TW201724581A - Light emitting element, light emitting element package and light emitting element manufacturing method providing a light emitting element high in quality and miniaturized and thinned - Google Patents

Light emitting element, light emitting element package and light emitting element manufacturing method providing a light emitting element high in quality and miniaturized and thinned Download PDF

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TW201724581A
TW201724581A TW105142050A TW105142050A TW201724581A TW 201724581 A TW201724581 A TW 201724581A TW 105142050 A TW105142050 A TW 105142050A TW 105142050 A TW105142050 A TW 105142050A TW 201724581 A TW201724581 A TW 201724581A
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light
emitting element
resin
protective resin
element wafer
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TW105142050A
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TWI631737B (en
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福田和彥
田村敏隆
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夏普股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/52Encapsulations
    • H01L33/54Encapsulations having a particular shape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0095Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/52Encapsulations
    • H01L33/56Materials, e.g. epoxy or silicone resin
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85909Post-treatment of the connector or wire bonding area
    • H01L2224/8592Applying permanent coating, e.g. protective coating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008Processes
    • H01L2933/0033Processes relating to semiconductor body packages
    • H01L2933/005Processes relating to semiconductor body packages relating to encapsulations

Abstract

This invention provides a light emitting element and the like which are high in quality and miniaturized and thinned. The light emitting element (1) includes a light emitting element chip (2) and a protective resin (3). The light emitting element chip (2) includes a substrate (2a) and a light emitting portion arranged on the substrate (2a). The protective resin (3) covers a side surface of the light emitting portion (2b) including a boundary portion between the substrate (2a) and the light emitting portion (2b) and also covers a part of the side face of the substrate (2a) containing the boundary portion.

Description

發光元件、發光元件封裝體以及發光元件的製造方法Light-emitting element, light-emitting element package, and method of manufacturing the same

本發明關於使用在複印機、傳真機、印表機等電子機器的光感測器等所具備的發光元件晶片的發光元件、藉由樹脂將發光元件密封的發光元件封裝體、以及發光元件的製造方法。The present invention relates to a light-emitting element of a light-emitting element wafer provided in a photosensor such as an electronic device such as a copying machine, a facsimile machine, or a printer, a light-emitting element package in which a light-emitting element is sealed by a resin, and a light-emitting element. method.

以往,在複印機或印表機等電子機器使用有以非接觸方式進行物體有無的檢測的光感測器。作為光感測器的一例,有光電遮斷器。光電遮斷器為具備發光元件及受光元件的二個元件並以受光元件測量從發光元件產生的光且掌握元件間的光的變化的感測器。Conventionally, an optical sensor such as a copier or a printer has used a photosensor that detects the presence or absence of an object in a non-contact manner. As an example of the photo sensor, there is a photo interrupter. The photointerrupter is a sensor including two elements of a light-emitting element and a light-receiving element, and measures light generated from the light-emitting element by the light-receiving element, and grasps a change in light between the elements.

使用於發光元件的保護的密封樹脂必須為具有光透射性的樹脂。然而,具有光透射性的樹脂,與一般作為密封樹脂使用的黑色環氧樹脂相比,會有應力變高的問題。此外,由於使用環境的溫度變化所產生的密封樹脂的膨脹及收縮的應力大時,會有以GaAs(砷化鎵、galliumarsenide)為材料的發光元件的發光強度隨時間明顯地劣化的問題。The sealing resin used for the protection of the light-emitting element must be a resin having light transparency. However, the resin having light transmissivity has a problem that stress is higher than that of a black epoxy resin generally used as a sealing resin. Further, when the stress of expansion and contraction of the sealing resin due to the temperature change of the use environment is large, there is a problem that the light-emitting intensity of the light-emitting element made of GaAs (gallium gallium arsenide) is significantly deteriorated with time.

因此,為了緩和由使用環境的溫度變化產生的內部應力,從以往提案使用應力不同的二種樹脂作為保護發光元件的本體部亦即發光元件晶片的樹脂。例如,在專利文獻1揭示如下技術,將由低應力化後的環氧系合成樹脂形成的下層封裝體形成為直接被覆搭載於電路基板的LED半導體晶片,接著,將由環氧系合成樹脂形成的上層封裝體形成為被覆下層封裝體整體。Therefore, in order to alleviate the internal stress caused by the temperature change in the use environment, it has been conventionally proposed to use two kinds of resins having different stresses as the resin of the light-emitting element wafer which is a main body portion for protecting the light-emitting element. For example, Patent Document 1 discloses a technique in which a lower layer package formed of a low-stressed epoxy-based synthetic resin is formed by directly coating an LED semiconductor wafer mounted on a circuit board, and then an upper layer package formed of an epoxy-based synthetic resin. The body is formed to cover the entire underlying package.

專利文獻1:日本特開2003-179267號公報(2003年6月27日公開)Patent Document 1: Japanese Laid-Open Patent Publication No. 2003-179267 (published on June 27, 2003)

此處,為了防止發光元件晶片的發光強度的劣化,必須以樹脂覆蓋的發光元件晶片的區域為發光元件晶片的發光部(PN接合部)中的露出發光元件晶片的外部的部位。然而,在習知技術,直接覆蓋發光元件晶片的保護樹脂的流動性高的情形(例如,矽氧樹脂的黏度為9~15帕斯卡秒(Pa・S)),會有保護樹脂流動而無法覆蓋必須以樹脂覆蓋的發光元件晶片的區域的問題。此外,為了使搭載發光元件晶片的產品小型化,必須使直接覆蓋發光元件晶片的保護樹脂的量變少,當保護樹脂的量過少時,會有無法覆蓋必須以樹脂覆蓋的發光元件晶片的區域的情形。Here, in order to prevent deterioration of the light-emitting intensity of the light-emitting element wafer, the region of the light-emitting element wafer that is required to be covered with the resin is a portion of the light-emitting portion (PN junction portion) of the light-emitting element wafer that is exposed outside the light-emitting element wafer. However, in the conventional technique, when the fluidity of the protective resin directly covering the light-emitting element wafer is high (for example, the viscosity of the silicone resin is 9 to 15 Pascal seconds (Pa·S)), the protective resin flows and cannot be covered. The problem of the area of the light-emitting element wafer that must be covered with a resin. Further, in order to reduce the size of the product on which the light-emitting element wafer is mounted, it is necessary to reduce the amount of the protective resin directly covering the light-emitting element wafer, and when the amount of the protective resin is too small, there is a possibility that the area of the light-emitting element wafer which must be covered with the resin cannot be covered. situation.

此外,上述專利文獻1的技術中,會有必須使搭載LED半導體晶片的電路基板的面積變大的問題。此為用於在低應力化後的環氧系合成樹脂形成為覆蓋LED半導體晶片時不使該環氧系合成樹脂從電路基板往外部流出的措施。Further, in the technique of Patent Document 1, there is a problem that the area of the circuit board on which the LED semiconductor wafer is mounted must be increased. This is a measure for forming the epoxy-based synthetic resin after the low stress is formed so as not to allow the epoxy-based synthetic resin to flow out from the circuit board when covering the LED semiconductor wafer.

本發明有鑑於上述問題點而構成,其目的在於提供高品質且小型化及薄型化的發光元件等。The present invention has been made in view of the above problems, and an object thereof is to provide a light-emitting element or the like which is high in quality, small in size, and thin.

為了解決上述問題,本發明一形態的發光元件,具備發光元件晶片、及保護該發光元件晶片的保護樹脂,其特徵在於:該發光元件晶片具備基板與配置在該基板上的發光部;該保護樹脂覆蓋包含該基板與該發光部的邊界部的該發光部的側面,且亦覆蓋包含該邊界部的該基板的側面的一部分。In order to solve the above problems, a light-emitting element according to one aspect of the present invention includes a light-emitting element wafer and a protective resin for protecting the light-emitting element wafer, wherein the light-emitting element wafer includes a substrate and a light-emitting portion disposed on the substrate; The resin covers a side surface of the light-emitting portion including a boundary portion between the substrate and the light-emitting portion, and also covers a portion of a side surface of the substrate including the boundary portion.

此外,本發明一形態的發光元件的製造方法,從作為具備基板及配置在該基板上的發光部的發光元件晶片的材料的發光元件晶圓製造發光元件,其特徵在於,包含:第1步驟,在夾著該發光部位於與該基板相反側的該發光元件晶圓的上面,形成用以將該發光元件晶圓區分成該發光元件單位的具有到達超過該發光部與該基板的邊界部的位置的深度的槽;第2步驟,以保護樹脂覆蓋在該第1步驟形成的該槽及該發光元件晶圓的該上面;第3步驟,於在該第2步驟覆蓋的該發光元件晶圓的該上面的該保護樹脂,就該發光元件單位分別形成開口部;以及第4步驟,在該第3步驟之後,沿著在該第1步驟形成的該槽,將該發光元件晶圓分割成該發光元件單位。Further, in the method of manufacturing a light-emitting device according to the aspect of the invention, the light-emitting element is manufactured from a light-emitting element wafer including a substrate and a light-emitting element wafer of a light-emitting portion disposed on the substrate, and includes: a first step Forming the light-emitting element wafer on the upper surface of the light-emitting element wafer opposite to the substrate, and forming the light-emitting element wafer into the light-emitting element unit having a boundary portion exceeding the light-emitting portion and the substrate a groove having a depth of position; a second step of covering the groove formed in the first step and the upper surface of the light-emitting element wafer with a protective resin; and a third step of crystallizing the light-emitting element covered in the second step The protective resin on the upper surface of the circle forms an opening in each of the light-emitting element units; and in the fourth step, after the third step, the light-emitting element wafer is divided along the groove formed in the first step The unit of the light-emitting element.

根據本發明一形態,發光元件具備的保護樹脂覆蓋包含基板與發光部的邊界部的發光部的側面及包含邊界部的基板的側面的一部分。藉此,保護樹脂可確實地覆蓋包含邊界部的發光元件晶片的側面中至少發光部的該側面。另外,由於保護樹脂為覆蓋發光元件晶片的該側面的一部分的構成,因此與保護樹脂覆蓋發光元件晶片的該側面的全部的情形相較,可縮小塗布有保護樹脂的發光元件晶片的區域。因此,能以少量的保護樹脂保護發光部的該側面。其結果,可保持高品質的發光元件,且實現發光元件的小型化及薄型化。另外,由於能使密封發光元件的硬質樹脂的量變少,因此在發光元件由硬質樹脂密封的情形,可實現具備該發光元件與該硬質樹脂的發光元件封裝體的小型化及薄型化。According to the aspect of the invention, the protective resin provided in the light-emitting element covers a side surface of the light-emitting portion including the boundary portion between the substrate and the light-emitting portion, and a part of the side surface of the substrate including the boundary portion. Thereby, the protective resin can surely cover at least the side surface of the light-emitting portion of the side surface of the light-emitting element wafer including the boundary portion. Further, since the protective resin covers a part of the side surface of the light-emitting element wafer, the area of the light-emitting element wafer coated with the protective resin can be reduced as compared with the case where the protective resin covers the entire side surface of the light-emitting element wafer. Therefore, the side surface of the light-emitting portion can be protected with a small amount of the protective resin. As a result, a high-quality light-emitting element can be maintained, and the size and thickness of the light-emitting element can be reduced. In addition, since the amount of the hard resin that seals the light-emitting element can be reduced, when the light-emitting element is sealed with a hard resin, the light-emitting element package including the light-emitting element and the hard resin can be reduced in size and thickness.

另外,藉由在打線前以保護樹脂塗布元件的晶片表面及邊緣,成為即使在外部力量造成的金屬線變形、或模具樹脂的填充時產生的金屬線位移導致與晶片邊緣的接觸時亦能以保護樹脂電絕緣的構造。因此,可預防金屬線與晶片元件接觸所引起的缺陷產生。In addition, by coating the surface and the edge of the wafer with the protective resin before the wire bonding, it becomes possible to contact the edge of the wafer even when the metal wire is deformed by the external force or the metal wire is displaced during the filling of the mold resin. A structure that protects the resin from electrical insulation. Therefore, it is possible to prevent the occurrence of defects caused by the contact of the metal wires with the wafer elements.

(實施形態1) 以下,詳細說明本發明的實施形態。此外,為了方便說明,針對與各實施形態所示的構件具有相同功能的構件賦予相同符號,適當地省略其說明。首先,參照圖1~圖5說明實施形態1。(Embodiment 1) Hereinafter, an embodiment of the present invention will be described in detail. In the following description, members having the same functions as those of the members described in the respective embodiments are denoted by the same reference numerals, and the description thereof will be appropriately omitted. First, the first embodiment will be described with reference to Figs. 1 to 5 .

(發光元件1的主要部分構成) 圖1(a)為表示本發明一實施形態的發光元件1的主要部位構成的剖面圖。如圖1(a)所示,發光元件1搭載於由銅等構成的第1引線架31上,被銀糊等導電性接著劑33固定。發光元件1具備發光元件晶片2及保護樹脂3。發光元件晶片2為例如半導體雷射及發光二極體,使n型半導體層(以下,稱為基板2a)與p型半導體層接觸。發光部2b為n型半導體層與p型半導體層相接的PN接合部,當對發光元件晶片2施加順向電壓時,即從發光部2b放出光。在圖1(a)所示的例子,發光部2b配置在基板2a上。(Main Configuration of Light-Emitting Element 1) Fig. 1(a) is a cross-sectional view showing the configuration of a main part of a light-emitting element 1 according to an embodiment of the present invention. As shown in FIG. 1(a), the light-emitting element 1 is mounted on a first lead frame 31 made of copper or the like, and is fixed by a conductive adhesive 33 such as a silver paste. The light-emitting element 1 includes a light-emitting element wafer 2 and a protective resin 3. The light-emitting element wafer 2 is, for example, a semiconductor laser and a light-emitting diode, and an n-type semiconductor layer (hereinafter referred to as a substrate 2a) is brought into contact with the p-type semiconductor layer. The light-emitting portion 2b is a PN junction portion where the n-type semiconductor layer and the p-type semiconductor layer are in contact with each other, and when a forward voltage is applied to the light-emitting element wafer 2, light is emitted from the light-emitting portion 2b. In the example shown in Fig. 1(a), the light-emitting portion 2b is disposed on the substrate 2a.

在位於與第1引線架31相反側的發光元件晶片2的面上配置電極墊4,電極墊4與由銅等構成的第2引線架32被由金等構成的金屬線5電連接。此外,以下說明中,配置有電極墊4的發光元件晶片2的面作為發光元件晶片2的上面。另外,發光部2b露出於發光元件晶片2的外部的發光部2b的面(包含基板2a與發光部2b的邊界部的發光部2b的面)作為發光部2b的側面。此外,發光元件晶片2的側面包含發光部2b的側面,基板2a的側面包含於發光元件晶片2的側面。The electrode pad 4 is placed on the surface of the light-emitting element wafer 2 on the side opposite to the first lead frame 31, and the electrode pad 4 and the second lead frame 32 made of copper or the like are electrically connected by a metal wire 5 made of gold or the like. In the following description, the surface of the light-emitting element wafer 2 on which the electrode pads 4 are disposed is referred to as the upper surface of the light-emitting element wafer 2. Further, the light-emitting portion 2b is exposed on the surface of the light-emitting portion 2b outside the light-emitting element wafer 2 (the surface including the light-emitting portion 2b at the boundary portion between the substrate 2a and the light-emitting portion 2b) as the side surface of the light-emitting portion 2b. Further, the side surface of the light-emitting element wafer 2 includes the side surface of the light-emitting portion 2b, and the side surface of the substrate 2a is included on the side surface of the light-emitting element wafer 2.

此處,必須由保護樹脂3覆蓋的發光元件晶片2的區域,如上述,為發光部2b(PN接合部)中露出於發光元件晶片2的外部的部位。因此,如圖1(a)所示,在發光元件晶片2的側面,露出外部的發光部2b的部位被保護樹脂3覆蓋。藉此,可防止發光元件晶片2的發光強度劣化。Here, the region of the light-emitting element wafer 2 which must be covered with the protective resin 3 is a portion exposed to the outside of the light-emitting element wafer 2 in the light-emitting portion 2b (PN junction portion) as described above. Therefore, as shown in FIG. 1(a), a portion where the external light-emitting portion 2b is exposed on the side surface of the light-emitting element wafer 2 is covered with the protective resin 3. Thereby, the light emission intensity of the light-emitting element wafer 2 can be prevented from deteriorating.

圖1(b)為表示作為比較例的發光元件101的概要的側視圖。如圖1(b)所示,保護樹脂103為覆蓋發光元件晶片102整體的構成。另一方面,圖1(a)所示的保護樹脂3為覆蓋發光元件晶片2的上面的一部分及發光元件晶片2的側面的一部分的構成。根據此構成,圖1(a)所示的保護樹脂3的量,相較於圖1(b)所示的保護樹脂103的量可進一步地減少,可實現發光元件1的小型化及薄型化。Fig. 1(b) is a side view showing an outline of a light-emitting element 101 as a comparative example. As shown in FIG. 1(b), the protective resin 103 is configured to cover the entire light-emitting element wafer 102. On the other hand, the protective resin 3 shown in FIG. 1(a) is a structure that covers a part of the upper surface of the light-emitting element wafer 2 and a part of the side surface of the light-emitting element wafer 2. According to this configuration, the amount of the protective resin 3 shown in FIG. 1(a) can be further reduced as compared with the amount of the protective resin 103 shown in FIG. 1(b), and the size and thickness of the light-emitting element 1 can be reduced. .

另外,圖1(a)所示的保護樹脂3,與圖1(b)所示的保護樹脂103相較,為沿著發光元件晶片2的形狀以一定厚度保護發光元件晶片2的構成。根據此構成,圖1(a)所示的保護樹脂3的量,相較於圖1(b)所示的保護樹脂103的量可進一步地減少,可實現發光元件1的小型化及薄型化。In addition, the protective resin 3 shown in FIG. 1(a) has a configuration in which the light-emitting element wafer 2 is protected to a certain thickness along the shape of the light-emitting element wafer 2 as compared with the protective resin 103 shown in FIG. 1(b). According to this configuration, the amount of the protective resin 3 shown in FIG. 1(a) can be further reduced as compared with the amount of the protective resin 103 shown in FIG. 1(b), and the size and thickness of the light-emitting element 1 can be reduced. .

(發光元件1的製程) 圖2為表示發光元件晶圓20的外形的圖。發光元件晶圓20為具備基板2a及配置在基板2a上的發光部2b的發光元件1的材料。本發明一實施形態的發光元件1,是在藉由保護樹脂3覆蓋發光元件晶圓20後,將發光元件晶圓20裁切成發光元件1的單位而被製造。以下,說明發光元件1的製程。(Process of Light-Emitting Element 1) FIG. 2 is a view showing an outer shape of the light-emitting element wafer 20. The light-emitting element wafer 20 is made of a material including the substrate 2a and the light-emitting element 1 of the light-emitting portion 2b disposed on the substrate 2a. The light-emitting element 1 according to the embodiment of the present invention is manufactured by covering the light-emitting element wafer 20 with the protective resin 3 and then cutting the light-emitting element wafer 20 into a unit of the light-emitting element 1. Hereinafter, the process of the light-emitting element 1 will be described.

圖3(a)~(f)為表示從發光元件晶圓20製造發光元件1的步驟的圖。圖3(a)為圖2所示的發光元件晶圓20的A-A’剖面圖。發光元件晶圓20,在基板2a上依序重疊有n型半導體層(未圖示)、發光部2b、p型發光層(未圖示)。3(a) to 3(f) are diagrams showing a procedure of manufacturing the light-emitting element 1 from the light-emitting element wafer 20. Fig. 3 (a) is a cross-sectional view taken along line A-A' of the light-emitting device wafer 20 shown in Fig. 2 . In the light-emitting element wafer 20, an n-type semiconductor layer (not shown), a light-emitting portion 2b, and a p-type light-emitting layer (not shown) are sequentially stacked on the substrate 2a.

圖3(b)為表示將發光元件晶圓20暫時分割成發光元件1的單位的步驟的圖。首先,將發光元件晶圓20在切割片50上載置成基板2a朝下(基板2a與切割片50相接)。接著,在發光元件晶圓20的上面,沿著厚度H的方向形成具有到達超過發光部2b與基板2a的邊界部的位置的深度的切割槽51(槽)(第1步驟)。切割槽51為用以將發光元件晶圓20區分成發光元件1的單位的槽。例如,從發光元件晶圓20的上面形成具有厚度H的一半的深度的切割槽51(半切斷)。FIG. 3(b) is a view showing a procedure of temporarily dividing the light-emitting element wafer 20 into units of the light-emitting element 1. First, the light-emitting element wafer 20 is placed on the dicing sheet 50 so that the substrate 2a faces downward (the substrate 2a is in contact with the dicing sheet 50). Next, on the upper surface of the light-emitting element wafer 20, a cutting groove 51 (groove) having a depth reaching a position exceeding a boundary portion between the light-emitting portion 2b and the substrate 2a is formed along the thickness H (first step). The dicing groove 51 is a groove for dividing the light-emitting element wafer 20 into a unit of the light-emitting element 1. For example, a cutting groove 51 (half-cut) having a depth of half the thickness H is formed from the upper surface of the light-emitting element wafer 20.

此處,發光元件晶圓20的上面為夾著發光部2b位於與基板2a相反側的發光元件晶圓20的面,在紙上為發光元件晶圓20上側的面。另外,厚度H的方向為基板2a及發光部2b重疊的方向。Here, the upper surface of the light-emitting element wafer 20 is a surface of the light-emitting element wafer 20 on the opposite side of the substrate 2a with the light-emitting portion 2b interposed therebetween, and is a surface on the upper side of the light-emitting element wafer 20 on the paper. Further, the direction of the thickness H is a direction in which the substrate 2a and the light-emitting portion 2b overlap.

圖3(c)為表示對圖3(b)所示的發光元件晶圓20進行台面蝕刻處理的步驟的圖。台面蝕刻處理為對圖3(b)所示的切割槽51的表面進行加工的處理,為對切割槽51的損傷除去層進行蝕刻的處理。藉由台面蝕刻處理,圖3(b)所示的切割槽51的表面變平滑,形成圖3(c)所示的台面蝕刻槽52。Fig. 3 (c) is a view showing a step of performing a mesa etching process on the light-emitting element wafer 20 shown in Fig. 3 (b). The mesa etching process is a process of processing the surface of the dicing groove 51 shown in FIG. 3(b), and is a process of etching the damage removing layer of the dicing groove 51. By the mesa etching process, the surface of the dicing groove 51 shown in FIG. 3(b) is smoothed, and the mesa etching groove 52 shown in FIG. 3(c) is formed.

圖3(d)為表示以保護樹脂3覆蓋(塗布)發光元件晶圓20的步驟的圖。對圖3(c)所示的發光元件晶圓20,以保護樹脂3覆蓋切割槽51及發光部2b的上面(第2步驟)。在實施形態1中的塗布步驟,在圖3(c)所示的發光元件晶圓20的上面塗布保護樹脂3的液體,使塗布有保護樹脂3的液體的發光元件晶圓20高速旋轉,以其離心力形成保護樹脂3的薄膜(旋塗處理)。由於塗布在發光元件晶圓20的上面的保護樹脂3為液體狀態,因此保護樹脂3的膜可藉由塗布步驟以均勻厚度形成在發光元件晶圓20的上面及台面蝕刻槽52的表面。FIG. 3(d) is a view showing a step of covering (coating) the light-emitting element wafer 20 with the protective resin 3. The light-emitting element wafer 20 shown in FIG. 3(c) covers the upper surface of the dicing groove 51 and the light-emitting portion 2b with a protective resin 3 (second step). In the coating step in the first embodiment, the liquid of the protective resin 3 is applied onto the upper surface of the light-emitting element wafer 20 shown in FIG. 3(c), and the light-emitting element wafer 20 coated with the liquid of the protective resin 3 is rotated at a high speed. The centrifugal force forms a film of the protective resin 3 (spin coating treatment). Since the protective resin 3 coated on the upper surface of the light-emitting element wafer 20 is in a liquid state, the film of the protective resin 3 can be formed on the upper surface of the light-emitting element wafer 20 and the surface of the mesa etching groove 52 with a uniform thickness by a coating step.

作為保護樹脂3,例如為矽氧樹脂、聚醯亞胺樹脂、及聚氨酯樹脂,在密封發光元件的樹脂中,較佳為,使用彈性係數較低的樹脂。藉此,在上述旋塗處理中,能使保護樹脂3的膜成為均勻厚度,且將保護樹脂3的膜形成較薄。其結果,能以更少量的保護樹脂3覆蓋發光部2b。The protective resin 3 is, for example, a silicone resin, a polyimide resin, or a polyurethane resin. In the resin that seals the light-emitting element, a resin having a low modulus of elasticity is preferably used. Thereby, in the above-described spin coating treatment, the film of the protective resin 3 can be made uniform, and the film of the protective resin 3 can be formed thin. As a result, the light-emitting portion 2b can be covered with a smaller amount of the protective resin 3.

另外,在發光元件晶圓20形成有切割槽51。因此,在旋塗處理中,在保護樹脂3覆蓋的發光元件晶片2的區域更少的狀態下,能穩定且容易地藉由保護樹脂3覆蓋欲以樹脂保護發光元件晶片2的部位即發光部2b。Further, a cutting groove 51 is formed in the light-emitting element wafer 20. Therefore, in the spin coating process, in a state where the area of the light-emitting element wafer 2 covered with the protective resin 3 is small, the portion where the light-emitting element wafer 2 is to be protected by the resin can be stably and easily covered with the protective resin 3 2b.

此處,較佳為,在圖3(d)所示的塗布步驟前,電極墊4配置在發光元件晶圓20的上面。此外,電極墊4配置在發光元件晶圓20的上面的時序,並不限於圖3(d)所示的塗布步驟前。例如,該時序亦可為在後述除去步驟(參照圖3(e))之後配置。Here, it is preferable that the electrode pad 4 is disposed on the upper surface of the light-emitting element wafer 20 before the coating step shown in FIG. 3(d). Further, the timing at which the electrode pads 4 are disposed on the upper surface of the light-emitting element wafer 20 is not limited to the coating step shown in FIG. 3(d). For example, the timing may be arranged after the removal step (see FIG. 3(e)) which will be described later.

圖3(e)為表示除去不需要部位的保護樹脂3的步驟的圖。不需要部位的保護樹脂3為電極墊4上的保護樹脂3。在圖3(d)說明的塗布步驟後,在發光元件晶圓20的上面的保護樹脂3,就每一發光元件單位分別形成開口部(第3步驟)。在實施形態1的除去步驟,在不需要部位的保護樹脂3的表面塗布光感光性光阻,由光微影光罩進行曝光及顯影,進行光阻的圖案化。接著,以蝕刻除去電極墊4上的保護樹脂3。Fig. 3(e) is a view showing a step of removing the protective resin 3 at an unnecessary portion. The protective resin 3 of the unnecessary portion is the protective resin 3 on the electrode pad 4. After the coating step described in FIG. 3(d), the protective resin 3 on the upper surface of the light-emitting element wafer 20 is formed with an opening for each light-emitting element unit (third step). In the removal step of the first embodiment, a photo-sensitive resist is applied to the surface of the protective resin 3 at an unnecessary portion, and exposure and development are performed by a photolithographic mask to pattern the photoresist. Next, the protective resin 3 on the electrode pad 4 is removed by etching.

藉由除去步驟,電極墊4成為不被保護樹脂3覆蓋的構成,在電極墊4連接有金屬線5的情形,金屬線5可由一種樹脂加以密封。此外,在發光元件晶圓20的上面藉由除去步驟除去的保護樹脂3,不僅是電極墊4上的保護樹脂3,亦包含電極墊4周圍的保護樹脂3。By the removal step, the electrode pad 4 is not covered by the protective resin 3. When the electrode pad 4 is connected with the metal wire 5, the metal wire 5 can be sealed with a resin. Further, the protective resin 3 removed by the removal step on the upper surface of the light-emitting element wafer 20 includes not only the protective resin 3 on the electrode pad 4 but also the protective resin 3 around the electrode pad 4.

圖3(f)為表示將發光元件晶圓20切割分離成發光元件1的單位的步驟的圖。如圖3(f)所示,沿著台面蝕刻槽52切斷圖3(e)所示的發光元件晶圓20,將發光元件晶圓20分割成發光元件1單位(第4步驟)。藉由以上步驟,製造發光元件1。FIG. 3(f) is a view showing a step of cutting and separating the light-emitting element wafer 20 into units of the light-emitting element 1. As shown in FIG. 3(f), the light-emitting element wafer 20 shown in FIG. 3(e) is cut along the mesa etching groove 52, and the light-emitting element wafer 20 is divided into light-emitting element units 1 (fourth step). The light-emitting element 1 was fabricated by the above steps.

圖4為表示圖3(f)所示的發光元件晶圓20的俯視圖。圖4所示的切斷痕跡53為沿著圖3(f)所示的台面蝕刻槽52切斷發光元件晶圓20的痕跡。如圖4所示,藉由切割片50被拉伸而擴大,相鄰的發光元件1之間的間隙變大。藉此,可容易地拾取各發光元件1。FIG. 4 is a plan view showing the light-emitting element wafer 20 shown in FIG. 3(f). The cutting mark 53 shown in FIG. 4 is a trace which cuts the light-emitting element wafer 20 along the mesa etching groove 52 shown in FIG. 3(f). As shown in FIG. 4, the dicing sheet 50 is stretched and expanded, and the gap between the adjacent light-emitting elements 1 becomes large. Thereby, each of the light-emitting elements 1 can be easily picked up.

(發光元件1的比較) 接著,使用圖5及圖6說明發光元件1的優點。圖5(a)為表示本發明一實施形態的發光元件1搭載於第1引線架31上的狀態的側視圖,圖5(b)為表示發光元件1搭載於第1引線架31上的狀態的俯視圖。藉由在圖3(a)~(f)說明的步驟製造的發光元件1,如圖5所示,搭載於第1引線架31上,電極墊4與第2引線架由金屬線5電連接。(Comparison of Light-Emitting Element 1) Next, the advantages of the light-emitting element 1 will be described with reference to Figs. 5 and 6 . Fig. 5 (a) is a side view showing a state in which the light-emitting element 1 according to the embodiment of the present invention is mounted on the first lead frame 31, and Fig. 5 (b) is a view showing a state in which the light-emitting element 1 is mounted on the first lead frame 31. Top view. The light-emitting element 1 manufactured by the steps described in FIGS. 3(a) to 3(f) is mounted on the first lead frame 31 as shown in FIG. 5, and the electrode pad 4 and the second lead frame are electrically connected by the metal wire 5. .

如圖5(a)所示,保護樹脂3的構成為,覆蓋包含基板2a與發光部2b的邊界部的發光部的側面,且亦覆蓋包含邊界部的基板2a的側面的一部分。亦即,保護樹脂3的構成為,在發光元件晶片2的側面,覆蓋從發光元件晶片2的上面至超過發光部2b的位置的區域。藉由此構成,與保護樹脂3覆蓋發光元件晶片2的側面的全部的情形相較,可縮小保護樹脂3覆蓋發光元件晶片2的區域。As shown in FIG. 5(a), the protective resin 3 is configured to cover a side surface of the light-emitting portion including the boundary portion between the substrate 2a and the light-emitting portion 2b, and also covers a part of the side surface of the substrate 2a including the boundary portion. That is, the protective resin 3 is configured to cover a region from the upper surface of the light-emitting element wafer 2 to a position beyond the light-emitting portion 2b on the side surface of the light-emitting element wafer 2. With this configuration, the area where the protective resin 3 covers the light-emitting element wafer 2 can be reduced as compared with the case where the protective resin 3 covers all of the side surfaces of the light-emitting element wafer 2.

另外,如圖5(b)所示,保護樹脂3覆蓋夾著發光部2b位於與基板2a相反側的發光元件晶片2的上面,在發光元件晶片2的上面的保護樹脂3形成有開口部。開口部是為了使配置在發光元件晶片2的上面的電極墊4露出而形成。亦即,保護樹脂3的構成為,在發光元件晶片2的上面,覆蓋配置有電極墊4的發光元件晶片2的區域(相當於上述開口部的區域)以外的發光元件晶片2的上面。此構成的情形,發光元件1被與保護樹脂3不同的模具樹脂(未圖示)密封時,金屬線5可由一種樹脂加以密封。此外,發光元件晶片2的上面的形成在保護樹脂3的開口部的大小,只要為不妨礙之後進行的金屬線5連接至電極墊4的大小,則亦可與電極墊4的大小相同,亦可大於電極墊4的大小。Further, as shown in FIG. 5(b), the protective resin 3 covers the upper surface of the light-emitting element wafer 2 on the side opposite to the substrate 2a with the light-emitting portion 2b interposed therebetween, and the protective resin 3 on the upper surface of the light-emitting element wafer 2 is formed with an opening. The opening is formed to expose the electrode pad 4 disposed on the upper surface of the light-emitting element wafer 2. In other words, the protective resin 3 is configured such that the upper surface of the light-emitting element wafer 2 other than the region (the region corresponding to the opening portion) in which the light-emitting element wafer 2 of the electrode pad 4 is disposed is covered on the upper surface of the light-emitting element wafer 2. In the case of this configuration, when the light-emitting element 1 is sealed by a mold resin (not shown) different from the protective resin 3, the metal wire 5 can be sealed with a resin. Further, the size of the opening of the protective resin 3 on the upper surface of the light-emitting element wafer 2 may be the same as the size of the electrode pad 4 as long as it does not prevent the metal wire 5 to be subsequently connected to the size of the electrode pad 4. It may be larger than the size of the electrode pad 4.

圖6(a)~(f)為表示發光元件1的比較例的圖。使用習知技術製造的發光元件101,藉由將發光元件晶片102搭載於第1引線架31上之後,以保護樹脂103覆蓋發光元件晶片102而被製造。6(a) to 6(f) are diagrams showing a comparative example of the light-emitting element 1. The light-emitting element 101 manufactured by the conventional technique is manufactured by mounting the light-emitting element wafer 102 on the first lead frame 31, and then covering the light-emitting element wafer 102 with the protective resin 103.

圖6(a)為表示保護樹脂103流動至引線架的邊緣的狀態的發光元件101的側視圖,圖6(b)為圖6(a)所示的發光元件101的俯視圖。保護樹脂103的流動性高(例如,矽氧樹脂的黏度為9~15帕斯卡秒(Pa・S))。因此,以保護樹脂103覆蓋發光元件晶片102時,會有保護樹脂103流出至引線架的邊緣的情形。Fig. 6(a) is a side view showing the light-emitting element 101 in a state where the protective resin 103 flows to the edge of the lead frame, and Fig. 6(b) is a plan view of the light-emitting element 101 shown in Fig. 6(a). The protective resin 103 has high fluidity (for example, the viscosity of the silicone resin is 9 to 15 Pascal seconds (Pa·S)). Therefore, when the light-emitting element wafer 102 is covered with the protective resin 103, the protective resin 103 flows out to the edge of the lead frame.

圖6(c)為表示保護樹脂103流動至引線架的側面的狀態的發光元件101的側視圖,圖6(d)為圖6(b)所示的發光元件101的俯視圖。覆蓋發光元件晶片102的保護樹脂103,從圖6(a)~(b)所示的狀態進一步流出,會有流出至引線架的側面的情形。Fig. 6 (c) is a side view showing the light-emitting element 101 in a state in which the protective resin 103 flows to the side surface of the lead frame, and Fig. 6 (d) is a plan view of the light-emitting element 101 shown in Fig. 6 (b). The protective resin 103 covering the light-emitting element wafer 102 further flows out from the state shown in FIGS. 6(a) to 6(b), and may flow out to the side surface of the lead frame.

圖6(e)為表示保護樹脂103流動至引線架的背面的狀態的發光元件101的側視圖,圖6(f)為圖6(e)所示的發光元件101的俯視圖。覆蓋發光元件晶片102的保護樹脂103,從圖6(c)~(d)所示的狀態進一步流出,會有覆蓋引線架的背面的情形。Fig. 6(e) is a side view showing the light-emitting element 101 in a state in which the protective resin 103 flows to the back surface of the lead frame, and Fig. 6(f) is a plan view of the light-emitting element 101 shown in Fig. 6(e). The protective resin 103 covering the light-emitting element wafer 102 further flows out from the state shown in FIGS. 6(c) to 6(d), and may cover the back surface of the lead frame.

如上述,藉由流動性高的保護樹脂103覆蓋發光元件晶片102的情形,會有保護樹脂103的形狀產生變形的危險。因此,在維持一定品質的狀態下提供使用習知技術製造的發光元件101是不容易的。特別是,由於保護樹脂103流出,在圖6(e)的狀態下,在金屬線的球頸部與保護樹脂的界面重疊,應力容易集中在引線的頸部。再者,由於以保護樹脂覆蓋引線架背面,與覆蓋發光元件的模具樹脂的密合性降低,導致品質降低。另外,由於保護樹脂103如圖6所示般流出,發光元件101不易小型化,其結果,搭載發光元件101的產品的小型化亦不容易。As described above, when the light-emitting element wafer 102 is covered with the protective resin 103 having high fluidity, the shape of the protective resin 103 may be deformed. Therefore, it is not easy to provide the light-emitting element 101 manufactured using a conventional technique while maintaining a certain quality. In particular, since the protective resin 103 flows out, in the state of FIG. 6(e), the interface between the spherical neck portion of the metal wire and the protective resin overlaps, and stress tends to concentrate on the neck portion of the lead. Further, since the back surface of the lead frame is covered with the protective resin, the adhesion to the mold resin covering the light-emitting element is lowered, resulting in deterioration in quality. In addition, since the protective resin 103 flows out as shown in FIG. 6, the light-emitting element 101 is not easily miniaturized, and as a result, the size of the product in which the light-emitting element 101 is mounted is not easy.

相對於此,本發明一實施形態的發光元件1中,如圖5所示,保護樹脂3的構成為,沿著發光元件晶片2的形狀以一定厚度保護發光元件晶片2。藉由此構成,能減輕發光元件1的光軸偏移、及光軸在多個發光元件1間的偏移不均。其結果,對於與發光元件成對使用的受光元件(未圖示),能使來自發光元件的光量提升,可最大限地利用發光元件的功能。On the other hand, in the light-emitting element 1 according to the embodiment of the present invention, as shown in FIG. 5, the protective resin 3 is configured to protect the light-emitting element wafer 2 with a constant thickness along the shape of the light-emitting element wafer 2. According to this configuration, it is possible to reduce the optical axis shift of the light-emitting element 1 and the shift unevenness of the optical axis between the plurality of light-emitting elements 1. As a result, the amount of light from the light-emitting element can be increased by the light-receiving element (not shown) used in pair with the light-emitting element, and the function of the light-emitting element can be utilized to the utmost.

再者,保護樹脂3為較圖6所示的保護樹脂103薄的膜,其構成為覆蓋發光元件晶片2的上面的一部分、及發光元件晶片2的側面的一部分。藉由此構成,圖5所示的保護樹脂3的量,相較於圖6所示的保護樹脂103的量可進一步地減少,可實現發光元件1的小型化及薄型化。其結果,可實現搭載發光元件1的產品的小型化及薄型化。Further, the protective resin 3 is a film thinner than the protective resin 103 shown in FIG. 6, and is configured to cover a part of the upper surface of the light-emitting element wafer 2 and a part of the side surface of the light-emitting element wafer 2. With this configuration, the amount of the protective resin 3 shown in FIG. 5 can be further reduced as compared with the amount of the protective resin 103 shown in FIG. 6, and the size and thickness of the light-emitting element 1 can be reduced. As a result, the size and thickness of the product in which the light-emitting element 1 is mounted can be reduced.

另外,使用習知技術製造的發光元件101,必須將保護樹脂103塗布於每一發光元件晶片102 (參照圖6)。另一方面,本發明一實施形態的發光元件1,如圖3(d)所說明,能以發光元件晶圓20單位塗布保護樹脂3。因此,以一次塗布即能對多個發光元件晶片2塗布保護樹脂3,能簡化發光元件1的製程。Further, in the light-emitting element 101 manufactured by the conventional technique, it is necessary to apply the protective resin 103 to each of the light-emitting element wafers 102 (see Fig. 6). On the other hand, in the light-emitting element 1 according to the embodiment of the present invention, as shown in FIG. 3(d), the protective resin 3 can be applied in units of the light-emitting element wafer 20. Therefore, the protective resin 3 can be applied to the plurality of light-emitting element wafers 2 by one application, and the process of the light-emitting elements 1 can be simplified.

(發光元件封裝體10的製程) 參照圖7說明本發明一實施形態的發光元件封裝體10的製程。圖7(a)為表示在第1引線架31(引線架)搭載發光元件1並藉由接著劑33固定的步驟的俯視圖,圖7(b)為該步驟的側視圖。圖7(c)為表示在圖7(a)~(b)的步驟後以金屬線5將電極墊4與第2引線架32電連接的步驟的俯視圖,圖7(d)為該步驟的側視圖。(Process of Light-Emitting Element Package 10) A process of the light-emitting element package 10 according to the embodiment of the present invention will be described with reference to Fig. 7 . Fig. 7 (a) is a plan view showing a step of mounting the light-emitting element 1 on the first lead frame 31 (lead frame) and fixed by the adhesive 33, and Fig. 7 (b) is a side view of the step. Fig. 7 (c) is a plan view showing a step of electrically connecting the electrode pad 4 and the second lead frame 32 by the metal wires 5 after the steps of Figs. 7 (a) to (b), and Fig. 7 (d) is the step of Side view.

圖7(e)為表示在圖7(c)~(d)的步驟後藉由模具樹脂11(硬質樹脂)將發光元件1密封的步驟的圖,圖7(f)為該步驟的側視圖。模具樹脂11為較保護樹脂3硬質的樹脂,將發光元件1及第1引線架31密封。更具體而言,如圖7(f)所示,模具樹脂11密封發光元件1,進一步密封金屬線5整體,亦密封第1引線架31的背面及第2引線架32的背面。Fig. 7 (e) is a view showing a step of sealing the light-emitting element 1 by the mold resin 11 (hard resin) after the steps of Figs. 7 (c) to (d), and Fig. 7 (f) is a side view of the step. . The mold resin 11 is a resin which is harder than the protective resin 3, and seals the light-emitting element 1 and the first lead frame 31. More specifically, as shown in FIG. 7(f), the mold resin 11 seals the light-emitting element 1 and further seals the entire metal wire 5, and also seals the back surface of the first lead frame 31 and the back surface of the second lead frame 32.

模具樹脂11為較保護樹脂3硬質的樹脂,保護樹脂3與模具樹脂11相較應力較小。例如,作為保護樹脂3,使用矽氧樹脂、聚醯亞胺樹脂、或聚氨酯樹脂的情形,作為模具樹脂11使用環氧樹脂。藉由以上步驟,製造以模具樹脂11將發光元件1密封的發光元件封裝體10。The mold resin 11 is a resin which is harder than the protective resin 3, and the protective resin 3 is less stressful than the mold resin 11. For example, when a silicone resin, a polyimide resin, or a urethane resin is used as the protective resin 3, an epoxy resin is used as the mold resin 11. By the above steps, the light-emitting element package 10 in which the light-emitting element 1 is sealed with the mold resin 11 is manufactured.

(發光元件封裝體10的比較) 圖8(a)~(h)為表示藉由習知技術製造發光元件封裝體110的步驟的圖。在圖8的步驟,塗布保護樹脂103的時序與圖7所示的步驟不同。(Comparison of Light-Emitting Element Package 10) FIGS. 8(a) to 8(h) are diagrams showing a procedure of manufacturing the light-emitting element package 110 by a conventional technique. In the step of FIG. 8, the timing of applying the protective resin 103 is different from the step shown in FIG.

圖8(a)為表示在第1引線架31搭載發光元件晶片102並藉由接著劑33固定的步驟的俯視圖,圖8(b)為該步驟的側視圖。此外,圖8(a)~(b)中,由於未以保護樹脂103覆蓋發光元件晶片102,因此發光部102b為在外部露出的狀態。Fig. 8(a) is a plan view showing a step of mounting the light-emitting element wafer 102 on the first lead frame 31 and fixing it by the adhesive 33, and Fig. 8(b) is a side view showing the step. Further, in FIGS. 8(a) to 8(b), since the light-emitting element wafer 102 is not covered with the protective resin 103, the light-emitting portion 102b is exposed to the outside.

圖8(c)為表示在圖8(a)~(b)的步驟後,以金屬線5將配置在發光元件晶片102的上面的電極墊4與第2引線架32加以電連接的步驟的俯視圖,圖8(d)為該步驟的側視圖。8(c) shows a step of electrically connecting the electrode pad 4 disposed on the upper surface of the light-emitting element wafer 102 and the second lead frame 32 by the metal wires 5 after the steps of FIGS. 8(a) to 8(b). In plan view, Figure 8(d) is a side view of this step.

圖8(e)為表示在圖8(c)~(d)的步驟後,由保護樹脂103覆蓋發光元件晶片102的步驟的俯視圖,圖8(f)為該步驟的側視圖。如圖8(f)所示,金屬線5為由保護樹脂103覆蓋發光元件晶片102側的部位的狀態。另外,由於覆蓋發光元件晶片102整體,因此保護樹脂103為如山般隆起的形狀。Fig. 8(e) is a plan view showing a step of covering the light-emitting element wafer 102 with the protective resin 103 after the steps of Figs. 8(c) to (d), and Fig. 8(f) is a side view of the step. As shown in FIG. 8(f), the metal wire 5 is in a state in which the portion on the side of the light-emitting element wafer 102 is covered with the protective resin 103. Further, since the entire light-emitting element wafer 102 is covered, the protective resin 103 has a shape that rises like a mountain.

圖8(g)為表示在圖8(e)~(f)的步驟後,由模具樹脂111密封保護發光元件晶片102的保護樹脂103的步驟的圖,圖8(h)為該步驟的側視圖。如圖8(h)所示,模具樹脂111密封覆蓋發光元件晶片102的保護樹脂103,進一步密封從保護樹脂103至第2引線架32為止的金屬線5的部位。此外,模具樹脂111亦可密封第1引線架31的背面及第2引線架32的背面。藉由上述習知技術的步驟,製造以模具樹脂111密封發光元件晶片102的發光元件封裝體110。Fig. 8(g) is a view showing a step of sealing the protective resin 103 for protecting the light-emitting element wafer 102 by the mold resin 111 after the steps of Figs. 8(e) to (f), and Fig. 8(h) is the side of the step. view. As shown in FIG. 8(h), the mold resin 111 seals the protective resin 103 covering the light-emitting element wafer 102, and further seals the portion of the metal wire 5 from the protective resin 103 to the second lead frame 32. Further, the mold resin 111 may seal the back surface of the first lead frame 31 and the back surface of the second lead frame 32. The light-emitting element package 110 in which the light-emitting element wafer 102 is sealed with the mold resin 111 is manufactured by the above-described steps of the prior art.

此處,模具樹脂111為較保護樹脂3硬質的樹脂。因此,在圖8(h)所示的發光元件封裝體110中,金屬線5分成由保護樹脂103覆蓋的部位、及由模具樹脂111覆蓋的部位。因此,會有金屬線5因為起因於保護樹脂103與模具樹脂111的線膨脹係數(長度對應溫度上升而變化的比例)不同產生的應力而變得容易斷線的危險。Here, the mold resin 111 is a resin which is harder than the protective resin 3. Therefore, in the light-emitting element package 110 shown in FIG. 8(h), the metal wire 5 is divided into a portion covered by the protective resin 103 and a portion covered by the mold resin 111. Therefore, the metal wire 5 may be easily broken due to a stress caused by a difference in linear expansion coefficient (a ratio in which the length changes depending on the temperature) of the protective resin 103 and the mold resin 111.

圖9為表示各種材料的楊氏係數及線膨脹係數的代表值的表。一般而言,模具樹脂111的材料為環氧樹脂,如圖9所示,矽氧樹脂的線膨脹係數為100~300PPM/℃,相對於此,環氧樹脂的線膨脹係數為45~65PPM/℃。另外,以金為材料的金屬線5的線膨脹係數為14.2PPM/℃。如上述,由於線膨脹係數因各材料而不同,因此在由矽氧樹脂構成的保護樹脂103與由環氧樹脂構成的模具樹脂111的邊界部,使用環境下的溫度變化造成的位移量不同,因此在由金構成的金屬線5產生內部應力。其結果,在習知技術所製造的發光元件封裝體110,會有金屬線5變得容易斷線的危險。Fig. 9 is a table showing representative values of Young's modulus and linear expansion coefficient of various materials. Generally, the material of the mold resin 111 is an epoxy resin. As shown in FIG. 9, the linear expansion coefficient of the epoxy resin is 100 to 300 PPM/° C. In contrast, the linear expansion coefficient of the epoxy resin is 45 to 65 PPM/ °C. Further, the metal wire 5 made of gold has a coefficient of linear expansion of 14.2 PPM/°C. As described above, since the coefficient of linear expansion differs depending on the material, the amount of displacement caused by the temperature change in the use environment is different between the boundary between the protective resin 103 made of the epoxy resin and the mold resin 111 made of epoxy resin. Therefore, internal stress is generated in the metal wire 5 composed of gold. As a result, in the light-emitting element package 110 manufactured by the prior art, the metal wire 5 may be easily broken.

另一方面,在本發明一實施形態的發光元件封裝體10中,如圖7(f)所示,金屬線5為僅由模具樹脂11覆蓋的構成。因此,關於由模具樹脂11密封的發光元件1,可藉由起因於保護樹脂3與模具樹脂的線膨脹係數不同產生的應力抑制金屬線5斷線。On the other hand, in the light-emitting element package 10 according to the embodiment of the present invention, as shown in FIG. 7(f), the metal wire 5 is configured to be covered only by the mold resin 11. Therefore, with respect to the light-emitting element 1 sealed by the mold resin 11, the metal wire 5 can be prevented from being broken by the stress caused by the difference in the linear expansion coefficient of the protective resin 3 and the mold resin.

另外,圖7(f)所示的保護樹脂3的量,相較於圖8(h)所示的保護樹脂103的量可進一步地減少。因此,能使圖7(f)所示的模具樹脂11的量相較於圖8(h)所示的模具樹脂111的量進一步地減少。另外,搭載發光元件晶片的架體尺寸,相較於圖8的架體,能將圖7的架體做成較小。因此,圖7(f)所示的發光元件封裝體10,與圖8(h)所示的發光元件封裝體110相較,能小型化及薄型化。Further, the amount of the protective resin 3 shown in Fig. 7 (f) can be further reduced as compared with the amount of the protective resin 103 shown in Fig. 8 (h). Therefore, the amount of the mold resin 11 shown in Fig. 7 (f) can be further reduced as compared with the amount of the mold resin 111 shown in Fig. 8 (h). Further, the size of the frame on which the light-emitting element wafer is mounted can be made smaller than that of the frame body of Fig. 8 . Therefore, the light-emitting element package 10 shown in FIG. 7(f) can be made smaller and thinner than the light-emitting element package 110 shown in FIG. 8(h).

(實施形態2) 說明本發明另一實施形態。實施形態2中,作為在實施形態1說明的保護樹脂3的材料,使用低應力的光感光性樹脂。亦即,在圖3(d)說明的塗布步驟使用的保護樹脂3的材料為低應力的光感光性樹脂。因此,在圖3(e)說明的除去步驟,在實施形態2中,可省略塗布光感光性光阻的處理。此外,關於其他步驟,為與實施形態1相同的步驟。如上述,作為保護樹脂3的材料,使用低應力的光感光性樹脂,藉此可簡化製造發光元件1的步驟。(Embodiment 2) Another embodiment of the present invention will be described. In the second embodiment, a low-stress photo-photosensitive resin is used as the material of the protective resin 3 described in the first embodiment. That is, the material of the protective resin 3 used in the coating step described in FIG. 3(d) is a low-stress photo-sensitive resin. Therefore, in the removal step described in FIG. 3(e), in the second embodiment, the treatment of applying the photo-sensitive photoresist can be omitted. Further, the other steps are the same as those in the first embodiment. As described above, as the material of the protective resin 3, a low-stress photo-sensitive resin is used, whereby the step of manufacturing the light-emitting element 1 can be simplified.

(實施形態3) 說明本發明再一實施形態。實施形態3中,替換在實施形態1說明的使用旋塗的塗布步驟(參照圖3(d)),進行使用網版印刷的塗布步驟。使用於網版印刷的網版遮罩,限制對發光元件晶圓20的上面塗布保護樹脂3的區域,被圖案化以在電極墊4上不塗布保護樹脂3,該電極墊4為不需要塗布保護樹脂3之處。(Embodiment 3) Another embodiment of the present invention will be described. In the third embodiment, the coating step using screen printing (see FIG. 3(d)), which is described in the first embodiment, is followed by a coating step using screen printing. The screen mask used for screen printing restricts the area on which the protective resin 3 is applied to the upper surface of the light-emitting element wafer 20, and is patterned so as not to apply the protective resin 3 on the electrode pad 4, which is not required to be coated. Protect the resin 3.

實施形態3中的塗布步驟,在圖3(c)說明的台面蝕刻處理步驟之後,使用上述網版遮罩進行網版印刷。藉此,保護樹脂3的薄膜形成在包含不需要塗布保護樹脂3的電極墊4上的區域以外的發光元件晶圓20的上面。藉由進行使用此種網版印刷的塗布步驟,可省略在圖3(e)說明的除去步驟(第3步驟)。因此,可簡化製造發光元件1的步驟。此外,關於其他步驟,為與實施形態1相同的步驟。In the coating step in the third embodiment, after the mesa etching treatment step described in FIG. 3(c), screen printing is performed using the screen mask. Thereby, the film of the protective resin 3 is formed on the upper surface of the light-emitting element wafer 20 excluding the region on which the electrode pad 4 on which the protective resin 3 is not required to be applied. By performing the coating step using such screen printing, the removal step (third step) explained in Fig. 3(e) can be omitted. Therefore, the step of manufacturing the light-emitting element 1 can be simplified. Further, the other steps are the same as those in the first embodiment.

(變形例) 在塗布步驟,亦可藉由使用上述網版遮罩進行噴塗以進行網版印刷。藉由噴塗進行網版印刷,由塗布步驟形成的保護樹脂3的薄膜可具有沿著發光元件晶圓20的形狀的一定厚度。因此,在發光元件晶片2發出光時,能減輕光軸偏移及該偏移不均。其結果,對於與發光元件成對使用的受光元件,能使來自發光元件晶片2的光量提升,可最大限地利用發光元件晶片2的功能。(Modification) In the coating step, screen printing can also be performed by using the above-described screen mask to perform screen printing. The film of the protective resin 3 formed by the coating step may have a certain thickness along the shape of the light-emitting element wafer 20 by screen printing by spraying. Therefore, when the light-emitting element wafer 2 emits light, the optical axis shift and the unevenness of the offset can be reduced. As a result, the amount of light from the light-emitting element wafer 2 can be increased by the light-receiving element used in pair with the light-emitting element, and the function of the light-emitting element wafer 2 can be utilized to the utmost.

(綜合) 本發明形態1的發光元件(1),具備發光元件晶片(2)、及保護該發光元件晶片的保護樹脂(3),其特徵在於:該發光元件晶片具備基板(2a)與配置在該基板上的發光部(2b);該保護樹脂覆蓋包含該基板與該發光部的邊界部的該發光部的側面,且亦覆蓋包含該邊界部的該基板的側面的一部分。(Integrated) A light-emitting element (1) according to a first aspect of the present invention includes a light-emitting element wafer (2) and a protective resin (3) for protecting the light-emitting element wafer, wherein the light-emitting element wafer includes a substrate (2a) and a configuration a light-emitting portion (2b) on the substrate; the protective resin covers a side surface of the light-emitting portion including a boundary portion between the substrate and the light-emitting portion, and also covers a portion of a side surface of the substrate including the boundary portion.

根據上述構成,發光元件所具備的保護樹脂覆蓋包含基板與發光部的邊界部的發光部的側面及包含邊界部的基板的側面的一部分。藉此,保護樹脂可確實地覆蓋包含邊界部的發光元件晶片的側面中至少發光部的該側面。另外,由於保護樹脂為覆蓋發光元件晶片的該側面的一部分的構成,因此與保護樹脂覆蓋發光元件晶片的該側面的全部的情形相較,可縮小塗布有保護樹脂的發光元件晶片的區域。因此,能以少量的保護樹脂保護發光部的該側面。其結果,可保持高品質的發光元件,且實現發光元件的小型化及薄型化。另外,由於能使密封發光元件的硬質樹脂(模具樹脂11)的量變少,因此在發光元件由硬質樹脂密封的情形,可實現具備該發光元件與該硬質樹脂的發光元件封裝體(10)的小型化及薄型化。According to the above configuration, the protective resin provided in the light-emitting element covers a side surface of the light-emitting portion including the boundary portion between the substrate and the light-emitting portion, and a part of the side surface of the substrate including the boundary portion. Thereby, the protective resin can surely cover at least the side surface of the light-emitting portion of the side surface of the light-emitting element wafer including the boundary portion. Further, since the protective resin covers a part of the side surface of the light-emitting element wafer, the area of the light-emitting element wafer coated with the protective resin can be reduced as compared with the case where the protective resin covers the entire side surface of the light-emitting element wafer. Therefore, the side surface of the light-emitting portion can be protected with a small amount of the protective resin. As a result, a high-quality light-emitting element can be maintained, and the size and thickness of the light-emitting element can be reduced. In addition, since the amount of the hard resin (mold resin 11) that seals the light-emitting element can be reduced, when the light-emitting element is sealed with a hard resin, the light-emitting element package (10) including the light-emitting element and the hard resin can be realized. Miniaturization and thinning.

另外,藉由在打線前以保護樹脂塗布元件的晶片表面及邊緣,成為即使在外部力量造成的金屬線變形、或模具樹脂的填充時產生的金屬線位移導致與晶片邊緣的接觸時亦能以保護樹脂電絕緣的構造。因此,可預防金屬線與晶片元件接觸所引起的缺陷產生。In addition, by coating the surface and the edge of the wafer with the protective resin before the wire bonding, it becomes possible to contact the edge of the wafer even when the metal wire is deformed by the external force or the metal wire is displaced during the filling of the mold resin. A structure that protects the resin from electrical insulation. Therefore, it is possible to prevent the occurrence of defects caused by the contact of the metal wires with the wafer elements.

本發明形態2的發光元件,亦可在上述形態1中,該保護樹脂覆蓋夾著該發光部位於與該基板相反側的該發光元件晶片的上面;在該發光元件晶片的該上面的該保護樹脂形成有開口部。In the light-emitting device of the second aspect of the present invention, in the first aspect, the protective resin may cover the upper surface of the light-emitting element wafer on the opposite side of the light-emitting portion, and the upper surface of the light-emitting element wafer may be protected. The resin is formed with an opening.

根據上述構成,在形成在發光元件晶片的上面的保護樹脂形成有開口部。該開口部用於使配置在發光元件晶片的上面的電極墊(4)露出而形成。因此,在配置在發光部的上面的電極墊(4)連接有金屬線(5)時,金屬線能被一種樹脂(模具樹脂11)密封。因此,藉由起因於溫度變化的樹脂膨脹及收縮,可抑制連接於電極墊的金屬線的斷線。尤其是,電極墊附近的金屬線的部位(金屬線的球頸部分)容易斷線。因此,上述構成在抑制連接於電極墊的金屬線斷線之點是有效的。According to the above configuration, the protective resin formed on the upper surface of the light-emitting element wafer is formed with an opening. The opening is formed by exposing the electrode pad (4) disposed on the upper surface of the light-emitting element wafer. Therefore, when the electrode pad (4) disposed on the upper surface of the light-emitting portion is connected with the metal wire (5), the metal wire can be sealed by a resin (mold resin 11). Therefore, the breakage of the metal wire connected to the electrode pad can be suppressed by the expansion and contraction of the resin due to the temperature change. In particular, the portion of the metal wire near the electrode pad (the neck portion of the metal wire) is easily broken. Therefore, the above configuration is effective in suppressing the disconnection of the metal wire connected to the electrode pad.

本發明形態3的發光元件,亦可在上述形態1或2中,該保護樹脂沿著該發光元件晶片的形狀具有一定厚度。In the light-emitting element of the third aspect of the invention, in the first aspect or the second aspect, the protective resin may have a constant thickness along the shape of the light-emitting element wafer.

根據上述構成,發光元件被沿著該發光元件晶片的形狀具有一定厚度的保護樹脂保護。因此,在發光元件晶片發出光時,能減輕光軸偏移及該偏移不均。其結果,對於與發光元件成對使用的受光元件,能使來自發光元件晶片的光量提升,可最大限地利用發光元件晶片的功能。According to the above configuration, the light-emitting element is protected by the protective resin having a certain thickness along the shape of the light-emitting element wafer. Therefore, when the light-emitting element wafer emits light, the optical axis shift and the unevenness of the offset can be reduced. As a result, the amount of light from the light-emitting element wafer can be increased by the light-receiving element used in pair with the light-emitting element, and the function of the light-emitting element wafer can be utilized to the utmost.

本發明形態4的發光元件,亦可在上述形態1至3中的任一形態,該保護樹脂為矽氧樹脂、聚醯亞胺樹脂、聚氨酯樹脂、或聚碳酸酯樹脂。The light-emitting element of the fourth aspect of the invention may be any one of the above aspects 1 to 3, wherein the protective resin is a silicone resin, a polyimide resin, a polyurethane resin, or a polycarbonate resin.

根據上述構成,保護樹脂可由樹脂之中應力較低的樹脂構成。因此,能使保護發光部的保護樹脂的量變少,且容易使保護樹脂的厚度成為一定。因此,可實現發光元件的小型化及薄型化。另外,在發光元件晶片發出光時,能減輕光軸偏移及該偏移不均,對於與發光元件成對使用的受光元件,能使來自發光元件晶片的光量提升。According to the above configuration, the protective resin can be composed of a resin having a low stress among the resins. Therefore, the amount of the protective resin that protects the light-emitting portion can be reduced, and the thickness of the protective resin can be made constant. Therefore, downsizing and thinning of the light-emitting element can be achieved. Further, when the light-emitting element wafer emits light, the optical axis shift and the shift unevenness can be reduced, and the light-receiving element used in pair with the light-emitting element can increase the amount of light from the light-emitting element wafer.

本發明形態5的發光元件封裝體(10),具備:上述形態1記載的發光元件(1);引線架(第1引線架31),搭載有該發光元件;以及硬質樹脂(模具樹脂11),將該發光元件及該引線架密封;該保護樹脂與該硬質樹脂相較應力較小。The light-emitting element package (10) according to the fifth aspect of the invention includes the light-emitting element (1) according to the first aspect, a lead frame (first lead frame 31) on which the light-emitting element is mounted, and a hard resin (mold resin 11). And sealing the light-emitting element and the lead frame; the protective resin has less stress than the hard resin.

根據上述構成,將發光元件及引線架密封的硬質樹脂,應力較保護發光元件晶片的保護樹脂高,保護樹脂的應力較將發光元件密封的硬質樹脂低。因此,以少量的保護樹脂即可保護發光元件晶片,且能以少量的硬質樹脂將發光元件密封以製造發光元件封裝體。其結果,可實現發光元件封裝體的小型化及薄型化。According to the above configuration, the hard resin that seals the light-emitting element and the lead frame has higher stress than the protective resin that protects the light-emitting element wafer, and the stress of the protective resin is lower than that of the hard resin that seals the light-emitting element. Therefore, the light-emitting element wafer can be protected with a small amount of the protective resin, and the light-emitting element can be sealed with a small amount of hard resin to manufacture the light-emitting element package. As a result, it is possible to reduce the size and thickness of the light-emitting element package.

本發明形態6的發光元件的製造方法,從作為具備基板(2a)及配置在該基板上的發光部(2b)的發光元件晶片的材料的發光元件晶圓(20)製造發光元件(1),其特徵在於,包含:第1步驟,在夾著該發光部位於與該基板相反側的該發光元件晶圓的上面,形成用以將該發光元件晶圓區分成該發光元件單位的具有到達超過該發光部與該基板的邊界部的位置的深度的槽(切割槽51);第2步驟,以保護樹脂(3)覆蓋在該第1步驟形成的該槽及該發光元件晶圓的該上面;第3步驟,於在該第2步驟覆蓋的該發光元件晶圓的該上面的該保護樹脂,就該發光元件單位分別形成開口部;以及第4步驟,在該第3步驟之後,沿著在該第1步驟形成的該槽,將該發光元件晶圓分割成該發光元件單位。In the method of manufacturing a light-emitting device of the sixth aspect of the present invention, a light-emitting element (1) is manufactured from a light-emitting element wafer (20) which is a material of a light-emitting element wafer including a substrate (2a) and a light-emitting portion (2b) disposed on the substrate. In the first step, the first step of forming the light-emitting element wafer on the upper surface of the light-emitting element wafer opposite to the light-emitting portion is formed to have the light-emitting element wafer divided into the light-emitting element units. a groove (cutting groove 51) exceeding a depth of a position of a boundary portion between the light-emitting portion and the substrate; and a second step of covering the groove formed in the first step and the light-emitting element wafer with a protective resin (3) In the third step, the protective resin on the upper surface of the light-emitting element wafer covered in the second step is formed with an opening portion in the light-emitting element unit; and the fourth step, after the third step, along the third step The groove formed in the first step divides the light-emitting element wafer into the light-emitting element unit.

根據上述方法,可達到與上述形態1及上述形態2相同的效果。另外,根據上述方法,在步驟2,對發光元件晶圓塗布保護樹脂3。因此,以一次塗布即可對從發光元件晶圓分割的多個發光元件晶片塗布保護樹脂3。因此,與就從發光元件晶圓分割的發光元件晶片分別塗布保護樹脂的步驟相較,可簡化發光元件的製程。According to the above method, the same effects as those of the above aspect 1 and the above aspect 2 can be achieved. Further, according to the above method, in step 2, the protective resin 3 is applied to the light-emitting element wafer. Therefore, the protective resin 3 can be applied to the plurality of light-emitting element wafers divided from the light-emitting element wafer by one application. Therefore, the process of applying the protective resin to the light-emitting element wafer divided from the light-emitting element wafer can be simplified as compared with the step of applying the protective resin.

本發明形態7的發光元件的製造方法,亦可在上述形態6中,在該第2步驟,使用光感光性樹脂作為該保護樹脂。根據上述方法,使用光感光性樹脂作為在第2步驟中的保護樹脂。因此,在第3步驟,可簡化形成開口部的步驟。更具體而言,使用光感光性樹脂作為保護樹脂時,在第3步驟,塗布光感光性光阻,由光微影光罩進行曝光及顯影,進行光阻的圖案化,以蝕刻形成開口部。另一方面,使用光感光性樹脂作為保護樹脂時,在第3步驟,由光微影光罩進行曝光及顯影,形成開口部。如上述,藉由使用光感光性樹脂作為保護樹脂,可省略塗布光感光性光阻的處理。根據上述,可簡化製造發光元件的步驟。In the method of producing a light-emitting device according to Aspect 7 of the present invention, in the sixth aspect, the photo-sensitive resin may be used as the protective resin in the second step. According to the above method, a photo-sensitive resin is used as the protective resin in the second step. Therefore, in the third step, the step of forming the opening portion can be simplified. More specifically, when a photo-sensitive resin is used as the protective resin, in the third step, a photo-sensitive resist is applied, and exposure and development are performed by a photolithography mask, and patterning of the photoresist is performed to form an opening by etching. . On the other hand, when a photo-sensitive resin is used as the protective resin, in the third step, exposure and development are performed by a photolithography mask to form an opening. As described above, by using a photo-sensitive resin as the protective resin, the treatment of applying the photo-sensitive photoresist can be omitted. According to the above, the step of manufacturing the light-emitting element can be simplified.

本發明形態8的發光元件的製造方法,從作為具備基板(2a)及配置在該基板上的發光部(2b)的發光元件晶片的材料的發光元件晶圓(20)製造發光元件(1),其特徵在於,包含:第1步驟,在夾著該發光部位於與該基板相反側的該發光元件晶圓的上面,形成用以將該發光元件晶圓區分成該發光元件單位的具有到達超過該發光部與該基板的邊界部的位置的深度的槽(切割槽51);第2步驟,以保護樹脂(3)覆蓋在該第1步驟形成的該槽及該發光元件晶圓的該上面;第4步驟,在該第2步驟之後,沿著在該第1步驟形成的該槽,將該發光元件晶圓分割成該發光元件單位;在該第2步驟,藉由進行網版印刷,對該發光元件晶圓的該上面的該保護樹脂,就該發光元件單位分別形成開口部。In the method of manufacturing a light-emitting device of the eighth aspect of the present invention, a light-emitting element (1) is produced from a light-emitting element wafer (20) which is a material of a light-emitting element wafer including a substrate (2a) and a light-emitting portion (2b) disposed on the substrate. In the first step, the first step of forming the light-emitting element wafer on the upper surface of the light-emitting element wafer opposite to the light-emitting portion is formed to have the light-emitting element wafer divided into the light-emitting element units. a groove (cutting groove 51) exceeding a depth of a position of a boundary portion between the light-emitting portion and the substrate; and a second step of covering the groove formed in the first step and the light-emitting element wafer with a protective resin (3) In the fourth step, after the second step, the light-emitting element wafer is divided into the light-emitting element units along the groove formed in the first step; in the second step, screen printing is performed. The protective resin on the upper surface of the light-emitting element wafer is formed with an opening in each of the light-emitting element units.

根據上述方法,在第2步驟,能以保護樹脂覆蓋發光元件晶圓的上面,且在發光元件晶圓的上面的保護樹脂,就發光元件單位分別形成開口部。因此,可省略在以保護樹脂覆蓋發光元件晶圓的上面後,為了在保護樹脂形成開口部而除去與開口部對應的區域的保護樹脂的步驟。因此,可簡化製造發光元件的步驟。According to the above method, in the second step, the upper surface of the light-emitting element wafer can be covered with the protective resin, and the protective resin on the upper surface of the light-emitting element wafer can form an opening in each of the light-emitting element units. Therefore, the step of removing the protective resin in the region corresponding to the opening portion in order to form the opening portion of the protective resin after covering the upper surface of the light-emitting element wafer with the protective resin can be omitted. Therefore, the step of manufacturing the light-emitting element can be simplified.

本發明形態9的發光元件的製造方法,亦可在上述形態8的上述第2步驟中,藉由噴塗進行網版印刷。藉由噴塗進行網版印刷,藉此在第2步驟形成的保護樹脂的薄膜可具有沿著發光元件晶圓的形狀的一定厚度。因此,在發光元件晶片發出光時,能減輕光軸偏移及該偏移不均。其結果,對於與發光元件成對使用的受光元件,能使來自發光元件晶片的光量提升,可最大限地利用發光元件晶片的功能。In the method for producing a light-emitting device according to Aspect 9 of the present invention, in the second step of the eighth aspect, screen printing may be performed by spraying. Screen printing is performed by spraying, whereby the film of the protective resin formed in the second step may have a certain thickness along the shape of the light-emitting element wafer. Therefore, when the light-emitting element wafer emits light, the optical axis shift and the unevenness of the offset can be reduced. As a result, the amount of light from the light-emitting element wafer can be increased by the light-receiving element used in pair with the light-emitting element, and the function of the light-emitting element wafer can be utilized to the utmost.

(附加事項) 本發明並不限於上述各實施形態,在請求項所示的範圍內可進行各種變更,關於適當地組合在不同實施形態分別揭示的技術手段所得的實施形態,亦包含在本發明的技術範圍。再者,藉由組合在各實施形態分別揭示的技術手段,可形成新的技術特徵。(Additional Items) The present invention is not limited to the above embodiments, and various modifications can be made within the scope of the claims. The embodiments obtained by appropriately combining the technical means disclosed in the different embodiments are also included in the present invention. The technical scope. Furthermore, by combining the technical means disclosed in each embodiment, new technical features can be formed.

1‧‧‧發光元件
2‧‧‧發光元件晶片
2a‧‧‧基板
2b‧‧‧發光部
3‧‧‧保護樹脂
4‧‧‧電極墊
5‧‧‧金屬線
10‧‧‧發光元件封裝體
11‧‧‧模具樹脂(硬質樹脂)
20‧‧‧發光元件晶圓
31‧‧‧第1引線架(引線架)
32‧‧‧第2引線架
33‧‧‧接著劑
50‧‧‧切割片
51‧‧‧切割槽
52‧‧‧台面蝕刻槽
53‧‧‧切斷痕跡
1‧‧‧Lighting elements
2‧‧‧Lighting element chip
2a‧‧‧Substrate
2b‧‧‧Lighting Department
3‧‧‧Protective resin
4‧‧‧electrode pads
5‧‧‧Metal wire
10‧‧‧Lighting element package
11‧‧‧Mold resin (hard resin)
20‧‧‧Lighting element wafer
31‧‧‧1st lead frame (lead frame)
32‧‧‧2nd lead frame
33‧‧‧Adhesive
50‧‧‧ cutting piece
51‧‧‧Cutting trough
52‧‧‧Working surface etching groove
53‧‧‧ cut marks

圖1(a)為表示本發明一實施形態的發光元件的主要部位構成的剖面圖,圖1(b)為表示作為比較例的發光元件的概要的側視圖。      圖2為表示發光元件晶圓的外形的圖。      圖3(a)~(f)為表示製造本發明一實施形態的發光元件的步驟的圖。      圖4為表示圖3(f)所示的發光元件晶圓的俯視圖。      圖5(a)為表示本發明一實施形態的發光元件搭載於第1引線架上的狀態的側視圖,圖5(b)為表示發光元件搭載於第1引線架的狀態的俯視圖。      圖6(a)~(f)為表示發光元件的比較例的圖。      圖7(a)~(f)為表示製造本發明一實施形態的發光元件封裝體的步驟的圖。      圖8(a)~(h)為表示藉由習知技術製造發光元件封裝體的步驟的圖。      圖9為表示各種材料的楊氏係數與線膨脹係數的代表值的表。Fig. 1 (a) is a cross-sectional view showing a configuration of a main portion of a light-emitting device according to an embodiment of the present invention, and Fig. 1 (b) is a side view showing an outline of a light-emitting device as a comparative example. 2 is a view showing an outer shape of a light-emitting element wafer. 3(a) to 3(f) are views showing a procedure for producing a light-emitting element according to an embodiment of the present invention. Fig. 4 is a plan view showing the light-emitting element wafer shown in Fig. 3 (f). Fig. 5 (a) is a side view showing a state in which a light-emitting element according to an embodiment of the present invention is mounted on a first lead frame, and Fig. 5 (b) is a plan view showing a state in which a light-emitting element is mounted on a first lead frame. 6(a) to 6(f) are diagrams showing a comparative example of a light-emitting element. 7(a) to 7(f) are views showing a procedure of manufacturing a light-emitting element package according to an embodiment of the present invention. 8(a) to 8(h) are diagrams showing a procedure of manufacturing a light-emitting element package by a conventional technique. Fig. 9 is a table showing representative values of Young's modulus and linear expansion coefficient of various materials.

1,101‧‧‧發光元件 1,101‧‧‧Lighting elements

2,102‧‧‧發光元件晶片 2,102‧‧‧Lighting element chip

2a‧‧‧基板 2a‧‧‧Substrate

2b‧‧‧發光部 2b‧‧‧Lighting Department

3,103‧‧‧保護樹脂 3,103‧‧‧Protective resin

4‧‧‧電極墊 4‧‧‧electrode pads

5‧‧‧金屬線 5‧‧‧Metal wire

31‧‧‧第1引線架 31‧‧‧1st lead frame

32‧‧‧第2引線架 32‧‧‧2nd lead frame

33‧‧‧接著劑 33‧‧‧Adhesive

Claims (10)

一種發光元件,具備發光元件晶片、及保護該發光元件晶片的保護樹脂,其特徵在於:   該發光元件晶片具備基板與配置在該基板上的發光部;   該保護樹脂覆蓋包含該基板與該發光部的邊界部的該發光部的側面,且亦覆蓋包含該邊界部的該基板的側面的一部分。A light-emitting element comprising a light-emitting element wafer and a protective resin for protecting the light-emitting element wafer, wherein the light-emitting element wafer includes a substrate and a light-emitting portion disposed on the substrate; and the protective resin covers the substrate and the light-emitting portion The side surface of the light-emitting portion at the boundary portion also covers a portion of the side surface of the substrate including the boundary portion. 如申請專利範圍第1項的發光元件,其中,該保護樹脂覆蓋夾著該發光部位於與該基板相反側的該發光元件晶片的上面;   在該發光元件晶片的該上面的該保護樹脂形成有開口部。The light-emitting element according to claim 1, wherein the protective resin covers the upper surface of the light-emitting element wafer on the opposite side of the light-emitting portion; the protective resin on the upper surface of the light-emitting element wafer is formed Opening. 如申請專利範圍第1項的發光元件,其中,該保護樹脂沿著該發光元件晶片的形狀具有一定厚度。The light-emitting element of claim 1, wherein the protective resin has a certain thickness along a shape of the light-emitting element wafer. 如申請專利範圍第2項的發光元件,其中,該保護樹脂沿著該發光元件晶片的形狀具有一定厚度。The light-emitting element of claim 2, wherein the protective resin has a certain thickness along a shape of the light-emitting element wafer. 如申請專利範圍第1至4項中任一項的發光元件,其中,該保護樹脂為矽氧樹脂、聚醯亞胺樹脂、聚氨酯樹脂、或聚碳酸酯樹脂。The light-emitting element according to any one of claims 1 to 4, wherein the protective resin is a silicone resin, a polyimide resin, a polyurethane resin, or a polycarbonate resin. 一種發光元件封裝體,具備:   申請專利範圍第1項的發光元件;   引線架,搭載有該發光元件;以及   硬質樹脂,將該發光元件及該引線架密封;   該保護樹脂與該硬質樹脂相較應力小。A light-emitting element package comprising: a light-emitting element according to claim 1; a lead frame on which the light-emitting element is mounted; and a hard resin to seal the light-emitting element and the lead frame; wherein the protective resin is compared with the hard resin The stress is small. 一種發光元件的製造方法,從作為具備基板及配置在該基板上的發光部的發光元件晶片的材料的發光元件晶圓製造發光元件,其特徵在於,包含:   第1步驟,在夾著該發光部位於與該基板相反側的該發光元件晶圓的上面,形成用以將該發光元件晶圓區分成該發光元件單位的具有到達超過該發光部與該基板的邊界部的位置的深度的槽;   第2步驟,以保護樹脂覆蓋在該第1步驟形成的該槽及該發光元件晶圓的該上面;   第3步驟,於在該第2步驟覆蓋的該發光元件晶圓的該上面的該保護樹脂,就該發光元件單位分別形成開口部;以及   第4步驟,在該第3步驟之後,沿著在該第1步驟形成的該槽,將該發光元件晶圓分割成該發光元件單位。A method of manufacturing a light-emitting element, comprising: manufacturing a light-emitting element from a light-emitting element wafer including a substrate and a material of a light-emitting element wafer disposed on a light-emitting portion of the substrate, comprising: a first step of sandwiching the light-emitting element a portion of the light-emitting element wafer on the opposite side of the substrate, and a groove for dividing the light-emitting element wafer into the light-emitting element unit and having a depth reaching a position exceeding a boundary portion between the light-emitting portion and the substrate In the second step, the groove formed in the first step and the upper surface of the light-emitting element wafer are covered with a protective resin; and the third step is the upper surface of the light-emitting element wafer covered by the second step The protective resin forms an opening in each of the light-emitting element units; and in the fourth step, after the third step, the light-emitting element wafer is divided into the light-emitting element units along the groove formed in the first step. 如申請專利範圍第7項的發光元件的製造方法,其中,在該第2步驟,使用光感光性樹脂作為該保護樹脂。The method for producing a light-emitting device according to claim 7, wherein in the second step, a photo-sensitive resin is used as the protective resin. 一種發光元件的製造方法,從作為具備基板及配置在該基板上的發光部的發光元件晶片的材料的發光元件晶圓製造發光元件,其特徵在於,包含:   第1步驟,在夾著該發光部位於與該基板相反側的該發光元件晶圓的上面,形成用以將該發光元件晶圓區分成該發光元件單位的具有到達超過該發光部與該基板的邊界部的位置的深度的槽;   第2步驟,以保護樹脂覆蓋在該第1步驟形成的該槽及該發光元件晶圓的該上面;   第4步驟,在該第2步驟之後,沿著在該第1步驟形成的該槽,將該發光元件晶圓分割成該發光元件單位;   在該第2步驟,藉由進行網版印刷,對該發光元件晶圓的該上面的該保護樹脂,就該發光元件單位分別形成開口部。A method of manufacturing a light-emitting element, comprising: manufacturing a light-emitting element from a light-emitting element wafer including a substrate and a material of a light-emitting element wafer disposed on a light-emitting portion of the substrate, comprising: a first step of sandwiching the light-emitting element a portion of the light-emitting element wafer on the opposite side of the substrate, and a groove for dividing the light-emitting element wafer into the light-emitting element unit and having a depth reaching a position exceeding a boundary portion between the light-emitting portion and the substrate In the second step, the groove formed in the first step and the upper surface of the light-emitting element wafer are covered with a protective resin; and the fourth step, after the second step, along the groove formed in the first step Dividing the light-emitting element wafer into the light-emitting element unit; in the second step, by performing screen printing, the protective resin on the upper surface of the light-emitting element wafer is formed with an opening portion in the light-emitting element unit . 如申請專利範圍第9項的發光元件的製造方法,其中,在該第2步驟,藉由噴塗進行網版印刷。A method of producing a light-emitting device according to claim 9, wherein in the second step, screen printing is performed by spraying.
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Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5542449Y2 (en) * 1974-05-14 1980-10-04
JPS645079A (en) * 1987-06-26 1989-01-10 Nec Corp Semiconductor light emitting device
JP2668140B2 (en) * 1989-09-30 1997-10-27 三菱電線工業株式会社 Light emitting module
JPH10215003A (en) * 1997-01-31 1998-08-11 Stanley Electric Co Ltd Led chip
JP4149677B2 (en) * 2001-02-09 2008-09-10 株式会社東芝 Light emitting device and manufacturing method thereof
JP2002241586A (en) * 2001-02-19 2002-08-28 Matsushita Electric Ind Co Ltd Wavelength conversion paste material, composite light- emitting element, semiconductor light-emitting device, and method for producing the same
JP2002314139A (en) * 2001-04-09 2002-10-25 Toshiba Corp Light emitting device
JP2003078248A (en) * 2001-08-31 2003-03-14 Noritake Co Ltd Method of manufacturing thick-film multilayer substrate having via-hole
JP4185784B2 (en) * 2003-02-17 2008-11-26 シャープ株式会社 Oxide semiconductor light emitting device, method for manufacturing the same, and semiconductor light emitting device using oxide semiconductor light emitting device
JP2006179511A (en) * 2004-12-20 2006-07-06 Sumitomo Electric Ind Ltd Light emitting device
JP5374810B2 (en) * 2006-07-18 2013-12-25 株式会社リコー Screen printing version
JP4193905B2 (en) * 2007-03-20 2008-12-10 日亜化学工業株式会社 Manufacturing method of semiconductor device
JP5321376B2 (en) * 2009-09-10 2013-10-23 ソニー株式会社 Semiconductor light emitting device and method for manufacturing the same, image display device, and electronic apparatus
CN101859759A (en) * 2010-06-03 2010-10-13 陕西科技大学 White LED light source package
DE102011100028A1 (en) * 2011-04-29 2012-10-31 Osram Opto Semiconductors Gmbh Component and method for manufacturing a device
DE102012201447A1 (en) * 2012-02-01 2013-08-01 Osram Gmbh LED module
WO2013190871A1 (en) * 2012-06-20 2013-12-27 アオイ電子株式会社 Light source-integrated optical sensor
JP2014045142A (en) * 2012-08-28 2014-03-13 Sony Corp Semiconductor device and semiconductor device manufacturing method
CN104752571A (en) * 2013-12-31 2015-07-01 晶能光电(江西)有限公司 Cutting method of wafer grade white-light LED chip

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