後進行照射的雷射光,會在經過某程度之時間後,照射至與先被分解去除而電漿化後之雷射光吸收物質之產生位置不同的位置,因此雷射光吸收物質會隨時間經過而擴散,對於1個保形遮罩的蓄熱量係受到抑制,可確保絕緣材內部之玻璃纖維布冷卻至玻璃移轉溫度以下之充分的照射間隔,結果,玻璃纖維布會被充分地分解去除,不會產生玻璃纖維布的突出,而可抑制玻璃珠殘留至孔底部,因此可效率良好地形成孔。 In this way, when focusing on an arbitrary conformal mask, the laser light that is irradiated thereafter will be irradiated to a position different from the generation position of the laser light absorbing material that is decomposed and removed and plasmatized after a certain period of time. Position, the laser light absorbing substance will diffuse with time, and the heat storage capacity of a conformal mask is suppressed, which can ensure that the glass fiber cloth inside the insulating material is cooled to a sufficient irradiation interval below the glass transition temperature. As a result, the glass fiber cloth is sufficiently decomposed and removed, and the glass fiber cloth does not protrude, and the glass beads can be suppressed from remaining at the bottom of the hole, so that the hole can be efficiently formed.

Claims (8)

一種雷射加工方法,其係對於按形成於基材上之N個保形遮罩各者分別設定之M個雷射光照射點依序進行雷射光照射之雷射加工方法,其中,在對前述M×N個雷射光照射點依序進行雷射光照射時,反覆進行M×N次下述操作:對於一個前述保形遮罩中的M個雷射光照射點之中的一點進行一個雷射光照射,接著對於別的前述保形遮罩的M個前述雷射光照射點之中的一點進行下一個雷射光照射之操作,藉此按每個前述保形遮罩形成一個孔。 A laser processing method is a laser processing method for sequentially performing laser light irradiation on M laser light irradiation points respectively set by each of N conformal masks formed on a substrate. When M × N laser light irradiation points are sequentially irradiated with laser light, the following operations are repeatedly performed M × N times: one laser light is irradiated on one of the M laser light irradiation points in a conformal mask Then, the next laser light irradiation operation is performed on one of the M aforementioned laser light irradiation points of the other conformal masks, thereby forming a hole for each of the aforementioned conformal masks. 一種雷射加工方法,其係對於按形成於基材上之N個保形遮罩各者分別設定之M個雷射光照射點依序進行雷射光照射之雷射加工方法,其中,在將第n個(1≦n≦N)保形遮罩的第m個(1≦m≦M)雷射光照射點k標示成k(n、m)時,從m=1至m=M為止反覆進行下述步驟:將m固定而一面將n從1逐一增加至N為止一面對從k(1、m)至k(N、m)之各雷射光照射點進行雷射光照射之步驟。 A laser processing method is a laser processing method for sequentially performing laser light irradiation on M laser light irradiation points respectively set by each of N conformal masks formed on a substrate. When the mth (1 ≦ m ≦ M) laser light irradiation point k of the n (1 ≦ n ≦ N) conformal masks is marked as k (n, m), it is repeated from m = 1 to m = M The following steps: the step of fixing m while increasing n from 1 to N one by one, and performing laser light irradiation at each laser light irradiation point from k (1, m) to k (N, m). 如申請專利範圍第1或2項所述之雷射加工方法,其中,前述雷射光照射點係以前述保形遮罩的重心為基點而規定於與前述保形遮罩為相似形狀的外周部。 The laser processing method according to item 1 or 2 of the scope of patent application, wherein the laser light irradiation point is defined on the outer peripheral portion of the shape conforming mask based on the center of gravity of the shape conforming mask. . 如申請專利範圍第3項所述之雷射加工方法,其中,前述雷射光照射點係設定於將前述外周部之外周長度予以均分為複數個而得的位置。 The laser processing method according to item 3 of the scope of the patent application, wherein the laser light irradiation point is set at a position where the outer peripheral portion is divided into a plurality of outer peripheral lengths. 如申請專利範圍第3項所述之雷射加工方法,其中,前述外周部係於前述保形遮罩的內側規定有複數個。 The laser processing method according to item 3 of the scope of the patent application, wherein the outer peripheral portion is provided on the inner side of the conformal mask, and a plurality of the outer peripheral portions are defined. 如申請專利範圍第1或2項所述之雷射加工方法,其中,前述雷射光照射點係對1個前述保形遮罩預先規定有4個以上。 The laser processing method according to item 1 or 2 of the scope of the patent application, wherein the laser light irradiation point is defined in advance to 4 or more for one of the conformal masks. 如申請專利範圍第1或2項所述之雷射加工方法,其中,前述雷射光係脈衝光。 The laser processing method according to item 1 or 2 of the scope of patent application, wherein the laser light is pulsed light. 如申請專利範圍第7項所述之雷射加工方法,其中,前述脈衝光的數量係1脈衝。 The laser processing method according to item 7 of the scope of patent application, wherein the number of the pulsed light is one pulse.
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