TW201415040A - Method of manufacturing for electric inspection jig - Google Patents

Method of manufacturing for electric inspection jig Download PDF

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Publication number
TW201415040A
TW201415040A TW102128074A TW102128074A TW201415040A TW 201415040 A TW201415040 A TW 201415040A TW 102128074 A TW102128074 A TW 102128074A TW 102128074 A TW102128074 A TW 102128074A TW 201415040 A TW201415040 A TW 201415040A
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TW
Taiwan
Prior art keywords
jig
plate
forming
probe
electrode plate
Prior art date
Application number
TW102128074A
Other languages
Chinese (zh)
Inventor
Hyun-Joon Kim
Myung-Kyu Kim
Kang-Wook Bong
Han-Seo Cho
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Samsung Electro Mech
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Publication of TW201415040A publication Critical patent/TW201415040A/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

Abstract

A method of manufacturing for an electric inspection jig is provided. The method includes the flowing steps. An electrode plate including a surface and the other surface is formed. A step-difference structure is formed on the other surface of the electrode plate according to the height of the electricity-detected object. A wire-insertion hole is formed along the direction perpendicular to the surface of the electrode plate. An electrical wire is inserted to the wire-insertion hole. A first jig plate including a step-difference structure formed in an area corresponding to the step-difference structure of the electrode plate is formed. A probe-insertion hole is formed on the first jig plate, and in an area corresponding to the wire-insertion hole of the electrode plate. The surface forming the step-difference structure of the electrode plate and the surface forming the step-difference structure of the first jig plate are contacted and combined each other.

Description

電力檢測用治具之製造方法 Manufacturing method of electric power detecting jig

本發明為關於電力檢測用治具之製造方法。 The present invention relates to a method of manufacturing a jig for electric power detection.

伴隨著電子機器的多功能化,有關POP(Package On Package,堆疊式封裝)、MCP(Multi-Chip Package,多晶片封裝)之技術也持續發展而越趨普遍化。 With the versatility of electronic devices, technologies related to POP (Package On Package) and MCP (Multi-Chip Package) have continued to grow and become more and more popular.

藉由這樣的技術,以專利文獻US 2008/0216314 A1為例,在封裝基板(例如,印刷電路板)中,與半導體晶片、其他封裝基板、被動元件等接觸的輸入輸出端子之形態已逐漸地多元化。 With such a technique, in the case of a package substrate (for example, a printed circuit board), the form of the input/output terminals that are in contact with semiconductor wafers, other package substrates, passive components, and the like have been gradually formed by the technique of US 2008/0216314 A1. Diversification.

例如,輸入輸出端子也可以是圓凸塊(Round Bump)、扁凸塊(Flat Bump)、裸墊(Bare Pad)、焊珠(Solder Ball)等之形態,上述例子的形態及突出高度皆是不同的。 For example, the input/output terminal may be in the form of a Round Bump, a Flat Bump, a Bare Pad, a Solder Ball, etc., and the form and the protruding height of the above examples are different.

另一方面,在電力檢測時,雖然使用與全部的輸入輸出端子一對一配對之探針來判定輸入輸出端子有無不良,然而在此時常會發生因輸入輸出端子間之突出高度不同,而致使電力檢測變不容易之問題。 On the other hand, in the case of power detection, it is determined whether or not the input/output terminals are defective by using a pair of probes that are paired with all of the input and output terminals. However, at this time, the difference in height between the input and output terminals often occurs. Power detection is not easy.

本發明為欲解決上述習知技術之問題點,目的在 於提供一種能夠適用電力檢測對象之各種突出高度的電力檢測用治具之製造方法。 The present invention is to solve the above problems of the prior art, and the object is A method of manufacturing a power detecting jig capable of applying various protruding heights of an electric power detection target is provided.

本發明之實施例有關的電力檢測用治具之製造 方法,其可包含以下步驟。形成電極板,電極板為具有一表面及其他表面,並於其他面根據電力檢測對象之高度加工成階差構造。以厚度方向為基準,於前述電極板形成電力導線插入用孔。於前述電力導線插入用孔插入電力導線。形成第一治具板,第一治具板為在與前述電極板之階差構造相對應區域,形成有具備與前述電極板之階差相對稱之階差構造。 於前述第一治具板之電力導線插入用孔之相對區域,形成探針插入用孔。使前述電極板與前述第一治具板之階差構造的形成面,彼此接觸而結合。 Manufacture of jig for electric power detection according to an embodiment of the present invention A method, which can include the following steps. The electrode plate is formed, and the electrode plate has a surface and other surfaces, and is processed into a stepped structure on the other surface according to the height of the power detecting object. A power wire insertion hole is formed in the electrode plate with respect to the thickness direction. The power wire is inserted into the aforementioned power wire insertion hole. The first jig plate is formed, and the first jig plate is formed in a region corresponding to the step structure of the electrode plate, and has a step structure having a step difference with respect to the step of the electrode plate. A probe insertion hole is formed in a region opposite to the power wire insertion hole of the first jig plate. The surface on which the electrode plate and the stepping structure of the first jig plate are formed is brought into contact with each other and joined.

本發明之實施例有關的電力檢測用治具之製造 方法,其係更進一步包含:於插入電力導線之步驟後,除去突出於前述電極板的其他面上之電力導線,使之平坦化。 Manufacture of jig for electric power detection according to an embodiment of the present invention The method further includes: after the step of inserting the power conductor, removing the power conductor protruding from the other surface of the electrode plate to planarize it.

本發明之實施例有關的電力檢測用治具之製造 方法,其係更進一步包含:於結合步驟後,在前述第一治具板之底部形成探針插入引導用的第二、第三、第四治具板,第二、第三、第四治具板分別形成與第一治具板的探針插入用孔相對應之探針插入用孔。 Manufacture of jig for electric power detection according to an embodiment of the present invention The method further comprises: after the bonding step, forming a second, third, and fourth jig plate for probe insertion and guiding at the bottom of the first jig plate, the second, third, and fourth treatments Each of the plates has a probe insertion hole corresponding to the probe insertion hole of the first jig plate.

本發明之實施例有關的電力檢測用治具之製造 方法,其係更進一步包含:於形成前述第二、第三、第四治具板步驟後,形成探針固定用的第五治具板,該第五治具板為與前述第四治具板分隔、並形成有與前述第四治具板的探針插入用孔相對應之探針插入用孔。 Manufacture of jig for electric power detection according to an embodiment of the present invention The method further includes: after forming the second, third, and fourth fixture boards, forming a fifth fixture board for fixing the probe, the fifth fixture board being the fourth fixture The plate is partitioned and formed with a probe insertion hole corresponding to the probe insertion hole of the fourth jig plate.

本發明之實施例有關的電力檢測用治具之製造 方法,其係更進一步包含:於形成前述第五治具板步驟前,形成支撐部,支撐部用以支撐並使第四治具板與第五治具板之間分隔。 Manufacture of jig for electric power detection according to an embodiment of the present invention The method further includes: forming a support portion for supporting and separating the fourth jig plate and the fifth jig plate before the step of forming the fifth jig plate.

本發明之實施例有關的電力檢測用治具之製造 方法,其係更進一步包含:於形成前述第五治具板步驟後,於前述第五治具板的底部,形成探針接觸引導用的第六治具板,該第六治具板為形成與前述第五治具板的探針插入用孔相對應之插入用孔。 Manufacture of jig for electric power detection according to an embodiment of the present invention The method further includes: after forming the step of forming the fifth fixture, forming a sixth fixture board for guiding contact of the probe on the bottom of the fifth fixture board, wherein the sixth fixture panel is formed An insertion hole corresponding to the probe insertion hole of the fifth jig plate.

本發明之實施例有關的電力檢測用治具之製造 方法,其係更進一步包含:於形成前述第六治具板步驟後,插入探針,探針插入前述第一、第二、第三、第四、第五、第六治具板的探針插入用孔。 Manufacture of jig for electric power detection according to an embodiment of the present invention The method further comprising: inserting a probe after inserting the probe into the first, second, third, fourth, fifth, and sixth jig plates after the step of forming the sixth jig plate Insert the hole.

本發明之實施例有關的電力檢測用治具之製造 方法,其係於形成電極板之步驟中,在前述電極板之其他面加工階差構造之時,形成逆階梯狀之階差構造。 Manufacture of jig for electric power detection according to an embodiment of the present invention The method is characterized in that, in the step of forming the electrode plate, when the step structure is processed on the other surface of the electrode plate, an stepped structure having an inverse step shape is formed.

本發明之實施例有關的電力檢測用治具製造方 法,其係於前述形成電極板之步驟中,前述電力檢測對象之高度是以基板厚度方向為基準之印刷電路板的輸入輸出端子之突出高度。 Fixture manufacturer for electric power detection according to an embodiment of the present invention In the step of forming the electrode plate, the height of the power detecting target is a protruding height of an input/output terminal of the printed circuit board based on the thickness direction of the substrate.

本發明之實施例有關的電力檢測用治具之製造 方法,其係於前述形成第一治具板之步驟中,在前述第一治具板加工階差構造之時,形成與前述電極板之階差構造相對應之階梯狀之階差構造。 Manufacture of jig for electric power detection according to an embodiment of the present invention The method is the step of forming the first jig plate in the step of forming the stepped structure corresponding to the step structure of the electrode plate when the first jig plate processes the step structure.

本發明之實施例有關的電力檢測用治具之製造 方法,由於是在電極板使用階差構造來製造電力檢測用治具,因而可以期待能夠達到:即便電力檢測對象的輸入輸出端子之高度是不同的,也可適用相同的探針來進行電力檢測的效果。 Manufacture of jig for electric power detection according to an embodiment of the present invention In the method of manufacturing the power detecting jig using the step structure on the electrode plate, it is expected that the same probe can be used for power detection even if the height of the input/output terminal of the power detecting target is different. Effect.

根據本發明之實施例,即使電力檢測對象之輸入 輸出端子的高度皆不同,也可以防止探針與輸入輸出端子間接觸不良,因此可以預防輸入輸出端子因探針所造成的損傷。 According to an embodiment of the present invention, even if an electric power detection object is input The height of the output terminals is different, and the contact between the probe and the input/output terminals can be prevented. Therefore, damage to the input/output terminals due to the probe can be prevented.

根據本發明之實施例,藉由在電極板使用階差構造,使得探針之更換及管理更為容易。 According to an embodiment of the present invention, the replacement and management of the probe is made easier by using a stepped configuration on the electrode plate.

100‧‧‧電力檢測用治具 100‧‧‧Jigs for power testing

110‧‧‧電極板 110‧‧‧electrode plate

110a‧‧‧電極板之一表面 110a‧‧‧One surface of the electrode plate

110b‧‧‧電極板之其他表面 110b‧‧‧Other surfaces of the electrode plates

111‧‧‧電極板之階差 111‧‧‧Steps of the electrode plate

120‧‧‧治具板 120‧‧ ‧ fixture board

121‧‧‧第一治具板 121‧‧‧First fixture board

122‧‧‧第二治具板 122‧‧‧Second fixture board

123‧‧‧第三治具板 123‧‧‧ Third fixture board

124‧‧‧第四治具板 124‧‧‧ Fourth Fixture Board

125‧‧‧第五治具板 125‧‧‧The fifth fixture board

126‧‧‧第六治具板 126‧‧‧ sixth fixture board

130‧‧‧電力導線 130‧‧‧Power wire

140‧‧‧支撐部 140‧‧‧Support

150‧‧‧探針 150‧‧‧ probe

160‧‧‧第一治具板之階差 160‧‧‧Steps of the first fixture board

170‧‧‧探針插入用孔 170‧‧‧ probe insertion hole

200‧‧‧電力檢測對象 200‧‧‧Power test objects

210a、210b、210c、210d、210e‧‧‧輸入輸出端子 210a, 210b, 210c, 210d, 210e‧‧‧ input and output terminals

A‧‧‧長度 A‧‧‧ length

第1圖為用以說明有關本發明之實施例的電力檢測用治具之製造方法的工程剖面圖。 Fig. 1 is a cross-sectional view showing the construction of a method for manufacturing a power detecting jig according to an embodiment of the present invention.

第2圖為用以說明有關本發明之實施例的電力檢測用治具之製造方法的工程剖面圖。 Fig. 2 is a cross-sectional view showing the construction of a method for manufacturing a power detecting jig according to an embodiment of the present invention.

第3圖為用以說明有關本發明之實施例的電力檢測用治具之製造方法的工程剖面圖。 Fig. 3 is a cross-sectional view showing the construction of a method for manufacturing a power detecting jig according to an embodiment of the present invention.

第4圖為用以說明有關本發明之實施例的電力檢測用治具之製造方法的工程剖面圖。 Fig. 4 is a cross-sectional view showing the construction of a method for manufacturing a power detecting jig according to an embodiment of the present invention.

第5圖為用以說明有關本發明之實施例的電力檢 測用治具之製造方法的工程剖面圖。 Figure 5 is a diagram for explaining power inspection in accordance with an embodiment of the present invention An engineering sectional view of the manufacturing method of the measuring jig.

第6圖為用以說明有關本發明之實施例的電力檢 測用治具之製造方法的工程剖面圖。 Figure 6 is a diagram for explaining power inspection in accordance with an embodiment of the present invention An engineering sectional view of the manufacturing method of the measuring jig.

第7圖為用以說明有關本發明之實施例的電力檢 測用治具之製造方法的工程剖面圖。 Figure 7 is a diagram for explaining power inspection in accordance with an embodiment of the present invention An engineering sectional view of the manufacturing method of the measuring jig.

第8圖為用以說明有關本發明之實施例的電力檢 測用治具之製造方法的工程剖面圖。 Figure 8 is a diagram for explaining power inspection in accordance with an embodiment of the present invention An engineering sectional view of the manufacturing method of the measuring jig.

第9圖為用以說明有關本發明之實施例的電力檢 測用治具之製造方法的工程剖面圖。 Figure 9 is a diagram for explaining power inspection in accordance with an embodiment of the present invention An engineering sectional view of the manufacturing method of the measuring jig.

第10圖為用以說明有關本發明之實施例的電力 檢測用治具之製造方法的工程剖面圖。 Figure 10 is a diagram for explaining electric power relating to an embodiment of the present invention. An engineering sectional view of a manufacturing method for detecting a jig.

本發明之目的、特定的長處及新穎的特徴,可以藉由與添附圖式有關之以下的詳細說明及實施例而變得更明白。在本說明書中,於各圖式的構成要素上附加參照號碼時,只要是同一構成要素,即使是顯示在不同的圖式上亦儘可能地附記同一個號碼,關於此點務必請留意。此外,「一面」、「其他面」、「第一」、「第二」等之用語是用以區別一個構成要素、其他的構成要素而使用,但構成要素並非因此而受到前述用語之限定。以下,在說明本發明時,對於具有致使本發明的要旨不明瞭之可能性的有關公知技術,省略其詳細說明。 The details of the invention, the specific advantages and the novel features of the invention will be apparent from In the present specification, when a reference number is added to each component of each drawing, as long as it is the same component, the same number is attached as much as possible even if it is displayed on a different drawing. Please pay attention to this point. In addition, terms such as "one side", "other side", "first", and "second" are used to distinguish one component from another, but the constituent elements are not limited by the above terms. In the following, in the description of the present invention, detailed descriptions of known related art that have the possibility of causing the gist of the present invention are omitted.

以下,參照添附之圖式來詳細地說明本發明之實施例。 Hereinafter, embodiments of the present invention will be described in detail with reference to the appended drawings.

第1圖至第10圖為說明本發明之實施例有關的電力檢測用治具之製造方法的工程剖面圖。 1 to 10 are engineering sectional views for explaining a method of manufacturing a jig for electric power detection according to an embodiment of the present invention.

以下,電力檢測用治具(第10圖之100)之意係指:用以進行確認印刷電路基板中的複數個電路圖案,是否有按照圖樣設計正常地形成之電力檢測裝置的治具。 Hereinafter, the jig for electric power detection (100 of FIG. 10) means a jig for confirming a plurality of circuit patterns in a printed circuit board, and whether or not there is a power detecting device that is normally formed in accordance with the pattern design.

如第1圖及第2圖所示,於電力檢測用治具(第10圖之100)之製造方法中,形成電極板110,電極板110為具有一表面110a及其他表面110b、並於其他表面110b上根據電力檢測對象(第10圖之200)之高度加工成階差111構造。 As shown in FIGS. 1 and 2, in the manufacturing method of the power detecting jig (100 of FIG. 10), the electrode plate 110 is formed, and the electrode plate 110 has a surface 110a and other surfaces 110b, and other The surface 110b is formed into a step 111 structure in accordance with the height of the power detecting object (200 in Fig. 10).

此外,於電極板110形成階差構造時,可以考慮電力檢測對象(特別是輸入輸出端子(第10圖之210a、210b、210c、210d、210e))之突出高度而決定階差111的各別高度。 Further, when the electrode plate 110 is formed with a stepped structure, the respective heights of the step 111 can be determined in consideration of the protruding height of the power detecting object (particularly the input/output terminals (210a, 210b, 210c, 210d, 210e of FIG. 10)). height.

參照第10圖來說明,藉由於電極板110上形成之階差構造,即可以期待能夠達到:即使安裝相同長度A之探針150,也能適用於彼此高度不同的電力檢測對象200的效果。 Referring to Fig. 10, it can be expected that the probe 150 having the same length A can be applied to the power detection target 200 having a different height from each other by the step structure formed on the electrode plate 110.

於形成前述電極板110之步驟中,如第2圖所示,在電極板110之其他表面110b上加工成階差構造時,可形成為逆階梯狀之階差構造。 In the step of forming the electrode plate 110, as shown in Fig. 2, when the stepped structure is processed on the other surface 110b of the electrode plate 110, a stepped structure having an inverse step shape can be formed.

另一方面,電極板110之階差111構造可以根據使用者的需要而為階梯狀或無規則狀中之任何者。 On the other hand, the step 111 configuration of the electrode plate 110 can be any of a stepped or irregular shape according to the needs of the user.

此時,無規則狀的定義係指:階差111構造的形 態不是依次變高或依次降低,而是根據使用者的需要,將特定區域之階差加工成比其他階差高或低之構造。 At this time, the definition of the irregular shape refers to the shape of the step 111 structure. The state does not become higher or lower in turn, but the step of the specific region is processed to be higher or lower than the other steps according to the needs of the user.

在一實施例中,前述電力檢測對象(第10圖之200) 之高度,亦可以是以基板厚度方向為基準之印刷電路板之輸入輸出端子(第10圖之210a、210b、210c、210d、210e)的突出高度。 In an embodiment, the foregoing power detection object (200 of FIG. 10) The height may be the protrusion height of the input/output terminals (210a, 210b, 210c, 210d, 210e in Fig. 10) of the printed circuit board based on the thickness direction of the substrate.

接著,如第3圖所示,可於電極板110上形成以厚度方向為基準之電力導線插入用孔113。 Next, as shown in FIG. 3, a power wire insertion hole 113 based on the thickness direction can be formed on the electrode plate 110.

此時,電力導線插入用孔113可以使用電腦數值控制(Computerized Numerical Control,CNC)鑽頭等機械鑽頭加工而成。 At this time, the power wire insertion hole 113 can be processed using a mechanical drill such as a computerized numerical control (CNC) drill.

接著,如第4圖所示,電力導線插入用孔113可插入電力導線130。 Next, as shown in FIG. 4, the power wire insertion hole 113 can be inserted into the power wire 130.

接著,如第5圖及第6圖所示,可除去突出於電極板110之其他表面110b上之電力導線130,使之平坦化。 Next, as shown in FIGS. 5 and 6, the power wires 130 protruding from the other surfaces 110b of the electrode plate 110 can be removed and planarized.

接著,如第7圖及第8圖所示,可形成第一治具板121,第一治具板121在與電極板110的階差111構造相對的區域,形成有與電極板的階差相對稱之階差160構造。 Next, as shown in FIGS. 7 and 8, a first jig plate 121 may be formed, and the first jig plate 121 is formed with a step difference from the electrode plate in a region opposite to the step 111 of the electrode plate 110. The relative scale is 160.

此時,於形成第一治具板121之步驟,對前述第一治具板121進行加工階差構造時,可形成階梯狀階差160構造,該階梯狀階差160構造與電極板110的階差111構造相對應。 At this time, in the step of forming the first jig plate 121, when the first jig plate 121 is processed into a step structure, a stepped step 160 structure may be formed, and the stepped step 160 is configured to be the electrode plate 110. The step 111 configuration corresponds.

另一方面,電極板110之階差111構造,可以根據使用者需要而為階梯狀或無規則狀中之任一種,在這種情 況下,第一治具板121之階差構造也可以變更成能夠再次相對應的形狀。 On the other hand, the step 111 of the electrode plate 110 is configured to be either stepped or irregular according to the needs of the user. In other words, the step structure of the first jig plate 121 may be changed to a shape that can be corresponding again.

接著,如第8圖所示,可在第一治具板121上, 與電力導線插入用孔113之相對區域處形成探針插入用孔170。 Then, as shown in FIG. 8, on the first jig plate 121, A probe insertion hole 170 is formed at a region opposite to the power wire insertion hole 113.

接著,如第9圖所示,可將電極板110與第一治 具板121之階差構造之形成面彼此接觸結合。 Next, as shown in FIG. 9, the electrode plate 110 and the first treatment can be The forming faces of the stepped structures having the plates 121 are in contact with each other.

接著,如第10圖所示,可於第一治具板121底 部,形成探針插入引導用第二、第三、第四治具板122、123、124,探針插入引導用第二、第三、第四治具板122、123、124分別形成有與第一治具板121的探針插入用孔170相對應之探針插入用孔。 Then, as shown in FIG. 10, at the bottom of the first fixture board 121 The second, third, and fourth jig plates 122, 123, and 124 for probe insertion and guidance are formed, and the second, third, and fourth jig plates 122, 123, and 124 for probe insertion and guide are respectively formed with The probe insertion hole 170 corresponds to the probe insertion hole of the first jig plate 121.

前述第二、第三、第四治具板122、123、124為 探針插入引導用,並可以擔任進行固定探針的作用,使得被插入並結合於第一治具板121的底部之探針150能夠接觸到電極板110的電極部(未圖示)。 The second, third, and fourth jig plates 122, 123, and 124 are The probe is inserted for guiding and can serve as a fixing probe so that the probe 150 inserted and bonded to the bottom of the first jig plate 121 can contact the electrode portion (not shown) of the electrode plate 110.

接著,如第10圖所示,可形成有支撐部140,該 支撐部140用以支撐並使第四治具板124與第五治具板125之間分隔。 Next, as shown in FIG. 10, a support portion 140 may be formed, which The support portion 140 is used to support and separate the fourth jig plate 124 from the fifth jig plate 125.

接著,如第10圖所示,可形成探針固定用第五 治具板125,第五治具板125與第四治具板124分隔,並形成與第四治具板124的探針插入用孔(未圖示)相對應之探針插入用孔。 Next, as shown in Fig. 10, a fifth probe can be formed. The jig plate 125, the fifth jig plate 125 is partitioned from the fourth jig plate 124, and a probe insertion hole corresponding to the probe insertion hole (not shown) of the fourth jig plate 124 is formed.

接著,如第10圖所示,於第五治具板125之底 部,形成有探針接觸引導用的第六治具板126,第六治具板126具有與第五治具板125之探針插入用孔相對應之探針插入用孔。 Next, as shown in FIG. 10, at the bottom of the fifth fixture board 125 The sixth jig plate 126 for probe contact guiding is formed, and the sixth jig plate 126 has a probe insertion hole corresponding to the probe insertion hole of the fifth jig plate 125.

接著,如第10圖所示,可將探針150插入第一、 第二、第三、第四、第五、第六治具板121、122、123、124、125、126之探針插入用孔。 Next, as shown in FIG. 10, the probe 150 can be inserted into the first, Probe insertion holes for the second, third, fourth, fifth, and sixth jig plates 121, 122, 123, 124, 125, and 126.

此時,探針150會與電力檢測對象200(例如,印 刷電路板)的檢測位置(例如,第10圖之輸入輸出端子210a、210b、210c、210d、210e)導電接觸,並且會與電極板110之電極部(未圖示)導電接觸。 At this time, the probe 150 will be associated with the power detection object 200 (for example, printing The detection position of the brush circuit board (for example, the input/output terminals 210a, 210b, 210c, 210d, 210e of FIG. 10) is in conductive contact, and is in conductive contact with the electrode portion (not shown) of the electrode plate 110.

此外,電極板110將電力檢測時檢測出之信號傳 達至檢測裝置(未圖示)。 In addition, the electrode plate 110 transmits a signal detected during power detection. A detection device (not shown) is reached.

前述探針150,其與檢測區域及電極板之電極部 接觸的部分係由可電性連接之金屬材質所形成,其他部分可以絕緣材質覆蓋的形態形成。 The probe 150, the detection region and the electrode portion of the electrode plate The contact portion is formed by a metal material that can be electrically connected, and the other portion can be formed by an insulating material.

如上所述,於本發明之實施例中,藉由使電極板 具有階差構造,即便電力檢測對象之接觸區域之高度是不同的,也可以防止因探針與電力檢測對象之接觸區域間之非接觸或接觸所造成的接觸區域損傷。 As described above, in the embodiment of the present invention, by making the electrode plate With the step structure, even if the height of the contact area of the power detecting object is different, the contact area damage caused by the non-contact or contact between the probe and the contact area of the power detecting object can be prevented.

再者,依據本發明之實施例,可以適用於藉由電 極板之階差構造,而使之標準化成具有相同長度的探針。 Furthermore, according to an embodiment of the present invention, it can be applied to electricity The steps of the plates are constructed to normalize them to probes of the same length.

更詳細地說明,在探針的長度差異為無法以目視 確認的程度時,例如,10μm~100μm,根據電力檢測對象之接觸區域的高度差來更換探針,實質上是有困難的。然而,若 根據本發明之實施例,因可省略上述更換探針之作業,所以能夠提高電力檢測對象之電力檢測効率,更能提升印刷電路板的生產率。 Explaining in more detail, the difference in the length of the probe is not visually In the case of the degree of confirmation, for example, 10 μm to 100 μm, it is substantially difficult to replace the probe based on the difference in height of the contact area of the power detection target. However, if According to the embodiment of the present invention, since the operation of replacing the probe can be omitted, the power detection efficiency of the power detection target can be improved, and the productivity of the printed circuit board can be further improved.

以上,雖然是基於具體的實施例詳細地說明本發明了,然而該等是用以具體地說明本發明而已,本發明不限定於此,只要是具有該領域中之通常知識者皆可以明白:在本發明之技術的思想內的變形及改良的可能性。 The present invention has been described above in detail based on the specific embodiments. However, the present invention is specifically described by the present invention, and the present invention is not limited thereto, as long as it is known to those skilled in the art: Variations and improvements in the idea of the technology of the present invention.

本發明之單純的變形或變更中之任一者皆屬於本發明的領域,而且本發明之具體的保護範圍藉由附加的專利申請範圍而變得明確。 It is intended that the present invention be construed as being limited by the scope of the appended claims.

100‧‧‧電力檢測用治具 100‧‧‧Jigs for power testing

110‧‧‧電極板 110‧‧‧electrode plate

120‧‧‧治具板 120‧‧ ‧ fixture board

121‧‧‧第一治具板 121‧‧‧First fixture board

122‧‧‧第二治具板 122‧‧‧Second fixture board

123‧‧‧第三治具板 123‧‧‧ Third fixture board

124‧‧‧第四治具板 124‧‧‧ Fourth Fixture Board

125‧‧‧第五治具板 125‧‧‧The fifth fixture board

126‧‧‧第六治具板 126‧‧‧ sixth fixture board

130‧‧‧電力導線 130‧‧‧Power wire

140‧‧‧支撐部 140‧‧‧Support

150‧‧‧探針 150‧‧‧ probe

200‧‧‧電力檢測對象 200‧‧‧Power test objects

210a、210b、210c、210d、210e‧‧‧輸入輸出端子 210a, 210b, 210c, 210d, 210e‧‧‧ input and output terminals

A‧‧‧長度 A‧‧‧ length

Claims (10)

一種電力檢測用治具之製造方法,其包含:形成電極板,該電極板具有一表面及一其他表面,於該其他面根據一電力檢測對象之高度加工成一階差構造;以厚度方向為基準,於該電極板形成一電力導線插入用孔;插入一電力導線於該電力導線插入用孔;在與該電極板之階差構造的相對應區域,形成一第一治具板,該第一治具板具有與該電極板之階差相對稱之階差構造;於該第一治具板上與該電力導線插入用孔之相對應區域形成一探針插入用孔;以及使該電極板與該第一治具板之階差構造的形成面彼此接觸而結合。 A manufacturing method of a power detecting jig, comprising: forming an electrode plate having a surface and a other surface, wherein the other surface is processed into a stepped structure according to a height of a power detecting object; and the thickness direction is used as a reference Forming a power wire insertion hole in the electrode plate; inserting a power wire into the power wire insertion hole; forming a first jig plate corresponding to a stepped structure of the electrode plate, the first The jig plate has a stepped structure symmetrical with the step of the electrode plate; a probe insertion hole is formed in a corresponding region of the first jig plate and the power wire insertion hole; and the electrode plate is made The forming faces of the stepped structure of the first jig plate are brought into contact with each other and joined. 如申請專利範圍第1項所記載之電力檢測用治具之製造方法,更包含:於插入該電力導線之步驟後,除去突出於該電極板的其他表面上之電力導線,使該電極板的其他表面平坦化。 The method for manufacturing a jig for power detection according to claim 1, further comprising: after inserting the power wire, removing a power wire protruding from another surface of the electrode plate to make the electrode plate Other surfaces are flattened. 如申請專利範圍第1項所記載之電力檢測用治具之製造方法,更包含:於該結合步驟後,在該第一治具板之底部形成探針插入引導用的一第二治具板、一第三治具板、一第四治具板,該第二、第三、第四治具板分別形成有與該第一治具板的探針插入用孔相對 應之探針插入用孔。 The method for manufacturing a jig for electric power detection according to claim 1, further comprising: forming a second jig plate for guiding the probe insertion at the bottom of the first jig plate after the bonding step a third jig plate and a fourth jig plate, wherein the second, third, and fourth jig plates are respectively formed opposite to the probe insertion holes of the first jig plate The probe should be inserted into the hole. 如申請專利範圍第3項所記載之電力檢測用治具之製造方法,更包含:於形成該第二、第三、第四治具板步驟後,形成固定探針用的一第五治具板,該第五治具板與該第四治具板分隔,並形成與該第四治具板的探針插入用孔相對應之探針插入用孔。 The method for manufacturing a jig for electric power detection according to claim 3, further comprising: forming a second jig for fixing the probe after the step of forming the second, third, and fourth jigs The plate, the fifth jig plate is partitioned from the fourth jig plate, and a probe insertion hole corresponding to the probe insertion hole of the fourth jig plate is formed. 如申請專利範圍第4項所記載之電力檢測用治具之製造方法,更包含:於形成該第五治具板步驟前,形成一支撐部,該支撐部用以支撐並使該第四治具板與該第五治具板之間分隔。 The method for manufacturing a jig for electric power detection according to the fourth aspect of the invention, further comprising: forming a support portion for supporting and making the fourth treatment before the step of forming the fifth jig plate The board is separated from the fifth fixture board. 如申請專利範圍第4項所記載之電力檢測用治具之製造方法,更包含:於形成該第五治具板步驟後,於該第五治具板的底部,形成探針接觸引導用的一第六治具板,該第六治具板形成為具有與該第五治具板的探針插入用孔相對應之插入用孔。 The method for manufacturing a power detecting jig according to the fourth aspect of the invention, further comprising: forming a probe contact guide at a bottom portion of the fifth jig plate after the step of forming the fifth jig plate A sixth jig plate is formed with an insertion hole corresponding to the probe insertion hole of the fifth jig plate. 如申請專利範圍第6項所記載之電力檢測用治具之製造方法,更包含:於形成該第六治具板步驟後,插入一探針,該探針插入該第一、第二、第三、第四、第五、第六治具板的探針插入用孔。 The method for manufacturing a jig for electric power detection according to claim 6, further comprising: inserting a probe after inserting the first jig, and inserting the probe into the first, second, and 3. The probe insertion hole of the fourth, fifth, and sixth jig plates. 如申請專利範圍第1項所記載之電力檢測用治具之製造方法,其係於該形成電極板之步驟中,在該電極板之其他面加工階差構造之時,形成一逆階梯狀之階差構造。 The method for manufacturing a jig for electric power detection according to claim 1, wherein in the step of forming the electrode plate, when the stepped structure is processed on the other surface of the electrode plate, an inverse stepped shape is formed. Step structure. 如申請專利範圍第1項所記載之電力檢測用治具之製造方法,其係於該形成電極板之步驟中,該電力檢測對象之高度是以基板厚度方向為基準之一印刷電路板的輸入輸出端子之突出高度。 The method for manufacturing a jig for electric power detection according to claim 1, wherein the height of the electric power detection target is an input of a printed circuit board based on a thickness direction of the substrate. The protruding height of the output terminal. 如申請專利範圍第1項所記載之電力檢測用治具之製造方法,其係於該形成第一治具板之步驟中,在該第一治具板加工階差構造之時,形成與該電極板之階差構造相對應之階梯狀之階差構造。 The method for manufacturing a jig for electric power detection according to claim 1, wherein in the step of forming the first jig plate, when the first jig plate is processed in a step structure, the method is formed The step structure of the electrode plate corresponds to a stepped step structure.
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