TW201725392A - Bidirectional conductive pattern module and semiconductor test socket using the same - Google Patents

Abstract

A bidirectional conductive pattern module for testing a semiconductor and a semiconductor test socket using the same are provided. The bidirectional conductive pattern module includes an upper bracket of an insulating material; a lower bracket of an insulating material spaced apart from the upper bracket in up-and-down direction; an elastic connection portion elastically connecting the upper bracket and the lower bracket to each other in a state where the upper bracket and the lower bracket are spaced apart from each other in the up-and-down direction; a plurality of upper contact portions having conductivity and bonded to a surface of one side of the upper bracket so as to be spaced apart from one another along a plate surface direction of the upper bracket; a plurality of lower contact portions having conductivity and bonded to a surface of one side of the lower bracket so as to be spaced apart from one another along a plate surface direction of the lower bracket; and a plurality of conductive connection portions electrically connecting the upper contact portions to the lower contact portions corresponding to each other.

Description

Bidirectional conductive pattern module and semiconductor test socket using same

The invention relates to a bidirectional conductive pattern module and a semiconductor test socket using the same, and is more systematic, relating to a bidirectional conductive pattern module for testing a semiconductor, and a semiconductor test socket using the same, which can complement the spring pin (Pogo -pin) type semiconductor test socket defect.

Cross-references to related applications

The present application is based on and claims the benefit of the benefit of the benefit of the benefit of the benefit of the benefit of the benefit of the benefit of the benefit of the benefit of the benefit of the benefit of the benefit of the benefit of the disclosure.

The semiconductor device is tested to determine if there is a defect in the electrical performance of the semiconductor device after the semiconductor device is fabricated. The defect test of the semiconductor device can be performed in a state in which a semiconductor test socket (or a contactor or a connector) forming an electrical contact terminal of the semiconductor device is inserted between the semiconductor device and the test circuit board. The semiconductor test socket can be used for the final defect test of the semiconductor device and the burn-in test process included in the semiconductor device process.

With the development of integration technology of semiconductor devices and the trend toward miniaturization, the size and pitch of terminals (ie, leads) of semiconductor devices have also been miniaturized, and therefore, there is a need for a fine formation between conductive patterns of test sockets. The method of spacing.

However, existing spring pin type semiconductor test sockets are limited in the manufacture of semiconductor test sockets for testing integrated semiconductor devices. 1 to 3 show an example of a spring pin type semiconductor test socket in the related art disclosed in Korean Patent Publication No. 10-2011-0065047.

Referring to FIGS. 1 to 3, the prior art semiconductor test socket (1000) includes: a main casing (1100) having a through hole (1110) formed in the position of the casing (1000), which corresponds to the upper a terminal (1310) of the semiconductor device (1300) in the downward direction; and a spring pin (1200) mounted on the through hole (1110) of the main casing (1100) to electrically connect the terminals of the semiconductor device (1300) to each other (1310) ) a spacer (1410) with the test device (1400).

The spring pin (1200) comprises: a hollow cylindrical body (1240) which is used as a spring pin body; a contact tip (1230) formed on the lower side of the hollow cylindrical body (1240); a spring (1220) coupled to the contact tip (1230) of the hollow cylindrical barrel (1240) for contraction and extension movement; and a contact pin (1210) coupled to the spring (1220) (connected to the contact tip The opposite side of (1230)) is moved up and down according to the contact of the semiconductor device (1300).

In this case, the springs (1220) contract and extend to electrically connect the terminals (1310) of the semiconductor device (1300) and the pads (1410) of the test device (1400) to each other while absorbing mechanical shock transfer to the contact pins (1210). With the contact tip (1230), it is tested whether the terminal (1310) of the semiconductor device (1300) is electrically defective.

However, since the conventional spring pin type semiconductor test socket as described above uses a physical spring to maintain the elasticity in the up and down directions, it is necessary to insert the spring and the pin into the barrel and insert the barrel into the through hole of the housing, and this may result in The complexity of the process increases manufacturing costs.

In addition, the physical configuration of the electrical contact structure for implementing the upper and lower directions is inherently limited in the implementation of fine pitch, and the application of the spring pin type semiconductor test socket to the latest integrated semiconductor devices has reached critical limits.

In order to overcome the limitations of the above-described spring pin type semiconductor device, a PCR socket type semiconductor test socket has been proposed in which a perforation pattern is formed in a vertical direction of a silicone body made of an elastic silicone material, and then the conductive powder is filled into the perforation pattern to A conductive pattern is formed.

However, the PCR type semiconductor test socket has a problem of a structural limitation of shortened life due to the deviation of the conductive powder filled in the socket.

Accordingly, there is a need to develop another type of semiconductor test socket that can implement fine pitch and that can address height limitations and other types of semiconductor test sockets, including PCR type semiconductor test sockets.

Accordingly, the present invention has solved the aforementioned problems occurring in the prior art, and an object of the present invention is to provide a bidirectional conductive pattern module for testing a semiconductor and a semiconductor test socket using the same, which can compensate for the type of spring pin or The PCR type semiconductor test socket has defects and ensures stable electrical contact even if the socket is implemented with high or low height in the upper and lower directions, while fine pitch can be implemented.

Another object of the present invention is to provide a semiconductor test socket which can extend semiconductor testing by providing a novel resilience when the semiconductor device is pressed down in the upper and lower directions during testing of the semiconductor device. The life of the socket.

According to an aspect of the present invention, a bidirectional conductive pattern module for testing a semiconductor is provided, comprising: an upper support which is an insulating material; a lower support which is an insulating material, the lower support being upper and The lower direction is to separate the upper support; an elastic connecting portion is elastically connected to the upper support and the lower support in a state in which the upper support and the lower support are spaced apart from each other in the upper and lower directions a plurality of upper contact portions having a surface electrically conductive and joined to one side of the upper support to be spaced apart from each other along a plate surface direction of the upper support; a plurality of lower contact portions having electrical conductivity And a surface joined to one side of the lower support to be spaced apart from each other along a plate surface direction of the lower support; and a plurality of electrically conductive connecting portions electrically connecting the upper contact portions to each other corresponding to each other Contact part.

The bidirectional conductive pattern module according to the aspect of the present invention may further include: a plurality of upper partitions formed on the upper support, and extending from the upper surface of the upper support between the adjacent upper contacts Venting to space the adjacent upper contact portions from each other; and a plurality of lower partition portions formed on the lower support, and the plate surface of the lower support between the adjacent lower contact portions Extending to space the adjacent lower contacts from each other.

Upper through holes corresponding to the upper contact portions may be formed on the upper support, and the upper contact portions may be joined to the upper support through curing of the bonding material, the bonding material being disposed at the upper contact portions In the state of the surface on one side of the upper support, the upper through holes are flowed from the other side of the upper support, and the lower through holes corresponding to the lower contact portions may be formed in the lower support And the lower contact portion is engageable to the lower holder by curing of the bonding material, wherein the bonding material is in a state where the lower contact portion is disposed on a surface of one side of the lower holder, from the lower branch The other side of the seat flows through the lower through holes.

The bonding material can be made of a material containing an elastic liquid silicone.

The upper contact portions may be disposed to be elastically movable independently of each other in the upper and lower directions by the elastic joining material.

The conductive connection portion may be formed by at least one conductive line or a plurality of twisted conductive lines.

The conductive connection portion may include an intermediate portion that is curved in the direction of the board surface.

The elastic connecting portion may be formed of a material containing elastic silicone.

The elastic connecting portion may include: an upper elastic portion, an intermediate elastic portion, and a lower elastic portion, and the intermediate elastic portion may be made of a material having elasticity, and the elastic portion is stronger than the upper elastic portion and the lower elastic portion The flexibility of the ministry.

The elastic connecting portion may include: a mesh type substrate; and an elastic coating layer which is a silicone material which is cured in a state where the substrate is coated with the elastic coating layer.

The upper contact portion may include: an upper conductive plate having electrical conductivity; and an upper conductive pin connected to the upper conductive sheet and having an upper edge extending toward an upper portion of the upper support.

According to another aspect of the present invention, a semiconductor test socket is provided, comprising: a main casing having an opening shape in an upper and lower direction, and correspondingly disposed on opposite sides of one of the main casings a plurality of slots formed; a plurality of bidirectional conductive pattern modules, as claimed in any one of claims 1 to 10, for testing a semiconductor inserted in a pair of opposite slits; a first upper support member and a a second upper supporting member, in a state in which the two-way conductive pattern modules are inserted into the slots, respectively contacting the two sides of the upper surface of the upper support of the two-way conductive pattern module; and a first elasticity a rest portion and a second elastic restoring portion elastically supporting the first upper support member and the second upper support member in an upper direction, wherein if the bidirectional conductive pattern modules are pressed in a downward direction by a semiconductor device of a test target, And the upper support moves in the downward direction, and the first elastic restoring portion and the second elastic restoring portion provide a restoring force in the upper direction.

A semiconductor test socket according to aspects of the present invention may further include: a first lower support member; and a second lower support member extending from both sides of the main housing to respectively support the first elastic restoring portion and the first a lower side of the second elastic restoring portion, wherein the first elastic restoring portion and the second elastic restoring portion are between the first upper support member and the first lower support member, and between the second upper support member and the second lower support member The direction provides resilience.

Each of the first elastic restoring portion and the second elastic restoring portion may include at least one elastic spring.

The first elastic restoring portion and the second elastic restoring portion are provided in a rod shape having elasticity in a thickness direction, and may be disposed between the first upper support member and the first lower support member, and between the second upper support member and the second lower support member The direction in which the gap between the support members is formed.

According to still another aspect of the present invention, a semiconductor test socket includes: a main casing having an opening shape in an upper and lower directions, and correspondingly disposed on a pair of opposite sides of the main casing a plurality of slots formed; a plurality of bidirectional conductive pattern modules, as claimed in any one of claims 1 to 10, for testing a semiconductor inserted in a pair of opposite slits; and a first elastic restoring portion a second elastic restoring portion provided by a rod having elasticity in a thickness direction, wherein an upper support and a lower support of the bidirectional conductive pattern module have two edge portions, and the upper support and the lower support When the slits are inserted, they extend to the outside of the main casing, and the first elastic restoring portion and the second elastic restoring portion are disposed along the direction in which the slit is formed, and are disposed on the upper support that extends to the outside of the main casing. And between the lower support, and if the two-way conductive pattern module is pressed in a downward direction by a semiconductor device of a test target, and the upper support is moved in a downward direction, the first elastic restoring portion and the second elastic restoring portion are Provides resilience in the upper direction.

According to the bidirectional conductive pattern module and the semiconductor test socket according to the present invention having the foregoing structure, the upper support and the lower support are separately provided, and the upper contact pin and the lower contact pin are connected through the conductive connection portion to A conductive pattern is formed in the upper and lower directions. Therefore, fine pitch can be achieved and the lifetime is not shortened by deviation from the conductive power.

In addition, in addition to the restoring force of the bidirectional conductive pattern module, the restoring force can be provided by the first elastic restoring portion and the second elastic restoring portion, respectively, thereby extending the life of the semiconductor test socket.

Hereinafter, specific embodiments of the present invention will be described in detail with reference to the accompanying drawings.

4a and 4b are diagrams schematically illustrating a bidirectional conductive pattern module (1) for testing a semiconductor according to an embodiment of the present invention, and FIG. 5 is a schematic diagram illustrating the bidirectional conductive pattern module of FIG. 4a ( 1) The pattern on the back. 4a, 4b and 5, a bidirectional conductive pattern module (1) according to an embodiment of the present invention includes: an upper support (10), a lower support (20), and an elastic connection (30). And a plurality of upper contact portions (40), a plurality of lower contact portions (50), and a plurality of conductive connecting portions (60). In the present specification, an upper contact portion (40), a lower contact portion (50), and a conductive connection portion (60) are electrically connected to each other to form conductive lines in the upper and lower directions.

The upper support (10) is made of an insulating material. In the present invention, it is exemplified that the upper support (10) is made of a stainless steel material, but it can be made of other insulating materials.

The lower support (20) is spaced apart from the upper support (10) in the upper and lower directions. In the present specification, the lower support (20) may be made of an insulating material, such as a stainless steel material, in the same manner as the upper support (10).

The elastic connecting portion (30) elastically connects the upper support (10) and the lower support (20) to each other such that the upper support (10) and the lower support (20) are spaced apart from each other in the upper and lower directions. In the present specification, the elastic connecting portion (30) is made of a material having elasticity such that the upper holder (10) and the lower holder (20) are elastically coupled to each other. Therefore, if the upper holder (10) is pressed in the lower direction, the upper holder (10) can be moved downward by the elastic force of the elastic connecting portion (30), and if the pressure in the lower direction is removed, the elastic connecting portion ( 30) Resilience can be provided so that the upper support (10) can be moved to its original position.

In a specific embodiment of the invention, it is exemplified that the elastic connecting portion (30) is formed using a resilient silicone material. More system, the upper support (10) and the lower support (20) are inserted into the mold in a state of being spaced apart from each other in the upper and lower directions, and the liquid silicone is injected to be solidified so that the upper support (10) can be formed. An elastic joint (30) with the lower supports (20). In another method, the elastic connecting portion (30) can be formed by coating and solidifying the liquid silicone so that the upper support (10) and the lower support (20) are in the upper support (10) and the lower support (20). ) are connected to each other in a state in which the upper and lower directions are spaced apart from each other.

In the present specification, as shown in FIG. 6b, the elastic connecting portion (30) according to an embodiment of the present invention may include: an upper elastic portion (31), an intermediate elastic portion (32); and a lower elastic portion (33). ). Further, the intermediate elastic portion (32) may be made of a material having elasticity which is stronger than the elasticity of the upper elastic portion (31) and the lower elastic portion (33).

For example, when the bidirectional conductive pattern module (1) according to the present invention is applied to the semiconductor test socket (100) to test the semiconductor device (3, see FIGS. 10 and 11), the upper elastic portion (31) will be a semiconductor device. (3) The pressure applied in the lower direction reacts, and the intermediate elastic portion (32) maintains the shape in the upper and lower directions of the bidirectional conductive pattern module (1).

The elastic connecting portion (30) according to another embodiment of the present invention may include: a mesh substrate; and an elastic coating of a silicone material in a state where the substrate is coated with the elastic coating Cured. The substrate can be made of an insulating material and provided with elasticity through an elastic coating of the silicone material.

The upper contact portion (40) is joined to the surface on one side of the upper support (10) such that the upper contact portion (40) is spaced along the plate surface direction of the upper support (10). Further, the lower contact portion (50) is joined to the surface on one side of the lower holder (20) such that the lower contact portion (50) is spaced along the plate surface direction of the lower holder (20).

In the present specification, it is exemplified that the upper contact portion (40) and the lower contact portion (50) according to a specific embodiment of the present invention are provided in the form of conductive pins. As shown in another example, the upper contact portion (40) can illustratively include: an upper conductive sheet having electrical conductivity; and an upper conductive pin connected to the upper conductive sheet. In the present specification, the upper conductive pin has an upper edge portion which is extended to connect the upper portion of the upper holder (10) as shown in Figs. 4a, 4b, and 5.

The upper conductive sheet can be formed by forming a flexible circuit board on which a conductive layer of a copper material is formed on one side or both sides of the PI film. In this case, in order to improve the conductivity of the conductive layer of the copper material, nickel plating and gold plating may be continuously formed.

In the same manner, the lower contact portion (50) may further include a lower conductive sheet and a lower conductive pin, and in the case of the lower contact portion (50), it may be composed only of the lower conductive sheet.

On the other hand, in a specific embodiment of the invention, it is exemplified that a plurality of upper partitions (11) are formed on the upper support (10). As shown in Figures 4a, 4b and 6, the upper partition (11) is formed to project from the face of the upper support (10) between adjacent upper contacts (40). Therefore, the upper contacts (40) adjacent to each other are spatially separated from each other, so that the electrical connection between the adjacent contacts (40) adjacent to each other can be intercepted.

In the same manner, a plurality of lower partitions (21) may be formed in the lower support (20). As shown in Figures 4a, 4b and 6, the lower partition (21) is formed to project from the face of the lower support (20) between adjacent lower contacts. Therefore, the lower contacts adjacent to each other can be spatially separated from each other, so that the electrical connection between the adjacent lower contacts can be intercepted.

On the other hand, as shown in Fig. 6, an upper through hole (12) corresponding to the upper contact portion (40) may be formed at a position of the upper holder (10) in which the plurality of upper contact portions (40) are joined. In the present specification, the upper contact portion (40) may be transmitted through the other side of the upper holder (10) in a state where the upper contact portion (40) is disposed on the surface on one side of the upper holder (10). The bonding material (71) of the upper via hole (12) is cured to be bonded to the upper holder (10).

In the same manner, as shown in Fig. 6, a lower through hole (22) corresponding to the lower contact portion (50) may be formed at a position of the lower holder (20) in which the plurality of lower contact portions (50) are joined. In the present specification, the lower contact portion (50) can be passed through the lower side of the lower holder (20) in a state where the lower contact portion (50) is disposed on the surface on one side of the lower holder (20). The bonding material (72) of the through hole (22) is cured to be bonded to the lower holder (20).

In the present specification, it is exemplified that the joining material (71, 72) is made of a material containing an elastic liquid silicone. Thus, the elastic bonding material (71, 72) can elastically support the upper contact portion (40) and the lower contact portion (50) in the upper and lower directions, and as such, in the semiconductor device using the semiconductor test socket (100) (3) During the test, the upper contact portion (40) and the lower contact portion (50) are independently and elastically movable in the upper and lower directions, thereby achieving more stable contact.

Referring again to FIG. 4a, each of the conductive connections (60) is electrically connected to the corresponding upper contact portion (40) and lower contact portion (50). Thus, an upper contact portion (40), a conductive connection portion (60), and a lower contact portion (50) are arranged to form a conductive line in the upper and lower directions. In the present invention, it is exemplified that the conductive connection portion (60) is formed of one or several conductive wires or a plurality of conductive strands.

In the present specification, if the conductive connection portion (60) is provided in the form of a conductive wire, one side of the conductive connection portion (60) may be welded to the upper contact portion (for example, the upper conductive sheet) (40), and the other One side can be welded to the lower contact (eg, lower conductive sheet) (50).

Further, as shown in FIG. 4, it is exemplified that the conductive connecting portion (60) includes an intermediate portion which is curved in the direction of the board surface. In this way, it is possible to avoid the application of pressure in the lower direction in the test process of the semiconductor device (3) to cause the disconnected conductive connection portion (60).

Through the foregoing structure, the upper holder (10) and the lower holder (20) are separately provided, and the upper contact stitch and the lower contact stitch are connected through the conductive connection portion (60) to form a conductive pattern in the upper and lower directions. Therefore, fine pitch can be implemented, and life can be prevented from being shortened due to the deviation of the conductive power.

Hereinafter, referring to FIG. 7 to FIG. 9, a semiconductor test socket (100) according to a first embodiment of the present invention will be described in detail.

As shown in FIGS. 7 to 9, a semiconductor test socket (100) according to a first embodiment of the present invention includes: a main casing (110); a plurality of bidirectional conductive pattern modules (1) for testing semiconductors; a first upper support member (121); a second lower support member (142); a first elastic restoring portion (131); and a second elastic restoring portion (132).

In the present specification, since the bidirectional conductive pattern module (1) for testing a semiconductor is as described above, detailed description thereof will be omitted, and constituent elements of the bidirectional conductive pattern module (1) shown in FIGS. 7 to 9 will be partially omitted. Reference number.

The main casing (110) has an open shape in the upper and lower directions, and in the first embodiment of the present invention, it exemplifies that the main casing (110) substantially adopts a rectangular shape. Further, on a pair of opposite sides of one of the main casings (110) facing each other, a plurality of slits (111) are correspondingly formed.

Each of the two-way conductive pattern modules (1) for testing semiconductors is inserted into a pair of opposing slits (111). That is, the bidirectional conductive pattern module (1) is mounted on the main casing (110) in a manner that the edges of the two sides of the lower support (20) of the bidirectional conductive pattern module (1) are first inserted. The pair of slits (111) and then the edges of the upper sides of the upper holder (10) are inserted into the corresponding slits (111).

In the present specification, a cover portion (not shown) in the form of a hollow frame is joined to the upper portion of the main casing (110), and in a state in which the bidirectional conductive pattern module (1) is exposed upward, a plurality of bidirectional conductive pattern modes are used. The group (1) is fixed to the main casing (110). In this case, if the cover portion is pressed in the lower direction to be fixed to the test device, the lower contact portion (50) of the bidirectional conductive pattern module (1) remains in contact with the spacer of the test device.

In this specification, various types of structures may be provided to maintain stable contact between the lower contact portion (50) and the spacer of the test device. As shown in an example, in a state in which the bidirectional conductive pattern module (1) is fixed inside the main casing (110), a structure is applied, which is applied to the main casing (110) in the downward direction of the cover portion. In the state, the cover is joined to the test device. As shown in another example, a structure may also be applied which is such that the lower support (20) of the bidirectional conductive pattern module (1) projects further away from the main housing (110) than the upper support (10). On both sides, and when the lower support (20) is depressed in the lower direction, the cover portion is joined to the test device.

As shown in FIG. 9, in a state in which the bidirectional conductive pattern module (1) is inserted into the slot, the first upper support member (121) and the second upper support member (122) are in contact with the bidirectional conductive pattern module (1). Both sides of the upper support (10) in the direction of the board surface. In a first embodiment of the invention, the first upper support member (121) and the second upper support member (122) are in contact with the bottom surface of the upper support (10).

The first elastic restoring portion (131) elastically supports the first upper support member (121) in the upper direction. Further, the second elastic restoring portion (132) elastically supports the second upper support member (122) in the upper direction.

In the present invention, as shown in Fig. 9, the first elastic restoring portion (131) and the second elastic restoring portion (132) are exemplified in the form of an elastic spring using a metal material. Further, as shown in FIG. 8, it is exemplified that the first elastic restoring portion (131) and the second elastic restoring portion (132) are composed of a pair of elastic springs, and are disposed on the first upper supporting member (121). Both sides in the longitudinal direction and both sides of the second upper support member (122) in the longitudinal direction.

In the present specification, as shown in FIG. 7, a semiconductor test socket (100) according to a first embodiment of the present invention may include a first lower support portion; and a second lower support portion which is from the main casing ( 110) extends on both sides. In the present specification, the first lower support portion (141) supports the lower side of the first elastic restoring portion (131), and the second lower support member (142) supports the lower side of the second elastic restoring portion (132). Further, the first elastic restoring portion (131) is a restoring force that provides the first upper support member (121) in the upper direction between the first upper support member (121) and the first lower support member (141), and the second The elastic restoring portion (132) is a restoring force that provides the second upper support member (122) between the second upper support member (122) and the second lower support portion.

Hereinafter, an operation method of the semiconductor test socket (100) in the process of testing the semiconductor device (3) using the semiconductor test socket (100) according to the first embodiment of the present invention will be described with reference to Figs. 10a to 11b.

First, the terminals (3a, 3b, 3c, and 3d) formed in the semiconductor device (3), such as a ball grid, may have a fixed size or have different sizes as shown in Fig. 10a. If it is lowered for testing the semiconductor device (3), as shown in FIG. 10b, the upper contact portion (40) of the bidirectional conductive pattern module (1) (contacting a terminal (3a) protruding in the direction of the semiconductor test socket (100) And 3d)) may be lowered by pressure, and as described above, the corresponding upper contact portion (40) may be arranged to move independently from the other upper contact portion (40).

If the semiconductor device (3) for testing is further lowered, as shown in FIG. 11a, in the state where all the terminals (3a, 3b, 3c, and 3d) of the semiconductor device (3) are in contact with the upper contact portion (40), the semiconductor device (3) will decline. In this state, if a constant pressure is further applied in the lower direction, the upper holder (10) presses the first upper support member (121) and the second upper support member (122) in the lower direction, and as shown in Fig. 11b, The support (10) is lowered (T→Ta). In the present specification, in the process as shown in Figs. 10b, 11a, and 11b, the elastic connecting portion (30) is elastically supported by the upper support (10) against the pressure in the lower direction.

In addition, if the test is completed and the semiconductor device (3) is removed, the upper support (10) can be raised to its original position by the elastic restoring force of the first elastic restoring portion (131) and the second elastic restoring portion (132). (T, see Figure 10a).

Through the foregoing structure, the pressure generated in the lower direction of the test semiconductor device (3) can pass through the upper contact portion (40), the elastic connection portion (30), the first elastic restoration portion (131), and the second elastic restoration portion (132). ) elastic support, so that it becomes more stable.

Further, even if the elastic force of the elastic connecting portion (30) or the bonding material (71) supporting the upper contact portion (40) is slightly deteriorated due to the continuous test process, the first elastic restoring portion (131) and the second elastic restoring portion (132) The upper support (10) is restored to its original position, thereby extending the life of the semiconductor test socket (100).

Hereinafter, referring to Figures 12 and 13, a semiconductor test socket (100a) according to a second embodiment of the present invention will be described. In the present specification, a semiconductor test socket (100a) according to a second embodiment of the present invention is a modified example of the first embodiment, and includes a first elastic restoring portion (131a) and a second elastic restoring portion (132a). ) different structures.

According to the second embodiment of the present invention, the first elastic restoring portion (131a) and the second elastic restoring portion (132a) may be provided in a rod shape having elasticity in the thickness direction. For example, the first elastic restoring portion (131a) and the second elastic restoring portion (132a) may be made of a silicone material.

Further, the first elastic restoring portion (131a) may be disposed along a direction in which the slit (111) between the first support member (121) and the first lower support member (141) is formed. In the same manner, the second elastic restoring portion (132a) may be disposed along the direction in which the slit (111) between the second upper support member (122) and the second lower support member (142) is formed.

The semiconductor test socket (100) according to the second embodiment of the present invention having the foregoing structure provides the same functions and effects as those according to the first embodiment.

Hereinafter, referring to Figures 14 and 15, a semiconductor test socket (100b) according to a third embodiment of the present invention will be explained. In the present specification, a semiconductor test socket (100b) according to a third embodiment of the present invention is a modified example of the second embodiment.

As shown in FIGS. 14 and 15, a semiconductor test socket (110b) according to a third embodiment of the present invention includes a main housing (110), a bidirectional conductive pattern module (1), and a first elastic restoring portion (131b). And a second elastic restoring portion (132b). In the present specification, since the structures of the main casing (110) and the bidirectional conductive pattern module (1) conform to the structures according to the first embodiment and the second embodiment, the description thereof will be omitted.

As in the second embodiment, the first elastic restoring portion (131b) and the second elastic restoring portion (132b) may be provided in a rod shape having elasticity in the thickness direction, and as shown in FIGS. 14 and 15, a cylindrical body may be employed. The form is provided.

In the present specification, when the upper support (10) and the lower support (20) of the bidirectional conductive pattern module (1) are inserted into the slit (111), the edges of both sides thereof extend toward the main casing (110). The outside.

In this case, as shown in FIG. 15, the first elastic restoring portion (131b) and the second elastic restoring portion (132b) are disposed between the upper support (10) and the lower support (20), which are along the slit. The forming direction of (111) protrudes from the outer side of the main casing (110).

That is, in the third embodiment of the present invention, which illustrates the removal of the first upper support member (121), the second upper support member (122), and the first lower support member (141) according to the second embodiment. And the second lower support member (142), and a first elastic restoring portion (131b) and a second elastic restoring portion (132b) provide restoring force between the upper support (10) and the lower support (20) . Thus, in the case where the bidirectional conductive pattern module (1) is pressed in the lower direction and the upper holder (10) is moved in the lower direction, the first elastic restoring portion (131b) and the second elastic restoring portion (132b) are in the upward direction. Provides the resilience of the upper support (10) directly.

Although the present invention has been described in connection with the specific embodiments of the present invention, it is understood that various modifications and changes may be made without departing from the spirit and scope of the invention. The scope of the invention is defined by the scope of the appended claims and their equivalents.

1‧‧‧Two-way conductive pattern module
3‧‧‧Semiconductor device
3a~3d‧‧‧ terminals
10‧‧‧Upper support
11‧‧‧Upper partition
12‧‧‧Upper through hole
20‧‧‧ lower support
21‧‧‧lower partition
22‧‧‧Under hole
30‧‧‧Flexible connection
31‧‧‧Upper Elastic Department
32‧‧‧Intermediate elastic part
33‧‧‧ Lower elastic section
40‧‧‧Upper contact
50‧‧‧Contacts
60‧‧‧Electrical connection
71‧‧‧Material materials
72‧‧‧ joining materials
100‧‧‧Semiconductor test socket
100a‧‧‧Semiconductor test socket
100b‧‧‧Semiconductor test socket
110‧‧‧Main housing
111‧‧‧slit
120‧‧ ‧ spring stitches
121‧‧‧First upper support member
122‧‧‧ Spring
122‧‧‧Second upper support member
123‧‧‧Contact tip
124‧‧‧ hollow cylindrical cylinder
130‧‧‧Semiconductor device
131‧‧‧First Elastic Restoration Department
131a‧‧‧First Elastic Restoration Department
131b‧‧‧First Elastic Restoration Department
132‧‧‧Second elastic rehabilitation department
132a‧‧‧Second Elastic Restoration Department
132b‧‧‧Second Elastic Restoration Department
140‧‧‧Testing device
141‧‧‧First lower support
142‧‧‧Second lower support member
1000‧‧‧Semiconductor test socket
1100‧‧‧ main housing
1000‧‧‧shell
1110‧‧‧through hole
1200‧‧ ‧ spring stitches
1210‧‧‧Contact pins
1220‧‧ spring
1230‧‧‧Contact tip
1240‧‧‧ hollow cylindrical cylinder
1300‧‧‧ semiconductor device
1310‧‧‧ Terminal
1400‧‧‧Testing device
1410‧‧‧ pads
Ta‧‧‧ decline
T‧‧‧ original location

1 to 3 are diagrams for explaining a spring pin type semiconductor test socket used in the related art; FIGS. 4a and 4b are diagrams schematically illustrating a bidirectional conductive pattern module for testing a semiconductor according to an embodiment of the present invention; Figure 5 is a schematic view showing the back side of the bidirectional conductive pattern module shown in Figure 4a; Figure 6 is a schematic view showing an upper support and a lower support of the bidirectional conductive pattern module shown in Figure 4; 9 is a diagram for explaining a semiconductor test socket according to a first embodiment of the present invention; and FIGS. 10a to 11b are diagrams for explaining a method of operating a semiconductor test socket according to a first embodiment of the present invention; 12 and FIG. 13 are diagrams for explaining a semiconductor test socket according to a second embodiment of the present invention; and FIGS. 14 and 15 are diagrams for explaining a semiconductor test socket according to a third embodiment of the present invention. .

1‧‧‧Two-way conductive pattern module

10‧‧‧Upper support

11‧‧‧Upper partition

20‧‧‧ lower support

21‧‧‧lower partition

30‧‧‧Flexible connection

40‧‧‧Upper contact

50‧‧‧Contacts

60‧‧‧Electrical connection

Claims (16)

A bidirectional conductive pattern module for testing a semiconductor, comprising: an upper support which is an insulating material; a lower support which is an insulating material, the lower support is spaced apart from the upper support in the upper and lower directions An elastic connecting portion elastically connecting the upper support and the lower support to each other in a state in which the upper support and the lower support are spaced apart from each other in the upper and lower directions; a plurality of upper contact portions, a surface having conductivity and joined to one side of the upper support to be spaced apart from each other along a plate surface direction of the upper support; a plurality of lower contacts electrically conductive and bonded to one of the lower supports The side surfaces are spaced apart from each other along the plate surface direction of the lower holder; and a plurality of conductive connecting portions electrically connecting the upper contact portions to the lower contact portions corresponding to each other. The bidirectional conductive pattern module of claim 1, wherein: a plurality of upper partitions formed on the upper support and extending from the upper surface of the upper support between the adjacent upper contacts Separating the adjacent upper contact portions from each other; and a plurality of lower partition portions formed on the lower support and extending from the plate surface of the lower support between the adjacent lower contact portions, Separating the adjacent lower contacts from each other in space. The bidirectional conductive pattern module of claim 1, wherein an upper through hole corresponding to the upper contact portions is formed on the upper support, and the upper contact portions are joined to the upper support by curing of the bonding material. a joint material flowing through the upper through holes from the other side of the upper support in a state where the upper contact portions are disposed on a surface on one side of the upper support; and corresponding to the lower portions a lower through hole of the contact portion is formed at the lower support, and the lower contact portions are joined to the lower support through curing of the bonding material, and the bonding material is disposed at the lower support at the lower contact portion In the state of the surface on one side, the lower through holes are flowed from the other side of the lower holder. The bidirectional conductive pattern module of claim 3, wherein the bonding material is made of a material containing an elastic liquid silicone. The bidirectional conductive pattern module of claim 3, wherein the upper contact portions are disposed to be elastically movable independently of each other in the upper and lower directions by the elastic bonding material. The bidirectional conductive pattern module of claim 1, wherein the conductive connection portion is formed by at least one conductive line or a plurality of stranded conductive lines. The bidirectional conductive pattern module of claim 6, wherein the conductive connection portion comprises an intermediate portion that is curved in the direction of the plate surface. The bidirectional conductive pattern module of claim 1, wherein the elastic connecting portion is formed of a material containing elastic silicone. The bidirectional conductive pattern module of claim 8, wherein the elastic connecting portion comprises an upper elastic portion, an intermediate elastic portion, and a lower elastic portion, and the intermediate elastic portion is made of a material having elasticity, and the elastic portion thereof It is stronger than the elasticity of the upper elastic portion and the lower elastic portion. The two-way conductive pattern module of claim 1, wherein the elastic connecting portion comprises: a mesh type substrate; and an elastic coating layer, which is a silicone material, wherein the substrate is coated with the elastic coating layer. Cured in the state. The bidirectional conductive pattern module of claim 1, wherein the upper contact portion comprises: an upper conductive plate having electrical conductivity; and an upper conductive pin connected to the upper conductive sheet and having an upper edge extending toward the The upper part of the upper support. A semiconductor test socket comprising: a main casing having an opening shape in an upper and lower direction, and a plurality of correspondingly formed slots are formed on opposite sides of one of the main casings; a plurality of bidirectional conductive A pattern module, as claimed in any one of claims 1 to 10, for testing a semiconductor inserted in a pair of opposite slits; a first upper support member and a second upper support member in the two-way Inserting the conductive pattern modules into the slots, respectively contacting the two sides of the upper surface of the upper support of the two-way conductive pattern module; and a first elastic restoring portion and a second elastic restoring portion And elastically supporting the first upper support member and the second upper support member in an upward direction, wherein if the two-way conductive pattern module is pressed in a downward direction by a semiconductor device of a test target, and the upper support moves in a downward direction, The first elastic restoring portion and the second elastic restoring portion provide a restoring force in the upper direction. The semiconductor test socket of claim 12, further comprising: a first lower support member; and a second lower support member extending from both sides of the main housing to respectively support the first elastic restoring portion a lower side of the second elastic restoring portion, wherein the first elastic restoring portion and the second elastic restoring portion are between the first upper support member and the first lower support member, and between the second upper support member and the second lower support member Provides resilience in the upper direction. The semiconductor test socket of claim 13, wherein each of the first elastic restoring portion and the second elastic restoring portion comprises at least one elastic spring. The semiconductor test socket according to claim 13, wherein the first elastic restoring portion and the second elastic restoring portion are provided in a rod shape having elasticity in a thickness direction, and are disposed between the first upper support member and the first lower support member, And a direction in which the slit is formed between the second upper support member and the second lower support member. A semiconductor test socket comprising: a main casing having an opening shape in an upper and lower direction, and a plurality of correspondingly formed slots are formed on opposite sides of one of the main casings; a plurality of bidirectional conductive The pattern module of any one of claims 1 to 10 for testing a semiconductor inserted into a pair of opposite slits; and a first elastic restoring portion and a second elastic restoring portion, which are used in thickness The upper direction of the two-way conductive pattern module has a double edge portion, and when the upper support and the lower support are inserted into the slits, the outer support and the lower support have a double edge. The outer side of the main casing, the first elastic restoring portion and the second elastic restoring portion are disposed along the direction in which the slit is formed, and are disposed between the upper and lower supports extending to the outside of the main casing; and if the two-way The conductive pattern module is pressed in a downward direction by a semiconductor device of a test target, and the upper support moves in a downward direction, and the first elastic restoring portion and the second elastic restoring portion provide a restoring force in an upward direction.