TW201544898A - Pellicle production apparatus - Google Patents

Pellicle production apparatus Download PDF

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Publication number
TW201544898A
TW201544898A TW104116500A TW104116500A TW201544898A TW 201544898 A TW201544898 A TW 201544898A TW 104116500 A TW104116500 A TW 104116500A TW 104116500 A TW104116500 A TW 104116500A TW 201544898 A TW201544898 A TW 201544898A
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Taiwan
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pellicle
pellicle frame
bonding
film
frame
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TW104116500A
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Chinese (zh)
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TWI653501B (en
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Kazuo Kohmura
Yosuke Ono
Daiki Taneichi
Yasuyuki Sato
Toshiaki Hirota
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Mitsui Chemicals Inc
Tazmo Co Ltd
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/62Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
    • G03F1/64Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof characterised by the frames, e.g. structure or material, including bonding means therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)

Abstract

A pellicle production apparatus includes a bonding unit that includes: a bonding chamber at which bonding of a pellicle frame member and a pellicle film member is performed, the pellicle frame member including a pellicle frame having a groove formed at least one of one end face and the other end face in a thickness direction of the pellicle frame and having a through-hole passing between an outer peripheral face of the pellicle frame and a wall surface of the groove, and the pellicle film member including a pellicle film; and an evacuation tube for evacuating the inside of the groove via the through-hole in a state in which the pellicle frame member and the pellicle film member are arranged in the bonding chamber such that the end face of the pellicle frame member at which the groove is formed and the pellicle film member oppose each other.

Description

防塵薄膜製造裝置Dust film manufacturing device

本發明是有關於一種防塵薄膜組件製造裝置。The present invention relates to a device for manufacturing a pellicle.

半導體器件(半導體裝置)的高積體化及微細化正逐年加速。 例如,現在是藉由準分子曝光來形成線寬45 nm左右的圖案,但近年,隨著半導體器件的進一步微細化,要求形成線寬32 nm以下的圖案。藉由現有的準分子曝光難以應對此種微細加工。因此,正研究將曝光光替換為波長更短的極紫外(Extreme Ultra Violet,EUV)光。The high integration and miniaturization of semiconductor devices (semiconductor devices) are accelerating year by year. For example, a pattern having a line width of about 45 nm is formed by excimer exposure. However, in recent years, with the further miniaturization of semiconductor devices, it has been required to form a pattern having a line width of 32 nm or less. It is difficult to cope with such microfabrication by existing excimer exposure. Therefore, it is being studied to replace the exposure light with a shorter wavelength Ultra Light Violet (EUV) light.

EUV光具有容易被所有物質吸收的特性。 因此,於使用EUV光作為曝光光的光微影術(以下亦稱為「EUV微影術」)中,使用反射光學系統進行曝光。具體而言,藉由反映曝光圖案的原版使EUV光反射,藉由作為反射光的EUV光對抗蝕劑進行曝光。此時,若原版上附著有異物,則由於EUV光被異物吸收,或EUV光發生散射,因此存在無法曝光為所需圖案的情形。 因此,正研究以防塵薄膜組件(pellicle)保護原版的EUV光照射面。 防塵薄膜組件的構成採用包含用以保護原版的EUV光照射面的防塵薄膜(pellicle film)、及支持該防塵薄膜的防塵薄膜組件框的構成。EUV light has characteristics that are easily absorbed by all substances. Therefore, in photolithography (hereinafter also referred to as "EUV lithography") using EUV light as exposure light, exposure is performed using a reflection optical system. Specifically, the EUV light is reflected by reflecting the original plate of the exposure pattern, and the resist is exposed by EUV light as reflected light. At this time, if foreign matter adheres to the original plate, the EUV light is absorbed by the foreign matter or the EUV light is scattered, so that the desired pattern cannot be exposed. Therefore, it is being studied to protect the original EUV light irradiation surface with a pellicle. The pellicle assembly is configured to include a pellicle film for protecting the original EUV light-irradiating surface and a pellicle frame for supporting the pellicle.

作為EUV微影術所使用的防塵薄膜,要求對EUV光具有高透過性,且不會因照射EUV光而分解、變形。作為滿足此種要求的防塵薄膜,提出有單晶矽膜等矽結晶膜(例如,參照文獻1及文獻2)、積層於金屬網上的氮化鋁膜(例如,參照文獻3)、石墨烯膜(例如,參照文獻4)等。As a dustproof film used for EUV lithography, it is required to have high permeability to EUV light, and it is not decomposed and deformed by irradiation of EUV light. As a pellicle film which satisfies such a requirement, a ruthenium crystal film such as a single crystal ruthenium film (for example, Reference 1 and Document 2), an aluminum nitride film laminated on a metal mesh (for example, Reference 3), and graphene are proposed. A film (for example, Reference 4) or the like.

文獻1:日本專利特開2010-256434號公報 文獻2:日本專利特開2009-116284號公報 文獻3:日本專利特開2005-43895號公報 文獻4:國際公開第2011/160861號公報Document 1: Japanese Patent Laid-Open Publication No. 2010-256434. Document 2: Japanese Patent Laid-Open Publication No. 2009-116284 No. JP-A-2005-43895

[發明所欲解決之課題][Problems to be solved by the invention]

且說,以EUV微影術用的防塵薄膜組件為代表的包含防塵薄膜與防塵薄膜組件框的防塵薄膜組件一般利用如下方法來製造:藉由手工操作並視需要使用接著劑來貼合防塵薄膜組件框與防塵薄膜組件。於該情形時,在進行貼合時,一般藉由裝置、夾具、手等與防塵薄膜的膜面接觸。 然而,防塵薄膜具有非常容易破損的性質,因此於防塵薄膜的處理中要求細心留意。於防塵薄膜中,含有無機系材料的防塵薄膜(例如,文獻1~文獻4所記載的防塵薄膜)不僅是難以自立的膜,而且是亦會因機械上的接觸而導致損傷或起塵的膜,因此於對其進行處理時要求進一步留意。 另外,伴隨半導體器件的微細化,為了避免異物附著於防塵薄膜,要求進一步留意。In addition, a pellicle film assembly including a pellicle film and a pellicle frame as represented by a pellicle for EUV lithography is generally manufactured by a method in which a pellicle is attached by hand and optionally using an adhesive. Frame with pellicle assembly. In this case, when bonding is performed, it is generally brought into contact with the film surface of the pellicle by means of a device, a jig, a hand or the like. However, the pellicle film has a property of being easily broken, and therefore it is required to pay careful attention to the treatment of the pellicle film. In the pellicle film, a pellicle film containing an inorganic material (for example, the pellicle film described in Documents 1 to 4) is not only a film that is difficult to be self-supporting, but also a film that is damaged or dusted by mechanical contact. Therefore, further attention is required when processing it. Further, in order to prevent the foreign matter from adhering to the pellicle film, it is required to further pay attention to the miniaturization of the semiconductor device.

根據以上觀點,對如下防塵薄膜組件製造裝置進行了研究:於將包含防塵薄膜組件框的防塵薄膜組件框構件與包含防塵薄膜的防塵薄膜構件貼合來製造防塵薄膜組件時,儘量不使裝置、夾具、手等與防塵薄膜的膜面接觸地將兩者貼合。In view of the above, a device for manufacturing a pellicle film assembly is disclosed. When a pellicle frame member including a pellicle frame is bonded to a pellicle member including a pellicle, a pellicle is manufactured without any device. The jig, the hand, and the like are brought into contact with the film surface of the pellicle film.

本發明是鑒於所述而完成者,其課題在於達成以下的目的。 即,本發明的目的在於提供一種於將包含防塵薄膜組件框的防塵薄膜組件框構件與包含防塵薄膜的防塵薄膜構件貼合來製造防塵薄膜組件時,可儘量不與防塵薄膜的膜面接觸地將兩者貼合的防塵薄膜組件製造裝置。 [解決課題之手段]The present invention has been made in view of the above, and it is an object of the present invention to achieve the following objects. In other words, it is an object of the present invention to provide a pellicle frame member including a pellicle frame and a pellicle member including a pellicle, and to prevent the film from being in contact with the film of the pellicle as much as possible. A pellicle manufacturing apparatus that bonds the two together. [Means for solving the problem]

用以解決所述課題的具體手段如以下所述。Specific means for solving the problem are as follows.

<1> 一種防塵薄膜組件製造裝置,其具備貼合單元,所述貼合單元包括: 貼合腔室,進行包含防塵薄膜組件框的防塵薄膜組件框構件與包含防塵薄膜的防塵薄膜構件的貼合,所述防塵薄膜組件框具有設置於厚度方向的一端面及另一端面的至少一者的溝槽以及貫通外周面與所述溝槽的壁面之間的通孔;以及 排氣管,用以於將所述防塵薄膜組件框構件及所述防塵薄膜構件以所述防塵薄膜組件框的設置有所述溝槽的端面與所述防塵薄膜構件相對向的方式配置於所述貼合腔室內的狀態下,經由所述防塵薄膜組件框的所述通孔而對所述溝槽的內部進行排氣。<1> A device for manufacturing a pellicle film assembly, comprising: a bonding unit comprising: a bonding chamber; and a pellicle frame member including a pellicle frame and a pellicle member including a pellicle The pellicle frame has at least one groove disposed at one end surface and the other end surface in the thickness direction, and a through hole penetrating between the outer peripheral surface and the wall surface of the groove; and an exhaust pipe The pellicle frame member and the pellicle member are disposed in the bonding chamber such that an end surface of the pellicle frame in which the groove is provided faces the pellicle member In the state of the trench, the inside of the trench is exhausted through the through hole of the pellicle frame.

<2> 如<1>所述的防塵薄膜組件製造裝置,其中所述貼合單元進而包括導入管,所述導入管用以將氣體導入所述貼合腔室內而對所述貼合腔室內進行加壓。 <3> 如<2>所述的防塵薄膜組件製造裝置,其中所述導入管包含第1導入管,所述第1導入管自與配置於所述貼合腔室內的所述防塵薄膜組件框構件及所述防塵薄膜構件中的所述防塵薄膜構件相對向之側導入氣體, 所述貼合單元進而包括氣體分散構件, 所述氣體分散構件用以使自所述第1導入管導入的氣體分散。 <4> 如<1>至<3>中任一項所述的防塵薄膜組件製造裝置,其進而具備保持構件,所述保持構件用以保持所述防塵薄膜構件且將其搬入所述貼合腔室內。 <5> 如<1>至<4>中任一項所述的防塵薄膜組件製造裝置,其中所述防塵薄膜構件包含所述防塵薄膜、以及支持基板,所述支持基板具有開口部且於所述開口部以外的部分對所述防塵薄膜進行支持。 <6> 如<4>所述的防塵薄膜組件製造裝置,其中所述防塵薄膜構件包含所述防塵薄膜、以及支持基板,所述支持基板具有開口部且於所述開口部以外的部分對所述防塵薄膜進行支持, 所述保持構件以與所述支持基板接觸且不與所述防塵薄膜接觸的方式保持所述防塵薄膜構件。<2> The apparatus for manufacturing a pellicle according to the above aspect, wherein the bonding unit further includes an introduction tube for introducing a gas into the bonding chamber to perform the inside of the bonding chamber Pressurize. The apparatus for manufacturing a pellicle according to the above aspect, wherein the introduction tube includes a first introduction tube, and the first introduction tube is configured from the pellicle frame disposed in the bonding chamber. The member and the pellicle member of the pellicle member are introduced with gas to the side, and the bonding unit further includes a gas dispersing member for introducing a gas introduced from the first introduction pipe dispersion. The pellicle assembly manufacturing apparatus according to any one of the aspects of the present invention, further comprising a holding member for holding the pellicle member and carrying the pellicle into the fitting Inside the chamber. The pellicle film manufacturing apparatus according to any one of the aspects of the present invention, wherein the pellicle film comprises the pellicle film and a support substrate, the support substrate having an opening portion The dust-proof film is supported by a portion other than the opening. The apparatus for manufacturing a pellicle according to the above aspect, wherein the pellicle member includes the pellicle and a support substrate, the support substrate having an opening and a portion opposite to the opening The pellicle film is supported, and the holding member holds the pellicle member so as to be in contact with the support substrate and not in contact with the pellicle.

<7> 如<1>至<6>中任一項所述的防塵薄膜組件製造裝置,其中所述貼合單元包括連通構件,所述連通構件於所述貼合腔室內連接於所述排氣管的一端,並使所述排氣管與所述防塵薄膜組件框的所述通孔連通。 <8> 如<7>所述的防塵薄膜組件製造裝置,其中所述連通構件被設置為可朝推入所述防塵薄膜組件框的外周面的方向移動。 <9> 如<7>或<8>所述的防塵薄膜組件製造裝置,其中所述連通構件具有可插入至所述通孔的開口端。The pellicle assembly manufacturing apparatus according to any one of the above aspects, wherein the bonding unit includes a communication member that is connected to the row in the bonding chamber One end of the air tube and the exhaust pipe communicate with the through hole of the pellicle frame. The device for manufacturing a pellicle according to the above aspect, wherein the communication member is provided to be movable in a direction of being pushed into an outer peripheral surface of the pellicle frame. <9> The pellicle manufacturing apparatus according to <7>, wherein the communicating member has an open end insertable into the through hole.

<10> 如<1>至<9>中任一項所述的防塵薄膜組件製造裝置,其進而具備切割單元,所述切割單元與所述防塵薄膜組件框構件的外周形狀相應地切割所述防塵薄膜構件。 <11> 如<10>所述的防塵薄膜組件製造裝置,其中所述防塵薄膜構件包含所述防塵薄膜、以及支持基板,所述支持基板具有開口部且於所述開口部以外的部分對所述防塵薄膜進行支持,並且所述支持基板具有切入部,所述切入部用以與所述防塵薄膜組件框構件的外周形狀相應地進行切割。 <12> 如<11>所述的防塵薄膜組件製造裝置,其中所述切割單元包括上推部件,所述上推部件藉由相對於支持基板的比所述切入部更靠外側的部分而上推所述支持基板的比所述切入部更靠內側的部分來切割所述防塵薄膜構件。 <13> 如<12>所述的防塵薄膜組件製造裝置,其中所述切割單元包括: 切割腔室,進行切割所述防塵薄膜構件的操作; 所述上推部件,配置於所述切割腔室內; 導入管,用以將氣體導入所述切割腔室內;以及 氣體分散構件,使藉由所述導入管導入的氣體分散並自與所述上推方向相反的方向吹附至所述內側部分。The apparatus for manufacturing a pellicle according to any one of the aspects of the present invention, further comprising a cutting unit, wherein the cutting unit cuts the outer peripheral shape of the pellicle frame member Dust-proof film member. The apparatus for manufacturing a pellicle according to the above aspect, wherein the pellicle member includes the pellicle film and a support substrate, wherein the support substrate has an opening portion and a portion other than the opening portion The pellicle film is supported, and the support substrate has a cut-in portion for cutting in accordance with an outer peripheral shape of the pellicle frame member. The apparatus for manufacturing a pellicle according to the above aspect, wherein the cutting unit includes a push-up member that is on the outer side of the support substrate with respect to the cut portion. The pellicle member is cut by pushing a portion of the support substrate further inside than the cut portion. The apparatus for manufacturing a pellicle according to the above aspect, wherein the cutting unit comprises: a cutting chamber that performs an operation of cutting the pellicle member; and the push-up member disposed in the cutting chamber Introducing a tube for introducing a gas into the cutting chamber; and a gas dispersing member that disperses a gas introduced through the introduction tube and blows to the inner portion from a direction opposite to the push-up direction.

<14> 如<10>至<13>中任一項所述的防塵薄膜組件製造裝置,其進而具備清洗單元,所述清洗單元對經切割的所述防塵薄膜構件進行清洗。 <15> 如<1>至<14>中任一項所述的防塵薄膜組件製造裝置,其進而具備檢查單元,所述檢查單元對所述貼合後的所述防塵薄膜組件框構件及所述防塵薄膜構件進行外觀檢查。 <16> 如<1>至<15>中任一項所述的防塵薄膜組件製造裝置,其具備: 第1測定部件,對與所述防塵薄膜構件貼合前的所述防塵薄膜組件框構件的所述防塵薄膜組件框的形狀進行測定;以及 第2測定部件,對與所述防塵薄膜構件貼合後的所述防塵薄膜組件框構件的所述防塵薄膜組件框的形狀進行測定。 <17> 如<16>所述的防塵薄膜組件製造裝置,其具備: 對準部件,於將所述防塵薄膜組件框構件與所述防塵薄膜構件貼合前,進行所述防塵薄膜組件框構件與所述防塵薄膜構件的對準;以及 控制部件,基於所述貼合前的所述防塵薄膜組件框的形狀的測定結果與所述貼合後的所述防塵薄膜組件框的形狀的測定結果,對藉由所述對準部件的對準進行前饋控制。 <18> 如<16>所述的防塵薄膜組件製造裝置,其具備算出部件,所述算出部件基於所述貼合前的所述防塵薄膜組件框的形狀的測定結果與所述貼合後的所述防塵薄膜組件框的形狀的測定結果的差,來算出因所述貼合而引起的所述防塵薄膜組件框的應變量。 <19> 如<18>所述的防塵薄膜組件製造裝置,其中所述貼合單元包括連通構件,所述連通構件於所述貼合腔室內連接於所述排氣管的一端,並使所述排氣管與所述防塵薄膜組件框的所述通孔連通,並且被設置為可朝推入所述防塵薄膜組件框的外周面的方向移動, 所述算出部件是基於所述應變量而對因所述連通構件而引起的所述防塵薄膜組件框的推入量進行前饋控制的控制部件。 [發明的效果]The apparatus for manufacturing a pellicle according to any one of the above aspects, further comprising a cleaning unit that cleans the cut pellicle member. The apparatus for manufacturing a pellicle according to any one of the above aspects, further comprising an inspection unit, wherein the inspection unit attaches the pellicle frame member and the attached The pellicle member is subjected to visual inspection. The apparatus for manufacturing a pellicle according to any one of the above aspects, comprising: the first measuring member, the pellicle frame member before bonding the pellicle member The shape of the pellicle frame is measured, and the second measuring member measures the shape of the pellicle frame of the pellicle frame member that is bonded to the pellicle member. The device for manufacturing a pellicle according to the above aspect, comprising: an alignment member that performs the pellicle frame member before bonding the pellicle frame member to the pellicle member Alignment with the pellicle member; and control result of the control member based on the measurement result of the shape of the pellicle frame before the bonding and the shape of the pellicle frame after the bonding Feedforward control by alignment of the alignment components. <18> The pellicle manufacturing apparatus according to <16>, comprising: a calculation member that is based on a measurement result of a shape of the pellicle frame before the bonding and the bonding The amount of measurement of the shape of the pellicle frame is determined by the difference in the measurement results of the pellicle frame. The apparatus for manufacturing a pellicle according to the above aspect, wherein the bonding unit includes a communication member that is connected to one end of the exhaust pipe in the bonding chamber, and The exhaust pipe communicates with the through hole of the pellicle frame, and is disposed to be movable in a direction of pushing into an outer peripheral surface of the pellicle frame, the calculation component being based on the strain amount A control member that performs feedforward control on the amount of pushing of the pellicle frame caused by the communicating member. [Effects of the Invention]

根據本發明,提供一種於將包含防塵薄膜組件框的防塵薄膜組件框構件與包含防塵薄膜的防塵薄膜構件貼合來製造防塵薄膜組件時,可儘量不與防塵薄膜的膜面接觸地將兩者貼合的防塵薄膜組件製造裝置。According to the present invention, when a pellicle frame member including a pellicle frame is bonded to a pellicle member including a pellicle, a pellicle is manufactured, and the pellicle is in contact with the film of the pellicle as much as possible. A laminated pellicle assembly manufacturing device.

以下,一面適當參照圖式,一面對本發明的實施方式進行說明。然而,本發明並不限定於圖式等具體的實施方式。另外,存在對各圖式共通的要素標注相同符號的情況,且存在省略重複說明的情況。另外,於圖式中,為了容易觀察結構,存在省略隱藏線的一部分的情況。Hereinafter, an embodiment of the present invention will be described with reference to the drawings as appropriate. However, the present invention is not limited to the specific embodiments such as the drawings. In addition, the same reference numerals are attached to the elements common to the respective drawings, and the overlapping description will be omitted. Further, in the drawings, in order to easily observe the structure, there is a case where a part of the hidden line is omitted.

本實施方式的防塵薄膜組件製造裝置具備貼合單元,所述貼合單元包括:貼合腔室、以及排氣管,所述貼合腔室進行包含防塵薄膜組件框的防塵薄膜組件框構件與包含防塵薄膜的防塵薄膜構件的貼合,所述防塵薄膜組件框具有設置於厚度方向的一端面及另一端面的至少一者的溝槽以及貫通外周面與所述溝槽的壁面之間的通孔,所述排氣管用以於將所述防塵薄膜組件框構件及所述防塵薄膜構件以所述防塵薄膜組件框的設置有所述溝槽的端面與所述防塵薄膜構件相對向的方式配置於所述貼合腔室內的狀態下,經由所述防塵薄膜組件框的所述通孔而對所述溝槽的內部進行排氣。 本實施方式的防塵薄膜組件製造裝置視需要亦可具備其他構成(例如,其他單元)。The pellicle manufacturing apparatus of the present embodiment includes a bonding unit including: a bonding chamber and an exhaust pipe, wherein the bonding chamber performs a pellicle frame member including a pellicle frame a bonding of a pellicle member including a pellicle having a groove provided at least one of an end surface and the other end surface in a thickness direction and a wall between the outer peripheral surface and the wall surface of the groove a through hole, the exhaust pipe is configured to dispose the pellicle frame member and the pellicle member in a manner in which an end surface of the pellicle frame in which the groove is disposed is opposed to the pellicle member The inside of the groove is exhausted through the through hole of the pellicle frame in a state of being disposed in the bonding chamber. The pellicle manufacturing apparatus of the present embodiment may have other configurations (for example, other units) as needed.

本實施方式中的防塵薄膜組件框構件的防塵薄膜組件框具有設置於厚度方向的一端面及另一端面的至少一者的溝槽。所述通孔貫通防塵薄膜組件框的外周面的一部分與所述溝槽的壁面(側面或底面。以下相同)的一部分之間。 而且,於本實施方式中的貼合單元中,於將防塵薄膜組件框構件及防塵薄膜構件配置為防塵薄膜組件框的設置有溝槽的端面與防塵薄膜構件相對向的狀態下,藉由所述排氣管經由防塵薄膜組件框的通孔而對溝槽的內部進行排氣。藉此,可使壓合力於防塵薄膜組件框構件的防塵薄膜組件框與防塵薄膜構件之間發揮作用。因此,(藉由裝置、夾具、手等)可儘量不與防塵薄膜的膜面接觸地將兩者貼合。 因此,根據本實施方式的防塵薄膜組件製造裝置,發揮於將包含防塵薄膜組件框的防塵薄膜組件框構件與包含防塵薄膜的防塵薄膜構件貼合來製造防塵薄膜組件時,可儘量不與防塵薄膜的膜面接觸地將兩者貼合的效果。 再者,於本實施方式中,「壓合力」與吸合力含義相同。The pellicle frame of the pellicle frame member of the present embodiment has at least one groove provided on one end surface and the other end surface in the thickness direction. The through hole penetrates between a part of the outer peripheral surface of the pellicle frame and a part of the wall surface (side surface or bottom surface of the groove). Further, in the bonding unit according to the present embodiment, the pellicle frame member and the pellicle member are disposed such that the end surface of the pellicle frame in which the groove is provided faces the pellicle member, and The exhaust pipe exhausts the inside of the groove through the through hole of the pellicle frame. Thereby, the pressing force can be exerted between the pellicle frame of the pellicle frame member and the pellicle member. Therefore, (by means of a device, a jig, a hand, etc.), it is possible to bond the two without contacting the film surface of the pellicle film as much as possible. Therefore, the dust-proof film module manufacturing apparatus according to the present embodiment is configured to bond the pellicle frame member including the pellicle frame to the pellicle member including the pellicle film to form the pellicle. The film is in contact with the surface to bring the two together. Further, in the present embodiment, the "compression force" has the same meaning as the suction force.

進而,根據本實施方式的防塵薄膜組件製造裝置,可抑制因與防塵薄膜組件的膜面接觸而引起的異物對防塵薄膜的附著、或防塵薄膜的破損。Further, according to the pellicle manufacturing apparatus of the present embodiment, it is possible to suppress adhesion of foreign matter to the pellicle film or damage of the pellicle film due to contact with the film surface of the pellicle.

且說,近年來伴隨半導體器件的微細化,抑制異物對防塵薄膜組件的附著的要求進一步變得強烈。 另外,線寬32 nm以下的圖案形成例如藉由EUV微影術進行。EUV微影術所使用的含有無機系材料的防塵薄膜與含有有機系材料的防塵薄膜相比有難以自立的傾向,另外,容易因機械上的接觸導致產生損傷或起塵。因此,於使用含有無機系材料的防塵薄膜來製作防塵薄膜組件的情形時,儘量不與防塵薄膜的膜面接觸地製作防塵薄膜組件的要求高。此處,所謂「自立」是指可單獨保持膜形狀。 根據本實施方式的防塵薄膜組件製造裝置,可應對伴隨半導體器件的微細化的該些要求。 具體而言,本實施方式的防塵薄膜組件製造裝置尤其適於使用波長短的曝光光(例如,EUV光、波長較EUV光更短的光等)的微影術用防塵薄膜組件的製作,其中適於具備含有無機系材料的防塵薄膜的防塵薄膜組件的製作。In addition, in recent years, with the miniaturization of semiconductor devices, the demand for suppressing adhesion of foreign matter to the pellicle film assembly has become stronger. Further, the pattern of the line width of 32 nm or less is formed by, for example, EUV lithography. The dust-proof film containing an inorganic material used for EUV lithography tends to be less likely to stand up than a dust-proof film containing an organic material, and is liable to cause damage or dusting due to mechanical contact. Therefore, when a pellicle is produced by using a pellicle film containing an inorganic material, it is highly demanded to produce a pellicle film without contacting the film surface of the pellicle. Here, "self-standing" means that the film shape can be maintained separately. According to the pellicle manufacturing apparatus of the present embodiment, it is possible to cope with these requirements accompanying the miniaturization of the semiconductor device. Specifically, the pellicle manufacturing apparatus of the present embodiment is particularly suitable for the production of a lithographic pellicle assembly using a short-wavelength exposure light (for example, EUV light, light having a shorter wavelength than EUV light, etc.), wherein It is suitable for the production of a pellicle film assembly having a pellicle film containing an inorganic material.

於本實施方式中,所謂極紫外(Extreme Ultra Violet,EUV)光是指波長5 nm~30 nm的光。 EUV光的波長較佳為5 nm~13.5 nm。 於本實施方式中,存在將EUV光、及波長較EUV光更短的光總稱為「EUV光等」的情況。In the present embodiment, the term "Extreme Ultra Violet (EUV)" refers to light having a wavelength of 5 nm to 30 nm. The wavelength of the EUV light is preferably from 5 nm to 13.5 nm. In the present embodiment, the EUV light and the light having a shorter wavelength than the EUV light are collectively referred to as "EUV light or the like".

另外,於本實施方式中,存在將防塵薄膜組件框的「厚度方向的端面」簡稱為「端面」的情況。 另外,於本實施方式中,所謂「厚度方向的一端面及另一端面」當然分別是指厚度方向的端面的其中一者、及厚度方向的端面的另一者。In the present embodiment, the "end surface in the thickness direction" of the pellicle frame is simply referred to as "end surface". In the present embodiment, the "one end surface and the other end surface in the thickness direction" are of course the other one of the end faces in the thickness direction and the other end faces in the thickness direction.

另外,於本實施方式中,將防塵薄膜組件框構件及防塵薄膜構件以防塵薄膜組件框的設置有溝槽的端面與所述防塵薄膜構件相對向的方式配置於貼合腔室內。此處,於將溝槽設置於防塵薄膜組件框的厚度方向的一端面及另一端面兩者的情形時,亦可使一端面及另一端面的任一者與防塵薄膜構件相對向。Further, in the present embodiment, the pellicle frame member and the pellicle member are disposed in the bonding chamber such that the grooved end surface of the pellicle frame is opposed to the pellicle member. Here, in the case where the groove is provided on both the one end surface and the other end surface in the thickness direction of the pellicle frame, either one end surface or the other end surface may be opposed to the pellicle member.

另外,本實施方式中的防塵薄膜組件框構件可僅包含防塵薄膜組件框,除防塵薄膜組件框以外,亦可於防塵薄膜組件框的至少與防塵薄膜構件相對向的端面之側具備含有接著劑的接著劑層。藉此,可牢靠地將防塵薄膜組件框構件與防塵薄膜構件貼附。 另外,除防塵薄膜組件框以外,防塵薄膜組件框構件亦可於防塵薄膜組件框的兩個端面之側具備含有接著劑的接著劑層。另外,防塵薄膜組件框構件亦可於防塵薄膜組件框的不與防塵薄膜構件相對向的端面之側依序具備所述接著劑層及剝離襯墊。Further, the pellicle frame member of the present embodiment may include only the pellicle frame, and may include an adhesive on the side of the end face of the pellicle frame facing at least the pellicle member, in addition to the pellicle frame. The layer of the adhesive. Thereby, the pellicle frame member and the pellicle member can be attached securely. Further, in addition to the pellicle frame, the pellicle frame member may be provided with an adhesive layer containing an adhesive on the side of both end faces of the pellicle frame. Further, the pellicle frame member may be provided with the adhesive layer and the release liner in this order on the side of the end surface of the pellicle frame that does not face the pellicle member.

另外,本實施方式的防塵薄膜構件可僅包含防塵薄膜,除防塵薄膜以外,亦可具備對防塵薄膜進行支持的支持基板等其他構件。防塵薄膜構件具備對防塵薄膜進行支持的支持基板的態樣尤其適於防塵薄膜為難以自立的膜(例如,矽結晶膜等含有無機系材料的防塵薄膜、厚度薄的防塵薄膜等)的情形。 作為支持基板,較佳為具有開口部且於所述開口部以外的部分對所述防塵薄膜進行支持的支持基板。換言之,所述支持基板的開口部為使防塵薄膜露出的開口部。所述支持基板的開口部(例如,後述的開口部127)的形狀較佳為設為如下形狀:於將防塵薄膜構件與防塵薄膜組件框構件貼合而製成防塵薄膜組件時,與由防塵薄膜組件框所圍成的區域(例如,後述的開口部50)之間具有重疊部分的形狀。作為一例,可列舉將所述支持基板的開口部的形狀設為與由防塵薄膜組件框所圍成的區域為相同形狀,但就防塵薄膜構件與防塵薄膜組件框構件的對準精度、所述開口部的加工精度、所述框構件的加工精度等觀點而言,兩者無須為完全相同的形狀。In addition, the pellicle member of the present embodiment may include only a pellicle film, and may be provided with other members such as a support substrate that supports the pellicle film in addition to the pellicle film. The pellicle film member is provided with a support substrate that supports the pellicle film, and is particularly suitable for a film in which the pellicle film is difficult to be self-supporting (for example, a pellicle film containing an inorganic material such as a ruthenium crystal film, or a thin pellicle film having a small thickness). As the support substrate, a support substrate having an opening and supporting the pellicle at a portion other than the opening is preferable. In other words, the opening of the support substrate is an opening that exposes the pellicle. The shape of the opening of the support substrate (for example, the opening 127 to be described later) is preferably a shape that is formed when the pellicle member and the pellicle frame member are bonded together to form a pellicle. A region surrounded by the film module frame (for example, an opening portion 50 to be described later) has a shape of an overlapping portion. As an example, the shape of the opening of the support substrate is the same as the area surrounded by the pellicle frame, but the alignment accuracy of the pell film member and the pellicle frame member is as described above. From the viewpoints of the processing accuracy of the opening portion, the processing accuracy of the frame member, and the like, the two need not be identical shapes.

另外,於本實施方式中,較佳為所述貼合單元進而包括導入管,所述導入管用以將氣體導入所述貼合腔室內而對所述貼合腔室內進行加壓。 藉由該導入管可對貼合腔室內進行加壓,因此進一步增大配置有防塵薄膜組件框構件及防塵薄膜構件的整體的環境的壓力、與溝槽內部的壓力的差(差壓)。因此,可進一步增大於防塵薄膜組件框構件與防塵薄膜構件之間產生的壓合力,可更容易地將兩者貼合。Further, in the present embodiment, it is preferable that the bonding unit further includes an introduction tube for introducing a gas into the bonding chamber to pressurize the bonding chamber. Since the introduction tube can pressurize the inside of the bonding chamber, the pressure of the entire environment in which the pellicle frame member and the pellicle member are disposed and the difference in pressure between the grooves (differential pressure) are further increased. Therefore, the pressing force generated between the pellicle frame member and the pellicle member can be further increased, and the two can be more easily attached.

另外,於本實施方式中,更佳為所述導入管包含第1導入管,所述第1導入管自與配置於所述貼合腔室內的所述防塵薄膜組件框構件及所述防塵薄膜構件中的所述防塵薄膜構件相對向之側導入氣體,所述貼合單元進而包括氣體分散構件,所述氣體分散構件用以使自所述第1導入管導入的氣體分散。 於該態樣中,藉由第1導入管導入的氣體的流動對防塵薄膜的影響得以減少。Further, in the present embodiment, it is preferable that the introduction tube includes a first introduction tube, and the first introduction tube is from the pellicle frame member and the pellicle disposed in the bonding chamber. The pellicle member in the member introduces a gas to the side, and the bonding unit further includes a gas dispersing member for dispersing a gas introduced from the first introduction pipe. In this aspect, the influence of the flow of the gas introduced through the first introduction tube on the pellicle film is reduced.

於所述導入管包含所述第1導入管的情形時,除第1導入管以外,所述導入管亦可包含作為第1導入管以外的其他導入管的第2導入管。In the case where the introduction tube includes the first introduction tube, the introduction tube may include a second introduction tube as another introduction tube other than the first introduction tube, in addition to the first introduction tube.

本實施方式的防塵薄膜組件製造裝置亦可進而具備保持構件,所述保持構件用以保持所述防塵薄膜構件且將其搬入所述貼合腔室內。藉此,可使手不觸碰防塵薄膜構件地將防塵薄膜構件搬入貼合腔室內。 保持構件不僅具備保持防塵薄膜構件的功能,亦可兼具保持防塵薄膜組件框構件的功能、保持貼合後的防塵薄膜組件框構件及防塵薄膜構件(即,防塵薄膜組件)的功能等其他功能。The pellicle manufacturing apparatus of the present embodiment may further include a holding member for holding the pellicle member and carrying it into the bonding chamber. Thereby, the pellicle member can be carried into the bonding chamber without touching the pellicle member. The holding member not only has the function of holding the pellicle member, but also functions to hold the pellicle frame member, and to maintain the functions of the pellicle frame member and the pellicle member (ie, the pellicle). .

於本實施方式的防塵薄膜組件製造裝置具備所述保持構件的情形時,較佳為所述防塵薄膜構件包含所述防塵薄膜、以及支持基板,所述支持基板具有開口部且於所述開口部以外的部分對所述防塵薄膜進行支持,所述保持構件以與所述支持基板接觸且不與所述防塵薄膜接觸的方式保持所述防塵薄膜構件。 藉此,可不與防塵薄膜接觸地將防塵薄膜構件搬入貼合腔室。In the case where the pellicle manufacturing apparatus of the present embodiment includes the holding member, the pellicle member preferably includes the pellicle and the support substrate, and the support substrate has an opening and the opening. The dust-proof film is supported by a portion other than the dust-proof film that is in contact with the support substrate and that does not contact the dust-proof film. Thereby, the pellicle member can be carried into the bonding chamber without coming into contact with the pellicle film.

於本實施方式中,較佳為所述貼合單元包括連通構件,所述連通構件於所述貼合腔室內連接於所述排氣管的一端,並使所述排氣管與所述防塵薄膜組件框的所述通孔連通。 藉此,於經由防塵薄膜組件框的通孔而對溝槽的內部進行排氣時,可使排氣的效率進一步提升。In the embodiment, it is preferable that the bonding unit includes a communication member that is connected to one end of the exhaust pipe in the bonding chamber, and the exhaust pipe and the dustproof The through holes of the membrane module frame are in communication. Thereby, when the inside of the groove is exhausted through the through hole of the pellicle frame, the efficiency of the exhaust can be further improved.

所述連通構件的形狀若為可使排氣管與通孔連通的形狀,則可為任意的形狀。 所述連通構件的形狀例如可列舉:具有與防塵薄膜組件框的外周面接觸的開口端且該開口端的直徑大於通孔的直徑的形狀。於該情形時,連通構件的所述開口端與通孔的位置對準變得更容易。 另外,所述連通構件的形狀亦可列舉具有直徑小於通孔的直徑的開口端的形狀。於該情形時,可將開口端插入至通孔,因此,可使連通構件的所述開口端與通孔牢靠地連接。The shape of the communicating member may be any shape if it has a shape that allows the exhaust pipe to communicate with the through hole. The shape of the communicating member may be, for example, a shape having an open end that is in contact with the outer peripheral surface of the pellicle frame, and the diameter of the open end is larger than the diameter of the through hole. In this case, it is easier to align the open end of the communication member with the position of the through hole. Further, the shape of the communicating member may also be a shape having an open end having a diameter smaller than the diameter of the through hole. In this case, the open end can be inserted into the through hole, and therefore, the open end of the communicating member can be firmly connected to the through hole.

如上所述,所述連通構件的形狀例如亦可列舉具有可插入至防塵薄膜組件框的通孔的開口端的形狀。於該情形時,可使連通構件的所述開口端與通孔更牢靠地連接。 作為該情形時的一例,可列舉如下例:框構件的通孔具有隨著朝向防塵薄膜組件框的外周面而直徑增大的錐形形狀,且連通構件具有可插入至所述錐形形狀的通孔的錐形形狀的開口端。As described above, the shape of the communicating member may be, for example, a shape having an open end that can be inserted into the through hole of the pellicle frame. In this case, the open end of the communication member can be more firmly connected to the through hole. As an example of the case, the through hole of the frame member has a tapered shape that increases in diameter toward the outer peripheral surface of the pellicle frame, and the communicating member has a shape that can be inserted into the tapered shape. The open end of the tapered shape of the through hole.

另外,所述連通構件較佳為被設置為可朝推入所述防塵薄膜組件框的外周面的方向移動。 藉此,可更牢靠地將連通構件與防塵薄膜組件框連接。進而,即便於因經由防塵薄膜組件框的通孔對溝槽的內部進行排氣而引起防塵薄膜組件框朝排氣方向產生應變變形的情形時,亦可藉由預先利用連通構件推入防塵薄膜組件框的外周面來抑制(修正)框構件的應變變形。 再者,當然,於該情形時,可將連通構件設置為不僅可朝推入防塵薄膜組件框的外周面的方向移動,亦可朝與其相反的方向(返回方向;即,遠離外周面的方向)移動。Further, the communication member is preferably provided to be movable in a direction of being pushed into the outer peripheral surface of the pellicle frame. Thereby, the connecting member can be connected to the pellicle frame more securely. Further, even when the pellicle frame is strain-deformed in the exhaust direction due to the exhaust of the inside of the groove through the through hole of the pellicle frame, the pellicle can be pushed in by using the connecting member in advance. The outer peripheral surface of the component frame suppresses (corrects) the strain deformation of the frame member. Further, of course, in this case, the communication member may be provided not only to be moved in the direction of pushing into the outer peripheral surface of the pellicle frame, but also to be opposite thereto (return direction; that is, away from the outer peripheral surface) )mobile.

本實施方式的防塵薄膜組件製造裝置亦可進而具備切割單元,所述切割單元與所述防塵薄膜組件框構件的外周形狀相應地切割(切斷)所述防塵薄膜構件。 於具備切割單元的態樣中,作為防塵薄膜構件,使用尺寸(size)大於所述防塵薄膜組件框構件的外周形狀的防塵薄膜構件。於該情形時,可於防塵薄膜構件與防塵薄膜組件框構件的貼合前對防塵薄膜構件進行切割,亦可於防塵薄膜構件與防塵薄膜組件框構件的貼合後對防塵薄膜構件進行切割。 與於貼合單元內進行所述切割的情形相比,於本實施方式的防塵薄膜組件製造裝置具備獨立於貼合單元的切割單元的態樣中,於防塵薄膜構件與防塵薄膜組件框構件的貼合時,因切割(切斷)而產生的切割屑對各構件的附著得以抑制。 更詳細而言,於貼合單元的貼合腔室內,因通過通孔的溝槽的排氣(減壓)及貼合腔室的大氣開放等而存在產生氣體的對流的情況。於貼合單元具有氣體的導入管且對貼合腔室進行加壓的情形時,更容易產生氣體的對流。 關於該氣體的對流,於本實施方式的防塵薄膜組件製造裝置具備獨立於貼合單元的切割單元的態樣中,因所述氣體的對流而引起的於貼合腔室內的切割屑飛舞的現象得以抑制,進而切割屑對貼合時的各構件的附著得以抑制。The pellicle manufacturing apparatus of the present embodiment may further include a cutting unit that cuts (cuts) the pellicle member in accordance with the outer peripheral shape of the pellicle frame member. In the aspect in which the cutting unit is provided, as the pell film member, a pellicle member having a size larger than the outer peripheral shape of the pellicle frame member is used. In this case, the pellicle member can be cut before the pellicle member and the pellicle frame member are bonded together, or the pellicle member can be cut after the pellicle member and the pellicle frame member are bonded together. Compared with the case where the cutting is performed in the bonding unit, the pellicle manufacturing apparatus of the present embodiment includes the cutting unit independent of the bonding unit, and the pell film member and the pellicle frame member. At the time of bonding, the adhesion of cutting chips due to cutting (cutting) to each member is suppressed. More specifically, in the bonding chamber of the bonding unit, convection of gas may occur due to exhaust (decompression) of the groove passing through the through hole and opening of the atmosphere of the bonding chamber. When the bonding unit has a gas introduction tube and pressurizes the bonding chamber, convection of the gas is more likely to occur. In the convection of the gas, the pellicle module manufacturing apparatus of the present embodiment includes a cutting unit that is independent of the bonding unit, and the cutting debris in the bonding chamber is caused by the convection of the gas. It is suppressed, and the adhesion of the cutting chips to the respective members at the time of bonding is suppressed.

於本實施方式的防塵薄膜組件製造裝置具備切割單元的情形時,所述防塵薄膜構件較佳為包含所述防塵薄膜、以及支持基板,所述支持基板具有開口部且於所述開口部以外的部分對所述防塵薄膜進行支持,並且所述支持基板具有切入部,所述切入部用以與所述防塵薄膜組件框構件的外周形狀相應地進行切割。藉此,可更容易地切割防塵薄膜構件。In the case where the pellicle manufacturing apparatus of the present embodiment includes a dicing unit, the pellicle member preferably includes the pellicle and the support substrate, and the support substrate has an opening and is outside the opening. The pellicle is partially supported, and the support substrate has a cut-in portion for cutting in accordance with an outer peripheral shape of the pellicle frame member. Thereby, the pellicle member can be cut more easily.

於本實施方式的防塵薄膜組件製造裝置具備切割單元的情形時,所述切割單元較佳為包括上推部件,所述上推部件藉由相對於支持基板的比所述切入部更靠外側的部分而上推所述支持基板的比所述切入部更靠內側的部分來切割所述防塵薄膜構件。 藉此,與相對於所述內側部分而上推所述外側部分的情形相比,可抑制支持基板的無計劃的破裂(切入部以外的部分中的破裂),且可藉由更簡易的裝置構成來切割防塵薄膜構件。 作為該態樣,例如可列舉設為如下結構:於切割單元各自獨立地設置對所述內側部分進行支持的支持構件(例如載置板)與對所述外側部分進行支持的支持構件(例如載置板),並且相對於對所述外側部分進行支持的支持構件而使對所述內側部分進行支持的支持構件可沿上推方向移動。 於該態樣中,內側部分是成為作為最終目標物的防塵薄膜組件的構成要素的有效部分,外側部分是不會成為作為最終目標物的防塵薄膜組件的構成要素的不需要部分。In the case where the pellicle manufacturing apparatus of the present embodiment includes a dicing unit, the dicing unit preferably includes a push-up member that is further outward than the cut-in portion with respect to the support substrate. The pellicle member is cut by partially pushing up a portion of the support substrate that is further inside than the cut portion. Thereby, unplanned cracking of the support substrate (breakage in a portion other than the cut portion) can be suppressed as compared with a case where the outer portion is pushed up with respect to the inner portion, and a simpler device can be used It is configured to cut the pellicle member. As such an aspect, for example, a configuration is adopted in which a support member (for example, a mounting plate) that supports the inner portion and a support member that supports the outer portion are independently provided in the cutting unit (for example, The support member that supports the inner portion is movable in the push-up direction with respect to the support member that supports the outer portion. In this aspect, the inner portion is an effective portion of the constituent elements of the pellicle film assembly as the final target, and the outer portion is an unnecessary portion that does not become a constituent element of the pellicle film assembly as the final target.

於本實施方式的防塵薄膜組件製造裝置具備切割單元的情形時,所述切割單元較佳為包括:切割腔室,進行切割所述防塵薄膜構件的操作;所述上推部件,配置於所述切割腔室內;導入管,用以將氣體導入所述切割腔室內;以及氣體分散構件,使藉由所述導入管導入的氣體分散並自與所述上推方向相反的方向吹附至所述內側部分。 於該態樣中,藉由利用氣體分散構件的氣體吹附,可自所述內側部分(有效部分)容易地去除因切割而產生的切割屑等。In the case where the pellicle manufacturing apparatus of the present embodiment includes a cutting unit, the cutting unit preferably includes a cutting chamber for performing an operation of cutting the pellicle member, and the push-up member is disposed at the a cutting chamber for introducing a gas into the cutting chamber; and a gas dispersing member that disperses a gas introduced through the introduction tube and blows the gas into the opposite direction from the push-up direction Inner part. In this aspect, by using the gas blowing of the gas dispersing member, cutting chips and the like which are generated by the cutting can be easily removed from the inner portion (effective portion).

於本實施方式的防塵薄膜組件製造裝置具備切割單元的情形時,較佳為進而具備清洗單元,所述清洗單元對經切割的所述防塵薄膜構件(與防塵薄膜組件框構件貼合前的防塵薄膜構件、或與防塵薄膜組件框構件貼合後的防塵薄膜構件)進行清洗。 藉此,可自所述內側部分(有效部分)去除因切割而產生的切割屑等異物。In the case where the pellicle manufacturing apparatus of the present embodiment includes a dicing unit, it is preferable to further include a cleaning unit that protects the diced pellicle film (the dustproof material before being attached to the pellicle frame member) The film member or the pellicle member attached to the pellicle frame member is cleaned. Thereby, foreign matter such as cutting chips generated by cutting can be removed from the inner portion (effective portion).

本實施方式的防塵薄膜組件製造裝置較佳為進而具備檢查單元,所述檢查單元對所述貼合後的所述防塵薄膜組件框構件及所述防塵薄膜構件進行外觀檢查。 作為外觀檢查,可列舉:附著於防塵薄膜組件框構件及防塵薄膜構件的至少一者的異物的檢查、防塵薄膜組件框構件(防塵薄膜組件框)的形狀測定、防塵薄膜組件框構件與防塵薄膜構件的位置對準偏差的測定等。 再者,防塵薄膜組件框構件與防塵薄膜構件的「位置對準」亦可稱為「重合」。The pellicle manufacturing apparatus of the present embodiment preferably further includes an inspection unit that performs an appearance inspection on the bonded pellicle frame member and the pellicle member. The inspection of the foreign matter attached to at least one of the pellicle frame member and the pellicle member, the shape measurement of the pellicle frame member (the pellicle frame), the pellicle frame member, and the pellicle film The measurement of the positional deviation of the member, and the like. Furthermore, the "alignment" of the pellicle frame member and the pellicle member may also be referred to as "coincidence".

本實施方式的防塵薄膜組件製造裝置較佳為進而具備:第1測定部件,對與所述防塵薄膜構件貼合前的所述防塵薄膜組件框構件的所述防塵薄膜組件框的形狀進行測定;以及第2測定部件,對與所述防塵薄膜構件貼合後的所述防塵薄膜組件框構件的所述防塵薄膜組件框的形狀進行測定。 於該態樣中,可調查因貼合(尤其是所述防塵薄膜組件框的所述溝槽內部的排氣)而引起的防塵薄膜組件框的變形的有無、及變形量。Preferably, the pellicle manufacturing apparatus of the present embodiment further includes: a first measuring member that measures a shape of the pellicle frame of the pellicle frame member before bonding the pellicle member; And the second measuring member measures the shape of the pellicle frame of the pellicle frame member that is bonded to the pellicle member. In this aspect, it is possible to investigate the presence or absence of deformation of the pellicle frame due to the bonding (especially the exhaust inside the groove of the pellicle frame) and the amount of deformation.

於本實施方式的防塵薄膜組件製造裝置具備第1測定部件及第2測定部件的情形時,本實施方式的防塵薄膜組件製造裝置更佳為具備:對準部件,於將所述防塵薄膜組件框構件與所述防塵薄膜構件貼合前,進行所述防塵薄膜組件框構件與所述防塵薄膜構件的對準;以及控制部件,基於所述貼合前的所述防塵薄膜組件框的形狀的測定結果與所述貼合後的所述防塵薄膜組件框的形狀的測定結果,對藉由所述對準部件的對準進行前饋控制。 於該態樣中,藉由所述控制部件可預測因貼合而引起的防塵薄膜組件框的變形,並可預先以變形導致的對準偏差(位置對準偏差)變小(較佳為被最小化)的方式,對藉由對準部件進行的防塵薄膜組件框構件與防塵薄膜構件的對準加以控制。 於該態樣中,可省略控制部件,亦可手動調整藉由對準部件的對準。In the case where the pellicle manufacturing apparatus of the present embodiment includes the first measuring member and the second measuring member, the pellicle manufacturing apparatus of the present embodiment preferably further includes an aligning member for arranging the pellicle frame Aligning the pellicle frame member with the pellicle member before bonding the member to the pellicle member; and controlling the member based on the shape of the pellicle frame before the bonding As a result, the result of measurement of the shape of the bonded pellicle frame is subjected to feedforward control by alignment of the alignment member. In this aspect, the control member can predict the deformation of the pellicle frame caused by the lamination, and the alignment deviation (position misalignment) caused by the deformation can be reduced in advance (preferably The method of minimizing the control of the alignment of the pellicle frame member and the pellicle member by the alignment member. In this aspect, the control components can be omitted and the alignment by the alignment components can be manually adjusted.

於本實施方式的防塵薄膜組件製造裝置具備第1測定部件及第2測定部件的情形時,本實施方式的防塵薄膜組件製造裝置較佳為進而具備算出部件,所述算出部件基於所述貼合前的所述防塵薄膜組件框的形狀的測定結果與所述貼合後的所述防塵薄膜組件框的形狀的測定結果的差,來算出因所述貼合而引起的所述防塵薄膜組件框的應變量。 於該態樣中,藉由所述算出部件可預測因貼合而引起的防塵薄膜組件框的應變量(例如,因通過通孔的溝槽的排氣而引起的防塵薄膜組件框的應變量),並可預先以防塵薄膜組件框的應變變小(較佳為被最小化)的方式,對因連通構件而引起的框構件的推入量進行控制。In the case where the pellicle manufacturing apparatus of the present embodiment includes the first measuring member and the second measuring member, the pellicle manufacturing apparatus of the present embodiment preferably further includes a calculating member, and the calculating member is based on the bonding. The measurement result of the shape of the front pellicle frame is different from the measurement result of the shape of the pellicle frame after the bonding, and the pellicle frame is caused by the bonding. The dependent variable. In this aspect, the calculation component can predict the strain amount of the pellicle frame caused by the lamination (for example, the strain amount of the pellicle frame due to the exhaust of the groove passing through the through hole) The amount of pushing of the frame member due to the communicating member can be controlled in advance so that the strain of the pellicle frame becomes small (preferably minimized).

於本實施方式的防塵薄膜組件製造裝置具備所述算出部件的情形時,本實施方式的防塵薄膜組件製造裝置較佳為所述貼合單元包括連通構件,所述連通構件於所述貼合腔室內連接於所述排氣管的一端,並使所述排氣管與所述防塵薄膜組件框的所述通孔連通,並且被設置為可朝推入所述防塵薄膜組件框的外周面的方向移動,且所述算出部件是基於所述應變量而對因所述連通構件而引起的所述防塵薄膜組件框的推入量進行前饋控制的控制部件。 於該態樣中,藉由所述算出部件,不僅可進行應變量的算出,亦可進行防塵薄膜組件框的推入量的控制。In the case where the pellicle manufacturing apparatus of the present embodiment includes the calculation member, the pellicle assembly manufacturing apparatus of the present embodiment preferably includes the communication unit, and the communication member is in the bonding cavity. Indoorly connected to one end of the exhaust pipe, and the exhaust pipe is communicated with the through hole of the pellicle frame, and is disposed to be pushed into the outer peripheral surface of the pellicle frame The direction is moved, and the calculation means is a control means for performing feedforward control of the amount of pushing of the pellicle frame caused by the communication member based on the strain amount. In this aspect, the calculation means can not only calculate the amount of strain but also control the amount of pushing of the pellicle frame.

<具體例> 繼而,一面參照圖1~圖26,一面對本實施方式的一例進行說明,但本發明並不限定於以下的一例。<Specific Example> Next, an example of the present embodiment will be described with reference to Figs. 1 to 26, but the present invention is not limited to the following examples.

(防塵薄膜組件框的具體例) 圖1及圖2為表示於本實施方式的防塵薄膜組件製造裝置中,作為貼合對象物之一的防塵薄膜組件框構件的防塵薄膜組件框的一例的概略立體圖。 圖1為自可觀察到一例的防塵薄膜組件框的厚度方向的一端面的方向進行觀察的概略立體圖,圖2為自可觀察到同一例的防塵薄膜組件框的厚度方向的另一端面的方向進行觀察的概略立體圖。 圖3為所述一例的防塵薄膜組件框的部分截面圖,詳細而言為圖1的A-A線截面圖。(Specific Example of PSA Module Frame) FIG. 1 and FIG. 2 are schematic diagrams showing an example of a pellicle frame of a pellicle frame member which is one of the bonding objects in the pellicle manufacturing apparatus of the present embodiment. Stereo picture. 1 is a schematic perspective view of a direction of one end surface in the thickness direction of an example of a pellicle frame which can be observed, and FIG. 2 is a view showing the direction of the other end surface in the thickness direction of the pellicle frame of the same example. A schematic perspective view of the observation. Fig. 3 is a partial cross-sectional view showing the dustproof film module frame of the above-described example, and is a cross-sectional view taken along line A-A of Fig. 1 in detail.

如圖1及圖2所示,本一例的防塵薄膜組件框100的形狀為矩形的框形狀。於將防塵薄膜組件框100設為防塵薄膜組件的一構件時,曝光光會透過由防塵薄膜組件框100所圍成的開口部50。 防塵薄膜組件框100的外形由防塵薄膜組件框100的厚度方向的一端面10、另一端面20、包含四個面的外周面30、及包含四個面的內周面40所確定。 再者,防塵薄膜組件框100的自厚度方向觀察的形狀如上述般為矩形形狀,但本實施方式的防塵薄膜組件框的自厚度方向觀察的形狀並不限定於矩形形狀,亦可為矩形形狀以外的形狀(例如,梯形形狀、框的外側部分具有突起的形狀等)。As shown in FIGS. 1 and 2, the pellicle frame 100 of the present example has a rectangular frame shape. When the pellicle frame 100 is used as a member of the pellicle assembly, the exposure light passes through the opening 50 surrounded by the pellicle frame 100. The outer shape of the pellicle frame 100 is determined by one end surface 10 in the thickness direction of the pellicle frame 100, the other end surface 20, the outer peripheral surface 30 including four faces, and the inner peripheral surface 40 including four faces. In addition, the shape of the pellicle frame 100 of the present embodiment is not limited to a rectangular shape, and may be a rectangular shape as viewed from the thickness direction. A shape other than (for example, a trapezoidal shape, an outer portion of the frame having a convex shape, or the like).

如圖1及圖3所示,於一端面10設置有溝槽12。 於該實施方式中,自防塵薄膜組件框100的厚度方向觀察的溝槽12的形狀為沿防塵薄膜組件框100的形狀繞一周的無端(endless)形狀。 關於自防塵薄膜組件框的厚度方向觀察的溝槽的形狀的變形例,將於後述。As shown in FIGS. 1 and 3, a groove 12 is provided on one end surface 10. In this embodiment, the shape of the groove 12 viewed from the thickness direction of the pellicle frame 100 is an endless shape that is wound around the shape of the pellicle frame 100. A modification of the shape of the groove viewed from the thickness direction of the pellicle frame will be described later.

防塵薄膜組件框100具有通孔14A及通孔14B。 通孔14A及通孔14B分別貫通溝槽12的底面與外周面30之間。The pellicle frame 100 has a through hole 14A and a through hole 14B. The through hole 14A and the through hole 14B penetrate between the bottom surface of the groove 12 and the outer peripheral surface 30, respectively.

此處,通孔14A及通孔14B亦可分別貫通溝槽12的側面與外周面30之間。 另外,可省略通孔14A及通孔14B中的任一者。即,於防塵薄膜組件框100中,對一個溝槽(溝槽12)連接兩個通孔(通孔14A及通孔14B),但本實施方式並不限定於該態樣。於本實施方式中,對一個溝槽(溝槽12、溝槽22)連接至少一個通孔即可。Here, the through hole 14A and the through hole 14B may also pass between the side surface of the groove 12 and the outer peripheral surface 30, respectively. In addition, any of the through hole 14A and the through hole 14B may be omitted. That is, in the pellicle frame 100, two through holes (the through hole 14A and the through hole 14B) are connected to one groove (groove 12), but the embodiment is not limited to this. In the present embodiment, at least one through hole may be connected to one trench (groove 12, trench 22).

另外,如圖2及圖3所示,於與一端面10為相反側的另一端面20設置有溝槽22。 於該實施方式中,溝槽22的形狀亦與溝槽12的形狀相同,於自厚度方向觀察時,為沿防塵薄膜組件框100的形狀繞一周的無端形狀。Further, as shown in FIGS. 2 and 3, a groove 22 is provided on the other end surface 20 opposite to the one end surface 10. In this embodiment, the shape of the groove 22 is also the same as that of the groove 12, and is an endless shape that is wound around the shape of the pellicle frame 100 when viewed from the thickness direction.

防塵薄膜組件框100具有通孔24A及通孔24B。 通孔24A及通孔24B分別貫通溝槽22的底面與外周面30之間。 通孔24A及通孔24B的變化(variation)與通孔14A及通孔14B的變化相同。The pellicle frame 100 has a through hole 24A and a through hole 24B. The through hole 24A and the through hole 24B penetrate between the bottom surface of the groove 22 and the outer peripheral surface 30, respectively. The variation of the through hole 24A and the through hole 24B is the same as that of the through hole 14A and the through hole 14B.

所述防塵薄膜組件框100適於使防塵薄膜支持於一端面10之側或另一端面20之側而製作防塵薄膜組件的用途。 例如,若對將防塵薄膜支持於一端面10之側的情形進行說明,則於防塵薄膜組件框100中,於與防塵薄膜為相對向面的一端面10設置有溝槽12,且設置有連接於該溝槽12的通孔14A及通孔14B。因此,於將防塵薄膜固定於一端面10之側時,經由通孔14A及通孔14B而對溝槽12的內部(例如藉由真空泵等排氣部件)進行排氣,藉此可減小防塵薄膜組件框100與防塵薄膜之間的壓力。藉由該減壓,可使壓合力於防塵薄膜組件框100與防塵薄膜之間發揮作用,因此可儘量不與防塵薄膜的膜面接觸地將兩者貼合。 另外,於將防塵薄膜支持於另一端面20之側的情形時,亦可發揮相同的效果。The pellicle frame 100 is adapted to support the pellicle film on the side of one end face 10 or the other end face 20 to make a pellicle assembly. For example, in the case where the dust-proof film is supported on the side of the one end surface 10, the dust-proof film module frame 100 is provided with a groove 12 on one end surface 10 facing the dust-proof film, and is provided with a connection. The through hole 14A and the through hole 14B of the trench 12. Therefore, when the pellicle film is fixed to the side of the one end surface 10, the inside of the groove 12 (for example, an exhaust member such as a vacuum pump) is exhausted through the through hole 14A and the through hole 14B, thereby reducing dustproof The pressure between the membrane module frame 100 and the pellicle film. By this pressure reduction, the pressing force can be made to function between the pellicle frame 100 and the pellicle film, so that the two can be bonded together without being in contact with the film surface of the pellicle film. Further, when the dustproof film is supported on the side of the other end surface 20, the same effect can be exerted.

防塵薄膜組件框100為將防塵薄膜支持於任一個端面之側的構件,因此所述溝槽亦可僅設置於與防塵薄膜相對向的端面。即,可省略溝槽12、通孔14A、及通孔14B的組合、以及溝槽22、通孔24A、及通孔24B的組合中的任一組合。Since the pellicle frame 100 is a member that supports the pellicle on either side of the end face, the groove may be provided only on the end surface facing the pellicle. That is, any combination of the combination of the trench 12, the via hole 14A, and the via hole 14B, and the combination of the trench 22, the via hole 24A, and the via hole 24B can be omitted.

防塵薄膜組件框100於一端面10及另一端面20兩者具有溝槽(溝槽12、溝槽22),因此具有對防塵薄膜進行支持的端面的選擇範圍廣的優點。 另外,防塵薄膜組件框100於一端面10及另一端面20兩者具有溝槽(溝槽12、溝槽22),因此亦具有適於製作如下構成的附防塵薄膜組件的曝光原版的優點,所述構成為於一端面10側(或另一端面20側)配置有防塵薄膜且於另一端面20側(或一端面10側)配置有原版(遮罩)的構成。於該情形時,藉由所述的通過通孔的溝槽的排氣(減壓),可不與防塵薄膜的膜面接觸地將防塵薄膜組件框100與防塵薄膜貼合,且可儘量不與防塵薄膜的膜面接觸地將防塵薄膜組件框100與原版貼合。Since the pellicle frame 100 has grooves (grooves 12 and grooves 22) on both the one end surface 10 and the other end surface 20, there is an advantage that the end face supporting the pellicle film has a wide selection range. In addition, the pellicle frame 100 has grooves (grooves 12, grooves 22) on both the one end face 10 and the other end face 20, and therefore has an advantage of being suitable for producing an exposure original plate with a pellicle assembly as follows. In the above configuration, the dustproof film is disposed on the one end surface 10 side (or the other end surface 20 side), and the original plate (mask) is disposed on the other end surface 20 side (or the one end surface 10 side). In this case, the pellicle frame 100 and the pellicle can be attached to the pellicle without contact with the film of the pellicle by the exhaust (decompression) of the through-hole. The pellicle frame 100 is bonded to the original plate by the film surface of the pellicle.

以下,為了方便起見,雖以將防塵薄膜支持於防塵薄膜組件框100的一端面10之側的情形為中心進行說明,當然,亦可將防塵薄膜支持於防塵薄膜組件框100的另一端面20之側。In the following, for the sake of convenience, the dust-proof film is supported on the side of the one end surface 10 of the pellicle frame 100, and of course, the pellicle may be supported on the other end of the pellicle frame 100. 20 side.

防塵薄膜組件框100的尺寸例如可設為以下尺寸。 防塵薄膜組件框100的長邊方向的長度L1例如可設為135 mm~153 mm,較佳為140 mm~152 mm,更佳為145 mm~151 mm。 防塵薄膜組件框100的短邊方向的長度L2例如可設為100 mm~130 mm,較佳為105 mm~125 mm,更佳為110 mm~120 mm。 長邊方向的長度L1與短邊方向的長度L2可為相同尺寸。即,防塵薄膜組件框100的形狀亦可為正方形形狀。 防塵薄膜組件框100的框寬(flame width)W例如可設為1.0 mm~5.0 mm,較佳為1.2 mm~3.5 mm,更佳為1.5 mm~2.5 mm。於矩形形狀的防塵薄膜組件框100的四條邊中,框寬可設為相同的尺寸,亦可設為不同的尺寸。 另外,由防塵薄膜組件框100所圍成的開口部50(通孔)的長邊方向的長度例如可設為130 mm~152 mm,較佳為135 mm~151 mm,更佳為140 mm~150 mm。 另外,開口部50的寬度例如可設為95 mm~130 mm,較佳為100 mm~125 mm,更佳為105 mm~120 mm。 防塵薄膜組件框的厚度t例如可設為0.5 mm~5.0 mm,較佳為0.5 mm~3.0 mm,更佳為0.5 mm~2.0 mm。The size of the pellicle frame 100 can be set, for example, to the following dimensions. The length L1 in the longitudinal direction of the pellicle frame 100 can be, for example, 135 mm to 153 mm, preferably 140 mm to 152 mm, and more preferably 145 mm to 151 mm. The length L2 of the pellicle frame 100 in the short-side direction can be, for example, 100 mm to 130 mm, preferably 105 mm to 125 mm, and more preferably 110 mm to 120 mm. The length L1 in the longitudinal direction and the length L2 in the short-side direction may be the same size. That is, the shape of the pellicle frame 100 may be a square shape. The flame width W of the pellicle frame 100 can be, for example, 1.0 mm to 5.0 mm, preferably 1.2 mm to 3.5 mm, more preferably 1.5 mm to 2.5 mm. Among the four sides of the rectangular pellicle frame 100, the frame width may be the same size or may be set to a different size. In addition, the length of the opening 50 (through hole) surrounded by the pellicle frame 100 can be, for example, 130 mm to 152 mm, preferably 135 mm to 151 mm, and more preferably 140 mm. 150 mm. Further, the width of the opening portion 50 can be, for example, 95 mm to 130 mm, preferably 100 mm to 125 mm, and more preferably 105 mm to 120 mm. The thickness t of the pellicle frame can be, for example, 0.5 mm to 5.0 mm, preferably 0.5 mm to 3.0 mm, more preferably 0.5 mm to 2.0 mm.

另外,溝槽12及溝槽22的寬度可考慮減少溝槽處的壓力損失、與防塵薄膜組件框的框寬的關係等而適當設定,例如可設為10 μm~1.0 mm,較佳為50 μm~700 μm,更佳為100 μm~600 μm,尤佳為200 μm~500 μm。 另外,溝槽12及溝槽22的深度可考慮減少溝槽處的壓力損失、與防塵薄膜組件框的厚度的關係等而適當設定,例如可設為10 μm~1.0 mm,較佳為50 μm~700 μm,更佳為100 μm~600 μm,尤佳為200 μm~500 μm。Further, the width of the groove 12 and the groove 22 can be appropriately set in consideration of the pressure loss at the groove, the relationship with the frame width of the pellicle frame, and the like, and can be, for example, 10 μm to 1.0 mm, preferably 50. Μm to 700 μm, more preferably 100 μm to 600 μm, and particularly preferably 200 μm to 500 μm. Further, the depth of the groove 12 and the groove 22 can be appropriately set in consideration of the relationship between the pressure loss at the groove and the thickness of the pellicle frame, and can be, for example, 10 μm to 1.0 mm, preferably 50 μm. ~700 μm, more preferably 100 μm to 600 μm, and particularly preferably 200 μm to 500 μm.

另外,通孔14A、通孔14B、通孔24A、及通孔24B的寬度可考慮減少通孔處的壓力損失、與防塵薄膜組件框的厚度的關係等而適當設定,例如例如可設為10 μm~1.0 mm,較佳為50 μm~700 μm,更佳為100 μm~600 μm,尤佳為200 μm~500 μm。 另外,通孔14A、通孔14B、通孔24A、及通孔24B的長度可考慮減少通孔處的壓力損失等而適當設定,例如可設為0.5 mm~10 mm,較佳為0.7 mm~5.0 mm,更佳為1.0 mm~2.0 mm。 此處,所謂通孔的寬度是指包含通孔的通路的通路寬度(於通孔的截面為圓形形狀的情形時為直徑),所謂通孔的長度是指包含通孔的通路的通路長度。In addition, the width of the through hole 14A, the through hole 14B, the through hole 24A, and the through hole 24B can be appropriately set in consideration of the relationship between the pressure loss at the through hole and the thickness of the pellicle frame, and the like, for example, can be set to 10 Μm to 1.0 mm, preferably 50 μm to 700 μm, more preferably 100 μm to 600 μm, and particularly preferably 200 μm to 500 μm. Further, the length of the through hole 14A, the through hole 14B, the through hole 24A, and the through hole 24B can be appropriately set in consideration of reducing the pressure loss at the through hole, and the like, and can be, for example, 0.5 mm to 10 mm, preferably 0.7 mm. 5.0 mm, more preferably 1.0 mm to 2.0 mm. Here, the width of the through hole refers to the passage width of the passage including the through hole (the diameter when the cross section of the through hole is a circular shape), and the length of the through hole refers to the length of the passage of the passage including the through hole. .

防塵薄膜組件框100的材質並無特別限制,可設為防塵薄膜組件框所使用的通常的材質。 作為防塵薄膜組件框100的材質,具體而言,可列舉:鋁、鋁合金(5000系、6000系、7000系等)、不鏽鋼、矽、矽合金、鐵、鐵系合金、碳鋼、工具鋼、陶瓷、金屬-陶瓷複合材料、樹脂等。其中,就輕量且剛性的方面而言,更佳為鋁、鋁合金。The material of the pellicle frame 100 is not particularly limited, and can be used as a normal material used for the pellicle frame. Specific examples of the material of the pellicle frame 100 include aluminum, aluminum alloy (5000 series, 6000 series, 7000 series, etc.), stainless steel, niobium, tantalum alloy, iron, iron alloy, carbon steel, and tool steel. , ceramics, metal-ceramic composites, resins, etc. Among them, aluminum and aluminum alloys are more preferable in terms of light weight and rigidity.

另外,防塵薄膜組件框100亦可於其表面具有保護膜。 作為保護膜,較佳為對存在於曝光環境中的氫自由基及EUV光具有耐受性的保護膜。 作為保護膜,例如可列舉氧化覆膜。 氧化覆膜可藉由陽極氧化等公知的方法形成。 另外,氧化覆膜可藉由黑色系染料進行著色。於防塵薄膜組件框100具有經黑色系染料著色的氧化覆膜的情形時,更容易檢測出防塵薄膜組件框100上的異物。 除此以外,關於防塵薄膜組件框100的其他構成,例如可適當參照日本專利特開2014-021217號公報、日本專利特開2010-146027號公報等公知的防塵薄膜組件框的構成。In addition, the pellicle frame 100 may have a protective film on its surface. As the protective film, a protective film which is resistant to hydrogen radicals and EUV light existing in an exposure environment is preferable. As a protective film, an oxide film is mentioned, for example. The oxide film can be formed by a known method such as anodization. Further, the oxide film can be colored by a black dye. When the pellicle frame 100 has an oxide film colored with a black dye, it is easier to detect foreign matter on the pellicle frame 100. In addition, as for the other configuration of the pellicle frame 100, for example, a configuration of a known pellicle frame such as JP-A-2014-021217 and JP-A-2010-146027 can be referred to.

繼而,對防塵薄膜組件框的變形例進行說明。 於圖1~圖3示出的防塵薄膜組件框100中,於每一端面設置有一個溝槽,但於本實施方式中,亦可於每一端面設置有兩個以上溝槽。於在每一端面設置有兩個以上溝槽的情形時,較佳為於兩個以上的溝槽分別連接所述通孔(例如,參照圖4)。 另外,於防塵薄膜組件框為矩形形狀的情形時,就使防塵薄膜組件框與其他構件之間的壓合力更有效地發揮作用的觀點而言,較佳為於防塵薄膜組件框的四條邊存在溝槽。 此處,「於防塵薄膜組件框的四條邊存在溝槽」的態樣例如包括: 跨防塵薄膜組件框的四條邊而設置有一個溝槽的態樣(例如,參照圖1及圖2)、 於防塵薄膜組件框的四條邊的每一條邊設置有一個以上的溝槽的態樣(例如,參照圖4)、 跨防塵薄膜組件框的兩條邊而設置有一個溝槽且跨防塵薄膜組件框的剩餘兩條邊而設置有一個溝槽的態樣等。Next, a modification of the pellicle frame will be described. In the pellicle frame 100 shown in FIGS. 1 to 3, one groove is provided on each end surface. However, in the present embodiment, two or more grooves may be provided on each end surface. In the case where two or more grooves are provided on each end surface, it is preferable to connect the through holes to two or more grooves (for example, refer to FIG. 4). Further, in the case where the pellicle frame is rectangular, it is preferable to have four sides of the pellicle frame from the viewpoint of more effectively exerting a pressing force between the pellicle frame and other members. Groove. Here, the aspect of "there is a groove on the four sides of the pellicle frame" includes, for example, a pattern in which a groove is provided across the four sides of the pellicle frame (for example, referring to FIGS. 1 and 2), Each of the four sides of the pellicle frame is provided with one or more grooves (for example, refer to FIG. 4), and a groove is provided across the two sides of the pellicle frame and across the pellicle frame. The remaining two sides are provided with a groove pattern and the like.

圖4為自可觀察到厚度方向的一端面的方向觀察本實施方式的變形例的防塵薄膜組件框101的概略立體圖。 如圖4所示,於防塵薄膜組件框101的一端面10設置有四個溝槽,即溝槽12A、溝槽12B、溝槽12C、及溝槽12D。於防塵薄膜組件框101分別設置有貫通溝槽12A、溝槽12B、溝槽12C、及溝槽12D各自的底面與外周面30之間的通孔16A、通孔16B、通孔16C、及通孔16D。 於該防塵薄膜組件框101中,每個溝槽為以防塵薄膜組件框101的角(corner)部分為中心而跨兩條邊、且於兩條邊的中途具有端部的形狀。其中,本實施方式的溝槽的形狀可為任意形狀。 另外,於該防塵薄膜組件框101中,於每個溝槽的一端部連接有通孔。其中,於本實施方式中,連接於溝槽的通孔的位置可為任意部分。總而言之,通孔只要貫通溝槽的壁面與防塵薄膜組件框的外周面之間即可。4 is a schematic perspective view of the pellicle frame 101 according to a modification of the embodiment, in a direction in which one end surface in the thickness direction can be observed. As shown in FIG. 4, one end surface 10 of the pellicle frame 101 is provided with four grooves, that is, a groove 12A, a groove 12B, a groove 12C, and a groove 12D. The pellicle frame 101 is provided with a through hole 16A, a through hole 16B, a through hole 16C, and a through hole between the bottom surface of each of the through groove 12A, the groove 12B, the groove 12C, and the groove 12D and the outer peripheral surface 30, respectively. Hole 16D. In the pellicle frame 101, each of the grooves has a shape that spans two sides around the corner portion of the pellicle frame 101 and has an end portion in the middle of the two sides. However, the shape of the groove of the present embodiment may be any shape. Further, in the pellicle frame 101, a through hole is connected to one end portion of each of the grooves. However, in the present embodiment, the position of the through hole connected to the groove may be any portion. In short, the through hole may pass between the wall surface of the groove and the outer peripheral surface of the pellicle frame.

另外,於圖4中雖省略圖示,但與防塵薄膜組件框100的另一端面20同樣地於防塵薄膜組件框101的另一端面設置有溝槽,進而設置有貫通另一端面側的溝槽的壁面與外周面的通孔。其中,可將防塵薄膜組件框101的另一端面側的溝槽的形狀設為與防塵薄膜組件框101的一端面側的溝槽的形狀相同的形狀。 於防塵薄膜組件框101中,所述以外的構成與防塵薄膜組件框100的構成相同,較佳的範圍亦相同。In addition, although not shown in FIG. 4, similarly to the other end surface 20 of the pellicle frame 100, a groove is provided on the other end surface of the pellicle frame 101, and a groove penetrating the other end side is provided. a through hole in the wall surface of the groove and the outer peripheral surface. In addition, the shape of the groove on the other end surface side of the pellicle frame 101 can be the same shape as the shape of the groove on the one end surface side of the pellicle frame 101. In the pellicle frame 101, the other configuration is the same as that of the pellicle frame 100, and the preferred range is also the same.

(防塵薄膜組件框構件的具體例) 圖5為表示於本實施方式的防塵薄膜組件製造裝置中,作為貼合對象物之一的防塵薄膜組件框構件的一例的概略截面圖。 如圖5所示,作為防塵薄膜組件框構件的一例的防塵薄膜組件框構件110具備所述防塵薄膜組件框100、與所述防塵薄膜組件框100的一端面10相接的接著劑層102、與所述防塵薄膜組件框100的另一端面20相接的接著劑層104、以及與接著劑層104相接的剝離襯墊106。(Specific Example of the Pellicle Frame Member) FIG. 5 is a schematic cross-sectional view showing an example of the pellicle frame member as one of the bonding targets in the pellicle manufacturing apparatus of the present embodiment. As shown in FIG. 5, the pellicle frame member 110 as an example of the pellicle frame member includes the pellicle frame 100, an adhesive layer 102 that is in contact with the one end surface 10 of the pellicle frame 100, An adhesive layer 104 that is in contact with the other end surface 20 of the pellicle frame 100 and a release liner 106 that is in contact with the adhesive layer 104.

於防塵薄膜組件框構件110中,接著劑層102被設置於防塵薄膜組件框100的一端面10中的除溝槽12以外的部分。藉此,效率良好地進行通過通孔14A及通孔14B的溝槽12的排氣。In the pellicle frame member 110, the adhesive layer 102 is provided in a portion other than the groove 12 in one end surface 10 of the pellicle frame 100. Thereby, the exhaust of the grooves 12 passing through the through holes 14A and the through holes 14B is efficiently performed.

接著劑層102為用以將防塵薄膜構件與防塵薄膜組件框100接著的層,且含有接著劑。 於本實施方式中,「接著劑」是指廣義的接著劑,「接著劑」的概念中亦包含黏著劑。 作為接著劑層102所含的接著劑,可列舉丙烯酸樹脂接著劑、環氧樹脂接著劑、聚醯亞胺樹脂接著劑、矽酮樹脂接著劑、無機系接著劑、雙面黏著帶、矽酮樹脂黏著劑、丙烯酸系黏著劑、聚烯烴系黏著劑等。 其中,較佳為丙烯酸樹脂接著劑、環氧樹脂接著劑、聚醯亞胺樹脂接著劑、矽酮樹脂接著劑、無機系接著劑。 接著劑層102的厚度並無特別限制,較佳為1 μm~500 μm,更佳為10 μm~400 μm,尤佳為20 μm~300 μm。The adhesive layer 102 is a layer for adhering the pellicle member to the pellicle frame 100 and contains an adhesive. In the present embodiment, the "adhesive" means a generalized adhesive, and the concept of "adhesive" also includes an adhesive. Examples of the adhesive agent contained in the adhesive layer 102 include an acrylic resin adhesive, an epoxy resin adhesive, a polyimide resin adhesive, an anthrone resin adhesive, an inorganic adhesive, a double-sided adhesive tape, and an anthrone. A resin adhesive, an acrylic adhesive, a polyolefin adhesive, or the like. Among them, an acrylic resin adhesive, an epoxy resin adhesive, a polyimide resin adhesive, an anthrone resin adhesive, and an inorganic adhesive are preferable. The thickness of the subsequent agent layer 102 is not particularly limited, but is preferably 1 μm to 500 μm, more preferably 10 μm to 400 μm, still more preferably 20 μm to 300 μm.

可於搬入至本實施方式的防塵薄膜組件製造裝置之前形成接著劑層102,亦可於本實施方式的防塵薄膜組件製造裝置內(例如,接著劑層形成單元)形成接著劑層102。The adhesive layer 102 can be formed before being carried into the pellicle manufacturing apparatus of the present embodiment, and the adhesive layer 102 can be formed in the pellicle manufacturing apparatus (for example, the adhesive layer forming unit) of the present embodiment.

接著劑層104為於藉由本實施方式的防塵薄膜組件製造裝置的防塵薄膜組件的製造(即,防塵薄膜組件框構件110與防塵薄膜構件的貼合)後,用以使防塵薄膜組件框100與原版(遮罩)接著的層,且含有接著劑。 作為接著劑層104所含的接著劑可列舉與接著劑層102所含的接著劑相同的接著劑,其中,較佳為雙面黏著帶、矽酮樹脂黏著劑、丙烯酸系黏著劑、聚烯烴系黏著劑。 接著劑層104的厚度並無特別限制,較佳為1 μm~500 μm,更佳為10 μm~400 μm,尤佳為20 μm~300 μm。The adhesive layer 104 is used to manufacture the pellicle assembly of the pellicle assembly manufacturing apparatus of the present embodiment (that is, the bonding of the pellicle frame member 110 and the pellicle member) to the pellicle frame 100 and The original (mask) is the next layer and contains an adhesive. The adhesive agent contained in the adhesive layer 104 may be the same adhesive as the adhesive contained in the adhesive layer 102, and preferably a double-sided adhesive tape, an anthrone resin adhesive, an acrylic adhesive, or a polyolefin. Adhesive. The thickness of the subsequent agent layer 104 is not particularly limited, but is preferably 1 μm to 500 μm, more preferably 10 μm to 400 μm, still more preferably 20 μm to 300 μm.

剝離襯墊106為於藉由本實施方式的防塵薄膜組件製造裝置的防塵薄膜組件的製造之前、所述防塵薄膜組件的製造中途、及所述防塵薄膜組件的製造後且防塵薄膜組件與原版的貼合前,用以防止因接著劑層104而引起的發黏或異物對接著劑層104的附著的構件。另外,剝離襯墊106亦具有如下意義:為於防塵薄膜組件框構件110的各構件中,即便藉由裝置、夾具、手等接觸而影響亦小的構件。The release liner 106 is used in the manufacture of the pellicle assembly of the pellicle assembly manufacturing apparatus of the present embodiment, in the middle of the manufacture of the pellicle assembly, and after the manufacture of the pellicle assembly, and the pellicle assembly and the original sticker. In the past, a member for preventing adhesion of foreign matter or foreign matter to the adhesive layer 104 due to the adhesive layer 104. Further, the release liner 106 also has a meaning that the members of the pellicle frame member 110 are less affected by contact with a device, a jig, a hand or the like.

剝離襯墊為亦被稱為剝離膜或隔片的構件。 作為剝離襯墊,可無特別限制地使用具有矽酮化合物等剝離層的聚對苯二甲酸乙二酯(Polyethylene Terephthalate,PET)膜等公知者。 於防塵薄膜組件框構件110中,剝離襯墊106的自厚度方向觀察的形狀為跨防塵薄膜組件框100及開口部50(由防塵薄膜組件框100所圍成的開口部)的形狀,即不具有開口部的平板形狀。其中,剝離襯墊106的形狀可為任意的形狀。剝離襯墊亦可為僅與接著劑層104的表面相接的框形狀的構件(具有開口部的構件)。另外,剝離襯墊亦可為大於防塵薄膜組件框100的構件,例如亦可為於自防塵薄膜組件框100的厚度方向觀察時,具有超出防塵薄膜組件框100的外側的大小的構件。The release liner is a member also referred to as a release film or separator. As the release liner, a polyethylene terephthalate (PET) film having a release layer such as an anthrone compound can be used without any particular limitation. In the pellicle frame member 110, the shape of the release liner 106 viewed from the thickness direction is a shape that spans the pellicle frame 100 and the opening 50 (the opening surrounded by the pellicle frame 100), that is, A flat plate shape having an opening. Among them, the shape of the release liner 106 may be any shape. The release liner may be a frame-shaped member (a member having an opening) that is in contact only with the surface of the adhesive layer 104. Further, the release liner may be a member larger than the pellicle frame 100, and may have a member that exceeds the outer side of the pellicle frame 100 when viewed from the thickness direction of the pellicle frame 100.

剝離襯墊106的厚度並無特別限制,較佳為5 μm~500 μm,更佳為10 μm~400 μm,尤佳為20 μm~300 μm。The thickness of the release liner 106 is not particularly limited, but is preferably 5 μm to 500 μm, more preferably 10 μm to 400 μm, and still more preferably 20 μm to 300 μm.

於防塵薄膜組件框構件110的構成構件(較佳為防塵薄膜組件框100)亦可形成用以提升與防塵薄膜構件的對準(位置對準)精度的對準標記。The constituent members of the pellicle frame member 110 (preferably the pellicle frame 100) may also be formed with alignment marks for improving the alignment (position alignment) accuracy of the pellicle member.

(防塵薄膜構件的具體例) 圖6為表示於本實施方式的防塵薄膜組件製造裝置中,作為貼合對象物之一的防塵薄膜構件的一例的概略平面圖。 圖7為圖6的B-B線截面圖。其中,圖7中,相對於圖6,以外側部分124的尺寸相對於防塵薄膜構件的整體尺寸的比率變小的方式進行圖示(於圖9、圖12、圖13中亦同樣地進行圖示)。(Specific Example of PSA Member) FIG. 6 is a schematic plan view showing an example of a pellicle member which is one of the bonding objects in the pellicle manufacturing apparatus of the present embodiment. Fig. 7 is a sectional view taken along line B-B of Fig. 6; In FIG. 7, the ratio of the size of the outer portion 124 to the overall size of the pellicle member is reduced as shown in FIG. 6 (the same applies to FIGS. 9, 12, and 13). Show).

如圖6及圖7所示,本一例的防塵薄膜構件120具備防塵薄膜130、以及對防塵薄膜130進行支持的支持基板126。 圖6為自可觀察到支持基板126的方向觀察防塵薄膜構件120的概略平面圖。As shown in FIGS. 6 and 7, the pellicle member 120 of the present example includes a pellicle film 130 and a support substrate 126 that supports the pellicle film 130. FIG. 6 is a schematic plan view of the pellicle member 120 viewed from a direction in which the support substrate 126 can be observed.

支持基板126為以矽晶圓為代表的圓形形狀的基板,且於其中央部具有矩形形狀的開口部127。 支持基板126於開口部127以外的部分對防塵薄膜130進行支持。換言之,於圖6中,於支持基板126的開口部127露出防塵薄膜130。 於防塵薄膜構件120中,支持基板126的開口部127的形狀及尺寸分別與所述由防塵薄膜組件框100所圍成的開口部50的形狀及尺寸大致相同。藉此,於將防塵薄膜構件120與所述防塵薄膜組件框構件110貼合來製造防塵薄膜組件時,可以開口部127與開口部50重疊的方式進行貼合(例如,參照後述的圖8及圖9)。於將所製造的防塵薄膜組件貼合於原版而裝設於曝光裝置的情形時,曝光光會透過開口部127與開口部50重疊的區域。 其中,開口部127的尺寸及開口部50的尺寸無須設為完全相同,例如可使開口部127的尺寸小於開口部50的尺寸,亦可使開口部127的尺寸大於開口部50的尺寸。其中,較佳為將開口部的一條邊的長度差異抑制為2 mm以內(較佳為1 mm以內)。The support substrate 126 is a circular-shaped substrate typified by a germanium wafer, and has a rectangular opening 127 at a central portion thereof. The support substrate 126 supports the pellicle film 130 at a portion other than the opening portion 127. In other words, in FIG. 6, the pellicle film 130 is exposed at the opening portion 127 of the support substrate 126. In the pellicle member 120, the shape and size of the opening portion 127 of the support substrate 126 are substantially the same as the shape and size of the opening portion 50 surrounded by the pellicle frame 100. When the pellicle member 120 is bonded to the pellicle frame member 110 to produce the pellicle, the opening 127 can be bonded to the opening 50 (for example, refer to FIG. 8 and FIG. Figure 9). When the produced pellicle is attached to the original plate and attached to the exposure apparatus, the exposure light passes through the area where the opening 127 overlaps the opening 50. However, the size of the opening portion 127 and the size of the opening portion 50 need not be completely the same. For example, the size of the opening portion 127 may be smaller than the size of the opening portion 50, or the size of the opening portion 127 may be larger than the size of the opening portion 50. Among them, it is preferable to suppress the difference in length of one side of the opening portion to within 2 mm (preferably within 1 mm).

另外,於將防塵薄膜構件120與防塵薄膜組件框構件110貼合前或貼合後,於支持基板126設置有用以與防塵薄膜組件框構件110的外周形狀相對應地進行切割(切斷)的切入部128。 於支持基板126中,比切入部128更靠內側的區域即內側部分122為殘留於最終的防塵薄膜組件的部分。內側部分122若作為單獨的構件來看,則為與防塵薄膜組件框相同的框形狀的構件。於支持基板126中,比切入部128更靠外側的區域即外側部分124為不會殘留於最終的防塵薄膜組件的部分(即,不需要的部分)。 內側部分122的外周的形狀及尺寸分別與防塵薄膜組件框100的外周的形狀及尺寸大致相同。 兩者的尺寸無須完全相同,較佳為將外周的一條邊的長度差異抑制為2 mm以內(較佳為1 mm以內)。In addition, before or after bonding the pellicle member 120 to the pellicle frame member 110, the support substrate 126 is provided to be cut (cut) in accordance with the outer peripheral shape of the pellicle frame member 110. The cutting portion 128 is cut. In the support substrate 126, the inner portion 122 which is the inner side of the cut portion 128 is a portion remaining in the final pellicle. When viewed as a separate member, the inner portion 122 is a member having the same frame shape as the pellicle frame. In the support substrate 126, the outer portion 124 which is the outer side than the cut portion 128 is a portion (i.e., an unnecessary portion) that does not remain in the final pellicle. The shape and size of the outer circumference of the inner portion 122 are substantially the same as the shape and size of the outer circumference of the pellicle frame 100. The sizes of the two are not necessarily the same, and it is preferable to suppress the difference in length of one side of the outer circumference to be within 2 mm (preferably within 1 mm).

作為所述支持基板126的材質,可列舉:鋁、鋁合金(5000系、6000系、7000系等)、不鏽鋼、矽、矽合金、鐵、鐵系合金、碳鋼、工具鋼、陶瓷、金屬-陶瓷複合材料、樹脂等。其中,較佳為矽、矽合金。Examples of the material of the support substrate 126 include aluminum, aluminum alloy (5000 series, 6000 series, and 7000 series), stainless steel, niobium, tantalum alloy, iron, iron alloy, carbon steel, tool steel, ceramic, and metal. - Ceramic composite materials, resins, and the like. Among them, ruthenium and osmium alloys are preferred.

另外,所述支持基板126的形狀未必限定為圓形形狀,亦可為矩形形狀、橢圓形狀等其他形狀。 另外,於支持基板126亦可設置有凹口(notch)、定向平面(orientation flat)等的缺口。Further, the shape of the support substrate 126 is not necessarily limited to a circular shape, and may be other shapes such as a rectangular shape or an elliptical shape. Further, the support substrate 126 may be provided with a notch such as a notch or an orientation flat.

支持基板126的厚度例如可設為0.03 mm~5.0 mm,較佳為0.05 mm~3.0 mm,更佳為0.15 mm~2.0 mm,尤佳為0.3 mm~1.0 mm。The thickness of the support substrate 126 can be, for example, 0.03 mm to 5.0 mm, preferably 0.05 mm to 3.0 mm, more preferably 0.15 mm to 2.0 mm, and particularly preferably 0.3 mm to 1.0 mm.

所述防塵薄膜130的材質並無特別限制,可為有機系材料、無機系材料、有機系材料與無機系材料的混合材料。 作為有機系材料,可列舉氟系聚合物等。 作為無機系材料,可列舉結晶矽(例如,單晶矽、多晶矽等)、類鑽碳(diamond like carbon,DLC)、石墨、非晶碳(amorphous carbon)、石墨烯、碳化矽、氮化矽、氮化鋁等。 防塵薄膜130可單獨含有一種所述材料,亦可含有兩種以上。The material of the pellicle film 130 is not particularly limited, and may be an organic material, an inorganic material, or a mixture of an organic material and an inorganic material. As an organic material, a fluorine-based polymer etc. are mentioned. Examples of the inorganic material include crystalline germanium (for example, single crystal germanium, polycrystalline germanium, etc.), diamond like carbon (DLC), graphite, amorphous carbon, graphene, tantalum carbide, and tantalum nitride. , aluminum nitride, etc. The pellicle film 130 may contain one type of the above material alone or two or more types.

另外,防塵薄膜130的構成可為單層構成,亦可為包含兩層以上的構成。 防塵薄膜的厚度(於包含兩層以上的情形時為總厚度)例如可設為10 nm~200 nm,較佳為10 nm~100 nm,更佳為10 nm~70 nm,尤佳為10 nm~50 nm。Further, the pellicle film 130 may have a single layer structure or a structure including two or more layers. The thickness of the pellicle film (the total thickness in the case of including two or more layers) can be, for example, 10 nm to 200 nm, preferably 10 nm to 100 nm, more preferably 10 nm to 70 nm, and particularly preferably 10 nm. ~50 nm.

如上所述,於防塵薄膜構件120中,防塵薄膜130藉由支持基板126而受到支持。 所述態樣的防塵薄膜構件具有如下優點:即便於防塵薄膜為難以自立的膜(例如,矽結晶膜等含有無機系材料的防塵薄膜、厚度薄的防塵薄膜等)的情形時,亦可一面藉由支持基板保持防塵薄膜的膜形狀一面製造防塵薄膜組件。As described above, in the pellicle member 120, the pellicle film 130 is supported by the support substrate 126. The pellicle film of the above-described aspect has the advantage that even when the pellicle film is a film that is difficult to stand on its own (for example, a pellicle film containing an inorganic material such as a ruthenium crystal film or a pellicle film having a small thickness), The pellicle is manufactured by supporting the substrate to maintain the film shape of the pellicle film.

防塵薄膜構件120例如可藉由如下方式來製作:首先,於作為支持基板126的原材料(設置開口部127之前的支持基板)的矽晶圓(例如8吋的矽晶圓)上形成作為防塵薄膜130的矽結晶膜,繼而,自該矽晶圓的矽結晶膜非形成面側對矽晶圓的中央部進行蝕刻,去除該中央部的矽晶圓從而形成開口部127。 作為防塵薄膜130,除矽結晶膜以外,亦可使用氮化矽膜/矽結晶膜/氮化矽膜的構成的積層膜等其他膜。另外,作為支持基板126,亦可使用矽晶圓以外的其他基板。 即便於使用其他材料(膜、基板)的情形時,亦可藉由與所述相同的方法來製作防塵薄膜構件。The pellicle member 120 can be produced, for example, by first forming a pellicle film on a crucible wafer (for example, a crucible wafer of 8 turns) which is a material of the support substrate 126 (a support substrate before the opening portion 127 is provided). The ruthenium crystal film of 130 is then etched from the central portion of the ruthenium wafer from the non-formed surface side of the ruthenium crystal film of the ruthenium wafer, and the ruthenium wafer at the center portion is removed to form the opening portion 127. As the pellicle film 130, in addition to the ruthenium crystal film, another film such as a laminate film of a ruthenium nitride film, a ruthenium crystal film, or a tantalum nitride film may be used. Further, as the support substrate 126, another substrate other than the germanium wafer may be used. In other words, when it is convenient to use other materials (film or substrate), the pellicle member can be produced by the same method as described above.

於防塵薄膜構件120的構成構件(較佳為支持基板126)亦可形成用以提升與防塵薄膜組件框構件的對準(位置對準)精度的對準標記。The constituent members of the pellicle member 120 (preferably the support substrate 126) may also form alignment marks for improving the alignment (position alignment) accuracy with the pellicle frame member.

(防塵薄膜組件的具體例) 圖8為表示藉由本實施方式的防塵薄膜組件製造裝置而製造的防塵薄膜組件的一例的概略截面圖。 如圖8所示,防塵薄膜組件200為將所述防塵薄膜組件框構件110與包含防塵薄膜130及支持基板的內側部分122的防塵薄膜構件140貼合而成者。詳細而言,於防塵薄膜組件200中,藉由防塵薄膜構件140的內側部分122與防塵薄膜組件框構件110的接著劑層102相接的配置,來將防塵薄膜組件框構件110與防塵薄膜構件140貼合。 此處,防塵薄膜構件140為藉由於切入部128的位置切割所述防塵薄膜構件120而自所述防塵薄膜構件120去除外側部分124及與外側部分124相接的防塵薄膜(以下,亦稱為「外側部分124等」)而獲得者。 防塵薄膜構件120的切割(外側部分124等的去除)可於防塵薄膜構件與防塵薄膜組件框構件的貼合前進行,亦可於貼合後進行。(Specific Example of PSA Module) FIG. 8 is a schematic cross-sectional view showing an example of a pellicle film assembly manufactured by the pellicle module manufacturing apparatus of the present embodiment. As shown in FIG. 8, the pellicle film assembly 200 is formed by bonding the pellicle frame member 110 to the pellicle member 140 including the pellicle film 130 and the inner portion 122 of the support substrate. In detail, in the pellicle film assembly 200, the pellicle frame member 110 and the pellicle member are disposed by the arrangement in which the inner portion 122 of the pellicle member 140 is in contact with the adhesive layer 102 of the pellicle frame member 110. 140 fits. Here, the pellicle film member 140 is a pellicle film that is removed from the pellicle film member 120 by the cutting of the pellicle film member 120 by the position of the cut-in portion 128 and is in contact with the outer portion 124 (hereinafter, also referred to as The "outer portion 124, etc.") is obtained. The cutting of the pellicle member 120 (removal of the outer portion 124 and the like) may be performed before the pellicle film member and the pellicle frame member are bonded together, or may be performed after bonding.

於防塵薄膜組件200中,各構件的厚度的較佳範圍如上所述。 各構件的厚度較佳為以防塵薄膜組件200的總厚度為5.0 mm以下(更佳為3.0 μm以下,進而佳為2.0 mm以下)的方式進行調整。In the pellicle film assembly 200, the preferred range of the thickness of each member is as described above. The thickness of each member is preferably adjusted so that the total thickness of the pellicle film assembly 200 is 5.0 mm or less (more preferably 3.0 μm or less, and further preferably 2.0 mm or less).

(貼合單元的具體例) 圖9~圖11為表示本實施方式的防塵薄膜組件製造裝置中的貼合單元的一例的概略構成圖。貼合單元為獨自亦作為防塵薄膜組件製造裝置而發揮功能的單元。 圖9為將視點置於在貼合單元的貼合腔室內進行包含防塵薄膜組件框的防塵薄膜組件框構件與包含防塵薄膜的防塵薄膜構件的貼合的形態的概略截面圖。圖9中省略貼合腔室內的詳細構成的圖示。 圖10及圖11為將視點置於貼合腔室內的詳細構成、及將防塵薄膜構件搬入至貼合腔室的形態的概略截面圖。圖10及圖11中省略關於防塵薄膜組件框構件及防塵薄膜構件的詳細構成的圖示。(Specific Example of Bonding Unit) FIG. 9 to FIG. 11 are schematic configuration diagrams showing an example of a bonding unit in the pellicle manufacturing apparatus of the present embodiment. The bonding unit is a unit that functions as a device for manufacturing a pellicle. FIG. 9 is a schematic cross-sectional view showing a state in which a view is placed in a bonding chamber of a bonding unit, and a pellicle frame member including a pellicle frame is bonded to a pellicle member including a pellicle. In Fig. 9, the detailed configuration of the inside of the bonding chamber is omitted. 10 and FIG. 11 are schematic cross-sectional views showing a detailed configuration in which a viewpoint is placed in a bonding chamber, and a configuration in which a pellicle member is carried into a bonding chamber. The detailed configuration of the pellicle frame member and the pellicle member is omitted in FIGS. 10 and 11 .

如圖9所示,於貼合單元300的貼合腔室310內配置有所述防塵薄膜構件120及所述防塵薄膜組件框構件110。兩者以防塵薄膜構件120的支持基板的內側部分122與防塵薄膜組件框構件110的接著劑層102相對向的方式被配置。於防塵薄膜組件框100的與防塵薄膜構件120相對向之側的端面(一端面10)設置有溝槽12。而且,接著劑層102被設置於防塵薄膜組件框100的一端面10上的除溝槽12以外的部分。 於貼合腔室310內,藉由排氣管(圖9中未圖示。圖10及圖11中為排氣管312A及排氣管312B),經由通孔14B而對溝槽12的內部進行排氣(減壓)(箭頭E2),並且經由通孔14A而對溝槽12的內部進行排氣(減壓)(箭頭E1)。藉由該些的排氣(減壓),可使吸合力F(即,壓合力)於防塵薄膜構件120與防塵薄膜組件框構件110之間發揮作用。藉由該力F的作用,可儘量不與防塵薄膜130接觸地將兩者貼合。 此時,較佳為藉由未圖示的導入管,將氣體導入貼合腔室310內而對貼合腔室310內進行加壓。藉此,可進一步增大配置有防塵薄膜組件框構件及防塵薄膜構件的貼合腔室310內整體的環境的壓力、與溝槽12的內部的壓力的差(差壓),因此可使所述力F更有效地發揮作用。As shown in FIG. 9, the pellicle member 120 and the pellicle frame member 110 are disposed in the bonding chamber 310 of the bonding unit 300. Both of them are disposed such that the inner portion 122 of the support substrate of the pellicle member 120 faces the adhesive layer 102 of the pellicle frame member 110. A groove 12 is provided in an end surface (one end surface 10) of the pellicle frame 100 opposite to the pellicle member 120. Further, the adhesive layer 102 is provided on a portion of the end surface 10 of the pellicle frame 100 other than the groove 12. In the bonding chamber 310, the inside of the trench 12 is passed through the through hole 14B by an exhaust pipe (not shown in FIG. 9; the exhaust pipe 312A and the exhaust pipe 312B in FIGS. 10 and 11). Exhaust (decompression) (arrow E2) is performed, and the inside of the groove 12 is exhausted (reduced pressure) via the through hole 14A (arrow E1). By the exhaust (decompression), the suction force F (that is, the pressing force) can be made to function between the pellicle member 120 and the pellicle frame member 110. By the action of the force F, the two can be bonded together without contacting the pellicle film 130 as much as possible. At this time, it is preferable to introduce the gas into the bonding chamber 310 by an introduction pipe (not shown) to pressurize the inside of the bonding chamber 310. Thereby, the difference between the pressure of the entire environment in the bonding chamber 310 in which the pellicle frame member and the pellicle member is disposed and the pressure inside the groove 12 (differential pressure) can be further increased, so that the Descriptive force F works more effectively.

所述力F(對防塵薄膜組件框整體施加的力)較佳為1 N以上,更佳為2 N以上。 所述力F(對防塵薄膜組件框整體施加的力)進而較佳為10 N以上,尤佳為20 N以上。 所述力F(對防塵薄膜組件框整體施加的力)的上限並無特別限制,就生產性等方面而言,例如為500 N,較佳為400 N。The force F (the force applied to the entire pellicle frame) is preferably 1 N or more, more preferably 2 N or more. The force F (the force applied to the entire pellicle frame) is more preferably 10 N or more, and particularly preferably 20 N or more. The upper limit of the force F (the force applied to the entire pellicle frame) is not particularly limited, and is, for example, 500 N, preferably 400 N, in terms of productivity and the like.

繼而,參照圖10及圖11對貼合單元300的構成進行說明。 圖10表示貼合單元300的將防塵薄膜組件框構件110搬入貼合腔室310內之後且將防塵薄膜構件120搬入貼合腔室310內之前的狀態。Next, the configuration of the bonding unit 300 will be described with reference to FIGS. 10 and 11 . FIG. 10 shows a state before the pellicle frame member 110 of the bonding unit 300 is carried into the bonding chamber 310 and the pellicle member 120 is carried into the bonding chamber 310.

如圖10及圖11所示,貼合單元300具備貼合腔室310、用以將氣體導入貼合腔室310內而對貼合腔室310內進行加壓的第1導入管322及第2導入管326、以及用以經由防塵薄膜組件框構件110的防塵薄膜組件框100的通孔而對所述溝槽的內部進行排氣的排氣管312A及排氣管312B。As shown in FIGS. 10 and 11 , the bonding unit 300 includes a bonding chamber 310 , a first introduction tube 322 for introducing a gas into the bonding chamber 310 , and pressurizing the inside of the bonding chamber 310 . The introduction pipe 326 and the exhaust pipe 312A and the exhaust pipe 312B for exhausting the inside of the groove through the through hole of the pellicle frame 100 of the pellicle frame member 110.

此處,第1導入管322於將防塵薄膜構件120及防塵薄膜組件框構件110配置於貼合腔室310內時,被配置於可自與防塵薄膜構件120相對向之側(於該例中,自貼合腔室310的上表面)導入氣體的位置。貼合單元300亦可具備多個第1導入管322。 另一方面,第2導入管326於將防塵薄膜構件120及防塵薄膜組件框構件110配置於貼合腔室310內時,被配置於可自防塵薄膜組件框構件110的下方且貼合腔室310的側面導入氣體的位置。第2導入管326並不限於該位置,可設置於能夠將氣體導入貼合腔室310內的所有位置。另外,貼合單元300亦可具備多個第2導入管326。Here, when the pellicle member 120 and the pellicle frame member 110 are disposed in the bonding chamber 310, the first introduction tube 322 is disposed on the side opposite to the pellicle member 120 (in this example) The position of the gas is introduced from the upper surface of the bonding chamber 310. The bonding unit 300 may include a plurality of first introduction tubes 322. On the other hand, when the pellicle member 120 and the pellicle frame member 110 are placed in the bonding chamber 310, the second introduction tube 326 is disposed under the pellicle frame member 110 and is attached to the chamber. The side of the 310 is introduced into the position of the gas. The second introduction pipe 326 is not limited to this position, and may be provided at all positions where gas can be introduced into the bonding chamber 310. Further, the bonding unit 300 may include a plurality of second introduction tubes 326.

第1導入管322及第2導入管326的另一端可分別(視需要經由其他配管等)連接於貯氣瓶等氣體供給部件。 另外,亦可於第1導入管322及第2導入管326的中途設置用以切換是否進行氣體導入的閥門(未圖示)。該閥門亦可為具備對氣體的流量等進行調整的機構的調整閥。 再者,經由第1導入管322及第2導入管326而供給的氣體並無特別限制,例如可使用乾燥空氣、惰性氣體等。The other ends of the first introduction pipe 322 and the second introduction pipe 326 may be connected to a gas supply member such as a gas cylinder, respectively (via other piping or the like as necessary). Further, a valve (not shown) for switching whether or not to introduce gas may be provided in the middle of the first introduction pipe 322 and the second introduction pipe 326. The valve may be a regulating valve having a mechanism for adjusting the flow rate of the gas or the like. In addition, the gas supplied through the first introduction pipe 322 and the second introduction pipe 326 is not particularly limited, and for example, dry air, an inert gas, or the like can be used.

排氣管312A及排氣管312B分別可經由與一端連接的連通構件而連接於防塵薄膜組件框構件110的防塵薄膜組件框的通孔。The exhaust pipe 312A and the exhaust pipe 312B are respectively connectable to the through holes of the pellicle frame of the pellicle frame member 110 via a communication member connected to one end.

圖12為概念性地表示圖10及圖11中的排氣管的其中一個即排氣管312B連接於防塵薄膜組件框的通孔的形態的部分截面圖。 如圖12所示,於排氣管312B的一端連接有使防塵薄膜組件框100的通孔14B與排氣管312B連通的連通構件314。藉由貼合單元300具備該連通構件314,於對通過通孔14B的溝槽12的內部進行排氣時,進一步提升排氣的效率。連通構件314無須相對於排氣管312B而為獨立的構件。即,排氣管312B與連通構件314亦可為經一體成形的一個構件。FIG. 12 is a partial cross-sectional view conceptually showing a form in which one of the exhaust pipes of FIGS. 10 and 11 , that is, the exhaust pipe 312B is connected to the through hole of the pellicle frame. As shown in FIG. 12, a communication member 314 that communicates the through hole 14B of the pellicle frame 100 with the exhaust pipe 312B is connected to one end of the exhaust pipe 312B. The bonding unit 300 is provided with the communication member 314 to further improve the efficiency of the exhaust gas when exhausting the inside of the trench 12 passing through the through hole 14B. The communication member 314 does not need to be an independent member with respect to the exhaust pipe 312B. That is, the exhaust pipe 312B and the communication member 314 may be one member that is integrally formed.

連通構件314的形狀為具有與防塵薄膜組件框100的外周面接觸的開口端、且該開口端的直徑大於通孔的直徑的形狀。藉由連通構件314的形狀為該形狀,可容易地進行連通構件314的開口端與通孔14B的位置對準。更具體而言,連通構件314的形狀為隨著遠離排氣管312B的一端而直徑增大的錐形形狀。The shape of the communication member 314 is a shape having an open end that is in contact with the outer peripheral surface of the pellicle frame 100, and the diameter of the open end is larger than the diameter of the through hole. By the shape of the communication member 314 being the shape, the positional alignment of the open end of the communication member 314 with the through hole 14B can be easily performed. More specifically, the shape of the communication member 314 is a tapered shape that increases in diameter as it goes away from one end of the exhaust pipe 312B.

另外,連通構件314被設置為可朝推入防塵薄膜組件框100的外周面的方向(箭頭J2的方向)移動。藉此,可更牢靠地連接連通構件314與防塵薄膜組件框100。進而,即便於因經由防塵薄膜組件框100的通孔14B對溝槽12的內部進行排氣而引起防塵薄膜組件框100朝排氣方向(箭頭E2的方向)產生應變變形的情形時,亦可藉由預先利用連通構件314推入防塵薄膜組件框100的外周面,來修正防塵薄膜組件框100的應變變形。 再者,當然,連通構件314亦可朝與箭頭J2相反的方向(返回方向)移動。Further, the communication member 314 is provided to be movable in a direction (direction of the arrow J2) that is pushed into the outer peripheral surface of the pellicle frame 100. Thereby, the communication member 314 and the pellicle frame 100 can be connected more securely. Further, even when the inside of the groove 12 is exhausted through the through hole 14B of the pellicle frame 100, the pellicle frame 100 is strain-deformed in the exhaust direction (the direction of the arrow E2). The strain deformation of the pellicle frame 100 is corrected by pushing the outer peripheral surface of the pellicle frame 100 by the communication member 314 in advance. Further, of course, the communication member 314 can also move in a direction (return direction) opposite to the arrow J2.

圖13為概念性地表示於本實施方式的變形例中,排氣管的其中一個連接於防塵薄膜組件框的通孔的形態的部分截面圖,且是與所述一例中的圖12的部分截面圖相對應的圖。 如圖13所示,變形例的防塵薄膜組件框103的通孔114B及通孔124B具有隨著朝向防塵薄膜組件框103的外周面而直徑增大的錐形形狀。變形例的連通構件316具有可插入至通孔114B的錐形形狀部分的錐形形狀。 根據該變形例,可藉由將連通構件316插入至通孔114B的錐形形狀部分(參照箭頭J12)來更牢靠地將排氣管312B與通孔114B連接。 於所述變形例中,關於除所述以外的方面,與所述一例相同,較佳態樣亦相同。 再者,即便於連通構件及通孔為錐形形狀以外的形狀的情形時,只要為可將連通構件插入至通孔的結構,亦發揮與所述變形例相同的效果。例如於連通構件為圓筒形狀的構件且通孔為圓柱形狀的空間的情形時,可藉由使連通構件的直徑小於通孔的直徑來將連通構件插入至通孔。FIG. 13 is a partial cross-sectional view conceptually showing a state in which one of the exhaust pipes is connected to the through hole of the pellicle frame in the modification of the embodiment, and is a portion of FIG. 12 in the example. The corresponding diagram of the section view. As shown in FIG. 13, the through hole 114B and the through hole 124B of the pellicle frame 103 of the modification have a tapered shape which increases in diameter toward the outer peripheral surface of the pellicle frame 103. The communication member 316 of the modification has a tapered shape that can be inserted into the tapered shape portion of the through hole 114B. According to this modification, the exhaust pipe 312B can be more firmly connected to the through hole 114B by inserting the communication member 316 into the tapered shape portion of the through hole 114B (refer to the arrow J12). In the above-described modification, the aspects other than the above are the same as the above-described example, and the preferred aspects are also the same. In addition, even when the communicating member and the through hole have a shape other than the tapered shape, the same effect as the above-described modification can be exerted as long as the connecting member can be inserted into the through hole. For example, in the case where the communication member is a cylindrical member and the through hole is a cylindrically shaped space, the communication member can be inserted into the through hole by making the diameter of the communication member smaller than the diameter of the through hole.

另外,於本實施方式中,亦可省略連通構件。總而言之,於本實施方式中,只要為可將排氣管與通孔連通的構成即可。Further, in the present embodiment, the communication member may be omitted. In other words, in the present embodiment, the exhaust pipe may be connected to the through hole.

繼而,返回到圖10及圖11,將排氣管312A及排氣管312B的另一端(未圖示)配置於貼合腔室310外,該些的另一端可分別(視需要經由其他配管等)連接於真空汞等排氣部件。 另外,亦可於排氣管312A及排氣管312B的中途設置用以切換是否進行溝槽12的排氣的閥門(未圖示)。該閥門亦可為具備對氣體的流量等進行調整的機構的調整閥。Then, returning to FIG. 10 and FIG. 11, the other end (not shown) of the exhaust pipe 312A and the exhaust pipe 312B is disposed outside the bonding chamber 310, and the other ends of the exhaust pipe 312A and the exhaust pipe 312B are separately (other pipes are required as needed) Etc.) Connected to exhaust components such as vacuum mercury. Further, a valve (not shown) for switching whether or not to exhaust the groove 12 may be provided in the middle of the exhaust pipe 312A and the exhaust pipe 312B. The valve may be a regulating valve having a mechanism for adjusting the flow rate of the gas or the like.

再者,於貼合單元300中,與連接於防塵薄膜組件框100的溝槽12的通孔的數量(兩個)相應地,設置有兩個排氣管,當然,本實施方式中的排氣管的數量不限定於兩個。排氣管的數量並無特別限制,較佳為使排氣管的端部的數量與所述通孔的數量一致。另外,作為排氣管,亦可使用分支的排氣管。總而言之,於本實施方式中,較佳為可於連接於溝槽的各通孔連接排氣管的各端部,所述溝槽設置於防塵薄膜組件框的與防塵薄膜構件相對向之側的端面。Further, in the bonding unit 300, two exhaust pipes are provided corresponding to the number (two) of the through holes connected to the grooves 12 of the pellicle frame 100, of course, the row in the present embodiment The number of trachea is not limited to two. The number of the exhaust pipes is not particularly limited, and it is preferable to make the number of the ends of the exhaust pipe coincide with the number of the through holes. Further, as the exhaust pipe, a branched exhaust pipe can also be used. In general, in the present embodiment, it is preferable that each end portion of the exhaust pipe is connected to each of the through holes connected to the groove, and the groove is provided on a side of the pellicle frame opposite to the pellicle member. End face.

如圖10及圖11所示,於貼合單元310內進而設置有用以載置防塵薄膜組件框構件110的載置板330。載置板330具備用以吸附防塵薄膜組件框構件110的吸附機構(例如多個吸附孔。以下相同)。 於貼合腔室310內,進而設置有可相對於載置板330而升降的升降銷332。該升降銷332具有如下功能:接收被搬入貼合腔室310內的防塵薄膜組件框構件110,其後,藉由下降而將防塵薄膜組件框構件110載置於載置板330上的功能;以及頂起載置於載置板330上的防塵薄膜組件框構件110而自載置板330離開的功能。 於貼合腔室310內,可各自獨立地設置防塵薄膜組件框構件110用的升降銷、防塵薄膜構件120用的升降銷,亦可設置兼具用於防塵薄膜組件框構件110的用途及用於防塵薄膜構件120的用途的升降銷。As shown in FIGS. 10 and 11, a mounting plate 330 for placing the pellicle frame member 110 is further provided in the bonding unit 310. The mounting plate 330 is provided with an adsorption mechanism (for example, a plurality of adsorption holes, the same applies hereinafter) for adsorbing the pellicle frame member 110. In the bonding chamber 310, a lift pin 332 that can be raised and lowered with respect to the mounting plate 330 is further provided. The lift pin 332 has a function of receiving the pellicle frame member 110 carried into the bonding chamber 310, and thereafter, the function of placing the pellicle frame member 110 on the mounting plate 330 by lowering; And a function of lifting the pellicle frame member 110 placed on the mounting plate 330 and moving away from the mounting plate 330. In the bonding chamber 310, the lift pins for the pellicle frame member 110 and the lift pins for the pellicle member 120 may be provided independently, and the use for the pellicle frame member 110 may be provided. A lift pin for the use of the pellicle member 120.

載置板330可被設置為可沿水平方向(更詳細而言,為相互正交的X方向及Y方向、以及作為旋轉方向的q方向)移動,藉此,可進行防塵薄膜組件框構件110與防塵薄膜構件120的對準(位置對準)調整。 即,被設置為可沿水平方向移動的情形時的載置板330作為對準部件發揮功能。The mounting plate 330 can be disposed to be movable in the horizontal direction (more specifically, the X direction and the Y direction orthogonal to each other, and the q direction as the rotation direction), whereby the pellicle frame member 110 can be performed. The alignment (position alignment) adjustment with the pellicle member 120. That is, the mounting plate 330 when it is set to be movable in the horizontal direction functions as an alignment member.

於貼合腔室310內進而設置有多個感測器340。 感測器340為用以讀取貼合腔室310內的防塵薄膜構件120的位置的構件。感測器340例如讀取有時設置於防塵薄膜構件120的支持基板126的切入部128的位置、對準標記的位置等。 感測器340被設置為可與讀取對象(切入部128、對準標記)的位置相應地移動。 利用感測器340的讀取可藉由圖像辨別來進行。 作為感測器340,可較佳地使用纖維感測器。A plurality of sensors 340 are further disposed in the bonding chamber 310. The sensor 340 is a member for reading the position of the pellicle member 120 in the fitting chamber 310. The sensor 340 reads, for example, the position of the cut portion 128 of the support substrate 126 which is sometimes provided on the pellicle member 120, the position of the alignment mark, and the like. The sensor 340 is disposed to be movable in accordance with the position of the reading object (the cut-in portion 128, the alignment mark). The reading by the sensor 340 can be performed by image discrimination. As the sensor 340, a fiber sensor can be preferably used.

再者,關於貼合單元中的對準機構(載置板的移動、利用中心的位置的讀取等),亦可應用曝光裝置(例如步進機)、晶片安裝裝置等公知裝置的公知的對準機構。Further, as for the alignment mechanism (movement of the mounting plate, reading of the position by the center, etc.) in the bonding unit, a well-known device such as an exposure device (for example, a stepping machine) or a wafer mounting device can be applied. Align the mechanism.

於貼合腔室310內進而設置有用以使自第1導入管322導入的氣體分散的氣體分散構件324。氣體分散構件324為覆蓋第1導入管322的端部(氣體的導入口)與貼合腔室310上部的內壁面的一部分的罩形狀的構件。而且,於氣體分散構件324的與防塵薄膜構件120相對向面側設置有多個孔(未圖示)。自第1導入管322導入的氣體首先到達由貼合腔室310上部的內壁面與氣體分散構件324形成的空間內,繼而藉由所述多個孔而被分散。 藉此,來自第1導入管322的氣體的流動對防塵薄膜的影響得以減少。就進一步減少氣體的流動對防塵薄膜的影響的觀點而言,較佳為所述多個孔以氣體不與防塵薄膜130的中央部分碰觸的配置而設置。Further, a gas dispersion member 324 for dispersing a gas introduced from the first introduction pipe 322 is further provided in the bonding chamber 310. The gas dispersion member 324 is a cover-shaped member that covers an end portion (introduction port of gas) of the first introduction pipe 322 and a part of an inner wall surface of the upper portion of the bonding chamber 310. Further, a plurality of holes (not shown) are provided on the surface of the gas dispersion member 324 facing the pellicle member 120. The gas introduced from the first introduction pipe 322 first reaches the space formed by the inner wall surface of the upper portion of the bonding chamber 310 and the gas dispersion member 324, and is then dispersed by the plurality of holes. Thereby, the influence of the flow of the gas from the first introduction pipe 322 on the pellicle film is reduced. In view of further reducing the influence of the flow of the gas on the pellicle film, it is preferable that the plurality of holes are provided in a configuration in which the gas does not contact the central portion of the pellicle film 130.

另外,於貼合腔室310設置有構件進出口350。 經由構件進出口350來對貼合腔室310搬入及搬出各構件。具體而言,經由構件進出口350,將貼合前的防塵薄膜構件120及貼合前的防塵薄膜組件框構件110分別搬入貼合腔室310內。另外,經由構件進出口350,將貼合後的防塵薄膜構件120及防塵薄膜組件框構件110搬出至貼合腔室310外。 另外,於貼合單元300設置有用以進行構件進出口350的開放(參照圖11)及閉合(參照圖10)的擋門352。Further, a member inlet and outlet 350 is provided in the bonding chamber 310. The members are carried into and out of the bonding chamber 310 via the member inlet and outlet 350. Specifically, the pellicle member 120 before bonding and the pellicle frame member 110 before bonding are carried into the bonding chamber 310 via the member inlet and outlet 350. Further, the bonded pellicle member 120 and the pellicle frame member 110 are carried out of the bonding chamber 310 via the member inlet and outlet 350. Further, a shutter 352 for opening (see FIG. 11) and closing (see FIG. 10) of the member inlet/outlet 350 is provided in the bonding unit 300.

如圖10及圖11所示,將藉由作為保持構件的手構件410而保持的防塵薄膜構件120搬入貼合腔室310內。 再者,雖省略了圖式,但防塵薄膜組件框構件110亦與防塵薄膜構件120同樣地藉由手構件(例如,後述的圖15中示出的手構件412)保持而被搬入貼合腔室310內。 保持防塵薄膜組件框構件110的保持構件與保持防塵薄膜構件120的保持構件可為相同的構件亦可為不同的構件。As shown in FIGS. 10 and 11, the pellicle member 120 held by the hand member 410 as a holding member is carried into the bonding chamber 310. In addition, the dust-proof film module frame member 110 is held by the hand member (for example, the hand member 412 shown in FIG. 15 described later) in the same manner as the pellicle film member 120, and is carried into the bonding cavity. Inside the chamber 310. The holding member that holds the pellicle frame member 110 and the holding member that holds the pellicle member 120 may be the same member or different members.

圖14為表示本一例中的手構件410保持防塵薄膜構件120的形態的概略平面圖。 如圖14所示,手構件410於自構件的厚度方向觀察的俯視時,以僅與防塵薄膜構件120中的支持基板的外側部分124(即,不需要區域)接觸的方式進行保持。藉由使用所述手構件410,於將防塵薄膜構件120搬入貼合腔室310時,可不與防塵薄膜130接觸地進行搬入。 再者,手構件亦可與防塵薄膜構件120中的支持基板的內側部分122接觸。例如,作為保持防塵薄膜構件120的手構件,可不使用本一例中的手構件410,而使用後述的手構件412(保持防塵薄膜組件框構件110的手構件)。即,可藉由同一手構件412來保持防塵薄膜構件120與防塵薄膜組件框構件110。FIG. 14 is a schematic plan view showing a state in which the hand member 410 holds the pellicle member 120 in the present example. As shown in FIG. 14, the hand member 410 is held in contact with only the outer portion 124 (i.e., the unnecessary region) of the support substrate in the pellicle member 120 when viewed from the thickness direction of the member. By using the hand member 410, when the pellicle member 120 is carried into the bonding chamber 310, it can be carried in without coming into contact with the pellicle film 130. Further, the hand member may also be in contact with the inner portion 122 of the support substrate in the pellicle member 120. For example, as the hand member that holds the pellicle member 120, the hand member 412 (the hand member that holds the pellicle frame member 110) to be described later can be used without using the hand member 410 in the present example. That is, the pellicle member 120 and the pellicle frame member 110 can be held by the same hand member 412.

圖15為表示本一例中的防塵薄膜組件框構件110、與保持防塵薄膜組件框構件110的手構件412的概略平面圖。 如圖15所示,手構件412於自構件的厚度方向觀察的俯視時,保持與防塵薄膜組件框100的一部分重疊的區域。該手構件412僅與防塵薄膜組件框構件110的剝離襯墊106接觸。Fig. 15 is a schematic plan view showing the pellicle frame member 110 of the present example and the hand member 412 holding the pellicle frame member 110. As shown in FIG. 15, the hand member 412 holds a region overlapping a part of the pellicle frame 100 in a plan view as viewed in the thickness direction of the member. The hand member 412 is only in contact with the release liner 106 of the pellicle frame member 110.

所述手構件410及手構件412可被包含於分別獨立的搬運部件(例如搬運機器人),但就防塵薄膜製造裝置的設置面積小的觀點而言,較佳為被包含於同一搬運部件。The hand member 410 and the hand member 412 may be included in separate transport members (for example, transport robots). However, from the viewpoint of a small installation area of the dust-proof film manufacturing apparatus, it is preferable to include them in the same transport member.

繼而,參照圖16~圖19來表示藉由所述貼合單元300(貼合腔室310)的貼合處理的流程的一例。 於圖16~圖19中,為了更易於理解貼合處理的流程,省略貼合單元300的構成的一部分及貼合腔室310的構成的一部分的圖示。Next, an example of the flow of the bonding process by the bonding unit 300 (the bonding chamber 310) will be described with reference to FIGS. 16 to 19 . In FIGS. 16 to 19, in order to make it easier to understand the flow of the bonding process, a part of the configuration of the bonding unit 300 and a part of the configuration of the bonding chamber 310 are omitted.

首先,如圖16所示,將防塵薄膜組件框構件110搬入貼合腔室310內。繼而,將排氣管312A及排氣管312B分別連接於防塵薄膜組件框構件110的防塵薄膜組件框100的通孔14A及通孔14B(箭頭J1及箭頭J2)。First, as shown in FIG. 16, the pellicle frame member 110 is carried into the bonding chamber 310. Then, the exhaust pipe 312A and the exhaust pipe 312B are respectively connected to the through hole 14A and the through hole 14B (arrow J1 and arrow J2) of the pellicle frame 100 of the pellicle frame member 110.

繼而,如圖17所示,將防塵薄膜構件120搬入貼合腔室310內,進行防塵薄膜構件120與防塵薄膜組件框構件110的對準(位置對準)調整後,使防塵薄膜構件120下降(箭頭D1)而載置於防塵薄膜組件框構件110上。該載置主要利用升降銷的下降及防塵薄膜構件120的自重來進行。 再者,亦可與該例不同,使防塵薄膜組件框構件110上升,藉此將防塵薄膜構件120載置於防塵薄膜組件框構件110上。Then, as shown in FIG. 17, the pellicle member 120 is carried into the bonding chamber 310, and the alignment (alignment) of the pellicle member 120 and the pellicle frame member 110 is adjusted, and the pellicle member 120 is lowered. (arrow D1) is placed on the pellicle frame member 110. This placement is mainly performed by the lowering of the lift pins and the weight of the pellicle member 120. Further, unlike the above example, the pellicle frame member 110 may be raised, whereby the pellicle member 120 is placed on the pellicle frame member 110.

繼而,如圖18所示,經由排氣管312A及排氣管312B、以及防塵薄膜組件框構件110的通孔,對防塵薄膜組件框構件110的防塵薄膜組件框100的溝槽12的內部進行排氣(減壓)。該排氣(減壓)是藉由與各排氣管的貼合腔室310外的端部連接的排氣部件(例如真空汞)來進行。藉由該排氣,如已參照圖9進行說明般,使吸合力F(即,壓合力)於防塵薄膜構件120與防塵薄膜組件框構件110之間發揮作用,從而進行兩者的貼合。 藉此,可儘量不與防塵薄膜的膜面接觸地貼合防塵薄膜構件120與防塵薄膜組件框構件110。Then, as shown in FIG. 18, the inside of the groove 12 of the pellicle frame 100 of the pellicle frame member 110 is subjected to the through holes of the exhaust pipe 312A and the exhaust pipe 312B and the pellicle frame member 110. Exhaust (decompression). The exhaust (decompression) is performed by an exhaust member (for example, vacuum mercury) connected to an end portion of the exhaust pipe that is outside the bonding chamber 310. By this exhaust gas, as described with reference to FIG. 9, the suction force F (that is, the pressing force) acts between the pellicle member 120 and the pellicle frame member 110, and the two are bonded together. Thereby, the pellicle film member 120 and the pellicle frame member 110 can be bonded together without contacting the film surface of the pellicle film as much as possible.

繼而,如圖19所示,經由第1導入管322而將氣體導入貼合腔室310內。被導入的氣體藉由氣體分散構件324而被分散於貼合腔室310內。此時,較佳為以氣體至少不與防塵薄膜構件120(防塵薄膜130)的中央部分碰觸的方式來使氣體分散(參照箭頭G1)。 藉由氣體向貼合腔室310內的導入,貼合腔室310內被加壓,從而配置有防塵薄膜組件框構件及防塵薄膜構件的貼合腔室310內的整體的環境的壓力與溝槽12的內部的壓力的差(差壓)增大。因該差壓而所述力F增強,防塵薄膜構件120與防塵包膜框構件110彼此更強烈進行推壓。再者,圖19中雖省略圖示,但除藉由第1導入管322來進行氣體的導入(加壓)以外,亦可藉由第2導入管進行氣體的導入(加壓)。Then, as shown in FIG. 19, gas is introduced into the bonding chamber 310 via the first introduction tube 322. The introduced gas is dispersed in the bonding chamber 310 by the gas dispersion member 324. At this time, it is preferable to disperse the gas so that the gas does not at least contact the central portion of the pellicle member 120 (pustproof film 130) (see an arrow G1). The introduction of the gas into the bonding chamber 310 causes the bonding chamber 310 to be pressurized, thereby arranging the pressure and the groove of the entire environment in the bonding chamber 310 of the pellicle frame member and the pellicle member. The difference in pressure (differential pressure) inside the groove 12 is increased. Due to the differential pressure, the force F is increased, and the pellicle member 120 and the dust-proof envelope frame member 110 are pressed more strongly with each other. In addition, although illustration is abbreviate|omitted in FIG. 19, in addition to the introduction of the gas (pressurization) by the 1st introduction tube 322, the introduction of the gas (pressurization) by the 2nd introduction tube is possible.

以因貼合腔室310內的整體壓力與溝槽的內部的壓力的差(差壓)而產生的、防塵薄膜構件與防塵薄膜組件框構件之間的壓合力F(對防塵薄膜組件框整體施加的力)成為所述較佳範圍內(例如,2 N左右)的方式,來調整所述加壓及所述減壓的程度。 例如,以貼合腔室310內的壓力為例如0.15 MPa左右的方式進行調整。The pressing force F between the pellicle member and the pellicle frame member due to the difference (differential pressure) between the total pressure in the bonding chamber 310 and the pressure inside the groove (for the entire pellicle frame) The applied force is adjusted to a degree within the preferred range (for example, about 2 N) to adjust the degree of pressurization and the pressure reduction. For example, the pressure in the bonding chamber 310 is adjusted to, for example, about 0.15 MPa.

(防塵薄膜組件製造裝置的具體例) 本實施方式的防塵薄膜組件製造裝置可為僅包含貼合單元(例如所述貼合單元300)的裝置,但亦可為具備貼合單元與其他單元的裝置。 圖20為本實施方式的防塵薄膜組件製造裝置的一例,且為具備貼合單元與其他單元的防塵薄膜組件製造裝置的概略構成圖。(Specific example of the pellicle manufacturing apparatus) The pellicle manufacturing apparatus of the present embodiment may be a device including only a bonding unit (for example, the bonding unit 300), but may be provided with a bonding unit and other units. Device. 20 is a schematic configuration diagram of a pellicle manufacturing apparatus including a bonding unit and another unit, which is an example of a pellicle manufacturing apparatus of the present embodiment.

如圖20所示,防塵薄膜組件製造裝置600具備:作為搬運部件的搬運機器人400、防塵薄膜構件裝載器610、防塵薄膜組件框構件裝載器620、所述貼合單元300、切割單元500、清洗單元640、檢查單元650、以及卸載器630。As shown in FIG. 20, the pellicle manufacturing apparatus 600 includes a transfer robot 400 as a transport member, a pellicle member loader 610, a pellicle frame member loader 620, the bonding unit 300, a cutting unit 500, and cleaning. Unit 640, inspection unit 650, and unloader 630.

搬運機器人400為用以將原材料(防塵薄膜構件及防塵薄膜組件框構件)及製造物(防塵薄膜組件)搬運至各單元(包含各裝載器、卸載器。以下相同)的搬運部件。 雖省略詳細的圖示,但搬運機器人400具備:作為保持防塵薄膜構件的保持構件的手構件410、以及作為保持防塵薄膜組件框構件的保持構件的手構件412。 手構件410及手構件412分別連接於機械手臂。搬運機器人400可對防塵薄膜構件及防塵薄膜組件框構件進行保持且藉由機械手臂的動作而搬入貼合腔室310內。 再者,搬運機器人400可僅具備一個手構件,亦可具備兩個以上的手構件。The transport robot 400 is a transport member for transporting a material (a dust-proof film member and a pellicle frame member) and a product (a pellicle assembly) to each unit (including the respective loaders and unloaders, the same applies hereinafter). Although the detailed illustration is omitted, the transfer robot 400 includes a hand member 410 as a holding member that holds the pellicle member, and a hand member 412 as a holding member that holds the pellicle frame member. The hand member 410 and the hand member 412 are respectively coupled to the robot arm. The transport robot 400 can hold the pellicle member and the pellicle frame member and carry it into the bonding chamber 310 by the operation of the robot arm. Furthermore, the transport robot 400 may have only one hand member, and may have two or more hand members.

當然,防塵薄膜構件裝載器610及防塵薄膜組件框構件裝載器620為分別安置有防塵薄膜構件120及防塵薄膜組件框構件110的單元。Of course, the pellicle member loader 610 and the pellicle frame member loader 620 are units in which the pellicle member 120 and the pellicle frame member 110 are respectively disposed.

關於貼合單元300如上所述。 貼合單元300較佳為具備對與防塵薄膜構件貼合前的防塵薄膜組件框構件的防塵薄膜組件框的形狀進行測定的第1測定部件。 作為此處所述的防塵薄膜組件框的形狀,可列舉所述長邊方向的長度L1、所述短邊方向的長度L2(以上,參照圖1)、防塵薄膜組件框的正交度等。 另外,作為第1測定部件,可列舉具有對防塵薄膜組件框的形狀進行測定的功能的所述感測器340。另外,於貼合單元300內,亦可設置對與防塵薄膜組件框的接觸進行檢測的部件作為第1測定部件。The bonding unit 300 is as described above. The bonding unit 300 preferably includes a first measuring member that measures the shape of the pellicle frame of the pellicle frame member before bonding with the pellicle member. The shape of the pellicle frame as described herein may be, for example, the length L1 in the longitudinal direction, the length L2 in the short-side direction (see FIG. 1 above), the degree of orthogonality of the pellicle frame, and the like. Further, the first measuring member includes the sensor 340 having a function of measuring the shape of the pellicle frame. Further, in the bonding unit 300, a member that detects contact with the pellicle frame may be provided as the first measuring member.

另外,貼合單元300較佳為具備於將防塵薄膜組件框構件與防塵薄膜構件貼合前,進行防塵薄膜組件框構件與防塵薄膜構件的對準(位置對準)的對準部件。作為對準部件,可列舉如上所述般被設置為可沿水平方向(X方向、Y方向及q方向)移動的載置板330。Moreover, it is preferable that the bonding unit 300 is provided with an alignment member which performs alignment (position alignment) of the pellicle frame member and the pell film member before bonding the pellicle frame member and the pellicle member. As the alignment member, a mounting plate 330 that is movable in the horizontal direction (X direction, Y direction, and q direction) as described above can be cited.

另外,於防塵薄膜組件製造裝置600中,除可移動的載置板330以外,亦可輔助性地併用具有水平方向的位置調整功能的搬運機器人400的機械手臂作為對準部件。 另外,於防塵薄膜組件製造裝置600中,各構件的大致位置的確定可藉由如下構件等進行:設置於手構件上且用以對防塵薄膜構件或防塵薄膜組件框構件相對於手構件的位置進行確定的引導構件;設置於載置板330上且用以對防塵薄膜組件框構件相對於載置板330的位置進行確定的引導構件。 就提升防塵薄膜組件框相對於載置板330的位置的確定精度的方面而言,設置於載置板330上的引導構件較佳為與防塵薄膜組件框構件的防塵薄膜組件框的外周面接觸且不與剝離襯墊106接觸。Further, in the pellicle manufacturing apparatus 600, in addition to the movable mounting plate 330, a robot arm of the transport robot 400 having a horizontal position adjustment function may be used in combination as an alignment member. Further, in the pellicle manufacturing apparatus 600, the approximate position of each member can be determined by a member or the like which is provided on the hand member and is used to position the pell film member or the pellicle frame member with respect to the hand member. A guiding member that performs the determination; a guiding member that is disposed on the mounting plate 330 and that determines the position of the pellicle frame member relative to the mounting plate 330. The guiding member provided on the placing plate 330 is preferably in contact with the outer peripheral surface of the pellicle frame of the pellicle frame member in terms of improving the accuracy of determining the position of the pellicle frame relative to the placing plate 330. And not in contact with the release liner 106.

切割單元500為用以於切入部128切割防塵薄膜構件120且將不需要的部分即外側部分124等(外側部分124及與外側部分124相接的防塵薄膜)去除的單元。 如上所述,藉由防塵薄膜組件製造裝置600具備切割單元500作為獨立於貼合單元300的單元,因貼合時的氣體的對流而引起的、切割屑對各構件的附著得以抑制。 另外,如上所述,藉由切割單元500的切割可於防塵薄膜構件與防塵薄膜組件框構件的貼合前進行,亦可於貼合後進行。 切割單元500的具體例將於後述。The cutting unit 500 is a unit for cutting the pellicle member 120 at the cutting portion 128 and removing an unnecessary portion, that is, the outer portion 124 or the like (the outer portion 124 and the pellicle film that is in contact with the outer portion 124). As described above, the pellicle module manufacturing apparatus 600 includes the cutting unit 500 as a unit independent of the bonding unit 300, and the adhesion of the cutting chips to the respective members due to the convection of the gas at the time of bonding is suppressed. Further, as described above, the cutting by the cutting unit 500 may be performed before the bonding of the pellicle member and the pellicle frame member, or may be performed after bonding. Specific examples of the cutting unit 500 will be described later.

清洗單元640為對切割後的防塵薄膜構件120進行清洗且清洗去除切割屑等異物的單元。 當於與防塵薄膜組件框構件的貼合前對防塵薄膜構件進行切割的情形時,清洗單元640對與防塵薄膜組件框構件的貼合前且切割後的防塵薄膜構件進行清洗。另外,當於與防塵薄膜組件框構件的貼合後對防塵薄膜構件進行切割的情形時,清洗單元640對與防塵薄膜組件框構件的貼合後且切割後的防塵薄膜構件(即,防塵薄膜組件所具備的防塵薄膜構件)進行清洗。 作為清洗單元640的構成,例如可適當參照半導體裝置、顯示裝置(液晶顯示裝置、有機電致發光裝置(有機EL(Electroluminescence)裝置)等)、印刷配線基板等電子器件領域中公知的清洗裝置的構成。The cleaning unit 640 is a unit that cleans the cut dust-proof film member 120 and cleans and removes foreign matter such as cutting chips. When the pellicle member is cut before bonding with the pellicle frame member, the cleaning unit 640 cleans the pell film member before and after the bonding with the pellicle frame member. In addition, when the pellicle film member is cut after bonding with the pellicle frame member, the cleaning unit 640 plies the pell film member after the bonding with the pellicle frame member (ie, the pellicle film) The dust-proof film member of the module is cleaned. As a configuration of the cleaning unit 640, for example, a semiconductor device, a display device (a liquid crystal display device, an organic electroluminescence device (organic EL device) or the like), and a cleaning device known in the field of electronic devices such as a printed wiring board can be appropriately referred to. Composition.

檢查單元650為對貼合後的防塵薄膜組件框構件及防塵薄膜構件進行外觀檢查的單元。 作為外觀檢查,可列舉:附著於防塵薄膜組件框構件及防塵薄膜構件的至少一者的異物的檢測、防塵薄膜組件框構件(防塵薄膜組件框)的形狀測定、防塵薄膜組件框構件與防塵薄膜構件的位置對準測定等。 檢查單元650尤佳為具備對與防塵薄膜構件貼合後的防塵薄膜組件框構件的防塵薄膜組件框的形狀進行測定的第2測定部件。 作為第2測定部件的例子,可列舉與第1測定部件相同的例子。The inspection unit 650 is a unit that performs visual inspection of the pellicle frame member and the pellicle member after bonding. For the visual inspection, the detection of the foreign matter adhering to at least one of the pellicle frame member and the pellicle member, the shape measurement of the pellicle frame member (the pellicle frame), the pellicle frame member and the pellicle film Position alignment of components, etc. The inspection unit 650 is preferably a second measurement member that measures the shape of the pellicle frame of the pellicle frame member that is bonded to the pellicle member. Examples of the second measuring member include the same examples as the first measuring member.

卸載器630為收容最終製造的防塵薄膜組件的單元。The unloader 630 is a unit that houses the finally manufactured pellicle.

防塵薄膜組件製造裝置600進而具備控制部件660。 控制部件660為基於貼合前的防塵薄膜組件框的形狀的測定結果(藉由第1測定部件的測定結果)與貼合後的防塵薄膜組件框的形狀的測定結果(藉由第2測定部件的測定結果),對藉由對準部件的對準進行前饋控制(FF(feedforward)控制)的控制部件。 其中,亦可省略控制部件660。The pellicle manufacturing apparatus 600 further includes a control member 660. The control member 660 is a measurement result based on the shape of the pellicle frame before bonding (the measurement result by the first measuring member) and the measurement result of the shape of the pellicle frame after bonding (by the second measuring member) The measurement result) is a control unit that performs feedforward control (FF (feedforward) control) by alignment of the alignment members. However, the control unit 660 may be omitted.

防塵薄膜組件製造裝置600進而具備算出部件670。 算出部件670為基於貼合前的防塵薄膜組件框的形狀的測定結果(藉由第1測定部件的測定結果)與貼合後的防塵薄膜組件框的形狀的測定結果(藉由第2測定部件的測定結果),來算出因貼合單元中的貼合而引起的防塵薄膜組件框的應變量的算出部件。該算出部件670亦進而具備基於所述應變量來對因連通構件314而引起的防塵薄膜組件框100的推入量進行前饋控制(FF控制)的功能。 其中,亦可省略算出部件670。The pellicle manufacturing apparatus 600 further includes a calculation member 670. The calculation member 670 is a measurement result based on the shape of the pellicle frame before bonding (the measurement result by the first measurement member) and the measurement result of the shape of the pellicle frame after bonding (by the second measurement member) The measurement result) is a calculation means for calculating the strain amount of the pellicle frame by the bonding in the bonding unit. Further, the calculation unit 670 further includes a function of performing feedforward control (FF control) on the amount of pushing of the pellicle frame 100 by the communication member 314 based on the amount of strain. However, the calculation unit 670 may be omitted.

另外,防塵薄膜組件製造裝置600雖具備所述各單元,但亦可適當省略除貼合單元300以外的單元。 即,貼合單元300以外的單元可作為獨立於具備貼合單元300的防塵薄膜組件製造裝置的裝置而設置。Further, although the pellicle manufacturing apparatus 600 includes the above-described respective units, units other than the bonding unit 300 may be omitted as appropriate. That is, the unit other than the bonding unit 300 can be provided as a device independent of the pellicle manufacturing apparatus including the bonding unit 300.

另外,防塵薄膜組件製造裝置600亦可具備所述各單元以外的其他單元。 作為其他單元,可列舉對防塵薄膜組件框100賦予接著劑而形成接著劑層102的接著劑層形成單元、對防塵薄膜組件框100賦予接著劑而形成接著劑層104的接著劑層形成單元、將剝離襯墊106貼附於接著劑層104上的剝離襯墊貼附單元等。於該情形時,防塵薄膜組件製造裝置600亦可具備使防塵薄膜組件框100中的一端面10與另一端面20反轉的反轉機構。Further, the pellicle manufacturing apparatus 600 may be provided with other units than the above units. The other unit includes an adhesive layer forming unit that forms an adhesive layer on the pellicle frame 100, and an adhesive layer forming unit that forms an adhesive layer on the pellicle frame 100 to form an adhesive layer 104. The release liner 106 is attached to a release liner attaching unit or the like on the adhesive layer 104. In this case, the pellicle manufacturing apparatus 600 may include an inversion mechanism that reverses the one end surface 10 and the other end surface 20 of the pellicle frame 100.

(切割單元的具體例) 繼而,一面參照圖21~圖24一面對本實施方式中的切割單元的一例進行說明。 圖21~圖24為一例的切割單元500的概略截面圖。 圖21~圖24表示切割單元500中的防塵薄膜構件120的切割處理的流程的一例。(Specific Example of Cutting Unit) Next, an example of the cutting unit in the present embodiment will be described with reference to Figs. 21 to 24 . 21 to 24 are schematic cross-sectional views of an example of the cutting unit 500. 21 to 24 show an example of the flow of the cutting process of the pellicle member 120 in the dicing unit 500.

如圖21所示,切割單元500具備:切割腔室510、配置於切割腔室510內的中央部的載置板530、用以上推載置板530的上推部件532、於切割腔室510內載置有防塵薄膜構件120的外側部分124的載置板540。As shown in FIG. 21, the cutting unit 500 includes a cutting chamber 510, a placing plate 530 disposed at a central portion of the cutting chamber 510, a push-up member 532 for pushing the mounting plate 530, and a cutting chamber 510. A placing plate 540 on which the outer portion 124 of the pellicle member 120 is placed is placed.

載置板530於在防塵薄膜構件120與防塵薄膜組件框構件110的貼合後進行切割的情形時,載置有防塵薄膜組件框構件110,並於在防塵薄膜構件120與防塵薄膜組件框構件110的貼合前進行切割的情形時,載置有防塵薄膜構件120的內側部分122。 於任一情形時,載置板540均載置有防塵薄膜構件120的外側部分124。 該一例為於防塵薄膜構件120與防塵薄膜組件框構件110的貼合後進行切割的情形、即、為於載置板530載置有防塵薄膜組件框構件110的例子。When the mounting plate 530 is cut after the pellicle member 120 and the pellicle frame member 110 are bonded together, the pellicle frame member 110 is placed on the pellicle member 120 and the pellicle frame member. When the cutting is performed before the bonding of 110, the inner portion 122 of the pellicle member 120 is placed. In either case, the mounting plate 540 carries the outer portion 124 of the pellicle member 120. This example is an example in which the pellicle member 120 and the pellicle frame member 110 are bonded together, that is, the pellicle frame member 110 is placed on the placing plate 530.

載置板530及載置板540分別具備用以吸附保持被載置物的公知的吸附機構。Each of the placing plate 530 and the placing plate 540 is provided with a known suction mechanism for sucking and holding the object to be placed.

載置板530可藉由上推部件532的上推動作及返回動作而沿垂直方向移動。上推部件532具有可改變上推速度的功能。The placing plate 530 is movable in the vertical direction by the push-up operation and the returning operation of the push-up member 532. The push-up member 532 has a function of changing the push-up speed.

再者,作為載置板530的變形例,可沿相對於垂直方向而傾斜的方向移動。另外,可將上推方向保持為垂直方向,亦可以相對於水平方向傾斜的方式載置防塵薄膜構件120。任一變形例均為以相對於垂直於防塵薄膜構件120的面的方向而傾斜的角度上推內側部分122的例子。Further, as a modification of the placing plate 530, it is possible to move in a direction inclined with respect to the vertical direction. Further, the push-up direction may be maintained in the vertical direction, or the pellicle member 120 may be placed so as to be inclined with respect to the horizontal direction. In any of the modifications, the inner portion 122 is pushed up at an angle inclined with respect to a direction perpendicular to the surface of the pellicle member 120.

相對於載置板530,載置板540被固定配置於切割腔室510內(即,不可移動)。The mounting plate 540 is fixedly disposed within the cutting chamber 510 with respect to the mounting plate 530 (ie, is not movable).

切割單元500進而具有用以將氣體導入切割腔室510內的導入管522。即,導入管522的一端被配置於切割腔室510內,另一端被配置於切割腔室510外。 於切割腔室510內進而設置有用以使自導入管522導入的氣體分散的氣體分散構件524。 氣體分散構件524為覆蓋導入管522的端部(氣體的導入口)與切割腔室510上部的內壁面的一部分的罩形狀的構件。而且,於氣體分散構件524的與防塵薄膜構件120相對向面側設置有多個孔(未圖示)。自導入管522導入的氣體首先到達由切割腔室510內的上部的內壁面與氣體分散構件524形成的空間內,繼而藉由所述多個孔而被分散。被分散的氣體朝垂直方向的下方(圖23及圖24中的箭頭G2的方向)、或呈放射狀流動。 藉由該些構成,於切割時產生的切割屑對防塵薄膜130的附著得以抑制。另外,亦發揮去除切割時產生的毛刺的效果。The cutting unit 500, in turn, has an introduction tube 522 for introducing a gas into the cutting chamber 510. That is, one end of the introduction tube 522 is disposed in the cutting chamber 510, and the other end is disposed outside the cutting chamber 510. Further, a gas dispersion member 524 for dispersing a gas introduced from the introduction tube 522 is further provided in the cutting chamber 510. The gas dispersion member 524 is a cover-shaped member that covers an end portion (introduction port of gas) of the introduction tube 522 and a part of an inner wall surface of the upper portion of the cutting chamber 510. Further, a plurality of holes (not shown) are provided on the surface of the gas dispersion member 524 facing the pellicle member 120. The gas introduced from the introduction pipe 522 first reaches the space formed by the inner wall surface of the upper portion in the cutting chamber 510 and the gas dispersion member 524, and is then dispersed by the plurality of holes. The dispersed gas flows downward in the vertical direction (the direction of the arrow G2 in FIGS. 23 and 24) or radially. With these configurations, the adhesion of the cutting chips generated at the time of cutting to the pellicle film 130 is suppressed. In addition, it also exerts the effect of removing burrs generated during cutting.

導入管522的另一端可分別(視需要經由其他配管等)連接於貯氣瓶等氣體供給部件。 另外,亦可於導入管522的中途設置用以切換是否進行氣體導入的閥門(未圖示)。該閥門亦可為具備對氣體的流量等進行調整的機構的調整閥。 再者,經由導入管522而供給的氣體並無特別限制,例如可使用乾燥空氣、惰性氣體等。The other end of the introduction pipe 522 can be connected to a gas supply member such as a gas cylinder via a separate pipe or the like as needed. Further, a valve (not shown) for switching whether or not to introduce gas may be provided in the middle of the introduction pipe 522. The valve may be a regulating valve having a mechanism for adjusting the flow rate of the gas or the like. Further, the gas supplied through the introduction pipe 522 is not particularly limited, and for example, dry air, an inert gas or the like can be used.

切割單元500進而具有用以對切割腔室510內進行排氣的排氣管512。排氣管512被分支為四個,且四個分支端存在於切割腔室510內。四個分支端中的位於載置板530與載置板540之間的兩個與具有截面為V字型的溝槽的構件514連接。構件514沿防塵薄膜構件120的切入部128而設置。構件514的溝槽的內部與排氣管512連通。藉由該些構成,可於沿切入部128對防塵薄膜構件120進行切割時,經由構件514及排氣管512而將因所述切割而產生的切割屑排出至切割腔室510外。再者,構件514的溝槽的形狀並不限定於V字型。The cutting unit 500, in turn, has an exhaust pipe 512 for exhausting the interior of the cutting chamber 510. The exhaust pipe 512 is branched into four, and four branch ends are present in the cutting chamber 510. Two of the four branch ends between the mounting plate 530 and the mounting plate 540 are connected to a member 514 having a V-shaped cross section. The member 514 is provided along the cut-in portion 128 of the pellicle member 120. The interior of the groove of member 514 is in communication with exhaust pipe 512. According to these configurations, when the pellicle member 120 is cut along the cutting portion 128, the cutting chips generated by the cutting can be discharged to the outside of the cutting chamber 510 via the member 514 and the exhaust pipe 512. Furthermore, the shape of the groove of the member 514 is not limited to the V shape.

排氣管512的切割腔室510外的端部(未圖示)可(視需要經由其他配管等)連接於真空泵等排氣部件。An end portion (not shown) outside the cutting chamber 510 of the exhaust pipe 512 may be connected to an exhaust member such as a vacuum pump (via other piping or the like as necessary).

另外,於切割腔室510設置有構件進出口550。 經由構件進出口550來對切割腔室510搬入及搬出構件(切割前及切割後的防塵薄膜構件120及防塵薄膜組件框構件110)。另外,於切割單元500設置有用以進行構件進出口550的開放及閉合的擋門552。In addition, a member inlet and outlet 550 is provided in the cutting chamber 510. The member (the pellicle member 120 and the pellicle frame member 110 before and after the cutting) are carried into and out of the cutting chamber 510 via the member inlet/outlet 550. In addition, a shutter 552 for opening and closing the member inlet and outlet 550 is provided in the cutting unit 500.

如圖21及圖22所示,將藉由作為保持構件的手構件410保持的、貼合後的防塵薄膜構件120及防塵薄膜組件框構件110搬入切割腔室510內。詳細而言,手構件410以僅與貼合後的防塵薄膜構件120及防塵薄膜組件框構件110中、防塵薄膜構件120中的支持基板的外側部分124(即,不需要區域)接觸的方式進行保持。 圖21表示將貼合後的防塵薄膜構件120及防塵薄膜組件框構件110搬入切割腔室510內之前的狀態,圖22表示將貼合後的防塵薄膜構件120及防塵薄膜組件框構件110搬入切割腔室510內之後的狀態。 如上所述,手構件410為亦用以將貼合前的防塵薄膜構件120搬入貼附腔室310內的手構件。 該一例中,手構件410與貼合後的防塵薄膜構件120及防塵薄膜組件框構件110中、防塵薄膜構件120的外側部分124相接。As shown in FIG. 21 and FIG. 22, the pell film member 120 and the pellicle frame member 110 which are held by the hand member 410 as a holding member are carried into the cutting chamber 510. Specifically, the hand member 410 is performed only in contact with the outer portion 124 (ie, the unnecessary region) of the support substrate in the pellicle member 120 and the pellicle frame member 110 after the bonding. maintain. FIG. 21 shows a state before the bonded pellicle member 120 and the pellicle frame member 110 are carried into the cutting chamber 510, and FIG. 22 shows the pell film member 120 and the pellicle frame member 110 that have been bonded together. The state after the inside of the chamber 510. As described above, the hand member 410 is a hand member that also serves to carry the pellicle member 120 before bonding into the attachment chamber 310. In this example, the hand member 410 is in contact with the outer portion 124 of the pellicle member 120 in the bonded pellicle member 120 and the pellicle frame member 110.

再者,雖省略了圖示,切割後的防塵薄膜構件120及防塵薄膜組件框構件110(即,防塵薄膜組件)可藉由所述手構件412來保持防塵薄膜組件框構件110而搬出至切割腔室510外。Further, although not shown, the cut-up pellicle member 120 and the pellicle frame member 110 (that is, the pellicle assembly) can be carried out to the cutting by holding the pellicle frame member 110 by the hand member 412. Outside the chamber 510.

再者,作為變形例,亦可於將防塵薄膜構件120及防塵薄膜組件框構件110搬入切割腔室510內的階段使用所述手構件412。於該情形時,藉由手構件412對防塵薄膜組件框構件110的部分進行支持。Further, as a modification, the hand member 412 may be used in a stage in which the pellicle member 120 and the pellicle frame member 110 are carried into the cutting chamber 510. In this case, the portion of the pellicle frame member 110 is supported by the hand member 412.

如圖23所示,搬入切割腔室510內的、貼合後的防塵薄膜構件120及防塵薄膜組件框構件110被載置於載置板530及載置板540。此時,於載置板530,以與防塵薄膜組件框構件110的剝離襯墊106相接的方式藉由載置板530的吸附機構來將剝離襯墊106吸附於載置板530。而且,於載置板540,以與防塵薄膜構件120的支持基板的外側部分124相接的方式藉由載置板540的吸附機構來將外側部分124吸附於載置板540。進而,經由導入管522及氣體分散構件524將氣體導入切割腔室510內。該例中,於切割腔室510內,氣體朝延長方向下方(箭頭G2的方向)流動。As shown in FIG. 23, the pellicle member 120 and the pellicle frame member 110 which are carried in the cutting chamber 510 are placed on the placing plate 530 and the placing plate 540. At this time, the release liner 106 is adsorbed to the placing plate 530 by the suction mechanism of the mounting plate 530 so as to be in contact with the release liner 106 of the pellicle frame member 110 on the placing plate 530. Further, on the placing plate 540, the outer portion 124 is attracted to the placing plate 540 by the suction mechanism of the placing plate 540 so as to be in contact with the outer portion 124 of the supporting substrate of the pellicle member 120. Further, gas is introduced into the cutting chamber 510 via the introduction pipe 522 and the gas dispersion member 524. In this example, in the cutting chamber 510, the gas flows downward in the extending direction (the direction of the arrow G2).

繼而,如圖24所示,藉由上推部件532朝垂直方向上方(箭頭P1的方向)上推載置板530。藉此,上推防塵薄膜組件框構件110及防塵薄膜構件120的內側部分122。 藉由該上推,防塵薄膜構件120沿切入部128而被切割。 此時的上推方向(箭頭P1)與氣體的流動方向(箭頭G2)為相反的方向。藉由該氣體,因切割產生的切割屑對防塵薄膜130的附著得以抑制。Then, as shown in FIG. 24, the placing plate 530 is pushed up by the push-up member 532 in the vertical direction (the direction of the arrow P1). Thereby, the inner portion 122 of the pellicle frame member 110 and the pellicle member 120 is pushed up. By this push-up, the pellicle member 120 is cut along the cut-in portion 128. The push-up direction (arrow P1) at this time is opposite to the flow direction of the gas (arrow G2). With this gas, the adhesion of the cutting chips generated by the cutting to the pellicle film 130 is suppressed.

(防塵薄膜組件製造裝置600的防塵薄膜組件製造流程的一例) 繼而,參照圖25來表示藉由防塵薄膜組件製造裝置600的防塵薄膜組件製造流程的一例。 再者,圖25的各步驟中,由虛線所圍成的步驟(步驟702、步驟708、步驟710、步驟712)是指於該一例中可省略的步驟。(An example of the manufacturing process of the pellicle assembly of the pellicle assembly manufacturing apparatus 600) Next, an example of the manufacturing process of the pellicle component by the pellicle manufacturing apparatus 600 is shown with reference to FIG. Further, in each step of FIG. 25, the steps (step 702, step 708, step 710, and step 712) surrounded by broken lines refer to steps that can be omitted in this example.

如圖25所示,首先,作為步驟700,將防塵薄膜構件安置於防塵薄膜構件裝載器,且將防塵薄膜組件框構件安置於防塵薄膜組件框構件裝載器。繼而,藉由機器人搬運而搬入貼合腔室內。 繼而,作為步驟702,於貼合腔室內,藉由第1測定部件來測定防塵薄膜組件框構件的防塵薄膜組件框的形狀(貼合前的形狀)。 繼而,作為步驟704,於貼合腔室內,藉由對準部件來進行防塵薄膜構件與防塵薄膜組件框構件的對準。繼而,於貼合腔室內進行防塵薄膜構件與防塵薄膜組件框構件的貼合。 繼而,作為步驟706,將貼合後的防塵薄膜構件及防塵薄膜組件框構件搬入切割腔室,並對防塵薄膜構件進行切割。 繼而,作為步驟708,將切割後的防塵薄膜構件及防塵薄膜組件框構件搬運至清洗單元,並對切割後的防塵薄膜構件及防塵薄膜組件框構件進行清洗。As shown in Fig. 25, first, as a step 700, the pellicle member is placed on the pellicle member loader, and the pellicle frame member is placed on the pellicle frame member loader. Then, it is carried by the robot and moved into the bonding chamber. Then, in step 702, the shape of the pellicle frame of the pellicle frame member (the shape before bonding) is measured by the first measuring member in the bonding chamber. Then, in step 704, the alignment of the pellicle member and the pellicle frame member is performed by the alignment member in the bonding chamber. Then, the pellicle film member and the pellicle frame member are bonded together in the bonding chamber. Then, in step 706, the pell film member and the pellicle frame member after bonding are carried into the cutting chamber, and the pellicle member is cut. Then, in step 708, the cut pellicle member and the pellicle frame member are conveyed to the cleaning unit, and the cut pellicle member and the pellicle frame member are cleaned.

繼而,作為步驟710,將防塵薄膜構件及防塵薄膜組件框構件搬運至外觀檢查單元,於外觀檢查單元中,藉由第2測定部件來測定防塵薄膜組件框構件的防塵薄膜組件框的形狀(貼合後的形狀)。 此處,視需要基於藉由第1測定部件的測定結果及藉由第2測定部件的測定結果,來進行步驟704中的對準部件的前饋控制(以下,亦稱為「FF1(對準修正)」)。FF1(對準修正)是藉由控制部件660來進行。Then, in step 710, the pellicle member and the pellicle frame member are transported to the visual inspection unit, and in the visual inspection unit, the shape of the pellicle frame of the pellicle frame member is measured by the second measuring member. Shape after closing). Here, the feedforward control of the alignment member in step 704 is performed based on the measurement result by the first measurement member and the measurement result by the second measurement member as needed (hereinafter, also referred to as "FF1 (alignment) Correct))). FF1 (alignment correction) is performed by the control unit 660.

繼而,作為步驟712,基於藉由第1測定部件的測定結果及藉由第2測定部件的測定結果,來算出因貼合而引起的防塵薄膜組件框的應變量。應變量的算出是藉由算出部件670來進行。 此處,視需要基於所算出的應變量,而對步驟704的貼合處理中因連通構件314而引起的防塵薄膜組件框100的推入量進行前饋控制(以下,亦稱為「FF2(應變修正)」)。於該一例中,FF2(應變修正)亦是藉由算出部件670來進行。其中,作為變形例,亦可獨立於對應變量進行算出的算出部件而另行設置進行FF2(應變修正)的控制部件。Then, in step 712, the strain amount of the pellicle frame due to the bonding is calculated based on the measurement result by the first measuring member and the measurement result by the second measuring member. The calculation of the dependent variable is performed by the calculation unit 670. Here, the feed-in control of the pellicle frame 100 due to the communication member 314 in the bonding process of the step 704 is performed based on the calculated strain amount (hereinafter, also referred to as "FF2 ( Strain correction))). In this example, FF2 (strain correction) is also performed by the calculation unit 670. However, as a modification, a control means for performing FF2 (strain correction) may be separately provided independently of the calculation means for calculating the corresponding variable.

繼而,作為步驟714,將防塵薄膜構件及防塵薄膜組件框構件(即,防塵薄膜組件)搬運至卸載器並加以收納。Then, in step 714, the pellicle member and the pellicle frame member (that is, the pellicle assembly) are conveyed to the unloader and stored.

以上,示出了藉由防塵薄膜組件製造裝置的防塵薄膜組件製造流程的一例,但本實施方式並不限定於該一例。 例如,如上所述,於防塵薄膜組件製造裝置600中,亦可省略控制部件660及算出部件670。即,亦可手動進行FF1(對準修正)及FF2(應變修正),來代替藉由控制部件的自動進行。 另外,於防塵薄膜組件製造裝置600中,控制部件660與算出部件670亦可為同一控制部件。即,亦可藉由一個控制部件來進行FF1(對準修正)、應變量的算出、及FF2(應變修正)。 若進一步而言,如上所述,本實施方式的防塵薄膜組件製造裝置亦可為僅包含貼合單元的裝置。即,即便藉由僅進行步驟704中的貼合處理,亦可儘量不與防塵薄膜接觸地貼合防塵薄膜構件及防塵薄膜組件框構件而製造防塵薄膜組件。Although an example of the manufacturing process of the pellicle assembly by the pellicle manufacturing apparatus has been described above, the embodiment is not limited to this example. For example, as described above, in the pellicle manufacturing apparatus 600, the control member 660 and the calculation member 670 may be omitted. That is, FF1 (alignment correction) and FF2 (strain correction) can be manually performed instead of being automatically performed by the control unit. Further, in the pellicle manufacturing apparatus 600, the control member 660 and the calculation member 670 may be the same control member. That is, FF1 (alignment correction), calculation of the strain amount, and FF2 (strain correction) can be performed by one control unit. Further, as described above, the pellicle manufacturing apparatus of the present embodiment may be a device including only the bonding unit. In other words, even if only the bonding process in step 704 is performed, the pellicle film member and the pellicle frame member can be bonded to the pellicle without contacting the pellicle film as much as possible.

(具備防塵薄膜組件的曝光裝置的具體例) 藉由本實施方式而製造的防塵薄膜組件,是以裝設於原版(遮罩)的狀態而於曝光裝置內使用。 圖26為具備藉由本實施方式而製造的防塵薄膜組件的一例的曝光裝置的一例、即EUV曝光裝置800的概略截面圖。 如圖26所示,EUV曝光裝置800具備:放射EUV光的光源831、曝光原版850、及將自光源831放射的EUV光導向曝光原版850的照明光學系統837。 曝光原版850具備包含防塵薄膜812及防塵薄膜組件框814的防塵薄膜組件810、及原版833(EUV遮罩)。該曝光原版850是以自光源831放射的EUV光透過防塵薄膜812而向原版833照射的方式而配置。 原版833是將所照射的EUV光以圖案狀反射者。(Specific Example of Exposure Apparatus Provided with PSA Module) The pellicle film manufactured by the present embodiment is used in an exposure apparatus in a state of being mounted on a master (mask). FIG. 26 is a schematic cross-sectional view of an EUV exposure apparatus 800 which is an example of an exposure apparatus including an example of a pellicle film assembly manufactured by the present embodiment. As shown in FIG. 26, the EUV exposure apparatus 800 includes a light source 831 that emits EUV light, an exposure master 850, and an illumination optical system 837 that guides EUV light emitted from the light source 831 to the exposure master 850. The exposure master 850 includes a pellicle film 810 including a pellicle film 812 and a pellicle frame 814, and a master 833 (EUV mask). The exposure original plate 850 is disposed such that EUV light emitted from the light source 831 passes through the pellicle film 812 and is irradiated onto the original plate 833. The original 833 is a person who reflects the irradiated EUV light in a pattern.

此處,作為原版833,可使用包含支持基板、積層於該支持基板上的反射層、及形成於反射層上的吸收體層的原版。原版的面中設置有反射層及吸收體層之側的面為光照射面。藉由吸收體層吸收EUV光的一部分而於感應基板(例如,附光阻劑膜的半導體基板)上形成所需的圖像。反射層可為鉬(Mo)與矽(Si)的多層膜。吸收體層可為鉻(Gr)或氮化鉭等EUV光等的吸收性高的材料。Here, as the master 833, a master including a support substrate, a reflective layer laminated on the support substrate, and an absorber layer formed on the reflective layer can be used. The surface on the side where the reflection layer and the absorber layer are provided in the surface of the original plate is a light irradiation surface. A desired image is formed on the sensing substrate (e.g., the semiconductor substrate with the photoresist film) by absorbing the portion of the EUV light by the absorber layer. The reflective layer can be a multilayer film of molybdenum (Mo) and bismuth (Si). The absorber layer may be a highly absorptive material such as EUV light such as chromium (Gr) or tantalum nitride.

防塵薄膜組件810為藉由本實施方式而製造的防塵薄膜組件的一例。 防塵薄膜組件810與自所述防塵薄膜組件200去除玻璃襯墊106而成者相對應。 防塵薄膜812例如與所述防塵薄膜130相對應。 防塵薄膜組件框814與所述內側部分122、所述接著劑層102、所述防塵薄膜組件框100、及所述接著劑層104的複合體相對應。The pellicle film assembly 810 is an example of a pellicle film assembly manufactured by the present embodiment. The pellicle assembly 810 corresponds to the removal of the glass liner 106 from the pellicle assembly 200. The dustproof film 812 corresponds to the pellicle film 130, for example. The pellicle frame 814 corresponds to the composite of the inner portion 122, the adhesive layer 102, the pellicle frame 100, and the adhesive layer 104.

於EUV曝光裝置800中,於光源831與照明光學系統837之間、及照明光學系統837與原版833之間分別設置有濾波窗(filter window)820及濾波窗825。 另外,EUV曝光裝置800具備將原版833所反射的EUV光導向感應基板834的投影光學系統838。In the EUV exposure apparatus 800, a filter window 820 and a filter window 825 are provided between the light source 831 and the illumination optical system 837, and between the illumination optical system 837 and the original 833, respectively. Further, the EUV exposure apparatus 800 includes a projection optical system 838 that guides EUV light reflected by the original 833 to the sensing substrate 834.

於EUV曝光裝置800中,由原版833所反射的EUV光經由投影光學系統838被導向感應基板834上,而將感應基板834曝光為圖案狀。再者,藉由EUV的曝光是於減壓條件下進行。In the EUV exposure apparatus 800, the EUV light reflected by the original 833 is guided onto the sensing substrate 834 via the projection optical system 838, and the sensing substrate 834 is exposed in a pattern. Further, the exposure by EUV is carried out under reduced pressure.

EUV光源831朝向照明光學系統837而放射EUV光。 於EUV光源831中包含靶材、及脈衝雷射照射部等。藉由將脈衝雷射照射至該靶材而使之產生電漿,藉此可獲得EUV。若將靶材設為Xe,則可獲得波長13 nm~14 nm的EUV。EUV光源所發出的光的波長並不限於13 nm~14 nm,只要為波長5 nm~30 nm的範圍內的適合目的的波長的光即可。The EUV light source 831 emits EUV light toward the illumination optical system 837. The EUV light source 831 includes a target, a pulsed laser irradiation unit, and the like. EUV is obtained by irradiating a pulsed laser onto the target to produce a plasma. When the target is set to Xe, EUV having a wavelength of 13 nm to 14 nm can be obtained. The wavelength of the light emitted by the EUV light source is not limited to 13 nm to 14 nm, and may be any suitable wavelength of light in the range of 5 nm to 30 nm.

照明光學系統837對自EUV光源831照射的光進行集光,將照度均一化而向原版833照射。 於照明光學系統837中包含用以調整EUV的光路的多片多層膜反射鏡832、及光耦合器(光學積分器(optical integrator))等。多層膜反射鏡是交替積層鉬(Mo)、矽(Si)而成的多層膜等。The illumination optical system 837 collects light irradiated from the EUV light source 831, and uniformizes the illuminance to illuminate the original 833. The illumination optical system 837 includes a plurality of multilayer film mirrors 832 for adjusting the optical path of the EUV, an optical coupler (optical integrator), and the like. The multilayer film mirror is a multilayer film in which molybdenum (Mo) or bismuth (Si) is alternately laminated.

濾波窗820、濾波窗825的裝設方法並無特別限制,可列舉經由接著劑等而進行貼附的方法、或機械固定於EUV曝光裝置內的方法等。 配置於光源831與照明光學系統837之間的濾波窗820捕捉自光源產生的飛散粒子(碎屑(debris)),以避免飛散粒子(碎屑)附著於照明光學系統837內部的元件(例如多層膜反射鏡832)。 另一方面,配置於照明光學系統837與原版833之間的濾波窗825捕捉自光源831側飛散的粒子(碎屑),以避免飛散粒子(碎屑)附著於原版833。The method of installing the filter window 820 and the filter window 825 is not particularly limited, and examples thereof include a method of attaching via an adhesive or the like, or a method of mechanically fixing the same in an EUV exposure apparatus. A filter window 820 disposed between the light source 831 and the illumination optics 837 captures scattered particles (debris) generated from the light source to prevent scattered particles (debris) from adhering to components within the illumination optics 837 (eg, multiple layers) Membrane mirror 832). On the other hand, the filter window 825 disposed between the illumination optical system 837 and the original 833 captures particles (debris) scattered from the side of the light source 831 to prevent scattered particles (debris) from adhering to the original 833.

另外,由於附著於原版的異物會吸收EUV光、或使EUV光發生散射,故而會對晶圓引起解析不良。因此,防塵薄膜組件810是以覆蓋原版833的EUV照射區的方式裝設。EUV光透過防塵薄膜812而向原版833照射。Further, since foreign matter adhering to the original plate absorbs EUV light or scatters EUV light, the wafer is poorly analyzed. Therefore, the pellicle assembly 810 is installed in such a manner as to cover the EUV irradiation area of the original 833. The EUV light is irradiated to the original 833 through the pellicle film 812.

由原版833所反射的EUV光透過防塵薄膜812,並經由投影光學系統838而向感應基板834照射。 投影光學系統838對由原版833所反射的光進行集光,而向感應基板834照射。於投影光學系統838中包含用以製備EUV的光路的多片多層膜反射鏡835、多層膜反射鏡836等。The EUV light reflected by the original 833 passes through the pellicle film 812 and is irradiated to the sensing substrate 834 via the projection optical system 838. The projection optical system 838 collects light reflected by the original 833 and irradiates the sensing substrate 834. A plurality of multilayer film mirrors 835, a multilayer film mirror 836, and the like for preparing an optical path of the EUV are included in the projection optical system 838.

感應基板834是於半導體晶圓上塗佈有抗蝕劑的基板等,藉由由原版833所反射的EUV,抗蝕劑被曝光為圖案狀。藉由對該抗蝕劑進行顯影,並對半導體晶圓進行蝕刻,而於半導體晶圓形成所需的圖案。The sensing substrate 834 is a substrate or the like on which a resist is applied on a semiconductor wafer, and the resist is exposed in a pattern shape by EUV reflected by the original plate 833. The desired pattern is formed on the semiconductor wafer by developing the resist and etching the semiconductor wafer.

將於2014年5月27日提出申請的日本專利申請案2014-109483所揭示的所有內容以參照的方式併入本說明書中。 關於本說明書中記載的所有文獻、專利申請案、及技術標準,是與以下情況同樣地以參照的方式併入至本說明書中,所述情況為具體且分別記載將各文獻、專利申請案、及技術標準以參照的方式併入的情況。All of the contents disclosed in Japanese Patent Application No. 2014-109483, filed on May 27, 2014, is incorporated herein by reference. All the documents, patent applications, and technical standards described in the present specification are incorporated into the present specification in the same manner as the following, which is specific and separately describes each document, patent application, And the case where technical standards are incorporated by reference.

10‧‧‧一端面
12、12A、12B、12C、12D、22‧‧‧溝槽
14A、14B、16A、16B、16C、16D、24A、24B、114B、124B‧‧‧通孔
20‧‧‧另一端面
30‧‧‧外周面
40‧‧‧內周面
50、127‧‧‧開口部
100、101、103、814‧‧‧防塵薄膜組件框
102、104‧‧‧接著劑層
106‧‧‧剝離襯墊
110‧‧‧防塵薄膜組件框構件
120、140‧‧‧防塵薄膜構件
122‧‧‧內側部分
124‧‧‧外側部分
126‧‧‧支持基板
128‧‧‧切入部
130、812‧‧‧防塵薄膜
200、810‧‧‧防塵薄膜組件
300‧‧‧貼合單元
310‧‧‧貼合腔室
312A、312B‧‧‧排氣管
314、316‧‧‧連通構件
322‧‧‧第1導入管
324、524‧‧‧氣體分散構件
326‧‧‧第2導入管
330、530、540‧‧‧載置板
332‧‧‧升降銷
340‧‧‧感測器
350、550‧‧‧構件進出口
352、552‧‧‧擋門
400‧‧‧搬運機器人
410、412‧‧‧手構件
500‧‧‧切割單元
510‧‧‧切割腔室
512‧‧‧排氣管
514‧‧‧截面具有V字型溝槽的構件
522‧‧‧導入管
532‧‧‧上推部件
600‧‧‧防塵薄膜組件製造裝置
610‧‧‧防塵薄膜構件裝載器
620‧‧‧防塵薄膜組件框構件裝載器
630‧‧‧卸載器
640‧‧‧清洗單元
650‧‧‧檢查單元
660‧‧‧控制部件
670‧‧‧算出部件
700~714‧‧‧步驟
800‧‧‧EUV曝光裝置
820、825‧‧‧濾波窗
831‧‧‧光源
832、835、836‧‧‧多層膜反射鏡
833‧‧‧原版
834‧‧‧感應基板
837‧‧‧照明光學系統
838‧‧‧投影光學系統
850‧‧‧曝光原版
D1、E1、E2、G1、G2、J1、J2、J12、P1‧‧‧箭頭
F‧‧‧吸合力(壓合力)
L1‧‧‧長邊方向的長度
L2‧‧‧短邊方向的長度
t‧‧‧厚度
W‧‧‧框寬
10‧‧‧One end
12, 12A, 12B, 12C, 12D, 22‧‧‧ trench
14A, 14B, 16A, 16B, 16C, 16D, 24A, 24B, 114B, 124B‧‧‧ through holes
20‧‧‧Other end face
30‧‧‧ outer perimeter
40‧‧‧ inner circumference
50, 127‧‧‧ openings
100, 101, 103, 814‧‧‧Plastic membrane module frame
102, 104‧‧‧ adhesive layer
106‧‧‧Release liner
110‧‧‧Plastic membrane module frame member
120, 140‧‧‧Dust film components
122‧‧‧ inside part
124‧‧‧Outer part
126‧‧‧Support substrate
128‧‧‧cutting department
130, 812‧‧‧Dust film
200, 810‧‧‧Dust film assembly
300‧‧‧Finishing unit
310‧‧‧Fitting chamber
312A, 312B‧‧‧ exhaust pipe
314, 316‧‧‧Connected components
322‧‧‧1st introduction tube
324, 524‧‧‧ gas dispersing members
326‧‧‧2nd introduction tube
330, 530, 540‧‧‧ mounting boards
332‧‧‧lifting pin
340‧‧‧ sensor
350, 550‧‧‧ component import and export
352, 552‧‧ ‧ door
400‧‧‧Handling robot
410, 412‧‧‧ hand components
500‧‧‧Cutting unit
510‧‧‧Cutting chamber
512‧‧‧Exhaust pipe
514‧‧‧ Components with V-shaped grooves in section
522‧‧‧Introduction tube
532‧‧‧Pushing parts
600‧‧‧Dust film assembly manufacturing device
610‧‧‧Dust film member loader
620‧‧‧Plastic membrane module frame member loader
630‧‧‧ Unloader
640‧‧‧cleaning unit
650‧‧‧Check unit
660‧‧‧Control components
670‧‧‧ Calculated parts
700-714‧‧‧ steps
800‧‧‧EUV exposure device
820, 825‧‧‧ filter window
831‧‧‧Light source
832, 835, 836‧‧‧ multilayer film mirror
833‧‧‧ original
834‧‧‧Induction substrate
837‧‧‧Lighting optical system
838‧‧‧Projection optical system
850‧‧‧Expo original
D1, E1, E2, G1, G2, J1, J2, J12, P1‧‧‧ arrows
F‧‧‧ suction force (compression force)
L1‧‧‧ Length in the long direction
L2‧‧‧ Length in the short side direction
T‧‧‧thickness
W‧‧‧ frame width

圖1為於本實施方式的防塵薄膜組件製造裝置中,自可觀察到厚度方向的一端面的方向觀察作為貼合對象物之一的防塵薄膜組件框構件的防塵薄膜組件框的一例的概略立體圖。 圖2為自可觀察到厚度方向的另一端面的方向觀察圖1所示的防塵薄膜組件框的概略立體圖。 圖3為圖1的A-A線截面圖。 圖4為自可觀察到厚度方向的一端面的方向觀察本實施方式的變形例的防塵薄膜組件框的概略立體圖。 圖5為表示於本實施方式的防塵薄膜組件製造裝置中,作為貼合對象物之一的防塵薄膜組件框構件的一例的概略截面圖。 圖6為表示於本實施方式的防塵薄膜組件製造裝置中,作為貼合對象物之一的防塵薄膜構件的一例的概略平面圖。 圖7為圖6的B-B線截面圖。 圖8為表示藉由本實施方式的防塵薄膜組件製造裝置而製造的防塵薄膜組件的一例的概略截面圖。 圖9為表示本實施方式的防塵薄膜組件製造裝置中的貼合單元的一例的概略構成圖。 圖10為表示本實施方式的防塵薄膜組件製造裝置中的貼合單元的一例的概略截面圖。 圖11為表示本實施方式的防塵薄膜組件製造裝置中的貼合單元的一例的概略截面圖。 圖12為概念性地表示於本實施方式的一例中,排氣管的其中一個連接於防塵薄膜組件框的通孔的形態的部分截面圖。 圖13為概念性地表示於本實施方式的變形例中,排氣管的其中一個連接於防塵薄膜組件框的通孔的形態的部分截面圖。 圖14為表示本實施方式的一例中的手(hand)構件保持防塵薄膜構件的形態的概略平面圖。 圖15為表示本實施方式的一例中的手構件保持防塵薄膜組件框構件的形態的概略平面圖。 圖16為表示本實施方式的一例中的貼合處理的流程的概略步驟圖。 圖17為表示本實施方式的一例中的貼合處理的流程的概略步驟圖。 圖18為表示本實施方式的一例中的貼合處理的流程的概略步驟圖。 圖19為表示本實施方式的一例中的貼合處理的流程的概略步驟圖。 圖20為表示本實施方式的防塵薄膜組件製造裝置的一例的概略構成圖。 圖21為表示本實施方式的一例中的切割處理的流程的概略步驟圖。 圖22為表示本實施方式的一例中的切割處理的流程的概略步驟圖。 圖23為表示本實施方式的一例中的切割處理的流程的概略步驟圖。 圖24為表示本實施方式的一例中的切割處理的流程的概略步驟圖。 圖25為表示本實施方式的一例的藉由防塵薄膜組件製造裝置的防塵薄膜組件製造流程的一例的流程圖。 圖26為具備藉由本實施方式而製造的防塵薄膜組件的一例的曝光裝置的一例,且為EUV曝光裝置的概略截面圖。1 is a schematic perspective view showing an example of a pellicle frame of a pellicle frame member which is one of the bonding objects in a direction in which one end surface in the thickness direction is observed in the pellicle manufacturing apparatus of the present embodiment. . Fig. 2 is a schematic perspective view of the pellicle frame shown in Fig. 1 as seen from the direction in which the other end face in the thickness direction is observed. Fig. 3 is a cross-sectional view taken along line A-A of Fig. 1; 4 is a schematic perspective view of the pellicle frame according to a modification of the embodiment, in a direction in which one end surface in the thickness direction is observed. FIG. 5 is a schematic cross-sectional view showing an example of a pellicle frame member as one of the bonding targets in the pellicle manufacturing apparatus of the present embodiment. FIG. 6 is a schematic plan view showing an example of a pellicle member which is one of the bonding objects in the pellicle manufacturing apparatus of the present embodiment. Fig. 7 is a sectional view taken along line B-B of Fig. 6; FIG. 8 is a schematic cross-sectional view showing an example of a pellicle film assembly manufactured by the pellicle manufacturing apparatus of the present embodiment. FIG. 9 is a schematic configuration diagram showing an example of a bonding unit in the pellicle manufacturing apparatus of the embodiment. FIG. 10 is a schematic cross-sectional view showing an example of a bonding unit in the pellicle manufacturing apparatus of the embodiment. FIG. 11 is a schematic cross-sectional view showing an example of a bonding unit in the pellicle manufacturing apparatus of the embodiment. FIG. 12 is a partial cross-sectional view conceptually showing a state in which one of the exhaust pipes is connected to the through hole of the pellicle frame in the example of the embodiment. Fig. 13 is a partial cross-sectional view conceptually showing a state in which one of the exhaust pipes is connected to the through hole of the pellicle frame in the modification of the embodiment. FIG. 14 is a schematic plan view showing a state in which a hand member holds a pellicle member in an example of the embodiment. FIG. 15 is a schematic plan view showing a state in which the hand member holds the pellicle frame member in the example of the embodiment. FIG. 16 is a schematic flow chart showing the flow of the bonding process in the example of the embodiment. 17 is a schematic flow chart showing the flow of the bonding process in an example of the embodiment. FIG. 18 is a schematic flowchart showing the flow of the bonding process in the example of the embodiment. FIG. 19 is a schematic flowchart showing the flow of the bonding process in the example of the embodiment. FIG. 20 is a schematic configuration diagram showing an example of a pellicle manufacturing apparatus of the present embodiment. FIG. 21 is a schematic flow chart showing a flow of a cutting process in an example of the embodiment. FIG. 22 is a schematic process diagram showing a flow of a cutting process in an example of the embodiment. FIG. 23 is a schematic flow chart showing a flow of a cutting process in an example of the embodiment. FIG. 24 is a schematic flow chart showing a flow of a cutting process in an example of the embodiment. FIG. 25 is a flowchart showing an example of a manufacturing flow of a pellicle according to an example of the present embodiment. FIG. 26 is a schematic cross-sectional view of an EUV exposure apparatus, which is an example of an exposure apparatus including an example of a pellicle film assembly manufactured by the present embodiment.

12‧‧‧溝槽 12‧‧‧ trench

14A、14B‧‧‧通孔 14A, 14B‧‧‧through holes

100‧‧‧防塵薄膜組件框 100‧‧‧Plastic membrane module frame

102、104‧‧‧接著劑層 102, 104‧‧‧ adhesive layer

106‧‧‧剝離襯墊 106‧‧‧Release liner

110‧‧‧防塵薄膜組件框構件 110‧‧‧Plastic membrane module frame member

120‧‧‧防塵薄膜構件 120‧‧‧Dust film components

122‧‧‧內側部分 122‧‧‧ inside part

124‧‧‧外側部分 124‧‧‧Outer part

130‧‧‧防塵薄膜 130‧‧‧Plastic film

300‧‧‧貼合單元 300‧‧‧Finishing unit

310‧‧‧貼合腔室 310‧‧‧Fitting chamber

E1、E2‧‧‧箭頭 E1, E2‧‧‧ arrows

F‧‧‧吸合力(壓合力) F‧‧‧ suction force (compression force)

Claims (19)

一種防塵薄膜組件製造裝置,其具備貼合單元,所述貼合單元包括: 貼合腔室,進行包含防塵薄膜組件框的防塵薄膜組件框構件與包含防塵薄膜的防塵薄膜構件的貼合,所述防塵薄膜組件框具有設置於厚度方向的一端面及另一端面的至少一者的溝槽以及貫通外周面與所述溝槽的壁面之間的通孔;以及 排氣管,用以於將所述防塵薄膜組件框構件及所述防塵薄膜構件以所述防塵薄膜組件框的設置有所述溝槽的端面與所述防塵薄膜構件相對向的方式配置於所述貼合腔室內的狀態下,經由所述防塵薄膜組件框的所述通孔而對所述溝槽的內部進行排氣。A dust-proof film module manufacturing apparatus comprising: a bonding unit comprising: a bonding chamber; and bonding a pellicle frame member including a pellicle frame to a pellicle member including a pellicle; The pellicle frame has at least one groove disposed at one end surface and the other end surface in the thickness direction, and a through hole penetrating between the outer peripheral surface and the wall surface of the groove; and an exhaust pipe for The pellicle frame member and the pellicle member are disposed in the bonding chamber such that the end surface of the pellicle frame is disposed such that the end surface of the groove faces the pellicle member The inside of the groove is exhausted through the through hole of the pellicle frame. 如申請專利範圍第1項所述的防塵薄膜組件製造裝置,其中所述貼合單元進而包括導入管,所述導入管用以將氣體導入所述貼合腔室內而對所述貼合腔室內進行加壓。The apparatus for manufacturing a pellicle according to claim 1, wherein the bonding unit further includes an introduction tube for introducing a gas into the bonding chamber to perform indoors in the bonding chamber. Pressurize. 如申請專利範圍第2項所述的防塵薄膜組件製造裝置,其中所述導入管包含第1導入管,所述第1導入管自與配置於所述貼合腔室內的所述防塵薄膜組件框構件及所述防塵薄膜構件中的所述防塵薄膜構件相對向之側導入氣體, 所述貼合單元進而包括氣體分散構件, 所述氣體分散構件用以使自所述第1導入管導入的氣體分散。The pellicle manufacturing apparatus according to claim 2, wherein the introduction pipe includes a first introduction pipe, and the first introduction pipe is configured from the pellicle frame disposed in the bonding chamber The member and the pellicle member of the pellicle member are introduced with gas to the side, and the bonding unit further includes a gas dispersing member for introducing a gas introduced from the first introduction pipe dispersion. 如申請專利範圍第1項至第3項中任一項所述的防塵薄膜組件製造裝置,其進而具備保持構件,所述保持構件用以保持所述防塵薄膜構件且將其搬入所述貼合腔室內。The pellicle manufacturing apparatus according to any one of the first to third aspects of the present invention, further comprising a holding member for holding the pellicle member and carrying the pellicle Inside the chamber. 如申請專利範圍第1項至第3項中任一項所述的防塵薄膜組件製造裝置,其中所述防塵薄膜構件包含所述防塵薄膜、以及支持基板,所述支持基板具有開口部且於所述開口部以外的部分對所述防塵薄膜進行支持。The dust-proof film module manufacturing apparatus according to any one of the preceding claims, wherein the dust-proof film member includes the dustproof film and a support substrate, the support substrate having an opening portion The dust-proof film is supported by a portion other than the opening. 如申請專利範圍第4項所述的防塵薄膜組件製造裝置,其中所述防塵薄膜構件包含所述防塵薄膜、以及支持基板,所述支持基板具有開口部且於所述開口部以外的部分對所述防塵薄膜進行支持, 所述保持構件以與所述支持基板接觸且不與所述防塵薄膜接觸的方式保持所述防塵薄膜構件。The pellicle manufacturing apparatus according to claim 4, wherein the pellicle member includes the pellicle and a support substrate, the support substrate having an opening and a portion opposite to the opening The pellicle film is supported, and the holding member holds the pellicle member so as to be in contact with the support substrate and not in contact with the pellicle. 如申請專利範圍第1項至第3項中任一項所述的防塵薄膜組件製造裝置,其中所述貼合單元包括連通構件,所述連通構件於所述貼合腔室內連接於所述排氣管的一端,並使所述排氣管與所述防塵薄膜組件框的所述通孔連通。The pellicle assembly manufacturing apparatus according to any one of claims 1 to 3, wherein the bonding unit includes a communication member, the communication member being connected to the row in the bonding chamber One end of the air tube and the exhaust pipe communicate with the through hole of the pellicle frame. 如申請專利範圍第7項所述的防塵薄膜組件製造裝置,其中所述連通構件被設置為可朝推入所述防塵薄膜組件框的外周面的方向移動。The pellicle manufacturing apparatus according to claim 7, wherein the communication member is provided to be movable in a direction of pushing into an outer peripheral surface of the pellicle frame. 如申請專利範圍第7項所述的防塵薄膜組件製造裝置,其中所述連通構件具有可插入至所述通孔的開口端。The pellicle manufacturing apparatus of claim 7, wherein the communication member has an open end insertable into the through hole. 如申請專利範圍第1項至第3項中任一項所述的防塵薄膜組件製造裝置,其進而具備切割單元,所述切割單元與所述防塵薄膜組件框構件的外周形狀相應地切割所述防塵薄膜構件。The pellicle manufacturing apparatus according to any one of the first to third aspects of the present invention, further comprising a cutting unit, wherein the cutting unit cuts the outer peripheral shape of the pellicle frame member Dust-proof film member. 如申請專利範圍第10項所述的防塵薄膜組件製造裝置,其中所述防塵薄膜構件包含所述防塵薄膜、以及支持基板,所述支持基板具有開口部且於所述開口部以外的部分對所述防塵薄膜進行支持,並且所述支持基板具有切入部,所述切入部用以與所述防塵薄膜組件框構件的外周形狀相應地進行切割。The pellicle manufacturing apparatus according to claim 10, wherein the pellicle member comprises the pellicle film and a support substrate, wherein the support substrate has an opening portion and a portion other than the opening portion The pellicle film is supported, and the support substrate has a cut-in portion for cutting in accordance with an outer peripheral shape of the pellicle frame member. 如申請專利範圍第11項所述的防塵薄膜組件製造裝置,其中所述切割單元包括上推部件,所述上推部件藉由相對於支持基板的比所述切入部更靠外側的部分而上推所述支持基板的比所述切入部更靠內側的部分來切割所述防塵薄膜構件。The pellicle manufacturing apparatus according to claim 11, wherein the cutting unit includes a push-up member that is upper than a portion of the support substrate that is more outward than the cut-in portion The pellicle member is cut by pushing a portion of the support substrate further inside than the cut portion. 如申請專利範圍第12項所述的防塵薄膜組件製造裝置,其中所述切割單元包括: 切割腔室,進行切割所述防塵薄膜構件的操作; 所述上推部件,配置於所述切割腔室內; 導入管,用以將氣體導入所述切割腔室內;以及 氣體分散構件,使藉由所述導入管導入的氣體分散並自與所述上推方向相反的方向吹附至所述內側部分。The apparatus for manufacturing a pellicle according to claim 12, wherein the cutting unit comprises: a cutting chamber for performing an operation of cutting the pellicle member; and the pushing member disposed in the cutting chamber Introducing a tube for introducing a gas into the cutting chamber; and a gas dispersing member that disperses a gas introduced through the introduction tube and blows to the inner portion from a direction opposite to the push-up direction. 如申請專利範圍第10項所述的防塵薄膜組件製造裝置,其進而具備清洗單元,所述清洗單元對經切割的所述防塵薄膜構件進行清洗。The pellicle manufacturing apparatus according to claim 10, further comprising a cleaning unit that cleans the cut pellicle member. 如申請專利範圍第1項至第3項中任一項所述的防塵薄膜組件製造裝置,其進而具備檢查單元,所述檢查單元對所述貼合後的所述防塵薄膜組件框構件及所述防塵薄膜構件進行外觀檢查。The pellicle manufacturing apparatus according to any one of the first to third aspect of the present invention, further comprising an inspection unit, wherein the inspection unit attaches the pellicle frame member and the bonded film module The pellicle member is subjected to visual inspection. 如申請專利範圍第1項至第3項中任一項所述的防塵薄膜組件製造裝置,其具備: 第1測定部件,對與所述防塵薄膜構件貼合前的所述防塵薄膜組件框構件的所述防塵薄膜組件框的形狀進行測定,以及 第2測定部件,對與所述防塵薄膜構件貼合後的所述防塵薄膜組件框構件的所述防塵薄膜組件框的形狀進行測定。The pellicle manufacturing apparatus according to any one of the first to third aspects of the present invention, comprising: a first measuring member; the pellicle frame member before bonding the pellicle member The shape of the pellicle frame is measured, and the second measuring member measures the shape of the pellicle frame of the pellicle frame member that is bonded to the pellicle member. 如申請專利範圍第16項所述的防塵薄膜組件製造裝置,其具備: 對準部件,於將所述防塵薄膜組件框構件與所述防塵薄膜構件貼合前,進行所述防塵薄膜組件框構件與所述防塵薄膜構件的對準;以及 控制部件,基於所述貼合前的所述防塵薄膜組件框的形狀的測定結果與所述貼合後的所述防塵薄膜組件框的形狀的測定結果,對藉由所述對準部件的對準進行前饋控制。The pellicle assembly manufacturing apparatus according to claim 16, comprising: an alignment member that performs the pellicle frame member before bonding the pellicle frame member to the pellicle member Alignment with the pellicle member; and control result of the control member based on the measurement result of the shape of the pellicle frame before the bonding and the shape of the pellicle frame after the bonding Feedforward control by alignment of the alignment components. 如申請專利範圍第16項所述的防塵薄膜組件製造裝置,其具備算出部件,所述算出部件基於所述貼合前的所述防塵薄膜組件框的形狀的測定結果與所述貼合後的所述防塵薄膜組件框的形狀的測定結果的差,來算出因所述貼合而引起的所述防塵薄膜組件框的應變量。The pellicle manufacturing apparatus according to claim 16, comprising: a calculation member that is based on a measurement result of a shape of the pellicle frame before the bonding and the bonding The amount of measurement of the shape of the pellicle frame is determined by the difference in the measurement results of the pellicle frame. 如申請專利範圍第18項所述的防塵薄膜組件製造裝置,其中所述貼合單元包括連通構件,所述連通構件於所述貼合腔室內連接於所述排氣管的一端,並使所述排氣管與所述防塵薄膜組件框的所述通孔連通,並且被設置為可朝推入所述防塵薄膜組件框的外周面的方向移動, 所述算出部件是基於所述應變量而對因所述連通構件而引起的所述防塵薄膜組件框的推入量進行前饋控制的控制部件。The pellicle assembly manufacturing apparatus according to claim 18, wherein the bonding unit includes a communication member that is connected to one end of the exhaust pipe in the bonding chamber, and The exhaust pipe communicates with the through hole of the pellicle frame, and is disposed to be movable in a direction of pushing into an outer peripheral surface of the pellicle frame, the calculation component being based on the strain amount A control member that performs feedforward control on the amount of pushing of the pellicle frame caused by the communicating member.
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