TW201708830A - Electronic component testing classifier consisting of a material supply device, a temperature control device, a conveying device, a test device and a central control device - Google Patents

Abstract

Provided is an electronic component testing classifier, which has a platform equipped with a material supply device, a temperature control device, a conveying device, a test device and a central control device, wherein the machine is at least provided with one preheating zone. The material supply device is equipped with a material supply plate portion outside of the preheating zone for accepting the material supply plate, and is provided with at least one material supply buffer portion in the interior of the preheating zone for accepting the placement of electronic components to be tested on the material supply plate outputted from the material supply plate portion. The temperature control device uses a first thermostat to enable the preheating zone to form a preheated working environment, and a built-in second thermostat is arranged in the preheating zone for accepting and preheating electronic components, when the material supply plate of the material supply buffer portion is supplying material in the preheating zone, the electronic components to be tested on the material supply plate are arranged for a first stage preheating. The conveying device is to take out the preheated electronic components using a material conveyor from the feeding plate and then is transferred to the second thermostat for a second stage preheating, so that the electronic components to be tested are quickly preheated to a predetermined temperature, then the material conveyor conveys the preheated electronic components to a tester of the test device for a test operation, thereby effectively shortening the operation time for preheating the electronic components, hence, the disclosed the improves production efficiency.

Description

Electronic component test sorter

The invention provides a method for feeding the electronic component on the feeding tray by using the feeding device in the pre-warming zone, and then transferring the electronic component to the second thermostat to continue the pre-warming to the preset operating temperature, so as to be effective. An electronic component test sorting machine that shortens the operation time of pre-warmed electronic components and further improves production efficiency.

Nowadays, the actual use of electronic components in the future may be low-temperature environment or high-temperature environment. In order to ensure the use quality of electronic components in low temperature or high temperature environment, electronic components must be cooled by test sorter after the electronic components are manufactured. For the purpose of measuring or thermal testing, and eliminating defective products, the tester performs the electronic component cold test operation as an example. The electronic components are tested in a -40 degree low temperature simulation environment, and the electronic components at normal temperature are directly placed. In the test device, the test device must have an empty electronic component cooled from a normal temperature to a low temperature of -40 degrees, so that the cold test operation can be performed, so that the test device consumes waiting time and reduces the production efficiency.

Therefore, referring to FIG. 1 , the test sorting machine is provided with a feeding device 12 on the machine table 11 , and the feeding device 12 is provided with at least one feeding tray 121 of the electronic component 13 to be tested. The pre-cooling tray 14 on the machine table 11 is used for pre-cooling the electronic component 13 to be tested, and the conveying device 15 mounted on the machine table 11 is in the first, second and third directions (such as X, the shifter 151). Y, Z direction) displacement, a batch of electronic components 13 precooled to -40 degrees in the pre-cooling tray 14 are transferred to the test socket 161 of a test device 16, and then taken out from the supply tray 121 of the feeding device 12. A batch of electronic components 13 to be tested is transferred to the pre-cooling tray 14 to perform a pre-cooling operation. At the same time, the testing device 16 performs a test operation on the pre-cooled electronic component 13 of the previous batch. The electronic component 13 is cooled. After the test is completed, the feeder 151 of the conveying device 15 takes out the measured electronic component 13 from the test socket 161 of the testing device 16, and transfers it to the receiving tray 171 of a receiving device 17. Upside down; however, the electronic component 13 to be tested can be pre-cooled on the pre-cooling disk 14 to avoid the consumption of the test device 16 The electronic components such as time and space are cooled, but the electronic component 13 to be tested at the feeding device 12 is at a normal temperature. When the feeder 151 of the conveying device 15 moves the electronic component 13 to be tested at normal temperature into the pre-cooling tray 14, the pre-cooling tray 14 remains The electronic component 13 at normal temperature is cooled and pre-cooled to a preset cold measurement temperature, so that the loader 151 of the conveying device 15 can transfer the electronic component 13 to be tested to the testing device 16, so that the pre-cooling cannot be effectively shortened. The working time and the improvement of the production efficiency; furthermore, the tested electronic component 13 at the testing device 16 is in a low temperature state, when the feeder 151 of the conveying device 15 transfers the low temperature tested electronic component 13 to the receiving device 17 At this time, the low-temperature electronic component 13 on the receiving device 17 cannot be quickly warmed to normal temperature, so that the measured electronic component 13 at a low temperature will contact the air having a high ambient water content, resulting in the measured device 17 being tested. Defects in condensation of electronic components.

A first object of the present invention is to provide an electronic component test classification machine, which is The machine is equipped with a feeding device, a temperature control device, a conveying device, a testing device and a central control device. The machine is provided with at least one pre-warming zone, and the feeding device is provided outside the pre-warming zone. a feeding tray portion of the feeding tray, and at least one feeding temporary portion is disposed inside the preheating portion to receive the feeding tray of the electronic component to be tested outputted by the feeding tray portion, the temperature The control device adopts a first thermostat to form a pre-warming working environment, and a second thermostat capable of receiving and pre-warning electronic components in the pre-warming zone, when the feeding temporary portion is provided While the tray is feeding in the pre-warming zone, the electronic component to be tested of the feeding tray can be pre-warmed in the first stage, and the conveying device is taken out from the feeding tray by the feeder to be pre-warmed. The electronic component is transferred to the second thermostat for the second stage pre-heating, so that the electronic component to be tested is quickly pre-warmed to a preset test temperature, and the shifter then completes the pre-warmed electronic device to be tested. The component is transferred to the tester of the test device to perform the test operation, thereby effectively shortening the working time of the pre-warmed electronic component L produce practical benefits of performance.

An object of the present invention is to provide an electronic component test sorting machine, wherein The machine platform is provided with at least one temperature recovery zone, and the temperature control device is provided with a third temperature controller in the temperature recovery zone, so that the temperature recovery zone forms a warming working environment, and a receiving device is attached to the machine platform. The receiving part of the receiving area is provided inside the returning temperature zone, and the tested electronic components can be subjected to the temperature returning from the low temperature back to the normal temperature while the receiving tray is placed on the tested electronic components. After the receiving tray completes the receiving, the receiving device outputs the electronic component with the measured temperature at normal temperature to the receiving tray portion located outside the temperature returning region, thereby effectively preventing the measured electronic components from dew condensation and improving the quality of the electronic component. Practical benefits.

[study]

11‧‧‧ machine

12‧‧‧Feeding device

121‧‧‧ Feeding tray

13‧‧‧Electronic components

14‧‧‧Pre-cooling tray

15‧‧‧Conveyor

151‧‧‧Transfer

16‧‧‧Testing device

161‧‧‧ test seat

17‧‧‧ Receiving device

171‧‧‧ receiving tray

〔this invention〕

20‧‧‧ machine

21‧‧‧Preheating zone

22‧‧‧Test area

23‧‧‧Return zone

24‧‧‧Open area

251‧‧‧ first gate

252‧‧‧second gate

253‧‧‧ third gate

254‧‧‧fourth gate

255‧‧‧ fifth gate

256‧‧‧ sixth gate

30‧‧‧Feeding device

31‧‧‧Feeding and placing department

32‧‧‧ Feeding tray

33‧‧‧Feeding Temporary Department

34‧‧‧Feed conveyor

40‧‧‧Receiving device

41‧‧‧Receipt Temporary Department

42‧‧‧ receiving tray

43‧‧‧Receiving and placing department

44‧‧‧ Receiving conveyor

50‧‧‧Testing device

51‧‧‧ boards

52‧‧‧ test seat

60‧‧‧temperature control device

61‧‧‧First thermostat

62‧‧‧Second thermostat

63‧‧‧ third thermostat

64‧‧‧ fourth thermostat

65‧‧‧ fifth thermostat

70‧‧‧Conveyor

71‧‧‧First mover

72‧‧‧First feeding platform

73‧‧‧Second feed stage

74‧‧‧Second shifter

75‧‧‧third shifter

76‧‧‧First discharge stage

77‧‧‧Second discharge platform

78‧‧‧fourth shifter

79‧‧‧ fifth shifter

80‧‧‧Air equipment

81‧‧‧ Empty Position Temporary Department

82‧‧‧ Empty Disk Collection Department

83‧‧‧ empty tray conveyor

Figure 1: Schematic diagram of a conventional electronic component test sorter.

Figure 2: Schematic diagram of the electronic component test sorter of the present invention.

Figure 3: Schematic diagram of the use of the electronic component test sorter of the present invention (1).

Figure 4: Schematic diagram of the use of the electronic component test sorter of the present invention (2).

Figure 5: Schematic diagram of the use of the electronic component test sorter of the present invention (3).

Figure 6: Schematic diagram of the use of the electronic component test sorter of the present invention (4).

Figure 7: Schematic diagram of the use of the electronic component test sorter of the present invention (5).

Figure 8: Schematic diagram of the use of the electronic component test sorter of the present invention (6).

Figure 9: Schematic diagram of the use of the electronic component test sorter of the present invention (7).

Figure 10: Schematic diagram of the use of the electronic component test sorter of the present invention (8).

In order to make the present invention more fully understood by the reviewing committee, a preferred embodiment and a drawing will be described in detail as follows: Referring to FIG. 2, the electronic component testing and sorting machine of the present invention comprises a machine 20 and a feeding device. The device 30, the receiving device 40, the testing device 50, the temperature control device 60, the conveying device 70, and the central control device (not shown) further comprise an empty device 80 for holding an empty tray in the embodiment. The machine 20 is provided with at least one pre-warming zone. In this embodiment, the machine 20 is provided with a pre-warming zone 21, a test zone 22, a temperature return zone 23 and an open area 24, and the pre-warming zone 21 is provided. An openable and closable first gate 251 is disposed between the preheating zone 21 and the open space 24, and the second gate 252 is opened and closed. The test zone 22 and the temperature return zone 23 are provided. There is a third gate 253 that can be opened and closed, and a fourth gate 254 that can be opened and closed is arranged between the temperature recovery zone 23 and the receiving device 40. The temperature return zone 23 and the open area 24 are provided between The fifth gate 255 of the opening and closing is provided with a sixth gate 256 that can be opened and closed between the open area 24 and the open space device 80. When the staff wants to repair the mechanism of the returning temperature zone 23, The third and fifth gates 253 and 255 are closed to prevent a large amount of air having a high water content in the external environment of the machine from flowing into the preheating zone 21 and the test zone 22, thereby preventing dew condensation of the electronic components at a low temperature; the feeding device 30 is attached to the machine 20 The preheating zone 21 is provided with at least one feeding tray portion 31 for accommodating at least one feeding tray 32 of the electronic component to be tested, and preheating the machine table 20 The inside of the area 21 is provided with at least one feeding temporary portion 33 for receiving the supply tray 32 with electronic components outputted by the supply tray portion 31. In the embodiment, the feeding device 30 is provided with a a feed conveyor 34 disposed in two directions (such as the Y direction), the feed conveyor 34 may be a pulley set or a stage, etc., to feed the supply tray of the electronic component to be tested at room temperature at the supply tray portion 31 32 is conveyed through the first gate 251 and sent to the feeding temporary portion 33 for taking out the material; the receiving device 40 is disposed in the temperature returning region 23 of the machine table 20 and is provided with at least one receiving temporary portion 41. The receiving temporary portion 41 has at least one receiving tray 42 for receiving the tested electronic components, and at least one receiving tray portion 43 is disposed outside the temperature returning region 23 of the machine 20 for receiving the receiving materials. In the present embodiment, the receiving device 40 is provided with a receiving conveyor 44 arranged in a second direction (such as the Y direction), and the receiving conveyor 44 can be a pulley. a group or a stage or the like for conveying the receiving tray 42 of the electronic component to be measured of the receiving temporary portion 41 through the fourth gate 254 and transporting it to the receiving tray portion 43 for storage; the testing device 50 The test unit 22 is mounted on the test area 22 of the machine 20, and is provided with at least one tester for testing the electronic components. In this embodiment, the tester has an electrically connected circuit board 51 and a test stand 52 for testing. The temperature control device 60 is provided with a first temperature controller 61 in the pre-heating zone 21 of the machine 20, so that the pre-warming zone 21 forms a pre-warming working environment, and is disposed in the pre-warming zone 21. The second temperature controller 62 of the electronic component to be tested preheats the electronic component to be tested. In the embodiment, the first thermostat 61 delivers low temperature dry air to the interior of the preheating zone 21, which can The preheating zone 21 forms a low temperature working environment, and the feeding tray 32 on the feeding temporary portion 33 feeds the preheating zone 21, and the electronic component to be tested on the feeding tray 32 is first staged. Pre-cooling can also reduce the air moisture content of the pre-warming zone 21, and prevent the pre-cooling of the electronic components from dew condensation. The second thermostat 62 is a bearing with a cooling chip, which is pre-cooled. After the electronic component to be tested, the second stage pre-warming of the electronic component to be tested, which has been pre-cooled, can be performed by using the cooled wafer to make the electronic element The temperature is automatically pre-warmed to the preset test temperature, and the temperature-recovering zone 23 of the machine 20 is provided with a third temperature controller 63, so that the temperature-recovering zone 23 forms a warming operating environment. In this embodiment, the third The temperature controller 63 is configured to transport the hot dry air to the interior of the temperature recovery zone 23, so that the temperature recovery zone 23 forms a warming operating environment, so that the low temperature measured electronic components at the receiving temporary portion 41 are gradually formed in the temperature returning zone 23. Returning to normal temperature, thereby preventing condensation of the measured electronic components; the conveying device 70 is mounted on the machine table 20, and is provided with at least one feeder for the feeding device 30, the testing device 50, the temperature The electronic component is transferred between the control device 60 and the receiving device 40. In this embodiment, it is pre- The temperature zone 21 is provided with a first shifter 71 for displacement in the first, second and third directions (for example, X, Y, Z directions), and the first shifter 71 is attached to the feeding temporary portion of the feeding device 30. The electronic component to be tested is taken out from the feeding tray 32 at 33, and transferred to the second thermostat 62 of the temperature control device 60, and the electronic component to be tested that has been preheated on the second thermostat 62 is removed. The first loading stage 72 and the second loading stage 73 are disposed on both sides of the testing device 50 for X-direction displacement, and the first and second loading stages 72, 73 can be loaded into the first feeder 71. The electronic component to be tested that has been pre-warmed is carried to the side of the test device 50, the second and third feeders 74, 75 disposed at the test device 50, and the second and third feeders 74, 75 Displacement in the YZ direction, and separately providing the temperature control device 60 to the fourth and fifth temperature controllers 64, 65, and the second and third feeders 74, 75 respectively on the first and second loading stages 72, 73 The electronic component to be tested is taken out and transferred to the test stand 52 of the test device 50, and the tested electronic components of the test stand 52 are removed, and the first and second discharges are arranged on both sides of the test device 50 and displaced in the X direction. Load 76, 77, respectively, for the second and third feeders 74, 75 to move into the measured electronic components, and carried to the temperature recovery zone 23, a fourth feeder 78 assembled in the temperature recovery zone 23, The XYZ direction is displaced, so that the first and second discharge stages 76, 77 take out the measured electronic components, and carry them to the receiving tray 42 of the receiving temporary portion 41, and another one for XZ direction displacement. The fifth shifter 79 is configured to transfer an empty tray between the feeding temporary portion 33 of the feeding device 30, the empty device 80 and the receiving temporary portion 41 of the receiving device 40; the empty device The 80 series is provided with at least one empty tray temporary portion 81 inside the open space 24 of the machine table 20 for the fifth feeder 79 to be moved into the empty supply tray 32 and disposed outside the open space 24 of the machine table 20. There is at least one empty tray receiving portion 82 for receiving the empty feeding tray outputted by the empty tray temporary portion 81. The empty tray receiving portion 82 can replenish the empty feeding tray to the empty tray temporary portion 81. In the present embodiment, the fifth feeder 79 of the conveying device 70 takes out the empty feeding tray 32 from the feeding device 30, and replenishes the empty feeding tray 32 to the receiving portion of the receiving device 40. 41, another configuration in the Y direction An empty tray conveyer 83, which may be a pulley set or a stage, etc., for carrying an empty supply tray between the empty tray temporary portion 81 and the empty tray storage portion 82; the central control device ( The figure is not shown) to control and integrate the various devices to perform automated operations.

Please refer to Figures 3 and 4 for feeding and feeding of the feeding device 30 during use. The feeder 34 carries the supply tray 32 of the supply tray portion 31 with the electronic component 91 to be tested through the first gate 251, and is sent to the feeding temporary portion 33 located in the pre-warming zone 21 due to the temperature. The control device 60 injects the low temperature dry air into the preheating zone 21 by using the first thermostat 61, so that the preheating zone 21 forms a low temperature preheating working environment, which not only reduces the moisture content of the air but also prevents condensation, and can be in the The electronic component 91 to be tested on the feeding temporary portion 33 of the pre-warming zone 21 performs the first-stage pre-warming operation, and when the first feeder 71 of the conveying device 70 is taken out from the feeding tray 32 of the feeding temporary portion 33 When a batch of electronic components 91 to be tested is detected, the other electronic components to be tested 91 on the supply tray 32 can continue to perform the pre-warming operation in the pre-warming zone 21, and the first shifter 71 is in the feeding temporary portion 33. The feeding tray 32 takes out a batch of electronic components 91 to be tested, and transfers them to the second thermostat 62 of the temperature control device 60. Since the electronic component 91 to be tested has been first in the pre-warming zone 21 In the stage pre-warming operation, the temperature of the electronic component 91 to be tested has been cooled (for example, to -20 degrees), and the second thermostat 62 can perform the second stage pre-measurement on the electronic component 91 to be tested which has been pre-warmed. Warm operation, so that the electronic component 91 to be tested is quickly pre-warmed to a preset test temperature (for example, cooling to -40 degrees), not only shortening the pre-warming Industrial time can also improve overall production efficiency.

Please refer to Figures 5 and 6 for pre-warning the electronic component 91 to be tested to the preset test. After the temperature, the first shifter 71 of the transport device 70 is taken out by the second thermostat 62 of the temperature control device 60 to take out the pre-warmed electronic component 91 to be tested and transferred to the first loading stage 72. The first loading stage 72 carries the pre-warmed electronic component 91 to be tested to the side of the testing device 50, and the second feeder 74 of the conveying device 70 is taken out from the first loading stage 72. The electronic component 91 is tested and moved into the test socket 52. Since the second shifter 74 is disposed with the fourth thermostat 64, the fourth thermostat 64 causes the second shifter 74 to be in a low temperature state. When the second loader 74 presses the electronic component 91 to be tested in the test socket 52 to perform a test operation, the electronic component 91 to be tested can perform a cold test operation in a simulated low temperature environment, and the test block 52 passes through the circuit. The board 51 transmits the test data to the central control unit.

Please refer to Figures 7, 8, 9, and 10. After the test is completed, the second feeder 74 is taken out of the test stand 52 to take out the measured electronic component 91, and transferred to the first discharge stage 76, the first discharge stage 76 is passed through the third gate 253, the measured electronic component 91 The temperature is sent to the temperature recovery zone 23. Since the air content of the external environment of the test sorter is high, in order to avoid dew condensation of the measured electronic component 91 at a low temperature, the third temperature controller 63 of the temperature control device 60 can be used to inject heat into the temperature return zone 23. The air is dried to form a warming working environment 23, which not only reduces the air moisture content of the temperature returning zone 23, but also when the fourth feeder 78 is to be placed on the first discharging stage 76. When the tested electronic component 91 is transferred to the receiving tray 42 of the receiving temporary portion 41 of the receiving device 40, the receiving tray 42 can be used to receive the low temperature of the receiving tray 42 while receiving the material. The electronic component 91 performs the operation of returning the temperature to the normal temperature before the temperature returning zone 23, and does not directly contact the air of the external environment of the test sorter, thereby preventing the measured electronic component 91 from dew condensation and returning to the measured electronic component 91. After the normal temperature, the receiving conveyor 44 of the receiving device 40 conveys the receiving tray 42 of the measured electronic component 91 at the receiving temporary portion 41 through the fourth gate 254, and transports it to the receiving tray portion 43. Set.

20‧‧‧ machine

21‧‧‧Preheating zone

22‧‧‧Test area

23‧‧‧Return zone

24‧‧‧Open area

251‧‧‧ first gate

252‧‧‧second gate

253‧‧‧ third gate

254‧‧‧fourth gate

255‧‧‧ fifth gate

256‧‧‧ sixth gate

30‧‧‧Feeding device

31‧‧‧Feeding and placing department

32‧‧‧ Feeding tray

33‧‧‧Feeding Temporary Department

34‧‧‧Feed conveyor

40‧‧‧Receiving device

41‧‧‧Receipt Temporary Department

42‧‧‧ receiving tray

43‧‧‧Receiving and placing department

44‧‧‧ Receiving conveyor

50‧‧‧Testing device

51‧‧‧ boards

52‧‧‧ test seat

60‧‧‧temperature control device

61‧‧‧First thermostat

62‧‧‧Second thermostat

63‧‧‧ third thermostat

64‧‧‧ fourth thermostat

65‧‧‧ fifth thermostat

70‧‧‧Conveyor

71‧‧‧First mover

72‧‧‧First feeding platform

73‧‧‧Second feed stage

74‧‧‧Second shifter

75‧‧‧third shifter

76‧‧‧First discharge stage

77‧‧‧Second discharge platform

78‧‧‧fourth shifter

79‧‧‧ fifth shifter

80‧‧‧Air equipment

81‧‧‧ Empty Position Temporary Department

82‧‧‧ Empty Disk Collection Department

83‧‧‧ empty tray conveyor

Claims (10)

An electronic component testing and sorting machine comprises: a machine: at least one pre-warming zone; and a feeding device: at least one feeding tray is arranged outside the pre-warming zone of the machine, the feeding tray The department is provided with at least one feeding tray for the electronic component to be tested, and at least one feeding temporary portion is disposed inside the pre-heating zone of the machine to receive the feeding tray outputted by the feeding tray portion; The test device is mounted on the machine and is provided with at least one tester for testing the electronic component; the temperature control device is provided with at least one first thermostat in the pre-heating zone of the machine, and The preheating zone is provided with at least one second thermostat for holding and preheating the electronic component; the conveying device is mounted on the machine table and is provided with at least one feeder for the feeding device, The electronic component is transferred between the test device and the temperature control device; the central control device is used to control and integrate the operation of each device. The electronic component testing and sorting machine according to claim 1, wherein the machine is provided with the pre-heating zone, the testing zone and the temperature-recovering zone, and the testing zone is for assembling the testing device, the temperature-recovering zone It is used to return the temperature of the tested electronic components. The electronic component test sorting machine according to claim 1 or 2, wherein the first thermostat of the temperature control device delivers pre-warmed dry air to the preheating zone of the machine. The electronic component testing and sorting machine according to claim 2, wherein the feeding device is provided with a feeding conveyor arranged in a second direction, and the feeding conveyor is attached to the feeding and placing portion The supply tray is transported between the supply temporary portions. The electronic component testing and sorting machine according to item 2 of the patent application scope further includes a receiving device, wherein the receiving device is provided with at least one receiving temporary portion inside the temperature returning area of the machine, the receiving device The material temporary portion has at least one receiving tray for receiving the tested electronic component, and at least one receiving tray portion is disposed outside the temperature returning region of the machine, and the receiving tray portion receives the receiving material The receiving tray is output by the temporary part. The electronic component testing and sorting machine according to claim 5, wherein the receiving device is provided with a receiving conveyor arranged in a second direction, and the receiving conveyor is attached to the receiving device. The receiving tray is transported between the disk portion and the receiving portion. The electronic component testing and sorting machine according to claim 5, wherein the temperature control device is provided with a third temperature controller in a temperature returning zone of the machine. The electronic component testing and sorting machine according to the second aspect of the patent application, wherein the machine is provided with a first gate between the preheating zone and the feeding device, and the testing zone and the temperature returning zone are provided The third gate is provided with a fourth gate between the temperature recovery zone and the receiving device. The electronic component testing and sorting machine according to claim 2, wherein the conveying device is provided with a first shifting device in a preheating zone of the machine for supplying a feeding tray of the feeding temporary portion And the electronic component to be tested is transferred between the second temperature controller of the temperature control device, and the first input and the output of the electronic component to be tested and the electronic component to be tested are disposed on one side of the testing device. a material loading platform, on the other side of the testing device, a second loading and discharging station for carrying the electronic component to be tested and the tested electronic component, and second and third shifting at the testing device a second shifter for transferring the electronic component between the test device and the first inlet and discharge carrier, the third feeder being attached to the testing device and the second inlet and outlet The electronic component is transferred between the stages, and a fourth shifter is arranged in the temperature returning zone of the machine to move between the first and second discharge loading platforms and the receiving tray of the receiving temporary part Load the measured electronic components. The electronic component test sorting machine according to claim 9 of the patent application scope further comprises an open space device, wherein the machine platform is provided with an open area, and the open space device is provided with at least one inside the open space of the machine. The empty tray temporary portion of the empty tray is temporarily disposed, and at least one empty tray receiving portion is disposed outside the open space to receive the empty tray outputted by the empty tray temporary portion.