TW201738993A - Wet etching device - Google Patents

Wet etching device Download PDF

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Publication number
TW201738993A
TW201738993A TW105112137A TW105112137A TW201738993A TW 201738993 A TW201738993 A TW 201738993A TW 105112137 A TW105112137 A TW 105112137A TW 105112137 A TW105112137 A TW 105112137A TW 201738993 A TW201738993 A TW 201738993A
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substrate
wet etching
platform
nozzles
liquid
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TW105112137A
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Chinese (zh)
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TWI587435B (en
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黃榮龍
呂峻杰
陳瀅如
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盟立自動化股份有限公司
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Publication of TW201738993A publication Critical patent/TW201738993A/en

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Abstract

A wet etching device is disclosed. The wet etching device includes a chamber, a plurality of etching solution nozzles, and a supporting platform. The chamber includes a gas inlet and a gas outlet. The etching solution nozzles are disposed in the chamber to etch a substrate. The supporting platform includes a body and a plurality of platform nozzles. The body is disposed below the substrate. The platform nozzles penetrate the body. A solution provides a liquid buoyancy force to support the substrate via the platform nozzles. The wet etching device can avoid the problem that a back side of the substrate is dirty.

Description

濕式蝕刻裝置 Wet etching device

本發明關於濕式製程領域,特別是關於一種濕式蝕刻裝置。 This invention relates to the field of wet processes, and more particularly to a wet etching apparatus.

在面板產業中,溼式製程的發展已經相當成熟。然而習知溼式製程機台中,使用上具有維修困難、耗液量大、均勻性不佳、漏夜、及背面髒污等等問題,上述問題在細線寬(fine pitch)的情況下特別嚴重。 In the panel industry, the development of wet processes is quite mature. However, in the conventional wet type processing machine, the use is difficult to maintain, the liquid consumption is large, the uniformity is poor, the night is leaking, and the back surface is dirty, and the like, the above problem is particularly serious in the case of fine pitch.

上述背面髒污的問題大部分的原因是支撐一基板並移動該基板的滾輪所造成,對於超薄基板而言,常常需要用到數以千計的滾輪,使用數量龐大的滾輪除了價格高昂之外,也不利於維護保養,甚至會在基板的背面(即與滾輪接觸的一面)形成滾痕(roller mark)。再者,現有立體(3D)封裝需要進行雙面製程,使用滾輪承載基板的濕式蝕刻裝置無法對基板的背面進行蝕刻製程。 Most of the problems of the backside contamination are caused by the rollers supporting the substrate and moving the substrate. For ultra-thin substrates, thousands of rollers are often used, and the use of a large number of rollers is expensive. In addition, it is not conducive to maintenance, and even a roller mark is formed on the back side of the substrate (i.e., the side in contact with the roller). Furthermore, the existing three-dimensional (3D) package requires a two-sided process, and the wet etching apparatus using the roller carrier substrate cannot perform an etching process on the back surface of the substrate.

因此需要針對上述習知技術中使用滾輪承載基板的問題提出解決方法。 Therefore, it is necessary to propose a solution to the problem of using a roller-carrying substrate in the above-mentioned prior art.

本發明提供一種濕式蝕刻裝置,其能解決習知技術中使用滾輪承載基板的問題。 The present invention provides a wet etching apparatus that solves the problem of using a roller-carrying substrate in the prior art.

本發明之濕式蝕刻裝置包括一腔體、複數個蝕刻液噴嘴、以及一承載平台。該腔體包括一進氣口以及一出氣口。該進氣口用於導入一蝕刻所需氣體。該出氣口用於導出該蝕刻所需氣體。該些蝕刻液噴嘴設置於該腔體中以對一基板進行蝕刻。該承載平台包括一本體以及複數個平台 噴嘴。該本體設置於該基板下方。該些平台噴嘴貫穿該本體,一液體透過該些平台噴嘴提供一液體浮力以承載該基板。 The wet etching apparatus of the present invention comprises a cavity, a plurality of etchant nozzles, and a carrier platform. The cavity includes an air inlet and an air outlet. The air inlet is used to introduce a gas required for etching. The gas outlet is used to derive the gas required for the etching. The etchant nozzles are disposed in the cavity to etch a substrate. The carrier platform includes a body and a plurality of platforms nozzle. The body is disposed below the substrate. The platform nozzles extend through the body, and a liquid provides a liquid buoyancy through the platform nozzles to carry the substrate.

在一較佳實施例中,該濕式蝕刻裝置進一步包括一抽風模組。該抽風模組連接至該進氣口及該出氣口且用於將該腔體內部之蝕刻所需氣體從該出氣口抽出承載板。 In a preferred embodiment, the wet etching apparatus further includes an exhaust module. The air extraction module is connected to the air inlet and the air outlet and is used for extracting the gas required for etching inside the cavity from the air outlet to the carrier.

在一較佳實施例中,該濕式蝕刻裝置進一步包括一定位單元。該定位單元設置於該本體上並用於將該基板限定在一特定範圍內。 In a preferred embodiment, the wet etching apparatus further includes a positioning unit. The positioning unit is disposed on the body and is used to define the substrate within a specific range.

在一較佳實施例中,該液體為水或製程所需藥液。 In a preferred embodiment, the liquid is water or a liquid chemical required for the process.

在一較佳實施例中,該本體之表面每平方公分包括一至五個平台噴嘴。 In a preferred embodiment, the surface of the body includes one to five platform nozzles per square centimeter.

在一較佳實施例中,各平台噴嘴之一口徑為0.5公厘至1.5公厘。 In a preferred embodiment, one of the platform nozzles has a diameter of from 0.5 mm to 1.5 mm.

在一較佳實施例中,該些平台噴嘴與該基板之間的距離為1公厘至6公厘。 In a preferred embodiment, the distance between the platform nozzles and the substrate is from 1 mm to 6 mm.

本發明之濕式蝕刻裝置能避免基板的背面髒污的問題、減少滾痕並能進行雙面製程。再者,蝕刻所需氣體經由抽風模組抽出後可進一步再生使用,對蝕刻液進行加壓的功能,因此能節省氣體使用量。 The wet etching apparatus of the present invention can avoid the problem of dirt on the back side of the substrate, reduce roll marks, and can perform a double-sided process. Further, since the gas required for etching can be further regenerated after being extracted by the air suction module, and the function of pressurizing the etching liquid, the gas usage can be saved.

1、1’‧‧‧濕式蝕刻裝置 1, 1'‧‧‧ Wet etching device

10、10’‧‧‧蝕刻液噴嘴 10, 10'‧‧‧etching liquid nozzle

20‧‧‧腔體 20‧‧‧ cavity

30‧‧‧基板 30‧‧‧Substrate

40‧‧‧承載平台 40‧‧‧Loading platform

50‧‧‧抽風模組 50‧‧‧Exhaust module

60‧‧‧定位單元 60‧‧‧ Positioning unit

200‧‧‧進氣口 200‧‧‧air inlet

202‧‧‧出氣口 202‧‧‧ outlet

400‧‧‧本體 400‧‧‧ body

402‧‧‧平台噴嘴 402‧‧‧ platform nozzle

第1圖顯示根據本發明一第一實施例之濕式蝕刻裝置之示意圖;以及第2圖顯示根據本發明一第二實施例之濕式蝕刻裝置之示意圖。 1 is a schematic view showing a wet etching apparatus according to a first embodiment of the present invention; and FIG. 2 is a view showing a wet etching apparatus according to a second embodiment of the present invention.

請參閱第1圖,第1圖顯示根據本發明一第一實施例之濕式蝕刻裝置1之示意圖。 Please refer to FIG. 1. FIG. 1 is a schematic view showing a wet etching apparatus 1 according to a first embodiment of the present invention.

如第1圖所示,本發明之濕式蝕刻裝置1包括複數個蝕刻液噴嘴10、一腔體20、一承載平台40、以及一抽風模組50。 As shown in FIG. 1, the wet etching apparatus 1 of the present invention includes a plurality of etching liquid nozzles 10, a cavity 20, a carrying platform 40, and a draft module 50.

該些噴嘴10設置於該腔體20中以對一基板30進行蝕刻,更明確地說,該些蝕刻液噴嘴10設置於該基板30的上方。該基板30可以為目前濕式製程中需要進行蝕刻的基板,例如但不限於為一玻璃基板。該承載平台40設置於該腔體20中並用於非接觸地承載該基板30。 The nozzles 10 are disposed in the cavity 20 to etch a substrate 30. More specifically, the etchant nozzles 10 are disposed above the substrate 30. The substrate 30 can be a substrate that needs to be etched in the current wet process, such as but not limited to being a glass substrate. The carrier platform 40 is disposed in the cavity 20 and is used to carry the substrate 30 in a non-contact manner.

該腔體20主要包括一進氣口200以及一出氣口202。於本實施例中,該進氣口200及該出氣口202分別設置於該腔體20之兩相對的側壁上,然而本發明並不限於此,該進氣口200及該出氣口202可設置於該腔體20之相同或不同側壁上。 The cavity 20 mainly includes an air inlet 200 and an air outlet 202. In the embodiment, the air inlet 200 and the air outlet 202 are respectively disposed on two opposite sidewalls of the cavity 20, but the invention is not limited thereto, and the air inlet 200 and the air outlet 202 may be disposed. On the same or different side walls of the cavity 20.

該進氣口200用於導入一蝕刻所需氣體,該抽風模組50連接至該出氣口202,該抽風模組50用於將該腔體20內部之蝕刻所需氣體從該出氣口202抽出,抽出之蝕刻所需氣體可以再透過該進氣口200導入,達到再生使用的目的,節省蝕刻所需氣體之使用量。 The air inlet 200 is configured to introduce a gas required for etching, and the air blowing module 50 is connected to the air outlet 202. The air blowing module 50 is configured to extract the gas required for etching inside the cavity 20 from the air outlet 202. The gas required for the extraction etching can be further introduced through the air inlet 200 to achieve the purpose of regeneration, and the amount of gas required for etching is saved.

要說明的是,蝕刻所需氣體為本發明所屬技術領域中具有通常知識者所熟知,此不多加贅述。 It is to be noted that the gas required for etching is well known to those of ordinary skill in the art to which the present invention pertains, and will not be described again.

本發明之一特點在於該承載平台40用於非接觸地承載該基板30,該承載平台40包括一本體400以及複數個平台噴嘴402,該本體40設置於該基板30下方並大致呈一平板狀。該些平台噴嘴402貫穿該本體400,一液體由下往上透過該些平台噴嘴402提供一液體浮力以承載該基板30,由於該基板30是由該液體浮力所承載,因此可避免造成該基板30的背面(即該基板30朝向該承載平台40的一面)髒污的問題並大幅減少滾輪的數量,且該基板30不會與該承載平台40接觸,不會發生使用滾輪承載時該基板30的背面(即該基板30朝向該承載平台40的一面)形成滾痕的問題。 One of the features of the present invention is that the carrying platform 40 is configured to carry the substrate 30 in a non-contact manner. The loading platform 40 includes a body 400 and a plurality of platform nozzles 402. The body 40 is disposed under the substrate 30 and has a substantially flat shape. . The platform nozzles 402 extend through the body 400, and a liquid provides a liquid buoyancy from the bottom to the top through the platform nozzles 402 to carry the substrate 30. Since the substrate 30 is carried by the liquid buoyancy, the substrate can be avoided. The back side of 30 (ie, the side of the substrate 30 facing the carrying platform 40) is dirty and the number of rollers is greatly reduced, and the substrate 30 does not come into contact with the carrying platform 40, and the substrate 30 does not occur when the roller is used. The back side (i.e., the side of the substrate 30 that faces the carrier platform 40) creates a problem of roll marks.

該液體可以為水或製程所需藥液,該液體為製程所需藥液時,除了能提供液體浮力以承載該基板30之外,能進一步將製程所需藥液(例如但不限於蝕刻液)均勻地噴灑在該基板30的背面(即該基板30朝向該承載平台40的一面),因此能適用於立體封裝所需的雙面製程。 The liquid may be water or a liquid required for the process. When the liquid is a liquid required for the process, in addition to providing liquid buoyancy to carry the substrate 30, the liquid required for the process (for example, but not limited to, an etchant) It is uniformly sprayed on the back surface of the substrate 30 (i.e., the side of the substrate 30 facing the carrier platform 40), and thus can be applied to a double-sided process required for a three-dimensional package.

該些平台噴嘴402的設計需要考量的因素包括該基板30的面積、重量、該本體400的材質、表面粗糙度等等。 The factors that need to be considered in the design of the platform nozzles 402 include the area and weight of the substrate 30, the material of the body 400, the surface roughness, and the like.

於一較佳實施例中,該本體400之表面每平方公分包括一至五個平台噴嘴402,該液體的液體壓力為每平方公分小於2.5公斤(kg/cm2),各平台噴嘴402之一口徑為0.5公厘(millimeter;mm)至1.5公厘,該些平台噴嘴402與該基板30之間的距離為1公厘至6公厘。 In a preferred embodiment, the surface of the body 400 includes one to five platform nozzles 402 per square centimeter. The liquid pressure of the liquid is less than 2.5 kilograms per square centimeter (kg/cm 2 ), and one of the platform nozzles 402 has a diameter. From 0.5 mm (millimeter; mm) to 1.5 mm, the distance between the platform nozzles 402 and the substrate 30 is from 1 mm to 6 mm.

要說明的是,該些平台噴嘴402的數量、該液體的液體壓力、各平台噴嘴402之口徑、及該些平台噴嘴402與該基板30之間的距離的範圍為特殊設計,並非僅是本發明所屬技術領域中具有通常知識者可輕易得知的範圍。 It should be noted that the number of the platform nozzles 402, the liquid pressure of the liquid, the diameter of each platform nozzle 402, and the range of the distance between the platform nozzles 402 and the substrate 30 are special designs, not only The scope of the invention is readily known to those of ordinary skill in the art.

請參閱第2圖,第2圖顯示根據本發明一第二實施例之濕式蝕刻裝置1’之示意圖。 Referring to Figure 2, there is shown a schematic view of a wet etching apparatus 1' according to a second embodiment of the present invention.

要說明的是,本實施例之該些蝕刻液噴嘴10’的設計與第一實施例之蝕刻液噴嘴10的設計略有不同,然而兩者之功能相同且皆可應用至本發明。本實施例與第一實施例具有相同標號的元件可參閱上述第一實施例的相關描述,此不多加贅述。 It should be noted that the design of the etchant nozzles 10' of the present embodiment is slightly different from the design of the etchant nozzles 10 of the first embodiment, but both functions are the same and can be applied to the present invention. For the components of the first embodiment having the same reference numerals as the first embodiment, reference may be made to the related description of the first embodiment, which is not described in detail.

於本實施例中,該濕式蝕刻裝置1’進一步包括一定位單元60,該定位單元60設置並固定於該本體400上,更明確地說,該定位單元60設置於該本體400上並位於該基板30的兩側,該定位單元60用於將該基板30限定在一特定範圍內,藉此避免該基板30在該液體的承載下大幅晃動。 In the present embodiment, the wet etching apparatus 1 ′ further includes a positioning unit 60 , which is disposed and fixed on the body 400 . More specifically, the positioning unit 60 is disposed on the body 400 and located On both sides of the substrate 30, the positioning unit 60 is used to define the substrate 30 within a specific range, thereby preventing the substrate 30 from being greatly shaken under the load of the liquid.

此外,要說明的是,第二實施例之定位單元60也可應用至第一實施例,此不多加贅述。 In addition, it should be noted that the positioning unit 60 of the second embodiment is also applicable to the first embodiment, and details are not described herein.

本發明之濕式蝕刻裝置能避免基板的背面(即基板朝向承載平台的一面)髒污的問題、減少滾痕並能進行雙面製程。再者,蝕刻所需氣體經由抽風模組抽出後可進一步再生使用,對蝕刻液進行加壓的功能,因此能節省氣體使用量。 The wet etching apparatus of the present invention can avoid the problem of contamination of the back side of the substrate (i.e., the side of the substrate facing the carrying platform), reduce the number of marks, and can perform a two-sided process. Further, since the gas required for etching can be further regenerated after being extracted by the air suction module, and the function of pressurizing the etching liquid, the gas usage can be saved.

雖然本發明已用較佳實施例揭露如上,然其並非用以限定本發明,本發明所屬技術領域中具有通常知識者在不脫離本發明之精神和範圍內,當可作各種之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 While the invention has been described above by way of a preferred embodiment, the invention is not intended to be limited thereto, and the invention may be modified and modified without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.

1‧‧‧濕式蝕刻裝置 1‧‧‧ Wet etching device

10‧‧‧蝕刻液噴嘴 10‧‧‧etching liquid nozzle

20‧‧‧腔體 20‧‧‧ cavity

30‧‧‧基板 30‧‧‧Substrate

40‧‧‧承載平台 40‧‧‧Loading platform

50‧‧‧抽風模組 50‧‧‧Exhaust module

200‧‧‧進氣口 200‧‧‧air inlet

202‧‧‧出氣口 202‧‧‧ outlet

400‧‧‧本體 400‧‧‧ body

402‧‧‧平台噴嘴 402‧‧‧ platform nozzle

Claims (7)

一種濕式蝕刻裝置,包括:一腔體,包括:一進氣口,用於導入一蝕刻所需氣體;以及一出氣口,用於導出該蝕刻所需氣體;複數個蝕刻液噴嘴,設置於該腔體中以對一基板進行蝕刻;以及一承載平台,包括:一本體,設置於該基板下方;以及複數個平台噴嘴,貫穿該本體,一液體透過該些平台噴嘴提供一液體浮力以承載該基板。 A wet etching apparatus comprising: a cavity comprising: an air inlet for introducing an etching required gas; and an air outlet for deriving the gas required for the etching; and a plurality of etching liquid nozzles disposed at The substrate is etched with a substrate; and a carrier platform includes: a body disposed under the substrate; and a plurality of platform nozzles through which a liquid provides a liquid buoyancy through the platform nozzles to carry The substrate. 根據申請專利範圍第1項所述之濕式蝕刻裝置,進一步包括:一抽風模組,連接至該進氣口及該出氣口且用於將該腔體內部之蝕刻所需氣體從該出氣口抽出。 The wet etching apparatus according to claim 1, further comprising: a ventilation module connected to the air inlet and the air outlet and configured to vent the gas required for etching inside the cavity from the air outlet Take out. 根據申請專利範圍第1項所述之濕式蝕刻裝置,進一步包括一定位單元,該定位單元設置於該本體上並用於將該基板限定在一特定範圍內。 The wet etching apparatus according to claim 1, further comprising a positioning unit disposed on the body and configured to define the substrate within a specific range. 根據申請專利範圍第1項所述之濕式蝕刻裝置,其中該液體為水或製程所需藥液。 The wet etching apparatus according to claim 1, wherein the liquid is water or a chemical required for the process. 根據申請專利範圍第1項所述之濕式蝕刻裝置,其中該本體之表面每平方公分包括一至五個平台噴嘴。 The wet etching apparatus according to claim 1, wherein the surface of the body comprises one to five platform nozzles per square centimeter. 根據申請專利範圍第1項所述之濕式蝕刻裝置,其中各平台噴嘴之一口徑為0.5公厘至1.5公厘。 The wet etching apparatus according to claim 1, wherein each of the platform nozzles has a diameter of from 0.5 mm to 1.5 mm. 根據申請專利範圍第1項所述之濕式蝕刻裝置,其中該些平台噴嘴與該基板之間的距離為1公厘至6公厘。 The wet etching apparatus according to claim 1, wherein the distance between the platform nozzles and the substrate is from 1 mm to 6 mm.
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JP2011210978A (en) * 2010-03-30 2011-10-20 Sumitomo Precision Prod Co Ltd Etching apparatus
JP4975169B1 (en) * 2011-02-10 2012-07-11 株式会社Nsc Method and apparatus for manufacturing glass substrate

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