TWI721158B - Protective film forming film and composite sheet for forming protective film - Google Patents
Protective film forming film and composite sheet for forming protective film Download PDFInfo
- Publication number
- TWI721158B TWI721158B TW106113478A TW106113478A TWI721158B TW I721158 B TWI721158 B TW I721158B TW 106113478 A TW106113478 A TW 106113478A TW 106113478 A TW106113478 A TW 106113478A TW I721158 B TWI721158 B TW I721158B
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- Taiwan
- Prior art keywords
- protective film
- film
- forming
- meth
- aforementioned
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- 230000001681 protective effect Effects 0.000 title claims abstract description 618
- 239000002131 composite material Substances 0.000 title claims abstract description 83
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- XOALFFJGWSCQEO-UHFFFAOYSA-N tridecyl prop-2-enoate Chemical compound CCCCCCCCCCCCCOC(=O)C=C XOALFFJGWSCQEO-UHFFFAOYSA-N 0.000 description 1
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- JXUKBNICSRJFAP-UHFFFAOYSA-N triethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CCO[Si](OCC)(OCC)CCCOCC1CO1 JXUKBNICSRJFAP-UHFFFAOYSA-N 0.000 description 1
- ZIBGPFATKBEMQZ-UHFFFAOYSA-N triethylene glycol Chemical compound OCCOCCOCCO ZIBGPFATKBEMQZ-UHFFFAOYSA-N 0.000 description 1
- 239000013638 trimer Substances 0.000 description 1
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 1
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 1
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- 229910052720 vanadium Inorganic materials 0.000 description 1
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Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/20—Adhesives in the form of films or foils characterised by their carriers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B3/00—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form
- B32B3/26—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a particular shape of the outline of the cross-section of a continuous layer; characterised by a layer with cavities or internal voids ; characterised by an apertured layer
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J201/00—Adhesives based on unspecified macromolecular compounds
- C09J201/02—Adhesives based on unspecified macromolecular compounds characterised by the presence of specified groups, e.g. terminal or pendant functional groups
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Optics & Photonics (AREA)
- Dicing (AREA)
- Laminated Bodies (AREA)
- Paints Or Removers (AREA)
Abstract
Description
本發明係關於一種保護膜形成用膜及保護膜形成用複合片。 The present invention relates to a film for forming a protective film and a composite sheet for forming a protective film.
本申請案主張基於2016年4月28日在日本提出申請之日本特願2016-092008號的優先權,並將該申請案的內容引用至本文中。 This application claims priority based on Japanese Patent Application No. 2016-092008 filed in Japan on April 28, 2016, and the content of the application is cited herein.
近年來,業界使用稱為所謂倒裝(face down)方式之安裝方法製造半導體裝置。倒裝方式中,使用於電路面上具有凸塊(bump)等電極之半導體晶片,將前述電極與基板接合。因此,會有半導體晶片中的與電路面為相反側的背面裸露之情形。 In recent years, the industry has used a mounting method called a so-called face down method to manufacture semiconductor devices. In the flip-chip method, a semiconductor wafer having electrodes such as bumps on the circuit surface is used to join the electrodes to the substrate. Therefore, the back surface of the semiconductor chip opposite to the circuit surface may be exposed.
會有於該裸露之半導體晶片的背面形成含有有機材料之樹脂膜作為保護膜,從而以附有保護膜的半導體晶片之形式組入至半導體裝置之情形。保護膜係用以防止在切割步驟或封裝之後半導體晶片產生龜裂。 There may be cases where a resin film containing an organic material is formed as a protective film on the back surface of the exposed semiconductor chip, and the protective film is incorporated into a semiconductor device in the form of a semiconductor chip with a protective film. The protective film is used to prevent the semiconductor chip from cracking after the dicing step or packaging.
為了形成此種保護膜,例如使用可藉由硬化而形成保護膜之保護膜形成用膜。作為保護膜形成用膜,例如使用雙面具備剝離膜之膜或者設置於支持片上且於露出面具備剝離膜之膜。作為於支持片上設置有保護膜形成用膜之保護膜形成用複合片,除了形成保護膜以外,亦可用作切割片(dicing sheet)。 In order to form such a protective film, for example, a protective film forming film that can form a protective film by curing is used. As the protective film formation film, for example, a film provided with a release film on both sides or a film provided on a support sheet and provided with a release film on the exposed surface is used. As a composite sheet for forming a protective film in which a film for forming a protective film is provided on a support sheet, in addition to forming a protective film, it can also be used as a dicing sheet.
作為此種保護膜形成用膜,此前主要利用以下保護膜形成用膜,該保護膜形成用膜無論有無支持片,均可藉由加熱而硬化,從而形成保護膜。該情形時,例如於半導體晶圓的背面(與電極形成面為相反側的面)貼附熱硬化性之保護膜形成用膜,或者將具備熱硬化性之保護膜形成用膜之保護膜形成用複合片藉由該保護膜形成用複合片之保護膜形成用膜而貼附後,藉由加熱使保護膜形成用膜硬化而成為保護膜,藉由切割將半導體晶圓連同保護膜一起分割而製成半導體晶片。然後,在保持貼附有該保護膜之狀態下直接拾取半導體晶片。再者,亦存在保護膜形成用膜之硬化及切割以與上述相反之順序進行之情形。 As such a film for forming a protective film, the following film for forming a protective film has been mainly used heretofore. The film for forming a protective film can be cured by heating regardless of the presence or absence of a support sheet to form a protective film. In this case, for example, a thermosetting protective film forming film is attached to the back surface of the semiconductor wafer (the surface opposite to the electrode formation surface), or a thermosetting protective film forming film is formed into a protective film After the composite sheet is attached to the protective film forming film of the protective film forming composite sheet, the protective film forming film is cured by heating to become a protective film, and the semiconductor wafer and the protective film are divided by dicing And make a semiconductor wafer. Then, the semiconductor wafer is directly picked up while keeping the protective film attached. Furthermore, there are cases where the curing and cutting of the protective film forming film are performed in the reverse order of the above.
另一方面,通常藉由照射雷射光對保護膜中之與對半導體晶圓之貼附面為相反側的面(保護膜形成用複合片中,保護膜中的與支持片相對向的面)實施印字(本說明書中有時稱為「雷射印字」)。並且,對於保護膜要求印字 視認性優異。 On the other hand, usually by irradiating laser light on the surface of the protective film that is on the opposite side of the attaching surface to the semiconductor wafer (in the protective film forming composite sheet, the surface of the protective film facing the support sheet) Implement printing (sometimes referred to as "laser printing" in this manual). And, for the protective film, printing is required Excellent visibility.
但是,若保護膜的雷射印字面在雷射印字前之階段既已變粗糙,則無法清晰地進行雷射印字,因此印字視認性變差。如此,推測保護膜的雷射印字面變粗糙的原因在於:在保護膜形成用膜之階段,相當於雷射印字面之表面既已變粗糙,或者熱硬化性之保護膜形成用膜在用以硬化之加熱中變柔軟而變得容易變形,或者填充材料等含有成分向表面方向移動。因此,期望為使用至少可藉由照射紫外線等能量線而並非加熱進行硬化之保護膜形成用膜,以雷射印字面不變粗糙之方式使保護膜形成用膜硬化。 However, if the laser printing surface of the protective film becomes rough in the stage before the laser printing, the laser printing cannot be clearly performed, and the printing visibility deteriorates. In this way, it is estimated that the reason for the roughening of the laser printing surface of the protective film is that at the stage of the protective film formation film, the surface equivalent to the laser printing surface has become rough, or the thermosetting protective film formation film is in use It becomes soft and easily deformed during heating by hardening, or the ingredients such as fillers move to the surface direction. Therefore, it is desirable to use a protective film forming film that can be cured by at least irradiating energy rays such as ultraviolet rays without heating, and to harden the protective film forming film so that the laser printing surface does not become rough.
作為此種能量線硬化性之保護膜形成用膜,例如揭示有:形成於剝離膜上之能量線硬化型保護膜(參照專利文獻1);可形成高硬度且對半導體晶片之密接性優異的保護膜之能量線硬化型晶片保護用膜(參照專利文獻2)。 As a film for forming such an energy-ray curable protective film, for example, an energy-ray curable protective film formed on a release film (refer to Patent Document 1); a film capable of forming a high hardness and excellent adhesion to a semiconductor wafer is disclosed The protective film is an energy ray-curable chip protective film (refer to Patent Document 2).
但是,專利文獻1中所揭示之能量線硬化型保護膜、專利文獻2中所揭示之能量線硬化型晶片保護用膜均未以對保護膜清晰地進行雷射印字為目的。 However, neither the energy ray hardening type protective film disclosed in Patent Document 1 nor the energy ray hardening type wafer protection film disclosed in Patent Document 2 aims to clearly perform laser printing on the protective film.
專利文獻1:日本特許第5144433號公報。 Patent Document 1: Japanese Patent No. 5144433.
專利文獻2:日本特開2010-031183號公報。 Patent Document 2: Japanese Patent Application Laid-Open No. 2010-031183.
本發明之目的在於提供一種能量線硬化性之保護膜形成用膜及具備前述能量線硬化性之保護膜形成用膜之保護膜形成用複合片,前述保護膜形成用膜可於半導體晶圓或半導體晶片的背面形成保護膜,從而可對保護膜清晰地進行雷射印字。 The object of the present invention is to provide a film for forming an energy ray curable protective film and a composite sheet for forming a protective film having the aforementioned energy ray curable film for forming a protective film. The film for forming a protective film can be used on a semiconductor wafer or A protective film is formed on the back side of the semiconductor wafer, so that the protective film can be clearly printed by laser.
為了解決上述課題,本發明提供一種保護膜形成用膜,為能量線硬化性之保護膜形成用膜,對前述保護膜形成用膜照射能量線而成為保護膜時前述保護膜中至少一方的表面(β')的最大剖面高度(Rt)未達10μm。 In order to solve the above-mentioned problems, the present invention provides a protective film formation film, which is an energy-ray curable protective film formation film. When the protective film formation film is irradiated with energy rays to form a protective film, the surface of at least one of the protective films The maximum profile height (Rt) of (β') is less than 10μm.
本發明之保護膜形成用膜中,較佳為前述表面(β')的光澤值為45以上。 In the film for forming a protective film of the present invention, it is preferable that the gloss value of the surface (β') is 45 or more.
本發明之保護膜形成用膜中,較佳為至少一方的表面(β)的最大剖面高度(Rt)未達10μm,前述表面(β)係對前述保護膜形成用膜照射能量線而成為保護膜時成為前述保護膜的表面(β')之面。 In the protective film forming film of the present invention, it is preferable that the maximum cross-sectional height (Rt) of at least one surface (β) is less than 10 μm, and the surface (β) is protected by irradiating energy rays to the protective film forming film When filming, it becomes the surface (β') of the aforementioned protective film.
另外,本發明提供一種保護膜形成用複合片,係具備支持片,並於前述支持片上具備前述保護膜形成用膜,且前述保護膜形成用膜的表面(β)與前述支持片相對向。前 述表面(β)係對前述保護膜形成用膜照射能量線而成為保護膜時成為前述保護膜的表面(β')之面。 In addition, the present invention provides a composite sheet for forming a protective film, which is provided with a support sheet, the film for forming the protective film is provided on the support sheet, and the surface (β) of the film for forming the protective film faces the support sheet. before The surface (β) is a surface that becomes the surface (β') of the protective film when the film for forming a protective film is irradiated with energy rays to become a protective film.
藉由使用本發明之保護膜形成用膜及保護膜形成用複合片,可於半導體晶圓或半導體晶片的背面形成保護膜,從而可對保護膜清晰地進行雷射印字。 By using the protective film forming film and the protective film forming composite sheet of the present invention, the protective film can be formed on the semiconductor wafer or the back surface of the semiconductor wafer, so that the protective film can be clearly laser printed.
1C、1D‧‧‧保護膜形成用複合片 1C, 1D‧‧‧Composite sheet for forming protective film
10‧‧‧支持片 10‧‧‧Support film
10a‧‧‧(支持片的)表面 10a‧‧‧(supporting film) surface
11‧‧‧基材 11‧‧‧Substrate
11a‧‧‧(基材的)表面 11a‧‧‧(of the substrate) surface
13‧‧‧保護膜形成用膜 13‧‧‧Film for forming protective film
13a‧‧‧(保護膜形成用膜的)表面(第1面) 13a‧‧‧(The surface of the protective film forming film) (1st side)
13b‧‧‧(保護膜形成用膜的)表面 13b‧‧‧(The surface of the protective film forming film)
15‧‧‧剝離膜 15‧‧‧Peeling film
151‧‧‧第1剝離膜 151‧‧‧The first peeling film
152‧‧‧第2剝離膜 152‧‧‧Second peeling film
16‧‧‧治具用接著劑層 16‧‧‧Adhesive layer for fixture
16a‧‧‧(治具用接著劑層的)表面 16a‧‧‧(Adhesive layer for jig) surface
圖1係以示意方式顯示本發明之保護膜形成用膜的一實施形態之剖面圖。 Fig. 1 is a cross-sectional view schematically showing one embodiment of the protective film forming film of the present invention.
圖2係以示意方式顯示本發明之保護膜形成用複合片的一實施形態之剖面圖。 Fig. 2 is a cross-sectional view schematically showing one embodiment of the composite sheet for forming a protective film of the present invention.
圖3係以示意方式顯示本發明之保護膜形成用複合片的另一實施形態之剖面圖。 Fig. 3 is a cross-sectional view schematically showing another embodiment of the composite sheet for forming a protective film of the present invention.
◇保護膜形成用膜 ◇Film for forming protective film
本發明之保護膜形成用膜為能量線硬化性之保護膜形成用膜,對前述保護膜形成用膜照射能量線而成為保護膜時前述保護膜中至少一方的表面(β')的最大剖面高度(Rt)未達10μm。 The protective film forming film of the present invention is an energy-ray curable protective film forming film, and the maximum cross-section of at least one surface (β') of the protective film when the protective film forming film is irradiated with energy rays to form a protective film The height (Rt) is less than 10μm.
如後述般,藉由將前述保護膜形成用膜設置於支持片,可構成保護膜形成用複合片。 As described later, by providing the aforementioned protective film forming film on a support sheet, a composite sheet for forming a protective film can be constructed.
前述保護膜形成用膜藉由照射能量線進行硬化而成為保護膜。該保護膜用以對半導體晶圓或半導體晶片的背面(與電極形成面為相反側的面)進行保護。保護膜形成用膜為軟質,可容易地貼附於貼附對象物。 The film for forming a protective film is cured by irradiation with energy rays to become a protective film. The protective film protects the semiconductor wafer or the back surface (the surface opposite to the electrode formation surface) of the semiconductor wafer. The protective film forming film is soft and can be easily attached to an object to be attached.
前述保護膜形成用膜為能量線硬化性,藉此相較於熱硬化性之保護膜形成用膜而言,可藉由短時間內之硬化而形成保護膜。 The above-mentioned protective film formation film is energy ray curable, so that the protective film can be formed by curing in a short time compared to a thermosetting protective film formation film.
再者,本說明書中,所謂「保護膜形成用膜」意指硬化前的保護膜形成用膜,所謂「保護膜」意指保護膜形成用膜硬化後之膜。 In addition, in this specification, the "protective film formation film" means the protective film formation film before curing, and the "protective film" means the protective film formation film after curing.
作為前述保護膜形成用膜,例如可列舉含有後述之能量線硬化性成分(a)之膜。 As the film for forming the protective film, for example, a film containing the energy ray curable component (a) described later can be cited.
能量線硬化性成分(a)較佳為未硬化,較佳為具有黏著性,更佳為未硬化且具有黏著性。 The energy ray curable component (a) is preferably uncured, preferably has adhesiveness, and more preferably has adhesiveness and uncured.
本發明中,所謂「能量線」意指具有能量量子的電磁波或帶電粒子束;作為該能量線的示例,可列舉紫外線、放射線、電子束等。 In the present invention, the term "energy rays" means electromagnetic waves or charged particle beams having energy quantum; examples of the energy rays include ultraviolet rays, radiation rays, electron beams, and the like.
紫外線例如可藉由使用高壓水銀燈、融合(Fusion)H型燈、氙氣燈、黑光燈或LED(Light Emitting Diode;發光二極體)燈等作為紫外線源進行照射。電子束可照射藉由 電子束加速器等產生之電子束。 The ultraviolet light can be irradiated by using a high-pressure mercury lamp, a Fusion H-type lamp, a xenon lamp, a black light lamp, or an LED (Light Emitting Diode) lamp as an ultraviolet source, for example. The electron beam can be irradiated by An electron beam produced by an electron beam accelerator, etc.
本發明中,所謂「能量線硬化性」意指藉由照射能量線而硬化之性質,所謂「非能量線硬化性」意指即便照射能量線亦不硬化之性質。 In the present invention, the "energy ray curability" refers to the property of curing by irradiation of energy rays, and the term "non-energy ray curability" refers to the property of not curing even if energy rays are irradiated.
對本發明之保護膜形成用膜照射能量線而獲得之保護膜中的任一方的表面或雙方的表面成為最大剖面高度(Rt)未達10μm之表面(β')。表面(β')為保護膜中的與對半導體晶圓或半導體晶片之貼附面為相反側的面,且可成為用以進行後述之雷射印字之面。 Either one or both surfaces of the protective film obtained by irradiating the film for protective film formation of the present invention with energy rays become a surface (β') with a maximum cross-sectional height (Rt) of less than 10 μm. The surface (β') is the surface on the opposite side of the protective film from the surface to which the semiconductor wafer or the semiconductor wafer is attached, and can be a surface for laser printing to be described later.
保護膜中,表面(β')的最大剖面高度(Rt)未達前述上限值,藉此該表面中的雷射印字變得清晰,印字視認性優異。獲得此種功效之原因在於對前述保護膜形成用膜照射能量線使前述保護膜形成用膜硬化而形成保護膜。 In the protective film, the maximum cross-sectional height (Rt) of the surface (β') does not reach the aforementioned upper limit, whereby the laser printing on the surface becomes clear and the printing visibility is excellent. The reason for this effect is that the film for forming a protective film is irradiated with energy rays to harden the film for forming a protective film to form a protective film.
再者,本說明書中,所謂「最大剖面高度(Rt)」只要無特別說明則意指依據JIS B 0601:2013(ISO 4287:1997,Amd.1:2009)所求出之粗糙度曲線的最大剖面高度(Rt),有時僅簡記為「Rt」。 In addition, in this specification, the "maximum section height (Rt)" means the maximum roughness curve calculated in accordance with JIS B 0601:2013 (ISO 4287:1997, Amd.1:2009) unless otherwise specified. The section height (Rt) is sometimes simply referred to as "Rt".
保護膜的表面(β')的最大剖面高度(Rt)較佳為9μm以下,更佳為8μm以下。 The maximum cross-sectional height (Rt) of the surface (β') of the protective film is preferably 9 μm or less, more preferably 8 μm or less.
表面(β')的最大剖面高度(Rt)的下限值並無特別限 定。例如表面(β')的最大剖面高度(Rt)可為0.5μm以上。 The lower limit of the maximum profile height (Rt) of the surface (β') is not particularly limited set. For example, the maximum cross-sectional height (Rt) of the surface (β') may be 0.5 μm or more.
保護膜的表面(β')的光澤值較佳為45以上,更佳為50以上,例如可為60以上、70以上等。 The gloss value of the surface (β') of the protective film is preferably 45 or more, more preferably 50 or more, for example, 60 or more, 70 or more.
表面(β')的光澤值的上限值並無特別限定。例如表面(β')的光澤值可為95以下。 The upper limit of the gloss value of the surface (β') is not particularly limited. For example, the gloss value of the surface (β') may be 95 or less.
再者,本說明書中,所謂「光澤值」只要無特別說明則係指依據JIS K 7105所求出且從自上方往下看測定對象的表面之側測定前述表面的60°鏡面光澤度所獲得之值。 In addition, in this specification, the term "gloss value" refers to the 60° specular gloss obtained by measuring the 60° specular gloss on the surface of the object to be measured from above, as long as there is no special description. The value.
保護膜形成用膜的表面(β)係對保護膜形成用膜照射能量線而成為保護膜時成為保護膜的表面(β')之面。另外,保護膜形成用膜的表面(β)為與對半導體晶圓之貼附面為相反側的面(保護膜形成用複合片中為保護膜形成用膜中的與支持片相對向的面),最終可成為保護膜的雷射印字面。 The surface (β) of the film for forming a protective film is a surface that becomes the surface (β') of the protective film when the film for forming a protective film is irradiated with energy rays to become a protective film. In addition, the surface (β) of the protective film formation film is the surface opposite to the surface to which the semiconductor wafer is attached (in the protective film formation composite sheet, the protective film formation film is the surface facing the support sheet) ), which can eventually become the laser printing surface of the protective film.
保護膜形成用膜的任一方的表面或雙方的表面(β)中,最大剖面高度(Rt)較佳為未達10μm,更佳為9μm以下,進而較佳為8.5μm以下,尤佳為8μm以下。 In any one surface or both surfaces (β) of the protective film forming film, the maximum cross-sectional height (Rt) is preferably less than 10 μm, more preferably 9 μm or less, still more preferably 8.5 μm or less, and particularly preferably 8 μm the following.
表面(β)的最大剖面高度(Rt)的下限值並無特別限定。例如表面(β)的最大剖面高度(Rt)可為0.5μm以上。 The lower limit of the maximum cross-sectional height (Rt) of the surface (β) is not particularly limited. For example, the maximum cross-sectional height (Rt) of the surface (β) may be 0.5 μm or more.
藉由保護膜形成用膜的表面(β)的最大剖面高度(Rt)未達前述上限值,可獲得更顯著的本發明之功效。亦即,使表面(β)成為保護膜的雷射印字面時,該表面(源於表面(β)之表面)中的雷射印字變得清晰,印字視認性優異。獲得此種功效之原因在於:保護膜形成用膜為能量線硬化性,硬化時無需加熱,於短時間內完成硬化。與熱硬化性之保護膜形成用膜不同,硬化時無需加熱,藉此可抑制保護膜形成用膜於硬化中變柔軟而變得容易變形,或者於保護膜形成用膜中填充材料等含有成分向表面方向移動。另外,藉由於短時間內完成硬化,即便表面(β)的最大剖面高度(Rt)可能變化,亦在過度變化之前完成硬化。如此,硬化中表面(β)的最大剖面高度(Rt)之增大得到抑制,硬化前的表面(β)的最大剖面高度(Rt)如上述般較小,因此藉由硬化所形成之保護膜的表面(β')中最大剖面高度(Rt)變小。另外,硬化中,關於保護膜形成用膜及保護膜之構成成分,如對印字視認性造成不良影響之變質亦得到抑制。 Since the maximum cross-sectional height (Rt) of the surface (β) of the protective film forming film does not reach the aforementioned upper limit, more significant effects of the present invention can be obtained. That is, when the surface (β) becomes the laser printing surface of the protective film, the laser printing on the surface (the surface derived from the surface (β)) becomes clear, and the printing visibility is excellent. The reason for this effect is that the film for forming the protective film is energy-ray curable, and the curing is completed in a short time without heating. Unlike the thermosetting film for forming a protective film, it does not require heating during curing, which can prevent the film for forming a protective film from becoming soft and easily deformed during curing, or containing ingredients such as fillers in the film for forming a protective film Move towards the surface. In addition, by completing the hardening in a short time, even if the maximum cross-sectional height (Rt) of the surface (β) may change, the hardening is completed before the excessive change. In this way, the increase in the maximum cross-sectional height (Rt) of the surface (β) during curing is suppressed, and the maximum cross-sectional height (Rt) of the surface (β) before curing is as small as described above, so the protective film formed by curing The maximum profile height (Rt) of the surface (β') becomes smaller. In addition, during curing, the deterioration of the protective film forming film and the constituent components of the protective film, such as adversely affecting the visibility of printing, is also suppressed.
保護膜形成用膜的表面(β)的光澤值較佳為45以上,更佳為50以上,例如可為60以上、70以上等。 The gloss value of the surface (β) of the film for forming a protective film is preferably 45 or more, more preferably 50 or more, and may be 60 or more, 70 or more, for example.
表面(β)的光澤值的上限值並無特別限定。例如表面(β)的光澤值可為95以下。 The upper limit of the gloss value of the surface (β) is not particularly limited. For example, the gloss value of the surface (β) may be 95 or less.
本發明之保護膜形成用膜只要為能量線硬化性且藉 由照射能量線而形成保護膜時表面(β')的最大剖面高度(Rt)未達10μm,則可發揮本發明之功效。 The film for forming the protective film of the present invention needs to be energy ray curable and When the protective film is formed by irradiating energy rays, the maximum cross-sectional height (Rt) of the surface (β') is less than 10 μm, and the effect of the present invention can be exerted.
另一方面,關於熱硬化性之保護膜形成用膜,藉由加熱而形成保護膜時,如上述之本發明之能量線硬化性之保護膜形成用膜中得到抑制之關於表面形狀之不良情形未得到抑制。另外,於熱硬化中,如上述般,不僅表面形狀容易變形,而且因加熱時間長亦會導致保護膜形成用膜及保護膜之構成成分容易產生對印字視認性造成不良影響之變質。例如,即便保護膜的表面中的最大剖面高度(Rt)未達10μm,亦存在保護膜的印字視認性不良之情形。如此,於使用熱硬化性之保護膜形成用膜之情形時,會因熱硬化中的各種因素導致保護膜的印字視認性惡化。 On the other hand, regarding the thermally curable protective film formation film, when the protective film is formed by heating, the above-mentioned energy ray curable protective film formation film of the present invention suppresses the defects related to the surface shape Not suppressed. In addition, during thermal curing, as described above, not only the surface shape is easily deformed, but also the protective film forming film and the constituent components of the protective film are easily deteriorated due to the long heating time, which adversely affects the visibility of printing. For example, even if the maximum cross-sectional height (Rt) on the surface of the protective film is less than 10 μm, the printing visibility of the protective film may be poor. In this way, when a thermally curable protective film formation film is used, various factors in the thermal curing will cause the printing visibility of the protective film to deteriorate.
保護膜形成用膜可藉由下述方式而製造:將後述之保護膜形成用組成物塗敷於保護膜形成用膜之形成對象面,並視需要使保護膜形成用組成物乾燥。並且,保護膜形成用膜的表面(β)的最大剖面高度(Rt)及光澤值、以及保護膜的表面(β')的最大剖面高度(Rt)及光澤值例如可藉由調節保護膜形成用組成物之塗敷面(保護膜形成用膜之形成對象面)的最大剖面高度(Rt)而適宜調節。 The film for protective film formation can be manufactured by applying the composition for protective film formation mentioned later to the formation target surface of the film for protective film formation, and drying the composition for protective film formation as needed. In addition, the maximum cross-sectional height (Rt) and gloss value of the surface (β) of the protective film formation film, and the maximum cross-sectional height (Rt) and gloss value of the surface (β') of the protective film can be formed, for example, by adjusting the protective film The maximum cross-sectional height (Rt) of the coating surface of the composition (the surface to be formed of the protective film forming film) is appropriately adjusted.
如後述般,例如於保護膜形成用膜於雙面具備剝離膜之情形時,保護膜形成用組成物之塗敷面可設為這些剝離膜之任一者的表面(較佳為剝離處理面)。另一方面,於保 護膜形成用膜設置於後述之支持片上之情形時,保護膜形成用組成物之塗敷面可設為前述支持片的表面。 As described later, for example, when the protective film forming film is provided with a release film on both sides, the coating surface of the protective film forming composition can be the surface of any one of these release films (preferably the release treatment surface). ). On the other hand, Yu Bao When the film for forming a protective film is provided on a support sheet described later, the coating surface of the composition for forming a protective film may be the surface of the aforementioned support sheet.
如上述般,於將剝離膜的表面設為保護膜形成用組成物之塗敷面之情形時,較佳為將剝離膜中的保護膜形成用組成物之塗敷面的最大剖面高度(Rt)設為例如相對於表面(β)的目標最大剖面高度(Rt)之值僅小0.5之值至僅大0.5之值之範圍內。藉此,可將表面(β)的最大剖面高度(Rt)更容易地調節為目標值。 As described above, when the surface of the release film is used as the coating surface of the protective film formation composition, it is preferable to set the maximum cross-sectional height (Rt) of the coating surface of the protective film formation composition in the release film ) Is set to, for example, the value of the target maximum cross-sectional height (Rt) relative to the surface (β) is only a value smaller than 0.5 to a value larger than 0.5. Thereby, the maximum cross-sectional height (Rt) of the surface (β) can be adjusted to the target value more easily.
另一方面,剝離膜中的並非保護膜形成用組成物之塗敷面之表面的最大剖面高度(Rt)並無特別限定,例如可與保護膜形成用組成物之塗敷面相同。 On the other hand, the maximum cross-sectional height (Rt) of the surface other than the coating surface of the protective film forming composition in the release film is not particularly limited, and may be the same as the coating surface of the protective film forming composition, for example.
於未將剝離膜的表面作為保護膜形成用組成物之塗敷面之情形時,剝離膜的表面(與保護膜形成用膜相對向的面)的最大剖面高度(Rt)並無特別限定。 When the surface of the release film is not used as the coating surface of the composition for forming a protective film, the maximum cross-sectional height (Rt) of the surface of the release film (the surface facing the film for forming a protective film) is not particularly limited.
剝離膜的表面的最大剖面高度(Rt)可利用公知的方法進行調節。 The maximum cross-sectional height (Rt) of the surface of the release film can be adjusted by a known method.
例如,作為藉由對剝離膜的作為凹凸面的表面進行平滑化處理而減小最大剖面高度(Rt)之方法,可列舉以下之所謂模壓法:於成為原材料之剝離膜的表面按壓平滑面而將平滑形狀轉印至前述表面。該模壓法中,藉由調節平滑 面中的平滑度,可調節剝離膜的表面的最大剖面高度(Rt)。用於轉印平滑形狀之模具可為捲筒狀(平滑面為捲筒面)、板狀(平滑面為平面)、塊狀(平滑面為平面)等任一種形狀。 For example, as a method of reducing the maximum cross-sectional height (Rt) by smoothing the surface of the release film as the uneven surface, the following so-called die press method can be cited: the surface of the release film used as the raw material is pressed against the smooth surface. The smooth shape is transferred to the aforementioned surface. In this molding method, by adjusting the smooth The smoothness of the surface can be adjusted to the maximum cross-sectional height (Rt) of the surface of the release film. The mold used to transfer the smooth shape can be any shape such as roll shape (smooth surface is roll surface), plate shape (smooth surface is flat), block shape (smooth surface is flat).
另一方面,作為藉由對剝離膜的作為平滑面的表面進行凹凸化處理而增大最大剖面高度(Rt)之方法,可列舉以下之模壓法:於成為原材料之剝離膜的表面按壓凹凸面而將凹凸形狀轉印至前述表面。該模壓法中,藉由調節凹凸面中的凹凸度,可調節剝離膜的表面的最大剖面高度(Rt)。用於轉印凹凸形狀之模具可為捲筒狀(凹凸面為捲筒面)、板狀(凹凸面為平面)、塊狀(凹凸面為平面)等任一種形狀。 On the other hand, as a method of increasing the maximum cross-sectional height (Rt) by performing uneven treatment on the smooth surface of the release film, the following molding method can be cited: pressing the uneven surface on the surface of the release film used as the raw material The uneven shape is transferred to the aforementioned surface. In this molding method, the maximum cross-sectional height (Rt) of the surface of the release film can be adjusted by adjusting the degree of unevenness in the uneven surface. The mold used to transfer the concave and convex shape can be any shape such as roll shape (concave and convex surface is roll surface), plate shape (concave and convex surface is flat), block shape (concave and convex surface is flat).
另外,作為增大剝離膜的平滑面的最大剖面高度(Rt)之方法,除了上述之模壓法以外,例如亦可列舉噴砂處理法、溶劑處理法等。 In addition, as a method of increasing the maximum cross-sectional height (Rt) of the smooth surface of the release film, in addition to the above-mentioned die press method, for example, a sandblasting method, a solvent treatment method, etc. may be cited.
保護膜形成用膜可僅為1層(單層),亦可為2層以上之複數層;於為複數層之情形時,這些複數層相互可相同亦可不同,這些複數層之組合並無特別限定。 The protective film formation film can be only one layer (single layer), or multiple layers of two or more layers; in the case of multiple layers, these multiple layers may be the same or different from each other, and there is no combination of these multiple layers Specially limited.
再者,本說明書中,並不限於保護膜形成用膜之情形,所謂「複數層相互可相同亦可不同」意指「可全部層相同,亦可全部層皆不同,還可僅一部分層相同」,再者所謂「複數層相互不同」意指「各層的構成材料及厚度之 至少一者相互不同」。 In addition, in this specification, it is not limited to the case of the protective film forming film. The so-called "a plurality of layers may be the same or different from each other" means "all the layers may be the same, or all the layers may be different, and only a part of the layers may be the same. "Furthermore, the so-called "multiple layers are different from each other" means "the material and thickness of each layer At least one is different from each other."
保護膜形成用膜的厚度較佳為1μm至100μm,更佳為5μm至75μm,尤佳為5μm至50μm。藉由保護膜形成用膜的厚度為前述下限值以上,可形成保護能力更高的保護膜。另外,藉由保護膜形成用膜的厚度為前述上限值以下,可抑制厚度過厚。 The thickness of the protective film formation film is preferably 1 μm to 100 μm, more preferably 5 μm to 75 μm, and particularly preferably 5 μm to 50 μm. When the thickness of the protective film forming film is more than the aforementioned lower limit, a protective film with higher protective ability can be formed. In addition, when the thickness of the film for forming a protective film is not more than the aforementioned upper limit, it is possible to suppress excessive thickness.
此處,所謂「保護膜形成用膜的厚度」意指保護膜形成用膜整體的厚度,例如所謂由複數層構成之保護膜形成用膜的厚度意指構成保護膜形成用膜之全部層的合計厚度。 Here, the "thickness of the protective film forming film" means the overall thickness of the protective film forming film. For example, the thickness of the protective film forming film composed of a plurality of layers means the thickness of all the layers constituting the protective film forming film Total thickness.
關於使保護膜形成用膜硬化而形成保護膜時的硬化條件,只要保護膜成為充分發揮該保護膜的功能之程度的硬化度,則並無特別限定,根據保護膜形成用膜的種類適宜選擇即可。 Regarding the curing conditions when the protective film forming film is cured to form the protective film, as long as the protective film has a degree of curing sufficient to fully exhibit the function of the protective film, there are no particular restrictions, and it is appropriately selected according to the type of the protective film forming film That's it.
例如,保護膜形成用膜之硬化時,能量線之照度較佳為4mW/cm2至280mW/cm2。並且,前述硬化時,能量線之光量較佳為3mJ/cm2至1000mJ/cm2。 For example, when the film for forming a protective film is cured, the illuminance of the energy ray is preferably 4 mW/cm 2 to 280 mW/cm 2 . In addition, during the aforementioned curing, the amount of light of the energy ray is preferably 3 mJ/cm 2 to 1000 mJ/cm 2 .
作為保護膜形成用膜之使用對象之半導體晶圓或半導體晶片的厚度並無特別限定,就獲得更顯著的本發明之功效而言,較佳為30μm至1000μm,更佳為100μm至300μm。 The thickness of the semiconductor wafer or the semiconductor wafer used as the protective film formation film is not particularly limited, but in terms of obtaining more significant effects of the present invention, it is preferably 30 μm to 1000 μm, more preferably 100 μm to 300 μm.
圖1係以示意方式顯示本發明之保護膜形成用膜的一實施形態之剖面圖。再者,以下之說明中所使用之圖中,為了易於理解本發明之特徵,方便起見有時將成為主要部分之部分放大顯示,而並不限於各構成要素的尺寸比率等與實際相同。 Fig. 1 is a cross-sectional view schematically showing one embodiment of the protective film forming film of the present invention. Furthermore, in the drawings used in the following description, in order to facilitate the understanding of the features of the present invention, the main parts may be enlarged for convenience, and the size ratios of the constituent elements are not limited to the actual size ratios.
此處所示之保護膜形成用膜13於該保護膜形成用膜13的一方的表面13a上具備第1剝離膜151,於與前述表面13a為相反側的另一方的表面13b上具備第2剝離膜152。
The protective
此種保護膜形成用膜13例如適於以捲筒狀進行保管。
Such a protective
保護膜形成用膜13可使用後述之保護膜形成用組成物而形成。
The
保護膜形成用膜13中,前述表面13a及表面13b之任一者或兩者為表面(β)。
In the
第1剝離膜151及第2剝離膜152均可為公知的剝離膜,如上所述可為表面的最大剖面高度(Rt)經調節之剝離膜。
Both the
第1剝離膜151及第2剝離膜152可相互相同亦可相互不同,例如自保護膜形成用膜13剝離時所需之剝離力
相互不同等。
The
圖1所示之保護膜形成用膜13係於將第1剝離膜151及第2剝離膜152之任一者移除所產生之露出面貼附半導體晶圓(省略圖示)的背面。並且,將第1剝離膜151及第2剝離膜152之剩餘之另一者移除所產生之露出面成為支持片之貼附面。
The protective
<<保護膜形成用組成物>> <<Protective film forming composition>>
保護膜形成用膜可使用含有該保護膜形成用膜的構成材料之保護膜形成用組成物而形成。例如,於保護膜形成用膜之形成對象面塗敷保護膜形成用組成物,視需要使保護膜形成用組成物乾燥,藉此可於目標部位形成保護膜形成用膜。通常保護膜形成用組成物中的常溫下不會氣化的成分彼此的含量比率係與保護膜形成用膜中的前述成分彼此的含量比率相同。再者,本說明書中,所謂「常溫」意指不特別冷或特別熱的溫度,亦即平常的溫度,例如可列舉15℃至25℃之溫度等。 The film for protective film formation can be formed using the composition for protective film formation containing the constituent material of the film for protective film formation. For example, by coating the protective film forming composition on the surface to be formed of the protective film forming film, and drying the protective film forming composition as necessary, the protective film forming film can be formed on the target site. Generally, the content ratio of the components that do not vaporize at room temperature in the protective film formation composition is the same as the content ratio of the aforementioned components in the protective film formation film. In addition, in this specification, the "normal temperature" means a temperature that is not particularly cold or particularly hot, that is, a normal temperature, and for example, a temperature of 15°C to 25°C, etc. can be mentioned.
利用公知的方法塗敷保護膜形成用組成物即可,例如可列舉使用以下各種塗佈機之方法:氣刀塗佈機、刮刀塗佈機、棒式塗佈機、凹版塗佈機、輥式塗佈機、輥刀塗佈機、簾幕式塗佈機、模具塗佈機、刀式塗佈機、絲網塗佈機、繞線棒(Meyer bar)式塗佈機、接觸式塗佈機等。 The composition for forming a protective film may be applied by a known method, for example, methods using various coating machines such as air knife coater, knife coater, bar coater, gravure coater, roll Type coater, roll knife coater, curtain coater, die coater, knife coater, screen coater, Meyer bar coater, contact coater Cloth machine and so on.
保護膜形成用組成物的乾燥條件並無特別限定,於保護膜形成用組成物含有後述溶劑之情形時,較佳為進行加熱乾燥。含有溶劑之保護膜形成用組成物較佳為於例如70℃至130℃且10秒至5分鐘之條件下進行乾燥。 The drying conditions of the composition for forming a protective film are not particularly limited, and when the composition for forming a protective film contains a solvent described later, it is preferable to heat and dry. The composition for forming a protective film containing a solvent is preferably dried under conditions of, for example, 70°C to 130°C and 10 seconds to 5 minutes.
<保護膜形成用組成物(IV-1)> <Composition for Forming Protective Film (IV-1)>
作為保護膜形成用組成物,例如可列舉含有前述能量線硬化性成分(a)之保護膜形成用組成物(IV-1)等。 As the protective film forming composition, for example, the protective film forming composition (IV-1) containing the aforementioned energy ray curable component (a) can be cited.
[能量線硬化性成分(a)] [Energy ray hardening component (a)]
能量線硬化性成分(a)係藉由照射能量線而硬化之成分,該成分用以對保護膜形成用膜賦予造膜性或可撓性等。 The energy-ray curable component (a) is a component that is cured by irradiation of energy rays, and the component is used to impart film-forming properties, flexibility, etc., to the film for forming a protective film.
作為能量線硬化性成分(a),例如可列舉:具有能量線硬化性基且重量平均分子量為80000至2000000之聚合物(a1)、及具有能量線硬化性基且分子量為100至80000之化合物(a2)。前述聚合物(a1)可至少一部分藉由後述之交聯劑(f)進行交聯,亦可不進行交聯。 Examples of the energy ray curable component (a) include: a polymer (a1) having an energy ray curable group and a weight average molecular weight of 80,000 to 2,000,000, and a compound having an energy ray curable group and a molecular weight of 100 to 80,000 (a2). The aforementioned polymer (a1) may be cross-linked at least partially by the cross-linking agent (f) described later, or may not be cross-linked.
再者,本說明書中,所謂重量平均分子量只要無特別說明則意指藉由凝膠滲透層析(GPC;Gel Permeation Chromatography)法所測定之聚苯乙烯換算值。 In addition, in this specification, the weight average molecular weight means the polystyrene conversion value measured by a gel permeation chromatography (GPC; Gel Permeation Chromatography) method, unless otherwise stated.
(具有能量線硬化性基且重量平均分子量為80000至 2000000之聚合物(a1)) (Having an energy ray hardening base and a weight average molecular weight of 80,000 to 2,000,000 polymer (a1))
作為具有能量線硬化性基且重量平均分子量為80000至2000000之聚合物(a1),例如可列舉丙烯酸系樹脂(a1-1),該丙烯酸系樹脂(a1-1)係丙烯酸系聚合物(a11)與能量線硬化性化合物(a12)聚合而成,前述丙烯酸系聚合物(a11)具有可與其他化合物所具有之基反應之官能基,前述能量線硬化性化合物(a12)具有與前述官能基反應之基及能量線硬化性雙鍵等能量線硬化性基。 Examples of the polymer (a1) having an energy-ray curable group and having a weight average molecular weight of 80,000 to 2,000,000 include acrylic resin (a1-1), and the acrylic resin (a1-1) is an acrylic polymer (a11). ) Is polymerized with an energy ray curable compound (a12), the aforementioned acrylic polymer (a11) has a functional group capable of reacting with groups possessed by other compounds, and the aforementioned energy ray curable compound (a12) has a functional group with the aforementioned functional group Energy ray hardening groups such as reaction bases and energy ray hardening double bonds.
作為可與其他化合物所具有之基反應之前述官能基,例如可列舉:羥基、羧基、胺基、取代胺基(胺基的1個或2個氫原子被氫原子以外的基取代而成之基)、環氧基等。其中,就防止半導體晶圓或半導體晶片等的電路腐蝕之方面而言,前述官能基較佳為羧基以外的基。 Examples of the functional groups that can react with groups possessed by other compounds include hydroxyl groups, carboxyl groups, amino groups, and substituted amino groups (one or two hydrogen atoms of the amino group are substituted with groups other than hydrogen atoms. Group), epoxy group and the like. Among them, in terms of preventing corrosion of circuits such as semiconductor wafers or semiconductor wafers, the aforementioned functional group is preferably a group other than a carboxyl group.
這些之中,前述官能基較佳為羥基。 Among these, the aforementioned functional group is preferably a hydroxyl group.
.具有官能基之丙烯酸系聚合物(a11) .Acrylic polymers with functional groups (a11)
前述具有官能基之丙烯酸系聚合物(a11)例如可列舉:使前述具有官能基之丙烯酸系單體與前述不具有官能基之丙烯酸系單體進行共聚合而成之聚合物,亦可為除了這些單體以外,進一步使丙烯酸系單體以外的單體(非丙烯酸系單體)進行共聚合而成之聚合物。 The aforementioned acrylic polymer (a11) having a functional group includes, for example, a polymer obtained by copolymerizing the aforementioned acrylic monomer having a functional group and the aforementioned acrylic monomer having no functional group. In addition to these monomers, a polymer obtained by further copolymerizing monomers other than acrylic monomers (non-acrylic monomers).
另外,前述丙烯酸系聚合物(a11)可為無規共聚物,亦可為嵌段共聚物。 In addition, the aforementioned acrylic polymer (a11) may be a random copolymer or a block copolymer.
作為前述具有官能基之丙烯酸系單體,例如可列舉:含羥基之單體、含羧基之單體、含胺基之單體、含取代胺基之單體、含環氧基之單體等。 Examples of the aforementioned acrylic monomer having a functional group include: hydroxyl group-containing monomers, carboxyl group-containing monomers, amine group-containing monomers, substituted amine group-containing monomers, epoxy group-containing monomers, etc. .
作為前述含羥基之單體,例如可列舉:(甲基)丙烯酸羥基甲酯、(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸2-羥基丙酯、(甲基)丙烯酸3-羥基丙酯、(甲基)丙烯酸2-羥基丁酯、(甲基)丙烯酸3-羥基丁酯、(甲基)丙烯酸4-羥基丁酯等(甲基)丙烯酸羥基烷基酯;乙烯醇、烯丙醇等非(甲基)丙烯酸系不飽和醇(不具有(甲基)丙烯醯基骨架之不飽和醇)等。 Examples of the hydroxyl-containing monomer include: hydroxymethyl (meth)acrylate, 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, 3-hydroxypropyl (meth)acrylate Hydroxypropyl (meth)acrylate, 2-hydroxybutyl (meth)acrylate, 3-hydroxybutyl (meth)acrylate, 4-hydroxybutyl (meth)acrylate and other hydroxyalkyl (meth)acrylates; vinyl alcohol, Non-(meth)acrylic unsaturated alcohols such as allyl alcohol (unsaturated alcohols that do not have a (meth)acryloyl skeleton) and the like.
作為前述含羧基之單體,例如可列舉:(甲基)丙烯酸、丁烯酸等乙烯性不飽和單羧酸(具有乙烯性不飽和鍵之單羧酸);反丁烯二酸、衣康酸、順丁烯二酸、檸康酸等乙烯性不飽和二羧酸(具有乙烯性不飽和鍵之二羧酸);前述乙烯性不飽和二羧酸之酐;甲基丙烯酸2-羧基乙酯等(甲基)丙烯酸羧基烷基酯等。 Examples of the aforementioned carboxyl group-containing monomer include: ethylenically unsaturated monocarboxylic acids (monocarboxylic acids having ethylenically unsaturated bonds) such as (meth)acrylic acid and crotonic acid; fumaric acid, itaconic acid, etc. Acid, maleic acid, citraconic acid and other ethylenically unsaturated dicarboxylic acids (dicarboxylic acids with ethylenically unsaturated bonds); anhydrides of the aforementioned ethylenically unsaturated dicarboxylic acids; 2-carboxyethyl methacrylic acid Esters and the like carboxyalkyl (meth)acrylates and the like.
前述具有官能基之丙烯酸系單體較佳為含羥基之單體、含羧基之單體,更佳為含羥基之單體。 The aforementioned acrylic monomer having a functional group is preferably a hydroxyl group-containing monomer or a carboxyl group-containing monomer, and more preferably a hydroxyl group-containing monomer.
構成前述丙烯酸系聚合物(a11)之前述具有官能基之 丙烯酸系單體可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The aforementioned functional group constituting the aforementioned acrylic polymer (a11) The acrylic monomer may be only one type or two or more types; in the case of two or more types, the combination and ratio of these can be arbitrarily selected.
作為前述不具有官能基之丙烯酸系單體,例如可列舉:(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸正丙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第二丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸正辛酯、(甲基)丙烯酸正壬酯、(甲基)丙烯酸異壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十一烷基酯、(甲基)丙烯酸十二烷基酯((甲基)丙烯酸月桂酯)、(甲基)丙烯酸十三烷基酯、(甲基)丙烯酸十四烷基酯((甲基)丙烯酸肉豆蔻酯)、(甲基)丙烯酸十五烷基酯、(甲基)丙烯酸十六烷基酯((甲基)丙烯酸棕櫚酯)、(甲基)丙烯酸十七烷基酯、(甲基)丙烯酸十八烷基酯((甲基)丙烯酸硬脂酯)等構成烷基酯之烷基為碳數為1至18之鏈狀結構之(甲基)丙烯酸烷基酯等。 As the aforementioned acrylic monomer having no functional group, for example, methyl (meth)acrylate, ethyl (meth)acrylate, n-propyl (meth)acrylate, isopropyl (meth)acrylate, N-Butyl (meth)acrylate, isobutyl (meth)acrylate, second butyl (meth)acrylate, tertiary butyl (meth)acrylate, pentyl (meth)acrylate, (meth) Hexyl acrylate, heptyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, isooctyl (meth)acrylate, n-octyl (meth)acrylate, n-nonyl (meth)acrylate , Isononyl (meth)acrylate, decyl (meth)acrylate, undecyl (meth)acrylate, dodecyl (meth)acrylate (lauryl (meth)acrylate), ( Tridecyl (meth)acrylate, tetradecyl (meth)acrylate (myristyl (meth)acrylate), pentadecyl (meth)acrylate, hexadecyl (meth)acrylate Alkyl ester (palmityl (meth)acrylate), heptadecyl (meth)acrylate, stearyl (meth)acrylate (stearyl (meth)acrylate), etc. The group is an alkyl (meth)acrylate with a chain structure of 1 to 18 carbon atoms.
另外,作為前述不具有官能基之丙烯酸系單體,例如亦可列舉:(甲基)丙烯酸甲氧基甲酯、(甲基)丙烯酸甲氧基乙酯、(甲基)丙烯酸乙氧基甲酯、(甲基)丙烯酸乙氧基乙酯等含烷氧基烷基之(甲基)丙烯酸酯;包含(甲基)丙烯酸苯酯等(甲基)丙烯酸芳基酯等之具有芳香族基之(甲基) 丙烯酸酯;非交聯性的(甲基)丙烯醯胺及其衍生物;(甲基)丙烯酸N,N-二甲胺基乙酯、(甲基)丙烯酸N,N-二甲胺基丙酯等非交聯性的具有三級胺基之(甲基)丙烯酸酯等。 In addition, as the aforementioned acrylic monomer having no functional group, for example, methoxymethyl (meth)acrylate, methoxyethyl (meth)acrylate, and ethoxymethyl (meth)acrylate can also be cited. (Meth)acrylates containing alkoxyalkyl groups such as ethoxyethyl (meth)acrylate, etc.; those containing aryl (meth)acrylates such as phenyl (meth)acrylate, etc., have aromatic groups Of (methyl) Acrylate; non-crosslinkable (meth)acrylamide and its derivatives; (meth)acrylic acid N,N-dimethylaminoethyl, (meth)acrylic acid N,N-dimethylaminopropyl Non-crosslinkable (meth)acrylates with tertiary amino groups such as esters.
構成前述丙烯酸系聚合物(a11)之前述不具有官能基之丙烯酸系單體可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The aforementioned acrylic monomer having no functional group constituting the aforementioned acrylic polymer (a11) may be only one type or two or more types; in the case of two or more types, the combination and ratio of these can be arbitrarily selected .
作為前述非丙烯酸系單體,例如可列舉:乙烯、降冰片烯等烯烴;乙酸乙烯酯;苯乙烯等。 Examples of the aforementioned non-acrylic monomers include olefins such as ethylene and norbornene; vinyl acetate; styrene and the like.
構成前述丙烯酸系聚合物(a11)之前述非丙烯酸系單體可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The aforementioned non-acrylic monomer constituting the aforementioned acrylic polymer (a11) may be only one type or two or more types; in the case of two or more types, the combination and ratio of these can be arbitrarily selected.
前述丙烯酸系聚合物(a11)中,由具有前述官能基之丙烯酸系單體衍生之結構單元之量相對於構成該丙烯酸系聚合物(a11)之結構單元之總質」量的比例(含量)較佳為0.1質量%至50質量%,更佳為1質量%至40質量%,尤佳為3質量%至30質量%。藉由前述比例為此種範圍,可將由前述丙烯酸系聚合物(a11)與前述能量線硬化性化合物(a12)之共聚合所獲得之前述丙烯酸系樹脂(a1-1)中能量線硬化性基的含量容易地調節為使保護膜的硬化程度較佳之範圍。 In the aforementioned acrylic polymer (a11), the ratio (content) of the amount of structural units derived from the acrylic monomer having the aforementioned functional group to the total mass of the structural units constituting the acrylic polymer (a11) It is preferably 0.1% by mass to 50% by mass, more preferably 1% by mass to 40% by mass, and particularly preferably 3% by mass to 30% by mass. With the aforementioned ratio in this range, the energy-ray-curable group in the acrylic resin (a1-1) obtained by copolymerization of the aforementioned acrylic polymer (a11) and the aforementioned energy-ray-curable compound (a12) The content of is easily adjusted to a better range for the degree of hardening of the protective film.
構成前述丙烯酸系樹脂(a1-1)之前述丙烯酸系聚合物(a11)可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The acrylic polymer (a11) constituting the acrylic resin (a1-1) may be only one type or two or more types; in the case of two or more types, the combination and ratio of these can be arbitrarily selected.
保護膜形成用組成物(IV-1)中,丙烯酸系樹脂(a1-1)的含量較佳為1質量%至40質量%,更佳為2質量%至30質量%,尤佳為3質量%至20質量%。 In the protective film forming composition (IV-1), the content of the acrylic resin (a1-1) is preferably 1% by mass to 40% by mass, more preferably 2% by mass to 30% by mass, and particularly preferably 3% by mass % To 20% by mass.
‧能量線硬化性化合物(a12) ‧Energy ray hardening compound (a12)
前述能量線硬化性化合物(a12)較佳為具有選自由異氰酸酯基、環氧基及羧基所組成之群組中的1種或2種以上作為可與前述丙烯酸系聚合物(a11)所具有之官能基反應之基,更佳為具有異氰酸酯基作為前述基。於前述能量線硬化性化合物(a12)例如具有異氰酸酯基作為前述基之情形時,該異氰酸酯基與前述具有羥基作為官能基之丙烯酸系聚合物(a11)的該羥基容易反應。 The aforementioned energy ray-curable compound (a12) preferably has one or more selected from the group consisting of isocyanate groups, epoxy groups, and carboxyl groups as those that can be combined with the aforementioned acrylic polymer (a11). The functional group reaction group preferably has an isocyanate group as the aforementioned group. When the energy ray curable compound (a12) has, for example, an isocyanate group as the group, the isocyanate group easily reacts with the hydroxyl group of the acrylic polymer (a11) having a hydroxyl group as a functional group.
前述能量線硬化性化合物(a12)較佳為於1分子中具有1個至5個前述能量線硬化性基,更佳為具有1個至3個前述能量線硬化性基。 The energy ray curable compound (a12) preferably has 1 to 5 energy ray curable groups in one molecule, and more preferably has 1 to 3 energy ray curable groups.
作為前述能量線硬化性化合物(a12),例如可列舉:異氰酸2-甲基丙烯醯氧基乙酯、間-異丙烯基-α,α-二甲基苄基異氰酸酯、甲基丙烯醯基異氰酸酯、異氰酸烯丙酯、 異氰酸1,1-(雙丙烯醯氧基甲基)乙酯;藉由二異氰酸酯化合物或多異氰酸酯化合物與(甲基)丙烯酸羥基乙酯之反應而獲得之丙烯醯基單異氰酸酯化合物;藉由二異氰酸酯化合物或多異氰酸酯化合物、多元醇化合物及(甲基)丙烯酸羥基乙酯之反應而獲得之丙烯醯基單異氰酸酯化合物等。 Examples of the energy ray curable compound (a12) include: 2-methacryloxyethyl isocyanate, m-isopropenyl-α,α-dimethylbenzyl isocyanate, and methacrylic acid Base isocyanate, allyl isocyanate, 1,1-(bisacryloxymethyl)ethyl isocyanate; an acrylic monoisocyanate compound obtained by the reaction of a diisocyanate compound or a polyisocyanate compound and hydroxyethyl (meth)acrylate; Acrylic monoisocyanate compounds etc. obtained by the reaction of diisocyanate compounds or polyisocyanate compounds, polyol compounds and hydroxyethyl (meth)acrylate.
這些之中,前述能量線硬化性化合物(a12)較佳為異氰酸2-甲基丙烯醯氧基乙酯。 Among these, the aforementioned energy ray curable compound (a12) is preferably 2-methacryloxyethyl isocyanate.
構成前述丙烯酸系樹脂(a1-1)之前述能量線硬化性化合物(a12)可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The aforementioned energy ray curable compound (a12) constituting the aforementioned acrylic resin (a1-1) may be only one type or two or more types; in the case of two or more types, the combination and ratio of these can be arbitrarily selected .
前述丙烯酸系樹脂(a1-1)中,源自前述能量線硬化性化合物(a12)之能量線硬化性基的含量相對於源自前述丙烯酸系聚合物(a11)之前述官能基的含量之比例較佳為20莫耳%至120莫耳%,更佳為35莫耳%至100莫耳%,尤佳為50莫耳%至100莫耳%。藉由前述含量比例為此種範圍,由硬化所形成之保護膜的接著力變得更大。再者,於前述能量線硬化性化合物(a12)為一官能(於1分子中具有1個前述基)化合物之情形時,前述含量之比例的上限值成為100莫耳%,但於前述能量線硬化性化合物(a12)為多官能(於1分子中具有2個以上前述基)化合物之情形時,會有前述含量之比例的上限值超過100莫耳%之情形。 In the acrylic resin (a1-1), the ratio of the content of the energy ray curable group derived from the energy ray curable compound (a12) to the content of the functional group derived from the acrylic polymer (a11) It is preferably 20 mol% to 120 mol%, more preferably 35 mol% to 100 mol%, and particularly preferably 50 mol% to 100 mol%. When the aforementioned content ratio is in this range, the adhesive force of the protective film formed by curing becomes greater. In addition, when the energy ray curable compound (a12) is a monofunctional (having one group in one molecule) compound, the upper limit of the ratio of the content becomes 100 mol%, but it is less than the energy When the linear curable compound (a12) is a polyfunctional (having two or more of the aforementioned groups in one molecule) compound, the upper limit of the aforementioned content ratio may exceed 100 mol%.
前述聚合物(a1)的重量平均分子量(Mw)較佳為100000至2000000,更佳為300000至1500000。 The weight average molecular weight (Mw) of the aforementioned polymer (a1) is preferably 100,000 to 2,000,000, more preferably 300,000 to 1,500,000.
於前述聚合物(a1)的至少一部分藉由交聯劑(f)進行交聯之情形時,前述聚合物(a1)可使不符合上述說明之構成前述丙烯酸系聚合物(a11)之任一單體且具有與交聯劑(f)反應之基之單體進行聚合,在與交聯劑(f)反應之基中進行交聯,亦可在源自前述能量線硬化性化合物(a12)之與前述官能基反應之基中進行交聯。 When at least a part of the aforementioned polymer (a1) is cross-linked by a cross-linking agent (f), the aforementioned polymer (a1) can make any one of the aforementioned acrylic polymers (a11) that does not meet the above description It is a monomer and a monomer having a group reactive with the crosslinking agent (f) is polymerized, and crosslinking is performed in the group reactive with the crosslinking agent (f). It may also be derived from the aforementioned energy ray curable compound (a12) Cross-linking is carried out in the group that reacts with the aforementioned functional group.
保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之前述聚合物(a1)可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The aforementioned polymer (a1) contained in the protective film forming composition (IV-1) and the protective film forming film may be only one type or two or more types; in the case of two or more types, these The combination and ratio can be selected arbitrarily.
(具有能量線硬化性基且分子量為100至80000之化合物(a2)) (Compound (a2) with energy ray hardening group and molecular weight of 100 to 80,000)
作為具有能量線硬化性基且分子量為100至80000之化合物(a2)中的前述能量線硬化性基,可列舉包含能量線硬化性雙鍵之基;作為較佳的該基,可列舉(甲基)丙烯醯基、乙烯基等。 As the aforementioned energy-ray-curable group in the compound (a2) having an energy-ray-curable group and a molecular weight of 100 to 80,000, a group containing an energy-ray-curable double bond can be cited; as a preferable group, (former) Base) acryloyl, vinyl and the like.
若前述化合物(a2)滿足上述條件,則並無特別限定,可列舉:具有能量線硬化性基之低分子量化合物、具有能 量線硬化性基之環氧樹脂、具有能量線硬化性基之酚樹脂等。 If the aforementioned compound (a2) satisfies the above conditions, it is not particularly limited. Examples include low-molecular-weight compounds having energy ray-curable groups, Epoxy resin with curable base for measuring line, phenol resin with curable base for energy line, etc.
前述化合物(a2)中,作為具有能量線硬化性基之低分子量化合物,例如可列舉多官能之單體或低聚物等,較佳為具有(甲基)丙烯醯基之丙烯酸酯系化合物。 Among the aforementioned compounds (a2), examples of the low-molecular-weight compound having an energy ray-curable group include polyfunctional monomers or oligomers, and preferably acrylate-based compounds having a (meth)acryloyl group.
作為前述丙烯酸酯系化合物,例如可列舉:甲基丙烯酸2-羥基-3-(甲基)丙烯醯氧基丙酯、聚乙二醇二(甲基)丙烯酸酯、丙氧基化乙氧基化雙酚A二(甲基)丙烯酸酯、2,2-雙[4-((甲基)丙烯醯氧基聚乙氧基)苯基]丙烷、乙氧基化雙酚A二(甲基)丙烯酸酯、2,2-雙[4-((甲基)丙烯醯氧基二乙氧基)苯基]丙烷、9,9-雙[4-(2-(甲基)丙烯醯氧基乙氧基)苯基]茀、2,2-雙[4-((甲基)丙烯醯氧基聚丙氧基)苯基]丙烷、三環癸烷二甲醇二(甲基)丙烯酸酯(三環癸烷二羥甲基二(甲基)丙烯酸酯)、1,10-癸二醇二(甲基)丙烯酸酯、1,6-己二醇二(甲基)丙烯酸酯、1,9-壬二醇二(甲基)丙烯酸酯、二丙二醇二(甲基)丙烯酸酯、三丙二醇二(甲基)丙烯酸酯、聚丙二醇二(甲基)丙烯酸酯、聚丁二醇二(甲基)丙烯酸酯、乙二醇二(甲基)丙烯酸酯、二乙二醇二(甲基)丙烯酸酯、三乙二醇二(甲基)丙烯酸酯、2,2-雙[4-((甲基)丙烯醯氧基乙氧基)苯基]丙烷、新戊二醇二(甲基)丙烯酸酯、乙氧基化聚丙二醇二(甲基)丙烯酸酯、2-羥基-1,3-二(甲基)丙烯醯氧基丙烷等2官能(甲基)丙烯酸酯;異氰脲酸三(2-(甲基)丙烯醯氧基乙基)酯、ε-己內酯改性異氰脲酸三 -(2-(甲基)丙烯醯氧基乙基)酯、乙氧基化甘油三(甲基)丙烯酸酯、季戊四醇三(甲基)丙烯酸酯、三羥甲基丙烷三(甲基)丙烯酸酯、二-三羥甲基丙烷四(甲基)丙烯酸酯、乙氧基化季戊四醇四(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇聚(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯等多官能(甲基)丙烯酸酯;(甲基)丙烯酸胺基甲酸酯低聚物等多官能(甲基)丙烯酸酯低聚物等。 Examples of the acrylate-based compound include: 2-hydroxy-3-(meth)acryloxypropyl methacrylate, polyethylene glycol di(meth)acrylate, and propoxylated ethoxy Bisphenol A bis(meth)acrylate, 2,2-bis[4-((meth)acryloyloxypolyethoxy)phenyl]propane, ethoxylated bisphenol A bis(methyl) )Acrylate, 2,2-bis[4-((meth)acryloyloxydiethoxy)phenyl]propane, 9,9-bis[4-(2-(meth)acryloyloxy) Ethoxy) phenyl] 茀, 2,2-bis[4-((meth) propylene oxypolypropoxy) phenyl] propane, tricyclodecane dimethanol di(meth)acrylate (three Cyclodecane dimethylol di(meth)acrylate), 1,10-decanediol di(meth)acrylate, 1,6-hexanediol di(meth)acrylate, 1,9- Nonanediol di(meth)acrylate, dipropylene glycol di(meth)acrylate, tripropylene glycol di(meth)acrylate, polypropylene glycol di(meth)acrylate, polybutylene glycol di(meth) Acrylate, ethylene glycol di(meth)acrylate, diethylene glycol di(meth)acrylate, triethylene glycol di(meth)acrylate, 2,2-bis[4-((methyl) ) Allyloxyethoxy) phenyl) propane, neopentyl glycol di(meth)acrylate, ethoxylated polypropylene glycol di(meth)acrylate, 2-hydroxy-1,3-bis( 2-functional (meth)acrylates such as meth)acryloxypropane; tris(2-(meth)acryloxyethyl)isocyanurate, ε-caprolactone modified isocyanuric acid three -(2-(meth)acryloxyethyl) ester, ethoxylated glycerol tri(meth)acrylate, pentaerythritol tri(meth)acrylate, trimethylolpropane tri(meth)acrylic acid Ester, di-trimethylolpropane tetra(meth)acrylate, ethoxylated pentaerythritol tetra(meth)acrylate, pentaerythritol tetra(meth)acrylate, dipentaerythritol poly(meth)acrylate, two Multifunctional (meth)acrylates such as pentaerythritol hexa(meth)acrylate; Multifunctional (meth)acrylate oligomers such as (meth)acrylate urethane oligomers, etc.
前述化合物(a2)中,作為具有能量線硬化性基之環氧樹脂、具有能量線硬化性基之酚樹脂,例如可使用「日本特開2013-194102號公報」中的段落0043等中所記載之樹脂。此種樹脂亦符合構成後述之熱硬化性成分(h)之樹脂,但本發明中視作前述化合物(a2)。 Among the aforementioned compounds (a2), as an epoxy resin having an energy ray curable group and a phenol resin having an energy ray curable group, for example, the description in paragraph 0043 of "JP 2013-194102 A" can be used.之resin. Such a resin also corresponds to the resin constituting the thermosetting component (h) described later, but is regarded as the aforementioned compound (a2) in the present invention.
前述化合物(a2)的重量平均分子量較佳為100至30000,更佳為300至10000。 The weight average molecular weight of the aforementioned compound (a2) is preferably 100 to 30,000, more preferably 300 to 10,000.
保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之前述化合物(a2)可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The aforementioned compound (a2) contained in the protective film forming composition (IV-1) and the protective film forming film may be one type or two or more types; in the case of two or more types, a combination of these And the ratio can be chosen arbitrarily.
[不具有能量線硬化性基之聚合物(b)] [Polymer without energy ray curable base (b)]
於保護膜形成用組成物(IV-1)及保護膜形成用膜含有前述化合物(a2)作為前述能量線硬化性成分(a)之情形 時,較佳為進一步亦含有不具有能量線硬化性基之聚合物(b)。 When the protective film forming composition (IV-1) and the protective film forming film contain the aforementioned compound (a2) as the aforementioned energy-ray curable component (a) In this case, it is preferable to further contain a polymer (b) that does not have an energy-ray curable group.
前述聚合物(b)可至少一部分藉由交聯劑(f)進行交聯,亦可不進行交聯。 The aforementioned polymer (b) may be cross-linked at least partially by the cross-linking agent (f), or may not be cross-linked.
作為不具有能量線硬化性基之聚合物(b),例如可列舉:丙烯酸系聚合物、苯氧基樹脂、胺基甲酸酯樹脂、聚酯、橡膠系樹脂、丙烯酸胺基甲酸酯樹脂、聚乙烯醇(PVA)、丁醛樹脂、聚酯胺基甲酸酯樹脂等。 Examples of the polymer (b) that does not have an energy-ray curable group include acrylic polymers, phenoxy resins, urethane resins, polyesters, rubber resins, and acrylic urethane resins. , Polyvinyl alcohol (PVA), butyraldehyde resin, polyester urethane resin, etc.
這些之中,前述聚合物(b)較佳為丙烯酸系聚合物(以下,有時簡稱為「丙烯酸系聚合物(b-1)」)。 Among these, the aforementioned polymer (b) is preferably an acrylic polymer (hereinafter, abbreviated as "acrylic polymer (b-1)" in some cases).
丙烯酸系聚合物(b-1)可為公知的聚合物,例如可為1種丙烯酸系單體的均聚物,亦可為2種以上丙烯酸系單體的共聚物,還可為1種或2種以上丙烯酸系單體與1種或2種以上除丙烯酸系單體以外的單體(非丙烯酸系單體)之共聚物。 The acrylic polymer (b-1) may be a well-known polymer, for example, it may be a homopolymer of one type of acrylic monomer, or a copolymer of two or more types of acrylic monomers, or may be one type or A copolymer of two or more acrylic monomers and one or more monomers (non-acrylic monomers) other than acrylic monomers.
作為構成丙烯酸系聚合物(b-1)之前述丙烯酸系單體,例如可列舉:(甲基)丙烯酸烷基酯、具有環狀骨架之(甲基)丙烯酸酯、含縮水甘油基之(甲基)丙烯酸酯、含羥基之(甲基)丙烯酸酯、含取代胺基之(甲基)丙烯酸酯等。此處,所謂「取代胺基」如上文所說明。 Examples of the aforementioned acrylic monomers constituting the acrylic polymer (b-1) include alkyl (meth)acrylates, (meth)acrylates having a cyclic skeleton, and (meth)acrylates containing glycidyl groups. (Methyl)acrylate, hydroxyl-containing (meth)acrylate, substituted amine-containing (meth)acrylate, etc. Here, the so-called "substituted amino group" is as described above.
作為前述(甲基)丙烯酸烷基酯,例如可列舉:(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸正丙酯、(甲基)丙烯酸異丙酯、(甲基)丙烯酸正丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸第二丁酯、(甲基)丙烯酸第三丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸庚酯、(甲基)丙烯酸2-乙基己酯、(甲基)丙烯酸異辛酯、(甲基)丙烯酸正辛酯、(甲基)丙烯酸正壬酯、(甲基)丙烯酸異壬酯、(甲基)丙烯酸癸酯、(甲基)丙烯酸十一烷基酯、(甲基)丙烯酸十二烷基酯((甲基)丙烯酸月桂酯)、(甲基)丙烯酸十三烷基酯、(甲基)丙烯酸十四烷基酯((甲基)丙烯酸肉豆蔻酯)、(甲基)丙烯酸十五烷基酯、(甲基)丙烯酸十六烷基酯((甲基)丙烯酸棕櫚酯)、(甲基)丙烯酸十七烷基酯、(甲基)丙烯酸十八烷基酯((甲基)丙烯酸硬脂酯)等構成烷基酯之烷基為碳數為1至18之鏈狀結構之(甲基)丙烯酸烷基酯等。 Examples of the aforementioned alkyl (meth)acrylate include: methyl (meth)acrylate, ethyl (meth)acrylate, n-propyl (meth)acrylate, isopropyl (meth)acrylate, ( N-Butyl (meth)acrylate, isobutyl (meth)acrylate, second butyl (meth)acrylate, tertiary butyl (meth)acrylate, amyl (meth)acrylate, (meth)acrylic acid Hexyl ester, heptyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, isooctyl (meth)acrylate, n-octyl (meth)acrylate, n-nonyl (meth)acrylate, Isononyl (meth)acrylate, decyl (meth)acrylate, undecyl (meth)acrylate, dodecyl (meth)acrylate (lauryl (meth)acrylate), (meth)acrylate Base) tridecyl acrylate, tetradecyl (meth)acrylate (myristyl (meth)acrylate), pentadecyl (meth)acrylate, hexadecyl (meth)acrylate Ester (palmityl (meth)acrylate), heptadecyl (meth)acrylate, stearyl (meth)acrylate (stearyl (meth)acrylate), etc. constitute the alkyl group of the alkyl ester It is an alkyl (meth)acrylate with a chain structure of 1 to 18 carbon atoms, etc.
作為前述具有環狀骨架之(甲基)丙烯酸酯,例如可列舉:(甲基)丙烯酸異冰片酯、(甲基)丙烯酸二環戊酯等(甲基)丙烯酸環烷基酯;(甲基)丙烯酸苄酯等(甲基)丙烯酸芳烷基酯;(甲基)丙烯酸二環戊烯酯等(甲基)丙烯酸環烯基酯;(甲基)丙烯酸二環戊烯氧基乙酯等(甲基)丙烯酸環烯氧基烷基酯等。 Examples of (meth)acrylates having a cyclic skeleton include cycloalkyl (meth)acrylates such as isobornyl (meth)acrylate and dicyclopentyl (meth)acrylate; (meth) ) Aralkyl (meth)acrylate such as benzyl acrylate; cycloalkenyl (meth)acrylate such as dicyclopentenyl (meth)acrylate; dicyclopentenoxyethyl (meth)acrylate, etc. (Meth) acrylate cycloalkenyloxy alkyl ester and the like.
作為前述含縮水甘油基之(甲基)丙烯酸酯,例如可列 舉(甲基)丙烯酸縮水甘油酯等。 As the aforementioned (meth)acrylate containing glycidyl groups, for example, Examples include glycidyl (meth)acrylate and the like.
作為前述含羥基之(甲基)丙烯酸酯,例如可列舉:(甲基)丙烯酸羥基甲酯、(甲基)丙烯酸2-羥基乙酯、(甲基)丙烯酸2-羥基丙酯、(甲基)丙烯酸3-羥基丙酯、(甲基)丙烯酸2-羥基丁酯、(甲基)丙烯酸3-羥基丁酯、(甲基)丙烯酸4-羥基丁酯等。 As the aforementioned hydroxyl group-containing (meth)acrylates, for example, hydroxymethyl (meth)acrylate, 2-hydroxyethyl (meth)acrylate, 2-hydroxypropyl (meth)acrylate, (methyl) ) 3-hydroxypropyl acrylate, 2-hydroxybutyl (meth)acrylate, 3-hydroxybutyl (meth)acrylate, 4-hydroxybutyl (meth)acrylate, etc.
作為前述含取代胺基之(甲基)丙烯酸酯,例如可列舉(甲基)丙烯酸N-甲基胺基乙酯等。 Examples of the aforementioned substituted amino group-containing (meth)acrylate include N-methylaminoethyl (meth)acrylate and the like.
作為構成丙烯酸系聚合物(b-1)之前述非丙烯酸系單體,例如可列舉:乙烯、降冰片烯等烯烴;乙酸乙烯酯;苯乙烯等。 Examples of the non-acrylic monomer constituting the acrylic polymer (b-1) include olefins such as ethylene and norbornene; vinyl acetate; styrene.
作為至少一部分藉由交聯劑(f)進行交聯且不具有前述能量線硬化性基之聚合物(b),例如可列舉:前述聚合物(b)中的反應性官能基與交聯劑(f)反應之聚合物。 Examples of the polymer (b) that is at least partly cross-linked by the cross-linking agent (f) and does not have the aforementioned energy-ray curable group include: the reactive functional group in the aforementioned polymer (b) and the cross-linking agent (f) Reactive polymer.
前述反應性官能基根據交聯劑(f)之種類等適宜選擇即可,並無特別限定。例如於交聯劑(f)為多異氰酸酯化合物之情形時,作為前述反應性官能基,可列舉羥基、羧基、胺基等;這些之中,較佳為與異氰酸酯基之反應性高之羥基。另外,於交聯劑(f)為環氧系化合物之情形時,作為前述反應性官能基,可列舉羧基、胺基、醯胺基等;這些之中,較佳為與環氧基之反應性高之羧基。其中,就防止半導體晶圓或半導體晶片的電路腐蝕之方面而言,前述反應 性官能基較佳為羧基以外的基。 The aforementioned reactive functional group may be appropriately selected according to the kind of crosslinking agent (f), etc., and is not particularly limited. For example, when the crosslinking agent (f) is a polyisocyanate compound, as the aforementioned reactive functional group, a hydroxyl group, a carboxyl group, an amino group, etc. can be mentioned; among these, a hydroxyl group having high reactivity with an isocyanate group is preferred. In addition, when the crosslinking agent (f) is an epoxy compound, the reactive functional group may include a carboxyl group, an amino group, an amide group, etc.; among these, the reaction with an epoxy group is preferred Highly carboxyl group. Among them, in terms of preventing the corrosion of the semiconductor wafer or the circuit of the semiconductor wafer, the aforementioned reaction The sexual functional group is preferably a group other than a carboxyl group.
作為具有前述反應性官能基且不具有能量線硬化性基之聚合物(b),例如可列舉:至少使具有前述反應性官能基之單體進行聚合而獲得之聚合物。於丙烯酸系聚合物(b-1)之情形時,作為構成該丙烯酸系聚合物(b-1)之單體所列舉之前述丙烯酸系單體及非丙烯酸系單體的任一者或兩者,使用具有前述反應性官能基之單體即可。作為具有羥基作為反應性官能基之前述聚合物(b),例如可列舉使含羥基之(甲基)丙烯酸酯進行聚合而獲得之聚合物,除此以外,亦可列舉使上文所列舉之前述丙烯酸系單體或非丙烯酸系單體中1個或2個以上氫原子被前述反應性官能基取代而成之單體進行聚合而獲得之聚合物。 As a polymer (b) which has the said reactive functional group and does not have an energy-ray curable group, the polymer obtained by polymerizing at least the monomer which has the said reactive functional group is mentioned, for example. In the case of acrylic polymer (b-1), either or both of the aforementioned acrylic monomers and non-acrylic monomers listed as monomers constituting the acrylic polymer (b-1) It is sufficient to use a monomer having the aforementioned reactive functional group. As the aforementioned polymer (b) having a hydroxyl group as a reactive functional group, for example, a polymer obtained by polymerizing a hydroxyl-containing (meth)acrylate may be mentioned. In addition to this, the above-mentioned polymer may also be mentioned. A polymer obtained by polymerizing a monomer in which one or more hydrogen atoms in the aforementioned acrylic monomer or non-acrylic monomer is substituted with the aforementioned reactive functional group.
具有反應性官能基之前述聚合物(b)中,由具有反應性官能基之單體衍生之結構單元的量相對於構成該聚合物(b)之結構單元的全部量之比例(含量)較佳為1質量%至25質量%,更佳為2質量%至20質量%。藉由前述比例為此種範圍,前述聚合物(b)中交聯程度成為更佳的範圍。 In the aforementioned polymer (b) having a reactive functional group, the ratio (content) of the amount of the structural unit derived from the monomer having the reactive functional group relative to the total amount of the structural unit constituting the polymer (b) It is preferably 1% by mass to 25% by mass, more preferably 2% by mass to 20% by mass. When the aforementioned ratio is in such a range, the degree of crosslinking in the aforementioned polymer (b) becomes a more preferable range.
就保護膜形成用組成物(IV-1)的造膜性更良好之方面而言,不具有能量線硬化性基之聚合物(b)的重量平均分子量(Mw)較佳為10000至2000000,更佳為100000至1500000。 In terms of better film forming properties of the protective film forming composition (IV-1), the weight average molecular weight (Mw) of the polymer (b) that does not have an energy ray curable group is preferably 10,000 to 2,000,000, More preferably, it is 100,000 to 1,500,000.
保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之不具有能量線硬化性基之聚合物(b)可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The composition for forming protective film (IV-1) and the polymer (b) having no energy ray curable group contained in the film for forming protective film may be only one type, or two or more types; in two types In the above case, the combination and ratio of these can be arbitrarily selected.
作為保護膜形成用組成物(IV-1),可列舉含有前述聚合物(a1)及前述化合物(a2)的任一者或兩者之組成物。並且,於保護膜形成用組成物(IV-1)含有前述化合物(a2)之情形時,較佳為亦進而含有不具有能量線硬化性基之聚合物(b),該情形時,亦較佳為進而含有前述(a1)。另外,保護膜形成用組成物(IV-1)亦可不含有前述化合物(a2),且一併含有前述聚合物(a1)及不具有能量線硬化性基之聚合物(b)。 As the composition (IV-1) for forming a protective film, a composition containing either or both of the aforementioned polymer (a1) and aforementioned compound (a2) can be cited. In addition, when the protective film forming composition (IV-1) contains the aforementioned compound (a2), it is preferable to further contain a polymer (b) that does not have an energy-ray curable group. In this case, it is also more It is preferable to further contain the aforementioned (a1). In addition, the composition (IV-1) for forming a protective film may not contain the compound (a2), and may also contain the polymer (a1) and the polymer (b) that does not have an energy ray curable group.
於保護膜形成用組成物(IV-1)含有前述聚合物(a1)、前述化合物(a2)及不具有能量線硬化性基之聚合物(b)之情形時,保護膜形成用組成物(IV-1)中,前述化合物(a2)的含量相對於前述聚合物(a1)及不具有能量線硬化性基之聚合物(b)的總含量100質量份,較佳為10質量份至400質量份,更佳為30質量份至350質量份。 When the protective film forming composition (IV-1) contains the aforementioned polymer (a1), the aforementioned compound (a2), and the polymer (b) without an energy-ray curable group, the protective film forming composition ( In IV-1), the content of the aforementioned compound (a2) is 100 parts by mass relative to the total content of the aforementioned polymer (a1) and the polymer (b) without an energy-ray curable group, preferably 10 parts by mass to 400 Parts by mass, more preferably 30 parts by mass to 350 parts by mass.
保護膜形成用組成物(IV-1)中,前述能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)的合計含量相 對於溶劑以外的成分的總含量之比例(亦即,保護膜形成用膜中的前述能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)的合計含量)較佳為5質量%至90質量%,更佳為10質量%至80質量%,尤佳為15質量%至70質量%,例如可為20質量%至60質量%及25質量%至50質量%之任一者。藉由前述合計含量的比例為此種範圍,保護膜形成用膜的能量線硬化性變得更良好。 In the composition for forming a protective film (IV-1), the total content of the aforementioned energy-ray curable component (a) and the polymer (b) that does not have an energy-ray curable group corresponds to The ratio of the total content of components other than the solvent (that is, the total content of the aforementioned energy ray curable component (a) and the polymer (b) without energy ray curable group in the film for forming a protective film) is preferable It is 5 mass% to 90 mass%, more preferably 10 mass% to 80 mass%, particularly preferably 15 mass% to 70 mass%, for example, it can be 20 mass% to 60 mass% and 25 mass% to 50 mass% Either. When the ratio of the aforementioned total content is in such a range, the energy ray curability of the protective film formation film becomes better.
於保護膜形成用組成物(IV-1)含有前述能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)之情形時,保護膜形成用組成物(IV-1)及保護膜形成用膜中,前述聚合物(b)的含量相對於能量線硬化性成分(a)的含量100質量份,較佳為3質量份至160質量份,更佳為6質量份至130質量份,例如可為15質量份至130質量份、40質量份至130質量份、65質量份至130質量份、及90質量份至130質量份之任一者。藉由前述聚合物(b)的前述含量為此種範圍,保護膜形成用膜的能量線硬化性變得更良好。 When the protective film forming composition (IV-1) contains the aforementioned energy ray curable component (a) and the polymer (b) without an energy ray curable group, the protective film forming composition (IV-1) ) And the protective film forming film, the content of the aforementioned polymer (b) relative to 100 parts by mass of the energy ray curable component (a), preferably 3 parts by mass to 160 parts by mass, more preferably 6 parts by mass To 130 parts by mass, for example, it may be any of 15 parts by mass to 130 parts by mass, 40 parts by mass to 130 parts by mass, 65 parts by mass to 130 parts by mass, and 90 parts by mass to 130 parts by mass. When the content of the polymer (b) is in this range, the energy ray curability of the protective film formation film becomes more favorable.
保護膜形成用組成物(IV-1)中,除了能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)以外,亦可根據目的含有選自由光聚合起始劑(c)、填充材料(d)、偶合劑(e)、交聯劑(f)、著色劑(g)、熱硬化性成分(h)、硬化促進劑(i)及通用添加劑(z)所組成之群組中的1種或2種以 上。 The composition (IV-1) for forming a protective film may contain a photopolymerization initiator according to the purpose in addition to the energy-ray curable component (a) and the polymer (b) without an energy-ray curable group (c), filler (d), coupling agent (e), crosslinking agent (f), coloring agent (g), thermosetting component (h), hardening accelerator (i) and general additives (z) 1 or 2 types in the group on.
例如,藉由使用含有前述能量線硬化性成分(a)及熱硬化性成分(h)之保護膜形成用組成物(IV-1),所形成之保護膜形成用膜藉由加熱而對被接著體之接著力提高,由該保護膜形成用膜形成之保護膜的強度亦提高。 For example, by using the protective film forming composition (IV-1) containing the aforementioned energy ray curable component (a) and thermosetting component (h), the formed protective film forming film is heated against the substrate The adhesive force of the adhering body is improved, and the strength of the protective film formed of the protective film forming film is also improved.
[光聚合起始劑(c)] [Photopolymerization initiator (c)]
作為光聚合起始劑(c),例如可列舉:安息香、安息香甲醚、安息香乙醚、安息香異丙醚、安息香異丁醚、安息香苯甲酸、安息香苯甲酸甲酯、安息香二甲基縮酮等安息香化合物;苯乙酮、2-羥基-2-甲基-1-苯基-丙烷-1-酮、2,2-二甲氧基-1,2-二苯基乙烷-1-酮等苯乙酮化合物;雙(2,4,6-三甲基苯甲醯基)苯基氧化膦、2,4,6-三甲基苯甲醯基二苯基氧化膦等醯基氧化膦化合物;苄基苯基硫化物、一硫化四甲基秋蘭姆等硫化物化合物;1-羥基環己基苯基酮等α-酮醇化合物;偶氮雙異丁腈等偶氮化合物;二茂鈦等二茂鈦化合物;噻噸酮等噻噸酮化合物;二苯甲酮、2-(二甲基胺基)-1-(4-嗎啉(morpholine)基苯基)-2-苄基-1-丁酮、乙酮,1-[9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基]-,1-(O-乙醯基肟)等二苯甲酮化合物;過氧化物化合物;二乙醯等二酮化合物;苯偶醯;二苯偶醯;2,4-二乙基噻噸酮;1,2-二苯基甲烷;2-羥基-2-甲基-1-[4-(1-甲基乙烯基)苯基]丙酮;2-氯蒽醌等。 Examples of the photopolymerization initiator (c) include benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, benzoin benzoic acid, benzoin methyl benzoate, benzoin dimethyl ketal, etc. Benzoin compounds; acetophenone, 2-hydroxy-2-methyl-1-phenyl-propane-1-one, 2,2-dimethoxy-1,2-diphenylethane-1-one, etc. Acetophenone compounds; bis(2,4,6-trimethylbenzyl)phenyl phosphine oxide, 2,4,6-trimethylbenzyl diphenyl phosphine oxide and other phosphine oxide compounds ; Sulfide compounds such as benzyl phenyl sulfide and tetramethylthiuram monosulfide; α-keto alcohol compounds such as 1-hydroxycyclohexyl phenyl ketone; azo compounds such as azobisisobutyronitrile; Titanocene And other titanocene compounds; thioxanthone and other thioxanthone compounds; benzophenone, 2-(dimethylamino)-1-(4-morpholine (morpholine) phenyl)-2-benzyl- 1-Butanone, ethyl ketone, 1-[9-ethyl-6-(2-methylbenzyl)-9H-carbazol-3-yl]-,1-(O-acetyloxime) Benzophenone compounds; peroxide compounds; diketone compounds such as diacetin; benzil; benzil; 2,4-diethylthioxanthone; 1,2-diphenylmethane; 2 -Hydroxy-2-methyl-1-[4-(1-methylvinyl)phenyl]acetone; 2-chloroanthraquinone and the like.
另外,作為光聚合起始劑(c),例如亦可使用1-氯蒽 醌等醌化合物;胺等光增感劑等。 In addition, as the photopolymerization initiator (c), for example, 1-chloroanthracene can also be used Quinone compounds such as quinones; light sensitizers such as amines, etc.
保護膜形成用組成物(IV-1)所含有之光聚合起始劑(c)可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The photopolymerization initiator (c) contained in the protective film forming composition (IV-1) may be only one type or two or more types; in the case of two or more types, the combination and ratio of these may be Free to choose.
於使用光聚合起始劑(c)之情形時,保護膜形成用組成物(IV-1)中,光聚合起始劑(c)的含量相對於能量線硬化性化合物(a)的含量100質量份,較佳為0.01質量份至20質量份,更佳為0.03質量份至10質量份,尤佳為0.05質量份至5質量份。 In the case of using the photopolymerization initiator (c), in the protective film forming composition (IV-1), the content of the photopolymerization initiator (c) is relative to the content of the energy ray curable compound (a) 100 Parts by mass, preferably 0.01 parts by mass to 20 parts by mass, more preferably 0.03 parts by mass to 10 parts by mass, particularly preferably 0.05 parts by mass to 5 parts by mass.
[填充材料(d)] [Filling material (d)]
藉由保護膜形成用膜含有填充材料(d),保護膜形成用膜硬化而獲得之保護膜容易調整熱膨脹係數。並且,藉由使該熱膨脹係數對於保護膜之形成對象物而言最適宜,使用保護膜形成用複合片所獲得之封裝的可靠性進一步提高。另外,藉由保護膜形成用膜含有填充材料(d),可降低保護膜的吸濕率,或提高散熱性。 When the protective film forming film contains the filler (d), the protective film obtained by curing the protective film forming film can easily adjust the thermal expansion coefficient. In addition, by optimizing the thermal expansion coefficient for the object to be formed of the protective film, the reliability of the package obtained by using the composite sheet for forming the protective film is further improved. In addition, when the protective film forming film contains the filler (d), the moisture absorption rate of the protective film can be reduced, or the heat dissipation can be improved.
作為填充材料(d),例如可列舉由導熱性材料構成之材料。 As the filler (d), for example, a material composed of a thermally conductive material can be cited.
填充材料(d)可為有機填充材料及無機填充材料之任一者,較佳為無機填充材料。 The filling material (d) may be any one of an organic filling material and an inorganic filling material, preferably an inorganic filling material.
作為較佳的無機填充材料,例如可列舉:二氧化矽、氧化鋁、滑石、碳酸鈣、鈦白、鐵丹、碳化矽、氮化硼等的粉末;將這些無機填充材料球形化而成之珠粒;這些無機填充材料的表面改質品;這些無機填充材料的單晶纖維;玻璃纖維等。 As preferred inorganic fillers, for example, powders such as silica, alumina, talc, calcium carbonate, titanium dioxide, iron oxide, silicon carbide, boron nitride, etc. can be cited; these inorganic fillers are made by spheroidizing these inorganic fillers. Beads; surface modification products of these inorganic fillers; single crystal fibers of these inorganic fillers; glass fibers, etc.
這些之中,無機填充材料較佳為二氧化矽或氧化鋁。 Among these, the inorganic filler is preferably silica or alumina.
填充材料(d)的平均粒徑並無特別限定,較佳為0.01μm至20μm,更佳為0.1μm至15μm,尤佳為0.3μm至10μm。藉由填充材料(d)的平均粒徑為此種範圍,可維持對保護膜之形成對象物之接著性,並且可抑制保護膜之光之透過率之降低。 The average particle size of the filler (d) is not particularly limited, and is preferably 0.01 μm to 20 μm, more preferably 0.1 μm to 15 μm, and particularly preferably 0.3 μm to 10 μm. When the average particle size of the filler (d) is in this range, the adhesion to the object to be formed of the protective film can be maintained, and the decrease in the light transmittance of the protective film can be suppressed.
再者,本說明書中,所謂「平均粒徑」只要無特別說明則意指藉由雷射繞射散射法所求出之粒度分佈曲線中累計值50%下的粒徑(D50)之值。 In addition, in this specification, the "average particle size" means the value of the particle size (D 50 ) at 50% of the cumulative value in the particle size distribution curve obtained by the laser diffraction scattering method, unless otherwise specified. .
保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之填充材料(d)可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The protective film forming composition (IV-1) and the protective film forming film may contain only one type of filler (d), or two or more types; in the case of two or more types, a combination of these And the ratio can be chosen arbitrarily.
於使用填充材料(d)之情形時,保護膜形成用組成物(IV-1)中,填充材料(d)的含量相對於溶劑以外的全部成分的總含量之比例(亦即,保護膜形成用膜中的填充材料(d)的含量)較佳為5質量%至83質量%,更佳為7質量%至 78質量%,例如可為10質量%至73質量%、25質量%至68質量%、及40質量%至63質量%之任一者。藉由填充材料(d)的含量為此種範圍,更容易調整上述之熱膨脹係數。 When the filler (d) is used, in the protective film forming composition (IV-1), the ratio of the content of the filler (d) to the total content of all components other than the solvent (that is, the protective film is formed) The content of the filler (d) in the film) is preferably 5 mass% to 83 mass%, more preferably 7 mass% to 78% by mass, for example, can be any of 10% to 73% by mass, 25% to 68% by mass, and 40% to 63% by mass. With the content of the filler (d) in this range, it is easier to adjust the above-mentioned coefficient of thermal expansion.
[偶合劑(e)] [Coupling agent (e)]
藉由使用具有可與無機化合物或有機化合物反應之官能基之偶合劑作為偶合劑(e),可提高保護膜形成用膜對被接著體之接著性及密接性。另外,藉由使用偶合劑(e),保護膜形成用膜硬化而獲得之保護膜無損耐熱性而耐水性提高。 By using a coupling agent having a functional group capable of reacting with an inorganic compound or an organic compound as the coupling agent (e), the adhesion and adhesion of the protective film forming film to the adherend can be improved. In addition, by using the coupling agent (e), the protective film obtained by curing the protective film forming film does not impair heat resistance and improves water resistance.
偶合劑(e)較佳為具有可與能量線硬化性成分(a)、不具有能量線硬化性基之聚合物(b)等所具有之官能基反應之官能基之化合物,更佳為矽烷偶合劑。 The coupling agent (e) is preferably a compound having a functional group capable of reacting with the functional group possessed by the energy-ray curable component (a), polymer (b) without an energy-ray curable group, etc., more preferably silane Coupling agent.
作為較佳的前述矽烷偶合劑,例如可列舉:3-縮水甘油氧基丙基三甲氧基矽烷、3-縮水甘油氧基丙基甲基二乙氧基矽烷、3-縮水甘油氧基丙基三乙氧基矽烷、3-縮水甘油氧基甲基二乙氧基矽烷、2-(3,4-環氧環己基)乙基三甲氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-胺基丙基三甲氧基矽烷、3-(2-胺基乙基胺基)丙基三甲氧基矽烷、3-(2-胺基乙基胺基)丙基甲基二乙氧基矽烷、3-(苯基胺基)丙基三甲氧基矽烷、3-苯胺基丙基三甲氧基矽烷、3-脲基丙基三乙氧基矽烷、3-巰基丙基三甲氧基矽烷、3- 巰基丙基甲基二甲氧基矽烷、雙(3-三乙氧基矽烷基丙基)四硫化物、甲基三甲氧基矽烷、甲基三乙氧基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙醯氧基矽烷、咪唑矽烷等。 As a preferred silane coupling agent, for example, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, 3-glycidoxypropyl Triethoxysilane, 3-glycidoxymethyldiethoxysilane, 2-(3,4-epoxycyclohexyl)ethyltrimethoxysilane, 3-methacryloxypropyltrimethyl Oxysilane, 3-aminopropyltrimethoxysilane, 3-(2-aminoethylamino)propyltrimethoxysilane, 3-(2-aminoethylamino)propylmethyl Diethoxysilane, 3-(phenylamino)propyltrimethoxysilane, 3-anilinopropyltrimethoxysilane, 3-ureidopropyltriethoxysilane, 3-mercaptopropyltrimethyl Oxysilane, 3- Mercaptopropylmethyldimethoxysilane, bis(3-triethoxysilylpropyl) tetrasulfide, methyltrimethoxysilane, methyltriethoxysilane, vinyltrimethoxysilane, Vinyl triacetoxysilane, imidazole silane, etc.
保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之偶合劑(e)可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The protective film forming composition (IV-1) and the protective film forming film may contain only one type of coupling agent (e), or two or more types; in the case of two or more types, a combination of these And the ratio can be chosen arbitrarily.
於使用偶合劑(e)之情形時,保護膜形成用組成物(IV-1)及保護膜形成用膜中,偶合劑(e)的含量相對於能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)的總含量100質量份,較佳為0.03質量份至20質量份,更佳為0.05質量份至10質量份,尤佳為0.1質量份至5質量份。藉由偶合劑(e)的前述含量為前述下限值以上,可獲得更顯著的以下由使用偶合劑(e)所帶來之功效:填充材料(d)於樹脂中的分散性提高,或保護膜形成用膜與被接著體之接著性提高等。另外,藉由偶合劑(e)的前述含量為前述上限值以下,可進一步抑制產生逸氣。 When the coupling agent (e) is used, in the protective film forming composition (IV-1) and the protective film forming film, the content of the coupling agent (e) is relative to the energy ray curable component (a) and does not have The total content of the polymer (b) of the energy ray curable base is 100 parts by mass, preferably 0.03 parts by mass to 20 parts by mass, more preferably 0.05 parts by mass to 10 parts by mass, particularly preferably 0.1 parts by mass to 5 parts by mass . With the aforementioned content of the coupling agent (e) above the aforementioned lower limit, the following more significant effects brought about by the use of the coupling agent (e) can be obtained: the dispersibility of the filler (d) in the resin is improved, or The adhesion between the protective film forming film and the adherend is improved. In addition, when the aforementioned content of the coupling agent (e) is not more than the aforementioned upper limit value, the generation of outgassing can be further suppressed.
[交聯劑(f)] [Crosslinking agent (f)]
藉由使用交聯劑(f),使上述之能量線硬化性成分(a)或不具有能量線硬化性基之聚合物(b)進行交聯,可調節保護膜形成用膜的初期接著力及凝聚力。 By using a crosslinking agent (f) to crosslink the above-mentioned energy ray curable component (a) or polymer (b) without an energy ray curable group, the initial adhesive force of the protective film formation film can be adjusted And cohesion.
作為交聯劑(f),例如可列舉:有機多元異氰酸酯化合物、有機多元亞胺化合物、金屬螯合物系交聯劑(具有金屬螯合物結構之交聯劑)、氮丙啶系交聯劑(具有氮丙啶基之交聯劑)等。 Examples of the crosslinking agent (f) include organic polyisocyanate compounds, organic polyimine compounds, metal chelate crosslinking agents (crosslinking agents having a metal chelate structure), and aziridine crosslinking Agent (crosslinking agent with aziridinyl group) and the like.
作為前述有機多元異氰酸酯化合物,例如可列舉:芳香族多元異氰酸酯化合物、脂肪族多元異氰酸酯化合物及脂環族多元異氰酸酯化合物(以下,有時將這些化合物統一簡稱為「芳香族多元異氰酸酯化合物等」);前述芳香族多元異氰酸酯化合物等的三聚物、異氰脲酸酯體及加合物;使前述芳香族多元異氰酸酯化合物等與多元醇化合物反應而獲得之末端異氰酸酯胺基甲酸酯預聚物等。前述「加合物」意指前述芳香族多元異氰酸酯化合物、脂肪族多元異氰酸酯化合物或脂環族多元異氰酸酯化合物,與乙二醇、丙二醇、新戊二醇、三羥甲基丙烷或蓖麻油等含低分子活性氫之化合物之反應物。作為前述加合物的示例,可列舉如後述之三羥甲基丙烷之苯二甲基二異氰酸酯加成物等。另外,所謂「末端異氰酸酯胺基甲酸酯預聚物」意指具有胺基甲酸酯鍵並且於分子末端部具有異氰酸酯基之預聚物。 Examples of the aforementioned organic polyvalent isocyanate compound include: aromatic polyvalent isocyanate compounds, aliphatic polyvalent isocyanate compounds, and alicyclic polyvalent isocyanate compounds (hereinafter, these compounds may be collectively referred to as "aromatic polyvalent isocyanate compounds, etc."); Trimers, isocyanurate bodies, and adducts of the aforementioned aromatic polyvalent isocyanate compounds, etc.; terminal isocyanate urethane prepolymers obtained by reacting the aforementioned aromatic polyvalent isocyanate compounds, etc. with polyol compounds, etc. . The aforementioned "adduct" means the aforementioned aromatic polyisocyanate compound, aliphatic polyisocyanate compound, or alicyclic polyisocyanate compound, which contains ethylene glycol, propylene glycol, neopentyl glycol, trimethylolpropane, or castor oil. The reactant of low-molecular-weight active hydrogen compounds. As an example of the said adduct, the xylylene diisocyanate adduct of trimethylolpropane etc. mentioned later can be mentioned. In addition, the term "terminal isocyanate urethane prepolymer" means a prepolymer having a urethane bond and an isocyanate group at the end of the molecule.
作為前述有機多元異氰酸酯化合物,更具體而言,例如可列舉:2,4-甲苯二異氰酸酯;2,6-甲苯二異氰酸酯;1,3-苯二甲基二異氰酸酯;1,4-二甲苯二異氰酸酯;二苯 基甲烷-4,4'-二異氰酸酯;二苯基甲烷-2,4'-二異氰酸酯;3-甲基二苯基甲烷二異氰酸酯;六亞甲基二異氰酸酯;異佛爾酮二異氰酸酯;二環己基甲烷-4,4'-二異氰酸酯;二環己基甲烷-2,4'-二異氰酸酯;對三羥甲基丙烷等多元醇的全部或一部分羥基,加成甲苯二異氰酸酯、六亞甲基二異氰酸酯及苯二甲基二異氰酸酯的任1種或2種以上而成之化合物;離胺酸二異氰酸酯等。 As the aforementioned organic polyvalent isocyanate compound, more specifically, for example, 2,4-toluene diisocyanate; 2,6-toluene diisocyanate; 1,3-xylylene diisocyanate; 1,4-xylene diisocyanate Isocyanate; diphenyl Methane-4,4'-diisocyanate; diphenylmethane-2,4'-diisocyanate; 3-methyldiphenylmethane diisocyanate; hexamethylene diisocyanate; isophorone diisocyanate; two Cyclohexylmethane-4,4'-diisocyanate; Dicyclohexylmethane-2,4'-diisocyanate; All or part of the hydroxyl groups of polyols such as p-trimethylolpropane, added toluene diisocyanate, hexamethylene Compounds of any one or more of diisocyanate and xylylene diisocyanate; lysine diisocyanate, etc.
作為前述有機多元亞胺化合物,例如可列舉:N,N'-二苯基甲烷-4,4'-雙(1-氮丙啶甲醯胺)、三羥甲基丙烷-三-β-氮丙啶基丙酸酯、四羥甲基甲烷-三-β-氮丙啶基丙酸酯、N,N'-甲苯-2,4-雙(1-氮丙啶甲醯胺)三伸乙基三聚氰胺等。 As the aforementioned organic polyimine compound, for example, N,N'-diphenylmethane-4,4'-bis(1-aziridinemethamide), trimethylolpropane-tri-β-nitrogen Propidinyl propionate, tetramethylolmethane-tris-β-aziridinyl propionate, N,N'-toluene-2,4-bis(1-aziridinylmethamine) triethylene Based on melamine and so on.
於使用有機多元異氰酸酯化合物作為交聯劑(f)之情形時,作為能量線硬化性成分(a)或不具有能量線硬化性基之聚合物(b),較佳為使用含羥基之聚合物。於交聯劑(f)具有異氰酸酯基,能量線硬化性成分(a)或不具有能量線硬化性基之聚合物(b)具有羥基之情形時,藉由交聯劑(f)與能量線硬化性成分(a)或不具有能量線硬化性基之聚合物(b)之反應,可將交聯結構簡便地導入至保護膜形成用膜中。 When an organic polyisocyanate compound is used as the crosslinking agent (f), it is preferable to use a hydroxyl-containing polymer as the energy-ray curable component (a) or polymer (b) that does not have an energy-ray curable group . When the crosslinking agent (f) has an isocyanate group and the energy ray curable component (a) or the polymer (b) without an energy ray curable group has a hydroxyl group, the crosslinking agent (f) and the energy ray The reaction of the curable component (a) or the polymer (b) that does not have an energy-ray curable group can easily introduce a cross-linked structure into the protective film forming film.
保護膜形成用組成物(IV-1)及保護膜形成用膜所含有 之交聯劑(f)可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 Contained in the protective film forming composition (IV-1) and the protective film forming film The crosslinking agent (f) may be only one type or two or more types; in the case of two or more types, the combination and ratio of these can be arbitrarily selected.
於使用交聯劑(f)之情形時,保護膜形成用組成物(IV-1)中,交聯劑(f)的含量相對於能量線硬化性成分(a)及不具有能量線硬化性基之聚合物(b)的總含量100質量份,較佳為0.01質量份至20質量份,更佳為0.1質量份至10質量份,尤佳為0.5質量份至5質量份。藉由交聯劑(f)的前述含量為前述下限值以上,可獲得更顯著的由使用交聯劑(f)所帶來之功效。另外,藉由交聯劑(f)的前述含量為前述上限值以下,可抑制交聯劑(f)之過量使用。 In the case of using the crosslinking agent (f), the content of the crosslinking agent (f) in the protective film forming composition (IV-1) is relative to the energy ray curable component (a) and does not have energy ray curability The total content of the base polymer (b) is 100 parts by mass, preferably 0.01 parts by mass to 20 parts by mass, more preferably 0.1 parts by mass to 10 parts by mass, and particularly preferably 0.5 parts by mass to 5 parts by mass. When the aforementioned content of the cross-linking agent (f) is above the aforementioned lower limit, more significant effects brought about by the use of the cross-linking agent (f) can be obtained. In addition, when the aforementioned content of the crosslinking agent (f) is below the aforementioned upper limit, excessive use of the crosslinking agent (f) can be suppressed.
[著色劑(g)] [Colorant (g)]
作為著色劑(g),例如可列舉:無機系顏料、有機系顏料、有機系染料等公知的著色劑。 As a coloring agent (g), well-known coloring agents, such as an inorganic type pigment, an organic type pigment, an organic type dye, etc. are mentioned, for example.
作為前述有機系顏料及有機系染料,例如可列舉:銨系色素、花青系色素、部花青系色素、克酮鎓(croconium)系色素、方酸鎓(squalilium)系色素、薁鎓系色素、聚次甲基系色素、萘醌系色素、吡喃鎓系色素、酞菁系色素、萘酞菁系色素、萘內醯胺系色素、偶氮系色素、縮合偶氮系色素、靛藍系色素、紫環酮(perinone)系色素、苝系色素、二噁烷(dioxane)系色素、喹吖啶酮系色素、異吲哚啉酮系色素、喹啉黃(quinophthalone)系色素、吡咯系色素、硫代 靛藍系色素、金屬錯合物系色素(金屬錯鹽染料)、二硫醇金屬錯合物系色素、吲哚酚系色素、三烯丙基甲烷系色素、蒽醌系色素、萘酚系色素、次甲基偶氮系色素、苯并咪唑酮系色素、皮蒽酮系色素及士林(threne)系色素等。 Examples of the aforementioned organic pigments and organic dyes include: ammonium-based pigments, cyanine-based pigments, merocyanine-based pigments, croconium-based pigments, squalilium-based pigments, and azulenium-based pigments. Pigments, polymethine pigments, naphthoquinone pigments, pyrylium pigments, phthalocyanine pigments, naphthalocyanine pigments, naphthalene lactam pigments, azo pigments, condensed azo pigments, indigo Pigment, perinone pigment, perylene pigment, dioxane pigment, quinacridone pigment, isoindolinone pigment, quinophthalone pigment, pyrrole Pigment, thio Indigo dyes, metal complex dyes (metal complex salt dyes), dithiol metal complex dyes, indoxyphenol dyes, triallylmethane dyes, anthraquinone dyes, naphthol dyes , Methine azo pigments, benzimidazolone pigments, pyranthrone pigments and threne pigments.
作為前述無機系顏料,例如可列舉:碳黑、鈷系色素、鐵系色素、鉻系色素、鈦系色素、釩系色素、鋯系色素、鉬系色素、釕系色素、鉑系色素、ITO(Indium Tin Oxide;氧化銦錫)系色素、ATO(Antimony Tin Oxide;氧化銻錫)系色素等。 Examples of the aforementioned inorganic pigments include carbon black, cobalt pigments, iron pigments, chromium pigments, titanium pigments, vanadium pigments, zirconium pigments, molybdenum pigments, ruthenium pigments, platinum pigments, ITO (Indium Tin Oxide; Indium Tin Oxide) based pigments, ATO (Antimony Tin Oxide; Antimony Tin Oxide) based pigments, etc.
保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之著色劑(g)可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The coloring agent (g) contained in the protective film forming composition (IV-1) and the protective film forming film may be only one type or two or more types; in the case of two or more types, a combination of these And the ratio can be chosen arbitrarily.
於使用著色劑(g)之情形時,保護膜形成用膜中的著色劑(g)的含量根據目的適宜調節即可。例如,於調節著色劑(g)的含量,調節保護膜的透光性,藉此調節印字視認性之情形時,保護膜形成用組成物(IV-1)中,著色劑(g)的含量相對於溶劑以外的全部成分的總含量之比例(亦即,保護膜形成用膜中的著色劑(g)的含量)較佳為0.1質量%至10質量%,更佳為0.4質量%至7.5質量%,尤佳為0.8質量%至5質量%。藉由著色劑(g)的前述含量為前述下限值以上,可獲得更顯著的由使用著色劑(g)所帶來之 功效。另外,藉由著色劑(g)的前述含量為前述上限值以下,可抑制著色劑(g)之過量使用。 In the case of using a coloring agent (g), the content of the coloring agent (g) in the film for forming a protective film may be appropriately adjusted according to the purpose. For example, when adjusting the content of the coloring agent (g) and adjusting the light transmittance of the protective film to adjust the visibility of printing, the content of the coloring agent (g) in the composition for forming a protective film (IV-1) The ratio with respect to the total content of all components other than the solvent (that is, the content of the coloring agent (g) in the protective film forming film) is preferably 0.1% by mass to 10% by mass, more preferably 0.4% by mass to 7.5% by mass % By mass, and more preferably 0.8% by mass to 5% by mass. By the aforementioned content of the colorant (g) being above the aforementioned lower limit, a more significant effect caused by the use of the colorant (g) can be obtained effect. In addition, since the aforementioned content of the coloring agent (g) is not more than the aforementioned upper limit, the excessive use of the coloring agent (g) can be suppressed.
[熱硬化性成分(h)] [Thermosetting component (h)]
保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之熱硬化性成分(h)可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The thermosetting component (h) contained in the protective film forming composition (IV-1) and the protective film forming film may be only one type or two or more types; in the case of two or more types, these The combination and ratio can be chosen arbitrarily.
作為熱硬化性成分(h),例如可列舉:環氧系熱硬化性樹脂、熱硬化性聚醯亞胺、聚胺基甲酸酯、不飽和聚酯、聚矽氧樹脂等,較佳為環氧系熱硬化性樹脂。 As the thermosetting component (h), for example, epoxy-based thermosetting resins, thermosetting polyimides, polyurethanes, unsaturated polyesters, silicone resins, etc. can be cited, and preferred are Epoxy-based thermosetting resin.
(環氧系熱硬化性樹脂) (Epoxy-based thermosetting resin)
環氧系熱硬化性樹脂係由環氧樹脂(h1)及熱硬化劑(h2)構成。 The epoxy-based thermosetting resin system is composed of an epoxy resin (h1) and a thermosetting agent (h2).
保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之環氧系熱硬化性樹脂可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The epoxy-based thermosetting resin contained in the protective film forming composition (IV-1) and the protective film forming film may be only one type or two or more types; in the case of two or more types, these The combination and ratio can be chosen arbitrarily.
‧環氧樹脂(h1) ‧Epoxy resin (h1)
作為環氧樹脂(h1),可列舉公知的環氧樹脂,例如可列舉:多官能系環氧樹脂、聯苯化合物、雙酚A二縮水甘油醚及其氫化物、鄰甲酚酚醛清漆環氧樹脂、二環戊二烯型環氧樹脂、聯苯型環氧樹脂、雙酚A型環氧樹脂、 雙酚F型環氧樹脂、伸苯基骨架型環氧樹脂等2官能以上之環氧化合物。 As the epoxy resin (h1), well-known epoxy resins can be cited, for example, polyfunctional epoxy resins, biphenyl compounds, bisphenol A diglycidyl ether and its hydrogenated products, ortho-cresol novolac epoxy Resin, dicyclopentadiene type epoxy resin, biphenyl type epoxy resin, bisphenol A type epoxy resin, Epoxy compounds with more than two functions, such as bisphenol F type epoxy resin and phenylene skeleton type epoxy resin.
作為環氧樹脂(h1),亦可使用具有不飽和烴基之環氧樹脂。具有不飽和烴基之環氧樹脂相較於不具有不飽和烴基之環氧樹脂而言,與丙烯酸系樹脂之相容性較高。因此,藉由使用具有不飽和烴基之環氧樹脂,使用保護膜形成用複合片所獲得之封裝的可靠性提高。 As the epoxy resin (h1), an epoxy resin having an unsaturated hydrocarbon group can also be used. Epoxy resins with unsaturated hydrocarbon groups have higher compatibility with acrylic resins than epoxy resins without unsaturated hydrocarbon groups. Therefore, by using an epoxy resin having an unsaturated hydrocarbon group, the reliability of the package obtained by using the composite sheet for forming a protective film is improved.
作為具有不飽和烴基之環氧樹脂,例如可列舉:多官能系環氧樹脂的一部分環氧基更換為具有不飽和烴基之基而成之化合物。此種化合物例如藉由使(甲基)丙烯酸或其衍生物與環氧基進行加成反應而獲得。 As an epoxy resin having an unsaturated hydrocarbon group, for example, a compound in which a part of the epoxy group of a polyfunctional epoxy resin is replaced with a group having an unsaturated hydrocarbon group is exemplified. Such a compound is obtained, for example, by performing an addition reaction of (meth)acrylic acid or a derivative thereof with an epoxy group.
另外,作為具有不飽和烴基之環氧樹脂,例如可列舉:於構成環氧樹脂之芳香環等上直接鍵結有具有不飽和烴基之基之化合物等。 In addition, as an epoxy resin having an unsaturated hydrocarbon group, for example, a compound in which a group having an unsaturated hydrocarbon group is directly bonded to an aromatic ring or the like constituting the epoxy resin can be cited.
不飽和烴基為具有聚合性之不飽和基,作為該不飽和烴基的具體例,可列舉:次乙基(乙烯基)、2-丙烯基(烯丙基)、(甲基)丙烯醯基、(甲基)丙烯醯胺基等,較佳為丙烯醯基。 The unsaturated hydrocarbon group is a polymerizable unsaturated group. Specific examples of the unsaturated hydrocarbon group include ethylene (vinyl), 2-propenyl (allyl), (meth)acrylic, The (meth)acrylamido group, etc., is preferably an acrylamido group.
環氧樹脂(h1)的數量平均分子量並無特別限定,就保護膜形成用膜的硬化性、以及保護膜的強度及耐熱性之方面而言,較佳為300至30000,更佳為400至10000,尤 佳為500至3000。 The number average molecular weight of the epoxy resin (h1) is not particularly limited. In terms of the curability of the protective film forming film, and the strength and heat resistance of the protective film, it is preferably 300 to 30,000, more preferably 400 to 10000, especially Preferably, it is 500 to 3000.
環氧樹脂(h1)的環氧當量較佳為100g/eq至1000g/eq,更佳為150g/eq至800g/eq。 The epoxy equivalent of the epoxy resin (h1) is preferably 100 g/eq to 1000 g/eq, more preferably 150 g/eq to 800 g/eq.
環氧樹脂(h1)可單獨使用1種,亦可併用2種以上;於併用2種以上之情形時,這些之組合及比率可任意選擇。 The epoxy resin (h1) may be used alone or in combination of two or more; when two or more of them are used in combination, the combination and ratio of these can be arbitrarily selected.
‧熱硬化劑(h2) ‧Thermal hardener (h2)
熱硬化劑(h2)發揮作為針對環氧樹脂(h1)之硬化劑的功能。 The thermal hardener (h2) functions as a hardener for the epoxy resin (h1).
作為熱硬化劑(h2),例如可列舉:1分子中具有2個以上可與環氧基反應之官能基之化合物。作為前述官能基,例如可列舉:酚性羥基、醇性羥基、胺基、羧基、酸基經酐化而成之基等,較佳為酚性羥基、胺基、或酸基經酐化而成之基,更佳為酚性羥基或胺基。 As a thermosetting agent (h2), the compound which has 2 or more functional groups which can react with an epoxy group in 1 molecule is mentioned, for example. As the aforementioned functional group, for example, a phenolic hydroxyl group, an alcoholic hydroxyl group, an amino group, a carboxyl group, a group formed by an anhydride of an acid group, etc. are mentioned, preferably a phenolic hydroxyl group, an amino group, or an acid group formed by an anhydride The formed group is more preferably a phenolic hydroxyl group or an amino group.
熱硬化劑(h2)中,作為具有酚性羥基之酚系硬化劑,例如可列舉:多官能酚樹脂、聯苯酚、酚醛清漆型酚樹脂、二環戊二烯系酚樹脂、芳烷基酚樹脂等。 Among the thermosetting agents (h2), as phenolic curing agents having phenolic hydroxyl groups, for example, polyfunctional phenol resins, biphenols, novolac type phenol resins, dicyclopentadiene phenol resins, and aralkylphenols can be cited Resin etc.
熱硬化劑(h2)中,作為具有胺基之胺系硬化劑,例如可列舉:二氰二胺(以下,有時簡稱為「DICY」)等。 In the thermosetting agent (h2), examples of the amine-based curing agent having an amine group include dicyandiamine (hereinafter, abbreviated as "DICY") and the like.
熱硬化劑(h2)亦可具有不飽和烴基。 The thermal hardener (h2) may also have an unsaturated hydrocarbon group.
作為具有不飽和烴基之熱硬化劑(h2),例如可列舉:酚樹脂的一部分羥基被具有不飽和烴基之基取代而成之化合物、酚樹脂的芳香環上直接鍵結具有不飽和烴基之基而成之化合物等。 As the thermosetting agent (h2) having an unsaturated hydrocarbon group, for example, a compound in which a part of the hydroxyl group of a phenol resin is substituted with a group having an unsaturated hydrocarbon group, and a group having an unsaturated hydrocarbon group is directly bonded to the aromatic ring of the phenol resin Compounds and so on.
熱硬化劑(h2)中的前述不飽和烴基與上述之具有不飽和烴基之環氧樹脂中的不飽和烴基相同。 The aforementioned unsaturated hydrocarbon group in the thermosetting agent (h2) is the same as the unsaturated hydrocarbon group in the aforementioned epoxy resin having an unsaturated hydrocarbon group.
於使用酚系硬化劑作為熱硬化劑(h2)之情形時,就保護膜自支持片之剝離性提高之方面而言,熱硬化劑(h2)較佳為軟化點或玻璃轉移溫度高的酚系硬化劑。 When a phenolic hardener is used as the thermosetting agent (h2), in terms of improving the peelability of the protective film from the supporting sheet, the thermosetting agent (h2) is preferably a phenol with a high softening point or glass transition temperature. Department of hardener.
熱硬化劑(h2)中,例如多官能酚樹脂、酚醛清漆型酚樹脂、二環戊二烯系酚樹脂、芳烷基酚樹脂等樹脂成分的數量平均分子量較佳為300至30000,更佳為400至10000,尤佳為500至3000。 In the thermosetting agent (h2), for example, the number average molecular weight of resin components such as polyfunctional phenol resin, novolak type phenol resin, dicyclopentadiene-based phenol resin, aralkylphenol resin, etc. is preferably 300 to 30,000, more preferably It is 400 to 10,000, particularly preferably 500 to 3,000.
熱硬化劑(h2)中,例如,聯苯酚、二氰二胺等非樹脂成分的分子量並無特別限定,例如較佳為60至500。 In the thermosetting agent (h2), for example, the molecular weight of non-resin components such as biphenol and dicyandiamine is not particularly limited. For example, it is preferably 60 to 500.
熱硬化劑(h2)可單獨使用1種,亦可併用2種以上;於併用2種以上之情形時,這些之組合及比率可任意選擇。 The thermosetting agent (h2) may be used alone or in combination of two or more; when two or more of them are used in combination, the combination and ratio of these can be arbitrarily selected.
於使用熱硬化性成分(h)之情形時,保護膜形成用組成物(IV-1)及保護膜形成用膜中,熱硬化劑(h2)的含量相 對於環氧樹脂(h1)的含量100質量份,較佳為0.01質量份至20質量份。 In the case of using the thermosetting component (h), the content of the thermosetting agent (h2) in the protective film formation composition (IV-1) and the protective film formation film With respect to 100 parts by mass of the content of the epoxy resin (h1), it is preferably 0.01 parts by mass to 20 parts by mass.
於使用熱硬化性成分(h)之情形時,保護膜形成用組成物(IV-1)及保護膜形成用膜中,熱硬化性成分(h)的含量(例如,環氧樹脂(h1)及熱硬化劑(h2)的總含量)相對於不具有能量線硬化性基之聚合物(b)的含量100質量份,較佳為1質量份至500質量份。 In the case of using the thermosetting component (h), the content of the thermosetting component (h) in the protective film forming composition (IV-1) and the protective film forming film (for example, epoxy resin (h1) And the total content of the thermosetting agent (h2)) relative to 100 parts by mass of the polymer (b) that does not have an energy ray curable group, preferably 1 part by mass to 500 parts by mass.
[硬化促進劑(i)] [Hardening accelerator (i)]
硬化促進劑(i)係用以調整保護膜形成用膜的硬化速度之成分。 The curing accelerator (i) is a component for adjusting the curing speed of the protective film forming film.
作為較佳的硬化促進劑(i),例如可列舉:三乙二胺、苄基二甲胺、三乙醇胺、二甲胺基乙醇、三(二甲胺基甲基)苯酚等三級胺類;2-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑等咪唑類(1個以上之氫原子由氫原子以外的基取代而成之咪唑);三丁基膦、二苯基膦、三苯基膦等有機膦類(1個以上之氫原子由有機基取代而成之膦);四苯基硼酸四苯基鏻、四苯基硼酸三苯基膦等四苯基硼鹽等。 Examples of preferable hardening accelerators (i) include tertiary amines such as triethylenediamine, benzyldimethylamine, triethanolamine, dimethylaminoethanol, and tris(dimethylaminomethyl)phenol ; 2-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5 -Imidazoles such as hydroxymethylimidazole (imidazoles in which one or more hydrogen atoms are replaced by groups other than hydrogen atoms); organic phosphines such as tributylphosphine, diphenylphosphine, and triphenylphosphine (more than one The hydrogen atoms are substituted by organic groups to form phosphines); tetraphenyl boron salts such as tetraphenyl phosphonium tetraphenyl borate, triphenyl phosphine tetraphenyl borate, etc.
硬化促進劑(i)可單獨使用1種,亦可併用2種以上,於併用2種以上之情形時,這些之組合及比率可任意選 擇。 The hardening accelerator (i) can be used singly, or two or more of them can be used in combination. When two or more of them are used in combination, the combination and ratio of these can be arbitrarily selected select.
於使用硬化促進劑(i)之情形時,保護膜形成用組成物(IV-1)及保護膜形成用膜中的硬化促進劑(i)的含量並無特別限定,根據併用之成分適宜選擇即可。 In the case of using the hardening accelerator (i), the content of the hardening accelerator (i) in the protective film forming composition (IV-1) and the protective film forming film is not particularly limited, and is appropriately selected according to the components used in combination That's it.
[通用添加劑(z)] [General additives (z)]
通用添加劑(z)可為公知的通用添加劑,可根據目的而任意選擇,並無特別限定;作為較佳的通用添加劑,例如可列舉:塑化劑、抗靜電劑、抗氧化劑、吸氣劑等。 The general additives (z) can be well-known general additives, and can be arbitrarily selected according to the purpose, and are not particularly limited; as preferred general additives, for example, plasticizers, antistatic agents, antioxidants, getters, etc. .
保護膜形成用組成物(IV-1)及保護膜形成用膜所含有之通用添加劑(z)可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The protective film forming composition (IV-1) and the general additive (z) contained in the protective film forming film may be only one type or two or more types; in the case of two or more types, a combination of these And the ratio can be chosen arbitrarily.
於使用通用添加劑(z)之情形時,保護膜形成用組成物(IV-1)及保護膜形成用膜中的通用添加劑(z)的含量並無特別限定,根據目的適宜選擇即可。 When a general-purpose additive (z) is used, the content of the general-purpose additive (z) in the protective film forming composition (IV-1) and the protective film forming film is not particularly limited, and may be appropriately selected according to the purpose.
[溶劑] [Solvent]
保護膜形成用組成物(IV-1)較佳為進而含有溶劑。含有溶劑之保護膜形成用組成物(IV-1)的操作性良好。 The composition (IV-1) for forming a protective film preferably further contains a solvent. The solvent-containing protective film forming composition (IV-1) has good operability.
前述溶劑並無特別限定,作為較佳的前述溶劑,例如可列舉:甲苯、二甲苯等烴;甲醇、乙醇、2-丙醇、異丁醇(2-甲基丙烷-1-醇)、1-丁醇等醇;乙酸乙酯等酯;丙酮、甲基乙基酮等酮;四氫呋喃等醚;二甲基甲醯胺、N-甲基 吡咯啶酮等醯胺(具有醯胺鍵之化合物)等。 The aforementioned solvent is not particularly limited. Preferred examples of the aforementioned solvent include hydrocarbons such as toluene and xylene; methanol, ethanol, 2-propanol, isobutanol (2-methylpropane-1-ol), 1 -Alcohols such as butanol; esters such as ethyl acetate; ketones such as acetone and methyl ethyl ketone; ethers such as tetrahydrofuran; dimethylformamide, N-methyl Pyrrolidone and other amides (compounds with amide bonds) and the like.
保護膜形成用組成物(IV-1)所含有之溶劑可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The solvent contained in the composition (IV-1) for forming a protective film may be only one type or two or more types; in the case of two or more types, the combination and ratio of these can be arbitrarily selected.
就可將保護膜形成用組成物(IV-1)中的含有成分更均勻地混合之方面而言,保護膜形成用組成物(IV-1)所含有之溶劑較佳為甲基乙基酮、甲苯或乙酸乙酯等。 The solvent contained in the protective film forming composition (IV-1) is preferably methyl ethyl ketone in terms of allowing the components contained in the protective film forming composition (IV-1) to be more uniformly mixed. , Toluene or ethyl acetate, etc.
<<保護膜形成用組成物的製造方法>> <<Production method of protective film forming composition>>
保護膜形成用組成物(IV-1)等保護膜形成用組成物係藉由將用以構成該保護膜形成用組成物之各成分加以調配而獲得。 The composition for protective film formation, such as the composition for protective film formation (IV-1), is obtained by mixing each component which comprises this composition for protective film formation.
調配各成分時的添加順序並無特別限定,亦可同時添加2種以上之成分。 The order of addition when preparing each component is not particularly limited, and two or more components may be added at the same time.
於使用溶劑之情形時,可藉由下述方式使用:將溶劑與溶劑以外的任一種調配成分混合而將該調配成分預先稀釋;亦可藉由下述方式使用:不將溶劑以外的任一種調配成分預先稀釋而將溶劑與這些調配成分混合。 When a solvent is used, it can be used by the following method: mixing the solvent with any compounding component other than the solvent and diluting the compounding component in advance; it can also be used by the following method: not adding any one other than the solvent The compounding components are diluted in advance, and the solvent is mixed with these compounding components.
調配時混合各成分之方法並無特別限定,自以下公知的方法中適宜選擇即可:使攪拌子或攪拌翼等旋轉而進行混合之方法;使用混合機進行混合之方法;施加超音波進行混合之方法等。 The method of mixing each component during compounding is not particularly limited, and can be appropriately selected from the following known methods: a method of mixing by rotating a stirrer or a stirring blade; a method of mixing using a mixer; mixing by applying ultrasonic waves The method and so on.
關於添加及混合各成分時的溫度及時間,只要不使各 調配成分劣化,則並無特別限定,適宜調節即可,溫度較佳為15℃至30℃。 Regarding the temperature and time when adding and mixing each component, as long as each There is no particular limitation on the deterioration of the compounding components, as long as they are adjusted appropriately, and the temperature is preferably 15°C to 30°C.
◇保護膜形成用膜的製造方法 ◇Method of manufacturing protective film forming film
本發明之保護膜形成用膜可藉由下述方式而製造:於剝離膜(較佳為該剝離膜的剝離處理面)上塗敷保護膜形成用組成物,視需要使保護膜形成用組成物乾燥。此時,藉由調節剝離膜中的保護膜形成用組成物之塗敷面的最大剖面高度(Rt),可形成具有前述表面(β)之保護膜形成用膜。 The film for forming a protective film of the present invention can be produced by applying a composition for forming a protective film on a release film (preferably the release-treated surface of the release film), and if necessary, using the composition for forming a protective film dry. At this time, by adjusting the maximum cross-sectional height (Rt) of the coating surface of the protective film forming composition in the release film, a protective film forming film having the aforementioned surface (β) can be formed.
再者,保護膜形成用膜例如如圖1所示般,通常以於該保護膜形成用膜的雙面貼合有剝離膜之狀態保管。因此,於如上所述般形成於剝離膜上之保護膜形成用膜的露出面(與具備剝離膜之側為相反側的面),進一步貼合剝離膜(較佳為該剝離膜的剝離處理面)即可。 In addition, as shown in FIG. 1, the film for protective film formation is usually stored in a state where a release film is attached to both sides of the film for protective film formation. Therefore, on the exposed surface of the protective film formation film formed on the release film as described above (the side opposite to the side with the release film), a release film is further bonded (preferably the release treatment of the release film) Noodles).
◇保護膜形成用膜的使用方法 ◇How to use the protective film formation film
如上所述,藉由將本發明之保護膜形成用膜設置於支持片,可構成保護膜形成用複合片。保護膜形成用複合片係藉由該保護膜形成用複合片之保護膜形成用膜貼附於半導體晶圓的背面(與電極形成面為相反側的面)而使用。以下,利用與後述之保護膜形成用複合片之情形相同的方法,藉由使保護膜形成用膜硬化而形成保護膜,並進 行切割、附有保護膜的半導體晶片之拾取等,製造目標半導體裝置即可。 As described above, by providing the protective film forming film of the present invention on the support sheet, a composite sheet for forming a protective film can be constructed. The composite sheet for forming a protective film is used by attaching the film for forming a protective film of the composite sheet for forming a protective film to the back surface (the surface opposite to the electrode forming surface) of the semiconductor wafer. Hereinafter, using the same method as in the case of the composite sheet for forming a protective film described later, the protective film is formed by curing the film for forming a protective film. Slicing, picking up of semiconductor wafers with protective films, etc. can be used to manufacture the target semiconductor device.
另一方面,本發明之保護膜形成用膜亦可先設置於半導體晶圓的背面,而並非設置於支持片。亦即,將保護膜形成用膜貼附於半導體晶圓的背面。接著,對保護膜形成用膜照射能量線,使保護膜形成用膜硬化而成為保護膜。接著,於該保護膜的露出面(與貼附於半導體晶圓之側為相反側的面)貼合支持片,藉此製成保護膜形成用膜成為保護膜之狀態之保護膜形成用複合片。以下,與上述同樣地,進行切割、附有保護膜的半導體晶片之拾取等,製造目標半導體裝置即可。 On the other hand, the protective film forming film of the present invention can also be provided on the back surface of the semiconductor wafer first, instead of being provided on the support sheet. That is, the film for forming a protective film is attached to the back surface of the semiconductor wafer. Next, the protective film formation film is irradiated with energy rays to harden the protective film formation film to become a protective film. Next, a support sheet is attached to the exposed surface of the protective film (the side opposite to the side attached to the semiconductor wafer), thereby forming a protective film forming composite in which the protective film forming film becomes a protective film sheet. Hereinafter, in the same manner as described above, dicing, picking up of a protective film-attached semiconductor wafer, etc. may be performed to manufacture the target semiconductor device.
再者,本文對使保護膜形成用膜硬化而成為保護膜後,將該保護膜與支持片貼合之情形進行了說明,但於使用本發明之保護膜形成用膜之情形時,進行這些步驟之順序亦可相反。亦即,將保護膜形成用膜貼附於半導體晶圓的背面後,於保護膜形成用膜的露出面(與貼附於半導體晶圓之側為相反側的面)貼合支持片,藉此製成保護膜形成用膜為未硬化之狀態之保護膜形成用複合片。接著,對保護膜形成用膜照射能量線,使保護膜形成用膜硬化而成為保護膜。以下,與上述同樣地,進行切割、附有保護膜的半導體晶片之拾取等,製造目標半導體裝置即可。 In addition, this article describes the case of bonding the protective film to the support sheet after curing the protective film forming film to become a protective film. However, when the protective film forming film of the present invention is used, these are carried out. The order of the steps can also be reversed. That is, after the protective film forming film is attached to the back surface of the semiconductor wafer, the support sheet is attached to the exposed surface of the protective film forming film (the side opposite to the side attached to the semiconductor wafer), by This is a composite sheet for forming a protective film in which the film for forming a protective film is in an uncured state. Next, the protective film formation film is irradiated with energy rays to harden the protective film formation film to become a protective film. Hereinafter, in the same manner as described above, dicing, picking up of a protective film-attached semiconductor wafer, etc. may be performed to manufacture the target semiconductor device.
◇保護膜形成用複合片 ◇Composite sheet for forming protective film
本發明之保護膜形成用複合片係具備支持片,並於前述支持片上具備前述保護膜形成用膜,且前述保護膜形成用膜的表面(β)與前述支持片相對向,前述表面(β)係對前述保護膜形成用膜照射能量線而成為保護膜時,成為前述保護膜的表面(β')之面。 The composite sheet for forming a protective film of the present invention is provided with a support sheet, the film for forming the protective film is provided on the support sheet, and the surface (β) of the film for forming the protective film faces the support sheet, and the surface (β) ) When the film for forming a protective film is irradiated with energy rays to become a protective film, it becomes the surface (β') of the protective film.
本發明之保護膜形成用複合片被預先賦予作為切割片之功能。 The composite sheet for forming a protective film of the present invention is provided with a function as a dicing sheet in advance.
前述保護膜形成用複合片中,保護膜形成用膜的表面(β)與支持片相對向,藉由照射能量線成為保護膜的表面(β')。 In the composite sheet for forming a protective film, the surface (β) of the film for forming a protective film faces the support sheet, and the surface (β') of the protective film is irradiated with energy rays.
前述保護膜形成用複合片具備前述保護膜形成用膜,藉此保護膜的表面(β')中的雷射印字變得清晰,印字視認性優異。 The composite sheet for forming a protective film includes the film for forming a protective film, whereby the laser printing on the surface (β') of the protective film becomes clear, and the visibility of the printing is excellent.
本發明中,即便於保護膜形成用膜硬化後,只要維持支持片及保護膜形成用膜之硬化物(換言之,支持片及保護膜)之積層結構,則亦將該積層結構體稱為「保護膜形成用複合片」。 In the present invention, even after the protective film formation film is cured, as long as the laminated structure of the support sheet and the cured product of the protective film formation film (in other words, the support sheet and the protective film) is maintained, the laminated structure is also referred to as " Composite sheet for forming protective film".
作為本發明之保護膜形成用複合片之使用對象之半導體晶圓或半導體晶片的厚度並無特別限定,就獲得更顯著的本發明之功效而言,較佳為30μm至1000μm,更佳 為100μm至300μm。 The thickness of the semiconductor wafer or the semiconductor wafer used as the object of the composite sheet for forming a protective film of the present invention is not particularly limited. In terms of obtaining more significant effects of the present invention, it is preferably 30 μm to 1000 μm, more preferably It is 100μm to 300μm.
以下,對保護膜形成用複合片之構成進行詳細說明。 Hereinafter, the structure of the composite sheet for protective film formation is demonstrated in detail.
◎支持片 ◎Support film
前述支持片可由1層(單層)構成,亦可由2層以上之複數層構成。於支持片由複數層構成之情形時,這些複數層相互可相同亦可不同;關於這些複數層之組合,只要無損本發明之功效,則並無特別限定。 The aforementioned support sheet may be composed of one layer (single layer), or may be composed of multiple layers of two or more layers. When the support sheet is composed of multiple layers, these multiple layers may be the same or different from each other; the combination of these multiple layers is not particularly limited as long as the effect of the present invention is not impaired.
作為較佳的支持片,例如可列舉僅由基材構成之支持片。 As a preferable support sheet, for example, a support sheet composed only of a base material can be cited.
以下,參照圖式說明本發明之保護膜形成用複合片之示例。 Hereinafter, examples of the composite sheet for forming a protective film of the present invention will be described with reference to the drawings.
圖2係以示意方式顯示本發明之保護膜形成用複合片的一實施形態之剖面圖。 Fig. 2 is a cross-sectional view schematically showing one embodiment of the composite sheet for forming a protective film of the present invention.
再者,於圖2以後之圖中,對於與既已說明之圖所示相同之構成要素,標附與該已說明之圖之情形相同的符號,並省略該符號的詳細說明。 In addition, in the figures after FIG. 2, the same components as those shown in the previously described figures are assigned the same symbols as in the previously described figures, and detailed descriptions of the symbols are omitted.
此處所示之保護膜形成用複合片1C於基材11上具備保護膜形成用膜13。支持片10僅由基材11構成;換言之,保護膜形成用複合片1C具有於支持片10的一方的表面10a上積層有保護膜形成用膜13之構成。另外,保護
膜形成用複合片1C進一步於保護膜形成用膜13上具備剝離膜15。
The
保護膜形成用複合片1C中,於基材11的一方的表面11a(支持片10的一方的表面10a)積層有保護膜形成用膜13,於保護膜形成用膜13的一方的表面(本說明書中,有時稱為「第1面」)13a的一部分亦即周緣部附近的區域積層有治具用接著劑層16,於保護膜形成用膜13的表面(第1面)13a中未積層治具用接著劑層16之區域及治具用接著劑層16的表面16a(上表面及側面)積層有剝離膜15。
In the protective film forming
保護膜形成用複合片1C中,亦可為:保護膜形成用膜13的另一方的表面(本說明書中,有時稱為「第2面」)亦即保護膜形成用膜13中的與支持片10相對向的表面13b為前述表面(β),保護膜形成用膜13的第1面13a為前述表面(β)。
In the
圖2所示之保護膜形成用複合片1C係以下述方式使用:在移除剝離膜15之狀態下,於保護膜形成用膜13的第1面13a貼附半導體晶圓(省略圖示)的背面,並將治具用接著劑層16的表面16a中的上表面貼附於環狀框等治具。
The
圖3係以示意方式顯示本發明之保護膜形成用複合 片的另一實施形態之剖面圖。 Figure 3 schematically shows the composite for forming a protective film of the present invention A cross-sectional view of another embodiment of the sheet.
關於此處所示之保護膜形成用複合片1D,除了不具備治具用接著劑層16之方面以外,與圖2所示之保護膜形成用複合片1C相同。亦即,保護膜形成用複合片1D中,於基材11的一方的表面11a積層有保護膜形成用膜13,於保護膜形成用膜13的第1面13a的整個面積層有剝離膜15。
The
圖3所示之保護膜形成用複合片1D係以下述方式使用:在移除剝離膜15之狀態下,於保護膜形成用膜13的第1面13a中的中央側的一部分區域貼附半導體晶圓(省略圖示)的背面,並將周緣部附近的區域貼附於環狀框等治具。
The
本發明之保護膜形成用複合片並不限定於圖2至圖3所示之保護膜形成用複合片,在無損本發明之功效之範圍內,亦可變更或刪除圖2至圖3所示之保護膜形成用複合片的一部分構成,或者對前文所說明之保護膜形成用複合片進一步追加其他構成。 The composite sheet for forming a protective film of the present invention is not limited to the composite sheet for forming a protective film shown in FIGS. 2 to 3, and within the scope that does not impair the effect of the present invention, the ones shown in FIGS. 2 to 3 can be changed or deleted A part of the composite sheet for forming a protective film, or another structure is added to the composite sheet for forming a protective film described above.
例如,關於圖2至圖3所示之保護膜形成用複合片,只要無損本發明之功效,則可將支持片、保護膜形成用膜、治具用接著劑層及剝離膜以外之層設置於任意部位。 For example, regarding the composite sheet for forming a protective film shown in FIGS. 2 to 3, as long as the effect of the present invention is not impaired, a supporting sheet, a film for forming a protective film, an adhesive layer for jigs, and a layer other than the release film can be provided In any part.
另外,本發明之保護膜形成用複合片中,亦可於剝離 膜和與該剝離膜直接接觸之層之間產生一部分間隙。 In addition, the composite sheet for forming a protective film of the present invention may also be peeled off There is a gap between the film and the layer directly in contact with the release film.
另外,本發明之保護膜形成用複合片中,各層之大小或形狀可根據目的任意調節。 In addition, in the composite sheet for forming a protective film of the present invention, the size or shape of each layer can be arbitrarily adjusted according to the purpose.
支持片可為透明亦可為不透明,還可根據目的而著色。 The support sheet can be transparent or opaque, and can be colored according to the purpose.
其中,保護膜形成用膜具有能量線硬化性之本發明中,支持片較佳為使能量線透過。 Among them, in the present invention in which the film for forming a protective film has energy ray curability, the support sheet preferably allows energy ray to pass through.
例如支持片中,波長375nm之光之透過率較佳為30%以上,更佳為50%以上,尤佳為70%以上。藉由前述光之透過率為此種範圍,經由支持片對保護膜形成用膜照射能量線(紫外線)時,保護膜形成用膜之硬化度進一步提高。 For example, in the support sheet, the transmittance of light with a wavelength of 375 nm is preferably 30% or more, more preferably 50% or more, and particularly preferably 70% or more. With the aforementioned light transmittance in this range, when energy rays (ultraviolet rays) are irradiated to the protective film forming film through the support sheet, the degree of curing of the protective film forming film is further improved.
另一方面,支持片中,波長375nm之光之透過率的上限值並無特別限定。例如前述光之透過率可為95%以下。 On the other hand, in the support sheet, the upper limit of the transmittance of light with a wavelength of 375 nm is not particularly limited. For example, the transmittance of the aforementioned light may be 95% or less.
另外,支持片中,波長532nm之光之透過率較佳為30%以上,更佳為50%以上,尤佳為70%以上。藉由前述光之透過率為此種範圍,經由支持片對保護膜形成用膜或保護膜照射雷射光而於這些進行印字時,可更清晰地進行印字。 In addition, in the support sheet, the transmittance of light with a wavelength of 532 nm is preferably 30% or more, more preferably 50% or more, and particularly preferably 70% or more. With the light transmittance in this range, the protective film forming film or the protective film is irradiated with laser light through the support sheet, and printing can be performed more clearly when these are printed.
另一方面,支持片中,波長532nm之光之透過率的上限值並無特別限定。例如前述光之透過率可為95%以 下。 On the other hand, in the support sheet, the upper limit of the transmittance of light with a wavelength of 532 nm is not particularly limited. For example, the transmittance of the aforementioned light can be above 95% under.
另外,支持片中,波長1064nm之光之透過率較佳為30%以上,更佳為50%以上,尤佳為70%以上。藉由前述光之透過率為此種範圍,經由支持片對保護膜形成用膜或保護膜照射雷射光而於這些進行印字時,可更清晰地進行印字。 In addition, in the support sheet, the transmittance of light with a wavelength of 1064 nm is preferably 30% or more, more preferably 50% or more, and particularly preferably 70% or more. With the light transmittance in this range, the protective film forming film or the protective film is irradiated with laser light through the support sheet, and printing can be performed more clearly when these are printed.
另一方面,支持片中,波長1064nm之光之透過率的上限值並無特別限定。例如前述光之透過率可為95%以下。 On the other hand, in the support sheet, the upper limit of the transmittance of light with a wavelength of 1064 nm is not particularly limited. For example, the transmittance of the aforementioned light may be 95% or less.
如後述之製造方法般,於藉由於支持片的表面塗敷保護膜形成用組成物,並視需要使之乾燥而形成保護膜形成用膜之情形時,較佳為將支持片中的保護膜形成用組成物之塗敷面的最大剖面高度(Rt)設為例如相對於表面(β)的目標最大剖面高度(Rt)之值僅小0.5之值至僅大0.5之值之範圍內。藉此,可將表面(β)的最大剖面高度(Rt)更容易地調節為目標值。 As in the manufacturing method described later, when the protective film forming composition is coated on the surface of the support sheet and dried as necessary to form the protective film forming film, it is preferable to use the protective film in the support sheet The maximum cross-sectional height (Rt) of the coating surface of the forming composition is set to, for example, the target maximum cross-sectional height (Rt) with respect to the surface (β) is within a range of only 0.5 to a value greater than 0.5. Thereby, the maximum cross-sectional height (Rt) of the surface (β) can be adjusted to the target value more easily.
作為支持片中的保護膜形成用組成物之塗敷面,例如可列舉前述基材的表面。 Examples of the coating surface of the protective film forming composition in the support sheet include the surface of the aforementioned substrate.
如後述之製造方法般,不於支持片的表面塗敷保護膜形成用組成物,而形成保護膜形成用膜之情形時,支持片的表面(與保護膜形成用膜相對向的面、及與該表面為相 反側的面)的最大剖面高度(Rt)並無特別限定,例如可與上述之保護膜形成用組成物之塗敷面相同。 As in the manufacturing method described later, when the protective film formation composition is not applied to the surface of the support sheet, and the protective film formation film is formed, the surface of the support sheet (the surface facing the protective film formation film, and Phase with the surface The maximum cross-sectional height (Rt) of the surface on the opposite side) is not particularly limited, and may be the same as the coating surface of the composition for forming a protective film described above, for example.
支持片的表面的最大剖面高度(Rt)例如可利用與上述之剝離膜的表面的最大剖面高度(Rt)之情形相同的方法進行調節。 The maximum cross-sectional height (Rt) of the surface of the support sheet can be adjusted by the same method as the case of the above-mentioned maximum cross-sectional height (Rt) of the surface of the release film, for example.
其次,對構成支持片之層更詳細地進行說明。 Next, the layers constituting the support sheet will be described in more detail.
○基材 ○Substrate
前述基材為片狀或膜狀,作為前述基材的構成材料,例如可列舉各種樹脂。 The substrate is in a sheet shape or a film shape, and as a constituent material of the substrate, various resins can be cited, for example.
作為前述樹脂,例如可列舉:低密度聚乙烯(LDPE;low density polyethylene)、直鏈低密度聚乙烯(LLDPE;linear low density polyethylene)、高密度聚乙烯(HDPE;high density polyethylene)等聚乙烯;聚丙烯、聚丁烯、聚丁二烯、聚甲基戊烯、冰片烯樹脂等聚乙烯以外的聚烯烴;乙烯-乙酸乙烯酯共聚物、乙烯-(甲基)丙烯酸共聚物、乙烯-(甲基)丙烯酸酯共聚物、乙烯-冰片烯共聚物等乙烯系共聚物(使用乙烯作為單體而獲得之共聚物);聚氯乙烯、氯乙烯共聚物等氯乙烯系樹脂(使用氯乙烯作為單體而獲得之樹脂);聚苯乙烯;聚環烯烴;聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯、聚對苯二甲酸丁二酯、聚間苯二甲酸乙二酯、聚2,6-萘二羧酸乙二酯、全部結構單元具有芳香族環式基之全芳香族聚酯等聚酯;2種以上之前述聚酯之 共聚物;聚(甲基)丙烯酸酯;聚胺基甲酸酯;聚丙烯酸胺基甲酸酯;聚醯亞胺;聚醯胺;聚碳酸酯;氟樹脂;聚縮醛;改質聚苯醚;聚苯硫醚;聚碸;聚醚酮等。 Examples of the aforementioned resin include polyethylenes such as low density polyethylene (LDPE; low density polyethylene), linear low density polyethylene (LLDPE), and high density polyethylene (HDPE; high density polyethylene); Polyolefins other than polyethylene such as polypropylene, polybutene, polybutadiene, polymethylpentene, and bornene resin; ethylene-vinyl acetate copolymer, ethylene-(meth)acrylic acid copolymer, ethylene-( Vinyl copolymers such as meth)acrylate copolymers and ethylene-bornene copolymers (copolymers obtained by using ethylene as a monomer); vinyl chloride resins such as polyvinyl chloride and vinyl chloride copolymers (using vinyl chloride as a monomer) Resin obtained from monomer); polystyrene; polycyclic olefin; polyethylene terephthalate, polyethylene naphthalate, polybutylene terephthalate, polyethylene isophthalate , Polyethylene 2,6-naphthalene dicarboxylate, wholly aromatic polyesters with aromatic cyclic groups in all structural units; among two or more of the aforementioned polyesters Copolymer; Poly(meth)acrylate; Polyurethane; Polyacrylate urethane; Polyimide; Polyamide; Polycarbonate; Fluorine resin; Polyacetal; Modified polyphenylene Ether; polyphenylene sulfide; polysulfide; polyether ketone, etc.
另外,作為前述樹脂,例如亦可列舉前述聚酯與前述聚酯以外的樹脂之混合物等聚合物合金。前述聚酯與前述聚酯以外的樹脂之聚合物合金較佳為聚酯以外的樹脂之量為相對較少量。 Moreover, as said resin, polymer alloys, such as a mixture of the said polyester and resin other than the said polyester, can also be mentioned, for example. The polymer alloy of the polyester and the resin other than the polyester preferably has a relatively small amount of the resin other than the polyester.
另外,作為前述樹脂,例如亦可列舉:前文所例示之前述樹脂之1種或2種以上交聯而成之交聯樹脂;使用前文所例示之前述樹脂之1種或2種以上之離子聚合物等改質樹脂。 In addition, as the aforementioned resin, for example, a cross-linked resin obtained by cross-linking one or more of the aforementioned resins as exemplified above; and ionic polymerization using one or more of the aforementioned resins exemplified in the foregoing Modified resin such as materials.
再者,本說明書中,「(甲基)丙烯酸」的概念係包括「丙烯酸」及「甲基丙烯酸」兩者。關於與(甲基)丙烯酸類似之用語亦相同。 Furthermore, in this specification, the concept of "(meth)acrylic acid" includes both "acrylic acid" and "methacrylic acid". The same applies to terms similar to (meth)acrylic acid.
構成基材之樹脂可僅為1種,亦可為2種以上;於為2種以上之情形時,這些之組合及比率可任意選擇。 The resin constituting the substrate may be only one type or two or more types; in the case of two or more types, the combination and ratio of these can be arbitrarily selected.
基材可由1層(單層)構成,亦可由2層以上之複數層構成;於由複數層構成之情形時,這些複數層相互可相同亦可不同;這些複數層之組合並無特別限定。 The substrate may be composed of one layer (single layer), or two or more layers; when it is composed of multiple layers, these multiple layers may be the same or different from each other; the combination of these multiple layers is not particularly limited.
基材的厚度較佳為50μm至300μm,更佳為60μm 至100μm。藉由基材的厚度為此種範圍,前述保護膜形成用複合片的可撓性、及對半導體晶圓或半導體晶片之貼附性進一步提高。 The thickness of the substrate is preferably 50 μm to 300 μm, more preferably 60 μm To 100μm. When the thickness of the base material is in this range, the flexibility of the composite sheet for forming a protective film and the adhesion to the semiconductor wafer or the semiconductor wafer are further improved.
此處,所謂「基材的厚度」意指基材整體的厚度,例如所謂由複數層構成之基材的厚度意指構成基材之全部層的合計厚度。 Here, the "thickness of the base material" means the thickness of the entire base material. For example, the thickness of the base material composed of a plurality of layers means the total thickness of all the layers constituting the base material.
基材較佳為厚度精度高,亦即任何部位均可抑制厚度不均。上述之構成材料中,作為可用於構成此種厚度精度高的基材之材料,例如可列舉:聚乙烯、聚乙烯以外的聚烯烴、聚對苯二甲酸乙二酯、乙烯-乙酸乙烯酯共聚物等。 The base material preferably has high thickness accuracy, that is, thickness unevenness can be suppressed at any part. Among the above-mentioned constituent materials, examples of materials that can be used to construct such a substrate with high thickness precision include polyethylene, polyolefins other than polyethylene, polyethylene terephthalate, and ethylene-vinyl acetate copolymers. Things and so on.
基材中,除了前述樹脂等主要構成材料以外,亦可含有填充材料、著色劑、抗靜電劑、抗氧化劑、有機潤滑劑、觸媒、軟化劑(塑化劑)等公知的各種添加劑。 The base material may contain various known additives such as fillers, colorants, antistatic agents, antioxidants, organic lubricants, catalysts, and softeners (plasticizers) in addition to the aforementioned main constituent materials such as resins.
基材的光學特性滿足前文所說明之支持片的光學特性即可。亦即,基材可為透明亦可為不透明,還可根據目的而著色,也可蒸鍍其他層。 The optical properties of the substrate may satisfy the optical properties of the support sheet described above. That is, the substrate may be transparent or opaque, and may be colored according to the purpose, and other layers may be vapor-deposited.
並且,保護膜形成用膜具有能量線硬化性之本發明中,基材較佳為使能量線透過。 Furthermore, in the present invention in which the film for forming a protective film has energy ray curability, it is preferable that the base material transmits energy rays.
基材可利用公知的方法進行製造。例如,含有樹脂之基材可藉由使含有前述樹脂之樹脂組成物成形而進行製 造。 The base material can be manufactured by a known method. For example, a resin-containing substrate can be manufactured by molding a resin composition containing the aforementioned resin Made.
◇保護膜形成用複合片的製造方法 ◇Method for manufacturing composite sheet for protective film formation
本發明之保護膜形成用複合片可藉由將上述各層以成為對應的位置關係之方式依序積層而製造。各層之形成方法如前文所說明。 The composite sheet for forming a protective film of the present invention can be produced by sequentially stacking the above-mentioned layers so as to have a corresponding positional relationship. The formation method of each layer is as described above.
於製造於支持片上積層保護膜形成用膜而成之保護膜形成用複合片之情形時,例如於支持片上塗敷保護膜形成用組成物,並視需要使保護膜形成用組成物乾燥,藉此獲得前述保護膜形成用複合片。此時,藉由如前文所說明般調節支持片中的保護膜形成用組成物之塗敷面的最大剖面高度(Rt),可形成具有前述表面(β)之保護膜形成用膜。 In the case of manufacturing a composite sheet for forming a protective film formed by laminating a film for forming a protective film on a support sheet, for example, a composition for forming a protective film is coated on the support sheet, and the composition for forming a protective film is dried as necessary, and In this way, the aforementioned composite sheet for forming a protective film was obtained. At this time, by adjusting the maximum cross-sectional height (Rt) of the coating surface of the protective film forming composition in the support sheet as described above, a protective film forming film having the aforementioned surface (β) can be formed.
另外,於製造於支持片上積層保護膜形成用膜而成之保護膜形成用複合片之情形時,亦可藉由下述方式而獲得前述保護膜形成用複合片:於剝離膜(較佳為該剝離膜的剝離處理面)上塗敷保護膜形成用組成物,並視需要使保護膜形成用組成物乾燥,藉此於剝離膜上預先形成保護膜形成用膜,將該保護膜形成用膜的露出面與支持片的一方的表面貼合。但是,此時以使保護膜形成用膜的露出面(與設置有剝離膜之側為相反側的表面)的最大剖面高度(Rt)成為前述表面(β)的最大剖面高度(Rt)之方式進行調節。 In addition, in the case of manufacturing a composite sheet for forming a protective film formed by laminating a film for forming a protective film on a support sheet, the composite sheet for forming a protective film can also be obtained by the following method: on a release film (preferably The protective film forming composition is applied to the peeling treatment surface of the peeling film, and the protective film forming composition is dried if necessary, thereby forming a protective film forming film on the peeling film in advance, and the protective film forming film The exposed surface of the support sheet is attached to the surface of one side of the support sheet. However, at this time, the maximum cross-sectional height (Rt) of the exposed surface of the protective film forming film (the surface opposite to the side where the release film is provided) is the maximum cross-sectional height (Rt) of the aforementioned surface (β) Make adjustments.
於形成保護膜形成用膜後的任意時間點移除剝離膜即可。 The release film may be removed at any point after the protective film formation film is formed.
再者,保護膜形成用複合片通常以如下狀態保管:於該保護膜形成用複合片中的與支持片為相反側的最表層(例如保護膜形成用膜)的表面貼合有剝離膜之狀態。因此,亦可藉由下述方式而獲得保護膜形成用複合片:於該剝離膜(較佳為該剝離膜的剝離處理面)上,塗敷保護膜形成用組成物等用以形成構成最表層之層之組成物,並視需要使組成物乾燥,藉此於剝離膜上形成構成最表層之層,於該層中的與和剝離膜接觸之側為相反側的露出面上積層剩餘之各層,不移除剝離膜而保持貼合之狀態不變。 In addition, the composite sheet for forming a protective film is usually stored in a state in which a release film is attached to the surface of the outermost layer (for example, the film for forming a protective film) on the opposite side of the supporting sheet in the composite sheet for forming a protective film. status. Therefore, a composite sheet for forming a protective film can also be obtained by coating the release film (preferably the release-treated surface of the release film) with a composition for forming a protective film, etc., to form the most The composition of the surface layer layer, and drying the composition as necessary, to form the outermost layer on the release film, and the remaining layer is laminated on the exposed surface of the layer opposite to the side in contact with the release film Each layer does not remove the release film and keeps the state of being attached.
◇保護膜形成用複合片的使用方法 ◇How to use the composite sheet for protective film formation
本發明之保護膜形成用複合片例如可利用以下所示之方法使用。 The composite sheet for forming a protective film of the present invention can be used, for example, by the method shown below.
亦即,將保護膜形成用複合片藉由該保護膜形成用複合片之保護膜形成用膜貼附於半導體晶圓的背面(與電極形成面為相反側的面)。接著,對保護膜形成用膜照射能量線,使保護膜形成用膜硬化而成為保護膜。接著,藉由切割,將半導體晶圓連同保護膜一起分割而製成半導體晶片。然後,將半導體晶片在保持貼附有該保護膜之狀態(亦即以附有保護膜的半導體晶片之形式)下直接自支持片拉離而進行拾取。 That is, the composite sheet for protective film formation is attached to the back surface of the semiconductor wafer (the surface opposite to the electrode formation surface) through the protective film formation film of the composite sheet for protective film formation. Next, the protective film formation film is irradiated with energy rays to harden the protective film formation film to become a protective film. Then, by dicing, the semiconductor wafer and the protective film are divided together to form a semiconductor wafer. Then, the semiconductor wafer is directly pulled away from the support sheet for picking up while maintaining the state where the protective film is attached (that is, in the form of a semiconductor wafer with a protective film).
以下,利用與先前法相同的方法,將所獲得之附有保護膜的半導體晶片的半導體晶片倒裝晶片連接於基板的電路面後,藉此製成半導體封裝。然後,使用該半導體封裝,製作目標半導體裝置即可。 Hereinafter, using the same method as the previous method, the obtained semiconductor wafer of the semiconductor wafer with a protective film is flip-chip connected to the circuit surface of the substrate, thereby forming a semiconductor package. Then, the semiconductor package can be used to manufacture the target semiconductor device.
再者,本文中對使保護膜形成用膜硬化而成為保護膜後進行切割之情形進行了說明,但於使用本發明之保護膜形成用複合片之情形時,進行這些步驟之順序亦可相反。亦即,於半導體晶圓的背面貼附保護膜形成用複合片後,藉由切割將半導體晶圓連同保護膜形成用膜一起分割而製成半導體晶片。接著,對已分割之保護膜形成用膜照射能量線,使保護膜形成用膜硬化而成為保護膜。以下,與上述同樣地,將附有保護膜的半導體晶片自支持片拉離而進行拾取,製作目標半導體裝置即可。 In addition, this article describes the case where the protective film formation film is cured to become a protective film and then cut. However, when the composite sheet for protective film formation of the present invention is used, the order of performing these steps may be reversed. . That is, after attaching the protective film forming composite sheet to the back surface of the semiconductor wafer, the semiconductor wafer is divided together with the protective film forming film by dicing to produce a semiconductor wafer. Next, the divided film for forming a protective film is irradiated with energy rays to harden the film for forming a protective film to become a protective film. Hereinafter, in the same manner as described above, the semiconductor wafer with the protective film is pulled away from the support sheet and picked up to produce the target semiconductor device.
以下,藉由具體的實施例對本發明進行更詳細的說明。但是,本發明並不受以下所示之實施例之任何限定。 Hereinafter, the present invention will be described in more detail through specific embodiments. However, the present invention is not limited at all by the examples shown below.
以下表示用於製造保護膜形成用組成物之成分。 The components used to manufacture the protective film forming composition are shown below.
‧能量線硬化性成分 ‧Energy ray hardening ingredients
(a2)-1:三環癸烷二羥甲基二丙烯酸酯(日本化藥公司製造之「KAYARAD R-684」,2官能紫外線硬化性化合物,分子量304)。 (a2)-1: Tricyclodecane dimethylol diacrylate ("KAYARAD R-684" manufactured by Nippon Kayaku Co., Ltd., a bifunctional ultraviolet curable compound, molecular weight 304).
‧不具有能量線硬化性基之聚合物 ‧Polymer without energy ray hardening base
(b)-1:使丙烯酸丁酯(以下,簡稱為「BA」)(10質量份)、丙烯酸甲酯(以下,簡稱為「MA」)(70質量份)、甲基丙烯酸縮水甘油酯(以下,簡稱為「GMA」)(5質量份)及丙烯酸-2-羥基乙酯(以下,簡稱為「HEA」)(15質量份)進行共聚合而成之丙烯酸系聚合物(重量平均分子量300000,玻璃轉移溫度-1℃)。 (b)-1: Make butyl acrylate (hereinafter referred to as "BA") (10 parts by mass), methyl acrylate (hereinafter referred to as "MA") (70 parts by mass), and glycidyl methacrylate ( Hereinafter referred to as "GMA") (5 parts by mass) and 2-hydroxyethyl acrylate (hereinafter referred to as "HEA") (15 parts by mass) copolymerized acrylic polymer (weight average molecular weight 300,000) , Glass transition temperature -1℃).
(b)-2:使MA(85質量份)及HEA(15質量份)進行共聚合而成之丙烯酸系聚合物(重量平均分子量370000,玻璃轉移溫度6℃)。 (b)-2: Acrylic polymer obtained by copolymerizing MA (85 parts by mass) and HEA (15 parts by mass) (weight average molecular weight 370,000, glass transition temperature 6°C).
‧光聚合起始劑 ‧Photopolymerization initiator
(c)-1:2-(二甲基胺基)-1-(4-嗎啉基苯基)-2-苄基-1-丁酮(BASF公司製造之「Irgacure(註冊商標)369」)。 (c)-1: 2-(Dimethylamino)-1-(4-morpholinylphenyl)-2-benzyl-1-butanone ("Irgacure (registered trademark) 369" manufactured by BASF Corporation ).
(c)-2:乙酮,1-[9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基]-,1-(O-乙醯基肟)(BASF公司製造之「Irgacure(註冊商標)OXE02」)。 (c)-2: Ethyl ketone, 1-[9-ethyl-6-(2-methylbenzyl)-9H-carbazol-3-yl]-,1-(O-acetyloxime ) ("Irgacure (registered trademark) OXE02" manufactured by BASF Corporation).
‧填充材料 ‧Filler
(d)-1:二氧化矽填料(溶融石英填料,平均粒徑8μm)。 (d)-1: Silica filler (fused silica filler, average particle size 8μm).
(d)-2:球狀二氧化矽填料(Admatechs公司製造之「SC2050MA」,平均粒徑0.5μm)。 (d)-2: Spherical silica filler ("SC2050MA" manufactured by Admatechs, with an average particle size of 0.5μm).
‧偶合劑 ‧Coupling agent
(e)-1:3-甲基丙烯醯氧基丙基三甲氧基矽烷(信越化學工業公司製造之「KBM-503」,矽烷偶合劑)。 (e)-1: 3-methacryloxypropyltrimethoxysilane ("KBM-503" manufactured by Shin-Etsu Chemical Co., Ltd., silane coupling agent).
(e)-2:3-胺基丙基三甲氧基矽烷(Nippon Unicar公司 製造之「A-1110」,矽烷偶合劑)。 (e)-2: 3-Aminopropyltrimethoxysilane (Nippon Unicar) Manufactured "A-1110", silane coupling agent).
‧著色劑 ‧Colorant
(g)-1:將酞菁系藍色色素(Pigment Blue 15:3)32質量份、異吲哚啉酮系黃色色素(Pigment Yellow 139)18質量份、及蒽醌系紅色色素(Pigment Red 177)50質量份進行混合,以前述3種色素的合計量/苯乙烯丙烯酸樹脂量=1/3(質量比)之方式進行顏料化而獲得之顏料。 (g)-1: 32 parts by mass of phthalocyanine-based blue pigment (Pigment Blue 15: 3), 18 parts by mass of isoindolinone-based yellow pigment (Pigment Yellow 139), and anthraquinone-based red pigment (Pigment Red 177) A pigment obtained by mixing 50 parts by mass, and pigmenting so that the total amount of the aforementioned 3 kinds of pigments/the amount of styrene acrylic resin=1/3 (mass ratio).
(g)-2:碳黑(三菱化學公司製造之「#MA650」,平均粒徑28nm)。 (g)-2: Carbon black ("#MA650" manufactured by Mitsubishi Chemical Corporation, with an average particle size of 28nm).
‧環氧樹脂 ‧Epoxy resin
(h1)-1:雙酚A型環氧樹脂(三菱化學公司製造之「jER828」,環氧當量184g/eq至194g/eq)。 (h1)-1: Bisphenol A epoxy resin ("jER828" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent 184g/eq to 194g/eq).
(h1)-2:雙酚A型環氧樹脂(三菱化學公司製造之「jER1055」,環氧當量800g/eq至900g/eq)。 (h1)-2: Bisphenol A epoxy resin ("jER1055" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent 800g/eq to 900g/eq).
(h1)-3:二環戊二烯型環氧樹脂(DIC公司製造之「Epiclon HP-7200HH」,環氧當量255g/eq至260g/eq)。 (h1)-3: Dicyclopentadiene epoxy resin ("Epiclon HP-7200HH" manufactured by DIC Corporation, epoxy equivalent 255g/eq to 260g/eq).
‧熱硬化劑 ‧Thermal hardener
(h2)-1:二氰二胺(熱活性潛伏性硬化劑,ADEKA公司製造之「Adeka Hardener EH-3636AS」,活性氫量21g/eq)。 (h2)-1: Dicyandiamine (thermally active latent hardener, "Adeka Hardener EH-3636AS" manufactured by ADEKA, with active hydrogen content of 21 g/eq).
‧硬化促進劑 ‧Hardening accelerator
(i)-1:2-苯基-4,5-二羥基甲基咪唑(四國化成工業公司製造之「Curezol 2PHZ-PW」)。 (i) -1: 2-Phenyl-4,5-dihydroxymethylimidazole ("Curezol 2PHZ-PW" manufactured by Shikoku Chemical Industry Co., Ltd.).
以下表示用於製造保護膜形成用複合片之基材。 The base material used for manufacturing the composite sheet for forming a protective film is shown below.
‧基材(11)-1:由厚度為80μm,一方的表面的最大剖面高度(Rt)為0.9μm,另一方的表面的最大剖面高度(Rt)為1.5μm之聚丙烯系膜構成之基材。 ‧Substrate (11)-1: A base made of polypropylene film with a thickness of 80μm, one surface with a maximum cross-sectional height (Rt) of 0.9μm, and the other surface with a maximum cross-sectional height (Rt) of 1.5μm material.
‧基材(11)-2:由厚度為80μm,一方的表面的最大剖面高度(Rt)為8.0μm,另一方的表面的最大剖面高度(Rt)為1.5μm之聚丙烯系膜構成之基材。 ‧Substrate (11)-2: A base made of polypropylene film with a thickness of 80μm, one surface with a maximum cross-sectional height (Rt) of 8.0μm, and the other surface with a maximum cross-sectional height (Rt) of 1.5μm material.
‧基材(91)-1:由厚度為80μm,一方的表面的最大剖面高度(Rt)為12.0μm,另一方的表面的最大剖面高度(Rt)為1.5μm之聚丙烯系膜構成之基材。 ‧Substrate (91)-1: A base made of polypropylene film with a thickness of 80μm, one surface with a maximum cross-sectional height (Rt) of 12.0μm, and the other surface with a maximum cross-sectional height (Rt) of 1.5μm material.
‧基材(91)-2:由厚度為80μm,一方的表面的最大剖面高度(Rt)為16.0μm,另一方的表面的最大剖面高度(Rt)為1.5μm之聚丙烯系膜構成之基材。 ‧Substrate (91)-2: A base made of polypropylene film with a thickness of 80μm, one surface with a maximum cross-sectional height (Rt) of 16.0μm, and the other surface with a maximum cross-sectional height (Rt) of 1.5μm material.
以下表示用於製造保護膜形成用膜或保護膜形成用複合片之剝離膜。 Hereinafter, the release film used for manufacturing the film for protective film formation or the composite sheet for protective film formation is shown.
‧剝離膜(15)-1:聚對苯二甲酸乙二酯製膜的單面經聚矽氧處理進行剝離處理之剝離膜(Lintec公司製造之「SP-PET381031」,厚度38μm)。 ‧Release film (15)-1: Polyethylene terephthalate film made of polyethylene terephthalate, one side of which is peeled off by silicone treatment ("SP-PET381031" made by Lintec, thickness 38μm).
‧剝離膜(15)-3:厚度為80μm,一方的表面的最大剖面高度(Rt)為0.9μm,另一方的表面的最大剖面高度(Rt)為1.5μm之使用聚對苯二甲酸乙二酯之剝離膜。 ‧Release film (15)-3: The thickness is 80μm, the maximum cross-sectional height (Rt) of one surface is 0.9μm, and the maximum cross-sectional height (Rt) of the other surface is 1.5μm using polyethylene terephthalate Ester peeling film.
‧剝離膜(15)-4:厚度為80μm,一方的表面的最大剖面高度(Rt)為8.0μm,另一方的表面的最大剖面高度(Rt) 為1.5μm之使用聚對苯二甲酸乙二酯之剝離膜。 ‧Release film (15)-4: The thickness is 80μm, the maximum cross-sectional height (Rt) of one surface is 8.0μm, and the maximum cross-sectional height (Rt) of the other surface 1.5μm peeling film using polyethylene terephthalate.
‧剝離膜(95)-1:厚度為80μm,一方的表面的最大剖面高度(Rt)為12.0μm,另一方的表面的最大剖面高度(Rt)為1.5μm之使用聚對苯二甲酸乙二酯之剝離膜。 ‧Release film (95)-1: The thickness is 80μm, the maximum cross-sectional height (Rt) of one surface is 12.0μm, and the maximum cross-sectional height (Rt) of the other surface is 1.5μm using polyethylene terephthalate Ester peeling film.
‧剝離膜(95)-2:厚度為80μm,一方的表面的最大剖面高度(Rt)為16.0μm,另一方的表面的最大剖面高度(Rt)為1.5μm之使用聚對苯二甲酸乙二酯之剝離膜。 ‧Release film (95)-2: The thickness is 80μm, the maximum cross-sectional height (Rt) of one surface is 16.0μm, and the maximum cross-sectional height (Rt) of the other surface is 1.5μm using polyethylene terephthalate Ester peeling film.
[實施例1] [Example 1]
<保護膜形成用膜及保護膜形成用複合片之製造> <Production of protective film formation film and protective film formation composite sheet>
(保護膜形成用組成物(IV-1)之製造) (Manufacturing of protective film forming composition (IV-1))
使能量線硬化性成分(a2)-1、聚合物(b)-1、光聚合起始劑(c)-1、光聚合起始劑(c)-2、填充材料(d)-1、偶合劑(e)-1及著色劑(g)-1,以這些的含量(固形物成分量,質量份)成為表1所示之值之方式溶解或分散於甲基乙基酮中,於23℃下進行攪拌,藉此製備固形物成分濃度為50質量%之保護膜形成用組成物(IV-1)。再者,表1中的含有成分一欄之「-」之記載意指保護膜形成用組成物(IV-1)不含有該成分。 Make energy ray curable component (a2)-1, polymer (b)-1, photopolymerization initiator (c)-1, photopolymerization initiator (c)-2, filler (d)-1, Coupling agent (e)-1 and coloring agent (g)-1 are dissolved or dispersed in methyl ethyl ketone so that their content (solid content, parts by mass) becomes the value shown in Table 1 By stirring at 23° C., a protective film forming composition (IV-1) having a solid content concentration of 50% by mass was prepared. In addition, the description of "-" in the column of contained components in Table 1 means that the protective film forming composition (IV-1) does not contain the component.
(保護膜形成用膜及保護膜形成用複合片之製造) (Manufacturing of protective film forming film and protective film forming composite sheet)
於基材(11)-1中的最大剖面高度(Rt)為0.9μm的一方的表面,藉由刀式塗佈機塗敷上述所獲得之保護膜形成用組成物(IV-1),於100℃下乾燥2分鐘,藉此製作厚度25μm 之能量線硬化性之保護膜形成用膜(13)-1。 The protective film forming composition (IV-1) obtained above was applied to the surface of the substrate (11)-1 with a maximum cross-sectional height (Rt) of 0.9 μm by a knife coater, and Dry for 2 minutes at 100°C to produce a thickness of 25μm The energy-ray curable protective film formation film (13)-1.
接著,於剝離膜(15)-1的剝離處理面,貼合上述所獲得之保護膜形成用膜(13)-1的露出面,製作保護膜形成用複合片,該保護膜形成用複合片係基材(11)-1、保護膜形成用膜(13)-1及剝離膜(15)-1於這些的厚度方向上依序積層而成。所獲得之保護膜形成用複合片之構成示於表2。 Next, the exposed surface of the protective film formation film (13)-1 obtained above was bonded to the peeling treatment surface of the peeling film (15)-1 to produce a composite sheet for forming a protective film, the composite sheet for forming a protective film The base material (11)-1, the protective film forming film (13)-1, and the release film (15)-1 are laminated in this order in the thickness direction. The composition of the obtained composite sheet for forming a protective film is shown in Table 2.
<保護膜之評價> <Evaluation of Protective Film>
(保護膜中的與對半導體晶圓之貼附面為相反側的表面的最大剖面高度(Rt)) (The maximum cross-sectional height (Rt) of the surface of the protective film on the opposite side to the attachment surface to the semiconductor wafer)
使用紫外線照射裝置(Lintec公司製造之「RAD2000m/8」),於照度195mW/cm2、光量170mJ/cm2之條件下,對上述所獲得之保護膜形成用複合片自支持片側照射紫外線,藉此使保護膜形成用膜(13)-1硬化,形成保護膜。 An ultraviolet irradiation apparatus (manufactured by the Lintec Company "RAD2000m / 8") at an illuminance 195mW / cm 2, light quantity of 170mJ / cm condition 2, the above obtained the protective film is formed by a composite sheet from the support sheet is irradiated with ultraviolet rays, by This hardens the film (13)-1 for forming a protective film to form a protective film.
接著,自所形成之保護膜剝離支持片,依據JIS B 0601:2013測定保護膜的露出面亦即保護膜中的與對半導體晶圓之貼附面為相反側的表面(與基材(11)-1相對向的面)的最大剖面高度(Rt)。結果示於表2。表2中,「Rt」一欄中所示之數值為上述測定值。 Next, the support sheet was peeled off from the formed protective film, and the exposed surface of the protective film was measured in accordance with JIS B 0601:2013, that is, the surface of the protective film on the opposite side to the surface of the semiconductor wafer (and the substrate (11 )-1 The maximum section height (Rt) of the opposite surface). The results are shown in Table 2. In Table 2, the values shown in the "Rt" column are the above-mentioned measured values.
(保護膜中的與對半導體晶圓之貼附面為相反側的表面的光澤值) (The gloss value of the surface of the protective film on the opposite side to the surface attached to the semiconductor wafer)
測定上述最大剖面高度(Rt)時,使用光澤計(日本電色公司製造之光澤計「VG 2000」),依據JIS K 7105針對保護膜自貼附半導體晶圓之側的相反側測定與對半導體晶圓之貼附面為相反側的表面的60°鏡面光澤度,將上述測定值設為保護膜的前述表面的光澤值。結果示於表2。 When measuring the above-mentioned maximum cross-sectional height (Rt), a gloss meter (gloss meter "VG 2000" manufactured by Nippon Denshoku Co., Ltd.) is used. According to JIS K 7105, the protective film is measured from the side opposite to the side where the semiconductor wafer is attached. The attaching surface of the wafer is the 60° specular gloss of the surface on the opposite side, and the above-mentioned measured value is taken as the gloss value of the above-mentioned surface of the protective film. The results are shown in Table 2.
(保護膜的雷射印字視認性) (Visibility of laser printing on protective film)
上述所獲得之保護膜形成用複合片中,利用與測定最大剖面高度(Rt)時相同的方法,使保護膜形成用膜(13)-1硬化,形成保護膜。 In the composite sheet for protective film formation obtained above, the protective film formation film (13)-1 was cured by the same method as when measuring the maximum cross-sectional height (Rt) to form a protective film.
接著,使用印字裝置(KEYENCE公司製造之「MD-S9910A」),於輸出1.2W、頻率40kHz、掃描速度100mm/秒之條件下,自保護膜中的對半導體晶圓之貼附面的相反側對保護膜的表面照射波長532nm之雷射光,進行雷射印字。 Next, using a printing device ("MD-S9910A" manufactured by KEYENCE), under the conditions of an output of 1.2W, a frequency of 40kHz, and a scanning speed of 100mm/sec, from the protective film on the opposite side of the semiconductor wafer attachment surface The surface of the protective film is irradiated with laser light with a wavelength of 532nm to perform laser printing.
隔著基材(11)-1,目視觀察保護膜的該印字,於清晰地讀取全部印字之情形時,將雷射印字視認性判定為「A」;於至少一部分印字無法清晰地讀取之情形時,將雷射印字視認性判定為「B」。結果示於表2。 Through the substrate (11)-1, visually observe the printing on the protective film, and when all the printing is clearly read, the laser printing visibility is judged as "A"; at least part of the printing cannot be clearly read In this case, the visibility of laser printing is judged as "B". The results are shown in Table 2.
<保護膜形成用膜及保護膜形成用複合片之製造、以及保護膜之評價> <Production of protective film formation film and protective film formation composite sheet, and evaluation of protective film>
[實施例2] [Example 2]
使用基材(11)-2代替基材(11)-1,除此方面以外,利 用與實施例1相同的方法,製造保護膜形成用膜及保護膜形成用複合片,對保護膜進行評價。保護膜形成用組成物(IV-1)係塗敷於基材(11)-2中的最大剖面高度(Rt)為8.0μm的一方的表面。結果示於表2。 Use base material (11)-2 instead of base material (11)-1, in addition to this, it is advantageous The protective film formation film and the protective film formation composite sheet were manufactured by the same method as Example 1, and the protective film was evaluated. The composition (IV-1) for forming a protective film was applied to the surface of the substrate (11)-2 with a maximum cross-sectional height (Rt) of 8.0 μm. The results are shown in Table 2.
[實施例3] [Example 3]
<保護膜形成用膜之製造> <Production of protective film forming film>
(保護膜形成用組成物(IV-1)之製造) (Manufacturing of protective film forming composition (IV-1))
利用與實施例1相同的方法,製造保護膜形成用組成物(IV-1)。 By the same method as in Example 1, a composition (IV-1) for forming a protective film was produced.
(保護膜形成用膜之製造) (Manufacturing of protective film forming film)
於剝離膜(15)-3中的最大剖面高度(Rt)為0.9μm的一方的表面,藉由刀式塗佈機塗敷上述所獲得之保護膜形成用組成物(IV-1),於100℃下乾燥2分鐘,藉此製作厚度25μm之能量線硬化性之保護膜形成用膜(13)-1。 The protective film forming composition (IV-1) obtained above was applied to the surface of the release film (15)-3 with the maximum cross-sectional height (Rt) of 0.9 μm by a knife coater, and By drying at 100°C for 2 minutes, a film (13)-1 for forming an energy ray curable protective film with a thickness of 25 μm was produced.
接著,於剝離膜(15)-1的剝離處理面,貼合上述所獲得之保護膜形成用膜(13)-1的露出面,製作積層片,該積層片係剝離膜(15)-3、保護膜形成用膜(13)-1及剝離膜(15)-1於這些的厚度方向上依序積層而成。所獲得之積層片之構成示於表2。 Next, the exposed surface of the protective film formation film (13)-1 obtained above was bonded to the peeling treatment surface of the peeling film (15)-1 to produce a laminate sheet, which is a peeling film (15)-3 , The protective film formation film (13)-1 and the release film (15)-1 are laminated in this order in the thickness direction. The composition of the obtained laminated sheet is shown in Table 2.
<保護膜形成用膜及保護膜之評價> <Evaluation of protective film formation film and protective film>
(保護膜形成用膜中的與對半導體晶圓之貼附面為相反側的表面的最大剖面高度(Rt)) (The maximum cross-sectional height (Rt) of the surface of the protective film formation film on the opposite side to the surface of the semiconductor wafer attached to it)
自上述所獲得之積層片移除剝離膜(15)-3,針對保護膜形成用膜(13)-1的露出面亦即保護膜形成用膜(13)-1中的與對半導體晶圓之貼附面為相反側的表面,依據JIS B 0601:2013測定最大剖面高度(Rt)。結果示於表2。表2中,「Rt」一欄中所示之數值為上述測定值。 The release film (15)-3 is removed from the laminated sheet obtained above, and the exposed surface of the protective film formation film (13)-1, that is, the protective film formation film (13)-1, and the semiconductor wafer The attached surface is the opposite surface, and the maximum section height (Rt) is measured in accordance with JIS B 0601:2013. The results are shown in Table 2. In Table 2, the values shown in the "Rt" column are the above-mentioned measured values.
(保護膜形成用膜中的與對半導體晶圓之貼附面為相反側的表面的光澤值) (The gloss value of the surface of the film for forming a protective film on the opposite side to the surface attached to the semiconductor wafer)
使用光澤計(日本電色公司製造之光澤計「VG 2000」),依據JIS K 7105針對上述所獲得之保護膜形成用膜(13)-1自貼附半導體晶圓之側的相反側測定與對半導體晶圓之貼附面為相反側的表面的60°鏡面光澤度,將該測定值設為保護膜形成用膜(13)-1的前述表面的光澤值。 結果示於表2。 Using a gloss meter (gloss meter "VG 2000" manufactured by Nippon Denshoku Co., Ltd.), in accordance with JIS K 7105, the obtained protective film formation film (13)-1 was measured from the side opposite to the side where the semiconductor wafer was attached. Regarding the attachment surface of the semiconductor wafer, the 60° specular gloss of the surface on the opposite side, and the measured value was taken as the gloss value of the aforementioned surface of the protective film formation film (13)-1. The results are shown in Table 2.
(保護膜中的與對半導體晶圓之貼附面為相反側的表面的最大剖面高度(Rt)) (The maximum cross-sectional height (Rt) of the surface of the protective film on the opposite side to the attachment surface to the semiconductor wafer)
使用紫外線照射裝置(Lintec公司製造之「RAD2000m/8」),於照度195mW/cm2、光量170mJ/cm2之條件下,對上述所獲得之保護膜形成用膜(13)-1照射紫外線,藉此使保護膜形成用膜(13)-1硬化,形成保護膜。 An ultraviolet irradiation apparatus (manufactured by the Lintec Company "RAD2000m / 8"), at 170mJ / cm Condition 2 is to the illuminance of 195mW / cm 2, light amount obtained as described above the protection film forming film (13) -1 irradiated with ultraviolet rays, This hardens the film (13)-1 for forming a protective film to form a protective film.
接著,針對所形成之保護膜,依據JIS B 0601:2013 測定與對半導體晶圓之貼附面為相反側的表面的最大剖面高度(Rt)。結果示於表2。 Next, for the formed protective film, according to JIS B 0601: 2013 The maximum cross-sectional height (Rt) of the surface on the opposite side to the surface to which the semiconductor wafer is attached is measured. The results are shown in Table 2.
(保護膜中的與對半導體晶圓之貼附面為相反側的表面的光澤值) (The gloss value of the surface of the protective film on the opposite side to the surface attached to the semiconductor wafer)
測定上述最大剖面高度(Rt)時,使用光澤計(日本電色公司製造之光澤計「VG 2000」),依據JIS K 7105針對保護膜自貼附半導體晶圓之側的相反側測定與對半導體晶圓之貼附面為相反側的表面的60°鏡面光澤度,將該測定值設為保護膜的前述表面的光澤值。結果示於表2。 When measuring the above-mentioned maximum cross-sectional height (Rt), a gloss meter (gloss meter "VG 2000" manufactured by Nippon Denshoku Co., Ltd.) is used. According to JIS K 7105, the protective film is measured from the side opposite to the side where the semiconductor wafer is attached. The attaching surface of the wafer is the 60° specular gloss of the surface on the opposite side, and the measured value is taken as the gloss value of the aforementioned surface of the protective film. The results are shown in Table 2.
(保護膜的雷射印字視認性) (Visibility of laser printing on protective film)
上述所獲得之積層片中,利用與實施例1之情形相同的方法,使保護膜形成用膜(13)-1硬化,形成保護膜。 In the laminated sheet obtained above, the protective film formation film (13)-1 was cured by the same method as in the case of Example 1 to form a protective film.
接著,使用印字裝置(KEYENCE公司製造之「MD-S9910A」),於輸出1.2W、頻率40kHz、掃描速度100mm/秒之條件下,自保護膜中的對半導體晶圓之貼附面的相反側對保護膜的表面照射波長532nm之雷射光,進行雷射印字。 Next, using a printing device ("MD-S9910A" manufactured by KEYENCE), under the conditions of an output of 1.2W, a frequency of 40kHz, and a scanning speed of 100mm/sec, from the protective film on the opposite side of the semiconductor wafer attachment surface The surface of the protective film is irradiated with laser light with a wavelength of 532nm to perform laser printing.
隔著剝離膜(15)-3,目視觀察保護膜之該印字,利用與實施例1之情形相同的方法,評價保護膜的雷射印字視認性。結果示於表2。 The printing on the protective film was visually observed through the release film (15)-3, and the laser printing visibility of the protective film was evaluated by the same method as in the case of Example 1. The results are shown in Table 2.
<保護膜形成用膜之製造、以及保護膜形成用膜及保 護膜之評價> <Production of protective film formation film, and protective film formation film and protection Evaluation of protective film>
[實施例4] [Example 4]
使用剝離膜(15)-4代替剝離膜(15)-3,除此方面以外,利用與實施例3相同的方法,製造保護膜形成用膜及積層片,並對保護膜形成用膜及保護膜進行評價。保護膜形成用組成物(IV-1)係塗敷於剝離膜(15)-4中的最大剖面高度(Rt)為8.0μm的一方的表面。另外,保護膜形成用膜(13)-1的露出面係貼合於剝離膜(15)-1的剝離處理面。結果示於表2。 The release film (15)-4 was used instead of the release film (15)-3. Except for this point, the same method as in Example 3 was used to produce a protective film forming film and a laminate sheet, and the protective film forming film and protective The film is evaluated. The composition for forming a protective film (IV-1) was applied to the surface of the release film (15)-4 where the maximum cross-sectional height (Rt) was 8.0 μm. In addition, the exposed surface of the film (13)-1 for forming a protective film was bonded to the peeling treatment surface of the peeling film (15)-1. The results are shown in Table 2.
<保護膜形成用膜及保護膜形成用複合片之製造、以及保護膜形成用膜及保護膜之評價> <Production of protective film formation film and protective film formation composite sheet, and evaluation of protective film formation film and protective film>
[比較例1] [Comparative Example 1]
使用基材(91)-1代替基材(11)-1,除此方面以外,利用與實施例1相同的方法,製造保護膜形成用膜及保護膜形成用複合片,並對保護膜形成用膜及保護膜進行評價。保護膜形成用組成物(IV-1)係塗敷於基材(91)-1中的最大剖面高度(Rt)為12.0μm的一方的表面。結果示於表3。 The base material (91)-1 was used instead of the base material (11)-1. Except for this point, the protective film formation film and the protective film formation composite sheet were manufactured by the same method as in Example 1, and the protective film Evaluate with film and protective film. The composition (IV-1) for forming a protective film was applied to the surface of the substrate (91)-1 with a maximum cross-sectional height (Rt) of 12.0 μm. The results are shown in Table 3.
[比較例2] [Comparative Example 2]
使用基材(91)-2代替基材(11)-1,除此方面以外,利用與實施例1相同的方法,製造保護膜形成用膜及保護膜形成用複合片,並對保護膜形成用膜及保護膜進行評價。保護膜形成用組成物(IV-1)係塗敷於基材(91)-2中的最大 剖面高度(Rt)為16.0μm的一方的表面。結果示於表3。 The base material (91)-2 was used instead of the base material (11)-1. Except for this point, the protective film formation film and the protective film formation composite sheet were produced by the same method as in Example 1, and the protective film Evaluate with film and protective film. The composition for forming a protective film (IV-1) is the largest one applied to the substrate (91)-2 The cross-sectional height (Rt) is one surface of 16.0 μm. The results are shown in Table 3.
<保護膜形成用膜之製造、以及保護膜形成用膜及保護膜之評價> <Production of protective film formation film, and evaluation of protective film formation film and protective film>
[比較例3] [Comparative Example 3]
使用剝離膜(95)-1代替剝離膜(15)-3,除此方面以外,利用與實施例3相同的方法,製造保護膜形成用膜及積層片,並對保護膜形成用膜及保護膜進行評價。保護膜形成用組成物(IV-1)係塗敷於剝離膜(95)-1中的最大剖面高度(Rt)為12.0μm的一方的表面。另外,保護膜形成用膜(13)-1的露出面係貼合於剝離膜(15)-1的剝離處理面。結果示於表3。 The release film (95)-1 was used instead of the release film (15)-3. Except for this point, the same method as in Example 3 was used to produce a protective film forming film and a laminate sheet, and the protective film forming film and protective The film is evaluated. The composition (IV-1) for forming a protective film was applied to the surface of the release film (95)-1 where the maximum cross-sectional height (Rt) was 12.0 μm. In addition, the exposed surface of the film (13)-1 for forming a protective film was bonded to the peeling treatment surface of the peeling film (15)-1. The results are shown in Table 3.
[比較例4] [Comparative Example 4]
使用剝離膜(95)-2代替剝離膜(15)-3,除此方面以外,利用與實施例3相同的方法,製造保護膜形成用膜及積層片,並對保護膜形成用膜及保護膜進行評價。保護膜形成用組成物(IV-1)係塗敷於剝離膜(95)-2中的最大剖面高度(Rt)為16.0μm的一方的表面。另外,保護膜形成用膜(13)-1的露出面係貼合於剝離膜(15)-1的剝離處理面。結果示於表3。 The release film (95)-2 was used instead of the release film (15)-3. Except for this point, the same method as in Example 3 was used to produce a protective film forming film and a laminate sheet, and the protective film forming film and protective The film is evaluated. The composition (IV-1) for forming a protective film was applied to the surface of the release film (95)-2 with a maximum cross-sectional height (Rt) of 16.0 μm. In addition, the exposed surface of the film (13)-1 for forming a protective film was bonded to the peeling treatment surface of the peeling film (15)-1. The results are shown in Table 3.
[參考例1] [Reference example 1]
<保護膜形成用膜之製造> <Production of protective film forming film>
(保護膜形成用組成物之製造) (Manufacturing of protective film forming composition)
使聚合物(b)-2、環氧樹脂(h1)-1、環氧樹脂(h1)-2、環氧樹脂(h1)-3、熱硬化劑(h2)-1、硬化促進劑(i)-1、填充材料(d)-2、偶合劑(e)-2及著色劑(g)-2,以這些的含量(固形物成分量,質量份)成為表1所示之值之方式,溶解或分散於甲基乙基酮中,於23℃下進行攪拌,藉此製備固形物成分濃度為50質量%之保護膜形成用組成物。環氧樹脂(h1)-1、環氧樹脂(h1)-2、環氧樹脂(h1)-3、及熱硬化劑(h2)-1為熱硬化性成分(h),所獲得之組成物為熱硬化性之保護膜形成用組成物。 Make polymer (b)-2, epoxy resin (h1)-1, epoxy resin (h1)-2, epoxy resin (h1)-3, thermosetting agent (h2)-1, hardening accelerator (i) )-1, filler (d)-2, coupling agent (e)-2, and coloring agent (g)-2, so that the content of these (solid content, parts by mass) becomes the value shown in Table 1 , Dissolved or dispersed in methyl ethyl ketone, and stirred at 23°C to prepare a protective film forming composition with a solid content of 50% by mass. Epoxy resin (h1)-1, epoxy resin (h1)-2, epoxy resin (h1)-3, and thermosetting agent (h2)-1 are thermosetting components (h), and the obtained composition It is a composition for forming a thermosetting protective film.
使用上述所獲得之熱硬化性之保護膜形成用組成物,除此方面以外,利用與實施例3相同的方法,製造保護膜形成用膜(93)-1及積層片。 Using the thermosetting protective film forming composition obtained above, except for this point, the protective film forming film (93)-1 and the laminated sheet were produced by the same method as in Example 3.
<保護膜形成用膜及保護膜之評價> <Evaluation of protective film formation film and protective film>
利用與實施例3之情形相同的方法,測定保護膜形成用膜及保護膜中的與對半導體晶圓之貼附面為相反側的表面的最大剖面高度(Rt)、以及保護膜形成用膜及保護膜中的與對半導體晶圓之貼附面為相反側的表面的光澤值。結果示於表3。 Using the same method as in the case of Example 3, the maximum cross-sectional height (Rt) of the protective film formation film and the protective film on the opposite side to the surface of the semiconductor wafer and the protective film formation film were measured And the gloss value of the surface of the protective film on the opposite side to the surface attached to the semiconductor wafer. The results are shown in Table 3.
上述所獲得之積層片中,將保護膜形成用膜(93)-1於130℃下加熱2小時而使保護膜形成用膜(93)-1硬化,形 成保護膜。 In the laminated sheet obtained above, the protective film forming film (93)-1 was heated at 130°C for 2 hours to harden the protective film forming film (93)-1 to form Into a protective film.
接著,利用與實施例3之情形相同的方法,對保護膜進行雷射印字,評價雷射印字視認性。結果示於表3。 Next, using the same method as in the case of Example 3, laser printing was performed on the protective film, and the visibility of the laser printing was evaluated. The results are shown in Table 3.
根據上述結果可明確,於使用實施例1至實施例4之保護膜形成用膜之情形時,藉由保護膜的表面(β')的最大剖面高度(Rt)為7.5μm以下,保護膜的雷射印字的視認性優異。確認到實施例3至實施例4之保護膜形成用膜的表面(β)的最大剖面高度(Rt)小,為7.7μm以下。 It is clear from the above results that when the protective film formation films of Examples 1 to 4 are used, when the maximum cross-sectional height (Rt) of the surface (β') of the protective film is 7.5 μm or less, the protective film The visibility of laser printing is excellent. It was confirmed that the maximum cross-sectional height (Rt) of the surface (β) of the protective film formation films of Examples 3 to 4 was as small as 7.7 μm or less.
另外,於使用實施例1至實施例4之保護膜形成用膜之情形時,保護膜的表面(β')的最大剖面高度(Rt)小,為0.8μm至7.5μm,與此相對應地,保護膜的表面(β')的光澤值足夠大,為50至90。 In addition, when the protective film formation films of Examples 1 to 4 are used, the maximum cross-sectional height (Rt) of the surface (β') of the protective film is as small as 0.8 μm to 7.5 μm. , The gloss value of the surface (β') of the protective film is sufficiently large, ranging from 50 to 90.
相對於此,於使用比較例1至比較例4之保護膜形成用膜之情形時,保護膜的表面(β')的最大剖面高度(Rt)為11.4μm以上,因此保護膜的雷射印字的視認性差。確認到比較例3至比較例4之保護膜形成用膜的表面(β)的最 大剖面高度(Rt)大,為11.5μm以上。 In contrast, when the protective film formation films of Comparative Examples 1 to 4 are used, the maximum cross-sectional height (Rt) of the surface (β') of the protective film is 11.4μm or more, so the laser printing of the protective film The visibility is poor. It was confirmed that the surface (β) of the protective film formation film of Comparative Example 3 to Comparative Example 4 was the most The large section height (Rt) is large, 11.5 μm or more.
另外,於使用比較例1至比較例4之保護膜形成用膜之情形時,保護膜的表面(β')的最大剖面高度(Rt)大,為11.4μm至15.1μm,與此相對應地,保護膜的表面(β')的光澤值小,為23至30。 In addition, when the protective film formation film of Comparative Example 1 to Comparative Example 4 is used, the maximum cross-sectional height (Rt) of the surface (β') of the protective film is as large as 11.4 μm to 15.1 μm. , The surface (β') of the protective film has a small gloss value of 23-30.
另一方面,參考例1之保護膜形成用膜的表面(β)的最大剖面高度(Rt)小,為0.8μm。但是,由於藉由加熱使該保護膜形成用膜硬化而形成保護膜,故而雖然保護膜的表面(β')的最大剖面高度(Rt)止於5.5μm,但光澤值小,為40,因而保護膜的雷射印字的視認性差。原因在於,前文所說明之因加熱硬化導致保護膜中產生不良情形(亦包含構成成分之變質等)。 On the other hand, the maximum cross-sectional height (Rt) of the surface (β) of the film for forming a protective film of Reference Example 1 was as small as 0.8 μm. However, since the protective film is hardened by heating to form a protective film, although the maximum cross-sectional height (Rt) of the surface (β') of the protective film is limited to 5.5 μm, the gloss value is as small as 40, so The visibility of the laser printing on the protective film is poor. The reason is that defects (including the deterioration of constituent components, etc.) occur in the protective film due to heat curing as described above.
本發明可用於製造半導體裝置。 The present invention can be used to manufacture semiconductor devices.
1C‧‧‧保護膜形成用複合片 1C‧‧‧Composite sheet for forming protective film
10‧‧‧支持片 10‧‧‧Support film
10a‧‧‧(支持片的)表面 10a‧‧‧(supporting film) surface
11‧‧‧基材 11‧‧‧Substrate
11a‧‧‧(基材的)表面 11a‧‧‧(of the substrate) surface
13‧‧‧保護膜形成用膜 13‧‧‧Film for forming protective film
13a‧‧‧(保護膜形成用膜的)表面(第1面) 13a‧‧‧(The surface of the protective film forming film) (1st side)
13b‧‧‧(保護膜形成用膜的)表面 13b‧‧‧(The surface of the protective film forming film)
15‧‧‧剝離膜 15‧‧‧Peeling film
16‧‧‧治具用接著劑層 16‧‧‧Adhesive layer for fixture
16a‧‧‧(治具用接著劑層的)表面 16a‧‧‧(Adhesive layer for jig) surface
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JP2010056328A (en) * | 2008-08-28 | 2010-03-11 | Furukawa Electric Co Ltd:The | Film for chip protection |
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