TW201812972A - Flip device handler having the same - Google Patents
Flip device handler having the same Download PDFInfo
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- TW201812972A TW201812972A TW106129032A TW106129032A TW201812972A TW 201812972 A TW201812972 A TW 201812972A TW 106129032 A TW106129032 A TW 106129032A TW 106129032 A TW106129032 A TW 106129032A TW 201812972 A TW201812972 A TW 201812972A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
- B65G47/74—Feeding, transfer, or discharging devices of particular kinds or types
- B65G47/90—Devices for picking-up and depositing articles or materials
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/06—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
- B65G49/061—Lifting, gripping, or carrying means, for one or more sheets forming independent means of transport, e.g. suction cups, transport frames
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67121—Apparatus for making assemblies not otherwise provided for, e.g. package constructions
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67236—Apparatus for manufacturing or treating in a plurality of work-stations the substrates being processed being not semiconductor wafers, e.g. leadframes or chips
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67712—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrate being handled substantially vertically
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2201/00—Indexing codes relating to handling devices, e.g. conveyors, characterised by the type of product or load being conveyed or handled
- B65G2201/02—Articles
- B65G2201/0214—Articles of special size, shape or weigh
- B65G2201/022—Flat
Abstract
Description
本發明涉及一種倒裝元件處理器,更具體是關於從裝載多個元件的晶圓環等裝載部件拾取元件,並進行倒裝後再卸載的倒裝元件處理器。 The present invention relates to a flip-chip component processor, and more particularly, to a flip-chip component processor that picks up components from a loading component such as a wafer ring on which a plurality of components are mounted, and performs flip-chip loading and unloading.
動態隨機記憶體、快閃記憶體、LSI、LED等半導體元件(以下簡稱「元件」)一般完成半導體製程之後經過切割製程、封裝製程等,之後上市銷售。 Semiconductor components such as dynamic random access memory, flash memory, LSI, and LED (hereinafter referred to as "components") are generally completed after the semiconductor process is completed, and then subjected to a cutting process and a packaging process.
而且,元件導線架、BGA等終端結構越發多樣化,因此晶片的種類越來越多。 In addition, terminal structures such as component lead frames and BGAs are becoming more diverse, so there are more and more types of chips.
再者,隨著奈米製程等精細製程的發展,半導體元件的整體尺寸呈現出比之前明顯變小的態勢。 Furthermore, with the development of fine processes such as nano-fabrication, the overall size of semiconductor devices has become significantly smaller than before.
此外,在智慧手機發展及智慧手機的輕薄化趨勢的影響下,智慧手機和智慧手錶所用元件的大小和厚度都被要求最小化。 In addition, under the influence of the development of smart phones and the trend of thinner and lighter smartphones, the size and thickness of components used in smart phones and smart watches are required to be minimized.
為滿足這一趨勢和要求,半導體元件不在切割製程後通過鍵合機進行基於引線等的封裝製程,而按照韓國第10-1088205號註冊專利,從晶圓級到封裝製程之後通過切割製程利用個別封裝元件的技術--所謂WL-CSP(Wafer level chip scale pacake)。 In order to meet this trend and requirements, semiconductor components are not packaged based on leads, etc. through bonding machines after the dicing process, but in accordance with Korean Registered Patent No. 10-1088205, individual devices are used through the dicing process from the wafer level to the packaging process The technology of packaging components-the so-called WL-CSP (Wafer level chip scale pacake).
與此同時,當形成WL-CSP元件時的元件為小型元件時,在晶圓級的基礎上形成球形終端受到諸多限制,存在元件生產製程難度大的問題。 At the same time, when the components used to form the WL-CSP components are small components, the formation of spherical terminations on a wafer-level basis is subject to many restrictions, and there is a problem that the component production process is difficult.
由此,針對已經完成半導體製程的元件,提出在切割製程後對單個元件進行引線、形成終端等的所謂Fan-Out WLP製程。 Therefore, for a component that has completed a semiconductor process, a so-called Fan-Out WLP process is proposed in which a single component is leaded, a terminal is formed, etc. after the dicing process.
同時,隨著動態隨機記憶體、移動動態隨機記憶體、移動CPU等LSI等半導體市場競爭加劇,需要降低元件製造成本,而且最終尤為迫切需要提高生產率。 At the same time, with the intensified competition in semiconductor markets such as dynamic random access memory, mobile dynamic random access memory, and mobile CPUs, it is necessary to reduce component manufacturing costs, and in the end, it is particularly urgent to increase productivity.
此外,鑒於半導體生產製程在超淨工廠內進行且超淨工廠內執行各製程的設備的處理速度與生產率直接相關,重要的是提高用於卸載不經過封裝製程或處於製程前的晶圓級元件的元件處理器或設備的處理速度。 In addition, in view of the fact that semiconductor manufacturing processes are performed in ultra-clean plants and the processing speed of the equipment that executes each process in the ultra-clean plants is directly related to productivity, it is important to improve wafer-level components that are not used for packaging or before the process. The processing speed of the component processor or device.
提高用於卸載晶圓級元件的元件處理器或設備的處理速度對半導體生產尤其重要。 Increasing the processing speed of a component processor or equipment used to offload wafer-level components is particularly important for semiconductor production.
然而,卸載晶圓級元件的元件處理器從已經完成半導體製程和切割製程的晶圓環上拾取元件,並放在載帶等裝載材料上,進而從晶圓環上卸載元件。 However, a component processor that unloads wafer-level components picks up components from a wafer ring that has completed a semiconductor process and a dicing process, and places them on a loading material such as a carrier tape, thereby unloading the components from the wafer ring.
此處,元件處理器的處理速度(通常以每小時處理數量(UPH)計算)取決於從晶圓環上拾取並倒裝元件後將元件放在載帶等裝載材料上的處理量。 Here, the processing speed of the component processor (usually calculated as the number of processed hours per hour (UPH)) depends on the processing capacity of the component placed on a carrier material such as a carrier tape after the component is picked up from the wafer ring and inverted.
具體而言,元件處理器的處理速度取決於攝影鏡頭識別元件與晶圓環和拾取器(拾取器)之間的位置調整等決定的晶圓環元件拾取效率、拾取後放在裝載材料上的元件裝載效率。 Specifically, the processing speed of the component processor depends on the wafer ring component picking efficiency determined by the position adjustment between the imaging lens recognition component and the wafer ring and the picker (pickup), and the position of the component on the loading material after picking up. Component loading efficiency.
此外,元件處理器的處理速度還取決於從裝有多種元件的晶圓環上拾取元件時的準確性、拾取速度、倒裝後的元件傳遞等。 In addition, the processing speed of the component processor also depends on the accuracy when picking components from a wafer ring with multiple components, picking speed, component transfer after flip-chip, and so on.
本發明的目的在於滿足所述趨勢和需求供應提供一種倒裝元件處理器,從裝載多個元件的裝載部件拾取元件並倒裝後再裝載到載帶等卸載部件,因此能夠顯著提高設備的處理速度。 An object of the present invention is to satisfy the above-mentioned trend and demand, and to provide a flip-chip component processor that picks up components from a loading component that loads a plurality of components and inverts them and then loads them into unloading components such as a carrier tape, so that the processing of the equipment can be significantly improved. speed.
本發明是為了達成所述本發明的目的而提出的,本發明揭露一種倒裝元件處理器,其特徵在於,包括:裝載部件工作盤200,從裝載附著多個元件1的裝載部件60的裝載部件載體部100接收裝載部件60,並以水平方向移動所述裝載部件60;卸載部300,從裝載部件工作盤200水平隔開佈置,並設有一個以上從裝載部件60接收元件1並裝載的卸載部件70;第一傳送工具400,在裝載部件工作盤200從裝載部件60的拾取位置P1拾取元件1並進行倒裝,之後移動到傳遞位置P2;第二傳送工具500,在傳遞位置P2從第一傳送工具400接收元件1,在卸載位置P3向卸載部件70卸下元件1。 The present invention is made in order to achieve the above-mentioned object of the present invention. The present invention discloses a flip-chip component processor, which is characterized by including a loading component work tray 200 and loading of a loading component 60 to which a plurality of components 1 are attached. The component carrier portion 100 receives the loading component 60 and moves the loading component 60 in a horizontal direction; the unloading portion 300 is horizontally spaced from the loading component work tray 200 and is provided with one or more components receiving the component 1 from the loading component 60 and loading it. unloading unit 70; a first delivery tool 400, the working disk loading member pickup position P 1 of the loading member 60 and the pickup element 1 is flip 200, after moving to the transfer position P 2; second transfer means 500, in the transfer position P 2 receives the component 1 from the first transfer tool 400 and unloads the component 1 to the unloading member 70 at the unloading position P 3 .
第一傳送工具400可包括:兩個以上的拾取器410,在裝載部件工作盤200,以與裝載部件60的上方垂直的第一旋轉軸420為中心旋轉經過拾取位置P1及傳遞位置P2,在拾取位置P1拾取元件1,在傳遞位置P2向第二傳送工具500傳遞元件1;第一旋轉驅動部,以第一旋轉軸420為中心旋轉驅動兩個以上的所述拾取器410,依次經過拾取位置P1及傳遞位置P2;倒裝旋轉部430,通過旋轉使拾取器410的拾取頭在拾取位置P1朝向裝載部件60的上方,而在傳遞位置P2使拾取器410的拾取頭朝向上側。 The first conveyance tool 400 may include two or more pickers 410 that rotate on the loading part work tray 200 around the first rotation axis 420 perpendicular to the upper part of the loading part 60 through the picking position P 1 and the transfer position P 2 , Picking up the component 1 at the pick-up position P 1 , and transferring the component 1 to the second transfer tool 500 at the transfer position P 2 ; the first rotation driving part rotates and drives two or more of the pickers 410 with the first rotation axis 420 as the center; , Passing through the pick-up position P 1 and the transfer position P 2 in sequence; the flip rotation part 430 rotates the pick-up head of the picker 410 at the pick-up position P 1 toward the top of the loading member 60, and makes the pick-up 410 at the transfer position P 2 The pickup head is facing up.
第二傳送工具500包括:兩個以上的拾取器510,在裝載部件工作盤200以與裝載部件60的上面垂直的第二旋轉軸520為中心旋轉,以經過傳遞位置P2及卸載位置P3,在拾取位置P1拾取被第一傳送工具400的拾取器410拾取並被倒裝的元件1,在卸載位置P3向卸載部件70卸載元件1;第二旋轉驅動部,以第二旋轉軸520為中心旋轉驅動兩個以上的拾取器510,依次經過傳遞位置P2及卸載位置P3。 The second conveyance tool 500 includes two or more pickers 510 that rotate on the loading member work tray 200 around a second rotation axis 520 that is perpendicular to the upper surface of the loading member 60 to pass through the transfer position P 2 and the unloading position P 3 , Picking up the component 1 picked up by the picker 410 of the first transfer tool 400 and flipped at the picking position P 1 , and unloading the component 1 to the unloading part 70 at the unloading position P 3 ; 520 rotates and drives two or more pickups 510 as the center, and passes the transfer position P 2 and the unloading position P 3 in order .
本發明的倒裝元件處理器的優點如下:利用以與晶圓環等裝載部件上方呈垂直的旋轉軸為中心旋轉的多個拾取器構成用於傳送元件的傳送工具,進而在執行元件的拾取與放置時,可一次性完成多個元件的拾取及放置,從而能夠顯著提高元件的卸載速度。 The advantages of the flip-chip processor of the present invention are as follows: a transfer tool for transferring components is constituted by using a plurality of pickers that rotate around a rotation axis that is perpendicular to the top of a loading member such as a wafer ring, and then picks up the components When placing and placing, multiple components can be picked and placed at once, which can significantly increase the unloading speed of components.
再者,本發明的倒裝元件處理器的優點如下:利用第一傳送工具來執行從晶圓環等裝載部件拾取及倒裝元件,利用第二傳送工具來執行拾取由第一傳送工具拾取以及倒裝的元件來卸載到卸載部,從而可不斷執行元件的拾取、倒裝及放置,進而能夠顯著提高元件卸載速度。 Further, the advantages of the flip-chip processor of the present invention are as follows: the first transfer tool is used to perform picking and flip-chip components from loading parts such as wafer rings, and the second transfer tool is used to perform pick-up by the first transfer tool and The components are flipped to unload to the unloading section, so that the components can be continuously picked up, flipped and placed, which can significantly increase the speed of component unloading.
尤其,所述第一傳送工具以與裝載部件上面呈垂直的旋轉軸為中心旋轉,在拾取位置拾取並倒裝元件後從傳遞位置傳遞到第二傳送工具,從而可不斷執行元件的拾取、倒裝及放置,進而能夠顯著提高元件卸載速度。 In particular, the first transfer tool rotates around a rotation axis that is perpendicular to the upper surface of the loading part, and after picking and flipping the component at the pick-up position, it is transferred from the transfer position to the second transfer tool. Installation and placement, which can significantly improve component unloading speed.
同時,所述第二傳送工具為以與裝載部件上層呈垂直的旋轉軸為中心旋轉被第一傳送工具拾取並倒裝的元件,並在傳遞位置從第一傳送工具接收元件,在卸載位置卸載元件,因此可不斷執行元件的拾取、倒裝及放置,進而能夠顯著提高元件卸載速度。 At the same time, the second transfer tool is a component that is picked up and inverted by the first transfer tool around a rotation axis that is perpendicular to the upper layer of the loading part, and receives the component from the first transfer tool at the transfer position and unloads at the unloading position. Components can therefore be continuously picked, flipped, and placed, which can significantly increase component unloading speed.
即,所述第一傳送工具及第二傳送工具具有多個拾取器水平旋轉的水平轉盤結構,因此可不斷執行元件的拾取、倒裝及放置,從而能夠顯著提高元件卸載速度。 That is, the first conveying tool and the second conveying tool have a horizontal turntable structure in which a plurality of pickers rotate horizontally, so that components can be continuously picked up, inverted, and placed, thereby significantly improving component unloading speed.
1‧‧‧元件 1‧‧‧ components
22‧‧‧槽 22‧‧‧slot
24‧‧‧真空壓形成裝置 24‧‧‧Vacuum pressure forming device
60‧‧‧裝載部件 60‧‧‧ Loading parts
61‧‧‧膠帶 61‧‧‧Tape
62‧‧‧框架部件 62‧‧‧Frame Parts
70‧‧‧卸載部件 70‧‧‧ unloading parts
71‧‧‧口袋部 71‧‧‧ Pocket
78‧‧‧滾軸部件 78‧‧‧ roller parts
79‧‧‧支撐部件 79‧‧‧ support parts
100‧‧‧裝載部件載體部 100‧‧‧ Loading parts carrier
200‧‧‧裝載部件工作盤 200‧‧‧ Loading component work tray
300‧‧‧卸載部 300‧‧‧Unloading Department
311‧‧‧結構一 311‧‧‧Structure 1
312‧‧‧結構二 312‧‧‧Structure 2
400‧‧‧第一傳送工具 400‧‧‧ First Teleporter
410‧‧‧拾取器 410‧‧‧Pickup
420‧‧‧第一旋轉軸 420‧‧‧first rotation axis
430‧‧‧倒裝旋轉部 430‧‧‧ Flip Rotary
500‧‧‧第二傳送工具 500‧‧‧ Second Teleporter
510‧‧‧拾取器 510‧‧‧Pickup
520‧‧‧第二旋轉軸 520‧‧‧Second rotation axis
810‧‧‧第一圖像獲取部 810‧‧‧First Image Acquisition Department
820‧‧‧第二圖像獲取部 820‧‧‧Second Image Acquisition Department
830‧‧‧第三圖像獲取部 830‧‧‧Third Image Acquisition Department
840‧‧‧第四圖像獲取部 840‧‧‧Fourth Image Acquisition Department
P1‧‧‧拾取位置 P 1 ‧‧‧Pick up position
P2‧‧‧傳遞位置 P 2 ‧‧‧ pass location
P3‧‧‧卸載位置 P 3 ‧‧‧ unloading position
圖1是顯示根據本發明的倒裝元件處理器設計概念的平面圖;圖2a和圖2b是顯示適用於圖1倒裝元件處理器的裝載部件示例的立體圖和剖面圖;圖3是顯示適用於圖1倒裝元件處理器的裝載部件的另一示例的立體圖;圖4是圖1的Ⅳ-Ⅳ方向的剖面圖;以及圖5是顯示在圖1利用第一傳送工具及第二傳送工具的傳送過程的部分側面圖。 1 is a plan view showing a design concept of a flip-chip processor according to the present invention; FIGS. 2a and 2b are perspective views and cross-sectional views showing an example of a loading component suitable for the flip-chip processor of FIG. 1; FIG. 1 is a perspective view of another example of a loading part of the flip-chip processor; FIG. 4 is a cross-sectional view taken along the IV-IV direction of FIG. 1; and FIG. 5 is a view showing the use of the first transfer tool and the second transfer tool in FIG. 1. Partial side view of the transfer process.
下面結合附圖,說明本發明所涉及的倒裝元件處理器。 The following describes a flip-chip processor according to the present invention with reference to the accompanying drawings.
如圖1及圖5所示,本發明的倒裝元件處理器包括:裝載部件工作盤200,從裝載附著多個元件1的裝載部件60的裝載部件載體部100獲取裝載部件60,以水平方向移動所述裝載部件60;卸載部300,從裝載部件工作盤200水平隔開佈置,並設有一個以上從裝載部件60接到元件1並裝載的卸載部件70;第一傳送工具400,在裝載部件工作盤200從裝載部件60的拾取位置P1拾取元件1並進行倒裝後移動到傳遞位置P2;第二傳送工具500,在傳遞位置P2,從第一傳送工具400接收元件1,在卸載位置P3向卸載部件70卸下元件1。 As shown in FIGS. 1 and 5, the flip-chip component processor of the present invention includes a loading component work tray 200, and the loading component 60 is obtained from a loading component carrier 100 for loading a loading component 60 to which a plurality of components 1 are attached, and the loading component 60 is horizontally oriented. The loading part 60 is moved; the unloading part 300 is horizontally spaced from the loading part work tray 200, and is provided with more than one unloading part 70 that is connected to the component 1 from the loading part 60 and loaded; The component work tray 200 picks up the component 1 from the pick-up position P 1 of the loading component 60 and then flips to the transfer position P 2 ; the second transfer tool 500 receives the component 1 from the first transfer tool 400 at the transfer position P 2 , At the unloading position P 3, the component 1 is unloaded to the unloading member 70.
裝載部件載體部100裝載附著多個元件1的裝載部件60,並且可採用多種結構。 The loading member carrier portion 100 loads a loading member 60 to which a plurality of components 1 are attached, and various structures can be adopted.
其中,裝載於裝載部件60的元件是在晶圓狀態下完成半導體製程及切割製程的元件;晶圓狀態下通過視覺檢查由單獨的元件處理器分類的元件等,可以是各種元件。 Among them, the components loaded on the loading part 60 are components that complete the semiconductor process and the dicing process in a wafer state; the components classified by a separate component processor through a visual inspection in the wafer state can be various components.
尤其,元件1與經過半導體製程後進行封裝製程的一般元件不同,無需封裝製程的所謂晶圓等級元件等多種元件可成為其物件,以倒 裝的狀態(即,以反轉的狀態)下裝載於如載帶等卸載部件70也可稱為其物件。 In particular, the component 1 is different from a general component that is subjected to a packaging process after a semiconductor process, and a variety of components such as a wafer-level component that does not require a packaging process can become its object and be loaded in an inverted state (that is, in an inverted state). The unloading member 70 such as a carrier tape may also be referred to as its object.
另外,如圖2a及圖2b所示,裝載部件60作為裝載完成半導體製程及切割製程的元件1的結構,包括附著元件1的膠帶61及固定膠帶61的框架部件62。 In addition, as shown in FIGS. 2 a and 2 b, the mounting member 60, as a structure for loading the component 1 that has completed the semiconductor process and the dicing process, includes a tape 61 to which the component 1 is attached and a frame member 62 that fixes the tape 61.
另外,膠帶61可為任何可附著的元件1的部件。 In addition, the adhesive tape 61 may be a component of any attachable element 1.
框架部件62為固定附著元件1的膠帶61的結構,可具備如圖2a及圖2b所示的圓形環,如圖3所示的四角環等,可採用多種結構。 The frame member 62 has a structure for fixing the adhesive tape 61 of the attachment element 1, and may include a circular ring as shown in FIGS. 2 a and 2 b, a four-corner ring as shown in FIG. 3, and the like, and various structures may be adopted.
另一方面,對於卸載部件70,只要是可裝載倒裝的元件1的結構均可,可以是任何一種結構,可使用如圖1所示的帶和盤載帶及上封帶;如圖3所示的附著膠帶的帶托盤,由裝載元件1的多個插入槽組成的托盤等,可使用為了市場出貨或其他製程而臨時裝載的部件多種部件。 On the other hand, as for the unloading member 70, as long as it has a structure capable of loading the flip-chip component 1, it may be any structure, and a tape as shown in FIG. 1 and a tape carrier tape and an upper sealing tape may be used; as shown in FIG. 3 The illustrated tape-attached tray, a tray composed of a plurality of insertion slots of the loading element 1, and the like can be used for a variety of parts temporarily loaded for market shipment or other processes.
並且,卸載部件70除臨時裝載元件1的部件以外,可使用製造裝載元件1的PCB等基板、條板(strip)、晶片的導線架(Lead Frame)等用於裝載晶片、封裝製程的部件。 In addition to the components for temporarily loading the component 1, the unloading component 70 may be a component for loading a wafer or a packaging process such as a substrate such as a PCB for manufacturing the component 1, a strip, or a lead frame of a wafer.
裝載部件載體部100用於裝載多個裝載部件60的結構,只要是上下層疊多個裝載部件60的結構均可,可以是任何一種結構。 The loading member carrier portion 100 is configured to load a plurality of loading members 60, and any structure may be used as long as a plurality of loading members 60 are stacked on top of each other.
裝載部件工作盤200構成從裝載部件載體部100接收裝載部件60,並且以水平方向移動裝載部件60的結構,可採用多種結構。 The loading member work tray 200 is configured to receive the loading member 60 from the loading member carrier portion 100 and move the loading member 60 in the horizontal direction, and various structures can be adopted.
例如,裝載部件工作盤200為,通過晶圓環裝載部件(圖未顯示)從裝載部件載體部100接受裝載部件60,並以水平方向移動裝載部件60,從而使第一傳送工具400拾取元件1的結構,可以是X-Y工作盤、X-Y-θ工作盤等多種結構。 For example, the loading unit work tray 200 receives the loading unit 60 from the loading unit carrier 100 through a wafer ring loading unit (not shown), and moves the loading unit 60 in a horizontal direction, so that the first transfer tool 400 picks up the component 1. The structure can be a variety of structures such as XY work plate, XY-θ work plate.
並且,裝載部件工作盤200可以上下方向,即Z軸方向移動。 In addition, the loading member work tray 200 can be moved in the vertical direction, that is, in the Z-axis direction.
並且,較佳為,在裝載部件工作盤200設置頂針組裝體(圖未顯示),進而在拾取位置P1順利拾取元件。 And, preferably, thimble assembly 200 is disposed in the working disk loading member (not shown), and further smooth the pickup position P 1 pickup element.
所述頂針組裝體為,第一傳送工具400的拾取器410在拾取位置P1拾取元件1時對裝載部件60施加壓力,例如,對在晶圓環的膠帶61的底面施加壓力,將附著元件1的膠帶61向拾取器410方向頂起等,可採用多種結構。 The thimble assembly is that the picker 410 of the first transfer tool 400 applies pressure to the loading member 60 when picking up the component 1 at the picking position P 1 , for example, applies pressure to the bottom surface of the tape 61 on the wafer ring to attach the component The tape 61 of 1 can be lifted in the direction of the picker 410, etc., and various structures are employable.
另外,較佳為,在拾取位置P1,於第一傳送工具400的拾取器410上側設置獲取裝載部件60上裝載的元件1的圖像的第一圖像獲取部位810。 In addition, it is preferable that a first image acquisition portion 810 that acquires an image of the component 1 loaded on the loading member 60 is provided on the pickup 410 of the first transfer tool 400 at the pickup position P 1 .
第一圖像獲取部810構成獲取裝載部件60裝載的元件1的圖像的結構,可採用掃描器,攝影機等多種結構。 The first image acquisition unit 810 is configured to acquire an image of the element 1 loaded on the loading unit 60, and various structures such as a scanner and a camera can be adopted.
並且,第一圖像獲取部810可應用於識別通過第一傳送工具400的拾取器410所拾取的元件1的位置,檢查元件1的上部等。 Also, the first image acquisition section 810 may be applied to identify the position of the component 1 picked up by the picker 410 of the first conveyance tool 400, inspect the upper part of the component 1, and the like.
第一圖像獲取部810較佳為設於裝載部件60附近,為防止第一傳送工具400的干涉,可設在裝載部件工作盤200上部並且可以水平移動或垂直移動。 The first image acquisition section 810 is preferably provided near the loading member 60. In order to prevent the interference of the first transfer tool 400, it may be provided on the upper portion of the loading member work tray 200 and may be moved horizontally or vertically.
另外,對於由裝載部件載體部100向裝載部件工作盤200傳遞裝載部件60的裝載部件裝載部位(圖未顯示),只要是可從裝載部件載體部100取出裝載部件60並將取出的裝載部件60傳遞至裝載部件工作盤200的結構均可,可以是任何一種結構。 In addition, as for the loading part loading part (not shown) for transferring the loading part 60 from the loading part carrier part 100 to the loading part work tray 200, as long as the loading part 60 can be taken out from the loading part carrier part 100 and the loaded loading part 60 can be taken out The structure transferred to the loading unit work tray 200 may be any structure.
例如,所述裝載部件裝載部可以是夾持裝置及線性驅動裝置結構,或由推送單元及線性移動推送單元的線性驅動裝置等多種結構。 For example, the loading part loading section may have various structures such as a clamping device and a linear driving device structure, or a linear driving device including a pushing unit and a linear moving pushing unit.
卸載部300從裝載部件工作盤200水平隔開佈置,並設有從裝載部件60接收倒裝後的元件1進行裝載的卸載部件70,可採用多種結構。 The unloading section 300 is horizontally spaced from the loading member work tray 200 and is provided with an unloading member 70 that receives the flipped component 1 from the loading member 60 for loading, and can adopt various structures.
尤其,卸載部300可根據帶和盤(載帶及上封帶)等卸載部件70的構成而決定。 In particular, the unloading unit 300 can be determined according to the configuration of the unloading member 70 such as a tape and a reel (a carrier tape and a top cover tape).
例如,如圖1以及圖4所示,卸載部300包括:放捲軸,沿著長度展開方向形成裝載元件1的口袋部71,並且在裝載元件之後由黏結帶(圖未顯示)密封的承載帶構成卸載部件70的情況下可旋轉地設置在一端,纏繞待裝載元件1的承載帶;捲繞輥(圖未顯示),可旋轉地設置在另一端,並且纏繞在裝載元件之後由黏結帶密封的承載帶;承載帶引導部(圖未顯示),為使從放捲輥(圖未顯示)展開的承載帶經過裝載位置而引導承載帶的移動。 For example, as shown in FIGS. 1 and 4, the unloading section 300 includes a unwinding shaft, a pocket section 71 of the loading element 1 formed along the length unfolding direction, and a carrier tape sealed by an adhesive tape (not shown) after loading the element. In the case where the unloading member 70 is configured, it is rotatably provided on one end to wind the carrier tape of the element 1 to be loaded; and a winding roller (not shown) is rotatably provided on the other end and is wound around the loading element and sealed by an adhesive tape. The carrier tape guide (not shown) guides the movement of the carrier tape so that the carrier tape unwound from the unwinding roller (not shown) passes through the loading position.
在此,如圖4所示,卸載部件70在裝載元件1的口袋部71的底面可形成多個槽22。 Here, as shown in FIG. 4, the unloading member 70 may form a plurality of grooves 22 on the bottom surface of the pocket portion 71 of the loading element 1.
然後,卸載部件70位於裝載位置時,設置在卸載部件70的垂直下方形成真空壓的真空壓形成裝置24,並利用後述的第二傳送工具500裝載時,可穩定裝載元件1。 Then, when the unloading member 70 is located at the loading position, a vacuum pressure forming device 24 for forming a vacuum pressure vertically below the unloading member 70 is provided, and when the second transfer tool 500 described later is loaded, the element 1 can be stably loaded.
在此,如圖4所示,卸載部件70為載帶時,可利用引導載帶的翼部分的一對滾軸部件78,以及固定滾軸部件的支撐部件79來引導移動過程。 Here, as shown in FIG. 4, when the unloading member 70 is a carrier tape, a pair of roller members 78 that guide a wing portion of the carrier tape and a support member 79 that fixes the roller members can be used to guide the movement process.
作為卸載部300的另一示例為附著卸載部件70的板件(參照圖3)的情況,元件卸載部300可包括:板件裝載部,設置在一端並裝載附著有多個半導體元件1的板件;X-Y台,在元件1裝載位置支撐板件並使所述板件移動,進而可通過傳送工具500接收元件1;托盤移動部(圖未顯示),將板件從托盤裝載部傳達到X-Y台。 As another example of the unloading section 300, when a board (see FIG. 3) of the unloading member 70 is attached, the component unloading section 300 may include a board loading section provided at one end and loading a board to which a plurality of semiconductor elements 1 are attached. XY stage, which supports and moves the component at the component 1 loading position, and can receive the component 1 through the conveying tool 500; the tray moving section (not shown) transfers the plate from the tray loading section to XY station.
在此,如圖3所示,所述板件作為與裝載部件60類似的結構,由附著元件1的黏結帶與固定黏結帶的同時具有批量(LOT)號碼、分類等級等標識的框架部件構成,或者作為形成有裝有元件1的多個插入槽的托盤,根據元件1的種類可使用標準的托盤,即可靠度試驗(JEDEC)托盤。 Here, as shown in FIG. 3, as a structure similar to the loading member 60, the plate is composed of a frame member having an adhesive tape of the attachment element 1 and a fixed adhesive tape, and having a lot (LOT) number, a classification level, and other identifiers. Or, as a tray formed with a plurality of insertion grooves in which the component 1 is formed, a standard tray, that is, a reliability test (JEDEC) tray can be used according to the type of the component 1.
另一方面,如圖1所示,卸載部300只由將元件1裝載於載帶的結構一311以及將元件1裝載於板件的結構二312等中的一種結構構成,或者在結構一311以及結構二312中包括兩個或者全部結構。 On the other hand, as shown in FIG. 1, the unloading section 300 is constituted only by one of the structure 1 311 for loading the component 1 on a carrier tape and the structure 2 312 for loading the component 1 on a board, or the structure 1 311 And structure two 312 includes two or all structures.
另外,卸載部300當然也可以設置至少兩個相同的結構,具體有將元件1裝載於載帶的結構一311、將元件1裝載於板件的結構二312等。 In addition, of course, the unloading unit 300 may be provided with at least two identical structures, specifically, a structure 1 311 for loading the component 1 on a carrier tape, a structure 312 for loading the component 1 on a board, and the like.
在此,若採用多個卸載部300,則需要向其佈置方向進行移動,此時第二傳送工具500的各拾取器510可單個或全部沿著卸載部300的佈置方向水平移動。 Here, if a plurality of unloading sections 300 are used, they need to be moved in the direction in which they are arranged. At this time, each of the pickers 510 of the second conveyance tool 500 can be moved horizontally along the arrangement direction of the unloading sections 300 individually or entirely.
第一傳送工具400在裝載部件工作盤200為可從裝載部件60在拾取位置P1拾取並倒裝元件1後移動到傳遞位置P2的結構,可採用各種結構。 The first transfer tool 400 has a structure in which the loading member work tray 200 can be picked up from the loading member 60 at the picking position P 1 and flipped to the transfer position P 2 , and various structures can be adopted.
例如,多個拾取器410可採用水平旋轉的水平轉盤結構,即,如圖1及圖2所示,第一傳送工具400可包括:兩個以上的拾取器410,在裝載部件工作盤200,以與裝載部件60的上面呈垂直的第一旋轉軸420為 中心旋轉經過拾取位置P1及傳遞位置P2,在拾取位置P1拾取元件1,並且傳遞位置P2向第二傳送工具500傳遞元件1;第一旋轉驅動部,以第一旋轉軸420為中心旋轉驅動兩個以上的拾取器410,依次經過拾取位置P1及傳遞位置P2;倒裝旋轉部430,通過旋轉使拾取器410的拾取頭在拾取位置P1朝向裝載部件60的上面,而在傳遞位置P2中使拾取器410的拾取頭朝向上側。 For example, the plurality of pickers 410 may adopt a horizontally rotating horizontal turntable structure, that is, as shown in FIG. 1 and FIG. 2, the first transfer tool 400 may include two or more pickers 410, and a loading tray 200, in the above load in a vertical member 60 of the first rotary shaft 420 rotates through the pick-up position P 1 P 2 and the delivery location, the pickup element picking position P 1 1, P 2 and the delivery location is transmitted to the second transmission means 500 Element 1; a first rotation driving part, which drives two or more pickups 410 in rotation around a first rotation shaft 420 as a center, and sequentially passes through a pickup position P 1 and a transfer position P 2 ; the flip-chip rotation part 430 makes the pickups by rotating The pickup head of 410 faces the upper side of the loading member 60 in the pickup position P 1 , and the pickup head of the pickup 410 faces the upper side in the transfer position P 2 .
兩個以上的拾取器410可在裝載部件工作盤200以與裝載部件60的上方呈垂直的第一旋轉軸420為中心旋轉,以經過拾取位置P1及傳遞位置P2,在拾取位置P1拾取元件1,在傳遞位置P2向第二傳送工具500傳遞元件1,可採用各種結構。 Two or more pickers 410 can be rotated on the loading member work tray 200 around a first rotation axis 420 that is perpendicular to the upper portion of the loading member 60 as a center, to pass through the picking position P 1 and the transfer position P 2 , and at the picking position P 1 Various structures can be adopted for picking up the component 1 and transferring the component 1 to the second transfer tool 500 at the transfer position P 2 .
尤其,各拾取器410可利用真空壓從裝載部件60拾取元件1。 In particular, each picker 410 can pick up the component 1 from the loading member 60 using vacuum pressure.
例如,拾取器410可包括:從外部接收空氣壓的空氣壓連接部;以及設於末端利用由空氣壓連接部位傳遞的空氣壓來拾取或放開元件1的拾取頭。 For example, the picker 410 may include an air pressure connection portion that receives air pressure from the outside, and a pickup head provided at an end to pick up or release the element 1 by using the air pressure transmitted by the air pressure connection portion.
同時,兩個以上的拾取器410以第一旋轉軸420為中心間隔固定距離,二個時180°、三個時120°、四個時90°等以等間距方式佈置所述拾取器。 At the same time, two or more pickups 410 are spaced a fixed distance from each other with the first rotation axis 420 as the center, and the pickups are arranged at equal intervals, such as 180 ° for two, 120 ° for three, and 90 ° for four.
不僅如此,拾取器410以第一旋轉軸420為中心旋轉,可通過旋轉接頭等使拾取器410能夠旋轉的同時能傳遞空氣壓。所述第一旋轉驅動部採用使兩個以上的拾取器410以第一旋轉軸420為中心依次經過拾取位置P1及傳遞位置P2的旋轉驅動的結構,可採用具備第一旋轉軸420的旋轉馬達等各種結構。 Moreover, the picker 410 is rotated around the first rotation shaft 420, and the picker 410 can be rotated by a rotary joint or the like and can transmit air pressure. The first rotation driving unit adopts a structure in which two or more pickups 410 are rotationally driven in order through the pickup position P 1 and the transfer position P 2 with the first rotation axis 420 as a center. Various structures such as rotary motors.
倒裝旋轉部430採用旋轉拾取器410,進而使拾取器410的拾取頭在拾取位置P1朝向裝載部件60上方,在傳遞位置P2的拾取器410的拾取頭朝向上側的結構,可選擇各種結構。 The flip rotation part 430 uses a rotary picker 410, so that the picking head of the picker 410 faces the loading member 60 at the picking position P 1 and the picking head of the picker 410 at the transfer position P 2 faces the upper side. structure.
例如,倒裝旋轉部430連接於第一旋轉軸420,並且設置於支撐各個拾取器410的臂部,可由旋轉拾取器410的旋轉馬達構成。 For example, the flip-chip rotation portion 430 is connected to the first rotation shaft 420 and is provided on an arm portion supporting each of the pickups 410, and may be constituted by a rotation motor that rotates the pickups 410.
第二傳送工具500採用在傳遞位置P2從第一傳送工具400接收元件1,在卸載位置P3向卸載部件70卸載元件1的結構,可採用各種結構。 The second transfer tool 500 adopts a structure in which the component 1 is received from the first transfer tool 400 at the transfer position P 2 and the component 1 is unloaded to the unloading member 70 at the unloading position P 3 , and various structures can be adopted.
例如,如圖1及圖2所示,第二傳送工具500可包括:兩個以上的拾取器510,在裝載部件工作盤200,以與裝載部件60的上方呈垂直的第二旋轉軸520為中心旋轉,以經過傳遞位置P2及卸載位置P3,在拾取位置P1拾取被第一傳送工具400的拾取器410拾取並被倒裝的元件1,在卸載位置P3向卸載部件70卸載元件1;第二旋轉驅動部,以第二旋轉軸520為中心旋轉驅動兩個以上的拾取器510,依次經過傳遞位置P2及卸載位置P3。 For example, as shown in FIGS. 1 and 2, the second conveyance tool 500 may include two or more pickers 510, and a second rotation axis 520 that is perpendicular to the upper part of the loading part 60 on the loading part work tray 200 as the center of rotation, to pass through the transfer position and the unloading position P 2 P 3, P 1 position of the pickup at the pickup 410 is a first pick-up transfer means 400 and flip chip pickup element 1, P 3 in the unloading position to unload the unloading means 70 Element 1; the second rotation driving unit drives two or more pickups 510 in rotation around the second rotation shaft 520 as the center, and sequentially passes through the transfer position P 2 and the unloading position P 3 .
兩個以上的拾取器510採用在裝載部件工作盤200以與裝載部件60的上方呈垂直的第二旋轉軸520為中心旋轉,以經過傳遞位置P2及卸載位置P3,在拾取位置P1拾取被第一傳送工具400的拾取器410拾取並被倒裝的元件1,在卸載位置P3向卸載部件70卸載元件1的結構,並可採用各種結構。 More than two pickup 200 to 510 using a second rotary shaft 520 in a vertical load to the upper member 60 rotates around the loading plate working member to pass through the position P 2 and the unloading position P 3, at the pickup position P 1 The structure of picking up the component 1 picked up by the picker 410 of the first transfer tool 400 and being flipped, and unloading the component 1 to the unloading part 70 at the unloading position P 3 , and various structures may be adopted.
尤其,各個拾取器510可利用真空壓力來拾取被第一傳送工具400的拾取器410拾取倒裝的元件1。 In particular, each picker 510 may use vacuum pressure to pick up the flip-chip component 1 by the picker 410 of the first transfer tool 400.
例如,拾取器510可包括:從外部接收空氣壓的空氣壓連接部;以及設於末端利用從空氣壓連接部傳遞的空氣壓來拾取或放開元件1的拾取頭。 For example, the picker 510 may include: an air pressure connection portion that receives air pressure from the outside; and a pickup head provided at an end to pick up or release the element 1 by using the air pressure transmitted from the air pressure connection portion.
然後,兩個以上的拾取器510以第二旋轉軸520為中心間隔固定距離,二個時180°、三個時120°、四個時90°等,能夠以等間距方式佈置。 Then, two or more pickups 510 are spaced a fixed distance from each other with the second rotation axis 520 as the center, 180 ° for two, 120 ° for three, 90 ° for four, etc., and they can be arranged at equal intervals.
另外,拾取器510以第二旋轉軸520為中心旋轉,可通過旋轉接頭等能夠旋轉各個拾取器510的同時能夠傳達空氣壓。 In addition, the pickup 510 is rotated about the second rotation shaft 520 as a center, and each of the pickups 510 can be rotated by a rotary joint or the like while transmitting air pressure.
所述第二旋轉驅動部位採用使兩個以上的拾取器510以第二旋轉軸520為中心旋轉驅動,依次經過傳遞位置P2及卸載位置P3的結構,可採用具備第二旋轉軸520的旋轉馬達等各種結構。 The second rotation driving part adopts a structure in which two or more pickups 510 are rotationally driven with the second rotation shaft 520 as the center, and sequentially passes through the transfer position P 2 and the unloading position P 3 . Various structures such as rotary motors.
另一方面,附圖中未進行說明的附圖符號820、830及840各為第二圖像獲取部、第三圖像獲取部及第四圖像獲取部。 On the other hand, reference numerals 820, 830, and 840 that are not described in the drawings are each a second image acquisition section, a third image acquisition section, and a fourth image acquisition section.
第二圖像獲取部820設於傳遞位置P2的上部,獲取被第一傳送工具400的拾取器410拾取的元件1的圖像,可採用掃描器、照相機等多種結構。 The second image acquisition section 820 is provided at an upper portion of the transfer position P 2 and acquires an image of the element 1 picked up by the pickup 410 of the first transfer tool 400. Various structures such as a scanner and a camera can be adopted.
此外,第二圖像獲取部820還可應用於確認被第一傳送工具400的拾取器410拾取的元件1的位置、檢查元件1底面等。 In addition, the second image acquisition section 820 can also be applied to confirm the position of the component 1 picked up by the pickup 410 of the first conveyance tool 400, check the bottom surface of the component 1, and the like.
尤其,第二圖像獲取部820可應用於補正被第一傳送工具400的拾取器410拾取的元件1的旋轉誤差(Z軸方向的旋轉誤差)。 In particular, the second image acquisition section 820 is applicable to correct a rotation error (a rotation error in the Z-axis direction) of the element 1 picked up by the pickup 410 of the first transfer tool 400.
此時,被第一傳送工具400的拾取器410拾取的元件1的旋轉誤差的補正可通過以Z軸細微旋轉第一傳送工具400的拾取器410,以Z軸為中心細微旋轉第二傳送工具500的拾取器510等方式來執行。 At this time, the rotation error of the component 1 picked up by the picker 410 of the first transfer tool 400 can be corrected by finely rotating the picker 410 of the first transfer tool 400 around the Z axis and finely rotating the second transfer tool around the Z axis. 500's picker 510 and so on.
第三圖像獲取部830設於拾取元件1的第二傳送工具500拾取器510的移動路徑上,獲取被第二傳送工具500的拾取器510拾取的元件1的圖像,可採用掃描器、照相機等多種結構。 The third image acquisition section 830 is provided on the moving path of the picker 510 of the second transfer tool 500 that picks up the component 1, and acquires an image of the element 1 picked up by the picker 510 of the second transfer tool 500. A scanner, Various structures such as cameras.
然後,第三圖像獲取部830還可應用於確認被第二傳送工具500的拾取器510拾取的元件1的位置,檢查元件1上面等。 Then, the third image acquisition section 830 can also be applied to confirm the position of the component 1 picked up by the pickup 510 of the second conveyance tool 500, check the top of the component 1, and the like.
第四圖像獲取部840可採用獲取被第二傳送工具500的拾取器510卸載於卸載部300的卸載部件70上的元件1的圖像的結構,可採用掃描器、照相機等多種結構。 The fourth image acquisition section 840 may adopt a structure that acquires an image of the element 1 that is unloaded on the unloading part 70 of the unloading section 300 by the pickup 510 of the second transfer tool 500, and may adopt various structures such as a scanner and a camera.
另外,第四圖像獲取部840可應用於確認被第二傳送工具500的拾取器510卸載於卸載部300的卸載部件70上的元件1的狀態。 In addition, the fourth image acquisition section 840 can be applied to confirm the state of the component 1 on the unloading section 70 of the unloading section 300 by the pickup 510 of the second transfer tool 500.
以上說明僅為本發明可實現的部分較佳實施例。因此,眾所周知本發明的範圍不能被上述實施例限定,而且如上所述的本發明技術思想與其根本的技術思想均包括在本發明的範圍之內。 The above description is only part of the preferred embodiments that can be implemented by the present invention. Therefore, it is well known that the scope of the present invention cannot be limited by the above-mentioned embodiments, and the technical idea of the present invention as described above and its fundamental technical idea are included in the scope of the present invention.
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KR101206765B1 (en) * | 2011-04-22 | 2012-11-30 | 미래산업 주식회사 | Luminous element Test Handler |
KR101672840B1 (en) * | 2011-11-09 | 2016-11-08 | 한화테크윈 주식회사 | Multiplication System of flip Chip Mounters |
AT512859B1 (en) * | 2012-05-11 | 2018-06-15 | Hanmi Semiconductor Co Ltd | Semiconductor chip Turning and fastening device |
US20140341691A1 (en) * | 2013-05-14 | 2014-11-20 | Kui Kam Lam | Bonding apparatus having a plurality of rotary transfer arms for transferring electronic devices for bonding |
KR101432493B1 (en) * | 2013-05-29 | 2014-08-21 | 주식회사 로보스타 | Sorter system |
KR20140144121A (en) * | 2013-06-07 | 2014-12-18 | (주)제이티 | Device Handler |
KR102159183B1 (en) * | 2014-03-03 | 2020-10-14 | (주)제이티 | Device handler and method for handling device |
KR102155346B1 (en) * | 2014-03-10 | 2020-09-14 | (주)제이티 | Device handler |
KR102231146B1 (en) * | 2014-04-22 | 2021-03-23 | (주)제이티 | Transfer tool module, needle pin assembly, and device handler having the same |
CN104701199B (en) * | 2015-03-20 | 2018-03-13 | 北京中电科电子装备有限公司 | A kind of flip-chip bonding apparatus |
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TWI647781B (en) | 2019-01-11 |
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