TW201411114A - Polarization measuring process, polarization measuring apparatus, polarization measuring system and photo-alignment irradiation apparatus - Google Patents

Polarization measuring process, polarization measuring apparatus, polarization measuring system and photo-alignment irradiation apparatus Download PDF

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TW201411114A
TW201411114A TW102125190A TW102125190A TW201411114A TW 201411114 A TW201411114 A TW 201411114A TW 102125190 A TW102125190 A TW 102125190A TW 102125190 A TW102125190 A TW 102125190A TW 201411114 A TW201411114 A TW 201411114A
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light
polarizer
polarization
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unit
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TWI585387B (en
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Hirokazu Ishitobi
Yasufumi Kawanabe
Yukimasa Saito
Eiichi Azami
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Iwasaki Electric Co Ltd
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Priority claimed from JP2013137899A external-priority patent/JP5516802B1/en
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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1337Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
    • G02F1/13378Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by treatment of the surface, e.g. embossing, rubbing or light irradiation
    • G02F1/133788Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by treatment of the surface, e.g. embossing, rubbing or light irradiation by light irradiation, e.g. linearly polarised light photo-polymerisation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light
    • G01J4/04Polarimeters using electric detection means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/10Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/281Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising used for attenuating light intensity, e.g. comprising rotatable polarising elements
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1335Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133528Polarisers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/10Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J2001/161Ratio method, i.e. Im/Ir
    • G01J2001/1615Computing a difference/sum ratio, i.e. (Im - Ir) / (Im + Ir)

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

To measure a polarization property of polarization light with high accuracy. Based on a light amount I of light at each rotating angle θ obtained by detecting the light transmitted through in order of a wire grid polarizer 16 and a detecting side polarizer 33 with rotating the detecting side polarizer 33, a change curve Q is calculated which shows periodical change of the light amount I when the detecting side polarizer 33 is rotated. In a case where a polarization property of polarization light F transmitted through the wire grid polarizer 16 is specified based on the change curve Q, the change curve Q is calculated based on the light amount I at the rotating angle θ that is included in a range W of the rotating angle θ which has the rotating angle θ = θ that is one minimum point of the change curve Q and in which the light amount I is lower than or equal to a predetermined value.

Description

偏光測定方法,偏光測定裝置,偏光測定系統及光配向照射裝置 Polarized light measuring method, polarized light measuring device, polarized light measuring system and optical alignment irradiating device

本發明係關於一種偏光光線之測定技術。 The present invention relates to a technique for measuring polarized light.

一直以來,已知有一種藉由對配向膜、或配向層(以下,將其等稱為「光配向膜」)照射偏光光線而進行配向的被稱為光配向之技術,該光配向被廣泛應用於液晶顯示面板之液晶顯示元件所具備之液晶配向膜之配向等。 A technique called optical alignment in which an alignment film or an alignment layer (hereinafter referred to as "optical alignment film") is irradiated with polarized light is known, and the optical alignment is widely used. It is applied to the alignment of a liquid crystal alignment film provided in a liquid crystal display element of a liquid crystal display panel.

用於光配向之照射裝置一般而言具備光源、及偏光片,使光源之光通過偏光片而獲得偏光光線。近年來,為了對較長之帶狀之光配向膜進行光配向,已知有如下照射裝置,即,將長度與光配向膜之寬度相當之棒狀燈作為光源,將數個偏光片排列於棒狀燈之長軸方向上,藉此照射線狀之偏光光線,且亦提出有如下技術,即,使帶狀之光配向膜之寬度方向與該照射裝置之偏光光線之照射區域延伸之方向吻合,於長度方向上搬送該光配向膜,藉此對帶狀之光配向膜均勻地進行光配向(例如,參照專利文獻1)。 An illumination device for light alignment generally includes a light source and a polarizer, and the light of the light source passes through the polarizer to obtain polarized light. In recent years, in order to perform light alignment on a long strip-shaped light alignment film, there has been known an irradiation apparatus in which a rod-shaped lamp having a length corresponding to the width of a light alignment film is used as a light source, and a plurality of polarizers are arranged. In the direction of the long axis of the rod lamp, the linear polarized light is irradiated, and a technique is also proposed in which the width direction of the strip-shaped light alignment film and the irradiation region of the polarized light of the irradiation device are extended. By adhering the light alignment film in the longitudinal direction, the band-shaped photoalignment film is uniformly optically aligned (for example, see Patent Document 1).

作為對光配向之品質產生影響之偏光光線之因素,已知有消光比、及偏光軸分佈之不均這兩個,作為光配向所使用之照射裝置,重要的是其等已以較高之精度經調整。作為測定該等消光比或偏光軸等偏光特性之技術,一直以來提出有各種技術(例如,參照專利文獻2~ 專利文獻4)。 As a factor of the polarized light that affects the quality of the light alignment, there are known two kinds of the extinction ratio and the uneven distribution of the polarization axis. As an irradiation device used for the optical alignment, it is important that the light is higher. The accuracy is adjusted. As techniques for measuring polarization characteristics such as the extinction ratio or the polarization axis, various techniques have been proposed (for example, refer to Patent Document 2~ Patent Document 4).

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本專利特開2004-163881號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2004-163881

[專利文獻2]日本專利特開2004-226209號公報 [Patent Document 2] Japanese Patent Laid-Open Publication No. 2004-226209

[專利文獻3]日本專利特開2005-227019號公報 [Patent Document 3] Japanese Patent Laid-Open Publication No. 2005-227019

[專利文獻4]日本專利特開2007-127567號公報 [Patent Document 4] Japanese Patent Laid-Open Publication No. 2007-127567

為了使用光配向而獲得高品質之液晶配向膜,必須照射消光比較高且偏光軸以誤差0.1°以內之精度經調整之偏光光線。為了以誤差0.1°以內之精度調整偏光軸,而要求測定精度之誤差為0.01°以內,但於將放電燈作為光源之照射裝置中,因該放電燈之點燈電力之波動等而使光量產生波動(閃爍),因此,無能夠以滿足此種要求之精度測定偏光光線之偏光特性之技術。 In order to obtain a high-quality liquid crystal alignment film by using light alignment, it is necessary to irradiate a polarized light whose extinction is relatively high and whose polarization axis is adjusted with an accuracy of 0.1° or less. In order to adjust the polarization axis with an accuracy of less than 0.1°, the error of the measurement accuracy is required to be within 0.01°, but in the irradiation device using the discharge lamp as a light source, the amount of light is generated due to the fluctuation of the lighting power of the discharge lamp or the like. Fluctuation (flickering), therefore, there is no technique for measuring the polarization characteristics of polarized light with the accuracy of such a requirement.

習知之方法中,有如下問題:由於光量產生波動,故而必須藉由反覆進行多次相同之測定並取得平均而提高反覆精度,測定需要時間。 In the conventional method, there is a problem that since the amount of light fluctuates, it is necessary to repeatedly perform the same measurement and obtain an average to improve the repeating accuracy, and the measurement takes time.

作為測定偏光軸之技術,提出有針對每個偏光片測定偏光軸之技術。此技術可使用一直以來便有之偏光測定技術。然而,上述方法中,由於朝偏光測定器之光線取入之角度較淺,故而無法測定實際照射至位於通過數個偏光片之偏光光線重合而照射之各種位置之載置台上之光配向膜的光之偏光特性。 As a technique for measuring a polarization axis, a technique for measuring a polarization axis for each polarizer has been proposed. This technology can use the polarization measurement technology that has been used for a long time. However, in the above method, since the angle of the light taken into the polarimeter is shallow, it is impossible to measure the photoalignment film which is actually irradiated onto the mounting table at various positions irradiated by the polarized rays of the plurality of polarizers. The polarization characteristics of light.

本發明係鑒於上述情況而完成者,其目的在於提供一種 可精度良好地測定偏光光線之偏光特性之偏光測定方法、偏光測定裝置、偏光測定系統及光配向照射裝置。 The present invention has been made in view of the above circumstances, and an object thereof is to provide a A polarization measuring method, a polarization measuring device, a polarization measuring system, and a light alignment irradiating device capable of accurately measuring the polarization characteristics of polarized light.

為了達成上述目的,本發明提供一種偏光測定方法,其特徵在於具備:第1步驟,其係根據將依序透過第1偏光片、及第2偏光片之光一邊使上述第2偏光片轉動而一邊進行檢測而所獲得之在各轉動角度之光之光量,而求出表示上述第2偏光片於旋轉時之上述光量之週期性變化之變化曲線;及第2步驟,其係根據上述第1步驟中所求出之變化曲線,特定透過上述第1偏光片之偏光光線之偏光特性;且在上述第1步驟中,根據包含上述變化曲線之1個極小點且包含於上述光量成為既定值以下之上述轉動角度之範圍中之在上述轉動角度之上述光量,而求出上述變化曲線。 In order to achieve the above object, the present invention provides a method of measuring a polarized light, comprising: a first step of rotating the second polarizer while sequentially transmitting light of the first polarizer and the second polarizer; a change curve indicating a periodic change of the amount of light of the second polarizer at the time of rotation while detecting the amount of light of each of the rotation angles obtained by the detection; and a second step based on the first The change curve obtained in the step specifically defines a polarization characteristic of the polarized light transmitted through the first polarizer; and in the first step, the light amount is equal to or less than a predetermined value based on one minimum point including the change curve The above-described variation curve is obtained by the amount of light at the above-described rotation angle in the range of the above-described rotation angle.

又,本發明係如上述偏光測定方法,其特徵在於具備:第3步驟,其係根據包含與上述第1步驟不同之1個極小點且包含於上述光量成為既定值以下之上述轉動角度之範圍中之在上述轉動角度之上述光量,而求出上述變化曲線;第4步驟,其係根據上述第3步驟中所求出之變化曲線,特定透過上述第1偏光片之偏光光線之偏光特性;及第5步驟,其係根據在上述第2步驟、及第4步驟各自所特定之上述偏光特性之平均,特定透過上述第1偏光片之偏光光線之偏光特性。 Further, the present invention is characterized in that the third method includes a third step of including a minimum point different from the first step and the range of the rotation angle included in the light amount being equal to or less than a predetermined value. The change curve is obtained by the light amount at the rotation angle; and the fourth step is to specify a polarization characteristic of the polarized light transmitted through the first polarizer according to the change curve obtained in the third step; And a fifth step of specifying a polarization characteristic of the polarized light transmitted through the first polarizer based on an average of the polarization characteristics specified in each of the second step and the fourth step.

又,本發明係如上述偏光測定方法,其特徵在於:上述既定值為上述光量之最大值之約20%之光量。 Further, the present invention is the polarization measuring method described above, characterized in that the predetermined value is a light amount of about 20% of a maximum value of the light amount.

又,本發明係如上述偏光測定方法,其特徵在於:根據對應於上述變化曲線所表示之光量之最大值之轉動角度而特定透過上 述第1偏光片之偏光光線之偏光軸,以及/或者,根據上述變化曲線所表示之最大值與最小值、或上述第2偏光片轉動至根據上述變化曲線所特定之偏光光線之偏光軸之轉動角度、及與該偏光軸正交之轉動角度之各者時所測定到之光量,特定透過上述第1偏光片之偏光光線之消光比。 Further, the present invention is characterized in that the polarized light measuring method is characterized in that the specific transmission is performed based on a rotation angle corresponding to a maximum value of the amount of light indicated by the change curve. a polarization axis of the polarized light of the first polarizer, and/or a maximum value and a minimum value indicated by the change curve, or a rotation of the second polarizer to a polarization axis of the polarized light specified by the change curve The amount of light measured in each of the rotation angle and the rotation angle orthogonal to the polarization axis specifies the extinction ratio of the polarized light transmitted through the first polarizer.

又,為了達成上述目的,本發明提供一種偏光測定裝置,其特徵在於具備:變化曲線算出手段,其係根據將依序透過第1偏光片、及第2偏光片之光一邊使上述第2偏光片轉動而一邊進行檢測而所獲得之在各轉動角度之光之光量,而求出表示上述第2偏光片旋轉時之上述光量之週期性變化之變化曲線;及偏光特性特定手段,其係根據上述變化曲線,特定透過上述第1偏光片之偏光光線之偏光特性;且上述變化曲線算出手段係根據包含上述變化曲線之1個極小點且包含於上述光量成為既定值以下之上述轉動角度之範圍中之在上述轉動角度之上述光量,而求出上述變化曲線。 In order to achieve the above object, the present invention provides a polarization measuring apparatus comprising: a change curve calculating means for causing the second polarized light to be transmitted through the first polarizer and the second polarizer in sequence The amount of light of each of the rotation angles obtained by detecting the rotation of the sheet is obtained, and a curve indicating a periodic change of the amount of light when the second polarizer is rotated is obtained; and a polarization characteristic specifying means is based on The change curve specifically defines a polarization characteristic of a polarized light transmitted through the first polarizer; and the change curve calculation means is included in a range of the rotation angle including the minimum amount of the light amount and the light amount is equal to or less than a predetermined value. The above-described variation curve is obtained by the above-described amount of light at the above-described rotation angle.

又,為了達成上述目的,本發明提供一種偏光測定系統,其特徵在於具備:檢測部,其包括入射有藉由第1偏光片所偏光化之偏光光線之第2偏光片,且一邊使上述第2偏光片轉動一邊檢測透過上述第2偏光片之光之光量;及偏光測定裝置,其係根據上述檢測部之檢測結果,特定透過上述第1偏光片之偏光光線之偏光特性;且上述檢測部具有:第1孔徑(aperture),其取入包含有斜入射成分之上述光並使其入射至上述第2偏光片;擴散手段,其使透過上述第2偏光片之光產生擴散;第2孔徑,其使藉由上述擴散手段所擴散之光之一部分通過;及受光感測器,其接收通過上述第2孔徑之光並檢測上述光量;且上述偏光測定裝置具備:變化曲線算出手段,其係根據 上述第2偏光片之在各轉動角度之光之光量,而求出表示上述第2偏光片於旋轉時之上述光量之週期性變化之變化曲線;及偏光特性特定手段,其係根據上述變化曲線,特定透過上述第1偏光片之偏光光線之偏光特性;且上述變化曲線算出手段係根據包含上述變化曲線之1個極小點且包含於上述光量成為既定值以下之上述轉動角度之範圍中之在上述轉動角度之上述光量,而求出上述變化曲線。 In order to achieve the above object, the present invention provides a polarization measuring system including: a detecting unit that includes a second polarizer on which a polarized light that is polarized by the first polarizer is incident, and that is (2) detecting a light amount of light transmitted through the second polarizer while rotating the polarizer; and a polarization measuring device that specifies a polarization characteristic of a polarized light transmitted through the first polarizer based on a detection result of the detecting unit; and the detecting unit And a first aperture having a light containing an oblique incident component and incident on the second polarizer; and a diffusion means for diffusing light transmitted through the second polarizer; the second aperture And passing a portion of the light diffused by the diffusion means; and receiving a light sensor that receives the light passing through the second aperture and detecting the amount of light; and the polarization measuring device includes: a curve calculation means according to a change curve indicating a periodic change of the amount of light of the second polarizer at the time of rotation of the second polarizer at a rotation angle; and a polarization characteristic specifying means according to the change curve a polarization characteristic of the polarized light that is transmitted through the first polarizer; and the change curve calculation means is included in a range of the rotation angle including the minimum amount of the light amount and the light amount is equal to or less than a predetermined value. The above-described change curve is obtained by the above-described amount of light of the above-described rotation angle.

又,為了達成上述目的,本發明係一種光配向照射裝置,其具備有對載置於載置台之工件表面之配向膜照射偏光光線之偏光片單元,且特徵在於:上述偏光片單元具備有橫排地整齊排列之複數個單位偏光片單元,上述單位偏光片單元則分別具備有偏光片,且該光配向照射裝置具備有對在通過上述複數個偏光片之偏光光線產生重合而所照射之上述載置台相當位置之光之偏光特性進行檢測之檢測手段。 In order to achieve the above object, the present invention provides a light alignment irradiation device including a polarizer unit that irradiates a polarizing ray to an alignment film placed on a surface of a workpiece on a mounting table, and is characterized in that the polarizer unit has a horizontal a plurality of unit polarizer units arranged in a row, wherein the unit polarizer units are respectively provided with polarizers, and the light alignment irradiating device is provided with the above-mentioned illumination light that is superposed on the polarized light passing through the plurality of polarizers A detection means for detecting the polarization characteristics of light at a position corresponding to the stage.

又,本發明係如上述光配向照射裝置,其特徵在於:上述檢測手段具備有以可沿上述單位偏光片單元之排列方向移動之方式所設置之檢測部。又,該檢測部亦可朝載置台移動方向移動。 Further, the present invention is directed to the optical alignment irradiating apparatus, wherein the detecting means includes a detecting portion that is provided to be movable in an array direction of the unit polarizer unit. Further, the detecting unit can also move in the moving direction of the mounting table.

又,本發明係如上述光配向照射裝置,其特徵在於上述檢測手段具備:檢測部,其具有測定用偏光片,一邊使上述測定用偏光片轉動一邊檢測透過上述測定用偏光片之光之光量;及偏光測定裝置,其係根據上述檢測部之檢測結果,特定上述載置台相當位置之光之偏光特性;且上述檢測部具有:孔徑,其配置於上述載置台相當位置,取入通過上述複數個偏光片之偏光光線而產生重合後之光並使其入射至上述測定用偏光片;擴散手段,其使透過上述測定用偏光片之光產生擴散;及受光感測器,其接收藉由上述擴散手段所擴散之光並 檢測上述光量;且上述偏光測定裝置具備:變化曲線算出手段,其係根據上述測定用偏光片之在各轉動角度之光之光量,而求出表示上述測定用偏光片於旋轉時之上述光量之週期性變化之變化曲線;及偏光特性特定手段,其係根據上述變化曲線,特定在上述載置台相當位置之照射光之偏光特性。 Furthermore, the present invention is characterized in that the detecting means includes a detecting unit that includes a polarizing plate for measurement, and detects the amount of light transmitted through the measuring polarizer while rotating the measuring polarizer. And a polarization measuring apparatus that specifies a polarization characteristic of light at a position corresponding to the mounting table based on a detection result of the detecting unit; and the detecting unit has an aperture that is disposed at a position corresponding to the mounting table, and is taken in the plural The polarized light of the polarizers generates the superposed light and is incident on the polarizer for measurement; the diffusion means diffuses the light transmitted through the polarizer for measurement; and the light receiving sensor receives the light by the above Diffusion means the light that spreads In the above-described polarization measuring device, the polarization measuring device includes a change curve calculation means for determining the amount of light when the measurement polarizer is rotated, based on the amount of light of each of the rotation angles of the measurement polarizer. A variation curve of the periodic variation; and a specific means for the polarization characteristic, which is based on the above-described variation curve, and specifies a polarization characteristic of the illumination light at a position corresponding to the mounting table.

根據本發明,設為如下構成:根據對依序透過第1偏光片、及第2偏光片之光一邊使第2偏光片轉動而一邊進行檢測而所獲得之在各轉動角度之光之光量,而求出第2偏光片於旋轉時之光量之週期性變化之變化曲線,此時係根據包含變化曲線之1個極小點且包含於光量成為既定值以下之轉動角度之範圍中之在轉動角度之光量,而求出變化曲線。 According to the present invention, the amount of light at each rotation angle obtained by detecting the rotation of the second polarizer while sequentially transmitting the light of the first polarizer and the second polarizer is configured. The curve of the periodic change of the amount of light of the second polarizer during the rotation is obtained. In this case, the rotation angle is included in the range of the rotation angle including the minimum amount of the light curve and the amount of rotation below the predetermined value. The amount of light is used to determine the curve.

藉此,根據與極大點附近之光量之檢測值相比、檢測值中所含之雜訊成分較小之檢測值求出變化曲線,故而變化曲線之精度提高。並且,藉由自該變化曲線求出偏光特性,可精度良好地求出偏光特性。 Thereby, the change curve is obtained based on the detected value of the noise component included in the detected value as compared with the detected value of the amount of light near the maximum point, so that the accuracy of the change curve is improved. Further, by obtaining the polarization characteristics from the variation curve, the polarization characteristics can be accurately obtained.

又,由於僅測定極小點附近之光量即可,故而能夠以較少之測定次數實現高精度之測定。 Further, since only the amount of light in the vicinity of the minimum point can be measured, it is possible to achieve high-accuracy measurement with a small number of measurement times.

又,根據本發明,設為檢測在通過複數個偏光片之偏光光線產生重合而所照射之上述載置台相當位置之光之偏光特性之構成。 Moreover, according to the present invention, it is assumed that the polarization characteristics of the light at the position corresponding to the mounting table that is irradiated by the polarization of the plurality of polarizers are detected.

藉此,可檢測實際照射至配置於載置台之工件表面之配向膜之偏光光線之偏光特性,故而可適當且精度良好地測定實際之照射光中之偏光特性。 Thereby, the polarization characteristics of the polarized light that is actually irradiated onto the alignment film disposed on the surface of the workpiece on the mounting table can be detected, so that the polarization characteristics in the actual irradiation light can be appropriately and accurately measured.

1、1A、100、200‧‧‧偏光測定系統(檢測手段) 1, 1A, 100, 200‧ ‧ polarized light measurement system (detection means)

2‧‧‧光配向裝置(光配向照射裝置) 2‧‧‧Light alignment device (light alignment device)

3‧‧‧載置台搬送台座 3‧‧‧Loading table pedestal

4‧‧‧照射器設置台座 4‧‧‧ illuminator setting pedestal

5‧‧‧工件載置台(載置台) 5‧‧‧Working table (mounting table)

5A‧‧‧工件載置台5之行進方向側之側面 5A‧‧‧Side side of the traveling direction side of the workpiece mounting table 5

6‧‧‧照射器 6‧‧‧ illuminator

7‧‧‧燈 7‧‧‧ lights

7A‧‧‧點光源 7A‧‧‧ point light source

8‧‧‧反射鏡 8‧‧‧Mirror

9‧‧‧偏光片單元固定台 9‧‧‧Polarizer unit fixed table

10‧‧‧偏光片單元 10‧‧‧Polarizer unit

12‧‧‧單位偏光片單元 12‧‧‧Unit polarizer unit

14‧‧‧框架 14‧‧‧Frame

16‧‧‧線柵偏光片(第1偏光片、偏光片) 16‧‧‧Wire grid polarizer (first polarizer, polarizer)

19‧‧‧螺釘 19‧‧‧ screws

20‧‧‧偏光測定裝置 20‧‧‧Polarization measuring device

21‧‧‧旋轉驅動控制部 21‧‧‧Rotary Drive Control

22‧‧‧輸入部 22‧‧‧ Input Department

23‧‧‧變化曲線算出部 23‧‧‧Change curve calculation section

24‧‧‧偏光特性特定部 24‧‧‧Special part of polarization characteristics

25‧‧‧偏光特性輸出部 25‧‧‧Polarization characteristic output unit

30‧‧‧測定單元 30‧‧‧Measurement unit

31、31A‧‧‧檢測部 31, 31A‧‧‧Detection Department

32‧‧‧線性導軌 32‧‧‧Linear guide

33‧‧‧檢測側偏光片(第2偏光片、測定用偏光片) 33‧‧‧Detecting side polarizer (2nd polarizer, measuring polarizer)

34‧‧‧受光感測器 34‧‧‧Photodetector

35‧‧‧檢測訊號 35‧‧‧Detection signal

70‧‧‧基座 70‧‧‧Base

71‧‧‧受光感測器單元 71‧‧‧Photodetector unit

72‧‧‧旋轉載置台 72‧‧‧Rotating table

73‧‧‧檢測光調整單元 73‧‧‧Detection light adjustment unit

74‧‧‧光電倍增管 74‧‧‧Photomultiplier

74A‧‧‧光電倍增管74之檢測面 74A‧‧‧Detection surface of photomultiplier tube 74

75‧‧‧水冷基底 75‧‧‧Water-cooled substrate

76‧‧‧孔徑 76‧‧‧Aperture

76A‧‧‧開口 76A‧‧‧ openings

77‧‧‧筒體 77‧‧‧Cylinder

78‧‧‧孔徑 78‧‧‧Aperture

78A‧‧‧開口 78A‧‧‧ Opening

79‧‧‧擴散單元(擴散手段) 79‧‧‧Diffusion unit (diffusion means)

79A、79B‧‧‧擴散板 79A, 79B‧‧‧ diffuser board

80‧‧‧板材 80‧‧‧ plates

80A‧‧‧針孔 80A‧‧ pinhole

81‧‧‧波長限制濾光片 81‧‧‧Wavelength limiting filter

A‧‧‧線方向 A‧‧‧ direction

B‧‧‧排列方向 B‧‧‧Orientation

C1、C2‧‧‧偏光軸 C1, C2‧‧‧ polarizing axis

D‧‧‧偏光軸調整裝置 D‧‧‧ Polarized axis adjustment device

E‧‧‧放射光 E‧‧‧radiation

F‧‧‧偏光光線 F‧‧‧ polarized light

G‧‧‧檢測光 G‧‧‧Detecting light

H‧‧‧反射光 H‧‧‧ reflected light

I‧‧‧光量 I‧‧‧Light quantity

Imax‧‧‧最大光量 I max ‧‧‧Maximum amount of light

Imin‧‧‧最小光量 I min ‧‧‧Minimum amount of light

P0‧‧‧基準位置 P0‧‧‧ reference position

Q‧‧‧變化曲線 Q‧‧‧change curve

S‧‧‧法線方向 S‧‧‧ normal direction

T‧‧‧光配向對象物(工件) T‧‧‧Light alignment object (workpiece)

W‧‧‧範圍 W‧‧‧Scope

X‧‧‧線性運動方向 X‧‧‧linear motion direction

Y‧‧‧入射角 Y‧‧‧ incident angle

θ‧‧‧轉動角度 Θ‧‧‧ turning angle

θa、θa+180°‧‧‧極小點之轉動角度 Θa, θa+180°‧‧‧The angle of rotation of the minimum point

θa+90°、θa+270°‧‧‧極大點之轉動角度 Θa+90°, θa+270°‧‧‧maximum angle of rotation

圖1係將本發明之第1實施形態之偏光測定系統之構成與光配向裝置一併表示之圖。 Fig. 1 is a view showing a configuration of a polarization measuring system according to a first embodiment of the present invention together with a light alignment device.

圖2係將偏光測定系統之構成與光配向裝置之俯視圖一併表示之圖。 Fig. 2 is a view showing a configuration of a polarization measuring system together with a plan view of the optical alignment device.

圖3係表示檢測部之構成之示意圖。 Fig. 3 is a schematic view showing the configuration of a detecting unit.

圖4係檢測光之變化曲線之示意圖。 Fig. 4 is a schematic view showing a curve of the detected light.

圖5係檢測檢測光之光量之轉動角度之範圍之說明圖。 Fig. 5 is an explanatory diagram of a range of a rotation angle at which the amount of light of the detection light is detected.

圖6係檢測光之光量之檢測之具體例之說明圖。 Fig. 6 is an explanatory diagram showing a specific example of detecting the amount of light light.

圖7係表示偏光測定系統之測定動作之流程圖。 Fig. 7 is a flow chart showing the measurement operation of the polarization measuring system.

圖8係表示檢測部之構成之外觀立體圖。 Fig. 8 is a perspective view showing the appearance of a detecting unit.

圖9係檢測部之剖面圖。 Figure 9 is a cross-sectional view of the detecting portion.

圖10係表示本發明之第2實施形態之光配向裝置之構成之圖。 Fig. 10 is a view showing the configuration of an optical alignment device according to a second embodiment of the present invention.

圖11係表示照射位置與相對照射光量之關係之圖表。 Fig. 11 is a graph showing the relationship between the irradiation position and the amount of relative irradiation light.

圖12係自短軸側表示偏光片單元與檢測部之關係之說明圖。 Fig. 12 is an explanatory view showing the relationship between the polarizer unit and the detecting unit from the short axis side.

圖13係表示偏光片單元之構成之圖,(A)為俯視圖,(B)為側視剖面圖。 Fig. 13 is a view showing the configuration of a polarizer unit, wherein (A) is a plan view and (B) is a side cross-sectional view.

圖14係表示偏光軸調整裝置之示意圖。 Fig. 14 is a schematic view showing a polarizing shaft adjusting device.

以下,參照圖式對本發明之實施形態進行說明。 Hereinafter, embodiments of the present invention will be described with reference to the drawings.

<第1實施形態> <First embodiment>

圖1係將本實施形態之偏光測定系統1之構成與光配向裝置2一併表示之示意圖。 Fig. 1 is a schematic view showing the configuration of the polarization measuring system 1 of the present embodiment together with the optical alignment device 2.

於該圖中,光配向裝置(光配向照射裝置)2係對板狀或帶狀之光配 向對象物(工件)之光配向膜照射偏光光線而進行光配向之照射裝置,偏光測定系統(檢測手段)1係測定光配向裝置2之照射光之偏光特性者。作為偏光特性,測定偏光光線之偏光軸、及消光比。 In the figure, the light alignment device (light alignment illumination device) 2 is used for plate-like or strip-shaped light distribution. An apparatus for irradiating a light-aligning light to a light-aligning film of an object (workpiece) to perform light-aligning, and a polarization measuring system (detecting means) 1 is a method of measuring a polarizing characteristic of the light of the light-aligning device 2. As the polarization characteristics, the polarization axis of the polarized light and the extinction ratio were measured.

光配向裝置2具備:載置台搬送台座3、照射器設置台座4、及載置光配向對象物之工件載置台(載置台)5。 The optical alignment device 2 includes a mounting table transfer pedestal 3, an illuminator mounting pedestal 4, and a workpiece mounting table (mounting table) 5 on which the light aligning object is placed.

照射器設置台座4係於自載置台搬送台座3隔開既定距離之上方位置橫架於載置台搬送台座3之寬度方向(垂直於下述線性運動機構之線性運動方向X之方向)上之門體,其兩柱固定於載置台搬送台座3。照射器設置台座4係內置照射器6,且照射器6朝正下方照射偏光光線。再者,為了將伴隨工件載置台5之移動之振動與由照射器6之冷卻引起之振動分離,亦可為不將照射器設置台座4固定於載置台搬送台座3而與該載置台搬送台座3分開設置之構成。載置台搬送台座3與照射器設置台座4亦可具有抗振構造。 The illuminator installation pedestal 4 is a door that is transversely positioned in the width direction of the stage transfer pedestal 3 (perpendicular to the linear motion direction X of the linear motion mechanism described below) from a position above the predetermined distance from the stage transfer pedestal 3 The two columns are fixed to the stage transfer pedestal 3. The illuminator is provided with a pedestal 4 in which the illuminator 6 is built, and the illuminator 6 illuminates the polarized ray directly below. Further, in order to separate the vibration accompanying the movement of the workpiece mounting table 5 from the vibration caused by the cooling by the illuminator 6, the illuminator mounting pedestal 4 may be fixed to the mounting table transfer pedestal 3, and the mounting table transfer pedestal may be omitted. 3 separate configuration. The stage transfer pedestal 3 and the illuminator installation pedestal 4 may have an anti-vibration structure.

於載置台搬送台座3,內設有線性運動機構(未圖示),該線性運動機構以沿線性運動方向X於載置台搬送台座3之面上通過照射器6之正下方之方式移送工件載置台5。於光配向對象物之光配向時,載置於工件載置台5之光配向對象物藉由線性運動機構與工件載置台5一併被移送並通過照射器6之正下方,於該通過時曝露於偏光光線下而使光配向膜被予以配向。 A linear motion mechanism (not shown) is disposed in the mounting table pedestal 3, and the linear motion mechanism transfers the workpiece carrier directly below the illuminator 6 on the surface of the stage transfer pedestal 3 in the linear motion direction X. Set up 5. When the light is aligned with the object, the light-aligning object placed on the workpiece mounting table 5 is transferred together with the workpiece mounting table 5 by the linear motion mechanism and passed directly under the illuminator 6, and exposed during the passage. The light alignment film is aligned under polarized light.

照射器6具備作為光源之燈7、反射鏡8、及偏光片單元10,且朝正下方照射經聚光之偏光光線。 The illuminator 6 includes a lamp 7 as a light source, a mirror 8, and a polarizer unit 10, and illuminates the condensed polarized ray directly below.

燈7為放電燈,使用至少延伸至與光配向對象物之寬度同等以上之直管型(棒狀)之紫外線燈。反射鏡8為剖面橢圓形且沿燈7之長度方向延伸之柱狀凹面反射鏡,將燈7之光聚光並朝向偏光片單元10照射。 The lamp 7 is a discharge lamp, and a straight tube type (rod-shaped) ultraviolet lamp that extends at least equal to the width of the light-aligning object is used. The mirror 8 is a columnar concave mirror having an elliptical cross section and extending in the longitudinal direction of the lamp 7, and condenses the light of the lamp 7 and irradiates it toward the polarizer unit 10.

偏光片單元10配置於反射鏡8與光配向對象物之間,使照射至光配向對象物之光偏光。藉由使該偏光光線照射至光配向對象物之光配向膜,而對該光配向膜進行配向。 The polarizer unit 10 is disposed between the mirror 8 and the light-aligning object, and polarizes the light that is incident on the light-aligning object. The light alignment film is aligned by irradiating the polarized light to the light alignment film of the light-aligning object.

圖2係將偏光測定系統1與光配向裝置2之俯視圖一併表示之圖。再者,該圖中,為了使偏光片單元10之構成容易理解,於照射器設置台座4中僅表示出偏光片單元10。 FIG. 2 is a plan view showing the polarization measuring system 1 and the optical alignment device 2 together. In the figure, in order to make the configuration of the polarizer unit 10 easy to understand, only the polarizer unit 10 is shown in the illuminator installation pedestal 4.

如該圖所示,偏光片單元10具備數個單位偏光片單元(第1偏光片)12、及將該等單位偏光片單元12橫排地整齊排列成一排之框架14。框架14係將各單位偏光片單元12連接配置之板狀之框體。單位偏光片單元12具備形成為大致矩形板狀之線柵偏光片(偏光片)16。 As shown in the figure, the polarizer unit 10 includes a plurality of unit polarizer units (first polarizers) 12, and a frame 14 in which the unit polarizer units 12 are aligned in a row in a row. The frame 14 is a frame-like frame in which the unit polarizer units 12 are connected to each other. The unit polarizer unit 12 includes a wire grid polarizer (polarizer) 16 formed in a substantially rectangular plate shape.

本實施形態中,各單位偏光片單元12形成為,將線柵偏光片16以線方向A與上述工件載置台5之線性運動方向X平行之方式支撐,使與該線方向A正交之方向和線柵偏光片16之排列方向B吻合。 In the present embodiment, each unit polarizer unit 12 is formed such that the wire grid polarizer 16 is supported in a line direction A parallel to the linear movement direction X of the workpiece stage 5 so as to be orthogonal to the line direction A. It is aligned with the arrangement direction B of the wire grid polarizer 16.

線柵偏光片16為直線偏光片之一種。如上所述,燈7為棒狀,因此於線柵偏光片16中入射有各種角度之光,但線柵偏光片16係即便為傾斜入射之光,亦可使其直線偏光化而透過。 The wire grid polarizer 16 is one of linear polarizers. As described above, since the lamp 7 has a rod shape, light of various angles is incident on the wire grid polarizer 16, but the wire grid polarizer 16 can be linearly polarized and transmitted even if it is obliquely incident.

線柵偏光片16係以能夠以其法線方向為轉動軸而於面內轉動從而對偏光軸C1之方向進行微調整之方式支撐於單位偏光片單元12。藉由對所有單位偏光片單元12以使線柵偏光片16之偏光軸C1沿既定之照射基準方向對齊之方式進行微調整,可獲得遍及偏光片單元10之長軸方向之全長而使偏光軸C1高精度地對齊之偏光光線,而可實現高品質之光配向。 The wire grid polarizer 16 is supported by the unit polarizer unit 12 so as to be rotatable in-plane with its normal direction as a rotation axis and finely adjust the direction of the polarization axis C1. By finely adjusting all of the unit polarizer units 12 so that the polarization axis C1 of the wire grid polarizer 16 is aligned in a predetermined irradiation reference direction, the entire length of the long-axis direction of the polarizer unit 10 can be obtained and the polarization axis can be obtained. C1 aligns the polarized light with high precision to achieve high-quality light alignment.

偏光測定系統1如圖1所示,具備偏光測定裝置20、及測定單元30。測定單元30具備檢測偏光光線之檢測部31,且偏光測 定裝置20根據藉由檢測部31獲得之偏光光線之檢測結果,而測定該偏光光線之偏光軸、及消光比。 As shown in FIG. 1, the polarization measuring system 1 includes a polarization measuring device 20 and a measuring unit 30. The measuring unit 30 includes a detecting unit 31 that detects a polarized light, and the polarized light measurement The fixing device 20 measures the polarization axis of the polarized light and the extinction ratio based on the detection result of the polarized light obtained by the detecting unit 31.

測定單元30如圖2所示,具備沿直線引導檢測部31之線性導軌32。於偏光光線測定時係以線性導軌32與上述工件載置台5之行進方向側之側面5A連結而被移送至偏光片單元10之正下方或者線性導軌32位於偏光片單元10之正下方之方式設置於載置台搬送台座3上。並且,以位於微調整對象之線柵偏光片16之正下方之方式使檢測部31沿線性導軌32移動或使其自行移動,藉由檢測部31檢測於其位置透過該線柵偏光片16之偏光光線,測定照射光之偏光特性。 As shown in FIG. 2, the measuring unit 30 includes a linear guide 32 that guides the detecting unit 31 in a straight line. In the measurement of the polarized light, the linear guide 32 is connected to the side surface 5A on the traveling direction side of the workpiece mounting table 5, and is transferred to the directly below the polarizer unit 10 or the linear guide 32 is positioned directly below the polarizer unit 10. It is placed on the stage transfer pedestal 3. Further, the detecting portion 31 is moved along the linear guide 32 or moved by itself so as to be positioned directly below the wire grid polarizer 16 of the fine adjustment target, and the detecting portion 31 detects that its position passes through the wire grid polarizer 16 The polarized light is used to measure the polarizing characteristics of the irradiated light.

圖3係表示檢測部31之構成之示意圖。 FIG. 3 is a schematic view showing the configuration of the detecting unit 31.

檢測部31具備檢測側偏光片(第2偏光片、測定用偏光片)33、及受光感測器34。 The detecting unit 31 includes a detecting side polarizer (a second polarizer, a measuring polarizer) 33 and a light receiving sensor 34.

檢測側偏光片33係具有偏光軸C2之板狀(圖示例中為圓盤狀)之光檢測用之直線偏光片,亦被稱為析光片。於該檢測側偏光片33中,入射有透過線柵偏光片16而直線偏光化之偏光光線F,而使該偏光光線F直線偏光化。對於檢測側偏光片33,只要為直線偏光片,則可使用任意之偏光片,例如可使用線柵偏光片。 The detection-side polarizer 33 is a linear polarizer for detecting light in a plate shape (a disk shape in the illustrated example) of the polarization axis C2, and is also referred to as a deposition sheet. In the detection-side polarizer 33, a polarized ray F that is linearly polarized by the line-gate polarizer 16 is incident, and the polarized ray F is linearly polarized. As the detection side polarizer 33, any polarizer can be used as long as it is a linear polarizer, and for example, a wire grid polarizer can be used.

受光感測器34接收於檢測側偏光片33之偏光軸C2經直線偏光化之檢測光G,並將表示光量I之檢測訊號35輸出至偏光測定裝置20。 The light-receiving sensor 34 receives the detection light G linearly polarized on the polarization axis C2 of the detection-side polarizer 33, and outputs a detection signal 35 indicating the light amount I to the polarization measuring device 20.

檢測部31中,檢測側偏光片33設置為以其法線方向S為轉動軸而至少連續旋轉1周地自由旋轉。檢測側偏光片33之轉動係由自基準位置P0之轉動角度θ規定。本實施形態中,基準位置P0被設定為偏光軸C2之方向與上述線柵偏光片16之照射基準方向一致之位置。即,於將檢測部31安裝於線性導軌32並使檢測側偏光片33與 基準位置P0吻合時,成為檢測側偏光片33之偏光軸C2朝向照射基準方向之狀態。 In the detecting unit 31, the detecting side polarizer 33 is provided to be freely rotatable by rotating at least one rotation continuously for one rotation direction in the normal direction S. The rotation of the detecting side polarizer 33 is defined by the rotation angle θ from the reference position P0. In the present embodiment, the reference position P0 is set to a position where the direction of the polarization axis C2 coincides with the irradiation reference direction of the wire grid polarizer 16. That is, the detecting unit 31 is attached to the linear guide 32 and the detecting side polarizer 33 is When the reference position P0 coincides, the polarization axis C2 of the detection side polarizer 33 is in a state of being directed toward the irradiation reference direction.

偏光測定裝置20係根據檢測側偏光片33旋轉1周時之檢測光G之光量之週期性變化而測定偏光光線F之偏光軸與消光比者。具體而言,偏光測定裝置20如圖2所示,具備旋轉驅動控制部21、輸入部22、變化曲線算出部23、偏光特性特定部24、及偏光特性輸出部25。再者,偏光測定裝置20亦可藉由使例如個人電腦執行實現圖2所示之各部之電腦可讀取之程式而實施。 The polarization measuring device 20 measures the polarization axis of the polarized light F and the extinction ratio based on the periodic variation of the amount of light of the detection light G when the detection side polarizer 33 rotates for one week. Specifically, as shown in FIG. 2, the polarization measuring device 20 includes a rotation drive control unit 21, an input unit 22, a change curve calculation unit 23, a polarization characteristic specifying unit 24, and a polarization characteristic output unit 25. Furthermore, the polarization measuring device 20 can also be implemented by, for example, a personal computer executing a computer readable program that implements the various parts shown in FIG. 2.

旋轉驅動控制部21控制檢測部31之檢測側偏光片33之旋轉。具體而言,檢測部31包括使檢測側偏光片33轉動之旋轉致動器,旋轉驅動控制部21控制旋轉致動器而使檢測側偏光片33轉動,藉此使其偏光軸C2與既定之轉動角度θ之方向吻合。此時之轉動角度θ被輸出至變化曲線算出部23。 The rotation drive control unit 21 controls the rotation of the detection side polarizer 33 of the detection unit 31. Specifically, the detecting unit 31 includes a rotary actuator that rotates the detecting-side polarizer 33, and the rotational driving control unit 21 controls the rotary actuator to rotate the detecting-side polarizer 33, thereby causing the polarization axis C2 and the predetermined one. The direction of the rotation angle θ coincides. The rotation angle θ at this time is output to the change curve calculation unit 23.

輸入部22係受理檢測光G之光量I之檢測值之輸入之手段,於該輸入部22輸入有檢測部31之檢測信號35。輸入部22自該檢測訊號35取得檢測光G之光量I之檢測值並輸出至變化曲線算出部23。 The input unit 22 receives a means for inputting the detection value of the light amount I of the detection light G, and the detection unit 35 of the detection unit 31 is input to the input unit 22. The input unit 22 acquires the detected value of the light amount I of the detection light G from the detection signal 35, and outputs it to the change curve calculation unit 23.

變化曲線算出部23係根據檢測光G之光量I之檢測值,算出表示使檢測側偏光片33旋轉1周時之檢測光G之光量I之週期性變化之變化曲線Q。若詳細敍述,則檢測光G如上文所揭示之圖3所示,為燈7之放射光E依序通過作為直線偏光片之線柵偏光片16、及檢測側偏光片33而獲得之光。 The change curve calculation unit 23 calculates a change curve Q indicating a periodic change in the light amount I of the detection light G when the detection side polarizer 33 is rotated by one rotation, based on the detected value of the light amount I of the detection light G. As described in detail above, the detection light G is the light obtained by sequentially passing the emitted light E of the lamp 7 through the line-gate polarizer 16 as the linear polarizer and the detection-side polarizer 33, as shown in FIG. 3 disclosed above.

因此,伴隨檢測側偏光片33之旋轉之檢測光G之光量I之變化曲線Q理想而言為如圖4所示,成為如於檢測側偏光片33之偏光軸C2平行於線柵偏光片16之偏光軸C1之情形(本實施形態中為轉動角度θ =0°、180°(極大點))時成為最大光量Imax(極大值)且於偏光軸C2與偏光軸C1正交之情形(本實施形態中為轉動角度θ=90°、270°(極小點))時成為最小光量Imin(極小值)般的1週期為π[rad](=180°)的下式(1)所表示之餘弦波形(所謂之馬呂士定律(Law of Malus))。 Therefore, the curve Q of the light amount I of the detection light G accompanying the rotation of the detection side polarizer 33 is desirably as shown in FIG. 4, and the polarization axis C2 as the detection side polarizer 33 is parallel to the wire grid polarizer 16. The case of the polarization axis C1 (in the present embodiment, the rotation angle θ =0°, 180° (maximum point)) is the maximum light amount Imax (maximum value) and is orthogonal to the polarization axis C2 and the polarization axis C1 (in the present embodiment, the rotation angle is θ=90°, 270° (very small) Point)) The cosine waveform represented by the following formula (1) in which one cycle is π[rad] (=180°) in the case of the minimum light amount Imin (minimum value) (so-called Law of Malus) .

變化曲線Q=α×cos(β×(θ-γ))+ε (1) Change curve Q=α×cos(β×(θ-γ))+ε (1)

其中,α為振幅,β為週期,γ為相位偏差(線柵偏光片16之偏光軸C1相對於基準位置P0之相位差),ε為偏壓成分。 Here, α is an amplitude, β is a period, γ is a phase deviation (a phase difference between a polarization axis C1 of the wire grid polarizer 16 and a reference position P0), and ε is a bias component.

然而,發明者等人通過銳意實驗,關於變化曲線Q獲得如下見解。 However, the inventors and the like obtained the following findings regarding the variation curve Q through a keen experiment.

即,由於光配向裝置2係以作為放電燈之燈7為光源,故而因將燈7點燈之電源裝置之點燈電力之波動或燈7之冷卻狀態等各種主要因素,而導致光源亮度於非常短之時間週期內變動而產生波動或閃爍,此成為光源亮度之雜訊成分。 In other words, since the light aligning device 2 uses the lamp 7 as the discharge lamp as the light source, the brightness of the light source is caused by various factors such as the fluctuation of the lighting power of the power supply device that lights the lamp 7 or the cooling state of the lamp 7. Fluctuating or flickering occurs during a very short period of time, which becomes a noise component of the brightness of the light source.

進而,由於光配向裝置2自燈7通過偏光片單元10廣範圍地照射偏光光線F,故而於檢測部31之受光感測器34中入射有各種入射角度之偏光光線F,而且通過鄰接於調整對象之線柵偏光片16之其他線柵偏光片16之偏光光線F亦入射並被檢測。 Further, since the optical alignment device 2 illuminates the polarized light F from the lamp 7 through the polarizer unit 10 in a wide range, the polarized light F of various incident angles is incident on the light receiving sensor 34 of the detecting portion 31, and is adjacent to the adjustment. The polarized light F of the other wire grid polarizer 16 of the object's wire grid polarizer 16 is also incident and detected.

因該等光源亮度之雜訊成分或偏光光線F之斜入射等而導致自檢測部31之檢測結果所求出之變化曲線Q自理想之餘弦函數(上述(1)式)偏移,該偏移以下式(2)所示之n次方餘弦波形(n≧2)充分地近似。 The variation curve Q obtained from the detection result of the detecting portion 31 due to the noise component of the brightness of the light source or the oblique incidence of the polarized light F is shifted from the ideal cosine function (formula (1) above). The n-th cosine waveform (n ≧ 2) shown by the following formula (2) is sufficiently approximated.

變化曲線Q=α×cosn(β×(θ-γ))+ε (2) Change curve Q=α×cosn(β×(θ-γ))+ε (2)

根據以上見解,作為變化曲線Q,最佳為根據檢測光G之光量之檢測值求出n次方餘弦波形,但這樣一來,有需要大量檢測光G之測定及計算之問題。 According to the above findings, as the variation curve Q, it is preferable to obtain the n-th cosine waveform from the detection value of the amount of light of the detection light G. However, there is a problem that measurement and calculation of a large amount of detection light G are required.

又,消光比係將最大光量Imax除以最小光量Imin,因此,最小光量Imin越小,該最小光量Imin中所占之雜訊成分對消光比之值之影響越大,於藉由上述(2)式求出變化曲線Q之情形時,由於最小光量Imin之反覆精度較差,故而無法準確地求出消光比。 Further, the extinction ratio divides the maximum light amount Imax by the minimum light amount Imin. Therefore, the smaller the minimum light amount Imin, the greater the influence of the noise component occupied by the minimum light amount Imin on the value of the extinction ratio, by the above (2) When the variation curve Q is obtained by the equation, since the accuracy of the minimum light amount Imin is poor, the extinction ratio cannot be accurately obtained.

因此,為了獲得所需之精度,只要反覆進行用以求出1個變化曲線Q之測定點之數量或數次測定而求出數次變化曲線Q並進行平均化等即可,但這樣一來,會產生由於測定次數變得非常多而使測定花費時間之問題。 Therefore, in order to obtain the required accuracy, it is only necessary to repeatedly determine the number of times or the number of measurement points for obtaining one change curve Q, and obtain the number of times of change Q and average them. There is a problem that the measurement takes time because the number of times of measurement becomes very large.

作為解決該問題之方法,考慮進行如下處理:為了可將光源亮度之雜訊成分自檢測部31之檢測訊號35去除,準備與檢測部31分開設置之受光感測器,藉由另外設置之受光感測器檢測檢測光G之光量I以作參照用,根據該參照用之檢測結果而自檢測部31之檢測訊號35去除雜訊成分。 As a method for solving this problem, a process is considered in which a noise sensor of the brightness of the light source is removed from the detection signal 35 of the detecting unit 31, and a light receiving sensor provided separately from the detecting unit 31 is prepared, and the light receiving unit is additionally provided. The sensor detects the light amount I of the detection light G for reference, and removes the noise component from the detection signal 35 of the detecting unit 31 based on the detection result of the reference.

然而,於偏光測定中,一般而言,即便係因光經由鏡或稜鏡等光學元件,偏光狀態亦會產生變化,因此無法使入射至檢測部31之檢測光G分岐至另外設置之受光感測器。因此,與檢測部31分開設置之受光感測器所接收之檢測光G不同,而使雜訊成分未被準確地去除。 However, in the polarization measurement, generally, even if the light is transmitted through the optical element such as a mirror or a cymbal, the polarization state changes, so that the detection light G incident on the detecting unit 31 cannot be branched to a separately received light sensation. Detector. Therefore, the detection light G received by the light receiving sensor provided separately from the detecting portion 31 is different, so that the noise component is not accurately removed.

又,由於檢測部31之受光感測器34所檢測到之檢測光G之光量I伴隨上述檢測側偏光片33之旋轉而產生變化,而且光源亮度之雜訊成分之量亦隨之而變化,故而,必需對於另外設置之受光感測器之檢測值反映檢測側偏光片33之轉動角度θ之處理。進而,於將檢測部31所具備之受光感測器34與另外設置之受光感測器進行比較時,亦必須修正由起因於感測器感度之經年變化或溫度特性之雜訊等而導致之兩者之受光特性之差異。 Further, the amount I of the detection light G detected by the light receiving sensor 34 of the detecting unit 31 changes in accordance with the rotation of the detecting side polarizing plate 33, and the amount of the noise component of the light source brightness also changes. Therefore, it is necessary to reflect the detection value of the separately received light sensor reflecting the rotation angle θ of the detection side polarizer 33. Further, when the light-receiving sensor 34 included in the detecting unit 31 is compared with a separately received light-receiving sensor, it is necessary to correct noise caused by the change in the sensitivity of the sensor or the temperature characteristic. The difference in the light receiving characteristics of the two.

如此,使用另外設置之受光感測器之測定方法包含為了實現高精度之測定而必須解決之大量問題。 As such, the measurement method using the separately provided light-receiving sensor includes a large number of problems that must be solved in order to achieve high-precision measurement.

因此,本實施形態中,將用於變化曲線Q之曲線擬合之光量I之檢測值限制為如圖5所示般於檢測光G之光量I最小之極小點附近之範圍W內所檢測到者,藉此,雖然係利用1個受光感測器34而進行之測定,但能夠以較少之測定點算出反覆精度較高之變化曲線Q。 Therefore, in the present embodiment, the detection value of the light amount I for fitting the curve of the variation curve Q is limited to be detected within the range W near the minimum point of the minimum light amount I of the detection light G as shown in FIG. Therefore, although the measurement is performed by one light receiving sensor 34, the variation curve Q having a high repeating accuracy can be calculated with a small number of measurement points.

若詳細敍述,則若使檢測光G之光量I中所占之光源亮度之雜訊成分之比率為大致固定,則雜訊成分之大小與檢測光G之光量I成比例地變大,因此,如上文所揭示之圖4所示,雜訊成分之大小係與最大光量Imax(極大點)之附近相比,於最小光量Imin(極小點)之附近變小。換言之,於最小光量Imin之附近,與最大光量Imax附近相比,因光源亮度之雜訊成分之影響而導致之光量I之變動幅度較小。 As will be described in detail, if the ratio of the noise component of the light source luminance occupied by the light amount I of the detection light G is substantially constant, the magnitude of the noise component becomes larger in proportion to the light amount I of the detection light G. As shown in FIG. 4 as disclosed above, the size of the noise component is smaller in the vicinity of the minimum light amount Imin (minimum point) than in the vicinity of the maximum light amount Imax (maximum point). In other words, in the vicinity of the minimum light amount Imin, the fluctuation amount of the light amount I due to the influence of the noise component of the light source luminance is smaller than the vicinity of the maximum light amount Imax.

因此,使用雜訊成分之影響較少之最小光量Imin附近之光量I之檢測值並藉由曲線擬合而求出上述變化曲線Q,藉此,可獲得抑制了因光源亮度之波動等之影響而導致之雜訊成分之變化曲線Q。並且,由於光源亮度之雜訊成分之影響受到抑制,故而反覆精度提高,即便進行1次測定,亦可獲得可靠性較高之變化曲線Q。 Therefore, the detected value Q of the light amount I in the vicinity of the minimum light amount Imin which is less affected by the noise component is obtained, and the above-described change curve Q is obtained by curve fitting, whereby the influence of the fluctuation of the brightness of the light source or the like can be suppressed. The resulting curve of the noise component Q. Further, since the influence of the noise component of the light source luminance is suppressed, the repeating accuracy is improved, and even if the measurement is performed once, the reliability curve Q having a high reliability can be obtained.

發明者等人藉由銳意實驗,獲得如下見解:作為最小光量Imin附近之範圍,若為檢測光G之光量I成為最大光量Imax之20%以下之轉動角度θ之範圍W,則根據以該範圍W內之轉動角度θ所測定到之檢測光G之光量I,可獲得抑制光源亮度之雜訊成分之影響而反覆精度較高之變化曲線Q。進而,發明者等人獲得如下見解:若為以可獲得最小光量Imin之轉動角度θa為中心±20°之範圍,則包含於上述 範圍W中。 The inventors of the present invention have obtained the following findings: a range of the vicinity of the minimum light amount Imin, and a range W of the rotation angle θ at which the light amount I of the detection light G becomes 20% or less of the maximum light amount Imax is based on the range The amount of light I of the detection light G measured by the rotation angle θ in W can be obtained by suppressing the influence of the noise component of the brightness of the light source and having a higher repeating accuracy curve Q. Further, the inventors obtained the following findings: if it is within a range of ±20° around the rotation angle θa at which the minimum light amount Imin is obtained, it is included in the above Range W.

根據該等見解,本實施形態中,如圖5所示,以包含於該範圍W中之4點轉動角度θ(θ=θa±10°、θa±20°)對檢測光G之光量I進行檢測,根據各轉動角度θ時之光量I,藉由曲線擬合求出上述變化曲線Q。 According to these findings, in the present embodiment, as shown in FIG. 5, the light amount I of the detection light G is performed by the four-point rotation angle θ (θ=θa±10°, θa±20°) included in the range W. It is detected that the above-described change curve Q is obtained by curve fitting based on the light amount I at each rotation angle θ.

藉由將對檢測光G之光量I進行檢測之轉動角度θ偏離10°左右,可使檢測光G之光量I之檢測值之間產生顯著之差,因此,可不使該檢測值之差隱藏於光源亮度之雜訊成分中,而確實地求出變化曲線Q。 By shifting the rotation angle θ for detecting the amount of light I of the detection light G by about 10°, a significant difference between the detected values of the light amount I of the detection light G can be made, so that the difference between the detected values can be prevented from being hidden. Among the noise components of the luminance of the light source, the variation curve Q is surely obtained.

再者,測定檢測光G之光量I之轉動角度θ不限定於4點,若為上述範圍W之範圍內,則為至少3點以上即可。 In addition, the rotation angle θ of the light amount I of the detection light G is not limited to four points, and may be at least three points or more in the range of the above range W.

變化曲線算出部23係根據包含於上述範圍W中之轉動角度θ時之檢測光G之光量I之檢測值,藉由曲線擬合(亦稱為曲線回歸)之方法求出式(1)式所示之餘弦波形,並將其輸出至偏光特性特定部24。 The change curve calculation unit 23 obtains the equation (1) by curve fitting (also referred to as curve regression) based on the detected value of the light amount I of the detection light G when the rotation angle θ is included in the above range W. The cosine waveform shown is output to the polarization characteristic specifying portion 24.

於偏光光線F之偏光方向自基準位置P0之方向偏離之情形時,即線柵偏光片16之偏光軸C1之方向自作為基準位置P0之方向之排列方向B偏離之情形時,如圖4中假想線所示,該偏離於變化曲線Q中表現為相位偏差γ(>0)。 When the polarization direction of the polarized light F is deviated from the direction of the reference position P0, that is, when the direction of the polarization axis C1 of the wire grid polarizer 16 deviates from the direction B which is the direction of the reference position P0, as shown in FIG. As indicated by the imaginary line, the deviation from the variation curve Q appears as a phase deviation γ (>0).

偏光特性特定部24係根據藉由變化曲線算出部23所求出之變化曲線Q,特定偏光光線F之偏光方向(即線柵偏光片16之偏光軸C1之方向)、及消光比,並輸出至偏光特性輸出部25。 The polarization characteristic specifying unit 24 specifies the polarization direction of the polarization ray F (that is, the direction of the polarization axis C1 of the wire grid polarizer 16) and the extinction ratio based on the variation curve Q obtained by the variation curve calculation unit 23, and outputs the same. To the polarization characteristic output unit 25.

具體而言,偏光特性特定部24如圖4所示,於變化曲線Q中,藉由特定作為可獲得檢測光G之最大光量Imax之轉動角度θ(極大點)之上述γ而特定偏光軸C1之方向,而且根據變化曲線Q之最大光量Imax與最小光量Imin之比(=最大光量Imax/最小光量Imin)而特定消光 比。變化曲線Q中之最大光量Imax係將轉動角度θ=γ(極大點)代入該變化曲線Q中而求出,而且最小光量Imin係將轉動角度θ=90°+γ(極小點)代入而求出。 Specifically, as shown in FIG. 4, the polarization characteristic specifying unit 24 specifies the polarization axis C1 by specifying the above-described γ which is the rotation angle θ (maximum point) of the maximum light amount Imax of the detection light G in the variation curve Q. Direction, and specific extinction according to the ratio of the maximum light amount Imax of the variation curve Q to the minimum light amount Imin (=maximum light amount Imax/minimum light amount Imin) ratio. The maximum light amount Imax in the variation curve Q is obtained by substituting the rotation angle θ=γ (maximum point) into the variation curve Q, and the minimum light amount Imin is obtained by substituting the rotation angle θ=90°+γ (minimum point). Out.

偏光特性輸出部25係輸出由偏光特性特定部24特定之偏光特性(偏光軸、及消光比)者。該輸出之態樣只要為使用者可利用偏光特性,則為任意,例如可列舉顯示、向其他電子機器之輸出、向記錄媒體之記錄等。 The polarization characteristic output unit 25 outputs the polarization characteristics (polarization axis and extinction ratio) specified by the polarization characteristic specifying unit 24. The aspect of the output is arbitrary as long as the user can utilize the polarization characteristic, and examples thereof include display, output to another electronic device, recording to a recording medium, and the like.

此處,可獲得最小光量Imin之轉動角度θa(極小點)係如上文所揭示之圖4所示,在檢測側偏光片33旋轉1周之期間(θ=0~360°),存在於相位偏離180°(π)之2處,因此,本實施形態中,變化曲線算出部23對於2處之轉動角度θ=θa、θa+180°各者,以範圍W內之4點轉動角度θ測定檢測光G之光量I而求出2個變化曲線Q,偏光特性特定部24對於2條變化曲線Q各者求出偏光軸、及消光比,求出其等之平均值,藉此而提高偏光軸、及消光比之測定精度。 Here, the rotation angle θa (minimum point) at which the minimum light amount Imin is obtained is as shown in FIG. 4 disclosed above, and is present in the phase during the rotation of the detection side polarizer 33 for one week (θ=0 to 360°). In the present embodiment, the change curve calculation unit 23 measures the four-point rotation angle θ in the range W for each of the two rotation angles θ=θa and θa+180°. The light amount I of the light G is detected to obtain two change curves Q, and the polarization characteristic specifying unit 24 obtains a polarization axis and an extinction ratio for each of the two change curves Q, and obtains an average value thereof, thereby improving polarization. The accuracy of the axis and the extinction ratio.

此外,本實施形態中,為了提高每2處轉動角度θ=θa、θa+180°之上述範圍W各者中4點轉動角度θ時之檢測光G之光量I之檢測精度,以相同之轉動角度θ反覆進行數次(例如10次)光量I之測定。 Further, in the present embodiment, in order to increase the detection accuracy of the light amount I of the detection light G at the four-point rotation angle θ in each of the above-described ranges W of the two rotation angles θ = θa and θa + 180°, the same rotation is performed. The angle θ is repeated several times (for example, 10 times) to measure the amount of light I.

其結果,如圖6所示,每個相同之轉動角度θ可獲得M個(M≧2)光量I之檢測值。變化曲線算出部23於自該等檢測值求出變化曲線Q時,於各轉動角度θ中選擇N個(M≧N≧1)檢測值,求出該等N個檢測值之平均值,並根據該等平均值求出變化曲線Q。由於自M個檢測值中選擇N個時之組合之數量為MCn個,因此變化曲線算出部23針對該MCn個組合之每個求出變化曲線Q。並且,偏光特性特定部24 對於MCn個變化曲線Q各者求出偏光軸、及消光比,而求出各偏光軸、及各消光比之平均值。藉此,可進一步高精度地求出偏光軸、及消光比。 As a result, as shown in FIG. 6, the detection value of M (M≧2) light amount I can be obtained for each of the same rotation angles θ. When the change curve Q is obtained from the detected values, the change curve calculation unit 23 selects N (M≧N≧1) detection values for each rotation angle θ, and obtains an average value of the N detection values, and The curve Q is obtained from the average values. Since the number of combinations of N selected from the M detection values is MCn, the change curve calculation unit 23 obtains the change curve Q for each of the MCn combinations. Further, the polarization characteristic specifying unit 24 The polarization axis and the extinction ratio are obtained for each of the MCn variation curves Q, and the average value of each polarization axis and each extinction ratio is obtained. Thereby, the polarization axis and the extinction ratio can be obtained with higher precision.

圖7係表示偏光測定系統1之測定動作之流程圖。 FIG. 7 is a flowchart showing the measurement operation of the polarization measuring system 1.

如該圖所示,偏光測定裝置20控制檢測部31之檢測側偏光片33之轉動,使轉動角度θ與測定點吻合(步驟S1)。本實施形態中,轉動角度θ之測定點如圖6所示,為θ=θa±20°、θa±10°、θa+180°±20°、θa+180°±10°之合計8點。轉動角度θa為可獲得最小光量Imin之角度(極小點),如上文所揭示之圖4所示,由θa=90°+γ規定。本實施形態中,於偏光軸C1無偏差之理想之狀態下,為γ=0。因此,於上述步驟S1中,偏光測定裝置20將轉動角度θ之測定點決定為θa=90°。 As shown in the figure, the polarization measuring device 20 controls the rotation of the detecting side polarizer 33 of the detecting unit 31 to match the rotation angle θ with the measurement point (step S1). In the present embodiment, the measurement point of the rotation angle θ is 8 points in total of θ = θa ± 20°, θa ± 10°, θa + 180° ± 20°, and θa + 180 ° ± 10° as shown in Fig. 6 . The rotation angle θa is an angle (minimum point) at which the minimum light amount Imin can be obtained, as shown in Fig. 4 disclosed above, which is specified by θa = 90° + γ. In the present embodiment, γ = 0 in a state where the polarization axis C1 is not deviated. Therefore, in the above-described step S1, the polarization measuring device 20 determines the measurement point of the rotational angle θ as θa = 90°.

繼而,偏光測定裝置20連續M次斷續地取入檢測光G之光量I之檢測訊號35,取得M個光量I之檢測值(步驟S2)。 Then, the polarization measuring device 20 intermittently takes in the detection signal 35 of the light amount I of the detection light G intermittently, and acquires the detected values of the M light amounts I (step S2).

偏光測定裝置20於轉動角度θ之所有測定點,反覆執行上述步驟S1、及步驟S2,直至取得M個光量I之檢測值為止(步驟S3:Yes(是))。 The polarization measuring device 20 repeatedly performs the above-described steps S1 and S2 at all the measurement points of the rotation angle θ until the detection values of the M light amounts I are obtained (step S3: Yes).

偏光測定裝置20為了使用最小光量Imin附近(極小點附近)之光量I之檢測值求出變化曲線Q,而根據轉動角度θ=θa±20°、θa±10°之4點時之光量I之檢測值,藉由曲線擬合而求出遵循上述(1)式之變化曲線Q(步驟S4)。若詳細敍述,則偏光測定裝置20對於該等轉動角度θ之每個選擇N個(M≧N≧1)檢測值,求出該等N個檢測值之平均值,將其作為轉動角度θ之檢測值而藉由曲線擬合求出變化曲線Q。如上所述,求出MCn個變化曲線Q。繼而,偏光測定裝置20對於MCn個變化曲線Q各者求出偏光軸、及消光比,而求出各偏光軸、及各消光比之平均值(步驟S5)。 The polarization measuring device 20 obtains the variation curve Q for using the detected value of the light amount I in the vicinity of the minimum light amount Imin (near the minimum point), and the light amount I at the four points according to the rotation angle θ = θa ± 20° and θa ± 10° The detected value is obtained by curve fitting to obtain a curve Q that follows the above formula (1) (step S4). When the details are described, the polarization measuring device 20 selects N (M≧N≧1) detection values for each of the rotation angles θ, and obtains an average value of the N detection values as the rotation angle θ. The value is detected and the curve Q is obtained by curve fitting. As described above, the MCn variation curves Q are obtained. Then, the polarization measuring device 20 obtains a polarization axis and an extinction ratio for each of the MCn variation curves Q, and obtains an average value of each polarization axis and each extinction ratio (step S5).

偏光測定裝置20以與步驟S4、及S5相同之方式,根據轉動角度θ=θa+180°±20°、θa+180°±10°之4點時之光量I之檢測值,藉由曲線擬合而求出變化曲線Q(步驟S6),並根據該變化曲線Q,特定偏光軸、及消光比(步驟S7)。 In the same manner as steps S4 and S5, the polarization measuring device 20 is based on the detection value of the light amount I at the four points of the rotation angle θ=θa+180°±20° and θa+180°±10°. The change curve Q is obtained in combination (step S6), and the polarization axis and the extinction ratio are specified based on the change curve Q (step S7).

繼而,偏光測定裝置20藉由求出步驟S5、及步驟S7中所求出之偏光軸、及消光比之平均值而特定偏光光線之偏光軸、及消光比(步驟S8)。 Then, the polarization measuring device 20 determines the polarization axis of the polarized light and the extinction ratio by obtaining the average of the polarization axes and the extinction ratios obtained in steps S5 and S7 (step S8).

藉此,可高精度地求出偏光光線之偏光軸、及消光比。 Thereby, the polarization axis of the polarized light and the extinction ratio can be obtained with high precision.

再者,於該測定中,偏光測定裝置20亦可根據變化曲線Q,而特定可獲得最小光量Imin之轉動角度θ=θa、可獲得最大光量Imax之轉動角度θ=γ,使檢測部31之檢測側偏光片33轉動,以各個轉動角度θ實際地檢測檢測光G之光量I,根據該檢測值而求出消光比。 Further, in the measurement, the polarization measuring device 20 can specify the rotation angle θ=θa at which the minimum light amount Imin can be obtained, and the rotation angle θ=γ at which the maximum light amount Imax can be obtained, so that the detecting portion 31 can be used. The detection side polarizer 33 is rotated, and the light amount I of the detection light G is actually detected at each rotation angle θ, and the extinction ratio is obtained based on the detection value.

又,於上述偏光測定中,於即便不進行步驟S6~步驟S8之處理亦可獲得所需之精度之情形時,亦可不進行該等步驟S6~步驟S8之處理而將步驟S5中所特定之偏光軸、及消光比作為測定結果。又,亦可使作業人員等使用者可選擇是否進行該等步驟S6~步驟S8之處理。 Further, in the above-described polarization measurement, even if the required precision is obtained without performing the processing of steps S6 to S8, the processing specified in step S5 may be omitted without performing the processing of steps S6 to S8. The polarization axis and the extinction ratio were used as the measurement results. Further, the user or the like can also select whether or not to perform the processing of steps S6 to S8.

接下來,對使用偏光測定系統1之光配向裝置2之偏光光線之測定進行說明。 Next, the measurement of the polarized light of the optical alignment device 2 using the polarization measuring system 1 will be described.

作業人員首先將測定單元30設置於光配向裝置2。於該設置時,作業人員係以線性導軌32之引導方向與上述線柵偏光片16之排列方向B平行且位於偏光片單元10之正下方之方式設置線性導軌32。其次,作業人員藉由線性導軌32引導檢測部31而將其配置於測定對象之線柵偏光片16之正下方,使用偏光測定系統1,檢測自該線柵偏光片16出射之偏光光線F,測定該線柵偏光片16之偏光軸C1、及消光 比。作業人員根據偏光軸C1之測定結果,視需要對線柵偏光片16之轉動進行微調整,藉此使偏光軸C1之方向與既定方向(本實施形態中為排列方向B)吻合。 The worker first sets the measurement unit 30 to the optical alignment device 2. At the time of this setting, the operator sets the linear guide 32 such that the guiding direction of the linear guide 32 is parallel to the arrangement direction B of the wire grid polarizer 16 and directly below the polarizer unit 10. Then, the operator guides the detecting unit 31 by the linear guide 32 and arranges it under the wire grid polarizer 16 of the measurement target, and detects the polarized light F emitted from the wire grid polarizer 16 using the polarization measuring system 1 . Measuring the polarization axis C1 of the wire grid polarizer 16 and extinction ratio. According to the measurement result of the polarization axis C1, the operator finely adjusts the rotation of the wire grid polarizer 16 as needed, thereby matching the direction of the polarization axis C1 with the predetermined direction (the arrangement direction B in the present embodiment).

作業人員對於偏光片單元10所具備之全部線柵偏光片16同樣地進行偏光光線F之測定,根據該測定結果,進行使偏光軸C1之方向與排列方向B吻合之作業,藉此使全部線柵偏光片16之偏光軸C1之方向沿排列方向B對齊。 The operator performs the measurement of the polarized light F in the same manner for all of the wire grid polarizers 16 included in the polarizer unit 10, and based on the measurement result, the operation of matching the direction of the polarization axis C1 with the arrangement direction B is performed, thereby making all the lines The direction of the polarization axis C1 of the gate polarizer 16 is aligned in the arrangement direction B.

如上所述,根據該偏光測定系統1,即便不進行數次同樣之測定,亦可獲得反覆精度較高且可靠性較高之變化曲線Q,可自該變化曲線Q高精度地特定偏光軸C1之方向。因此,於對各個線柵偏光片16進行微調整時,可減少偏光光線F之測定次數,而且可在短時間內結束微調整作業,並且以較高之精度調整偏光軸C1之方向。 As described above, according to the polarization measuring system 1, the variation curve Q having high repetition accuracy and high reliability can be obtained without performing the same measurement several times, and the polarization axis C1 can be specified with high precision from the variation curve Q. The direction. Therefore, when the respective wire grid polarizers 16 are finely adjusted, the number of times of measurement of the polarized light F can be reduced, and the fine adjustment operation can be ended in a short time, and the direction of the polarization axis C1 can be adjusted with high precision.

且說,光配向裝置2中,自棒狀之燈7所放射之各種角度之放射光E入射至線柵偏光片16,藉由線柵偏光片16經直線偏光化而出射。 In the optical alignment device 2, the radiation E of various angles radiated from the rod-shaped lamp 7 is incident on the wire grid polarizer 16, and is emitted by linearly polarizing the wire grid polarizer 16.

另一方面,一直以來已知有將格蘭-湯姆森偏光稜鏡用於檢測側偏光片33之檢測部。然而,於使用有格蘭-湯姆森偏光稜鏡之檢測部中,格蘭-湯姆森偏光稜鏡之消光比因入射角而大幅度變化,故而必須極力縮小入射至該檢測部之入射角。 On the other hand, it has been known to use a Glan-Thomson polarizing ray for detecting a detecting portion of the side polarizer 33. However, in the detection unit using the Glan-Thomson polarization, the extinction ratio of the Glan-Thomson polarization is greatly changed by the incident angle, and therefore the incident angle incident on the detection portion must be minimized.

因此,習知之檢測部中,僅可檢測自線柵偏光片16所輸出之包含各種角度成分之偏光光線F中非常受限制之範圍之角度成分,無法準確地測定該偏光光線F。 Therefore, in the conventional detecting unit, only the angular component of the range of the polarized light F including the various angular components outputted from the wire grid polarizer 16 can be detected, and the polarized light F cannot be accurately measured.

因此,本實施形態中,藉由使用以下所說明之構成之檢測部31,即便為包含各種角度成分之偏光光線F,亦可檢測較廣之角度成分之範 圍而測定偏光特性。 Therefore, in the present embodiment, by using the detecting unit 31 having the configuration described below, it is possible to detect a wide angle component even if it is a polarized ray F including various angular components. The polarization characteristics were measured.

圖8係表示檢測部31之構成之外觀立體圖,圖9係檢測部31之剖面圖。 8 is an external perspective view showing the configuration of the detecting unit 31, and FIG. 9 is a cross-sectional view of the detecting unit 31.

檢測部31如該等圖所示,具備矩形板狀之基座70,於其上具備受光感測器單元71、檢測側偏光片33、旋轉載置台72、及檢測光調整單元73(圖9)。 As shown in the above figures, the detecting unit 31 includes a rectangular plate-shaped base 70, and includes a light receiving sensor unit 71, a detecting side polarizing plate 33, a rotating mounting table 72, and a detecting light adjusting unit 73 (FIG. 9). ).

受光感測器單元71具備作為受光感測器34之一例之光電倍增管74、及使該光電倍增管74冷卻並使溫度保持為固定並降低因光電倍增管74之溫度特性而導致之雜訊之水冷基底75,且光電倍增管74之檢測訊號35(圖3)被偏光測定裝置20取入。 The photosensor unit 71 includes a photomultiplier tube 74 as an example of the photodetector 34, and the photomultiplier tube 74 is cooled to keep the temperature constant and reduce the noise caused by the temperature characteristics of the photomultiplier tube 74. The substrate 75 is water-cooled, and the detection signal 35 (Fig. 3) of the photomultiplier tube 74 is taken in by the polarization measuring device 20.

基座70卡合於線性導軌32並由該線性導軌32直線性地引導。藉由使基座70之既定之一邊與線性導軌32之長軸方向吻合地進行安裝,而構成為基準位置P0、及檢測側偏光片33之偏光軸C2朝向照射基準方向。再者,若可使基座70之既定之一邊與照射基準方向吻合地進行設置,則未必使用線性導軌32。 The base 70 is engaged with the linear guide 32 and linearly guided by the linear guide 32. By arranging one of the predetermined sides of the susceptor 70 in conformity with the long-axis direction of the linear guide 32, the reference position P0 and the polarization axis C2 of the detecting-side polarizer 33 are oriented toward the irradiation reference direction. Further, the linear guide 32 is not necessarily used if one of the predetermined sides of the susceptor 70 is provided to coincide with the irradiation reference direction.

檢測側偏光片33配置於光電倍增管74之檢測面74A之正上方,由形成有既定直徑之開口76A之孔徑76覆蓋檢測光G之入射側。該孔徑76係限制朝向檢測側偏光片33之入射光者,但於該檢測部31中,為了配合線柵偏光片16亦使斜入射之光透過而生成偏光光線F,且亦取入根據該等斜入射之成分之偏光光線F,開口76A係以使入射角Y為0°~70°之範圍之偏光光線F通過之方式形成。 The detecting side polarizer 33 is disposed directly above the detecting surface 74A of the photomultiplier tube 74, and covers the incident side of the detecting light G by the aperture 76 formed with the opening 76A of a predetermined diameter. The aperture 76 restricts the incident light toward the detecting side polarizer 33. However, in the detecting portion 31, oblique light is transmitted through the wire grid polarizer 16 to generate the polarized light F, and is also taken in accordance with the aperture The polarized light F of the component which is obliquely incident, and the opening 76A is formed by passing the polarized light F having an incident angle Y of 0° to 70°.

再者,入射角Y之範圍係根據檢測部31、線柵偏光片16、及燈7各者之形狀或配置關係,而決定為自線柵偏光片16傾斜地放射之偏光光線F之成分被取入之角度。 Further, the range of the incident angle Y is determined based on the shape or arrangement relationship of each of the detecting portion 31, the wire grid polarizer 16, and the lamp 7, and the component of the polarized light F radiated obliquely from the wire grid polarizer 16 is taken. Into the angle.

檢測光調整單元73為配設於檢測側偏光片33與光電倍增管74之檢測面74A之間之筒狀之構件,且具備筒體77,將通過孔徑76被取入並通過檢測側偏光片33之檢測光G自筒體77之上表面取入,於內部進行混合並自下表面導入至光電倍增管74。 The detection light adjustment unit 73 is a cylindrical member disposed between the detection side polarizer 33 and the detection surface 74A of the photomultiplier tube 74, and includes a cylindrical body 77 that is taken in through the aperture 76 and passed through the detection side polarizer. The detection light G of 33 is taken in from the upper surface of the cylinder 77, mixed internally, and introduced into the photomultiplier tube 74 from the lower surface.

具體而言,於檢測光調整單元73之筒體77之上表面,設置有孔徑78,該孔徑78形成有使至孔徑76所取入之入射角Y之範圍之檢測光G通過內部之開口78A。 Specifically, on the upper surface of the cylindrical body 77 of the detecting light adjusting unit 73, an aperture 78 is formed which is formed with an opening 78A through which the detection light G of the range of the incident angle Y taken in by the aperture 76 is passed. .

於筒體77,為了確保較廣之光線入射角,及解除所取入之光線之偏光狀態而進行無偏光化,於孔徑78之正下方不隔開間隙地設置有使所透過之光擴散之擴散單元79。擴散單元79具備以既定間隔對面配置之2片擴散板79A、79B,將各種入射角Y之檢測光G混合並輸出。對於擴散板79A、79B,例如使用磨砂(frost)型合成石英板。 In the cylindrical body 77, in order to ensure a wide angle of incidence of the light and to cancel the polarization state of the taken light, the polarizing is performed, and the transmitted light is diffused without being separated by a gap directly below the aperture 78. Diffusion unit 79. The diffusion unit 79 includes two diffusion plates 79A and 79B that are disposed opposite to each other at a predetermined interval, and mix and output the detection light G of various incident angles Y. For the diffusion plates 79A and 79B, for example, a frost-type synthetic quartz plate is used.

於筒體77之下表面,設置有形成有限制朝向光電倍增管74之入射光量之針孔80A之板材80,使通過該針孔80A之光入射至光電倍增管74之檢測面74A。 On the lower surface of the cylindrical body 77, a plate member 80 having a pinhole 80A for restricting the amount of incident light toward the photomultiplier tube 74 is formed, and light passing through the pinhole 80A is incident on the detecting surface 74A of the photomultiplier tube 74.

又,於針孔80A與光電倍增管74之檢測面74A之間,設置有截斷光配向作用波長以外之波長之光之波長限制濾光片81,將藉由波長限制濾光片81而使環境光被截斷之光導入至光電倍增管74。 Further, between the pinhole 80A and the detection surface 74A of the photomultiplier tube 74, a wavelength limiting filter 81 that cuts light having a wavelength other than the wavelength of the light distribution is provided, and the environment is limited by the wavelength limiting filter 81. The light-cut light is introduced into the photomultiplier tube 74.

如此,檢測部31係設為至相對較大之入射角Y之範圍取入偏光光線F並於內部使其擴散且藉由光電倍增管74檢測光量之構成,因此,即便係如使棒狀之燈7之放射光E通過線柵偏光片16而獲得之偏光光線F般包含各種角度成分之偏光光線F,亦可檢測較廣之角度成分之範圍而測定偏光特性。 In this manner, the detecting unit 31 is configured to take the polarized light F into a relatively large incident angle Y and diffuse it inside, and detect the amount of light by the photomultiplier tube 74. Therefore, even if it is made of a rod shape The polarized light E obtained by the light emitted from the lamp 7 through the wire grid polarizer 16 includes the polarized light F of various angular components, and the range of the wide angle component can be detected to measure the polarization characteristics.

如以上所說明般,根據本實施形態,設為如下構成:根 據一邊使檢測側偏光片33轉動而一邊檢測依序透過線柵偏光片16、及檢測側偏光片33之檢測光G而所獲得之在各轉動角度θ之光量I,而求出表示使檢測側偏光片33於旋轉1周時之光量I之週期性變化之變化曲線Q,此時係根據包含作為變化曲線Q之1個極小點之轉動角度θ=θa且包含於光量I成為既定值以下(本實施形態中,為最大光量Imax之約20%以下)之轉動角度θ之範圍W中之在各轉動角度θ=θa±20°、θa±10°之光量I,而求出變化曲線Q。 As described above, according to the present embodiment, the following configuration is adopted: The detection of the light amount I at each rotation angle θ obtained by sequentially transmitting the detection light G of the wire grid polarizer 16 and the detection side polarizer 33 while rotating the detection side polarizer 33 is performed to determine the detection. The curve Q of the periodic variation of the amount of light I when the side polarizer 33 is rotated for one week is obtained by including the rotation angle θ=θa which is one minimum point of the variation curve Q and is included in the light amount I to be a predetermined value or less. (In the present embodiment, in the range W of the rotational angle θ of the maximum light amount Imax, the light amount I at each of the rotational angles θ = θa ± 20° and θa ± 10° is obtained, and the variation curve Q is obtained. .

藉此,根據與作為極大點之最大光量Imax附近之光量I之檢測值相比、檢測值中所含之雜訊成分較少之檢測值,而求出變化曲線,故而,變化曲線之精度提高。藉由自該變化曲線求出偏光特性,可精度良好地求出偏光特性。 In this way, the variation curve is obtained based on the detected value of the noise component included in the detected value as compared with the detected value of the light amount I in the vicinity of the maximum light amount Imax of the maximum point, so that the accuracy of the change curve is improved. . By obtaining the polarization characteristics from the change curve, the polarization characteristics can be accurately obtained.

又,由於只要僅測定作為極小點之最小光量Imin附近之光量I即可,故而能夠以較少之測定次數進行高精度之測定。 Further, since only the amount of light I in the vicinity of the minimum light amount Imin which is the minimum point is measured, it is possible to perform measurement with high precision with a small number of measurement times.

又,根據本實施形態,設為如下構成:根據包含作為與上述轉動角度θ=θa不同之1個極小點之轉動角度θ=θa+180°且包含於光量I成為既定值以下之轉動角度θ之範圍W中之在轉動角度θ=θa+180°±20°、θa+180°±10°之光量I,而求出變化曲線Q,根據該變化曲線Q特定偏光光線F之偏光特性,並且,根據與自對應於包含上述轉動角度θ=θa之範圍W之變化曲線Q所特定之偏光特性之平均,特定偏光光線F之偏光特性。 Further, according to the present embodiment, the rotation angle θ is included in the rotation angle θ=θa+180° which is one of the minimum points different from the rotation angle θ=θa and is included in the rotation amount θ which is equal to or less than the predetermined value. In the range W, the light amount I at the rotation angle θ=θa+180°±20°, θa+180°±10°, and the variation curve Q is obtained, according to which the polarization characteristic of the polarization ray F is specified, and The polarization characteristic of the specific polarized light F is specified based on the average of the polarization characteristics specified by the variation curve Q corresponding to the range W including the above-described rotational angle θ = θa.

藉此,於必需高精度之測定之情形時,可精度更加良好地求出偏光光線F之偏光特性。 Therefore, when it is necessary to measure with high precision, the polarization characteristics of the polarized light F can be obtained with higher accuracy.

又,本實施形態中,藉由將上述範圍W設為檢測光G之光量I相對於最大光量Imax成為約20%之光量之範圍,可獲得抑制 了雜訊成分之影響之高精度之變化曲線Q。 In the present embodiment, the range W is set such that the light amount I of the detection light G is within a range of about 20% of the maximum light amount Imax. The high-precision curve Q of the influence of the noise component.

又,根據本實施形態,檢測部31構成為具有:孔徑76,其取入包含斜入射成分之偏光光線F並使其入射至檢測側偏光片33;擴散單元79,其使透過檢測側偏光片33之光擴散;及作為受光感測器之光電倍增管74,其接收藉由該擴散單元79經擴散之光並檢測光量I。 Further, according to the present embodiment, the detecting unit 31 is configured to include an aperture 76 that takes in the polarized light F including the oblique incident component and enters the detecting side polarizing plate 33, and a diffusing unit 79 that transmits the detecting side polarizer The light diffusion of 33; and a photomultiplier tube 74 as a light-receiving sensor receives the light diffused by the diffusion unit 79 and detects the amount of light I.

藉此,即便係如使棒狀之燈7之放射光E通過線柵偏光片16而獲得之偏光光線F般包含各種角度成分之偏光光線F,亦可檢測較廣之角度成分之範圍並測定偏光特性。 Thereby, even if the polarized light F of various angle components is included in the polarized light F obtained by passing the emitted light E of the rod-shaped lamp 7 through the wire grid polarizer 16, the range of the wide angle component can be detected and measured. Polarized characteristics.

<第2實施形態> <Second embodiment>

接下來,參照圖10或圖14,對本發明之第2實施形態進行說明。 Next, a second embodiment of the present invention will be described with reference to Fig. 10 or Fig. 14 .

上述第1實施形態中係針對每個線柵偏光片16測定偏光軸C1,但第2實施形態中係針對每個光配向對象物之位置(測定點)測定偏光光線之偏光方向。再者,第2實施形態中,對與第1實施形態相同之部分標附相同之符號而省略說明。 In the first embodiment, the polarization axis C1 is measured for each of the wire grid polarizers 16. However, in the second embodiment, the polarization direction of the polarization light is measured for each position (measurement point) of the light alignment object. In the second embodiment, the same portions as those in the first embodiment are denoted by the same reference numerals and will not be described.

圖10係表示第2實施形態之光配向裝置100之構成之圖。 Fig. 10 is a view showing the configuration of the optical alignment device 100 of the second embodiment.

光配向裝置100具備偏光測定系統1,該光配向裝置100中,為了提高照射光之均勻性之目的,而且為了防止於光配向對象物之處理中(照射中)自配向膜所產生之逸氣附著之目的,線柵偏光片16如圖10所示,自光配向對象物之表面之配向膜隔開既定之距離而配置。光配向裝置100除具備偏光測定系統1之構成、及線柵偏光片16與配向膜之距離以外,形成為與第1實施形態之光配向裝置1相同。 The optical alignment device 100 includes a polarization measuring system 1 for preventing the uniformity of the irradiation light and preventing the escape from the alignment film during the processing of the light alignment object (in the process of irradiation). For the purpose of adhesion, as shown in FIG. 10, the wire grid polarizer 16 is disposed with a predetermined distance from the alignment film on the surface of the light-aligning object. The optical alignment device 100 is formed in the same manner as the optical alignment device 1 of the first embodiment except that the configuration of the polarization measuring system 1 and the distance between the wire grid polarizer 16 and the alignment film are provided.

又,如上所述,自棒狀之燈7所放射之各種角度之放射光E入射 至線柵偏光片16,藉由線柵偏光片16經直線偏光化而作為偏光光線F出射。此種偏光光線F包含各種角度成分。 Further, as described above, the incident light E of various angles radiated from the rod-shaped lamp 7 is incident. The wire grid polarizer 16 is emitted as a polarized light F by linearly polarizing the wire grid polarizer 16. Such polarized light F contains various angular components.

如此,線柵偏光片16係自光配向對象物之表面之配向膜隔開既定之距離而配置,並且偏光光線F包含各種角度成分,因此,通過數個線柵偏光片16之偏光光線F重合而照射至光配向對象物。偏光光線F之偏光特性由於因所通過之偏光片之部位而導致之特性差異之影響或入射角之影響而未經統一,從而對光配向對象物照射具有各種偏光特性之偏光光線F。 In this manner, the wire grid polarizer 16 is disposed with a predetermined distance from the alignment film of the surface of the light-aligning object, and the polarized light F includes various angular components, and thus the polarized light F of the plurality of wire grid polarizers 16 overlaps. The light is directed to the object of the light. The polarization characteristics of the polarized light F are not uniform due to the influence of the difference in characteristics or the incident angle due to the portion of the polarizer that passes through, and the polarized light F having various polarization characteristics is irradiated to the light-aligning object.

例如,本實施形態中,若將照射器6正下方之燈7長度方向之照射分佈針對每個線柵偏光片16(n-3~n+1)而分離,則成為如圖11所示之曲線,某一照射位置(0mm)之照射光量受到兩側3個照射位置之照射光量之影響。如圖11所示,即便於線柵偏光片16之中心正下方,作為照射光,通過正上方之線柵偏光片16之光量亦為成為通過周圍之線柵偏光片16之光量之合計之照射光量之一半左右。 For example, in the present embodiment, when the illumination distribution in the longitudinal direction of the lamp 7 directly under the illuminator 6 is separated for each of the wire grid polarizers 16 (n-3 to n+1), it is as shown in FIG. In the curve, the amount of illumination light at a certain irradiation position (0 mm) is affected by the amount of illumination light at three irradiation positions on both sides. As shown in Fig. 11, even when the center of the wire grid polarizer 16 is directly below, as the irradiation light, the amount of light passing through the wire grid polarizer 16 directly above is the total amount of light passing through the surrounding wire grid polarizer 16. One and a half of the amount of light.

又,框架14及固定框架14之偏光片單元固定台9等構造構件係由遮光構件形成,或者,由遮光構件覆蓋等而構成為遮光構件。然而,無法完全防止於框架14或偏光片單元固定台9等構造構件之反射,如圖12所示,由構造構件反射之反射光H亦成為散射光並照射至工件載置台5上之光配向對象物T。偏光光線F之偏光特性亦根據反射而產生變化。再者,於反射光H,亦包含由光配向對象物T之表面之配向膜反射之後由線柵偏光片16反射之光等。 Further, the structural members such as the polarizer unit fixing base 9 of the frame 14 and the fixed frame 14 are formed of a light shielding member, or are covered by a light shielding member to constitute a light shielding member. However, reflection of the structural member such as the frame 14 or the polarizer unit fixing table 9 cannot be completely prevented, and as shown in FIG. 12, the reflected light H reflected by the structural member also becomes scattered light and is incident on the workpiece mounting table 5 Object T. The polarization characteristics of the polarized light F also vary depending on the reflection. Further, the reflected light H also includes light reflected by the alignment film of the surface of the object T and then reflected by the wire grid polarizer 16 and the like.

因此,於例如使檢測部31之檢測光之取入角度範圍變窄並針對每個線柵偏光片16測定偏光軸C1之情形時,無法對測定對象以外之線柵偏光片16之偏光光線F或反射光H進行測定。其結果, 不可謂準確地測定了實際照射至光配向對象物之照射光之偏光特性。 Therefore, for example, when the angle of incidence of the detection light of the detecting unit 31 is narrowed and the polarization axis C1 is measured for each of the wire grid polarizers 16, the polarized light F of the wire grid polarizer 16 other than the measurement target cannot be obtained. Or the reflected light H is measured. the result, The polarization characteristics of the illumination light actually irradiated to the light-aligning object can not be accurately measured.

因此,本實施形態中,藉由使用至相對較大之入射角Y之範圍而取入偏光光線F並於內部使其擴散並利用光電倍增管74檢測光量之檢測部31,可檢測較廣之角度成分之範圍而測定實際照射至光配向對象物之偏光光線F(照射光)之偏光特性(偏光方向、消光比)。 Therefore, in the present embodiment, the detection unit 31 that takes in the polarized light F and diffuses the inside and uses the photomultiplier tube 74 to detect the amount of light by using the range of the relatively large incident angle Y can detect a wider range. The polarization characteristics (polarization direction, extinction ratio) of the polarized light F (irradiation light) actually irradiated to the light-aligning object are measured in the range of the angle component.

再者,檢測部31所接收之檢測光G為燈7之放射光E依序通過作為直線偏光片之線柵偏光片16、及檢測側偏光片33而獲得之光,且為數個線柵偏光片16之偏光光線重合後之光。即,相位偏差γ係作為偏光光線F之偏光方向相對於基準位置P0之相位差被求出。又,檢測光G中包含數個線柵偏光片16之偏光光線或反射光,因此,偏光光線之偏光方向及消光比進行分佈,而偏光光線之偏光方向及消光比係根據分佈之峰值而求出。 Further, the detection light G received by the detecting unit 31 is the light obtained by sequentially passing the emitted light E of the lamp 7 through the line-gate polarizer 16 as the linear polarizer and the detecting-side polarizing plate 33, and is a plurality of wire grid polarized lights. The light of the polarized light of the sheet 16 coincides. In other words, the phase deviation γ is obtained as the phase difference between the polarization direction of the polarized ray F and the reference position P0. Further, since the detection light G includes a plurality of polarization ray beams or reflected light of the wire grid polarizer 16, the polarization direction and the extinction ratio of the polarization ray are distributed, and the polarization direction and the extinction ratio of the polarization ray are obtained according to the peak value of the distribution. Out.

且說,線柵偏光片16係使用玻璃等材料而形成,為相對較易損壞之光學元件,故而,經由緩衝材料(未圖示)保持於框架14。更詳細而言,偏光軸C1經調整之線柵偏光片16如圖13所示,藉由單位偏光片單元12之上端、及下端由螺釘(固定手段)19固定於框架14,而固定配置於框架14。因保持線柵偏光片16之緩衝材料之經年劣化或光配向裝置100之振動,有產生線柵偏光片16之位置偏移之虞,其結果,偏光光線之偏光方向偏移。 In other words, the wire grid polarizer 16 is formed of a material such as glass and is a relatively easily damaged optical component. Therefore, it is held by the frame 14 via a cushioning material (not shown). More specifically, the wire grid polarizer 16 whose polarization axis C1 is adjusted is fixed to the frame 14 by screws (fixing means) 19 at the upper end and the lower end of the unit polarizer unit 12 as shown in FIG. Frame 14. The deterioration of the buffer material of the wire grid polarizer 16 or the vibration of the light alignment device 100 causes the positional shift of the wire grid polarizer 16 to occur, and as a result, the polarization direction of the polarized light is shifted.

又,於光配向對象物之處理中(照射中)有自配向膜產生逸氣之情況,若該逸氣等雜質混入、或附著於線柵偏光片16,則線柵偏光片16之偏光特性會產生變化。 Further, in the treatment of the light-aligning object (during irradiation), there is a case where the gas is generated from the alignment film, and if impurities such as outgas are mixed in or adhered to the wire grid polarizer 16, the polarization characteristics of the wire grid polarizer 16 are obtained. Will change.

本實施形態之光配向裝置100中,並非藉由偏光測定系統1經常測定偏光特性,而係於因經年劣化或逸氣等而使偏光特性產生變化之 既定期間後、例如1個月後測定偏光特性。 In the optical alignment device 100 of the present embodiment, the polarization characteristics are not always measured by the polarization measuring system 1, but the polarization characteristics are changed due to deterioration over time or outgas. The polarizing characteristics were measured after a predetermined period of time, for example, one month later.

接下來,參照圖14,對光配向裝置100之偏光光線之測定進行說明。 Next, the measurement of the polarized light of the optical alignment device 100 will be described with reference to FIG. 14.

圖14係表示偏光軸調整裝置D之示意圖。 Fig. 14 is a schematic view showing the polarization axis adjusting device D.

偏光軸調整裝置D係具備偏光測定系統1A、及點光源7A且調整線柵偏光片16之偏光軸C1之方向之裝置。偏光測定系統1A除檢測部31A之開口(未圖示)形成得較偏光測定系統1之檢測部31之開口76A窄以外,與偏光測定系統1構成相同。再者,圖14中,對與光配向裝置100相同之部分標附同樣之符號而表示,並省略說明。 The polarization axis adjustment device D includes a polarization measuring system 1A and a point light source 7A, and adjusts the direction of the polarization axis C1 of the wire grid polarizer 16. The polarization measuring system 1A has the same configuration as the polarization measuring system 1 except that the opening (not shown) of the detecting unit 31A is formed to be narrower than the opening 76A of the detecting unit 31 of the polarization measuring system 1. In FIG. 14, the same portions as those of the optical alignment device 100 are denoted by the same reference numerals, and description thereof will be omitted.

作業人員首先於另一位置之偏光軸調整裝置D配置偏光片單元10。其次,作業人員將偏光軸調整裝置D之檢測部31A配置於測定對象之線柵偏光片16之正下方,並且將點光源7A配置於測定對象之線柵偏光片16之正上方。繼而,作業人員使用偏光測定系統1A檢測自該線柵偏光片16出射之偏光光線F,測定該線柵偏光片16之偏光軸C1、及消光比。作業人員根據偏光軸C1之測定結果,視需要對線柵偏光片16之轉動進行微調整,藉此使偏光軸C1之方向與既定方向(本實施形態中為照射基準方向)吻合。 The operator first arranges the polarizer unit 10 at the polarization axis adjusting device D at another position. Next, the operator arranges the detecting unit 31A of the polarization axis adjusting device D directly under the wire grid polarizer 16 to be measured, and arranges the point light source 7A directly above the wire grid polarizer 16 to be measured. Then, the operator detects the polarized light F emitted from the wire grid polarizer 16 using the polarization measuring system 1A, and measures the polarization axis C1 and the extinction ratio of the wire grid polarizer 16. According to the measurement result of the polarization axis C1, the operator finely adjusts the rotation of the wire grid polarizer 16 as needed, thereby matching the direction of the polarization axis C1 with the predetermined direction (the irradiation reference direction in the present embodiment).

作業人員對於偏光片單元10所具備之全部線柵偏光片16同樣地進行偏光光線F之測定,根據該測定結果,進行使偏光軸C1之方向與照射基準方向吻合之作業,藉此使全部線柵偏光片16之偏光軸C1之方向沿照射基準方向對齊。 The operator performs the measurement of the polarized light F in the same manner for all of the wire grid polarizers 16 included in the polarizer unit 10, and based on the measurement result, the operation of matching the direction of the polarization axis C1 with the irradiation reference direction is performed, thereby making all the lines The direction of the polarization axis C1 of the gate polarizer 16 is aligned in the irradiation reference direction.

繼而,作業人員將經調整之偏光片單元10設置於光配向裝置100,對偏光測定系統1指示偏光特性(偏光方向、消光比)之測定之開始。偏光特性係於線柵偏光片16之排列方向B上數個測定點進 行測定,測定點係由作業人員設定,並記憶於偏光測定系統1中。 Then, the operator sets the adjusted polarizer unit 10 to the optical alignment device 100, and instructs the polarization measuring system 1 to start the measurement of the polarization characteristics (polarization direction, extinction ratio). The polarization characteristics are determined by several measurement points in the arrangement direction B of the wire grid polarizer 16 The measurement is performed by the operator and stored in the polarization measuring system 1.

偏光測定系統1係藉由線性導軌32將檢測部31引導並配置於所設定之既定之測定點,檢測自該線柵偏光片16出射之偏光光線F,測定偏光方向、及消光比。偏光測定系統1對於全部測定點測定偏光光線F後,將其結果及其合格與否之判定輸出至偏光特性輸出部25。合格與否之判定值亦由作業人員設定,並記憶於偏光測定系統1中。 In the polarization measuring system 1, the detecting unit 31 is guided by the linear guide 32 and placed at a predetermined measurement point, and the polarized light F emitted from the wire grid polarizer 16 is detected, and the polarization direction and the extinction ratio are measured. The polarization measuring system 1 outputs the polarization ray F to all the measurement points, and outputs the result and the determination of the pass or fail to the polarization characteristic output unit 25. The judgment value of the pass or fail is also set by the operator and is stored in the polarization measuring system 1.

如上所述,根據該光配向裝置100,由於測定實際照射至光配向對象物之偏光光線,故而可高精度地特定偏光光線之偏光方向。於光配向裝置100中,照射至光配向對象物之偏光特性係表示光配向裝置100之性能者,而且成為決定由偏光光線所配向之配向膜之優劣之主要因素,故而把握其特性非常重要。 As described above, according to the optical alignment device 100, since the polarized light that is actually irradiated onto the light-aligning object is measured, the polarization direction of the polarized light can be specified with high precision. In the light alignment device 100, the polarization characteristics of the light-aligning object are indicative of the performance of the light-aligning device 100, and are the main factors determining the quality of the alignment film to be aligned by the polarized light. Therefore, it is important to grasp the characteristics.

作業人員於全部測定點之偏光特性滿足基準之情形時結束測定,於即便有一個測定點之偏光特性不滿足基準之情形時,便於偏光軸調整裝置D中調整線柵偏光片16之偏光軸C1之方向,或者,維護偏光片單元10。再者,由於線柵偏光片16於調整後藉由螺釘19而固定於框架14,故而於自偏光軸調整裝置D朝向光配向裝置100之設置等中,線柵偏光片16之偏光軸C1之方向不會產生變化。 When the operator determines that the polarization characteristics of all the measurement points satisfy the standard, the measurement is completed, and the polarization axis C1 of the wire grid polarizer 16 is adjusted in the polarization axis adjusting device D even when the polarization characteristic of one of the measurement points does not satisfy the reference. Or the direction of the polarizer unit 10 is maintained. Further, since the wire grid polarizer 16 is fixed to the frame 14 by the screw 19 after the adjustment, the polarization axis C1 of the wire grid polarizer 16 is disposed in the arrangement from the polarization axis adjusting device D toward the optical alignment device 100 and the like. The direction will not change.

如以上所說明,根據本實施形態,設為具備偏光測定系統1之構成,該偏光測定系統1檢測通過橫排地整齊排列之數個線柵偏光片16之偏光光線重合而照射之工件載置台5相當位置之光之偏光方向。藉由該構成,可檢測實際照射至配置於工件載置台5之光配向對象物之表面之配向膜之偏光光線之偏光特性,故而可精度良好地測定偏光方向。 As described above, according to the present embodiment, the polarization measuring system 1 is provided. The polarization measuring system 1 detects the workpiece mounting table that is irradiated by overlapping the polarized rays of the plurality of wire grid polarizers 16 arranged in a row. 5 The direction of polarization of the light of the position. According to this configuration, the polarization characteristics of the polarized light that is actually irradiated onto the alignment film disposed on the surface of the light-aligning object placed on the workpiece mounting table 5 can be detected, so that the polarization direction can be accurately measured.

又,根據本實施形態,偏光測定系統1設為具備檢測部 31之構成,該檢測部31以可沿單位偏光片單元12之排列方向移動之方式設置。藉由該構成,可測定單位偏光片單元12之排列方向上各測定點之偏光特性,故而,可藉由縮小測定點之間隔而詳細地取得每個照射至光配向對象物之位置之偏光特性。 Moreover, according to the present embodiment, the polarization measuring system 1 is provided with a detecting unit. In the configuration of 31, the detecting portion 31 is provided to be movable in the arrangement direction of the unit polarizer unit 12. According to this configuration, the polarization characteristics of the measurement points in the arrangement direction of the unit polarizer unit 12 can be measured. Therefore, the polarization characteristics of each position irradiated to the optical alignment object can be obtained in detail by narrowing the interval between the measurement points. .

又,根據本實施形態,檢測部31構成為具有:孔徑76,其取入包含斜入射成分之偏光光線F並使其入射至檢測側偏光片33;擴散單元79,其使透過檢測側偏光片33之光擴散;及作為受光感測器之光電倍增管74,其接收藉由該擴散單元79經擴散之光並檢測光量I。 Further, according to the present embodiment, the detecting unit 31 is configured to include an aperture 76 that takes in the polarized light F including the oblique incident component and enters the detecting side polarizing plate 33, and a diffusing unit 79 that transmits the detecting side polarizer The light diffusion of 33; and a photomultiplier tube 74 as a light-receiving sensor receives the light diffused by the diffusion unit 79 and detects the amount of light I.

藉此,即便係如使棒狀之燈7之放射光E通過線柵偏光片16而獲得之偏光光線F般包含各種角度成分之偏光光線F,亦可檢測較廣之角度成分之範圍而測定偏光特性。 Therefore, even if the polarized light F of various angle components is included in the polarized light F obtained by passing the emitted light E of the rod-shaped lamp 7 through the wire grid polarizer 16, the range of the wide angle component can be detected and measured. Polarized characteristics.

再者,上述實施形態僅為例示本發明之一態樣者,可於不脫離本發明之主旨之範圍內任意地進行變形、及應用。 It is to be noted that the above-described embodiments are merely illustrative of one embodiment of the present invention, and may be arbitrarily modified and applied without departing from the spirit and scope of the invention.

例如於上述實施形態中,作為偏光測定系統1所測定之偏光光線之光源,例示有作為放電燈之燈7,但光源不限定於此,而為任意。即,本發明可用於任意光源之光透過偏光片而獲得之經直線偏光之偏光光線之測定。又,光源未必為線狀光源。 For example, in the above-described embodiment, the light source 7 as the discharge lamp is exemplified as the light source of the polarized light measured by the polarization measuring system 1. However, the light source is not limited thereto and is arbitrary. That is, the present invention can be applied to the measurement of linearly polarized polarized light obtained by transmitting light of any light source through a polarizer. Also, the light source is not necessarily a linear light source.

又,例如,於上述實施形態中,作為獲得測定對象之偏光光線之偏光片之一例,例示有線柵偏光片16,但偏光片不限定於此。即,偏光片只要為可獲得經直線偏光之偏光光線之偏光片,則可為任意。 Further, for example, in the above-described embodiment, the wired gate polarizer 16 is exemplified as an example of a polarizing plate that obtains a polarized light to be measured, but the polarizing plate is not limited thereto. In other words, the polarizer may be any one as long as it is a polarizer that can obtain a polarized light that is linearly polarized.

又,例如,於上述實施形態中,例示有偏光測定裝置20測定偏光光線之偏光軸(或偏光方向)與消光比兩者之構成,但亦可僅測定一者。又,偏光測定裝置20除偏光光線之偏光軸(或偏光方向)、以及/或者消光比以外,亦可測定光強度等其他特性。 Further, for example, in the above-described embodiment, the polarization measuring device 20 is configured to measure the polarization axis (or the polarization direction) of the polarized light and the extinction ratio, but only one of them may be measured. Further, the polarization measuring device 20 can measure other characteristics such as light intensity in addition to the polarization axis (or polarization direction) of the polarized light and/or the extinction ratio.

又,例如,於上述實施形態中係設為藉由將檢測部31之檢測訊號35輸入至偏光測定裝置20中而使偏光測定裝置20取得檢測光G之光量之構成,但不限定於此。即,亦可自例如其他電子機器或記錄媒體(例如半導體記憶體等)取得記錄有轉動角度θ與檢測光G之光量之對應之記錄資料。 In the above-described embodiment, the polarization measuring device 20 obtains the amount of light of the detection light G by inputting the detection signal 35 of the detecting unit 31 to the polarization measuring device 20, but the configuration is not limited thereto. In other words, the recording data in which the rotation angle θ and the amount of the detection light G are recorded may be acquired from, for example, another electronic device or a recording medium (for example, a semiconductor memory or the like).

又,上述實施形態中,檢測部31係以可沿單位偏光片單元12之排列方向B移動之方式設置,但不限定於此,例如,該檢測部31亦可朝載置台移動方向移動。 Further, in the above-described embodiment, the detecting unit 31 is provided so as to be movable in the arrangement direction B of the unit polarizer unit 12. However, the detecting unit 31 is not limited thereto. For example, the detecting unit 31 can also move in the moving direction of the stage.

Claims (10)

一種偏光測定方法,其特徵在於具備:第1步驟,其係根據將依序透過第1偏光片、及第2偏光片之光一邊使上述第2偏光片轉動而一邊進行檢測而所獲得之在各轉動角度之光之光量,而求出表示上述第2偏光片於旋轉時之上述光量之週期性變化之變化曲線;及第2步驟,其係根據上述第1步驟中所求出之變化曲線,特定透過上述第1偏光片之偏光光線之偏光特性;且在上述第1步驟中,根據包含上述變化曲線之1個極小點且包含於上述光量成為既定值以下之上述轉動角度之範圍中之在上述轉動角度之上述光量,而求出上述變化曲線。 A method for measuring a polarized light, comprising: a first step of detecting a second polarizer while rotating the light of the first polarizer and the second polarizer in sequence; a change curve indicating a periodic change of the amount of light of the second polarizer at the time of rotation of each of the rotation angles; and a second step of the curve obtained according to the first step a polarization characteristic of the polarized light that is transmitted through the first polarizer; and in the first step, the one of the minimum angles including the change curve is included in the range of the rotation angle in which the light amount is equal to or less than a predetermined value. The above-described change curve is obtained at the above-described amount of light of the rotation angle. 如申請專利範圍第1項之偏光測定方法,其具備:第3步驟,其係根據包含與上述第1步驟不同之1個極小點且包含於上述光量成為既定值以下之上述轉動角度之範圍中之在上述轉動角度之上述光量,而求出上述變化曲線;第4步驟,其係根據上述第3步驟中所求出之變化曲線,特定透過上述第1偏光片之偏光光線之偏光特性;及第5步驟,其係根據在上述第2步驟、及第4步驟各自所特定之上述偏光特性之平均,特定透過上述第1偏光片之偏光光線之偏光特性。 The polarized light measuring method according to the first aspect of the invention, further comprising: a third step of including a minimum point different from the first step and included in the range of the rotation angle in which the amount of light is equal to or less than a predetermined value The change curve is obtained by the light amount of the rotation angle; and the fourth step is to specify a polarization characteristic of the polarized light transmitted through the first polarizer according to the change curve obtained in the third step; and In the fifth step, the polarization characteristics of the polarized light transmitted through the first polarizer are specified based on an average of the polarization characteristics specified in each of the second step and the fourth step. 如申請專利範圍第1或2項之偏光測定方法,其中,上述既定值為上述光量之最大值之約20%之光量。 The polarized light measuring method according to claim 1 or 2, wherein the predetermined value is a light amount of about 20% of a maximum value of the light amount. 如申請專利範圍第3項之偏光測定方法,其係根據對應於上述變化 曲線所表示之光量之最大值之轉動角度,特定透過上述第1偏光片之偏光光線之偏光軸,以及/或者,根據上述變化曲線所表示之最大值與最小值,特定透過上述第1偏光片之偏光光線之消光比。 The method for measuring polarized light according to item 3 of the patent application is based on the change corresponding to the above The rotation angle of the maximum value of the amount of light indicated by the curve specifies the polarization axis of the polarized light transmitted through the first polarizer, and/or the first polarizer is specifically transmitted through the maximum value and the minimum value indicated by the change curve. The extinction ratio of the polarized light. 如申請專利範圍第1或2項之偏光測定方法,其係根據對應於上述變化曲線所表示之光量之最大值之轉動角度,特定透過上述第1偏光片之偏光光線之偏光軸,以及/或者,根據上述變化曲線所表示之最大值與最小值,特定透過上述第1偏光片之偏光光線之消光比。 The method for measuring polarized light according to claim 1 or 2, wherein the polarization axis of the polarized light transmitted through the first polarizer is specifically determined according to a rotation angle corresponding to a maximum value of the amount of light indicated by the change curve, and/or The extinction ratio of the polarized light transmitted through the first polarizer is specified based on the maximum value and the minimum value indicated by the change curve. 一種偏光測定裝置,其特徵在於具備:變化曲線算出手段,其係根據將依序透過第1偏光片、及第2偏光片之光一邊使上述第2偏光片轉動而一邊進行檢測而所獲得之在各轉動角度之光之光量,而求出表示上述第2偏光片於旋轉時之上述光量之週期性變化之變化曲線;及偏光特性特定手段,其係根據上述變化曲線,特定透過上述第1偏光片之偏光光線之偏光特性;且上述變化曲線算出手段係根據包含上述變化曲線之1個極小點且包含於上述光量成為既定值以下之上述轉動角度之範圍中之在上述轉動角度之上述光量,而求出上述變化曲線。 A polarization measuring apparatus comprising: a change curve calculating means obtained by detecting a second polarizer while rotating the light of the first polarizer and the second polarizer in sequence; A change curve indicating a periodic change of the amount of light when the second polarizer is rotated at a rotation angle of each of the rotation angles, and a polarization characteristic specifying means for specifically transmitting the first through the change curve a polarization characteristic of the polarized light of the polarizer; and the change curve calculation means is configured to include the light amount at the rotation angle in a range including the minimum angle of the change curve and the rotation angle below a predetermined value And the above curve is obtained. 一種偏光測定系統,其特徵在於具備:檢測部,其包括入射有藉由第1偏光片所偏光化之偏光光線之第2偏光片,一邊使上述第2偏光片轉動一邊檢測透過上述第2偏光片之光之光量;及偏光測定裝置,其係根據上述檢測部之檢測結果,特定透過上述第1偏光片之偏光光線之偏光特性;且 上述檢測部具有:孔徑,其取入包含有斜入射成分之上述光並使其入射至上述第2偏光片;擴散手段,其使透過上述第2偏光片之光產生擴散;及受光感測器,其接收藉由上述擴散手段所擴散之光並檢測上述光量;且上述偏光測定裝置具備:變化曲線算出手段,其係根據上述第2偏光片之在各轉動角度之光之光量,而求出表示上述第2偏光片於旋轉時之上述光量之週期性變化之變化曲線;及偏光特性特定手段,其係根據上述變化曲線,特定透過上述第1偏光片之偏光光線之偏光特性;且上述變化曲線算出手段係根據包含上述變化曲線之1個極小點且包含於上述光量成為既定值以下之上述轉動角度之範圍中之在上述轉動角度之上述光量,而求出上述變化曲線。 A polarization measuring system comprising: a detecting unit that includes a second polarizer on which a polarized light that is polarized by the first polarizer is incident, and detects the transmission of the second polarizer while rotating the second polarizer; And a polarization measuring device that specifies a polarization characteristic of a polarized light transmitted through the first polarizer based on a detection result of the detecting unit; The detecting unit includes an aperture that takes in the light including the oblique incident component and causes the light to enter the second polarizer, and a diffusion means that diffuses the light transmitted through the second polarizer; and the light receiving sensor And receiving the light diffused by the diffusion means to detect the amount of light; and the polarization measuring apparatus includes: a curve calculation means for determining the amount of light of each of the rotation angles of the second polarizer; a change curve indicating a periodic change of the amount of light of the second polarizer at the time of rotation; and a polarization characteristic specifying means for specifying a polarization characteristic of a polarized light transmitted through the first polarizer according to the change curve; and the change The curve calculation means obtains the change curve based on the amount of light at the rotation angle included in the range of the rotation angle in which the light amount is equal to or less than a predetermined value, including one minimum point of the change curve. 一種光配向照射裝置,其係具備有對載置於載置台之工件表面之配向膜照射偏光光線之偏光片單元者,且其特徵在於:上述偏光片單元具備有橫排地整齊排列之複數個單位偏光片單元,上述單位偏光片單元則分別具備有偏光片,且該光配向照射裝置具備有對在通過上述複數個偏光片之偏光光線產生重合而所照射之上述載置台相當位置之光之偏光特性進行檢測之檢測手段。 A light alignment irradiation device comprising a polarizer unit that irradiates a polarizing ray to an alignment film placed on a surface of a workpiece of a mounting table, wherein the polarizer unit is provided with a plurality of rows arranged neatly in a horizontal row In the unit polarizer unit, each of the unit polarizer units includes a polarizer, and the light alignment device includes light for a position corresponding to the mounting table that is irradiated by the polarized light passing through the plurality of polarizers. Detection means for detecting polarization characteristics. 如申請專利範圍第8項之光配向照射裝置,其中,上述檢測手段具備有以可沿上述單位偏光片單元之排列方向移動之方式所設置之 檢測部。 The optical alignment illuminating device of claim 8, wherein the detecting means is provided to be movable in an arrangement direction of the unit polarizer unit Detection department. 如申請專利範圍第8或9項之光配向照射裝置,其中,上述檢測手段具備:檢測部,其具有測定用偏光片,一邊使上述測定用偏光片轉動一邊檢測透過上述測定用偏光片之光之光量;及偏光測定裝置,其係根據上述檢測部之檢測結果,特定上述載置台相當位置之光之偏光特性;且上述檢測部具有:孔徑,其配置於上述載置台相當位置,取入通過上述複數個偏光片之偏光光線而產生重合後之光並使其入射至上述測定用偏光片;擴散手段,其使透過上述測定用偏光片之光產生擴散;及受光感測器,其接收藉由上述擴散手段所擴散之光並檢測上述光量;且上述偏光測定裝置具備:變化曲線算出手段,其係根據上述測定用偏光片之在各轉動角度之光之光量,而求出表示上述測定用偏光片於旋轉時之上述光量之週期性變化之變化曲線;及偏光特性特定手段,其係根據上述變化曲線,特定上述載置台相當位置之照射光之偏光特性。 The optical alignment illuminating device according to claim 8 or 9, wherein the detecting means includes a detecting portion that detects the light transmitted through the measuring polarizer while rotating the measuring polarizer And a polarization measuring device that specifies a polarization characteristic of light at a position corresponding to the mounting table based on a detection result of the detecting unit; and the detecting unit has an aperture that is disposed at a position corresponding to the mounting table and is taken in and passed through The polarized light of the plurality of polarizers generates overlapping light and is incident on the measuring polarizer; the diffusing means diffuses light transmitted through the measuring polarizer; and the light receiving sensor receives the light The light that has been diffused by the diffusion means detects the light amount, and the polarization measuring device includes a change curve calculating means for determining the measurement amount based on the light amount of the light at each rotation angle of the measuring polarizer. a variation curve of the periodic variation of the amount of light when the polarizer is rotated; and a specific means of polarization characteristics, According to the curve, the mounting table is quite specific polarization characteristic of the position of the irradiation light.
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Publication number Priority date Publication date Assignee Title
JP5920402B2 (en) * 2014-05-27 2016-05-18 ウシオ電機株式会社 Polarization measuring device, polarization measuring method, and polarized light irradiation device
US20160231176A1 (en) * 2015-02-05 2016-08-11 Polarization Solutions, Llc Light irradiation device having polarization measuring mechanism
CN108106817B (en) * 2017-12-11 2019-12-24 哈尔滨工程大学 Method for improving polarization performance measurement accuracy of Y waveguide device
CN110132420B (en) * 2018-02-09 2020-11-27 上海微电子装备(集团)股份有限公司 Polarization measuring device, polarization measuring method, and optical alignment method
CN109238466B (en) * 2018-08-13 2020-09-29 首都师范大学 Characterization method of terahertz wave polarization state and time-resolved focal plane imaging system
TWI730540B (en) * 2019-12-11 2021-06-11 精準基因生物科技股份有限公司 A time-of-flight sensing system and light emitter thereof

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3250272B2 (en) * 1992-09-30 2002-01-28 ホーヤ株式会社 Birefringence measurement method and device
JP2000230863A (en) * 1999-02-09 2000-08-22 Hamamatsu Photonics Kk Method and device for measuring polarization
JP3998485B2 (en) * 2002-02-08 2007-10-24 本田技研工業株式会社 How to paint the bumper and towing hook cover
US6874899B2 (en) 2002-07-12 2005-04-05 Eastman Kodak Company Apparatus and method for irradiating a substrate
JP4637454B2 (en) 2003-01-22 2011-02-23 株式会社 オプトクエスト Polarization extinction ratio measuring device and measuring method of polarization extinction ratio usable in the measuring device
EP1610114A4 (en) * 2003-03-28 2007-04-18 Citizen Watch Co Ltd Optical rotatory power measuring instrument
JP2005227019A (en) 2004-02-10 2005-08-25 Yamatake Corp Measuring method and measuring instrument for polarization axis
JP4740604B2 (en) * 2005-01-21 2011-08-03 富士フイルム株式会社 Optical compensation film, method for producing the same, polarizing plate, and liquid crystal display device
JP2006323060A (en) * 2005-05-18 2006-11-30 Ushio Inc Polarized-light irradiating device
JP2007127567A (en) 2005-11-07 2007-05-24 Ushio Inc Polarization direction measurement device
US7298480B2 (en) * 2005-12-23 2007-11-20 Ecole Polytechnique Broadband ellipsometer / polarimeter system
JP4744496B2 (en) * 2007-04-16 2011-08-10 日東電工株式会社 Polarizing plate, optical film and image display device
JP2009210457A (en) * 2008-03-05 2009-09-17 Omron Corp Spectropolarimetric measurement device
CN101949734B (en) * 2010-08-20 2011-11-09 中国科学院上海光学精密机械研究所 Method for improving measurement precision of beam polarization degree

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