TW201351060A - Exposure apparatus, flat-panel display manufacturing method, and device manufacturing method - Google Patents

Exposure apparatus, flat-panel display manufacturing method, and device manufacturing method Download PDF

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TW201351060A
TW201351060A TW102112060A TW102112060A TW201351060A TW 201351060 A TW201351060 A TW 201351060A TW 102112060 A TW102112060 A TW 102112060A TW 102112060 A TW102112060 A TW 102112060A TW 201351060 A TW201351060 A TW 201351060A
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exposure apparatus
moving
weight canceling
load
axis direction
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TW102112060A
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Chinese (zh)
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TWI609244B (en
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青木保夫
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尼康股份有限公司
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Liquid Crystal (AREA)

Abstract

In a substrate stage device (PST), an X movable element (56), which faces an X stator (82) provided on an X beam (25) and in which a magnetic attractive force is generated with respect to a weight canceling device (50), is fixed at the tip of an arm (54) of the weight canceling device (50). The weight canceling device (50) transfers its own weight and part of the weight of a micro-movement stage (30) that the weight canceling device (50) supports to a floor (11) via a base frame (14) by means of the magnetic attractive force. Therefore, the biased load applied to a vibration prevention device (34) is reduced.

Description

曝光裝置、平面顯示器之製造方法、及元件製造方法 Exposure device, method for manufacturing flat display, and device manufacturing method

本發明係關於曝光裝置、平面顯示器之製造方法、及元件製造方法,詳言之,係關於製造半導體元件、液晶顯示元件等之微影製程中所使用之曝光裝置、使用前述曝光裝置之平面顯示器之製造方法、及使用前述曝光裝置之元件製造方法。 The present invention relates to an exposure apparatus, a method of manufacturing a flat panel display, and a device manufacturing method, and more particularly to an exposure apparatus used in a lithography process for manufacturing a semiconductor element, a liquid crystal display element, or the like, and a flat panel display using the same A manufacturing method and a component manufacturing method using the above exposure apparatus.

一直以來,於製造液晶顯示元件、半導體元件(積體電路等)等電子元件(微元件)之微影製程中,係採用一邊使光罩或標線片(以下,統稱為「光罩」)與玻璃板或晶圓(以下,統稱為「基板」)沿既定掃描方向(scan方向)同步移動、一邊將形成於光罩之圖案使用能量束轉印至基板上之步進掃描(step & scan)方式之曝光裝置(所謂之掃描步進機(亦稱掃描機))等。 In the lithography process for manufacturing electronic components (microcomponents) such as a liquid crystal display device or a semiconductor device (integrated circuit), a photomask or a reticle (hereinafter collectively referred to as a "mask") is used. Stepping scan with a glass plate or wafer (hereinafter collectively referred to as "substrate") moving in synchronization with a predetermined scanning direction (scan direction) while transferring the pattern formed on the reticle to the substrate using an energy beam (step & scan The exposure device of the mode (so-called scanning stepper (also called scanner)).

作為此種曝光裝置,有一種具有在能於掃描方向以長行程移動之X粗動載台上,搭載能於掃描交叉(cross scan)方向(與掃描方向正交之方向)移動之Y粗動載台的重疊型(龍門(gantry)型)載台裝置,作為此種載台裝置,以例如在由石材形成之平台(surface plate)上沿水平面移動之構成者廣為人知(例如,參照專利文獻1)。 As such an exposure apparatus, there is an X coarse motion stage which is movable in a scanning direction for a long stroke, and is mounted with a Y-movement which is movable in a cross-scanning direction (a direction orthogonal to the scanning direction). The superimposing type (gantry type) stage device of the stage is known as such a stage device, for example, moving along a horizontal surface on a surface plate formed of stone (for example, refer to Patent Document 1) ).

上述專利文獻1之曝光裝置,由於重量抵消裝置係在對應步 進掃描之大範圍移動,因此必須於大範圍將平台上面(重量抵消裝置之移動導引面)之平面度作的高。此外,近年來曝光裝置之曝光對象的基板有越來越大型化之傾向,隨此,平台亦日漸大型化,因此除成本增加外,曝光裝置之搬送性、安裝時之作業性悪化等皆受到關心。為此,皆期待有一種能使平台變小之新技術的出現。 In the exposure apparatus of the above Patent Document 1, since the weight canceling means is in the corresponding step The large-scale movement of the scanning is performed, so that the flatness of the upper surface of the platform (the moving guiding surface of the weight canceling device) must be made high. In addition, in recent years, the substrate to be exposed by the exposure apparatus has become larger and larger, and the platform has become larger and larger. Therefore, in addition to the increase in cost, the conveyance of the exposure apparatus and the workability during installation are affected. care. To this end, it is expected that there will be a new technology that will make the platform smaller.

先行技術文獻Advanced technical literature

[專利文獻1]美國專利申請公開第2010/0018950號說明書 [Patent Document 1] US Patent Application Publication No. 2010/0018950

為縮小平台,本案發明人已提出一種具備支承重量抵消裝置之平台係移動於掃描交叉方向之被稱為步進平台之平台的曝光裝置(美國專利申請第13/221568號)。具備此步進平台之曝光裝置,用以引導從下方支承保持曝光對象基板之基板保持構件之重量抵消裝置往掃描方向之移動的步進平台,係在能移動於掃描交叉方向之狀態下被支承於防振裝置之架台上。具備步進平台之曝光裝置,由於本身重量亦大之步進平台係在支承有基板保持構件及重量抵消裝置等之狀態下被驅動於掃描交叉方向,因此在驅動前後,曝光裝置整體之重心移動大。因此,最近發現,使用步進平台之曝光裝置,會於防振裝置施加極大的偏載重,尤其是保持大型基板之基板保持構件變重,因此透過支承基板保持構件之重量抵消裝置作用於步進平台、以及進一步透過步進平台作用於架台之偏載重増大,使得曝光動作時因施加至被防振裝置支承之架台之偏載重導致曝光裝置整體些微的傾斜,而有招致曝光精度降低之虞。 In order to reduce the size of the platform, the inventors of the present invention have proposed an exposure apparatus having a platform for supporting a weight canceling device that moves in a scanning cross direction, which is called a stepping platform (U.S. Patent Application No. 13/221,568). An exposure apparatus having the stepping platform for guiding a stepping platform for supporting the movement of the substrate holding member holding the exposure target substrate from the lower side in the scanning direction is supported while being movable in the scanning intersecting direction On the stand of the anti-vibration device. Since the stepping platform having the stepping platform is driven in the scanning intersecting direction while the substrate holding member and the weight canceling device are supported, the center of gravity of the entire exposure device is moved before and after the driving. Big. Therefore, it has recently been found that the use of the exposure apparatus of the stepping platform imposes a large eccentric load on the anti-vibration device, in particular, the substrate holding member that holds the large substrate becomes heavy, so that the weight canceling device that transmits the support member through the substrate acts on the stepping The platform and the eccentric load acting on the gantry further through the stepping platform are large, so that the exposure device is slightly tilted due to the eccentric load applied to the gantry supported by the anti-vibration device during the exposure operation, and the exposure accuracy is lowered.

本發明第1態樣,提供一種第1掃描型之曝光裝置,係在曝光處理時相對曝光用能量束使曝光對象物體在與水平面平行之第1方向以既定第1行程移動,其具備:移動體,能於該第1方向至少以該既定第1行程移動、且能在該水平面內於與該第1方向正交之第2方向以第2行程移動;物體保持構件,能保持該物體、與該移動體一起至少在與該水平面平行之方向移動;重量抵消裝置,從下方支承該物體保持構件以抵消該物體保持構件之重量;支承構件,延伸於該第1方向,從下方支承該重量抵消裝置並能在從下方支承該重量抵消裝置之狀態下,於該第2方向以該第2行程移動;支承架台,支承該支承構件;以及載重減輕裝置,用以減輕作用於該支承架台之重力方向之載重負荷。 According to a first aspect of the present invention, there is provided a first scanning type exposure apparatus that moves an exposure target object in a first direction parallel to a horizontal plane by a predetermined first stroke during an exposure process, and includes: moving The body can move at least in the first direction by the predetermined first stroke, and can move in the second direction in the second direction orthogonal to the first direction in the horizontal plane; the object holding member can hold the object, Moving together with the moving body at least in a direction parallel to the horizontal plane; the weight canceling device supports the object holding member from below to offset the weight of the object holding member; the supporting member extends in the first direction to support the weight from below The canceling device is movable in the second direction by the second stroke while supporting the weight canceling device from below; the support frame supports the support member; and the load reducing device for reducing the acting on the support frame Load load in the direction of gravity.

根據此發明,在對物體之曝光處理時,因物體保持構件、重量抵消裝置及支承構件本身重量而產生之重力方向(鉛直方向向下)之載重負荷雖會作用於支承架台,但會因載重減輕裝置而減輕。從而能降低包含物體保持構件、重量抵消裝置及支承構件、以及支承架台之系的重心移動而作用於支承架台之偏載重,據此,即能維持充分高的曝光精度。 According to the invention, in the exposure processing of the object, the load direction of the gravity direction (vertical direction downward) due to the weight of the object holding member, the weight canceling device, and the support member itself acts on the support frame, but the load is due to the load. Reduce the device and reduce it. Therefore, it is possible to reduce the eccentric load acting on the support gantry by the movement of the center of gravity including the object holding member, the weight canceling device, the supporting member, and the support gantry, thereby maintaining sufficiently high exposure accuracy.

本發明第2態樣,提供一種第2掃描型曝光裝置,係在曝光處理時相對曝光用能量束使曝光對象之物體在與水平面平行之第1方向以既定第1行程移動,其具備:第1移動構件,能於該第1方向至少以該既定第1行程移動;第2移動構件,引導該第1移動構件往該第1方向之移動、且能在該水平面內與該第1方向正交之第2方向與該第1移動構件一起以第2行程移動;物體保持構件,保持該物體、能與該第1移動構件一起至少在與該水平面平行之方向移動;重量抵消裝置,從下方支承該物體保持 構件以抵消該物體保持構件之重量;支承架台,包含從下方支承該重量抵消裝置之平台;線性馬達,包含設於該第2移動構件之磁石與設於該第1移動構件之線圈,將該第1移動構件以該第1行程驅動於該第1方向;以及載重減輕裝置,利用作用於該磁石與該重量抵消裝置之一部分之間之力,來減輕作用於該支承架台之重力方向之載重負荷。 According to a second aspect of the present invention, in a second scanning type exposure apparatus, the object to be exposed is moved by a predetermined first stroke in a first direction parallel to a horizontal plane with respect to an exposure energy beam during exposure processing, and includes: The moving member is movable at least in the predetermined first stroke in the first direction, and the second moving member guides the movement of the first moving member in the first direction and is positive in the horizontal direction in the first direction The second direction intersects with the first moving member to move along the second stroke; the object holding member holds the object and can move at least in a direction parallel to the horizontal plane together with the first moving member; the weight canceling device is from below Support the object to keep The member is configured to cancel the weight of the object holding member; the support frame includes a platform for supporting the weight canceling device from below; and the linear motor includes a magnet disposed on the second moving member and a coil disposed on the first moving member, The first moving member is driven in the first direction by the first stroke; and the load reducing device reduces the load acting on the gravity direction of the support frame by a force acting between the magnet and a part of the weight canceling device. load.

根據此發明,在對物體之曝光處理時,能與保持物體之物體保持構件一起往與水平面平行之方向移動之第1移動構件,係被線性馬達驅動於第1方向。此時,因物體保持構件及重量抵消裝置本身重量而產生之重力方向之載重負荷雖會作用於支承架台,但該載重負荷,可藉由載重減輕裝置,利用作用在與重量抵消裝置之一部分之間之力來加以減輕。因此,從而能降低包含物體保持構件、重量抵消裝置及支承架台之系的重心移動而作用於支承架台之偏載重,據此,即能維持充分高的曝光精度。 According to the invention, in the exposure processing of the object, the first moving member that can move in the direction parallel to the horizontal plane together with the object holding member that holds the object is driven by the linear motor in the first direction. At this time, the load in the gravity direction due to the weight of the object holding member and the weight canceling device itself acts on the support frame, but the load load can be utilized by the load reducing device to utilize a part of the weight canceling device. The power of each can be reduced. Therefore, the eccentric load acting on the support gantry can be reduced by the movement of the center of gravity including the object holding member, the weight canceling device, and the support stand, whereby the sufficiently high exposure accuracy can be maintained.

本發明第3態樣提供一種平面顯示器之製造方法,包含:使用上述第1及第2曝光裝置中之任一種使基板曝光的動作;以及使曝光後之前述基板顯影的動作。 A third aspect of the present invention provides a method of manufacturing a flat panel display, comprising: an operation of exposing a substrate using any one of the first and second exposure apparatuses; and an operation of developing the substrate after exposure.

本發明第4態樣提供一種元件製造方法,包含:使用上述第1及第2曝光裝置中之任一種使物體曝光的動作;以及使曝光後之前述物體顯影的動作。 According to a fourth aspect of the present invention, there is provided a device manufacturing method comprising: an operation of exposing an object using any one of the first and second exposure apparatuses; and an operation of developing the object after exposure.

10‧‧‧曝光裝置 10‧‧‧Exposure device

11‧‧‧地面 11‧‧‧ Ground

12‧‧‧照明系 12‧‧‧Lighting

14、414‧‧‧基架 14, 414‧‧‧ pedestal

14a、414a‧‧‧基架之本體部 14a, 414a‧‧‧ body part of the base

14b‧‧‧基架之腳部 14b‧‧‧foot of the base

14c‧‧‧調整器 14c‧‧‧ adjuster

15‧‧‧輔助基架 15‧‧‧Auxiliary pedestal

15a‧‧‧輔助基架之本體部 15a‧‧‧The main body of the auxiliary pedestal

15b‧‧‧輔助基架之調整器 15b‧‧‧Auxiliary pedestal adjuster

16‧‧‧Y線性導引裝置 16‧‧‧Y linear guide

16a‧‧‧Y線性導件 16a‧‧‧Y linear guide

16b‧‧‧滑件 16b‧‧‧Sliding parts

17a‧‧‧X線性導件 17a‧‧‧X linear guide

17b‧‧‧滑件 17b‧‧‧Sliding parts

18x‧‧‧X音圈馬達 18x‧‧‧X voice coil motor

18y‧‧‧Y音圈馬達 18y‧‧‧Y voice coil motor

21、28‧‧‧鏡座 21, 28‧‧ ‧ mirror base

22x‧‧‧X移動鏡 22x‧‧‧X moving mirror

22y‧‧‧Y移動鏡 22y‧‧‧Y moving mirror

23‧‧‧粗動載台 23‧‧‧ coarse moving stage

23x、123x、223x‧‧‧X粗動載台 23x, 123x, 223x‧‧‧X coarse moving stage

23y‧‧‧Y粗動載台 23y‧‧‧Y coarse moving stage

25、125、325、325b‧‧‧X樑 25, 125, 325, 325b‧‧‧X beam

26‧‧‧感測器 26‧‧‧Sensor

27‧‧‧標的物 27‧‧‧ Subject matter

30‧‧‧微動載台 30‧‧‧Micro-motion stage

31‧‧‧基板保持具 31‧‧‧Substrate holder

33‧‧‧基板載台架台 33‧‧‧Substrate mounting platform

34‧‧‧防振裝置 34‧‧‧Anti-vibration device

35‧‧‧Y線性導引裝置 35‧‧‧Y linear guide

35a‧‧‧Y線性導件 35a‧‧‧Y linear guide

35b‧‧‧滑件 35b‧‧‧Sliding parts

40、140、240、340、340b、440‧‧‧X托架 40, 140, 240, 340, 340b, 440‧‧‧X brackets

41、341‧‧‧連結板 41, 341‧‧‧ link board

42‧‧‧缺口部 42‧‧‧Gap section

43、45‧‧‧撓曲裝置(連結裝置) 43, 45‧‧‧Flexing device (linking device)

46、446、478‧‧‧固定構件 46, 446, 478‧‧‧ fixed components

50、250、350、350a、450‧‧‧重量抵消裝置 50, 250, 350, 350a, 450‧‧‧ weight offset devices

51、351‧‧‧筐體 51, 351‧‧‧ housing

52‧‧‧空氣彈簧 52‧‧‧Air spring

53‧‧‧Z滑件 53‧‧‧Z slider

54‧‧‧臂部 54‧‧‧arms

55‧‧‧基墊(空氣軸承) 55‧‧‧ base pad (air bearing)

56‧‧‧X可動子 56‧‧‧X movable

57‧‧‧密封墊(空氣軸承) 57‧‧‧Sealing pad (air bearing)

59、61‧‧‧平板構件 59, 61‧‧‧ flat member

58、62、66、68‧‧‧側壁構件 58, 62, 66, 68‧‧‧ side wall members

63‧‧‧頂部 63‧‧‧ top

64‧‧‧側壁部 64‧‧‧ Side wall

65‧‧‧平板構件 65‧‧‧Table components

70‧‧‧調平裝置 70‧‧‧ Leveling device

72、472‧‧‧Y可動子 72, 472‧‧‧Y movable

73‧‧‧Y固定子 73‧‧‧Y fixed

75、475、475a‧‧‧Y托架 75, 475, 475a‧‧‧Y bracket

76‧‧‧板片 76‧‧‧ plates

77‧‧‧支承構件 77‧‧‧Support members

78‧‧‧輔助托架 78‧‧‧Auxiliary bracket

81‧‧‧X可動子 81‧‧‧X movable

82‧‧‧X固定子 82‧‧‧X fixed

90、490、490a‧‧‧Y步進平台 90, 490, 490a‧‧‧Y stepping platform

94‧‧‧Y可動子 94‧‧‧Y movable

96、353‧‧‧磁性體 96, 353‧‧‧ magnetic body

97、343、343a、343b、346‧‧‧永久磁石 97, 343, 343a, 343b, 346‧‧‧ permanent magnet

124‧‧‧安裝構件 124‧‧‧Installation components

254‧‧‧X臂部 254‧‧‧X arm

255‧‧‧Y臂部 255‧‧‧Y arm

342‧‧‧開口部 342‧‧‧ openings

352‧‧‧鍔部 352‧‧‧锷

F1~F4‧‧‧分力 F 1 ~F 4 ‧‧‧

Fb、Ff、Fg、Fh‧‧‧磁吸力 Fb, Ff, Fg, Fh‧‧ magnetic attraction

Fd‧‧‧磁反作用力 Fd‧‧‧Magnetic reaction force

IL‧‧‧照明光 IL‧‧‧Lights

IOP‧‧‧照明系 IOP‧‧‧Lighting Department

M‧‧‧光罩 M‧‧‧Photo Mask

MST‧‧‧光罩載台 MST‧‧‧Photomask stage

P‧‧‧基板 P‧‧‧Substrate

PL‧‧‧投影光學系 PL‧‧‧Projection Optics

PST、PSTa、PST1~PST4、PST3a、PST3b、PST4a‧‧‧基板載台裝置 PST, PSTa, PST1~PST4, PST3a, PST3b, PST4a‧‧‧ substrate stage device

圖1係概略顯示第1實施形態之曝光裝置之構成的圖。 Fig. 1 is a view schematically showing the configuration of an exposure apparatus according to a first embodiment.

圖2係將圖1之曝光裝置所具有之基板載台從微動載台去除後加以顯 示的俯視圖。 2 is a view showing the substrate stage of the exposure apparatus of FIG. 1 removed from the micro-motion stage The top view of the show.

圖3係從+X方向觀察圖1之曝光裝置所具有之基板載台的圖。 Fig. 3 is a view of the substrate stage of the exposure apparatus of Fig. 1 as seen from the +X direction.

圖4係以示意方式顯示因基板載台裝置本身重量產生之力之流向的圖。 Fig. 4 is a view schematically showing the flow of force generated by the weight of the substrate stage device itself.

圖5係用以說明作用於重量抵消裝置之磁吸力的圖。 Figure 5 is a diagram for explaining the magnetic attraction force acting on the weight canceling device.

圖6(A)係以示意方式顯示未設置會作用於重量抵消裝置之磁吸力之產生裝置之基板載台裝置之重心移動的圖、圖6(B)係以示意方式顯示對重量抵消裝置作用鉛直方向向上之磁吸力之基板載台裝置之重心移動的圖。 Fig. 6(A) is a view schematically showing the movement of the center of gravity of the substrate stage device in which the magnetic attraction generating means acting on the weight canceling means is not provided, and Fig. 6(B) showing the effect of the weight canceling means in a schematic manner. A diagram showing the movement of the center of gravity of the substrate stage device in the vertical direction of the magnetic attraction.

圖7係從+X方向觀察第2實施形態之基板載台裝置的圖。 Fig. 7 is a view of the substrate stage device of the second embodiment as seen from the +X direction.

圖8係第3實施形態之基板載台裝置的俯視圖。 Fig. 8 is a plan view showing a substrate stage device according to a third embodiment.

圖9係從+X方向觀察第3實施形態之基板載台裝置之部分剖面的圖。 Fig. 9 is a partial cross-sectional view of the substrate stage device of the third embodiment as seen from the +X direction.

圖10係從+X方向觀察第4實施形態之基板載台裝置之部分剖面的圖。 Fig. 10 is a partial cross-sectional view of the substrate stage device of the fourth embodiment as seen from the +X direction.

圖11係第4實施形態之基板載台裝置的俯視圖。 Fig. 11 is a plan view showing a substrate stage device according to a fourth embodiment.

圖12(A)係顯示將產生磁吸力之永久磁石與磁性體加以組合之一例的圖、圖12(B)係將產生磁吸力之永久磁石與永久磁石加以組合之一例的圖。 Fig. 12(A) is a view showing an example in which a permanent magnet that generates magnetic attraction is combined with a magnetic body, and Fig. 12(B) is a view showing an example in which a permanent magnet that generates magnetic attraction is combined with a permanent magnet.

圖13係從+X方向觀察第4實施形態之第1變形例之基板載台裝置之部分剖面的圖。 Fig. 13 is a partial cross-sectional view of the substrate stage device according to the first modification of the fourth embodiment as seen from the +X direction.

圖14係從+X方向觀察第4實施形態之第2變形例之基板載台裝置之部分剖面的圖。 Fig. 14 is a partial cross-sectional view of the substrate stage device according to a second modification of the fourth embodiment as seen from the +X direction.

圖15係從-Y方向觀察第5實施形態之曝光裝置所具備之基板載台裝置之部分剖面的圖。 Fig. 15 is a partial cross-sectional view of the substrate stage device included in the exposure apparatus of the fifth embodiment as seen from the -Y direction.

圖16係顯示從+X方向觀察圖15之基板載台裝置之部分剖面的圖。 Fig. 16 is a view showing a partial cross section of the substrate stage device of Fig. 15 as seen from the +X direction.

圖17係顯示從-Y方向觀察第5實施形態之變形例之基板載台裝置的 圖。 Fig. 17 is a view showing the substrate stage device according to a modification of the fifth embodiment as seen from the -Y direction; Figure.

《第1實施形態》 "First Embodiment"

以下,根據圖1~圖6(B),說明第1實施形態。圖1中概略顯示了第1實施形態之曝光裝置10之構成。曝光裝置10、係以用於液晶顯示裝置(平面顯示器)之矩形(方型)玻璃基板P(以下,僅稱基板P)為曝光對象物之步進掃描方式的投影曝光裝置(亦稱掃描機)。 Hereinafter, the first embodiment will be described with reference to Figs. 1 to 6(B). The configuration of the exposure apparatus 10 of the first embodiment is schematically shown in Fig. 1 . The exposure apparatus 10 is a step-and-scan type projection exposure apparatus (also referred to as a scanner) in which a rectangular (square) glass substrate P (hereinafter, simply referred to as a substrate P) for a liquid crystal display device (planar display) is an exposure target. ).

曝光裝置10、具有照明系IOP、保持光罩M之光罩載台MST、投影光學系PL、一對基板載台架台33、包含保持基板P之基板保持具31的基板載台裝置PST、及此等之控制系等。以下,將曝光時光罩M與基板P相對投影光學系16分別被掃描之方向設為X軸方向、水平面內與X軸正交之方向為Y軸方向、與X軸及Y軸正交之方向為Z軸方向,並以繞X軸、Y軸及Z軸旋轉之方向分別為θx、θy及θz方向來進行說明。此外,將於X軸、Y軸及Z軸方向之位置分別設為X位置、Y位置及Z位置來進行說明。又,於基板P表面(+Z側之面)塗有光阻劑(感應劑)。 The exposure apparatus 10 includes a lighting system IOP, a mask stage MST holding the mask M, a projection optical system PL, a pair of substrate stage stages 33, a substrate stage device PST including a substrate holder 31 holding the substrate P, and Such control systems, etc. Hereinafter, the direction in which the exposure mask M and the substrate P are scanned with respect to the projection optical system 16 is defined as the X-axis direction, the direction orthogonal to the X-axis in the horizontal plane is the Y-axis direction, and the direction orthogonal to the X-axis and the Y-axis. The directions in the Z-axis direction and the directions of rotation around the X-axis, the Y-axis, and the Z-axis are θx, θy, and θz directions, respectively. In addition, the positions of the X-axis, the Y-axis, and the Z-axis direction are assumed to be the X position, the Y position, and the Z position, respectively. Further, a photoresist (inductive agent) is applied to the surface of the substrate P (the surface on the +Z side).

照明系IOP,係與例如美國專利第6,552,775號說明書等所揭示之照明系同樣的構成。亦即,照明系IOP具有分別照明光罩M上被配置成鋸齒狀之複數個、例如5個照明區域的複數個、例如5個照明系,各照明系將從未圖示之光源(例如水銀燈)射出之光,經由未圖示之反射鏡、分光鏡(dichroic mirror)、遮簾、波長選擇濾波器、各種透鏡等,作為曝光用照明光(照明光)IL照射於光罩M。照明光IL,係使用例如i線(波長365nm)、g線(波長436nm)、h線(波長405nm)等之光(或上述i線、g線、h線之合成光)。又,照 明光IL之波長可藉由波長選擇濾波器,例如視所要求之解析度適當的加以切換。 The illumination system IOP is configured in the same manner as the illumination system disclosed in, for example, the specification of U.S. Patent No. 6,552,775. That is, the illumination system IOP has a plurality of, for example, five illumination systems that respectively illuminate a plurality of, for example, five illumination regions arranged in a zigzag shape on the mask M, and each illumination system uses a light source (for example, a mercury lamp). The emitted light is irradiated to the mask M as exposure illumination light (illumination light) IL via a mirror, a dichroic mirror, a blind, a wavelength selective filter, various lenses, and the like (not shown). For the illumination light IL, for example, an i-line (wavelength: 365 nm), a g-line (wavelength: 436 nm), an h-line (wavelength: 405 nm), or the like (or the above-described i-line, g-line, and h-line combined light) is used. Again, according to The wavelength of the bright light IL can be switched by a wavelength selective filter, for example, depending on the required resolution.

於光罩載台MST,例如以真空吸附着方式固定有其圖案面(圖1之下面)形成有電路圖案等之光罩M。光罩載台MST係以非接觸狀態搭載在未圖示之導件上,藉由例如包含線性馬達之光罩載台驅動系(未圖示)以既定行程驅動,並被適當的微驅動於Y軸方向及θz方向。光罩載台MST於XY平面內之位置資訊(含θz方向之旋轉資訊),係藉由包含對固定(或形成)於光罩M之反射面照射雷射光束(測長光束)之雷射干涉儀之為圖示的光罩干涉儀系統加以測量。此測量結果被供應至未圖示之主控制裝置。主控制裝置根據光罩干涉儀系統測量之上述測量結果,透過光罩載台驅動系(未圖示)驅動(位置控制)光罩載台MST。又,亦可取代光罩干涉儀系統、或與光罩干涉儀系統一起使用編碼器(或由複數個編碼器構成之編碼器系統)。 In the mask stage MST, for example, a mask M having a circuit pattern or the like formed on the pattern surface (below the FIG. 1) is fixed by vacuum suction. The mask stage MST is mounted on a guide (not shown) in a non-contact state, and is driven by a mask stage drive system (not shown) including a linear motor for a predetermined stroke, and is appropriately micro-driven. Y-axis direction and θz direction. The position information of the mask stage MST in the XY plane (including the rotation information in the θz direction) is obtained by including a laser beam that irradiates the laser beam (measuring the long beam) to the reflecting surface fixed (or formed) on the mask M. The interferometer is measured for the illustrated mask interferometer system. This measurement result is supplied to a main control unit not shown. The main control unit drives (position control) the mask stage MST through the mask stage drive system (not shown) based on the measurement results measured by the mask interferometer system. Alternatively, an encoder (or an encoder system composed of a plurality of encoders) may be used in place of or in conjunction with the reticle interferometer system.

投影光學系PL配置在光罩載台MST之圖1中的下方。投影光學系PL具有與例如美國專利第6,552,775號說明書所揭示之投影光學系相同之構成。亦即,投影光學系PL對應前述複數個照明區域,包含光罩M之圖案像之投影區域配置成交錯狀之複數個、例如五個投影光學系(多透鏡投影光學系),與具有以Y軸方向為長邊方向之長方形單一像場之投影光學系具有相等之機能。本實施形態中,複數個投影光學系之各個係使用例如兩側遠心之等倍系、形成正立正像者。 The projection optical system PL is disposed below the reticle stage MST in FIG. The projection optical system PL has the same configuration as the projection optical system disclosed in the specification of U.S. Patent No. 6,552,775. In other words, the projection optical system PL corresponds to the plurality of illumination regions, and the projection regions including the pattern image of the mask M are arranged in a zigzag pattern, for example, five projection optical systems (multi-lens projection optical systems), and have Y A projection optical system in which a rectangular single image field having an axial direction of a long side direction has an equal function. In the present embodiment, each of the plurality of projection optical systems is formed by using, for example, a double-centered telecentric system on both sides to form an erect positive image.

因此,當以來自照明系IOP之照明光IL照明光罩M上之照明區域時,即藉由通過被配置成投影光學系PL之第1面(物體面)與圖案面大致一致之光罩M的照明光IL,透過投影光學系PL將該照明區域內之光罩M之電 路圖案之投影像(部分正立像),形成於與被配置在投影光學系PL之第2面(像面)側、基板P上之照明區域共軛之照明光IL之照射部位(曝光區域)。並藉由光罩載台MST與構成基板載台裝置PST之一部分之後述微動載台30的同步驅動,相對照明區域(照明光IL)使光罩M移動於掃描方向(X軸方向)且相對曝光區域(照明光IL)使基板P移動於掃描方向(X軸方向),據以進行基板P上一個照射區域(區劃區域)之掃描曝光,於該照射區域轉印光罩M之圖案(光罩圖案)。亦即,本實施形態中,係以照明系IOP及投影光學系PL在基板P上生成光罩M之圖案,藉由使用照明光IL之基板P上感應層(光阻層)之曝光以在基板P上形成該圖案。 Therefore, when the illumination area on the reticle M is illuminated by the illumination light IL from the illumination system IOP, that is, by the reticle M which is arranged to be substantially coincident with the pattern surface by the first surface (object surface) of the projection optical system PL Illumination light IL, through the projection optics PL, the photomask M in the illumination area The projection image (partial erect image) of the road pattern is formed on the irradiation portion (exposure region) of the illumination light IL that is conjugate with the illumination region disposed on the second surface (image surface) side of the projection optical system PL and on the substrate P. . By the synchronous movement of the mask stage MST and the micro-motion stage 30 which is a part of the substrate stage device PST described later, the mask M is moved in the scanning direction (X-axis direction) with respect to the illumination area (illumination light IL) and is relatively The exposure area (illumination light IL) moves the substrate P in the scanning direction (X-axis direction), thereby performing scanning exposure of one irradiation area (division area) on the substrate P, and transferring the pattern of the mask M (light) in the irradiation area Cover pattern). That is, in the present embodiment, the illumination system IOP and the projection optical system PL are used to form the pattern of the mask M on the substrate P, and the exposure layer (photoresist layer) on the substrate P using the illumination light IL is exposed. This pattern is formed on the substrate P.

一對基板載台架台33分別由延伸於Y軸方向之構件構成(參照圖3,其長邊方向兩端部被設在地面11上之防振裝置34從下方支承。一對基板載台架台33於X軸方向以既定間隔平行配置。於一對基板載台架台33各個之上面,如圖2所示,於X軸方向分離彼此平行的固定有延伸於Y軸方向之機械性Y線性導引裝置(單軸導引裝置)之要素的複數個(例如針對各基板載台架台33為3個)Y線性導件35a。 Each of the pair of substrate stages 33 is formed of a member extending in the Y-axis direction (see FIG. 3, and the vibration-proof devices 34 provided at both ends in the longitudinal direction on the floor 11 are supported from below. A pair of substrate-mounted stages 33 are arranged in parallel at a predetermined interval in the X-axis direction. On the respective upper surfaces of the pair of substrate stages 33, as shown in FIG. 2, the mechanical Y linear guide extending in the Y-axis direction is fixed in parallel with each other in the X-axis direction. A plurality of elements (for example, three for each substrate stage gantry 33) of the indexing device (single-axis guiding device) are Y linear guides 35a.

一對基板載台架台33構成曝光裝置10之裝置本體(機體),投影光學系PL及光罩載台MST等則搭載於裝置本體。 The pair of substrate stage stages 33 constitute a device body (body) of the exposure apparatus 10, and the projection optical system PL and the mask stage MST are mounted on the apparatus body.

基板載台裝置PST,如圖1所示,具備一對基架(base frame)14、輔助基架15、粗動載台23、微動載台30、重量抵消裝置50、及從下方支承重量抵消裝置50之Y步進平台90等。 As shown in FIG. 1, the substrate stage device PST includes a pair of base frames 14, an auxiliary pedestal 15, a coarse movement stage 23, a fine movement stage 30, a weight canceling device 50, and a weight offset from below. The Y stepping platform 90 of the device 50 and the like.

一對基架14中之一方,如圖1及圖2所示,配置在+X側之基板載台架台33之+X側,另一方則配置在-X側之基板載台架台33之-X側 。由於一對基架14具有相同構造,因此,以下僅針對+X側之基架14加以說明。基架14,如圖1所示,包含由具有與YZ平面平行之一面與另一面延伸於Y軸方向之板狀構件構成之本體部14a、與從下方支承本體部14a之複數個脚部14b。脚部14b於Y軸方向以既定間隔、例如設有3個。於各脚部14b之下端部設有複數個調整器14c,能調整本體部14a之Z位置。 One of the pair of pedestals 14 is disposed on the +X side of the substrate stage gantry 33 on the +X side as shown in Figs. 1 and 2, and the other is placed on the substrate stage gantry table 33 on the -X side. X side . Since the pair of base frames 14 have the same configuration, only the base frame 14 on the +X side will be described below. As shown in FIG. 1, the base frame 14 includes a main body portion 14a composed of a plate-like member having one surface parallel to the YZ plane and the other surface extending in the Y-axis direction, and a plurality of leg portions 14b supporting the main body portion 14a from below. . The leg portion 14b is provided at a predetermined interval in the Y-axis direction, for example, three. A plurality of adjusters 14c are provided at the lower end portions of the respective leg portions 14b, and the Z position of the main body portion 14a can be adjusted.

於本體部14a之X軸方向兩側面(亦即,上述之一面與另一面)分別固定有線性馬達之要素的Y固定子73。Y固定子73具有磁石單元,此磁石單元包含於Y軸方向以既定間隔排列之複數個永久磁石。又,於本體部14a之上面,固定有延伸於Y軸方向之機械性Y線性導引裝置(單軸導引裝置)之要素的Y線性導件16a。 The Y stator 73 of the element of the linear motor is fixed to both side surfaces of the main body portion 14a in the X-axis direction (that is, the one surface and the other surface). The Y stator 73 has a magnet unit including a plurality of permanent magnets arranged at predetermined intervals in the Y-axis direction. Further, a Y linear guide 16a which is an element of a mechanical Y linear guide (single-axis guide) extending in the Y-axis direction is fixed to the upper surface of the main body portion 14a.

輔助基架15配置載一對基板載台架台33之間。輔助基架15,其大小雖不同,但除基架14之本體部14a外的部分則係同樣構成。亦即,輔助基架15,包含由延伸於Y軸方向之板狀構件構成之本體部15a、與從下方支承本體部15a而能調整本體部14a之Z位置之調整器15b。於輔助基架15之本體部15a上面,與基架14同樣的固定有延伸於Y軸方向之Y線性導件16a。輔助基架15上端之Z位置被設定為較一對基板載台架台33之上面略低(或大致相同)。 The auxiliary pedestal 15 is disposed between the pair of substrate stages pedestal 33. The auxiliary pedestal 15 has a different size, but the portion other than the main body portion 14a of the pedestal 14 is constructed in the same manner. That is, the auxiliary base frame 15 includes the main body portion 15a formed of a plate-like member extending in the Y-axis direction, and the adjuster 15b capable of adjusting the Z position of the main body portion 14a by supporting the main body portion 15a from below. On the upper surface 15a of the auxiliary base frame 15, a Y linear guide 16a extending in the Y-axis direction is fixed in the same manner as the base frame 14. The Z position of the upper end of the auxiliary base frame 15 is set to be slightly lower (or substantially the same) as the upper surface of the pair of substrate stage platforms 33.

粗動載台23,包含Y粗動載台23y與搭載在Y粗動載台23y上之X粗動載台23x。 The coarse movement stage 23 includes a Y coarse movement stage 23y and an X coarse motion stage 23x mounted on the Y coarse motion stage 23y.

Y粗動載台23y搭載在一對基架14及輔助基架15上。Y粗動載台23y,如圖2所示,具有一對X樑25。一對X樑25分別由延伸於X軸方向之構件構成,於Y軸方向以既定間隔彼此平行配置。一對X樑25之各個,如圖3 所示,YZ剖面之形狀為上邊較底邊長之倒立的大致等腰梯形。此梯形,除上下2邊外,具有在YZ平面內相對Z軸以角θ(θ較45度小,例如為10度)傾斜之一邊、與在YZ平面內相對Z軸以角-θ傾斜之另一邊。 The Y coarse movement stage 23y is mounted on the pair of base frames 14 and the auxiliary base frame 15. The Y coarse movement stage 23y, as shown in Fig. 2, has a pair of X-beams 25. Each of the pair of X-beams 25 is formed of a member extending in the X-axis direction, and is disposed in parallel with each other at a predetermined interval in the Y-axis direction. A pair of X beams 25, as shown in Figure 3. As shown, the shape of the YZ section is an inverted isosceles trapezoid having an upper side that is longer than the bottom side. The trapezoid has an inclination of one side with respect to the Z axis at an angle θ (θ is smaller than 45 degrees, for example, 10 degrees) in the YZ plane, and is inclined at an angle −θ with respect to the Z axis in the YZ plane. the other side.

於一對X樑25各個之長邊方向兩端部近旁下面,如圖2所示,固定有被稱為Y托架(carriage)75之構件。亦即,於Y粗動載台23y下面,安裝有例如合計4個Y托架75。配置在+X側之2個Y托架75,係透過固定在各個之上面之板片76彼此連結。同樣的,配置在-X側之2個Y托架75亦透過板片76彼此連結。由於例如合計4個Y托架75之各個具有相同構造,以下,僅針對對應+X側基架14之1個Y托架75加以說明。 A member called a Y bracket 75 is fixed to the lower side of both end portions in the longitudinal direction of each of the pair of X-beams 25 as shown in FIG. 2 . That is, for example, a total of four Y brackets 75 are attached to the lower side of the Y coarse movement stage 23y. The two Y brackets 75 disposed on the +X side are coupled to each other through the sheets 76 fixed to the respective upper sides. Similarly, the two Y brackets 75 disposed on the -X side are also coupled to each other through the plate 76. For example, each of the four Y brackets 75 has the same configuration. Hereinafter, only one Y bracket 75 corresponding to the +X side base frame 14 will be described.

Y托架75,如圖1所示,由XZ剖面倒U字形之構件成,在一對對向面間插入基架14之本體部14a。於Y托架75之一對對向面之各個,分別固定有透過既定間隙(clearance/gap)與一對Y固定子73之各個對向之一對Y可動子72。各Y可動子72,包含未圖示之線圈單元,與對向之Y固定子73一起構成將Y粗動載台23y於Y軸方向以既定行程驅動之電磁力(羅倫茲力)驅動方式的動圈型Y線性馬達。又,Y粗動載台23y之Y位置資訊係以未圖示之線性編碼器系統加以求出。 As shown in Fig. 1, the Y bracket 75 is formed by a U-shaped U-shaped cross section, and the main body portion 14a of the base frame 14 is inserted between a pair of opposing surfaces. A pair of Y movable members 72 that are transmitted through a predetermined gap (clearance/gap) and a pair of Y stators 73 are fixed to each of the pair of opposing faces of the Y bracket 75. Each of the Y movable members 72 includes a coil unit (not shown), and constitutes an electromagnetic force (Lorentz force) driving method for driving the Y coarse moving stage 23y in the Y-axis direction by a predetermined stroke together with the opposing Y stator 73. Dynamic coil type Y linear motor. Further, the Y position information of the Y coarse movement stage 23y is obtained by a linear encoder system (not shown).

於Y托架75之頂面,相對各個Y托架75固定有複數個(例如2個(參照圖2))包含滾動體(例如複數個球等)、以能滑動之方式卡合於Y線性導件16a之滑件16b。Y粗動載台23y,被包含Y線性導件16a與滑件16b之複數個Y線性導引裝置,直進引導於Y軸方向。 On the top surface of the Y bracket 75, a plurality of (for example, two (refer to FIG. 2)), including rolling elements (for example, a plurality of balls, etc.) are fixed to the Y brackets 75, and are slidably engaged with the Y linear. The slider 16b of the guide 16a. The Y coarse movement stage 23y is comprised of a plurality of Y linear guides including a Y linear guide 16a and a slider 16b, and is guided in the Y-axis direction.

又,於一對X樑25之長邊方向中央部下面,透過支承構件77固定有複數個(例如2個)輔助托架78。輔助托架78由長方體狀之構件成,於 其下面,與Y托架75同樣的,固定有以可滑動之方式卡合於Y線性導件16a之滑件16b。據此,Y粗動載台23y即相對基板載台架台33在振動上分離。此外,於圖1中雖係於紙面深度方向重疊而隱藏,針對1個輔助托架78,滑件16b係於紙面深度方向(Y軸方向)以既定間隔、例如安裝有2個。如此,Y粗動載台23y,其長邊方向中央部透過輔助托架78被輔助基架15從下方支承,而使本身重量引起之撓曲受到抑制。 Further, a plurality of (for example, two) auxiliary brackets 78 are fixed to the lower surface of the center portion of the pair of X-beams 25 in the longitudinal direction by the support member 77. The auxiliary bracket 78 is formed of a rectangular parallelepiped member, below it, with the Y bracket 75 Similarly, the slider 16b that is slidably engaged with the Y linear guide 16a is fixed. Accordingly, the Y coarse movement stage 23y is separated from the substrate stage stage 33 by vibration. In addition, in FIG. 1, although the paper surface is overlapped and hidden in the depth direction of the paper, the slider 16b is attached to the auxiliary paper 78 in the depth direction (Y-axis direction) of the paper at a predetermined interval, for example, two. As described above, the Y coarse movement stage 23y has its central portion in the longitudinal direction transmitted through the auxiliary bracket 78 from the lower side by the auxiliary base frame 15, and the deflection caused by its own weight is suppressed.

於一對X樑25各個之上面,如圖2及圖3所示,於Y軸方向以既定間隔彼此平行的固定又複數條(本實施形態中,針對1個X樑25例如為2條)延伸於X軸方向之機械性單軸導引裝置之要素的X線性導件17a。又,於一對X樑25之YZ剖面中之2個斜邊(斜面),如圖1及圖2所示,固定有從X樑25之-X側端部近旁到+X側端部近旁延設之X固定子82。X固定子82具有磁石單元,此磁石單元包含於X軸方向以既定間隔排列之複數個永久磁石。 As shown in FIG. 2 and FIG. 3, the upper surface of each of the pair of X-beams 25 is fixed in parallel with each other at a predetermined interval in the Y-axis direction (in the present embodiment, for example, two X-beams 25 are two). The X linear guide 17a extends over the elements of the mechanical uniaxial guiding device in the X-axis direction. Further, two oblique sides (inclined faces) of the YZ sections of the pair of X beams 25 are fixed from the vicinity of the -X side end of the X beam 25 to the vicinity of the +X side end as shown in Figs. 1 and 2 . Extended X anchors 82. The X stator 82 has a magnet unit including a plurality of permanent magnets arranged at predetermined intervals in the X-axis direction.

X粗動載台23x,如圖2所示的包含連結一對X托架40與一對X托架40之一對連結板41。又,由於一對X托架40具有相同構造,因此,以下僅針對Y側之X托架40加以說明。 The X coarse movement stage 23x includes a pair of coupling plates 41 that connect a pair of X brackets 40 and a pair of X brackets 40 as shown in FIG. 2 . Moreover, since the pair of X brackets 40 have the same structure, only the X bracket 40 on the Y side will be described below.

X托架40,如圖2及圖3所示,具有以X軸方向為長邊方向之俯視長方形的平板構件61、與在平板構件61之長邊方向一端部與另一端部之Y軸方向兩端面分別以上端面與平板構件61之上面大致同面高之狀態固定的各一對、合計4個側壁構件62。X托架40,從+X方向觀察,如圖3所示,具有倒U字狀之形狀,於彼此成對之+Y側與-Y側之側壁構件62彼此間插入X樑25。平板構件61之X軸方向兩端,相對+X側及-X側之側壁構件62之各個,向X軸方向之外側略突出(參照圖2)。彼此成對之+Y側與-Y側之側 壁構件62,分別具有與從上端(+Z側端)至中央部近旁之XZ平面平行的第1部分、與從中央部近旁至下端(-Z側端)向-Y側或+Y側傾斜而與上述X樑25之2個斜面對向的第2部分。於X托架40之長邊方向(X軸方向)中央部近旁,設有在X托架40之X軸方向長度之1/3略短之範圍不存在側壁構件62之部分(以下,稱缺口部)42(參照圖2)。 As shown in FIG. 2 and FIG. 3, the X bracket 40 has a rectangular plate member 61 having a rectangular shape in the longitudinal direction of the X-axis direction, and a Y-axis direction at one end portion and the other end portion in the longitudinal direction of the flat plate member 61. Each of the pair of end faces is fixed in a state in which the upper end faces are substantially flush with the upper surface of the plate member 61, and a total of four side wall members 62 are provided. The X bracket 40 has an inverted U-shape as viewed in the +X direction, and the X-beams 25 are inserted between the +Y side and the -Y side wall member 62 which are paired with each other. Both ends of the plate member 61 in the X-axis direction are slightly protruded outward from the X-axis direction with respect to each of the +X side and the -X side wall member 62 (see FIG. 2). Paired with each other on the +Y side and the -Y side The wall member 62 has a first portion parallel to the XZ plane from the upper end (+Z side end) to the center portion, and a tilt from the center portion to the lower end (-Z side end) to the -Y side or the +Y side. And the second part facing the two oblique faces of the X beam 25 described above. In the vicinity of the center portion in the longitudinal direction (X-axis direction) of the X-bracket 40, a portion in which the side wall member 62 is not present in a range of 1/3 of the length of the X-bracket 40 in the X-axis direction is provided (hereinafter, referred to as a notch) Part 42 (see Fig. 2).

於X托架40之平板構件61各個之下面(-Z側之面),如圖3所示,相對各個X線性導件17a固定有複數個(例如4個(參照圖2))包含滾動體、以能滑動之方式卡合於Y線性導件17a之滑件17b。本實施形態中,於X粗動載台23x之下面固定有例如合計16個之滑件17b。X粗動載台23x,被包含Y線性導件17a與滑件17b之複數個X線性導引裝置,直進引導於X軸方向。 On the lower surface (the surface on the -Z side) of the plate member 61 of the X bracket 40, as shown in FIG. 3, a plurality of (for example, four (refer to FIG. 2)) rolling bodies are fixed to the respective X linear guides 17a. The slider 17b of the Y linear guide 17a is slidably engaged. In the present embodiment, for example, a total of 16 sliders 17b are fixed to the lower surface of the X coarse movement stage 23x. The X coarse movement stage 23x is comprised of a plurality of X linear guides including a Y linear guide 17a and a slider 17b, and is guided in the X-axis direction.

於X托架40所具有之4個側壁構件62各個之第2部分之內面,固定有與一對X固定子82之各個透過既定間隙(clearance/gap)對向之X可動子81。各X可動子81,包含未圖示之線圈單元,與對向之X固定子82一起構成將X粗動載台23x於X軸方向以既定行程驅動之電磁力(羅倫茲力)驅動方式的動圈型X線性馬達。又,各X可動子81包含未圖示之鐵心,在與對向之X固定子82之間產生磁吸力。亦即,各可動子81構成有芯線圈單元。、X粗動載台23x之X位置資訊係以未圖示之線性編碼器系統加以求出。 The X movable member 81 that is opposed to each of the pair of X stators 82 through a predetermined clearance/gap is fixed to the inner surface of each of the four side wall members 62 of the X bracket 40. Each of the X movable members 81 includes a coil unit (not shown), and constitutes an electromagnetic force (Lorentz force) driving method for driving the X coarse motion stage 23x in the X-axis direction by a predetermined stroke together with the opposing X stator 82. Dynamic type X linear motor. Further, each of the X movable members 81 includes a core (not shown), and generates a magnetic attraction force between the opposing X stators 82. That is, each movable member 81 constitutes a core coil unit. The X position information of the X coarse motion stage 23x is obtained by a linear encoder system (not shown).

一對連結板41之各個,如圖2所示,由延設於Y軸方向之平板構件構成。一方之連結板41,係固定在從配置於+Y側之X托架40之Y軸方向中央略靠-Y側起、至配置於-Y側之X托架40之Y軸方向中央略靠+Y側,將一對X托架40之+X端部彼此連結。另一方之連結板41,則固定在從配置於+Y側之X托架40之Y軸方向中央略靠-Y側起、至配置於-Y側之X 托架40之Y軸方向中央略靠+Y側,將一對X托架40之-X端部彼此連結。亦即,具有一對X托架40與一對連結板41之X粗動載台23x,具有俯視呈中央具開口部之略矩形形狀。 Each of the pair of coupling plates 41 is constituted by a flat plate member extending in the Y-axis direction as shown in Fig. 2 . One of the connecting plates 41 is fixed slightly from the center of the Y-axis direction of the X-bracket 40 disposed on the +Y side to the center of the Y-axis direction of the X-bracket 40 disposed on the -Y side. On the +Y side, the +X ends of the pair of X brackets 40 are coupled to each other. The other connecting plate 41 is fixed to the X disposed on the -Y side from the center in the Y-axis direction of the X bracket 40 disposed on the +Y side. The center of the bracket 40 in the Y-axis direction is slightly closer to the +Y side, and the -X end portions of the pair of X brackets 40 are coupled to each other. That is, the X coarse movement stage 23x having the pair of X brackets 40 and the pair of coupling plates 41 has a substantially rectangular shape having a central opening in plan view.

此外,雖未圖示,但於X粗動載台23x,安裝有以機械方式限制後述微動載台30相對X粗動載台23x之可移動量的擋止構件、或於X軸、及Y軸方向用以測量微動載台30相對X粗動載台23x之移動量的間隙感測器等。 Further, although not shown, a blocking member that mechanically restricts the movable amount of the fine movement stage 30 to the X coarse movement stage 23x, or the X-axis, and Y, is mechanically limited to the X coarse movement stage 23x. The axial direction is a gap sensor for measuring the amount of movement of the fine movement stage 30 with respect to the X coarse movement stage 23x.

微動載台30,由圖1及圖3可知,由俯視大致正方形之板狀構件(或箱形(中空長方體)之構件)構成,於其上面透過基板保持具31以例如真空吸附(或靜電吸附)方式吸附保持基板P。 As shown in FIGS. 1 and 3, the fine movement stage 30 is formed of a plate-like member (or a box-shaped (hollow rectangular parallelepiped) member) having a substantially square shape in plan view, and is passed through the substrate holder 31 to, for example, vacuum adsorption (or electrostatic adsorption). The method of adsorbing and holding the substrate P.

微動載台30,係被包含分別含固定於X粗動載台23x之固定子與固定於微動載台30之可動子構成之複數個音圈馬達(或線性馬達)的微動載台驅動系,於X粗動載台23x上微驅動於XY平面內之3自由度方向(X軸、Y軸及θz之各方向)。複數個音圈馬達,如圖1所示,將微動載台30微驅動於X軸方向之X音圈馬達18x係於Y軸方向分離設置有一對(紙面內深處之X音圈馬達18x未圖示),如圖3所示,將微動載台30微驅動於Y軸方向之Y音圈馬達18y則於X軸方向分離間設置有一對(紙面內深處之Y音圈馬達18y未圖示)。微動載台30,使用上述X音圈馬達18x及/或Y音圈馬達18y與X粗動載台23x同步驅動(與X粗動載台23x同方向、同速度驅動),而與X粗動載台23x一起以既定行程移動於X軸方向及/或Y軸方向。因此,微動載台30可相對投影光學系PL(參照圖1)於XY2軸方向以長行程移動(粗動)可能,且能於X,Y、θz方向之3自由度方向微幅移動(微動)。 The fine movement stage 30 is provided with a fine movement stage drive system including a plurality of voice coil motors (or linear motors) each of which is fixed to the fixed portion of the X coarse movement stage 23x and the movable body fixed to the fine movement stage 30. The X coarse motion stage 23x is micro-driven in the three-degree-of-freedom direction (the X-axis, the Y-axis, and the θz direction) in the XY plane. A plurality of voice coil motors, as shown in FIG. 1, an X-coil motor 18x that micro-drives the micro-motion stage 30 in the X-axis direction is provided in a pair in the Y-axis direction (the X-sound motor 18x is not deep in the paper surface) As shown in FIG. 3, the Y-coil motor 18y that micro-drives the fine movement stage 30 in the Y-axis direction is provided with a pair in the X-axis direction separation (the Y-coil motor 18y in the depth of the paper surface is not shown). Show). The fine movement stage 30 is driven synchronously with the X coarse motion stage 23x by using the X voice coil motor 18x and/or the Y voice coil motor 18y (driven in the same direction and at the same speed as the X coarse motion stage 23x), and is rotated with X. The stage 23x moves together in the X-axis direction and/or the Y-axis direction with a predetermined stroke. Therefore, the fine movement stage 30 can move with a long stroke (coarse motion) in the XY2 axis direction with respect to the projection optical system PL (refer to FIG. 1), and can move slightly in the three degrees of freedom in the X, Y, and θz directions (micromotion). ).

又,微動載台驅動系具有用以將微動載台30微幅驅動於θx、θy及Z軸方向之3自由度方向之未圖示的複數個Z音圈馬達。關於包含複數個音圈馬達之微動載台驅動系之構成,已揭示於例如美國專利申請公開第2010/0018950號說明書。 Further, the fine movement stage drive system has a plurality of Z voice coil motors (not shown) for slightly driving the fine movement stage 30 in the three degrees of freedom directions of θx, θy, and Z-axis directions. A configuration of a micro-motion stage drive system including a plurality of voice coil motors is disclosed in, for example, U.S. Patent Application Publication No. 2010/0018950.

於微動載台30之-X側之側面,如圖1所示,透過鏡座21固定了具有與X軸正交之反射面的X移動鏡(棒狀反射鏡)22x。又,於微動載台30之-Y側之側面,如圖3所示,透過鏡座28固定了具有與Y軸正交之反射面的Y移動鏡22y。微動載台30之XY平面內之位置資訊,係藉由包含對X移動鏡22x及Y移動鏡22y分別照射測長光束(干涉儀光束)之複數個雷射干涉儀的雷射干涉儀系統(以下,稱基板干涉儀系統),隨時加以檢測。又,實際上,基板干涉儀系統具備複數個分別對應X移動鏡22x之X雷射干涉儀、及對應Y移動鏡22y之Y雷射干涉儀,但圖1中僅代表性的顯示來自X雷射干涉儀之測長光束。複數個雷射干涉儀分別固定於裝置本體。又,微動載台30於θx、θy及Z軸方向之位置資訊,係藉由固定在微動載台30下面之感測器26(參照圖3),使用例如後述固定於重量抵消裝置50之標的物27加以求出。關於上述微動載台30之位置測量系之構成,已揭示於例如美國專利申請公開第2010/0018950號說明書。 On the side of the -X side of the fine movement stage 30, as shown in Fig. 1, an X-moving mirror (rod mirror) 22x having a reflecting surface orthogonal to the X-axis is fixed to the mirror holder 21. Further, on the side of the -Y side of the fine movement stage 30, as shown in FIG. 3, the Y moving mirror 22y having the reflecting surface orthogonal to the Y-axis is fixed to the mirror holder 28. The positional information in the XY plane of the fine movement stage 30 is a laser interferometer system including a plurality of laser interferometers that respectively irradiate the X-ray moving mirror 22x and the Y moving mirror 22y with the length measuring beam (interferometer beam). Hereinafter, the substrate interferometer system is called, and it is detected at any time. Further, in practice, the substrate interferometer system includes a plurality of X laser interferometers corresponding to the X moving mirror 22x and a Y laser interferometer corresponding to the Y moving mirror 22y, but only a representative display in FIG. 1 is from X Ray. The long beam of the interferometer. A plurality of laser interferometers are respectively fixed to the apparatus body. Further, the positional information of the fine movement stage 30 in the θx, θy, and Z-axis directions is fixed to the sensor 26 (under FIG. 3) under the fine movement stage 30, and is fixed to the target of the weight canceling device 50, for example, which will be described later. The object 27 is obtained. The configuration of the position measuring system of the above-described fine movement stage 30 is disclosed in, for example, U.S. Patent Application Publication No. 2010/0018950.

重量抵消裝置50,如圖3所示,由延設於Z軸方向之柱狀構件構成,亦稱為心柱。重量抵消裝置50插入X粗動載台23x之開口部內,搭載在後述Y步進平台90上。重量抵消裝置50透過後述調平裝置70從下方支承微動載台30。 As shown in FIG. 3, the weight canceling device 50 is composed of a columnar member extending in the Z-axis direction, and is also referred to as a stem. The weight canceling device 50 is inserted into the opening of the X coarse movement stage 23x, and is mounted on a Y stepping stage 90 which will be described later. The weight canceling device 50 supports the fine movement stage 30 from below via a leveling device 70 which will be described later.

重量抵消裝置50具有筐體51、空氣彈簧52及Z滑件53、一對 臂部54等。 The weight canceling device 50 has a housing 51, an air spring 52, and a Z slider 53, a pair The arm portion 54 and the like.

筐體51由俯視矩形之構件構成,於中央部形成有+Z側之面開口之圓形開口部(參照圖2)。於筐體51之下面安裝有軸承面朝向-Z側之複數個空氣軸承(以下,稱基墊)55。 The casing 51 is formed of a member having a rectangular shape in plan view, and a circular opening portion having a surface opening on the +Z side is formed at the center portion (see FIG. 2). A plurality of air bearings (hereinafter referred to as base pads) 55 having bearing surfaces facing the -Z side are attached to the lower surface of the casing 51.

空氣彈簧52收容在筐體51之開口部內。於空氣彈簧52從外部供應加壓氣體。 The air spring 52 is housed in the opening of the casing 51. The air spring 52 supplies the pressurized gas from the outside.

Z滑件53由延伸於Z軸方向之筒狀構件構成,插入筐體51之開口部內,搭載在空氣彈簧52上。 The Z slider 53 is formed of a cylindrical member extending in the Z-axis direction, and is inserted into the opening of the casing 51 and mounted on the air spring 52.

一對臂部54之各個,由延伸於Y軸方向之棒狀構件構成。一對臂部54中配置在+Y側之臂部54,其一端固定在筐體51之+Y側側面、另一端則插入X托架40所具有之缺口部42內。同樣的,配置在-Y側之臂部54,其一端固定在筐體51之-Y側側面、另一端則插入X托架40所具有之缺口部42內。一對臂部54各個之另一端,具有與一對X樑25分別具有之斜面中、形成於Y軸方向內側之斜面平行對向之斜面。又,於一對臂部54各個之另一端之斜面,、固定有與一對X樑25分別具有之一對X固定子82中、配置在Y軸方向內側之X固定子82透過既定間隙(clearance/gap)對向之X可動子56。各X可動子56,包含未圖示之線圈單元,與對向之X固定子82一起構成將重量抵消裝置50於X軸方向以既定行程驅動之X線性馬達。又,各X可動子56,包含未圖示之鐵心,在與對向之X固定子82之間產生磁吸力。 Each of the pair of arm portions 54 is formed of a rod-shaped member that extends in the Y-axis direction. The arm portion 54 disposed on the +Y side of the pair of arm portions 54 is fixed to the +Y side surface of the casing 51 at one end, and inserted into the notch portion 42 of the X bracket 40 at the other end. Similarly, the arm portion 54 disposed on the -Y side has one end fixed to the -Y side surface of the casing 51 and the other end inserted into the notch portion 42 of the X bracket 40. The other end of each of the pair of arm portions 54 has a slope which is parallel to the inclined surface formed on the inner side in the Y-axis direction among the inclined surfaces of the pair of X-beams 25, respectively. Further, in the inclined surface of the other end of each of the pair of arm portions 54, the X-fixer 82 which is disposed in the pair of X-beams 25 and has an X-axis direction on the inner side in the Y-axis direction is fixed to a predetermined gap ( Clearance/gap) The opposite X mover 56. Each of the X movable members 56 includes a coil unit (not shown), and constitutes an X linear motor that drives the weight canceling device 50 in a predetermined stroke in the X-axis direction together with the opposing X stator 82. Further, each of the X movable members 56 includes a core (not shown), and generates a magnetic attraction force between the opposing X stators 82.

於重量抵消裝置50之上方搭載調平(leveling)裝置70。調平裝置70,被安裝在Z滑件53之+Z側端部、軸承面朝向+Z側之空氣軸承(以下,稱密封墊)57從下方以非接觸方式支承。調平裝置70係將微動載台30支承 為傾動(tilt)自如(相對XY平面於θx及θy方向擺動自如)之裝置。重量抵消裝置50,藉由空氣彈簧52產生之鉛直方向向上之力,透過Z滑件53及調平裝置70抵消包含微動載台30之系之重量(重力方向之力),具以降低上述複數個Z音圈馬達之負荷。 A leveling device 70 is mounted above the weight canceling device 50. The leveling device 70 is attached to the +Z side end portion of the Z slider 53 and the air bearing (hereinafter referred to as a gasket) 57 whose bearing surface faces the +Z side is supported in a non-contact manner from below. The leveling device 70 supports the fine movement stage 30 A device that is tiltable (freely swingable in the θx and θy directions with respect to the XY plane). The weight canceling device 50, by the force of the vertical direction generated by the air spring 52, passes through the Z slider 53 and the leveling device 70 to cancel the weight of the system including the micro-motion stage 30 (force in the direction of gravity), thereby reducing the above plural The load of a Z voice coil motor.

重量抵消裝置50,如圖2所示,係透過複數條(例如4條)被稱為撓曲裝置條連結裝置45(以下,適當地稱撓曲裝置45)機械性的連接於X粗動載台23x(X托架40)。撓曲裝置45,包含例如與XY平面平行配置之薄厚度之帶狀鋼板(或鋼索、合成樹脂製繩、鍊等)、與設在該鋼板兩端部之鉸接裝置(例如球接頭、或鉸練裝置),上述鋼板透過鉸接裝置架設在重量抵消裝置50與X托架40之間。複數個撓曲裝置45之Z位置,與重量抵消裝置50於Z軸方向之重心位置大致一致。撓曲裝置45,其一端固定於筐體51之角部(俯視下,筐體51之頂點),另一端則固定於X托架40之側壁構件62。亦即,重量抵消裝置50,藉由透過複數個撓曲裝置45之任一者被X粗動載台23x牽引,而與該X粗動載台23x一體的移動於X軸方向、或Y軸方向。此時,於重量抵消裝置50,在包含其於Z軸方向重心位置之與XY平面平行之平面內會有牽引力之作用,因此繞與移動方向正交之軸線之力矩具(俯仰力矩)不會作用。此外,包含調平裝置70、撓曲裝置45,關於本實施形態之重量抵消裝置50之詳細構成,以揭示於例如美國專利申請公開第2010/0018950號說明書。 As shown in FIG. 2, the weight canceling device 50 is mechanically connected to the X coarse dynamic load by a plurality of (for example, four) flexure device strip connecting devices 45 (hereinafter, appropriately referred to as the flexing device 45). Table 23x (X bracket 40). The flexure device 45 includes, for example, a strip-shaped steel sheet (or a steel cord, a synthetic resin rope, a chain, etc.) having a thin thickness arranged in parallel with the XY plane, and a hinge device (for example, a ball joint or a hinge) provided at both ends of the steel sheet. In the training device, the steel plate is placed between the weight canceling device 50 and the X bracket 40 through the hinge device. The Z position of the plurality of flexing devices 45 substantially coincides with the position of the center of gravity of the weight canceling device 50 in the Z-axis direction. The flexure device 45 has one end fixed to a corner portion of the casing 51 (the apex of the casing 51 in plan view), and the other end fixed to the side wall member 62 of the X bracket 40. That is, the weight canceling device 50 is moved by the X coarse movement stage 23x by any one of the plurality of bending apparatuses 45, and moves integrally with the X coarse movement stage 23x in the X-axis direction or the Y-axis. direction. At this time, in the weight canceling device 50, there is a pulling force in a plane including the center of gravity in the Z-axis direction parallel to the XY plane, and therefore the moment (pitching moment) about the axis orthogonal to the moving direction does not effect. Further, the leveling device 70 and the flexing device 45 are included, and the detailed configuration of the weight canceling device 50 of the present embodiment is disclosed in, for example, the specification of U.S. Patent Application Publication No. 2010/0018950.

Y步進平台90,綜合圖1至圖3可知,由延伸於X軸方向之YZ剖面矩形之構件構成,於俯視下,以和一對X樑25之各個相距既定距離之狀態(非接觸狀態)配置在一對X樑25之間。Y步進平台90之長邊方向尺寸,被設定為較微動載台30於X軸方向之移動行程略長若干。又,Y步進平台90之寬 度方向(Y軸方向)尺寸,係設定可支承重量抵消裝置50所具有之基墊55之寬度。Y步進平台90之材質為鑄鐵或緻密之石材(輝長岩)、陶瓷、CFRP材等,其上面之平坦度被加工為非常高。 The Y stepping platform 90, as shown in FIG. 1 to FIG. 3, is composed of a member having a rectangular YZ section extending in the X-axis direction, and is placed at a predetermined distance from each of the pair of X-beams 25 in a plan view (non-contact state). ) is disposed between a pair of X beams 25. The longitudinal direction dimension of the Y stepping stage 90 is set to be slightly longer than the movement stroke of the fine movement stage 30 in the X-axis direction. Also, the width of the Y stepping platform 90 The dimension (Y-axis direction) dimension is set to support the width of the base pad 55 of the weight canceling device 50. The material of the Y stepping platform 90 is cast iron or dense stone (gabbro), ceramic, CFRP material, etc., and the flatness of the upper surface is processed to be very high.

於Y步進平台90之下面,相對各個Y線性導件35a固定有複數個(例如2個(參照圖2))包含滾動體(例如,複數個球等)、以能滑動之方式卡合於複數個Y線性導件35a之滑件35b。Y步進平台90,被包含Y線性導件35a與Y滑件35b之複數個Y線性導引裝置35,於一對基板載台架台33上以既定行程直進引導於Y軸方向。 Below the Y stepping platform 90, a plurality of (for example, two (refer to FIG. 2)), including rolling elements (for example, a plurality of balls, etc.) are fixed to each of the Y linear guides 35a, and are slidably engaged with each other. A plurality of sliders 35b of the Y linear guide 35a. The Y stepping stage 90 is a plurality of Y linear guides 35 including Y linear guides 35a and Y sliders 35b, and is guided in the Y-axis direction by a predetermined stroke on a pair of substrate stages 33.

Y步進平台90,如圖2所示,透過連接在固定於+X側及-X側端面之固定構件46各個之一對撓曲裝置43,機械性的連結於各一對Y托架75。撓曲裝置43與上述撓曲裝置45具有大致相同構成。如此,Y步進平台90,當在Y軸方向之一側或另一側之Y托架75被驅動於Y軸方向時,即被該Y托架75牽引而一體的往Y軸方向移動。撓曲裝置43,其長邊方向(此處係Y軸方向)之剛性較其他5自由度方向(此處係X,Z,θx、θy、θz方向)之剛性低,於上述5自由度方向,Y步進平台90與Y粗動載台23y在振動上分離。 As shown in FIG. 2, the Y stepping platform 90 is mechanically coupled to each pair of Y brackets 75 by a pair of flexure means 43 connected to the fixing members 46 fixed to the +X side and the -X side end surface. . The flexure device 43 has substantially the same configuration as the above-described flexure device 45. As described above, when the Y bracket 75 on one side or the other side in the Y-axis direction is driven in the Y-axis direction, the Y stepping platform 90 is pulled by the Y bracket 75 and integrally moved in the Y-axis direction. The flexibility of the deflection device 43 in the longitudinal direction (here, the Y-axis direction) is lower than that in the other five degrees of freedom directions (here, X, Z, θx, θy, and θz directions) in the above-described five-degree-of-freedom direction. The Y stepping platform 90 and the Y coarse moving stage 23y are separated by vibration.

以上述方式構成之曝光裝置10,在未圖示之主控制裝置之管理下,以未圖示之光罩搬送裝置(光罩裝載器)進行光罩M往光罩載台MST上之裝載、並藉由未圖示之基板搬入裝置進行基板P往基板載台裝置PST上之搬入(裝載)。之後,由主控制裝置使用未圖示之對準檢測系實施對準測量,在該對準測量結束後,進行步進掃描(step & scan)方式之曝光動作。由於此曝光動作與習知之步進掃描方式之曝光動作相同,因此省略其詳細說明。 The exposure apparatus 10 configured as described above performs loading of the mask M onto the mask stage MST by a mask transport apparatus (mask loader) (not shown) under the management of a main control unit (not shown). The substrate P is carried in (loaded) onto the substrate stage device PST by a substrate loading device (not shown). Thereafter, the main control device performs alignment measurement using an alignment detection system (not shown), and after the alignment measurement is completed, a step-scan (step & scan) exposure operation is performed. Since this exposure operation is the same as the exposure operation of the conventional step-and-scan method, detailed description thereof will be omitted.

此處,上述步進掃描方式之曝光動作,係對設定在基板P之 複數個照射區域依序進行曝光處理。基板P,在掃描動作時係於X軸方向以既定行程被等速驅動(以下,稱X掃描動作),於步進動作時(照射區域間移動時)則係適當的被驅動於X軸方向及/或Y軸方向(以下,分別稱X步進動作、Y步進動作)。 Here, the exposure operation of the step-and-scan method described above is set on the substrate P. A plurality of irradiation areas are sequentially subjected to exposure processing. The substrate P is driven at a constant speed in a predetermined stroke in the X-axis direction during the scanning operation (hereinafter referred to as an X-scan operation), and is appropriately driven in the X-axis direction during the stepping operation (when moving between the irradiation regions). And/or the Y-axis direction (hereinafter, referred to as X step operation and Y step operation, respectively).

上述X掃描動作中、及X步進動作中使基板P移動於X軸方向時,於基板載台裝置PST,係根據編碼器系統之測量值在Y粗動載台23y上將X粗動載台23x驅動於X軸方向,並根據基板干涉儀系統之測量值以複數個X音圈馬達18x將微動載台30與X粗動載台23x同步驅動。又,當X粗動載台23x往X軸方向移動時,因被此X粗動載台23x牽引,重量抵消裝置50即與X粗動載台23x一起往X軸方向移動。此時、重量抵消裝置50,係由主控制裝置透過由X可動子56與X固定子82構成之線性馬達,與X粗動載台23x同步被驅動於X軸方向。此時,重量抵消裝置50係在Y步進平台90上移動。又,上述X掃描動作及X步進動作時,微動載台30雖有相對X粗動載台23x被微幅驅動於Y軸方向、及/或θz方向之情形,但由於重量抵消裝置50之Y位置不會變化,因此重量抵消裝置50恆僅在Y步進平台90上移動。 When the substrate P is moved in the X-axis direction during the X-scan operation and during the X-step operation, the substrate carrier device PST is configured to increase the X coarse motion on the Y coarse movement stage 23y based on the measured value of the encoder system. The stage 23x is driven in the X-axis direction, and the fine movement stage 30 and the X coarse movement stage 23x are synchronously driven by a plurality of X voice coil motors 18x according to the measured values of the substrate interferometer system. When the X coarse movement stage 23x is moved in the X-axis direction, the weight canceling device 50 is moved in the X-axis direction together with the X coarse movement stage 23x by being pulled by the X coarse movement stage 23x. At this time, the weight canceling device 50 is driven by the main control device through a linear motor including the X movable member 56 and the X fixed member 82, and is driven in the X-axis direction in synchronization with the X coarse motion stage 23x. At this time, the weight canceling device 50 moves on the Y stepping platform 90. Further, in the X-scan operation and the X-step operation, the fine movement stage 30 is slightly driven in the Y-axis direction and/or the θz direction with respect to the X coarse motion stage 23x, but the weight canceling device 50 The Y position does not change, so the weight canceling device 50 always moves only on the Y stepping platform 90.

相對於此,上述Y步進動作時,於基板載台裝置PST,Y粗動載台23y在一對基架14上被以既定行程驅動於Y軸方向,與此Y粗動載台23y一體的,X粗動載台23x以既定行程移動於Y軸方向。又,重量抵消裝置50與X粗動載台23x一體的以既定行程移動於Y軸方向。此時,從下方支承重量抵消裝置50之Y步進平台90,被與Y粗動載台23y同步驅動。因此,重量抵消裝置50恆被Y步進平台90從下方支承。 On the other hand, in the above-described Y step operation, the Y-stacking stage 23 is driven by the substrate stage device PST and the Y-stacking stage 23y on the pair of pedestals 14 in the Y-axis direction with a predetermined stroke, and is integrated with the Y-stacking stage 23y. The X coarse motion stage 23x moves in the Y-axis direction with a predetermined stroke. Further, the weight canceling device 50 is moved in the Y-axis direction by a predetermined stroke integrally with the X coarse movement stage 23x. At this time, the Y stepping stage 90 that supports the weight canceling device 50 from below is driven in synchronization with the Y coarse moving stage 23y. Therefore, the weight canceling device 50 is constantly supported by the Y stepping platform 90 from below.

其次,說明基板載台裝置PST之組裝順序。本第1實施形態 中,基板載台裝置PST,首先在無塵室之地面11上,以圖2所示之配置分別設置一對基板載台架台33、一對基架14、及輔助基架15。之後,分別透過Y線性導引裝置16將Y托架75搭載於一對基架14、將輔助托架78搭載於輔助基架15,並於一對基板載台架台33上透過複數個Y線性導引裝置35搭載Y步進平台90。又,亦可事先於其他場所將Y托架75組裝於一對基架14、將輔助托架78組裝於輔助基架15。 Next, the assembly procedure of the substrate stage device PST will be described. The first embodiment In the substrate stage device PST, first, a pair of substrate stage stages 33, a pair of base frames 14, and an auxiliary base frame 15 are respectively disposed on the floor 11 of the clean room in the arrangement shown in FIG. Thereafter, the Y bracket 75 is mounted on the pair of base frames 14 by the Y linear guide device 16, and the auxiliary bracket 78 is mounted on the auxiliary base frame 15, and a plurality of Y linearities are transmitted through the pair of substrate stage mounts 33. The guiding device 35 is equipped with a Y stepping platform 90. Further, the Y bracket 75 may be assembled to the pair of base frames 14 in other places, and the auxiliary bracket 78 may be assembled to the auxiliary base frame 15.

接著,於Y步進平台90上搭載重量抵消裝置50,此外,於Y托架75及輔助托架78上搭載一對X樑25。之後,以X固定子82與固定於重量抵消裝置50所具有之臂部54之X可動子56對向之方式搭載X托架40。又,亦可事先於其他場所於一對X樑分別安裝X托架40。之後,調整一對X樑25之位置(Y軸方向間隔)以使X固定子82與固定於重量抵消裝置50所具有之臂部54之X可動子56相距既定間隔對向,亦可藉由一對連結板76及77固定位置。 Next, the weight canceling device 50 is mounted on the Y stepping platform 90, and a pair of X-beams 25 are mounted on the Y bracket 75 and the auxiliary bracket 78. Thereafter, the X bracket 40 is mounted so that the X stator 82 is opposed to the X movable member 56 fixed to the arm portion 54 of the weight canceling device 50. Further, the X bracket 40 may be attached to each of the pair of X beams in advance at other places. Thereafter, the position of the pair of X-beams 25 (the Y-axis direction interval) is adjusted so that the X-fixer 82 is opposed to the X-movable member 56 fixed to the arm portion 54 of the weight canceling device 50 at a predetermined interval, or by The pair of webs 76 and 77 are fixed in position.

之後,將微動載台30(含調平裝置70)裝載於重量抵消裝置50上,並將複數個音圈馬達之固定子與可動子加以組合。接著,對重量抵消裝置50之空氣彈簧52、基墊55及密封墊57、以及調平裝置70所具有之未圖示的空氣軸承供應加壓氣體,微動載台30即被重量抵消裝置50以非接觸方式支承。 Thereafter, the fine movement stage 30 (including the leveling device 70) is loaded on the weight canceling device 50, and the stators of the plurality of voice coil motors are combined with the movable member. Next, the air spring 52 of the weight canceling device 50, the base pad 55 and the gasket 57, and the air bearing (not shown) of the leveling device 70 are supplied with pressurized gas, and the fine movement stage 30 is the weight canceling device 50. Supported in a non-contact manner.

其次,說明施加於基板載台裝置PST之力的流向。又,以下說明之施加於基板載台裝置PST之力,無論微動載台30之靜止中或動作中,皆會產生。 Next, the flow of the force applied to the substrate stage device PST will be described. Further, the force applied to the substrate stage device PST described below is generated regardless of whether the fine movement stage 30 is stationary or in operation.

當基板載台裝置PST被組裝完成時,基板P、基板保持具31及微動載台30(含調平裝置70)等(以下,稱微動載台30等)因本身重量之Z軸方 向向下之力,即如圖4所示,以下述流向傳至地面11上。又,雖然圖4中之基板載台裝置PST係以示意方式顯示而與圖1~3中所示形狀略有不同,但對於與圖1~圖3中所示構成部分對應之構成部分,係使用予相同符號。 When the substrate stage device PST is assembled, the substrate P, the substrate holder 31, the fine movement stage 30 (including the leveling device 70), and the like (hereinafter referred to as the fine movement stage 30, etc.) are Z-axis due to their own weight. The downward force, as shown in Fig. 4, is transmitted to the ground 11 in the following flow direction. Further, although the substrate stage device PST in FIG. 4 is schematically shown and slightly different from the shapes shown in FIGS. 1 to 3, the components corresponding to the components shown in FIGS. 1 to 3 are Use the same symbol.

如圖4所示,微動載台30等之本身重量係透過重量抵消裝置50被Y步進平台90支承。此處,如圖5所示,於重量抵消裝置50所具有之一對臂部54中、安裝在+Y側之臂部54,會作用在包含固定於臂部54另一端之鐵心的X可動子56與安裝在X樑25之斜面之X固定子82之間於YZ平面相對Y軸傾斜θ方向之磁吸力F。同樣的,於安裝在-Y側之臂部54,會作用於YZ平面相對Y軸傾斜-θ方向之磁吸力F。各個磁吸力F,分解為鉛直方向(Z軸方向)之分力F1、與水平方向(Y軸方向)之分力F2。此處,由於水平方向之分力F2會往彼此抵消之方向作用,因此於重量抵消裝置50僅會作用加上鉛直方向分力F1之力(亦即2F1)。因此,如圖4所示,微動載台30等之本身重量,其一部分被鉛直方向之分力F1(2F1)抵消,剩餘之力傳至Y步進平台90。傳至Y步進平台90之力,介由基板載台架台33及防振裝置34傳至地面11。另一方面,於X樑25則會施加鉛直方向之分力F1的反力,本身重量與鉛直方向分力F1之反力介由基架14及輔助基架15(參照圖1)傳至地面11。 As shown in FIG. 4, the weight of the fine movement stage 30 or the like is supported by the Y stepping stage 90 through the weight canceling device 50. Here, as shown in FIG. 5, in the arm portion 54 of the weight canceling device 50, the arm portion 54 attached to the +Y side acts on the X movable member including the core fixed to the other end of the arm portion 54. The magnetic force F between the sub-56 and the X stator 82 mounted on the slope of the X-beam 25 is inclined in the θ direction with respect to the Y-axis in the YZ plane. Similarly, the arm portion 54 mounted on the -Y side acts on the magnetic attraction force F of the YZ plane inclined in the -θ direction with respect to the Y axis. Each of the magnetic attractive force F, divided into a vertical direction (Z axis direction) of the component force F 1, the horizontal direction (Y axis direction) of the component force F 2. Here, since the component F 2 in the horizontal direction acts in a direction canceling each other, the weight canceling device 50 only acts to apply the force of the vertical component force F 1 (that is, 2F 1 ). Therefore, as shown in FIG. 4, the weight of the fine movement stage 30 or the like is partially offset by the component force F 1 (2F 1 ) in the vertical direction, and the remaining force is transmitted to the Y stepping stage 90. The force transmitted to the Y stepping platform 90 is transmitted to the floor 11 via the substrate stage stand 33 and the anti-vibration device 34. On the other hand, in the X-beam 25, the reaction force of the component force F 1 in the vertical direction is applied, and the reaction force of the weight of the vertical component F 1 is transmitted through the base frame 14 and the auxiliary base frame 15 (refer to FIG. 1). To the ground 11.

如以上之說明,根據本實施形態之曝光裝置10,如圖6(A)、圖6(B)所示,與重量抵消裝置50與X樑25之間不會產生磁吸力之基板載台裝置PSTa(圖6(A))相較,本實施形態之基板載台裝置PST(圖6(B)),由於磁吸力之作用而可將微動載台30及重量抵消裝置50視為例如中空構件等輕量之物,因此能縮短基板載台裝置PST被驅動於掃描交叉方向時之重心移動距離L。亦即,基板載台裝置PST,由於能減小被驅動於掃描交叉方向時防振裝 置34所承受之載重變化,因此能減少曝光裝置10之變形,提升曝光精度。 As described above, according to the exposure apparatus 10 of the present embodiment, as shown in FIGS. 6(A) and 6(B), the substrate stage device does not generate a magnetic attraction force between the weight canceling device 50 and the X-beam 25. PSTa (Fig. 6(A)), in comparison with the substrate stage device PST (Fig. 6(B)) of the present embodiment, the fine movement stage 30 and the weight canceling device 50 can be regarded as, for example, a hollow member due to the action of magnetic attraction. Since the lightweight object is used, the center of gravity moving distance L when the substrate stage device PST is driven in the scanning intersecting direction can be shortened. That is, the substrate stage device PST can be reduced in vibration resistance when it is driven in the scanning cross direction. The change in the load carried by the 34 is reduced, so that the deformation of the exposure device 10 can be reduced and the exposure accuracy can be improved.

又,由於將因微動載台30等及重量抵消裝置50本身重量產生之鉛直方向向下之力之一部分傳至X樑25,因此Y步進平台90能減小作用於本身之鉛直方向向下之力。從而,支承重量抵消裝置50之基墊55,可使用負荷容量小之小型基墊。亦即,Y步進平台90可縮小支承基墊55之引導面(Y軸方向尺寸)。 Further, since a portion of the vertical downward force generated by the weight of the fine movement stage 30 and the weight canceling device 50 itself is transmitted to the X-beam 25, the Y stepping platform 90 can reduce the vertical direction acting on itself. Power. Therefore, the base pad 55 supporting the weight canceling device 50 can be used with a small base pad having a small load capacity. That is, the Y stepping stage 90 can reduce the guide surface (the Y-axis direction dimension) of the support base pad 55.

又,Y步進平台90,由於能減少本身之負荷,因此能降低Y步進平台90之剛性。從而,Y步進平台90可減少厚度等而進一步小型化。 Moreover, the Y stepping platform 90 can reduce the rigidity of the Y stepping platform 90 because it can reduce its own load. Thereby, the Y stepping stage 90 can be further miniaturized by reducing the thickness and the like.

此外,基板載台裝置PST,由於Y步進平台90可小型化,因此能減小使Y步進平台90於Y軸方向步進移動之驅動力。 Further, since the substrate stage device PST can be miniaturized by the Y stepping stage 90, the driving force for stepwise movement of the Y stepping stage 90 in the Y-axis direction can be reduced.

其次,說明曝光裝置之其他實施形態。以下之第2實施形態以後之各實施形態中,由於基板載台裝置以外之部分與前述第1實施形態之曝光裝置10相同,因此,以下僅針對基板載台裝置加以說明。 Next, another embodiment of the exposure apparatus will be described. In each of the following embodiments of the second embodiment, the portion other than the substrate stage device is the same as that of the exposure device 10 of the first embodiment. Therefore, only the substrate stage device will be described below.

《第2實施形態》 "Second Embodiment"

接著,根據圖7說明第2實施形態。此處,與前述第1實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, a second embodiment will be described based on Fig. 7 . Here, the same or equivalent components as those of the above-described first embodiment are denoted by the same or similar reference numerals, and the description thereof will be simplified or omitted.

本第2實施形態之基板載台裝置PST1,其整體構成雖與前述基板載台裝置PST相同,但取代X樑25而設置X樑125之點、以及X托架140之形狀與X托架40之形狀一部分不同等,部分構成與基板載台裝置PST相異。以下,以兩者之相異點為中心進行說明。 The substrate stage device PST1 of the second embodiment has the same overall configuration as the substrate stage device PST, but the X-beam 125 is provided instead of the X-beam 25, and the shape of the X-bracket 140 and the X-bracket 40 are the same. The shape is partially different, and the partial configuration is different from the substrate stage device PST. Hereinafter, the description will be given focusing on the difference between the two.

如圖7所示,基板載台裝置PST1具備之一對X樑125,分別具有於YZ剖面將矩形(含菱形及正方形)之4個頂點分別切除(去角)的形狀,亦 即具有八角形狀。一方(+Y側)之X樑125,以在θx方向相對Y軸傾斜角φ(例如45度)之狀態透過安裝構件124固定在一方之Y托架75上面。另一方(-Y側)之X樑125,與一方之X樑125左右對稱的,亦即以在θx方向相對Y軸傾斜角-φ之狀態透過安裝構件124固定在另一方之Y托架75上面。一對X樑125分別具有4個斜面(相對XY平面傾斜之面)。 As shown in FIG. 7, the substrate stage device PST1 includes one pair of X-beams 125, each having a shape in which the four vertices of a rectangle (including a rhombus and a square) are cut off (de-angular) in the YZ cross-section, respectively. That is, it has an octagonal shape. The X beam 125 of one (+Y side) is fixed to the upper surface of one Y bracket 75 through the mounting member 124 in a state where the θx direction is inclined by φ (for example, 45 degrees) with respect to the Y axis. The other side (-Y side) of the X-beam 125 is bilaterally symmetrical with respect to one of the X-beams 125, that is, in a state of being inclined by an angle θ with respect to the Y-axis in the θx direction, and is fixed to the other Y-bracket 75 through the mounting member 124. Above. The pair of X beams 125 respectively have four slopes (faces inclined with respect to the XY plane).

於一方之X樑125之4個斜面中、未固定在安裝構件124之彼此對向之一對斜面,亦即於+Y側且+Z側之第1斜面與-Y側且-Z側之第2斜面,於長邊方向(X軸方向)之大致全長延設有一對X固定子82之各個。又,於一方之X樑125之與固定於安裝構件124之第3斜面相反側之第4斜面(亦即-Y側且+Z側之斜面),在與該斜面平行之方向以既定間隔、彼此平行的固定有複數條(例如2條)延伸於X軸方向之X線性導件17a。 Among the four inclined faces of one of the X-beams 125, the pair of inclined faces of the mounting member 124 are not fixed to each other, that is, the first inclined surface on the +Y side and the +Z side, and the -Y side and the -Z side. In the second inclined surface, each of the pair of X stators 82 is extended over substantially the entire length in the longitudinal direction (X-axis direction). Further, the fourth inclined surface of the one X beam 125 and the fourth inclined surface (that is, the -Y side and the +Z side inclined surface) fixed to the opposite side of the third inclined surface of the mounting member 124 is at a predetermined interval in a direction parallel to the inclined surface. A plurality of (for example, two) X linear guides 17a extending in the X-axis direction are fixed in parallel with each other.

於另一方之X樑125,以和上述一方之X樑為左右對稱之配置,設有一對X固定子82、複數條X線性導件17a。 The other X beam 125 is disposed symmetrically with the X beam of the above one, and is provided with a pair of X stators 82 and a plurality of X linear guides 17a.

一對X托架140,分別由具有頂部與分別設在頂部長邊方向兩端部之2對側壁部之YZ剖面倒U字狀的構件構成。一方(+Y側)之X托架140,係以側視(從+X方向觀察)於θx方向相對Y軸傾斜φ之狀態與X樑125之第1、第2及第4斜面對向配置。又,此一方之X托架140,於該側壁部(與X樑125之第1及第2斜面分別對向之部分)之X軸方向中央部近旁,與前述X托架40同樣的形成有缺口部42(參照圖2),於該一方之缺口部42內插入臂部54。 Each of the pair of X brackets 140 is formed of a member having a U-shaped cross section having a top portion and two pairs of side wall portions respectively provided at both end portions in the top longitudinal direction. The X bracket 140 of one side (+Y side) is placed sideways (viewed from the +X direction) in a state where the θx direction is inclined by φ with respect to the Y axis, and the first, second, and fourth oblique faces of the X beam 125 are arranged facing each other. . Further, the X bracket 140 of the one side is formed in the same manner as the X bracket 40 in the vicinity of the central portion in the X-axis direction of the side wall portion (the portion facing the first and second inclined surfaces of the X-beam 125). The notch portion 42 (see FIG. 2) is inserted into the notch portion 42 of the one of the arm portions 54.

於一方之X托架140之一對側壁部內面,分別固定有透過既定間隙(clearance/gap)與固定在前述X樑125之第1、第2斜面各個之一對X固定子82對向的一對X可動子81。又,於X托架140之頂部內面,相對各個X線 性導件17a固定有複數個(例如4個)包含滾動體、以能滑動之方式卡合於Y線性導件17a之滑件17b。 One of the X brackets 140 is fixed to the inner surface of the side wall portion so as to be opposed to the X stator 82 by a predetermined clearance (gearance/gap) and one of the first and second slopes fixed to the X beam 125. A pair of X movable members 81. Also, on the inner surface of the top of the X bracket 140, opposite to each X-ray The sexual guide 17a is fixed with a plurality of (for example, four) sliders 17b including rolling elements that are slidably engaged with the Y linear guides 17a.

另一方(-Y側)之X托架140,與一方之X托架140為左右對稱,具相同構成,亦同樣設有一對X可動子81及複數個滑件17b。 The X bracket 140 on the other side (-Y side) is symmetrical with respect to one of the X brackets 140, and has the same configuration. Similarly, a pair of X movable members 81 and a plurality of sliders 17b are provided.

彼此對向之X固定子82與X可動子81,分別構成電磁力(羅倫茲力)驅動方式之動圈型X線性馬達。X粗動載台123x雖被此等X線性馬達驅動於X軸方向,於此時,被包含X線性導件17a與滑件17b之複數個X線性導引裝置直進引導於X軸方向。 Each of the X stator 82 and the X movable member 81 opposed to each other constitutes a moving coil type X linear motor of an electromagnetic force (Lorentz force) driving method. The X coarse motion stage 123x is driven by the X linear motor in the X-axis direction, and at this time, a plurality of X linear guides including the X linear guide 17a and the slider 17b are guided in the X-axis direction.

本實施形態中,無論在X粗動載台123x之驅動中或停止中,在一方(+Y側)之X樑125即與此卡合之X托架140之間,會在固定於X樑125之第1斜面之X固定子82即與此對向之X可動子81之間產生磁吸力Fb,在固定於X樑125之第2斜面之X固定子82即與此對向之X可動子81之間亦會產生磁吸力Fb。2個磁吸力Fb,其大小相等而方向正對。當然,2個磁吸力Fb,其各個之鉛直分力F3及水平分力F4亦相等。因此,在一方(+Y側)之X樑125與X托架140之間,就整體而言,相對X樑125不會產生X托架140被驅動於Z軸及Y軸方向之力。同樣的,在另一方(-Y側)之X樑125與X托架140之間,就整體而言,亦不會產生X托架140相對X樑125被驅動於Z軸及Y軸方向之力。亦即,可保持安裝在重量抵消裝置50之一對臂部54前端之朝向斜上方之X可動子56(有芯線圈單元(參照圖5))與X固定子82(磁石單元)間之既定間隙(clearance/gap)。 In the present embodiment, the X beam 125 on one (+Y side), that is, the X bracket 140 that is engaged therewith, is fixed to the X beam regardless of whether the X coarse movement stage 123x is being driven or stopped. The X-fixer 82 of the first inclined surface of 125 generates a magnetic attraction force Fb between the opposite X movable member 81, and the X-fixed member 82 fixed to the second inclined surface of the X-beam 125 is movable toward the X opposite thereto. A magnetic attraction force Fb is also generated between the sub-81s. Two magnetic forces Fb, which are equal in size and facing in the right direction. Of course, the two magnetic attraction forces Fb are also equal to each of the vertical component F 3 and the horizontal component F 4 . Therefore, as a whole, between the X beam 125 on one side (+Y side) and the X bracket 140, the force of the X bracket 140 being driven in the Z-axis and Y-axis directions is not generated with respect to the X-beam 125. Similarly, between the X beam 125 on the other side (-Y side) and the X bracket 140, as a whole, the X bracket 140 is not driven relative to the X beam 125 in the Z-axis and the Y-axis direction. force. That is, it is possible to maintain the predetermined relationship between the X movable member 56 (the cored coil unit (refer to FIG. 5)) and the X stator 82 (the magnet unit) which are mounted obliquely upward toward the front end of the arm portion 54 of the weight canceling device 50. Clearance (gap).

如以上之說明,根據本第2實施形態之基板載台裝置PST1,能獲得與第1實施形態之基板載台裝置PST同等的效果。除此之外,根據基 板載台裝置PST1,由於作用在一對X樑125與一對X托架140之間之磁吸力Fb會被抵消,因此可防止對一對X托架140(X滑件17b)施加鉛直向上之力。因此,藉由將一對X樑125之傾角φ(-φ)與和X樑125對向之臂部54之傾角φ任意的設定為既定角度,即能在防止了一對X托架140之浮起之狀態下,任意的設定作用於基墊55及Y步進平台90之鉛直方向向下之力。如此,即能使基墊55進一步小型化、及Y步進平台90之進一步小型化。 As described above, according to the substrate stage device PST1 of the second embodiment, the same effects as those of the substrate stage device PST of the first embodiment can be obtained. In addition to this, according to the base The plate stage device PST1 can prevent the magnetic attraction force Fb acting between the pair of X-beams 125 and the pair of X brackets 140 from being canceled, thereby preventing vertical application of a pair of X brackets 140 (X sliders 17b) Power. Therefore, by setting the inclination angle φ(-φ) of the pair of X-beams 125 to the inclination angle φ of the arm portion 54 opposed to the X-beam 125 to a predetermined angle, it is possible to prevent the pair of X brackets 140 from being prevented. In the floating state, any setting acts on the downward direction of the base pad 55 and the Y stepping platform 90. In this way, the base pad 55 can be further miniaturized, and the Y stepping platform 90 can be further miniaturized.

《第3實施形態》 "Third Embodiment"

其次,針對第3實施形態,根據圖8及圖9加以。此處,與前述第2實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, the third embodiment will be described with reference to Figs. 8 and 9 . Here, the same or equivalent components as those of the above-described second embodiment are denoted by the same or similar reference numerals, and the description thereof will be simplified or omitted.

本第3實施形態之基板載台裝置PST2,整體的構成雖與前述第2實施形態之基板載台裝置PST1相同,但在取代X托架140及重量抵消裝置50設置X托架240及重量抵消裝置250之點等、部分構成與基板載台裝置PST1相異。以下,以相異點為中心進行說明。 The substrate stage device PST2 of the third embodiment has the same overall configuration as the substrate stage device PST1 of the second embodiment, but the X bracket 240 and the weight offset are provided instead of the X bracket 140 and the weight canceling device 50. The configuration of the device 250 or the like is partially different from that of the substrate stage device PST1. Hereinafter, the description will be given focusing on the difference point.

一對X托架240之各個,如圖8所示,具有延設於X軸方向之平板狀頂部63與設在頂部63之長邊方向中間部之一對側壁部64,側視(從+X方向觀察)倒U字狀之形狀(參照圖9)。又,圖8中,一對X托架240被簡化顯示。此外,如圖9所示,一方(+Y側)之X托架240,係以側視(從+X方向觀察)於θx方向相對Y軸傾斜φ之狀態與X樑125之第1、第2及第4斜面對向配置。一方之X托架240,由比較圖2與圖8可知,與前述X托架40、140相較,X軸方向之尺寸小,於X軸方向中央部近旁未形成缺口。 Each of the pair of X brackets 240, as shown in FIG. 8, has a flat top portion 63 extending in the X-axis direction and a pair of side wall portions 64 disposed at the intermediate portion in the longitudinal direction of the top portion 63, side view (from + Observed in the X direction) The shape of the inverted U shape (see Fig. 9). Further, in Fig. 8, a pair of X brackets 240 are shown in a simplified manner. Further, as shown in FIG. 9, one (+Y side) X bracket 240 is in a side view (viewed from the +X direction) in a state where the θx direction is inclined by φ with respect to the Y axis, and the first and the first of the X beam 125. 2 and 4th oblique facing configuration. As can be seen from a comparison between FIG. 2 and FIG. 8, the X bracket 240 of the one side has a smaller dimension in the X-axis direction than the X brackets 40 and 140, and no gap is formed in the vicinity of the center portion in the X-axis direction.

如圖9所示,於一方之X托架240之一對側壁部64內面,分別 固定有透過既定間隙(clearance/gap)與固定在前述X樑125之第1、第2斜面各個之一對X固定子82對向的一對X可動子81。又,於X托架240之頂部63內面,相對各個X線性導件17a固定有複數個(例如4個)包含滾動體、以能滑動之方式卡合於Y線性導件17a之滑件17b。 As shown in FIG. 9, one of the X brackets 240 of one side faces the inner side of the side wall portion 64, respectively A pair of X movable members 81 that are opposed to the X stator 82 by one of the first and second inclined surfaces fixed to the X beam 125 through a predetermined clearance (clearance/gap) are fixed. Further, on the inner surface of the top portion 63 of the X bracket 240, a plurality of (for example, four) sliders 17b including rolling elements and slidably engaged with the Y linear guides 17a are fixed to the respective X linear guides 17a. .

另一方(-Y側)之X托架240與一方之X托架240為左右對稱,具有同樣構成,亦同樣設有一對X可動子81及複數個滑件17b。 The X bracket 240 on the other side (-Y side) is symmetrical with respect to one of the X brackets 240, and has the same configuration. Similarly, a pair of X movable members 81 and a plurality of sliders 17b are provided.

彼此對向之X固定子82與X可動子81,分別構成電磁力(羅倫茲力)驅動方式之動圈型X線性馬達。X粗動載台223x雖被此等X線性馬達驅動於X軸方向,於此時,被包含X線性導件17a與滑件17b之複數個X線性導引裝置直進引導於X軸方向。 Each of the X stator 82 and the X movable member 81 opposed to each other constitutes a moving coil type X linear motor of an electromagnetic force (Lorentz force) driving method. The X coarse motion stage 223x is driven by the X linear motor in the X-axis direction, and at this time, a plurality of X linear guides including the X linear guide 17a and the slider 17b are guided in the X-axis direction.

回到圖8,重量抵消裝置250,於筐體51之Y軸方向兩側面固定有一對X臂部254。一對X臂部254,分別由延設於X軸方向之棒狀構件構成,其X軸方向長度較X托架240所具有之剖面倒U字狀部之X軸方向長度略長若干。一對X臂部254之各個,於Y軸方向外側面之X軸方向中央位置,透過撓曲裝置45連接於X托架240之側壁部64。撓曲裝置45之高度與重量抵消裝置250之Z軸方向重心位置大致一致。一對X臂部254之各個,其長邊方向兩端部連結於一對Y臂部255。一對Y臂部255之各個,由延設於Y軸方向之棒狀構件構成,Y軸方向長度與一對X托架240彼此間之間隔大致同長。此外,一對Y臂部255之各個,於X軸方向外側面之Y軸方向中央位置,透過撓曲裝置45連接於連結板41。於一對Y臂部255之長邊方向兩端面,固定有透過既定間隙(clearance/gap)與一對X樑125分別具有之一對X固定子82中、配置在Y軸方向內側之X固定子82對向之X可動子56。各X可動子56,包含未圖示之有 芯線圈單元,與對向之X固定子82(磁石單元)一起構成將重量抵消裝置250驅動於X軸方向之動圈型線性馬達。 Referring back to Fig. 8, the weight canceling device 250 has a pair of X arm portions 254 fixed to both side surfaces of the casing 51 in the Y-axis direction. Each of the pair of X-arm portions 254 is formed of a rod-shaped member extending in the X-axis direction, and the length in the X-axis direction is slightly longer than the length in the X-axis direction of the inverted U-shaped portion of the X bracket 240. Each of the pair of X arm portions 254 is connected to the side wall portion 64 of the X bracket 240 through the flexure means 45 at a central position in the X-axis direction of the outer surface in the Y-axis direction. The height of the flexure device 45 substantially coincides with the position of the center of gravity of the weight canceling device 250 in the Z-axis direction. Each of the pair of X arm portions 254 is coupled to the pair of Y arm portions 255 at both end portions in the longitudinal direction. Each of the pair of Y arm portions 255 is formed of a rod-shaped member extending in the Y-axis direction, and the length in the Y-axis direction and the interval between the pair of X brackets 240 are substantially the same length. Further, each of the pair of Y arm portions 255 is connected to the coupling plate 41 through the bending device 45 at a central position in the Y-axis direction of the outer surface in the X-axis direction. In the longitudinal direction end faces of the pair of Y arm portions 255, a fixed gap (clearance/gap) and a pair of X beams 125 are respectively fixed, and each of the X stators 82 is disposed in the Y-axis direction. Sub 82 is opposite to X mover 56. Each X mover 56 includes a not shown The core coil unit constitutes a moving coil type linear motor that drives the weight canceling device 250 in the X-axis direction together with the opposing X stator 82 (magnet unit).

如以上之說明,根據本第3實施形態之基板載台裝置PST2,能獲得與第2實施形態之基板載台裝置PST1同等的效果。除此之外,根據基板載台裝置PST2,由於在一對Y臂部255兩端會作用磁吸力,因此能加大作用於重量抵消裝置250之鉛直方向向上之力。又,重量抵消裝置250,由於係在磁吸力作用之Y臂部255之長邊方向中央近旁之2處,被X臂部254支承(固定),因此能防止磁吸力作用於Y臂部255兩端時之Y臂部255之撓曲,恆使重量抵消裝置250產生一定之磁吸力。 As described above, according to the substrate stage device PST2 of the third embodiment, the same effects as those of the substrate stage device PST1 of the second embodiment can be obtained. In addition, according to the substrate stage device PST2, since the magnetic attraction force acts on both ends of the pair of Y arm portions 255, the force acting on the vertical direction of the weight canceling device 250 can be increased. Further, since the weight canceling device 250 is supported (fixed) by the X arm portion 254 at two places near the center in the longitudinal direction of the Y arm portion 255 by the magnetic attraction force, it is possible to prevent the magnetic attraction force from acting on the Y arm portion 255. The deflection of the Y-arm 255 at the end causes the weight canceling device 250 to generate a certain magnetic attraction.

《第4實施形態》 "Fourth Embodiment"

其次,針對第4實施形態,根據圖10~圖12加以說明。此處,與前述第1實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, the fourth embodiment will be described with reference to Figs. 10 to 12 . Here, the same or equivalent components as those of the above-described first embodiment are denoted by the same or similar reference numerals, and the description thereof will be simplified or omitted.

本第4實施形態之基板載台裝置PST3,其整體構成雖與前述基板載台裝置PST相同,但在X樑325、X托架340及重量抵消裝置350之形狀與前述X樑25、X托架40及重量抵消裝置50部分不同之點等,與基板載台裝置PST相異。以下,以相異點為中心進行說明。 The substrate stage device PST3 of the fourth embodiment has the same overall configuration as the substrate stage device PST, but the X beam 325, the X bracket 340, and the weight canceling device 350 have the same shape as the X beam 25 and the X bracket. The difference between the frame 40 and the weight canceling device 50 is different from that of the substrate stage device PST. Hereinafter, the description will be given focusing on the difference point.

如圖10及圖11所示,一對X樑325由延設於X軸方向之棒狀構件構成。一對X樑325之各個,其YZ剖面形狀與X樑25不同。亦即,一對X樑325之各個,係YZ剖面之外形為矩形,具有被設在Y軸方向中央之延伸於X軸方向、與XZ平面平行之肋部區分為2部分之中空部的中空構件。一對X樑325之各個,於Y軸方向兩側面固定有延伸於X軸方向之X固定子82,於上面 固定有複數條(例如2條)於Y軸方向以既定間隔延伸於X軸方向的X線性導件17a。 As shown in FIGS. 10 and 11, the pair of X-beams 325 are formed of a rod-shaped member extending in the X-axis direction. Each of the pair of X-beams 325 has a different YZ cross-sectional shape than the X-beam 25. That is, each of the pair of X-beams 325 has a rectangular shape outside the YZ cross section, and has a hollow portion which is divided into two parts in the center of the Y-axis direction and extends in the X-axis direction and has a rib portion parallel to the XZ plane. member. Each of the pair of X beams 325 has an X stator 82 extending in the X-axis direction on both sides in the Y-axis direction. A plurality of (for example, two) X linear guides 17a extending in the X-axis direction at a predetermined interval in the Y-axis direction are fixed.

一對X托架340之各個,如圖11所示,具有延設於X軸方向之平板構件65、與在平板構件65條長邊方向中間部之Y軸方向兩側面以各個之上端面與平板構件65之上面大致同面高之狀態固定之與一對Z軸平行的側壁構件66。亦即,一對X托架340,分別具有X軸方向中央部於YZ剖面為剖面倒U字形之形狀,配置成跨在一對X樑325之各個(參照圖10)。 As shown in FIG. 11, each of the pair of X brackets 340 has a flat plate member 65 extending in the X-axis direction and two side faces in the Y-axis direction at the intermediate portion in the longitudinal direction of the plate member 65. The side wall member 66 parallel to the pair of Z-axis is fixed to the upper surface of the plate member 65 substantially in the same plane. In other words, each of the pair of X brackets 340 has a shape in which the central portion in the X-axis direction has a U-shaped cross section in the YZ cross section, and is disposed so as to straddle each of the pair of X beams 325 (see FIG. 10).

一方(+Y側)之X托架340,如圖10所示,於平板構件65之下面(頂面)相對各X線性導件17a固定有複數個(例如4個)以可滑動之方式卡合於X線性導件17a之滑件17b,此外,於一對側壁構件66各個之內面,分別固定有透過既定間隙(clearance/gap)與一對X固定子82之各個對向之X可動子81。另一方(-Y側)之X托架340,係與一方之X托架340同樣構成。 The X bracket 340 of one side (+Y side), as shown in FIG. 10, is fixed to a plurality of (for example, four) slidable cards with respect to the respective X linear guides 17a on the lower surface (top surface) of the plate member 65. The sliding member 17b of the X linear guide 17a is coupled to the inner surface of each of the pair of side wall members 66, and is fixed to each of the opposing sides (clearance/gap) and the pair of X stators 82. Sub 81. The X bracket 340 of the other side (-Y side) is configured similarly to one of the X brackets 340.

一對X托架340,如圖11所示,透過將分別具有之一對側壁構件66中、配置在Y軸方向內側之側壁構件66彼此連結之連結板341連結。連結板341,由俯視下中央形成有圓形開口部342之平板構件構成,於X軸方向具有既定長度(例如,與側壁構件66大致相同長度)。連結板341之下面,於開口部342周圍之複數處(例如90度間隔之4處)固定有永久磁石343(參照圖10)。永久磁石343,其材料無特別限定,係使用例如鐵磁體磁石(Ferrite magnet)、釹磁石(Neodymium magnet)及鋁鎳鈷磁石等形成。 As shown in FIG. 11, the pair of X brackets 340 are connected to each other by a connecting plate 341 having a pair of side wall members 66 disposed on the inner side in the Y-axis direction. The connecting plate 341 is formed of a flat plate member having a circular opening portion 342 formed in the center in plan view, and has a predetermined length in the X-axis direction (for example, substantially the same length as the side wall member 66). On the lower surface of the connecting plate 341, a permanent magnet 343 (see FIG. 10) is fixed at a plurality of places around the opening 342 (for example, four at intervals of 90 degrees). The material of the permanent magnet 343 is not particularly limited, and is formed using, for example, a ferrite magnet, a neodymium magnet, and an alnico magnet.

回到圖10,重量抵消裝置350係從下方插入開口部342內、透過基墊55被支承在Y步進平台90上。重量抵消裝置350,在筐體351之形狀及撓曲裝置45之連接位置等,與前述重量抵消裝置50不同。 Referring back to FIG. 10, the weight canceling device 350 is inserted into the opening 342 from below and supported by the Y stepping platform 90 through the base pad 55. The weight canceling device 350 is different from the weight canceling device 50 in the shape of the casing 351 and the connection position of the bending device 45.

筐體351由上面開口之有底圓筒狀構件構成。筐體351,於底面周圍具有圓環狀鍔部352。鍔部352,於外周緣部之上面以和固定於連結板341之永久磁石343對向之方式,磁性體353以既定間隔(既定角度間隔)配置。重量抵消裝置350,在透過基墊55以非接觸狀態搭載於Y步進平台90上時,係配置成永久磁石343與磁性體353透過既定間隙(clearance/gap)對向。磁性體353由具有一定厚度之塊狀構件構成,材料雖無特別限定,係使用例如氧化鐵、氧化鉻、鈷或鐵氧體等形成。 The casing 351 is composed of a bottomed cylindrical member having an open top. The casing 351 has an annular crotch portion 352 around the bottom surface. The crotch portion 352 is disposed on the upper surface of the outer peripheral portion so as to face the permanent magnet 343 fixed to the coupling plate 341 at a predetermined interval (a predetermined angular interval). When the transmission base pad 55 is mounted on the Y stepping stage 90 in a non-contact state, the weight canceling device 350 is disposed such that the permanent magnet 343 and the magnetic body 353 are opposed to each other by a predetermined clearance (gaceance/gap). The magnetic body 353 is composed of a block member having a certain thickness, and the material is not particularly limited, and is formed using, for example, iron oxide, chromium oxide, cobalt, or ferrite.

撓曲裝置45,其一端以既定間隔(既定角度間隔)在筐體351之外周面固定複數個(例如4個),另一端則固定在形成於連結板341之開口部內周面(參照圖11)。 The flexure device 45 has a plurality of ends (for example, four) fixed to the outer peripheral surface of the casing 351 at a predetermined interval (a predetermined angular interval), and the other end is fixed to the inner peripheral surface of the opening formed in the connecting plate 341 (refer to FIG. 11). ).

作為固定在連結板341下面複數處之永久磁石343,可分別使用單一之永久磁石,但不限於此,亦可組合複數個磁石加以使用。 As the permanent magnet 343 fixed to a plurality of places below the connecting plate 341, a single permanent magnet may be used, but it is not limited thereto, and a plurality of magnets may be combined and used.

舉一例而言,可如圖12(A)所示,在埋於連結板341下面之磁軛344之下面,將極性相異之一對永久磁石343a、343b相距既定間隔加以固定,據以構成一個永久磁石343。圖12(A)之例中,配置在-Y側之永久磁石343a,其+Z側面為S極、-Z側面為N極,另一方面,配置在+Y側之永久磁石343b,其+Z側面為N極、-Z側面為S極。在一對永久磁石343a、343b與磁性體353之間,產生磁吸力Fc。又,如圖12(B)所示,亦可取代磁性體353將永久磁石345配置成與永久磁石343對向。此時,永久磁石345係配置成其與永久磁石343a對向之一側為S極、與永久磁石343b對向之另一側為N極。 For example, as shown in FIG. 12(A), one of the permanent magnets 343a and 343b having a different polarity may be fixed at a predetermined interval below the yoke 344 buried under the connecting plate 341, thereby constituting A permanent magnet 343. In the example of Fig. 12(A), the permanent magnet 343a disposed on the -Y side has an S-side on the +Z side and an N-pole on the -Z side, and a permanent magnet 343b on the +Y side on the other hand. The Z side is the N pole and the -Z side is the S pole. A magnetic attraction force Fc is generated between the pair of permanent magnets 343a and 343b and the magnetic body 353. Further, as shown in FIG. 12(B), the permanent magnet 345 may be disposed to face the permanent magnet 343 instead of the magnetic body 353. At this time, the permanent magnet 345 is disposed such that its one side opposite to the permanent magnet 343a is the S pole and the other side opposite to the permanent magnet 343b is the N pole.

如以上之說明,根據本第4實施形態之基板載台裝置PST3,能獲得與第1實施形態之基板載台裝置PST同等之效果。除此之外,根據基 板載台裝置PST3,由於不會產生使X托架340浮起之力,因此能防止X托架340之浮起。據此,於基板載台裝置PST3,即能將永久磁石343與磁性體353之間產生之磁吸力Fc調整為任意大小,其結果,能自如地減輕施加至Y步進平台90及防振裝置34之載重。 As described above, according to the substrate stage device PST3 of the fourth embodiment, the same effects as those of the substrate stage device PST of the first embodiment can be obtained. In addition to this, according to the base Since the plate stage device PST3 does not generate a force for floating the X bracket 340, the floating of the X bracket 340 can be prevented. According to this, in the substrate stage device PST3, the magnetic attraction force Fc generated between the permanent magnet 343 and the magnetic body 353 can be adjusted to an arbitrary size, and as a result, the Y stepping platform 90 and the vibration isolating device can be freely reduced. 34 load.

《第4實施形態之第1變形例》 "First Modification of Fourth Embodiment"

其次,針對第4實施形態之第1變形例,根據圖13加以說明。此處,與前述第4實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, a first modification of the fourth embodiment will be described with reference to Fig. 13 . Here, the same or equivalent components as those of the above-described fourth embodiment are denoted by the same or similar reference numerals, and the description thereof will be simplified or omitted.

此變形例之基板載台裝置PST3a,在將基板載台裝置PST3中重量抵消裝置350所具有之鍔部352與連結板341之位置加以互換之點、隨此以撓曲裝置45將鍔部352與X托架340加以連結之點、以及將作用於Y步進平台90之微動載台30等之重量的一部分以永久磁石343與永久磁石346間之磁反作用力Fd加以減輕之點,與前述基板載台裝置PST3相異。 In the substrate stage device PST3a of this modification, the position of the flange portion 352 of the weight canceling device 350 in the substrate stage device PST3 is interchanged with the position of the connecting plate 341, and the bending portion 45 is used to bend the flange portion 352. The point at which the X bracket 340 is coupled and the portion of the weight of the fine movement stage 30 acting on the Y stepping platform 90 are alleviated by the magnetic reaction force Fd between the permanent magnet 343 and the permanent magnet 346, The substrate stage device PST3 is different.

如圖13所示,此變形例之重量抵消裝置350a,於筐體351a之Z軸方向中間之位置,具體而言,在與重量抵消裝置350a之重心位置大致一致之高度位置設有鍔部352。於鍔部352下面之外周緣部固定有永久磁石343。此外,於鍔部352之外周面,以既定間隔(既定角度間隔)連接有複數個(例如4個)撓曲裝置45之一端。撓曲裝置45之另一端,連接在X托架340之側壁構件66中、配置在Y軸方向內側之側壁構件66。 As shown in Fig. 13, the weight canceling device 350a of this modification is provided at a position intermediate the Z-axis direction of the casing 351a, specifically, at a height position substantially coincident with the position of the center of gravity of the weight canceling device 350a. . A permanent magnet 343 is fixed to the outer peripheral portion of the lower portion of the crotch portion 352. Further, on the outer peripheral surface of the crotch portion 352, one end of a plurality of (for example, four) flexure means 45 is connected at a predetermined interval (a predetermined angular interval). The other end of the bending device 45 is connected to the side wall member 66 of the X bracket 340 and disposed on the inner side in the Y-axis direction.

連結一對X托架340之連結板341,固定在一對X托架340各個之側壁構件66中、配置在Y軸方向內側之側壁構件66之下端部。又,於連結板341上面之開口部周圍,在與各永久磁石343對向之位置,分別固定有對永 久磁石343產生反作用磁力之永久磁石346。 The connecting plate 341 that connects the pair of X brackets 340 is fixed to the lower end portions of the side wall members 66 on the inner side in the Y-axis direction in the side wall members 66 of the pair of X brackets 340. Further, around the opening portion on the upper surface of the connecting plate 341, the position opposite to each of the permanent magnets 343 is fixed to the permanent The long magnet 343 produces a permanent magnet 346 that reacts to the magnetic force.

如以上之說明,根據本第1變形例之基板載台裝置PST3a,除能獲得與第4實施形態之基板載台裝置PST3同等之效果愛,由於將固定有永久磁石343之鍔部352固定在重量抵消裝置350a之Z軸方向中間位置近旁,將固定有永久磁石346之連結板341固定在X托架340之下端部,因此X樑325之Z位置係配置在較重量抵消裝置350a之Z位置若干下方處。據此,基板載台裝置PST3a,可提升往掃描方向及掃描交叉方向之可動時的安定性。 As described above, the substrate stage device PST3a according to the first modification can obtain the same effect as the substrate stage device PST3 of the fourth embodiment, and the crotch portion 352 to which the permanent magnet 343 is fixed is fixed. In the vicinity of the intermediate position in the Z-axis direction of the weight canceling device 350a, the connecting plate 341 to which the permanent magnet 346 is fixed is fixed to the lower end portion of the X bracket 340, so that the Z position of the X beam 325 is disposed at the Z position of the weight canceling device 350a. A few below. According to this, the substrate stage device PST3a can improve the stability when moving in the scanning direction and the scanning intersecting direction.

《第4實施形態之第2變形例》 <<Second Modification of Fourth Embodiment>>

其次,針對第4實施形態之第2變形例,根據圖14加以說明。此處,與前述第4實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, a second modification of the fourth embodiment will be described with reference to Fig. 14 . Here, the same or equivalent components as those of the above-described fourth embodiment are denoted by the same or similar reference numerals, and the description thereof will be simplified or omitted.

此變形例之基板載台裝置PST3b中,X樑325b之形狀及X托架340b之形狀,與前述基板載台裝置PST3之X樑325之形狀及X托架340之形狀不同。 In the substrate stage device PST3b of this modification, the shape of the X beam 325b and the shape of the X bracket 340b are different from the shape of the X beam 325 of the substrate stage device PST3 and the shape of the X bracket 340.

一對X樑325b,分別由延伸於X軸方向之棒狀構件構成,YZ剖面之形狀細上邊較底邊常若干之倒立的大致等腰梯形。亦即,一對X樑,分別具有與XY平面平行之上面及下面、與相對XZ平面於θx方向以既定角θ、-θ傾斜之一對斜面(Y軸方向兩側面)。X線性導件17a及X固定子82,與X樑325同樣的,分別固定在X樑325b之上面及一對斜面(Y軸方向兩側面)。 Each of the pair of X-beams 325b is formed of a rod-shaped member extending in the X-axis direction, and the shape of the YZ cross section is a substantially isosceles trapezoid having an inverted upper side and a lower side. That is, a pair of X-beams have an upper surface and a lower surface parallel to the XY plane, and a pair of inclined surfaces (both sides in the Y-axis direction) inclined at a predetermined angle θ and -θ in the θx direction with respect to the XZ plane. Similarly to the X beam 325, the X linear guide 17a and the X stator 82 are fixed to the upper surface of the X beam 325b and a pair of inclined surfaces (both sides in the Y-axis direction).

一對X托架340b,各自所具有之一對側壁構件68之形狀與X托架340所具有之一對側壁構件66相異。亦即,彼此成對之+Y側與-Y側之 側壁構件68,分別具有從上端(+Z側端)至中央部附近與XZ平面平行的第1部分,與從中央部附近至下端(-Z側端)傾斜於-Y側或+Y側而與上述X樑325b之2個斜面對向的第2部分。於一對X托架340b之頂面(平板構件65之下面),固定有以可滑動之方式卡合於X線性導件17a之滑件17b,此外,於側壁構件68內壁面之第2部分,固定有透過既定間隙(clearance/gap)與X固定子82對向、產生磁吸力Fe之X可動子81。在一方之X樑325b與X托架340b之間作用之磁吸力Fe,水平方向之分力被抵消,同樣的,另一方之X樑325b與X托架340b之間作用之磁吸力Fe,水平方向之分力亦被抵消。亦即,作用於X托架340b之磁吸力Fe,僅對X托架340b施加鉛直方向向上之分力。 A pair of X brackets 340b, each having a shape of one of the pair of side wall members 68, is different from a pair of side wall members 66 of the X bracket 340. That is, the +Y side and the -Y side are paired with each other. The side wall member 68 has a first portion parallel to the XZ plane from the upper end (+Z side end) to the vicinity of the center portion, and is inclined to the -Y side or the +Y side from the vicinity of the center portion to the lower end (-Z side end). The second portion facing the two oblique faces of the X beam 325b. A sliding member 17b slidably engaged with the X linear guide 17a is fixed to a top surface of the pair of X brackets 340b (under the plate member 65), and a second portion of the inner wall surface of the side wall member 68 is fixed. The X movable member 81 which is opposed to the X stator 82 by a predetermined clearance (clearance/gap) and generates a magnetic attraction Fe is fixed. The magnetic attraction force Fe acting between one of the X-beams 325b and the X-bracket 340b is offset by the horizontal force. Similarly, the magnetic attraction force Fe between the other X-beam 325b and the X-bracket 340b is horizontal. The direction of the force is also offset. That is, the magnetic attraction force Fe acting on the X bracket 340b applies only a component in the vertical direction upward to the X bracket 340b.

如以上之說明,根據本變形例之基板載台裝置PST3b,除能獲得與第4實施形態之基板載台裝置PST3同等之效果外,由於施加至X托架340b之鉛直方向向下之力獲得減輕,因此在基板載台裝置PST3b被驅動於X軸方向時,可減輕在X滑件17b與X線性導件17a之間產生之驅動抵抗。此外,由於在產生用以減輕作用於上述X托架340b之鉛直方向向下之力之磁吸力Fe的X可動子81、X固定子82之外,另設置了產生用以減輕作用於基板載台架台33之重量抵消裝置350等重量之一部分之磁吸力Fc的永久磁石343、磁性體353,因此可分別設定為產生既定磁吸力。 As described above, the substrate stage device PST3b according to the present modification can obtain the same effect as the substrate stage device PST3 of the fourth embodiment, and can be obtained by the downward force applied to the X bracket 340b. Since the substrate stage device PST3b is driven in the X-axis direction, the driving resistance generated between the X slider 17b and the X linear guide 17a can be alleviated. Further, since the X movable member 81 and the X fixed member 82 for reducing the magnetic attraction force Fe acting on the downward direction of the X bracket 340b are additionally provided, the generation is made to reduce the effect on the substrate. The weight of the gantry table 33 cancels the permanent magnet 343 and the magnetic body 353 of the magnetic attraction force Fc of one part of the weight of the device 350, and so on, so that it can be set to generate a predetermined magnetic attraction force.

《第5實施形態》 "Fifth Embodiment"

其次,針對第5實施形態,根據圖15及圖16加以說明。此處,與前述第1實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, the fifth embodiment will be described with reference to Figs. 15 and 16 . Here, the same or equivalent components as those of the above-described first embodiment are denoted by the same or similar reference numerals, and the description thereof will be simplified or omitted.

本第5實施形態之基板載台裝置PST4,其整體構成雖與基板 載台裝置PST相同,但X樑325之形狀、X托架440之形狀與前述X樑25之形狀、X托架40之形狀相異,且減輕防振裝置34承受之負荷之方法等、部分構成與基板載台裝置PST相異。以下,以相異點為中心進行說明。 The substrate stage device PST4 of the fifth embodiment has an overall configuration and a substrate The stage device PST is the same, but the shape of the X-beam 325, the shape of the X-bracket 440 is different from the shape of the X-beam 25, the shape of the X-bracket 40, and the method of reducing the load on the vibration-damping device 34, and the like. The configuration is different from the substrate stage device PST. Hereinafter, the description will be given focusing on the difference point.

如圖15及圖16所示,本實施形態之一對X樑325,由與上述第4實施形態司我使用之一對X樑325相同形狀之構件構成,同樣的,複數個X線性導件17a、一對X固定子82固定在上面及一對側面。 As shown in Fig. 15 and Fig. 16, in the first embodiment, the X-beam 325 is composed of a member having the same shape as the X-beam 325, which is used in the fourth embodiment, and a plurality of X-linear guide members. 17a, a pair of X stators 82 are fixed to the upper surface and a pair of sides.

一對X托架440,如圖15及圖16所示,具有以X軸方向為長邊方向之俯視矩形的平板構件59、與各自之上端面與平板構件59之上面大致同面高之狀態固定在平板構件59之長邊方向一端部與另一端部之Y軸方向兩端面之一對、合計4個與Z軸平行的側壁構件58。X托架440,從+X方向觀察,如圖16所示,具有倒U字形狀,於彼此成對之+Y側與-Y側之側壁構件58彼此間插入X樑325。於X托架440之長邊方向(X軸方向)中央部近旁設有缺口部42(參照圖15)。 As shown in FIG. 15 and FIG. 16, the pair of X brackets 440 have a rectangular plate member 59 having a rectangular shape in the longitudinal direction of the X-axis direction, and a state in which the upper end surface and the upper surface of the flat plate member 59 are substantially flush with each other. One side of the one end portion in the longitudinal direction of the plate member 59 and one end surface of the other end portion in the Y-axis direction are fixed, and a total of four side wall members 58 parallel to the Z-axis are provided. The X bracket 440 has an inverted U shape as viewed in the +X direction, and is inserted into the X beam 325 between the +Y side and the -Y side side wall member 58 which are paired with each other. A notch portion 42 is provided near the center portion in the longitudinal direction (X-axis direction) of the X bracket 440 (see FIG. 15).

一對X托架440,分別於頂面(平板構件59之下面)相對各X線性導件17a固定有複數個(例如4個)以能滑動之方式卡合於X線性導件17a之滑件17b,此外,於側壁構件58之內壁面分別固定有透過既定間隙(clearance/gap)與一對X固定子82之各個對向之X可動子81。 A pair of X brackets 440 are respectively fixed to the X-shaped linear guides 17a with a plurality of (for example, four) sliders slidably engaged with the X linear guides 17a on the top surface (below the flat member 59). Further, on the inner wall surface of the side wall member 58, an X movable member 81 that transmits a predetermined gap (clearance/gap) and a pair of X stators 82 is fixed.

前述第1實施形態,係於固定在重量抵消裝置50之一對臂部54之前端分別固定X可動子56,來減輕作用於防振裝置34之重力方向之載重負荷之一部分,但如圖16所示,於本實施形態之重量抵消裝置450並未設置臂部54及X可動子56。亦即,重量抵消裝置450由筐體51、空氣彈簧52、Z滑件53及基墊55等構成。重量抵消裝置450透過連接在筐體51之複數條(例如4 條)撓曲裝置45連接於一對X托架440。各撓曲裝置45被製成與重量抵消裝置450之重心位置大致相同高度。 In the first embodiment, the X movable member 56 is fixed to the front end of the arm portion 54 fixed to one of the weight canceling devices 50, and the load acting on the gravity direction of the vibration isolating device 34 is reduced. As shown in the figure, the weight canceling device 450 of the present embodiment is not provided with the arm portion 54 and the X movable member 56. That is, the weight canceling device 450 is constituted by the casing 51, the air spring 52, the Z slider 53, the base pad 55, and the like. The weight canceling device 450 transmits a plurality of strips connected to the housing 51 (for example, 4) The flexure device 45 is coupled to a pair of X brackets 440. Each of the flexing means 45 is formed at substantially the same height as the center of gravity of the weight canceling means 450.

回到圖15,一對基架414,分別由延伸於Y軸方向之棒狀構件構成。一對基架414,分別包含與XY平面平行的上面及下面、由具有相對YZ平面於θx方向略傾斜之一面(斜面)與和此一面於相反方向(-θx方向)同角度傾斜之另一面(斜面)之中空構件構成的本體部414a、以及從下方支承本體部414a的複數個脚部14b。於各脚部14b之下端部設有複數個調整器14c,而能調整本體部414a之Z位置。 Returning to Fig. 15, a pair of base frames 414 are respectively formed of rod-like members extending in the Y-axis direction. The pair of base frames 414 respectively include an upper surface and a lower surface parallel to the XY plane, and have one side inclined (slanted surface) slightly inclined in the θx direction with respect to the YZ plane and the other side inclined at the same angle in the opposite direction (−θx direction) The body portion 414a of the hollow member (beveled) and the plurality of leg portions 14b supporting the body portion 414a from below. A plurality of adjusters 14c are provided at the lower end portions of the respective leg portions 14b, and the Z position of the body portion 414a can be adjusted.

於本體部414a之X軸方向兩側面(對向之一對斜面),分別固定有作為線性馬達之要素之延設於Y軸方向的Y固定子73。又,於本體部414a之上面,彼此平行的固定有複數條(例如2條)延伸於Y軸方向之機械性Y線性導引裝置(單軸導引裝置)之要素之延設於Y軸方向的Y線性導件16a。 A Y stator 73 extending in the Y-axis direction as an element of the linear motor is fixed to both side surfaces (one pair of inclined surfaces) of the main body portion 414a in the X-axis direction. Further, on the upper surface of the main body portion 414a, a plurality of (for example, two) mechanical Y linear guides (single-axis guide devices) extending in the Y-axis direction are fixed in parallel with each other in the Y-axis direction. Y linear guide 16a.

本體部414a配置(插入)在由XZ剖面倒U字狀之構件構成之Y托架475之一對對向面間(側壁構件間)。Y托架475,相對1個基架414於Y軸方向分離間配置有複數個(例如2個),各Y托架475藉由固定在上面之板片76而彼此連結。Y托架475之一對對向面,具有從各個之上端(+Z側端)至中央部近旁與YZ平面平行的第1部分、與從中央部近旁至下端(-Z側端)傾斜於-X側或+X側而與上述基架414之本體部414a之2個斜面對向的第2部分。Y托架475,係設定為在被搭載於基架414之狀態下,本體部414a之2個傾斜面與和此對向之Y托架475所具有之一對對向面之第2部分平行。於Y托架475之一對對向面之第2部分之各個,分別固定有透過既定間隙(clearance/gap)與一對Y固定子73之各個對向之一對Y可動子472。各Y可動子472,包含未圖示之有 芯線圈單元,與對向之Y固定子73一起構成將X樑325於Y軸方向以既定行程加以驅動之Y線性馬達。又,在各Y可動子472與對向之Y固定子73之間會產生磁吸力Ff。此外,於Y托架475之頂面,相對各Y托架475固定有複數個(例如2個)以可滑動之方式卡合於Y線性導件16a之滑件16b。 The main body portion 414a is disposed (inserted) between one of the opposing faces (between the side wall members) of the Y bracket 475 formed of a member having an inverted U-shape in the XZ cross section. In the Y bracket 475, a plurality (for example, two) are disposed between the one base frame 414 in the Y-axis direction, and the Y brackets 475 are coupled to each other by the plate 76 fixed to the upper surface. One pair of opposite faces of the Y bracket 475 has a first portion parallel to the YZ plane from the respective upper ends (+Z side ends) to the vicinity of the center portion, and is inclined from the vicinity of the center portion to the lower end (-Z side end) a second portion facing the two sides of the body portion 414a of the base frame 414 on the -X side or the +X side. The Y bracket 475 is set such that the two inclined surfaces of the main body portion 414a are parallel to the second portion of the opposite pair of Y brackets 475 which are opposite to each other in the state of being mounted on the base frame 414. . A pair of Y movable members 472 that are transparent to a predetermined gap (clearance/gap) and a pair of Y stators 73 are fixed to the second portion of the pair of Y brackets 475. Each Y mover 472 includes a not shown The core coil unit, together with the opposing Y stator 73, constitutes a Y linear motor that drives the X beam 325 in a Y-axis direction with a predetermined stroke. Further, a magnetic attraction force Ff is generated between each of the Y movable members 472 and the opposing Y stator 73. Further, on the top surface of the Y bracket 475, a plurality of (for example, two) sliders 16b slidably engaged with the Y linear guide 16a are fixed to the Y brackets 475.

Y步進平台490,由延伸於X軸方向之棒狀構件構成,搭載在基板載台架台33上。於Y步進平台490之長邊方向兩端,透過固定構件446固定有透過既定間隙(clearance/gap)與Y固定子73對向之Y可動子94。各Y可動子94,包含未圖示之有芯線圈單元,與對向之Y固定子73一起構成將Y步進平台490於X軸方向以既定行程加以驅動之X線性馬達。又,在各Y可動子94與對向之Y固定子73之間會產生磁吸力Fg。 The Y stepping stage 490 is composed of a rod-shaped member extending in the X-axis direction, and is mounted on the substrate stage stand 33. At both ends in the longitudinal direction of the Y stepping stage 490, a Y movable member 94 that is opposed to the Y stator 73 through a predetermined clearance (gearance/gap) is fixed through the fixing member 446. Each of the Y movable members 94 includes a core coil unit (not shown), and constitutes an X linear motor that drives the Y stepping stage 490 in a predetermined stroke in the X-axis direction together with the opposing Y stator 73. Further, a magnetic attraction force Fg is generated between each of the Y movable members 94 and the opposing Y stator 73.

在固定於Y步進平台490之+X側固定構件446之Y可動子94與和此對向之Y固定子73之間,於+X方向且+Z方向作用磁吸力Fg,在固定於Y步進平台490之-X側固定構件446之Y可動子94與和此對向之Y固定子73之間,於-X方向且+Z方向作用磁吸力Fg。此場合,由於該2個磁吸力Fg之水平方向分力彼此大小相等而方向相反(正對),因此彼此抵銷。亦即,上述2個磁吸力Fg,對Y步進平台490施加鉛直方向向上之力,其反力則透過基架414傳至地面11。 The magnetic attraction force Fg is applied in the +X direction and the +Z direction between the Y movable member 94 fixed to the +X side fixing member 446 of the Y stepping stage 490 and the Y fixed holder 73 opposed thereto, and is fixed to Y in the +X direction and the +Z direction. The magnetic attraction force Fg acts in the -X direction and the +Z direction between the Y movable member 94 of the -X side fixing member 446 of the stepping stage 490 and the Y stator 73 opposed thereto. In this case, since the horizontal force components of the two magnetic attraction forces Fg are equal in magnitude and opposite in direction (positive), they cancel each other. That is, the above two magnetic attraction forces Fg apply a vertical upward force to the Y stepping stage 490, and the reaction force is transmitted to the ground 11 through the base frame 414.

如以上之說明,本第5實施形態之基板載台裝置PST4,能獲得與第1實施形態之基板載台裝置PST同等之效果。此外,於基板載台裝置PST4,由於防振裝置34承受之負荷受到減輕,因此能降低基板載台裝置PST4驅動時作用於防振裝置34之偏載重。 As described above, the substrate stage device PST4 of the fifth embodiment can obtain the same effect as the substrate stage device PST of the first embodiment. Further, in the substrate stage device PST4, since the load applied to the vibration isolating device 34 is reduced, the eccentric load acting on the vibration isolating device 34 when the substrate stage device PST4 is driven can be reduced.

《第5實施形態之變形例》 "Modification of the fifth embodiment"

其次,針對第5實施形態之變形例,根據圖17加以說明。此處,與前述第5實施形態相同或同等之構成部分,係使用相同或類似符號並簡化或省略其說明。 Next, a modification of the fifth embodiment will be described with reference to Fig. 17 . Here, the same or equivalent components as those in the fifth embodiment are denoted by the same or similar reference numerals, and the description thereof will be simplified or omitted.

此變形例之基板載台裝置PST4a,在設於Y步進平台490a之長邊方向兩端部之固定構件446未設置Y可動子94之點、以及固定構件446之上面固定有磁性體96,於磁性體96之上方透過既定間隙(clearance/gap)於X托架475a設有永久磁石97之點,與基板載台裝置PST4不同。 In the substrate stage device PST4a of the modification, the magnetic member 96 is fixed to the fixing member 446 provided at both end portions in the longitudinal direction of the Y stepping stage 490a, and the magnetic member 96 is fixed to the upper surface of the fixing member 446. Above the magnetic body 96, a predetermined clearance (gearance/gap) is applied to the X bracket 475a at a point where the permanent magnet 97 is provided, which is different from the substrate stage device PST4.

永久磁石97,實際上係固定在固定構件478下面。於Y步進平台490a之+X側,固定構件478係以將於Y軸方向以既定間隔配置之複數個(例如2個)Y托架475a彼此連結之方式,固定在各個Y托架475a-X側側面之上端部。永久磁石97以透過既定間隙和磁性體96對向之方式固定在固定構件478之下面。亦即,於本變形例之Y步進平台490a,會被施加與固定在基架414之本體部414a之Y固定子73與固定在Y托架475a之Y可動子472之間產生之磁吸力Ff不同之獨立的在磁性體96與永久磁石97之間產生之磁吸力Fh形成之鉛直方向向上之力。又,Y托架475a之其他部分,具有與上述Y托架475相同之構成。 The permanent magnet 97 is actually fixed under the fixing member 478. On the +X side of the Y stepping stage 490a, the fixing member 478 is fixed to each Y bracket 475a in such a manner that a plurality of (for example, two) Y brackets 475a arranged at predetermined intervals in the Y-axis direction are coupled to each other. The upper end of the X side. The permanent magnet 97 is fixed under the fixing member 478 in such a manner as to pass through the predetermined gap and the magnetic body 96. That is, in the Y stepping stage 490a of the present modification, the magnetic attraction generated between the Y stator 73 fixed to the body portion 414a of the base frame 414 and the Y movable member 472 fixed to the Y bracket 475a is applied. The Ff is independently independent of the force generated by the magnetic attraction force Fh generated between the magnetic body 96 and the permanent magnet 97 in the vertical direction. Further, the other portion of the Y bracket 475a has the same configuration as the above-described Y bracket 475.

如以上之說明,本第5實施形態之變形例之基板載台裝置PST4a,可獲得與第5實施形態同等之效果。除此之外,根據基板載台裝置PST4a,由於作用於Y步進平台490a之鉛直向上之磁吸力Fh、與作用於Y托架475a之磁吸力Ff係由獨立之磁氣產生裝置產生,因此可將作用於Y步進平台490a之磁吸力Fh與作用於Y托架475a之磁吸力Ff,分別設定為既定之力。亦即,可將作用於防振裝置34之載重負荷(偏載重)、以及包含Y線性導件16a與 滑件16b之複數個Y線性導引裝置所承受之驅動抵抗減至既定值。 As described above, the substrate stage device PST4a according to the modification of the fifth embodiment can obtain the same effects as those of the fifth embodiment. In addition, according to the substrate stage device PST4a, since the magnetic attraction force Fh acting in the vertical direction of the Y stepping stage 490a and the magnetic attraction force Ff acting on the Y bracket 475a are generated by the independent magnetic gas generating means, The magnetic attraction force Fh acting on the Y stepping stage 490a and the magnetic attraction force Ff acting on the Y bracket 475a can be set to a predetermined force, respectively. That is, the load (the partial load) acting on the vibration isolating device 34, and the Y linear guide 16a and The driving resistance of the plurality of Y linear guides of the slider 16b is reduced to a predetermined value.

又,上述第1~第5各實施形態及各變形例(以下,稱各實施形態等)所說明之裝置構成僅為一例,當然可有各種變形。例如,上述各實施形態等中,雖係針對利用磁吸力或磁性斥力以減輕作用於Y步進平台90、490、490a及支承此之基板載台架台33及防振裝置34之重力方向之載重負荷的情形做了說明,但不限於此,在具有鉛直方向分力之方向之電磁力,是由X粗動載台驅動用之線性馬達、或Y粗動載台驅動用之線性馬達產生之情形時,可將利用該電磁力之鉛直分力,以減輕作用於Y步進平台90、490、490a及支承此之基板載台架台33及防振裝置34之重力方向載重負荷的負荷減輕裝置,裝備於基板載台裝置PST、PST1、PST2、PST3、PST3a、PST3b、PST4、PST4a。 Further, the device configurations described in the first to fifth embodiments and the modifications (hereinafter, referred to as the respective embodiments) are merely examples, and various modifications are of course possible. For example, in the above-described embodiments and the like, the magnetic load or the magnetic repulsion is used to reduce the load acting on the Y stepping platforms 90, 490, and 490a and the gravity of the substrate stage 33 and the vibration isolating device 34. The case of the load is described, but it is not limited thereto, and the electromagnetic force in the direction of the vertical direction component is generated by the linear motor for driving the X coarse motion stage or the linear motor for driving the Y coarse motion stage. In this case, the direct force component of the lead using the electromagnetic force can be used to reduce the load mitigation device acting on the Y stepping platforms 90, 490, and 490a and the gravity-loading load supporting the substrate stage platform 33 and the vibration-proof device 34. It is equipped in the substrate stage devices PST, PST1, PST2, PST3, PST3a, PST3b, PST4, and PST4a.

又,亦可取代上述各實施形態等中之固定子(磁石單元)與可動子(有芯線圈單元)之組合,而藉由固定子(磁石單元)與磁性體構件之組合來構成上述負荷減輕裝置。或者,亦可取代構成負荷減輕裝置之至少一部分之永久磁石而使用電磁石。 Further, in place of the combination of the stator (magnet unit) and the movable member (core coil unit) in each of the above embodiments, the load reduction can be configured by a combination of a stator (magnet unit) and a magnetic member. Device. Alternatively, the electromagnet may be used instead of the permanent magnet constituting at least a part of the load mitigation device.

又,上述各實施形態,雖係針對具備在Y步進平台90、490、490a上移動之重量抵消裝置50、250、350、350a,450的基板載台裝置PST、PST1、PST2、PST3、PST3a、PST3b、PST4、PST4a做了說明,但不限於此,亦可例如美國專利申請公開第2010/0018950號說明書等所揭示,在具備裝有重量抵消裝置之基板載台裝置的掃描型曝光裝置中,設置包含設於Y粗動載台之固定子(磁石)與設於X粗動載台之可動子(線圈)以將X粗動載台於X軸方向(掃描方向)以既定行程驅動的X線性馬達、與利用作用在構成上 述可動子之線圈與重量抵消裝置之一部分之間之力以抵消作用於包含從下方支承重量抵消裝置之平台之支承架台之重力方向載重負荷的載重減輕裝置。此場合,於基板(物體)之曝光處理時,可與保持基板之基板保持具(物體保持構件)一起往與水平面平行之方向移動之X粗動載台,係被線性馬達驅動於X軸方向。此時,於支承架台雖會作用基板保持具及重量抵消裝置本身重量形成之重力方向載重負荷,但該載重負荷可藉由載重減輕裝置利用作用在與重量抵消裝置一部分之間之力,從重量抵消裝置將一部分之力移至X粗動載台來加以減輕。因此,能減輕包含基板保持具、重量抵消裝置及支承架台之系之重心移動而形成之作用於支承架台之偏載重,據以維持充分之曝光精度。 Further, in each of the above embodiments, the substrate stage devices PST, PST1, PST2, PST3, and PST3a including the weight canceling devices 50, 250, 350, 350a, and 450 that move on the Y stepping platforms 90, 490, and 490a are provided. And PST3b, PST4, and PST4a are described, but are not limited thereto, and may be disclosed in a scanning type exposure apparatus including a substrate stage device equipped with a weight canceling device, as disclosed in, for example, the specification of the US Patent Application Publication No. 2010/0018950. a stator (magnet) provided on the Y coarse movement stage and a movable element (coil) provided on the X coarse movement stage are provided to drive the X coarse movement stage in the X-axis direction (scanning direction) by a predetermined stroke. X linear motor, and the use of the role in the composition The force between the coil of the movable member and a portion of the weight canceling device cancels the load reducing device acting on the gravity direction load of the support frame including the platform supporting the weight canceling device from below. In this case, during the exposure processing of the substrate (object), the X coarse movement stage that can move in the direction parallel to the horizontal plane together with the substrate holder (object holding member) holding the substrate is driven by the linear motor in the X-axis direction. . At this time, although the support frame acts on the weight direction load formed by the weight of the substrate holder and the weight canceling device itself, the load can be utilized by the load reducing device to exert a force between a part of the weight canceling device and the weight. The counteracting device reduces the force by moving a portion of the force to the X coarse motion stage. Therefore, it is possible to reduce the eccentric load acting on the support gantry formed by the movement of the center of gravity including the substrate holder, the weight canceling device, and the support stand, thereby maintaining sufficient exposure accuracy.

又,亦可將上述第1~第4實施形態之變形例與上述第5實施形態及其變形例加以組合使用。亦即,可併用對重量抵消裝置50、250、350、350a、450產生鉛直方向向上之力的裝置、與對Y步進平台90、490、490a產生鉛直方向向上之力的裝置。 Further, the modifications of the first to fourth embodiments described above may be used in combination with the fifth embodiment and its modifications. That is, a means for generating a force in the vertical direction upward for the weight canceling devices 50, 250, 350, 350a, 450, and a device for generating a vertical upward force to the Y stepping platforms 90, 490, 490a may be used in combination.

又,上述各實施形態中,一對X托架40、140、240、340、340b、440雖係以連結板41、341加以連結,但亦可取代連結板41、341而將一對X托架以主控制裝置同步驅動於X軸方向。同樣的,1個基架14、414上搭載之複數個Y托架75、475、475a雖係以板片76分別加以連結,但亦可取代板片76而將複數個Y托架75、475、475a以主控制裝置同步驅動於Y軸方向。 Further, in each of the above embodiments, the pair of X brackets 40, 140, 240, 340, 340b, and 440 are coupled by the connecting plates 41 and 341, but a pair of X brackets may be used instead of the connecting plates 41 and 341. The frame is driven synchronously in the X-axis direction by the main control unit. Similarly, the plurality of Y brackets 75, 475, and 475a mounted on one of the base frames 14, 414 are respectively connected by the plate pieces 76, but a plurality of Y brackets 75 and 475 may be replaced by the plate pieces 76. The 475a is driven synchronously in the Y-axis direction by the main control unit.

又,上述各實施形態中,Y步進平台90、490、490a係中實構件,但不限定於此,亦可以是中空構件、或具有在中空構件內部設置肋部之形狀。例如,可以鑄造等方式製造由中空構件構成之Y步進平台。 Further, in each of the above embodiments, the Y stepping platforms 90, 490, and 490a are solid members, but the present invention is not limited thereto, and may be a hollow member or a shape in which a rib is provided inside the hollow member. For example, a Y stepping platform composed of a hollow member can be manufactured by casting or the like.

又,第1實施形態中,連接重量抵消裝置50與X托架40之撓曲裝置45,可以是配置成僅能將重量抵消裝置50牽引於Y軸方向。此外,若係藉由撓曲裝置45將重量抵消裝置50與X托架40一起驅動於X軸方向及Y軸方向的話,亦可取代固定在重量抵消裝置50之臂部54前端之X可動子56,而固定磁性體。 Further, in the first embodiment, the bending device 45 that connects the weight canceling device 50 and the X bracket 40 may be arranged such that only the weight canceling device 50 can be pulled in the Y-axis direction. Further, if the weight canceling device 50 is driven together with the X bracket 40 in the X-axis direction and the Y-axis direction by the flexing device 45, the X movable member fixed to the front end of the arm portion 54 of the weight canceling device 50 may be replaced. 56, while fixing the magnetic body.

又,第4實施形態及第4實施形態之變形例中,雖將一對X托架340、340b以形成有開口部之連結板341加以連結,但不限於此,亦可將一對X托架340、340b以在X軸方向分離配置之複數個連結板加以連結。此外,固定在重量抵消裝置350、350a之鍔部352,無須設置在重量抵消裝置350、350a之全周,可以是朝向外周方向伸出之棒狀構件。 Further, in the modification of the fourth embodiment and the fourth embodiment, the pair of X brackets 340 and 340b are coupled to the coupling plate 341 having the opening, but the present invention is not limited thereto, and a pair of X brackets may be used. The frames 340 and 340b are connected by a plurality of connecting plates that are disposed apart in the X-axis direction. Further, the crotch portion 352 fixed to the weight canceling devices 350, 350a does not need to be provided over the entire circumference of the weight canceling devices 350, 350a, and may be a rod-like member that protrudes in the outer circumferential direction.

又,第5實施形態之變形例中,雖係於Y步進平台490a之長邊方向兩端部配置了磁性體96,但不限於此,由於只要是能在Y步進平台490a作用鉛直方向向上之力即可,因此,可例如於Y步進平台490a之長邊方向中間部分透過固定構件配置磁性體96,並以在其對向面配置永久磁石97之方式於X樑325之下面固定永久磁石97。 Further, in the modification of the fifth embodiment, the magnetic body 96 is disposed at both end portions in the longitudinal direction of the Y stepping stage 490a. However, the present invention is not limited thereto, and the vertical direction can be applied to the Y stepping platform 490a. The upward force may be sufficient. Therefore, for example, the magnetic body 96 may be disposed through the fixing member at the intermediate portion in the longitudinal direction of the Y stepping platform 490a, and fixed to the lower surface of the X beam 325 by disposing the permanent magnet 97 on the opposite surface thereof. Permanent magnet 97.

又,照明光可以是ArF準分子雷射光(波長193nm)、KrF準分子雷射光(波長248nm)等之紫外光、或F2雷射光(波長157nm)等之真空紫外光。此外,作為照明光,亦可使用例如將從DFB半導體雷射或光纖雷射發出之紅外線帶或可見光帶之單一波長雷射光以例如摻雜有鉺(或鉺及鐿兩者)之光纖放大器加以増幅,使用非線性光學結晶加以波長轉換為紫外光之諧波。再者,亦可使用固體雷射(波長:355nm、266nm)等。 Further, the illumination light may be ultraviolet light such as ArF excimer laser light (wavelength 193 nm), KrF excimer laser light (wavelength 248 nm), or vacuum ultraviolet light such as F 2 laser light (wavelength 157 nm). Further, as the illumination light, for example, a single-wavelength laser light of an infrared band or a visible light band emitted from a DFB semiconductor laser or a fiber laser may be used, for example, an optical fiber amplifier doped with germanium (or both germanium and germanium). The amplitude is converted to the harmonics of ultraviolet light using nonlinear optical crystallization. Further, a solid laser (wavelength: 355 nm, 266 nm) or the like can also be used.

又,於上述各實施形態等中,雖係針對投影光學系PL為具 備複數隻投影光學單元之多透鏡方式投影光學系之情形做了說明,但投影光學單元之數量不限於此,只要是1隻以上即可。此外,亦不限於多透鏡方式之投影光學系,亦可以是使用例如歐夫那(Ofner)型大型反射鏡之投影光學系等。再著,上述實施形態中雖係針對作為投影光學系PL使用投影倍率為等倍者之情形作了說明,但不限於此,投影光學系可以是縮小系及拡大系之任一種。 Further, in the above embodiments and the like, the projection optical system PL is provided. The case of the multi-lens projection optical system in which only a plurality of projection optical units are provided has been described, but the number of projection optical units is not limited thereto, and may be one or more. Further, the projection optical system of the multi-lens type is not limited, and a projection optical system using, for example, an OFNER type large-sized mirror may be used. Further, in the above-described embodiment, the case where the projection magnification is equal to the projection optical system PL is described. However, the present invention is not limited thereto, and the projection optical system may be either a reduction system or a large system.

又,上述各實施形態等中,雖係使用在光透射性光罩基板上形成有既定遮光圖案(或相位圖案、減光圖案)之光透射型光罩,但亦可使用例如美國專利第6,778,257號公報所揭示之,根據待曝光圖案之電子資料形成透射圖案或反射圖案、或形成發光圖案之電子光罩(可變成形光罩),例如可採用使用非發光型影像顯示元件(亦稱為空間光調變器)之一種的DMD(Digital Micro-mirror Device)的可變成形光罩。 Further, in each of the above-described embodiments, a light-transmitting type reticle having a predetermined light-shielding pattern (or a phase pattern and a light-reducing pattern) formed on the light-transmitting mask substrate is used, but for example, US Pat. No. 6,778,257 As disclosed in the publication, an electronic mask (variable shaping mask) for forming a transmission pattern or a reflection pattern or an illumination pattern according to an electronic material of a pattern to be exposed can be used, for example, a non-light-emitting type image display element (also referred to as A variable-mold mask of a DMD (Digital Micro-mirror Device) of one type of a spatial light modulator.

又,作為曝光裝置,尤其是適用於對尺寸(包含外徑、對角線長度、一邊中之至少1種)為500mm以上之基板、例如使液晶顯示元件等平面顯示器用之大型基板曝光之曝光裝置時,特別有效。 Further, the exposure apparatus is particularly suitable for exposure of a substrate having a size (including at least one of an outer diameter, a diagonal length, and one side) of 500 mm or more, for example, a large substrate for a flat panel display such as a liquid crystal display element. It is especially effective when it is installed.

又,作為曝光裝置,亦能適用於步進重複(step & repeat)方式之曝光裝置、步進接合(step & stitch)方式之曝光裝置。此外,被保持於移動體裝置之移動體的物體不限於曝光對象物體基板等,亦可以是光罩等之圖案保持體(原板)。 Further, the exposure apparatus can also be applied to an exposure apparatus of a step & repeat method and an exposure apparatus of a step & stitch type. In addition, the object to be held by the moving body of the mobile device is not limited to the substrate to be exposed, and the like, and may be a pattern holder (original plate) such as a photomask.

又,曝光裝置之用途,並不限於將液晶顯示元件圖案轉印至方型玻璃板之液晶用曝光裝置,亦可廣泛適用於例如半導體製造用之曝光裝置、用以製造薄膜磁頭、微機器及DNA晶片等之曝光裝置。此外,不僅 是半導體元件等之微元件,本發明亦能適用於為製造用於光曝光裝置、EUV曝光裝置、X線曝光裝置及電子線曝光裝置等之光罩或標線片,而將電路圖案轉印至玻基板或矽晶圓等之曝光裝置。又,具備保持物體之物體保持裝置的裝置,並不限於曝光裝置,亦可以是其他的基板處理裝置、例如玻璃基板(或晶圓)檢查裝置等。又,曝光對象之物體不限於玻璃板,亦可以是例如晶圓、陶瓷基板、薄膜構件或光罩基板(mask blank)等其他物體。又,曝光對象物是平板顯示器用基板之情形時,該基板之厚度並無特別限定,例如亦包含薄膜狀(具可撓性之片狀構件)者。 Further, the use of the exposure apparatus is not limited to a liquid crystal exposure apparatus for transferring a liquid crystal display element pattern to a square glass plate, and can be widely applied to, for example, an exposure apparatus for semiconductor manufacturing, a thin film magnetic head, a micromachine, and An exposure device such as a DNA wafer. In addition, not only It is a micro component such as a semiconductor component, and the present invention can also be applied to transfer a circuit pattern for manufacturing a photomask or a reticle for a photoexposure device, an EUV exposure device, an X-ray exposure device, and an electron beam exposure device. Exposure device to a glass substrate or a germanium wafer. Further, the device including the object holding device for holding the object is not limited to the exposure device, and may be another substrate processing device such as a glass substrate (or wafer) inspection device. Further, the object to be exposed is not limited to a glass plate, and may be another object such as a wafer, a ceramic substrate, a film member, or a mask blank. In the case where the object to be exposed is a substrate for a flat panel display, the thickness of the substrate is not particularly limited, and for example, a film-like member having a flexible sheet member is also included.

液晶顯示元件(或半導體元件)等之電子元件,係經由進行元件之功能性能設計的步驟、依據此設計步驟製作光罩(或標線片)的步驟、製作玻璃基板(或晶圓)的步驟、以上述各實施形態之曝光裝置及其曝光方法將光罩(標線片)圖案轉印至玻璃基板的微影步驟、使經曝光之玻璃基板顯影的顯影步驟、將殘存抗蝕劑之部分以外部分之露出構件以蝕刻加以去除的蝕刻步驟、去除完成蝕刻而無需之抗蝕劑的抗蝕劑去除步驟、元件組裝步驟、檢查步驟等加以製造。此場合,由於在微影步驟係使用上述實施形態之曝光裝置實施前述曝光方法,於玻璃基板上形成元件圖案,因此能以良好生產性製造高積體度之元件。 An electronic component such as a liquid crystal display element (or a semiconductor element) is a step of fabricating a photomask (or a reticle) according to the design of the functional performance of the component, and a step of fabricating a glass substrate (or wafer) In the exposure apparatus and the exposure method thereof according to the above embodiments, the photomask (reticle) pattern is transferred to the lithography step of the glass substrate, the development step of developing the exposed glass substrate, and the remaining resist portion The exposed portions of the other portions are etched by etching, the resist removal step of removing the etching is completed, the resist removal step of the resist, the component assembly step, the inspection step, and the like are performed. In this case, since the exposure method is carried out by using the exposure apparatus of the above-described embodiment in the lithography step, the element pattern is formed on the glass substrate, so that a high-complexity element can be manufactured with good productivity.

此外,援用上述說明所引用之關於曝光裝置之所有公報、國際公開公報、美國專利申請公開說明書及美國專利說明書之揭示作為本說明書記載之一部分。 In addition, the disclosures of all publications, the International Publications, the U.S. Patent Application Publications, and the U.S. Patent Application Serial No.

產業上之可利用性Industrial availability

如以上之說明,本發明之曝光裝置適於使板上之物體曝光。 又,本發明之平面顯示器之製造方法非常適於使曝光後之物體顯影。此外,本發明之元件製造方法非常適於製造微元件。 As explained above, the exposure apparatus of the present invention is adapted to expose an object on a board. Further, the method of manufacturing a flat panel display of the present invention is very suitable for developing an object after exposure. Further, the component manufacturing method of the present invention is very suitable for manufacturing microcomponents.

11‧‧‧地面 11‧‧‧ Ground

14‧‧‧基架 14‧‧‧ pedestal

16a‧‧‧Y線性導件 16a‧‧‧Y linear guide

17a‧‧‧X線性導件 17a‧‧‧X linear guide

17b‧‧‧滑件 17b‧‧‧Sliding parts

18y‧‧‧Y音圈馬達 18y‧‧‧Y voice coil motor

22y‧‧‧Y移動鏡 22y‧‧‧Y moving mirror

25‧‧‧X樑 25‧‧‧X beam

26‧‧‧感測器 26‧‧‧Sensor

27‧‧‧標的物 27‧‧‧ Subject matter

28‧‧‧鏡座 28‧‧‧Mirror base

30‧‧‧微動載台 30‧‧‧Micro-motion stage

31‧‧‧基板保持具 31‧‧‧Substrate holder

33‧‧‧基板載台架台 33‧‧‧Substrate mounting platform

34‧‧‧防振裝置 34‧‧‧Anti-vibration device

35a‧‧‧Y線性導件 35a‧‧‧Y linear guide

35b‧‧‧滑件 35b‧‧‧Sliding parts

40‧‧‧X托架 40‧‧‧X bracket

41‧‧‧連結板 41‧‧‧Link board

50‧‧‧重量抵消裝置 50‧‧‧Weight offset device

51‧‧‧筐體 51‧‧‧Shell

52‧‧‧空氣彈簧 52‧‧‧Air spring

53‧‧‧Z滑件 53‧‧‧Z slider

54‧‧‧臂部 54‧‧‧arms

55‧‧‧基墊(空氣軸承) 55‧‧‧ base pad (air bearing)

56‧‧‧X可動子 56‧‧‧X movable

57‧‧‧密封墊(空氣軸承) 57‧‧‧Sealing pad (air bearing)

61‧‧‧平板構件 61‧‧‧Table components

62‧‧‧側壁構件 62‧‧‧ sidewall components

70‧‧‧調平裝置 70‧‧‧ Leveling device

73‧‧‧Y固定子 73‧‧‧Y fixed

75‧‧‧Y托架 75‧‧‧Y bracket

76‧‧‧板片 76‧‧‧ plates

81‧‧‧X可動子 81‧‧‧X movable

82‧‧‧X固定子 82‧‧‧X fixed

90‧‧‧Y步進平台 90‧‧‧Y stepping platform

PST‧‧‧基板載台裝置 PST‧‧‧Substrate stage device

Claims (29)

一種掃描型之曝光裝置,係在曝光處理時相對曝光用能量束使曝光對象物體在與水平面平行之第1方向以既定第1行程移動,其具備:移動體,能於該第1方向至少以該既定第1行程移動、且能在該水平面內於與該第1方向正交之第2方向以第2行程移動;物體保持構件,能保持該物體、與該移動體一起至少在與該水平面平行之方向移動;重量抵消裝置,從下方支承該物體保持構件以抵消該物體保持構件之重量;支承構件,延伸於該第1方向,從下方支承該重量抵消裝置並能在從下方支承該重量抵消裝置之狀態下,於該第2方向以該第2行程移動;支承架台,支承該支承構件;以及載重減輕裝置,用以減輕作用於該支承架台之重力方向之載重負荷。 A scanning type exposure apparatus that moves an exposure target object in a first direction parallel to a horizontal plane by a predetermined first stroke during exposure processing, and includes a moving body that can be at least in the first direction The predetermined first stroke moves and can move in the second direction in the second direction orthogonal to the first direction in the horizontal plane; the object holding member can hold the object together with the moving body at least with the horizontal plane Moving in parallel; a weight canceling device supporting the object holding member from below to offset the weight of the object holding member; the support member extending in the first direction, supporting the weight canceling device from below and capable of supporting the weight from below In the state of the canceling device, the second stroke is moved in the second direction; the support frame supports the support member; and the load reducing device reduces the load acting on the support frame in the direction of gravity. 如申請專利範圍第1項之曝光裝置,其中,該載重減輕裝置係藉由將作用於該重量抵消裝置之力之一部分釋放至該支承架台外部,來減輕該載重負荷。 The exposure apparatus of claim 1, wherein the load reducing device relieves the load by releasing a portion of the force acting on the weight canceling device to the outside of the support frame. 如申請專利範圍第1或2項之曝光裝置,其中,該載重減輕裝置係利用作用在該移動體之一部分與該重量抵消裝置之一部分之間之力,來減輕該載重負荷。 The exposure apparatus of claim 1 or 2, wherein the load reducing means uses a force acting between a portion of the moving body and a portion of the weight canceling means to reduce the load. 如申請專利範圍第1至3項中任一項之曝光裝置,其中,該移動體包含能於該第1方向至少以該既定第1行程移動之第1移動構件,與引導該第1移動構件往該第1方向之移動且能在該水平面內於該第2方向與該 第1移動構件一起以該第2行程移動之第2移動構件。 The exposure apparatus according to any one of claims 1 to 3, wherein the moving body includes a first moving member that is movable at least in the first first stroke in the first direction, and guides the first moving member Moving in the first direction and being in the second direction in the second direction The first moving member moves together with the second moving member in the second stroke. 如申請專利範圍第4項之曝光裝置,其中,該第1移動構件係被包含設於該第2移動構件之磁石、與設於該第1移動構件之線圈的線性馬達,以該第1行程驅動於該第1方向;該載重減輕裝置係利用作用在該磁石與該重量抵消裝置之一部分或該支承構件之一部分之間之力,來減輕作用於該支承構件之重力方向之載重負荷。 The exposure apparatus of claim 4, wherein the first moving member includes a magnet provided in the second moving member and a linear motor provided in a coil of the first moving member, and the first stroke is used Driving in the first direction; the load reducing device uses a force acting between one portion of the magnet and the weight canceling device or a portion of the supporting member to reduce the load acting on the supporting member in the direction of gravity. 如申請專利範圍第5項之曝光裝置,其中,於該重量抵消裝置設有有芯線圈;該重量抵消裝置係被該磁石與該有芯線圈之間之電磁相互作用而產生之電磁力,於該支承構件上驅動於該第1方向;該載重減輕裝置利用作用在該磁石與該有芯線圈之間之磁力,來減輕該載重負荷。 The exposure apparatus of claim 5, wherein the weight canceling device is provided with a core coil; the weight canceling device is an electromagnetic force generated by electromagnetic interaction between the magnet and the cored coil, The support member is driven in the first direction; the load reducing device reduces the load by utilizing a magnetic force acting between the magnet and the cored coil. 如申請專利範圍第1項之曝光裝置,其中,該載重減輕裝置係利用作用在該移動體之一部分與該支承構件之一部分之間之力,來減輕該載重負荷。 The exposure apparatus of claim 1, wherein the load reducing means reduces the load by using a force acting between a portion of the moving body and a portion of the supporting member. 如申請專利範圍第7項之曝光裝置,其中,該載重減輕裝置係藉由將作用於該支承構件之力之一部分釋放至該支承架台外部,來減輕該載重負荷。 The exposure apparatus of claim 7, wherein the load reducing device relieves the load by releasing a portion of the force acting on the support member to the outside of the support frame. 如申請專利範圍第7或8項之曝光裝置,其中,該移動體包含能於該第1方向至少以該既定第1行程移動之第1移動構件、與引導該第1移動構件往該第1方向之移動且能在該水平面內於該第2方向與該第1移動構 件一起以該第2行程移動之第2移動構件。 The exposure apparatus of claim 7 or 8, wherein the moving body includes a first moving member that can move at least in the first direction by the predetermined first stroke, and guides the first moving member to the first The direction of movement and the second movement and the first movement in the horizontal plane The second moving member that moves together in the second stroke. 如申請專利範圍第9項之曝光裝置,其中,該載重減輕裝置係利用作用在該第2移動構件與該支承構件之間之力,來減輕該載重負荷。 The exposure apparatus according to claim 9, wherein the load reducing device reduces the load by using a force acting between the second moving member and the supporting member. 如申請專利範圍第9或10項之曝光裝置,其進一步具備支承該第2移動構件、與該支承架台在振動上分離之支承架;該第2移動構件係被包含設於該支承架之磁石、與設於該第2移動構件之有芯線圈的線性馬達,以該第2行程驅動於該第2方向;該載重減輕裝置利用作用在該磁石與該有芯線圈之間之磁力,進一步減輕該載重負荷。 An exposure apparatus according to claim 9 or 10, further comprising: a support frame that supports the second moving member and is separated from the support frame by vibration; and the second moving member includes a magnet provided on the support frame And a linear motor provided with the core coil of the second moving member is driven in the second direction by the second stroke; the load reducing device further reduces the magnetic force acting between the magnet and the cored coil The load capacity. 如申請專利範圍第4至6、9至11項中任一項之曝光裝置,其中,該支承構件係以連接裝置機械性的連結於該第2移動構件,在該第2移動構件移動時透過該連接裝置被該第2移動構件牽引,據以移動於該第2方向。 The exposure apparatus according to any one of claims 4 to 6, wherein the support member is mechanically coupled to the second moving member by a connecting device, and is transmitted while the second moving member moves. The connecting device is pulled by the second moving member and moved in the second direction. 如申請專利範圍第12項之曝光裝置,其中,該連接裝置中,與該第2方向之剛性相較,其另一方向之剛性較低。 The exposure apparatus of claim 12, wherein the connection device has a lower rigidity in the other direction than the rigidity in the second direction. 如申請專利範圍第12或13項之曝光裝置,其中,該連接裝置係在通過該支承構件之重心位置、與該第2方向平行之軸線上,連接於該支承構件。 The exposure apparatus of claim 12, wherein the connection device is connected to the support member at an axis parallel to the second direction through a center of gravity of the support member. 如申請專利範圍第1至14項中任一項之曝光裝置,其進一步具備導件,該導件包含以機械方式引導該支承構件往該第2方向之移動之單軸導引裝置之要素;該導件相對該移動體在振動上分離。 The exposure apparatus according to any one of claims 1 to 14, further comprising: a guide comprising an element of a uniaxial guide that mechanically guides movement of the support member in the second direction; The guide is separated from the moving body by vibration. 如申請專利範圍第15項之曝光裝置,其中,該單軸導引裝置於該第1方向以既定間隔設有複數個。 The exposure apparatus of claim 15, wherein the single-axis guiding device is provided at a predetermined interval in the first direction. 如申請專利範圍第15或16項之曝光裝置,其中,該導件沿該第2方向彼此分離配置有複數個;該支承構件係搭載在該複數個導件上。 The exposure apparatus of claim 15 or 16, wherein the guides are disposed apart from each other in the second direction; the support member is mounted on the plurality of guides. 如申請專利範圍第1至17項中任一項之曝光裝置,其中,該支承構件係由中實之石材或中空之鑄造物構成。 The exposure apparatus according to any one of claims 1 to 17, wherein the support member is composed of a medium stone or a hollow cast. 如申請專利範圍第1至18項中任一項之曝光裝置,其中,該重量抵消裝置係以非接觸狀態搭載在該支承構件上。 The exposure apparatus according to any one of claims 1 to 18, wherein the weight canceling device is mounted on the support member in a non-contact state. 如申請專利範圍第1至19項中任一項之曝光裝置,其中,該物體保持構件能相對該移動體至少於該第1方向、該第2方向、及繞與該水平面正交之軸線方向微動。 The exposure apparatus according to any one of claims 1 to 19, wherein the object holding member is at least in the first direction, the second direction, and an axis orthogonal to the horizontal plane with respect to the moving body Jog. 如申請專利範圍第20項之曝光裝置,其中,該物體保持構件進一步能相對該移動體在與該水平面正交之方向、及繞與該水平面平行之軸線方向微動。 The exposure apparatus of claim 20, wherein the object holding member is further movable relative to the moving body in a direction orthogonal to the horizontal plane and in an axis parallel to the horizontal plane. 如申請專利範圍第1至21項中任一項之曝光裝置,其進一步具備將該物體保持構件支承為能繞與該水平面平行之軸線擺動的擺動支承裝置。 The exposure apparatus according to any one of claims 1 to 21, further comprising a swing support device that supports the object holding member so as to be swingable about an axis parallel to the horizontal plane. 如申請專利範圍第22項之曝光裝置,其中,該擺動支承裝置以非接觸方式支承該物體保持構件。 The exposure apparatus of claim 22, wherein the swing support device supports the object holding member in a non-contact manner. 如申請專利範圍第22或23項之曝光裝置,其中,該擺動支承裝置被該該重量抵消裝置從下方支承; 該重量抵消裝置係以非接觸狀態搭載在該支承構件上。 The exposure apparatus of claim 22 or 23, wherein the swing support device is supported by the weight canceling device from below; The weight canceling device is mounted on the support member in a non-contact state. 如申請專利範圍第22至24項中任一項之曝光裝置,其中,該重量抵消裝置具備產生鉛直方向向上之力的力產生裝置;該擺動支承裝置係配置成能在與該水平面正交之方向移動,將該力產生裝置產生之該力傳遞至該物體保持構件。 The exposure apparatus according to any one of claims 22 to 24, wherein the weight canceling device is provided with a force generating device that generates a force in a vertical direction upward; the swing support device is configured to be orthogonal to the horizontal plane The direction moves, and the force generated by the force generating device is transmitted to the object holding member. 一種掃描型曝光裝置,係在曝光處理時相對曝光用能量束使曝光對象之物體在與水平面平行之第1方向以既定第1行程移動,其具備:第1移動構件,能於該第1方向至少以該既定第1行程移動;第2移動構件,引導該第1移動構件往該第1方向之移動、且能在該水平面內與該第1方向正交之第2方向與該第1移動構件一起以第2行程移動;物體保持構件,保持該物體、能與該第1移動構件一起至少在與該水平面平行之方向移動;重量抵消裝置,從下方支承該物體保持構件以抵消該物體保持構件之重量;支承架台,包含從下方支承該重量抵消裝置之平台;線性馬達,包含設於該第2移動構件之磁石與設於該第1移動構件之線圈,將該第1移動構件以該第1行程驅動於該第1方向;以及載重減輕裝置,利用作用於該磁石與該重量抵消裝置之一部分之間之力,來減輕作用於該支承架台之重力方向之載重負荷。 A scanning type exposure apparatus that moves an object to be exposed in a first direction parallel to a horizontal plane by a predetermined first stroke during an exposure process, and includes: a first moving member capable of being in the first direction Moving at least in the predetermined first stroke; the second moving member guiding the movement of the first moving member in the first direction and the second direction orthogonal to the first direction in the horizontal plane and the first movement The member moves together in a second stroke; the object holding member holds the object, can move with the first moving member at least in a direction parallel to the horizontal plane; and the weight canceling device supports the object holding member from below to cancel the object holding a weight of the member; the support stand includes a platform for supporting the weight canceling device from below; and the linear motor includes a magnet provided on the second moving member and a coil provided in the first moving member, and the first moving member is used as the weight The first stroke is driven in the first direction; and the load reducing device uses a force acting between the magnet and a portion of the weight canceling device to reduce the action on the branch Truck load of the direction of gravity of the gantry. 如申請專利範圍第1至26項中任一項之曝光裝置,其中,該物體係用於平面顯示器之製造之基板。 The exposure apparatus according to any one of claims 1 to 26, wherein the object system is used for a substrate for manufacturing a flat panel display. 一種平面顯示器之製造方法,包含:使用申請專利範圍第27項之曝光裝置使該基板曝光的動作;以及使曝光後之該基板顯影的動作。 A method of manufacturing a flat panel display comprising: an operation of exposing the substrate using an exposure apparatus of claim 27; and an operation of developing the substrate after exposure. 一種元件製造方法,包含:使用申請專利範圍第1至26項中任一項之曝光裝置使物體曝光的動作;以及使曝光後之該物體顯影的動作。 A method of manufacturing a component, comprising: an action of exposing an object using an exposure device according to any one of claims 1 to 26; and an action of developing the object after exposure.
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