TW201610651A - Opening/closing device of electronic component testing module (I) - Google Patents

Abstract

An opening/closing device of electronic component testing module (I) is provided. The testing module is provided with a testing base and a cover body covering the testing base. The cover body having a heat dissipation structure is hooked to the buckle portions of the testing base to achieve positioning through a plurality of hooks. The opening/closing device comprises a moving mechanism and an opening/closing unit. The moving mechanism is provided with a moving carrier moving in at least one direction so as to be connected and assembled with the opening/closing unit. The opening/closing unit is provided with at least one driving source for driving two clamping members of at least one clamper to displace relatively such that the two clamping members leaning against or releasing from the two hooks of the cover body of the testing module are disengaged from or hooked to the buckle portions of the testing base to take the cover body out or cover the testing base so as to further open or close the cover body of the testing module. Thus, the testing module can be automatically opened or closed, Not only labor force and cost can be saved, but also the opening/closing time can be shortened, thereby achieving the practical benefits of saving cost and improving the testing capacity.

Description

Opening and closing device for electronic component test module (1)

The invention provides an opening and closing device capable of automatically opening and closing a test module, which not only reduces manpower, but also shortens the opening and closing operation time, thereby saving cost and improving test productivity (1).

Nowadays, after the electronic component is packaged in the back stage, in order to ensure the quality of the product, the electronic component is placed in the test socket of the test module to perform a test operation to detect whether the electronic component is damaged during the manufacturing process, so as to eliminate the Good product, because the electronic components in the process of performing the test operation, it will generate self-heating due to the execution of the program operation. In order to avoid the self-heating temperature of the electronic components exceeding the preset test temperature and affecting the test quality, the manufacturer is in the test mode. The test seat of the group is equipped with a cover body with a heat dissipation structure, and the heat dissipation structure and the electronic components are used for cold heat exchange, so that the temperature of the electronic components is maintained within a preset test temperature range, thereby ensuring the detection yield of the electronic components.

Referring to FIGS. 1 and 2 , a plurality of test modules 10 are mounted on a test circuit board 20 . Each test module 10 includes a test stand 11 and a cover 12 . The test stand 11 is provided with a receiving electronic component. The receiving slot 111 is disposed, and a plurality of probes 112 electrically connected to the test circuit board 20 are disposed in the receiving slot 111, and a fastening portion 113 is recessed on both sides of the test socket 11, and the cover body 12 is The top surface is provided with a heat dissipating structure, and the heat dissipating structure is provided with a conductive member 121 protruding from the bottom surface of the cover body 12 to contact the self-heating of the conductive electronic component, and to connect the heat dissipating fins 122 on the top surface of the cover body 12, A heat dissipating fan 123 is disposed above the heat dissipating fins 122, and a hook 125 is pivotally disposed at a position of the latching portion 113 of the test seat 11 on both sides of the cover body 12, and one end of each of the hooks 125 A spring 126 is disposed between the cover body 12 and a hook portion 1251 is provided at the other end to hook the buckle portion 113 of the test seat 11 to cover the cover body 12 It is located on the test stand 11; please refer to the figures 3 and 4, in use, the staff presses one end of the two hooks 125 on both sides of the cover body 12 by hand, and the hook 125 is a compression spring 126 and is pivoted. 124 is a center of rotation, so that the hook portion 1251 of the other end swings outwardly away from the fastening portion 113 of the test seat 11, so that the cover body 12 can be opened and the staff member manually inserts the electronic component 30 to be tested. In the receiving slot 111 of the test seat 11, the cover 12 is then manually placed over the test seat 11, and the two hooks 125 are released, so that the two hooks 125 are reset by the spring force of the spring 126, and The hook portion 1251 is hooked on the fastening portion 113 of the test seat 11 to close the test socket 11, and the conductive member 121 is in contact with the self-heating of the conductive electronic component 30, and then the heat dissipation fin 122 and the cooling fan on the top surface of the cover 12 are used. The heat is dissipated to maintain the temperature of the electronic component 30 within a preset test temperature range, thereby ensuring the detection yield of the electronic component 30. However, the use of the manual opening and closing test module 10 has the following disadvantages:

1. The operator opens and closes the cover 12 of the test module 10 by manual operation. If the number of test modules 10 is large, it is necessary to configure more manpower to open and close the cover 12 one by one, resulting in an increase in operating cost.

2. Since the cover 12 is provided with components such as the conductive member 121, the heat dissipation fins 122, and the heat dissipation fan 123, the weight of the cover 12 is relatively heavy. During the test operation, the worker must laboriously cover the cover of the plurality of test modules 10. 12 is removed one by one from the test stand 11 for the electronic component 30 to be placed in the test stand 11, and then the cover body 12 is re-attached one by one to the test stand 11, so that the manual opening and closing operation is not only time-consuming and laborious, It also reduces test capacity.

3. After the staff member manually opens the cover 12 of the test module 10, the electronic component 30 needs to be manually and manually placed on the test stand 11 to increase the loading and unloading operation time, thereby reducing the test throughput.

An object of the present invention is to provide an opening and closing device (1) for an electronic component test module, wherein the test module is provided with a test seat and a cover placed on the test seat, and the cover body having the heat dissipation structure And the plurality of hooks are hooked to the fastening portion of the test seat, and the opening and closing device comprises a transfer mechanism and an opening and closing unit, and the transfer mechanism is provided The at least one direction shifting carrier is coupled to the assembly opening and closing unit, wherein the opening and closing unit is provided with at least one driving source for driving the two clamping members of the at least one clamping member to be relatively displaced, so that the two clamping members are pressed or The two hooks of the cover of the release test module are detached or hooked to the fastening portion of the test seat, and the cover body is taken out or placed in the test seat, thereby opening or closing the cover of the test module; thereby, Automated opening and closing of test modules, and greatly reduced manpower allocation, to achieve cost-effective practical benefits.

The object of the present invention is to provide an opening and closing device (1) for an electronic component test module, wherein the transfer device of the transfer mechanism can drive a plurality of clamps of the opening and closing unit to correspond to a plurality of test modules, The plurality of driving sources of the opening and closing unit drive a plurality of fixtures to pick up and place a plurality of covers, thereby automatically opening and closing the cover of a batch of test modules, so as to greatly reduce the working time of the opening and closing cover, thereby improving the test capacity. Practical benefits.

The third object of the present invention is to provide an opening and closing device (1) for an electronic component test module, wherein the opening and closing unit is configured to assemble a plurality of driving sources by using a shelf plate, and to transfer the carrier to the carrier plate and the transfer mechanism. A connecting structure is provided between the frame plate and the transfer carrier, and a first connecting seat with a locking portion and a second connecting seat with a fastening member are arranged between the frame and the transfer carrier, when the entire opening and closing unit is replaced It can pneumatically drive the embedded fasteners to automatically disengage or snap the card jaws, so that the entire opening and closing unit can be conveniently assembled and disassembled, thereby achieving the practical benefit of improving the use efficiency.

The fourth object of the present invention is to provide an opening and closing device (1) for an electronic component test module, wherein the opening and closing device is provided with a picking mechanism having at least one picker, and the test module is automatically opened in the opening and closing unit. After the cover body, the pick-up mechanism can automatically pick up and place the electronic components in the test stand, and it is not necessary to manually pick and place, so as to greatly reduce the loading and unloading operation time, and achieve the practical benefit of improving the test capacity.

[study]

10‧‧‧Test module

11‧‧‧ test seat

111‧‧‧ accommodating slots

112‧‧‧Probe

113‧‧‧Withholding department

12‧‧‧ Cover

121‧‧‧Transmission parts

122‧‧‧Heat cooling film

123‧‧‧ cooling fan

124‧‧‧ pivot

125‧‧‧ card hook

1251‧‧‧Hook

126‧‧ ‧ spring

20‧‧‧Test circuit board

30‧‧‧Electronic components

〔this invention〕

40‧‧‧Opening and closing device

41‧‧‧Transportation mechanism

411‧‧‧First Transferr

412‧‧‧Second transfer

4121‧‧‧Motor

4122‧‧‧Transmission group

413‧‧‧Rack

414‧‧‧Transfer Vehicle

415‧‧‧Second joint

4151‧‧‧Inlay fasteners

42‧‧‧Opening unit

421‧‧‧ ‧ boards

422‧‧‧ first joint

4221‧‧‧Card Department

423‧‧‧ drive source

424, 425‧‧‧Clamping parts

4241, 4251‧‧‧ first cushion

4242, 4252‧‧‧ second cushion

43‧‧‧ picking institutions

431‧‧‧ Third Transfer

432‧‧‧ Picker

50‧‧‧Test module

51‧‧‧ test seat

511‧‧‧ accommodating slots

512‧‧‧ probe

513, 514‧‧‧Deduction Department

52‧‧‧ Cover

521, 522‧‧ ‧ pivot

523, 524‧‧‧ hooks

5231, 5241‧‧‧ Pressure Department

5232, 5242‧‧ ‧ hook

525, 526‧‧ spring

53‧‧‧Test circuit board

531‧‧‧Transmission parts

532‧‧‧Hot film

533‧‧‧ cooling fan

60‧‧‧Electronic components

Figure 1: Schematic diagram of a conventional test module.

Figure 2: Schematic diagram of the test socket and cover of the conventional test module.

Figure 3: Schematic diagram of the use of the conventional test module (1).

Figure 4: Schematic diagram of the use of the conventional test module (2).

Figure 5: Schematic diagram of the opening and closing device of the present invention.

Figure 6 is a schematic view of the opening and closing unit of the opening and closing device of the present invention.

Figure 7: Schematic diagram of the use of the opening and closing device of the present invention (1).

Figure 8: Schematic diagram of the use of the opening and closing device of the present invention (2).

Figure 9: Schematic diagram of the use of the opening and closing device of the present invention (3).

Figure 10: Schematic diagram of the use of the opening and closing device of the present invention (4).

Figure 11: Schematic diagram of the use of the opening and closing device of the present invention (5).

Figure 12: Schematic diagram of the use of the opening and closing device of the present invention (6).

Figure 13: Schematic diagram of the use of the opening and closing device of the present invention (7).

Figure 14: Schematic diagram of the use of the opening and closing device of the present invention (8).

Figure 15 is a schematic view showing the separation of the transfer mechanism and the opening and closing unit of the opening and closing device of the present invention.

In order to make the present invention further understand the present invention, a preferred embodiment and a drawing will be described in detail as follows: Referring to Figures 5 and 6, the opening and closing device 40 of the present invention includes a transfer mechanism 41 and The opening and closing unit 42 is provided with at least one transfer device for transferring at least one transfer carrier for at least one direction displacement. In this embodiment, the transfer mechanism is provided with a first transfer device 411 and a second transfer 412, the first transfer device 411 drives a frame 413 equipped with a second transfer device 412 for displacement in a first direction (such as an X direction), and the second transfer device 412 is provided with a motor 4121. The drive transmission group 4122 is actuated. The transmission group 4122 includes a pulley set and a screw base set, and the transfer base 414 is coupled to the transfer carrier 414 by the screw seat of the screw screw set to drive the transfer carrier 414 to the second direction (eg, In the Z direction), the opening and closing unit 42 is provided with at least one driving source for driving at least one clamp to be actuated. Further, the driving source can be directly mounted on the transfer carrier 414 or mounted on a board. And the carrier 414 is connected by a shelf. In this embodiment, the opening and closing unit 42 A plate 421 is disposed, and a connection structure is disposed between the top surface of the shelf plate 421 and the transfer carrier 414 of the transfer mechanism 41. The connection structure is provided between the shelf plate 421 and the transfer carrier 414. a first connecting seat of the latching portion and a second connecting seat having a fastening member for attaching and detaching the opening and closing unit 42 in the embodiment The connecting structure is provided with a first connecting seat 422 having a latching portion 4221 on the top surface of the shelf 421. The latching portion 4221 can be a ring groove, and the transfer carrier 414 is connected to the bottom surface to correspond to the first link. The second connecting seat 415 is provided with a plurality of inserting members 4151 which can be a bead body, and pneumatically drives a plurality of inflating members 4151 to be snapped or disengaged from the first position. The latching portion 4221 of the connecting base 422 is further provided with a plurality of driving sources 423 which are pressurizing cylinders on the bottom surface of the mounting plate 421, and the driving elements 423 are driven by the two holding members 424 and 425 for relative displacement, and the respective clips are respectively The inner side surfaces of the holding members 424 and 425 are respectively provided with first mat bodies 4241 and 4251, and second inner mat bodies 4242 and 4252 are provided on the inner top surface for buffering.

Referring to Figures 7, 8, and 9, the test module 50 is applied to the opening and closing device 40 of the present invention. The plurality of test modules 50 are disposed on the test circuit board. The test module 50 includes the test stand 51 and the cover. The test block 51 is provided with a receiving slot 511 for mounting electronic components, and a plurality of probes 512 electrically connected to the test circuit board are disposed in the receiving slot 511, and are further disposed on both sides of the test socket 51. The recesses 513 and 514 are recessed, and the hooks 523 and 524 are pivoted by the pivots 521 and 522 at the positions of the engaging portions 513 and 514 of the corresponding test seats 51. The hooks 523 and 524 are respectively disposed. Springs 525 and 526 are disposed between the pressure receiving portions 5231 and 5241 of one end and the cover 52, and hook portions 5232 and 5242 are provided at the other end to hook the fastening portions 513 and 514 of the test seat 51. The body 52 is provided with a heat dissipation structure for dissipating heat of the auxiliary electronic component. The heat dissipation structure is provided with a conductive member 531 protruding from the bottom surface of the cover 52 to contact the self-heating of the conductive electronic component, and is connected to the top surface of the cover 52. The heat dissipation fin 532 is disposed above the heat dissipation fin 532, and the heat dissipation fan 533 is mounted thereon; the cover of the test module 50 is opened by using the opening and closing device 40. At 52 o'clock, the first transfer device 411 of the transfer mechanism 41 of the opening and closing device 40 carries the second transfer device 412 and the opening and closing unit 42 for displacement in the X direction above the test module 50, and makes a plurality of clamp pairs The plurality of covers 52 are located, and then the motor 4121 of the second transfer device 412 drives the transmission group 4122, and drives the transfer carrier 414 and the opening and closing unit 42 to rotate in the Z direction via the screw seat of the transmission group 4122. The two holding members 424 and 425 of the respective clamps of the opening and closing unit 42 are placed on the side of the two hooks 523 and 524 of the respective covers 52.

Referring to FIG. 10, the driving source 423 of the opening and closing unit 42 drives the two clamping members 424 and 425 of the clamp to be relatively displaced, and presses against the pressure receiving portions 5231 and 5241 of the two hooks 523 and 524 of the cover 52. And the first pad body 4241, 4251 is adhered to the pressure receiving portions 5231, 5241 to increase the contact friction force, so as to smoothly clamp the two hooks 523, 524, the pressure portions 5231 of the two hooks 523, 524. The 5241 is a compression spring 525, 526, and swings outwardly with the pivots 521, 522 as a center of rotation, so that the hook portions 5232, 5242 are disengaged from the engaging portions 513, 514 of the test seat 51.

Referring to FIGS. 7 and 11, after the two hooks 523 and 524 of the cover 52 are separated from the test seat 51, the motor 4121 of the second transfer unit 412 of the transfer mechanism 41 drives the transmission group 4122 and is driven by the transmission group 4122. The screw base moves the transfer carrier 414 and the opening and closing unit 42 to increase the displacement in the Z direction, so that the two clamping members 424 and 425 of the clamp of the opening and closing unit 42 clamp the cover 52 away from the test seat 51, thereby opening the test module 50. The cover 52, then the first transfer 411 carries the second transfer 412 and the opening and closing unit 42 for reverse displacement in the X direction from above the test module 50 for the test stand 51 to perform the loading operation.

Referring to Figures 11 and 12, the loading operation can be manually loaded or automated. Since the present invention can automatically open the cover 52 of the test module 50, in order to automate the operation of the opening and closing device 40, it is necessary to The electronic component is manually picked up and lowered to greatly reduce the loading and unloading operation time. The opening and closing device 40 of the present invention further includes a picking mechanism 43 that is provided with at least one pick-and-place electronic component pick-up device and at least one The pick-up device drives the pick-up device to be displaced in at least one direction. In the embodiment, the pick-up mechanism 43 is provided with a third transporter 431 for driving the pick-up 432 having the electronic component 60 to be tested for X-direction displacement to the test module 50. Above the test stand 51, the third transfer device 431 drives the pick-up 432 to shift the Z-direction to place the electronic component 60 to be tested in the receiving slot 511 of the test stand 51, so that the electronic component 60 to be tested is electrically contacted with the test stand 51. Probe 512 to After the loading operation is completed, the third conveyor 431 of the picking mechanism 43 drives the plurality of pickers 432 to move away from the test module 50 in the X-Z direction.

Referring to Figures 7, 13, and 14, the first transfer unit 411 of the transfer mechanism 41 carries the second transfer unit 412 and the opening and closing unit 42 for displacement in the X direction above the test module 50, and makes a plurality of The clamping member 424, 425 holds the plurality of cover bodies 52 in a plurality of test seats 51, and the two clamping members 424, 425 are still pressed against the two clamping hooks 523, 524 of the clamping cover 52, so that two The hooks 523 and 524 are kept in an external state, and then the motor 4121 of the second conveyor 412 drives the transmission group 4122, and drives the transfer carrier 414 and the opening and closing unit 42 to perform a Z-direction downward displacement via the screw seat of the transmission group 4122. The two clamping members 424 and 425 of the clamp of the opening and closing unit 42 cover the clamping cover 52 on the test seat 51, so that the two hooks 523 and 524 of the cover 52 are located at the two fastening portions of the test seat 51. 513, 514, the driving source 423 of the opening and closing unit 42 drives the two clamping members 424, 425 of the clamp to reverse displacement, and releases the two hooks 523, 524 of the cover 52, and the two hooks 523, 524 utilize springs. The reset spring force of 525 and 526 is pivoted inward with the pivots 521 and 522 as the center of rotation, so that the hook portions 5232 and 5242 of the two hooks 523 and 524 are hooked on the test seat. The engaging portions 513 and 514 of the 51 position the cover 52 on the test seat 51 to close the test seat 51.

Referring to FIGS. 7 and 15 , the first transfer unit 411 and the second transfer unit 412 of the transfer mechanism 41 drive the opening and closing unit 42 to move away from the test module 50 in the XZ direction, because the cover 52 is placed on the test seat. When 51 is on, the conductive member 531 is contacted with the electronic component 60 to be tested. When the electronic component 60 to be tested performs a test operation in the test socket 51 and generates self-heating, the self-heating of the electronic component 60 to be tested can be conducted via the conductive member 531. The heat dissipation fins 532 radiate heat, and the heat dissipation fan 533 is used to assist heat dissipation, so that the electronic component 60 to be tested is maintained within a preset test temperature range, thereby ensuring the detection yield. After the test is completed, the opening and closing device 40 can utilize the plurality of The clamp grips the cover 52 and opens the test stand 51 for loading and unloading.

Referring to FIG. 16, the opening and closing device 40 of the present invention can replace the opening and closing unit 42 to respond to different types of test modules, and the transfer device 414 of the transfer mechanism 41 and the shelf 421 of the opening and closing unit 42 are utilized. The first connecting seat 422 and the second connecting base 415 of the connecting structure are coupled and assembled. When the opening and closing unit 42 is replaced, the fastening member 4151 of the second connecting seat 415 is pneumatically driven to retract from the first connecting seat 422. The latching portion 4221 separates the transfer carrier 414 from the shelf 421, so that the opening and closing unit 42 can be conveniently replaced, thereby achieving the practical benefit of improving the convenience of use.

41‧‧‧Transportation mechanism

414‧‧‧Transfer Vehicle

415‧‧‧Second joint

4151‧‧‧Inlay fasteners

42‧‧‧Opening unit

421‧‧‧ ‧ boards

422‧‧‧ first joint

4221‧‧‧Card Department

423‧‧‧ drive source

424, 425‧‧‧Clamping parts

4241, 4251‧‧‧ first cushion

4242, 4252‧‧‧ second cushion

Claims (10)

An opening and closing device (1) for an electronic component test module, comprising: a transfer mechanism: at least one transfer device is provided to drive at least one transfer carrier for at least one direction displacement; and the opening and closing unit is mounted on the shift Carrying the carrier of the carrier, and providing at least one driving source for driving at least one clamp to clamp or release the two hooks of the cover of the test module to detach or hook the fastening portion of the test socket of the test module, And the cover of the test module is opened and closed. The opening and closing device (1) of the electronic component test module according to the first aspect of the invention, wherein the transfer mechanism of the opening and closing device is provided with a first transfer device and a second transfer device, the first transfer The device drives at least one frame equipped with the second transfer device to perform a first direction displacement, and the second transfer device drives the transfer carrier and the opening and closing unit to perform a second direction displacement. The opening and closing device (1) of the electronic component test module according to the second aspect of the patent application, wherein the second transfer device of the transfer mechanism is provided with a motor to drive at least one transmission group to operate, the transmission group The link drives the shifting of the transfer carrier. The opening and closing device (1) of the electronic component test module according to the first aspect of the patent application, wherein the driving source of the opening and closing unit is a pressure cylinder. The opening and closing device (1) of the electronic component test module according to claim 1, wherein the fixture of the opening and closing unit has two clamping members, and the driving source drives the clamping member to be opposite. Displacement. The opening and closing device (1) of the electronic component test module according to claim 5, wherein the inner side of the clamping member of the clamp is provided with a first cushion body for contacting and fitting the test module The hook of the cover. The opening and closing device (1) of the electronic component test module according to the fifth aspect of the invention, wherein the inner top surface of the clamping member of the clamp is provided with a second cushion body for buffering. The opening and closing device (1) of the electronic component test module according to claim 1, wherein the opening and closing unit is provided with at least one plate on the shelf plate The at least one drive source is assembled. The opening and closing device (1) of the electronic component test module according to the eighth aspect of the invention, wherein the shelf of the opening and closing unit and the transfer carrier of the transfer mechanism are provided with a connection structure, the connection The structure is characterized in that a first connecting seat with a locking portion and a second connecting seat with an engaging member are disposed between the shelf and the transfer carrier. The opening and closing device (1) of the electronic component test module according to claim 1, further comprising the pick-up device, wherein the pick-up mechanism is provided with at least one pick-and-place device for picking and placing electronic components. And providing at least one transfer device to drive the picker to be displaced in at least one direction.