TWI650526B - Measuring apparatus - Google Patents

Abstract

A measuring device for measuring surface geometry of a plurality of rails to be tested, comprising: a multi-quantity probe fixed to the measuring probe support, the measuring probe being installed according to the surface geometry of the rail to be tested Measuring probe support. At least one mobile device shifts the probe support or the rail to be tested on the cross section of the rail to be tested, so that the measuring probe has a relative displacement with respect to the rail to be tested. Each of the measuring probes has a corresponding coordinate system, and the corresponding coordinate systems are different from each other. The corresponding coordinate system is corrected to the same coordinate system through the standard component, and the surface geometry of the test rail to be tested is measured based on the same coordinate system.

Description

Measuring device

The invention relates to a topography measuring device for a geometrically constrained surface of a rail of a slide rail.

The slide rails use the geometrically constrained surface of the guide rails to match the ball or roller to restrain the direction of movement of the slider in a fixed direction. The rails, balls (columns), and the sliding grooves of the sliders are related to the pre-stress and overall smoothness. A conventional method is to prepare balls (columns) of various sizes, and perform post-friction quality detection after assembly of the slide rails. If the above test does not meet the requirements, re-trim the size or replace it with a ball (column) fit of other sizes, and repeat the friction detection to meet the demand. However, this increases the manufacturing complexity and increases the size of the balls (columns), increasing material, time and labor costs.

Other possible detection methods include the use of a coordinate-measuring machine (CMM), a profilometer or optical metrology. However, the volume of the three-dimensional bed is too large to be suitable for on-line measurement. When the profilometer's probe telescopic direction is perpendicular to the scanning direction, the probe will get stuck due to the lateral force. Optical measurement accuracy is reduced by the influence of cutting oil and dust.

In view of the above problems, an embodiment of the present invention provides a measuring device for measuring surface geometry of a plurality of rails to be tested, including: a multi-quantity probe, a fixed-measuring probe support, and a measuring probe according to the rail to be tested. The surface geometry is mounted on the measurement probe support; at least one moving device translates the probe support or the guide rail to be tested on the cross section of the guide rail to be tested, so that the probe has a relative displacement with respect to the guide rail to be tested; Each of the measuring probes has a corresponding coordinate system, and the corresponding coordinate systems are different from each other. The corresponding coordinate system is corrected to the same coordinate system through the standard components, and the surface geometry of the test rail to be tested is measured based on the same coordinate system.

The above description of the present invention and the following description of the embodiments are intended to illustrate and explain the principles of the invention, and to provide a further explanation of the scope of the invention.

Referring to FIG. 1, an embodiment of the present invention discloses a measuring device 10 for measuring the surface geometry of a plurality of rails 30 to be tested, including: a multi-quantity probe 10a fixed to the probe support 10b; in this embodiment The measuring device includes two measuring probes 10a, but not limited thereto. The measuring probe 10a is mounted on the probe supporting base 10b according to the surface geometry of the guide rail, for example, the probe is turned into a direction parallel to the normal direction of the guide rail, thereby reducing the influence of the lateral force, but does not limit the installation in the normal direction. .

In the present embodiment, the measuring device 10 includes: at least one moving device 10c, and shifts the probe support 10b or the rail to be tested 30 on the cross section of the rail 30 to be tested, so that the measuring probe is opposite to the rail to be tested. Has a relative displacement. The mobile device 10c can be configured to move the rails 30 to be tested or to move the metrology probe 10a. In a preferred embodiment, since the slide rail is long and heavy and does not easily move, the mobile device 10c is provided for moving the measurement probe 10a as shown in Fig. 5A.

The measurement principle of this embodiment will be described below with reference to FIGS. 2A and 2B. In the present embodiment, the probe 10a is a contact type linear displacement gauge. The contact linear displacement gauge can be a magnetic grid, a grating, a capacitive grid, or a linear variable transformer (LVDT). In other embodiments, the measurement probe 10a can be an optical, pneumatic or electromagnetic displacement measurement probe. The measuring probe 10a contacts the surface of the rail to be tested and moves along the rail to be tested. The geometric shape of the surface of the rail to be tested makes the measuring probe expand and contract. According to the degree of the telescopic displacement of the measuring probe, the surface of the rail can be known. Morphology. Each of the plurality of probes 10a has a corresponding coordinate system, such as a coordinate system CL or CR, and the respective coordinate systems are different from each other, and all of the corresponding coordinate systems must be corrected to the same coordinate system SL by the standard member 20, The surface geometry of the rail 30 to be tested is measured based on the same coordinate system SL. Referring to FIG. 2B, the morphological trajectory of the slide track measured by the measuring device 10 can be fitted by a simulated circle, wherein the center and coordinates of the left simulated circle are R=0.0755 and (2.529, 3.3514), respectively, and the center of the right simulated circle is The coordinates are R=0.0755 and (9.1414, 3.261). The pitch circle diameter (PCD) of the slide rail can be known by simulating the distance of the center of the circle.

3A, 3B, 3C and 3D are other aspects of the embodiment. 3A and 3B are schematic views of the present embodiment for measuring a ball type slide rail. 3A shows a measuring device for measuring four ball slides (four-groove type slide rails), the measuring device includes four measuring probes, each of which is perpendicular to the cut surface of the rail surface to be tested, and the moving device enables the measuring probe to Move left and right or up and down relative to the section of the side rail to be side. Figure 3B shows the measuring device for measuring with two ball slides (Gothic track slides). The measuring device comprises two measuring probes; or four measuring probes, two or two of which are staggered. The moving device enables the measuring probe to move left and right or up and down relative to the section of the side rail to be side.

3C and 3D are schematic views of the present embodiment for measuring a roller type slide rail. Figure 3C shows the measuring device for measuring a slide rail with two roller guides, the measuring device comprising two probes; or four probes, two or two of which are staggered, and the moving device enables the probe to be in the cross section of the side rail to be side Move left and right or up and down relative to each other. Figure 3D shows the measuring device for measuring four roller slides, the measuring device comprises four measuring probes, and the moving device enables the probe to move left and right or up and down on the section of the side rail to be moved.

Referring to FIG. 4A, a more compact measuring structure can be achieved by using the rail to be tested as a fixed jig. The embodiment further includes an adsorption device 10d, which is a magnetic adsorption device or a gas adsorption device. Referring to FIG. 4B, the embodiment further includes a side abutment surface 10e and a side edge clamping fixture 10f. The measuring device abuts one side of the slide rail with the side abutment surface 10e; the side gripping jig 10f holds the other side of the slide rail with the gripping surface 10g.

Fig. 5A is a cross-sectional view showing the measuring device of the embodiment. The relative positional relationship between the measuring probe 10a, the probe supporting base 10b, the moving device 10c, the side clamping jig 10f and the side rail 30 to be side is shown in FIG. 5A. The order of use of the device can be exemplified by placing the measuring device 10 on the slide rail from top to bottom, starting the adsorption device 10d, starting the side clamping jig 10f, and extending the probe 10a to start measurement. FIG. 5B is a schematic view showing the measuring device 10 and the rail 30 to be tested in the embodiment.

While the present invention has been described above in terms of the preferred embodiments thereof, it is not intended to limit the invention, and the invention may be modified and modified without departing from the spirit and scope of the invention. The patent protection scope of the invention is subject to the definition of the scope of the patent application attached to the specification.

10‧‧‧Measurement device

10a‧‧‧Measurement probe

10b‧‧‧ probe support

10c‧‧‧Mobile devices

10d‧‧‧Adsorption device

10e‧‧‧ side to side

10f‧‧‧Side clamping fixture

10g‧‧‧ clamping surface

20‧‧‧Standard parts

30‧‧‧ rails to be tested

FIG. 1 is a schematic diagram of a measuring device according to an embodiment of the present invention. 2A and 2B illustrate the measurement principle of this embodiment. 3A and 3B illustrate other aspects of the relative movement between the measuring probe and the rolling rail of the present embodiment. 3C and 3D illustrate other aspects of the relative movement between the measuring probe and the roller type slide rail of the present embodiment. Fig. 4A shows the adsorption device of this embodiment. Fig. 4B shows the side abutment, the clamping surface and the side clamping jig of the present embodiment. Fig. 5A is a cross-sectional view showing the measuring device of the embodiment. Fig. 5B is a schematic view showing the measuring device and the slide rail of the embodiment.

Claims (5)

A measuring device for measuring a relative geometry of a plurality of rails to be tested of a sliding rail, comprising: a plurality of measuring probes fixed to a probe supporting base, wherein the measuring probes are based on a surface geometry of the waiting guide rails And being mounted on the measuring probe support; at least one moving device translating the measuring probe support or the waiting guide on the cross section of the waiting guide to make the measuring probes relative to the waiting guide Each has a relative displacement; wherein each of the measuring probes has a corresponding coordinate system, the corresponding coordinate systems are different from each other, and the corresponding coordinate system is corrected to a same coordinate system through a standard member, and then The same coordinate is used as a reference to measure the surface geometry of the waiting track. The measuring device of claim 1, wherein the measuring probe is a contact linear displacement gauge. The measuring device according to claim 1, wherein the probes are displacement measuring probes of optical, pneumatic or electromagnetic principles. The measuring device according to claim 1, further comprising: an adsorption device that is adsorbed and fixed to the guide rail; one side of the side surface, the measuring device abuts against the guide rail with the side edge a side; and a side clamping fixture, the side clamping fixture clamping the other side of the rail with a clamping surface. The measuring device according to claim 4, wherein the adsorption device is a magnetic adsorption device or a gas adsorption device.