TW201710531A - Vapor deposition apparatus having the capability to limit the injection scope of vapor particles at a predetermined incident angle - Google Patents

Vapor deposition apparatus having the capability to limit the injection scope of vapor particles at a predetermined incident angle Download PDF

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TW201710531A
TW201710531A TW105118782A TW105118782A TW201710531A TW 201710531 A TW201710531 A TW 201710531A TW 105118782 A TW105118782 A TW 105118782A TW 105118782 A TW105118782 A TW 105118782A TW 201710531 A TW201710531 A TW 201710531A
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evaporation source
vapor deposition
opening
deposition device
shielding portion
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TWI654326B (en
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風間良秋
後藤亮太
三澤啓太
七五三木浩一
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佳能特機股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/243Crucibles for source material
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/225Oblique incidence of vaporised material on substrate
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/16Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Physical Vapour Deposition (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

Provided is a vapor deposition device for carrying out an easy maintenance operation of an evaporation source. An evaporation source (2) accommodating the vapor material is provided on the evaporation source portion (40) for performing vapor deposition, comprising a shielding portion (5) to surround the periphery of the evaporation source portion, the shielding portion has an open/close structure and a limiting plate disposed above same to limit the vapor particles from moving towards the substrate at a predetermined incident angle.

Description

蒸鍍裝置 Vapor deposition device

本發明,係有關蒸鍍裝置者。 The present invention relates to a vapor deposition device.

使從蒸發源蒸發而噴出的成膜材料堆積於基板以將薄膜進行成膜的蒸鍍裝置,係廣泛用於有機EL裝置的製造,為了滿足製造上的要求而下了各種的工夫。在專利文獻1,係為了限制從蒸發源所放出的成膜材料的蒸氣的放射範圍,已揭露在收納了蒸發源的蒸發源收納部的外側壁設置限制板。 A vapor deposition device that deposits a film-forming material that evaporates from an evaporation source and deposits on a substrate to form a film is widely used in the production of an organic EL device, and various efforts have been made to satisfy the manufacturing requirements. In Patent Document 1, in order to limit the radiation range of the vapor of the film forming material discharged from the evaporation source, it is disclosed that the outer side wall of the evaporation source housing portion in which the evaporation source is housed is provided with a regulating plate.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本專利特開2011-68980號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2011-68980

然而,上述構成的情況下,每次蒸發源的清掃、收容於蒸發源內的成膜材料的補充、交換等的保養作業時,需 要卸除限制板及固定作業,保養作業的效率降低。 However, in the case of the above configuration, it is necessary to perform maintenance work such as cleaning of the evaporation source and replenishment and exchange of the film forming material contained in the evaporation source. To remove the limit plate and the fixed work, the maintenance work is less efficient.

本發明,係解決如上述的問題點者,提供容易進行蒸發源的保養作業的蒸鍍裝置。 The present invention solves the above problems and provides a vapor deposition device that facilitates maintenance work of an evaporation source.

參照附圖而說明本發明的要旨。 The gist of the present invention will be described with reference to the accompanying drawings.

本發明之第1態樣,係一種蒸鍍裝置,具備供於將對基板1進行蒸鍍的蒸發源2設置在蒸鍍室用的蒸發源設置部,設置包圍前述蒸發源設置部40的遮蔽部5,並作成將針對從設置在前述蒸發源設置部40的蒸發源2朝向前述基板1而放出的成膜材料的蒸發粒子的往基板1的入射角進行限制的限制板4設於前述遮蔽部5之上方位置的構成,且在前述遮蔽部5係設有開閉部6。 According to a first aspect of the present invention, there is provided a vapor deposition apparatus including an evaporation source 2 for vapor deposition of the substrate 1 in an evaporation source installation portion for a vapor deposition chamber, and shielding provided around the evaporation source installation portion 40. In the portion 5, the limiting plate 4 for restricting the incident angle of the evaporating particles of the film forming material discharged from the evaporation source 2 provided in the evaporation source setting portion 40 toward the substrate 1 is provided in the shielding. The configuration of the position above the portion 5 is such that the opening and closing portion 6 is provided in the shielding portion 5.

此外,關於一種蒸鍍裝置,其中前述限制板4,係設於在保養時仍不開閉的固定支撐構材。 Further, in a vapor deposition device, the restriction plate 4 is provided in a fixed support member that does not open and close during maintenance.

此外,關於一種蒸鍍裝置,其中前述開閉部6,係在蒸鍍時關閉,在保養時打開。 Further, in a vapor deposition device, the opening and closing portion 6 is closed during vapor deposition and opened during maintenance.

此外,關於一種蒸鍍裝置,其中前述固定支撐構材7,係構成為具有容許前述開口部6的開閉動作的開口的框狀。 Further, in the vapor deposition device, the fixed support member 7 is configured in a frame shape having an opening that allows opening and closing of the opening portion 6.

此外,關於一種蒸鍍裝置,其中前述固定支撐構材7,係設於對於前述開閉部6的開閉動作不會干涉的位置。 Further, in a vapor deposition device, the fixed support member 7 is provided at a position where the opening and closing operation of the opening and closing portion 6 does not interfere.

此外,關於一種蒸鍍裝置,其中作成包圍前述蒸發源 2之側周面的前述遮蔽部5而在與前述蒸發源2的長邊方向之側面對向的位置設置前述開閉部6。 Furthermore, a vapor deposition apparatus in which the evaporation source is surrounded The shielding portion 5 on the side surface of the side of the second surface is provided with the opening and closing portion 6 at a position facing the side surface in the longitudinal direction of the evaporation source 2.

此外,關於一種蒸鍍裝置,其中將前述遮蔽部5構成為使前述開閉部6為開狀態時,前述蒸發源2在其長邊方向整個全長從此開閉部6曝露。 Further, in the vapor deposition device, when the shielding portion 5 is configured such that the opening and closing portion 6 is in an open state, the evaporation source 2 is exposed from the opening and closing portion 6 over the entire length in the longitudinal direction.

此外,關於一種蒸鍍裝置,其中前述限制板4,係設為相對於前述遮蔽部5可動自如。 Further, in a vapor deposition device, the restricting plate 4 is movable with respect to the shielding portion 5.

此外,關於一種蒸鍍裝置,其中使將前述蒸發源2的四周包圍的前述遮蔽部5的開口部10開閉的遮蔽器9,係設為可相對於前述遮蔽部5而移動。 Further, in a vapor deposition device, the shutter 9 that opens and closes the opening 10 of the shielding portion 5 surrounding the evaporation source 2 is movable relative to the shielding portion 5.

本發明之第2態樣,係一種蒸鍍裝置,具備設置收容成膜材料的蒸發源的蒸發源設置部、及將前述蒸發源設置部的四周包圍的遮蔽部,前述遮蔽部具有開閉構造。 According to a second aspect of the invention, there is provided a vapor deposition device comprising: an evaporation source installation portion that houses an evaporation source that stores a film formation material; and a shielding portion that surrounds the periphery of the evaporation source installation portion, wherein the shielding portion has an opening and closing structure.

依本發明相關的蒸鍍裝置時,變得容易進行蒸發源的保養作業,故可縮短保養所需的時間。 According to the vapor deposition device according to the present invention, the maintenance work of the evaporation source is facilitated, so that the time required for maintenance can be shortened.

1‧‧‧基板 1‧‧‧Substrate

2‧‧‧蒸發源 2‧‧‧ evaporation source

4‧‧‧限制板 4‧‧‧Restricted board

5‧‧‧遮蔽部 5‧‧‧Shading Department

6‧‧‧開閉部 6‧‧‧Opening and closing department

7‧‧‧固定支撐構材 7‧‧‧Fixed support members

9‧‧‧遮蔽器 9‧‧‧Shader

10‧‧‧開口部 10‧‧‧ openings

40‧‧‧蒸發源設置部 40‧‧‧Evaporation source setting department

[圖1]本實施例的概略說明透視圖。 Fig. 1 is a schematic perspective view showing the present embodiment.

[圖2]本實施例的概略說明剖面圖。 Fig. 2 is a schematic cross-sectional view showing the present embodiment.

[圖3]本實施例的概略說明剖面圖。 Fig. 3 is a schematic cross-sectional view showing the present embodiment.

[圖4]本實施例的示意說明側面圖。 Fig. 4 is a schematic side view showing the present embodiment.

針對本發明相關的蒸鍍裝置的實施形態,舉具體的實施例進行說明。 Embodiments of the vapor deposition device according to the present invention will be described with reference to specific examples.

圖1及圖2,係針對本發明相關的蒸鍍裝置的一實施例進行繪示的圖。圖1係蒸鍍裝置的內部構造的透視圖,此等構造係設於未圖示的真空室的內部。圖2,係將圖1在蒸發源支撐體3的短邊方向上的剖圖面。 1 and 2 are views showing an embodiment of a vapor deposition device according to the present invention. Fig. 1 is a perspective view showing the internal structure of a vapor deposition device which is provided inside a vacuum chamber (not shown). Fig. 2 is a cross-sectional view of Fig. 1 in the short-side direction of the evaporation source support 3.

首先,在針對本發明相關的蒸鍍裝置的主要構成進行說明後,說明其他構成。 First, after explaining the main configuration of the vapor deposition device according to the present invention, another configuration will be described.

在蒸發源支撐體3之上表面係設有蒸發源設置部40,在蒸鍍源設置部40係設置收容了成膜材料的蒸發源2。在蒸發源支撐體3之上表面,係進一步設有包圍蒸發源2的四周的遮蔽部5。在本說明書中,遮蔽部5,係存在於蒸發源2的下部(設置蒸發源的蒸鍍室的底面)與上部(蒸發源的基板側)以外的蒸發源2的周圍,將此狀態表示為「包圍四周」。換言之,遮蔽部5,係存在於蒸發源之側周。遮蔽部5,係優選上配置成防止往蒸發源之側周方向的成膜材料的飛散。 An evaporation source installation portion 40 is provided on the upper surface of the evaporation source support 3, and an evaporation source 2 in which a film formation material is accommodated is provided in the vapor deposition source installation portion 40. On the upper surface of the evaporation source support 3, a shielding portion 5 surrounding the periphery of the evaporation source 2 is further provided. In the present specification, the shielding portion 5 is present around the evaporation source 2 except for the lower portion of the evaporation source 2 (the bottom surface of the vapor deposition chamber where the evaporation source is provided) and the upper portion (the substrate side of the evaporation source). "Bound around." In other words, the shielding portion 5 is present on the side of the evaporation source. The shielding portion 5 is preferably disposed so as to prevent scattering of the film forming material in the circumferential direction of the evaporation source.

蒸發源2,係是於一方向長形的形狀的所謂線源,呈將並置多數個材料放出口11的上蓋(未圖示)裝卸自如地設於容器主體的構成。在蒸發源2的內部,係具備供於收容成膜材料用的材料容器,透過將上蓋卸除,使得可進行材料容器內的成膜材料的補充、交換等。 The evaporation source 2 is a so-called line source having a shape elongated in one direction, and is configured such that an upper cover (not shown) that juxtaposes a plurality of material discharge ports 11 is detachably provided in the container body. Inside the evaporation source 2, a material container for accommodating a film forming material is provided, and the upper cover is removed, so that the film forming material in the material container can be replenished and exchanged.

蒸發源2,係可卸除地設置於蒸發源設置部40。蒸發 源設置部40,係具有與蒸發源2的底面大致相同的面積,故包圍蒸發源2的四周而設的遮蔽部5,係變成包圍蒸發源設置部40的四周而設。此外,蒸發源設置部40,係設有供於決定蒸發源2的設置位置用的未圖示的定位構材。為此,即使暫時卸除蒸發源2,仍可再次設置於相同的位置。 The evaporation source 2 is detachably provided in the evaporation source setting portion 40. evaporation Since the source installation portion 40 has substantially the same area as the bottom surface of the evaporation source 2, the shielding portion 5 provided to surround the periphery of the evaporation source 2 is provided to surround the periphery of the evaporation source installation portion 40. Further, the evaporation source installation unit 40 is provided with a positioning member (not shown) for determining the installation position of the evaporation source 2. For this reason, even if the evaporation source 2 is temporarily removed, it can be set again at the same position.

遮蔽部5,係以包圍蒸發源2之側周面的構材而構成,為將從蒸發源2所放出的成膜材料的蒸氣進行遮蔽者。在本實施例,係在蒸發源2,亦即在蒸發源設置部40的四周將各構材立設為垂直狀態而構成俯視矩形狀的遮蔽部5。在蒸發源支撐體3之上表面,係進一步設有固定支撐構材7,在固定支撐構材7,係為了限制從蒸發源2朝向基板1所放出的成膜材料的蒸鍍粒子相對於基板1的入射角,設有限制板4。限制板4,係配置於前述遮蔽部5之上方位置。 The shielding portion 5 is configured by a member that surrounds the peripheral surface of the evaporation source 2, and shields the vapor of the film forming material discharged from the evaporation source 2. In the present embodiment, each of the members is vertically disposed on the evaporation source 2, that is, around the evaporation source installation portion 40, and the shielding portion 5 having a rectangular shape in a plan view is formed. On the upper surface of the evaporation source support 3, a fixed support member 7 is further provided, and the support member 7 is fixed to limit the vapor deposition particles of the film formation material discharged from the evaporation source 2 toward the substrate 1 with respect to the substrate. The incident angle of 1 is provided with a limiting plate 4. The restricting plate 4 is disposed above the shielding portion 5.

因成膜使得收容於蒸發源2的材料的量變少時,成膜速度變不穩定,變得無法獲得既定的膜厚或膜質降低。為了抑制發生如此的狀況,進行蒸發源2的保養。在蒸鍍裝置保養時,係將蒸發源2之上蓋卸除而進行內部的清掃,在收容具備於內部的材料的容器內補充成膜材料。需要保養的間隔,係依存於成膜時間與成膜速度,故在蒸鍍裝置用作為量產機的情況下,保養的頻率變高。 When the amount of the material contained in the evaporation source 2 is reduced by the film formation, the film formation speed becomes unstable, and a predetermined film thickness or film quality cannot be obtained. In order to suppress such a situation, maintenance of the evaporation source 2 is performed. At the time of maintenance of the vapor deposition device, the upper cover of the evaporation source 2 is removed to perform internal cleaning, and the film forming material is replenished in a container that accommodates the material contained therein. The interval required for maintenance depends on the film formation time and the film formation speed. Therefore, when the vapor deposition device is used as a mass production machine, the frequency of maintenance becomes high.

然而,蒸發源2的四周被遮蔽部5包圍,故在保持此狀態下係保養非常困難。本實施例之情況下,在蒸發源2 之上部係進一步配置限制板4故更加困難。在示於專利文獻1的歷來的蒸鍍裝置的構成方面,係每次保養作業時,需要限制板等包圍蒸發源而設的構材的卸除及固定作業,保養作業的效率降低。 However, since the periphery of the evaporation source 2 is surrounded by the shielding portion 5, maintenance in this state is extremely difficult. In the case of this embodiment, in the evaporation source 2 It is more difficult to arrange the restriction plate 4 in the upper portion. In the configuration of the conventional vapor deposition device disclosed in Patent Document 1, it is necessary to limit the removal and fixation of the member provided around the evaporation source such as a plate, and the efficiency of the maintenance work is lowered.

所以,在本發明相關的蒸鍍裝置,係在遮蔽部5設置開閉構造,設置可透過開閉構造,而變更為遮蔽部5包圍蒸發源的狀態(閉狀態)與蒸發源曝露的狀態(開狀態)的保養用的開閉部6。例如,在蒸鍍時,係可使開閉部6成為閉狀態,在保養時等,可利用開閉構造,而打開開閉部6。藉此,保養作業的效率提升。 Therefore, the vapor deposition device according to the present invention is provided with an opening and closing structure in the shielding portion 5, and is provided with a permeable opening/closing structure, and is changed to a state in which the shielding portion 5 surrounds the evaporation source (closed state) and a state in which the evaporation source is exposed (open state). The opening and closing portion 6 for maintenance. For example, at the time of vapor deposition, the opening and closing portion 6 can be closed, and the opening and closing portion 6 can be opened by the opening and closing structure during maintenance or the like. Thereby, the efficiency of maintenance work is improved.

具體而言,將遮蔽部5,以一對的固定構材14與一對的可動構材15而構成,該一對的固定構材14係位於蒸發源2的短邊方向之側面側,固定於蒸發源支撐體3的對向,該一對的可動構材15係位於蒸發源2的長邊方向之側面側,可在一對的固定構材14之間相對於固定構材14而移動。 Specifically, the shielding portion 5 is configured by a pair of fixed members 14 and a pair of movable members 15 which are located on the side of the short side direction of the evaporation source 2 and fixed. In the direction opposite to the evaporation source support 3, the pair of movable members 15 are located on the side of the longitudinal direction of the evaporation source 2, and are movable between the pair of fixed members 14 with respect to the fixed member 14. .

可動構材15,係比蒸發源2的長邊方向長形,一對的可動構材15係在一對的固定構材14之間對向而配置。可動構材15的兩端部,係藉軸旋轉支撐部17在固定構材14的內面下部被軸旋轉支撐,呈可作成使可動構材15以軸旋轉支撐部17旋轉而從垂直立設狀態往外方打開的狀態的構成。藉如此的開閉構造,從而實現可變更為蒸發源2在長邊方向整個全長被遮蔽的狀態與被曝露的狀態的開閉部6。 The movable member 15 is longer than the longitudinal direction of the evaporation source 2, and the pair of movable members 15 are disposed to face each other between the pair of fixed members 14. Both ends of the movable member 15 are rotatably supported by the shaft rotating support portion 17 at the lower portion of the inner surface of the fixed member 14, so that the movable member 15 can be rotated from the vertical by the shaft rotation support portion 17 The state of the state in which the state is opened to the outside. With such an opening and closing structure, the opening and closing portion 6 in which the evaporation source 2 is shielded in the entire length in the longitudinal direction and the exposed state can be realized.

於本實施例中,遮蔽部5,係除了將從蒸發源2所放出的成膜材料的蒸氣進行遮蔽的功能以外,具有將從蒸發源2所發出的熱進行遮蔽的功能。因此,固定構材14及可動構材15,係呈設有水等的冷媒在內部流通的冷媒流通路13的冷卻板,在可動構材15的內側面係設有將冷媒流通路13閉塞的閉塞板16。 In the present embodiment, the shielding portion 5 has a function of shielding the heat generated from the evaporation source 2 in addition to the function of shielding the vapor of the film forming material discharged from the evaporation source 2. Therefore, the fixed member 14 and the movable member 15 are cooling plates of the refrigerant flow path 13 through which the refrigerant such as water flows, and the refrigerant flow path 13 is closed on the inner side surface of the movable member 15. The occlusion plate 16 is closed.

固定支撐構材7,係構成為具有容許開閉部6的開閉動作的開口的框狀。具體而言,固定支撐構材7,係作成具有設置在不干涉開閉部6的開閉動作的位置的4個腳部18,並在此腳部18之上端架設水平材的構成。 The fixed support member 7 is configured in a frame shape having an opening that allows opening and closing operations of the opening and closing portion 6. Specifically, the fixed support member 7 is formed to have four leg portions 18 provided at positions that do not interfere with the opening and closing operation of the opening and closing portion 6, and a horizontal member is placed on the upper end of the leg portion 18.

4個腳部18,係相對於蒸發源2,立設在比用於各固定構材14的開閉的軸旋轉支撐部17外側的位置。亦即,蒸發源的長邊方向上的腳部18之間隔,係比蒸發源的長邊方向上的可動構材的長度長。 The four leg portions 18 are erected to a position outside the shaft rotation support portion 17 for opening and closing of each of the fixed members 14 with respect to the evaporation source 2 . That is, the interval between the leg portions 18 in the longitudinal direction of the evaporation source is longer than the length of the movable member in the longitudinal direction of the evaporation source.

水平材,係具有與固定構材14平行的一對的短形水平材19、及與可動構材15平行的一對的長形水平材20。另外,各腳部18的高度,係設定為水平材(19、20)設於比可動構材15之上端高的位置。 The horizontal material is a pair of short horizontal members 19 that are parallel to the fixed member 14, and a pair of elongated horizontal members 20 that are parallel to the movable member 15. Further, the height of each of the leg portions 18 is set such that the horizontal members (19, 20) are provided at positions higher than the upper end of the movable member 15.

因此,蒸發源2,係配置在被以4個腳部18與水平材而構成的框狀的固定支撐構材7所包圍的區域之中。本實施例中固定支撐構材7係以剖面視L字狀的角材而構成。 Therefore, the evaporation source 2 is disposed in a region surrounded by the frame-shaped fixed support member 7 composed of the four leg portions 18 and the horizontal member. In the present embodiment, the fixed support member 7 is formed of an angular material having an L-shaped cross section.

在是固定支撐構材7之上表面的長形水平材20上,係設有一對的限制板4。 On the elongated horizontal member 20 which is the upper surface of the fixed support member 7, a pair of restricting plates 4 are provided.

設置限制板4,使得成膜材料的蒸鍍粒子往基板1入射的角度受限制,可在使用了遮罩的成膜中,將以侵入於遮罩與基板之間的角度而入射至基板的蒸鍍粒子進行遮蔽。 The limiting plate 4 is provided such that the angle at which the vapor deposition particles of the film forming material enter the substrate 1 is restricted, and in the film formation using the mask, the substrate may be incident on the substrate at an angle between the mask and the substrate. The vapor deposited particles were shielded.

限制板4,係呈可透過分別設於長形水平材20上的滑動導引構材,而水平移動以自由地予以接近遠離,可在期望的位置進行固定。限制板4係具有與長形水平材20大致相同的長度,透過調整一對的限制板4彼此之間隔,使得可容易進行入射角的調整。 The restricting plate 4 is permeable to the sliding guide members respectively disposed on the elongated horizontal member 20, and is horizontally moved to be freely approached and fixed at a desired position. The restricting plate 4 has substantially the same length as the elongated horizontal member 20, and the distance between the pair of restricting plates 4 is adjusted so that the adjustment of the incident angle can be easily performed.

在圖3及圖4中,繪示透過可動構材15的打開轉動而使蒸發源2在其長邊方向整個全長曝露的狀態。圖3係從蒸發源2的長邊方向所見的圖,圖4係從蒸發源2的短邊方向所見的圖。如此,使蒸發源2在長邊方向整個全長予以曝露,使得容易進行將蒸發源2之上蓋卸除等。亦即,透過設置開閉部6,使得變得不需要設於蒸發源2的周圍的構材的卸除及固定作業,故保養的作業性提升。另外,在圖中,係雖可開閉地構成位於長邊方向之側面側的一對的可動構材15,惟只要可進行保養作業,則亦可僅在長邊方向之側面側的一方設置可動構材15,使另一方為固定構材。 In FIGS. 3 and 4, a state in which the evaporation source 2 is exposed to the entire length in the longitudinal direction thereof by the opening and rotation of the movable member 15 is shown. 3 is a view seen from the longitudinal direction of the evaporation source 2, and FIG. 4 is a view seen from the short side direction of the evaporation source 2. In this manner, the evaporation source 2 is exposed to the entire length in the longitudinal direction, so that the upper cover of the evaporation source 2 can be easily removed. In other words, by providing the opening and closing portion 6, the removal and fixation of the member provided around the evaporation source 2 are unnecessary, and the workability of maintenance is improved. In addition, in the figure, the pair of movable members 15 located on the side surface side in the longitudinal direction may be opened and closed, but only one of the side faces on the longitudinal side may be provided as long as maintenance work is possible. The member 15 is made of the other member as a fixed member.

尤其,限制板4,係供於限制成膜材料的蒸鍍粒子往基板1入射的角度用的位置為重要,故暫時卸除時,要再現卸除前的狀態需要相當的時間。然而,本發明的蒸鍍裝置係具有保養用的開閉部6,故使蒸鍍時關閉的狀態的可 動構材15,在保養時成為打開的狀態,使得可簡單地進行保養。如此,在保養時亦不需要卸除限制板4,故可維持限制板4的位置下進行保養,保養的作業性格外提升。保養的結束後,再次關閉可動構材15即可恢復至可容易地蒸鍍的狀態。 In particular, the restriction plate 4 is important for limiting the position at which the vapor deposition particles of the film formation material enter the substrate 1. Therefore, it takes a considerable time to reproduce the state before the removal. However, since the vapor deposition device of the present invention has the opening and closing portion 6 for maintenance, it is possible to close the state during vapor deposition. The moving member 15 is in an open state during maintenance so that maintenance can be easily performed. In this way, it is not necessary to remove the restriction plate 4 during maintenance, so that the maintenance of the position of the restriction plate 4 can be maintained, and the workability of maintenance is particularly improved. After the end of the maintenance, the movable member 15 is closed again to return to a state in which it can be easily vapor-deposited.

接著,基於圖1、2,而詳細說明有關本實施例的蒸鍍裝置的其他具體的構成。 Next, another specific configuration of the vapor deposition device according to the present embodiment will be described in detail based on Figs.

在本實施例,係可動自如地設有將包圍蒸發源2的遮蔽部5的開口部10進行開閉的遮蔽器9。遮蔽器9係設置一對,以比可動構材15稍為長形而配置為可將遮蔽部5的開口部10進行閉塞。具體而言,各遮蔽器9的兩端部,係分別隔著滑動導引構材21而設於固定構材14上。並且,各遮蔽器9在固定構材14之上接近遠離而移動,從而將前述開口部10進行開閉。 In the present embodiment, the shutter 9 that opens and closes the opening 10 that surrounds the shielding portion 5 of the evaporation source 2 is movably provided. The shutter 9 is provided in a pair and is disposed slightly longer than the movable member 15 so as to block the opening 10 of the shielding portion 5. Specifically, both end portions of the respective shutters 9 are provided on the fixed member 14 via the slide guide members 21, respectively. Then, each of the shutters 9 moves closer to the fixed member 14 and opens and closes the opening 10.

此外,遮蔽器9,係作成具有將遮蔽部5的開口部10進行閉塞的水平板部22、及將固定支撐構材7的長形水平材20與可動構材15之間隙進行閉塞的垂直板部23的構成。垂直板部23,係在水平板部22之上表面設置比水平構材22稍短的剖面視L字狀的角材而形成。 Further, the shutter 9 is formed with a horizontal plate portion 22 that closes the opening portion 10 of the shielding portion 5, and a vertical plate that closes the gap between the elongated horizontal member 20 and the movable member 15 of the fixed supporting member 7. The structure of the part 23. The vertical plate portion 23 is formed on the upper surface of the horizontal plate portion 22 with an L-shaped angle member which is slightly shorter than the horizontal member 22.

並且,將各水平板部22等構成為在將遮蔽器9關閉的狀態下,係水平板部22的對向部重疊,並構成為在蒸鍍時將遮蔽器9打開的狀態下,係水平板部22將長形水平材20與可動構材15之間隙(的大部分)閉塞(圖1、2參照)。 Further, each of the horizontal plate portions 22 and the like is configured such that the opposing portions of the horizontal plate portion 22 are overlapped in a state where the shutter 9 is closed, and the shutter 9 is opened at the time of vapor deposition. The plate portion 22 closes (most of) the gap between the elongated horizontal member 20 and the movable member 15 (see FIGS. 1 and 2).

具體而言,在遮蔽部5,係作成在固定構材14的內方,包含寬比前述一對的可動構材15的對向間隔稍小,且高度比固定構材14高的矩形狀的停止用板體8的構成。 Specifically, the shielding portion 5 is formed to be inside the fixed member 14 and includes a rectangular shape having a width smaller than that of the pair of movable members 15 and a height higher than that of the fixed member 14 . The configuration of the plate body 8 is stopped.

在此停止用板體8,係構成為分別設於遮蔽器9的長邊方向兩端部及寬度方向外方側端部的折返部25、26、及設在設於可動構材15的內面側的閉塞板16的兩端部的折返部27,作成將此遮蔽器9及可動構材15關閉的狀態時重疊。因此,上述的遮蔽器9閉塞的遮蔽部5的開口部10,係具體而言係以停止用板體8與可動構材15所包圍的空間的開口部10。 The stop plate body 8 is configured to be provided in the longitudinal end portions of the shutter 9 and the folded portions 25 and 26 at the outer end portions in the width direction, and in the movable member 15 The folded portion 27 at both end portions of the blocking plate 16 on the front side is overlapped in a state in which the shutter 9 and the movable member 15 are closed. Therefore, the opening portion 10 of the shielding portion 5 in which the shutter 9 is closed is specifically the opening portion 10 that stops the space surrounded by the plate body 8 and the movable member 15.

此外,於本實施例中,係構成為可動構材15的閉塞板16的折返部27重疊於停止用板體8的外側,遮蔽器9的折返部25、26重疊於此閉塞板16的外側。因此,變得可確實防止成膜材料從蒸發源2的長邊方向兩端部側的漏出,使得可在將前述成膜材料良好地封入前述空間的狀態下進行將蒸發源2進行蒸鍍前的試運轉(running in)等。 Further, in the present embodiment, the folded portion 27 of the blocking plate 16 of the movable member 15 is overlapped with the outside of the stopping plate 8, and the folded portions 25 and 26 of the shutter 9 are overlapped on the outside of the blocking plate 16. . Therefore, it is possible to surely prevent the film formation material from leaking from the both end sides of the evaporation source 2 in the longitudinal direction, so that the vapor deposition source 2 can be vapor-deposited while the film formation material is well sealed in the space. Run in, etc.

根據以上,依本實施時,如圖示於圖1、2在蒸鍍時係將遮蔽器9打開而將遮蔽部5的開口部10開放,可在透過限制板4而限制入射角的狀態下進行蒸鍍。 According to the above, in the present embodiment, when the shutter 9 is opened during vapor deposition as shown in FIGS. 1 and 2, the opening 10 of the shielding portion 5 is opened, and the incident angle can be restricted by the restriction plate 4. Perform evaporation.

此外,在蒸發源2等的保養時,係如圖示於圖3、4將遮蔽器9開至可動構材15及閉塞板16不會干涉的位置,使可動構材15朝外方打開轉動而使蒸發源2在其整個全長從以固定支撐構材7的腳部18與長形水平材20所 包圍的空間而蒸發源2而曝露。在此狀態下,將蒸發源2之上蓋卸除而從遮蔽部5取出,使得可進行清掃、成膜材料的補充等,可縮短保養時間。此外,不限於蒸發源2的保養,進行固定構材14、可動構材15、遮蔽器9等的其他構材的清掃時,亦無須接觸設於固定支撐構材7的限制板4,使得可在保養的前後維持一度設定的入射角。此外,入射角的微調整亦透過調整限制板4的背離程度而變得容易進行。 Further, at the time of maintenance of the evaporation source 2 or the like, the shutter 9 is opened to a position where the movable member 15 and the blocking plate 16 do not interfere as shown in Figs. 3 and 4, and the movable member 15 is opened outward. The evaporation source 2 is caused to extend from the leg portion 18 of the fixed support member 7 to the elongated horizontal member 20 throughout its entire length. The surrounding space is evaporated while the source 2 is exposed. In this state, the upper cover of the evaporation source 2 is removed and taken out from the shielding portion 5, so that cleaning, replenishment of the film forming material, and the like can be performed, and the maintenance time can be shortened. Further, it is not limited to the maintenance of the evaporation source 2, and it is not necessary to contact the restriction plate 4 provided on the fixed support member 7 when cleaning the other members such as the fixed member 14, the movable member 15, and the shutter 9. Maintain a set angle of incidence before and after maintenance. Further, the fine adjustment of the incident angle is also facilitated by adjusting the degree of deviation of the limiting plate 4.

此外,本實施例的蒸發源支撐體3,係具備滑件。具體而言,在蒸鍍室的底面設置延伸於第一方向的導軌31,並設置可相對於此導軌31而往返滑動的框狀的第一方向移動用滑件32。並且,在此第一方向移動用滑件32之上表面設置延伸於第二移動方向的導軌33,在蒸發源支撐體3的下部設置可相對於此導軌33而往返滑動的第二方向移動用滑件35。在此蒸發源支撐體3的底面,係連結供於使蒸發源支撐體3移動用的臂件構材34,可驅動此臂件構材34而使蒸發源支撐體3(蒸發源2)移動於第一方向或第二方向。 Further, the evaporation source support 3 of the present embodiment is provided with a slider. Specifically, a guide rail 31 extending in the first direction is provided on the bottom surface of the vapor deposition chamber, and a frame-shaped first direction movement slider 32 that can slide back and forth with respect to the guide rail 31 is provided. Further, a guide rail 33 extending in the second movement direction is provided on the upper surface of the first direction moving slider 32, and a second direction movement capable of reciprocatingly sliding with respect to the guide rail 33 is provided in the lower portion of the evaporation source support body 3. Slide 35. On the bottom surface of the evaporation source support 3, an arm member 34 for moving the evaporation source support 3 is coupled, and the arm member 34 can be driven to move the evaporation source support 3 (evaporation source 2). In the first direction or the second direction.

因此,例如於第一方向並置2個蒸鍍區域,使得可使一個蒸發源2,在一個蒸鍍區域往返移動於成膜移動方向(第二方向)而進行成膜後,予以移動於蒸鍍區域移動方向(第一方向)而在其他蒸鍍區域同樣地進行成膜等。本實施例之情況下,構成為在一個蒸鍍區域進行成膜時,係使蒸發源2移動於與蒸發源2的長邊方向交叉的方向而進 行成膜。 Therefore, for example, two vapor deposition zones are juxtaposed in the first direction, so that one evaporation source 2 can be moved to the vapor deposition zone in the film formation moving direction (second direction) to form a film, and then moved to the vapor deposition. In the region moving direction (first direction), film formation or the like is performed in the same manner in the other vapor deposition regions. In the case of the present embodiment, when the film formation is performed in one vapor deposition zone, the evaporation source 2 is moved in a direction intersecting the longitudinal direction of the evaporation source 2. Film formation.

另外,本發明,係非限於本實施例者,各構成要件的具體構成係可適當設計者。 Further, the present invention is not limited to the embodiment, and the specific configuration of each constituent element can be appropriately designed.

1‧‧‧基板 1‧‧‧Substrate

3‧‧‧蒸發源支撐體 3‧‧‧ evaporation source support

4‧‧‧限制板 4‧‧‧Restricted board

5‧‧‧遮蔽部 5‧‧‧Shading Department

6‧‧‧開閉部 6‧‧‧Opening and closing department

7‧‧‧固定支撐構材 7‧‧‧Fixed support members

9‧‧‧遮蔽器 9‧‧‧Shader

13‧‧‧冷媒流通路 13‧‧‧Refrigerant flow path

14‧‧‧固定構材 14‧‧‧Fixed members

15‧‧‧可動構材 15‧‧‧ movable members

17‧‧‧軸旋轉支撐部 17‧‧‧Axis Rotation Support

18‧‧‧腳部 18‧‧‧ feet

19‧‧‧短形水平材 19‧‧‧Short horizontal timber

20‧‧‧長形水平材 20‧‧‧Long horizontal timber

21‧‧‧滑動導引構材 21‧‧‧Sliding guide members

31‧‧‧導軌 31‧‧‧ rails

32‧‧‧第一方向移動用滑件 32‧‧‧First direction moving slider

33‧‧‧第二移動方向的導軌 33‧‧‧Second moving direction guide

34‧‧‧臂件構材 34‧‧‧arm members

35‧‧‧第二方向移動用滑件 35‧‧‧Second direction moving slider

Claims (15)

一種蒸鍍裝置,在蒸鍍室具備供於設置收容成膜材料的蒸發源用的蒸發源設置部,特徵在於:設置將前述蒸發源設置部包圍的遮蔽部,並作成將針對從設置於前述蒸發源設置部的蒸發源朝向前述基板所放出的成膜材料的蒸發粒子的往基板的入射角進行限制的限制板設於前述遮蔽部之上方位置的構成,且在前述遮蔽部係設有開閉部。 In a vapor deposition apparatus, an evaporation source installation unit for providing an evaporation source for accommodating a film formation material is provided in a vapor deposition chamber, and a shielding portion that surrounds the evaporation source installation portion is provided, and is provided in the vapor deposition device. a restriction plate that restricts an incident angle of the evaporating particles of the film formation material discharged from the substrate to the substrate, and a restriction plate that is disposed at an upper position of the shielding portion, and is provided with an opening and closing portion in the shielding portion. unit. 如申請專利範圍第1項之蒸鍍裝置,其中,前述限制板,係設於在保養時仍不開閉的固定支撐構材。 The vapor deposition device according to claim 1, wherein the restricting plate is provided as a fixed supporting member that does not open and close during maintenance. 如申請專利範圍第1項之蒸鍍裝置,其中,前述開閉部,係在蒸鍍時關閉,在保養時打開。 The vapor deposition device according to claim 1, wherein the opening and closing portion is closed during vapor deposition and opened during maintenance. 如申請專利範圍第1項之蒸鍍裝置,其中,前述固定支撐構材,係構成為具有容許前述開口部的開閉動作的開口的框狀。 The vapor deposition device according to the first aspect of the invention, wherein the fixed support member is formed in a frame shape having an opening that allows opening and closing of the opening. 如申請專利範圍第1項之蒸鍍裝置,其中,前述固定支撐構材,係設於對於前述開閉部的開閉動作不會干涉的位置。 The vapor deposition device according to claim 1, wherein the fixed support member is provided at a position where the opening and closing operation of the opening and closing portion does not interfere. 如申請專利範圍第1項之蒸鍍裝置,其中,作成包圍前述蒸發源設置部的四周的前述遮蔽部而在與前述蒸發源設置部的長邊方向之側面對向的位置設置前述開閉部。 The vapor deposition device according to the first aspect of the invention, wherein the shielding portion is provided around the evaporation source installation portion, and the opening and closing portion is provided at a position facing a side surface in a longitudinal direction of the evaporation source installation portion. 如申請專利範圍第6項之蒸鍍裝置,其中,將前述遮蔽部構成為使前述開閉部為開狀態時,設置於前述蒸發源設置部的蒸發源在其長邊方向整個全長從此開閉部曝 露。 The vapor deposition device of the sixth aspect of the invention, wherein the shielding portion is configured such that when the opening and closing portion is in an open state, the evaporation source provided in the evaporation source installation portion is exposed from the opening and closing portion in the entire longitudinal direction thereof. dew. 如申請專利範圍第1項之蒸鍍裝置,其中,前述限制板,係設為相對於前述遮蔽部可動自如。 The vapor deposition device according to claim 1, wherein the restricting plate is movable with respect to the shielding portion. 如申請專利範圍第1~8項中任1項之蒸鍍裝置,其中,使將前述蒸發源設置部包圍的前述遮蔽部的開口部開閉的遮蔽器,係設為可相對於前述遮蔽部移動。 The vapor deposition device according to any one of the first to eighth aspects of the present invention, wherein the shutter that opens and closes the opening of the shielding portion that surrounds the evaporation source installation portion is movable relative to the shielding portion . 一種蒸鍍裝置,具備供於設置收容成膜材料的蒸發源用的蒸發源設置部、及將前述蒸發源設置部的四周包圍的遮蔽部,特徵在於:前述遮蔽部具有開閉構造。 A vapor deposition device includes an evaporation source installation portion for providing an evaporation source for accommodating a film formation material, and a shielding portion for surrounding the evaporation source installation portion, wherein the shielding portion has an opening and closing structure. 如申請專利範圍第10項之蒸鍍裝置,其中,前述蒸發源設置部設於蒸發源支撐體之上,前述遮蔽部具備夾著前述蒸發源設置部而對向的一對的固定構材、及在前述一對的固定構材之間夾著前述蒸發源設置部而對向的一對的構材,前述一對的固定構材固定於前述蒸發源支撐體,前述一對的構材中的至少一方為以設於兩端部的軸旋轉支撐部而軸旋轉支撐於前述一對的固定構材的內面下部的可動構材。 The vapor deposition device according to claim 10, wherein the evaporation source installation portion is provided on the evaporation source support, and the shielding portion includes a pair of fixed members that face each other across the evaporation source installation portion, And a pair of members facing the evaporation source installation portion between the pair of fixed members, wherein the pair of fixed members are fixed to the evaporation source support, and the pair of members are At least one of the movable members is pivotally supported by the lower surface of the pair of fixed members by a shaft rotation support portion provided at both end portions. 如申請專利範圍第11項之蒸鍍裝置,其中,前述蒸發源設置部在一方向呈長形的形狀,前述可動部係沿著前述蒸發源設置部的長邊方向而設。 The vapor deposition device according to claim 11, wherein the evaporation source installation portion has an elongated shape in one direction, and the movable portion is provided along a longitudinal direction of the evaporation source installation portion. 如申請專利範圍第10~12項中任1項之蒸鍍裝 置,其中,在前述蒸發源支撐體,係設有將前述蒸發源設置部包圍的框狀的固定支撐構材,在前述固定支撐構材之上表面設有限制板。 For example, the vapor deposition package of any of the 10th to 12th patent applications In the evaporation source support, a frame-shaped fixed support member surrounding the evaporation source installation portion is provided, and a restriction plate is provided on the upper surface of the fixed support member. 如申請專利範圍第13項之蒸鍍裝置,其中,構成前述固定支撐構材的框的前述蒸發源設置部的長邊方向上的間隔,比前述可動部的前述蒸發源設置部的長邊方向上的長度長。 The vapor deposition device according to claim 13, wherein an interval in a longitudinal direction of the evaporation source installation portion constituting the frame of the fixed support member is longer than a longitudinal direction of the evaporation source installation portion of the movable portion The length on the top is long. 一種蒸鍍裝置,將隔著遮罩而對基板進行蒸鍍的蒸發源,設於蒸鍍室而成,特徵在於:設置將前述蒸發源包圍的遮蔽部,並作成將針對從前述蒸發源朝向前述基板而飛散的成膜材料的往基板的入射角進行限制的限制板設於前述遮蔽部之上方位置的構成,且在前述遮蔽部,係設置在保養時開閉而將前述蒸發源進行曝露隱蔽的保養用開閉部,而前述限制板係設於在保養時仍不開閉的固定支撐構材。 A vapor deposition device in which an evaporation source for vapor-depositing a substrate via a mask is provided in a vapor deposition chamber, and is characterized in that a shielding portion that surrounds the evaporation source is provided and is oriented toward the evaporation source The restricting plate that restricts the incident angle of the film forming material scattered on the substrate to the substrate is disposed above the shielding portion, and the shielding portion is opened and closed during maintenance to expose the evaporation source to the concealment The maintenance opening and closing portion is provided, and the restriction plate is provided on a fixed support member that does not open and close during maintenance.
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