TW201806978A - Film for forming protective film and composite sheet for forming protective film - Google Patents

Film for forming protective film and composite sheet for forming protective film Download PDF

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TW201806978A
TW201806978A TW106113089A TW106113089A TW201806978A TW 201806978 A TW201806978 A TW 201806978A TW 106113089 A TW106113089 A TW 106113089A TW 106113089 A TW106113089 A TW 106113089A TW 201806978 A TW201806978 A TW 201806978A
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protective film
film
forming
mass
meth
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TW106113089A
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TWI778960B (en
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小橋力也
稻男洋一
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琳得科股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/06Interconnection of layers permitting easy separation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B37/00Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding
    • B32B37/14Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by the properties of the layers
    • B32B37/26Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by the properties of the layers with at least one layer which influences the bonding during the lamination process, e.g. release layers or pressure equalising layers
    • B32B2037/268Release layers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/50Properties of the layers or laminate having particular mechanical properties
    • B32B2307/538Roughness
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/70Other properties
    • B32B2307/748Releasability
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68327Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Dicing (AREA)
  • Adhesive Tapes (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Formation Of Insulating Films (AREA)
  • Laminated Bodies (AREA)

Abstract

The present invention relates to an energy ray-curable film for forming a protective film, wherein when a protective film is formed by irradiation with an energy ray to the energy ray-curable film for forming a protective film, a surface roughness (Ra) of at least one surface ([beta]) of the protective film is not less than 0.038 [mu]m.

Description

保護膜形成用膜以及保護膜形成用複合片 Film for forming a protective film and composite sheet for forming a protective film

本發明係關於一種保護膜形成用膜以及保護膜形成用複合片。 The present invention relates to a film for forming a protective film and a composite sheet for forming a protective film.

本申請案主張基於2016年4月28日在日本提出申請之日本特願2016-92009號之優先權,並將該申請案的內容引用至本文中。 The present application claims priority to Japanese Patent Application No. 2016-92009, filed on Jan. 28,,,,,,,,,

近年來,業界使用稱為所謂倒裝(face down)方式之安裝方法製造半導體裝置。倒裝方式中,使用於電路面上具有凸塊等電極之半導體晶片,將前述電極與基板接合。因此,有時半導體晶片中的與電路面為相反側的背面裸露。 In recent years, the industry has manufactured semiconductor devices using a mounting method called a so-called face down method. In the flip chip method, a semiconductor wafer having electrodes such as bumps on a circuit surface is used, and the electrodes are bonded to the substrate. Therefore, the back surface of the semiconductor wafer opposite to the circuit surface may be exposed.

有時於該裸露之半導體晶片的背面,形成含有有機材料之樹脂膜作為保護膜,從而以附有保護膜的半導體晶片之形式組入至半導體裝置中。 A resin film containing an organic material is sometimes formed as a protective film on the back surface of the bare semiconductor wafer, and incorporated into the semiconductor device in the form of a semiconductor wafer with a protective film.

保護膜係用以防止在切割步驟或封裝之後半導體晶片產生龜裂。 The protective film is used to prevent cracking of the semiconductor wafer after the cutting step or packaging.

為了形成此種保護膜,例如使用於支持片上具備用以形成保護膜之保護膜形成用膜之保護膜形成用複合片。保護膜形成用複合片中,可使保護膜形成用膜藉由硬化而形成保護膜,進而可利用支持片作為切割片,從而可製成保護膜形成用膜與切割片形成為一體之保護膜形成用複合片。 In order to form such a protective film, for example, a composite sheet for forming a protective film having a film for forming a protective film for forming a protective film on a support sheet is used. In the composite sheet for forming a protective film, the film for forming a protective film can be formed into a protective film by curing, and the support sheet can be used as a dicing sheet, whereby the protective film can be formed into a protective film integrally formed with the dicing sheet. A composite sheet for forming.

作為此種保護膜形成用複合片,例如此前主要利用具備熱硬化性之保護膜形成用膜之保護膜形成用複合片,前述熱硬化性之保護膜形成用膜藉由利用加熱進行硬化而形成保護膜。該情形時,例如,於半導體晶圓的背面(與電極形成面為相反側的面),藉由熱硬化性之保護膜形成用膜,貼附保護膜形成用複合片後,藉由加熱使保護膜形成用膜硬化而成為保護膜,藉由切割將半導體晶圓連同保護膜一起分割而製成半導體晶片。然後,將半導體晶片保持貼附有該保護膜之狀態不變,自支持片拉離而進行拾取。再者,亦存在保護膜形成用膜之硬化及切割以與此相反之順序進行之情況。 In the composite sheet for forming a protective film, for example, a composite sheet for forming a protective film having a film for forming a protective film having thermosetting properties is mainly used, and the film for forming a thermosetting protective film is formed by curing by heating. Protective film. In this case, for example, on the back surface of the semiconductor wafer (the surface opposite to the surface on which the electrode is formed), the film for forming a protective film by thermosetting is attached, and then the composite sheet for forming a protective film is attached, and then heated. The film for forming a protective film is cured to form a protective film, and the semiconductor wafer is divided together with the protective film by dicing to form a semiconductor wafer. Then, the state in which the semiconductor wafer is adhered to the protective film is maintained, and the support sheet is pulled away to be picked up. Further, there is a case where the curing and cutting of the film for forming a protective film are performed in the reverse order.

但是,熱硬化性之保護膜形成用膜之加熱硬化通常需要數小時左右之長時間,因此期望縮短硬化時間。針對上述情況,業界正研究將可藉由照射紫外線等能量線而硬化之保護膜形成用膜用於形成保護膜。例如,揭示有:形成 於剝離膜上之能量線硬化型保護膜(參照專利文獻1);可形成高硬度且對半導體晶片之密接性優異之保護膜之能量線硬化型晶片保護用膜(參照專利文獻2)。 However, since the heat curing of the film for forming a thermosetting protective film usually takes about several hours, it is desirable to shorten the curing time. In view of the above, the industry is investigating a film for forming a protective film which can be cured by irradiation with an energy ray such as ultraviolet rays for forming a protective film. For example, revealing: forming An energy ray-curable protective film for a protective film having a high hardness and excellent adhesion to a semiconductor wafer (see Patent Document 2).

[先前技術文獻] [Previous Technical Literature]

[專利文獻] [Patent Literature]

專利文獻1:日本特許第5144433號公報。 Patent Document 1: Japanese Patent No. 5144433.

專利文獻2:日本特開2010-031183號公報。 Patent Document 2: Japanese Laid-Open Patent Publication No. 2010-031183.

但是,並不確定專利文獻1中所揭示之能量線硬化型保護膜對支持片之黏著力是否適合。另外,關於專利文獻2中所揭示之能量線硬化型晶片保護用膜,亦揭示有形成於支持片上之能量線硬化型晶片保護用膜,但並不確定對支持片之黏著力是否適合。如此,關於專利文獻1及專利文獻2中所揭示之保護膜形成用膜,拾取適性不明確。 However, it is not determined whether or not the adhesion of the energy ray-curable protective film disclosed in Patent Document 1 to the support sheet is suitable. Further, the energy ray-curable wafer protective film disclosed in Patent Document 2 also discloses an energy ray-curable wafer protective film formed on a support sheet, but it is not determined whether or not the adhesion to the support sheet is suitable. In the film for forming a protective film disclosed in Patent Document 1 and Patent Document 2, the pick-up property is not clear.

因此,本發明之目的在於提供一種能量線硬化性之保護膜形成用膜以及具備前述保護膜形成用膜之保護膜形成用複合片,前述保護膜形成用膜可於半導體晶圓或半導體晶片的背面形成保護膜,且具有良好的拾取適性。 In view of the above, it is an object of the present invention to provide a film for forming a protective film for energy ray-hardening and a film for forming a protective film comprising the film for forming a protective film, which can be used for a semiconductor wafer or a semiconductor wafer. A protective film is formed on the back side and has good pick-up properties.

為了解決上述課題,本發明提供一種能量線硬化性之保護膜形成用膜,對保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的至少一表面(β)的表面粗糙度(Ra)為0.038μm以上。 In order to solve the problem, the present invention provides a film for forming a protective film for an energy ray-curable film. When the film for forming a protective film is irradiated with an energy ray to form a protective film, the surface roughness of at least one surface (β) of the protective film is provided. (Ra) is 0.038 μm or more.

本發明之保護膜形成用膜中,較佳為前述表面(β)的表面粗糙度(Ra)為1.5μm以下。 In the film for forming a protective film of the present invention, the surface roughness (Ra) of the surface (β) is preferably 1.5 μm or less.

另外,本發明提供一種保護膜形成用複合片,於支持片上具備前述保護膜形成用膜,前述保護膜形成用膜的前述表面(β)與前述支持片相對向。 Moreover, the present invention provides a composite sheet for forming a protective film, comprising the film for forming a protective film on the support sheet, wherein the surface (β) of the film for forming a protective film faces the support sheet.

根據本發明,提供一種保護膜形成用複合片,具備能量線硬化性之保護膜形成用膜,該保護膜形成用膜可於半導體晶圓或半導體晶片的背面形成保護膜,且具有良好的拾取適性。 According to the invention, there is provided a composite sheet for forming a protective film, comprising a film for forming a protective film for energy ray-curable, which can form a protective film on a back surface of a semiconductor wafer or a semiconductor wafer, and has a good pick-up Fitness.

1C、1D‧‧‧保護膜形成用複合片 1C, 1D‧‧‧Composite film for protective film formation

1F‧‧‧保護膜形成用片 1F‧‧‧Protective film forming sheet

10‧‧‧支持片 10‧‧‧Support tablets

10a‧‧‧支持片的表面 10a‧‧‧Surface of the support sheet

11‧‧‧基材 11‧‧‧Substrate

11a‧‧‧基材的表面 11a‧‧‧ Surface of the substrate

13、23‧‧‧保護膜形成用膜 13, 23‧‧‧film for protective film formation

13a、23a‧‧‧保護膜形成用膜的表面 13a, 23a‧‧‧ Surface of film for protective film formation

15‧‧‧剝離膜 15‧‧‧Release film

15a‧‧‧第2剝離膜 15a‧‧‧2nd release film

15b‧‧‧第1剝離膜 15b‧‧‧1st release film

16‧‧‧治具用接著劑層 16‧‧‧Layer layer for fixtures

16a‧‧‧治具用接著劑層的表面 16a‧‧‧ Surface of the adhesive layer for the fixture

圖1係以示意方式表示本發明之保護膜形成用複合片的一實施形態之剖面圖。 Fig. 1 is a cross-sectional view showing an embodiment of a composite sheet for forming a protective film of the present invention.

圖2係以示意方式表示本發明之保護膜形成用複合片的另一實施形態之剖面圖。 Fig. 2 is a cross-sectional view showing another embodiment of the composite sheet for forming a protective film of the present invention.

圖3係以示意方式表示本發明之保護膜形成用膜的又一實施形態之剖面圖。 Fig. 3 is a cross-sectional view showing still another embodiment of the film for forming a protective film of the present invention.

◇保護膜形成用膜 ◇Protective film forming film

本發明之保護膜形成用膜為能量線硬化性,且對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的至少一表面(β)的表面粗糙度(Ra)為0.038μm以上。 When the film for forming a protective film of the present invention is energy ray-curable, and the film for forming a protective film is irradiated with an energy ray to form a protective film, the surface roughness (Ra) of at least one surface (β) of the protective film is 0.038 μm or more.

本發明之保護膜形成用膜可於至少一表面具有第1剝離膜,亦可於另一表面進而具有第2剝離膜。本發明之保護膜形成用膜可以捲繞成捲筒狀之長條狀膜之形式提供。 The film for forming a protective film of the present invention may have a first release film on at least one surface or a second release film on the other surface. The film for forming a protective film of the present invention can be provided in the form of a roll film which is wound into a roll.

圖3係以示意方式表示本發明之保護膜形成用膜的一實施形態之剖面圖。圖3中,依序積層有第1剝離膜15b、保護膜形成用膜13(23)及第2剝離膜15a。 Fig. 3 is a cross-sectional view showing an embodiment of a film for forming a protective film of the present invention in a schematic manner. In FIG. 3, the first release film 15b, the protective film formation film 13 (23), and the second release film 15a are laminated in this order.

本說明書中,保護膜形成用膜中,有時將貼附於半導體晶圓的背面(亦即,與電路面為相反側的表面)的表面稱為「表面(α)」,將與貼附於半導體晶圓的背面的表面為相反側的表面稱為「表面(β)」。 In the film for forming a protective film, the surface to be attached to the back surface of the semiconductor wafer (that is, the surface on the opposite side to the circuit surface) may be referred to as "surface (α)", and attached and attached. The surface on the opposite side of the surface of the semiconductor wafer is referred to as "surface (β)".

本發明之保護膜形成用膜的至少一表面(β)的表面粗糙度(Ra)較佳為0.038μm以上,且較佳為1.5μm以下。 The surface roughness (Ra) of at least one surface (β) of the film for forming a protective film of the present invention is preferably 0.038 μm or more, and preferably 1.5 μm or less.

本發明之一態樣係關於一種保護膜形成用膜,具有能量線硬化性,用以於半導體晶圓或半導體晶片的背面形成保護膜,且對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的與貼附於前述半導體晶圓或半導體晶片之側的表面(α)為相反側的表面(β)的表面粗糙度(Ra)為0.038μm以上。前述與貼附於半導體晶圓或半導體晶片 之側的表面(α)為相反側的表面(β)的表面粗糙度(Ra)較佳為1.5μm以下。 One aspect of the present invention relates to a film for forming a protective film, which has energy ray curability and is used to form a protective film on a back surface of a semiconductor wafer or a semiconductor wafer, and to protect the film for forming a protective film from energy rays. In the case of the film, the surface roughness (Ra) of the surface (β) on the side opposite to the surface (α) attached to the side of the semiconductor wafer or the semiconductor wafer is 0.038 μm or more. The foregoing and attached to a semiconductor wafer or a semiconductor wafer The surface roughness (Ra) of the surface (β) on the opposite side is preferably 1.5 μm or less.

本發明之另一態樣係關於一種保護膜形成用片,具備第1剝離膜及保護膜形成用膜,該保護膜形成用膜與前述第1剝離膜直接接觸且具有能量線硬化性,且對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的與前述第1剝離膜直接接觸之側的表面(β)的表面粗糙度(Ra)為0.038μm以上。貼附於前述第1剝離膜之側的表面(β)的表面粗糙度(Ra)較佳為1.5μm以下。 According to another aspect of the invention, there is provided a film for forming a protective film, comprising: a first release film and a film for forming a protective film, wherein the film for forming a protective film is in direct contact with the first release film and has energy ray curability; When the film for forming a protective film is irradiated with an energy ray to form a protective film, the surface roughness (Ra) of the surface (β) on the side directly contacting the first release film in the protective film is 0.038 μm or more. The surface roughness (Ra) of the surface (β) attached to the side of the first release film is preferably 1.5 μm or less.

與前述保護膜形成用膜的表面(β)直接接觸之第1剝離膜的表面的表面粗糙度(Ra)較佳為0.03μm至2.0μm,更佳為0.05μm至1.8μm。藉由於具有此種表面粗糙度(Ra)之剝離膜的表面直接積層保護膜形成用膜,對前述保護膜形成用膜照射能量線而成為保護膜時,可將前述保護膜中的至少一表面(β)的表面粗糙度(Ra)調整為0.038μm以上且1.5μm以下。亦即,將前述保護膜形成用膜中的與貼附有第1剝離膜之側為相反側的表面(α)貼附於半導體晶圓或半導體晶片的背面,對前述保護膜形成用膜照射能量線而成為保護膜,將前述第1剝離膜剝離,藉此可將前述保護膜的表面(β)的表面粗糙度(Ra)調整為0.038μm以上且1.5μm以下。 The surface roughness (Ra) of the surface of the first release film which is in direct contact with the surface (β) of the film for forming a protective film is preferably from 0.03 μm to 2.0 μm, more preferably from 0.05 μm to 1.8 μm. When the film for forming a protective film is directly laminated on the surface of the release film having such a surface roughness (Ra), and the protective film forming film is irradiated with an energy ray to form a protective film, at least one of the protective films may be used. The surface roughness (Ra) of (β) is adjusted to be 0.038 μm or more and 1.5 μm or less. In other words, the surface (α) of the film for forming a protective film opposite to the side to which the first release film is attached is attached to the back surface of the semiconductor wafer or the semiconductor wafer, and the film for forming a protective film is irradiated. The energy ray is used as a protective film, and the surface roughness (Ra) of the surface (β) of the protective film can be adjusted to 0.038 μm or more and 1.5 μm or less.

本發明之保護膜形成用膜中,前述表面(β)的表面粗糙度(Ra)較佳為0.038μm至1.5μm,更佳為0.04μm至1.47μm,更佳為0.08μm至1.47μm,進而較佳為0.8μm至 1.43μm。 In the film for forming a protective film of the present invention, the surface roughness (Ra) of the surface (β) is preferably from 0.038 μm to 1.5 μm, more preferably from 0.04 μm to 1.47 μm, still more preferably from 0.08 μm to 1.47 μm. Preferably 0.8 μm to 1.43 μm.

本說明書中,保護膜形成用膜的表面(β)的表面粗糙度(Ra)可藉由實施例中所記載之測定方法進行測定。 In the present specification, the surface roughness (Ra) of the surface (β) of the film for forming a protective film can be measured by the measurement method described in the examples.

◇保護膜形成用複合片 复合Protective film forming composite sheet

本發明之保護膜形成用複合片於支持片上具備能量線硬化性之保護膜形成用膜,對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的至少一表面(β)的表面粗糙度(Ra)為0.038μm以上。 In the composite film for forming a protective film of the present invention, the film for protective film formation having an energy ray-curable property is provided on the support sheet, and when the film for forming a protective film is irradiated with an energy ray to form a protective film, at least one surface of the protective film (β) The surface roughness (Ra) is 0.038 μm or more.

本發明之保護膜形成用複合片中,較佳為前述保護膜形成用膜的前述表面(β)與前述支持片相對向。 In the composite sheet for forming a protective film of the present invention, it is preferable that the surface (β) of the film for forming a protective film faces the support sheet.

本發明之保護膜形成用複合片中的前述保護膜形成用膜的前述表面(β)較佳為0.038μm以上,且較佳為1.5μm以下。另外,本發明之保護膜形成用複合片中的前述保護膜形成用膜中,前述表面(β)的表面粗糙度(Ra)較佳為0.038μm至1.5μm,更佳為0.04μm至1.47μm,更佳為0.08μm至1.47μm,進而較佳為0.8μm至1.43μm。 The surface (β) of the film for forming a protective film in the composite sheet for forming a protective film of the present invention is preferably 0.038 μm or more, and preferably 1.5 μm or less. Further, in the film for forming a protective film in the composite sheet for forming a protective film of the present invention, the surface roughness (Ra) of the surface (β) is preferably from 0.038 μm to 1.5 μm, more preferably from 0.04 μm to 1.47 μm. More preferably, it is 0.08 μm to 1.47 μm, and further preferably 0.8 μm to 1.43 μm.

對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜與前述支持片之間的黏著力可為50mN/25mm至1500mN/25mm。 When the film for forming a protective film is irradiated with an energy ray to form a protective film, the adhesive force between the protective film and the support sheet may be 50 mN/25 mm to 1500 mN/25 mm.

再者,本說明書中,所謂「保護膜形成用膜」意指硬化前的保護膜形成用膜,所謂「保護膜」意指保護膜形成用膜硬化後之膜。另外,保護膜形成用複合片中的保護膜形成用膜的表面(β)的表面粗糙度(Ra)可藉由實施例中所 記載之測定方法進行測定。 In the present specification, the "film for forming a protective film" means a film for forming a protective film before curing, and the term "protective film" means a film obtained by curing a film for forming a protective film. In addition, the surface roughness (Ra) of the surface (β) of the film for forming a protective film in the composite sheet for forming a protective film can be obtained by the embodiment. The measurement method described is measured.

前述保護膜形成用膜藉由照射能量線進行硬化而成為保護膜。該保護膜用以對半導體晶圓或半導體晶片的背面(與電極形成面為相反側的面)進行保護。保護膜形成用膜為軟質,可容易地貼附於貼附對象物。並且,對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的至少一表面(β)的表面粗糙度(Ra)為0.038μm以上,藉此本發明之保護膜形成用複合片具有良好的拾取適性,例如可高選擇性地拾取目標半導體晶片,此時半導體晶片之破裂及缺損得到抑制。進而,藉由保護膜與前述支持片之間的黏著力成為例如50mN/25mm至1500mN/25mm,具有良好的拾取適性。 The film for forming a protective film is cured by irradiation with an energy ray to form a protective film. The protective film protects the back surface of the semiconductor wafer or the semiconductor wafer (the surface opposite to the electrode forming surface). The film for forming a protective film is soft and can be easily attached to an attached object. In addition, when the film for forming a protective film is irradiated with an energy ray to form a protective film, the surface roughness (Ra) of at least one surface (β) of the protective film is 0.038 μm or more, whereby the protective film of the present invention is formed. The composite sheet has good pick-up suitability, for example, the target semiconductor wafer can be picked up with high selectivity, at which time cracking and defect of the semiconductor wafer are suppressed. Further, the adhesive force between the protective film and the support sheet becomes, for example, 50 mN/25 mm to 1500 mN/25 mm, and has good pick-up property.

另外,本發明之保護膜形成用複合片中,前述保護膜形成用膜為能量線硬化性,藉此相較於具備熱硬化性之保護膜形成用膜之先前之保護膜形成用複合片之情形,可藉由短時間之硬化而形成保護膜。 Further, in the composite sheet for forming a protective film of the present invention, the film for forming a protective film is energy ray-curable, and the composite sheet for forming a protective film before the film for forming a film having a thermosetting protective film is used. In this case, the protective film can be formed by hardening for a short time.

本發明中,所謂「能量線」意指具有能量量子的電磁波或帶電粒子束,作為該能量線的示例,可列舉紫外線、放射線、電子束等。 In the present invention, the "energy line" means an electromagnetic wave or a charged particle beam having an energy quantum, and examples of the energy line include ultraviolet rays, radiation, electron beams, and the like.

紫外線例如可藉由使用高壓水銀燈、融合(Fusion)H型燈、氙氣燈、黑光燈或LED(Light Emitting Diode;發光二極體)燈等作為紫外線源進行照射。電子束可照射藉 由電子束加速器等產生之電子束。 The ultraviolet light can be irradiated as an ultraviolet source by using, for example, a high pressure mercury lamp, a Fusion H-type lamp, a xenon lamp, a black light, or an LED (Light Emitting Diode) lamp. Electron beam can be irradiated An electron beam generated by an electron beam accelerator or the like.

本發明中,所謂「能量線硬化性」意指藉由照射能量線而硬化之性質,所謂「非能量線硬化性」意指即便照射能量線亦不硬化之性質。 In the present invention, the term "energy ray hardenability" means a property of being hardened by irradiation with an energy ray, and "non-energy ray curability" means a property that does not harden even when irradiated with an energy ray.

作為本發明之保護膜形成用複合片之使用對象之半導體晶圓或半導體晶片的厚度並無特別限定,就獲得更顯著的本發明之功效而言,較佳為30μm至1000μm,更佳為100μm至300μm。 The thickness of the semiconductor wafer or the semiconductor wafer to be used as the composite sheet for forming a protective film of the present invention is not particularly limited, and from the viewpoint of obtaining more remarkable effects of the present invention, it is preferably from 30 μm to 1000 μm, more preferably 100 μm. Up to 300 μm.

以下,對本發明之構成進行詳細說明。 Hereinafter, the configuration of the present invention will be described in detail.

◎支持片 ◎Support film

前述支持片可由1層(單層)構成,亦可由2層以上之複數層構成。於支持片由複數層構成之情形時,這些複數層之構成材料及厚度相互可相同亦可不同,只要無損本發明之功效,則這些複數層之組合並無特別限定。 The support sheet may be composed of one layer (single layer) or may be composed of a plurality of layers of two or more layers. In the case where the support sheet is composed of a plurality of layers, the constituent materials and thicknesses of the plurality of layers may be the same or different from each other, and the combination of the plurality of layers is not particularly limited as long as the effects of the present invention are not impaired.

再者,本說明書中,不限於支持片之情形,所謂「複數層相互可相同亦可不同」意指「可全部層相同,亦可全部層皆不同,還可僅一部分層相同」,進而所謂「複數層相互不同」意指「各層之構成材料及厚度之至少一者相互不同」。 Furthermore, in the present specification, the present invention is not limited to the case of the support sheet, and the phrase "the plural layers may be the same or different from each other" means that "all layers may be the same, or all layers may be different, and only a part of the layers may be the same", and so-called "Multiple layers are different from each other" means that "at least one of the constituent materials and thickness of each layer is different from each other".

作為較佳的支持片,例如可列舉:於基材上以直接接觸之方式積層黏著劑層而成之支持片、於基材上經由中間 層積層黏著劑層而成之支持片、僅由基材構成之支持片等。本發明中,較佳為僅由基材構成之支持片。 As a preferable support sheet, for example, a support sheet in which an adhesive layer is laminated on a substrate in direct contact is used, and the support sheet is formed on the substrate. A support sheet in which a layer of an adhesive layer is laminated, a support sheet composed only of a substrate, and the like. In the present invention, a support sheet composed only of a substrate is preferred.

以下,按照上述支持片之每個種類,一面參照圖式一面說明本發明之保護膜形成用複合片之示例。再者,以下之說明中所使用之圖中,為了易於理解本發明之特徵,方便起見,有時將成為主要部分之部分放大表示,而並不限於各構成要素的尺寸比率等與實際相同。 Hereinafter, an example of the composite sheet for forming a protective film of the present invention will be described with reference to the drawings in accordance with each of the above-mentioned support sheets. In addition, in the drawings used in the following description, in order to facilitate the understanding of the features of the present invention, it is convenient to show a part that is a main part, and the size ratio of each component is not limited to the actual one. .

圖1係以示意方式表示本發明之保護膜形成用複合片的一實施形態之剖面圖。 Fig. 1 is a cross-sectional view showing an embodiment of a composite sheet for forming a protective film of the present invention.

此處所示之保護膜形成用複合片1C不具備黏著劑層。亦即,保護膜形成用複合片1C中,支持片10僅由基材11構成。並且,於基材11的一表面11a(支持片10的一表面10a)積層有保護膜形成用膜13,於保護膜形成用膜13的表面13a的一部分,亦即周緣部附近的區域積層有治具用接著劑層16,於保護膜形成用膜13的表面13a中未積層治具用接著劑層16之面及治具用接著劑層16的表面16a(上表面及側面)積層有剝離膜15。 The composite sheet 1C for forming a protective film shown here does not have an adhesive layer. In other words, in the composite sheet 1C for forming a protective film, the support sheet 10 is composed only of the substrate 11. In addition, a film 13 for forming a protective film is laminated on one surface 11a of the substrate 11 (one surface 10a of the support sheet 10), and a part of the surface 13a of the film 13 for forming a protective film, that is, a region in the vicinity of the peripheral portion is laminated. The adhesive agent layer 16 is formed by peeling off the surface of the adhesive film forming film 13 on the surface 13a of the protective film forming film 13 and the surface 16a (upper surface and side surface) of the adhesive layer 16 for the jig. Membrane 15.

保護膜形成用複合片1C中,硬化後之保護膜形成用膜13(亦即保護膜)與支持片10之間的黏著力,換言之保護膜與基材11之間的黏著力較佳為50mN/25mm至1500mN/25mm。 In the composite sheet 1C for forming a protective film, the adhesion between the film 13 for protective film formation (that is, the protective film) and the support sheet 10 after curing, in other words, the adhesion between the protective film and the substrate 11 is preferably 50 mN. /25mm to 1500mN/25mm.

圖1所示之保護膜形成用複合片1C係以下述方式使用,亦即,在移除剝離膜15之狀態下,於保護膜形成用膜13的表面13a貼附半導體晶圓(省略圖示)的背面,進而,將治具用接著劑層16的表面16a中的上表面貼附於環狀框等治具。 The composite film 1C for forming a protective film shown in FIG. 1 is used in a state in which a semiconductor wafer is attached to the surface 13a of the film 13 for forming a protective film in a state where the release film 15 is removed (illustration omitted) Further, the upper surface of the surface 16a of the adhesive adhesive layer 16 is attached to a jig such as a ring frame.

圖2係以示意方式表示本發明之保護膜形成用複合片的另一實施形態之剖面圖。 Fig. 2 is a cross-sectional view showing another embodiment of the composite sheet for forming a protective film of the present invention.

關於此處所示之保護膜形成用複合片1D,除不具備治具用接著劑層16之方面以外,與圖1所示之保護膜形成用複合片1C相同。亦即,保護膜形成用複合片1D中,於基材11的一表面11a積層有保護膜形成用膜13,於保護膜形成用膜13的表面13a的整個面積層有剝離膜15。 The composite sheet 1D for forming a protective film shown here is the same as the composite sheet 1C for forming a protective film shown in Fig. 1 except that the adhesive layer 16 for a jig is not provided. In the composite sheet 1D for forming a protective film, the protective film forming film 13 is laminated on one surface 11a of the substrate 11, and the peeling film 15 is formed over the entire surface 13a of the protective film forming film 13.

圖2所示之保護膜形成用複合片1D係以下述方式使用,亦即,在移除剝離膜15之狀態下,於保護膜形成用膜13的表面13a中的中央側的一部分區域貼附半導體晶圓(省略圖示)的背面,進而,將保護膜形成用膜13之周緣部附近之區域貼附於環狀框等治具。 The composite sheet 1D for forming a protective film shown in Fig. 2 is used in such a manner that a part of the central portion of the surface 13a of the film 13 for forming a protective film is attached in a state where the release film 15 is removed. On the back surface of the semiconductor wafer (not shown), a region in the vicinity of the peripheral edge portion of the film for protective film formation 13 is attached to a jig such as a ring frame.

如此,本發明之保護膜形成用複合片亦可具備治具用接著劑層。但是,通常,如圖1所示,作為具備治具用接著劑層之本發明之保護膜形成用複合片,較佳為於保護膜 形成用膜上具備治具用接著劑層。 As described above, the composite sheet for forming a protective film of the present invention may further comprise an adhesive layer for a jig. However, as shown in Fig. 1, the composite sheet for forming a protective film of the present invention having an adhesive layer for a jig is preferably used as a protective film. An adhesive layer for a jig is provided on the film for formation.

本發明之保護膜形成用複合片並不限定於圖1至圖3所示之保護膜形成用複合片,在無損本發明之功效之範圍內,亦可變更或刪除圖1至圖3所示之保護膜形成用複合片的一部分構成,或者對前文所說明之保護膜形成用複合片進一步追加其他構成。 The composite sheet for forming a protective film of the present invention is not limited to the composite sheet for forming a protective film shown in FIGS. 1 to 3, and may be modified or deleted as shown in FIGS. 1 to 3 without departing from the effects of the present invention. The composite film for forming a protective film is partially formed, or another structure is added to the composite sheet for forming a protective film described above.

另外,本發明之保護膜形成用複合片中,亦可於剝離膜和與該剝離膜直接接觸之層之間產生一部分間隙。 Further, in the composite sheet for forming a protective film of the present invention, a part of the gap may be formed between the release film and the layer directly in contact with the release film.

另外,本發明之保護膜形成用複合片中,各層之大小或形狀可根據目的任意調節。 Further, in the composite sheet for forming a protective film of the present invention, the size or shape of each layer can be arbitrarily adjusted according to the purpose.

支持片可為透明,亦可為不透明,還可根據目的而著色。 The support sheet can be transparent or opaque, and can be colored according to the purpose.

其中,保護膜形成用膜具有能量線硬化性之本發明中,支持片較佳為使能量線透過。 Among the inventions in which the film for forming a protective film has energy ray curability, the support sheet preferably transmits energy rays.

例如,支持片中,波長375nm之光之透過率較佳為30%以上,更佳為50%以上,尤佳為70%以上。藉由前述光之透過率為此種範圍,經由支持片對保護膜形成用膜照射能量線(紫外線)時,保護膜形成用膜之硬化度進一步提高。 For example, in the support sheet, the transmittance of light having a wavelength of 375 nm is preferably 30% or more, more preferably 50% or more, and particularly preferably 70% or more. When the transmittance of the light is in such a range and the energy ray (ultraviolet rays) is applied to the film for forming a protective film via the support sheet, the degree of hardening of the film for forming a protective film is further improved.

另一方面,支持片中,波長375nm之光之透過率的上限值並無特別限定,例如可設為95%。 On the other hand, in the support sheet, the upper limit of the transmittance of light having a wavelength of 375 nm is not particularly limited, and may be, for example, 95%.

另外,支持片中,波長532nm之光之透過率較佳為30%以上,更佳為50%以上,尤佳為70%以上。 Further, in the support sheet, the transmittance of light having a wavelength of 532 nm is preferably 30% or more, more preferably 50% or more, and particularly preferably 70% or more.

藉由前述光之透過率為此種範圍,經由支持片對保護膜形成用膜或保護膜照射雷射光而於這些進行印字時,可更清晰地進行印字。 When the transmittance of the light is in such a range, the protective film forming film or the protective film is irradiated with the laser light through the support sheet, and when printing is performed, the printing can be performed more clearly.

另一方面,支持片中,波長532nm之光之透過率的上限值並無特別限定,例如可設為95%。 On the other hand, in the support sheet, the upper limit of the transmittance of light having a wavelength of 532 nm is not particularly limited, and may be, for example, 95%.

另外,支持片中,波長1064nm之光之透過率較佳為30%以上,更佳為50%以上,尤佳為70%以上。藉由前述光之透過率為此種範圍,經由支持片對保護膜形成用膜或保護膜照射雷射光而於這些進行印字時,可更清晰地進行印字。 Further, in the support sheet, the transmittance of light having a wavelength of 1064 nm is preferably 30% or more, more preferably 50% or more, and particularly preferably 70% or more. When the transmittance of the light is in such a range, the protective film forming film or the protective film is irradiated with the laser light through the support sheet, and when printing is performed, the printing can be performed more clearly.

另一方面,支持片中,波長1064nm之光之透過率的上限值並無特別限定,例如可設為95%。 On the other hand, in the support sheet, the upper limit of the transmittance of light having a wavelength of 1064 nm is not particularly limited, and may be, for example, 95%.

其次,對構成支持片之各層,進行更詳細的說明。 Next, each layer constituting the support sheet will be described in more detail.

○基材 ○Substrate

前述基材為片狀或膜狀,作為前述基材的構成材料,例如可列舉各種樹脂。 The base material is in the form of a sheet or a film, and examples of the constituent material of the substrate include various resins.

作為前述樹脂,例如可列舉:低密度聚乙烯(LDPE;low density polyethylene)、直鏈低密度聚乙烯(LLDPE;linear low density polyethylene)、高密度聚乙烯(HDPE; high density polyethylene)等聚乙烯;聚丙烯、聚丁烯、聚丁二烯、聚甲基戊烯、冰片烯樹脂等聚乙烯以外的聚烯烴;乙烯-乙酸乙烯酯共聚物、乙烯-(甲基)丙烯酸共聚物、乙烯-(甲基)丙烯酸酯共聚物、乙烯-冰片烯共聚物等乙烯系共聚物(使用乙烯作為單體而獲得之共聚物);聚氯乙烯、氯乙烯共聚物等氯乙烯系樹脂(使用氯乙烯作為單體而獲得之樹脂);聚苯乙烯;聚環烯烴;聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯、聚對苯二甲酸丁二酯、聚間苯二甲酸乙二酯、聚2,6-萘二羧酸乙二酯、全部結構單元具有芳香族環式基之全芳香族聚酯等聚酯;2種以上之前述聚酯之共聚物;聚(甲基)丙烯酸酯;聚胺基甲酸酯;聚丙烯酸胺基甲酸酯;聚醯亞胺;聚醯胺;聚碳酸酯;氟樹脂;聚縮醛;改質聚苯醚;聚苯硫醚;聚碸;聚醚酮等。 Examples of the resin include low density polyethylene (LDPE), linear low density polyethylene (LLDPE), and high density polyethylene (HDPE; High density polyethylene); polyolefins other than polyethylene such as polypropylene, polybutene, polybutadiene, polymethylpentene, norbornene resin; ethylene-vinyl acetate copolymer, ethylene-(methyl ) an ethylene-based copolymer such as an acrylic copolymer, an ethylene-(meth)acrylate copolymer or an ethylene-borneene copolymer (a copolymer obtained by using ethylene as a monomer); a chlorine such as a polyvinyl chloride or a vinyl chloride copolymer; Vinyl resin (resin obtained using vinyl chloride as a monomer); polystyrene; polycycloolefin; polyethylene terephthalate, polyethylene naphthalate, polybutylene terephthalate, Polyethylene isophthalate, poly(2,6-naphthalenedicarboxylic acid ethylene glycol), polyesters such as wholly aromatic polyesters having an aromatic ring group in all structural units; copolymerization of two or more kinds of the aforementioned polyesters Poly(meth)acrylate;polyurethane;polyurethane amide;polyimine;polyamine;polycarbonate;fluororesin;polyacetal;modified polyphenylene ether ; polyphenylene sulfide; polyfluorene; polyether ketone.

另外,作為前述樹脂,例如亦可列舉前述聚酯與前述聚酯以外的樹脂之混合物等聚合物合金。前述聚酯與前述聚酯以外的樹脂之聚合物合金較佳為聚酯以外的樹脂之量為相對較少量。 In addition, as the resin, for example, a polymer alloy such as a mixture of the polyester and a resin other than the polyester may be used. The polymer alloy of the polyester and the resin other than the polyester is preferably a relatively small amount of the resin other than the polyester.

另外,作為前述樹脂,例如亦可列舉:前文所例示之前述樹脂之1種或2種以上交聯而成之交聯樹脂;使用前文所例示之前述樹脂之1種或2種以上之離子聚合物等改質樹脂。 In addition, as the resin, for example, one or two or more kinds of the above-exemplified resins may be used as a cross-linking resin, and one or two or more kinds of ionic polymerizations of the above-exemplified resins may be used. Remodeling resin such as matter.

再者,本說明書中,「(甲基)丙烯酸」的概念係包括「丙烯酸」及「甲基丙烯酸」兩者。關於與(甲基)丙烯酸 類似之用語亦相同。 Further, in the present specification, the concept of "(meth)acrylic acid" includes both "acrylic acid" and "methacrylic acid". About (meth)acrylic acid Similar terms are used.

構成基材之樹脂可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The resin constituting the substrate may be one type or two or more types. When two or more types of the resin are used, the combination and ratio of these may be arbitrarily selected.

基材可由1層(單層)構成,亦可由2層以上之複數層構成,於由複數層構成之情形時,這些複數層相互可相同亦可不同,這些複數層之組合並無特別限定。 The base material may be composed of one layer (single layer) or a plurality of layers of two or more layers. When the plurality of layers are formed, the plurality of layers may be the same or different from each other, and the combination of the plurality of layers is not particularly limited.

基材的厚度較佳為50μm至300μm,更佳為60μm至100μm。藉由基材的厚度為此種範圍,前述保護膜形成用複合片的可撓性、及對半導體晶圓或半導體晶片之貼附性進一步提高。 The thickness of the substrate is preferably from 50 μm to 300 μm, more preferably from 60 μm to 100 μm. When the thickness of the substrate is in such a range, the flexibility of the composite sheet for forming a protective film and the adhesion to a semiconductor wafer or a semiconductor wafer are further improved.

此處,所謂「基材的厚度」意指基材整體的厚度,例如所謂由複數層構成之基材的厚度意指構成基材之全部層的合計厚度。 Here, the "thickness of the base material" means the thickness of the entire base material. For example, the thickness of the base material composed of a plurality of layers means the total thickness of all the layers constituting the base material.

本說明書中,所謂「厚度」係指利用接觸式厚度計測定對象物之任意5個部位並以所測得之厚度之平均表示之值。 In the present specification, the term "thickness" means a value obtained by measuring any five parts of an object by a contact thickness meter and expressing the average of the measured thicknesses.

基材較佳為厚度精度高,亦即,任何部位均可抑制厚度不均。上述之構成材料中,作為可用於構成此種厚度精度高的基材之材料,例如可列舉:聚乙烯、聚乙烯以外的聚烯烴、聚對苯二甲酸乙二酯、乙烯-乙酸乙烯酯共聚物 等。 The substrate preferably has a high thickness precision, that is, any portion can suppress thickness unevenness. Among the above-mentioned constituent materials, examples of the material which can be used to constitute such a substrate having high thickness precision include polyolefin, polyethylene, polyethylene terephthalate, and ethylene-vinyl acetate copolymerization. Object Wait.

基材中,除前述樹脂等主要構成材料以外,亦可含有填充材料、著色劑、抗靜電劑、抗氧化劑、有機潤滑劑、觸媒、軟化劑(塑化劑)等公知的各種添加劑。 The base material may contain various additives such as a filler, a colorant, an antistatic agent, an antioxidant, an organic lubricant, a catalyst, and a softener (plasticizer) in addition to the main constituent materials such as the above resin.

基材的光學特性滿足前文所說明之支持片的光學特性即可。亦即,基材可為透明,亦可為不透明,還可根據目的而著色,也可蒸鍍其他層。 The optical characteristics of the substrate may satisfy the optical characteristics of the support sheet described above. That is, the substrate may be transparent or opaque, and may be colored according to the purpose, or may be vapor-deposited.

並且,保護膜形成用膜具有能量線硬化性之本發明中,基材較佳為使能量線透過。 Further, in the invention in which the film for forming a protective film has energy ray curability, the substrate preferably transmits energy rays.

基材的表面亦可經實施以下處理以提高與設置於該基材上之黏著劑層等其他層之密接性:利用噴砂處理、溶劑處理等之凹凸化處理;或者電暈放電處理、電子束照射處理、電漿處理、臭氧/紫外線照射處理、火焰處理、鉻酸處理、熱風處理等氧化處理等。 The surface of the substrate may be subjected to the following treatment to improve adhesion to other layers such as an adhesive layer provided on the substrate: by embossing treatment such as blasting or solvent treatment; or corona discharge treatment or electron beam treatment Oxidation treatment such as irradiation treatment, plasma treatment, ozone/ultraviolet irradiation treatment, flame treatment, chromic acid treatment, hot air treatment, and the like.

另外,基材的表面亦可經實施底塗處理。 In addition, the surface of the substrate may also be subjected to a primer treatment.

另外,基材亦可具有抗靜電塗層或以下用途之層等:將保護膜形成用複合片重疊保存時,防止基材接著於其他片或基材接著於吸附台。 Further, the substrate may have an antistatic coating layer or a layer for the following use. When the composite sheet for forming a protective film is stacked and stored, the substrate is prevented from adhering to the other sheet or substrate to the adsorption stage.

這些之中,就抑制因切割時刀片摩擦而導致基材產生斷片之方面而言,基材尤佳為表面經實施電子束照射處理。 Among these, the substrate is preferably subjected to electron beam irradiation treatment in terms of suppressing the occurrence of fragmentation of the substrate due to blade rubbing during cutting.

關於基材的表面的表面粗糙度(Ra),只要對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的至少一表面(β)的表面粗糙度(Ra)為0.038μm以上,則並無特別限定。 The surface roughness (Ra) of the surface of the substrate is such that when the film for forming a protective film is irradiated with an energy ray to form a protective film, the surface roughness (Ra) of at least one surface (β) of the protective film is 0.038. When it is μm or more, it is not particularly limited.

作為本發明之一態樣,基材的至少一表面的表面粗糙度(Ra)較佳為0.03μm至2.0μm,更佳為0.05μm至1.8μm。於具有此種表面粗糙度(Ra)之基材的表面貼合保護膜形成用膜的露出面(亦即,表面(β)),前述保護膜形成用膜係於剝離膜上塗敷後述之保護膜形成用組成物,視需要使之乾燥而形成,藉此對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的至少一表面(β)的表面粗糙度(Ra)可調整為0.038μm以上且1.5μm以下。 As one aspect of the present invention, the surface roughness (Ra) of at least one surface of the substrate is preferably from 0.03 μm to 2.0 μm, more preferably from 0.05 μm to 1.8 μm. The exposed surface of the film for forming a protective film (that is, the surface (β)) is bonded to the surface of the substrate having such a surface roughness (Ra), and the film for forming a protective film is coated on the release film and then protected. The film forming composition is formed by drying the film for forming a protective film, and the surface roughness (Ra) of at least one surface (β) of the protective film when the protective film forming film is irradiated with an energy ray to form a protective film. It can be adjusted to 0.038 μm or more and 1.5 μm or less.

作為本發明之另一態樣,基材的至少一表面的表面粗糙度(Ra)較佳為0.05μm至1.3μm。於具有此種表面粗糙度(Ra)之基材的表面貼合保護膜形成用膜的露出面(亦即,表面(β)),前述保護膜形成用膜係於剝離膜上塗敷後述之保護膜形成用組成物,視需要使之乾燥而形成,藉此對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的至少一表面(β)的表面粗糙度(Ra)可調整為0.038μm以上且0.9μm以下。 As another aspect of the invention, the surface roughness (Ra) of at least one surface of the substrate is preferably from 0.05 μm to 1.3 μm. The exposed surface of the film for forming a protective film (that is, the surface (β)) is bonded to the surface of the substrate having such a surface roughness (Ra), and the film for forming a protective film is coated on the release film and then protected. The film forming composition is formed by drying the film for forming a protective film, and the surface roughness (Ra) of at least one surface (β) of the protective film when the protective film forming film is irradiated with an energy ray to form a protective film. It can be adjusted to 0.038 μm or more and 0.9 μm or less.

作為本發明之又一態樣,基材的至少一表面的表面粗糙度(Ra)可未達0.12μm,更佳為未達0.03μm,進而較佳為0.020μm至0.025μm。於至少一表面的表面粗糙度(Ra)為0.03μm至2.0μm之第1剝離膜中的具有前述表面粗糙 度的表面上,塗敷後述之保護膜形成用組成物,視需要使之乾燥而形成保護膜形成用膜,於前述保護膜形成用膜的露出面貼合第2剝離膜,將剝離了前述第1剝離膜之保護膜形成用膜的露出面(亦即,表面(β))貼合於具有上述表面粗糙度(Ra)之基材的表面,藉此對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的至少一表面(β)的表面粗糙度(Ra)可調整為0.038μm以上且0.9μm以下。 As still another aspect of the present invention, the surface roughness (Ra) of at least one surface of the substrate may be less than 0.12 μm, more preferably less than 0.03 μm, still more preferably 0.020 μm to 0.025 μm. The surface roughness of the first release film having a surface roughness (Ra) of at least one surface of 0.03 μm to 2.0 μm On the surface of the protective film, a film for forming a protective film to be described later is applied, and if necessary, a film for forming a protective film is formed, and the second release film is bonded to the exposed surface of the film for forming a protective film. The exposed surface (that is, the surface (β)) of the film for forming a protective film of the first release film is bonded to the surface of the substrate having the surface roughness (Ra), thereby irradiating the film for forming the protective film with energy. When the film is a protective film, the surface roughness (Ra) of at least one surface (β) of the protective film can be adjusted to 0.038 μm or more and 0.9 μm or less.

作為本發明之又一態樣,基材的至少一表面的表面粗糙度(Ra)可未達0.12μm,更佳為未達0.03μm,進而較佳為0.020μm至0.025μm。於第2剝離膜上塗敷後述之保護膜形成用組成物,視需要使之乾燥而形成保護膜形成用膜,於前述保護膜形成用膜的露出面貼合至少一表面的表面粗糙度(Ra)為0.03μm至2.0μm之第1剝離膜中的具有前述表面粗糙度的表面,將剝離了前述第1剝離膜之保護膜形成用膜的露出面(亦即,表面(β))貼合於具有上述表面粗糙度(Ra)之基材的表面,藉此對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的至少一表面(β)的表面粗糙度(Ra)可調整為0.038μm以上且0.9μm以下。 As still another aspect of the present invention, the surface roughness (Ra) of at least one surface of the substrate may be less than 0.12 μm, more preferably less than 0.03 μm, still more preferably 0.020 μm to 0.025 μm. A coating film forming composition to be described later is applied to the second release film, and if necessary, a film for forming a protective film is formed, and the surface roughness of at least one surface is bonded to the exposed surface of the film for forming a protective film. The surface having the surface roughness of the first release film of 0.03 μm to 2.0 μm is bonded to the exposed surface (that is, the surface (β)) of the film for forming a protective film from which the first release film is peeled off. The surface roughness of at least one surface (β) of the protective film when the protective film forming film is irradiated with an energy ray to form a protective film on the surface of the substrate having the surface roughness (Ra) It can be adjusted to 0.038 μm or more and 0.9 μm or less.

本說明書中,基材的表面的表面粗糙度(Ra)可藉由實施例中所記載之測定方法進行測定。 In the present specification, the surface roughness (Ra) of the surface of the substrate can be measured by the measurement method described in the examples.

基材可利用公知的方法進行製造。例如,含有樹脂之基材可藉由使含有前述樹脂之樹脂組成物成形而進行製造。 The substrate can be produced by a known method. For example, the resin-containing substrate can be produced by molding a resin composition containing the above resin.

◎保護膜形成用膜 ◎ Protective film forming film

本發明之保護膜形成用複合片中,對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的至少一表面(β)的表面粗糙度(Ra)為0.038μm以上,藉此拾取附有保護膜的半導體晶片時,目標外的附有保護膜的半導體晶片之拾取得到抑制,從而可高選擇性地拾取成為目標的附有保護膜的半導體晶片。另外,藉由前述黏著力為前述上限值以下,拾取附有保護膜的半導體晶片時,半導體晶片之破裂及缺損得到抑制。另外,保護膜形成用膜硬化而獲得之保護膜與支持片之間的黏著力較佳為50mN/25mm至1500mN/25mm,更佳為52mN/25mm至1450mN/25mm,進而更佳為53mN/25mm至1430mN/25mm。如此,進而前述黏著力為特定範圍內,藉此保護膜形成用複合片具有更良好的拾取適性。 In the composite sheet for forming a protective film of the present invention, when the protective film forming film is irradiated with an energy ray to form a protective film, at least one surface (β) of the protective film has a surface roughness (Ra) of 0.038 μm or more. By picking up the semiconductor wafer with the protective film by this, the pickup of the semiconductor wafer with the protective film outside the target is suppressed, and the target semiconductor film with the protective film can be picked up with high selectivity. In addition, when the semiconductor wafer with the protective film is picked up by the adhesion force being equal to or less than the above upper limit value, cracking and defect of the semiconductor wafer are suppressed. Further, the adhesion between the protective film obtained by curing the film for forming a protective film and the support sheet is preferably from 50 mN/25 mm to 1500 mN/25 mm, more preferably from 52 mN/25 mm to 1450 mN/25 mm, and even more preferably 53 mN/25 mm. To 1430mN/25mm. In this way, the adhesive force is in a specific range, whereby the composite sheet for forming a protective film has better pick-up property.

再者,本發明中,即便保護膜形成用膜硬化後,亦只要維持支持片及保護膜形成用膜之硬化物(換言之,支持片及保護膜)之積層結構,則將該積層結構體稱為「保護膜形成用複合片」。 In the present invention, even if the film for forming a protective film is cured, the laminated structure of the cured product (in other words, the support sheet and the protective film) of the support sheet and the film for forming a protective film is maintained. It is a "composite sheet for forming a protective film".

保護膜與支持片之間的黏著力可利用以下之方法進行測定。 The adhesion between the protective film and the support sheet can be measured by the following method.

亦即,將寬度為25mm且長度為任意之保護膜形成用 複合片藉由該保護膜形成用複合片之保護膜形成用膜貼附於被接著體。 That is, a protective film is formed having a width of 25 mm and a length of any The composite sheet is attached to the adherend by the film for forming a protective film of the composite sheet for forming a protective film.

繼而,照射能量線而使保護膜形成用膜硬化,形成保護膜後,自貼附於被接著體之該保護膜,將支持片以剝離速度300mm/min剝離。此時的剝離係設為以下所謂180°剝離:以保護膜及支持片相互接觸之面彼此成為180°之角度之方式,使支持片沿該支持片的長度方向(保護膜形成用複合片的長度方向)剝離。並且,測定該180°剝離時的荷重(剝離力),將該荷重(剝離力)的測定值設為前述黏著力(mN/25mm)。 Then, the film for forming a protective film was cured by irradiation with an energy ray, and after the protective film was formed, the protective film was adhered to the adherend, and the support sheet was peeled off at a peeling speed of 300 mm/min. In this case, the peeling system is a so-called 180° peeling in which the surface of the protective film and the support sheet are in contact with each other at an angle of 180°, and the support sheet is along the longitudinal direction of the support sheet (the composite sheet for forming a protective film) Stripped in the length direction. Then, the load (peeling force) at the time of 180° peeling was measured, and the measured value of the load (peeling force) was defined as the above-described adhesive force (mN/25 mm).

供於測定之保護膜形成用複合片的長度只要為可穩定地檢測出黏著力之範圍,則並無特別限定,較佳為100mm至300mm。另外,較佳為於測定時,使保護膜形成用複合片成為貼附於被接著體之狀態,使保護膜形成用複合片的貼附狀態穩定化。 The length of the composite sheet for forming a protective film to be measured is not particularly limited as long as it is a range in which the adhesive force can be stably detected, and is preferably 100 mm to 300 mm. In addition, it is preferable to stabilize the attached state of the composite sheet for forming a protective film by attaching the composite sheet for forming a protective film to the adherend.

本發明中,保護膜形成用膜與前述支持片之間的黏著力並無特別限定,例如可為80mN/25mm以上等,較佳為100mN/25mm以上,更佳為150mN/25mm以上,尤佳為200mN/25mm以上。藉由前述黏著力為100mN/25mm以上,於切割時,保護膜形成用膜與支持片之剝離得到抑制,例如於背面具備保護膜形成用膜之半導體晶片自支持片之飛散得到抑制。 In the present invention, the adhesive force between the film for forming a protective film and the support sheet is not particularly limited, and may be, for example, 80 mN/25 mm or more, preferably 100 mN/25 mm or more, more preferably 150 mN/25 mm or more. It is 200mN/25mm or more. When the adhesive force is 100 mN/25 mm or more, peeling of the film for forming a protective film and the support sheet during dicing is suppressed, and for example, scattering of the semiconductor wafer having the film for forming a protective film on the back surface from the support sheet is suppressed.

另一方面,保護膜形成用膜與前述支持片之間的黏著力的上限值並無特別限定,例如可設為4000mN/25mm、3500mN/25mm、3000mN/25mm等之任一者。但是,這些為一例。 On the other hand, the upper limit of the adhesive force between the film for forming a protective film and the support sheet is not particularly limited, and may be, for example, any of 4000 mN/25 mm, 3500 mN/25 mm, and 3000 mN/25 mm. However, these are examples.

關於保護膜形成用膜與支持片之間的黏著力,除不藉由照射能量線而使供於測定之保護膜形成用膜硬化之方面以外,可利用與上述之保護膜與支持片之間的黏著力相同的方法進行測定。 The adhesion between the film for forming a protective film and the support sheet can be utilized between the protective film and the support sheet described above, except that the film for protective film formation for measurement is not cured by irradiation of the energy ray. The same method of adhesion is used for the measurement.

關於上述之保護膜與支持片之間的黏著力、及保護膜形成用膜與支持片之間的黏著力,例如可藉由調節保護膜形成用膜的含有成分的種類及量、支持片中的設置保護膜形成用膜之層的構成材料、該層的表面狀態等而適宜調節。 The adhesion between the protective film and the support sheet and the adhesive force between the film for forming a protective film and the support sheet can be adjusted, for example, by the type and amount of the component contained in the film for forming a protective film, and in the support sheet. The constituent material of the layer of the film for forming a protective film, the surface state of the layer, and the like are appropriately adjusted.

例如,保護膜形成用膜的含有成分的種類及量可藉由後述之保護膜形成用組成物的含有成分的種類及量進行調節。並且,藉由調節保護膜形成用組成物的含有成分中,例如不具有能量線硬化性基之聚合物(b)的種類及含量、填充材料(d)的含量、或交聯劑(f)的含量,可更容易地調節保護膜或保護膜形成用膜與支持片之間的黏著力。 For example, the type and amount of the component contained in the film for forming a protective film can be adjusted by the type and amount of the component contained in the protective film forming composition to be described later. Further, by adjusting the content of the component of the protective film-forming composition, for example, the type and content of the polymer (b) having no energy ray-curable group, the content of the filler (d), or the crosslinking agent (f) The content of the protective film or the film for forming a protective film and the support sheet can be more easily adjusted.

於支持片中的設置保護膜形成用膜之層為基材之情 形時,保護膜或保護膜形成用膜與支持片之間的黏著力,除基材的構成材料以外,亦可利用基材的表面狀態進行調節。並且,基材的表面狀態例如可藉由實施前文作為提高基材與其他層之密接性之處理所列舉之表面處理而進行調節,亦即,利用噴砂處理、溶劑處理等之凹凸化處理;電暈放電處理、電子束照射處理、電漿處理、臭氧/紫外線照射處理、火焰處理、鉻酸處理、熱風處理等氧化處理;底塗處理等任一處理。 Providing a layer of a film for forming a protective film in a support sheet as a substrate In the case of the shape, the adhesion between the protective film or the film for forming a protective film and the support sheet can be adjusted by the surface state of the substrate in addition to the constituent material of the substrate. Further, the surface state of the substrate can be adjusted, for example, by performing the surface treatment as described above for improving the adhesion between the substrate and the other layer, that is, by the embossing treatment such as blasting or solvent treatment; Any treatment such as faint treatment, electron beam irradiation treatment, plasma treatment, ozone/ultraviolet irradiation treatment, flame treatment, chromic acid treatment, hot air treatment, etc.;

保護膜形成用膜可列舉:具有能量線硬化性,例如含有能量線硬化性成分(a)之保護膜形成用膜。 The film for forming a protective film includes a film for forming a protective film having energy ray-curable properties, for example, an energy ray-curable component (a).

能量線硬化性成分(a)較佳為未硬化,較佳為具有黏著性,更佳為未硬化且具有黏著性。 The energy ray-curable component (a) is preferably uncured, preferably adhesive, more preferably uncured and adhesive.

保護膜形成用膜可僅為1層(單層),亦可為2層以上之複數層,於為複數層之情形時,這些複數層相互可相同亦可不同,這些複數層之組合並無特別限定。 The film for forming a protective film may be only one layer (single layer), or may be a plurality of layers of two or more layers. In the case of a plurality of layers, the plurality of layers may be the same or different from each other, and the combination of the plurality of layers is not Specially limited.

保護膜形成用膜的厚度較佳為1μm至100μm,更佳為5μm至75μm,尤佳為5μm至50μm。藉由保護膜形成用膜的厚度為前述下限值以上,可形成保護能力更高的保護膜。另外,藉由保護膜形成用膜的厚度為前述上限值以下,可抑制厚度過厚。 The thickness of the film for forming a protective film is preferably from 1 μm to 100 μm, more preferably from 5 μm to 75 μm, still more preferably from 5 μm to 50 μm. When the thickness of the film for forming a protective film is at least the above lower limit value, a protective film having a higher protective ability can be formed. In addition, when the thickness of the film for forming a protective film is equal to or less than the above upper limit value, the thickness can be suppressed from being too thick.

此處,所謂「保護膜形成用膜的厚度」意指保護膜形 成用膜整體的厚度,例如,所謂由複數層構成之保護膜形成用膜的厚度意指構成保護膜形成用膜之全部層的合計厚度。 Here, the "thickness of the film for forming a protective film" means a protective film shape. The thickness of the entire film for forming a film, for example, the thickness of the film for forming a protective film composed of a plurality of layers means the total thickness of all the layers constituting the film for forming a protective film.

關於使保護膜形成用膜硬化而形成保護膜時的硬化條件,只要保護膜成為充分發揮該保護膜的功能之程度的硬化度,則並無特別限定,根據保護膜形成用膜的種類適宜選擇即可。 The curing condition when the protective film forming film is cured to form a protective film is not particularly limited as long as the protective film has a degree of hardening that sufficiently exhibits the function of the protective film, and is appropriately selected depending on the type of the protective film forming film. Just fine.

例如,保護膜形成用膜之硬化時,能量線之照度較佳為4mW/cm2至280mW/cm2。並且,前述硬化時,能量線之光量較佳為3mJ/cm2至1000mJ/cm2For example, when the film for forming a protective film is cured, the illuminance of the energy ray is preferably from 4 mW/cm 2 to 280 mW/cm 2 . Further, in the hardening, the amount of light of the energy ray is preferably from 3 mJ/cm 2 to 1000 mJ/cm 2 .

<<保護膜形成用組成物>> <<Constituent for forming a protective film>>

保護膜形成用膜可使用含有該保護膜形成用膜的構成材料之保護膜形成用組成物而形成。例如,於保護膜形成用膜之形成對象面塗敷保護膜形成用組成物,視需要使之乾燥,藉此可於目標部位形成保護膜形成用膜。保護膜形成用組成物中的常溫下不會氣化的成分彼此的含量比率,通常與保護膜形成用膜中的前述成分彼此的含量比率相同。此處,所謂「常溫」意指不特別冷或特別熱的溫度,亦即平常的溫度,例如可列舉15℃至25℃之溫度等。 The film for forming a protective film can be formed using a composition for forming a protective film containing a constituent material of the film for forming a protective film. For example, a protective film forming composition is applied to the surface to be formed of the film for forming a protective film, and if necessary, it is dried, whereby a film for forming a protective film can be formed at a target portion. The content ratio of the components which are not vaporized at normal temperature in the composition for forming a protective film is usually the same as the content ratio of the components in the film for forming a protective film. Here, the term "normal temperature" means a temperature which is not particularly cold or particularly hot, that is, a normal temperature, and examples thereof include a temperature of 15 ° C to 25 ° C.

利用公知的方法塗敷保護膜形成用組成物即可,例如可列舉使用以下各種塗佈機之方法:氣刀塗佈機、刮刀塗 佈機、棒式塗佈機、凹版塗佈機、輥式塗佈機、輥刀塗佈機、簾幕式塗佈機、模具塗佈機、刀式塗佈機、絲網塗佈機、繞線棒(Meyer bar)式塗佈機、接觸式塗佈機等。 The protective film-forming composition may be applied by a known method, and examples thereof include the following various coaters: air knife coater and doctor blade coat. Cloth machine, bar coater, gravure coater, roll coater, roll coater, curtain coater, die coater, knife coater, screen coater, Meyer bar coater, contact coater, and the like.

保護膜形成用組成物的乾燥條件並無特別限定,於保護膜形成用組成物含有後述之溶劑之情形時,較佳為進行加熱乾燥,該情形時,較佳為於例如70℃至130℃且10秒至5分鐘之條件下進行乾燥。 The drying condition of the protective film-forming composition is not particularly limited. When the protective film-forming composition contains a solvent to be described later, it is preferably heated and dried. In this case, it is preferably, for example, 70 ° C to 130 ° C. Drying is carried out for 10 seconds to 5 minutes.

<保護膜形成用組成物(IV-1)> <Construction film forming composition (IV-1)>

作為保護膜形成用組成物,例如可列舉含有前述能量線硬化性成分(a)之保護膜形成用組成物(IV-1)等。 The protective film-forming composition (IV-1) or the like containing the energy ray-curable component (a) is exemplified as the protective film-forming composition.

[能量線硬化性成分(a)] [Energy line hardening component (a)]

能量線硬化性成分(a)係藉由照射能量線而硬化之成分,該成分用以對保護膜形成用膜賦予造膜性或可撓性等。 The energy ray-curable component (a) is a component which is cured by irradiation with an energy ray, and this component is used to impart film-forming property or flexibility to the film for forming a protective film.

作為能量線硬化性成分(a),例如可列舉:具有能量線硬化性基且重量平均分子量為80000至2000000之聚合物(a1)、及具有能量線硬化性基且分子量為100至80000之化合物(a2)。前述聚合物(a1)可至少一部分藉由後述之交聯劑(f)進行交聯,亦可不進行交聯。 Examples of the energy ray-curable component (a) include a polymer (a1) having an energy ray-curable group and having a weight average molecular weight of 80,000 to 2,000,000, and a compound having an energy ray-curable group and having a molecular weight of 100 to 80,000. (a2). At least a part of the polymer (a1) may be crosslinked by a crosslinking agent (f) to be described later, or may not be crosslinked.

再者,本說明書中,所謂重量平均分子量,只要無特別說明,則意指藉由凝膠滲透層析(GPC;Gel Permeation Chromatography)法所測定之聚苯乙烯換算值。 In the present specification, the weight average molecular weight means gel permeation chromatography (GPC; Gel Permeation unless otherwise specified). The polystyrene equivalent value determined by the Chromatography method.

(具有能量線硬化性基且重量平均分子量為80000至2000000之聚合物(a1)) (Polymer (a1) having an energy ray-hardening group and having a weight average molecular weight of 80,000 to 2,000,000)

作為具有能量線硬化性基且重量平均分子量為80000至2000000之聚合物(a1),例如可列舉丙烯酸系樹脂(a1-1),該丙烯酸系樹脂(a1-1)係丙烯酸系聚合物(a11)與能量線硬化性化合物(a12)聚合而成,前述丙烯酸系聚合物(a11)具有可與其他化合物所具有之基反應之官能基,前述能量線硬化性化合物(a12)具有與前述官能基反應之基及能量線硬化性雙鍵等能量線硬化性基。 Examples of the polymer (a1) having an energy ray-curable group and having a weight average molecular weight of 80,000 to 2,000,000 include an acrylic resin (a1-1), and the acrylic resin (a1-1) is an acrylic polymer (a11). And an energy ray-curable compound (a12) having a functional group reactive with a group of another compound, wherein the energy ray-curable compound (a12) has a functional group An energy ray-curable group such as a reaction group and an energy ray-hardening double bond.

作為可與其他化合物所具有之基反應之前述官能基,例如可列舉:羥基、羧基、胺基、取代胺基(胺基的1個或2個氫原子被氫原子以外的基取代而成之基)、環氧基等。但是,就防止半導體晶圓或半導體晶片等的電路腐蝕之方面而言,前述官能基較佳為羧基以外的基。 Examples of the functional group which can react with a group of another compound include a hydroxyl group, a carboxyl group, an amine group, and a substituted amine group (one or two hydrogen atoms of the amine group are substituted by a group other than a hydrogen atom) Base), epoxy group, and the like. However, in terms of preventing corrosion of a circuit such as a semiconductor wafer or a semiconductor wafer, the functional group is preferably a group other than a carboxyl group.

這些之中,前述官能基較佳為羥基。 Among these, the aforementioned functional group is preferably a hydroxyl group.

‧具有官能基之丙烯酸系聚合物(a11) ‧Acrylic polymer with functional group (a11)

前述具有官能基之丙烯酸系聚合物(a11)例如可列舉:使前述具有官能基之丙烯酸系單體與前述不具有官能基之丙烯酸系單體進行共聚合而成之聚合物,亦可為除這些單體以外,進而使丙烯酸系單體以外的單體(非丙烯酸 系單體)進行共聚合而成之聚合物。 The acrylic polymer (a11) having a functional group may, for example, be a polymer obtained by copolymerizing the acrylic monomer having a functional group and the acrylic monomer having no functional group, or may be a polymer. In addition to these monomers, monomers other than acrylic monomers (non-acrylic) A monomer obtained by copolymerization.

另外,前述丙烯酸系聚合物(a11)可為無規共聚物,亦可為嵌段共聚物。 Further, the acrylic polymer (a11) may be a random copolymer or a block copolymer.

作為前述具有官能基之丙烯酸系單體,例如可列舉:含羥基之單體、含羧基之單體、含胺基之單體、含取代胺基之單體、含環氧基之單體等。 Examples of the acrylic monomer having a functional group include a hydroxyl group-containing monomer, a carboxyl group-containing monomer, an amine group-containing monomer, a substituted amine group-containing monomer, and an epoxy group-containing monomer. .

作為前述含羥基之單體,例如可列舉:(甲基)丙烯酸羥基甲酯、(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸2-羥基丙酯、(甲基)丙烯酸3-羥基丙酯、(甲基)丙烯酸2-羥基丁酯、(甲基)丙烯酸3-羥基丁酯、(甲基)丙烯酸4-羥基丁酯等(甲基)丙烯酸羥基烷基酯;乙烯醇、烯丙醇等非(甲基)丙烯酸系不飽和醇(不具有(甲基)丙烯醯基骨架之不飽和醇)等。 Examples of the hydroxyl group-containing monomer include hydroxymethyl (meth)acrylate, 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, and (meth)acrylic acid 3- Hydroxypropyl ester, 2-hydroxybutyl (meth)acrylate, 3-hydroxybutyl (meth)acrylate, 4-hydroxybutyl (meth)acrylate, etc.; hydroxyalkyl (meth)acrylate; vinyl alcohol, A non-(meth)acrylic unsaturated alcohol such as allyl alcohol (an unsaturated alcohol having no (meth) acrylonitrile skeleton) or the like.

作為前述含羧基之單體,例如可列舉:(甲基)丙烯酸、丁烯酸等乙烯性不飽和單羧酸(具有乙烯性不飽和鍵之單羧酸);富馬酸、衣康酸、馬來酸、檸康酸等乙烯性不飽和二羧酸(具有乙烯性不飽和鍵之二羧酸);前述乙烯性不飽和二羧酸的酐;2-羧基乙基甲基丙烯酸酯等(甲基)丙烯酸羧基烷基酯等。 Examples of the carboxyl group-containing monomer include an ethylenically unsaturated monocarboxylic acid (monocarboxylic acid having an ethylenically unsaturated bond) such as (meth)acrylic acid or crotonic acid; fumaric acid and itaconic acid; An ethylenically unsaturated dicarboxylic acid such as maleic acid or citraconic acid (dicarboxylic acid having an ethylenically unsaturated bond); an anhydride of the above ethylenically unsaturated dicarboxylic acid; 2-carboxyethyl methacrylate; a carboxyalkyl acrylate or the like.

前述具有官能基之丙烯酸系單體較佳為含羥基之單 體、含羧基之單體,更佳為含羥基之單體。 The aforementioned acrylic monomer having a functional group is preferably a hydroxyl group-containing single The monomer, the carboxyl group-containing monomer, more preferably a hydroxyl group-containing monomer.

構成前述丙烯酸系聚合物(a11)之前述具有官能基之丙烯酸系單體可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The acrylic monomer having the functional group in the acrylic polymer (a11) may be one type or two or more types. When two or more types are used, the combination and ratio may be arbitrarily selected.

作為前述不具有官能基之丙烯酸系單體,例如可列舉:(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸正丙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第二丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸正辛酯、(甲基)丙烯酸正壬酯、(甲基)丙烯酸異壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十一烷基酯、(甲基)丙烯酸十二烷基酯(亦稱為(甲基)丙烯酸月桂酯)、(甲基)丙烯酸十三烷基酯、(甲基)丙烯酸十四烷基酯(亦稱為(甲基)丙烯酸肉豆蔻酯)、(甲基)丙烯酸十五烷基酯、(甲基)丙烯酸十六烷基酯(亦稱為(甲基)丙烯酸棕櫚酯)、(甲基)丙烯酸十七烷基酯、(甲基)丙烯酸十八烷基酯(亦稱為(甲基)丙烯酸硬脂酯)等構成烷基酯之烷基為碳數為1至18之鏈狀結構之(甲基)丙烯酸烷基酯等。 Examples of the acrylic monomer having no functional group include methyl (meth)acrylate, ethyl (meth)acrylate, n-propyl (meth)acrylate, and isopropyl (meth)acrylate. N-butyl (meth)acrylate, isobutyl (meth)acrylate, second butyl (meth)acrylate, tert-butyl (meth)acrylate, amyl (meth)acrylate, (methyl) Hexyl acrylate, heptyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, isooctyl (meth)acrylate, n-octyl (meth)acrylate, n-decyl (meth)acrylate , isodecyl (meth) acrylate, decyl (meth) acrylate, undecyl (meth) acrylate, lauryl (meth) acrylate (also known as lauryl (meth) acrylate ), tridecyl (meth)acrylate, tetradecyl (meth)acrylate (also known as myristyl (meth)acrylate), pentadecyl (meth)acrylate, (a) Cetyl hexyl acrylate (also known as palmityl (meth) acrylate), heptadecyl (meth) acrylate, octadecyl (meth) acrylate (also known as (methyl) Acetyl acrylate Alkyl esters of a chain structure having a carbon number of 1 to 18 of (meth) acrylate and the like.

另外,作為前述不具有官能基之丙烯酸系單體,例如亦可列舉:(甲基)丙烯酸甲氧基甲酯、(甲基)丙烯酸甲氧 基乙酯、(甲基)丙烯酸乙氧基甲酯、(甲基)丙烯酸乙氧基乙酯等含烷氧基烷基之(甲基)丙烯酸酯;包含(甲基)丙烯酸苯酯等(甲基)丙烯酸芳基酯等之具有芳香族基之(甲基)丙烯酸酯;非交聯性的(甲基)丙烯醯胺及其衍生物;(甲基)丙烯酸N,N-二甲胺基乙酯、(甲基)丙烯酸N,N-二甲胺基丙酯等非交聯性的具有三級胺基之(甲基)丙烯酸酯等。 Further, examples of the acrylic monomer having no functional group include methoxymethyl (meth)acrylate and methoxy (meth)acrylate. (A) alkoxyalkyl group-containing (meth) acrylate such as ethyl ethoxide, ethoxymethyl (meth) acrylate or ethoxyethyl (meth) acrylate; or phenyl (meth) acrylate ( (meth) acrylate having an aromatic group such as aryl methacrylate; non-crosslinkable (meth) acrylamide and its derivatives; N,N-dimethylamine (meth) acrylate A non-crosslinkable (meth) acrylate having a tertiary amino group such as a ethyl ester or a N,N-dimethylaminopropyl (meth)acrylate.

構成前述丙烯酸系聚合物(a11)之前述不具有官能基之丙烯酸系單體可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The acrylic monomer having no functional group in the acrylic polymer (a11) may be one type or two or more types. When two or more types are used, the combination and ratio may be arbitrarily selected. .

作為前述非丙烯酸系單體,例如可列舉:乙烯、降冰片烯等烯烴;乙酸乙烯酯;苯乙烯等。 Examples of the non-acrylic monomer include olefins such as ethylene and norbornene; vinyl acetate; and styrene.

構成前述丙烯酸系聚合物(a11)之前述非丙烯酸系單體可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The non-acrylic monomer constituting the acrylic polymer (a11) may be one type or two or more types. When two or more types are used, the combination and ratio may be arbitrarily selected.

前述丙烯酸系聚合物(a11)中,由具有前述官能基之丙烯酸系單體衍生之結構單元之量相對於構成該丙烯酸系聚合物(a11)之結構單元之總質量的比例(含量)較佳為0.1質量%至50質量%,更佳為1質量%至40質量%,尤佳為3質量%至30質量%。藉由前述比例為此種範圍,可將由前述丙烯酸系聚合物(a11)與前述能量線硬化性化合物(a12)之共聚合所獲得之前述丙烯酸系樹脂(a1-1)中能 量線硬化性基的含量容易地調節為使第1保護膜的硬化程度較佳之範圍。 In the acrylic polymer (a11), the ratio (content) of the structural unit derived from the acrylic monomer having the functional group to the total mass of the structural unit constituting the acrylic polymer (a11) is preferred. It is from 0.1% by mass to 50% by mass, more preferably from 1% by mass to 40% by mass, even more preferably from 3% by mass to 30% by mass. When the ratio is in such a range, the acrylic resin (a1-1) obtained by copolymerization of the acrylic polymer (a11) and the energy ray-curable compound (a12) can be used. The content of the strand curable group is easily adjusted to a range in which the degree of hardening of the first protective film is better.

構成前述丙烯酸系樹脂(a1-1)之前述丙烯酸系聚合物(a11)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The acrylic polymer (a11) constituting the acrylic resin (a1-1) may be one type or two or more types. When two or more types are used, the combination and ratio may be arbitrarily selected.

保護膜形成用組成物(IV-1)中,丙烯酸系樹脂(a1-1)的含量相對於前述保護膜形成用組成物(IV-1)的總質量,較佳為1質量%至40質量%,更佳為2質量%至30質量%,尤佳為3質量%至20質量%。 In the protective film-forming composition (IV-1), the content of the acrylic resin (a1-1) is preferably from 1% by mass to 40% by mass based on the total mass of the protective film-forming composition (IV-1). % is more preferably 2% by mass to 30% by mass, particularly preferably 3% by mass to 20% by mass.

‧能量線硬化性化合物(a12) ‧Energy line hardening compound (a12)

前述能量線硬化性化合物(a12)較佳為具有選自由異氰酸酯基、環氧基及羧基所組成之群組中的1種或2種以上作為可與前述丙烯酸系聚合物(a11)所具有之官能基反應之基,更佳為具有異氰酸酯基作為前述基。於前述能量線硬化性化合物(a12)例如具有異氰酸酯基作為前述基之情形時,該異氰酸酯基與前述具有羥基作為官能基之丙烯酸系聚合物(a11)的該羥基容易反應。 The energy ray-curable compound (a12) preferably has one or more selected from the group consisting of an isocyanate group, an epoxy group, and a carboxyl group, and is compatible with the acrylic polymer (a11). The group of the functional group reaction is more preferably an isocyanate group as the above group. When the energy ray-curable compound (a12) has, for example, an isocyanate group as the above-mentioned group, the isocyanate group is easily reacted with the hydroxyl group of the acrylic polymer (a11) having a hydroxyl group as a functional group.

前述能量線硬化性化合物(a12)較佳為於1分子中具有1個至5個前述能量線硬化性基,更佳為具有1個至3個。 The energy ray-curable compound (a12) preferably has one to five of the energy ray-curable groups in one molecule, and more preferably has one to three.

作為前述能量線硬化性化合物(a12),例如可列舉:2-甲基丙烯醯氧基異氰酸乙酯、間-異丙烯基-α,α-二甲基苄基異氰酸酯、甲基丙烯醯基異氰酸酯、異氰酸烯丙酯、1,1-(雙丙烯醯氧基甲基)異氰酸乙酯;藉由二異氰酸酯化合物或多異氰酸酯化合物與(甲基)丙烯酸羥基乙酯之反應而獲得之丙烯醯基單異氰酸酯化合物;藉由二異氰酸酯化合物或多異氰酸酯化合物、多元醇化合物及(甲基)丙烯酸羥基乙酯之反應而獲得之丙烯醯基單異氰酸酯化合物等。 Examples of the energy ray-curable compound (a12) include 2-methylpropenyloxyisocyanate, m-isopropenyl-α,α-dimethylbenzyl isocyanate, and methacryl Isocyanate, allyl isocyanate, 1,1-(bispropenyloxymethyl)isocyanate; by reaction of a diisocyanate compound or a polyisocyanate compound with hydroxyethyl (meth)acrylate The obtained acrylonitrile-based monoisocyanate compound; an acrylonitrile-based monoisocyanate compound obtained by a reaction of a diisocyanate compound or a polyisocyanate compound, a polyol compound, and a hydroxyethyl (meth)acrylate.

這些之中,前述能量線硬化性化合物(a12)較佳為2-甲基丙烯醯氧基異氰酸乙酯。 Among these, the energy ray-curable compound (a12) is preferably 2-methylpropenyloxy isocyanate.

構成前述丙烯酸系樹脂(a1-1)之前述能量線硬化性化合物(a12)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The energy ray-curable compound (a12) constituting the acrylic resin (a1-1) may be one type or two or more types. When two or more types are used, the combinations and ratios may be arbitrarily selected. .

前述丙烯酸系樹脂(a1-1)中,源自前述能量線硬化性化合物(a12)之能量線硬化性基的含量相對於源自前述丙烯酸系聚合物(a11)之前述官能基的含量之比例較佳為20莫耳%至120莫耳%,更佳為35莫耳%至100莫耳%,尤佳為50莫耳%至100莫耳%。藉由前述含量比例為此種範圍,由硬化所形成之保護膜的接著力變得更大。再者,於前述能量線硬化性化合物(a12)為一官能(於1分子中具有 1個前述基)化合物之情形時,前述含量之比例的上限值成為100莫耳%,但於前述能量線硬化性化合物(a12)為多官能(於1分子中具有2個以上前述基)化合物之情形時,前述含量之比例的上限值有時超過100莫耳%。 In the acrylic resin (a1-1), the ratio of the content of the energy ray-curable group derived from the energy ray-curable compound (a12) to the content of the aforementioned functional group derived from the acrylic polymer (a11) It is preferably from 20 mol% to 120 mol%, more preferably from 35 mol% to 100 mol%, still more preferably from 50 mol% to 100 mol%. By the above content ratio being such a range, the adhesion force of the protective film formed by hardening becomes larger. Furthermore, the energy ray-curable compound (a12) is monofunctional (having one molecule) In the case of the compound of the above-mentioned group), the upper limit of the ratio of the content is 100 mol%, but the energy ray-curable compound (a12) is polyfunctional (having two or more of the above groups in one molecule) In the case of a compound, the upper limit of the ratio of the above content may exceed 100 mol%.

前述聚合物(a1)的重量平均分子量(Mw)較佳為100000至2000000,更佳為300000至1500000。 The weight average molecular weight (Mw) of the aforementioned polymer (a1) is preferably from 100,000 to 2,000,000, more preferably from 300,000 to 1,500,000.

於前述聚合物(a1)的至少一部分藉由交聯劑(f)進行交聯之情形時,前述聚合物(a1)可使不符合上述說明之構成前述丙烯酸系聚合物(a11)之任一單體且具有與交聯劑(f)反應之基之單體進行聚合,在前述與交聯劑(f)反應之基中進行交聯,亦可在源自前述能量線硬化性化合物(a12)之與前述官能基反應之基中進行交聯。 When at least a part of the polymer (a1) is crosslinked by a crosslinking agent (f), the polymer (a1) may be any one of the acrylic polymers (a11) which does not conform to the above description. The monomer having a monomer reactive with the crosslinking agent (f) is polymerized, crosslinked in the above-mentioned group reactive with the crosslinking agent (f), or may be derived from the aforementioned energy ray-curable compound (a12) Crosslinking is carried out in the group reactive with the aforementioned functional groups.

保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之前述聚合物(a1)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The polymer (a1) to be contained in the protective film-forming composition (IV-1) and the film for forming a protective film may be one type or two or more types. When two or more types are used, these are Combinations and ratios can be arbitrarily chosen.

(具有能量線硬化性基且分子量為100至80000之化合物(a2)) (Compound (a2) having an energy ray-hardening group and having a molecular weight of 100 to 80,000)

作為具有能量線硬化性基且分子量為100至80000之化合物(a2)所具有之能量線硬化性基,可列舉包含能量線硬化性雙鍵之基,作為較佳的該基,可列舉(甲基)丙烯 醯基、乙烯基等。 Examples of the energy ray-curable group of the compound (a2) having an energy ray-curable group and having a molecular weight of from 100 to 80,000 include a group containing an energy ray-curable double bond, and preferred examples of the group include (A) Propylene Sulfhydryl, vinyl, etc.

若前述化合物(a2)滿足上述條件,則並無特別限定,可列舉:具有能量線硬化性基之低分子量化合物、具有能量線硬化性基之環氧樹脂、具有能量線硬化性基之酚樹脂等。 When the compound (a2) satisfies the above conditions, it is not particularly limited, and examples thereof include a low molecular weight compound having an energy ray-curable group, an epoxy resin having an energy ray-curable group, and a phenol resin having an energy ray-curable group. Wait.

前述化合物(a2)中,作為具有能量線硬化性基之低分子量化合物,例如可列舉多官能之單體或低聚物等,較佳為具有(甲基)丙烯醯基之丙烯酸酯系化合物。 In the compound (a2), the low molecular weight compound having an energy ray-curable group may, for example, be a polyfunctional monomer or oligomer, and is preferably an acrylate-based compound having a (meth) acrylonitrile group.

作為前述丙烯酸酯系化合物,例如可列舉:2-羥基-3-(甲基)丙烯醯氧基丙基甲基丙烯酸酯、聚乙二醇二(甲基)丙烯酸酯、丙氧基化乙氧基化雙酚A二(甲基)丙烯酸酯、2,2-雙[4-((甲基)丙烯醯氧基聚乙氧基)苯基]丙烷、乙氧基化雙酚A二(甲基)丙烯酸酯、2,2-雙[4-((甲基)丙烯醯氧基二乙氧基)苯基]丙烷、9,9-雙[4-(2-(甲基)丙烯醯氧基乙氧基)苯基]茀、2,2-雙[4-((甲基)丙烯醯氧基聚丙氧基)苯基]丙烷、三環癸烷二甲醇二(甲基)丙烯酸酯(亦稱為三環癸烷二羥甲基二(甲基)丙烯酸酯)、1,10-癸二醇二(甲基)丙烯酸酯、1,6-己二醇二(甲基)丙烯酸酯、1,9-壬二醇二(甲基)丙烯酸酯、二丙二醇二(甲基)丙烯酸酯、三丙二醇二(甲基)丙烯酸酯、聚丙二醇二(甲基)丙烯酸酯、聚丁二醇二(甲基)丙烯酸酯、乙二醇二(甲基)丙烯酸酯、二乙二醇二(甲基)丙烯酸酯、三乙二醇二(甲基)丙烯酸酯、2,2-雙[4-((甲 基)丙烯醯氧基乙氧基)苯基]丙烷、新戊二醇二(甲基)丙烯酸酯、乙氧基化聚丙二醇二(甲基)丙烯酸酯、2-羥基-1,3-二(甲基)丙烯醯氧基丙烷等2官能(甲基)丙烯酸酯;異氰脲酸三(2-(甲基)丙烯醯氧基乙基)酯、ε-己內酯改性異氰脲酸三-(2-(甲基)丙烯醯氧基乙基)酯、乙氧基化甘油三(甲基)丙烯酸酯、季戊四醇三(甲基)丙烯酸酯、三羥甲基丙烷三(甲基)丙烯酸酯、二-三羥甲基丙烷四(甲基)丙烯酸酯、乙氧基化季戊四醇四(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇聚(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯等多官能(甲基)丙烯酸酯;(甲基)丙烯酸胺基甲酸酯低聚物等多官能(甲基)丙烯酸酯低聚物等。 Examples of the acrylate-based compound include 2-hydroxy-3-(meth)acryloxypropyl methacrylate, polyethylene glycol di(meth)acrylate, and propoxylated ethoxylate. Bisphenol bis(meth)acrylate, 2,2-bis[4-((meth)propenyloxypolyethoxy)phenyl]propane, ethoxylated bisphenol A di(A) Acrylate, 2,2-bis[4-((meth)propenyloxydiethoxy)phenyl]propane, 9,9-bis[4-(2-(methyl)propene oxime) Ethyloxy)phenyl]anthracene, 2,2-bis[4-((meth)propenyloxypolypropoxy)phenyl]propane, tricyclodecane dimethanol di(meth)acrylate ( Also known as tricyclodecane dimethylol di(meth) acrylate), 1,10-nonanediol di(meth) acrylate, 1,6-hexanediol di(meth) acrylate, 1,9-nonanediol di(meth)acrylate, dipropylene glycol di(meth)acrylate, tripropylene glycol di(meth)acrylate, polypropylene glycol di(meth)acrylate, polytetramethylene glycol (Meth) acrylate, ethylene glycol di(meth) acrylate, diethylene glycol di(meth) acrylate, triethylene glycol di(meth) acrylate, 2, 2- bis [ 4-((A Alkenyloxyethoxy)phenyl]propane, neopentyl glycol di(meth)acrylate, ethoxylated polypropylene glycol di(meth)acrylate, 2-hydroxy-1,3-di Bifunctional (meth) acrylate such as (meth) propylene decyloxypropane; tris(2-(methyl) propylene oxyethyl) isocyanurate, ε-caprolactone modified isocyanurate Tris-(2-(methyl)propenyloxyethyl) acid, ethoxylated glycerol tri(meth) acrylate, pentaerythritol tri(meth) acrylate, trimethylolpropane tris(methyl) Acrylate, di-trimethylolpropane tetra(meth)acrylate, ethoxylated pentaerythritol tetra(meth)acrylate, pentaerythritol tetra(meth)acrylate, dipentaerythritol poly(meth)acrylate A polyfunctional (meth) acrylate oligomer such as dipentaerythritol hexa(meth) acrylate or a polyfunctional (meth) acrylate oligomer such as a (meth) acrylate urethane oligomer.

前述化合物(a2)中,作為具有能量線硬化性基之環氧樹脂、具有能量線硬化性基之酚樹脂,例如可使用「日本專利特開2013-194102號公報」中的段落0043等中所記載之樹脂。此種樹脂亦符合構成後述之熱硬化性成分(h)之樹脂,但本發明中視作前述化合物(a2)。 In the above-mentioned compound (a2), as the epoxy resin having an energy ray-curable group or a phenol resin having an energy ray-curable group, for example, paragraph 0043 in "Japanese Patent Laid-Open Publication No. 2013-194102", or the like can be used. The resin is described. Such a resin also conforms to the resin constituting the thermosetting component (h) to be described later, but in the present invention, the compound (a2) is regarded.

前述化合物(a2)的重量平均分子量較佳為100至30000,更佳為300至10000。 The weight average molecular weight of the aforementioned compound (a2) is preferably from 100 to 30,000, more preferably from 300 to 10,000.

保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之前述化合物(a2)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The compound (a2) to be contained in the protective film-forming composition (IV-1) and the film for forming a protective film may be one type or two or more types. When two or more types are used, the combination thereof may be used. And the ratio can be arbitrarily chosen.

[不具有能量線硬化性基之聚合物(b)] [Polymer without energy line hardening group (b)]

於保護膜形成用組成物(IV-1)及保護膜形成用膜含有前述化合物(a2)作為前述能量線硬化性成分(a)之情形時,較佳為進而亦含有不具有能量線硬化性基之聚合物(b)。 When the protective film-forming composition (IV-1) and the film for forming a protective film contain the compound (a2) as the energy ray-curable component (a), it is preferable to further contain no energy ray curability. Base polymer (b).

前述聚合物(b)可至少一部分藉由交聯劑(f)進行交聯,亦可不進行交聯。 The polymer (b) may be crosslinked at least in part by the crosslinking agent (f) or may not be crosslinked.

作為不具有能量線硬化性基之聚合物(b),例如可列舉:丙烯酸系聚合物、苯氧基樹脂、胺基甲酸酯樹脂、聚酯、橡膠系樹脂、丙烯酸胺基甲酸酯樹脂、聚乙烯醇(polyvinyl alcohol;PVA)、縮丁醛樹脂、聚酯胺基甲酸酯樹脂等。 Examples of the polymer (b) having no energy ray-curable group include an acrylic polymer, a phenoxy resin, a urethane resin, a polyester, a rubber resin, and an urethane urethane resin. Polyvinyl alcohol (PVA), butyral resin, polyester urethane resin, and the like.

這些之中,前述聚合物(b)較佳為丙烯酸系聚合物(以下,有時簡稱為「丙烯酸系聚合物(b-1)」)。 Among these, the polymer (b) is preferably an acrylic polymer (hereinafter, simply referred to as "acrylic polymer (b-1)").

丙烯酸系聚合物(b-1)可為公知的聚合物,例如可為1種丙烯酸系單體的均聚物,亦可為2種以上丙烯酸系單體的共聚物,還可為1種或2種以上丙烯酸系單體與1種或2種以上除丙烯酸系單體以外的單體(非丙烯酸系單體)之共聚物。 The acrylic polymer (b-1) may be a known polymer, and may be, for example, a homopolymer of one type of acrylic monomer, or a copolymer of two or more types of acrylic monomers, or one type or A copolymer of two or more kinds of acrylic monomers and one or more monomers (non-acrylic monomers) other than the acrylic monomers.

作為構成丙烯酸系聚合物(b-1)之前述丙烯酸系單 體,例如可列舉:(甲基)丙烯酸烷基酯、具有環狀骨架之(甲基)丙烯酸酯、含縮水甘油基之(甲基)丙烯酸酯、含羥基之(甲基)丙烯酸酯、含取代胺基之(甲基)丙烯酸酯等。此處,所謂「取代胺基」如上文所說明。 The aforementioned acrylic single sheet constituting the acrylic polymer (b-1) Examples of the body include (meth)acrylic acid alkyl ester, (meth)acrylate having a cyclic skeleton, glycidyl group-containing (meth)acrylate, hydroxyl group-containing (meth)acrylate, and Amine (meth) acrylate or the like. Here, the "substituted amine group" is as described above.

作為前述(甲基)丙烯酸烷基酯,例如可列舉:(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸正丙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第二丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸正辛酯、(甲基)丙烯酸正壬酯、(甲基)丙烯酸異壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十一烷基酯、(甲基)丙烯酸十二烷基酯(亦稱為(甲基)丙烯酸月桂酯)、(甲基)丙烯酸十三烷基酯、(甲基)丙烯酸十四烷基酯(亦稱為(甲基)丙烯酸肉豆蔻酯)、(甲基)丙烯酸十五烷基酯、(甲基)丙烯酸十六烷基酯(亦稱為(甲基)丙烯酸棕櫚酯)、(甲基)丙烯酸十七烷基酯、(甲基)丙烯酸十八烷基酯(亦稱為(甲基)丙烯酸硬脂酯)等構成烷基酯之烷基為碳數為1至18之鏈狀結構之(甲基)丙烯酸烷基酯等。 Examples of the alkyl (meth)acrylate include methyl (meth)acrylate, ethyl (meth)acrylate, n-propyl (meth)acrylate, and isopropyl (meth)acrylate. N-butyl methacrylate, isobutyl (meth)acrylate, second butyl (meth)acrylate, tert-butyl (meth)acrylate, amyl (meth)acrylate, (meth)acrylic acid Hexyl ester, heptyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, isooctyl (meth)acrylate, n-octyl (meth)acrylate, n-decyl (meth)acrylate, Isodecyl (meth)acrylate, decyl (meth)acrylate, undecyl (meth)acrylate, dodecyl (meth)acrylate (also known as lauryl (meth)acrylate) , tridecyl (meth)acrylate, tetradecyl (meth)acrylate (also known as myristyl (meth)acrylate), pentadecyl (meth)acrylate, (methyl) Cetyl acrylate (also known as palmityl (meth) acrylate), heptadecyl (meth) acrylate, octadecyl (meth) acrylate (also known as (meth) acrylate An alkyl group constituting an alkyl ester such as stearyl ester It is an alkyl (meth)acrylate or the like having a chain structure of 1 to 18 carbon atoms.

作為前述具有環狀骨架之(甲基)丙烯酸酯,例如可列舉:(甲基)丙烯酸異冰片酯、(甲基)丙烯酸二環戊酯等(甲基)丙烯酸環烷基酯;(甲基)丙烯酸苄酯等(甲基)丙烯酸芳 烷基酯;(甲基)丙烯酸二環戊烯酯等(甲基)丙烯酸環烯基酯;(甲基)丙烯酸二環戊烯氧基乙酯等(甲基)丙烯酸環烯氧基烷基酯等。 Examples of the (meth) acrylate having a cyclic skeleton include (meth)acrylic acid cycloalkyl esters such as isobornyl (meth)acrylate and dicyclopentanyl (meth)acrylate; Benzyl acrylate, etc. Alkyl ester; (meth)acrylic acid cycloalkenyl ester such as dicyclopentenyl (meth)acrylate; (meth)acrylic acid cycloalkoxyalkyl group such as dicyclopentenyloxyethyl (meth)acrylate Ester and the like.

作為前述含縮水甘油基之(甲基)丙烯酸酯,例如可列舉(甲基)丙烯酸縮水甘油酯等。 Examples of the glycidyl group-containing (meth) acrylate include glycidyl (meth)acrylate and the like.

作為前述含羥基之(甲基)丙烯酸酯,例如可列舉:(甲基)丙烯酸羥基甲酯、(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸2-羥基丙酯、(甲基)丙烯酸3-羥基丙酯、(甲基)丙烯酸2-羥基丁酯、(甲基)丙烯酸3-羥基丁酯、(甲基)丙烯酸4-羥基丁酯等。 Examples of the hydroxyl group-containing (meth) acrylate include hydroxymethyl (meth)acrylate, 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, and (methyl). 3 - hydroxypropyl acrylate, 2-hydroxybutyl (meth) acrylate, 3-hydroxybutyl (meth) acrylate, 4-hydroxybutyl (meth) acrylate, and the like.

作為前述含取代胺基之(甲基)丙烯酸酯,例如可列舉(甲基)丙烯酸N-甲基胺基乙酯等。 Examples of the (meth) acrylate containing a substituted amino group include N-methylaminoethyl (meth) acrylate and the like.

作為構成丙烯酸系聚合物(b-1)之前述非丙烯酸系單體,例如可列舉:乙烯、降冰片烯等烯烴;乙酸乙烯酯;苯乙烯等。 The non-acrylic monomer constituting the acrylic polymer (b-1) may, for example, be an olefin such as ethylene or norbornene; vinyl acetate; styrene or the like.

作為至少一部分藉由交聯劑(f)進行交聯且不具有前述能量線硬化性基之聚合物(b),例如可列舉:前述聚合物(b)中的反應性官能基與交聯劑(f)反應之聚合物。 As the polymer (b) which is crosslinked by at least a part of the crosslinking agent (f) and does not have the aforementioned energy ray-curable group, for example, a reactive functional group and a crosslinking agent in the above polymer (b) (f) a polymer of the reaction.

前述反應性官能基根據交聯劑(f)之種類等適宜選擇即可,並無特別限定。例如,於交聯劑(f)為多異氰酸酯化合物之情形時,作為前述反應性官能基,可列舉羥基、羧 基、胺基等,這些之中,較佳為與異氰酸酯基之反應性高之羥基。另外,於交聯劑(f)為環氧系化合物之情形時,作為前述反應性官能基,可列舉羧基、胺基、醯胺基等,這些之中,較佳為與環氧基之反應性高之羧基。但是,就防止半導體晶圓或半導體晶片的電路腐蝕之方面而言,前述反應性官能基較佳為羧基以外的基。 The reactive functional group is appropriately selected depending on the type of the crosslinking agent (f), and the like, and is not particularly limited. For example, when the crosslinking agent (f) is a polyisocyanate compound, examples of the reactive functional group include a hydroxyl group and a carboxyl group. Among these, a hydroxyl group having high reactivity with an isocyanate group is preferred among these. In the case where the crosslinking agent (f) is an epoxy compound, the reactive functional group may, for example, be a carboxyl group, an amine group or a guanamine group, and among these, a reaction with an epoxy group is preferred. High carboxyl group. However, in terms of preventing corrosion of a circuit of a semiconductor wafer or a semiconductor wafer, the reactive functional group is preferably a group other than a carboxyl group.

作為具有前述反應性官能基且不具有能量線硬化性基之聚合物(b),例如可列舉:至少使具有前述反應性官能基之單體進行聚合而獲得之聚合物。於丙烯酸系聚合物(b-1)之情形時,作為構成該丙烯酸系聚合物(b-1)之單體所列舉之前述丙烯酸系單體及非丙烯酸系單體的任一者或兩者,使用具有前述反應性官能基之單體即可。例如,作為具有羥基作為反應性官能基之前述聚合物(b),例如可列舉使含羥基之(甲基)丙烯酸酯進行聚合而獲得之聚合物,除此以外,亦可列舉使上文所列舉之前述丙烯酸系單體或非丙烯酸系單體中1個或2個以上氫原子被前述反應性官能基取代而成之單體進行聚合而獲得之聚合物。 The polymer (b) having the reactive functional group and having no energy ray-curable group may, for example, be a polymer obtained by polymerizing at least a monomer having the reactive functional group. In the case of the acrylic polymer (b-1), either or both of the acrylic monomer and the non-acrylic monomer exemplified as the monomer constituting the acrylic polymer (b-1) A monomer having the aforementioned reactive functional group may be used. For example, the polymer (b) having a hydroxyl group as a reactive functional group may, for example, be a polymer obtained by polymerizing a hydroxyl group-containing (meth) acrylate, and may be exemplified above. A polymer obtained by polymerizing a monomer in which one or two or more hydrogen atoms of the acrylic monomer or non-acrylic monomer are substituted with the reactive functional group is polymerized.

具有反應性官能基之前述聚合物(b)中,由具有反應性官能基之單體衍生之結構單元的量相對於構成該聚合物(b)之結構單元的全部量之比例(含量)較佳為1質量%至25質量%,更佳為2質量%至20質量%。藉由前述比例為此種範圍,前述聚合物(b)中,交聯程度成為更佳的範 圍。 In the aforementioned polymer (b) having a reactive functional group, the ratio of the amount of the structural unit derived from the monomer having a reactive functional group to the total amount of the structural unit constituting the polymer (b) is higher It is preferably from 1% by mass to 25% by mass, more preferably from 2% by mass to 20% by mass. By the above ratio being such a range, in the above polymer (b), the degree of crosslinking becomes a better range. Wai.

就保護膜形成用組成物(IV-1)的造膜性更良好之方面而言,不具有能量線硬化性基之聚合物(b)的重量平均分子量(Mw)較佳為10000至2000000,更佳為100000至1500000。 The weight average molecular weight (Mw) of the polymer (b) having no energy ray-curable group is preferably from 10,000 to 2,000,000, in terms of the film forming property of the protective film-forming composition (IV-1) being more excellent. More preferably, it is 100,000 to 1,500,000.

保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之不具有能量線硬化性基之聚合物(b)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The polymer (b) having no energy ray-curable group contained in the protective film-forming composition (IV-1) and the film for forming a protective film may be used alone or in combination of two or more kinds. In the above cases, the combinations and ratios of these can be arbitrarily selected.

作為保護膜形成用組成物(IV-1),可列舉含有前述聚合物(a1)及前述化合物(a2)的任一者或兩者之組成物。並且,於保護膜形成用組成物(IV-1)含有前述化合物(a2)之情形時,較佳為亦進而含有不具有能量線硬化性基之聚合物(b),該情形時,亦較佳為進而含有前述(a1)。另外,保護膜形成用組成物(IV-1)亦可不含有前述化合物(a2),且一併含有前述聚合物(a1)及不具有能量線硬化性基之聚合物(b)。 The composition (IV-1) for forming a protective film includes a composition containing either or both of the polymer (a1) and the compound (a2). In the case where the protective film-forming composition (IV-1) contains the compound (a2), it is preferred to further contain the polymer (b) having no energy ray-curable group, and in this case, Further, it further contains the aforementioned (a1). In addition, the protective film-forming composition (IV-1) may not contain the compound (a2), and may contain the polymer (a1) and the polymer (b) having no energy ray-curable group.

於保護膜形成用組成物(IV-1)含有前述聚合物(a1)、前述化合物(a2)及不具有能量線硬化性基之聚合物(b)之情形時,保護膜形成用組成物(IV-1)中,前述化合物(a2) 的含量相對於前述聚合物(a1)及不具有能量線硬化性基之聚合物(b)的總含量100質量份,較佳為10質量份至400質量份,更佳為30質量份至350質量份。 When the protective film-forming composition (IV-1) contains the polymer (a1), the compound (a2), and the polymer (b) having no energy ray-curable group, the protective film-forming composition ( In the above IV-1), the aforementioned compound (a2) The content is preferably 10 parts by mass to 400 parts by mass, more preferably 30 parts by mass to 350 parts by mass per 100 parts by mass of the total of the polymer (a1) and the polymer (b) having no energy ray-curable group. Parts by mass.

保護膜形成用組成物(IV-1)中,前述能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)的合計含量相對於溶劑以外的成分的總含量之比例(亦即,保護膜形成用膜中的前述能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)的合計含量)較佳為5質量%至90質量%,更佳為10質量%至80質量%,尤佳為15質量%至70質量%。藉由前述合計含量的比例為此種範圍,保護膜形成用膜的能量線硬化性變得更良好。 In the composition for forming a protective film (IV-1), the ratio of the total content of the energy ray-curable component (a) and the polymer (b) having no energy ray-curable group to the total content of components other than the solvent (that is, the total content of the energy ray-curable component (a) and the polymer (b) having no energy ray-curable group in the film for forming a protective film) is preferably from 5% by mass to 90% by mass, more preferably It is preferably from 10% by mass to 80% by mass, particularly preferably from 15% by mass to 70% by mass. When the ratio of the total content is in such a range, the energy ray hardenability of the film for forming a protective film becomes better.

本發明之一態樣中,前述能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)的合計含量相對於前述溶劑以外的成分的總含量之比例較佳為78質量%至92質量%,更佳為82質量%至91質量%,進而較佳為84質量%至90質量%。 In one aspect of the invention, the ratio of the total content of the energy ray-curable component (a) and the polymer (b) having no energy ray-curable group to the total content of components other than the solvent is preferably 78. The mass% to 92% by mass, more preferably 82% by mass to 91% by mass, still more preferably 84% by mass to 90% by mass.

於保護膜形成用組成物(IV-1)含有前述能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)之情形時,保護膜形成用組成物(IV-1)及保護膜形成用膜中,前述聚合物(b)的含量相對於能量線硬化性成分(a)的含量100質量份,較佳為3質量份至160質量份,更佳為6質量份至130質量份。藉由前述聚合物(b)的前述含量為此種範圍, 保護膜形成用膜的能量線硬化性變得更良好。 When the protective film-forming composition (IV-1) contains the energy ray-curable component (a) and the polymer (b) having no energy ray-curable group, the protective film-forming composition (IV-1) In the film for forming a protective film, the content of the polymer (b) is preferably from 3 parts by mass to 160 parts by mass, more preferably 6 parts by mass, per 100 parts by mass of the content of the energy ray-curable component (a). Up to 130 parts by mass. By the aforementioned content of the aforementioned polymer (b) being such a range, The energy ray hardenability of the film for forming a protective film is further improved.

保護膜形成用組成物(IV-1)中,除能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)以外,亦可根據目的含有選自由光聚合起始劑(c)、填充材料(d)、偶合劑(e)、交聯劑(f)、著色劑(g)、熱硬化性成分(h)、及通用添加劑(z)所組成之群組中的1種或2種以上。例如,藉由使用含有前述能量線硬化性成分(a)及熱硬化性成分(h)之保護膜形成用組成物(IV-1),所形成之保護膜形成用膜藉由加熱而對被接著體之接著力提高,由該保護膜形成用膜形成之保護膜的強度亦提高。 In addition to the energy ray-curable component (a) and the polymer (b) having no energy ray-curable group, the protective film-forming composition (IV-1) may be selected from photopolymerization initiators depending on the purpose. (c), a filler (d), a coupling agent (e), a crosslinking agent (f), a coloring agent (g), a thermosetting component (h), and a general additive (z) One or two or more. For example, by using the protective film forming composition (IV-1) containing the energy ray-curable component (a) and the thermosetting component (h), the formed protective film forming film is heated by heating. Then, the adhesion of the body is increased, and the strength of the protective film formed of the film for forming a protective film is also improved.

[光聚合起始劑(c)] [Photopolymerization initiator (c)]

作為光聚合起始劑(c),例如可列舉:安息香、安息香甲醚、安息香乙醚、安息香異丙醚、安息香異丁醚、安息香苯甲酸、安息香苯甲酸甲酯、安息香二甲基縮酮等安息香化合物;苯乙酮、2-羥基-2-甲基-1-苯基-丙烷-1-酮、2,2-二甲氧基-1,2-二苯基乙烷-1-酮等苯乙酮化合物;雙(2,4,6-三甲基苯甲醯基)苯基氧化膦、2,4,6-三甲基苯甲醯基二苯基氧化膦等醯基氧化膦化合物;苄基苯基硫化物、一硫化四甲基秋蘭姆等硫化物化合物;1-羥基環己基苯基酮等α-酮醇化合物;偶氮雙異丁腈等偶氮化合物;二茂鈦等二茂鈦化合物;噻噸酮等噻噸酮化合物;二苯甲酮、2-(二甲基胺基)-1-(4-嗎啉基苯基)-2-苄基-1-丁酮、乙 酮,1-[9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基]-,1-(O-乙醯基肟)等二苯甲酮化合物;過氧化物化合物;二乙醯等二酮化合物;苯偶醯;二苯偶醯;2,4-二乙基噻噸酮;1,2-二苯基甲烷;2-羥基-2-甲基-1-[4-(1-甲基乙烯基)苯基]丙酮;2-氯蒽醌等。 Examples of the photopolymerization initiator (c) include benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, benzoin benzoic acid, benzoin benzoic acid methyl ester, benzoin dimethyl ketal, and the like. Benzoin compounds; acetophenone, 2-hydroxy-2-methyl-1-phenyl-propan-1-one, 2,2-dimethoxy-1,2-diphenylethane-1-one, etc. Acetophenone compound; fluorenylphosphine oxide compound such as bis(2,4,6-trimethylbenzylidene)phenylphosphine oxide or 2,4,6-trimethylbenzimidyldiphenylphosphine oxide a sulfonate compound such as benzyl phenyl sulfide or tetramethyl thiuram monosulfide; an α-keto alcohol compound such as 1-hydroxycyclohexyl phenyl ketone; an azo compound such as azobisisobutyronitrile; Isoferrocene compound; thioxanthone compound such as thioxanthone; benzophenone, 2-(dimethylamino)-1-(4-morpholinylphenyl)-2-benzyl-1-butane Ketone, B Ketone, benzophenone compound such as 1-[9-ethyl-6-(2-methylbenzhydryl)-9H-indazol-3-yl]-, 1-(O-ethenylhydrazine) Peroxide compound; diketone compound such as diethyl hydrazine; benzoin; diphenyl oxime; 2,4-diethyl thioxanthone; 1,2-diphenylmethane; 2-hydroxy-2-methyl 1-[4-(1-methylvinyl)phenyl]acetone; 2-chloroindole and the like.

另外,作為光聚合起始劑(c),例如亦可使用1-氯蒽醌等醌化合物;胺等光增感劑等。 Further, as the photopolymerization initiator (c), for example, a ruthenium compound such as 1-chloroindole or a photosensitizer such as an amine can be used.

保護膜形成用組成物(IV-1)所含有之光聚合起始劑(c)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The photopolymerization initiator (c) contained in the protective film-forming composition (IV-1) may be one type or two or more types. When two or more types are used, the combinations and ratios thereof may be Free to choose.

於使用光聚合起始劑(c)之情形時,保護膜形成用組成物(IV-1)中,光聚合起始劑(c)的含量相對於能量線硬化性化合物(a)的含量100質量份,較佳為0.01質量份至20質量份,更佳為0.03質量份至10質量份,尤佳為0.05質量份至5質量份。 In the case of using the photopolymerization initiator (c), the content of the photopolymerization initiator (c) in the composition for forming a protective film (IV-1) relative to the content of the energy ray-curable compound (a) is 100. The parts by mass are preferably from 0.01 part by mass to 20 parts by mass, more preferably from 0.03 part by mass to 10 parts by mass, still more preferably from 0.05 part by mass to 5 parts by mass.

[填充材料(d)] [filler (d)]

藉由保護膜形成用膜含有填充材料(d),保護膜形成用膜硬化而獲得之保護膜容易調整熱膨脹係數,使該熱膨脹係數對於保護膜之形成對象物而言最適宜,藉此使用保護膜形成用複合片所獲得之封裝的可靠性進一步提高。另外,藉由保護膜形成用膜含有填充材料(d),可降低保護 膜的吸濕率,或提高散熱性。 When the film for forming a protective film contains the filler (d), the film obtained by curing the film for forming a protective film is easily adjusted in thermal expansion coefficient, and the coefficient of thermal expansion is most suitable for the object to be formed of the protective film, thereby protecting the film. The reliability of the package obtained by the composite sheet for film formation is further improved. In addition, since the film for forming a protective film contains the filler (d), the protection can be reduced. The moisture absorption rate of the film or the heat dissipation.

作為填充材料(d),例如可列舉由導熱性材料構成之材料。 As the filler (d), for example, a material composed of a thermally conductive material can be cited.

填充材料(d)可為有機填充材料及無機填充材料之任一者,較佳為無機填充材料。 The filler (d) may be any of an organic filler and an inorganic filler, and is preferably an inorganic filler.

作為較佳的無機填充材料,例如可列舉:二氧化矽、氧化鋁、滑石、碳酸鈣、鈦白、鐵丹、碳化矽、氮化硼等的粉末;將這些無機填充材料球形化而成之珠粒;這些無機填充材料的表面改質品;這些無機填充材料的單晶纖維;玻璃纖維等。 Examples of preferred inorganic fillers include powders of cerium oxide, aluminum oxide, talc, calcium carbonate, titanium white, iron oxide, tantalum carbide, and boron nitride; and these inorganic filler materials are spheroidized. Beads; surface modification of these inorganic fillers; single crystal fibers of these inorganic fillers; glass fibers, and the like.

這些之中,無機填充材料較佳為二氧化矽或氧化鋁,更佳為表面經環氧基修飾之二氧化矽。 Among these, the inorganic filler is preferably cerium oxide or aluminum oxide, more preferably cerium oxide whose surface is modified with an epoxy group.

填充材料(d)的平均粒徑並無特別限定,較佳為0.01μm至20μm,更佳為0.1μm至15μm,尤佳為0.3μm至10μm。另外,本發明之一態樣中,填充材料(d)的平均粒徑為0.05μm至0.1μm。藉由填充材料(d)的平均粒徑為此種範圍,可維持對保護膜之形成對象物之接著性,並且可抑制保護膜之光之透過率之降低。 The average particle diameter of the filler (d) is not particularly limited, but is preferably from 0.01 μm to 20 μm, more preferably from 0.1 μm to 15 μm, still more preferably from 0.3 μm to 10 μm. Further, in one aspect of the invention, the filler (d) has an average particle diameter of from 0.05 μm to 0.1 μm. When the average particle diameter of the filler (d) is in such a range, the adhesion to the object to be formed of the protective film can be maintained, and the decrease in the transmittance of light of the protective film can be suppressed.

再者,本說明書中,所謂「平均粒徑」只要無特別說明則意指藉由雷射繞射散射法所求出之粒度分佈曲線中累計值50%下的粒徑(D50)之值。 In the present specification, the "average particle diameter" means the value of the particle diameter (D 50 ) at an integrated value of 50% in the particle size distribution curve obtained by the laser diffraction scattering method unless otherwise specified. .

保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之填充材料(d)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The filler (d) which is contained in the protective film-forming composition (IV-1) and the film for forming a protective film may be one type or two or more types. When two or more types are used, the combination of these may be used. And the ratio can be arbitrarily chosen.

於使用填充材料(d)之情形時,保護膜形成用組成物(IV-1)中,填充材料(d)的含量相對於溶劑以外的全部成分的總含量之比例(亦即,保護膜形成用膜中的填充材料(d)的含量)較佳為5質量%至83質量%,更佳為7質量%至78質量%。藉由填充材料(d)的含量為此種範圍,變得更容易調整上述之熱膨脹係數。 In the case of using the filler (d), the ratio of the content of the filler (d) to the total content of all components other than the solvent in the protective film-forming composition (IV-1) (that is, the formation of a protective film) The content of the filler (d) in the film is preferably from 5% by mass to 83% by mass, more preferably from 7% by mass to 78% by mass. By the content of the filler (d) being such a range, it becomes easier to adjust the above thermal expansion coefficient.

作為本發明之一態樣,填充材料(d)的含量相對於保護膜形成用膜的質量,較佳為4質量%至15質量%,更佳為4質量%至10質量%。 As one aspect of the present invention, the content of the filler (d) is preferably from 4% by mass to 15% by mass, and more preferably from 4% by mass to 10% by mass based on the mass of the film for forming a protective film.

作為本發明之另一態樣,填充材料(d)的平均粒徑為0.05μm至0.1μm時,填充材料(d)的含量相對於保護膜形成用膜的質量,較佳為4質量%至15質量%,更佳為4質量%至10質量%。 In another aspect of the present invention, when the average particle diameter of the filler (d) is from 0.05 μm to 0.1 μm, the content of the filler (d) is preferably from 4% by mass to the mass of the film for forming a protective film. 15% by mass, more preferably 4% by mass to 10% by mass.

[偶合劑(e)] [coupler (e)]

藉由使用具有可與無機化合物或有機化合物反應之官能基之偶合劑作為偶合劑(e),可提高保護膜形成用膜對被接著體之接著性及密接性。另外,藉由使用偶合劑(e),保護膜形成用膜硬化而獲得之保護膜無損耐熱性而耐水性提高。 By using a coupling agent having a functional group reactive with an inorganic compound or an organic compound as the coupling agent (e), the adhesion of the film for forming a protective film to the adherend and the adhesion can be improved. In addition, by using the coupling agent (e), the protective film obtained by curing the film for protective film formation is not resistant to heat resistance and water resistance is improved.

偶合劑(e)較佳為具有可與能量線硬化性成分(a)、不具有能量線硬化性基之聚合物(b)等所具有之官能基反應之官能基之化合物,更佳為矽烷偶合劑。 The coupling agent (e) is preferably a compound having a functional group reactive with a functional group having an energy ray-curable component (a) and a polymer (b) having no energy ray-curable group, and more preferably a decane. Coupling agent.

作為較佳的前述矽烷偶合劑,例如可列舉:3-縮水甘油氧基丙基三甲氧基矽烷、3-縮水甘油氧基丙基甲基二乙氧基矽烷、3-縮水甘油氧基丙基三乙氧基矽烷、3-縮水甘油氧基甲基二乙氧基矽烷、2-(3,4-環氧環己基)乙基三甲氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-胺基丙基三甲氧基矽烷、3-(2-胺基乙基胺基)丙基三甲氧基矽烷、3-(2-胺基乙基胺基)丙基甲基二乙氧基矽烷、3-(苯基胺基)丙基三甲氧基矽烷、3-苯胺基丙基三甲氧基矽烷、3-脲基丙基三乙氧基矽烷、3-巰基丙基三甲氧基矽烷、3-巰基丙基甲基二甲氧基矽烷、雙(3-三乙氧基矽烷基丙基)四硫化物、甲基三甲氧基矽烷、甲基三乙氧基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙醯氧基矽烷、咪唑矽烷等。 Preferred examples of the decane coupling agent include 3-glycidoxypropyltrimethoxydecane, 3-glycidoxypropylmethyldiethoxydecane, and 3-glycidoxypropyl group. Triethoxy decane, 3-glycidoxymethyl diethoxy decane, 2-(3,4-epoxycyclohexyl)ethyltrimethoxydecane, 3-methylpropenyloxypropyltrimethyl Oxydecane, 3-aminopropyltrimethoxydecane, 3-(2-aminoethylamino)propyltrimethoxydecane, 3-(2-aminoethylamino)propylmethyl Diethoxydecane, 3-(phenylamino)propyltrimethoxydecane, 3-anilinopropyltrimethoxydecane, 3-ureidopropyltriethoxydecane, 3-mercaptopropyltrimethyl Oxydecane, 3-mercaptopropylmethyldimethoxydecane, bis(3-triethoxydecylpropyl)tetrasulfide, methyltrimethoxydecane, methyltriethoxydecane, ethylene Trimethoxy decane, vinyl triethoxy decane, imidazolium, and the like.

保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之偶合劑(e)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The coupling agent (IV) and the protective film forming film may be used alone or in combination of two or more kinds. In the case of two or more types, these combinations may be used. And the ratio can be arbitrarily chosen.

於使用偶合劑(e)之情形時,保護膜形成用組成物(IV-1)及保護膜形成用膜中,偶合劑(e)的含量相對於能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)的 總含量100質量份,較佳為0.03質量份至20質量份,更佳為0.05質量份至10質量份,尤佳為0.1質量份至5質量份。藉由偶合劑(e)的前述含量為前述下限值以上,可獲得更顯著的以下由使用偶合劑(e)所帶來之功效:填充材料(d)於樹脂中的分散性提高,或保護膜形成用膜與被接著體之接著性提高等。另外,藉由偶合劑(e)的前述含量為前述上限值以下,可進一步抑制產生逸氣。 In the case of using the coupling agent (e), the protective film-forming composition (IV-1) and the film for forming a protective film have a content of the coupling agent (e) with respect to the energy ray-curable component (a) and Energy line hardening based polymer (b) The total content is 100 parts by mass, preferably 0.03 parts by mass to 20 parts by mass, more preferably 0.05 parts by mass to 10 parts by mass, still more preferably 0.1 part by mass to 5 parts by mass. When the content of the coupling agent (e) is at least the above lower limit value, more remarkable effects by using the coupling agent (e) can be obtained: the dispersibility of the filler (d) in the resin is improved, or The adhesion between the film for forming a protective film and the adherend is improved. Further, when the content of the coupling agent (e) is at most the above upper limit value, generation of outgas can be further suppressed.

[交聯劑(f)] [crosslinking agent (f)]

使用交聯劑(F),使上述之能量線硬化性成分(a)或不具有能量線硬化性基之聚合物(b)進行交聯,藉此可調節保護膜形成用膜的初期接著力及凝聚力。 By using the crosslinking agent (F), the energy ray-curable component (a) or the polymer (b) having no energy ray-curable group is crosslinked, whereby the initial adhesion of the film for forming a protective film can be adjusted. And cohesion.

作為交聯劑(f),例如可列舉:有機多元異氰酸酯化合物、有機多元亞胺化合物、金屬螯合物系交聯劑(具有金屬螯合物結構之交聯劑)、氮丙啶系交聯劑(具有氮丙啶基之交聯劑)等。 Examples of the crosslinking agent (f) include an organic polyvalent isocyanate compound, an organic polyimine compound, a metal chelate crosslinking agent (a crosslinking agent having a metal chelate structure), and an aziridine crosslinking. A reagent (a cross-linking agent having an aziridine group) or the like.

作為前述有機多元異氰酸酯化合物,例如可列舉:芳香族多元異氰酸酯化合物、脂肪族多元異氰酸酯化合物及脂環族多元異氰酸酯化合物(以下,有時將這些化合物統一簡稱為「芳香族多元異氰酸酯化合物等」);前述芳香族多元異氰酸酯化合物等的三聚物、異氰脲酸酯體及加合物;使前述芳香族多元異氰酸酯化合物等與多元醇化合物 反應而獲得之末端異氰酸酯胺基甲酸酯預聚物等。前述「加合物」意指前述芳香族多元異氰酸酯化合物、脂肪族多元異氰酸酯化合物或脂環族多元異氰酸酯化合物,與乙二醇、丙二醇、新戊二醇、三羥甲基丙烷或蓖麻油等含低分子活性氫之化合物之反應物,作為前述加合物的示例,可列舉如後述之三羥甲基丙烷之苯二甲基二異氰酸酯加成物等。另外,所謂「末端異氰酸酯胺基甲酸酯預聚物」,意指具有胺基甲酸酯鍵,並且於分子末端部具有異氰酸酯基之預聚物。 Examples of the organic polyvalent isocyanate compound include an aromatic polyisocyanate compound, an aliphatic polyisocyanate compound, and an alicyclic polyisocyanate compound (hereinafter, these compounds may be collectively referred to simply as "aromatic polyisocyanate compounds"); a trimer, an isocyanurate body, and an adduct of the aromatic polyvalent isocyanate compound; and the aromatic polyisocyanate compound and the like and a polyol compound A terminal isocyanate urethane prepolymer obtained by the reaction or the like. The term "adduct" means the aforementioned aromatic polyisocyanate compound, aliphatic polyisocyanate compound or alicyclic polyisocyanate compound, and is contained in ethylene glycol, propylene glycol, neopentyl glycol, trimethylolpropane or castor oil. The reactant of the compound of the low molecular weight active hydrogen, as an example of the above-mentioned adduct, may be a benzodimethyl diisocyanate adduct of trimethylolpropane mentioned later. Further, the term "terminal isocyanate urethane prepolymer" means a prepolymer having a urethane bond and having an isocyanate group at a terminal portion of the molecule.

作為前述有機多元異氰酸酯化合物,更具體而言,例如可列舉:2,4-甲苯二異氰酸酯;2,6-甲苯二異氰酸酯;1,3-苯二甲基二異氰酸酯;1,4-二甲苯二異氰酸酯;二苯基甲烷-4,4'-二異氰酸酯;二苯基甲烷-2,4'-二異氰酸酯;3-甲基二苯基甲烷二異氰酸酯;六亞甲基二異氰酸酯;異佛爾酮二異氰酸酯;二環己基甲烷-4,4'-二異氰酸酯;二環己基甲烷-2,4'-二異氰酸酯;對三羥甲基丙烷等多元醇的全部或一部分羥基,加成甲苯二異氰酸酯、六亞甲基二異氰酸酯及苯二甲基二異氰酸酯的任1種或2種以上而成之化合物;離胺酸二異氰酸酯等。 As the above-mentioned organic polyvalent isocyanate compound, more specifically, for example, 2,4-toluene diisocyanate; 2,6-toluene diisocyanate; 1,3-benzenedimethyl diisocyanate; 1,4-dimethylbenzene Isocyanate; diphenylmethane-4,4'-diisocyanate; diphenylmethane-2,4'-diisocyanate; 3-methyldiphenylmethane diisocyanate; hexamethylene diisocyanate; isophorone Diisocyanate; dicyclohexylmethane-4,4'-diisocyanate; dicyclohexylmethane-2,4'-diisocyanate; addition of toluene diisocyanate to all or a part of hydroxyl groups of polyhydric alcohols such as trimethylolpropane A compound obtained by using one or more of hexamethylene diisocyanate and benzodimethyl diisocyanate; an isocyanuric acid diisocyanate or the like.

作為前述有機多元亞胺化合物,例如可列舉:N,N'-二苯基甲烷-4,4'-雙(1-氮丙啶甲醯胺)、三羥甲基丙烷-三-β-氮丙啶基丙酸酯、四羥甲基甲烷-三-β-氮丙啶基丙酸 酯、N,N'-甲苯-2,4-雙(1-氮丙啶甲醯胺)三伸乙基三聚氰胺等。 The organic polyimine compound may, for example, be N,N'-diphenylmethane-4,4'-bis(1-aziridinecarboxamide) or trimethylolpropane-tri-beta-nitrogen. Propidyl propionate, tetramethylol methane-tri-β-aziridine propionic acid Ester, N, N'-toluene-2,4-bis(1-aziridinecarboxamide), tri-ethyl melamine, and the like.

於使用有機多元異氰酸酯化合物作為交聯劑(f)之情形時,作為能量線硬化性成分(a)或不具有能量線硬化性基之聚合物(b),較佳為使用含羥基之聚合物。於交聯劑(f)具有異氰酸酯基,能量線硬化性成分(a)或不具有能量線硬化性基之聚合物(b)具有羥基之情形時,藉由交聯劑(f)與能量線硬化性成分(a)或不具有能量線硬化性基之聚合物(b)之反應,可將交聯結構簡便地導入至保護膜形成用膜中。 When an organic polyvalent isocyanate compound is used as the crosslinking agent (f), it is preferred to use a hydroxyl group-containing polymer as the energy ray-curable component (a) or the polymer (b) having no energy ray-curable group. . When the crosslinking agent (f) has an isocyanate group, and the energy ray-curable component (a) or the polymer (b) having no energy ray-curable group has a hydroxyl group, the crosslinking agent (f) and the energy ray are used. The reaction of the curable component (a) or the polymer (b) having no energy ray-curable group can easily introduce the crosslinked structure into the film for forming a protective film.

保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之交聯劑(f)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The protective film-forming composition (IV-1) and the crosslinking agent (f) contained in the film for forming a protective film may be one type or two or more types. When two or more types are used, these are Combinations and ratios can be arbitrarily chosen.

於使用交聯劑(f)之情形時,保護膜形成用組成物(IV-1)中,交聯劑(f)的含量相對於能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)的總含量100質量份,較佳為0.01質量份至20質量份,更佳為0.1質量份至10質量份,尤佳為0.5質量份至5質量份。藉由交聯劑(f)的前述含量為前述下限值以上,可獲得更顯著的由使用交聯劑(f)所帶來之功效。另外,藉由交聯劑(f)的前述含量為前述上限值以下,可抑制交聯劑(f)之過量使用。 In the case of using the crosslinking agent (f), in the protective film-forming composition (IV-1), the content of the crosslinking agent (f) is relative to the energy ray-curable component (a) and has no energy ray hardenability. The total content of the polymer (b) based on 100 parts by mass is preferably from 0.01 part by mass to 20 parts by mass, more preferably from 0.1 part by mass to 10 parts by mass, still more preferably from 0.5 part by mass to 5 parts by mass. When the content of the crosslinking agent (f) is at least the above lower limit value, a more remarkable effect by the use of the crosslinking agent (f) can be obtained. Further, when the content of the crosslinking agent (f) is at most the above upper limit value, excessive use of the crosslinking agent (f) can be suppressed.

[著色劑(g)] [coloring agent (g)]

作為著色劑(g),例如可列舉:無機系顏料、有機系顏料、有機系染料等公知的著色劑。 Examples of the colorant (g) include known coloring agents such as inorganic pigments, organic pigments, and organic dyes.

作為前述有機系顏料及有機系染料,例如可列舉:銨系色素、花青系色素、部花青系色素、克酮鎓(croconium)系色素、方酸鎓(squalilium)系色素、薁鎓系色素、聚次甲基系色素、萘醌系色素、吡喃鎓系色素、酞菁系色素、萘酞菁系色素、萘內醯胺系色素、偶氮系色素、縮合偶氮系色素、靛藍系色素、紫環酮(perinone)系色素、苝系色素、二噁烷系色素、喹吖啶酮系色素、異吲哚啉酮系色素、喹啉黃(quinophthalone)系色素、吡咯系色素、硫代靛藍系色素、金屬錯合物系色素(金屬錯鹽染料)、二硫醇金屬錯合物系色素、吲哚酚系色素、三烯丙基甲烷系色素、蒽醌系色素、萘酚系色素、次甲基偶氮系色素、苯并咪唑酮系色素、皮蒽酮系色素及士林(threne)系色素等。 Examples of the organic pigment and the organic dye include an ammonium dye, a cyanine dye, a merocyanine dye, a croconium dye, a squalilium dye, and an anthraquinone. Pigment, polymethine dye, naphthoquinone dye, pyryl quinone dye, phthalocyanine dye, naphthalocyanine dye, naphthalene amide dye, azo dye, condensed azo dye, indigo a pigment, a perinone dye, an anthraquinone dye, a dioxane dye, a quinacridone dye, an isoindolinone dye, a quinophthalone pigment, a pyrrole dye, A thioindigo dye, a metal complex dye (metal stear salt dye), a dithiol metal complex dye, a nonylphenol dye, a triallylmethane dye, an anthraquinone dye, a naphthol A coloring matter, a methine azo dye, a benzimidazolone dye, a swainone pigment, and a threne pigment.

作為前述無機系顏料,例如可列舉:碳黑、鈷系色素、鐵系色素、鉻系色素、鈦系色素、釩系色素、鋯系色素、鉬系色素、釕系色素、鉑系色素、ITO(Indium Tin Oxide;氧化銦錫)系色素、ATO(Antimony Tin Oxide;氧化銻錫)系色素等。 Examples of the inorganic pigment include carbon black, a cobalt dye, an iron dye, a chromium dye, a titanium dye, a vanadium dye, a zirconium dye, a molybdenum dye, an anthraquinone dye, a platinum dye, and ITO. (Indium Tin Oxide; indium tin oxide) dye, ATO (Antimony Tin Oxide) pigment, and the like.

保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之著色劑(g)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The coloring agent (g) to be contained in the protective film-forming composition (IV-1) and the film for forming a protective film may be one type or two or more types. When two or more types are used, these combinations may be used. And the ratio can be arbitrarily chosen.

於使用著色劑(g)之情形時,保護膜形成用膜中的著色劑(g)的含量根據目的適宜調節即可。例如,有時藉由雷射照射對保護膜實施印字,藉由調節保護膜形成用膜中的著色劑(g)的含量,調節保護膜的透光性,可調節印字視認性。該情形時,保護膜形成用組成物(IV-1)中,著色劑(g)的含量相對於溶劑以外的全部成分的總含量之比例(亦即,保護膜形成用膜中的著色劑(g)的含量)較佳為0.1質量%至10質量%,更佳為0.4質量%至7.5質量%,尤佳為0.8質量%至5質量%。藉由著色劑(g)的前述含量為前述下限值以上,可獲得更顯著的由使用著色劑(g)所帶來之功效。另外,藉由著色劑(g)的前述含量為前述上限值以下,可抑制著色劑(g)之過量使用。 In the case of using the coloring agent (g), the content of the coloring agent (g) in the film for forming a protective film may be appropriately adjusted depending on the purpose. For example, printing may be performed on the protective film by laser irradiation, and the transmittance of the protective film may be adjusted by adjusting the content of the coloring agent (g) in the film for forming a protective film, thereby improving the print visibility. In this case, in the protective film-forming composition (IV-1), the ratio of the content of the colorant (g) to the total content of all the components other than the solvent (that is, the coloring agent in the film for forming a protective film ( The content of g) is preferably from 0.1% by mass to 10% by mass, more preferably from 0.4% by mass to 7.5% by mass, even more preferably from 0.8% by mass to 5% by mass. When the content of the coloring agent (g) is at least the above lower limit value, a more remarkable effect by the use of the coloring agent (g) can be obtained. In addition, when the content of the coloring agent (g) is at most the above upper limit value, excessive use of the coloring agent (g) can be suppressed.

[熱硬化性成分(h)] [thermosetting component (h)]

保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之熱硬化性成分(h)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The thermosetting component (h) contained in the protective film-forming composition (IV-1) and the film for forming a protective film may be one type or two or more types. When two or more types are used, these are The combination and ratio can be arbitrarily selected.

作為熱硬化性成分(h),例如可列舉:環氧系熱硬化性樹脂、熱硬化性聚醯亞胺、聚胺基甲酸酯、不飽和聚酯、 聚矽氧樹脂等,較佳為環氧系熱硬化性樹脂。 Examples of the thermosetting component (h) include an epoxy thermosetting resin, a thermosetting polyimide, a polyurethane, an unsaturated polyester, and the like. A polyoxyxylene resin or the like is preferably an epoxy thermosetting resin.

(環氧系熱硬化性樹脂) (epoxy thermosetting resin)

環氧系熱硬化性樹脂係由環氧樹脂(h1)及熱硬化劑(h2)構成。 The epoxy thermosetting resin is composed of an epoxy resin (h1) and a thermosetting agent (h2).

保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之環氧系熱硬化性樹脂可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The epoxy-based thermosetting resin contained in the protective film-forming composition (IV-1) and the film for forming a protective film may be one type or two or more types. When two or more types are used, these are The combination and ratio can be arbitrarily selected.

‧環氧樹脂(h1) ‧Epoxy resin (h1)

作為環氧樹脂(h1),可列舉公知的環氧樹脂,例如可列舉:多官能系環氧樹脂、聯苯化合物、雙酚A二縮水甘油醚及其氫化物、鄰甲酚酚醛清漆環氧樹脂、二環戊二烯型環氧樹脂、聯苯型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、伸苯基骨架型環氧樹脂等2官能以上之環氧化合物。 Examples of the epoxy resin (h1) include known epoxy resins, and examples thereof include polyfunctional epoxy resins, biphenyl compounds, bisphenol A diglycidyl ether and hydrogenated products thereof, and o-cresol novolac epoxy. Two or more epoxy resins such as resin, dicyclopentadiene type epoxy resin, biphenyl type epoxy resin, bisphenol A type epoxy resin, bisphenol F type epoxy resin, and phenyl skeleton type epoxy resin Compound.

作為環氧樹脂(h1),亦可使用具有不飽和烴基之環氧樹脂。具有不飽和烴基之環氧樹脂相較於不具有不飽和烴基之環氧樹脂而言,與丙烯酸系樹脂之相容性較高。因此,藉由使用具有不飽和烴基之環氧樹脂,使用保護膜形成用複合片所獲得之封裝的可靠性提高。 As the epoxy resin (h1), an epoxy resin having an unsaturated hydrocarbon group can also be used. The epoxy resin having an unsaturated hydrocarbon group has higher compatibility with the acrylic resin than the epoxy resin having no unsaturated hydrocarbon group. Therefore, the reliability of the package obtained by using the composite sheet for forming a protective film is improved by using an epoxy resin having an unsaturated hydrocarbon group.

作為具有不飽和烴基之環氧樹脂,例如可列舉:多官 能系環氧樹脂的一部分環氧基更換為具有不飽和烴基之基而成之化合物。此種化合物例如藉由使(甲基)丙烯酸或其衍生物與環氧基進行加成反應而獲得。 As the epoxy resin having an unsaturated hydrocarbon group, for example, a plurality of officials A compound in which a part of the epoxy group of the epoxy resin is replaced with a group having an unsaturated hydrocarbon group. Such a compound is obtained, for example, by subjecting (meth)acrylic acid or a derivative thereof to an addition reaction with an epoxy group.

另外,作為具有不飽和烴基之環氧樹脂,例如可列舉:於構成環氧樹脂之芳香環等上直接鍵結有具有不飽和烴基之基之化合物等。 In addition, examples of the epoxy resin having an unsaturated hydrocarbon group include a compound in which a group having an unsaturated hydrocarbon group is directly bonded to an aromatic ring or the like constituting the epoxy resin.

不飽和烴基為具有聚合性之不飽和基,作為該不飽和烴基的具體例,可列舉:次乙基(亦稱為乙烯基)、2-丙烯基(亦稱為烯丙基)、(甲基)丙烯醯基、(甲基)丙烯醯胺基等,較佳為丙烯醯基。 The unsaturated hydrocarbon group is a polymerizable unsaturated group, and specific examples of the unsaturated hydrocarbon group include a secondary ethyl group (also referred to as a vinyl group), a 2-propenyl group (also referred to as an allyl group), and (a). The acrylonitrile group, the (meth) acrylamide group, and the like are preferably an acrylonitrile group.

環氧樹脂(h1)的數量平均分子量並無特別限定,就保護膜形成用膜的硬化性、以及保護膜的強度及耐熱性之方面而言,較佳為300至30000,更佳為400至10000,尤佳為500至3000。 The number average molecular weight of the epoxy resin (h1) is not particularly limited, and is preferably from 300 to 30,000, more preferably from 400 to 3, in terms of the curability of the film for forming a protective film and the strength and heat resistance of the protective film. 10,000, especially 500 to 3000.

本說明書中,所謂「數量平均分子量」只要無特別說明則意指藉由凝膠滲透層析(GPC)法所測定之以標準聚苯乙烯換算之值表示之數量平均分子量。 In the present specification, the "number average molecular weight" means a number average molecular weight expressed by a value in terms of standard polystyrene measured by a gel permeation chromatography (GPC) method unless otherwise specified.

環氧樹脂(h1)的環氧當量較佳為100g/eq至1000g/eq,更佳為150g/eq至800g/eq。 The epoxy equivalent of the epoxy resin (h1) is preferably from 100 g/eq to 1000 g/eq, more preferably from 150 g/eq to 800 g/eq.

本說明書中,所謂「環氧當量」意指包含1克當量之環氧基之環氧化合物的克數(g/eq),可依據JIS K 7236:2001之方法進行測定。 In the present specification, the term "epoxy equivalent" means the number of grams (g/eq) of an epoxy compound containing 1 gram equivalent of an epoxy group, which can be measured in accordance with the method of JIS K 7236:2001.

環氧樹脂(h1)可單獨使用1種,亦可併用2種以上,於併用2種以上之情形時,這些之組合及比率可任意選擇。 The epoxy resin (h1) may be used singly or in combination of two or more. When two or more kinds are used in combination, the combination and ratio may be arbitrarily selected.

‧熱硬化劑(h2) ‧Heat hardener (h2)

熱硬化劑(h2)發揮作為針對環氧樹脂(h1)之硬化劑的功能。 The heat hardener (h2) functions as a hardener for the epoxy resin (h1).

作為熱硬化劑(h2),例如可列舉:1分子中具有2個以上可與環氧基反應之官能基之化合物。作為前述官能基,例如可列舉:酚性羥基、醇性羥基、胺基、羧基、酸基經酐化而成之基等,較佳為酚性羥基、胺基、或酸基經酐化而成之基,更佳為酚性羥基或胺基。 The thermosetting agent (h2) is, for example, a compound having two or more functional groups reactive with an epoxy group in one molecule. Examples of the functional group include a phenolic hydroxyl group, an alcoholic hydroxyl group, an amine group, a carboxyl group, and a group in which an acid group is anhydride-formed. Preferably, the phenolic hydroxyl group, the amine group, or the acid group is anhydride-treated. More preferably, it is a phenolic hydroxyl group or an amine group.

熱硬化劑(h2)中,作為具有酚性羥基之酚系硬化劑,例如可列舉:多官能酚樹脂、聯苯酚、酚醛清漆型酚樹脂、二環戊二烯系酚樹脂、芳烷基酚樹脂等。 In the thermosetting agent (h2), examples of the phenolic curing agent having a phenolic hydroxyl group include a polyfunctional phenol resin, a biphenol, a novolak type phenol resin, a dicyclopentadiene type phenol resin, and an aralkylphenol. Resin, etc.

熱硬化劑(h2)中,作為具有胺基之胺系硬化劑,例如可列舉:二氰二胺(以下,有時簡稱為「DICY;Dicyandiamde」)等。 In the thermosetting agent (h2), examples of the amine-based curing agent having an amine group include dicyandiamide (hereinafter sometimes abbreviated as "DICY; Dicyandiamde").

熱硬化劑(h2)亦可具有不飽和烴基。 The heat hardener (h2) may also have an unsaturated hydrocarbon group.

作為具有不飽和烴基之熱硬化劑(h2),例如可列舉:酚樹脂的一部分羥基被具有不飽和烴基之基取代而成之化合物、酚樹脂的芳香環上直接鍵結具有不飽和烴基之基 而成之化合物等。 Examples of the thermosetting agent (h2) having an unsaturated hydrocarbon group include a compound in which a part of the hydroxyl group of the phenol resin is substituted with a group having an unsaturated hydrocarbon group, and a group in which an aromatic ring of the phenol resin is directly bonded to have an unsaturated hydrocarbon group. Compounds and the like.

熱硬化劑(h2)中的前述不飽和烴基與上述之具有不飽和烴基之環氧樹脂中的不飽和烴基相同。 The aforementioned unsaturated hydrocarbon group in the heat hardener (h2) is the same as the unsaturated hydrocarbon group in the above epoxy resin having an unsaturated hydrocarbon group.

於使用酚系硬化劑作為熱硬化劑(h2)之情形時,就保護膜自支持片之剝離性提高之方面而言,熱硬化劑(h2)較佳為軟化點或玻璃轉移溫度高的酚系硬化劑。 When a phenolic curing agent is used as the thermosetting agent (h2), the thermosetting agent (h2) is preferably a phenol having a softening point or a high glass transition temperature in terms of improving the peeling property of the protective film from the support sheet. A hardener.

本說明書中,所謂「玻璃轉移溫度」係使用示差掃描熱量計測定試樣的DSC(Differential Scanning Calorimetry;示差掃描熱量)曲線並以所獲得之DSC曲線的反曲點溫度表示。 In the present specification, the "glass transition temperature" is a DSC (Differential Scanning Calorimetry) curve of a sample measured by a differential scanning calorimeter and expressed by the inflection point temperature of the obtained DSC curve.

熱硬化劑(h2)中,例如,多官能酚樹脂、酚醛清漆型酚樹脂、二環戊二烯系酚樹脂、芳烷基酚樹脂等樹脂成分的數量平均分子量較佳為300至30000,更佳為400至10000,尤佳為500至3000。 In the thermosetting agent (h2), for example, the resin component such as a polyfunctional phenol resin, a novolac type phenol resin, a dicyclopentadiene phenol resin, or an aralkyl phenol resin preferably has a number average molecular weight of 300 to 30,000, more preferably Good for 400 to 10,000, especially for 500 to 3000.

熱硬化劑(h2)中,例如,聯苯酚、二氰二胺等非樹脂成分的分子量並無特別限定,例如較佳為60至500。 In the heat curing agent (h2), for example, the molecular weight of the non-resin component such as biphenol or dicyandiamide is not particularly limited, and is, for example, preferably 60 to 500.

熱硬化劑(h2)可單獨使用1種,亦可併用2種以上,於併用2種以上之情形時,這些之組合及比率可任意選擇。 The heat-hardening agent (h2) can be used singly or in combination of two or more. When two or more types are used in combination, the combination and ratio can be arbitrarily selected.

於使用熱硬化性成分(h)之情形時,保護膜形成用組 成物(IV-1)及保護膜形成用膜中,熱硬化劑(h2)的含量相對於環氧樹脂(h1)的含量100質量份,較佳為0.01質量份至20質量份。 When the thermosetting component (h) is used, the protective film forming group In the film (IV-1) and the film for forming a protective film, the content of the thermosetting agent (h2) is preferably 0.01 parts by mass to 20 parts by mass based on 100 parts by mass of the epoxy resin (h1).

於使用熱硬化性成分(h)之情形時,保護膜形成用組成物(IV-1)及保護膜形成用膜中,熱硬化性成分(h)的含量(例如,環氧樹脂(h1)及熱硬化劑(h2)的總含量)相對於不具有能量線硬化性基之聚合物(b)的含量100質量份,較佳為1質量份至500質量份。 When the thermosetting component (h) is used, the content of the thermosetting component (h) in the protective film-forming composition (IV-1) and the film for forming a protective film (for example, epoxy resin (h1)) The total content of the thermosetting agent (h2) is preferably from 1 part by mass to 500 parts by mass based on 100 parts by mass of the polymer (b) having no energy ray-curable group.

[通用添加劑(z)] [General Additives (z)]

通用添加劑(z)可為公知的通用添加劑,可根據目的而任意選擇,並無特別限定,作為較佳的通用添加劑,例如可列舉:塑化劑、抗靜電劑、抗氧化劑、吸氣劑等。 The general-purpose additive (z) can be a known general-purpose additive, and can be arbitrarily selected according to the purpose, and is not particularly limited. Examples of preferred general-purpose additives include plasticizers, antistatic agents, antioxidants, getters, and the like. .

保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之通用添加劑(z)可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The protective film forming composition (IV-1) and the protective film forming film may be used alone or in combination of two or more kinds. And the ratio can be arbitrarily chosen.

於使用通用添加劑(z)之情形時,保護膜形成用組成物(IV-1)及保護膜形成用膜中的通用添加劑(z)的含量並無特別限定,根據目的適宜選擇即可。 In the case of using the general-purpose additive (z), the content of the general-purpose additive (z) in the protective film-forming composition (IV-1) and the film for forming a protective film is not particularly limited, and may be appropriately selected according to the purpose.

[溶劑] [solvent]

保護膜形成用組成物(IV-1)較佳為進而含有溶劑。含 有溶劑之保護膜形成用組成物(IV-1)的操作性良好。 The protective film-forming composition (IV-1) preferably further contains a solvent. Contain The composition (IV-1) having a protective film for forming a solvent is excellent in handleability.

前述溶劑並無特別限定,作為較佳的前述溶劑,例如可列舉:甲苯、二甲苯等烴;甲醇、乙醇、2-丙醇、異丁醇(亦稱為2-甲基丙烷-1-醇)、1-丁醇等醇;乙酸乙酯等酯;丙酮、甲基乙基酮等酮;四氫呋喃等醚;二甲基甲醯胺、N-甲基吡咯啶酮等醯胺(具有醯胺鍵之化合物)等。 The solvent is not particularly limited, and examples of preferred solvents include hydrocarbons such as toluene and xylene; methanol, ethanol, 2-propanol and isobutanol (also known as 2-methylpropan-1-ol). An alcohol such as 1-butanol; an ester such as ethyl acetate; a ketone such as acetone or methyl ethyl ketone; an ether such as tetrahydrofuran; an amide such as dimethylformamide or N-methylpyrrolidone (having decylamine) The compound of the bond) and the like.

保護膜形成用組成物(IV-1)所含有之溶劑可僅為1種,亦可為2種以上,於為2種以上之情形時,這些之組合及比率可任意選擇。 The solvent contained in the protective film-forming composition (IV-1) may be one type or two or more types. When two or more types are used, the combination and ratio may be arbitrarily selected.

就可將保護膜形成用組成物(IV-1)中的含有成分更均勻地混合之方面而言,保護膜形成用組成物(IV-1)所含有之溶劑較佳為甲基乙基酮、甲苯或乙酸乙酯等。 The solvent contained in the protective film-forming composition (IV-1) is preferably methyl ethyl ketone, in that the component contained in the protective film-forming composition (IV-1) is more uniformly mixed. , toluene or ethyl acetate.

本發明之一態樣中,保護膜形成用組成物(IV-1)包含:作為能量線硬化性成分(a2)之三環癸烷二羥甲基二丙烯酸酯(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量為37質量%至45質量%,更佳為40質量%至43質量%);作為聚合物(b)之由源自丙烯酸丁酯之結構單元(相對於丙烯酸系樹脂的質量,為8質量%至12質量%,更佳為10質量%)、源自丙烯酸甲酯之結構單元(相對於丙烯酸系樹脂的質量,為68質量%至72質量%,更佳為70質量%)、源自甲基丙烯酸縮水甘油酯之結構單元(相對於丙烯酸系樹脂的質量,為3質量%至7質量%,更佳為5質量%)及源自丙烯酸-2-羥基乙酯之結構單元(相對 於丙烯酸系樹脂的質量,為13質量%至17質量%,更佳為15質量%)構成之丙烯酸系樹脂(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為41質量%至50質量%,更佳為44至47質量%);作為光聚合起始劑(c)之2-(二甲基胺基)-1-(4-嗎啉基苯基)-2-苄基-1-丁酮(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為0.2質量%至1.1質量%,更佳為0.6質量%至0.64質量%)及乙酮,1-[9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基]-,1-(O-乙醯基肟)(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為0.2質量%至1.1質量%,更佳為0.6質量%至0.64質量%);作為填充材料(d)之二氧化矽填料(表面修飾基:環氧基)(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為2.1質量%至13.5質量%,更佳為4.2質量%至10質量%);作為偶合劑(e)之3-甲基丙烯醯氧基丙基三甲氧基矽烷(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為0.4質量%至1.5質量%,更佳為0.8質量%至0.86質量%);以及作為著色劑(g)之包含酞菁系藍色色素、異吲哚啉酮系黃色色素及蒽醌系紅色色素、與苯乙烯丙烯酸樹脂之顏料(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為2.0質量%至6.25質量%,更佳為4.0質量%至4.3質量%)(其中,各成分的含量之和相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量不超過100質量%)。 In one aspect of the invention, the protective film-forming composition (IV-1) comprises tricyclodecane dimethylol diacrylate as the energy ray-curable component (a2) (content: formed with respect to a protective film) The total mass of the solid component in the composition (IV-1) is from 37% by mass to 45% by mass, more preferably from 40% by mass to 43% by mass; and the polymer (b) is derived from butyl acrylate. The structural unit (from 8 mass% to 12 mass%, more preferably 10 mass% based on the mass of the acrylic resin) and the structural unit derived from methyl acrylate (68 mass% based on the mass of the acrylic resin) 72% by mass, more preferably 70% by mass), a structural unit derived from glycidyl methacrylate (from 3% by mass to 7% by mass, more preferably 5% by mass based on the mass of the acrylic resin) Structural unit derived from 2-hydroxyethyl acrylate (relative An acrylic resin (content: relative to the solid content in the protective film forming composition (IV-1)) in an amount of 13% by mass to 17% by mass, more preferably 15% by mass based on the mass of the acrylic resin The total mass is 41% by mass to 50% by mass, more preferably 44 to 47% by mass); 2-(dimethylamino)-1-(4-morpholinyl group as photoinitiator (c) Phenyl)-2-benzyl-1-butanone (content: from 0.2% by mass to 1.1% by mass based on the total mass of the solid content component in the protective film-forming composition (IV-1), more preferably 0.6% by mass to 0.64% by mass) and ethyl ketone, 1-[9-ethyl-6-(2-methylbenzhydryl)-9H-indazol-3-yl]-, 1-(O-B (醯) (content: from 0.2% by mass to 1.1% by mass, more preferably from 0.6% by mass to 0.64% by mass based on the total mass of the solid content component in the protective film forming composition (IV-1); The cerium oxide filler (surface modifying group: epoxy group) as the filler (d) (content: 2.1% by mass based on the total mass of the solid content component in the protective film forming composition (IV-1) 13.5 mass%, more preferably 4.2 mass% to 10 mass%); 3-methylpropenyloxypropyl group as coupling agent (e) Methoxy decane (content: 0.4% by mass to 1.5% by mass, more preferably 0.8% by mass to 0.86% by mass) based on the total mass of the solid content component in the protective film forming composition (IV-1); And a pigment containing a phthalocyanine-based blue dye, an isoindolinone-based yellow dye, an anthraquinone-based red pigment, and a styrene-based acrylic resin as a coloring agent (g) (content: composition for forming a protective film) The total mass of the solid content in IV-1) is from 2.0% by mass to 6.25% by mass, more preferably from 4.0% by mass to 4.3% by mass) (wherein the sum of the contents of the respective components is relative to the composition for forming a protective film) The total mass of the solid content in (IV-1) does not exceed 100% by mass).

<<保護膜形成用組成物的製造方法>> <<Method for Producing Composition for Protective Film Formation>>

保護膜形成用組成物(IV-1)等保護膜形成用組成物係藉由將用以構成該保護膜形成用組成物之各成分加以調配而獲得。 The protective film forming composition such as the protective film-forming composition (IV-1) is obtained by blending the components constituting the protective film-forming composition.

調配各成分時的添加順序並無特別限定,亦可同時添加2種以上之成分。 The order of addition of each component is not particularly limited, and two or more components may be added at the same time.

於使用溶劑之情形時,可藉由下述方式使用,亦即,將溶劑與溶劑以外的任一種調配成分混合而將該調配成分預先稀釋;亦可藉由下述方式使用,亦即,不將溶劑以外的任一種調配成分預先稀釋而將溶劑與這些調配成分混合。 When a solvent is used, it can be used by mixing a solvent with any of the formulation components other than the solvent to preliminarily dilute the formulation component; or by using the following method, that is, not Any of the formulation components other than the solvent is diluted in advance to mix the solvent with these formulation components.

調配時混合各成分之方法並無特別限定,自以下公知的方法中適宜選擇即可:使攪拌子或攪拌翼等旋轉而進行混合之方法;使用混合機進行混合之方法;施加超音波進行混合之方法等。 The method of mixing the components at the time of preparation is not particularly limited, and may be appropriately selected from the following known methods: a method of mixing by stirring a stirring blade or a stirring blade, a method of mixing using a mixer, and applying ultrasonic waves for mixing. Method and so on.

關於添加及混合各成分時的溫度及時間,只要不使各調配成分劣化,則並無特別限定,適宜調節即可,溫度較佳為15℃至30℃。 The temperature and time when the components are added and mixed are not particularly limited as long as the respective components are not deteriorated, and it is preferably adjusted, and the temperature is preferably from 15 ° C to 30 ° C.

與本發明之保護膜形成用複合片同樣地,作為貼附於半導體晶圓或半導體晶片中的與電路面為相反側的背面,且於支持片上具備顯示接著性之層之複合片,有切晶黏晶片。 In the same manner as the composite sheet for forming a protective film of the present invention, a composite sheet which is attached to a semiconductor wafer or a semiconductor wafer on the opposite side to the circuit surface, and which has a layer on the support sheet which exhibits an adhesive layer, is cut. Crystal bonded wafer.

但是,切晶黏晶片所具備之接著劑層發揮以下功能,亦即,與半導體晶片一起自支持片拾取後,將該半導體晶片安裝於基板、引線框架、或其他半導體晶片等時,作為接著劑之功能。另一方面,關於本發明之保護膜形成用複合片中的保護膜形成用膜,就與半導體晶片一起自支持片拾取之方面而言,與前述接著劑層相同,但最終藉由硬化而成為保護膜,具有保護經貼附之半導體晶片的背面之功能。如此,本發明中的保護膜形成用膜的用途與切晶黏晶片中的接著劑層不同,當然所要求之性能亦不同。並且,反映該用途之差異,通常,若與切晶黏晶片中的接著劑層進行比較,則保護膜形成用膜存在較硬且不易拾取之傾向。因此,通常難以將切晶黏晶片中的接著劑層直接轉用作保護膜形成用複合片中的保護膜形成用膜。本發明之保護膜形成用複合片具備能量線硬化性之保護膜形成用膜,關於附有保護膜的半導體晶片的拾取適性,空前之極其優異。 However, the adhesive layer provided in the diced wafer has a function of being attached to a support wafer after being picked up from a support wafer, and then mounting the semiconductor wafer on a substrate, a lead frame, or another semiconductor wafer as an adhesive. The function. On the other hand, the film for forming a protective film in the composite sheet for forming a protective film of the present invention is the same as the above-mentioned adhesive layer in terms of picking up from the support sheet together with the semiconductor wafer, but is finally cured by curing. The protective film has the function of protecting the back side of the attached semiconductor wafer. As described above, the use of the film for forming a protective film in the present invention is different from that of the adhesive layer in the diced bonded wafer, and of course the required performance is also different. Further, in view of the difference in the use, in general, when the adhesive layer is formed in comparison with the adhesive layer in the crystal-cut wafer, the film for forming a protective film tends to be hard and difficult to pick up. Therefore, it is generally difficult to directly convert the adhesive layer in the crystal-cut wafer to the film for forming a protective film in the composite sheet for forming a protective film. The composite sheet for forming a protective film of the present invention is provided with an energy ray-curable film for forming a protective film, and the pick-up property of the semiconductor wafer with the protective film is extremely excellent.

◇保護膜形成用膜以及保護膜形成用複合片的製造方法 ◇Protective film forming film and method for producing protective film forming composite sheet

<保護膜形成用膜的製造方法(1)> <Method for Producing Film for Protective Film Formation (1)>

本發明之保護膜形成用膜的製造方法的第1態樣可藉由下述方式而製造,亦即,於剝離膜(有時稱為第2剝離膜)上塗敷保護膜形成用組成物,視需要使之乾燥而形成保護膜形成用膜,於前述保護膜形成用膜的露出面(亦 即,表面(β))貼合至少一表面的表面粗糙度(Ra)為0.03μm至2.0μm之第1剝離膜的具有前述表面粗糙度之表面。 The first aspect of the method for producing a film for forming a protective film of the present invention can be produced by coating a protective film forming composition on a release film (sometimes referred to as a second release film). The film for forming a protective film is formed by drying it as needed, and the exposed surface of the film for forming a protective film is also That is, the surface (β) is bonded to the surface of the first release film having a surface roughness (Ra) of at least one surface of 0.03 μm to 2.0 μm having the surface roughness.

該情形時,前述第1剝離膜的表面的表面粗糙度(Ra)較佳為0.03μm至1.8μm。 In this case, the surface roughness (Ra) of the surface of the first release film is preferably from 0.03 μm to 1.8 μm.

本說明書中,有時將具備剝離膜之保護膜形成用膜稱為「保護膜形成用片」。 In the present specification, a film for forming a protective film having a release film may be referred to as a "sheet for forming a protective film".

<保護膜形成用膜的製造方法(2)> <Method for Producing Film for Protective Film Formation (2)>

本發明之保護膜形成用膜的製造方法的第2態樣可藉由下述方式而製造,亦即,於至少一表面的表面粗糙度(Ra)為0.03μm至2.0μm之剝離膜(有時稱為第1剝離膜)的具有前述表面粗糙度之表面上,塗敷保護膜形成用組成物,視需要使之乾燥。該情形時,前述第1剝離膜的表面的表面粗糙度(Ra)較佳為0.03μm至1.8μm。另外,關於本發明之保護膜形成用膜,亦可於以上述方式製造之保護膜形成用膜中,於與貼附有前述第1剝離膜之表面為相反側的表面(亦即,表面(α))貼附另一剝離膜(有時稱為第2剝離膜)。 The second aspect of the method for producing a film for forming a protective film of the present invention can be produced by, for example, a release film having a surface roughness (Ra) of at least one surface of from 0.03 μm to 2.0 μm. The surface having the surface roughness described above, which is referred to as a first release film, is coated with a composition for forming a protective film, and is dried as necessary. In this case, the surface roughness (Ra) of the surface of the first release film is preferably from 0.03 μm to 1.8 μm. In addition, the film for forming a protective film of the present invention may be a surface opposite to the surface on which the first release film is attached (that is, the surface (of the surface). α)) Another peeling film (sometimes referred to as a second peeling film) is attached.

本說明書中,有時將具備剝離膜之保護膜形成用膜稱為「保護膜形成用片」。 In the present specification, a film for forming a protective film having a release film may be referred to as a "sheet for forming a protective film".

本發明之一態樣中,保護膜形成用膜包含:作為能量線硬化性成分(a2)之三環癸烷二羥甲基二丙烯酸酯(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為37質量%至45質量%,更佳為40質量%至43質量%);作為聚合物(b)之由源自丙烯酸丁酯之結構單 元(相對於丙烯酸系樹脂的質量,為8質量%至12質量%,更佳為10質量%)、源自丙烯酸甲酯之結構單元(相對於丙烯酸系樹脂的質量,為68質量%至72質量%,更佳為70質量%)、源自甲基丙烯酸縮水甘油酯之結構單元(相對於丙烯酸系樹脂的質量,為3質量%至7質量%,更佳為5質量%)及源自丙烯酸-2-羥基乙酯之結構單元(相對於丙烯酸系樹脂的質量,為13質量%至17質量%,更佳為15質量%)構成之丙烯酸系樹脂(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為41質量%至50質量%,更佳為44至47質量%);作為光聚合起始劑(c)之2-(二甲基胺基)-1-(4-嗎啉基苯基)-2-苄基-1-丁酮(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為0.2質量%至1.1質量%,更佳為0.6質量%至0.64質量%)及乙酮,1-[9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基]-,1-(O-乙醯基肟)(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為0.2質量%至1.1質量%,更佳為0.6質量%至0.64質量%);作為填充材料(d)之二氧化矽填料(表面修飾基:環氧基)(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為2.1質量%至13.5質量%,更佳為4.2質量%至10質量%);作為偶合劑(e)之3-甲基丙烯醯氧基丙基三甲氧基矽烷(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為0.4質量%至1.5質量%,更佳為0.8質量%至0.86質量%);以及作為著色劑(g)之包含酞菁系藍色色 素、異吲哚啉酮系黃色色素及蒽醌系紅色色素、苯乙烯丙烯酸樹脂之顏料(含量:相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量,為2.0質量%至6.25質量%,更佳為4.0質量%至4.3質量%)(其中,各成分的含量之和相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量不超過100質量%)。 In one aspect of the invention, the film for forming a protective film contains tricyclodecane dimethylol diacrylate as the energy ray-curable component (a2) (content: composition for forming a protective film (IV- The total mass of the solid content in 1) is from 37% by mass to 45% by mass, more preferably from 40% by mass to 43% by mass; as the structure of the polymer (b) derived from butyl acrylate A structural unit derived from methyl acrylate (compared to the mass of the acrylic resin) of 68% by mass to 72% by mass based on the mass of the acrylic resin, more preferably 10% by mass, more preferably 10% by mass. (% by mass, more preferably 70% by mass), a structural unit derived from glycidyl methacrylate (from 3% by mass to 7% by mass, more preferably 5% by mass based on the mass of the acrylic resin) and derived from Acrylic resin composed of a structural unit of 2-hydroxyethyl acrylate (13% by mass to 17% by mass, more preferably 15% by mass based on the mass of the acrylic resin) (content: composition for forming a protective film) The total mass of the solid component in the substance (IV-1) is 41% by mass to 50% by mass, more preferably 44 to 47% by mass); 2-(dimethyl group) as the photopolymerization initiator (c) Amino)-1-(4-morpholinylphenyl)-2-benzyl-1-butanone (content: relative to the total mass of the solid component in the composition for forming a protective film (IV-1), It is 0.2% by mass to 1.1% by mass, more preferably 0.6% by mass to 0.64% by mass) and ethyl ketone, 1-[9-ethyl-6-(2-methylbenzylidene)-9H-carbazole- 3-yl]-, 1-(O-ethylindenyl) (content: relative to insurance The total mass of the solid content component in the film-forming composition (IV-1) is from 0.2% by mass to 1.1% by mass, more preferably from 0.6% by mass to 0.64% by mass); as the filler (d), cerium oxide Filler (surface modifying group: epoxy group) (content: 2.1% by mass to 13.5% by mass, more preferably 4.2% by mass based on the total mass of the solid content component in the protective film forming composition (IV-1) To 10% by mass); 3-methylpropenyloxypropyltrimethoxydecane as a coupling agent (e) (content: total amount of solid components in the composition (IV-1) for protective film formation) The mass is 0.4% by mass to 1.5% by mass, more preferably 0.8% by mass to 0.86% by mass); and the coloring agent (g) contains phthalocyanine blue color Pigment of the pigment, the isomeric ketone ketone yellow pigment, the lanthanide red pigment, and the styrene acrylic resin (content: the total mass of the solid component in the protective film forming composition (IV-1) is 2.0 The mass% to 6.25 mass%, more preferably 4.0 mass% to 4.3 mass%) (wherein the sum of the contents of the respective components does not exceed the total mass of the solid component in the protective film forming composition (IV-1) 100% by mass).

<保護膜形成用複合片的製造方法(1)> <Method for Producing Composite Sheet for Forming Protective Film (1)>

以下說明本發明之保護膜形成用複合片的製造方法的第1態樣。 The first aspect of the method for producing a composite sheet for forming a protective film of the present invention will be described below.

於至少一表面的表面粗糙度(Ra)為0.03μm至2.0μm之剝離膜(有時稱為第1剝離膜)的具有前述表面粗糙度之表面上,塗敷保護膜形成用組成物,視需要使之乾燥,藉此形成保護膜形成用膜,於前述保護膜形成用膜的露出面貼合第2剝離膜。 Applying a protective film forming composition to a surface having the surface roughness of a release film (sometimes referred to as a first release film) having a surface roughness (Ra) of at least one surface of 0.03 μm to 2.0 μm It is necessary to dry the film to form a film for forming a protective film, and the second release film is bonded to the exposed surface of the film for forming a protective film.

可藉由將剝離了前述第1剝離膜之保護膜形成用膜的露出面(亦即,表面(β))貼合於作為支持片之基材的表面而製造。前述基材的表面的表面粗糙度(Ra)並無特別限定,較佳為貼合於前述表面粗糙度(Ra)例如未達0.12μm,更佳為未達0.03μm,進而較佳為0.020μm至0.025μm之平滑面。 The exposed surface (that is, the surface (β)) of the film for forming a protective film from which the first release film is peeled off can be produced by bonding the surface of the substrate as the support sheet. The surface roughness (Ra) of the surface of the substrate is not particularly limited, and it is preferable that the surface roughness (Ra) is, for example, less than 0.12 μm, more preferably less than 0.03 μm, still more preferably 0.020 μm. Smooth surface to 0.025 μm.

<保護膜形成用複合片的製造方法(2)> <Method for Producing Composite Sheet for Forming Protective Film (2)>

以下說明本發明之保護膜形成用複合片的製造方法的第2態樣。 Next, a second aspect of the method for producing a composite sheet for forming a protective film of the present invention will be described.

於第2剝離膜上塗敷保護膜形成用組成物,視需要使 之乾燥而形成保護膜形成用膜,於前述保護膜形成用膜的露出面貼合至少一表面的表面粗糙度(Ra)為0.03μm至2.0μm之第1剝離膜的具有前述表面粗糙度之表面。 Applying a protective film forming composition to the second release film, if necessary The first release film having a surface roughness (Ra) of at least one surface having a surface roughness (Ra) of 0.03 μm to 2.0 μm is bonded to the exposed surface of the film for forming a protective film to have the surface roughness. surface.

可藉由將剝離了前述第1剝離膜之保護膜形成用膜的露出面(亦即,表面(β))貼合於作為支持片之基材的表面而製造。前述基材的表面的表面粗糙度(Ra)並無特別限定,較佳為貼合於前述表面粗糙度(Ra)例如未達0.12μm,更佳為未達0.03μm,進而較佳為0.020μm至0.025μm之平滑面。 The exposed surface (that is, the surface (β)) of the film for forming a protective film from which the first release film is peeled off can be produced by bonding the surface of the substrate as the support sheet. The surface roughness (Ra) of the surface of the substrate is not particularly limited, and it is preferable that the surface roughness (Ra) is, for example, less than 0.12 μm, more preferably less than 0.03 μm, still more preferably 0.020 μm. Smooth surface to 0.025 μm.

<保護膜形成用複合片的製造方法(3)> <Method for Producing Composite Sheet for Forming Protective Film (3)>

以下說明本發明之保護膜形成用複合片的製造方法的第3態樣。 Next, a third aspect of the method for producing a composite sheet for forming a protective film of the present invention will be described.

於剝離膜上塗敷保護膜形成用組成物,視需要使之乾燥而形成保護膜形成用膜。 A film for forming a protective film is applied onto the release film, and if necessary, dried to form a film for forming a protective film.

可藉由將前述保護膜形成用膜的露出面(亦即,表面(β))貼合於具有至少一表面的表面粗糙度(Ra)為0.03μm至2.0μm,更佳為0.05μm至1.8μm,進而較佳為0.05μm至1.3μm之表面粗糙度(Ra)之基材的前述表面粗糙度(Ra)的表面而製造。 The surface roughness (Ra) having at least one surface to be bonded to the exposed surface of the film for forming a protective film (that is, the surface (β)) may be from 0.03 μm to 2.0 μm, more preferably from 0.05 μm to 1.8. The surface of the surface roughness (Ra) of the substrate having a surface roughness (Ra) of preferably 0.05 μm to 1.3 μm is preferably produced in the range of μm.

本發明之保護膜形成用複合片亦可藉由將上述各層以成為對應的位置關係之方式依序積層而製造。各層之形成方法如前文所說明。 The composite sheet for forming a protective film of the present invention can also be produced by sequentially laminating the above layers in a corresponding positional relationship. The formation method of each layer is as described above.

於形成連續之2層之積層結構之情形時,可於由第1 組成物形成之層上,進而塗敷第2組成物而新形成層。但是,較佳為藉由下述方式而形成連續之2層之積層結構,亦即,於另一剝離膜上,使用前述第2組成物,預先形成這些2層中後積層之層,將該已形成之層中的與和前述剝離膜接觸之側為相反側的露出面,與既已形成之其餘層的露出面貼合。此時,前述第2組成物較佳為塗敷於剝離膜的剝離處理面。形成積層結構後,視需要移除剝離膜即可。 In the case of forming a continuous two-layer laminated structure, it can be used by the first On the layer on which the composition is formed, a second composition is further applied to form a layer. However, it is preferable to form a continuous two-layer laminated structure by using the second composition on the other release film, and to form the two layers of the back layer in advance. The exposed surface on the opposite side to the side in contact with the release film in the formed layer is bonded to the exposed surface of the remaining layer formed. In this case, the second composition is preferably applied to the release-treated surface of the release film. After forming the laminate structure, the release film may be removed as needed.

於形成目標積層結構後的任意時間點移除剝離膜即可。 The release film can be removed at any point after the formation of the target laminate structure.

如此,構成保護膜形成用複合片之基材以外的層均可利用以下方法積層,亦即,預先形成於剝離膜上,再貼合於目標層的表面,因此視需要適宜選擇採用此種步驟之層,製造保護膜形成用複合片即可。 In this manner, the layer other than the base material constituting the composite sheet for forming a protective film can be laminated by being formed in advance on the release film and then bonded to the surface of the target layer. Therefore, such a step is appropriately selected as needed. In the layer, a composite sheet for forming a protective film can be produced.

再者,保護膜形成用複合片通常以如下狀態保管,亦即,於該保護膜形成用複合片中的與支持片為相反側的最表層(例如,保護膜形成用膜)的表面貼合有剝離膜之狀態。因此,亦可藉由下述方式而獲得保護膜形成用複合片,亦即,於該剝離膜(較佳為該剝離膜的剝離處理面)上,塗敷保護膜形成用組成物等用以形成構成最表層之層之組成物,視需要使之乾燥,藉此於剝離膜上預先形成構成最表層之層,於該層中的與和剝離膜接觸之側為相反側的露出面上,利用上述任一種方法積層其餘各層(例如, 作為支持片之基材),不移除剝離膜而保持貼合狀態不變。 In addition, the composite sheet for forming a protective film is usually stored in the following state, that is, the surface of the outermost layer (for example, a film for forming a protective film) on the opposite side of the support sheet in the composite sheet for forming a protective film. There is a state of peeling film. Therefore, a composite sheet for forming a protective film can be obtained by applying a protective film forming composition or the like to the release film (preferably, a release-treated surface of the release film). The composition constituting the layer constituting the outermost layer is formed, and if necessary, dried, whereby a layer constituting the outermost layer is formed in advance on the release film, and an exposed surface on the opposite side to the side in contact with the release film in the layer is formed. Stacking the remaining layers using any of the above methods (for example, As the substrate of the support sheet, the release film was not removed and the bonding state was maintained.

◇保護膜形成用膜以及保護膜形成用複合片的使用方法 Method for using ruthenium film for protective film formation and composite sheet for forming protective film

本發明之保護膜形成用膜或保護膜形成用片例如可利用以下所示之方法使用。 The film for forming a protective film or the sheet for forming a protective film of the present invention can be used, for example, by the method described below.

亦即,將保護膜形成用片中的與具有第1剝離膜之面為相反側的表面(α)藉由該保護膜形成用片之保護膜形成用膜貼附於半導體晶圓的背面(與電極形成面為相反側的面)。繼而,對保護膜形成用膜照射能量線,使保護膜形成用膜硬化而成為保護膜。繼而,剝離第1剝離膜,將前述保護膜的露出面(表面(β))貼附於支持片,藉由切割,將半導體晶圓連同保護膜一起分割而製成半導體晶片。然後,將半導體晶片,保持貼附有該保護膜之狀態(亦即,以附有保護膜的半導體晶片之形式),自支持片拉離而進行拾取。本說明書中,前述支持片較佳為僅由基材構成之支持片。此處,作為支持片,可應用本發明之保護膜形成用複合片中所使用之支持片。 In other words, the protective film forming film of the protective film forming sheet is attached to the back surface of the semiconductor wafer by the surface (α) on the side opposite to the surface having the first release film in the protective film forming sheet. a surface opposite to the electrode forming surface). Then, the film for forming a protective film is irradiated with an energy ray, and the film for forming a protective film is cured to form a protective film. Then, the first release film is peeled off, and the exposed surface (surface (β)) of the protective film is attached to the support sheet, and the semiconductor wafer is divided together with the protective film by dicing to form a semiconductor wafer. Then, the semiconductor wafer is held in a state in which the protective film is attached (that is, in the form of a semiconductor wafer with a protective film attached thereto), and is pulled out from the support sheet to be picked up. In the present specification, the support sheet is preferably a support sheet composed only of a base material. Here, as the support sheet, the support sheet used in the composite sheet for forming a protective film of the present invention can be applied.

以下,利用與先前法相同的方法,將所獲得之附有保護膜的半導體晶片的半導體晶片倒裝晶片連接於基板的電路面後,製成半導體封裝。然後,使用該半導體封裝,製作目標半導體裝置即可。 Hereinafter, the semiconductor wafer of the obtained semiconductor wafer with the protective film obtained is flip-chip bonded to the circuit surface of the substrate by the same method as the prior art, and then a semiconductor package is produced. Then, the target semiconductor device can be fabricated using the semiconductor package.

本發明之保護膜形成用複合片例如可利用以下所示之方法使用。 The composite sheet for forming a protective film of the present invention can be used, for example, by the method shown below.

亦即,將保護膜形成用複合片藉由該保護膜形成用複合片之保護膜形成用膜貼附於半導體晶圓的背面(與電極形成面為相反側的面)。繼而,對保護膜形成用膜照射能量線,使保護膜形成用膜硬化而成為保護膜。繼而,藉由切割,將半導體晶圓連同保護膜一起分割而製成半導體晶片。然後,將半導體晶片,保持貼附有該保護膜之狀態(亦即,以附有保護膜的半導體晶片之形式),自支持片拉離而進行拾取。 In other words, the composite film for forming a protective film is attached to the back surface of the semiconductor wafer (the surface opposite to the electrode forming surface) by the protective film forming film of the protective film forming composite sheet. Then, the film for forming a protective film is irradiated with an energy ray, and the film for forming a protective film is cured to form a protective film. Then, by cutting, the semiconductor wafer is divided together with the protective film to form a semiconductor wafer. Then, the semiconductor wafer is held in a state in which the protective film is attached (that is, in the form of a semiconductor wafer with a protective film attached thereto), and is pulled out from the support sheet to be picked up.

以下,利用與先前法相同的方法,將所獲得之附有保護膜的半導體晶片的半導體晶片倒裝晶片連接於基板的電路面後,藉由樹脂將整體密封,藉此製成半導體封裝。然後,使用該半導體封裝,製作目標半導體裝置即可。 Hereinafter, the semiconductor wafer of the obtained semiconductor wafer with the protective film obtained is flip-chip bonded to the circuit surface of the substrate by the same method as the prior art, and then the entire surface is sealed by a resin to form a semiconductor package. Then, the target semiconductor device can be fabricated using the semiconductor package.

再者,本文中對使保護膜形成用膜硬化而成為保護膜後進行切割之情形進行了說明,但於使用本發明之保護膜形成用複合片之情形時,進行這些步驟之順序亦可相反。亦即,於半導體晶圓的背面貼附保護膜形成用複合片後,藉由切割,將半導體晶圓連同保護膜形成用膜一起分割而製成半導體晶片。繼而,對已分割之保護膜形成用膜照射能量線,使保護膜形成用膜硬化而成為保護膜。以下,與上述同樣地,將附有保護膜的半導體晶片自支持片拉離而進行拾取,製作目標半導體裝置即可。 In the case where the film for forming a protective film is cured to form a protective film and then diced, the case of performing these steps may be reversed when the composite sheet for forming a protective film of the present invention is used. . In other words, after the composite sheet for forming a protective film is attached to the back surface of the semiconductor wafer, the semiconductor wafer is divided together with the film for forming a protective film by dicing to form a semiconductor wafer. Then, the film for forming a protective film to be divided is irradiated with an energy ray to cure the film for forming a protective film to form a protective film. In the same manner as described above, the semiconductor wafer with the protective film is pulled away from the support sheet and picked up to produce a target semiconductor device.

[實施例] [Examples]

以下,藉由具體的實施例對本發明進行更詳細的說明。但是,本發明並不受以下所示之實施例之任何限定。 Hereinafter, the present invention will be described in more detail by way of specific examples. However, the present invention is not limited by the examples shown below.

以下表示用於製造保護膜形成用組成物之成分。 The components for producing a composition for forming a protective film are shown below.

‧能量線硬化性成分 ‧ energy line hardening ingredients

(a2)-1:三環癸烷二羥甲基二丙烯酸酯(日本化藥公司製造之「KAYARAD R-684」,2官能紫外線硬化性化合物,分子量304)。 (a2)-1: tricyclodecane dimethylol diacrylate ("KAYARAD R-684" manufactured by Nippon Kayaku Co., Ltd., bifunctional ultraviolet curable compound, molecular weight 304).

‧不具有能量線硬化性基之聚合物 ‧ polymer without energy line hardening

(b)-1:使丙烯酸丁酯(以下,簡稱為「BA」)(10質量份)、丙烯酸甲酯(以下,簡稱為「MA」)(70質量份)、甲基丙烯酸縮水甘油酯(以下,簡稱為「GMA」)(5質量份)及丙烯酸-2-羥基乙酯(以下,簡稱為「HEA」)(15質量份)進行共聚合而成之丙烯酸系樹脂(重量平均分子量300000,玻璃轉移溫度-1℃)。 (b)-1: butyl acrylate (hereinafter abbreviated as "BA") (10 parts by mass), methyl acrylate (hereinafter abbreviated as "MA") (70 parts by mass), and glycidyl methacrylate ( Hereinafter, an acrylic resin (weight average molecular weight: 300,000, which is simply referred to as "GMA") (5 parts by mass) and 2-hydroxyethyl acrylate (hereinafter abbreviated as "HEA") (15 parts by mass) is copolymerized. Glass transfer temperature -1 ° C).

‧光聚合起始劑 ‧Photopolymerization initiator

(c)-1:2-(二甲基胺基)-1-(4-嗎啉基苯基)-2-苄基-1-丁酮(BASF公司製造之「Irgacure(註冊商標)369」)。 (c)-1: 2-(Dimethylamino)-1-(4-morpholinylphenyl)-2-benzyl-1-butanone (Irgacure (registered trademark) 369, manufactured by BASF Corporation) ).

(c)-2:乙酮,1-[9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基]-,1-(O-乙醯基肟)(BASF公司製造之「Irgacure(註冊商標)OXE02」)。 (c)-2: Ethylketone, 1-[9-ethyl-6-(2-methylbenzhydryl)-9H-indazol-3-yl]-, 1-(O-ethylindenyl) (Irgacure (registered trademark) OXE02" manufactured by BASF Corporation).

‧填充材料 ‧Filler

(d)-1:二氧化矽填料(表面修飾基:環氧基)(平均粒徑0.1μm)。 (d)-1: cerium oxide filler (surface modifying group: epoxy group) (average particle diameter: 0.1 μm).

(d)-2:二氧化矽填料(表面修飾基:環氧基)(平均粒徑0.05μm)。 (d)-2: cerium oxide filler (surface modifying group: epoxy group) (average particle diameter: 0.05 μm).

‧偶合劑 ‧ coupling agent

(e)-1:3-甲基丙烯醯氧基丙基三甲氧基矽烷(信越化學工業公司製造之「KBM-503」,矽烷偶合劑)。 (e)-1: 3-methacryloxypropyltrimethoxydecane ("KBM-503" manufactured by Shin-Etsu Chemical Co., Ltd., decane coupling agent).

‧著色劑 ‧Colorant

(g)-1:將酞菁系藍色色素(Pigment Blue 15:3)32質量份、異吲哚啉酮系黃色色素(Pigment Yellow 139)18質量份、及蒽醌系紅色色素(Pigment Red 177)50質量份進行混合,以前述3種色素的合計量/苯乙烯丙烯酸樹脂量=1/3(質量比)之方式進行顏料化而獲得之顏料。 (g)-1: 32 parts by mass of a phthalocyanine-based blue pigment (Pigment Blue 15:3), 18 parts by mass of an isoindolinone-based yellow pigment (Pigment Yellow 139), and a lanthanide red pigment (Pigment Red) 177) A pigment obtained by pigmenting at a mass ratio of 50 mass parts of the above three types of dyes/the amount of styrene acrylic resin = 1/3 (mass ratio).

[實施例1] [Example 1]

<保護膜形成用複合片之製造> <Manufacture of composite sheet for forming a protective film>

(保護膜形成用組成物(IV-1)之製造) (Manufacture of protective film forming composition (IV-1))

使能量線硬化性成分(a2)-1(20質量份)、聚合物(b)-1(22質量份)、光聚合起始劑(c)-1(0.3質量份)、光聚合起始劑(c)-2(0.3質量份)、填充材料(d)-1(2質量份,亦即,相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量為4.3質量%)、偶合劑(e)-1(0.4質量份)及著色劑(g)-1(2質量份)溶解或分散於甲基乙基酮中,於23℃下進行攪拌,藉此製備固形物成分濃度為50質量%之保護膜形成用組成物(IV-1)。 Energy ray curable component (a2)-1 (20 parts by mass), polymer (b)-1 (22 parts by mass), photopolymerization initiator (c)-1 (0.3 parts by mass), photopolymerization initiation The agent (c)-2 (0.3 parts by mass) and the filler (d)-1 (2 parts by mass, that is, the total mass of the solid component in the protective film-forming composition (IV-1) is 4.3. (% by mass), coupling agent (e)-1 (0.4 parts by mass), and coloring agent (g)-1 (2 parts by mass) were dissolved or dispersed in methyl ethyl ketone, and stirred at 23 ° C to prepare The composition for forming a protective film (IV-1) having a solid content concentration of 50% by mass.

(保護膜形成用複合片之製造) (Manufacture of composite sheet for forming a protective film)

於聚對苯二甲酸乙二酯製膜的單面經聚矽氧處理進行剝離處理之剝離膜(Lintec公司製造之「SP-PET381031」,厚度38μm)的前述剝離處理面,藉由刀式塗佈機塗敷上述所獲得之保護膜形成用組成物(IV-1),於100℃下乾燥2分鐘,藉此製作厚度25μm之能量線硬化性之保護膜形成用膜(13)-1。 The release-treated surface of the release film ("SP-PET381031" manufactured by Lintec Co., Ltd., thickness: 38 μm) which was subjected to a release treatment on a single side of a polyethylene terephthalate film by a polyphthalic acid treatment, was coated by a knife The protective film-forming composition (IV-1) obtained above was applied to a cloth machine and dried at 100 ° C for 2 minutes to prepare a film (13)-1 for protective film formation having an energy ray curability of 25 μm.

繼而,於表面粗糙度(Ra)為1.3μm之聚丙烯系膜(厚度80μm)之基材亦即支持片(10)-1的具有前述表面粗糙度(Ra)之面,貼合上述所獲得之保護膜形成用膜(13)-1的露出面,製作基材、保護膜形成用膜(13)-1及剝離膜於這些的厚度方向上依序積層而成之保護膜形成用複合片。 Then, the substrate having a polypropylene film (thickness: 80 μm) having a surface roughness (Ra) of 1.3 μm, that is, the surface of the support sheet (10)-1 having the surface roughness (Ra), was obtained by laminating the above. The exposed surface of the film (13)-1 for forming a protective film, and a composite film for forming a protective film formed by sequentially forming a substrate, a film for forming a protective film (13)-1, and a release film in the thickness direction thereof. .

[實施例2] [Embodiment 2]

<保護膜形成用複合片之製造> <Manufacture of composite sheet for forming a protective film>

將實施例1中所使用之表面粗糙度(Ra)為1.3μm之聚丙烯系膜(厚度80μm)之基材亦即支持片(10)-1,替換為表面粗糙度(Ra)為0.05μm之聚丙烯系膜(厚度80μm)之基材亦即支持片(10)-2,此外,以與實施例1相同之方式製作保護膜形成用膜(13)-1、及保護膜形成用片。 The support sheet (10)-1, which is a base material of a polypropylene film (thickness: 80 μm) having a surface roughness (Ra) of 1.3 μm used in Example 1, was replaced by a surface roughness (Ra) of 0.05 μm. The support sheet (10)-2, which is a base material of a polypropylene film (thickness: 80 μm), was formed into a film (13)-1 for forming a protective film and a sheet for forming a protective film in the same manner as in Example 1. .

[實施例3] [Example 3]

<保護膜形成用複合片之製造> <Manufacture of composite sheet for forming a protective film>

將實施例1中所使用之保護膜形成用組成物(IV-1)中的填充材料(d)-1(2質量份,亦即,相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量為4.3質量%),替換為填充材料(d)-2(5質量份,亦即,相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量為10質量%),此外,以與實施例1相同之方式製作保護膜形成用膜(13)-2、及保護膜形成用片。 The filler (d)-1 (2 parts by mass, that is, with respect to the protective film forming composition (IV-1) in the composition for forming a protective film (IV-1) used in Example 1 The total mass of the solid component is 4.3% by mass), and is replaced by the filler (d)-2 (5 parts by mass, that is, the total amount of the solid component in the protective film forming composition (IV-1). A film (13)-2 for forming a protective film and a sheet for forming a protective film were produced in the same manner as in Example 1 except that the mass was 10% by mass.

[實施例4] [Example 4]

<保護膜形成用片之製造> <Manufacture of Sheet for Forming Protective Film>

於表面粗糙度(Ra)為1.8μm之聚對苯二甲酸乙二酯製膜(厚度80μm)亦即第1剝離膜的具有前述表面粗糙度(Ra)之表面,藉由刀式塗佈機塗敷實施例1中所使用之保護膜形成用組成物(IV-1),於100℃下乾燥2分鐘,藉此製作厚度25μm之能量線硬化性之保護膜形成用膜(13)-1。 A film made of polyethylene terephthalate having a surface roughness (Ra) of 1.8 μm (thickness: 80 μm), that is, a surface having the surface roughness (Ra) of the first release film, by a knife coater The protective film-forming composition (IV-1) used in Example 1 was applied and dried at 100 ° C for 2 minutes to prepare an energy ray-curable protective film forming film (13)-1 having a thickness of 25 μm. .

繼而,於聚對苯二甲酸乙二酯製膜的單面經聚矽氧處理進行剝離處理之第2剝離膜(Lintec公司製造之「SP-PET381031」,厚度38μm)的前述剝離處理面,貼合上述所獲得之保護膜形成用膜(13)-1的露出面,製作第1剝離膜、保護膜形成用膜(13)-1及第2剝離膜於這些的厚度方向上依序積層而成之保護膜形成用片。 Then, the peeling treatment surface of the second release film ("SP-PET381031" manufactured by Lintec Co., Ltd., thickness: 38 μm) which was subjected to the release treatment on the one side of the polyethylene terephthalate film by the polyoxyethylene treatment was attached. In the exposed surface of the film for protective film formation (13)-1 obtained above, the first release film, the film for protective film formation (13)-1, and the second release film are laminated in this thickness direction. A sheet for forming a protective film.

[比較例1] [Comparative Example 1]

<保護膜形成用複合片之製造> <Manufacture of composite sheet for forming a protective film>

將實施例1中所使用之表面粗糙度(Ra)為1.3μm之聚丙烯系膜(厚度80μm)之基材亦即支持片(10)-1,替換為表面粗糙度(Ra)為0.025μm之聚丙烯系膜(厚度80μm)之基材亦即支持片(10)-3,此外,以與實施例1相同之方式製作保護膜形成用膜(13)-1、及保護膜形成用片。 The support sheet (10)-1, which is a substrate of a polypropylene film (thickness: 80 μm) having a surface roughness (Ra) of 1.3 μm used in Example 1, was replaced by a surface roughness (Ra) of 0.025 μm. The support sheet (10)-3, which is a base material of a polypropylene film (thickness: 80 μm), was formed into a film (13)-1 for forming a protective film and a sheet for forming a protective film in the same manner as in Example 1. .

[比較例2] [Comparative Example 2]

<保護膜形成用複合片之製造> <Manufacture of composite sheet for forming a protective film>

將實施例1中所使用之表面粗糙度(Ra)為1.3μm之聚丙烯系膜(厚度80μm)之基材亦即支持片(10)-1,替換為表面粗糙度(Ra)為0.020μm之聚丙烯系膜(厚度80μm)之基材亦即支持片(10)-4,此外,以與實施例1相同之方式製作保護膜形成用膜(13)-1、及保護膜形成用片。 The support sheet (10)-1, which is a base material of a polypropylene film (thickness: 80 μm) having a surface roughness (Ra) of 1.3 μm used in Example 1, was replaced by a surface roughness (Ra) of 0.020 μm. The support sheet (10)-4, which is a base material of a polypropylene film (thickness: 80 μm), was formed into a film (13)-1 for forming a protective film and a sheet for forming a protective film in the same manner as in Example 1. .

[比較例3] [Comparative Example 3]

<保護膜形成用複合片之製造> <Manufacture of composite sheet for forming a protective film>

將實施例1中所使用之保護膜形成用組成物(IV-1)之填充材料(d)-1(2質量份,亦即,相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量為4.3質量%),替換為填充材料(d)-2(5質量份,亦即,相對於保護膜形成用組成物(IV-1)中的固形物成分的總質量為10質量%),另外,將實施例1中所使用之表面粗糙度(Ra)為1.3μm之聚丙烯系膜(厚度80μm)之基材亦即支持片(10)-1,替換為表面粗糙度(Ra)為0.025μm之聚丙烯系膜(厚度80μm)之基材亦即支持片(10)-3,此外,以與實施例1相同之方式製 作保護膜形成用膜(13)-2、及保護膜形成用片。 The filler (d)-1 (2 parts by mass, that is, in the composition for forming a protective film (IV-1), the composition for forming a protective film (IV-1) used in Example 1 The total mass of the solid content is 4.3% by mass), and is replaced by the filler (d)-2 (5 parts by mass, that is, the total mass of the solid component in the protective film forming composition (IV-1). In addition, the support sheet (10)-1, which is a substrate of a polypropylene film (thickness: 80 μm) having a surface roughness (Ra) of 1.3 μm used in Example 1, was replaced with a surface. A support sheet (10)-3 which is a base material of a polypropylene film (thickness: 80 μm) having a roughness (Ra) of 0.025 μm is produced in the same manner as in the first embodiment. The film for protective film formation (13)-2 and the sheet for forming a protective film.

<保護膜形成用片及保護膜形成用複合片之評價> <Evaluation of Sheet for Forming Protective Film and Composite Sheet for Forming Protective Film>

(表面粗糙度(Ra)之測定) (Measurement of surface roughness (Ra))

使用光干涉式表面形狀測定裝置(Veeco Metrology Group公司製造,製品名「WYKO WT1100」),以PSI(Phase Shift Interferometry;相移干涉)模式於倍率10倍下,對測定對象的表面的表面粗糙度(Ra)進行測定。 Using the optical interference type surface shape measuring device (manufactured by Veeco Metrology Group, product name "WYKO WT1100"), the surface roughness of the surface to be measured was measured at a magnification of 10 times in a PSI (Phase Shift Interferometry) mode at a magnification of 10 times. (Ra) was measured.

針對實施例1至實施例3、及比較例1至比較例3之保護膜形成用複合片,將貼合於作為支持片之基材之保護膜形成用膜的表面設為表面(β),使保護膜形成用膜硬化而成為保護膜後,自支持片之基材剝離保護膜,測定前述保護膜的前述表面(β)的表面粗糙度(Ra)。另外,對於作為支持片之基材的表面粗糙度(Ra),於貼合保護膜形成用膜之前進行測定。 In the composite sheet for forming a protective film of the first embodiment to the third embodiment and the comparative example 1 to the comparative example 3, the surface of the film for forming a protective film to be bonded to the substrate of the support sheet is referred to as a surface (β). After the film for forming a protective film is cured to form a protective film, the protective film is peeled off from the substrate of the support sheet, and the surface roughness (Ra) of the surface (β) of the protective film is measured. Moreover, the surface roughness (Ra) of the base material as a support sheet was measured before bonding the film for protective film formation.

結果示於表1。 The results are shown in Table 1.

(拾取時之矽晶片之破裂、缺損之抑制) (Suppression of chip breakage and defect after picking up)

(1)將實施例1至實施例3、及比較例1至比較例3中所獲得之保護膜形成用複合片,藉由該保護膜形成用複合片之保護膜形成用膜的露出面(亦即表面(α)),貼附於8吋矽晶圓(厚度100μm)之#2000研磨面,進而將該片固定於環狀框,靜置30分鐘。 (1) The composite sheet for forming a protective film obtained in Examples 1 to 3 and Comparative Examples 1 to 3, and the exposed surface of the film for forming a protective film of the composite sheet for forming a protective film ( That is, the surface (α)) was attached to a #2000 polished surface of an 8-inch wafer (thickness: 100 μm), and the sheet was fixed in a ring frame and allowed to stand for 30 minutes.

繼而,使用紫外線照射裝置(Lintec公司製造之「RAD2000m/8」),於照度195mW/cm2、光量170mJ/cm2之條件下,自前述支持片側對保護膜形成用複合片照射紫外線,藉此使前述保護膜形成用膜硬化而成為保護膜。 Then, using a UV irradiation device ("RAD2000m/8" manufactured by Lintec Co., Ltd.), the composite sheet for forming a protective film is irradiated with ultraviolet rays from the side of the support sheet under the conditions of an illuminance of 195 mW/cm 2 and a light amount of 170 mJ/cm 2 . The film for forming a protective film is cured to form a protective film.

繼而,使用切割刀片,將矽晶圓連同保護膜一起切割而進行單片化,獲得5mm×5mm之矽晶片。 Then, using a dicing blade, the ruthenium wafer was cut together with the protective film to be singulated, and a 5 mm × 5 mm ruthenium wafer was obtained.

繼而,使用黏晶機(Canon Machinery公司製造之「BESTEM-D02」),拾取20個附有保護膜之矽晶片。此時,目視確認矽晶片有無破裂及缺損,將完全無破裂及缺損之情形判定為「○」,將僅有少許破裂或缺損之情形判定為「×」,評價拾取適性。 Then, using a die bonder ("BESTEM-D02" manufactured by Canon Machinery Co., Ltd.), 20 wafers with a protective film were picked up. At this time, the presence or absence of cracks and defects of the wafer was visually confirmed, and the case where no cracks and defects were completely eliminated was judged as "○", and the case where only a few cracks or defects were found was judged as "x", and the picking property was evaluated.

結果示於表1。 The results are shown in Table 1.

(2)剝離實施例4中所獲得之保護膜形成用片之第2剝離膜,藉由保護膜形成用膜(13)-1的露出面(亦即表面(α)),貼附於8吋矽晶圓(厚度100μm)之#2000研磨面,進而剝離該片的第1剝離膜,將保護膜形成用膜的露出面(亦即表面(β))貼合於比較例2中所使用之支持片(10)-3,將所得積層體固定於環狀框,靜置30分鐘。 (2) The second release film of the film for forming a protective film obtained in Example 4 was peeled off, and the exposed surface (that is, the surface (α)) of the film (13)-1 for protective film formation was attached to 8 The #2000 polished surface of the wafer (thickness: 100 μm) was peeled off, and the first release film of the sheet was peeled off, and the exposed surface of the film for forming a protective film (that is, the surface (β)) was bonded to Comparative Example 2. The support sheet (10)-3 was fixed to the ring frame by the obtained laminate, and allowed to stand for 30 minutes.

上述步驟之後的步驟係以與上述(1)中所記載之步驟相同之方式拾取20個附有保護膜之矽晶片。 The steps after the above steps were carried out in the same manner as the procedure described in the above (1) to pick up 20 wafers with a protective film.

結果示於表2。 The results are shown in Table 2.

根據上述結果可明確,於使用實施例1至實施例3之保護膜形成用複合片或實施例4之保護膜形成用片之情形時,若對保護膜形成用膜照射能量線而成為保護膜時,前述保護膜的表面(β)的表面粗糙度(Ra)為0.038μm以上,則拾取時矽晶片之破裂及缺損得到抑制,亦未見其他不良情況,拾取適性優異。 According to the above-mentioned results, in the case of using the composite sheet for forming a protective film of Examples 1 to 3 or the sheet for forming a protective film of Example 4, the film for forming a protective film is irradiated with an energy ray to form a protective film. When the surface roughness (Ra) of the surface (β) of the protective film is 0.038 μm or more, cracking and defects of the tantalum wafer are suppressed at the time of pick-up, and no other defects are observed, and the pick-up property is excellent.

相對於此,於使用比較例1至比較例3之保護膜形成 用複合片之情形時,對保護膜形成用膜照射能量線而成為保護膜時,若前述保護膜的表面(β)的表面粗糙度(Ra)未達0.038μm,則拾取時矽晶片之破裂及缺損得到抑制,拾取適性差。 On the other hand, the protective film formation of Comparative Example 1 to Comparative Example 3 was used. In the case of using a composite sheet, when the film for forming a protective film is irradiated with an energy ray to form a protective film, if the surface roughness (Ra) of the surface (β) of the protective film is less than 0.038 μm, the wafer is broken at the time of picking up. And the defect is suppressed, and the picking property is poor.

推測原因在於,上述態樣中,於基材上直接積層有保護膜形成用膜,因此使前述保護膜形成用膜硬化而成為保護膜時,前述保護膜與基材之界面在特定範圍內粗面化,藉此可適度調整前述保護膜與基材之黏著力而拾取性提高。該情形時,藉由支持片僅由基材構成,容易表現出前述保護膜之粗面化之功效,故而較佳。 In the above-described aspect, the film for forming a protective film is directly laminated on the substrate. Therefore, when the film for forming a protective film is cured to form a protective film, the interface between the protective film and the substrate is thick in a specific range. The surface is formed, whereby the adhesion between the protective film and the substrate can be appropriately adjusted, and the pick-up property is improved. In this case, since the support sheet is composed only of the base material, it is easy to exhibit the effect of roughening the protective film, which is preferable.

(產業可利用性) (industry availability)

本發明可用於製造半導體裝置。 The invention can be used to fabricate semiconductor devices.

Claims (3)

一種保護膜形成用膜,為能量線硬化性之保護膜形成用膜;對前述保護膜形成用膜照射能量線而成為保護膜時,前述保護膜中的至少一表面(β)的表面粗糙度(Ra)為0.038μm以上。 A film for forming a protective film which is an energy ray-curable protective film forming film; and when the protective film forming film is irradiated with an energy ray to form a protective film, surface roughness of at least one surface (β) of the protective film (Ra) is 0.038 μm or more. 如請求項1所記載之保護膜形成用膜,其中前述表面粗糙度(Ra)為1.5μm以下。 The film for forming a protective film according to claim 1, wherein the surface roughness (Ra) is 1.5 μm or less. 一種保護膜形成用複合片,於支持片上具備如請求項1或2所記載之保護膜形成用膜,前述保護膜形成用膜的前述表面(β)與前述支持片相對向。 A composite sheet for forming a protective film, comprising the film for forming a protective film according to claim 1 or 2, wherein the surface (β) of the film for forming a protective film faces the support sheet.
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