TW201802620A - Exposure apparatus, flat-panel display manufacturing method, and device manufacturing method - Google Patents
Exposure apparatus, flat-panel display manufacturing method, and device manufacturing method Download PDFInfo
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- TW201802620A TW201802620A TW106132437A TW106132437A TW201802620A TW 201802620 A TW201802620 A TW 201802620A TW 106132437 A TW106132437 A TW 106132437A TW 106132437 A TW106132437 A TW 106132437A TW 201802620 A TW201802620 A TW 201802620A
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
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- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Liquid Crystal (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
本發明係關於曝光裝置、平面顯示器之製造方法、及元件製造方法,詳言之,係關於製造半導體元件、液晶顯示元件等之微影製程中所使用之曝光裝置、使用前述曝光裝置之平面顯示器之製造方法、及使用前述曝光裝置之元件製造方法。 The present invention relates to an exposure device, a method for manufacturing a flat display, and a method for manufacturing an element. Specifically, the present invention relates to an exposure device used in a lithography process for manufacturing a semiconductor element, a liquid crystal display element, and the like, and a flat display using the aforementioned exposure device Manufacturing method, and device manufacturing method using the aforementioned exposure device.
一直以來,於製造液晶顯示元件、半導體元件(積體電路等)等電子元件(微元件)之微影製程中,係採用一邊使光罩或標線片(以下,統稱為「光罩」)與玻璃板或晶圓(以下,統稱為「基板」)沿既定掃描方向(scan方向)同步移動、一邊將形成於光罩之圖案使用能量束轉印至基板上之步進掃描(step & scan)方式之曝光裝置(所謂之掃描步進機(亦稱掃描機))等。 In the lithography process for manufacturing electronic components (micro-components) such as liquid crystal display elements, semiconductor elements (integrated circuits, etc.), a photomask or a reticle (hereinafter, collectively referred to as a "photomask") has been used Step & scan (step & scan) that moves synchronously with a glass plate or wafer (hereinafter collectively referred to as the "substrate") along a predetermined scanning direction (scan direction) while transferring the pattern formed on the photomask to the substrate using an energy beam ) Exposure device (the so-called scanning stepper (also known as a scanner)) and so on.
作為此種曝光裝置,有一種具有在能於掃描方向以長行程移動之X粗動載台上,搭載能於掃描交叉(cross scan)方向(與掃描方向正交之方向)移動之Y粗動載台的重疊型(龍門(gantry)型)載台裝置,作為此種載台裝置,以例如在由石材形成之平台(surface plate)上沿水平面移動之構成者廣為人知(例如,參照專利文獻1)。 As such an exposure apparatus, there is a type Y coarse movement capable of moving in a cross scan direction (a direction orthogonal to the scanning direction) on an X coarse movement stage capable of moving in a long stroke in the scanning direction. A superimposed type (gantry type) stage device of the stage is known as a type of such a stage device that moves along a horizontal plane on a surface plate made of stone (for example, refer to Patent Document 1) ).
上述專利文獻1之曝光裝置,由於重量抵消裝置係在對應步 進掃描之大範圍移動,因此必須於大範圍將平台上面(重量抵消裝置之移動導引面)之平面度作的高。此外,近年來曝光裝置之曝光對象的基板有越來越大型化之傾向,隨此,平台亦日漸大型化,因此除成本增加外,曝光裝置之搬送性、安裝時之作業性惡化等皆受到關心。為此,皆期待有一種能使平台變小之新技術的出現。 Since the exposure device of the aforementioned Patent Document 1 is in a corresponding step because the weight canceling device is During the large-scale movement of scanning, the flatness of the platform (moving guide surface of the weight offset device) must be made high in a large range. In addition, in recent years, the substrate of the exposure device tends to become larger and larger. With this, the platform has also become larger. Therefore, in addition to the increase in cost, the transportability of the exposure device and the workability during installation have deteriorated. care. For this reason, everyone is looking forward to the emergence of a new technology that can make the platform smaller.
先行技術文獻Advance technical literature
[專利文獻1]美國專利申請公開第2010/0018950號說明書 [Patent Document 1] US Patent Application Publication No. 2010/0018950
為縮小平台,本案發明人已提出一種具備支承重量抵消裝置之平台係移動於掃描交叉方向之被稱為步進平台之平台的曝光裝置(美國專利申請第13/221568號)。具備此步進平台之曝光裝置,用以引導從下方支承保持曝光對象基板之基板保持構件之重量抵消裝置往掃描方向之移動的步進平台,係在能移動於掃描交叉方向之狀態下被支承於防振裝置之架台上。具備步進平台之曝光裝置,由於本身重量亦大之步進平台係在支承有基板保持構件及重量抵消裝置等之狀態下被驅動於掃描交叉方向,因此在驅動前後,曝光裝置整體之重心移動大。因此,最近發現,使用步進平台之曝光裝置,會於防振裝置施加極大的偏載重,尤其是保持大型基板之基板保持構件變重,因此透過支承基板保持構件之重量抵消裝置作用於步進平台、以及進一步透過步進平台作用於架台之偏載重増大,使得曝光動作時因施加至被防振裝置支承之架台之偏載重導致曝光裝置整體些微的傾斜,而有招致曝光精度降低之虞。 In order to reduce the platform, the inventor of the present case has proposed an exposure device having a platform called a step platform that moves in the scanning cross direction (US Patent Application No. 13/221568). The exposure device provided with this stepping platform is used to guide the movement of the weight canceling device supporting the substrate holding member holding the exposure target substrate from below to the scanning direction. The stepping platform is supported in a state capable of moving in the scanning cross direction. On the stand of anti-vibration device. The exposure device with a stepping platform is driven by the stepping platform in the scanning cross direction while supporting a substrate holding member and a weight canceling device, etc., so the entire center of the exposure device moves before and after driving. Big. Therefore, recently, it has been found that an exposure device using a stepping platform will exert a large partial load on the anti-vibration device, especially the substrate holding member holding a large substrate becomes heavy, so the weight canceling device supporting the substrate holding member acts on the stepping The platform and the eccentric load applied to the gantry further through the stepping platform are so large that the entire exposure device may be tilted slightly due to the eccentric load applied to the gantry supported by the anti-vibration device during the exposure operation, which may cause the exposure accuracy to decrease.
本發明第1態樣,提供一種第1掃描型之曝光裝置,係在曝光處理時相對曝光用能量束使曝光對象物體在與水平面平行之第1方向以既定第1行程移動,其具備:移動體,能於該第1方向至少以該既定第1行程移動、且能在該水平面內於與該第1方向正交之第2方向以第2行程移動;物體保持構件,能保持該物體、與該移動體一起至少在與該水平面平行之方向移動;重量抵消裝置,從下方支承該物體保持構件以抵消該物體保持構件之重量;支承構件,延伸於該第1方向,從下方支承該重量抵消裝置並能在從下方支承該重量抵消裝置之狀態下,於該第2方向以該第2行程移動;支承架台,支承該支承構件;以及載重減輕裝置,用以減輕作用於該支承架台之重力方向之載重負荷。 According to a first aspect of the present invention, there is provided a first scanning-type exposure apparatus that moves an exposure target object with a predetermined first stroke in a first direction parallel to a horizontal plane with respect to an energy beam for exposure during exposure processing, and includes: The body can move at least the predetermined first stroke in the first direction, and can move the second stroke in the second direction orthogonal to the first direction in the horizontal plane; the object holding member can hold the object, Move with the moving body at least in a direction parallel to the horizontal plane; a weight canceling device supports the object holding member from below to offset the weight of the object holding member; a supporting member extending in the first direction to support the weight from below The offset device can move in the second direction in the second direction while supporting the weight offset device from below; a support stand supporting the support member; and a load reducing device for reducing the weight acting on the support stand Load in the direction of gravity.
根據此發明,在對物體之曝光處理時,因物體保持構件、重量抵消裝置及支承構件本身重量而產生之重力方向(鉛直方向向下)之載重負荷雖會作用於支承架台,但會因載重減輕裝置而減輕。從而能降低包含物體保持構件、重量抵消裝置及支承構件、以及支承架台之系的重心移動而作用於支承架台之偏載重,據此,即能維持充分高的曝光精度。 According to this invention, during the exposure process of an object, the load in the direction of gravity (vertical direction downward) due to the weight of the object holding member, the weight canceling device, and the support member itself will act on the support stand, but it will be affected by the load. Lighten the device while lightening. As a result, it is possible to reduce the eccentric load acting on the support frame including the object holding member, the weight canceling device and the support member, and the support frame, thereby maintaining a sufficiently high exposure accuracy.
本發明第2態樣,提供一種第2掃描型曝光裝置,係在曝光處理時相對曝光用能量束使曝光對象之物體在與水平面平行之第1方向以既定第1行程移動,其具備:第1移動構件,能於該第1方向至少以該既定第1行程移動;第2移動構件,引導該第1移動構件往該第1方向之移動、且能在該水平面內與該第1方向正交之第2方向與該第1移動構件一起以第2行程移動;物體保持構件,保持該物體、能與該第1移動構件一起至少在與該水平面平行之方向移動;重量抵消裝置,從下方支承該物體保持 構件以抵消該物體保持構件之重量;支承架台,包含從下方支承該重量抵消裝置之平台;線性馬達,包含設於該第2移動構件之磁石與設於該第1移動構件之線圈,將該第1移動構件以該第1行程驅動於該第1方向;以及載重減輕裝置,利用作用於該磁石與該重量抵消裝置之一部分之間之力,來減輕作用於該支承架台之重力方向之載重負荷。 According to a second aspect of the present invention, there is provided a second scanning-type exposure apparatus that moves an object of an exposure target in a first direction parallel to a horizontal plane with a predetermined first stroke during an exposure process with respect to an energy beam for exposure, and includes: 1 a moving member that can move at least the predetermined first stroke in the first direction; a second moving member that guides the first moving member to move in the first direction and can be positively aligned with the first direction in the horizontal plane The second direction intersects with the first moving member in a second stroke; the object holding member holds the object and can move with the first moving member at least in a direction parallel to the horizontal plane; the weight canceling device is from below Support the object A component to offset the weight of the object holding member; a support stand including a platform supporting the weight canceling device from below; a linear motor including a magnet provided on the second moving member and a coil provided on the first moving member, The first moving member is driven in the first direction by the first stroke; and a load reducing device that uses a force acting between the magnet and a part of the weight canceling device to reduce a load in the direction of gravity acting on the support stand. load.
根據此發明,在對物體之曝光處理時,能與保持物體之物體保持構件一起往與水平面平行之方向移動之第1移動構件,係被線性馬達驅動於第1方向。此時,因物體保持構件及重量抵消裝置本身重量而產生之重力方向之載重負荷雖會作用於支承架台,但該載重負荷,可藉由載重減輕裝置,利用作用在與重量抵消裝置之一部分之間之力來加以減輕。因此,從而能降低包含物體保持構件、重量抵消裝置及支承架台之系的重心移動而作用於支承架台之偏載重,據此,即能維持充分高的曝光精度。 According to this invention, during the exposure processing of the object, the first moving member capable of moving in the direction parallel to the horizontal plane together with the object holding member holding the object is driven by the linear motor in the first direction. At this time, although the load in the direction of gravity due to the weight of the object holding member and the weight canceling device itself will act on the support frame, the load can be used by the load reducing device to act as a part of the weight canceling device. Time to mitigate. Therefore, it is possible to reduce the eccentric load acting on the support frame including the movement of the center of gravity of the system including the object holding member, the weight canceling device, and the support frame, thereby maintaining sufficiently high exposure accuracy.
本發明第3態樣提供一種平面顯示器之製造方法,包含:使用上述第1及第2曝光裝置中之任一種使基板曝光的動作;以及使曝光後之前述基板顯影的動作。 A third aspect of the present invention provides a method for manufacturing a flat panel display, including: an operation of exposing a substrate using any of the first and second exposure devices; and an operation of developing the substrate after the exposure.
本發明第4態樣提供一種元件製造方法,包含:使用上述第1及第2曝光裝置中之任一種使物體曝光的動作;以及使曝光後之前述物體顯影的動作。 According to a fourth aspect of the present invention, there is provided a device manufacturing method including: an operation of exposing an object using any one of the first and second exposure devices; and an operation of developing the aforementioned object after exposure.
10‧‧‧曝光裝置 10‧‧‧Exposure device
11‧‧‧地面 11‧‧‧ Ground
12‧‧‧照明系 12‧‧‧ Department of Lighting
14、414‧‧‧基架 14, 414‧‧‧ base frame
14a、414a‧‧‧基架之本體部 14a, 414a‧‧‧The main body of the base frame
14b‧‧‧基架之腳部 14b‧‧‧foot of base frame
14c‧‧‧調整器 14c‧‧‧Adjuster
15‧‧‧輔助基架 15‧‧‧ auxiliary base frame
15a‧‧‧輔助基架之本體部 15a‧‧‧The main body of the auxiliary base frame
15b‧‧‧輔助基架之調整器 15b‧‧‧ Adjuster for auxiliary base frame
16‧‧‧Y線性導引裝置 16‧‧‧Y linear guide
16a‧‧‧Y線性導件 16a‧‧‧Y linear guide
16b‧‧‧滑件 16b‧‧‧Slider
17a‧‧‧X線性導件 17a‧‧‧X Linear Guide
17b‧‧‧滑件 17b‧‧‧Slider
18x‧‧‧X音圈馬達 18x‧‧‧X voice coil motor
18y‧‧‧Y音圈馬達 18y‧‧‧Y voice coil motor
21、28‧‧‧鏡座 21, 28‧‧‧ mirror mount
22x‧‧‧X移動鏡 22x‧‧‧X mobile mirror
22y‧‧‧Y移動鏡 22y‧‧‧Y moving mirror
23‧‧‧粗動載台 23‧‧‧Coarse movement stage
23x、123x、223x‧‧‧X粗動載台 23x, 123x, 223x‧‧‧X coarse motion stage
23y‧‧‧Y粗動載台 23y‧‧‧Y coarse moving stage
25、125、325、325b‧‧‧X樑 25, 125, 325, 325b‧‧‧X beam
26‧‧‧感測器 26‧‧‧Sensor
27‧‧‧標的物 27‧‧‧Target
30‧‧‧微動載台 30‧‧‧Micro-motion stage
31‧‧‧基板保持具 31‧‧‧ substrate holder
33‧‧‧基板載台架台 33‧‧‧ Substrate Stage
34‧‧‧防振裝置 34‧‧‧Anti-vibration device
35‧‧‧Y線性導引裝置 35‧‧‧Y linear guide
35a‧‧‧Y線性導件 35a‧‧‧Y linear guide
35b‧‧‧滑件 35b‧‧‧ slider
40、140、240、340、340b、440‧‧‧X托架 40, 140, 240, 340, 340b, 440‧‧‧X brackets
41、341‧‧‧連結板 41, 341‧‧‧ link board
42‧‧‧缺口部 42‧‧‧ gap
43、45‧‧‧撓曲裝置(連結裝置) 43, 45‧‧‧Deflection device (connection device)
46、446、478‧‧‧固定構件 46, 446, 478‧‧‧ fixed members
50、250、350、350a、450‧‧‧重量抵消裝置 50, 250, 350, 350a, 450‧‧‧ weight offset device
51、351‧‧‧筐體 51, 351‧‧‧
52‧‧‧空氣彈簧 52‧‧‧air spring
53‧‧‧Z滑件 53‧‧‧Z slider
54‧‧‧臂部 54‧‧‧arm
55‧‧‧基墊(空氣軸承) 55‧‧‧ base pad (air bearing)
56‧‧‧X可動子 56‧‧‧X mover
57‧‧‧密封墊(空氣軸承) 57‧‧‧Gasket (air bearing)
59、61‧‧‧平板構件 59, 61‧‧‧ Flat member
58、62、66、68‧‧‧側壁構件 58, 62, 66, 68‧‧‧ sidewall members
63‧‧‧頂部 63‧‧‧Top
64‧‧‧側壁部 64‧‧‧ sidewall
65‧‧‧平板構件 65‧‧‧ flat member
70‧‧‧調平裝置 70‧‧‧leveling device
72、472‧‧‧Y可動子 72, 472‧‧‧Y
73‧‧‧Y固定子 73‧‧‧Y
75、475、475a‧‧‧Y托架 75, 475, 475a‧‧‧Y bracket
76‧‧‧板片 76‧‧‧ plates
77‧‧‧支承構件 77‧‧‧ support member
78‧‧‧輔助托架 78‧‧‧ auxiliary bracket
81‧‧‧X可動子 81‧‧‧X mover
82‧‧‧X固定子 82‧‧‧X
90、490、490a‧‧‧Y步進平台 90, 490, 490a‧‧‧Y step platform
94‧‧‧Y可動子 94‧‧‧Y mover
96、353‧‧‧磁性體 96, 353‧‧‧ magnetic body
97、343、343a、343b、346‧‧‧永久磁石 97, 343, 343a, 343b, 346‧‧‧ permanent magnets
124‧‧‧安裝構件 124‧‧‧Mounting member
254‧‧‧X臂部 254‧‧‧X Arm
255‧‧‧Y臂部 255‧‧‧Y Arm
342‧‧‧開口部 342‧‧‧ opening
352‧‧‧鍔部 352‧‧‧ 锷 部
F1~F4‧‧‧分力 F 1 ~ F 4 ‧‧‧component
Fb、Ff、Fg、Fh‧‧‧磁吸力 Fb, Ff, Fg, Fh‧‧‧ magnetic attraction
Fd‧‧‧磁反作用力 Fd‧‧‧Magnetic reaction force
IL‧‧‧照明光 IL‧‧‧illumination light
IOP‧‧‧照明系 IOP‧‧‧Lighting Department
M‧‧‧光罩 M‧‧‧Photomask
MST‧‧‧光罩載台 MST‧‧‧Photomask Stage
P‧‧‧基板 P‧‧‧ substrate
PL‧‧‧投影光學系 PL‧‧‧ Projection Optics
PST、PSTa、PST1~PST4、PST3a、PST3b、PST4a‧‧‧基板載台裝置 PST, PSTa, PST1 ~ PST4, PST3a, PST3b, PST4a‧‧‧ substrate stage device
圖1係概略顯示第1實施形態之曝光裝置之構成的圖。 FIG. 1 is a diagram schematically showing a configuration of an exposure apparatus according to a first embodiment.
圖2係將圖1之曝光裝置所具有之基板載台從微動載台去除後加以顯 示的俯視圖。 FIG. 2 shows the substrate stage included in the exposure apparatus of FIG. 1 after being removed from the micro stage. The top view shown.
圖3係從+X方向觀察圖1之曝光裝置所具有之基板載台的圖。 3 is a view of a substrate stage included in the exposure apparatus of FIG. 1 as viewed from the + X direction.
圖4係以示意方式顯示因基板載台裝置本身重量產生之力之流向的圖。 FIG. 4 is a diagram schematically showing a flow of a force due to the weight of the substrate stage device itself.
圖5係用以說明作用於重量抵消裝置之磁吸力的圖。 Fig. 5 is a diagram for explaining a magnetic attraction force acting on the weight canceling device.
圖6(A)係以示意方式顯示未設置會作用於重量抵消裝置之磁吸力之產生裝置之基板載台裝置之重心移動的圖、圖6(B)係以示意方式顯示對重量抵消裝置作用鉛直方向向上之磁吸力之基板載台裝置之重心移動的圖。 FIG. 6 (A) is a diagram schematically showing the movement of the center of gravity of a substrate stage device without a magnetic attraction force generating device that acts on the weight canceling device, and FIG. 6 (B) is a schematic view showing the effect on the weight canceling device Figure of the center of gravity of the substrate stage device with magnetic attraction upward in the vertical direction.
圖7係從+X方向觀察第2實施形態之基板載台裝置的圖。 Fig. 7 is a view of the substrate stage device of the second embodiment as viewed from the + X direction.
圖8係第3實施形態之基板載台裝置的俯視圖。 Fig. 8 is a plan view of a substrate stage device according to a third embodiment.
圖9係從+X方向觀察第3實施形態之基板載台裝置之部分剖面的圖。 FIG. 9 is a partial cross-sectional view of the substrate stage device of the third embodiment as viewed from the + X direction.
圖10係從+X方向觀察第4實施形態之基板載台裝置之部分剖面的圖。 FIG. 10 is a partial cross-sectional view of the substrate stage device of the fourth embodiment as viewed from the + X direction.
圖11係第4實施形態之基板載台裝置的俯視圖。 11 is a plan view of a substrate stage device according to a fourth embodiment.
圖12(A)係顯示將產生磁吸力之永久磁石與磁性體加以組合之一例的圖、圖12(B)係將產生磁吸力之永久磁石與永久磁石加以組合之一例的圖。 FIG. 12 (A) is a diagram showing an example of a combination of a permanent magnet and a magnetic body that generates magnetic attraction, and FIG. 12 (B) is an example of a combination of a permanent magnet and a permanent magnet that generates magnetic attraction.
圖13係從+X方向觀察第4實施形態之第1變形例之基板載台裝置之部分剖面的圖。 FIG. 13 is a partial cross-sectional view of a substrate stage device according to a first modification of the fourth embodiment as viewed from the + X direction.
圖14係從+X方向觀察第4實施形態之第2變形例之基板載台裝置之部分剖面的圖。 FIG. 14 is a partial cross-sectional view of a substrate stage device according to a second modified example of the fourth embodiment as viewed from the + X direction.
圖15係從-Y方向觀察第5實施形態之曝光裝置所具備之基板載台裝置之部分剖面的圖。 FIG. 15 is a partial cross-sectional view of a substrate stage device provided in the exposure apparatus according to the fifth embodiment as viewed from the −Y direction.
圖16係顯示從+X方向觀察圖15之基板載台裝置之部分剖面的圖。 FIG. 16 is a view showing a partial cross section of the substrate stage device of FIG. 15 as viewed from the + X direction.
圖17係顯示從-Y方向觀察第5實施形態之變形例之基板載台裝置的 圖。 Fig. 17 is a view showing a substrate stage device according to a modification of the fifth embodiment as viewed from the -Y direction; Illustration.
《第1實施形態》 "First Embodiment"
以下,根據圖1~圖6(B),說明第1實施形態。圖1中概略顯示了第1實施形態之曝光裝置10之構成。曝光裝置10、係以用於液晶顯示裝置(平面顯示器)之矩形(方型)玻璃基板P(以下,僅稱基板P)為曝光對象物之步進掃描方式的投影曝光裝置(亦稱掃描機)。 Hereinafter, a first embodiment will be described with reference to FIGS. 1 to 6 (B). FIG. 1 schematically shows the configuration of an exposure apparatus 10 according to the first embodiment. Exposure device 10 is a projection exposure device (also referred to as a scanner) in a step-and-scan method using a rectangular (square) glass substrate P (hereinafter, simply referred to as a substrate P) for a liquid crystal display device (flat display) as an exposure target. ).
曝光裝置10、具有照明系IOP、保持光罩M之光罩載台MST、投影光學系PL、一對基板載台架台33、包含保持基板P之基板保持具31的基板載台裝置PST、及此等之控制系等。以下,將曝光時光罩M與基板P相對投影光學系16分別被掃描之方向設為X軸方向、水平面內與X軸正交之方向為Y軸方向、與X軸及Y軸正交之方向為Z軸方向,並以繞X軸、Y軸及Z軸旋轉之方向分別為θx、θy及θz方向來進行說明。此外,將於X軸、Y軸及Z軸方向之位置分別設為X位置、Y位置及Z位置來進行說明。又,於基板P表面(+Z側之面)塗有光阻劑(感應劑)。 An exposure device 10, a mask stage MST having an illumination IOP, a holding mask M, a projection optics PL, a pair of substrate stage 33, a substrate stage device PST including a substrate holder 31 that holds a substrate P, and These controls are such. Hereinafter, the directions in which the reticle M and the substrate P are scanned relative to the projection optical system 16 during exposure are set to the X-axis direction, and the direction orthogonal to the X-axis in the horizontal plane is the Y-axis direction, and the directions orthogonal to the X-axis and Y-axis The directions are the Z-axis directions, and the directions of rotation about the X-axis, Y-axis, and Z-axis are the directions θx, θy, and θz, respectively. In addition, the positions in the X-axis, Y-axis, and Z-axis directions will be described as X, Y, and Z positions, respectively. A photoresist (sensitizer) is coated on the surface of the substrate P (the surface on the + Z side).
照明系IOP,係與例如美國專利第6,552,775號說明書等所揭示之照明系同樣的構成。亦即,照明系IOP具有分別照明光罩M上被配置成鋸齒狀之複數個、例如5個照明區域的複數個、例如5個照明系,各照明系將從未圖示之光源(例如水銀燈)射出之光,經由未圖示之反射鏡、分光鏡(dichroic mirror)、遮簾、波長選擇濾波器、各種透鏡等,作為曝光用照明光(照明光)IL照射於光罩M。照明光IL,係使用例如i線(波長365nm)、g線(波長436nm)、h線(波長405nm)等之光(或上述i線、g線、h線之合成光)。又,照 明光IL之波長可藉由波長選擇濾波器,例如視所要求之解析度適當的加以切換。 The lighting system IOP has the same configuration as the lighting system disclosed in, for example, US Pat. No. 6,552,775. That is, the lighting system IOP has a plurality of zigzag-shaped, for example, five lighting areas, such as five lighting systems arranged on the illumination mask M, and each lighting system will be a light source (such as a mercury lamp) (not shown). ) The emitted light is irradiated onto the mask M as an exposure illumination light (illumination light) IL through an unillustrated reflector, dichroic mirror, shade, wavelength selection filter, various lenses, and the like. For the illumination light IL, light (i.e., i-line, g-line, and h-line combined light) such as i-line (wavelength 365 nm), g-line (wavelength 436 nm), and h-line (wavelength 405 nm) is used. Again, according to The wavelength of bright light IL can be switched by a wavelength selection filter, for example, depending on the required resolution.
於光罩載台MST,例如以真空吸附着方式固定有其圖案面(圖1之下面)形成有電路圖案等之光罩M。光罩載台MST係以非接觸狀態搭載在未圖示之導件上,藉由例如包含線性馬達之光罩載台驅動系(未圖示)以既定行程驅動,並被適當的微驅動於Y軸方向及θz方向。光罩載台MST於XY平面內之位置資訊(含θz方向之旋轉資訊),係藉由包含對固定(或形成)於光罩M之反射面照射雷射光束(測長光束)之雷射干涉儀之為圖示的光罩干涉儀系統加以測量。此測量結果被供應至未圖示之主控制裝置。主控制裝置根據光罩干涉儀系統測量之上述測量結果,透過光罩載台驅動系(未圖示)驅動(位置控制)光罩載台MST。又,亦可取代光罩干涉儀系統、或與光罩干涉儀系統一起使用編碼器(或由複數個編碼器構成之編碼器系統)。 On the photomask stage MST, for example, a photomask M having a circuit pattern or the like formed on its pattern surface (lower side in FIG. 1) is fixed by vacuum adsorption. The photomask stage MST is mounted on a guide (not shown) in a non-contact state, and is driven at a predetermined stroke by, for example, a photomask stage drive system (not shown) including a linear motor, and is appropriately micro-driven at Y-axis direction and θz direction. The position information of the mask stage MST in the XY plane (including the rotation information in the θz direction) is a laser that includes a laser beam (length-measuring beam) irradiated to the reflecting surface fixed (or formed) on the mask M The interferometer is a photomask interferometer system as shown in the figure. This measurement result is supplied to a master control device (not shown). The main control device drives (position control) the mask stage MST through the mask stage driving system (not shown) according to the above measurement results measured by the mask interferometer system. In addition, an encoder (or an encoder system composed of a plurality of encoders) may be used instead of or in combination with the mask interferometer system.
投影光學系PL配置在光罩載台MST之圖1中的下方。投影光學系PL具有與例如美國專利第6,552,775號說明書所揭示之投影光學系相同之構成。亦即,投影光學系PL對應前述複數個照明區域,包含光罩M之圖案像之投影區域配置成交錯狀之複數個、例如五個投影光學系(多透鏡投影光學系),與具有以Y軸方向為長邊方向之長方形單一像場之投影光學系具有相等之機能。本實施形態中,複數個投影光學系之各個係使用例如兩側遠心之等倍系、形成正立正像者。 The projection optical system PL is arranged below the mask stage MST in FIG. 1. The projection optical system PL has the same configuration as the projection optical system disclosed in, for example, US Pat. No. 6,552,775. That is, the projection optical system PL corresponds to the aforementioned plurality of illumination areas, and the projection areas including the pattern image of the mask M are arranged in a plurality of staggered shapes, for example, five projection optical systems (multi-lens projection optical systems), The projection optical system of the rectangular single image field whose axis direction is the long side direction has the same function. In the present embodiment, each of the plurality of projection optical systems uses, for example, a telecentric equal magnification system on both sides to form an erect image.
因此,當以來自照明系IOP之照明光IL照明光罩M上之照明區域時,即藉由通過被配置成投影光學系PL之第1面(物體面)與圖案面大致一致之光罩M的照明光IL,透過投影光學系PL將該照明區域內之光罩M之電 路圖案之投影像(部分正立像),形成於與被配置在投影光學系PL之第2面(像面)側、基板P上之照明區域共軛之照明光IL之照射部位(曝光區域)。並藉由光罩載台MST與構成基板載台裝置PST之一部分之後述微動載台30的同步驅動,相對照明區域(照明光IL)使光罩M移動於掃描方向(X軸方向)且相對曝光區域(照明光IL)使基板P移動於掃描方向(X軸方向),據以進行基板P上一個照射區域(區劃區域)之掃描曝光,於該照射區域轉印光罩M之圖案(光罩圖案)。亦即,本實施形態中,係以照明系IOP及投影光學系PL在基板P上生成光罩M之圖案,藉由使用照明光IL之基板P上感應層(光阻層)之曝光以在基板P上形成該圖案。 Therefore, when the illumination area on the mask M is illuminated with the illumination light IL from the lighting system IOP, the mask M that passes through the first surface (object surface) configured to project the optical system PL substantially coincides with the pattern surface. The illumination light IL is transmitted through the projection optical system PL to the electricity of the mask M in the illumination area. The projection image (partially erect image) of the road pattern is formed on the irradiation portion (exposure area) of the illumination light IL conjugated to the illumination area on the substrate P on the second surface (image surface) side of the projection optical system PL. . The photomask stage MST and the micro-movement stage 30 described later constituting a part of the substrate stage device PST are driven synchronously to move the photomask M in the scanning direction (X-axis direction) and relative to the illumination area (illumination light IL). The exposure area (illumination light IL) moves the substrate P in the scanning direction (X-axis direction), thereby performing scanning exposure of an irradiation area (regional area) on the substrate P, and transferring the pattern (light Hood pattern). That is, in this embodiment, the pattern of the photomask M is generated on the substrate P with the illumination system IOP and the projection optical system PL, and the exposure of the induction layer (photoresist layer) on the substrate P using the illumination light IL is performed in This pattern is formed on the substrate P.
一對基板載台架台33分別由延伸於Y軸方向之構件構成(參照圖3,其長邊方向兩端部被設在地面11上之防振裝置34從下方支承。一對基板載台架台33於X軸方向以既定間隔平行配置。於一對基板載台架台33各個之上面,如圖2所示,於X軸方向分離彼此平行的固定有延伸於Y軸方向之機械性Y線性導引裝置(單軸導引裝置)之要素的複數個(例如針對各基板載台架台33為3個)Y線性導件35a。 The pair of substrate stage holders 33 are each constituted by members extending in the Y-axis direction (refer to FIG. 3, and both ends in the longitudinal direction are supported from below by a vibration isolator 34 provided on the ground 11. The pair of substrate stage holders 33 is arranged in parallel at a predetermined interval in the X-axis direction. On each of a pair of substrate stage stands 33, as shown in FIG. 2, a mechanical Y linear guide extending in the Y-axis direction is separated from each other in the X-axis direction and fixed in parallel. A plurality of Y linear guides 35a (for example, three for each substrate stage 33) of the guide device (single-axis guide device).
一對基板載台架台33構成曝光裝置10之裝置本體(機體),投影光學系PL及光罩載台MST等則搭載於裝置本體。 A pair of substrate stage 33 constitutes the apparatus body (body) of the exposure apparatus 10, and the projection optical system PL and the mask stage MST are mounted on the apparatus body.
基板載台裝置PST,如圖1所示,具備一對基架(base frame)14、輔助基架15、粗動載台23、微動載台30、重量抵消裝置50、及從下方支承重量抵消裝置50之Y步進平台90等。 As shown in FIG. 1, the substrate stage device PST includes a pair of base frames 14, an auxiliary base frame 15, a coarse motion stage 23, a micro motion stage 30, a weight canceling device 50, and a weight canceling device supported from below. Y step platform 90 of the device 50 and the like.
一對基架14中之一方,如圖1及圖2所示,配置在+X側之基板載台架台33之+X側,另一方則配置在-X側之基板載台架台33之-X側 。由於一對基架14具有相同構造,因此,以下僅針對+X側之基架14加以說明。基架14,如圖1所示,包含由具有與YZ平面平行之一面與另一面延伸於Y軸方向之板狀構件構成之本體部14a、與從下方支承本體部14a之複數個脚部14b。脚部14b於Y軸方向以既定間隔、例如設有3個。於各脚部14b之下端部設有複數個調整器14c,能調整本體部14a之Z位置。 As shown in FIGS. 1 and 2, one of the pair of base frames 14 is disposed on the + X side of the substrate stage stand 33 on the + X side, and the other is disposed on the -X side of the substrate stage stand 33- X side . Since the pair of base frames 14 have the same structure, only the base frame 14 on the + X side will be described below. The base frame 14, as shown in FIG. 1, includes a main body portion 14a composed of a plate-shaped member having one surface parallel to the YZ plane and the other surface extending in the Y-axis direction, and a plurality of leg portions 14b supporting the main body portion 14a from below. . The leg portions 14b are provided at a predetermined interval in the Y-axis direction, for example, three leg portions 14b are provided. A plurality of adjusters 14c are provided at the lower end of each leg portion 14b, and the Z position of the main body portion 14a can be adjusted.
於本體部14a之X軸方向兩側面(亦即,上述之一面與另一面)分別固定有線性馬達之要素的Y固定子73。Y固定子73具有磁石單元,此磁石單元包含於Y軸方向以既定間隔排列之複數個永久磁石。又,於本體部14a之上面,固定有延伸於Y軸方向之機械性Y線性導引裝置(單軸導引裝置)之要素的Y線性導件16a。 Y fixtures 73 which are elements of a linear motor are fixed to both sides of the body portion 14a in the X-axis direction (that is, one of the above faces and the other face). The Y holder 73 has a magnet unit, and the magnet unit includes a plurality of permanent magnets arranged at a predetermined interval in the Y-axis direction. Further, a Y linear guide 16a, which is a component of a mechanical Y linear guide (uniaxial guide) extending in the Y-axis direction, is fixed to the upper surface of the main body portion 14a.
輔助基架15配置載一對基板載台架台33之間。輔助基架15,其大小雖不同,但除基架14之本體部14a外的部分則係同樣構成。亦即,輔助基架15,包含由延伸於Y軸方向之板狀構件構成之本體部15a、與從下方支承本體部15a而能調整本體部14a之Z位置之調整器15b。於輔助基架15之本體部15a上面,與基架14同樣的固定有延伸於Y軸方向之Y線性導件16a。輔助基架15上端之Z位置被設定為較一對基板載台架台33之上面略低(或大致相同)。 The auxiliary base frame 15 is arranged between a pair of substrate stage frames 33. Although the auxiliary base frame 15 is different in size, portions other than the main body portion 14 a of the base frame 14 are similarly configured. That is, the auxiliary base frame 15 includes a main body portion 15a composed of a plate-like member extending in the Y-axis direction, and an adjuster 15b that supports the main body portion 15a from below to adjust the Z position of the main body portion 14a. A Y linear guide 16 a extending in the Y-axis direction is fixed to the main body portion 15 a of the auxiliary base frame 15 in the same manner as the base frame 14. The Z position of the upper end of the auxiliary base frame 15 is set to be slightly lower (or substantially the same) than the upper surfaces of the pair of substrate stage frames 33.
粗動載台23,包含Y粗動載台23y與搭載在Y粗動載台23y上之X粗動載台23x。 The coarse movement stage 23 includes a Y coarse movement stage 23y and an X coarse movement stage 23x mounted on the Y coarse movement stage 23y.
Y粗動載台23y搭載在一對基架14及輔助基架15上。Y粗動載台23y,如圖2所示,具有一對X樑25。一對X樑25分別由延伸於X軸方向之構件構成,於Y軸方向以既定間隔彼此平行配置。一對X樑25之各個,如圖3 所示,YZ剖面之形狀為上邊較底邊長之倒立的大致等腰梯形。此梯形,除上下2邊外,具有在YZ平面內相對Z軸以角θ(θ較45度小,例如為10度)傾斜之一邊、與在YZ平面內相對Z軸以角-θ傾斜之另一邊。 The Y coarse movement stage 23 y is mounted on a pair of the base frame 14 and the auxiliary base frame 15. The Y coarse movement stage 23y includes a pair of X beams 25 as shown in FIG. 2. The pair of X beams 25 are each composed of members extending in the X-axis direction, and are arranged parallel to each other at a predetermined interval in the Y-axis direction. Each of a pair of X beams 25, as shown in Figure 3 As shown, the shape of the YZ section is a generally isosceles trapezoid with an upper side longer than the bottom side. This trapezoid has one side inclined at an angle θ (θ is smaller than 45 degrees, for example, 10 degrees) with respect to the Z axis in the YZ plane, and two sides inclined with an angle -θ with respect to the Z axis in the YZ plane. the other side.
於一對X樑25各個之長邊方向兩端部近旁下面,如圖2所示,固定有被稱為Y托架(carriage)75之構件。亦即,於Y粗動載台23y下面,安裝有例如合計4個Y托架75。配置在+X側之2個Y托架75,係透過固定在各個之上面之板片76彼此連結。同樣的,配置在-X側之2個Y托架75亦透過板片76彼此連結。由於例如合計4個Y托架75之各個具有相同構造,以下,僅針對對應+X側基架14之1個Y托架75加以說明。 A member called a Y carriage 75 is fixed to the lower surface of the pair of X beams 25 near both ends in the longitudinal direction, as shown in FIG. 2. That is, a total of, for example, four Y brackets 75 are mounted below the Y coarse moving stage 23y. The two Y brackets 75 arranged on the + X side are connected to each other through a plate 76 fixed to each of the Y brackets 75. Similarly, two Y brackets 75 arranged on the -X side are also connected to each other through a plate 76. Since each of the four Y brackets 75 in total has the same structure, for example, only one Y bracket 75 corresponding to the + X side base frame 14 will be described below.
Y托架75,如圖1所示,由XZ剖面倒U字形之構件成,在一對對向面間插入基架14之本體部14a。於Y托架75之一對對向面之各個,分別固定有透過既定間隙(clearance/gap)與一對Y固定子73之各個對向之一對Y可動子72。各Y可動子72,包含未圖示之線圈單元,與對向之Y固定子73一起構成將Y粗動載台23y於Y軸方向以既定行程驅動之電磁力(羅倫茲力)驅動方式的動圈型Y線性馬達。又,Y粗動載台23y之Y位置資訊係以未圖示之線性編碼器系統加以求出。 As shown in FIG. 1, the Y bracket 75 is made of an inverted U-shaped member in the XZ cross section, and the main body portion 14 a of the base frame 14 is inserted between a pair of facing surfaces. A pair of Y movers 72 are fixed to each of a pair of facing surfaces of the Y bracket 75 through a predetermined clearance (gap) and a pair of Y holders 73. Each Y mover 72 includes a coil unit (not shown), and an opposing Y holder 73 constitutes an electromagnetic force (Lorentz force) driving method that drives the Y coarse moving stage 23y in the Y axis direction with a predetermined stroke. Moving coil type Y linear motor. The Y position information of the Y coarse movement stage 23y is obtained using a linear encoder system (not shown).
於Y托架75之頂面,相對各個Y托架75固定有複數個(例如2個(參照圖2))包含滾動體(例如複數個球等)、以能滑動之方式卡合於Y線性導件16a之滑件16b。Y粗動載台23y,被包含Y線性導件16a與滑件16b之複數個Y線性導引裝置,直進引導於Y軸方向。 On the top surface of the Y-bracket 75, a plurality of (for example, two (see FIG. 2)) fixed to each Y-bracket 75 include rolling elements (for example, a plurality of balls, etc.), and are slidably engaged with the Y-line. The sliding member 16b of the guide member 16a. The Y coarse movement stage 23y is linearly guided in the Y-axis direction by a plurality of Y linear guides including a Y linear guide 16a and a slider 16b.
又,於一對X樑25之長邊方向中央部下面,透過支承構件77固定有複數個(例如2個)輔助托架78。輔助托架78由長方體狀之構件成,於 其下面,與Y托架75同樣的,固定有以可滑動之方式卡合於Y線性導件16a之滑件16b。據此,Y粗動載台23y即相對基板載台架台33在振動上分離。此外,於圖1中雖係於紙面深度方向重疊而隱藏,針對1個輔助托架78,滑件16b係於紙面深度方向(Y軸方向)以既定間隔、例如安裝有2個。如此,Y粗動載台23y,其長邊方向中央部透過輔助托架78被輔助基架15從下方支承,而使本身重量引起之撓曲受到抑制。 Further, a plurality of (for example, two) auxiliary brackets 78 are fixed below the center portions in the longitudinal direction of the pair of X beams 25 through a support member 77. The auxiliary bracket 78 is made of a rectangular parallelepiped member, and below it, it is connected with the Y bracket 75 Similarly, a slider 16b that is slidably engaged with the Y linear guide 16a is fixed. Accordingly, the Y coarse movement stage 23y is separated from the substrate stage stage 33 in vibration. In addition, although it is hidden in the paper surface depth direction in FIG. 1, the slider 16 b is attached to the paper surface depth direction (Y-axis direction) at a predetermined interval, for example, two auxiliary brackets 78. In this way, the Y coarse movement stage 23y is supported by the auxiliary base frame 15 from below through the auxiliary bracket 78 through the auxiliary portion 78 in the longitudinal direction center portion, thereby suppressing deflection due to its own weight.
於一對X樑25各個之上面,如圖2及圖3所示,於Y軸方向以既定間隔彼此平行的固定又複數條(本實施形態中,針對1個X樑25例如為2條)延伸於X軸方向之機械性單軸導引裝置之要素的X線性導件17a。又,於一對X樑25之YZ剖面中之2個斜邊(斜面),如圖1及圖2所示,固定有從X樑25之-X側端部近旁到+X側端部近旁延設之X固定子82。X固定子82具有磁石單元,此磁石單元包含於X軸方向以既定間隔排列之複數個永久磁石。 On each of a pair of X beams 25, as shown in FIG. 2 and FIG. 3, a plurality of fixed X beams are parallel to each other at a predetermined interval in the Y-axis direction (in this embodiment, for example, two X beams 25) An X linear guide 17a, which is an element of a mechanical single-axis guidance device extending in the X-axis direction. In addition, as shown in FIG. 1 and FIG. 2, two hypotenuses (inclined faces) in the YZ cross section of a pair of X beams 25 are fixed from the vicinity of the −X side end portion of the X beam 25 to the + X side end portion. X extension 82 fixed. The X holder 82 includes a magnet unit, and the magnet unit includes a plurality of permanent magnets arranged at a predetermined interval in the X-axis direction.
X粗動載台23x,如圖2所示的包含連結一對X托架40與一對X托架40之一對連結板41。又,由於一對X托架40具有相同構造,因此,以下僅針對Y側之X托架40加以說明。 The X coarse movement stage 23x includes, as shown in FIG. 2, a pair of coupling plates 41 that connect one pair of X brackets 40 and one pair of X brackets 40. Since the pair of X brackets 40 have the same structure, only the X bracket 40 on the Y side will be described below.
X托架40,如圖2及圖3所示,具有以X軸方向為長邊方向之俯視長方形的平板構件61、與在平板構件61之長邊方向一端部與另一端部之Y軸方向兩端面分別以上端面與平板構件61之上面大致同面高之狀態固定的各一對、合計4個側壁構件62。X托架40,從+X方向觀察,如圖3所示,具有倒U字狀之形狀,於彼此成對之+Y側與-Y側之側壁構件62彼此間插入X樑25。平板構件61之X軸方向兩端,相對+X側及-X側之側壁構件62之各個,向X軸方向之外側略突出(參照圖2)。彼此成對之+Y側與-Y側之側 壁構件62,分別具有與從上端(+Z側端)至中央部近旁之XZ平面平行的第1部分、與從中央部近旁至下端(-Z側端)向-Y側或+Y側傾斜而與上述X樑25之2個斜面對向的第2部分。於X托架40之長邊方向(X軸方向)中央部近旁,設有在X托架40之X軸方向長度之1/3略短之範圍不存在側壁構件62之部分(以下,稱缺口部)42(參照圖2)。 As shown in FIGS. 2 and 3, the X bracket 40 includes a flat plate member 61 with a rectangular plan view with the X-axis direction being the long side direction, and a Y-axis direction at one end portion and the other end portion of the long-side direction of the plate member 61. The two end surfaces are respectively a pair of four side wall members 62 fixed in a state where the upper end surface and the upper surface of the flat plate member 61 are approximately the same height. The X bracket 40 is viewed from the + X direction, and has an inverted U-shape as shown in FIG. 3. The X-beams 25 are inserted between the + Y-side and -Y-side side wall members 62 that are paired with each other. The two ends of the flat plate member 61 in the X-axis direction are slightly protruded to the outer side in the X-axis direction with respect to each of the side wall members 62 on the + X side and the −X side (see FIG. 2). + Y side and -Y side in pairs The wall member 62 has a first portion parallel to the XZ plane from the upper end (+ Z side end) to the vicinity of the central portion, and is inclined toward the -Y side or + Y side from the central portion to the lower end (-Z side end). And the second part facing obliquely with the two X beams 25 mentioned above. Near the center of the long side (X-axis direction) of the X-bracket 40, there is a portion (hereinafter, referred to as a notch) in which the side wall member 62 is absent within a short range of 1/3 of the X-axis length of the X-bracket 40. Section) 42 (see FIG. 2).
於X托架40之平板構件61各個之下面(-Z側之面),如圖3所示,相對各個X線性導件17a固定有複數個(例如4個(參照圖2))包含滾動體、以能滑動之方式卡合於Y線性導件17a之滑件17b。本實施形態中,於X粗動載台23x之下面固定有例如合計16個之滑件17b。X粗動載台23x,被包含Y線性導件17a與滑件17b之複數個X線性導引裝置,直進引導於X軸方向。 Below each of the flat plate members 61 of the X bracket 40 (the surface on the -Z side), as shown in Fig. 3, a plurality of (for example, 4 (see Fig. 2)) rolling elements are fixed to each X linear guide 17a. Slider 17b which is slidably engaged with Y linear guide 17a. In this embodiment, for example, a total of 16 sliders 17b are fixed below the X coarse movement stage 23x. The X coarse movement stage 23x is linearly guided in the X axis direction by a plurality of X linear guides including a Y linear guide 17a and a slider 17b.
於X托架40所具有之4個側壁構件62各個之第2部分之內面,固定有與一對X固定子82之各個透過既定間隙(clearance/gap)對向之X可動子81。各X可動子81,包含未圖示之線圈單元,與對向之X固定子82一起構成將X粗動載台23x於X軸方向以既定行程驅動之電磁力(羅倫茲力)驅動方式的動圈型X線性馬達。又,各X可動子81包含未圖示之鐵心,在與對向之X固定子82之間產生磁吸力。亦即,各可動子81構成有芯線圈單元。、X粗動載台23x之X位置資訊係以未圖示之線性編碼器系統加以求出。 On the inner surface of the second part of each of the four side wall members 62 included in the X bracket 40, an X mover 81 facing each of a pair of X holders 82 through a predetermined clearance (gap) is fixed. Each X mover 81 includes a coil unit (not shown) and, together with the opposite X fixer 82, constitutes an electromagnetic force (Lorentz force) driving method that drives the X coarse moving stage 23x in the X axis direction with a predetermined stroke. Moving coil type X linear motor. Each X mover 81 includes an iron core (not shown), and generates a magnetic attraction force between the X mover 81 and the opposite X fixer 82. That is, each movable element 81 constitutes a cored coil unit. The X position information of the X coarse motion stage 23x is obtained using a linear encoder system (not shown).
一對連結板41之各個,如圖2所示,由延設於Y軸方向之平板構件構成。一方之連結板41,係固定在從配置於+Y側之X托架40之Y軸方向中央略靠-Y側起、至配置於-Y側之X托架40之Y軸方向中央略靠+Y側,將一對X托架40之+X端部彼此連結。另一方之連結板41,則固定在從配置於+Y側之X托架40之Y軸方向中央略靠-Y側起、至配置於-Y側之X 托架40之Y軸方向中央略靠+Y側,將一對X托架40之-X端部彼此連結。亦即,具有一對X托架40與一對連結板41之X粗動載台23x,具有俯視呈中央具開口部之略矩形形狀。 Each of the pair of connecting plates 41 is, as shown in FIG. 2, a flat plate member extending in the Y-axis direction. One connection plate 41 is fixed from the center of the Y-axis of the X-bracket 40 arranged on the + Y side to the -Y side, and to the center of the Y-axis of the X-bracket 40 arranged on the -Y side. The + Y side connects the + X ends of the pair of X brackets 40 to each other. The connecting plate 41 on the other side is fixed from the -Y side to the center of the Y-axis of the X bracket 40 arranged on the + Y side, to the X arranged on the -Y side. The center of the bracket 40 in the Y-axis direction is slightly closer to the + Y side, and the −X ends of the pair of X brackets 40 are connected to each other. That is, the X coarse movement stage 23x having a pair of X brackets 40 and a pair of connecting plates 41 has a substantially rectangular shape with an opening at the center in plan view.
此外,雖未圖示,但於X粗動載台23x,安裝有以機械方式限制後述微動載台30相對X粗動載台23x之可移動量的擋止構件、或於X軸、及Y軸方向用以測量微動載台30相對X粗動載台23x之移動量的間隙感測器等。 In addition, although not shown, a stopper member that mechanically restricts the amount of movement of the micro-motion stage 30 to the X-coarse movement stage 23x described later on the X-coarse movement stage 23x, or the X-axis and Y A gap sensor or the like for measuring the movement amount of the micro-movement stage 30 relative to the X coarse movement stage 23x in the axis direction.
微動載台30,由圖1及圖3可知,由俯視大致正方形之板狀構件(或箱形(中空長方體)之構件)構成,於其上面透過基板保持具31以例如真空吸附(或靜電吸附)方式吸附保持基板P。 As can be seen from FIGS. 1 and 3, the micro-movement stage 30 is composed of a plate-like member (or a box-shaped (hollow rectangular parallelepiped) member) having a substantially square shape in plan view, and a substrate holder 31 is passed therethrough for vacuum adsorption (or electrostatic adsorption), for example. ) Method to suck and hold the substrate P.
微動載台30,係被包含分別含固定於X粗動載台23x之固定子與固定於微動載台30之可動子構成之複數個音圈馬達(或線性馬達)的微動載台驅動系,於X粗動載台23x上微驅動於XY平面內之3自由度方向(X軸、Y軸及θz之各方向)。複數個音圈馬達,如圖1所示,將微動載台30微驅動於X軸方向之X音圈馬達18x係於Y軸方向分離設置有一對(紙面內深處之X音圈馬達18x未圖示),如圖3所示,將微動載台30微驅動於Y軸方向之Y音圈馬達18y則於X軸方向分離間設置有一對(紙面內深處之Y音圈馬達18y未圖示)。微動載台30,使用上述X音圈馬達18x及/或Y音圈馬達18y與X粗動載台23x同步驅動(與X粗動載台23x同方向、同速度驅動),而與X粗動載台23x一起以既定行程移動於X軸方向及/或Y軸方向。因此,微動載台30可相對投影光學系PL(參照圖1)於XY2軸方向以長行程移動(粗動)可能,且能於X,Y、θz方向之3自由度方向微幅移動(微動)。 The micro-motion stage 30 is a micro-motion stage drive system including a plurality of voice coil motors (or linear motors) composed of a stator fixed to the X coarse motion stage 23x and a movable element fixed to the micro-motion stage 30, On the X coarse motion stage 23x, the three degrees of freedom (X-axis, Y-axis, and θz directions) in the XY plane are micro-driven. A plurality of voice coil motors, as shown in FIG. 1, an X voice coil motor 18x that micro-drives the micro-motion stage 30 in the X axis direction is separated from the Y axis, and a pair of X voice coil motors 18x deep in the paper (Pictured), as shown in FIG. 3, a Y voice coil motor 18y that drives the micro-motion stage 30 in the Y-axis direction is provided with a pair between the X-axis separations (the Y voice coil motor 18y deep inside the paper is not shown)示). The micro-movement stage 30 uses the X voice coil motor 18x and / or Y voice coil motor 18y to drive synchronously with the X coarse movement stage 23x (driving in the same direction and at the same speed as the X coarse movement stage 23x), and moves coarsely with X The stage 23x moves in the X-axis direction and / or the Y-axis direction together with a predetermined stroke. Therefore, the micro-motion stage 30 can move (coarse movement) with a long stroke in the XY2 axis direction relative to the projection optical system PL (refer to FIG. 1), and can move slightly (micro-motion) in 3 degrees of freedom in the X, Y, and θz directions. ).
又,微動載台驅動系具有用以將微動載台30微幅驅動於θx、θy及Z軸方向之3自由度方向之未圖示的複數個Z音圈馬達。關於包含複數個音圈馬達之微動載台驅動系之構成,已揭示於例如美國專利申請公開第2010/0018950號說明書。 In addition, the micro-motion stage driving system includes a plurality of Z voice coil motors (not shown) for driving the micro-motion stage 30 by a small amount in the directions of θx, θy, and 3 degrees of freedom in the Z-axis direction. The structure of a micro-motion stage drive system including a plurality of voice coil motors has been disclosed in, for example, US Patent Application Publication No. 2010/0018950.
於微動載台30之-X側之側面,如圖1所示,透過鏡座21固定了具有與X軸正交之反射面的X移動鏡(棒狀反射鏡)22x。又,於微動載台30之-Y側之側面,如圖3所示,透過鏡座28固定了具有與Y軸正交之反射面的Y移動鏡22y。微動載台30之XY平面內之位置資訊,係藉由包含對X移動鏡22x及Y移動鏡22y分別照射測長光束(干涉儀光束)之複數個雷射干涉儀的雷射干涉儀系統(以下,稱基板干涉儀系統),隨時加以檢測。又,實際上,基板干涉儀系統具備複數個分別對應X移動鏡22x之X雷射干涉儀、及對應Y移動鏡22y之Y雷射干涉儀,但圖1中僅代表性的顯示來自X雷射干涉儀之測長光束。複數個雷射干涉儀分別固定於裝置本體。又,微動載台30於θx、θy及Z軸方向之位置資訊,係藉由固定在微動載台30下面之感測器26(參照圖3),使用例如後述固定於重量抵消裝置50之標的物27加以求出。關於上述微動載台30之位置測量系之構成,已揭示於例如美國專利申請公開第2010/0018950號說明書。 On the side of the -X side of the micro-movement stage 30, as shown in Fig. 1, an X-moving mirror (rod-shaped mirror) 22x having a reflecting surface orthogonal to the X-axis is fixed through the lens holder 21. On the side of the -Y side of the micro-motion stage 30, as shown in FIG. 3, a Y moving mirror 22y having a reflecting surface orthogonal to the Y axis is fixed through the lens holder 28. The position information in the XY plane of the micro-motion stage 30 is a laser interferometer system including a plurality of laser interferometers that respectively irradiate a long-length beam (interferometer beam) to the X-moving mirror 22x and the Y-moving mirror 22y. Hereinafter, it is referred to as a substrate interferometer system) and is inspected at any time. In fact, the substrate interferometer system includes a plurality of X laser interferometers corresponding to the X moving mirror 22x and a Y laser interferometer corresponding to the Y moving mirror 22y. However, only a representative display in FIG. 1 comes from the X laser The measuring beam of the interferometer. A plurality of laser interferometers are respectively fixed to the device body. The position information of the micro-motion stage 30 in the θx, θy, and Z-axis directions is obtained by using a sensor 26 (see FIG. 3) fixed below the micro-motion stage 30. Find the thing 27. The configuration of the position measurement system of the micro-motion stage 30 is disclosed in, for example, US Patent Application Publication No. 2010/0018950.
重量抵消裝置50,如圖3所示,由延設於Z軸方向之柱狀構件構成,亦稱為心柱。重量抵消裝置50插入X粗動載台23x之開口部內,搭載在後述Y步進平台90上。重量抵消裝置50透過後述調平裝置70從下方支承微動載台30。 As shown in FIG. 3, the weight canceling device 50 is composed of a columnar member extending in the Z-axis direction, and is also referred to as a core post. The weight canceling device 50 is inserted into the opening of the X coarse movement stage 23x, and is mounted on a Y step platform 90 described later. The weight canceling device 50 supports the micro-motion stage 30 from below through a leveling device 70 described later.
重量抵消裝置50具有筐體51、空氣彈簧52及Z滑件53、一對 臂部54等。 The weight canceling device 50 includes a casing 51, an air spring 52 and a Z slider 53, and a pair of The arm portion 54 and the like.
筐體51由俯視矩形之構件構成,於中央部形成有+Z側之面開口之圓形開口部(參照圖2)。於筐體51之下面安裝有軸承面朝向-Z側之複數個空氣軸承(以下,稱基墊)55。 The casing 51 is formed of a rectangular member in plan view, and a circular opening portion (see FIG. 2) is formed in the central portion with a surface opening on the + Z side. A plurality of air bearings (hereinafter referred to as base pads) 55 with bearing surfaces facing the -Z side are mounted below the casing 51.
空氣彈簧52收容在筐體51之開口部內。於空氣彈簧52從外部供應加壓氣體。 The air spring 52 is housed in the opening of the casing 51. The air spring 52 is supplied with pressurized gas from the outside.
Z滑件53由延伸於Z軸方向之筒狀構件構成,插入筐體51之開口部內,搭載在空氣彈簧52上。 The Z slider 53 is composed of a cylindrical member extending in the Z-axis direction, is inserted into an opening portion of the casing 51, and is mounted on an air spring 52.
一對臂部54之各個,由延伸於Y軸方向之棒狀構件構成。一對臂部54中配置在+Y側之臂部54,其一端固定在筐體51之+Y側側面、另一端則插入X托架40所具有之缺口部42內。同樣的,配置在-Y側之臂部54,其一端固定在筐體51之-Y側側面、另一端則插入X托架40所具有之缺口部42內。一對臂部54各個之另一端,具有與一對X樑25分別具有之斜面中、形成於Y軸方向內側之斜面平行對向之斜面。又,於一對臂部54各個之另一端之斜面,、固定有與一對X樑25分別具有之一對X固定子82中、配置在Y軸方向內側之X固定子82透過既定間隙(clearance/gap)對向之X可動子56。各X可動子56,包含未圖示之線圈單元,與對向之X固定子82一起構成將重量抵消裝置50於X軸方向以既定行程驅動之X線性馬達。又,各X可動子56,包含未圖示之鐵心,在與對向之X固定子82之間產生磁吸力。 Each of the pair of arm portions 54 is configured by a rod-shaped member extending in the Y-axis direction. One of the pair of arm portions 54 is disposed on the + Y side, one end of which is fixed to the + Y side surface of the casing 51 and the other end is inserted into the notch portion 42 of the X bracket 40. Similarly, one end of the arm portion 54 disposed on the -Y side is fixed to the side surface of the -Y side of the casing 51, and the other end is inserted into the notch portion 42 of the X bracket 40. The other end of each of the pair of arm portions 54 has an inclined surface facing in parallel with the inclined surface formed on the inner side in the Y-axis direction among the inclined surfaces each of the pair of X beams 25 has. In addition, on the inclined surface at the other end of each of the pair of arm portions 54, among the X-fixers 82 having one pair of X-fixers 82 and a pair of X-beams 25 respectively, the X-fixers 82 arranged inside the Y-axis direction pass through a predetermined gap ( clearance / gap) X mover 56 opposite. Each X mover 56 includes a coil unit (not shown) and an X linear motor that drives the weight canceling device 50 in the X axis direction with a predetermined stroke together with the opposite X fixer 82. Each X movable element 56 includes an iron core (not shown), and generates a magnetic attraction force between the X movable element 56 and the opposite X stationary element 82.
於重量抵消裝置50之上方搭載調平(leveling)裝置70。調平裝置70,被安裝在Z滑件53之+Z側端部、軸承面朝向+Z側之空氣軸承(以下,稱密封墊)57從下方以非接觸方式支承。調平裝置70係將微動載台30支承 為傾動(tilt)自如(相對XY平面於θx及θy方向擺動自如)之裝置。重量抵消裝置50,藉由空氣彈簧52產生之鉛直方向向上之力,透過Z滑件53及調平裝置70抵消包含微動載台30之系之重量(重力方向之力),具以降低上述複數個Z音圈馬達之負荷。 A leveling device 70 is mounted above the weight canceling device 50. The leveling device 70 is non-contactly supported from below by an air bearing (hereinafter, referred to as a gasket) 57 mounted on the + Z side end of the Z slider 53 with the bearing surface facing the + Z side. Leveling device 70 supports the micro-motion stage 30 It is a device that can tilt (freely swing in the directions of θx and θy relative to the XY plane). The weight canceling device 50 cancels the weight (force in the direction of gravity) of the system including the micro-motion stage 30 through the Z-slider 53 and the leveling device 70 by the upward force generated by the air spring 52, so as to reduce the above-mentioned plural number. Z voice coil motor load.
重量抵消裝置50,如圖2所示,係透過複數條(例如4條)被稱為撓曲裝置條連結裝置45(以下,適當地稱撓曲裝置45)機械性的連接於X粗動載台23x(X托架40)。撓曲裝置45,包含例如與XY平面平行配置之薄厚度之帶狀鋼板(或鋼索、合成樹脂製繩、鍊等)、與設在該鋼板兩端部之鉸接裝置(例如球接頭、或鉸練裝置),上述鋼板透過鉸接裝置架設在重量抵消裝置50與X托架40之間。複數個撓曲裝置45之Z位置,與重量抵消裝置50於Z軸方向之重心位置大致一致。撓曲裝置45,其一端固定於筐體51之角部(俯視下,筐體51之頂點),另一端則固定於X托架40之側壁構件62。亦即,重量抵消裝置50,藉由透過複數個撓曲裝置45之任一者被X粗動載台23x牽引,而與該X粗動載台23x一體的移動於X軸方向、或Y軸方向。此時,於重量抵消裝置50,在包含其於Z軸方向重心位置之與XY平面平行之平面內會有牽引力之作用,因此繞與移動方向正交之軸線之力矩具(俯仰力矩)不會作用。此外,包含調平裝置70、撓曲裝置45,關於本實施形態之重量抵消裝置50之詳細構成,以揭示於例如美國專利申請公開第2010/0018950號說明書。 As shown in FIG. 2, the weight canceling device 50 is mechanically connected to the X coarse dynamic load through a plurality of (for example, four) devices called a flexure device connection device 45 (hereinafter, appropriately referred to as a flexure device 45). Station 23x (X bracket 40). The deflection device 45 includes, for example, a thin strip steel plate (or steel cable, synthetic resin rope, chain, etc.) arranged parallel to the XY plane, and hinge devices (such as ball joints or hinges) provided at both ends of the steel plate. Training device), the steel plate is erected between the weight canceling device 50 and the X bracket 40 through a hinge device. The Z positions of the plurality of deflection devices 45 substantially coincide with the positions of the centers of gravity of the weight canceling devices 50 in the Z-axis direction. One end of the bending device 45 is fixed to a corner portion of the casing 51 (the top of the casing 51 in plan view), and the other end is fixed to the side wall member 62 of the X bracket 40. That is, the weight canceling device 50 is pulled by the X coarse movement stage 23x through any one of the plurality of deflection devices 45, and moves integrally with the X coarse movement stage 23x in the X-axis direction or the Y-axis. direction. At this time, the weight cancelling device 50 has a traction force in a plane that is parallel to the XY plane including the position of the center of gravity in the Z-axis direction. Therefore, the moment (pitch moment) around the axis orthogonal to the moving direction does not occur. effect. In addition, a detailed configuration of the weight canceling device 50 of the present embodiment including the leveling device 70 and the flexing device 45 is disclosed in, for example, the specification of US Patent Application Publication No. 2010/0018950.
Y步進平台90,綜合圖1至圖3可知,由延伸於X軸方向之YZ剖面矩形之構件構成,於俯視下,以和一對X樑25之各個相距既定距離之狀態(非接觸狀態)配置在一對X樑25之間。Y步進平台90之長邊方向尺寸,被設定為較微動載台30於X軸方向之移動行程略長若干。又,Y步進平台90之寬 度方向(Y軸方向)尺寸,係設定可支承重量抵消裝置50所具有之基墊55之寬度。Y步進平台90之材質為鑄鐵或緻密之石材(輝長岩)、陶瓷、CFRP材等,其上面之平坦度被加工為非常高。 Y stepping platform 90, as shown in Figs. 1 to 3, is composed of a YZ cross-section rectangular member extending in the X-axis direction. In a plan view, it is in a state (non-contact state) at a predetermined distance from each of a pair of X beams 25. ) Is arranged between a pair of X beams 25. The length dimension of the Y step platform 90 is set to be slightly longer than the movement stroke of the micro-motion stage 30 in the X-axis direction. Also, the width of Y step platform 90 The size in the direction of the direction (Y-axis direction) is set to the width of the base pad 55 of the supportable weight canceling device 50. The material of the Y step platform 90 is cast iron or dense stone (gabbro), ceramics, CFRP, etc., and the flatness of the top is processed to be very high.
於Y步進平台90之下面,相對各個Y線性導件35a固定有複數個(例如2個(參照圖2))包含滾動體(例如,複數個球等)、以能滑動之方式卡合於複數個Y線性導件35a之滑件35b。Y步進平台90,被包含Y線性導件35a與Y滑件35b之複數個Y線性導引裝置35,於一對基板載台架台33上以既定行程直進引導於Y軸方向。 Below the Y step platform 90, a plurality of (for example, two (refer to FIG. 2)) fixed to each of the Y linear guides 35a are composed of rolling bodies (for example, a plurality of balls, etc.), and are slidably engaged with The slider 35b of the plurality of Y linear guides 35a. The Y step platform 90 is guided by a plurality of Y linear guides 35 including a Y linear guide 35a and a Y slider 35b on a pair of substrate stage tables 33 in a Y-axis direction.
Y步進平台90,如圖2所示,透過連接在固定於+X側及-X側端面之固定構件46各個之一對撓曲裝置43,機械性的連結於各一對Y托架75。撓曲裝置43與上述撓曲裝置45具有大致相同構成。如此,Y步進平台90,當在Y軸方向之一側或另一側之Y托架75被驅動於Y軸方向時,即被該Y托架75牽引而一體的往Y軸方向移動。撓曲裝置43,其長邊方向(此處係Y軸方向)之剛性較其他5自由度方向(此處係X,Z,θx、θy、θz方向)之剛性低,於上述5自由度方向,Y步進平台90與Y粗動載台23y在振動上分離。 As shown in FIG. 2, the Y step platform 90 is mechanically connected to each pair of Y brackets 75 through a pair of deflection devices 43 connected to each of the fixing members 46 fixed to the + X and -X side end faces. . The deflection device 43 has substantially the same configuration as the deflection device 45 described above. In this way, when the Y-bracket 75 on one or the other side of the Y-axis direction is driven in the Y-axis direction, the Y-step platform 90 is pulled by the Y-bracket 75 and moves in the Y-axis direction as a whole. The bending device 43 has a lower rigidity in the long-side direction (here, the Y-axis direction) than the other five-degree-of-freedom directions (here, the X, Z, θx, θy, and θz directions). The Y step platform 90 is separated from the Y coarse movement stage 23y in vibration.
以上述方式構成之曝光裝置10,在未圖示之主控制裝置之管理下,以未圖示之光罩搬送裝置(光罩裝載器)進行光罩M往光罩載台MST上之裝載、並藉由未圖示之基板搬入裝置進行基板P往基板載台裝置PST上之搬入(裝載)。之後,由主控制裝置使用未圖示之對準檢測系實施對準測量,在該對準測量結束後,進行步進掃描(step & scan)方式之曝光動作。由於此曝光動作與習知之步進掃描方式之曝光動作相同,因此省略其詳細說明。 The exposure device 10 configured as described above, under the management of a main control device (not shown), loads the photomask M onto the photomask stage MST with a photomask transfer device (photomask loader) (not shown), The substrate P is loaded (loaded) onto the substrate stage device PST by a substrate loading device (not shown). After that, the main control device performs an alignment measurement using an alignment detection system (not shown), and after the alignment measurement is completed, a step & scan exposure operation is performed. Since this exposure operation is the same as the exposure operation of the conventional step-and-scan method, a detailed description is omitted.
此處,上述步進掃描方式之曝光動作,係對設定在基板P之 複數個照射區域依序進行曝光處理。基板P,在掃描動作時係於X軸方向以既定行程被等速驅動(以下,稱X掃描動作),於步進動作時(照射區域間移動時)則係適當的被驅動於X軸方向及/或Y軸方向(以下,分別稱X步進動作、Y步進動作)。 Here, the exposure operation of the above-mentioned step-and-scan method is performed on the substrate P The plurality of irradiation areas are sequentially subjected to exposure processing. The substrate P is driven at a constant speed in a predetermined stroke in the X-axis direction during a scanning operation (hereinafter referred to as the X-scanning operation), and is appropriately driven in the X-axis direction during a stepping operation (when moving between irradiation areas). And / or the Y-axis direction (hereinafter referred to as the X step operation and the Y step operation, respectively).
上述X掃描動作中、及X步進動作中使基板P移動於X軸方向時,於基板載台裝置PST,係根據編碼器系統之測量值在Y粗動載台23y上將X粗動載台23x驅動於X軸方向,並根據基板干涉儀系統之測量值以複數個X音圈馬達18x將微動載台30與X粗動載台23x同步驅動。又,當X粗動載台23x往X軸方向移動時,因被此X粗動載台23x牽引,重量抵消裝置50即與X粗動載台23x一起往X軸方向移動。此時、重量抵消裝置50,係由主控制裝置透過由X可動子56與X固定子82構成之線性馬達,與X粗動載台23x同步被驅動於X軸方向。此時,重量抵消裝置50係在Y步進平台90上移動。又,上述X掃描動作及X步進動作時,微動載台30雖有相對X粗動載台23x被微幅驅動於Y軸方向、及/或θz方向之情形,但由於重量抵消裝置50之Y位置不會變化,因此重量抵消裝置50恆僅在Y步進平台90上移動。 When the substrate P is moved in the X-axis direction during the X scanning operation and the X step operation, the X coarse movement is carried on the Y coarse movement stage 23y at the substrate stage device PST according to the measurement value of the encoder system. The stage 23x is driven in the X-axis direction, and the micro-motion stage 30 and the X coarse-motion stage 23x are synchronously driven by a plurality of X voice coil motors 18x according to the measurement values of the substrate interferometer system. When the X coarse movement stage 23x moves in the X-axis direction, the weight cancelling device 50 moves in the X-axis direction together with the X coarse movement stage 23x because it is pulled by the X coarse movement stage 23x. At this time, the weight canceling device 50 is driven by the main control device in the X-axis direction in synchronization with the X coarse moving stage 23x through a linear motor composed of the X mover 56 and the X fixer 82. At this time, the weight canceling device 50 moves on the Y step platform 90. In the X-scanning operation and the X-stepping operation, the fine movement stage 30 may be slightly driven in the Y-axis direction and / or the θz direction with respect to the X coarse movement stage 23x. The Y position does not change, so the weight canceling device 50 constantly moves only on the Y step platform 90.
相對於此,上述Y步進動作時,於基板載台裝置PST,Y粗動載台23y在一對基架14上被以既定行程驅動於Y軸方向,與此Y粗動載台23y一體的,X粗動載台23x以既定行程移動於Y軸方向。又,重量抵消裝置50與X粗動載台23x一體的以既定行程移動於Y軸方向。此時,從下方支承重量抵消裝置50之Y步進平台90,被與Y粗動載台23y同步驅動。因此,重量抵消裝置50恆被Y步進平台90從下方支承。 In contrast, during the above-mentioned Y step operation, the Y coarse movement stage 23y is driven on the pair of base frames 14 in the Y-axis direction with a predetermined stroke in the substrate stage device PST, and is integrated with the Y coarse movement stage 23y. Yes, the X coarse movement stage 23x moves in the Y-axis direction with a predetermined stroke. The weight canceller 50 is integrated with the X coarse movement stage 23x and moves in the Y-axis direction with a predetermined stroke. At this time, the Y step platform 90 supporting the weight canceling device 50 from below is driven synchronously with the Y coarse movement stage 23y. Therefore, the weight canceling device 50 is constantly supported by the Y step platform 90 from below.
其次,說明基板載台裝置PST之組裝順序。本第1實施形態 中,基板載台裝置PST,首先在無塵室之地面11上,以圖2所示之配置分別設置一對基板載台架台33、一對基架14、及輔助基架15。之後,分別透過Y線性導引裝置16將Y托架75搭載於一對基架14、將輔助托架78搭載於輔助基架15,並於一對基板載台架台33上透過複數個Y線性導引裝置35搭載Y步進平台90。又,亦可事先於其他場所將Y托架75組裝於一對基架14、將輔助托架78組裝於輔助基架15。 Next, the assembly procedure of the substrate stage device PST will be described. First Embodiment In the substrate stage device PST, a pair of substrate stage stands 33, a pair of base frames 14, and an auxiliary base frame 15 are respectively arranged on the floor 11 of the clean room in the configuration shown in FIG. Thereafter, the Y bracket 75 is mounted on the pair of base frames 14, the auxiliary bracket 78 is mounted on the auxiliary base frame 15 through the Y linear guide 16, and a plurality of Y linears are transmitted through the pair of substrate stage frames 33. The guide device 35 is equipped with a Y step platform 90. In addition, the Y bracket 75 may be assembled to the pair of base frames 14 and the auxiliary bracket 78 may be assembled to the auxiliary base frame 15 at other locations in advance.
接著,於Y步進平台90上搭載重量抵消裝置50,此外,於Y托架75及輔助托架78上搭載一對X樑25。之後,以X固定子82與固定於重量抵消裝置50所具有之臂部54之X可動子56對向之方式搭載X托架40。又,亦可事先於其他場所於一對X樑分別安裝X托架40。之後,調整一對X樑25之位置(Y軸方向間隔)以使X固定子82與固定於重量抵消裝置50所具有之臂部54之X可動子56相距既定間隔對向,亦可藉由一對連結板76及77固定位置。 Next, a weight canceling device 50 is mounted on the Y step platform 90, and a pair of X beams 25 are mounted on the Y bracket 75 and the auxiliary bracket 78. After that, the X bracket 40 is mounted so that the X holder 82 faces the X mover 56 fixed to the arm portion 54 of the weight canceling device 50. Alternatively, the X brackets 40 may be attached to a pair of X beams in other places in advance. After that, adjust the position of the pair of X beams 25 (interval in the Y-axis direction) so that the X holder 82 and the X mover 56 fixed to the arm portion 54 of the weight canceling device 50 are spaced apart from each other at a predetermined interval. A pair of link plates 76 and 77 are fixed in position.
之後,將微動載台30(含調平裝置70)裝載於重量抵消裝置50上,並將複數個音圈馬達之固定子與可動子加以組合。接著,對重量抵消裝置50之空氣彈簧52、基墊55及密封墊57、以及調平裝置70所具有之未圖示的空氣軸承供應加壓氣體,微動載台30即被重量抵消裝置50以非接觸方式支承。 After that, the micro-motion stage 30 (including the leveling device 70) is mounted on the weight canceling device 50, and a plurality of voice coil motor holders and movable members are combined. Next, pressurized gas is supplied to the air spring 52, the base pad 55 and the sealing pad 57 of the weight canceling device 50, and an air bearing (not shown) included in the leveling device 70, and the micro-motion stage 30 is used by the weight canceling device 50 to Non-contact support.
其次,說明施加於基板載台裝置PST之力的流向。又,以下說明之施加於基板載台裝置PST之力,無論微動載台30之靜止中或動作中,皆會產生。 Next, the flow of the force applied to the substrate stage device PST will be described. The force applied to the substrate stage device PST described below occurs regardless of whether the micro-motion stage 30 is stationary or in motion.
當基板載台裝置PST被組裝完成時,基板P、基板保持具31及微動載台30(含調平裝置70)等(以下,稱微動載台30等)因本身重量之Z軸方 向向下之力,即如圖4所示,以下述流向傳至地面11上。又,雖然圖4中之基板載台裝置PST係以示意方式顯示而與圖1~3中所示形狀略有不同,但對於與圖1~圖3中所示構成部分對應之構成部分,係使用予相同符號。 When the substrate stage device PST is assembled, the Z axis of the substrate P, the substrate holder 31, the micro-motion stage 30 (including the leveling device 70), etc. (hereinafter, referred to as the micro-motion stage 30, etc.) due to its weight. The downward force, as shown in FIG. 4, is transmitted to the ground 11 in the following flow direction. Also, although the substrate stage device PST in FIG. 4 is shown in a schematic manner and has a slightly different shape from that shown in FIGS. 1 to 3, the components corresponding to the components shown in FIGS. 1 to 3 are Use the same symbols.
如圖4所示,微動載台30等之本身重量係透過重量抵消裝置50被Y步進平台90支承。此處,如圖5所示,於重量抵消裝置50所具有之一對臂部54中、安裝在+Y側之臂部54,會作用在包含固定於臂部54另一端之鐵心的X可動子56與安裝在X樑25之斜面之X固定子82之間於YZ平面相對Y軸傾斜θ方向之磁吸力F。同樣的,於安裝在-Y側之臂部54,會作用於YZ平面相對Y軸傾斜-θ方向之磁吸力F。各個磁吸力F,分解為鉛直方向(Z軸方向)之分力F1、與水平方向(Y軸方向)之分力F2。此處,由於水平方向之分力F2會往彼此抵消之方向作用,因此於重量抵消裝置50僅會作用加上鉛直方向分力F1之力(亦即2F1)。因此,如圖4所示,微動載台30等之本身重量,其一部分被鉛直方向之分力F1(2F1)抵消,剩餘之力傳至Y步進平台90。傳至Y步進平台90之力,介由基板載台架台33及防振裝置34傳至地面11。另一方面,於X樑25則會施加鉛直方向之分力F1的反力,本身重量與鉛直方向分力F1之反力介由基架14及輔助基架15(參照圖1)傳至地面11。 As shown in FIG. 4, the weight of the micro-motion stage 30 and the like is supported by the Y step platform 90 through the weight canceling device 50. Here, as shown in FIG. 5, among the pair of arm portions 54 included in the weight canceling device 50, the arm portion 54 mounted on the + Y side will act on X movable including the iron core fixed to the other end of the arm portion 54. The magnetic attraction force F between the sub-56 and the X-fixer 82 installed on the inclined surface of the X-beam 25 is inclined in the θ direction with respect to the Y-axis in the YZ plane. Similarly, the arm portion 54 mounted on the -Y side acts on a magnetic attraction force F in which the YZ plane is inclined to the -θ direction with respect to the Y axis. Each of the magnetic attractive force F, divided into a vertical direction (Z axis direction) of the component force F 1, the horizontal direction (Y axis direction) of the component force F 2. Here, since the component force F 2 in the horizontal direction acts in a direction that cancels each other, only the force (ie, 2F 1 ) that adds the component force F 1 in the vertical direction acts on the weight canceling device 50. Therefore, as shown in FIG. 4, a part of the weight of the micro-motion stage 30 and the like is cancelled by the component force F 1 (2F 1 ) in the vertical direction, and the remaining force is transmitted to the Y step platform 90. The force transmitted to the Y stepping platform 90 is transmitted to the ground 11 via the substrate stage 33 and the anti-vibration device 34. On the other hand, a reaction force of the component force F 1 in the vertical direction is applied to the X beam 25. The reaction force of the weight and the component force F 1 in the vertical direction is transmitted through the base frame 14 and the auxiliary base frame 15 (see FIG. 1). To the ground 11.
如以上之說明,根據本實施形態之曝光裝置10,如圖6(A)、圖6(B)所示,與重量抵消裝置50與X樑25之間不會產生磁吸力之基板載台裝置PSTa(圖6(A))相較,本實施形態之基板載台裝置PST(圖6(B)),由於磁吸力之作用而可將微動載台30及重量抵消裝置50視為例如中空構件等輕量之物,因此能縮短基板載台裝置PST被驅動於掃描交叉方向時之重心移動距離L。亦即,基板載台裝置PST,由於能減小被驅動於掃描交叉方向時防振裝 置34所承受之載重變化,因此能減少曝光裝置10之變形,提升曝光精度。 As described above, according to the exposure apparatus 10 of this embodiment, as shown in FIGS. 6 (A) and 6 (B), a substrate stage device that does not generate magnetic attraction between the weight canceling device 50 and the X beam 25 Compared with PSTa (Fig. 6 (A)), the substrate stage device PST (Fig. 6 (B)) of this embodiment can treat the micro-motion stage 30 and the weight canceling device 50 as, for example, hollow members due to the effect of magnetic attraction. Since it is lightweight, it is possible to shorten the center-of-gravity moving distance L when the substrate stage device PST is driven in the scanning cross direction. In other words, the substrate stage device PST can reduce the vibration-proof mounting when it is driven in the scanning cross direction. The load of the bearing 34 is changed, so the deformation of the exposure device 10 can be reduced, and the exposure accuracy can be improved.
又,由於將因微動載台30等及重量抵消裝置50本身重量產生之鉛直方向向下之力之一部分傳至X樑25,因此Y步進平台90能減小作用於本身之鉛直方向向下之力。從而,支承重量抵消裝置50之基墊55,可使用負荷容量小之小型基墊。亦即,Y步進平台90可縮小支承基墊55之引導面(Y軸方向尺寸)。 In addition, since a part of the downward force generated in the vertical direction due to the weight of the micro-motion stage 30 and the weight canceling device 50 itself is transmitted to the X beam 25, the Y step platform 90 can reduce the vertical direction acting on itself downward. Power. Therefore, as the base pad 55 of the supporting weight canceling device 50, a small base pad having a small load capacity can be used. That is, the Y step platform 90 can reduce the guide surface (the dimension in the Y-axis direction) of the support base pad 55.
又,Y步進平台90,由於能減少本身之負荷,因此能降低Y步進平台90之剛性。從而,Y步進平台90可減少厚度等而進一步小型化。 In addition, the Y step platform 90 can reduce its own load, so the rigidity of the Y step platform 90 can be reduced. Therefore, the Y step platform 90 can be further downsized by reducing the thickness and the like.
此外,基板載台裝置PST,由於Y步進平台90可小型化,因此能減小使Y步進平台90於Y軸方向步進移動之驅動力。 In addition, since the substrate stage device PST can be miniaturized, the driving force for moving the Y step platform 90 in the Y-axis direction can be reduced.
其次,說明曝光裝置之其他實施形態。以下之第2實施形態以後之各實施形態中,由於基板載台裝置以外之部分與前述第1實施形態之曝光裝置10相同,因此,以下僅針對基板載台裝置加以說明。 Next, another embodiment of the exposure apparatus will be described. In the following embodiments after the second embodiment, the parts other than the substrate stage device are the same as the exposure device 10 of the first embodiment. Therefore, only the substrate stage device will be described below.
《第2實施形態》 "Second Embodiment"
接著,根據圖7說明第2實施形態。此處,與前述第1實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, a second embodiment will be described with reference to FIG. 7. Here, the same or equivalent components as those in the first embodiment described above are denoted by the same or similar symbols, and the description thereof is simplified or omitted.
本第2實施形態之基板載台裝置PST1,其整體構成雖與前述基板載台裝置PST相同,但取代X樑25而設置X樑125之點、以及X托架140之形狀與X托架40之形狀一部分不同等,部分構成與基板載台裝置PST相異。以下,以兩者之相異點為中心進行說明。 Although the overall structure of the substrate stage device PST1 of the second embodiment is the same as the aforementioned substrate stage device PST, the point where the X beam 125 is provided instead of the X beam 25, the shape of the X bracket 140, and the X bracket 40 Part of the shape is different, and part of the configuration is different from the substrate stage device PST. The following description focuses on the differences between the two.
如圖7所示,基板載台裝置PST1具備之一對X樑125,分別具有於YZ剖面將矩形(含菱形及正方形)之4個頂點分別切除(去角)的形狀,亦 即具有八角形狀。一方(+Y側)之X樑125,以在θx方向相對Y軸傾斜角φ(例如45度)之狀態透過安裝構件124固定在一方之Y托架75上面。另一方(-Y側)之X樑125,與一方之X樑125左右對稱的,亦即以在θx方向相對Y軸傾斜角-φ之狀態透過安裝構件124固定在另一方之Y托架75上面。一對X樑125分別具有4個斜面(相對XY平面傾斜之面)。 As shown in FIG. 7, the substrate stage device PST1 includes a pair of X beams 125 each having a shape in which four vertices of a rectangle (including a rhombus and a square) are cut off (cornered) at the YZ section, and That is, it has an octagonal shape. The X-beam 125 on one side (+ Y side) is fixed to the Y-bracket 75 on the one side through the mounting member 124 in a state of an inclination angle φ (for example, 45 degrees) with respect to the Y-axis in the θx direction. The X-beam 125 on the other side (-Y side) is symmetrical to the X-beam 125 on one side, that is, it is fixed to the other Y-bracket 75 through the mounting member 124 in a state of an inclination angle -φ relative to the Y-axis in the θx direction. Above. Each pair of X beams 125 has four inclined surfaces (surfaces inclined with respect to the XY plane).
於一方之X樑125之4個斜面中、未固定在安裝構件124之彼此對向之一對斜面,亦即於+Y側且+Z側之第1斜面與-Y側且-Z側之第2斜面,於長邊方向(X軸方向)之大致全長延設有一對X固定子82之各個。又,於一方之X樑125之與固定於安裝構件124之第3斜面相反側之第4斜面(亦即-Y側且+Z側之斜面),在與該斜面平行之方向以既定間隔、彼此平行的固定有複數條(例如2條)延伸於X軸方向之X線性導件17a。 Among the 4 slopes of one X-beam 125, a pair of slopes facing each other that are not fixed to the mounting member 124, that is, the first slope on the + Y side and + Z side and the -Y side and -Z side The second inclined surface is provided with each of a pair of X anchors 82 extending substantially over the entire length in the longitudinal direction (X-axis direction). In addition, the fourth inclined surface (that is, the -Y side and the + Z side inclined surface) of the X beam 125 on one side opposite to the third inclined surface fixed to the mounting member 124 is spaced at a predetermined interval in a direction parallel to the inclined surface. A plurality of (for example, two) X linear guides 17a extending in the X-axis direction are fixed in parallel to each other.
於另一方之X樑125,以和上述一方之X樑為左右對稱之配置,設有一對X固定子82、複數條X線性導件17a。 The X beam 125 on the other side is arranged symmetrically with the X beam on the other side, and is provided with a pair of X anchors 82 and a plurality of X linear guides 17a.
一對X托架140,分別由具有頂部與分別設在頂部長邊方向兩端部之2對側壁部之YZ剖面倒U字狀的構件構成。一方(+Y側)之X托架140,係以側視(從+X方向觀察)於θx方向相對Y軸傾斜φ之狀態與X樑125之第1、第2及第4斜面對向配置。又,此一方之X托架140,於該側壁部(與X樑125之第1及第2斜面分別對向之部分)之X軸方向中央部近旁,與前述X托架40同樣的形成有缺口部42(參照圖2),於該一方之缺口部42內插入臂部54。 The pair of X brackets 140 are each formed of an inverted U-shaped member having a YZ cross section having a top portion and two pairs of side wall portions provided at both ends in the longitudinal direction of the top portion. The X bracket 140 on one side (+ Y side) is arranged in a side view (viewed from the + X direction) in the state of θx tilted φ with respect to the Y axis, and the first, second, and fourth oblique faces of the X beam 125 are arranged facing each other. . The X bracket 140 on the one side is formed near the central portion in the X-axis direction of the side wall portion (the portion facing the first and second slopes of the X beam 125), similarly to the X bracket 40 described above. The notch portion 42 (see FIG. 2) is inserted into the arm portion 54 in the one notch portion 42.
於一方之X托架140之一對側壁部內面,分別固定有透過既定間隙(clearance/gap)與固定在前述X樑125之第1、第2斜面各個之一對X固定子82對向的一對X可動子81。又,於X托架140之頂部內面,相對各個X線 性導件17a固定有複數個(例如4個)包含滾動體、以能滑動之方式卡合於Y線性導件17a之滑件17b。 On the inner surface of one pair of side walls of one of the X brackets 140, a pair of X-fixers 82 facing each other through a predetermined clearance (gap / clearance) and each of the first and second slopes of the X-beam 125 are fixed. A pair of X mover 81. In addition, the inner surface of the top of the X bracket 140 is opposite to each X line. A plurality of (for example, four) guides 17a are fixed to the sliders 17b including rolling elements and slidably engaged with the Y linear guides 17a.
另一方(-Y側)之X托架140,與一方之X托架140為左右對稱,具相同構成,亦同樣設有一對X可動子81及複數個滑件17b。 The X bracket 140 on the other side (-Y side) is bilaterally symmetrical with the X bracket 140 on the one side, and has the same structure, and is also provided with a pair of X movers 81 and a plurality of sliders 17b.
彼此對向之X固定子82與X可動子81,分別構成電磁力(羅倫茲力)驅動方式之動圈型X線性馬達。X粗動載台123x雖被此等X線性馬達驅動於X軸方向,於此時,被包含X線性導件17a與滑件17b之複數個X線性導引裝置直進引導於X軸方向。 The X-fixer 82 and the X-mover 81 which oppose each other constitute a moving coil type X linear motor of an electromagnetic force (Lorentz force) driving method, respectively. Although the X coarse motion stage 123x is driven in the X-axis direction by these X linear motors, at this time, it is guided in the X-axis direction by a plurality of X linear guides including the X linear guide 17a and the slider 17b.
本實施形態中,無論在X粗動載台123x之驅動中或停止中,在一方(+Y側)之X樑125即與此卡合之X托架140之間,會在固定於X樑125之第1斜面之X固定子82即與此對向之X可動子81之間產生磁吸力Fb,在固定於X樑125之第2斜面之X固定子82即與此對向之X可動子81之間亦會產生磁吸力Fb。2個磁吸力Fb,其大小相等而方向正對。當然,2個磁吸力Fb,其各個之鉛直分力F3及水平分力F4亦相等。因此,在一方(+Y側)之X樑125與X托架140之間,就整體而言,相對X樑125不會產生X托架140被驅動於Z軸及Y軸方向之力。同樣的,在另一方(-Y側)之X樑125與X托架140之間,就整體而言,亦不會產生X托架140相對X樑125被驅動於Z軸及Y軸方向之力。亦即,可保持安裝在重量抵消裝置50之一對臂部54前端之朝向斜上方之X可動子56(有芯線圈單元(參照圖5))與X固定子82(磁石單元)間之既定間隙(clearance/gap)。 In this embodiment, whether the X coarse movement stage 123x is driven or stopped, the X beam 125 on one side (+ Y side), that is, the X bracket 140 engaged with this, is fixed to the X beam. The X anchor 82 of the first inclined plane of 125 generates a magnetic attraction Fb between the opposite X movable element 81, and the X anchor 82 fixed to the second inclined plane of the X beam 125 is X movable opposite to this A magnetic attraction force Fb is also generated between the sub-81s. The two magnetic attraction forces Fb are equal in size and facing in opposite directions. Of course, for the two magnetic attraction forces Fb, the vertical component force F 3 and the horizontal component force F 4 are also equal. Therefore, between the X-beam 125 and the X-bracket 140 on one side (+ Y side), as a whole, no force is generated on the X-bracket 140 to be driven in the Z-axis and Y-axis directions with respect to the X-beam 125. Similarly, between the X-beam 125 and the X-bracket 140 on the other side (-Y side), the X-bracket 140 is not driven in the Z-axis and Y-axis directions relative to the X-beam 125 as a whole. force. That is, the predetermined position between the X movable element 56 (core coil unit (see FIG. 5)) and the X anchor 82 (magnet unit) mounted diagonally upward from the front ends of the pair of arm portions 54 of the weight canceling device 50 can be maintained. Clearance (gap).
如以上之說明,根據本第2實施形態之基板載台裝置PST1,能獲得與第1實施形態之基板載台裝置PST同等的效果。除此之外,根據基 板載台裝置PST1,由於作用在一對X樑125與一對X托架140之間之磁吸力Fb會被抵消,因此可防止對一對X托架140(X滑件17b)施加鉛直向上之力。因此,藉由將一對X樑125之傾角φ(-φ)與和X樑125對向之臂部54之傾角φ任意的設定為既定角度,即能在防止了一對X托架140之浮起之狀態下,任意的設定作用於基墊55及Y步進平台90之鉛直方向向下之力。如此,即能使基墊55進一步小型化、及Y步進平台90之進一步小型化。 As described above, according to the substrate stage device PST1 of the second embodiment, it is possible to obtain the same effect as that of the substrate stage device PST of the first embodiment. Other than that, according to On-board stage device PST1, since the magnetic attraction force Fb acting between a pair of X-beams 125 and a pair of X-brackets 140 is canceled, it is possible to prevent a vertical upward movement of a pair of X-brackets 140 (X slider 17b). Power. Therefore, by arbitrarily setting the inclination angle φ (-φ) of the pair of X beams 125 and the inclination angle φ of the arm portion 54 opposing the X beam 125 to a predetermined angle, it is possible to prevent the pair of X brackets 140 In the floating state, an arbitrary setting force acting on the base pad 55 and the Y step platform 90 in the vertical direction is set downward. In this way, it is possible to further miniaturize the base pad 55 and further miniaturize the Y step platform 90.
《第3實施形態》 "Third Embodiment"
其次,針對第3實施形態,根據圖8及圖9加以。此處,與前述第2實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, a third embodiment will be described with reference to FIGS. 8 and 9. Here, the same or equivalent components as those in the second embodiment described above are denoted by the same or similar symbols, and the description thereof is simplified or omitted.
本第3實施形態之基板載台裝置PST2,整體的構成雖與前述第2實施形態之基板載台裝置PST1相同,但在取代X托架140及重量抵消裝置50設置X托架240及重量抵消裝置250之點等、部分構成與基板載台裝置PST1相異。以下,以相異點為中心進行說明。 Although the overall structure of the substrate stage device PST2 of the third embodiment is the same as that of the substrate stage device PST1 of the second embodiment described above, an X bracket 240 and a weight cancellation are provided in place of the X bracket 140 and the weight cancellation device 50. The point and the like of the device 250 are different from those of the substrate stage device PST1. The following description focuses on the differences.
一對X托架240之各個,如圖8所示,具有延設於X軸方向之平板狀頂部63與設在頂部63之長邊方向中間部之一對側壁部64,側視(從+X方向觀察)倒U字狀之形狀(參照圖9)。又,圖8中,一對X托架240被簡化顯示。此外,如圖9所示,一方(+Y側)之X托架240,係以側視(從+X方向觀察)於θx方向相對Y軸傾斜φ之狀態與X樑125之第1、第2及第4斜面對向配置。一方之X托架240,由比較圖2與圖8可知,與前述X托架40、140相較,X軸方向之尺寸小,於X軸方向中央部近旁未形成缺口。 Each of a pair of X brackets 240, as shown in FIG. 8, has a flat plate-shaped top portion 63 extending in the X-axis direction and a pair of side wall portions 64 provided in the middle portion in the longitudinal direction of the top portion 63. (Viewed in the X direction) an inverted U-shape (see FIG. 9). In FIG. 8, a pair of X brackets 240 are simplified and displayed. In addition, as shown in FIG. 9, the X bracket 240 on one side (+ Y side) is in a state where the side view (viewed from the + X direction) is inclined φ with respect to the Y axis in the θx direction and the first and the first of the X beam 125 2 and 4 are placed diagonally. Comparing FIG. 2 and FIG. 8 with one X bracket 240, it can be seen that, compared with the X brackets 40 and 140 described above, the dimension in the X-axis direction is small, and no notch is formed near the central portion in the X-axis direction.
如圖9所示,於一方之X托架240之一對側壁部64內面,分別 固定有透過既定間隙(clearance/gap)與固定在前述X樑125之第1、第2斜面各個之一對X固定子82對向的一對X可動子81。又,於X托架240之頂部63內面,相對各個X線性導件17a固定有複數個(例如4個)包含滾動體、以能滑動之方式卡合於Y線性導件17a之滑件17b。 As shown in FIG. 9, the inner surfaces of a pair of side wall portions 64 of one of the X brackets 240 are respectively A pair of X movers 81 that are opposed to each other through a predetermined gap (clearance / gap) and fixed to one of the first and second slopes of the X beam 125 are fixed to the X mover 82. On the inner surface of the top 63 of the X bracket 240, a plurality of (for example, four) sliding members 17b including rolling elements are slidably engaged with the Y linear guide 17a with respect to each X linear guide 17a. .
另一方(-Y側)之X托架240與一方之X托架240為左右對稱,具有同樣構成,亦同樣設有一對X可動子81及複數個滑件17b。 The X bracket 240 on the other side (-Y side) is symmetrical with one X bracket 240 on the left and right sides, and has the same structure, and is also provided with a pair of X movers 81 and a plurality of sliders 17b.
彼此對向之X固定子82與X可動子81,分別構成電磁力(羅倫茲力)驅動方式之動圈型X線性馬達。X粗動載台223x雖被此等X線性馬達驅動於X軸方向,於此時,被包含X線性導件17a與滑件17b之複數個X線性導引裝置直進引導於X軸方向。 The X-fixer 82 and the X-mover 81 which oppose each other constitute a moving coil type X linear motor of an electromagnetic force (Lorentz force) driving method, respectively. Although the X coarse movement stage 223x is driven in the X-axis direction by these X linear motors, at this time, it is guided in the X-axis direction by a plurality of X linear guides including the X-linear guide 17a and the slider 17b.
回到圖8,重量抵消裝置250,於筐體51之Y軸方向兩側面固定有一對X臂部254。一對X臂部254,分別由延設於X軸方向之棒狀構件構成,其X軸方向長度較X托架240所具有之剖面倒U字狀部之X軸方向長度略長若干。一對X臂部254之各個,於Y軸方向外側面之X軸方向中央位置,透過撓曲裝置45連接於X托架240之側壁部64。撓曲裝置45之高度與重量抵消裝置250之Z軸方向重心位置大致一致。一對X臂部254之各個,其長邊方向兩端部連結於一對Y臂部255。一對Y臂部255之各個,由延設於Y軸方向之棒狀構件構成,Y軸方向長度與一對X托架240彼此間之間隔大致同長。此外,一對Y臂部255之各個,於X軸方向外側面之Y軸方向中央位置,透過撓曲裝置45連接於連結板41。於一對Y臂部255之長邊方向兩端面,固定有透過既定間隙(clearance/gap)與一對X樑125分別具有之一對X固定子82中、配置在Y軸方向內側之X固定子82對向之X可動子56。各X可動子56,包含未圖示之有 芯線圈單元,與對向之X固定子82(磁石單元)一起構成將重量抵消裝置250驅動於X軸方向之動圈型線性馬達。 Returning to FIG. 8, a pair of X arm portions 254 are fixed to the weight canceling device 250 on both sides in the Y-axis direction of the casing 51. The pair of X arm portions 254 are respectively formed by rod-shaped members extending in the X-axis direction, and the length in the X-axis direction is slightly longer than the length in the X-axis direction of the inverted U-shaped portion of the cross section of the X bracket 240. Each of the pair of X arm portions 254 is connected to the side wall portion 64 of the X bracket 240 at a central position in the X axis direction on the outer side surface in the Y axis direction through a flexure device 45. The height of the deflection device 45 is substantially the same as the position of the center of gravity in the Z-axis direction of the weight canceling device 250. Each of the pair of X arm portions 254 is connected to the pair of Y arm portions 255 at both ends in the longitudinal direction. Each of the pair of Y arm portions 255 is composed of a rod-shaped member extending in the Y-axis direction, and the length in the Y-axis direction and the interval between the pair of X brackets 240 are approximately the same length. In addition, each of the pair of Y arm portions 255 is connected to the connection plate 41 via a flexure device 45 at a center position in the Y axis direction on the outer side surface in the X axis direction. On both ends of the pair of Y-arm portions 255 in the longitudinal direction, X-fixes arranged in a pair of X-fixers 82 that pass through a predetermined gap (clearance / gap) and a pair of X-beams 125 are arranged inside the Y-axis direction. Child 82 is opposite to X mover 56. Each X mover 56 includes The core coil unit constitutes a moving-coil linear motor that drives the weight canceling device 250 in the X-axis direction together with the opposing X holder 82 (magnet unit).
如以上之說明,根據本第3實施形態之基板載台裝置PST2,能獲得與第2實施形態之基板載台裝置PST1同等的效果。除此之外,根據基板載台裝置PST2,由於在一對Y臂部255兩端會作用磁吸力,因此能加大作用於重量抵消裝置250之鉛直方向向上之力。又,重量抵消裝置250,由於係在磁吸力作用之Y臂部255之長邊方向中央近旁之2處,被X臂部254支承(固定),因此能防止磁吸力作用於Y臂部255兩端時之Y臂部255之撓曲,恆使重量抵消裝置250產生一定之磁吸力。 As described above, according to the substrate stage device PST2 of the third embodiment, it is possible to obtain effects equivalent to those of the substrate stage device PST1 of the second embodiment. In addition, according to the substrate stage device PST2, since a magnetic attraction force acts on both ends of a pair of Y arm portions 255, the force acting in the vertical direction on the weight canceling device 250 can be increased. In addition, the weight canceling device 250 is supported (fixed) by the X arm portion 254 at two places near the center in the long side direction of the Y arm portion 255 acting by the magnetic attraction force, so that the magnetic attraction force can be prevented from acting on the two sides of the Y arm portion 255. The deflection of the Y arm portion 255 at the end causes the weight canceling device 250 to generate a certain magnetic attraction force.
《第4實施形態》 "Fourth Embodiment"
其次,針對第4實施形態,根據圖10~圖12加以說明。此處,與前述第1實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, a fourth embodiment will be described with reference to FIGS. 10 to 12. Here, the same or equivalent components as those in the first embodiment described above are denoted by the same or similar symbols, and the description thereof is simplified or omitted.
本第4實施形態之基板載台裝置PST3,其整體構成雖與前述基板載台裝置PST相同,但在X樑325、X托架340及重量抵消裝置350之形狀與前述X樑25、X托架40及重量抵消裝置50部分不同之點等,與基板載台裝置PST相異。以下,以相異點為中心進行說明。 Although the overall structure of the substrate stage device PST3 of the fourth embodiment is the same as that of the substrate stage device PST, the shape of the X beam 325, the X bracket 340, and the weight canceling device 350 is the same as that of the X beam 25 and the X bracket. The difference between the rack 40 and the weight canceling device 50 is different from the substrate stage device PST. The following description focuses on the differences.
如圖10及圖11所示,一對X樑325由延設於X軸方向之棒狀構件構成。一對X樑325之各個,其YZ剖面形狀與X樑25不同。亦即,一對X樑325之各個,係YZ剖面之外形為矩形,具有被設在Y軸方向中央之延伸於X軸方向、與XZ平面平行之肋部區分為2部分之中空部的中空構件。一對X樑325之各個,於Y軸方向兩側面固定有延伸於X軸方向之X固定子82,於上面 固定有複數條(例如2條)於Y軸方向以既定間隔延伸於X軸方向的X線性導件17a。 As shown in FIG. 10 and FIG. 11, the pair of X beams 325 are composed of rod-shaped members extending in the X-axis direction. Each of a pair of X beams 325 has a YZ cross-sectional shape different from that of the X beams 25. That is, each of a pair of X beams 325 has a rectangular shape outside the YZ cross section, and has a hollow portion that is located in the center of the Y axis direction and extends in the X axis direction and is parallel to the XZ plane. member. Each of a pair of X-beams 325 is fixed on both sides of the Y-axis direction with X-fixers 82 extending in the X-axis direction. A plurality of (for example, two) X linear guides 17a extending in the X-axis direction at predetermined intervals in the Y-axis direction are fixed.
一對X托架340之各個,如圖11所示,具有延設於X軸方向之平板構件65、與在平板構件65條長邊方向中間部之Y軸方向兩側面以各個之上端面與平板構件65之上面大致同面高之狀態固定之與一對Z軸平行的側壁構件66。亦即,一對X托架340,分別具有X軸方向中央部於YZ剖面為剖面倒U字形之形狀,配置成跨在一對X樑325之各個(參照圖10)。 Each of a pair of X brackets 340, as shown in FIG. 11, has a flat plate member 65 extending in the X-axis direction, and both sides of the Y-axis direction in the middle portion of the 65 long-side direction of the flat plate member with upper surfaces and The upper side of the flat plate member 65 is fixed to a side wall member 66 parallel to the pair of Z-axes in a state where the upper surface is substantially the same height. That is, the pair of X brackets 340 each have a shape in which the central portion in the X-axis direction has an inverted U-shape in cross section at the YZ cross section, and are arranged to straddle each of the pair of X beams 325 (see FIG. 10).
一方(+Y側)之X托架340,如圖10所示,於平板構件65之下面(頂面)相對各X線性導件17a固定有複數個(例如4個)以可滑動之方式卡合於X線性導件17a之滑件17b,此外,於一對側壁構件66各個之內面,分別固定有透過既定間隙(clearance/gap)與一對X固定子82之各個對向之X可動子81。另一方(-Y側)之X托架340,係與一方之X托架340同樣構成。 As shown in FIG. 10, one (+ Y side) X bracket 340 has a plurality of (for example, four) fixed in a slidable manner relative to each X linear guide 17a below (top surface) the flat plate member 65. The sliding piece 17b which is combined with the X linear guide 17a, and in addition, each of the pair of side members 66 is fixed on the inner surface of each of the pair of X-movers through a predetermined gap (clearance / gap) and a pair of X-fixers 82. Child 81. The X bracket 340 on the other side (-Y side) has the same configuration as the X bracket 340 on the other side.
一對X托架340,如圖11所示,透過將分別具有之一對側壁構件66中、配置在Y軸方向內側之側壁構件66彼此連結之連結板341連結。連結板341,由俯視下中央形成有圓形開口部342之平板構件構成,於X軸方向具有既定長度(例如,與側壁構件66大致相同長度)。連結板341之下面,於開口部342周圍之複數處(例如90度間隔之4處)固定有永久磁石343(參照圖10)。永久磁石343,其材料無特別限定,係使用例如鐵磁體磁石(Ferrite magnet)、釹磁石(Neodymium magnet)及鋁鎳鈷磁石等形成。 As shown in FIG. 11, the pair of X brackets 340 are connected by a connection plate 341 that connects the side wall members 66 disposed on the inner side in the Y-axis direction among the pair of side wall members 66. The connection plate 341 is a flat plate member having a circular opening 342 formed in the center in a plan view, and has a predetermined length in the X-axis direction (for example, approximately the same length as the side wall member 66). A permanent magnet 343 (see FIG. 10) is fixed to a plurality of places around the opening portion 342 (for example, four places at 90-degree intervals) below the link plate 341. The material of the permanent magnet 343 is not particularly limited, and it is formed using, for example, a ferrite magnet, a neodymium magnet, and a nickel-cobalt magnet.
回到圖10,重量抵消裝置350係從下方插入開口部342內、透過基墊55被支承在Y步進平台90上。重量抵消裝置350,在筐體351之形狀及撓曲裝置45之連接位置等,與前述重量抵消裝置50不同。 Returning to FIG. 10, the weight canceling device 350 is inserted into the opening portion 342 from below, and is supported on the Y step platform 90 through the base pad 55. The weight canceling device 350 is different from the aforementioned weight canceling device 50 in the shape of the casing 351 and the connection position of the flexure device 45.
筐體351由上面開口之有底圓筒狀構件構成。筐體351,於底面周圍具有圓環狀鍔部352。鍔部352,於外周緣部之上面以和固定於連結板341之永久磁石343對向之方式,磁性體353以既定間隔(既定角度間隔)配置。重量抵消裝置350,在透過基墊55以非接觸狀態搭載於Y步進平台90上時,係配置成永久磁石343與磁性體353透過既定間隙(clearance/gap)對向。磁性體353由具有一定厚度之塊狀構件構成,材料雖無特別限定,係使用例如氧化鐵、氧化鉻、鈷或鐵氧體等形成。 The casing 351 is constituted by a bottomed cylindrical member having an opened upper surface. The casing 351 has a ring-shaped crotch 352 around the bottom surface. The flange portions 352 are arranged on the outer peripheral edge portion so as to face the permanent magnets 343 fixed to the connecting plate 341, and the magnetic bodies 353 are arranged at a predetermined interval (a predetermined angular interval). When the weight canceling device 350 is mounted on the Y stepping platform 90 in a non-contact state through the base pad 55, the permanent magnet 343 and the magnetic body 353 are arranged to face each other through a predetermined clearance (gap). The magnetic body 353 is composed of a block member having a certain thickness. Although the material is not particularly limited, it is formed using, for example, iron oxide, chromium oxide, cobalt, or ferrite.
撓曲裝置45,其一端以既定間隔(既定角度間隔)在筐體351之外周面固定複數個(例如4個),另一端則固定在形成於連結板341之開口部內周面(參照圖11)。 One end of the bending device 45 is fixed to the outer peripheral surface of the casing 351 at a predetermined interval (predetermined angular interval) (for example, four), and the other end is fixed to the inner peripheral surface of the opening formed in the connecting plate 341 (see FIG. 11). ).
作為固定在連結板341下面複數處之永久磁石343,可分別使用單一之永久磁石,但不限於此,亦可組合複數個磁石加以使用。 As the plurality of permanent magnets 343 fixed under the link plate 341, a single permanent magnet may be used respectively, but it is not limited thereto, and a plurality of magnets may be used in combination.
舉一例而言,可如圖12(A)所示,在埋於連結板341下面之磁軛344之下面,將極性相異之一對永久磁石343a、343b相距既定間隔加以固定,據以構成一個永久磁石343。圖12(A)之例中,配置在-Y側之永久磁石343a,其+Z側面為S極、-Z側面為N極,另一方面,配置在+Y側之永久磁石343b,其+Z側面為N極、-Z側面為S極。在一對永久磁石343a、343b與磁性體353之間,產生磁吸力Fc。又,如圖12(B)所示,亦可取代磁性體353將永久磁石345配置成與永久磁石343對向。此時,永久磁石345係配置成其與永久磁石343a對向之一側為S極、與永久磁石343b對向之另一側為N極。 For example, as shown in FIG. 12 (A), a pair of permanent magnets 343a and 343b having different polarities can be fixed at a predetermined interval below the yoke 344 buried under the connecting plate 341, and can be constituted according to A permanent magnet 343. In the example of FIG. 12 (A), the permanent magnet 343a arranged on the -Y side has S pole on the + Z side and the N pole on the -Z side. On the other hand, the permanent magnet 343b on the + Y side has + The Z side is the N pole and the -Z side is the S pole. A magnetic attraction force Fc is generated between the pair of permanent magnets 343a and 343b and the magnetic body 353. As shown in FIG. 12 (B), instead of the magnetic body 353, the permanent magnet 345 may be arranged to face the permanent magnet 343. At this time, the permanent magnet 345 is arranged such that one side facing the permanent magnet 343a is an S pole, and the other side facing the permanent magnet 343b is an N pole.
如以上之說明,根據本第4實施形態之基板載台裝置PST3,能獲得與第1實施形態之基板載台裝置PST同等之效果。除此之外,根據基 板載台裝置PST3,由於不會產生使X托架340浮起之力,因此能防止X托架340之浮起。據此,於基板載台裝置PST3,即能將永久磁石343與磁性體353之間產生之磁吸力Fc調整為任意大小,其結果,能自如地減輕施加至Y步進平台90及防振裝置34之載重。 As described above, according to the substrate stage device PST3 of the fourth embodiment, an effect equivalent to that of the substrate stage device PST of the first embodiment can be obtained. Other than that, according to Since the on-board stage device PST3 does not generate a force to float the X bracket 340, the X bracket 340 can be prevented from floating. According to this, in the substrate stage device PST3, the magnetic attraction force Fc generated between the permanent magnet 343 and the magnetic body 353 can be adjusted to an arbitrary size, and as a result, the Y step platform 90 and the vibration isolator can be lightened and relaxed. Load of 34.
《第4實施形態之第1變形例》 "First Modification of Fourth Embodiment"
其次,針對第4實施形態之第1變形例,根據圖13加以說明。此處,與前述第4實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, a first modification of the fourth embodiment will be described with reference to FIG. 13. Here, the same or equivalent components as those in the fourth embodiment are denoted by the same or similar symbols, and descriptions thereof are simplified or omitted.
此變形例之基板載台裝置PST3a,在將基板載台裝置PST3中重量抵消裝置350所具有之鍔部352與連結板341之位置加以互換之點、隨此以撓曲裝置45將鍔部352與X托架340加以連結之點、以及將作用於Y步進平台90之微動載台30等之重量的一部分以永久磁石343與永久磁石346間之磁反作用力Fd加以減輕之點,與前述基板載台裝置PST3相異。 The substrate stage device PST3a of this modified example is a point where the position of the flange portion 352 and the connecting plate 341 of the weight offset device 350 in the substrate stage device PST3 is interchanged, and the flange portion 352 is then flexed by the flexure device 45 The point where the X bracket 340 is connected, and a part of the weight acting on the micro-movement stage 30 of the Y step platform 90 is reduced by the magnetic reaction force Fd between the permanent magnet 343 and the permanent magnet 346, as described above. The substrate stage device PST3 is different.
如圖13所示,此變形例之重量抵消裝置350a,於筐體351a之Z軸方向中間之位置,具體而言,在與重量抵消裝置350a之重心位置大致一致之高度位置設有鍔部352。於鍔部352下面之外周緣部固定有永久磁石343。此外,於鍔部352之外周面,以既定間隔(既定角度間隔)連接有複數個(例如4個)撓曲裝置45之一端。撓曲裝置45之另一端,連接在X托架340之側壁構件66中、配置在Y軸方向內側之側壁構件66。 As shown in FIG. 13, the weight canceling device 350 a of this modification is provided at a middle position in the Z-axis direction of the casing 351 a, and specifically, a ridge portion 352 is provided at a height position substantially consistent with the center of gravity of the weight canceling device 350 a. . A permanent magnet 343 is fixed to the outer peripheral portion below the lower portion 352. Further, one end of a plurality of (for example, four) bending devices 45 are connected to the outer peripheral surface of the crotch portion 352 at a predetermined interval (a predetermined angular interval). The other end of the flexure device 45 is connected to the side wall member 66 of the X bracket 340 and the side wall member 66 disposed on the inner side in the Y-axis direction.
連結一對X托架340之連結板341,固定在一對X托架340各個之側壁構件66中、配置在Y軸方向內側之側壁構件66之下端部。又,於連結板341上面之開口部周圍,在與各永久磁石343對向之位置,分別固定有對永 久磁石343產生反作用磁力之永久磁石346。 The connecting plate 341 that connects the pair of X brackets 340 is fixed to the lower end portion of the side wall member 66 disposed on the inner side in the Y-axis direction among the side wall members 66 of each of the pair of X brackets 340. In addition, around the opening on the upper surface of the connecting plate 341, a pair of permanent magnets are fixed at positions facing the permanent magnets 343, respectively. The permanent magnet 343 generates a permanent magnet 346 of a reactive magnetic force.
如以上之說明,根據本第1變形例之基板載台裝置PST3a,除能獲得與第4實施形態之基板載台裝置PST3同等之效果愛,由於將固定有永久磁石343之鍔部352固定在重量抵消裝置350a之Z軸方向中間位置近旁,將固定有永久磁石346之連結板341固定在X托架340之下端部,因此X樑325之Z位置係配置在較重量抵消裝置350a之Z位置若干下方處。據此,基板載台裝置PST3a,可提升往掃描方向及掃描交叉方向之可動時的安定性。 As described above, according to the substrate stage device PST3a of the first modified example, the same effect as that of the substrate stage device PST3 of the fourth embodiment can be obtained, because the crotch portion 352 to which the permanent magnet 343 is fixed is fixed to The weight offset device 350a is near the middle position in the Z-axis direction, and the connecting plate 341 fixed with the permanent magnet 346 is fixed at the lower end of the X bracket 340. Therefore, the Z position of the X beam 325 is arranged at the Z position of the weight offset device 350a. Several below. Accordingly, the substrate stage device PST3a can improve the stability when moving in the scanning direction and the scanning cross direction.
《第4實施形態之第2變形例》 "Second Modification of Fourth Embodiment"
其次,針對第4實施形態之第2變形例,根據圖14加以說明。此處,與前述第4實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, a second modification of the fourth embodiment will be described with reference to FIG. 14. Here, the same or equivalent components as those in the fourth embodiment are denoted by the same or similar symbols, and descriptions thereof are simplified or omitted.
此變形例之基板載台裝置PST3b中,X樑325b之形狀及X托架340b之形狀,與前述基板載台裝置PST3之X樑325之形狀及X托架340之形狀不同。 In the substrate stage device PST3b of this modification, the shape of the X beam 325b and the shape of the X bracket 340b are different from the shape of the X beam 325 and the shape of the X bracket 340 of the substrate stage device PST3.
一對X樑325b,分別由延伸於X軸方向之棒狀構件構成,YZ剖面之形狀細上邊較底邊常若干之倒立的大致等腰梯形。亦即,一對X樑,分別具有與XY平面平行之上面及下面、與相對XZ平面於θx方向以既定角θ、-θ傾斜之一對斜面(Y軸方向兩側面)。X線性導件17a及X固定子82,與X樑325同樣的,分別固定在X樑325b之上面及一對斜面(Y軸方向兩側面)。 A pair of X-beams 325b are each composed of rod-shaped members extending in the X-axis direction. The shape of the YZ cross section is thin and generally isosceles trapezoidal, which has a number of upsides than the bottom. That is, a pair of X beams each have a pair of inclined surfaces (both sides in the Y-axis direction) that are inclined above and below the XY plane and inclined with respect to the XZ plane at a predetermined angle θ, -θ. The X linear guide 17a and the X holder 82 are respectively fixed on the upper surface of the X beam 325b and a pair of inclined surfaces (both sides in the Y-axis direction) similarly to the X beam 325.
一對X托架340b,各自所具有之一對側壁構件68之形狀與X托架340所具有之一對側壁構件66相異。亦即,彼此成對之+Y側與-Y側之 側壁構件68,分別具有從上端(+Z側端)至中央部附近與XZ平面平行的第1部分,與從中央部附近至下端(-Z側端)傾斜於-Y側或+Y側而與上述X樑325b之2個斜面對向的第2部分。於一對X托架340b之頂面(平板構件65之下面),固定有以可滑動之方式卡合於X線性導件17a之滑件17b,此外,於側壁構件68內壁面之第2部分,固定有透過既定間隙(clearance/gap)與X固定子82對向、產生磁吸力Fe之X可動子81。在一方之X樑325b與X托架340b之間作用之磁吸力Fe,水平方向之分力被抵消,同樣的,另一方之X樑325b與X托架340b之間作用之磁吸力Fe,水平方向之分力亦被抵消。亦即,作用於X托架340b之磁吸力Fe,僅對X托架340b施加鉛直方向向上之分力。 The pair of X brackets 340b each have a pair of side wall members 68 having a shape different from that of the pair of side wall members 66 that the X bracket 340 has. That is, the + Y side and the -Y side are paired with each other. The side wall member 68 has a first portion parallel to the XZ plane from the upper end (+ Z side end) to the vicinity of the central portion, and is inclined to the −Y side or the + Y side from the vicinity of the central portion to the lower end (−Z side end). The second part facing obliquely to the two X-beams 325b. On the top surfaces of the pair of X brackets 340b (below the flat plate member 65), a slide member 17b that is slidably engaged with the X linear guide 17a is fixed, and the second part of the inner wall surface of the side wall member 68 is fixed. The X mover 81 which is opposed to the X holder 82 through a predetermined clearance (clearance / gap) and generates a magnetic attraction Fe is fixed. The magnetic force Fe acting between the X-beam 325b on one side and the X bracket 340b is cancelled in the horizontal direction. Similarly, the magnetic force Fe acting between the X-beam 325b on the other side and the X bracket 340b is horizontal. The component of direction is also offset. That is, the magnetic attraction force Fe acting on the X-bracket 340b exerts only a vertical upward component force on the X-bracket 340b.
如以上之說明,根據本變形例之基板載台裝置PST3b,除能獲得與第4實施形態之基板載台裝置PST3同等之效果外,由於施加至X托架340b之鉛直方向向下之力獲得減輕,因此在基板載台裝置PST3b被驅動於X軸方向時,可減輕在X滑件17b與X線性導件17a之間產生之驅動抵抗。此外,由於在產生用以減輕作用於上述X托架340b之鉛直方向向下之力之磁吸力Fe的X可動子81、X固定子82之外,另設置了產生用以減輕作用於基板載台架台33之重量抵消裝置350等重量之一部分之磁吸力Fc的永久磁石343、磁性體353,因此可分別設定為產生既定磁吸力。 As described above, according to the substrate stage device PST3b of this modification, in addition to obtaining the same effect as the substrate stage device PST3 of the fourth embodiment, it is obtained by the downward force applied to the X bracket 340b in the vertical direction. This reduces the driving resistance generated between the X slider 17b and the X linear guide 17a when the substrate stage device PST3b is driven in the X-axis direction. In addition, in addition to the X mover 81 and the X holder 82 that generate the magnetic attraction force Fe for reducing the downward force acting on the X bracket 340b in the vertical direction, a generator for reducing the effect on the substrate carrier is also provided. The permanent magnet 343 and the magnetic body 353 of the magnetic attraction force Fc, which are a part of the weight of the stage 350 and the weight of the device 350, can be set to generate predetermined magnetic attraction forces, respectively.
《第5實施形態》 "Fifth Embodiment"
其次,針對第5實施形態,根據圖15及圖16加以說明。此處,與前述第1實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, a fifth embodiment will be described with reference to Figs. 15 and 16. Here, the same or equivalent components as those in the first embodiment described above are denoted by the same or similar symbols, and the description thereof is simplified or omitted.
本第5實施形態之基板載台裝置PST4,其整體構成雖與基板 載台裝置PST相同,但X樑325之形狀、X托架440之形狀與前述X樑25之形狀、X托架40之形狀相異,且減輕防振裝置34承受之負荷之方法等、部分構成與基板載台裝置PST相異。以下,以相異點為中心進行說明。 Although the overall structure of the substrate stage device PST4 of the fifth embodiment is the same as that of the substrate The stage device PST is the same, but the shape of the X-beam 325 and the shape of the X-bracket 440 are different from the shape of the X-beam 25 and the X-bracket 40 described above, and a method to reduce the load on the anti-vibration device 34, etc. The structure is different from that of the substrate stage device PST. The following description focuses on the differences.
如圖15及圖16所示,本實施形態之一對X樑325,由與上述第4實施形態司我使用之一對X樑325相同形狀之構件構成,同樣的,複數個X線性導件17a、一對X固定子82固定在上面及一對側面。 As shown in Figs. 15 and 16, one pair of X beams 325 in this embodiment is composed of a member having the same shape as one of the pair of X beams 325 used in the fourth embodiment. Similarly, a plurality of X linear guides 17a. A pair of X anchors 82 are fixed on the upper surface and a pair of side surfaces.
一對X托架440,如圖15及圖16所示,具有以X軸方向為長邊方向之俯視矩形的平板構件59、與各自之上端面與平板構件59之上面大致同面高之狀態固定在平板構件59之長邊方向一端部與另一端部之Y軸方向兩端面之一對、合計4個與Z軸平行的側壁構件58。X托架440,從+X方向觀察,如圖16所示,具有倒U字形狀,於彼此成對之+Y側與-Y側之側壁構件58彼此間插入X樑325。於X托架440之長邊方向(X軸方向)中央部近旁設有缺口部42(參照圖15)。 As shown in FIG. 15 and FIG. 16, the pair of X brackets 440 have a flat plate member 59 with a rectangular plan view with the X-axis direction as the long side direction, and a state where the upper end surfaces and the upper surfaces of the flat plate members 59 are substantially the same as each other. A pair of side wall members 58 parallel to the Z axis are fixed to one pair of one end portion in the longitudinal direction and the other end portion in the Y-axis direction of the flat plate member 59. As viewed from the + X direction, the X bracket 440 has an inverted U shape as shown in FIG. 16, and X beams 325 are inserted between the side wall members 58 on the + Y side and the −Y side that are paired with each other. A notch portion 42 is provided near the center of the long side direction (X-axis direction) of the X bracket 440 (see FIG. 15).
一對X托架440,分別於頂面(平板構件59之下面)相對各X線性導件17a固定有複數個(例如4個)以能滑動之方式卡合於X線性導件17a之滑件17b,此外,於側壁構件58之內壁面分別固定有透過既定間隙(clearance/gap)與一對X固定子82之各個對向之X可動子81。 A pair of X brackets 440 are respectively fixed on the top surface (below the flat plate member 59) with a plurality of (for example, four) sliding members that are slidably engaged with the X linear guides 17a relative to the X linear guides 17a. 17b. In addition, on the inner wall surface of the side wall member 58 are respectively fixed X movers 81 that pass through a predetermined clearance (gap) and a pair of X fixers 82 opposite to each other.
前述第1實施形態,係於固定在重量抵消裝置50之一對臂部54之前端分別固定X可動子56,來減輕作用於防振裝置34之重力方向之載重負荷之一部分,但如圖16所示,於本實施形態之重量抵消裝置450並未設置臂部54及X可動子56。亦即,重量抵消裝置450由筐體51、空氣彈簧52、Z滑件53及基墊55等構成。重量抵消裝置450透過連接在筐體51之複數條(例如4 條)撓曲裝置45連接於一對X托架440。各撓曲裝置45被製成與重量抵消裝置450之重心位置大致相同高度。 In the first embodiment, the X mover 56 is fixed to the front end of the pair of arm portions 54 fixed to one of the weight canceling devices 50 to reduce a portion of the load acting on the gravity direction of the anti-vibration device 34, but as shown in FIG. 16 As shown, the weight canceling device 450 in this embodiment is not provided with the arm portion 54 and the X mover 56. That is, the weight canceling device 450 includes a casing 51, an air spring 52, a Z slider 53, a base pad 55, and the like. The weight canceling device 450 passes through a plurality of bars (such as 4 The flexure device 45 is connected to a pair of X brackets 440. Each of the deflection devices 45 is formed at approximately the same height as the position of the center of gravity of the weight canceling device 450.
回到圖15,一對基架414,分別由延伸於Y軸方向之棒狀構件構成。一對基架414,分別包含與XY平面平行的上面及下面、由具有相對YZ平面於θx方向略傾斜之一面(斜面)與和此一面於相反方向(-θx方向)同角度傾斜之另一面(斜面)之中空構件構成的本體部414a、以及從下方支承本體部414a的複數個脚部14b。於各脚部14b之下端部設有複數個調整器14c,而能調整本體部414a之Z位置。 Returning to FIG. 15, a pair of base frames 414 are each composed of rod-shaped members extending in the Y-axis direction. A pair of base frames 414 respectively include an upper surface and a lower surface parallel to the XY plane, a surface (inclined surface) slightly inclined in the θx direction with respect to the YZ plane, and the other surface inclined at the same angle as the opposite direction (-θx direction). (Slope) A main body portion 414a composed of a hollow member, and a plurality of leg portions 14b supporting the main body portion 414a from below. A plurality of adjusters 14c are provided at the lower end of each leg portion 14b, and the Z position of the main body portion 414a can be adjusted.
於本體部414a之X軸方向兩側面(對向之一對斜面),分別固定有作為線性馬達之要素之延設於Y軸方向的Y固定子73。又,於本體部414a之上面,彼此平行的固定有複數條(例如2條)延伸於Y軸方向之機械性Y線性導引裝置(單軸導引裝置)之要素之延設於Y軸方向的Y線性導件16a。 On both sides of the body portion 414a in the X-axis direction (a pair of opposite inclined surfaces), Y-fixers 73 extending in the Y-axis direction, which are elements of a linear motor, are respectively fixed. Further, on the main body portion 414a, a plurality of (for example, two) mechanical Y linear guides (single-axis guides) extending in the Y-axis direction are fixed in parallel to each other, and the elements are extended in the Y-axis direction. Y linear guide 16a.
本體部414a配置(插入)在由XZ剖面倒U字狀之構件構成之Y托架475之一對對向面間(側壁構件間)。Y托架475,相對1個基架414於Y軸方向分離間配置有複數個(例如2個),各Y托架475藉由固定在上面之板片76而彼此連結。Y托架475之一對對向面,具有從各個之上端(+Z側端)至中央部近旁與YZ平面平行的第1部分、與從中央部近旁至下端(-Z側端)傾斜於-X側或+X側而與上述基架414之本體部414a之2個斜面對向的第2部分。Y托架475,係設定為在被搭載於基架414之狀態下,本體部414a之2個傾斜面與和此對向之Y托架475所具有之一對對向面之第2部分平行。於Y托架475之一對對向面之第2部分之各個,分別固定有透過既定間隙(clearance/gap)與一對Y固定子73之各個對向之一對Y可動子472。各Y可動子472,包含未圖示之有 芯線圈單元,與對向之Y固定子73一起構成將X樑325於Y軸方向以既定行程加以驅動之Y線性馬達。又,在各Y可動子472與對向之Y固定子73之間會產生磁吸力Ff。此外,於Y托架475之頂面,相對各Y托架475固定有複數個(例如2個)以可滑動之方式卡合於Y線性導件16a之滑件16b。 The main body portion 414a is disposed (inserted) between a pair of facing surfaces (between the side wall members) of one of the Y brackets 475 constituted by an inverted U-shaped member having an XZ cross section. A plurality of (for example, two) Y brackets 475 are arranged between the base frames 414 in the Y-axis direction, and each of the Y brackets 475 is connected to each other by a plate 76 fixed on the Y brackets 475. One of the opposite faces of the Y bracket 475 has a first portion parallel to the YZ plane from each upper end (+ Z side end) to the vicinity of the central portion, and is inclined from the near portion of the central portion to the lower end (-Z side end). -X side or + X side and the second part facing obliquely to the two main body parts 414a of the base frame 414. The Y bracket 475 is set so that the two inclined surfaces of the main body portion 414a are parallel to the second portion of the opposite surface of the opposite Y bracket 475 when the Y bracket 475 is mounted on the base frame 414. . A pair of Y movers 472 are fixed to each of the second part of one of the opposite sides of the Y bracket 475 through a predetermined clearance (gap) and each of a pair of Y holders 73. Each Y mover 472 includes The core coil unit constitutes a Y linear motor that drives the X beam 325 in the Y-axis direction with a predetermined stroke together with the opposing Y-fixer 73. Further, a magnetic attraction force Ff is generated between each of the Y movers 472 and the opposite Y fixer 73. In addition, a plurality of (for example, two) sliding members 16b slidably engaged with the Y linear guide 16a are fixed to the top surface of the Y bracket 475.
Y步進平台490,由延伸於X軸方向之棒狀構件構成,搭載在基板載台架台33上。於Y步進平台490之長邊方向兩端,透過固定構件446固定有透過既定間隙(clcarance/gap)與Y固定子73對向之Y可動子94。各Y可動子94,包含未圖示之有芯線圈單元,與對向之Y固定子73一起構成將Y步進平台490於X軸方向以既定行程加以驅動之X線性馬達。又,在各Y可動子94與對向之Y固定子73之間會產生磁吸力Fg。 The Y step stage 490 is formed of a rod-shaped member extending in the X-axis direction, and is mounted on the substrate stage 33. At both ends in the longitudinal direction of the Y step platform 490, a Y mover 94 opposed to the Y holder 73 through a predetermined gap (clcarance / gap) is fixed through the fixing member 446. Each Y mover 94 includes a core coil unit (not shown), and an X linear motor that drives the Y step platform 490 in the X-axis direction with a predetermined stroke together with the opposite Y stator 73. Further, a magnetic attraction force Fg is generated between each of the Y movers 94 and the opposite Y fixer 73.
在固定於Y步進平台490之+X側固定構件446之Y可動子94與和此對向之Y固定子73之間,於+X方向且+Z方向作用磁吸力Fg,在固定於Y步進平台490之-X側固定構件446之Y可動子94與和此對向之Y固定子73之間,於-X方向且+Z方向作用磁吸力Fg。此場合,由於該2個磁吸力Fg之水平方向分力彼此大小相等而方向相反(正對),因此彼此抵銷。亦即,上述2個磁吸力Fg,對Y步進平台490施加鉛直方向向上之力,其反力則透過基架414傳至地面11。 Between the Y mover 94 which is fixed to the + X side fixing member 446 of the Y step platform 490 and the opposite Y fixer 73, a magnetic attraction force Fg acts in the + X direction and the + Z direction, and is fixed to the Y Between the Y mover 94 of the -X side fixing member 446 of the stepping platform 490 and the opposite Y fixer 73, a magnetic attraction force Fg acts in the -X direction and the + Z direction. In this case, since the horizontal component forces of the two magnetic attraction forces Fg are equal to each other in opposite directions (opposite), they cancel each other out. That is, the above two magnetic attraction forces Fg exert a vertical upward force on the Y step platform 490, and the reaction force thereof is transmitted to the ground 11 through the base frame 414.
如以上之說明,本第5實施形態之基板載台裝置PST4,能獲得與第1實施形態之基板載台裝置PST同等之效果。此外,於基板載台裝置PST4,由於防振裝置34承受之負荷受到減輕,因此能降低基板載台裝置PST4驅動時作用於防振裝置34之偏載重。 As described above, the substrate stage device PST4 of the fifth embodiment can obtain the same effects as the substrate stage device PST of the first embodiment. In addition, in the substrate stage device PST4, since the load received by the vibration prevention device 34 is reduced, it is possible to reduce the eccentric load of the vibration prevention device 34 when the substrate stage device PST4 is driven.
《第5實施形態之變形例》 "Modification of the fifth embodiment"
其次,針對第5實施形態之變形例,根據圖17加以說明。此處,與前述第5實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, a modification of the fifth embodiment will be described with reference to FIG. 17. Here, the same or equivalent components as those in the fifth embodiment are denoted by the same or similar reference numerals, and descriptions thereof are simplified or omitted.
此變形例之基板載台裝置PST4a,在設於Y步進平台490a之長邊方向兩端部之固定構件446未設置Y可動子94之點、以及固定構件446之上面固定有磁性體96,於磁性體96之上方透過既定間隙(clearance/gap)於X托架475a設有永久磁石97之點,與基板載台裝置PST4不同。 The substrate stage device PST4a of this modified example has a point where the Y mover 94 is not provided on the fixed member 446 provided at both ends in the longitudinal direction of the Y step platform 490a, and a magnetic body 96 is fixed on the fixed member 446. The point where a permanent magnet 97 is provided on the X bracket 475a through a predetermined clearance (gap) above the magnetic body 96 is different from the substrate stage device PST4.
永久磁石97,實際上係固定在固定構件478下面。於Y步進平台490a之+X側,固定構件478係以將於Y軸方向以既定間隔配置之複數個(例如2個)Y托架475a彼此連結之方式,固定在各個Y托架475a-X側側面之上端部。永久磁石97以透過既定間隙和磁性體96對向之方式固定在固定構件478之下面。亦即,於本變形例之Y步進平台490a,會被施加與固定在基架414之本體部414a之Y固定子73與固定在Y托架475a之Y可動子472之間產生之磁吸力Ff不同之獨立的在磁性體96與永久磁石97之間產生之磁吸力Fh形成之鉛直方向向上之力。又,Y托架475a之其他部分,具有與上述Y托架475相同之構成。 The permanent magnet 97 is actually fixed under the fixing member 478. On the + X side of the Y step platform 490a, the fixing member 478 is fixed to each Y bracket 475a by connecting a plurality of (for example, two) Y brackets 475a to each other at a predetermined interval in the Y-axis direction. X side side above the end. The permanent magnet 97 is fixed below the fixed member 478 so as to face the magnetic body 96 through a predetermined gap. That is, in the Y step platform 490a of this modification, a magnetic attraction force is generated between the Y holder 73 fixed to the body portion 414a of the base frame 414 and the Y mover 472 fixed to the Y bracket 475a. Ff is different and the force in the vertical direction formed by the magnetic attraction force Fh generated between the magnetic body 96 and the permanent magnet 97 is independent. The other parts of the Y bracket 475a have the same configuration as the Y bracket 475 described above.
如以上之說明,本第5實施形態之變形例之基板載台裝置PST4a,可獲得與第5實施形態同等之效果。除此之外,根據基板載台裝置PST4a,由於作用於Y步進平台490a之鉛直向上之磁吸力Fh、與作用於Y托架475a之磁吸力Ff係由獨立之磁氣產生裝置產生,因此可將作用於Y步進平台490a之磁吸力Fh與作用於Y托架475a之磁吸力Ff,分別設定為既定之力。亦即,可將作用於防振裝置34之載重負荷(偏載重)、以及包含Y線性導件16a與 滑件16b之複數個Y線性導引裝置所承受之驅動抵抗減至既定值。 As described above, the substrate stage device PST4a according to the modification of the fifth embodiment can obtain the same effect as that of the fifth embodiment. In addition, according to the substrate stage device PST4a, since the vertical magnetic attraction force Fh acting on the Y step platform 490a and the magnetic attraction force Ff acting on the Y bracket 475a are generated by independent magnetic generating devices, The magnetic attraction force Fh acting on the Y step platform 490a and the magnetic attraction force Ff acting on the Y bracket 475a can be set as predetermined forces, respectively. That is, the load (eccentric load) acting on the anti-vibration device 34 and the Y linear guide 16a and The driving resistance experienced by the plurality of Y linear guides of the slider 16b is reduced to a predetermined value.
又,上述第1~第5各實施形態及各變形例(以下,稱各實施形態等)所說明之裝置構成僅為一例,當然可有各種變形。例如,上述各實施形態等中,雖係針對利用磁吸力或磁性斥力以減輕作用於Y步進平台90、490、490a及支承此之基板載台架台33及防振裝置34之重力方向之載重負荷的情形做了說明,但不限於此,在具有鉛直方向分力之方向之電磁力,是由X粗動載台驅動用之線性馬達、或Y粗動載台驅動用之線性馬達產生之情形時,可將利用該電磁力之鉛直分力,以減輕作用於Y步進平台90、490、490a及支承此之基板載台架台33及防振裝置34之重力方向載重負荷的負荷減輕裝置,裝備於基板載台裝置PST、PST1、PST2、PST3、PST3a、PST3b、PST4、PST4a。 In addition, the device configuration described in each of the first to fifth embodiments and modifications (hereinafter, referred to as each embodiment, etc.) is only an example, and various modifications are of course possible. For example, in the above embodiments, the magnetic load or magnetic repulsion is used to reduce the load in the direction of gravity acting on the Y step platforms 90, 490, and 490a and the substrate stage 33 and the anti-vibration device 34 that support them. The load situation has been explained, but it is not limited to this. The electromagnetic force in the direction with the vertical component force is generated by the linear motor for driving the X coarse movement stage or the linear motor for driving the Y coarse movement stage. In this case, a load-reducing device that can use the electromagnetic force to reduce the load in the direction of gravity acting on the Y-step platforms 90, 490, and 490a, and the substrate stage 33 and the anti-vibration device 34 supporting the same can be reduced. , Equipped with substrate stage devices PST, PST1, PST2, PST3, PST3a, PST3b, PST4, PST4a.
又,亦可取代上述各實施形態等中之固定子(磁石單元)與可動子(有芯線圈單元)之組合,而藉由固定子(磁石單元)與磁性體構件之組合來構成上述負荷減輕裝置。或者,亦可取代構成負荷減輕裝置之至少一部分之永久磁石而使用電磁石。 In addition, instead of the combination of the stator (magnet unit) and the movable element (cored coil unit) in the above-mentioned embodiments, the load reduction can be constituted by the combination of the stator (magnet unit) and the magnetic member. Device. Alternatively, an electromagnet may be used instead of a permanent magnet constituting at least a part of the load reduction device.
又,上述各實施形態,雖係針對具備在Y步進平台90、490、490a上移動之重量抵消裝置50、250、350、350a,450的基板載台裝置PST、PST1、PST2、PST3、PST3a、PST3b、PST4、PST4a做了說明,但不限於此,亦可例如美國專利申請公開第2010/0018950號說明書等所揭示,在具備裝有重量抵消裝置之基板載台裝置的掃描型曝光裝置中,設置包含設於Y粗動載台之固定子(磁石)與設於X粗動載台之可動子(線圈)以將X粗動載台於X軸方向(掃描方向)以既定行程驅動的X線性馬達、與利用作用在構成上 述可動子之線圈與重量抵消裝置之一部分之間之力以抵消作用於包含從下方支承重量抵消裝置之平台之支承架台之重力方向載重負荷的載重減輕裝置。此場合,於基板(物體)之曝光處理時,可與保持基板之基板保持具(物體保持構件)一起往與水平面平行之方向移動之X粗動載台,係被線性馬達驅動於X軸方向。此時,於支承架台雖會作用基板保持具及重量抵消裝置本身重量形成之重力方向載重負荷,但該載重負荷可藉由載重減輕裝置利用作用在與重量抵消裝置一部分之間之力,從重量抵消裝置將一部分之力移至X粗動載台來加以減輕。因此,能減輕包含基板保持具、重量抵消裝置及支承架台之系之重心移動而形成之作用於支承架台之偏載重,據以維持充分之曝光精度。 In addition, each of the above embodiments is directed to the substrate stage devices PST, PST1, PST2, PST3, and PST3a provided with the weight canceling devices 50, 250, 350, 350a, and 450 that move on the Y step platforms 90, 490, and 490a. , PST3b, PST4, PST4a have been described, but are not limited to this. For example, as disclosed in US Patent Application Publication No. 2010/0018950, etc., in a scanning type exposure apparatus including a substrate stage device equipped with a weight canceling device , Including a fixed element (magnet) provided on the Y coarse movement stage and a movable element (coil) provided on the X coarse movement stage to drive the X coarse movement stage in the X-axis direction (scanning direction) with a predetermined stroke. X linear motor The force between the coil of the movable element and a part of the weight canceling device is used to cancel the load reducing device acting on the load in the direction of gravity acting on a support frame including a platform supporting the weight canceling device from below. In this case, during the exposure processing of the substrate (object), the X coarse movement stage that can move in a direction parallel to the horizontal plane together with the substrate holder (object holding member) holding the substrate is driven by the linear motor in the X-axis direction. . At this time, although the load in the direction of gravity formed by the weight of the substrate holder and the weight canceling device acts on the support stand, the load can be reduced from the weight by using the force acting between the load reducing device and a part of the weight canceling device. The canceling device moves part of the force to the X coarse movement stage to reduce it. Therefore, it is possible to reduce the eccentric load acting on the support stand formed by the movement of the center of gravity of the system including the substrate holder, the weight canceling device, and the support stand, thereby maintaining sufficient exposure accuracy.
又,亦可將上述第1~第4實施形態之變形例與上述第5實施形態及其變形例加以組合使用。亦即,可併用對重量抵消裝置50、250、350、350a、450產生鉛直方向向上之力的裝置、與對Y步進平台90、490、490a產生鉛直方向向上之力的裝置。 The modified examples of the first to fourth embodiments may be used in combination with the fifth embodiment and the modified examples. That is, a device that generates a vertical upward force on the weight canceling devices 50, 250, 350, 350a, and 450 and a device that generates a vertical upward force on the Y step platforms 90, 490, and 490a can be used in combination.
又,上述各實施形態中,一對X托架40、140、240、340、340b、440雖係以連結板41、341加以連結,但亦可取代連結板41、341而將一對X托架以主控制裝置同步驅動於X軸方向。同樣的,1個基架14、414上搭載之複數個Y托架75、475、475a雖係以板片76分別加以連結,但亦可取代板片76而將複數個Y托架75、475、475a以主控制裝置同步驅動於Y軸方向。 In each of the above embodiments, although the pair of X brackets 40, 140, 240, 340, 340b, and 440 are connected by the connecting plates 41 and 341, the pair of X brackets may be replaced instead of the connecting plates 41 and 341. The rack is synchronously driven in the X-axis direction by the main control device. Similarly, although a plurality of Y brackets 75, 475, and 475a mounted on one base frame 14, 414 are connected by plates 76, respectively, instead of the plate 76, a plurality of Y brackets 75 and 475 may be connected. The 475a is synchronously driven in the Y-axis direction by the main control device.
又,上述各實施形態中,Y步進平台90、490、490a係中實構件,但不限定於此,亦可以是中空構件、或具有在中空構件內部設置肋部之形狀。例如,可以鑄造等方式製造由中空構件構成之Y步進平台。 In each of the above embodiments, the Y step platforms 90, 490, and 490a are solid members, but the invention is not limited thereto, and may be a hollow member or a shape having ribs provided inside the hollow member. For example, a Y step platform made of a hollow member can be manufactured by casting or the like.
又,第1實施形態中,連接重量抵消裝置50與X托架40之撓曲裝置45,可以是配置成僅能將重量抵消裝置50牽引於Y軸方向。此外,若係藉由撓曲裝置45將重量抵消裝置50與X托架40一起驅動於X軸方向及Y軸方向的話,亦可取代固定在重量抵消裝置50之臂部54前端之X可動子56,而固定磁性體。 Further, in the first embodiment, the deflection device 45 connecting the weight canceling device 50 and the X bracket 40 may be arranged so that the weight canceling device 50 can be pulled only in the Y-axis direction. In addition, if the weight canceling device 50 and the X bracket 40 are driven in the X-axis direction and the Y-axis direction by the flexure device 45, the X mover fixed at the front end of the arm portion 54 of the weight canceling device 50 may be replaced. 56, while fixing the magnetic body.
又,第4實施形態及第4實施形態之變形例中,雖將一對X托架340、340b以形成有開口部之連結板341加以連結,但不限於此,亦可將一對X托架340、340b以在X軸方向分離配置之複數個連結板加以連結。此外,固定在重量抵消裝置350、350a之鍔部352,無須設置在重量抵消裝置350、350a之全周,可以是朝向外周方向伸出之棒狀構件。 In addition, in the fourth embodiment and the modified examples of the fourth embodiment, although a pair of X brackets 340 and 340b are connected by a connecting plate 341 formed with an opening portion, it is not limited to this, and a pair of X brackets may also be connected. The racks 340 and 340b are connected by a plurality of connection plates arranged separately in the X-axis direction. In addition, the crotch portion 352 fixed to the weight canceling devices 350 and 350a need not be provided on the entire circumference of the weight canceling devices 350 and 350a, and may be a rod-shaped member protruding toward the outer peripheral direction.
又,第5實施形態之變形例中,雖係於Y步進平台490a之長邊方向兩端部配置了磁性體96,但不限於此,由於只要是能在Y步進平台490a作用鉛直方向向上之力即可,因此,可例如於Y步進平台490a之長邊方向中間部分透過固定構件配置磁性體96,並以在其對向面配置永久磁石97之方式於X樑325之下面固定永久磁石97。 In the modified example of the fifth embodiment, although the magnetic bodies 96 are arranged at both ends in the longitudinal direction of the Y step platform 490a, it is not limited to this, as long as the vertical direction can be applied to the Y step platform 490a The upward force is sufficient. Therefore, for example, the magnetic body 96 can be disposed through the fixing member at the middle portion in the long side direction of the Y step platform 490a, and fixed under the X beam 325 by arranging a permanent magnet 97 on the opposite side. Permanent magnet 97.
又,照明光可以是ArF準分子雷射光(波長193nm)、KrF準分子雷射光(波長248nm)等之紫外光、或F2雷射光(波長157nm)等之真空紫外光。此外,作為照明光,亦可使用例如將從DFB半導體雷射或光纖雷射發出之紅外線帶或可見光帶之單一波長雷射光以例如摻雜有鉺(或鉺及鐿兩者)之光纖放大器加以増幅,使用非線性光學結晶加以波長轉換為紫外光之諧波。再者,亦可使用固體雷射(波長:355nm、266nm)等。 The illumination light may be ultraviolet light such as ArF excimer laser light (wavelength 193 nm), KrF excimer laser light (wavelength 248 nm), or vacuum ultraviolet light such as F 2 laser light (wavelength 157 nm). In addition, as the illuminating light, a single-wavelength laser light such as an infrared band or a visible light band emitted from a DFB semiconductor laser or an optical fiber laser may be used, for example, a fiber amplifier doped with erbium (or erbium and erbium). The amplitude is converted to harmonics of ultraviolet light using non-linear optical crystals. Furthermore, a solid laser (wavelength: 355 nm, 266 nm) or the like may be used.
又,於上述各實施形態等中,雖係針對投影光學系PL為具 備複數隻投影光學單元之多透鏡方式投影光學系之情形做了說明,但投影光學單元之數量不限於此,只要是1隻以上即可。此外,亦不限於多透鏡方式之投影光學系,亦可以是使用例如歐夫那(Ofner)型大型反射鏡之投影光學系等。再著,上述實施形態中雖係針對作為投影光學系PL使用投影倍率為等倍者之情形作了說明,但不限於此,投影光學系可以是縮小系及拡大系之任一種。 In each of the above embodiments, the projection optical system PL A case has been described in which a multi-lens projection optical system having only a plurality of projection optical units is provided, but the number of projection optical units is not limited to this, as long as it is one or more. In addition, it is not limited to the projection optical system of the multi-lens method, and may be a projection optical system using, for example, a large-type reflector of the Ofner type. It should be noted that although the above embodiment has described the case where a projection magnification is used as the projection optical system PL, the projection optical system may be any of a reduction system and a large system.
又,上述各實施形態等中,雖係使用在光透射性光罩基板上形成有既定遮光圖案(或相位圖案、減光圖案)之光透射型光罩,但亦可使用例如美國專利第6,778,257號公報所揭示之,根據待曝光圖案之電子資料形成透射圖案或反射圖案、或形成發光圖案之電子光罩(可變成形光罩),例如可採用使用非發光型影像顯示元件(亦稱為空間光調變器)之一種的DMD(Digital Micro-mirror Device)的可變成形光罩。 In each of the embodiments described above, although a light-transmitting type mask in which a predetermined light-shielding pattern (or phase pattern or light-reduction pattern) is formed on a light-transmitting mask substrate is used, for example, U.S. Patent No. 6,778,257 may be used. According to the publication, an electronic photomask (variable forming photomask) that forms a transmission pattern or a reflection pattern or forms a light-emitting pattern according to the electronic data of the pattern to be exposed, for example, a non-light-emitting image display element (also referred to as A variable shape photomask of DMD (Digital Micro-mirror Device), which is a type of spatial light modulator.
又,作為曝光裝置,尤其是適用於對尺寸(包含外徑、對角線長度、一邊中之至少1種)為500mm以上之基板、例如使液晶顯示元件等平面顯示器用之大型基板曝光之曝光裝置時,特別有效。 In addition, as an exposure device, it is particularly suitable for exposing a substrate having a size (including at least one of outer diameter, diagonal length, and at least one of one side) of 500 mm or more, such as exposing a large substrate for a flat panel display such as a liquid crystal display element. It is particularly effective when installed.
又,作為曝光裝置,亦能適用於步進重複(step & repeat)方式之曝光裝置、步進接合(step & stitch)方式之曝光裝置。此外,被保持於移動體裝置之移動體的物體不限於曝光對象物體基板等,亦可以是光罩等之圖案保持體(原板)。 In addition, as an exposure device, it can be applied to an exposure device of a step & repeat method, and an exposure device of a step & stitch method. In addition, the object held by the moving body of the moving body device is not limited to an exposure target object substrate or the like, but may be a pattern holding body (original plate) such as a photomask.
又,曝光裝置之用途,並不限於將液晶顯示元件圖案轉印至方型玻璃板之液晶用曝光裝置,亦可廣泛適用於例如半導體製造用之曝光裝置、用以製造薄膜磁頭、微機器及DNA晶片等之曝光裝置。此外,不僅 是半導體元件等之微元件,本發明亦能適用於為製造用於光曝光裝置、EUV曝光裝置、X線曝光裝置及電子線曝光裝置等之光罩或標線片,而將電路圖案轉印至玻基板或矽晶圓等之曝光裝置。又,具備保持物體之物體保持裝置的裝置,並不限於曝光裝置,亦可以是其他的基板處理裝置、例如玻璃基板(或晶圓)檢查裝置等。又,曝光對象之物體不限於玻璃板,亦可以是例如晶圓、陶瓷基板、薄膜構件或光罩基板(mask blank)等其他物體。又,曝光對象物是平板顯示器用基板之情形時,該基板之厚度並無特別限定,例如亦包含薄膜狀(具可撓性之片狀構件)者。 In addition, the application of the exposure device is not limited to an exposure device for liquid crystal that transfers a pattern of a liquid crystal display element to a square glass plate, and can also be widely applied to, for example, an exposure device for semiconductor manufacturing, a thin film magnetic head, a micromachine, and Exposure device for DNA wafers. Besides, not only It is a micro-element such as a semiconductor element, and the present invention can also be applied to transfer a circuit pattern to manufacture a photomask or a reticle for a light exposure device, an EUV exposure device, an X-ray exposure device, an electron-ray exposure device, and the like Exposure devices to glass substrates or silicon wafers. The device including an object holding device for holding an object is not limited to an exposure device, and may be another substrate processing device, such as a glass substrate (or wafer) inspection device. The object to be exposed is not limited to a glass plate, and may be other objects such as a wafer, a ceramic substrate, a thin film member, or a mask blank. When the object to be exposed is a substrate for a flat panel display, the thickness of the substrate is not particularly limited, and for example, a film-like (flexible sheet-like member) is also included.
液晶顯示元件(或半導體元件)等之電子元件,係經由進行元件之功能性能設計的步驟、依據此設計步驟製作光罩(或標線片)的步驟、製作玻璃基板(或晶圓)的步驟、以上述各實施形態之曝光裝置及其曝光方法將光罩(標線片)圖案轉印至玻璃基板的微影步驟、使經曝光之玻璃基板顯影的顯影步驟、將殘存抗蝕劑之部分以外部分之露出構件以蝕刻加以去除的蝕刻步驟、去除完成蝕刻而無需之抗蝕劑的抗蝕劑去除步驟、元件組裝步驟、檢査步驟等加以製造。此場合,由於在微影步驟係使用上述實施形態之曝光裝置實施前述曝光方法,於玻璃基板上形成元件圖案,因此能以良好生產性製造高積體度之元件。 Electronic components such as liquid crystal display elements (or semiconductor elements) are the steps of designing the functional performance of the elements, the steps of making a photomask (or reticle) based on this design step, and the steps of making a glass substrate (or wafer). 5. The lithography step of transferring a photomask (reticle) pattern to a glass substrate by the exposure apparatus and exposure method of each of the above-mentioned embodiments, a development step of developing the exposed glass substrate, and a portion of the remaining resist The exposed parts of the other parts are manufactured by an etching step of removing the exposed members, a resist removing step of removing the resist that is not necessary to complete the etching, an element assembling step, an inspection step, and the like. In this case, since the exposure method is performed in the lithography step using the exposure apparatus of the above-mentioned embodiment to form an element pattern on a glass substrate, it is possible to manufacture a highly integrated element with good productivity.
此外,援用上述說明所引用之關於曝光裝置之所有公報、國際公開公報、美國專利申請公開說明書及美國專利說明書之揭示作為本說明書記載之一部分。 In addition, the disclosures of all the publications on the exposure device, the International Publications, the U.S. Patent Application Publication, and the U.S. Patent Specification cited in the above description are cited as part of the description of this specification.
產業上之可利用性Industrial availability
如以上之說明,本發明之曝光裝置適於使板上之物體曝光。 又,本發明之平面顯示器之製造方法非常適於使曝光後之物體顯影。此外,本發明之元件製造方法非常適於製造微元件。 As explained above, the exposure device of the present invention is suitable for exposing objects on the board. In addition, the manufacturing method of the flat display of the present invention is very suitable for developing an exposed object. In addition, the device manufacturing method of the present invention is very suitable for manufacturing micro-devices.
11‧‧‧地面 11‧‧‧ Ground
14‧‧‧基架 14‧‧‧ base frame
16a‧‧‧Y線性導件 16a‧‧‧Y linear guide
17a‧‧‧X線性導件 17a‧‧‧X Linear Guide
17b‧‧‧滑件 17b‧‧‧Slider
18y‧‧‧Y音圈馬達 18y‧‧‧Y voice coil motor
22y‧‧‧Y移動鏡 22y‧‧‧Y moving mirror
25‧‧‧X樑 25‧‧‧X beam
26‧‧‧感測器 26‧‧‧Sensor
27‧‧‧標的物 27‧‧‧Target
28‧‧‧鏡座 28‧‧‧Mirror mount
30‧‧‧微動載台 30‧‧‧Micro-motion stage
31‧‧‧基板保持具 31‧‧‧ substrate holder
33‧‧‧基板載台架台 33‧‧‧ Substrate Stage
34‧‧‧防振裝置 34‧‧‧Anti-vibration device
35a‧‧‧Y線性導件 35a‧‧‧Y linear guide
35b‧‧‧滑件 35b‧‧‧ slider
40‧‧‧X托架 40‧‧‧X bracket
41‧‧‧連結板 41‧‧‧Link board
50‧‧‧重量抵消裝置 50‧‧‧ weight offset device
51‧‧‧筐體 51‧‧‧Chassis
52‧‧‧空氣彈簧 52‧‧‧air spring
53‧‧‧Z滑件 53‧‧‧Z slider
54‧‧‧臂部 54‧‧‧arm
55‧‧‧基墊(空氣軸承) 55‧‧‧ base pad (air bearing)
56‧‧‧X可動子 56‧‧‧X mover
57‧‧‧密封墊(空氣軸承) 57‧‧‧Gasket (air bearing)
61‧‧‧平板構件 61‧‧‧ flat member
62‧‧‧側壁構件 62‧‧‧ sidewall members
70‧‧‧調平裝置 70‧‧‧leveling device
73‧‧‧Y固定子 73‧‧‧Y
75‧‧‧Y托架 75‧‧‧Y bracket
76‧‧‧板片 76‧‧‧ plates
81‧‧‧X可動子 81‧‧‧X mover
82‧‧‧X固定子 82‧‧‧X
90‧‧‧Y步進平台 90‧‧‧Y step platform
PST‧‧‧基板載台裝置 PST‧‧‧ substrate stage device
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