TW201805643A - Measurement system including a measurement platform, a cantilever, a probe module, and a holding member - Google Patents

Abstract

A measurement system for conducting measurement on an object to be measured includes a measurement platform having a carrying surface for receiving the object to be measured to be placed thereon; a cantilever, of which on end is connected to the measurement platform and movable relative to the measurement platform; a probe module disposed on the cantilever, the probe module having at least one probe; a holding member connected to the cantilever, the holding member bein designed to be grasped by a user so as to drive the cantilever to move relative to the carrying surface; wherein one of the cantilever and the probe module is provided with a stopping portion for abutting a reference surface so that the cantilever is spaced from the receiving surface by a predetermined distance.

Description

Measurement system

The invention relates to a measurement system; in particular, it relates to a measurement system for measuring electronic components or circuit substrates.

With the development of electronic products, in order to ensure the quality of electronic products when they leave the factory, the measurement, inspection, and measurement of the electrical connections between precision electronic components of electronic products are usually carried out before manufacturing, assembling and leaving the factory. Are there electrical errors in the surface and buried circuits?

The size of electronic components or circuit substrates is not singular, and will change according to various requirements. The same applies to the probe module used for electrical detection of the object to be measured. Therefore, the inspector directly holds the probe module. The electrical detection of extremely delicate objects to be tested can't help but be unable to accurately move the probe module to an appropriate position due to physiological factors such as breathing and heartbeat or physiological factors such as tension and fatigue. Test the test object. In addition, since the DUT and the probe module are both high unit price and precision parts, if there is any error, it may cause the delay of the test period and increase the test cost.

In view of this, the object of the present invention is to provide a measurement system, which can improve the efficiency and accuracy of the electrical detection of the object to be measured by the inspector.

In order to achieve the above object, the measurement system provided by the present invention is used to measure an object to be measured, which includes: a measurement platform having a bearing surface for placing the object to be measured; One end of the cantilever is connected to the measurement platform and can be moved relative to the measurement platform; a probe module is arranged on the cantilever, the probe module has at least one probe; a holding member is connected On the cantilever, the holding member is used for holding by the user, so as to drive the cantilever to move relative to the bearing surface; wherein one of the cantilever and the probe module is provided with a stopper, the The blocking portion is used to abut a reference surface so that the cantilever and the bearing surface are separated by a predetermined distance.

In order to achieve the above object, the present invention further provides a measurement method suitable for a measurement system. The measurement system includes a measurement platform, a cantilever, and a probe module. The measurement platform carries an object to be measured. One end of the cantilever is connected to the measurement platform, the probe module is disposed on the cantilever, and the probe module has at least one probe, and one of the cantilever and the probe module is provided with a Stop portion; the measurement method includes the following steps: moving the cantilever and the probe module, and making the stop portion abut a reference surface, so that the cantilever is at a predetermined distance from the measurement platform; Limiting the distance between the cantilever and the measurement platform to the predetermined distance to fix the vertical distance between the probe and the object to be measured; driving the probe module to move the probe toward the object Move the travel distance in the direction of the test object and contact the test object, so as to perform electrical measurement on the test object.

In order to achieve the above object, the present invention further provides a measurement system for measuring an object to be measured, which includes: a measurement platform having a bearing surface for placing the object to be measured; A cantilever includes a plurality of arms pivotally connected to each other. The arms include a first arm and a second arm. One end of the first arm is connected to the measurement platform and can be opposite to the measurement platform. Moving; a probe module provided on the second arm, the probe module having at least one probe; a holding member connected to the second arm, the holding member being used for holding by the user Holding to move the cantilever relative to the bearing surface.

The effect of the present invention is that through the above design, as long as the inspector holds the grip, the probe module can easily drive the probe module to move, so that the object to be tested can be electrically detected, and the support through the cantilever can be more effective. The auxiliary probe module is maintained in a stable state and is not easy to shake, which can improve the detection efficiency and accuracy of the inspector.

In order to explain the present invention more clearly, a preferred embodiment is described in detail below with reference to the drawings. Please refer to FIG. 1 to FIG. 3, which is a measurement system 100 according to a preferred embodiment of the present invention, which includes a measurement platform 10, a cantilever 20, a probe module 30, a holding member 40, a The horizontal limit mechanism 50, a vertical limit mechanism 60, and a controller 70.

In this embodiment, the measurement platform 10 includes a base 12 and a column 14. The base 12 includes a body 122 and a carrier plate 124. The carrier plate 124 is movably disposed on the base. On the body 122, preferably, the carrier plate 124 is disposed on the base body 122 in a manner capable of moving in a horizontal direction relative to the base body 122, and / or may be vertical to the base body 122. The upward movement mode is arranged on the base body 122, in other words, it can also be designed as a carrier plate 124 that can also be raised and lowered, wherein the carrier plate 124 has a bearing surface 125, which can be used to place a test surface. Object (not shown), the object to be measured may be an electronic component or a circuit substrate. The upright 14 is disposed on the base 122.

One end of the cantilever 20 is connected to the measurement platform 10 and can be moved relative to the measurement platform 10. The cantilever 20 includes a plurality of arms pivotally connected to each other. In this embodiment, the arms include a first An arm 22 and a second arm 24. One end of the first arm 22 is connected to the post 14 of the measurement platform 10, and can swing in a horizontal direction relative to the bearing surface 125 on the measurement platform 10. As shown in FIG. 2, the first arm 22 can swing in the horizontal direction means that the first arm 22 swings in the arrow direction A1 with the column 14 as the rotation axis; one end of the second arm 24 and the first arm 22 The other end of one arm 22 is connected, and the second arm 24 is swingable in a horizontal direction and a vertical direction relative to the first arm 22, wherein, as shown in FIG. 2, the second arm 24 may be horizontally Swing in the direction means that the second arm 24 swings in the arrow direction A2 with the end connected to the first arm 22 as the rotation axis. In this embodiment, the second arm 24 includes a parallel link group 242 and a A bracket 244, one end of the parallel link group 242 is pivotally connected to the first arm 22, and the other end is connected to the bearing 244 is pivotally connected, so that through the design of the parallel link group 242, the end of the bracket 244 that is pivotally connected to the parallel link group 242 and the first arm can be used as a fulcrum, in a direction perpendicular to the bearing surface 125. (As shown in Figure 3, the second arm 24 can move up and down in the direction of the arrow A3).

The probe module 30 is disposed on the support 244 and has at least one probe 32 for contacting the object to be measured, so as to perform electrical measurement on the object to be measured.

The holding member 40 is disposed on the supporting frame 244 and is located above the probe module 30. The holding member 40 is used for holding by the user, so as to drive the cantilever 20 and the probe disposed on the cantilever 20. The needle module 30 moves relative to the bearing surface 125, so that the probe module 30 can be moved to the side of the object to be tested or other appropriate test positions.

The horizontal limit mechanism 50 is disposed on the cantilever 20, is electrically connected to the controller 70, and is controlled by the controller 70. The horizontal limit mechanism 50 is controlled to limit the inability of the arms Relatively pivot in the horizontal direction. For example, when the horizontal limit mechanism 50 is triggered, the first arm 22 and the second arm 24 can be restricted from moving in the horizontal direction relative to the measurement platform. As shown in FIG. 1 again, in this embodiment, the horizontal limiting mechanism 50 includes a first horizontal limiting member 50a and a second horizontal limiting member 50b. The first horizontal limiting member 50a is disposed at Between the first arm 22 and the upright 14, for restricting the swing of the first arm 22 in the horizontal direction, the second horizontal stopper 50 b is disposed between the second arm 24 and the first arm 22 for restricting the second arm. 24 is a swing in the horizontal direction with respect to the first arm 22. In this embodiment, the first horizontal limiter 50a and the second horizontal limiter 50b are electromagnetically braked or powered by a motor to achieve the effect of electromagnetic braking.

Please also cooperate with FIG. 4, the vertical limit mechanism 60 is disposed on the second arm 24 and is electrically connected to the controller 70, and controlled by the controller 70, the vertical limit mechanism 60 It is used to control to keep a predetermined distance between the cantilever 20 and the bearing surface 125, or to limit a predetermined distance between the probe module 30 and the object to be measured disposed on the cantilever 20. In this embodiment, the vertical limit mechanism 60 mainly includes three parts, which are a slide rail assembly 60a, a stopper 60b, and a power driving part 60c. The slide rail assembly 60a is connected to the stopper 60b. It is used to adjust the height (or vertical position) of the stopper 60b in the vertical direction. One end of the stopper 60b has a stopper for abutting on a reference surface R, so that the cantilever 20 There is a predetermined distance from the bearing surface 125. In this embodiment, the stopper 60b is disposed on the cantilever 20, so that the stopper is disposed on the cantilever 20; please also cooperate with FIG. 3 The power driving member 60c is connected to the second arm 24. In this embodiment, the power driving member 60c is a nitrogen cylinder, which is used to drive the parallel link group 242 to drive the carrier 244 to move in the vertical direction. In other practical implementations, the power driving member 60c is not limited to a nitrogen cylinder, and other power driving members such as a hydraulic cylinder, an electric cylinder, a pneumatic cylinder, or a screw can also be used.

In this embodiment, the controller 70 is disposed on the holding member 40 and is electrically connected to the probe module 30, the horizontal limit mechanism 50 and the vertical limit mechanism 60. The controller 70 includes a A probe switch (not shown), a horizontal limit switch (not shown), and a vertical limit switch (not shown), wherein each of the above open relationships is for a user to click or touch to trigger the corresponding action ,E.g:

When the probe switch is triggered, the probe module 30 is driven to drive the probe 32 to move a distance of travel in the direction of the object to be tested, and contact the object to be tested, thereby powering the object to be tested. On the other hand, when the probe switch is not triggered, the probe 32 does not actively move in the direction of the object to be measured.

When the horizontal limit switch is triggered, the horizontal limit mechanism 50 restricts the cantilever 20 from moving relative to the measurement platform 10 in the horizontal direction. As in this embodiment, the first arm 22 and the second arm are restricted. The arm 24 cannot move in the horizontal direction relative to the measurement platform 10, or it is referred to as fixing the cantilever 20 on a specific X, Y axis coordinate on the bearing surface. On the other hand, when the horizontal limit switch is not triggered, the cantilever 20 can be arbitrarily moved and swung by the user.

When the vertical limit switch is triggered, the vertical limit mechanism 60 restricts the cantilever 20 and the bearing surface 125 from maintaining a predetermined distance, that is, it can limit the probe module provided on the cantilever 20 30 is maintained at a predetermined distance above the object to be measured, so that the probe module 30 can be positioned at a predetermined height relative to the bearing surface 125, or a specific fixed on the bearing surface 125 For example, in this embodiment, the parallel link group 242 is fixed by controlling a nitrogen cylinder, so that the bracket 244 cannot move in the vertical direction, thereby limiting the retention between the cantilever 20 and the bearing surface 125. The effect at the predetermined distance. On the other hand, when the vertical limit switch is not triggered, the second arm 24 can move vertically relative to the bearing surface 125, or it can be said to move along the Z-axis direction.

Preferably, each of the above-mentioned opening relationships is provided on the surface of the gripping member 40, so that when a user holds the gripping member 40 to control the above-mentioned switches, it is more ergonomic and easier User control, and its operation feel can also be significantly improved.

The following describes the measurement method applicable to the above measurement system. First of all, firstly, the object to be measured is statically placed on the bearing surface 125, and the user can adjust the horizontal position and vertical of the carrier plate 124 relative to the base body 122 as required. Position, then, after adjusting, the user can hold on the holding member 40 and drive the cantilever 20 and the probe module 30 to move relative to the bearing surface 125, and then approach or move away from the object or object to be measured Test points for things.

Among them, in order to avoid accidents such as collision with the object to be measured or the carrier board 124 due to misoperation or unfamiliar operation of the measurement system, the probe module 30 is moved down to a low distance and collided with the object to be measured or the carrier plate 124. A predetermined measurement height (also referred to as a predetermined distance) of the cantilever 20 relative to the bearing surface 125 or the object to be measured. Please refer to FIG. 4. First, the user first adjusts the slide rail assembly 60 a to set the vertical position of the stopper 60 b. It is used to set the height at which the stopper of the stopper 60 b protrudes from the bracket 244. At this time, the vertical limit mechanism 60 is in a setting mode. Then, the user triggers the stopper 60b on the slide rail assembly 60a to extend, and controls the holding member 40 to move the cantilever 20 and the probe module 30. The stopper of the stopper 60b is abutted on the reference surface R, so that the cantilever 20 and the probe module 30 are spaced a predetermined distance from the bearing surface 125 of the measurement platform 10, which is first defined by the above setting mode. The required predetermined distance and height are measured, and then the action of the stopper against the reference plane R is performed. Among them, the stopper 60b must extend beyond the needle tip of the probe 32 so that when the measurement height is set, the needle tip of the probe 32 will not directly contact the reference surface R. Damaged.

Then, after abutting the reference surface R, the stopper 60b on the slide rail assembly 60a is triggered and retracted, that is, the vertical position of the stopper 60b is raised and made to be higher than the probe module. The 30-point tip is still high, and the vertical limit mechanism 60 can be in a working mode. At this time, the power driving member 60c will be triggered to fix the parallel link group 242, so that the bracket 244 is in the vertical direction. It cannot be moved, in other words, the bracket 244 is fixed on a specific Z-axis coordinate. Thereafter, when the user operates the cantilever 20, the cantilever 20 can be subject to the height limitation steps performed by the previous vertical limit mechanism 60, so that the shortest vertical distance between the cantilever 20 and the measurement platform 10 or the object to be measured when the cantilever 20 moves. Due to the limitation, the risk of the probe 32 striking the bearing surface 125 or the object to be tested can be effectively avoided when the cantilever 20 is too close to the bearing surface 125 during operation.

Another mention is that the aforementioned extension and withdrawal of the stopper 60b and the action of triggering the power drive member 60c to perform the vertical limit of the cantilever 20 can be performed simultaneously. For example, when using a vertical limit switch When the triggering stopper 60b is extended, the power driving member 60c releases the limit on the vertical height of the cantilever 20, and the cantilever 20 can move up and down according to the user's control. In addition, when the stopper abuts the reference surface R After the execution of the motion is completed, when the vertical limit switch is used to trigger the withdrawal of the stopper 60b, the power driving member 60c is simultaneously triggered, thereby restricting the movement of the cantilever 20 in the vertical direction, that is, limiting the cantilever 20 in a specific Z-axis coordinate on. In addition, in an embodiment, the extending and retracting actions of the stopper 60b may be performed at different times from the action of triggering the vertical driving of the cantilever 20 by the power driving member 60c. At this time, the extension of the stopper 60b It is necessary to set a stopper switch for triggering the withdrawal and withdrawal. The power driving part 60c uses a vertical limit switch to trigger the vertical height limit or opening, not limited to the foregoing description.

Then, the user can control the holding member 40 to move the cantilever 20 and the probe module 30 relative to the measurement platform 10 to move the probe module 30 closer to the position of the object to be measured, for example, to Directly above one of the test points of the object to be measured, at this time, the user can trigger the vertical limit switch and / or the horizontal limit switch as required to activate the vertical limit mechanism 60 and / or the horizontal limit mechanism 50 to limit the cantilever. For example, when the user has moved the probe module 30 directly above the measurement point to be measured, that is, the horizontal direction of the probe module 30 relative to the object to be measured (XY The position on the plane is determined, then the horizontal limit mechanism 50 can be activated to fix the horizontal position of the cantilever 20 relative to the measurement platform 10; then, when the user has moved the probe module 30 above the object to be measured When measuring a height, the vertical limit mechanism 60 can be activated to fix the vertical position of the cantilever 20 relative to the measurement platform, so as to fix the vertical distance between the probe 32 and the object to be measured.

After that, the user can trigger the probe switch to drive the probe 32 of the probe module 30 to move a travel distance in the direction of the DUT and contact the DUT, thereby breaking the DUT to power Sex measurement. Among them, preferably, the travel distance of the probe 32 is greater than the vertical distance between the probe 32 and the object to be measured, so that the probe 32 can slightly penetrate into the object to be measured. Test points to make effective contact with the test object, and complete the acquisition of correct measurement data. In this embodiment, the user triggers the probe switch to drive other power driving components such as electric cylinders, hydraulic cylinders, and pneumatic cylinders to move the probe 32 of the probe module 30 to move.

With this, through the above-mentioned measurement system and method, the user can easily move the cantilever 20 and the probe module 30 to the ideal test position, and through its horizontal limit mechanism 50 and vertical limit mechanism 60 The assistance and support of the cantilever 20 can effectively reduce the user's misoperation due to physiological factors such as breathing or psychological factors such as tension, and can also effectively assist the probe module during the test and during the needle down. Keeping it in a stable state without accidental shaking can improve the efficiency and accuracy of detection.

The predetermined distance may be a distance interval, for example, between 3cm and 6cm, and between 5mm and 10mm. In addition, the predetermined distance may also be a specific value. For example, the predetermined distance may be 3mm, The specific value of 5 mm or 5 cm depends on the user's desire to restrict the second arm 24 of the cantilever 20 to be movable within a specific vertical height range, or to be movable within a specific vertical height range.

In addition, the order in which the aforementioned locking cantilever moves relative to the measurement platform in the horizontal or vertical direction is not limited to the above-mentioned exemplary description. Of course, in other practical applications, it is of course possible to lock the cantilever to the vertical first. The direction then locks the movement of the cantilever in the horizontal direction, or simultaneously locks the movement of the cantilever in the vertical and horizontal directions.

In addition, in an embodiment, the cantilever can also include a third arm, which is pivotally connected between the first arm and the second arm, thereby increasing the range and angle of movement of the cantilever, and having more Possibility of measuring range.

In addition, in an embodiment, please refer to FIG. 5, a bearing portion 246 may be provided on the aforementioned bracket, and the bearing portion 246 may be provided with a light point marking device for facing the lower part of the probe module. A light point prompt is emitted from the needle position, for example, by projecting a laser light point to assist or guide the user to accurately find the lower needle position; in addition, the bearing portion 246 can also be provided with a magnifying glass, so that the user can clearly see the measurement through the magnifying glass. The lower needle position of the object and the probe; in addition, a camera, such as a CCD camera, can be set on the bearing section 246 to take pictures of the probe and the object to be measured, and it can be used as a reference for the user to measure the position. .

The above descriptions are only the preferred and feasible embodiments of the present invention, and any equivalent changes made by applying the description of the present invention and the scope of patent application should be included in the patent scope of the present invention.

[this invention]
100‧‧‧ measurement system
10‧‧‧Measuring platform
12‧‧‧ base
122‧‧‧ seat
124‧‧‧ Carrier Board
125‧‧‧ bearing surface
14‧‧‧ post
20‧‧‧ cantilever
22‧‧‧ first arm
24‧‧‧ second arm
242‧‧‧ Parallel Link Set
244‧‧‧Frame
30‧‧‧ Probe Module
32‧‧‧ Probe
40‧‧‧Grip
50‧‧‧ horizontal limit agency
50a‧‧‧First level limiter
50b‧‧‧Second level limiter
60‧‧‧Vertical limit mechanism
60a slide rail assembly
60b‧‧‧stop
60c‧‧‧Power Drive
70‧‧‧controller
A1 ~ A3‧‧‧‧Arrow direction
R‧‧‧ reference surface

FIG. 1 is a perspective view of a measurement system according to a preferred embodiment of the present invention. FIG. 2 is a top view of the measurement system of the above preferred embodiment. FIG. 3 is a side view of the measurement system of the above preferred embodiment. FIG. 4 is a side view of the measurement system of the above preferred embodiment, revealing that the blocking portion abuts on a reference surface to set a predetermined distance. FIG. 5 is a side view of the measurement system of the above-mentioned preferred embodiment, revealing that the blocking portion is retracted after the predetermined distance is set.

100‧‧‧ measurement system

10‧‧‧Measuring platform

12‧‧‧ base

122‧‧‧ seat

124‧‧‧ Carrier Board

125‧‧‧ bearing surface

14‧‧‧ post

20‧‧‧ cantilever

22‧‧‧ first arm

24‧‧‧ second arm

40‧‧‧Grip

50‧‧‧ horizontal limit agency

Claims (17)

A measurement system for measuring an object to be measured includes: a measurement platform having a bearing surface for placing the object to be measured; a cantilever whose one end is connected to the measurement A platform that is movable relative to the measurement platform; a probe module provided on the cantilever, the probe module having at least one probe; a holding member connected to the cantilever, the holding member For holding by the user to drive the cantilever relative to the bearing surface; wherein one of the cantilever and the probe module is provided with a stopper for abutting against a The reference plane is such that the cantilever and the bearing plane are separated by a predetermined distance. The measurement system according to claim 1, further comprising a vertical limit mechanism and a controller, the vertical limit mechanism is disposed on the cantilever, and is used to control to limit the distance between the cantilever and the bearing surface. The predetermined distance is used to fix the vertical distance between the probe and the object to be measured; the controller includes a vertical limit switch, and when the vertical limit switch is triggered, the vertical limit mechanism limits the The cantilever maintains the predetermined distance from the bearing surface. According to the measurement system described in claim 1 or 2, the controller includes a probe switch. When the probe switch is triggered, the probe module is driven to drive the probe toward the object to be measured. Move a travel distance in the direction and contact the object to be measured, so as to perform electrical measurement on the object to be measured. The measurement system according to claim 3, wherein the travel distance of the probe to the object to be measured is greater than the distance between the probe and the object to be measured in a vertical direction. The measurement system according to claim 2, wherein the vertical limit mechanism includes a slide rail assembly, a stopper and a power driving part; the slide rail assembly is connected to the stopper for adjusting the stopper The height in the vertical direction; the stopper has the stopper; the power driving member is connected to the cantilever for driving the cantilever to move in the vertical direction. The measurement system according to claim 1, wherein the cantilever includes a first arm and a second arm, and one end of the first arm is connected to the measurement platform and can be horizontal with respect to the measurement platform. Swinging upward, one end of the second arm is connected to the other end of the first arm, and the other end is connected with the probe module and the holding member, and the second arm can be horizontally opposite to the first arm Swing in the vertical direction. The measurement system according to claim 6, further comprising a horizontal limit mechanism and a controller. The horizontal limit mechanism is disposed on the cantilever, is electrically connected to the controller, and is controlled by the controller. The controller further includes a horizontal limit switch. When the horizontal limit switch is triggered, the horizontal limit mechanism restricts the first arm and the second arm from moving in a horizontal direction relative to the measurement platform. The measurement system according to claim 7, wherein the horizontal limit mechanism includes a first horizontal limit member and a second horizontal limit member, and the first horizontal limit member is disposed on the first arm and used To limit the swing of the first arm in the horizontal direction; the second horizontal limiter is disposed between the first arm and the second arm, and is used to limit the second arm to be horizontal relative to the first arm Swing in the direction. The measurement system according to claim 6, wherein the second arm includes a parallel link group and a support frame, one end of the parallel link group is pivotally connected to the first arm, and the other end is pivotally connected to the support frame. The probe module and the holding member are arranged on the support frame. The measurement system according to claim 1, wherein the measurement platform includes a base and a column, the base includes a body and a carrier board, and the carrier board is disposed on the base in a horizontally movable manner. Body, and the carrier board has the bearing surface; the upright post is arranged on the base, and the upright post is connected to one end of the cantilever. A measurement method suitable for a measurement system. The measurement system includes a measurement platform, a cantilever, and a probe module. The measurement platform carries a test object, and one end of the cantilever is connected to the measurement platform. Above, the probe module is arranged on the cantilever, and the probe module has at least one probe, and one of the cantilever and the probe module is provided with a stopper; the measurement method includes The following steps: move the cantilever and the probe module, and make the stop part abut a reference surface, so that the cantilever and the measurement platform are separated by a predetermined distance; restricting the distance between the cantilever and the measurement platform The distance is the predetermined distance to fix the distance between the probe and the object to be measured in a vertical direction; the probe module is driven to move the probe a distance of travel in the direction of the object to be measured and Touch the object to be measured, so as to perform electrical measurement on the object. The measuring method according to claim 11, before driving the probe module, further comprising: driving the cantilever and the probe module to move relative to the measuring platform, thereby moving the probe to the waiting It is directly above the measuring object; after driving the cantilever and the probe module relative to the measuring platform, the method further includes: restricting the cantilever from moving relative to the measuring platform in the horizontal direction. The measurement method according to claim 11, wherein the travel distance of the probe moving toward the object to be measured is greater than a distance between the probe and the object to be measured in a vertical direction. A measurement system for measuring an object to be measured includes: a measurement platform having a bearing surface for placing the object to be measured; a cantilever containing a plurality of pivots with each other Connected arms, the arms include a first arm and a second arm, one end of the first arm is connected to the measurement platform and can be moved relative to the measurement platform; a probe module is disposed on the On the second arm, the probe module has at least one probe; a holding member is connected to the second arm, and the holding member is used for holding by the user to drive the cantilever relative to the bearing Face movement. The measurement system according to claim 14, further comprising a horizontal limit mechanism and a controller, the horizontal limit mechanism is disposed on the cantilever and is controlled by the controller; the controller is electrically connected to the level The limit mechanism. The controller includes a horizontal limit switch. When the horizontal limit switch is triggered, the horizontal limit mechanism restricts the cantilever from moving in a horizontal direction relative to the measurement platform. The measurement system according to claim 14, wherein the arms further include a third arm pivotally connected between the first arm and the second arm. The measurement system according to claim 15, further comprising a vertical limit mechanism for controlling to limit a predetermined distance between the cantilever and the bearing surface to fix the probe and the object to be measured. The vertical distance; the controller includes a vertical limit switch, when the vertical limit switch is triggered, the vertical limit mechanism limits the cantilever and the bearing surface to maintain the predetermined distance.