TW201401417A - Insert assembly and electronic device accommodation apparatus including the same - Google Patents

Insert assembly and electronic device accommodation apparatus including the same Download PDF

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Publication number
TW201401417A
TW201401417A TW101137605A TW101137605A TW201401417A TW 201401417 A TW201401417 A TW 201401417A TW 101137605 A TW101137605 A TW 101137605A TW 101137605 A TW101137605 A TW 101137605A TW 201401417 A TW201401417 A TW 201401417A
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Taiwan
Prior art keywords
electronic component
support plate
insert assembly
pusher
spring
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TW101137605A
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Chinese (zh)
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TWI471969B (en
Inventor
Kwang-Chul Heo
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Semes Co Ltd
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Publication of TWI471969B publication Critical patent/TWI471969B/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • G01R1/0483Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • G01R1/0441Details
    • G01R1/0466Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding

Abstract

Provided are an insert assembly for accommodating an electronic device, and an electronic device accommodation apparatus including the insert assembly. The insert assembly includes an insert main body having a through hole in which an electronic device is accommodated, a support sheet disposed under the through hole to support the electronic device, and having an aperture in which solder balls disposed on a bottom surface of the electronic device are inserted, and a pusher horizontally pressing the electronic device to bring the solder balls into tight contact with a first inner surface of the aperture and a second inner surface perpendicular to the first inner surface. Since the electronic device is aligned using the solder balls as a reference, the electronic device can be positioned more accurately in the insert assembly.

Description

插入件組合及包含該組合之電子元件收容裝置 Insert combination and electronic component housing device including the same

本發明係有關於一種插入件組合以及包含此插入件組合之電子元件收容裝置,本發明更特別係有關於一種插入件組合收容一電子元件,例如待檢測之半導體封裝,以及包含此插入件組合之收容裝置。 The present invention relates to an insert assembly and an electronic component housing device including the same, and more particularly to an insert assembly for housing an electronic component, such as a semiconductor package to be inspected, and including the insert assembly Containment device.

半導體元件可由矽晶片如半導體基板重覆執行一系列之製造程序所形成,之後,半導體元件可經由切割程序(dicing process)、接合程序(bonding process)及封裝程序(packaging process)而構成半導體封裝。 The semiconductor device can be formed by repeating a series of manufacturing processes by using a germanium wafer such as a semiconductor substrate. Thereafter, the semiconductor device can constitute a semiconductor package via a dicing process, a bonding process, and a packaging process.

上述半導體封裝可經由一電子特性檢測程序以判定為有缺陷產品或合格產品,在電子特性檢測程序中,將使用一測試處理器(test handler)用以操控半導體封裝以及一測試器(tester)用以檢測半導體封裝。 The semiconductor package can be determined to be a defective product or a qualified product via an electronic characteristic detecting program. In the electronic characteristic detecting program, a test handler is used to manipulate the semiconductor package and a tester. To detect semiconductor packages.

為執行電子特性檢測程序,例如半導體封裝之電子元件將收容於裝設在測試盤上之插入件組合,之後,收容於插入件組合之電子元件之外部連接端子(external connection terminal)可與測試器電性連接。 In order to perform an electronic characteristic detecting program, for example, an electronic component of a semiconductor package is housed in an interposer assembly mounted on a test disc, and then an external connection terminal of the electronic component housed in the interposer assembly can be connected to the tester. Electrical connection.

插入件組合可具有一收容凹陷部(accommodation recess)用以收容電子元件,測試器可包括一測試插座(test socket)具有接觸端子如彈簧探針(pogo pin)、探針(probe pin)及墊(rub pad)以與外部連接端子如焊料球 (solder ball)相接觸,藉以將測試器及電子元件電性連接。此類測試插座之技術已揭露於韓國專利第10-2006-0003893號中。 The insert assembly can have an accommodation recess for receiving electronic components, and the tester can include a test socket having contact terminals such as a pogo pin, a probe pin, and a pad. (rub pad) to connect external terminals such as solder balls The (solder ball) is in contact with each other to electrically connect the tester and the electronic components. The technique of such a test socket has been disclosed in Korean Patent No. 10-2006-0003893.

當電子元件之外部連接端子之尺寸,特別是焊料球之尺寸及其彼此間距離縮小時,將增加焊料球與探針接觸之對準困難。 When the size of the external connection terminals of the electronic component, particularly the size of the solder balls and the distance between them, is reduced, the alignment of the solder balls in contact with the probes is increased.

為了解決此一限制,韓國專利第10-2006-0003893號揭露一種定位收容於插入件組合之電子元件之方法,透過將電子元件與插入件組合之收容凹陷部之內壁緊密接觸(tight contact)而達成。 In order to solve this limitation, a method of positioning an electronic component housed in an insert assembly by a tight contact of an inner wall of a housing recess in which the electronic component and the insert are combined is disclosed in Korean Patent Publication No. 10-2006-0003893. And reached.

然而,由於在半導體封裝之側表面及最外層之焊料球之間的距離公差大於焊料球之尺寸及其之間的距離,因此,利用半導體封裝之一側表面作為指標以定位半導體封裝之方法將受到限制。 However, since the distance tolerance between the solder balls of the side surface and the outermost layer of the semiconductor package is larger than the size of the solder balls and the distance between them, using one side surface of the semiconductor package as an index to position the semiconductor package will restricted.

有鑑於此,本發明提供一種插入件組合其可以實施準確地定位電子元件。 In view of this, the present invention provides an insert assembly that can perform accurate positioning of electronic components.

本發明亦提供一種電子元件收容裝置包含有插入件組合。 The present invention also provides an electronic component housing device including an insert assembly.

依據本發明一實施例之一態樣,插入件組合,包括:一插入件本體,具有一通孔,且一電子元件可容置於此;一支撐板,設置於通孔之下以支撐電子元件,且具有一開孔,則設置於電子元件之一底表面之複數個焊料球可插置 於此;以及一推動件,水平地推動電子元件,使得上述焊料球可與開孔之一第一內表面及與第一內表面垂直之一第二內表面緊密接觸。 According to an aspect of an embodiment of the present invention, an insert assembly includes: an insert body having a through hole, and an electronic component can be accommodated therein; and a support plate disposed under the through hole to support the electronic component And having an opening, the plurality of solder balls disposed on the bottom surface of one of the electronic components can be inserted And a pushing member horizontally pushing the electronic component such that the solder ball can be in close contact with one of the first inner surface of the opening and one of the second inner surface perpendicular to the first inner surface.

依據本發明之一實施例,插入件組合可更包括一栓鎖件,利用一彈簧之彈性彈力以垂直地推動放置於支撐板上之電子元件。 In accordance with an embodiment of the present invention, the insert assembly can further include a latch that utilizes the resilient spring force of a spring to vertically push the electronic components placed on the support plate.

依據本發明之一實施例,栓鎖件可以為可旋轉地樞接於插入件本體,且與彈簧耦接,使得栓鎖件之一端可推動電子元件。 According to an embodiment of the invention, the latch can be rotatably pivotally coupled to the insert body and coupled to the spring such that one end of the latch can push the electronic component.

依據本發明之一實施例,電子元件具有一第一側表面鄰近於開孔之第一內表面,一第二側表面鄰近於開孔之第二內表面,一第三側表面相對於第一側表面,以及一第四側表面相對於第二側表面,且推動件包括一第一推動件推動電子元件之第三側表面,以及一第二推動件推動電子元件之第四側表面。 According to an embodiment of the invention, the electronic component has a first side surface adjacent to the first inner surface of the opening, a second side surface adjacent to the second inner surface of the opening, and a third side surface relative to the first a side surface, and a fourth side surface opposite to the second side surface, and the pushing member includes a first pushing member for pushing the third side surface of the electronic component, and a second pushing member pushing the fourth side surface of the electronic component.

依據本發明之一實施例,推動件可對角線地於電子元件之一角落推動著第三側表面及第四側表面,第三側表面接觸著第四側表面。 According to an embodiment of the invention, the pushing member can diagonally push the third side surface and the fourth side surface at a corner of the electronic component, the third side surface contacting the fourth side surface.

依據本發明之一實施例,推動件可利用一彈簧之彈性彈力以推動電子元件。 According to an embodiment of the invention, the pusher can utilize an elastic spring force of a spring to push the electronic component.

依據本發明之一實施例,推動件可以為可旋轉地樞接於插入件本體,且與彈簧耦接,使得推動件之一端可水平地推動電子元件。 According to an embodiment of the invention, the pusher member may be rotatably pivotally coupled to the insert body and coupled to the spring such that one end of the pusher member can horizontally push the electronic component.

依據本發明之一實施例,電子元件收容裝置,包括: 一插入件組合,用以容置一電子元件;一托盤,插入件組合裝設於此;以及一支撐平板,支撐著托盤,其中,上述插入件組合包括:一插入件本體,具有一通孔,電子元件可容置於此;一支撐板,設置於通孔之下以支撐電子元件,且具有一開孔,則設置於電子元件之一底表面之複數個焊料球可插置於此;以及一推動件,水平地推動電子元件,使得焊料球可與開孔之一第一內表面及與第一內表面垂直之一第二內表面緊密接觸。 According to an embodiment of the invention, an electronic component housing device includes: An insert assembly for accommodating an electronic component; a tray, the insert assembly being mounted thereon; and a support plate supporting the tray, wherein the insert assembly comprises: an insert body having a through hole, The electronic component can be accommodated therein; a support plate disposed under the through hole to support the electronic component and having an opening, wherein a plurality of solder balls disposed on a bottom surface of the electronic component can be inserted therein; A pushing member horizontally pushes the electronic component such that the solder ball is in close contact with one of the first inner surface of the opening and one of the second inner surface perpendicular to the first inner surface.

依據本發明之一實施例,電子元件收容裝置可更包括一栓鎖件,利用一彈簧之彈性彈力以垂直地推動放置於支撐板上之電子元件。 According to an embodiment of the present invention, the electronic component housing device may further include a latching member for vertically pushing the electronic component placed on the support plate by the elastic elastic force of a spring.

依據本發明之一實施例,栓鎖件可以為可旋轉地樞接於插入件本體,且與彈簧耦接,使得栓鎖件之一端可推動電子元件。 According to an embodiment of the invention, the latch can be rotatably pivotally coupled to the insert body and coupled to the spring such that one end of the latch can push the electronic component.

依據本發明之一實施例,一第一銷軸可設置於支撐平板,並可旋轉栓鎖件以開啟栓鎖件。 According to an embodiment of the invention, a first pin can be disposed on the support plate and the latch can be rotated to open the latch.

依據本發明之一實施例,栓鎖件先垂直地推動著電子元件,之後,推動件再水平地推動著電子元件。 According to an embodiment of the invention, the latch member pushes the electronic component vertically, and then the pusher pushes the electronic component horizontally.

依據本發明之一實施例,推動件可利用一彈簧之彈性彈力以推動電子元件。 According to an embodiment of the invention, the pusher can utilize an elastic spring force of a spring to push the electronic component.

依據本發明之一實施例,推動件可以為可旋轉地樞接於插入件本體,且與彈簧耦接,使得推動件之一端可水平地推動電子元件。 According to an embodiment of the invention, the pusher member may be rotatably pivotally coupled to the insert body and coupled to the spring such that one end of the pusher member can horizontally push the electronic component.

依據本發明之一實施例,一第二銷軸可設置於支撐平 板,並可旋轉推動件以移動推動件之上述端遠離電子元件。 According to an embodiment of the invention, a second pin can be disposed on the support flat a plate and a rotating pusher to move the end of the pusher away from the electronic component.

依據本發明之一實施例,一支撐構件可設置於支撐平板上,且在支撐板支撐著電子元件之前,先支撐著電子元件,以及當托盤及支撐平板彼此分離時,電子元件係放置於支撐板上。 According to an embodiment of the present invention, a support member may be disposed on the support plate, and the electronic component is supported before the support plate supports the electronic component, and the electronic component is placed on the support when the tray and the support plate are separated from each other. On the board.

依據上述之本發明之實施例,當包括焊料球之電子元件容置於插入件組合時,電子元件可被具有開孔之支撐板所支撐,其中焊料球係插置於此,且焊料球可與開孔之第一內表面及第二內表面緊密接觸。由於電子元件係利用焊料球作為對準之參考標準,因此電子元件相較於習知技術可更為精確地定位。因此,在之後的檢測程序中,電子元件及測試器之間的電性連接可更為穩定。 According to the embodiment of the invention described above, when the electronic component including the solder ball is accommodated in the interposer assembly, the electronic component can be supported by the support plate having the opening, wherein the solder ball is interposed therein, and the solder ball can be The first inner surface and the second inner surface of the opening are in close contact. Since electronic components utilize solder balls as a reference standard for alignment, electronic components can be positioned more accurately than conventional techniques. Therefore, in the subsequent detection procedure, the electrical connection between the electronic component and the tester can be more stable.

為使本發明之上述目的、特徵和優點能更明顯易懂,下文特舉較佳實施例並配合所附圖式做詳細說明,然其僅用以例示說明而已,並非用以限定本發明的範圍。 The above described objects, features, and advantages of the invention will be apparent from the embodiments of the invention. range.

本發明具體之實施例揭示之形態內容將配合圖示加以詳細說明。 The details disclosed in the specific embodiments of the present invention will be described in detail in conjunction with the drawings.

體現本發明特徵與優點的一些典型實施例將在之後的說明中詳細敘述。應理解的是本發明能夠在不同的態樣上具有各種的變化,其皆不脫離本發明的範圍,且本發明的說明及圖式在本質上係當作說明之用,而非用以限制本發明。 Some exemplary embodiments embodying the features and advantages of the present invention are described in detail in the description which follows. It is to be understood that the invention is capable of various modifications in the various embodiments of the invention this invention.

在以下的說明中,可以理解的是,當一元件(層)被說明為”設置於(disposed)”或”連接在/至(connect on/to)”另一元件(層)時,其可以是直接設置於或連接在/至另一元件(層),或是間接(intervening)設置於或連接在/至另一元件(層)。換句話說,可以理解的是,當一元件被說明為”直接設置於(directly diposed)”或”直接連接在/至(directly connect on/to)”另一元件時,則中間就沒有其他的元件存在。同樣地,雖然在文中使用了”第一”、”第二”、及”第三”等等以表示不同的元件(element)、構件(component)、區域(region)、層(layer)及/或段部(section),然這些元件、構件、區域、層及/或段部並不被此所限定。 In the following description, it will be understood that when an element (layer) is described as "disposed" or "connected/to" another element (layer), It is directly disposed or connected to/to another component (layer), or is intervening or connected to/to another component (layer). In other words, it can be understood that when an element is described as being "directly diposed" or "directly connected on/to" another element, there is no other in the middle. The component is present. Similarly, although "first", "second", and "third" and the like are used herein to mean different elements, components, regions, layers, and / Or a section, but these elements, components, regions, layers and/or sections are not limited by this.

在本文中所使用之專業術語(technical terms)係僅用以特別說明本發明之實施例之用,但並不用以限制本發明。除非另外有賦予定義,在本文中提及之所有的名詞皆與本領域中熟悉此技藝者一般認知具有相同的意義。這些通常使用之用語及如在一般字典中所定義之名詞可具有在其適當之領域中與其在文中相符之意義。在本文中,除非有特別定義外,名詞之解釋不為過於理想化(ideally)或過度解釋其正式的意義。 The technical terms used herein are used to specifically describe the embodiments of the invention, but are not intended to limit the invention. Unless otherwise defined, all terms mentioned herein have the same meaning as commonly understood by those skilled in the art. These commonly used terms and nouns as defined in the general dictionary may have meaning in the appropriate field to conform to them in the text. In this article, unless otherwise defined, the interpretation of a noun is not too idealistic or overly interpreted in its formal meaning.

另外,本發明之實施例以剖面視圖(sectional view)配合說明,其係用以理解實施例之示意圖示,基於此,範例從外型之變化之結果,舉例來說,製造技術及/或誤差(allowable errors),其係可修改的。因此,示範之實施 例並不能以其文中說明範圍之特殊外型而解釋為限制條件,而應該是包括外型誤差之結果,舉例來說,在圖示中顯示的區域或描述為平坦時,其係可為大致上具有粗糙或粗糙及非線性之特徵。因此,在圖示中顯示的區域係基本上之繪示,且其外型也並沒有要顯示此區域之真實外型,亦沒有要用以限制本發明之範圍。 In addition, the embodiments of the present invention are described in conjunction with the sectional views, which are used to understand the schematic diagrams of the embodiments. Based on the results of the variations of the examples, for example, manufacturing techniques and/or Allowables, which are modifiable. Therefore, the implementation of the demonstration The examples are not to be construed as limiting, but rather to include the result of the appearance error. For example, when the area shown in the illustration or description is flat, the system can be approximate. It has the characteristics of rough or rough and non-linear. Therefore, the regions shown in the drawings are basically depicted, and the appearance thereof is not intended to indicate the true appearance of the region, nor is it intended to limit the scope of the invention.

第1圖係顯示依據本發明一實施例之插入件組合及包含插入件組合之電子元件收容裝置之剖面示意圖,第2圖係顯示第1圖之插入件組合之平面示意圖。 1 is a cross-sectional view showing an insert assembly and an electronic component housing device including an insert assembly according to an embodiment of the present invention, and FIG. 2 is a plan view showing the insert assembly of FIG. 1.

請參見第1及2圖,依據本實施例之插入件組合(insert assembly)100及包含插入件組合100之電子元件收容裝置(electronic device accommodation apparatus)200可適用於容置電子元件(electronic device)10,例如在測試系統中之半導體封裝(semiconductor package),用以檢測電子元件10。舉例來說,插入件組合100及電子元件收容裝置200可用以容置及操控包括焊料球(solder ball)20之電子元件10,當電性連接端子位於其底表面時。 Referring to FIGS. 1 and 2, an insert assembly 100 and an electronic device accommodation apparatus 200 including the interposer assembly 100 according to the present embodiment are applicable to an electronic device. 10, for example, a semiconductor package in a test system for detecting electronic components 10. For example, the interposer assembly 100 and the electronic component containment device 200 can be used to house and manipulate electronic components 10 including solder balls 20 when the electrical connection terminals are on their bottom surfaces.

更好的是,插入件組合100及電子元件收容裝置200可用以於測試處理器(test handler)中操控電子元件10,用以檢測電子元件10。 More preferably, the interposer assembly 100 and the electronic component housing device 200 can be used to manipulate the electronic component 10 in a test handler for detecting the electronic component 10.

插入件組合100可包括插入件本體(insert main body)110具有通孔(through hole)112,電子元件10容置於此;以及支撐板(support sheet)120,設置於通孔112 之下以支撐電子元件10。 The insert assembly 100 can include an insert main body 110 having a through hole 112 into which the electronic component 10 is received, and a support sheet 120 disposed in the through hole 112. Below to support the electronic component 10.

第3圖係顯示第1圖之支撐板之底側示意圖,第4圖係顯示第1圖之電子元件之底側示意圖。第5及6圖係顯示第1圖之支撐板支撐著第1圖之電子元件之底側示意圖。第7圖係顯示第1圖之電子元件定位過程之部份放大剖面示意圖。 Fig. 3 is a schematic view showing the bottom side of the support plate of Fig. 1, and Fig. 4 is a view showing the bottom side of the electronic component of Fig. 1. Figures 5 and 6 are schematic views showing the bottom side of the electronic component of Figure 1 supported by the support plate of Figure 1. Fig. 7 is a partially enlarged cross-sectional view showing the positioning process of the electronic component of Fig. 1.

請參見第3至7圖,電子元件10可具有近似矩形板狀外型,且包括:半導體封裝(semiconductor package)30包含基板(substrate)、半導體晶片(semiconductor chip)裝設於基板上以及封膠(mold)將半導體晶片封閉;以及焊料球20設置於半導體封裝30之底表面。 Referring to FIGS. 3-7, the electronic component 10 can have an approximately rectangular plate shape, and includes: a semiconductor package 30 including a substrate, a semiconductor chip mounted on the substrate, and a sealant. (mold) the semiconductor wafer is closed; and the solder ball 20 is disposed on the bottom surface of the semiconductor package 30.

支撐板120可具有開孔(aperture)122具矩形之外型,焊料球20插置於其中。舉例來說,支撐板120可具有近似四方環外型,且可支撐半導體封裝30之邊緣,使得焊料球20可插置於開孔122中。 The support plate 120 may have an aperture 122 having a rectangular shape in which the solder balls 20 are inserted. For example, the support plate 120 can have an approximately square ring profile and can support the edges of the semiconductor package 30 such that the solder balls 20 can be inserted into the openings 122.

依據本發明另一實施例,支撐板120可支撐著鄰近於半導體封裝30之第一側表面(first side surface)32之第一邊緣,以及支撐著鄰近於第二側表面(second side surface)34之第二邊緣,其係垂直於第一側表面32。在本例中,第二支撐板(圖上未顯示)可支撐著鄰近於第三側表面(third side surface)36之邊緣,其係相對於第一側表面32,以及支撐著鄰近於第四側表面(fourth side surface)38之邊緣,其係相對於第二側表面34。 According to another embodiment of the present invention, the support plate 120 can support a first edge adjacent to the first side surface 32 of the semiconductor package 30 and support adjacent to the second side surface 34. The second edge is perpendicular to the first side surface 32. In this example, a second support plate (not shown) can support an edge adjacent the third side surface 36 relative to the first side surface 32 and supported adjacent to the fourth The edge of the fourth side surface 38 is relative to the second side surface 34.

請再參見第1及2圖,插入件組合100可包括推動件 (pusher)130、132水平地推動電子元件10,使得焊料球20可與開孔122之第一內表面(first inner surface)124及與第一內表面124垂直之第二內表面(second inner surface)126緊密接觸(tight contact)。更進一步,插入件組合100可包括栓鎖件(latch)140、142垂直地推動由支撐板120所支撐之電子元件10,使得電子元件10可與支撐板120緊密接觸。 Referring again to Figures 1 and 2, the insert assembly 100 can include a pusher The (pusher) 130, 132 horizontally pushes the electronic component 10 such that the solder ball 20 can be spaced apart from the first inner surface 124 of the opening 122 and the second inner surface perpendicular to the first inner surface 124 (second inner surface ) 126 tight contact. Still further, the insert assembly 100 can include latches 140, 142 that vertically push the electronic components 10 supported by the support plate 120 such that the electronic components 10 can be in intimate contact with the support plate 120.

如上所述,由於鄰近於半導體封裝30之第一側表面32及第二側表面34的焊料球20係與開孔122之第一內表面124及第二內表面126緊密接觸,電子元件10即可以被精確的定位,且推動件130、132及栓鎖件140、142可穩定地維持著電子元件10的定位。 As described above, since the solder balls 20 adjacent to the first side surface 32 and the second side surface 34 of the semiconductor package 30 are in close contact with the first inner surface 124 and the second inner surface 126 of the opening 122, the electronic component 10 is It can be accurately positioned, and the pushers 130, 132 and the latches 140, 142 can stably maintain the positioning of the electronic component 10.

舉例來說,插入件組合100可包括:第一推動件130推動著半導體封裝30的第三側表面36,使得鄰近於半導體封裝30之第一側表面32的焊料球20可與開孔122之第一內表面124緊密接觸;以及第二推動件132推動著半導體封裝30的第四側表面38,使得鄰近於半導體封裝30之第二側表面34的焊料球20可與開孔122之第二內表面126緊密接觸。更詳細地來說,請參見第6圖,第一推動件130及第二推動件132係如圖上箭頭所示水平地推動電子元件10。基於此,如第7圖所示,焊料球20可與支撐板120之第一內表面124及第二內表面126緊密接觸。 For example, the interposer assembly 100 can include the first pusher 130 pushing the third side surface 36 of the semiconductor package 30 such that the solder balls 20 adjacent to the first side surface 32 of the semiconductor package 30 can be aligned with the openings 122 The first inner surface 124 is in intimate contact; and the second pusher 132 pushes the fourth side surface 38 of the semiconductor package 30 such that the solder ball 20 adjacent to the second side surface 34 of the semiconductor package 30 can be second with the opening 122 Inner surface 126 is in intimate contact. In more detail, referring to Fig. 6, the first pusher 130 and the second pusher 132 push the electronic component 10 horizontally as indicated by the arrow on the figure. Based on this, as shown in FIG. 7, the solder balls 20 may be in close contact with the first inner surface 124 and the second inner surface 126 of the support plate 120.

更進一步,插入件組合100可包括:第一栓鎖件140及第二栓鎖件142垂直地推動設置於支撐板120上之電子 元件10,使得電子元件10可與支撐板120緊密接觸。 Still further, the insert assembly 100 can include the first latching member 140 and the second latching member 142 vertically pushing the electrons disposed on the support plate 120 The component 10 is such that the electronic component 10 can be in close contact with the support plate 120.

請再參見第1及2圖,凹陷部(recess)可設置於插入件本體110之通孔112中,而第一栓鎖件140、第二栓鎖件142、第一推動件130及第二推動件132係設置於凹陷部中。第一栓鎖件140、第二栓鎖件142、第一推動件130及第二推動件132可以可旋轉地方式樞接於凹陷部中。 Referring again to FIGS. 1 and 2, a recess may be disposed in the through hole 112 of the insert body 110, and the first latch 140, the second latch 142, the first pusher 130, and the second The pushing member 132 is disposed in the recess. The first latching member 140, the second latching member 142, the first pushing member 130 and the second pushing member 132 may be rotatably pivoted in the recess.

第一栓鎖件140及第二栓鎖件142可藉由如彈簧(圖上未顯示)之彈性彈力裝置而垂直地推動電子元件10。舉例來說,雖然圖上未顯示,然第一栓鎖件140及第二栓鎖件142可耦接有彈簧如線圈彈簧(coil spring)或扭簧(torsion spring)。在本例中,彈簧可以第一栓鎖件140及第二栓鎖件142的末端以接近垂直的方向推動電子元件10之頂表面的方式構成。 The first latching member 140 and the second latching member 142 can vertically push the electronic component 10 by an elastic spring device such as a spring (not shown). For example, although not shown in the drawings, the first latching member 140 and the second latching member 142 may be coupled with a spring such as a coil spring or a torsion spring. In this example, the spring may be constructed in such a manner that the ends of the first latching member 140 and the second latching member 142 push the top surface of the electronic component 10 in a nearly vertical direction.

第一推動件130及第二推動件132可藉由如彈簧之彈性彈力裝置而水平地推動電子元件10。更特別的是,第一推動件130及第二推動件132分別推動著半導體封裝30的第三側表面36及第四側表面38,使得焊料球20可與支撐板120之第一內表面124及第二內表面126緊密接觸。舉例來說,第一推動件130及第二推動件132可耦接至彈簧如線圈彈簧或扭簧。在本例中,彈簧可以第一推動件130及第二推動件132的末端分別推動半導體封裝30之第三側表面36及第四側表面38的方式構成。 The first pushing member 130 and the second pushing member 132 can horizontally push the electronic component 10 by an elastic elastic device such as a spring. More specifically, the first pushing member 130 and the second pushing member 132 respectively urge the third side surface 36 and the fourth side surface 38 of the semiconductor package 30 such that the solder ball 20 and the first inner surface 124 of the supporting plate 120 The second inner surface 126 is in intimate contact. For example, the first pusher 130 and the second pusher 132 can be coupled to a spring such as a coil spring or a torsion spring. In this example, the spring may be configured such that the ends of the first pusher 130 and the second pusher 132 respectively urge the third side surface 36 and the fourth side surface 38 of the semiconductor package 30.

第8圖係顯示第2圖之推動件另一實施修改例之平面示意圖。 Fig. 8 is a plan view showing another modification of the pusher of Fig. 2.

請參見第8圖,依據本實施例,推動件(pusher)138可推動第三側表面36連接第四側表面38之半導體封裝30的角落,藉以平行地推動電子元件10。推動件138可具有L型之末端,藉由如彈簧之彈性彈力裝置而與第三側表面36連接第四側表面38緊密接觸。更特別的是,推動件138以半導體封裝30之對角線的方向推動第三側表面36及第四側表面38,藉以使得電子元件10之焊料球20可與支撐板120之第一內表面124及第二內表面126緊密接觸。 Referring to FIG. 8, in accordance with the present embodiment, a pusher 138 can push the third side surface 36 to connect the corners of the semiconductor package 30 of the fourth side surface 38, thereby pushing the electronic component 10 in parallel. The pusher member 138 may have an L-shaped end that is in close contact with the third side surface 36 by the fourth side surface 38 by an elastic elastic means such as a spring. More specifically, the pusher 138 pushes the third side surface 36 and the fourth side surface 38 in a diagonal direction of the semiconductor package 30, so that the solder ball 20 of the electronic component 10 can be coupled to the first inner surface of the support board 120. 124 and second inner surface 126 are in intimate contact.

再請參見第1圖,插入件組合100可裝設於托盤(tray)210中,舉例來說,複數個插入件組合100可裝設於檢測系統之測試托盤210中,例如測試處理器。 Referring again to FIG. 1, the insert assembly 100 can be mounted in a tray 210. For example, a plurality of insert assemblies 100 can be mounted in the test tray 210 of the inspection system, such as a test processor.

托盤210可由支撐平板(support plate)220所支撐,托盤210可藉由傳統移動裝置(圖上未顯示)而裝載於支撐平板220上。第一銷軸(first pin)230及第二銷軸(second pin)240可垂直地延伸於支撐平板220,藉以操控第一栓鎖件140及第二栓鎖件142與第一推動件130及第二推動件132。或者是,支撐平板220係以可垂直地移動以耦接至托盤210的方式構成。 The tray 210 can be supported by a support plate 220 that can be loaded onto the support plate 220 by a conventional moving device (not shown). The first pin 230 and the second pin 240 extend perpendicularly to the support plate 220, thereby controlling the first latching member 140 and the second latching member 142 and the first pushing member 130 and The second pusher 132. Alternatively, the support plate 220 is constructed to be vertically movable to be coupled to the tray 210.

更詳細地來說,當托盤210耦接至支撐平板220時,第一銷軸230可開啟第一栓鎖件140及第二栓鎖件142,也就是說,第一銷軸230可旋轉第一栓鎖件140及第二栓鎖件142的末端,藉以抬起(raise)第一栓鎖件140及第二栓鎖件142的末端,使得電子元件10可容置於通孔112中。另外,當托盤210耦接至支撐平板220時,第二銷軸 240可旋轉第一推動件130及第二推動件132的末端,藉以朝後(rearward)移動第一推動件130及第二推動件132的末端,意即,可使其遠離通孔112。 In more detail, when the tray 210 is coupled to the support plate 220, the first pin 230 can open the first latch 140 and the second latch 142, that is, the first pin 230 can be rotated. The ends of the latching member 140 and the second latching member 142 are used to raise the ends of the first latching member 140 and the second latching member 142 so that the electronic component 10 can be received in the through hole 112. In addition, when the tray 210 is coupled to the support plate 220, the second pin shaft The end of the first pusher 130 and the second pusher 132 can be rotated to thereby move the ends of the first pusher 130 and the second pusher 132 rearward, that is, to be away from the through hole 112.

支撐構件(support member)250可設置於支撐平板220,在托盤210耦接至支撐平板220之後,容置於通孔112之電子元件10可輕易地由支撐構件250所支撐,相對於支撐板120來說。 The support member 250 may be disposed on the support plate 220. After the tray 210 is coupled to the support plate 220, the electronic component 10 accommodated in the through hole 112 may be easily supported by the support member 250 with respect to the support plate 120. Said.

第9至12圖係顯示利用第1圖之插入件組合及電子元件收容裝置以容置電子元件之方法之剖面示意圖。 9 to 12 are schematic cross-sectional views showing a method of housing an electronic component by using the interposer assembly of Fig. 1 and an electronic component housing device.

請參見第9圖,在托盤210耦接至支撐平板220之後,也就是托盤210被支撐平板220所支撐之後,電子元件10可藉由拾取器(picker)300而移轉至通孔112中,此時,第一栓鎖件140及第二栓鎖件142被第一銷軸230所開啟,也就是說,第一栓鎖件140及第二栓鎖件142的末端可被朝上旋轉,且第一推動件130及第二推動件132的末端藉由第二銷軸240被朝後移動。 Referring to FIG. 9 , after the tray 210 is coupled to the support plate 220 , that is, after the tray 210 is supported by the support plate 220 , the electronic component 10 can be moved into the through hole 112 by the picker 300 . At this time, the first latching member 140 and the second latching member 142 are opened by the first pin 230, that is, the ends of the first latching member 140 and the second latching member 142 can be rotated upward. The ends of the first pusher 130 and the second pusher 132 are moved rearward by the second pin 240.

接著,請參見第10圖,拾取器300將電子元件10放置於設置在支撐平板220之支撐構件250上,通孔112的內表面可具有既定之傾斜角度,因此,在拾取器300放置電子元件10於支撐構件250上時,可大致上對準電子元件10。也就是說,電子元件10可被通孔112的內表面被導引向下。 Next, referring to FIG. 10, the pickup 300 places the electronic component 10 on the support member 250 disposed on the support plate 220. The inner surface of the through hole 112 may have a predetermined inclination angle, and therefore, the electronic component is placed at the pickup 300. When the support member 250 is on the support member 250, the electronic component 10 can be substantially aligned. That is, the electronic component 10 can be guided downward by the inner surface of the through hole 112.

在電子元件10放置於支撐構件250之後,托盤210及支撐平板220可如第11圖所示而彼此分開,此時,托盤 210可朝上移動,或是支撐平板220可朝下移動。 After the electronic component 10 is placed on the support member 250, the tray 210 and the support plate 220 can be separated from each other as shown in FIG. 11, at this time, the tray 210 can be moved up, or the support plate 220 can be moved downward.

當托盤210及支撐平板220彼此分開時,電子元件10係放置於支撐板120上,此時,焊料球20可插置入支撐板120之開孔122中,且半導體封裝30之邊緣由支撐板120所支撐。 When the tray 210 and the support plate 220 are separated from each other, the electronic component 10 is placed on the support plate 120. At this time, the solder ball 20 can be inserted into the opening 122 of the support plate 120, and the edge of the semiconductor package 30 is supported by the support plate. 120 support.

支撐構件250可用以減少電子元件10從拾取器300之掉落距離,也就是,電子元件10係主要由支撐構件250所支撐,再從支撐構件250轉移到支撐板120,藉以更進一步穩定地容置電子元件10。 The support member 250 can be used to reduce the falling distance of the electronic component 10 from the pickup 300, that is, the electronic component 10 is mainly supported by the support member 250, and then transferred from the support member 250 to the support plate 120, thereby further stabilizing the content. The electronic component 10 is placed.

當托盤210持續地朝上移動或支撐平板220持續地朝下移動時,被第一銷軸230所開啟之第一栓鎖件140及第二栓鎖件142可如第11圖所示而關閉,第一銷軸230及第二銷軸240可以第一栓鎖件140及第二栓鎖件142較第一推動件130及第二推動件132更為輕易操控的方式構成。也就是說,第一栓鎖件140及第二栓鎖件142以近乎垂直之方向推動電子元件10,之後,第一推動件130及第二推動件132以近乎水平之方向推動電子元件10。 When the tray 210 is continuously moved upward or the support plate 220 is continuously moved downward, the first latching member 140 and the second latching member 142 opened by the first pin 230 can be closed as shown in FIG. The first pin 230 and the second pin 240 can be configured to be easier to handle than the first pusher 130 and the second pusher 132. That is, the first latching member 140 and the second latching member 142 push the electronic component 10 in a nearly vertical direction, after which the first pushing member 130 and the second pushing member 132 push the electronic component 10 in a nearly horizontal direction.

當第一推動件130及第二推動件132的操作易於第一栓鎖件140及第二栓鎖件142時,也就是說,當剛放置於支撐板120上之電子元件10被水平地推動時,由於焊料球20的直徑明顯地較小,焊料球20可能不會被支撐板120的第一內表面124及第二內表面126所阻擋,且可能會移動越過支撐板120的上表面,基於此,電子元件10可能會偏移。另外,焊料球20可能會與第一內表面124及第二內 表面126產生碰撞,而造成其之損壞。 When the operations of the first pushing member 130 and the second pushing member 132 are easy to the first latching member 140 and the second latching member 142, that is, when the electronic component 10 just placed on the supporting plate 120 is pushed horizontally At this time, since the diameter of the solder ball 20 is significantly smaller, the solder ball 20 may not be blocked by the first inner surface 124 and the second inner surface 126 of the support plate 120, and may move over the upper surface of the support plate 120, Based on this, the electronic component 10 may be offset. Additionally, the solder balls 20 may be associated with the first inner surface 124 and the second inner surface Surface 126 creates a collision that causes damage.

然而,依據本實施例,第一栓鎖件140及第二栓鎖件142將電子元件10與支撐板120緊密接觸,之後,第一推動件130及第二推動件132再水平地推動電子元件10,如第1圖所示。因此,電子元件10的焊料球20可穩定地與支撐板120之第一內表面124及第二內表面126緊密接觸。另外,由於第一栓鎖件140及第二栓鎖件142會推動著電子元件10,之後,第一推動件130及第二推動件132再水平地移動電子元件10,故電子元件10水平移動的速度將被減慢。因此,即使焊料球20與支撐板120之第一內表面124及第二內表面126緊密接觸,亦可避免焊料球20遭到碰撞及撞擊。 However, according to the embodiment, the first latching member 140 and the second latching member 142 closely contact the electronic component 10 with the support plate 120, and then the first pushing member 130 and the second pushing member 132 push the electronic component horizontally. 10, as shown in Figure 1. Therefore, the solder balls 20 of the electronic component 10 can be stably in close contact with the first inner surface 124 and the second inner surface 126 of the support plate 120. In addition, since the first latching member 140 and the second latching member 142 push the electronic component 10, then the first pushing member 130 and the second pushing member 132 horizontally move the electronic component 10, so that the electronic component 10 moves horizontally. The speed will be slowed down. Therefore, even if the solder balls 20 are in close contact with the first inner surface 124 and the second inner surface 126 of the support plate 120, the solder balls 20 can be prevented from colliding and colliding.

依據本實施例,第二銷軸240可以為彈簧塞柱(spring plunger)彈性地被彈簧所支撐的形式構成,藉以依序操作第一栓鎖件140及第二栓鎖件142,以及第一推動件130及第二推動件132。也就是,由於第二銷軸240是彈性地被彈簧所支撐,故當第一銷軸230操作第一栓鎖件140及第二栓鎖件142時,第一推動件130及第二推動件132不會被操作。然而,上述之依序操作第一栓鎖件140及第二栓鎖件142,以及第一推動件130及第二推動件132之構成可被變化,因此,本發明之範圍並不限定第一栓鎖件140及第二栓鎖件142、第一推動件130及第二推動件132及第一銷軸230及第二銷軸240的構成。 According to the embodiment, the second pin 240 may be configured such that the spring plunger is elastically supported by the spring, thereby sequentially operating the first latching member 140 and the second latching member 142, and the first The pusher 130 and the second pusher 132 are pushed. That is, since the second pin 240 is elastically supported by the spring, when the first pin 230 operates the first latch 140 and the second latch 142, the first pusher 130 and the second pusher 132 will not be operated. However, the above-described operation of the first latching member 140 and the second latching member 142, and the configuration of the first pushing member 130 and the second pushing member 132 may be changed. Therefore, the scope of the present invention is not limited to the first. The latching member 140 and the second latching member 142, the first pushing member 130 and the second pushing member 132, and the first pin 230 and the second pin 240 are configured.

依據上述實施例,當電子元件10包括焊料球20容置 於插入件組合100時,電子元件10可由具有開孔122之支撐板120所支撐,焊料球20係插置於其中,且焊料球20可與開孔122之第一內表面124及第二內表面126緊密接觸。由於電子元件10利用電子元件之焊料球20作為對準之參考標準(reference),電子元件10相較於習知技術可更為精確地定位。因此,在之後的檢測程序中,電子元件10及測試器(tester)之間的電性連接可被穩定。 According to the above embodiment, when the electronic component 10 includes the solder ball 20 In the insert assembly 100, the electronic component 10 can be supported by a support plate 120 having an opening 122 into which the solder ball 20 is inserted, and the solder ball 20 can be coupled to the first inner surface 124 and the second inner opening 122. Surface 126 is in intimate contact. Since the electronic component 10 utilizes the solder ball 20 of the electronic component as a reference for alignment, the electronic component 10 can be positioned more accurately than conventional techniques. Therefore, in the subsequent detection procedure, the electrical connection between the electronic component 10 and the tester can be stabilized.

雖然插入件組合及包含其之電子元件收容裝置係以較佳實施例揭露如上,然並不限定於此,其並非用以限定本發明的範圍,任何熟習此項技藝者,在不脫離本發明之精神和範圍內,當可做些許的更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 Although the insert assembly and the electronic component housing device including the same are disclosed in the above preferred embodiments, the present invention is not limited thereto, and is not intended to limit the scope of the present invention. In the spirit and scope of the invention, the scope of protection of the invention is defined by the scope of the appended claims.

10‧‧‧電子元件(electronic device) 10‧‧‧electronic device

20‧‧‧焊料球(solder ball) 20‧‧‧solder ball

30‧‧‧半導體封裝(semiconductor package) 30‧‧‧Semiconductor package

32‧‧‧第一側表面(first side surface) 32‧‧‧first side surface

100‧‧‧插入件組合(insert assembly) 100‧‧‧insert assembly

110‧‧‧插入件本體(insert main body) 110‧‧‧insert main body

112‧‧‧通孔(through hole) 112‧‧‧through hole

120‧‧‧支撐板(support sheet) 120‧‧‧support sheet

122‧‧‧開孔(aperture) 122‧‧‧opening

124‧‧‧第一內表面(first inner surface) 124‧‧‧first inner surface

126‧‧‧第二內表面(second inner surface) 126‧‧‧second inner surface

130 132 138‧‧‧推動件(pusher) 130 132 138‧‧‧Pushing parts (pusher)

140 142‧‧‧栓鎖件(latch) 140 142‧‧‧Latch

200‧‧‧電子元件收容裝置(electronic device accommodation apparatus) 200‧‧‧electronic device accommodation apparatus

210‧‧‧托盤(tray) 210‧‧‧Tray

220‧‧‧支撐平板(support plate) 220‧‧‧support plate

230‧‧‧第一銷軸(first pin) 230‧‧‧first pin (first pin)

240‧‧‧第二銷軸(second pin) 240‧‧‧second pin (second pin)

250‧‧‧支撐構件(support member) 250‧‧‧support member

300‧‧‧拾取器(picker) 300‧‧‧ picker (picker)

第1圖係顯示依據本發明一實施例之插入件組合及包含插入件組合之電子元件收容裝置之剖面示意圖;第2圖係顯示第1圖之插入件組合之平面示意圖;第3圖係顯示第1圖之支撐板之底側示意圖;第4圖係顯示第1圖之電子元件之底側示意圖;第5及6圖係顯示第1圖之支撐板支撐著第1圖之電子元件之底側示意圖;第7圖係顯示第1圖之電子元件定位過程之部份放大剖面示意圖;第8圖係顯示第2圖之推動件另一實施修改例之平面 示意圖;以及第9至12圖係顯示利用第1圖之插入件組合及電子元件收容裝置以容置電子元件之方法之剖面示意圖。 1 is a schematic cross-sectional view showing an insert assembly and an electronic component housing device including the same according to an embodiment of the present invention; FIG. 2 is a plan view showing the insert assembly of FIG. 1; Fig. 1 is a bottom side view of the support plate; Fig. 4 is a bottom view showing the electronic component of Fig. 1; and Figs. 5 and 6 show the support plate of Fig. 1 supporting the bottom of the electronic component of Fig. 1. FIG. 7 is a partially enlarged cross-sectional view showing the positioning process of the electronic component of FIG. 1; FIG. 8 is a plan showing another embodiment of the pusher of FIG. FIG. 9 and FIG. 12 are schematic cross-sectional views showing a method of housing an electronic component using the insert assembly of FIG. 1 and an electronic component housing device.

10‧‧‧電子元件(electronic device) 10‧‧‧electronic device

20‧‧‧焊料球(solder ball) 20‧‧‧solder ball

100‧‧‧插入件組合(insert assembly) 100‧‧‧insert assembly

110‧‧‧插入件本體(insert main body) 110‧‧‧insert main body

112‧‧‧通孔(through hole) 112‧‧‧through hole

120‧‧‧支撐板(support sheet) 120‧‧‧support sheet

130‧‧‧推動件(pusher) 130‧‧‧Pushing parts (pusher)

140‧‧‧栓鎖件(latch) 140‧‧‧Latching (latch)

200‧‧‧電子元件收容裝置(electronic device accommodation apparatus) 200‧‧‧electronic device accommodation apparatus

210‧‧‧托盤(tray) 210‧‧‧Tray

220‧‧‧支撐平板(support plate) 220‧‧‧support plate

230‧‧‧第一銷軸(first pin) 230‧‧‧first pin (first pin)

240‧‧‧第二銷軸(second pin) 240‧‧‧second pin (second pin)

250‧‧‧支撐構件(support member) 250‧‧‧support member

Claims (16)

一種插入件組合,包括:一插入件本體,具有一通孔,一電子元件容置於此;一支撐板,設置於該通孔之下以支撐該電子元件,且具有一開孔,設置於該電子元件之一底表面之複數個焊料球插置於此;以及一推動件,水平地推動該電子元件,使得該等焊料球與該開孔之一第一內表面及與該第一內表面垂直之一第二內表面緊密接觸。 An insert assembly includes: an insert body having a through hole, an electronic component is received therein; a support plate disposed under the through hole to support the electronic component, and having an opening disposed therein a plurality of solder balls on a bottom surface of the electronic component are interposed therein; and a pushing member horizontally pushing the electronic component such that the solder balls and the first inner surface of the opening and the first inner surface One of the vertical second inner surfaces is in close contact. 如申請專利範圍第1項所述之插入件組合,其更包括一栓鎖件,利用一彈簧之彈性彈力以垂直地推動放置於該支撐板上之該電子元件。 The insert assembly of claim 1, further comprising a latching member that utilizes an elastic spring force of a spring to vertically push the electronic component placed on the support plate. 如申請專利範圍第2項所述之插入件組合,其中,該栓鎖件可旋轉地樞接於該插入件本體,且與該彈簧耦接,使得該栓鎖件之一端推動該電子元件。 The insert assembly of claim 2, wherein the latch is rotatably pivotally coupled to the insert body and coupled to the spring such that one end of the latch pushes the electronic component. 如申請專利範圍第1項所述之插入件組合,其中,該電子元件具有一第一側表面鄰近於該開孔之該第一內表面,一第二側表面鄰近於該開孔之該第二內表面,一第三側表面相對於該第一側表面,以及一第四側表面相對於該第二側表面,且該推動件包括一第一推動件推動該電子元件之該第三側表面,以及一第二推動件推動該電子元件之該第四側表面。 The insert assembly of claim 1, wherein the electronic component has a first side surface adjacent to the first inner surface of the opening, and a second side surface adjacent to the opening a second inner surface, a third side surface opposite to the first side surface, and a fourth side surface opposite the second side surface, and the pushing member includes a first pushing member to push the third side of the electronic component And a second pusher pushes the fourth side surface of the electronic component. 如申請專利範圍第1項所述之插入件組合,其中,該電子元件具有一第一側表面鄰近於該開孔之該第一內表 面,一第二側表面鄰近於該開孔之該第二內表面,一第三側表面相對於該第一側表面,以及一第四側表面相對於該第二側表面,且該推動件對角線地於該電子元件之一角落推動該第三側表面及該第四側表面,該第三側表面接觸該第四側表面。 The insert assembly of claim 1, wherein the electronic component has a first side surface adjacent to the first inner surface of the opening a second side surface adjacent to the second inner surface of the opening, a third side surface opposite the first side surface, and a fourth side surface opposite the second side surface, and the pushing member The third side surface and the fourth side surface are diagonally pushed at a corner of the electronic component, the third side surface contacting the fourth side surface. 如申請專利範圍第1項所述之插入件組合,其中,該推動件利用一彈簧之彈性彈力以推動該電子元件。 The insert assembly of claim 1, wherein the pusher utilizes an elastic spring force of a spring to push the electronic component. 如申請專利範圍第6項所述之插入件組合,其中,該推動件可旋轉地樞接於該插入件本體,且與該彈簧耦接,使得該推動件之一端水平地推動該電子元件。 The insert assembly of claim 6, wherein the pusher is rotatably pivotally coupled to the insert body and coupled to the spring such that one end of the pusher pushes the electronic component horizontally. 一種電子元件收容裝置,包括:一插入件組合,用以容置一電子元件;一托盤,該插入件組合裝設於此;以及一支撐平板,支撐該托盤,其中,該插入件組合包括:一插入件本體,具有一通孔,該電子元件容置於此;一支撐板,設置於該通孔之下以支撐該電子元件,且具有一開孔,設置於該電子元件之一底表面之複數個焊料球插置於此;以及一推動件,水平地推動該電子元件,使得該等焊料球與該開孔之一第一內表面及與該第一內表面垂直之一第二內表面緊密接觸。 An electronic component housing device comprising: an insert assembly for accommodating an electronic component; a tray, the insert assembly being mounted thereon; and a support plate supporting the tray, wherein the insert assembly comprises: An insert body having a through hole, the electronic component is received therein; a support plate disposed under the through hole to support the electronic component, and having an opening disposed on a bottom surface of the electronic component a plurality of solder balls interposed therein; and a pushing member horizontally pushing the electronic component such that the solder balls are adjacent to a first inner surface of the opening and a second inner surface perpendicular to the first inner surface Close contact. 如申請專利範圍第8項所述之電子元件收容裝 置,其更包括一栓鎖件,利用一彈簧之彈性彈力以垂直地推動放置於該支撐板上之該電子元件。 Such as the electronic component storage device described in claim 8 Further, it further includes a latching member that utilizes an elastic elastic force of a spring to vertically push the electronic component placed on the support plate. 如申請專利範圍第9項所述之電子元件收容裝置,其中,該栓鎖件可旋轉地樞接於該插入件本體,且與該彈簧耦接,使得該栓鎖件之一端推動該電子元件。 The electronic component housing device of claim 9, wherein the latching member is rotatably pivotally coupled to the insert body and coupled to the spring such that one end of the latching member pushes the electronic component . 如申請專利範圍第10項所述之電子元件收容裝置,其中,一第一銷軸設置於該支撐平板,並可旋轉該栓鎖件以開啟該栓鎖件。 The electronic component housing device of claim 10, wherein a first pin is disposed on the support plate, and the latch is rotatable to open the latch. 如申請專利範圍第9項所述之電子元件收容裝置,其中,該栓鎖件垂直地推動該電子元件,之後,該推動件水平地推動該電子元件。 The electronic component housing device of claim 9, wherein the latch member vertically pushes the electronic component, and then the pusher pushes the electronic component horizontally. 如申請專利範圍第8項所述之電子元件收容裝置,其中,該推動件利用一彈簧之彈性彈力以推動該電子元件。 The electronic component housing device of claim 8, wherein the pushing member utilizes an elastic elastic force of a spring to push the electronic component. 如申請專利範圍第13項所述之電子元件收容裝置,其中,該推動件可旋轉地樞接於該插入件本體,且與該彈簧耦接,使得該推動件之一端水平地推動該電子元件。 The electronic component housing device of claim 13, wherein the pushing member is rotatably pivotally coupled to the insert body and coupled to the spring such that one end of the pushing member horizontally pushes the electronic component . 如申請專利範圍第14項所述之電子元件收容裝置,其中,一第二銷軸設置於該支撐平板,並可旋轉該推動件以移動該推動件之該端遠離該電子元件。 The electronic component housing device of claim 14, wherein a second pin is disposed on the support plate, and the pusher is rotatable to move the end of the pusher away from the electronic component. 如申請專利範圍第8項所述之電子元件收容裝置,其中,一支撐構件設置於該支撐平板,且在該支撐板支撐該電子元件之前,支撐著該電子元件,以及當該托盤及該支撐平板彼此分離時,該電子元件放置於該支撐板上。 The electronic component housing device of claim 8, wherein a support member is disposed on the support plate, and supports the electronic component before the support plate supports the electronic component, and when the tray and the support When the plates are separated from each other, the electronic component is placed on the support plate.
TW101137605A 2012-06-30 2012-10-12 Insert assembly and electronic device accommodation apparatus including the same TWI471969B (en)

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TW440699B (en) * 1998-06-09 2001-06-16 Advantest Corp Test apparatus for electronic parts
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